MICROSCOPY SYSTEM AND METHOD FOR OPERATING A MICROSCOPY SYSTEM
Patent Information
- Authority / Receiving Office
- DE · DE
- Patent Type
- Patents
- Current Assignee / Owner
- Filing Date
- 2022-05-06
- Publication Date
- 2026-03-12
AI Technical Summary
Existing microscopy systems face challenges with reliable and accurate position detection, particularly in medical applications, due to issues such as occlusion, recalibration needs, high power consumption, and increasing inaccuracy at large distances, which affect usability and precision.
A microscopy system with a tracking camera, tracking illumination devices, and a control unit that adjusts illumination and image acquisition based on position, brightness, and working distance to ensure precise and reliable position tracking, minimizing overexposure and underexposure.
The system enables accurate and efficient position tracking with reduced energy consumption and improved usability by dynamically adjusting illumination and image capture based on object position and working distance, ensuring reliable and precise detection.
Description
[0001] The invention relates to a microscopy system and a method for operating a microscopy system.
[0002] Microscopy systems for magnifying the display of objects under examination, particularly in medical applications, are known from the prior art. Such microscopy systems can be, in particular, so-called operating microscopes. These serve, among other things, to magnify parts of the body, thus providing a surgeon with better visual orientation during a procedure. Operating microscopes are generally mounted in a movable manner, especially on a stand. This allows a user, among other things, to change the position and / or orientation of the microscope, for example, to change the viewing angle of one area of examination or to view other areas.
[0003] German patent DE 10 2018 206 406 B3 discloses a microscopy system with a position detection device for determining the spatial position of a target, wherein the position detection device comprises at least one target with at least one marker element and an image acquisition device for optically detecting the target. The document further discloses that the microscopy system may include an illumination device for illuminating the target. The disclosed position detection device can be used, in particular, to detect the position of an instrument, for example, a medical instrument, when the target is attached to the instrument. Such position detection may be desirable, for example, if the current position of the instrument relative to preoperatively generated data, such as MRI or CT volume data, is to be displayed.
[0004] Also known is US patent 9,827,054 B2. This patent discloses the mechanically assisted positioning of medical instruments during medical applications. A microscope and a position detection system are also disclosed.
[0005] Further known is the subsequently published EP 21 172 758.1, which discloses a microscopy system with a device for determining a working distance, wherein the position of a movable optical element, the position of which is adjustable for setting a detection range of a tracking camera, is adjustable depending on the working distance. The document further describes that an operating mode and / or an illumination range of tracking illumination devices of the microscopy system is / are adjustable depending on the working distance.
[0006] Also known are microscope-external position tracking devices, which are, for example, arranged as separate systems in an operating room. One example is the Polaris Vega VT optical position tracking device from NDI (Northern Digital Inc.). Such devices require additional installation space in the operating room. Another problem with these types of devices is occlusion, for example, when a user moves between a target and the image acquisition elements of such a system. This restricts the movement of medical personnel. Furthermore, position tracking with such a device regularly requires a target with at least one marker to be positioned on the operating microscope itself to provide the desired functionality.Attaching additional targets to the operating microscope during maintenance typically requires removing these targets, which then need to be reattached after maintenance, necessitating recalibration of the position tracking system. Furthermore, such external position tracking systems require powerful illumination to light up the operating room area, ensuring that all targets of interest—whether located on the patient, an instrument, or the microscopy system—are reliably imaged. These systems also require high-resolution image acquisition capabilities and significant computing power for image processing, which is essential for position tracking. Another disadvantage of such position tracking systems is their increasing inaccuracy at large distances between the target and the image acquisition system.
[0007] The technical problem therefore arises of creating a microscopy system and a method for operating this microscopy system that enable reliable and accurate position detection and provide improved usability.
[0008] The solution to the technical problem is provided by the articles with the features of the independent claims. Further advantageous embodiments of the invention are described in the dependent claims.
[0009] A microscopy system is proposed. The microscopy system comprises a microscope. For the purposes of this invention, a microscope is defined as a device for the magnified visual representation of an object under investigation. The microscope can be a conventional light microscope, which produces a magnified image by utilizing optical effects, in particular by means of beam guidance, shaping, and / or direction, for example, lenses. However, the microscope can also be a digital microscope, wherein the image to be visualized by the microscope is generated by means of an image acquisition device and can be displayed on a corresponding display device, for example, a screen.
[0010] The microscope can, in particular, include at least one eyepiece. The eyepiece is a part of the microscope through or into which a user looks to visually perceive the image produced by the microscope. In other words, an eyepiece forms an optical interface of the microscope for the user's eyes. The eyepiece can form part of a tube. Furthermore, the microscope can include at least one objective or objective system. This objective can produce a real optical image of an object under investigation. The objective can include optical elements for beam guidance, shaping, and / or direction. The eyepiece can be, or become, optically connected to the objective.
[0011] Furthermore, the microscope can comprise a microscope body. The microscope body can have or form a beam path for microscopic imaging. The microscope body can include further optical elements for beam guidance, shaping, and / or deflection. The objective lens can be integrated into or attached to the microscope body, in particular detachably. The objective lens can be fixed in position relative to the microscope body. Furthermore, the microscope body can have or form at least one mounting interface for attaching, in particular detachably, a tube. The microscope body can comprise or form a housing or be arranged within a housing.
