Test equipment and test procedures

Abstract

Fluctuations in a voltage applied to a winding during testing are suppressed. A testing device (1) is characterized in that, when an instruction receiving unit (3) receives a predetermined instruction, a voltage generating circuit (2) generates and outputs a voltage corresponding to a value (Et) obtained by correcting a voltage command value (Ee) associated with the predetermined instruction (A1) using a correction coefficient (C), and furthermore, a correction coefficient calculating unit (5) updates the correction coefficient (C) such that the deviation between a voltage measured by a voltage measuring unit (4) and the voltage command value (Ee) is small, and in that, when a measurement of a winding to be tested is carried out, the voltage generating circuit (2) generates and outputs a voltage corresponding to a value obtained by correcting a voltage command value (Em) associated with the measurement using the correction coefficient (C),and further an analysis result generation unit (6) generates an analysis result (83) based on the voltage measured by the voltage measuring unit (4).,

Description

Technical area

[0001] The present invention relates to a testing device and a testing method, for example, a testing device and a testing method for measuring properties of a winding of a component or product formed by a coil, such as a rotary machine, an electric motor and a generator, or a transformer and the like. Background technology

[0002] As a test device for measuring characteristics of a winding of a rotating machine such as an electric motor and a generator, a pulse winding test device is conventionally known that measures the electrical characteristics of a winding based on a change in a voltage generated when a pulse voltage is applied to the winding to be tested (see Patent Document 1). Citation listPatent document

[0003] Patent Document 1: JP 5405518 B2 Overview of the inventionTechnical task

[0004] A conventional pulse winding tester according to Patent Document 1 generates a pulse voltage using a voltage generation circuit provided in the pulse winding tester and applies it to a winding. In many cases, a difference occurs between the pulse voltage generated by the voltage generation circuit and the voltage actually applied to the winding.

[0005] For example, if a user operates the pulse winding tester to set the pulse voltage to 1000 V, and a pulse voltage of 1000 V is output from the voltage generation circuit, the voltage applied to the winding under test may drop from the set voltage (1000 V), for example, to 950 V to 980 V, or even fluctuate. This phenomenon is suspected to be due to a voltage drop due to parasitic capacitance, output impedance, and transient response, as well as variations in the characteristics of the winding itself or the characteristics of a winding core due to manufacturing. Since the winding including the core has magnetic properties with hysteresis, the magnetization state of the core changes depending on a variation in the voltage or current applied to the winding.In the case of the winding containing the core, it is therefore suspected that the state of the core's magnetization could also be a factor in fluctuations in the applied voltage. The voltage drop can be corrected by measuring a defect-free product and increasing the voltage applied to the winding under test by the amount of the drop, and fluctuations in the core's magnetization can be suppressed using a demagnetization pulse, described later.

[0006] However, it is difficult to suppress fluctuations in the applied voltage caused by variations in manufacturing. For quality management of a winding by a user, it is undesirable for the voltage applied to the winding under test to fluctuate for each winding, even if the pulse voltage setting is constant, as this will result in inconsistent actual measurement conditions.

[0007] The present invention has been made in view of the above-described objects, and it is an object of the present invention to suppress fluctuations in a voltage applied to a winding when testing a winding. Means of solving the task

[0008] A test device according to a representative embodiment of the present invention includes a first external terminal to which one terminal of a winding to be tested is connected, and a second external terminal to which the other terminal of the winding to be tested is connected, an instruction receiving unit that receives an instruction, a correction coefficient calculating unit that calculates a correction coefficient, a voltage generating circuit that generates a voltage based on a voltage command value and the correction coefficient and outputs it between the first external terminal and the second external terminal, a voltage measuring unit that measures a voltage between the first external terminal and the second external terminal, and an analysis result generating unit,which carries out an analysis of the electrical properties of the winding to be tested based on the voltage measured by the voltage measuring unit and generates an analysis result, characterized in that when the instruction receiving unit receives a predetermined instruction, the voltage generating circuit generates and outputs a voltage corresponding to a value obtained by correcting the voltage command value associated with the predetermined instruction by means of the correction coefficient, and furthermore the correction coefficient calculating unit updates the correction coefficient such that the deviation between the voltage measured by the voltage measuring unit and the voltage command value associated with the predetermined instruction is small, and in that when the analysis is carried out, the voltage generating circuit generates a voltage,which corresponds to a value obtained by correcting the voltage command value associated with the analysis using the correction coefficient, and further, the analysis result generation unit generates the analysis result based on the voltage measured by the voltage measurement unit. Effects of the invention

[0009] The testing device according to the present invention makes it possible to suppress fluctuations in a voltage applied to the winding during testing of the winding. Brief explanation of the figures [ Fig. 1] Fig. 1 is a diagram illustrating a configuration of a test device according to an embodiment. [ Fig. 2] Fig. 2 is a diagram showing an example of a configuration of a voltage generating circuit. [ Fig. 3] Fig. 3 is a timing chart resulting when a demagnetization pulse and a measurement pulse are output from the voltage generation circuit. [ Fig. 4] Fig. 4 is a flowchart showing a process flow using the test device in a demagnetization mode. [ Fig. 5] Fig. 5 is a flowchart showing a process flow using the test device in a test mode. Modes for carrying out the invention 1. Overview of an embodiment

