SURFACE MEASUREMENT USING EXCITED FLUORESCENCE

DE502018015655D1Active Publication Date: 2025-04-10HEXAGON INNOVATION HUB GMBH
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Patent Information

Application Number
DE502018015655
Authority / Receiving Office
DE · DE
Patent Type
Patents
Current Assignee / Owner
Filing Date
2018-06-15
Publication Date
2025-04-10
Estimated Expiration
2038-06-15

AI Technical Summary

Technical Problem

Existing optical triangulation sensors face challenges in accurately measuring surfaces that are non-diffuse, reflective, or transparent, as they require specific conditions and result in reduced accuracy and longer measurement times.

Method used

A hybrid measuring device that utilizes both reflected measurement radiation and fluorescence radiation to generate distance information, allowing for more reliable and precise distance measurements by distinguishing between the different origins and properties of the radiation.

Benefits of technology

The hybrid approach enables more accurate and robust surface measurements, particularly on materials that are partially transparent or reflective, by combining reflection and fluorescence data to create a comprehensive point cloud representation of the object surface.

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Description

[0001] The invention relates to a measuring device and a method for measuring object surfaces based on a hybrid measuring technique utilizing a fluorescence effect.

[0002] In many technical applications, there is a need to measure objects with high accuracy or with regard to their composition. This is especially true in the manufacturing industry, where measuring and inspecting the surfaces of workpieces is of great importance, especially for quality control purposes.

[0003] For such applications, coordinate measuring machines are used, for example, which enable precise measurement of the geometry of an object's surface, typically with micrometer accuracy. Objects to be measured can be, for example, engine blocks, transmissions, and tools. Known coordinate measuring machines measure the surface by establishing mechanical contact and scanning the surface. Examples of these are gantry measuring machines, as described in DE 43 25 337 or DE 43 25 347. Another system is based on the use of an articulated arm, the measuring sensor arranged at the end of the multi-part arm that can be moved along the surface. Articulated arms of this type are described, for example, in US Pat. No. 5,402,582 or EP 1 474 650.

[0004] Coordinate surface measurement allows the detection of geometric deviations on the workpiece from the corresponding target values. This provides highly accurate information about manufacturing precision. It can therefore be determined whether the shape and dimensions of the produced part are within a specified tolerance and whether the component should be considered a good or scrap part.

[0005] In the state of the art, such coordinate measuring machines use a tactile sensor as a standard measuring sensor, for example, consisting of a ruby ​​sphere mounted on a measuring rod. The deflection of the tactile sensor—in the case of a coordinate measuring machine designed for three-dimensional measurements, in three mutually perpendicular directions X, Y, and Z—is determined during scanning via a switching element or displacement measuring element. Based on the switching point or displacement, the location of the contact and thus the surface coordinates are calculated.

[0006] Furthermore, approaches for non-contact measurement, particularly with optical sensors, are known. Using such an optical sensor, surface topographies can be measured very precisely using an emitted measuring light beam, particularly a laser beam. The resolution for measuring surface profiles with optical measuring sensors can be significantly higher than that with tactile measuring sensors. Optical sensors now introduced into metrology with coordinate measuring machines, for example, are based on irradiating laser light onto an object surface for interferometric measurements (EP 2 037 214). Methods based on white light interferometry (DE 10 2005 061 464) and chromatic confocal methods (FR 273 8343) have also been proposed.

[0007] WO 2016 / 127173 A1 relates to a triangulation sensor with additional surface information acquisition using fluorescence. US 2013 / 120712 A1 and DE 10 2016 105426 relate to laser processing systems, each of which provides a triangulation sensor for surface measurement. Rindra Rantoson: "Optimization of transparent objects digitization from visible fluorescence ultraviolet induced," Optical Engineering, 2012, concerns an approach for surface measurement of transparent objects using fluorescence.

[0008] An equally efficient approach for optical surface measurement relies on the use of an optical sensor whose measuring functionality is based on the principle of triangulation. For this purpose, measuring radiation is directed at the object to be measured and diffusely scattered by this object. Portions of the emitted measuring light are captured by a detector on the sensor after corresponding reflection from the object surface at a specific angle. A sensor on the detector can capture an image of the illumination created by the impact of the measuring radiation on the object surface (e.g., as an image). Based on the position of the imaged illumination in the image, a distance can be calculated from the known relative arrangement of the beam emitter and detector.

[0009] The measuring radiation can be emitted in the form of a line, and the image sensor can be designed as an area sensor to project the projected lines. This allows not only point-based distance information to be generated, but also a multitude of measured values ​​to be recorded.

[0010] Such a triangulation sensor can also be designed as a scanner. In this embodiment, the measuring beam can be guided in a scanning motion across the surface to be measured, either as a moving point or line, while corresponding distances are derived from the resulting reflections. The distance measurement data (e.g., Z coordinates) are then assigned to the respective lateral object positions (X and Y coordinates) according to the relative movement to the object surface. The result of this measurement can be a point cloud that can represent the measured object surface in terms of spatial extent and shape.

[0011] In general, one advantage of using a triangulation sensor is the comparatively high measuring speed and the simultaneous non-contact measurement.