[0012] Furthermore, the microscopy system can include a stand for mounting the microscope. The microscope, in particular the microscope body, can thus be mechanically attached to the stand. The stand is designed such that it allows movement of the microscope in space, in particular with at least one degree of freedom, preferably with six degrees of freedom, where one degree of freedom can be translational or rotational. The degrees of freedom can refer to a reference coordinate system. A vertical axis (z-axis) of this reference coordinate system can be oriented parallel to and opposite to the force of gravity. A longitudinal axis (x-axis) and a transverse axis (y-axis) of the reference coordinate system can define a plane that is oriented perpendicular to the vertical axis. Furthermore, the longitudinal and transverse axes can also be orthogonal to each other.
[0013] Furthermore, the stand can include at least one drive unit for moving the microscope. Such a drive unit could be, for example, a servo motor. Naturally, the stand can also include means for transmitting force / torque, such as gear units. In particular, it is possible to control the at least one drive unit in such a way that the microscope performs a desired movement and thus a desired change of position in space, or assumes a desired position and / or orientation in space. For example, the at least one drive unit can be controlled in such a way that an optical axis of the objective lens assumes a desired orientation. Furthermore, the at least one drive unit can be controlled in such a way that a reference point of the microscope, e.g., a focal point, is positioned at a desired position in space.A target position can be specified by a user or another higher-level system. Methods for controlling the at least one drive unit as a function of a target position and a kinematic structure of the tripod are known to those skilled in the art.
[0014] The microscopy system includes a tracking camera for determining the position of at least one object to be scanned. The tracking camera, in this context, refers to an image acquisition device for capturing the spatial position of at least one object to be scanned. The image acquisition device serves to image the object to be scanned. The tracking camera can be part of a position detection unit of the microscopy system. Furthermore, the position detection unit can include an evaluation or computing unit that can determine / capture the position by evaluating the images generated by the tracking camera. The object to be scanned can, in particular, be a marker or marker element. The object to be scanned can also be an instrument. The instrument can, in particular, be a medical instrument, and furthermore, a surgical instrument. This includes, for example...Instruments such as clamps, holders, syringes, tweezers, spoons, scissors, scalpels, wound retractors, forceps, suction devices, cautery, and also retractors, e.g., a brain retractor. The instrument can be, in particular, a handheld instrument. It can also be an operating room piece of equipment, such as an operating table or a Mayfield clamp. One or more marker elements may be arranged on an instrument. The marker or marker element may be part of a target or attached to a target. The target or marker may, in particular, be attached to a (medical) instrument. Furthermore, the position detection device, in particular its evaluation device, can identify an object to be detected, especially image-based, i.e., via image processing and evaluation methods known to those skilled in the art.
[0015] The tracking camera includes an image sensor, such as a CCD or CMOS image sensor. The image sensor resolution can be, for example, 12 megapixels. Furthermore, the tracking camera can include an optical system with at least one optical element. Position detection can also be used for position tracking, i.e., determining the position at several successive points in time. In particular, the tracking camera can be used for so-called monoscopic position detection. Here, the position can be determined by evaluating a two-dimensional image, specifically exactly one two-dimensional image. The tracking camera can be part of a position detection system, which, in addition to the tracking camera, can also include an evaluation unit for determining the position in a predetermined reference coordinate system. Position refers to a spatial location and / or a spatial orientation within the reference coordinate system.In particular, the position can be determined by evaluating the intensity values of pixels in the two-dimensional image. Such methods for image-based position detection using exactly one tracking camera or multiple tracking cameras are known to those skilled in the art.
[0016] According to the invention, the microscopy system comprises at least one, but preferably at least two, tracking illumination devices. A tracking illumination device is an illumination device for illuminating or lighting a detection area of the at least one tracking camera.
[0017] Furthermore, the microscopy system can include at least one optical element, in particular designed as a lens, for guiding the radiation generated by the tracking illumination device(s) and at least one control device for controlling the tracking illumination device and / or for controlling the tracking camera.
[0018] A computing unit can be designed as a microcontroller or integrated circuit, or may include one or more such components. In particular, the computing unit can be designed as, or be part of, a control unit of the microscopy system. Furthermore, the microscopy system may include a computing unit for image analysis, position determination, and illumination adjustment.
[0019] The at least one optical element can thus define an illumination area. A tracking illumination device can, in particular, be designed as an LED. Such a tracking illumination device can generate light in the near-infrared range, preferably in a narrowband wavelength range, for example with a wavelength of 850 nm or with a wavelength from the range of 800 nm to 900 nm. In particular, in such an embodiment, the object to be detected can be made at least partially or completely of a material that reflects this radiation.
[0020] The control unit can be used to control an operating mode, in particular an activation state and / or the intensity of the generated radiation, and / or to adjust the illumination area of a tracking illumination device. The illumination area can also be used to adjust the illuminated surface, in particular its size and / or shape. An activation state can be, for example, "inactive," in which case no radiation is generated by the tracking illumination device. Another activation state can be "active," in which case radiation is generated by the tracking illumination device. Furthermore, the intensity can be adjusted in the active state.To set an illumination area, an illumination angle, size, and / or geometric shape of the illumination area can be adjusted, for example, by controlling at least one or more optical elements to adjust these parameters. For instance, an optical element for guiding the beam generated by a tracking illumination device may be a movable and / or deformable optical element, whereby the position and / or shape of this optical element can be changed to set different illumination areas and / or to set different illumination states in different spatial regions. In particular, such an optical element may be designed like a movable optical element for adjusting the detection range of the tracking camera. The illumination angle may be a beam angle of the illumination device.This in turn can correspond to the opening angle of a cone-shaped illumination area.
