Laser-based alignment support device, laser-based alignment support system, and an X-ray imaging system

Abstract

Laser-based alignment support device (1) for assisting the alignment of an instrument (2) for puncturing an object (3), in particular for an X-ray imaging system (4), comprising: - a first line laser (5) for generating a first laser beam in a first laser plane (7), which is configured to generate a first laser line (14) on a first surface line (9) of the instrument (2) in a first section plane (11) of the instrument (2) when the first section plane (11) coincides with the first laser plane (7), and - a second line laser (6) for generating a second laser beam in a second laser plane (8) intersecting the first laser plane (7), characterized by: - ​​a point-like shielding element (16) of the second line laser (6) for generating a shadow line (17) in the second laser plane (8), wherein the second line laser (6) is configuredto map a shadow point (18) of the shadow line (17) onto a second surface line (10) of the instrument (2) in a second cutting plane (12) of the instrument (2) when the first cutting plane (11) and the second cutting plane (12) are aligned.

Description

The invention relates to a laser-based alignment support device for aligning an instrument for puncturing an object, in particular for an X-ray imaging system. The laser-based alignment support device, hereinafter referred to as the device, comprises a first line laser for generating a first laser beam in a first laser plane, which is configured to generate a first laser line on a first surface line of the instrument in a first cross-sectional plane of the instrument when the first cross-sectional plane coincides with the first laser plane. Furthermore, the device comprises a second line laser for generating a second laser beam in a second laser plane intersecting the first laser plane. The invention further relates to a laser-based alignment support system, which additionally includes the instrument for puncturing.Furthermore, the invention relates to an X-ray imaging system comprising an X-ray source, an X-ray detector and the aforementioned alignment support device. A laser-based alignment support device can be used in medical applications, among other areas of application, for example in technical applications for material processing. For example, medical interventions may require the targeted insertion of a medical instrument, such as a medical needle or cannula, into an object, particularly percutaneously into a patient, along a planned and precisely defined puncture trajectory through an object's surface. Especially when treating internal organs, such as the spine, the precise guidance and alignment of the instrument along the planned trajectory is crucial to ensure both the correct trajectory through tissue and bone and the targeted treatment of the specific organ, vessel, or bone. The precise guidance and alignment of the instrument can be supported and monitored, particularly by means of an X-ray imaging system, but only to a limited extent, since the X-ray imaging system can only provide a two-dimensional X-ray image of the X-ray detector plane. Especially in a tracking position of the X-ray detector or X-ray source, where the instrument's path within the object can be displayed, a swiveling movement of the instrument into or away from the detector plane cannot be shown, which can lead to hidden tilting of the instrument. To align the instrument, line lasers from the laser-based alignment support device can be used to assist in the process. These lasers can generate laser beams in intersecting laser planes. Before the puncture, for example, in a first position, the laser-based alignment support device can project two intersecting laser lines onto the object's surface, such as the patient's skin, indicating the puncture entry point. Additionally, in this first position, the instrument can be aligned by pivoting it around a first and second axis of rotation so that the intersecting laser beams are projected onto the instrument.In particular, the instrument has a first and second cutting plane, and is aligned according to the trajectory, i.e., correctly positioned and oriented at the puncture entry point, when the first laser plane coincides with the first cutting plane and the second laser plane coincides with the second cutting plane of the instrument. Specifically, the line lasers can be adjusted such that, with a correctly aligned instrument, the first cutting plane coincides with the first laser plane and the second cutting plane coincides with the second laser plane. Accordingly, an adjustment device can be provided for the first and for the second line laser, which can be adjusted in particular automatically according to a predetermined puncture trajectory. However, due to design constraints, it may be necessary to rotate the device from the first position to a second position during or during the puncture of the object, particularly to bring the X-ray detector into the imaging position for the intervention. A disadvantage of this is that in the second position, the device's ability to align the instrument is limited, as the two laser planes can no longer be superimposed on the instrument's two cutting planes due to its design. Specifically, in the second position, the instrument can only be aligned with respect to the first cutting plane using the laser lines. The second laser plane, which may be rotated relative to the second cutting plane, cannot, according to the prior art, provide any supporting information for aligning the second cutting plane. Similarly, the instrument's second cutting plane cannot be aligned using the X-ray image, so there is a risk of the instrument tilting during the intervention perpendicular to the detector plane. This problem has been solved so far by periodically rotating the device briefly back from the first position to the second position during the intervention, so that both cutting planes of the instrument could be correctly realigned. However, this adversely interrupts the intervention, thus delaying it and increasing radiation exposure. Alternatively, a mechanical alignment support device can be provided, but its handling could be improved. DE 195 01 069 A1 discloses a device for marking the intended