[0012] A disadvantage of the measuring principle arises, for example, when measuring surfaces that do not reflect or only reflect diffusely to a limited extent. For example, if a reflective or transparent area of ​​an object is to be measured, the required reflection of at least a portion of the measuring radiation toward the detector may be missing, since diffuse scattering or reflection typically does not occur at the surface. In this case, a measurement can only be successful in a specific arrangement of the sensor relative to the surface, which is typically not the case.

[0013] In addition, diffuse scattering due to surface defects such as scratches or dust can dominate, which can greatly reduce the accuracy of the measurement.

[0014] A further disadvantage arises when measuring an object whose surface is diffusely reflective only in parts and reflective or transparent in others. Optically measuring such a surface requires very specific local boundary conditions. This is technically complex and results in a correspondingly long measurement time.

[0015] The above limitations make an optical (triangulation) sensor appear unsuitable for measuring numerous parts in the automotive or aircraft construction sectors.

[0016] It is therefore an object of the present invention to provide an improved measuring device for measuring the surface of an object, whereby the above disadvantages can be overcome or reduced.

[0017] It is a particular object of the present invention to provide a measuring device which provides increased robustness and reliability, in particular a broader field of application, with regard to surface measurement.

[0018] This object is achieved by implementing the characterizing features of the independent claims. Features that further develop the invention in an alternative or advantageous manner can be found in the dependent patent claims.

[0019] The invention is based on the idea of ​​using the effect of fluorescence and the resulting emitted fluorescence radiation, in addition to a typical triangulation measurement using reflected measuring radiation, e.g., laser radiation, to generate additional distance information using the fluorescence radiation. The fluorescence radiation is detected by a detector (e.g., a CCD or CMOS) arranged in a known manner relative to the beam source, so that fluorescence-based distance measurement data can also be derived using the principle of triangulation.

[0020] Plastic or glass-based materials, in particular, absorb light in the UV range or in the spectral range of violet or blue light, causing electrons in the material to temporarily assume a higher energy level before returning to their original level. Upon returning to the lower level, the absorbed energy is then released in the form of spontaneous emission of fluorescent light. The fluorescent light has a longer wavelength than the radiation used for excitation. Thus, radiation originating from transparent or reflective glass or plastic surfaces can be generated and captured using adapted detection.

[0021] For example, surfaces that are provided with a reflective or non-diffuse-reflective coating can be subjected to appropriate measurement.

[0022] Other examples include materials such as polymethyl methacrylate (PMMA, acrylic glass) or polyethylene terephthalate (PET), as well as glass-ceramic materials. Their absorption spectra are so pronounced that they exhibit a relatively high absorption capacity for electromagnetic radiation in the UV, violet, or blue spectral range, and upon absorption of corresponding radiation, fluorescence is induced or excited. The excitation of fluorescence is based on the nature of the organic compounds present in the materials.

[0023] As already indicated, radiation with a central wavelength in the blue or ultraviolet range between approximately 250 nm and 450 nm is preferably used to excite fluorescence.

[0024] In general, materials that have a sufficiently high absorption coefficient for the measurement wavelength used and a sufficiently high emission coefficient for fluorescence can be measured with such an embodiment.

[0025] The inventive approach also allows for differentiation of the detected radiation. This leads to significantly more reliable and accurate distance measurements due to the different origins and properties of the radiation emanating from the object. The reflected measuring light is reflected at the surface, making the reference point for a triangulation measurement a direct surface point on the object. However, the majority of the fluorescent light is generated within the object material, making it impossible to clearly assign a reference point for distance measurements to the surface. In addition, the spatial length profile of the measuring radiation (e.g., Gaussian profile) usually differs from that of the fluorescence radiation (a broader profile with decreasing intensity depending on the penetration depth of the measuring radiation into the material).

[0026] A distinction between the detected radiations is therefore advantageous for deriving accurate distance values.

[0027] The invention thus relates to a hybrid measuring device for measuring an object, wherein the measuring device comprises a distance measuring device. The distance measuring device has a beam emission unit configured to generate measuring radiation with a defined wavelength spectrum and a detector configured to detect the measuring radiation reflected, in particular diffusely, from the object surface, with at least one first sensor. The distance measuring device is further configured to generate distance measurement data, wherein reflection measurement data can be generated as first distance measurement data by emitting the measuring radiation and detecting the reflected measuring radiation according to the principle of triangulation.

[0028] The measuring radiation can be generated with a wavelength spectrum such that fluorescence can be generated and fluorescent light can be emitted through interaction of the measuring radiation with the object material. The excitability of the fluorescence generally also depends on the material of the object. To generate fluorescence, it is therefore particularly advisable to match the wavelength of the incoming measuring radiation to the object material. Preferably, the materials from which the object to be measured is made or constructed are at least partially known, and the measuring radiation used is selected accordingly. A spectrum of the fluorescent light and the wavelength spectrum of the measuring radiation are preferably different.

[0029] The detector is also designed to detect fluorescent light, meaning it is sensitive to light of the fluorescence wavelength. This allows fluorescence measurement data to be generated as a second distance measurement data based on the detection of the fluorescent light (using triangulation).

[0030] The sensor can be designed, for example, as a planar image sensor (CCD or CMOS). This allows distance information to be generated not just for one measuring point, but for multiple measuring points along the lines when the measuring radiation is projected as a line of light. This information can be derived from the position and path of the measuring radiation reflected from the object as a line captured by the sensor in an image.