[0021] It is therefore possible that different spatial areas can be illuminated by the tracking lighting devices in a region-specific manner, particularly independently of each other, for example with different lighting parameters such as intensity and / or illumination angle. This can be achieved by adjusting the position and / or shape of at least one optical element, or alternatively or cumulatively by controlling the operating mode and / or adjusting the illumination area.
[0022] According to an unclaimed and a third alternative according to the invention, illumination information can be determined or is determined by evaluating at least one image from the tracking camera. According to a first and a fourth alternative according to the invention, or as an alternative or additional feature in the third alternative according to the invention, position information of the object relative to at least one illumination device, i.e., information about the position of the object relative to the illumination device, can be determined or is determined, wherein the position information in the first alternative according to the invention is information about the position and orientation of the object. This determination can be carried out by the described control device or by a different evaluation device, which can also be configured as a computing device.According to a second alternative of the invention, or as an alternative or additional feature in the third alternative of the invention, a working distance can be determined or is determined. This will be explained in more detail below.
[0023] According to the invention and in the unclaimed embodiment, the illumination, in other words, an illumination state, is adjustable or set by means of the at least one tracking illumination device and / or the image acquisition, in other words, an image acquisition state, by means of the at least one tracking camera, depending on the illumination information (in the unclaimed and the third alternative according to the invention) and / or the position information of the object (first and third alternatives according to the invention) and / or depending on the working distance (second and third alternatives according to the invention). The illumination is adjustable, for example, by the described setting of the operating mode and / or the illumination range of the at least one tracking illumination device, in particular by setting illumination parameters.The lighting can also be adjusted by changing the position and / or shape of a described optical element. Image acquisition can be adjusted, in particular, by setting an operating mode of the at least one tracking camera, especially by setting an image acquisition parameter such as an exposure time.
[0024] The illumination information can be, in particular, brightness information, that is, information about the brightness of the image or a part of the image. This information can, for example, be a brightness value. For instance, image brightness can be determined as the average of the pixel intensities in the image or part of the image. A pixel intensity can be a grayscale intensity. In the case of a color image, the image brightness can, for example, be determined as the average of pixel intensities that represent the brightness of a pixel in a brightness-color model, such as the YCbCr model. For this, it may be necessary to transform the color image into a representation according to the aforementioned brightness-color model.
[0025] The brightness of a pixel can also be determined depending on the intensity in each of the color channels assigned to the pixel, for example as the average of these color channel-specific intensities.
[0026] If the brightness value is greater than a predetermined threshold, the illumination can be adjusted to reduce the brightness value, for example, by reducing the overall intensity of the radiation generated by the at least one tracking illumination device. If the brightness value is less than another predetermined threshold, the illumination can be adjusted to increase the brightness value, for example, by increasing the overall intensity of the radiation generated by the at least one tracking illumination device. Alternatively or cumulatively, the exposure time during image acquisition can be extended, particularly if the overall intensity remains constant.If the brightness range in a specific sub-area of the image is greater than a predetermined threshold, the illumination can be modified to reduce the brightness value in that sub-area while maintaining it or modifying it differently outside of that sub-area. This can be achieved, for example, by reducing the intensity of the radiation generated by the at least one tracking illumination device in the spatial area that is mapped to that sub-area of the image. Alternatively or cumulatively, the exposure time during image acquisition can be shortened. If the brightness range in a specific sub-area of the image is less than a predetermined threshold, the illumination can be modified to increase the brightness value in that sub-area while maintaining it or modifying it differently outside of that sub-area. This can be achieved, for example, by reducing the intensity of the radiation generated by the at least one tracking illumination device in the spatial area that is mapped to that sub-area.This can be achieved by increasing the intensity of the radiation generated by the at least one tracking illumination device in the spatial area that is mapped into the sub-area of the image. In particular, the illumination can be adjusted so that the brightness value in the entire image, or in one or more sub-areas, lies within a predetermined brightness value interval. Different illumination can be set for several spatial areas to achieve this.
[0027] The illumination information can be, alternatively or cumulatively, information about an intensity maximum or local intensity maxima and / or an intensity minimum or local intensity minima in the image. The illumination can then be adjusted so that the intensity minimum and the intensity maximum, or all local intensity minima and all local intensity maxima, lie within a predetermined brightness value interval. This allows for the reduction of the effects of unwanted reflections in the image.
[0028] It is particularly possible that the illumination information is determined only for a sub-area(s) of the image in which an object to be detected is depicted. Such a sub-area can be determined using methods known to those skilled in the art for object identification in images. The illumination can then be adjusted such that the brightness value in the sub-area(s) thus determined lies within a predetermined brightness value interval, in particular an interval that enables reliable image evaluation for position determination, e.g., reliable and accurate detection of a reference point, such as the center point, of an object to be detected, such as a marker. In other words, an object-specific ideal illumination can be set.