guidance path of an instrument, in particular a puncture needle or a catheter. CN 1 09 793 559 A describes a CT-based percutaneous laser locating device. DE 10 2007 029 199 A1 discloses a method for aligning a target guidance system to support target guidance during a puncture of a patient, as well as an X-ray angiography system usable in the method. The object of the invention is to propose an improved concept for a laser-based alignment support device, for a laser-based alignment support system and for an X-ray imaging system, so that a user of the instrument can be supported in aligning both the first sectional plane of the instrument and the second sectional plane of the instrument according to a puncture trajectory during a puncture, in particular in a progression display position of the X-ray detector or a second position of the alignment support device. The problem is solved by the subject matter of the independent patent claims. Advantageous embodiments of the invention are described by the dependent patent claims, the following description, and the figures. A first aspect of the invention relates to a laser-based alignment support device for aligning an instrument for puncturing an object, wherein the alignment support device may in particular be provided for an X-ray imaging system. The alignment support device includes, in particular, a first line laser for generating a first laser beam in a first laser plane. The first line laser is configured to generate a first laser line on a first surface line of the instrument in a first cutting plane of the instrument when the first cutting plane coincides with the first laser plane. The alignment support device further comprises, in particular, a second line laser for generating a second laser beam in a second laser plane intersecting the first laser plane. The second line laser, in particular, has a point-like shielding element, wherein a shadow line can be generated in the second laser plane by means of the shielding element. The second line laser is configured to project a shadow point of the shadow line onto a second surface line of the instrument in a second cutting plane of the instrument when the first cutting plane and the second cutting plane are aligned. Alignment can be understood to mean, in particular, positioning the instrument in its predetermined position and rotating and pivoting it in its predetermined orientation, specifically a transverse movement along the three spatial dimensions and a rotation around the three spatial dimensions. In particular, alignment also includes correct alignment, especially the correct alignment of the instrument with respect to a predetermined or planned puncture trajectory. The term "support" can be understood in particular to mean that the device does not perform the alignment itself, but assists a user or another technical device in aligning the instrument correctly. The invention advantageously ensures that a user of the instrument can be assisted in correctly aligning both the first and second cutting planes of the instrument according to a predetermined puncture trajectory during a puncture, particularly in a tracking position of the X-ray detector or a second position of the alignment support device. In particular, the user can visually perceive when the instrument is correctly aligned. The instrument is considered correctly aligned when both the first laser line is generated on the first surface line and the shadow point is projected onto the second surface line. The user can visually monitor this to ensure that the instrument is aligned according to the planned puncture trajectory. In particular, the user cannot visually detect any deviation from the correct alignment of the instrument, especially if the first laser line is not on the first surface line and / or if the shadow point is not on the second surface line. Specifically, the user may see a second laser line on the second surface line, intersecting it at a point, if the instrument is not correctly aligned. In this case, the user can use the device to correctly align the instrument. To align correctly, the user should preferably proceed as follows. First, the user positions the instrument on a predetermined puncture entry point, for example, using the tip of the instrument. The user then pivots the instrument around a first axis until the first laser line is visually perceived on the instrument, with this axis potentially passing through the puncture entry point. Next, the user can pivot the instrument around this first axis and rotate it around a rotation axis passing through the puncture entry point so that the first laser line is projected onto the first surface line. Finally, the user can pivot the instrument around a second axis, essentially perpendicular to the first, until the shadow point is projected onto the second surface line. With a rotationally symmetrical instrument, such as a medical needle, the step of rotating around the axis of rotation can be omitted. In particular, with such an instrument, a first line along the needle can represent the first surface line, and a second line offset from the first line along the needle can represent the second surface line. When inserting the instrument along the predetermined puncture trajectory, it may be specifically intended that the first laser line continues to be generated on the first object line, and the shadow point moves on the second surface line. A significant advantage of the device according to the invention is, in particular, that it can assist a user or an electromechanical system in aligning both the first and second cutting planes of the instrument according to a predetermined alignment pose or puncture trajectory. Such assistance can advantageously be provided even if the second line laser, for example, due to its constrained positioning during puncture, cannot emit the second laser beam in the laser plane that would coincide with the second cutting plane of the aligned instrument. This can be the case, for example, if the line lasers are arranged on the housing of the X-ray detector or the X-ray source of the X-ray imaging system. In such a case, it can be provided that in a first position of the device, orIn a top-down position of the X-ray imaging system, the line lasers can be arranged in such a