[0031] The detector may comprise an optical assembly, in particular a lens, with one or more optical components (e.g., lens, aperture, etc.). The detector is designed, in particular, as a camera.

[0032] In one embodiment, a center wavelength of the wavelength spectrum can be selected from a range between 250 nm and 500 nm, in particular 450 nm. The wavelength of the measuring radiation is preferably in the visually blue range (around 450 nm). The measuring radiation is generated, for example, using a laser diode. Alternatively, the wavelength can be assigned to the UV range, for example, < 400 nm. These wavelengths can be used to generate fluorescence, particularly in polymer- or plastic-based materials, but also in glass.

[0033] The detector of the measuring device can have a first optical filter component, wherein the first optical filter component, in cooperation with the first sensor, provides a wavelength-dependent separation of reflected measuring radiation and fluorescent light. The filter can thus separate the two radiations emanating from the object. This is particularly advantageous if, upon irradiation of the measuring radiation, both a diffuse reflection of the radiation and fluorescence are excited, and distance measurement data can thus be generated using both approaches. In particular, the first optical filter component is designed as a spatially distributed multi-color filter, in particular an RGB filter. This can also be a component of the area sensor in the form of an RGB matrix.

[0034] The filter can be a composition of several spatially distributed pixel-level color filters that have different transmission spectra or can be realized with a color camera with Bayer pattern.

[0035] In one variant, the detector can have a second optical filter component, wherein the second optical filter component is designed as a two-part interchangeable filter with a first and a second filter region. The second optical filter component can be provided alternatively or in addition to the first optical filter component. The first filter region provides substantially exclusive transmittance with respect to the wavelength spectrum, in particular for the center wavelength of the wavelength spectrum. The second filter region provides transmittance with respect to a spectrum of the fluorescent light. The first and second filter regions can be positioned alternately, in particular sequentially, in a field of view of the first sensor. The light incident on the detector can thus be filtered as required such that either fluorescent radiation or only reflected measuring radiation strikes the sensor.The filter component can be operated manually or positioned automatically or in a controlled manner.

[0036] The beam emission unit can further comprise a first and a second beam source, and the measuring radiation can be generated as a composition, in particular a superposition, of the measuring radiation that can be generated with the first beam source and has the defined wavelength spectrum and a further measuring radiation that can be generated with the second beam source and has a further wavelength spectrum that differs from the defined wavelength spectrum.

[0037] In addition to the use of two beam sources, a single beam source can be provided, which, for example, emits measuring radiation with two different wavelengths.

[0038] This allows for a separation (with regard to wavelength) of fluorescence-exciting radiation from radiation to be reflected already at the emitter side. The detector can, for example, be designed to detect light of a measurement wavelength (e.g., using a suitable filter), whereby at this wavelength, fluorescence generation is not expected, but rather reflection. Alternatively, the detector can be designed to detect fluorescence, for example.

[0039] In this context, the distance measuring device can be configured to control the first and second beam sources in such a way that the measuring radiation with the defined wavelength spectrum and the measuring radiation with the wider wavelength spectrum (fluorescence radiation) can be emitted sequentially and alternately at specific intervals. The distance measuring device can also be configured to control the detector in such a way that a first detection and a second detection can be carried out sequentially and synchronized with the control of the first and second beam sources. As a result, the detector can be configured, for example, to detect both radiation phenomena (reflection and fluorescence), but detection can be synchronized with the respective emission such that only fluorescent light or reflected light is detected with an image capture, and a clear distinction between the detected radiations can be made.

[0040] The detector may have a second sensor and be configured such that the reflected measuring radiation can be detected by the first sensor and the fluorescent light by the second sensor, in particular wherein a filter unit is each assigned to the first and the second sensor and the respective filter unit is essentially exclusively permeable with respect to the reflected measuring radiation or the fluorescent light.

[0041] The detector may comprise a dichroic or dichromatic beam splitter, and the beam splitter may be configured for wavelength-dependent separation of the reflected measuring radiation from the fluorescent light.

[0042] In general, other types of beam splitters or filters are also conceivable, which, for example, work according to the principle of interference.

[0043] In one embodiment, the sensor has a first and a second, in particular spatially separated, detection zone, and the detector can be configured such that the reflected measurement radiation can be detected by interaction with the first detection zone and the fluorescent light by interaction with the second detection zone. For this purpose, the respective radiation components can be directed to the respective detection zones.

[0044] According to the invention, the measuring device can have a control and processing unit which is particularly designed to carry out a method described below.

[0045] According to the invention, the control and processing unit has a data fusion functionality configured such that, during its execution, the detection of the measuring radiation and the fluorescent light is continuously monitored, a respective intensity information for the respective detection of the measuring radiation and the fluorescent light is continuously derived and a point cloud representing the object surface is generated by selectively processing the reflection measurement data and the fluorescence measurement data based on the intensity information, in particular wherein those distance measurement data for a respective object point are processed for which a greater intensity is derived.

[0046] In this way, the database that provides the most accurate and complete image of the surface can be used for each captured area of ​​the object surface.