[0029] The object's position information can be information about its location relative to at least one illumination device, particularly relative to a tracking illumination device or a field-of-view illumination device (described below). The illumination device can also be external to the microscope, such as an operating room light source. The position of the illumination device can be known in advance or determined by a tracking system. It is also possible that the object's position information is information about the distance between the object and the illumination device, for example, a distance value. In this case, the illumination can be adjusted such that the overall intensity of the radiation generated by the tracking illumination device(s) increases with increasing distance from the illumination device and decreases with decreasing distance.Alternatively or cumulatively, the exposure time can be increased with increasing distance and decreased with decreasing distance, especially if the overall intensity remains constant.
[0030] It is also possible that the intensity in the area of the room in which the object is located increases with increasing distance from the lighting device and decreases with decreasing distance from the lighting device, while the intensity outside the area of the room is not changed or is changed in a different way.
[0031] If multiple objects are located in different positions within the illumination range of the tracking lighting device(s) and / or within the detection range of the tracking camera, the lighting can be adjusted to provide object-position-specific illumination for each object. This adjustment can be made so that multiple objects or each object is illuminated simultaneously in an object-position-specific manner. For example, if several objects are located at different distances from the lighting device, each object can be illuminated simultaneously with a distance-specific intensity. In this case, as explained below, spatial areas that are mapped to different sub-areas of the image can be illuminated differently, particularly with different intensities.
[0032] However, it is also possible to illuminate different objects within a set of multiple objects sequentially, with the illumination tailored to their specific position. For example, if several objects are located at varying distances from the lighting device, each object can be illuminated sequentially with a distance-specific intensity. Then, for instance, a first image can be generated under initial illumination adapted to objects within a certain distance range, followed by a second image generated under further illumination adapted to objects within a different distance range. If the distance values in the first range are smaller than those in the second range, the intensity of the radiation during the first illumination can be lower.Therefore, brighter illumination can be used for a far-field image than for a near-field image.
[0033] It is also possible to sequentially capture different objects within a set of multiple objects, taking into account their specific positions. For example, if several objects are located at varying distances from the lighting device, images can be generated sequentially with exposure times tailored to each distance. In other words, a first image can be generated with an exposure time adapted to objects within a specific distance range, followed by a second image with an exposure time adapted to objects within a different distance range. If the distance values in the first range are smaller than those in the second range, the exposure time for generating the first image can be shorter than the exposure time for generating the second image.In this process, the illumination intensity for generating the images is preferably constant.
[0034] It is also possible that the lighting device is assigned an illumination area with a pre-known spatial intensity distribution, determined, for example, by calibration. In this case, the object's position information can be information about its location within the illumination area. Furthermore, the lighting can be adjusted such that a resulting intensity, which depends on, for example, the sum of, the object-position-specific intensity generated by the lighting device (determined by the pre-known intensity distribution) and the intensity generated by the tracking lighting device(s), lies within a predetermined intensity interval, for example, an intensity interval that corresponds to a predetermined brightness interval for imaging.In other words, adjusting the lighting allows for the desired illumination of an object, taking into account the known spatial intensity distribution of a lighting device.
[0035] Image acquisition, and in particular an image acquisition parameter, can be set specifically for lighting. For example, the lighting can be set before the image acquisition, in which case the lighting-scene-specific image acquisition is set based on a pre-known assignment of an image acquisition scenario, such as an exposure time, to different lighting scenarios. However, the lighting can also be set specifically for image acquisition, in which case the lighting is set based on a pre-known assignment of a lighting scenario, such as one to different image acquisition scenarios. Of course, it is also possible for image acquisition and lighting to be set independently of each other.The lighting can be adjusted based on lighting information and / or position information using a control or regulation system. This control / regulation allows the image generated by the tracking camera to be incorporated into the lighting settings. In particular, dynamic lighting adjustment is possible, meaning adjustments can be made in real time. This allows the lighting to change when the lighting information and / or the object's position information changes.
[0036] The proposed microscopy system advantageously enables precise and reliable position tracking of an object whose location is to be determined, using the tracking camera. In particular, the illumination can be adjusted to ensure reliable and accurate detection of the object within the image and reliable and accurate evaluation of the image information for position determination. This is especially advantageous because illumination outside the target area, as well as overexposure and / or underexposure within the target area, can be avoided. This saves energy costs and prevents unwanted heat generation. Furthermore, the generation of stray light from the illumination is reduced.
[0037] Furthermore, the microscopy system can include at least one field-of-view illumination device. The field-of-view illumination device can be located in or on the microscope body. The field-of-view illumination device is also distinct from the tracking illumination device(s). In particular, the illumination area of the field-of-view illumination device can be larger than the largest adjustable illumination area of the tracking illumination device(s). Furthermore, the field-of-view illumination device can generate radiation with wavelengths from a wavelength range that differs from the wavelength range of the radiation emitted by the tracking illumination device(s). Specifically, the wavelength ranges may not overlap at all or may overlap only partially.
[0038] This advantageously allows the illumination for position detection to be set independently of the illumination for microscopic imaging, thus improving the user experience for the microscopy system.
[0039] For the determination of the working distance for the adjustment of the illumination and / or image acquisition according to the invention, as explained above, the microscopy system can include at least one device for determining a working distance.