way that they can generate a laser cross on the object surface and a laser cross on the instrument; however, in this position, the path of the instrument as it penetrates the body cannot be monitored. To monitor the instrument's movement, the X-ray imaging system may need to be rotated into a tracking position, inevitably rotating the device into a second position as well. In this second position, the instrument may only be oriented with respect to the first sectioning plane using the first line laser, whereas the second line laser, without generating the shadow line, would no longer provide any supporting information for aligning the instrument with respect to the second sectioning plane. In particular, the instrument itself can be aligned in the second position of the device with respect to the second cutting plane by means of the point-like shielding element according to the invention, so that handling the instrument is significantly easier and the puncture can be carried out in a much more targeted manner. A further advantage is that existing devices without such a shielding element according to the invention can be retrofitted with a shielding element particularly easily and cost-effectively through a minimal modification, thereby generating a high added benefit. Advantageously, the shielding element does not restrict any other function of the device, especially in the top-view position, so that no negative side effects occur due to the shielding element. It may be provided that the instrument must be aligned manually by a user, in particular by hand, or by means of an alignment or guiding device for the instrument, whereby the user is assisted in aligning the instrument by means of the laser-based device. In particular, the instrument must be aligned according to a puncture trajectory planned before the puncture, along which the instrument is to be guided through the object surface into the object. A puncture can be understood, in particular, as the insertion of a sharp instrument or a sharp part of an instrument through the object's surface into the object itself. In this context, puncture is not limited to medical procedures but can also be used in the mechanical processing of objects. Medical puncture may involve inserting a medical needle, cannula, trocar, or similar instrument into a human or animal body, particularly percutaneously, for example to inject fluids or to extract body fluids. The instrument can be a medical instrument such as a medical needle, cannula, trocar, drill, or the like; the object surface can be the skin; and the object can be the body. In the broadest sense, the instrument can be a technical instrument such as a drill, screwdriver, chisel, or the like, suitable for puncture. The instrument can, in particular, have three virtual cutting planes, comparable to the principal planes of a human body. The three cutting planes can, in particular, be orthogonal to each other and intersect, for example, at a common point of intersection, especially at the center of the instrument. The first cutting plane and the second cutting plane can, in particular, extend in a direction along the longitudinal axis of the instrument, for example, along the needle. In particular, the first and second cutting planes can intersect along the longitudinal axis. The longitudinal axis can, in particular, pass through the center of the needle of the instrument. The first surface line and / or the second surface line may be visible on the instrument, for example, as an indentation or a color-coded line. Likewise, the first and / or the second surface line may be predetermined by the instrument itself, for example, if the instrument is a medical needle or handle. The device can be used in particular as an additional aid during a medical intervention, for example during percutaneous vertebroplasty, with the supportive use of an X-ray imaging system. A line laser can be understood as a laser with special optics that, instead of a laser pointer, projects a laser line onto a surface. The line laser emits laser radiation in a fan-like pattern into a laser plane, which, upon striking a surface, creates the line. A laser plane can be understood, in particular, as the plane spanned by the vectors of the laser beams. Specifically, the two laser planes intersect at a laser intersection line. In particular, it can be intended, at least approximately, that the laser intersection line intersects the intersection line of the first and second cutting planes of the aligned instrument. In particular, the line lasers are designed to emit laser radiation continuously over time. Therefore, laser radiation is emitted even when the instrument is not yet aligned or only partially aligned. Specifically, the first laser line may appear oblique or off-axis if the instrument is not correctly aligned with respect to the first cutting plane, or the shadow point may appear off-axis if the instrument is not correctly aligned with respect to the second cutting plane. The line lasers can be adjusted and / or calibrated accordingly for an individual puncture, so that they can serve to assist in correctly aligning the instrument along the puncture trajectory. The device can be configured, particularly in the first position, to indicate a puncture point on the object surface by means of a laser cross, and to align the instrument with respect to the first and second cutting planes even without the shielding element. In the second position of the device, the second laser plane of the second line laser can no longer be adjusted to the second cutting plane of the aligned instrument due to its position. Instead, it may be specified that the second laser plane can be positioned perpendicular to the aligned second cutting plane, for example, at a right angle to each other, or at an angle of 30 degrees to 150 degrees to each other. The shielding element can preferably be arranged directly at an exit point or in an exit area of ​​the second line laser. "Point-like" can be understood to mean, in particular, that the shielding element can represent a point in the second laser plane, or that the shielding element intersects the second laser plane at a point. In particular, the shielding element is designed to block the second laser beam at a single point. This point creates a shadow