[0047] The control and processing unit can further comprise a switching functionality configured such that, when executed, the measuring radiation or the fluorescent light is continuously detected, corresponding reflection measurement data or fluorescence measurement data are generated, the detection of the measuring radiation or the fluorescent light is continuously monitored with respect to a signal intensity, the signal intensity is continuously compared with a defined threshold value, and a switchover between the detection of the measuring radiation and the detection of the fluorescent light takes place depending on the comparison.

[0048] If it is determined that no fluorescence signal can be detected, the system can be switched to reflectance measurement and vice versa.

[0049] The invention also relates to a hybrid measuring method for measuring an object comprising a material that fluorescently reflects a known wavelength range. The measuring method comprises at least generating and emitting a measuring radiation with a defined wavelength spectrum, scanningly illuminating an object region with the measuring radiation, detecting the measuring radiation reflected, in particular diffusely, from the object surface, and generating reflection measurement data as first distance measurement data based on the detection of the reflected measuring radiation according to the principle of triangulation.

[0050] During the measurement process, the measuring radiation is generated with a wavelength spectrum such that, during scanning illumination, fluorescence is excited by the interaction of the measuring radiation with the object material, and fluorescent light is emitted from the object. The fluorescent light is detected, and fluorescence measurement data is generated as a second distance measurement data based on the detection of the fluorescent light using the principle of triangulation.

[0051] In one embodiment, a reflection point cloud can be generated based on the reflection measurement data, and a fluorescence point cloud can be generated based on the fluorescence measurement data. A representation of the object surface can then be generated by combining the reflection point cloud and the fluorescence point cloud. Data fusion is thus feasible, resulting in the surface of a partially transparent object being completely imaged using optical, contactless measurement.

[0052] In particular, the reflection measurement data and the fluorescence measurement data can be analyzed location-dependently with regard to their respective characteristics, quality, or density with respect to the detection of the object area, whereby a segmentation of the object area can be performed based on the analysis. A combination of at least part of the reflection measurement data and at least part of the fluorescence measurement data can then be performed based on the segmentation.

[0053] The invention further relates to a computer program product, which is stored on a machine-readable medium or embodied by an electromagnetic wave, for controlling or executing at least the steps of detecting the reflected measurement radiation, generating reflection measurement data, detecting the fluorescent light, and generating fluorescence measurement data of an above-mentioned measurement method. The computer program product can be executed, in particular, on a control and processing unit of a hybrid measuring device.

[0054] The method and device according to the invention are described in more detail below using specific embodiments schematically illustrated in the drawings, purely by way of example, and further advantages of the invention are also discussed. In detail: Fig. 1 shows an embodiment of a measuring device according to the invention for measuring an object; Fig. 2 shows a further embodiment of a measuring device according to the invention for measuring an object; Fig. 3 shows a further embodiment of a measuring device according to the invention for measuring an object; Fig. 4 shows a further embodiment of a measuring device according to the invention for measuring an object; Fig. 5 shows a further embodiment of a measuring device according to the invention for measuring an object; Fig. 6 shows a further embodiment of a measuring device according to the invention for measuring an object; Fig. 7 shows an embodiment of a measuring strategy according to the invention with a hybrid triangulation scanner according to the invention; and Fig. 8 shows a model for a fluorescence intensity distribution for data evaluation.

[0055] Figure 1shows an embodiment of a measuring device 1 according to the invention for measuring an object 2. The measuring device 1 has a distance measuring unit 10, which is designed to generate measurement data by triangulation. The distance measuring unit 10, in turn, has a beam emission unit 11 and a detector 12. The beam emission unit 11 and the detector 12 are arranged in a known position and orientation relative to each other.

[0056] The beam emitter 11 is designed to emit measuring radiation 13, in particular laser radiation. The measuring radiation 13 can be used to provide specific illumination of the object 2. For example, the measuring radiation 13 can be generated in the form of a line, and a corresponding light line can be projected onto the object 2.

[0057] The measuring radiation 13 is generated here as blue laser radiation with a wavelength of 450 nm.

[0058] The object 2 to be measured comprises, at least in sections, material that can be excited to emit fluorescent light. The absorption spectrum of said object material is so pronounced that the fluorescence can be excited, in particular, by irradiation with electromagnetic radiation having a wavelength from a wavelength range of 250 nm to 500 nm, in particular 300 nm to 450 nm. Such fluorescence behavior applies to numerous plastic-like or plastic-based materials. The wavelength of the exciting measurement light should therefore preferably be selected from the ultraviolet or blue spectral range.

[0059] The measuring radiation 13 strikes the object and interacts with the object material. Depending on the respective measuring property of the currently irradiated object section, i.e., whether the object section is diffusely reflective or fluorescence is excited, or both effects occur simultaneously, a portion of the measuring radiation 13 is reflected as reflected radiation 14 toward the detector 12 and / or the measuring radiation 13 is (at least partially) absorbed, and fluorescent radiation 15 is emitted by the object. The fluorescent radiation 15 can also be detected by the detector 2.

[0060] In the measurement example shown, both the measurement radiation is diffusely reflected and fluorescence is excited. Thus, both reflected measurement radiation 14 and fluorescent light 15 can be detected by the detector 12. Both signals can be sampled and selectively detected using a multi-color filter 16, e.g., an RGB filter, placed in front of the sensor 17. Such a filter 16 provides wavelength-dependent signal separation. The fluorescent light has a longer wavelength than the (reflected) measurement radiation.