[0040] This working distance of the microscope can refer to the distance between a plane of focus and a terminal element of the microscope's objective system along an optical axis of the microscope, which may be defined by the objective or objective system. The terminal element can be, for example, a lens (front lens) of the objective / objective system or a transparent cover plate. The plane of focus or detection can refer to a plane in object space, in which an object is imaged with a desired sharpness. It can be oriented orthogonally to the optical axis of the microscope, which intersects the plane of focus at the midpoint of the depth of field. The depth of field depends, as is known, on the currently set focal length, the currently set distance, and the currently set aperture.In particular, it is possible to determine the focal plane and thus also the working distance as a function of at least one of the aforementioned parameters. Of course, other methods for determining the working distance are also conceivable. For example, it is possible to set the working distance of the microscope to one or more, but not all, values within a predetermined range, such as 100 mm, 200 mm, and 630 mm.
[0041] The working distance of the microscope can be determined automatically using methods known to those skilled in the art. In particular, the working distance can be determined when a user has set the position of the microscope's focal plane, or when an autofocus function has been activated—in other words, when the microscope is in focus. Focusing is achieved, in particular, by adjusting parameters of the microscope's objective lens, such as the position of at least one movable optical element of that lens.
[0042] The autofocus function can be performed, for example, by a focusing device of the microscopy system. In this state, a working distance can then be determined depending on the set parameters of the objective lens, e.g., via a predetermined assignment, a predetermined characteristic curve, or a predetermined function, in particular a polynomial function. During focusing, for example, an image distance of a microscope objective can be set, whereby a working distance can be assigned to this image distance or a working distance can be determined from a set image distance. Thus, it can be assumed, for example, that the distance of an object, in particular a marker arranged on an instrument, from the tracking camera of the microscopy system corresponds exactly or approximately to the working distance of the microscope, especially because a surgeon, for example,an instrument, especially one with such a marker, is usually also used / moved in the area sharply imaged by the microscope.
[0043] It is also possible that the microscopy system includes a device for determining the working distance of the tracking camera, wherein this working distance is preferably, but not necessarily, determined as a function of the working distance of the microscope, for example, via a known mapping. Through this mapping, the working distance of the tracking camera can be assigned to a working distance or a working distance range of the microscope. The working distance of the tracking camera can be defined as a distance between a focal plane and a termination element, e.g., a (front) lens of an objective system of the tracking camera, along an optical axis of the tracking camera, which may be defined by the objective or objective system of the tracking camera. However, it is also conceivable to determine the working distance of the tracking camera independently of the working distance of the microscope.It is further possible that the microscopy system includes a computing unit for determining the working distance. This computing unit can be implemented as, or be part of, a control unit of the microscopy system. Thus, the operating mode of the tracking illumination unit(s) and / or image acquisition by the at least one tracking camera can be adjusted depending on the working distance. It is possible that different operating modes of the tracking illumination unit(s) and / or different operating modes of the tracking camera are assigned to different working distances or ranges, with the control unit then setting the operating mode of the tracking illumination unit(s) and / or the tracking camera that is assigned to the currently determined working distance or range.Different operating modes of the tracking illumination system can vary in the number of activated tracking illumination units and / or in the intensity of the radiation generated by at least one activated tracking illumination unit. Alternatively or cumulatively, the illumination area can also be adjusted depending on the working distance, particularly by adjusting the operating mode of the tracking illumination units, but also by controlling various elements to influence the illumination area. Different operating modes of the tracking camera can differ, for example, in their exposure times.
[0044] Thus, the number of activated tracking lights and / or the intensity of the activated tracking lights and / or the operating mode of the tracking camera can be adjusted depending on the working distance. In particular, this allows the overall intensity of the radiation generated by the tracking light(s) to be adjusted. As explained above, this setting can be assignment-based, whereby different numbers of activated tracking lights and / or different intensities of the activated tracking light(s) are assigned to different working distances and can be set when a corresponding working distance has been determined.This advantageously results in an adjustment of the lighting to the working distance, which in particular avoids overexposure at short working distances and underexposure at comparatively long working distances.
[0045] Furthermore, an initial total intensity of the radiation generated by the tracking illumination device(s) can be set for a first working distance. A further total intensity of the radiation generated by the tracking illumination device(s) is then set for a subsequent working distance, where the first working distance is smaller than the subsequent working distance and the first total intensity is lower than the subsequent total intensity. As explained, it is possible to adjust the total intensity by setting the number of activated illumination devices and / or by setting the intensity of the activated illumination devices. However, it is possible to adjust the activation state of the tracking illumination device, but not the intensity of the radiation generated in the activated state.This advantageously results in lower intensities of the generated radiation being set for smaller target working distances compared to larger working distances, thereby minimizing the risk of overexposure at small working distances and underexposure at larger working distances, which ensures reliable and therefore accurate position detection.
[0046] For example, it is possible to set initial lighting and / or image acquisition depending on the working distance—that is, lighting with initial lighting parameters and / or image acquisition with initial image acquisition parameters. This initial lighting and / or image acquisition can be determined and set independently of the lighting information and / or the object's position information and then—as explained above—modified depending on the lighting information and / or the object's position information. In other words, working-distance-dependent pre-control of the lighting and / or image acquisition is possible. This advantageously enables fast and reliable lighting or image acquisition.However, it is also possible that the working distance and the lighting information and / or the position information of the object are taken into account simultaneously for adjusting the lighting and / or image acquisition, whereby in particular the working distance-dependent pre-control is not carried out.