[0010] First, an overview of a representative embodiment of the invention disclosed in the present application will be described. It should be noted that in the following description, the reference numerals in the figures corresponding to the elements of the invention are placed in parentheses by way of example. [1] A test device (1) according to a representative embodiment of the present invention comprises a first external terminal (T1) to which one terminal of a winding (11) to be tested is connected, and a second external terminal (T2) to which the other terminal of the winding to be tested is connected, an instruction receiving unit (3) that receives an instruction, a correction coefficient calculating unit (5) that calculates a correction coefficient, a voltage generating circuit (2) that generates a voltage based on a voltage command value and the correction coefficient and outputs it between the first external terminal and the second external terminal, a voltage measuring unit (4) that measures a voltage between the first external terminal and the second external terminal, and an analysis result generating unit (6),which carries out an analysis of the electrical properties of the winding to be tested based on the voltage measured by the voltage measuring unit and generates an analysis result, characterized in that when the instruction receiving unit receives a predetermined instruction (A1), the voltage generating circuit generates and outputs a voltage corresponding to a value obtained by correcting the voltage command value associated with the predetermined instruction by means of the correction coefficient, and furthermore the correction coefficient calculating unit calculates the correction coefficient such that the deviation between the voltage measured by the voltage measuring unit and the voltage command value associated with the predetermined instruction is small, and in that when the analysis is carried out, the voltage generating circuit generates a voltage,which corresponds to a value obtained by correcting the voltage command value associated with the analysis using the correction coefficient, and further, the analysis result generation unit generates the analysis result based on the voltage measured by the voltage measurement unit. [2] In the test device described in [1] above, it is also possible that when the instruction receiving unit receives the predetermined instruction, the voltage generating circuit outputs a pulse having a voltage (Et) corresponding to a value obtained by correcting the voltage command value associated with the predetermined instruction by means of the correction coefficient for a predetermined number of outputs, and further, the correction coefficient calculating unit updates the correction coefficient for each output of the pulse. [3] In the test device described in [1] or [2] above, it is also possible for the correction coefficient calculation unit to update the correction coefficient based on the relationship between the voltage (V) measured by the voltage measuring unit and the voltage command value (Ee) associated with the predetermined instruction. [4] In the test device described in any one of [1] to [3] above, the predetermined instruction is an instruction (A1) to output a demagnetization pulse which is a voltage for suppressing fluctuations in the magnetization of a core of a winding including the core, and it is also possible that, when, after calculating the correction coefficient, the instruction receiving unit receives an instruction (A2) to execute the analysis, the voltage generating circuit generates and outputs a voltage corresponding to a value obtained by correcting the voltage command value (Em) associated with the analysis by means of the correction coefficient, and further, the analysis result generating unit generates the analysis result based on the voltage measured by the voltage measuring unit. [5] In the test device described in any one of [1] to [3] above, the predetermined instruction is an instruction (A2) to execute the analysis, and it is also possible that after calculating the correction coefficient, the voltage generating circuit generates and outputs a voltage corresponding to a value obtained by correcting the voltage command value (Em) associated with the analysis by means of the correction coefficient, and further, the analysis result generating unit generates the analysis result based on the voltage measured by the voltage measuring unit. [6] In the test device described above in any one of [1] to [4], it is also possible that the voltage command value (Ee) associated with the predetermined instruction coincides with the voltage command value (Em) associated with the measurement. [7] A method according to a representative embodiment of the present invention is a testing method using a testing device comprising a first external terminal to which one terminal of a winding to be tested is connected, and a second external terminal to which the other terminal of the winding to be tested is connected, an instruction receiving unit that receives an instruction, a correction coefficient calculating unit that calculates a correction coefficient, a voltage generating circuit that generates a voltage based on a set voltage command value and the correction coefficient and outputs it between the first external terminal and the second external terminal, a voltage measuring unit that measures a voltage between the first external terminal and the second external terminal, and an analysis result generating unit,which performs an analysis of the electrical properties of the winding to be tested based on the voltage measured by the voltage measuring unit and generates an analysis result. The method is characterized by comprising a first step (S1, S2) in which the instruction receiving unit receives a predetermined instruction; a second step (S3 to S6) in which, after the first step, the voltage generating circuit generates and outputs a voltage corresponding to a value obtained by correcting the voltage command value associated with the predetermined instruction using the correction coefficient; a third step (S7) in which the voltage measuring unit measures a voltage between the first external terminal and the second external terminal when the voltage generating circuit outputs a voltage in the second step; a fourth step (S8) in which the correction coefficient calculating unit calculates the correction coefficient such thatthat the deviation between the voltage measured in the third step and the voltage command value associated with the predetermined instruction is small, a fifth step (S13 to S16) in which the voltage generation circuit, when the analysis is carried out, generates and outputs a voltage corresponding to a value obtained by correcting the voltage command value associated with the analysis using the correction coefficient, a sixth step (S17) in which the voltage measuring unit measures a voltage between the first external terminal and the second external terminal when the voltage generation circuit outputs a voltage in the fifth step, and a seventh step (S19) in which the analysis result generation unit generates the analysis result based on the voltage measured in the sixth step. 2. Specific example of an embodiment

[0011] A specific example of an embodiment of the present invention will be described below with reference to the figures. It should be noted that in the following description, the elements common to the embodiments are provided with identical reference numerals, and a repeated description will be omitted.

[0012] Fig. 1 is a diagram illustrating a configuration of a test device 1 according to an embodiment.

[0013] The Fig. The test device 1 shown in FIG. 1 is a device for analyzing electrical properties of a winding (coil) constituting an electrical device, such as a rotary machine, an electric motor, a generator, or a transformer, etc. The test device 1 is, for example, a pulse winding test device that calculates at least one value of an equivalent inductance, an equivalent capacitance, or an equivalent resistance, which are parameters related to a winding under test, based on a change in voltage when a voltage (pulse voltage) is applied to the winding under test.

[0014] In addition to the function for analyzing the electrical properties of the winding, the test device 1 has a function for outputting a voltage for suppressing fluctuations in the magnetization of a core of a winding containing the core (hereinafter also referred to as a "demagnetization pulse"). The test device 1 also has a function for suppressing fluctuations in the voltage applied to the winding during the winding test.

[0015] As functional units for implementing the functions described above, the test device 1 comprises, for example, as shown in Fig. 1, external terminals T1 and T2, a voltage generation circuit 2, an instruction receiving unit 3, a voltage measuring unit 4, a correction coefficient calculation unit 5, an analysis result generation unit 6, an output unit 7, and a storage unit 8.

[0016] The external terminals T1 and T2 are terminals for connecting to a winding 11 as the device under test (DUT). For example, one terminal of winding 11 is connected to the external terminal T1, and the other terminal of winding 11 is connected to the external terminal T2.

[0017] The voltage generation circuit 2 is a circuit for applying a desired voltage to the winding 11 under test, which is connected between the external terminals T1 and T2. Hereinafter, the pulse voltage outputted by the voltage generation circuit 2 during the test of the winding 11 is referred to as a "measurement pulse," and the pulse voltage outputted by the voltage generation circuit 2 for suppressing fluctuations in the magnetization of the core of the winding 11 under test is referred to as a "demagnetization pulse," as described above.

[0018] The voltage generation circuit 2 generates a voltage based on a voltage command value E and correction coefficient C described later, and outputs the voltage between the external terminal T1 and the external terminal T2. Note that details of a method for generating the voltage using the voltage generation circuit 2 will be described later.

[0019] The instruction receiving unit 3 is a functional unit that receives an instruction for the test device 1. The instruction receiving unit 3 is implemented, for example, by an input interface device such as an operation button or a touch screen, which receives a user's operation of the test device 1, and by program processing by a CPU.

[0020] The instruction receiving unit 3 may, for example, include a communication circuit for communicating with an external device via cable or radio. The instruction receiving unit 3 may, for example, receive a signal transmitted from an information processing device (e.g., a PC or a tablet device) connected to the test device 1 via a wired or wireless network via the communication circuit and instruct the other functional units to execute processing according to the received signal.

[0021] The instruction receiving unit 3 receives, for example, a first instruction A1 and a second instruction A2. The first instruction A1 and the second instruction A2 are input, for example, by the user operating the above-described operation button or touch screen, etc., or by means of the signal received via the communication circuit.