[0061] The measuring arrangement 1 thus allows the generation of distance measurement data from both directly reflected measuring radiation and based on emitted fluorescent light. If the measuring radiation falls on the object 2, for example, as a line, the detector 2 can detect a line on the object surface 2 in a wavelength spectrum corresponding to the emitted measuring radiation 13 and an (excited) line with a different wavelength spectrum. Based on the different spectral characteristics, the respective images on the sensor 17 can be assigned to the respective measuring principles (reflection and fluorescence).

[0062] Figure 2shows a further embodiment of a measuring device 1 according to the invention for measuring an object 2. The measuring device 1 has a first beam source 11a and a second beam source 11b. The first beam source 11a is designed to emit fluorescence-inducing measuring radiation 13a with a wavelength in the blue or ultraviolet spectral range, in particular as a laser diode. The second beam source 11b is designed to emit a second longer-wavelength measuring radiation 13b, e.g., in the red spectral range, in particular also as a laser diode.

[0063] The beam guidance for the respective emitted radiation can be designed such that both measuring beams 13a and 13b emit coaxially or parallel with respect to a common optical axis. Such a combination of beams can be provided, for example, by means of a partially transparent deflection element (e.g., a steel splitter). Both beam bundles thus impinge on the object surface, for example, in identical positions or with a defined parallel offset.

[0064] While the second measuring radiation 13b can be emitted for direct triangulation measurements by means of beam reflection, the first measuring radiation 13a is intended to induce possible fluorescence effects. In the example shown, both direct reflection of the second measuring radiation 13 and induction of fluorescence occur.

[0065] The radiation components emitted or reflected by the object 2 due to the illumination with both measuring radiations 13a and 13b thus result in a reflected part of the first measuring radiation 14a and the second measuring radiation 14b, as well as the fluorescence radiation 15 resulting from the interaction with the first measuring radiation 13a. These three components radiate through a viewing window into the measuring device 1 and strike the detector 12.

[0066] A filter element 16 with a permeability for radiation corresponding to the fluorescence spectrum and the spectrum of the second measurement radiation is provided. The wavelength of the second measurement radiation is preferably selected so that it lies within the expected fluorescence spectrum.

[0067] The sensor 17 is designed to detect corresponding radiation.

[0068] The first and second beam sources 11a and 11b can be controlled such that their measuring radiations 13a and 13b are emitted alternately and sequentially, i.e., only the first measuring radiation 13a or the second measuring radiation 13b is emitted at any one time. The detector 12, in turn, can be controlled such that—synchronized with the alternating emission of the two measuring radiations—two exposures of the sensor are detected alternately (sequentially). Thus, each detection of a sensor illumination can be assigned to either the reflection measurement or the fluorescence measurement.

[0069] The wavelength of the second measuring radiation 13b is such that fluorescence preferably does not occur when the object is illuminated with this radiation. In particular, a red laser line is generated by the second beam source 11b and a blue laser line is generated by the first beam source 11a.

[0070] Camera 12 can therefore capture light of both wavelengths, making directly reflected light and fluorescence measurable. This allows even surfaces that do not exhibit fluorescence, such as metallic surfaces, to be measured. The wavelength of beam source 11b is preferably not too close to the fluorescence-exciting wavelength.

[0071] The second beam source 11b thus provides in particular the emission of a second laser with a longer wavelength (relative to the first beam source 11a) so that a reflection (without fluorescence) that can be generated thereby can be measured with the same camera 12.

[0072] Figure 3 shows a further embodiment of a measuring device 1 according to the invention for measuring an object 2. The beam emission unit 11, the possible interactions with the object 2 and the emission of measuring light from the object 2 essentially correspond to the embodiment according to Figure 1 .

[0073] The embodiment differs with regard to the detection of the measuring radiations 14 and 15 containing the object information. The detector 12 has a single sensor 17 which is designed to detect light with a measuring radiation spectrum, in particular a central measuring radiation wavelength, and with a fluorescence spectrum, in particular a broader-band one.

[0074] To separate the respective signals, the detector 12 has a filter unit with two filter elements 16a and 16b. The filter elements 16a and 16b can be inserted alternately into the beam path or into the optical axis of the detector or sensor. The effect of the elements 16a and 16b in the detector can be interchanged multiple times. This can be done manually or controlled (automatically) by means of a mechanical actuator.

[0075] A sequential exchange of the filter elements can be carried out depending on the measurement method to be used (reflection or fluorescence).

[0076] For example, an object can initially be measured using the typical triangulation approach, utilizing a diffuse reflection of the measuring radiation at the object. If, during the course of the measurement, it is then determined that signals with low, insufficient intensity are being measured at the detector, or that an intensity level drops significantly (sharply and quickly), this can be an indication that a transparent or reflective object region has been reached. Furthermore, an operator of the measuring device can, for example, individually determine (by visual inspection of object 2) that a transparent region needs to be measured. In response to one of the above determinations, a change of the previously used filter 16a or 16b can then be initiated or carried out. Following the change, a corresponding measurement functionality of the device can also be changed, e.g. from reflection to fluorescence measurement.