[0047] By adjusting the lighting and / or image capture depending on the working distance, an accurate and reliable position detection of an object by the tracking camera is advantageously achieved, while simultaneously ensuring good user-friendliness.
[0048] In a further embodiment, overexposure and / or underexposure of the image or a sub-area of the image can be detected by evaluating the at least one image, wherein the illumination and / or image acquisition can be adjusted such that the overexposure or underexposure is reduced. Overexposure can be detected if a brightness value in the image or sub-area is greater than a predetermined threshold. Overexposure of a sub-area can also be detected if the ratio of the brightness value in the sub-area to a brightness value of the remaining sub-area or the entire image is greater than a predetermined threshold. Underexposure can be detected if a brightness value in the image or sub-area is less than a predetermined threshold.Underexposure of a sub-area can also be detected if the ratio of the brightness value in the sub-area to the brightness value of the remaining sub-area or the entire image is less than a predetermined threshold. Of course, other methods for detecting overexposure or underexposure in the image or sub-area are also conceivable, for example, histogram-based methods. Such methods are known to those skilled in the art. As explained above, the detection of overexposure or underexposure can also be performed only in sub-areas of the image in which objects to be captured are depicted. The illumination and / or image acquisition can then be adjusted in such a way that the overexposure or underexposure in these sub-areas is reduced. In this case, overexposure or underexposure in other sub-areas may not be reduced, or only to a different extent.This advantageously enables the setting of lighting or image acquisition in which the probability of overexposed and / or underexposed areas is reduced, which in turn enables the generation of images whose evaluation allows for a reliable and accurate determination of position.
[0049] In a further embodiment, by evaluating the at least one image, at least one sub-area can be identified in which the object to be captured is depicted, wherein the illumination and / or image acquisition can be adjusted such that the object is depicted with a predetermined brightness. This has already been explained above. This advantageously results in a simplified adjustment of the illumination or image acquisition, since no brightness specifications apply to image areas outside the image areas in which an object is depicted.
[0050] In a further embodiment, as well as in the fourth alternative according to the invention, the object's position information is information about the position of the object to be detected relative to at least one field-of-view illumination device with a known intensity distribution in its illumination area, wherein the illumination and / or image acquisition is additionally adjustable depending on a position-specific intensity generated by the field-of-view illumination device. The field-of-view illumination device can, in particular, have an inhomogeneous intensity distribution in the illumination area. This has already been explained above. This advantageously results in a faster and simpler adjustment of the illumination or image acquisition, since, in the
[0051] The setting takes into account previously known information about the lighting by the field-of-view lighting device.
[0052] In a further embodiment, spatial areas that are mapped to different sub-areas of the image are illuminated differently, in particular with different illumination parameters. This has already been explained above. This advantageously enables the setting of an illumination that allows the generation of images whose evaluation enables reliable and accurate position determination, which results in particular from the targeted illumination.
[0053] In a further embodiment, different spatial areas, in which various objects to be captured are arranged and which are depicted in different sub-areas of the image, are illuminated in such a way that each object is depicted with a predetermined brightness. This has already been explained above. This advantageously results in a simplified setting of the lighting or image capture, since no lighting or image capture specifications apply to spatial areas in which no object to be captured is arranged.
[0054] In a further embodiment, spatial areas that are mapped into different sub-areas of the image are illuminated differently in such a way that the difference between the resulting intensity generated in a first spatial area and the resulting intensity generated in a further spatial area is reduced compared to a difference between the intensity generated by the field-of-view illumination device in the first spatial area and the intensity generated by the field-of-view illumination device in the further spatial area, wherein the resulting intensity, as explained above, is determined as a function of, for example as a sum of, the intensity generated by the field-of-view illumination device (which can be determined, for example, as a function of the previously known intensity distribution) and the intensity generated by the tracking illumination device(s).In other words, the lighting can compensate for the inhomogeneous lighting.
[0055] In a further embodiment, the microscopy system comprises at least one movable optical element whose position can be changed to adjust the detection range of the tracking camera, wherein the position of the movable optical element is adjustable depending on the working distance. In this embodiment, the microscopy system can, in particular, include the previously described device for determining the working distance. The movable optical element can be part of the objective system of the tracking camera. In particular, the angle of view of the tracking camera can be changed by changing its position. The detection range can, for example, be conical. By moving the optical element, the position of a focal point of the optical element or of an objective system comprising the optical element can also be changed.Furthermore, the microscopy system comprises at least one control unit for controlling the movable optical element, in particular for motion control. This control unit can, in particular, control the movement of the movable optical element into a desired position. This control unit may be the same as the control unit for the tracking illumination system or different from it.
[0056] Furthermore, the position of the movable optical element is adjustable depending on the working distance. For example, different positions of the movable optical element can be assigned to different working distances or different working distance ranges, whereby the position is set for a given working distance that corresponds to that working distance or the range in which the working distance lies. For example, the assignment of a working distance to a position can be determined by a calibration procedure. It is also conceivable that a functional relationship exists between the position and the working distance, in which case the position can be determined by evaluating this relationship. The various adjustable positions of the movable optical element define different detection ranges, in particular detection ranges with different detection angles.Thus, these layers also define different focus planes for the tracking camera.