line in the second laser plane, which extends linearly within that plane. Due to technical or optical limitations, the shadow line may fan out slightly over time. The shadow point can be understood, particularly on the instrument, as a hidden point or area of ​​the second laser line. Specifically, by swiveling the instrument around its second axis, the second laser line can be visually perceived on the instrument, and the shadow point can be seen as the hidden area between two segments of the second laser line. In particular, it may be provided that the shadow line of the second laser plane intersects the first laser plane at a point of intersection, whereby this point of intersection may correspond at least approximately to a point on the line of intersection of the first and second cutting planes. At least one embodiment provides that the shielding element is adjustable. Accordingly, an adjustment device for the shielding element can be provided, which can be adjusted, in particular automatically, according to the predetermined or planned puncture trajectory. Advantageously, the shielding element can be adjusted, in particular set and calibrated, for each individual puncture intervention. For example, the adjustment device can change the geometric position of the physical shielding element. The shielding element can also correspond to the tinting of photochromic glass or the darkening of electrochromic glass, which is penetrated by the second laser beam. In particular, the shielding element can be adjusted by applying an electrical voltage to the electrochromic glass. Furthermore, the shielding element can be implemented technically using a liquid crystal element. At least one embodiment provides that the second line laser has imaging optics configured to sharpen the contour of the shadow point. A sharpened shadow point advantageously allows the instrument to be aligned even more precisely around the second pivot axis. In particular, the imaging optics can sharpen the ends of the sub-lines of the second laser line that define the shadow point. Preferably, the imaging optics are configured to bring the ends of the sub-lines as close as possible to each other, while still maintaining a visual distance, so that the shadow point is as small as possible. The imaging optics can in particular include various lenses and apertures, which are preferably adjustable and in particular focusable. At least one embodiment provides for the shielding element to be a filament that intersects the second laser plane at a single point. Using a filament makes the shielding element particularly easy and cost-effective to implement, or to retrofit to existing devices that lack a shielding element. A filament can be understood to be, in particular, a thread, a fiber, a cord, a fine wire, or the like. The filament is preferably linear. In particular, the filament can run substantially orthogonally to the second laser plane, or at least at an angle of intersection of 60 degrees to 120 degrees. At least one embodiment provides that the laser-based alignment support device has a housing in which the first and second line lasers are arranged separately. The shared housing advantageously allows for precise control over the relative positions of the two line lasers. Furthermore, the fixed relative positions of the two line lasers allow for the use of a common laser coordinate system for their adjustment. Additionally, the housing can be precisely oriented in space, thus simplifying the alignment and calibration of the two line lasers. At least one embodiment provides that the housing has a main extension surface, wherein the first line laser is formed on a longitudinal side of the main extension surface and the second line laser is formed on a transverse side of the main extension surface. In particular, the line lasers are arranged at an edge of the main extension surface. Preferably, this allows the housing to also be used for other purposes, in particular for the arrangement of an X-ray detector or an X-ray source, wherein the main extension surface can correspond to the detector surface. At least one embodiment provides that the first line laser is configured to generate the first laser beam in the first laser plane, which extends substantially perpendicular to the principal extension surface, and the second line laser is configured to generate the second laser beam in the second laser plane, which extends substantially perpendicular to both the principal extension surface and the first laser plane. In particular, the laser planes can each be parallel to an orthogonal of the principal extension surface and, for example, parallel to a central projection beam of the X-ray detector. In this way, the laser planes arranged in this manner can advantageously be used to assist in aligning the instrument. At least one embodiment provides that the laser-based alignment support device has a positioning device on which the housing is arranged. In particular, the housing can be fixedly or rotatably connected to the rotating device. Specifically, the housing can be positioned by means of the positioning device. The positioning device can be mounted in such a way that the housing can be positioned along a path, for example along a circular path. Preferably, the rotary device is configured to position the housing relative to the object in at least a first position and a second position, for example along a circular path around the object. The first position and the second position can be offset from each other on the circular path by an angle of approximately 90 degrees, or within a range of 60 degrees to 120 degrees. In the first position, the first and second line lasers are preferably configured so that the first and second laser lines intersect at a puncture entry point on the object's surface. This allows the device to assist the user in positioning the instrument at the puncture entry point. Additionally, the intersecting lines can also be used to correctly orient the instrument. However, the first position may be unsuitable for the puncture intervention, particularly because in this position the X-ray imaging system cannot be positioned in a progression display position to track the course of the instrument within the object. In the second position, where the X-ray