[0022] The first instruction A1, for example, is an instruction for outputting the demagnetization pulse. The first instruction A1 is linked, for example, to information 84 regarding output conditions of the demagnetization pulse (hereinafter also referred to as "demagnetization pulse information"). The demagnetization pulse information 84 includes, for example, a voltage command value Ee that specifies a size (amplitude) of the demagnetization pulse, and a specified output number Ne that specifies the number of times to output the demagnetization pulse. Note that the demagnetization pulse information 84 may be included in the first instruction A1.

[0023] The second instruction A2, for example, is an instruction that shows an execution of the analysis of the electrical characteristics of the winding 11 under test. The second instruction A2 is linked to information 87 regarding the measurement pulse as test conditions (hereinafter also referred to as "measurement pulse information"). The measurement pulse information 87 includes, for example, a voltage command value Em that specifies a size (amplitude) of the measurement pulse, and a specified output number Nm that specifies the number of times to output the measurement pulse during the test. The measurement pulse information 87 can be included in the second instruction A2.

[0024] When the instruction receiving unit 3 receives the measurement pulse information 87 (the voltage command value Em and the set output number Nm), it stores the measurement pulse information 87 in the storage unit 8. Further, when the instruction receiving unit 3 receives the demagnetization pulse information 84 (the voltage command value Ee and the set output number Ne), it stores the demagnetization pulse information 84 in the storage unit 8.

[0025] It should be noted that the measurement pulse information 87 does not necessarily have to be included in the second instruction A2. For example, it is sufficient if the measurement pulse information 87 is set in the test device 1 (storage unit 8) before the measurement pulse is output, inputted by the user into the instruction receiving unit 3 before the second instruction A2 is input, or pre-stored in the storage unit 8. Similarly, it is sufficient if the degaussing pulse information 84 is set in the test device 1 before the degaussing pulse is output, inputted by the user into the instruction receiving unit 3 before the first instruction A1 is input, or pre-stored in the storage unit 8.

[0026] It should be noted that when, in addition to the above-described demagnetization pulse information 84 and measurement pulse information 87, information about a sampling frequency and the like described later are input as measurement conditions, the instruction receiving unit 3 may store them in the storage unit 8.

[0027] The voltage measuring unit 4 is a functional unit that measures a voltage V between the external terminal T1 and the external terminal T2 (voltage between terminals). The voltage measuring unit 4 stores a measured value (voltage measured value) 81 of the voltage V in the storage unit 8.

[0028] Specifically, the voltage measuring unit 4 acquires the measured value of the voltage V by sampling the voltage V at a predetermined sampling period. The voltage measuring unit 4 is configured, for example, to include a resistor voltage divider circuit for voltage dividing the voltage V between the external terminal T1 and the external terminal T2, and an A / D conversion circuit for converting the voltage divided by the resistor voltage divider circuit into a digital signal with a predetermined sampling period. For example, by sampling the voltage V at a predetermined sampling period, the voltage measuring unit 4 acquires time series data of the measured value (sampling data) of the voltage V to store it as the voltage measurement value 81 in the storage unit 8.It should be noted that the sampling period can be set, for example, by operation of the instruction receiving unit 3 by the user or also via the instruction receiving unit 3 from an external device.

[0029] The correction coefficient calculation unit 5 is a functional unit that calculates the correction coefficient C.

[0030] The correction coefficient C is a parameter for correcting the voltage command value so that the voltage output between the external terminals T1 and T2 has a desired value.

[0031] The correction coefficient C is stored as correction coefficient information 82 in the storage unit 8. For example, an initial value of the correction coefficient (correction coefficient C0) is prestored as correction coefficient information 82. The correction coefficient calculation unit 5 updates the correction coefficient C in the correction coefficient information 82 each time it calculates the correction coefficient C. Note that the correction coefficient C0 (initial value) can be set by the user operating the instruction receiving unit 3 or by an external device via the instruction receiving unit 3. For example, in the present embodiment, it is assumed that the correction coefficient C0 is prestored in the storage unit 8 and the correction coefficient C0 is equal to 1.000.It should be noted that a method for calculating (updating) the correction coefficient C by means of the correction coefficient calculating unit 5 will be described later.

[0032] The analysis result generation unit 6 is a functional unit that generates an analysis result of the electrical characteristics of the winding 11 under test based on the voltage V measured by the voltage measurement unit 4. As an analysis of the electrical characteristics of the winding 11 under test, the analysis result generation unit 6 calculates, according to a known analysis method, for example, at least one value of the equivalent inductance, the equivalent capacitance, or the equivalent resistance, which are parameters related to the winding 11, based on the transient response characteristics of the voltage V between the external terminals T1 and T2 when the voltage (pulse voltage) is applied to the winding 11 connected between the external terminals T1 and T2.

[0033] The output unit 7 is a functional unit that outputs information for setting test conditions or information about an analysis result, etc. The output unit 7 is implemented, for example, by a display device such as a liquid crystal display. The display device can display information for setting test conditions or information about an analysis result, etc., on the screen. The display device can further display the transient response characteristics of the voltage measured by the voltage measuring unit 4 in the form of a graph on the screen.

[0034] It should be noted that the output unit 7 may, for example, in addition to (or instead of) the display device described above, comprise a communication circuit for transmitting data such as an analysis result via cable or radio to an external information processing device or a circuit for writing data such as an analysis result to a storage device (e.g., a memory card) connected to the test device 1, and the like.

[0035] The storage unit 8 is a functional unit for storing programs and various parameters that contribute to the function of the test device 1 as a pulse winding test device, or an analysis result of the winding 11 under test, and the like. For example, the voltage measurement value 81, the correction coefficient information 82, an analysis result 83, the demagnetization pulse information 84, the measurement pulse information 87, and the like, which have been described above, are stored in the storage unit 8.

[0036] The correction coefficient calculation unit 5, the analysis result generation unit 6, and the storage unit 8 described above are implemented, for example, by a program processing device. In a program processing device (e.g., a microcontroller) having a configuration in which a processor such as a CPU, various storage devices such as RAM and ROM, and peripheral circuits such asa counter (timer), an A / D conversion circuit, a D / A conversion circuit, a clock generation circuit, and an input / output interface circuit, are connected to each other via a bus or dedicated lines, the processor specifically performs various arithmetic operations according to a program stored in a memory and controls the above-mentioned peripheral circuits based on the processing result, thereby realizing the correction coefficient calculation unit 5, the analysis result generation unit 6, and the storage unit 8.

[0037] It should be noted that some of the functional units constituting the test device 1 may be implemented by an external information processing device (e.g., a PC, a portable terminal such as a tablet device, or a server) that can communicate with the test device 1. For example, by transmitting the voltage measurement value 81 and the like to the external information processing device, the analysis result generation unit 6 may be implemented by this information processing device.

[0038] The configuration of the voltage generation circuit 2 is described here.