[0077] A distinction between the received radiation, i.e., reflected and fluorescent radiation, is relevant for determining distance data based on the principle of triangulation. Reflected radiation is emitted by the object surface, while fluorescent radiation largely originates in deeper material layers, and this radiation origin must be taken into account for signal evaluation. Specific calibration parameters are stored for the evaluation of fluorescent light, allowing for precise determination of the object surface, even based on fluorescent light.

[0078] In addition, the differentiation of the signals is relevant for signal processing and evaluation because the spectrum of a reflected measuring radiation, especially when using a laser, is comparatively well-defined, whereas the spectrum when fluorescent light is generated deviates significantly from this.

[0079] In standard operation, i.e., using beam reflection, a symmetrical, thin laser line is typically projected, and an image of the lines is captured by the detector after reflection from the object. The intensity profile of the image of the lines is typically Gaussian. The position of the intensity maximum represents the relevant height coordinate on the object and can be determined using a Gaussian or parabolic approximation.

[0080] Distance determination using fluorescent light requires an analysis adapted to the fluorescence spectrum. An analysis based on determining an intensity maximum or centroid—as is typically done with classical reflection—can lead to inaccurate results, as the intensity distribution depends on the penetration depth of the fluorescence-stimulating radiation and thus on the location of the fluorescence origin. The centroid of intensity therefore does not correlate with the object surface, but is typically attributable to a deeper material layer.

[0081] Figure 8shows, by way of example, an intensity distribution 81 of fluorescence, such as can be recorded when measuring a fluorescently excitable object with a sensor 12 of the measuring device 1. The emitted fluorescent light is collected by the sensor or a specific camera chip. The intensity is plotted against the penetration depth 83 (here: measured in mm) of the radiation into the object material. The line 82 marks the coordinate of the material surface. As can be seen, the position of the intensity maximum or the intensity center does not correspond to a point on the object surface, but would indicate a coordinate inside the object. The evaluation of the measurement points recorded by means of fluorescence is therefore preferably carried out using this or a similar model. Figure 4 shows a further embodiment of a measuring device 1 according to the invention for measuring an object 2. The embodiment differs from that of Figure 3 detector side alone.

[0082] The detector 12 has two cameras 18a and 18b. Each of the cameras 18a and 18b, in turn, has a sensor, an optical assembly, and a filter element 16a and 16b, respectively. The filter elements 16a and 16b differ in their permeability to electromagnetic radiation.

[0083] The filter 16a is permeable to light of the measuring wavelength and thus also to its reflections 14. When using a laser beam source, this filter can be designed with a correspondingly narrowband to minimize or eliminate possible external radiation influences.

[0084] Filter 16b is designed to transmit generated fluorescent light 15. This filter 16b can be specifically tailored to the measurement of an object made of a specific material. That is, if the material properties of an object 2 and the associated excitable fluorescence behavior are known, filter 16b can be configured to be suitably transmissive. Typically, this filter has a broader transmittance range than filter 16a.

[0085] The respective camera sensor can be adjusted to detect reflected light or fluorescent light, e.g. it can be sensitive in a certain wavelength range.

[0086] The configuration thus provides for simultaneous derivation of fluorescence measurement data (using camera 18b) and reflection measurement data (using camera 18a).

[0087] Figure 5shows a further embodiment of a measuring device 1 according to the invention for measuring an object 2. The embodiment differs from that of Figure 4 regarding the structure of detector 12.

[0088] The detector 12 has two sensors 17a and 17b. Furthermore, the detector 12 has a beam splitter 19, in particular a dichroic or dichroic beam splitter. The beam splitter 19 provides a wavelength-selective separation of the reflected measurement radiation 14 incident on the detector 12 from the fluorescent light 15 incident thereon. The reflected measurement radiation 14 is directed onto the sensor 17b by the beam splitter 19. The fluorescent light 15 can (at least substantially) be transmitted through the beam splitter 19 and captured (as an image) by the sensor 17a. Alternatively, it is conceivable that the beam splitter is designed to transmit light only in the wavelength range of the measurement radiation.

[0089] With this arrangement, both a measurement based on emitted fluorescent light 15 and a measurement based on reflected measuring light 14 can be performed. Both measurement options can be operated separately, e.g., alternately, or in combination, e.g., simultaneously.

[0090] Figure 6 shows a further embodiment of a measuring device 1 according to the invention for measuring an at least partially transparent or reflective object 2. The embodiment differs from that of Figure 5 regarding the structure of detector 12.

[0091] The detector 12 comprises a single sensor 17 and a beam splitter 19. The signals (fluorescence 15 and reflection 14) are separated by the beam splitter 19. The respective separated signals are directed by deflection elements (e.g., mirrors) to the individual sensor 17, but to different detection areas of the sensor 17. Thus, both the fluorescence radiation 15 and the reflected radiation 14 can be imaged with the single sensor 17.

[0092] Due to the spatially separated signal acquisition, one sensor 17 can capture an image for each signal, i.e., a profile of the beam reflection or beam emission at the object. Based on the line profile in the image, the topography of object 2 can then be calculated point by point with respect to this line.