imaging system can be in the progression display position, the first line laser is configured to project the first laser line onto the first surface line of the instrument positioned at the puncture entry point, provided the first section plane coincides with the first laser plane. Similarly, in the second position, the second line laser is configured to project the shadow point onto the second surface line of the instrument positioned at the puncture entry point, provided the first and second section planes are aligned. In this way, the device can assist the user in at least two positions to correctly align the instrument according to the specified puncture trajectory. Another aspect of the invention relates to a laser-based alignment support system for assisting in the alignment of an instrument for puncturing an object. The laser-based alignment support system comprises the laser-based alignment support device according to the invention, as well as the instrument which has a marking along the second surface line, wherein the second cutting plane is aligned when the shadow point is mapped onto the marked second line. In other words, a marking is provided on the instrument to visually identify the second surface line for the user. Particularly with complex instruments, where the surface lines are not inherent to the instrument's geometry, this marking, or the marked second surface line, can be advantageous in helping the user to align the shadow point on the second surface line by pivoting the instrument, thus ensuring correct instrument alignment. Preferably, the marking is placed on the second surface line, especially on narrow instruments. The marking can be, for example, a colored marking and / or an indentation or a protruding ridge on the surface of the instrument. In particular, the first surface line may also be marked, unless the first surface line is already evident from the geometry of the instrument. The system according to the invention advantageously ensures that a user of the instrument can be supported in correctly aligning both the first and second cutting planes of the instrument according to a predetermined puncture trajectory during a puncture, particularly in a tracking position of the X-ray detector or a second position of the alignment support device. In particular, the user can visually perceive when the instrument is correctly aligned, which is further ensured by the marking. The instrument is correctly aligned, in particular, when both the first laser line is generated on the first surface line and the shadow point is projected onto the marked second surface line. The user can visually monitor this to ensure that the instrument is aligned according to the planned puncture trajectory. At least one embodiment of the alignment support system provides that the instrument includes a handle which has the marking for the second surface line. The handle may be particularly suitable for attaching the marking, as it can be of a certain size. A needle for puncture may be arranged on the handle, allowing the user, for example, to grasp the handle and thus insert the needle into the object. At least one embodiment of the alignment support system provides that, depending on the thickness of the instrument, the marking is arranged offset from the second surface line. In particular, the marking can run parallel to the second surface line. This allows for advantageous consideration of the angle of incidence of the second laser beam on the instrument. Another aspect of the invention relates to an X-ray imaging system, at least comprising an X-ray source and an X-ray detector, as well as the laser-based alignment support device or the laser-based alignment support system according to the invention. At least one embodiment of the X-ray imaging system provides that the first and second line lasers are arranged on the housing of the X-ray detector or the housing of the X-ray source. In particular, this allows the positioning of the line lasers relative to the X-ray detector or the X-ray source to be precisely defined. This, and especially the shared housing of the line lasers with the detector or the X-ray source, enables a particularly simple coupling of the X-ray detector's X-ray coordinate system with the line lasers' laser coordinate system. This allows the line lasers to be adjusted in a simplified manner according to a planned trajectory within an X-ray image from the X-ray detector. The common housing directly couples the first position of the alignment support device to the top view position of the X-ray imaging system, and the second position of the alignment support device to the trend display position of the X-ray imaging system. At least one embodiment of the X-ray imaging system provides that the first line laser is configured to generate the first laser radiation in the first laser plane, which extends substantially parallel to a projection direction of the X-ray imaging system, and the second line laser is configured to generate the second laser radiation in the second laser plane, which extends substantially parallel to the projection direction and perpendicular to the first laser plane. At least one embodiment of the X-ray imaging system provides that the X-ray imaging system has a rotatable C-arm as a positioning device. The C-arm is configured to rotate the X-ray source and the X-ray detector relative to the object, at least into the top-view position and the progression display position. In the top view position, the first line laser and the second line laser are set up so that the first laser line and the second laser line intersect at the puncture entry point on the object surface, and in the gradient display position, the first line laser is set up to generate the first laser line on the first surface line of the instrument positioned at the puncture entry point when the first cutting plane coincides with the first laser plane, and the second line laser is set up to map the shadow point on the second surface line of the instrument positioned at the puncture entry point when the first cutting plane and the second cutting plane are aligned. Regardless of the grammatical gender of a particular term, persons with male, female or other gender identities are included. The following describes exemplary embodiments