[0057] In a further embodiment, a second detection area of the tracking camera and / or a second illumination state and / or a second image acquisition state is set, particularly from a first detection area, a first illumination state, or a first image acquisition state, when the working distance increases and reaches a first predetermined threshold. Furthermore, a first detection area and / or a first illumination state and / or a first image acquisition state is set, particularly from the second detection area, the second illumination state, or the second image acquisition state, when the working distance decreases and reaches a second predetermined threshold that is lower than the first threshold. The second detection area can be set by moving the movable optical element, particularly from a first position, to a second position.The first detection range can be set by moving the movable optical element, in particular from the second position, to the first position. The positions of the optical element are distinct and can also be referred to as positions. The first detection range can have a first detection angle that is larger than the second detection angle of the second detection range. In other words, a first detection range and / or a first illumination state and / or a first image acquisition state is set when the working distance decreases and reaches a second predetermined threshold. A second detection range, in particular a second detection angle, and / or a second illumination state and / or image acquisition state, is set when the working distance increases and reaches a first predetermined threshold.The setting, which depends on the working distance, is therefore subject to hysteresis. This advantageously improves the user experience of the microscopy system, particularly by reducing the risk of frequent changes in the field of view, illumination, and / or image acquisition status when the working distance changes around a set point, which can be perceived as irritating by the user. Furthermore, the hysteretic setting of the illumination and / or image acquisition depending on the working distance also advantageously enables accurate and reliable position tracking of an object by the tracking camera, as it avoids frequent switching at working distances that negatively impact reliability and accuracy.
[0058] Setting a lighting state can refer to the setting of at least one lighting parameter. Similarly, setting an image acquisition state can refer to the setting of at least one image acquisition parameter.
[0059] Preferably, the threshold values are selected such that the detection ranges set up to the threshold values enable imaging with sufficiently high resolution. The described aspect can constitute an independent invention. Thus, a microscopy system is described, comprising at least one tracking camera for detecting the position of at least one object to be detected and at least one device for determining a working distance, further comprising at least one tracking illumination device and at least one optical element for guiding the radiation generated by the tracking illumination devices and / or at least one movable optical element whose position can be changed to set a detection range of the tracking camera, wherein a second detection range and / or a second illumination state and / or a second image acquisition state is set.when the working distance increases and reaches a first predetermined threshold, and wherein the movable optical element is moved from the second to the first position and / or a first illumination state and / or a first image acquisition state is set, when the working distance decreases and reaches a second predetermined threshold that is smaller than the first threshold. This microscopy system may additionally be further developed according to one or more of the aspects mentioned in this disclosure.
[0060] In another embodiment, exactly two positions of the movable optical element can be set with repeatable accuracy, i.e., with a predetermined repeatability. Repeatability represents the magnitude of the maximum positional deviation that occurs when the optical element is moved to a specific position multiple times. This repeatability can be determined, for example, as the standard deviation of the positional deviations over a large number of repeated positionings, such as more than 100. Preferably, the repeatability is less than or equal to 1 µm or 1°. In other words, a microscopy system designed in this way can set two detection ranges with repeatable accuracy. This advantageously results in a mechanically simple design of the microscopy system, while simultaneously enabling reliable and precise position detection.
[0061] In a further embodiment, the movable optical element is movably, preferably linearly, mounted between two end-stop elements, wherein a first end-stop element has or forms a first bearing element for static mounting, and a further end-stop element has or forms a further bearing element for static mounting, the bearing elements defining the stop positions of the optical element with repeatable accuracy. Furthermore, the repeatability of a movement position of the optical element can be lower than the repeatability of a stop position. The movement position can, in particular, be a position between the two stop positions.The repeatability of a movement position can represent the magnitude of the maximum deviation between the actual movement positions that occur when the beam is repeatedly moved into a target movement position, with the beam being supported by a motion bearing element during these movements, thus guiding the beam's movement. The movement position therefore denotes a position and / or orientation of the beam between the end positions, which can be set by moving the beam while it is supported or guided by the motion bearing element. In other words, the motion bearing element is configured such that the repeatability achieved when repeatedly moving the beam into a movement position is lower than the repeatability achieved when repeatedly moving the beam into the end position.From a given position of movement, the carrier can move into a first stop position and into a further stop position; such movement is therefore permitted. From the first or further stop position, the carrier can move into a position of movement or into the remaining stop position. The fact that the accuracy is lower can mean that the repeatability value is greater than the repeatability value in a single stop position, for example, by a factor of ten. In other words, a position of movement of the optical element is not defined with the same repeatability accuracy by the movement bearing element as a stop position is defined by the first and subsequent bearing elements.This advantageously results in a simple and cost-effective design of the optical system, especially since no high-precision manufacturing of the motion bearing element and, if applicable, the guide elements provided by this element is necessary.
[0062] In a further embodiment, a first detection angle of the tracking camera is set for a first working distance, and a further detection angle of the tracking camera is set for at least one further working distance, wherein the first working distance is smaller than the further working distance and the first detection angle is larger than the further detection angle. The detection angle can here denote a field of view of the tracking camera, in particular a horizontal field of view, vertical field of view, or diagonal field of view. Thus, the dimension of an intersection of the detection area with a plane that intersects the optical axis of the tracking camera at the first working distance, for example, orthogonally, can be larger for the first detection angle than for the further detection angle.However, this in turn ensures that objects located at a greater working distance from the end element of the tracking camera can also be captured with a sufficiently high resolution.