[0039] Fig. 2 is a diagram showing an example of a configuration of the voltage generating circuit 2.

[0040] As in Fig. 2, the voltage generating circuit 2 includes, for example, a switch SW, a pulse voltage applying capacitor Cs, a current limiting resistor Rs, a rectifying element D, and an output control unit 20.

[0041] The pulse voltage application capacitor Cs is a capacitor that stores a charge to generate a pulse voltage. One end of the pulse voltage application capacitor Cs is connected to the external terminal T2.

[0042] The switch SW is a component for switching between the output and non-output of the pulse voltage. The switch SW is implemented, for example, by a semiconductor element such as a power transistor or a thyristor. The switch SW is connected between the other end of the pulse voltage application capacitor Cs and the external terminal T1.

[0043] The current-limiting resistor Rs is an element for limiting the current flowing from the external terminal T1 to the winding 11 under test when the pulse voltage application capacitor Cs is discharged. The current-limiting resistor Rs is connected in series with the switch SW between the other end of the pulse voltage application capacitor Cs and the external terminal T1.

[0044] The rectifier element D is an element that allows current to flow from the pulse voltage application capacitor Cs side to the external terminal T1 side and blocks current from the external terminal T1 side to the pulse voltage application capacitor Cs side. The rectifier element D is, for example, a diode. Note that in the following description, the rectifier element D is also referred to as a "backflow prevention diode D."

[0045] Between the other end of the pulse voltage application capacitor Cs and the external terminal T1, the backflow prevention diode D is connected in series with the switch SW and the current-limiting resistor Rs. For example, the anode electrode of the backflow prevention diode D is connected to one end of the current-limiting resistor Rs, and the cathode electrode of the backflow prevention diode D is connected to the external terminal T1.

[0046] The output control unit 20 is a functional unit that controls the charging and discharging of the pulse voltage application capacitor Cs according to an instruction transmitted from the instruction receiving unit 3. The output control unit 20 is implemented, for example, by the program processing device (microcontroller) described above.

[0047] According to an instruction transmitted from the instruction receiving unit 3, the output control unit 20 controls a charging voltage of the pulse voltage application capacitor Cs and the switch SW based on the demagnetization pulse information 84 and the measurement pulse information 87 to generate the voltage V between the external terminals T1 and T2. In a state where the switch SW is open, the output control unit 20 charges the pulse voltage application capacitor Cs using, for example, a DC power source (not shown) until a desired voltage is reached, and then, by closing the switch SW, the voltage V is generated between the external terminals T1 and T2.

[0048] As described above, variations in the characteristics, etc., of the winding 11 under test may cause the voltage V applied to the winding 11 from the external terminals T1 and T2 to fluctuate. That is, if the voltage command value is set to "Em," the pulse voltage application capacitor Cs is charged such that the voltage of the pulse voltage application capacitor Cs is set to "Em," and the pulse voltage application capacitor Cs is discharged through the switch SW, the voltage V applied to the winding 11 from the external terminals T1 and T2 may differ from "Em" (V ≠ Em). In addition, the voltage V may have a different value for each winding 11 under test due to variations in the characteristics, etc.

[0049] The output control unit 20 therefore corrects the voltage command value Em using the correction coefficient C calculated so that the voltage V applied from the external terminals T1 and T2 to the winding 11 has a desired value, and charges the pulse voltage application capacitor Cs so that the voltage of the pulse voltage application capacitor Cs has a value obtained by correcting the voltage command value Em using the correction coefficient C. Then, by discharging the pulse voltage application capacitor Cs through the switch SW, the output control unit 20 applies the voltage V having a desired value to the winding 11.

[0050] Next, the method for calculating the correction coefficient C using the test device 1 is described.

[0051] As described above, the correction coefficient C is a parameter for correcting the voltage command value so that the voltage output between the external terminals T1 and T2 has a desired value. The correction coefficient C is calculated and updated by the correction coefficient calculation unit 5.

[0052] When the instruction receiving unit 3 receives a predetermined instruction, the voltage generation circuit 2 generates and outputs a voltage (adjustment voltage) Et corresponding to a value obtained by correcting the voltage command value associated with the predetermined instruction using the correction coefficient C. The correction coefficient calculation unit 5 updates the correction coefficient C such that the deviation between the voltage V measured by the voltage measuring unit 4 and the voltage command value associated with the predetermined instruction is small.

[0053] The predetermined instruction is, for example, the above-described first instruction A1 (command to output the demagnetization pulse) or second instruction A2 (command to perform the analysis of the electrical characteristics of the winding 11). In the present embodiment, the description is made assuming, for example, that the predetermined instruction is the first instruction A1.

[0054] Specifically, when the instruction receiving unit 3 receives the first instruction, the voltage generation circuit 2 generates and outputs a voltage based on the voltage command value associated with the first instruction A1, namely, the voltage command value Ee included in the demagnetization pulse information 84. Next, the correction coefficient calculation unit 5 calculates the correction coefficient C such that the deviation between the voltage measured by the voltage measuring unit 4 and the voltage command value Ee associated with the first instruction A1 is small.

[0055] It is also possible for the correction coefficient calculation unit 5 to calculate the correction coefficient C based on the relationship between the voltage V measured by the voltage measurement unit 4 and the voltage command value (Ee) associated with the predetermined instruction. For example, if the correction coefficient before the update is Cn-1 and the correction coefficient after the update is Cn, the correction coefficient calculation unit 5 can calculate (update) the correction coefficient Cn using the following formula (1). formula 1 Cn=Ee÷V×Cn−1

[0056] Furthermore, it is also possible for the correction coefficient calculation unit 5 to update the correction coefficient C for each output of a pulse. Specifically, when the instruction receiving unit 3 receives a predetermined instruction, the voltage generation circuit 2 may output a pulse having a voltage corresponding to a value obtained by correcting the voltage command value associated with the predetermined instruction using the correction coefficient a predetermined number of times, and the correction coefficient calculation unit 5 may update the correction coefficient C for each output of the pulse.

[0057] For example, when the instruction receiving unit 3 receives the first instruction A1, the voltage generation circuit 2 outputs the demagnetization pulse having a voltage (Et = Ee × C) corresponding to a value obtained by correcting the voltage command value Ee of the demagnetization pulse using the correction coefficient C, a predetermined number of times (predetermined output number) Ne. The correction coefficient calculation unit 5 can update the correction coefficient Cn based on the voltage V measured for each output of the demagnetization pulse, the voltage command value Ee, and the immediately preceding correction coefficient Cn-1.

[0058] The procedure for calculating the correction coefficient C is described below.

[0059] Fig. 3 is a timing chart resulting when the demagnetization pulse and the measuring pulse are output from the voltage generating circuit 2.