of the invention. Figure 1 shows a schematic representation of an exemplary embodiment of an X-ray imaging system according to the invention in a top-view position; Figure 2 shows a schematic representation of a detector image from the top-view position; Figure 3 shows a schematic representation of an exemplary embodiment of an X-ray detector with a laser-based alignment support device according to the invention in a first position; Figure 4 shows a schematic representation of an exemplary embodiment of an X-ray imaging system according to the invention in a progression display position; Figure 5 shows a schematic representation of a detector image from the progression display position; Figure 6 shows a schematic sketch of a laser-based alignment support device according to the invention in a second position; Figure 7 shows the following:Fig. 7 a schematic sketch of a laser-based alignment support device according to the invention in a second position with a medical needle; Fig. 8 an enlarged schematic representation of the medical needle; Fig. 9 a schematic sketch of a laser-based alignment support system according to the invention in a second position; Fig. 10 a first schematic representation of an instrument with a marker; Fig. 11 a second schematic representation of an instrument with a marker; Fig. 12 a schematic representation of a second line laser with a shielding element. Figure 1 shows a schematic representation of an embodiment of an X-ray imaging system 4 according to the invention in a top-view position P11. In the example shown, the X-ray imaging system 4 comprises an X-ray source 31 and an X-ray detector 32, which can generate a detector image 36 of an object 3, here a patient 34. For this purpose, the patient 34 can lie on a patient table 35 of the system 4. For example, the X-ray imaging system 4 can provide imaging support during a puncture of the patient 34, for example, during percutaneous vertebroplasty. An instrument 2 can be designed as a medical instrument 2, for example, a medical needle. However, in the top-view position P11, the path of the instrument 2 within the patient cannot be shown, in particular not the penetration depth of the instrument 2 into the patient 34, see Figure 2.Therefore, the X-ray imaging system 4 cannot be used advantageously in the top view position P11 during the medical intervention. The detector can, in particular, be mounted on a positioning device 25 designed as a rotatable C-arm 33, which is designed to rotate the X-ray source 31 and the X-ray detector 32 relative to the object 3 from the top view position P11, for example, to a progress view position P22, see Fig. 4. For this purpose, the C-arm 33 can be mounted via a rotary bearing 40. A housing 21 of the X-ray detector 32 can, in particular, serve as a common housing 21 for the X-ray detector 32 and a laser-based alignment support device 1. The device 1 can, in particular, comprise a first line laser 5 and a second line laser 6, which can be arranged separately from each other on the housing 21. In the top view position P11, the device 1 can in particular be aligned in a first position P1, since it can be coupled to the position of the X-ray imaging system 4 due to the common housing 21. Fig. 2 shows a schematic representation of a detector image 36 of an object 3, for example, the patient 34, from the top-view position P11. In particular, a vertebra 37 and the instrument 2, which may have a handle 30, can be seen. From the top-view position P11, the positioning of the instrument 2 in the detector plane can be determined, but the penetration depth of the instrument 2, which would be of interest to the user, for example, the treating physician, for the intervention, cannot be determined. Figure 3 shows a schematic representation of an embodiment of an X-ray detector 32 with a laser-based alignment support device 1 according to the invention for assisting the alignment of the instrument 2 for a puncture in a first position P1. In this example, the first line laser 5 is provided on a longitudinal side 23 of the main extension surface 22 and the second line laser 6 on a transverse side 24 of the main extension surface 22, so that they are located outside the detector plane and do not interfere with the detector image. The first line laser 5 can be configured to generate a first laser beam in a first laser plane 7, which can extend substantially perpendicular to a principal extension surface 22 of the housing 21, which can correspond in particular to the detector plane of the X-ray detector 32. The second line laser 6 can be configured to generate a second laser beam in a second laser plane 8, which can extend substantially perpendicular to the principal extension surface 22 and perpendicular to the first laser plane 7. When the laser beams strike a surface, for example an object surface 27 of the object 3, the first line laser 5 can generate a first laser line 14, and the second line laser 6 a second laser line 15. In the first position P1, the first line laser 5 and the second line laser 6 can be adjusted and configured such that the first laser line 14 and the second laser line 15 intersect at a puncture entry point 26 on the object surface 27. Fig. 4 shows a schematic representation of an embodiment of an X-ray imaging system 4 according to the invention in a progression display position P22. In particular, the X-ray source 31 and the X-ray detector 32, together with the device 1, can have been rotated from the top view position P11 by about 90 degrees to this progression display position P22 by means of the C-arm 33 (not shown). This progress display position P22 can be particularly advantageous for the user in that he can see the penetration depth of the instrument 2 into the patient 34 on the detector image 36, compare Fig. 5, so that during the intervention the system 4 is primarily used in the progress display position P22. At the progress display position P22, the laser-based alignment support device 1, which is coupled to the position of the system 4, is in a second position P2, which may be offset by approximately 90 degrees to the first position P1. Figure 5 shows a schematic representation of a detector image 36 from the tracking position P22. The treating physician can advantageously demonstrate the penetration