[0093] Figure 7shows an embodiment of a measurement strategy according to the invention with a hybrid triangulation scanner according to the invention, in particular according to a structure according to one of the Figures 1 to 6 .

[0094] A hybrid triangulation scanner is a measuring device that is designed to emit measuring radiation and detect reflected measuring radiation, as well as to emit fluorescence-stimulating radiation (this can be identical to the measuring radiation, particularly in terms of wavelength) and detect fluorescent light. Both the detection of the reflected measuring radiation and the detection of fluorescent light can generate respective distance measurement data, i.e., the distance to an object can be determined, for example.

[0095] The measuring radiation can be emitted in the form of a line. This allows measurement data to be derived from the entire line. Distances can be calculated from the shape (course) and position of the line in an image captured by the sensor, based on the known relative positioning of the radiation source and detector and a prior calibration of the sensor.

[0096] The line can be moved relative to the object across its surface, meaning the object can move relative to the scanner, the scanner can be moved relative to the object, or the scanner can have a deflection device that allows the lines to move. This allows the object's surface to be scanned.

[0097] To detect an object surface, a triangulation measurement is carried out by means of reflection of measuring radiation 50, whereby corresponding reflection image data 51 are generated.

[0098] On the other hand, to detect the object surface, a (further) triangulation measurement is carried out by inducing fluorescence 60 and detecting the resulting light, whereby corresponding fluorescence image data 61 are generated.

[0099] These two raw data sets (reflection image data 51, fluorescence image data 61) are processed together, and based on the overall processing, a (virtual) segmentation 70 of the object surface into reflective and fluorescent regions is performed, in particular automatically using a correspondingly implemented algorithm. For this purpose, for example, signal intensities can be averaged.

[0100] Corresponding masks 52 and 62 can be derived for the surface areas, each with reference to one of the measurement methods. Together with the raw data sets, both a reflection point cloud 53 (for a diffusely reflecting surface area) and a fluorescence point cloud 63 (for a transparent or reflective surface area) can be generated.

[0101] In a subsequent combination step 71, the point clouds 53 and 63 can be merged into a complete point cloud 72. This results in a point cloud 72 that represents both diffusely reflecting parts of the object surface and transparent or reflective parts of the surface, thus being able to represent the respective object as a whole.

[0102] In general, reflection measurement data can be embodied by the reflection image data 51 and / or the reflection point cloud 53. Fluorescence measurement data can correspondingly be embodied by the fluorescence image data 61 and / or the fluorescence point cloud 63.

[0103] It is understood that these figures only schematically depict possible embodiments. According to the invention, the various approaches can also be combined with each other, as well as with prior art triangulation measurement or fluorescence measurement methods.

Claims

1. Measuring device (1) for measuring an object (2), wherein the measuring device (1) comprises a distance measuring unit (10) having • a beam emission unit (11) configured for generating a measurement radiation (13, 13a, 13b) having a defined wavelength spectrum and • a detector (12) configured for detecting the measurement radiation (14, 14a, 14b) reflected, in particular diffusely reflected, on the object surface, having at least one first sensor (17, 17a, 17b), wherein the distance measuring unit (10) is designed for generating first and second distance measured data and reflection measured data as the first distance measured data by means of emission of the measurement radiation (13, 13a, 13b) and detection of the reflected measurement radiation (14, 14a, 14b) according to the principle of triangulation, characterized in that • the measurement radiation (13, 13a, 13b) can be generated having a wavelength spectrum such that a fluorescence can be excited by an interaction of the measurement radiation (13, 13a, 13b) with the object material and fluorescent light (15) can be emitted, wherein a spectrum of the fluorescent light and the wavelength spectrum of the measurement radiation are different, • the detector (12) is designed for detecting the fluorescent light, • the distance measuring unit (10) is designed for generating fluorescence measured data as second distance measured data based on the detection of the fluorescent light (15) according to the principle of triangulation, and • the measuring device (1) comprises a control and processing unit, wherein the control and processing unit has a data fusion functionality configured such that upon its execution □ the detection of the measurement radiation and the fluorescent light is continuously monitored, □ a respective item of intensity information for the respective detection of the measurement radiation and the fluorescent light is continuously derived, and □ a point cloud representing the object surface is generated by selective processing of the reflection measured data and the fluorescence measured data based on the intensity information.

2. Measuring device (1) according to Claim 1, characterized in that a center wavelength of the wavelength spectrum is selected from a range between 250 nm and 500 nm, in particular is 405 nm or 450 nm.

3. Measuring device (1) according to Claim 1 or 2, characterized in that the detector (12) comprises a first optical filter component (16) and the first optical filter component (16), in cooperation with the first sensor, provides a wavelength-dependent separation of reflected measurement radiation and fluorescent light, in particular wherein the first optical filter component (16) is designed as a spatially distributed multicolor filter, in particular an RGB filter.

4. Measuring device (1) according to any one of Claims 1 to 3, characterized in that the detector (12) comprises a second optical filter component and the second optical filter component is designed as a two-part alternating filter having a first and a second filter region (16a, 16b), wherein • the first filter region (16a) provides a substantially exclusive transmissivity with respect to the wavelength spectrum, in particular for the center wavelength of the wavelength spectrum, • the second filter region (16b) provides a transmissivity with respect to a spectrum of the fluorescent light, and • the first and the second filter regions (16a, 16b) are positionable alternately, in particular sequentially, in a field of view of the first sensor (17).