[0060] In Fig. 3 are from the top side of the Fig. 3, temporal changes of the application timing and magnitude of the demagnetization pulse and measurement pulse outputted from the voltage generating circuit 2, the voltage between the external terminals T1 and T2, the correction coefficient, and the operation mode of the test device 1 are shown in sequence.

[0061] As an operating mode, the test device 1 has, for example, a "wait mode (wait state)" for waiting for an instruction to be input to the test device 1, a "demagnetization mode," and a "test mode." In the demagnetization mode, the test device 1 outputs the demagnetization pulse to suppress fluctuations in the magnetization of the winding 11 under test and calculate (update) the correction coefficient C. In the test mode, the test device 1 outputs the measurement pulse to analyze the electrical characteristics of the winding 11 under test.

[0062] Fig. 4 is a flowchart showing a process flow using the test device 1 in the demagnetization mode.

[0063] For example, if at time t0 in Fig. 3, the test device 1 is supplied with power, the test device 1 is placed in "wait mode." In the wait mode, the test device 1 determines whether the instruction receiving unit 3 has received the first instruction A1 or not (step S1). If the instruction receiving unit 3 has not received the first instruction A1 (step S1: No), the test device 1 maintains the wait mode.

[0064] For example, if at time t1 in Fig. 3 the instruction receiving unit 3 has received the first instruction A1 (step S1: Yes), the test device 1 is put into the demagnetization mode (step S2).

[0065] In the demagnetization mode, the test device 1 sets the conditions of the demagnetization pulse (step S3). Specifically, the output control unit 20 of the voltage generation circuit 2 reads the voltage command value Ee and the set output number Ne of the demagnetization pulse, which correspond to the demagnetization pulse information 84 stored in the storage unit 8, and the correction coefficient C contained in the correction coefficient information 82. Here, it is assumed that the voltage command value Ee is 1000 V, the set output number Ne is 2, and the correction coefficient C is C0 (initial value) = 1,000.

[0066] Next, the output control unit 20 determines the setting voltage Et of the demagnetization pulse to be output next based on the voltage command value Ee and the correction coefficient C (step S4). For example, the output control unit 20 sets the setting voltage Et of the demagnetization pulse to a value resulting from multiplying the voltage command value Ee by the correction coefficient C0 (= Ee × C0 = 1000 V).

[0067] Next, the output control unit 20 charges the pulse voltage application capacitor Cs by means of a DC power source (not shown) so that the voltage of the pulse voltage application capacitor Cs is set to the setting voltage Et (= 1000 V) (step S5).

[0068] Next, the test device 1 outputs the first demagnetization pulse (step S6). At time t2 in Fig. 3, specifically, the output control unit 20 turns on the switch SW. This causes the charge stored on the pulse voltage application capacitor Cs to be discharged through the current-limiting resistor Rs and the backflow prevention diode D, thereby generating the demagnetization pulse with the voltage (amplitude) V between the external terminals T1 and T2. When the demagnetization pulse is output in step S6, the voltage measuring unit 4 begins measuring the voltage V between the external terminals T1 and T2 (step S7).

[0069] Next, the correction coefficient calculation unit 5 calculates the correction coefficient C (step 8). As shown in Fig. 3, the correction coefficient calculation unit 5 acquires the maximum value of the voltage V measured by the voltage measuring unit 4 between the external terminals T1 and T2 to calculate a new correction coefficient C based on the set voltage Et determined in step S4, the maximum value Vmax of the voltage V measured in step S7, and the immediately preceding correction coefficient C. For example, when Vmax is 920 V, the immediately preceding correction coefficient is C0 (initial value), and the correction coefficient after correction is C1, the correction coefficient calculation unit 5 calculates the correction coefficient C1 using the following formula (2) to store the correction coefficient C1 as correction coefficient information 82 in the storage unit 8. This updates the correction coefficient information 82 in the storage unit 8. Formula 2 C1=Ee÷Vmax×C0=1000÷920×1.000=1.087

[0070] Next, the test device 1 determines whether the output number of the demagnetization pulse has reached the specified output number Ne (step S9). If the output number of the demagnetization pulse has not reached the specified output number Ne (step S9: No), the test device 1 executes steps S4 to S9 again.

[0071] In the example described above, the demagnetization pulse has been output only once for the specified output number Ne = 2. Therefore, the test device 1 returns to step S4, and the output control unit 20 first determines the setting voltage Et of the demagnetization pulse to be output next (step S4). For example, the output control unit 20 sets the setting voltage Et of the demagnetization pulse to be output second to a value resulting from multiplying the voltage command value Ee by the updated correction coefficient C1 (= Ee × C = 1000 × 1.087 = 1087 V).

[0072] Next, the output control unit 20 charges the pulse voltage application capacitor Cs by means of a DC power source (not shown) so that the voltage of the pulse voltage application capacitor Cs is set to the setting voltage Et (= 1087 V) (step S5).

[0073] Next, the test device 1 outputs the second demagnetization pulse (= 1087 V) (step S6). At time t3 in Fig. 3, specifically, the output control unit 20 turns on the switch SW. This causes the charge stored on the pulse voltage application capacitor Cs to be discharged through the current-limiting resistor Rs and the backflow prevention diode D, thereby generating the demagnetization pulse with the voltage (amplitude) V between the external terminals T1 and T2. When the second demagnetization pulse is output in step S6, the voltage measuring unit 4 begins measuring the voltage V between the external terminals T1 and T2 (step S7).

[0074] Next, the correction coefficient calculation unit 5 calculates (updates) the correction coefficient (step 8). As shown in Fig. 3, the correction coefficient calculation unit 5 acquires the maximum value of the voltage V measured by the voltage measuring unit 4 between the external terminals T1 and T2 to update the correction coefficient C based on the set voltage Et determined in step S4, the maximum value Vmax of the voltage V measured in step S7, and the immediately preceding correction coefficient C. For example, when the maximum value Vmax of the voltage V measured from time t3 is 1007 V, the immediately preceding correction coefficient is C1 (= 1.087), and the correction coefficient after correction is C2, the correction coefficient calculation unit 5 calculates the correction coefficient C2 using the following formula (3) to store the correction coefficient C2 as correction coefficient information 82 in the storage unit 8. This updates the correction coefficient information in the storage unit 8. Formula 3 C2=Ee÷Vmax×C1=1000÷1007×1.087=1.079

[0075] Next, the test device 1 determines whether the output count of the demagnetization pulse has reached the specified output count Ne (step S9). In the example described above, the output count of the demagnetization pulse (= 2) has reached the specified output count Ne (= 2) (step S9: Yes), so the test device 1 terminates the process of updating the correction coefficient C (step S10). After that, the test device 1 switches from the demagnetization mode to the standby mode, for example.

[0076] The above-described process makes it possible to calculate the correction coefficient C for applying a desired voltage to the winding 11 under test. Note that in the above-described example, the case where the set output number Ne of the demagnetization pulse (update number of the correction coefficient) is set to "2" is exemplified, but it is not limited to this, and it is sufficient if the set output number Ne is 1 or more.