depth of the instrument 2, for example, a medical needle, into the object 3, for example, into the vertebra 37 of the patient. However, a disadvantage is that this detector image 37 does not allow for the detection of any tilting of the instrument 2 into or out of the detector plane. Likewise, this cannot be detected using an alignment support device from the prior art in the second position P2. Fig. 6 shows a schematic sketch of a laser-based alignment support device 1 according to the invention in the second position P2. Here, it can be provided that the first line laser 5 is configured and adjusted such that it generates the first laser radiation in the first laser plane 7, which coincides with a first virtual first cutting plane 11 of the instrument 2 (not shown), correctly aligned according to a planned puncture trajectory. Due to the arrangement of the second line laser 6 shown and described, it cannot be adjusted such that the second laser plane 8 coincides with a second, virtual, second cutting plane 12 of the instrument 2, correctly aligned according to the planned puncture trajectory. In particular, the second laser plane 8 may be approximately at a right angle to the second cutting plane 12, so that without further aids the instrument 2 cannot be aligned with respect to the second cutting plane 12. To solve the problem, a point-like shielding element 16 of the second line laser 6 can be provided, which generates a shadow line 17 in the second laser plane 8. The second line laser 6 can then be configured and adjusted so that the shadow line 17 intersects, at least approximately, a virtual intersection line 41 of the first intersection plane 11 and the second intersection plane 12. "Approximately" in this context means that, depending on the thickness of the instrument 2, the shadow line 17 may run slightly beside the intersection line 41, thus ensuring correct alignment of the instrument 2. The shielding element 16 is preferably an adjustable shielding element 16 which can be adjusted depending on the puncture trajectory and thickness of the instrument 2, preferably automatically by an adjustment device and appropriate software. In the example, the shielding element 16 can be a filament 19, for example a thin metal wire, which cuts the second laser plane 8 at a point 20 “point-like”. In particular, the second line laser 6 can have an imaging optic (not shown) configured to sharpen a contour of the shadow line 17. For the sake of completeness, Fig. 6 and the further Fig. 7 and Fig. 8 also show the third section plane 13 of the instrument 2. Figure 7 shows a schematic sketch of the laser-based alignment support device 1 according to the invention in the second position P2 with a medical needle as instrument 2. The instrument 2 is positioned, in particular, at the puncture entry point 26 on the object surface 27. The first line laser 5 can be configured such that the first laser line 14 is generated on a first surface line 9 of the instrument 2 in a first cutting plane 11 of the instrument 2 if the first cutting plane 11 coincides with the first laser plane 7. The second line laser 6 can be configured to map a shadow point 18 of the shadow line 17 onto a second surface line 10 of the instrument 2 in a second cutting plane 12 of the instrument 2, if the first cutting plane 11 and the second cutting plane 12 are correctly aligned according to the puncture trajectory. Fig. 8 shows an enlarged, schematic representation of the instrument 2, designed as a medical needle, particularly in a section of the needle. The user can visually perceive when the first laser line 9 appears on the first virtual surface line 9, where the first surface line 9 can correspond to a partial area of ​​the needle's surface. The second virtual surface line 10 can also correspond to a partial area of ​​the needle's surface, but offset from the first surface line 9. The second laser line 15 can also be projected onto the needle transversely to a longitudinal axis, with the shadow point 18 located between a first sub-line 38 and a second sub-line 39 of the second laser line 15. In particular, the instrument 2 is also aligned in the second sectional plane 12 when the instrument 2 is pivoted such that the shadow point 18 is projected onto the second surface line 10. However, with thin needles or large shadow points 18, the second laser line 15 may not be visible on an aligned instrument 2, especially if the shadow diameter of the shadow point 18 is larger than the diameter of the needle. For example, in this case, the needle is aligned if the second laser line 15 is not visible on the needle. Figure 9 shows a schematic sketch of a laser-based alignment support system 28 according to the invention in the second position P2. In particular, the instrument 2 of the system 28 has a marking 29 along the second surface line 10, wherein the second section plane 12 is aligned when the shadow point 18 is projected onto the marking 29. The instrument 2 can comprise a needle and a handle 30, the handle 30 being marked 29. Depending on the thickness of the instrument 2 or the handle 30, the mark 29 can be slightly offset from the second surface line 10 to compensate for a shallow irradiation angle. Fig. 10 shows a first schematic representation of an embodiment of an instrument 2, in particular with a marking 29 on the second surface line 10. The instrument 2 has a handle 30 and a needle for puncture. On the instrument 2, which is aligned at the puncture entry point 26 and in the section planes 12, 13, it can be seen that the first laser line runs along the first surface line 9 and also on the object surface 27 of the object 3. In addition, the first sub-line 38 and the second sub-line 39 of the second laser line 15 can be seen, with the shadow point 18 on the marking 29 being located between the sub-lines 38, 39. Fig. 11 shows a second schematic representation of an exemplary embodiment of instrument 2 with a marking 29 from a different perspective. Fig. 12 shows a schematic representation of a second line laser 6 with a shielding element 16 designed as a filament 19. In this example, the second line laser 6 is arranged on the common housing 21 of the X-ray detector 32. The line laser 6 can be retrofitted to such a housing 21 relatively easily with the shielding element 16.