5. Measuring device (1) according to any one of Claims 1 to 4, characterized in that the beam emission unit comprises a first and a second beam source (11a, 11b) and the measurement radiation (13) can be generated as a composition, in particular overlay, of the measurement radiation (13a) that can be generated using the first beam source (11a) having the defined wavelength spectrum and a further measurement radiation (13b) that can be generated using the second beam source (11b) having a further wavelength spectrum different from the defined wavelength spectrum, in particular wherein • the distance measuring unit (10) is designed for the activation of the first and the second beam source (11a, 11b) in such a way that the measurement radiation having the defined wavelength spectrum (13a) and the measurement radiation having the further wavelength spectrum (13b) can be sequentially emitted alternately at specific intervals, and • the distance measuring unit (10) is designed for the activation of the detector (12) such that a first detection and a second detection can be carried out sequentially synchronized with the activation of the first and the second beam source.

6. Measuring device (1) according to any one of Claims 1 to 5, characterized in that the detector (12) comprises a second sensor (17b) and is configured in such a way that the reflected measurement radiation (14, 14a, 14b) is detectable using the first sensor (17, 17a) and the fluorescent light (15) is detectable using the second sensor (17b), in particular wherein one filter unit (16a, 16b) is assigned to each of the first and the second sensor (17, 17a, 17b) and the respective filter unit (16a, 16b) is essentially exclusively transmissive with respect to the reflected measurement radiation or the fluorescent light, respectively.

7. Measuring device (1) according to any one of Claims 1 to 6, characterized in that the detector (12) comprises a beam splitter (19) and the beam splitter (19) is designed in particular as dichroic for the wavelength-dependent separation of the reflected measurement radiation (14, 14a, 14b) from the fluorescent light (15).

8. Measuring device (1) according to any one of Claims 1 to 7, characterized in that the at least one first sensor (17, 17a) comprises a first and a second, in particular spatially separated, detection region and the detector (12) is configured in such a way that the reflected measurement radiation (14, 14a, 14b) is detectable by interaction with the first detection region and the fluorescent light (15) is detectable by interaction with the second detection region.

9. Measuring device (1) according to any one of Claims 1 to 8, characterized in that the control and processing unit is configured to execute a method according to any one of Claims 12 to 14.

10. Measuring device (1) according to any one of Claims 1 to 9, characterized in that the distance measured data are processed for a respective object point for which a greater intensity is derived.

11. Measuring device (1) according to any one of Claims 1 to 10, characterized in that the control and processing unit comprises a switchover functionality configured such that upon its execution • the measurement radiation or the fluorescent light is continuously detected, • corresponding reflection measured data or fluorescence measured data, respectively, are generated, • the detection of the measurement radiation or the fluorescent light is continuously monitored with respect to a signal intensity, • the signal intensity is continuously compared to a defined threshold value, and • a switchover takes place between the detection of the measurement radiation and the detection of the fluorescent light in dependence on the comparison.

12. Hybrid measuring method for measuring an object (2) comprising a material which fluoresces with respect to a known wavelength range, comprising • generating and emitting a measurement radiation (13, 13a, 13b) having a defined wavelength spectrum, • illuminating of an object region using the measurement radiation (13, 13a, 13b), • detecting the measurement radiation (14, 14a, 14b) reflected on the surface, in particular diffusely, • generating reflection measured data as first distance measured data based on the detection of the reflected measurement radiation (14, 14a, 14b) according to the principle of triangulation, characterized in that • the measurement radiation (13, 13a, 13b) is generated having a wavelength spectrum such that in the scope of the illumination, a fluorescence is excited due to an interaction of the measurement radiation (13, 13a, 13b) with the object material and fluorescent light (15) is emitted at the object, • the fluorescent light (15) is detected, • fluorescent measured data are generated as second distance measured data based on the detection of the fluorescent light (15) according to the principle of triangulation, • the detection of the measurement radiation and the fluorescent light is continuously monitored, • a respective item of intensity information for the respective detection of the measurement radiation and the fluorescent light is continuously derived, and • a point cloud representing the object surface is generated by selective processing of the reflection measured data and the fluorescence measured data based on the intensity information.

13. Measuring method according to Claim 12, characterized in that • a reflection point cloud (53) is generated based on the reflection measured data (51), • a fluorescence point cloud (63) is generated based on the fluorescence measured data (61), and • a representation of the object surface is generated by a combination of the reflection point cloud and the fluorescence point cloud.

14. Measuring method according to Claim 12 or 13, characterized in that • the reflection measured data (51) and the fluorescence measured data (61) are analyzed depending on the location with respect to the respective quality thereof, in particular density, in regard to the detection of the object region, • a segmentation (70) of the object region is carried out based on the analysis, • a combination of at least a part of the reflection measured data (51) and of at least a part of the fluorescence measured data (61) is carried out based on the segmentation.

15. Computer program product, which is stored on a machine-readable carrier or is embodied by an electromagnetic wave, for controlling and / or executing the steps of the measuring method according to any one of Claims 12 to 14, when the computer program product is executed on a control and processing unit of a measuring device (1) according to any one of Claims 1 to 11.