[0077] Next, a process using test device 1 in test mode is described.

[0078] When an analysis of the electrical characteristics of the winding 11 to be tested is performed, the voltage generation circuit 2 generates and outputs a voltage corresponding to a value obtained by correcting the voltage command value associated with the analysis of the electrical characteristics of the winding 11 to be tested using the correction coefficient C, and the analysis result generation unit 6 also generates the analysis result 83 based on the voltage measured by the voltage measurement unit 4.

[0079] The voltage command value associated with the analysis of the electrical properties of the winding 11 to be tested is, for example, the voltage command value Em of the measurement pulse information 87.

[0080] For example, after calculating the correction coefficient, when the instruction receiving unit 3 receives the second instruction A2 for instructing the execution of the analysis of the electrical characteristics of the winding 11 to be tested, the voltage generating circuit 2 generates and outputs a voltage corresponding to a value obtained by correcting the voltage command value Em associated with the second instruction A2 by means of the correction coefficient C, and the analysis result generating unit 6 also generates the analysis result 83 based on the voltage measured by the voltage measuring unit 4.

[0081] Fig. 5 is a flowchart showing a process flow using the test device 1 in the test mode.

[0082] In the following description, it is assumed that before executing the process in test mode, the process described above for updating the correction coefficient C (in Fig. 4) is executed and the correction coefficient C2 (= 1.079) is stored as correction coefficient information 82 in the storage unit 8.

[0083] For example, in the wait mode, the test device 1 determines whether the instruction receiving unit 3 has received the second instruction A2 or not (step S11). If the instruction receiving unit 3 has not received the second instruction A2 (step S11: No), the test device 1 maintains the wait mode.

[0084] For example, if at time t4 in Fig. 3 the instruction receiving unit 3 has received the second instruction A2 (step S11: Yes), the test device 1 is put into the test mode (step S12).

[0085] In the test mode, the test device 1 sets the measurement pulse conditions (step S3). Specifically, the output control unit 20 reads the voltage command value Em and the specified output number Nm, which represent the measurement pulse information 87 stored in the storage unit 8, and the correction coefficient C2 contained in the correction coefficient information 82. Here, it is assumed that the voltage command value Em is 1000 V, the specified output number Ne is 1, and the correction coefficient C2 is 1.079.

[0086] Next, the output control unit 20 determines the setting voltage Et of the next measurement pulse to be output based on the voltage command value Em and the correction coefficient C2 (step S14). For example, the output control unit 20 sets the setting voltage Et to be set for the pulse voltage application capacitor Cs to a value resulting from multiplying the voltage command value Em by the correction coefficient C2 (= Em × C2 = 1079 V).

[0087] Next, the output control unit 20 charges the pulse voltage application capacitor Cs by means of a DC power source (not shown) so that the voltage of the pulse voltage application capacitor Cs is set to the setting voltage Et (= 1079 V) (step S15).

[0088] Next, the test device 1 outputs the measuring pulse (= 1079 V) (step S16). At time t5 in Fig.3, specifically, the output control unit 20 turns on the switch SW. This causes the charge stored on the pulse voltage application capacitor Cs to be discharged through the current-limiting resistor Rs and the backflow prevention diode D, thereby generating the measurement pulse with the voltage (amplitude) V between the external terminals T1 and T2. When the measurement pulse is output in step S16, the voltage measurement unit 4 starts measuring the voltage V between the external terminals T1 and T2 to store the measurement result of the voltage V as the voltage measurement value 81 in the storage unit 8 (step S17). At this time, the setting voltage Et of the pulse voltage application capacitor Cs is adjusted using the correction coefficient C2 (Et = 1079 V), which is why the maximum value of the voltage V is approximately 1000 V.

[0089] Next, the test device 1 determines whether the output number of the measuring pulse has reached the specified output number Nm (step S18). If the output number of the measuring pulse has not reached the specified output number Nm (step S18: No), the test device 1 executes steps S14 to S18 again.

[0090] In the example described above, the output number of the measurement pulse (= 1) has reached the specified output number Nm (= 1) (step S18: Yes), so the test device 1 executes the process for analyzing the electrical properties of the winding 11 under test (step S19). Specifically, the analysis result generation unit 6 calculates various parameters of the winding 11 according to the method described above using the voltage measurement value 81 measured in step S17 to store them as analysis results 83 in the storage unit 8. The output unit 7 displays, for example, information corresponding to the analysis results 83 of the winding 11 on the screen of the display device. After that, the test device 1 is switched from the test mode to the standby mode, for example.

[0091] In the above-described test device 1 according to the embodiment, when the instruction receiving unit 3 receives a predetermined instruction (e.g., the first instruction A1), the voltage generating circuit 2 generates and outputs a voltage (setting voltage Et = Ee × C) corresponding to a value obtained by correcting the voltage command value (e.g., the voltage command value Ee) associated with the predetermined instruction using the correction coefficient C, and the correction coefficient calculating unit 5 also updates the correction coefficient C such that the deviation between the voltage V measured by the voltage measuring unit 4 and the voltage command value (Ee) associated with the predetermined instruction is small.When an analysis of the electrical characteristics of the winding 11 is performed, the voltage generation circuit 2 generates and outputs a voltage (adjustment voltage Et = Em × C) corresponding to a value obtained by correcting the voltage command value associated with the analysis of the electrical characteristics of the winding 11 (e.g., the voltage command value Em) using the correction coefficient C, and the analysis result generation unit 6 also generates the analysis result 83 based on the voltage V measured by the voltage measurement unit 4 at that time.

[0092] Accordingly, the correction coefficient C can be adjusted so that the voltage applied to the winding 11 under test has a desired magnitude, and the voltage of the measuring pulse to be applied to the winding 11 under test can be determined based on the adjusted correction coefficient C, whereby a fluctuation of the voltage applied to the winding 11 under test due to the characteristics, etc., of the winding 11 under test can be suppressed.

[0093] It is also possible that, in the test device 1, when the instruction receiving unit 3 receives a predetermined instruction, the voltage generating circuit 2 outputs a pulse having a voltage corresponding to a value obtained by correcting the voltage command value associated with the predetermined instruction by means of the correction coefficient for a predetermined number of times, and the correction coefficient calculating unit 5 updates the correction coefficient for each output of the pulse.

[0094] Therefore, the higher the output number of the pulse (e.g., the demagnetization pulse) applied to the winding 11 under test before performing the test, the higher the update number of the correction coefficient C, so that the precision of the correction coefficient C can be improved and fluctuations in the voltage applied to the winding 11 under test can be further suppressed. Furthermore, the output number of the demagnetization pulse can be set depending on the precision required for the voltage applied to the winding 11 under test, thereby realizing a user-friendly test device 1 to meet various user needs.