Claims

Laser-based alignment support device (1) for assisting the alignment of an instrument (2) for puncturing an object (3), in particular for an X-ray imaging system (4), comprising: - a first line laser (5) for generating a first laser beam in a first laser plane (7), which is configured to generate a first laser line (14) on a first surface line (9) of the instrument (2) in a first section plane (11) of the instrument (2) when the first section plane (11) coincides with the first laser plane (7), and - a second line laser (6) for generating a second laser beam in a second laser plane (8) intersecting the first laser plane (7), characterized by: - ​​a point-like shielding element (16) of the second line laser (6) for generating a shadow line (17) in the second laser plane (8), wherein the second line laser (6) is configuredto map a shadow point (18) of the shadow line (17) onto a second surface line (10) of the instrument (2) in a second cutting plane (12) of the instrument (2) when the first cutting plane (11) and the second cutting plane (12) are aligned. Laser-based alignment support device (1) according to claim 1, characterized in that the shielding element (16) is an adjustable shielding element (16). Laser-based alignment support device (1) according to claim 1 or 2, characterized in that the second line laser (6) has an imaging optic configured to sharpen a contour of the shadow point (18). Laser-based alignment support device (1) according to one of the preceding claims, characterized in that the shielding element (16) is a filament (19) which intersects the second laser plane (8) at a point (20). Laser-based alignment support device (1) according to one of the preceding claims, characterized by a housing (21) in which the first line laser (5) and the second line laser (6) are arranged separately from each other. Laser-based alignment support device (1) according to claim 5, characterized in that the housing (21) has a main extension surface (22), wherein the first line laser (5) is formed on a longitudinal side (23) of the main extension surface (22) and the second line laser (6) is formed on a transverse side (24) of the main extension surface (22). Laser-based alignment support device (1) according to claim 6, characterized in that the first line laser (5) is configured to generate the first laser radiation in the first laser plane (7), which extends substantially perpendicular to the main extension surface (22), and the second line laser (6) is configured to generate the second laser radiation in the second laser plane (8), which extends substantially perpendicular to the main extension surface (22) and perpendicular to the first laser plane (7). Laser-based alignment support device (1) according to one of claims 5 to 7, characterized by a positioning device (25) on which the housing (21) is arranged, wherein the positioning device (25) is configured to rotate the housing (21) relative to the object (3) at least into a first position (P1) and into a second position (P2), wherein - in the first position (P1) the first line laser (5) and the second line laser (6) are configured such that the first laser line (14) and a second laser line (15) generated by the second line laser (6) intersect at a puncture entry point (26) on an object surface (27) of the object (3), and - in the second position the first line laser (5) is configured to generate the first laser line (14) on the first surface line (9) on the instrument (2) positioned at the puncture entry point (26) when the first cutting plane (11) is aligned with the first laser plane (7) coincides,and the second line laser (5) is set up to map the shadow point (18) onto the second surface line (10) of the instrument (2) positioned at the puncture entry point (26) when the first cutting plane (11) and the second cutting plane (12) are aligned. Laser-based alignment support system (28) for assisting the alignment of an instrument (2) for puncturing an object (3), characterized by: - ​​a laser-based alignment support device (1) according to one of the preceding claims, and - the instrument (2) which has a marker (29) along the second surface line (10), wherein the second cutting plane (12) is aligned when the shadow point (18) is imaged on the marker (29). Laser-based alignment support system (28) according to claim 9, characterized in that the instrument (2) comprises a handle (30) which has the marking (29). Laser-based alignment support system (28) according to claim 9 or 10, characterized in that, depending on the thickness of the instrument (2), the marking (29) is arranged offset from the second surface line (10). X-ray imaging system (4) comprising an X-ray source (31) and an X-ray detector (32), characterized by a laser-based alignment support device (1) according to one of claims 1 to 8 . X-ray imaging system (4) according to claim 12, characterized in that the first line laser (5) and the second line laser (6) are arranged on a housing (21) of the X-ray detector (32) or on a housing (21) of the X-ray source (31). X-ray imaging system (4) according to claim 13, characterized in that the first line laser (5) is configured to generate the first laser radiation in the first laser plane (7), which extends substantially parallel to a projection direction of the X-ray imaging system (4), and the second line laser (6) is configured to generate the second laser radiation in the second laser plane (8), which extends substantially parallel to the projection direction and perpendicular to the first laser plane (7). X-ray imaging system (4) according to claim 14, characterized by a rotatable C-arm (33) as a positioning device (25) on which the X-ray source (31) and the X-ray detector (32) are arranged, wherein the C-arm (33) is configured to rotate the X-ray source (31) and the X-ray detector (32) relative to the object (3) at least into a top-view position (P11) and into a progression display position (P22), wherein - in the top-view position (P11) the first line laser (5) and the second line laser (6) are configured such that the first laser line (14) and a second laser line (15) generated by the second line laser (6) intersect at a puncture entry point (26) on an object surface (27) of the object (3), and - in the progression display position (P22) the first line laser (5) is configured on which at the puncture entry point (26) to generate the first laser line (14) by positioning the instrument (2) on the first surface line (9),when the first cutting plane (11) coincides with the first laser plane (7), and the second line laser (6) is set up to project the shadow point (18) onto the second surface line (10) of the instrument (2) positioned at the puncture entry point (26), when the first cutting plane (11) and the second cutting plane (12) are aligned.

Images