[0095] The predetermined instruction may also be the first instruction A1, which is an instruction to output the demagnetization pulse. Therefore, it is not necessary to newly provide an operation button, etc., or a command, etc., for updating the correction coefficient C. Furthermore, simply by instructing the demagnetization pulse while operating the test device 1, the suppression of fluctuations in the magnetization state of the winding 11 and the updating of the correction coefficient C are performed, thereby suppressing an increase in the analysis time by executing the updating of the correction coefficient C.

[0096] It is also possible that, in the test device 1, when the instruction receiving unit 3 receives the second instruction A2 for performing the analysis of the electrical characteristics of the winding 11 to be tested, the voltage generating circuit 2 generates and outputs a voltage corresponding to a value obtained by correcting the voltage command value Em associated with the second instruction A2 by means of the correction coefficient C, and further, the analysis result generating unit 6 generates the analysis result S3 based on the voltage measured by the voltage measuring unit 4.

[0097] Accordingly, the correction coefficient calculation process and the winding analysis process are executed according to the independent first instruction A1 and second instruction A2, whereby the user of the test device 1 can execute the correction coefficient update and the winding analysis separately at a desired time.

[0098] In the test device 1, it is also possible for the correction coefficient calculation unit 5 to update the correction coefficient C based on the relationship between the voltage V measured by the voltage measurement unit 4 and the voltage command value (Ee) associated with the predetermined instruction. For example, the correction coefficient calculation unit 5 can update the correction coefficient Cn using the above-mentioned formula (1).

[0099] Accordingly, the correction coefficient can be updated with a simpler calculation, whereby an increase in the computational load of the test device 1 (program processing device) can be suppressed by integrating a voltage correction function into the test device 1.

[0100] In the test device 1, it is further preferable that the voltage command value associated with the predetermined instruction A1 matches the voltage command value associated with the analysis of the electrical properties of the winding 11 under test. For example, it is preferable that the voltage command value Ee of the demagnetization pulse matches the voltage command value Em of the measurement pulse (Ee = Em). Accordingly, the correction coefficient is adjusted according to the voltage to be applied to the winding 11 during the analysis, which can further improve the precision of the voltage of the measurement pulse. <<Erweiterung der Ausführungsform> >

[0101] Above, the invention made by the inventors of the present application has been specifically described using one embodiment. However, it should be understood that the present invention is not limited to this specific embodiment, and various modifications are possible without departing from the scope of the invention.

[0102] For example, in the above-described embodiment, the case where a predetermined instruction serving as a start trigger for the correction coefficient calculation process is the first instruction A1 (an instruction to output the demagnetization pulse) is exemplified, but this is not limited to this. For example, an instruction different from the instruction to output the demagnetization pulse (e.g., an instruction to calculate the correction coefficient) is also possible. In this case, a user interface such as an operation button or a command for the above instruction may be newly provided in the test device 1.

[0103] In the above-described embodiment, the case where the predetermined instruction serving as a start trigger for the correction coefficient calculation process is the first instruction A1 is executable, that is, the test device 1 executes the calculation (update) of the correction coefficient when the first instruction A1 is input to the test device 1, but this is not limited to this. For example, when the second instruction A2 is input to the test device 1, the test device 1 can continuously execute the correction coefficient calculation process C and the winding analysis process 11 according to the input of the second instruction A2.

[0104] Specifically, the predetermined instruction is the second instruction A2 (an instruction for performing the analysis of the electrical characteristics of the winding 11 under test). Specifically, when the instruction receiving unit 3 receives the second instruction A2, the voltage generation circuit 2 generates and outputs a voltage based on the voltage command value Em associated with the second instruction A2, and the correction coefficient calculation unit 5 calculates the correction coefficient C such that the deviation between the voltage measured by the voltage measuring unit 4 and the voltage command value Em associated with the second instruction A2 is small.Then, after calculating the correction coefficient C, the voltage generation circuit 2 generates and outputs a voltage corresponding to a value obtained by correcting the voltage command value Em by means of the correction coefficient C, and the analysis result generation unit 6 also generates the analysis result 83 based on the voltage measured by the voltage measurement unit 4.

[0105] Therefore, only by inputting an instruction to execute the analysis of the electrical characteristics of the winding 11 (the second instruction A2) by the user, the calculation of the correction coefficient C and the analysis of the electrical characteristics of the winding 11 using the correction coefficient C are continuously executed, therefore the user does not need to input the instruction to output the demagnetization pulse (first instruction A1) in advance.

[0106] In this case, the voltage generation circuit 2 may use the measurement pulse information 87 as the demagnetization pulse information 84. For example, the voltage generation circuit 2 may set the voltage command value Ee of the demagnetization pulse to the same value as the voltage command value Em of the measurement pulse information 87 to output the demagnetization pulse. It is also possible for the voltage generation circuit 2 to also set the predetermined output number Ne of the demagnetization pulse to the same value as the predetermined output number Nm of the measurement pulse to output the demagnetization pulse. Alternatively, the demagnetization pulse information 84 may be preset in the storage unit 8. Therefore, it is sufficient for the user to only set the measurement pulse information 87, and it is not necessary to set the demagnetization pulse information 84.

[0107] In the above-described embodiment, the case where the test device 1, when outputting a plurality of demagnetization pulses, performs the update of the correction coefficient C for each output of the demagnetization pulse is exemplified, but this is not limited to this. That is, according to the above-described method, the correction coefficient calculation unit 5 can calculate the correction coefficient C based on the measured value of the voltage V generated when at least one of the plurality of demagnetization pulses is applied to the winding 11.

[0108] For example, the correction coefficient calculation unit 5 can calculate the correction coefficient Cn based on the measured value of the voltage V generated when the first demagnetization pulse is applied to the winding 11 and the correction coefficient Cn-1, or the correction coefficient Cn based on the measured value of the voltage V generated when the last demagnetization pulse is applied to the winding 11 and the correction coefficient Cn-1. Alternatively, if the demagnetization pulse is output Ne times, the correction coefficient calculation unit 5 can calculate the correction coefficient C based on each of the first n (<Ne) demagnetization pulses output, or the correction coefficient C based on each of the last n demagnetization pulses output.This means that the output number of the demagnetization pulse (fixed output number Ne) does not necessarily have to match the update number of the correction coefficient.

[0109] For example, in the embodiment described above, the case where the voltage command value Ee of the first demagnetization pulse is set to 1000 V so that the voltage applied to the winding 11 during the test is 1000 V is exemplified, but this is not limited to this. For example, a voltage command value required to apply 1000 V to a defect-free winding 11 is measured in advance, and this voltage command value may be set as the voltage command value of the first demagnetization pulse. For example, if the voltage command value required to apply 1000 V to the winding 11 is 1090 V, the voltage command value Ee of the first demagnetization pulse may be "1090 V". Alternatively, the initial value C0 of the correction coefficient may be "1.090 (= 1090 V ÷ 1000 V)" to output the first demagnetization pulse.

[0110] In the above-described embodiment, the case where a demagnetization pulse is used as the pulse applied to the winding 11 for calculating the correction coefficient is exemplified, but the type of pulse is not limited thereto. For example, a pulse identical to the measurement pulse applied during the electrical characteristic analysis of the winding 11 under test may be applied to the winding 11 for calculating the correction coefficient. The output number of the pulse for calculating the correction coefficient and the output number of the measurement pulse (set output number Nm) may be the same or different.

[0111] Furthermore, if the correction coefficient C calculated by updating exceeds a predetermined range, the correction coefficient calculation unit 5 can limit the correction coefficient C to the upper limit or lower limit of the predetermined range, or the output unit 7 can output information indicating an abnormal condition (fault), and the voltage generation circuit 2 can also interrupt the output of the demagnetization pulse or the measurement pulse. Therefore, when an abnormality (e.g., a short-circuit fault or an open-circuit fault) occurs in the winding under test itself, the correction coefficient C can be prevented from being set to an abnormal value and an inappropriate voltage from the external terminals T1 and T2.

[0112] The above flowcharts show examples to illustrate the operation, but are not limited to these. This means that the steps shown in the flowchart figures represent specific examples and are not limited to this flow. For example, the order of some of the steps can be changed, other steps can be inserted between the steps, or some of the steps can be executed in parallel. List of reference symbols 1 test facility, 2 voltage generation circuit, 3 instruction receiving unit, 4 voltage measuring unit, 5 Correction coefficient calculation unit, 6 Analysis result generation unit, 7 Output unit, 8 storage unit, 81 voltage measurement, 82 Correction coefficient information, 83 Analysis result, 84 Demagnetization pulse information, 87 Measurement pulse information, A1 first instruction, A2 second instruction, Cs pulse voltage application capacitor, Rs current limiting resistor, D rectifier element (backflow prevention diode), T1 external connection (first external connection), T2 external connector (second external connector). QUOTES CONTAINED IN THE DESCRIPTION

[0000] This list of documents submitted by the applicant was generated automatically and is included solely for the convenience of the reader. This list is not part of the German patent or utility model application. The DPMA assumes no liability for any errors or omissions. Cited patent literature

[0000] JP 5405518 B2

[0003]

Claims

[1] Test facility comprising: a first external terminal to which one terminal of a winding to be tested is connected; and a second external terminal to which the other terminal of the winding to be tested is connected; an instruction receiving unit that receives an instruction; a correction coefficient calculation unit that calculates a correction coefficient; a voltage generation circuit that generates a voltage based on a voltage command value and the correction coefficient and outputs it between the first external terminal and the second external terminal; a voltage measuring unit that measures a voltage between the first external terminal and the second external terminal; and an analysis result generation unit that performs an analysis of the electrical properties of the winding to be tested based on the voltage measured by the voltage measuring unit and generates an analysis result, wherein, when the instruction receiving unit receives a predetermined instruction, the voltage generating circuit generates and outputs a voltage based on the voltage command value associated with the predetermined instruction, and further, the correction coefficient calculating unit calculates the correction coefficient such that the deviation between the voltage measured by the voltage measuring unit and the voltage command value associated with the predetermined instruction is small, and wherein, when the analysis is performed, the voltage generation circuit generates and outputs a voltage corresponding to a value obtained by correcting the voltage command value associated with the analysis by means of the correction coefficient, and further, the analysis result generation unit generates the analysis result based on the voltage measured by the voltage measurement unit. [2] The test device according to claim 1, wherein, when the instruction receiving unit receives the predetermined instruction, the voltage generating circuit outputs a pulse having a voltage corresponding to a value obtained by correcting the voltage command value associated with the predetermined instruction by means of the correction coefficient a predetermined number of times, and further, the correction coefficient calculating unit updates the correction coefficient for each output of the pulse. [3] The testing device according to claim 1, wherein the correction coefficient calculating unit calculates the correction coefficient based on the relationship between the voltage measured by the voltage measuring unit and the voltage command value associated with the predetermined instruction. [4] Test device according to claim 1, wherein the predetermined instruction is an instruction to output a demagnetization pulse which is a voltage for suppressing fluctuations in the magnetization of a core of a winding having the core, and wherein, after calculating the correction coefficient, when the instruction receiving unit receives an instruction to execute the analysis, the voltage generating circuit generates and outputs a voltage corresponding to a value obtained by correcting the voltage command value associated with the analysis by means of the correction coefficient, and further, the analysis result generating unit generates the analysis result based on the voltage measured by the voltage measuring unit. [5] Test device according to claim 1, wherein the predetermined instruction is an instruction to perform the analysis, and wherein, after calculating the correction coefficient, the voltage generation circuit generates and outputs a voltage corresponding to a value obtained by correcting the voltage command value associated with the measurement by means of the correction coefficient, and further, the analysis result generation unit generates the analysis result based on the voltage measured by the voltage measurement unit. [6] The test device according to claim 1, wherein the voltage command value associated with the predetermined instruction is the same as the voltage command value associated with the measurement. [7] A test method using a test device comprising a first external terminal to which one terminal of a winding to be tested is connected, and a second external terminal to which the other terminal of the winding to be tested is connected, an instruction receiving unit that receives an instruction, a correction coefficient calculating unit that calculates a correction coefficient, a voltage generating circuit that generates a voltage based on a set voltage command value and the correction coefficient and outputs it between the first external terminal and the second external terminal, a voltage measuring unit that measures a voltage between the first external terminal and the second external terminal, and an analysis result generating unit,which carries out an analysis of the electrical properties of the winding to be tested based on the voltage measured by the voltage measuring unit and generates an analysis result comprising: a first step in which the instruction receiving unit receives a predetermined instruction; a second step in which, after the first step, the voltage generating circuit generates and outputs a voltage corresponding to a value obtained by correcting the voltage command value associated with the predetermined instruction by means of the correction coefficient; a third step in which the voltage measuring unit measures a voltage between the first external terminal and the second external terminal when the voltage generating circuit outputs a voltage in the second step; a fourth step in which the correction coefficient calculation unit calculates the correction coefficient such that the deviation between the voltage measured in the third step and the voltage command value associated with the predetermined instruction is small; a fifth step in which the voltage generation circuit, when the analysis is carried out, generates and outputs a voltage corresponding to a value obtained by correcting the voltage command value associated with the analysis by means of the correction coefficient; a sixth step in which the voltage measuring unit measures a voltage between the first external terminal and the second external terminal when the voltage generating circuit outputs a voltage in the fifth step; and a seventh step in which the analysis result generation unit generates the analysis result based on the voltage measured in the sixth step.

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