[0063] In a further embodiment, the microscopy system comprises several groups of tracking illumination devices, each group comprising at least one, but preferably more than one, tracking illumination device. A group can, for example, comprise a so-called array of tracking illumination devices. The microscopy system further comprises at least two optical elements for beam guidance, which are assigned to different groups. This can mean that the radiation generated by the tracking illumination device(s) of this group is guided through the optical element assigned to that group. For example, a first optical element can be assigned to a first group and a further optical element to a further group of tracking illumination devices. In this case, at least one tracking illumination device of a group cannot be part of a further group.Preferably, none of the tracking illumination devices of one group is part of another group of tracking illumination devices. It is possible for an optical element to be assigned to several groups of tracking illumination devices. In this case, the various optical elements for beam guidance differ in at least one assigned group of tracking illumination devices. The various illumination devices of a group can be arranged in a row along a common straight line or in a matrix configuration. Each of the illumination devices of a group can be individually controlled, for example, to set an activation state and / or the intensity of the generated radiation. Furthermore, the illumination devices can be arranged on a thermally conductive substrate that is thermally connected to a cooling device for improved heat dissipation.This advantageously allows for the simple adjustment of an illumination area, particularly depending on the working distance. Different illumination areas or states can be defined by the (various) optical properties of the optical elements, with the correspondingly defined illumination area being illuminated when the tracking illumination devices of the group associated with the optical element are activated, particularly at a predetermined intensity. Different illumination areas can vary in location, shape, size, or other properties. By adjusting the illumination area, especially to the working distance, the risk of underexposure or overexposure can be further advantageously reduced.This in turn can advantageously improve the quality of the positional data acquisition, since under- or overexposure can lead to inaccurate and therefore unreliable positional data acquisition, or to a positional data acquisition that is not feasible.
[0064] Furthermore, unnecessary illumination of areas not relevant for position sensing can be advantageously avoided. This advantageously reduces energy consumption for position sensing and also advantageously reduces unwanted stray light, which can affect the functioning of other systems. In particular, the previously described area-specific illumination can thus be implemented in a simple and reliable manner.
[0065] Furthermore, at least two of the multiple optical elements used for beam guidance can have different optical properties. The optical properties can be selected such that, when one or more groups of the optical elements are activated, different illumination zones are set, particularly in a cross-sectional plane perpendicular to the optical axis of at least one element. This advantageously allows for a simple adjustment of the illumination zone, especially to the working distance, particularly via integrated, static optical elements, thus enabling adjustment without complicated changes to the optical properties. Of course, it is also possible for the different optical elements to have the same optical properties.Furthermore, the illumination angle of the illumination area determined by the optical properties of a first optical element can be greater than the illumination angle of the illumination area determined by the optical properties of a further optical element. If the first optical element is assigned to a first group of tracking illumination devices, these devices can be activated when a first working distance is determined, where the first working distance is smaller than a further working distance, and where, upon determination of the further working distance, the tracking illumination devices of a further group to which the further optical element is assigned are activated.In other words, a larger illumination angle of the illumination area can be set for comparatively shorter working distances. This allows the illumination angles to be adapted to the detection angles and also reduces unwanted light scattering. Specifically, the illumination angles of the illumination areas, particularly those dependent on the working distance, can correspond to the detection angles in the detection areas, particularly those specific to the working distance, or be larger than them by a predetermined amount. Furthermore, the optical axes of the beam-guiding optical elements can intersect at a common point. This advantageously creates an illumination area by activating several groups whose radiations effectively superimpose to form a single, combined radiation pattern.However, it is also possible that the optical axes of the illumination devices are oriented or arranged differently and do not intersect at a common point. Furthermore, the tracking illumination devices can be operated in pulsed mode, particularly with a predetermined duty cycle. This duty cycle can be an illumination parameter. In this case, a tracking illumination device can be activated for a predetermined duration and deactivated for a further predetermined duration, the sum of these durations equaling one period. The duration of an activated state (and thus also the duty cycle described above) is adapted to an exposure period of the tracking camera. The exposure period can be determined by a higher-level system, such as a camera control unit. This camera control unit can also be part of the microscopy system and, for example,The system can be connected to the control unit via a signal link. Furthermore, as previously explained, the exposure time can be determined based on illumination information and / or object position information and / or a working position. This advantageously further reduces the previously described stray light generation, particularly since no illumination is provided during periods when no image acquisition for position determination is taking place. This also reduces the energy consumption of the microscopy system.
[0066] Furthermore, the microscopy system can include or form a beam path for generating the microscopic image. This beam path can, in particular, be the beam path of an objective lens of the microscope and / or be formed by the microscope body. The microscopic image here refers to the magnified image of an area under investigation. The microscopy system also includes or forms at least one further beam path for generating the tracking image, wherein the beam paths are distinct from one another. This beam path can, in particular, be the beam path of an objective lens system of the tracking camera and / or be formed by the microscope body. For example, the different beam paths can be separated from one another by wall elements and / or bridge elements. These elements can be formed by the microscope body.
[0067] The microscopy system can also include optical elements for generating images, which are arranged in or along the respective beam path. Optical elements arranged in different beam paths can be different from one another. It is possible for a component containing the movable optical element and / or the tracking illumination device(s) and the optical elements for beam guidance to be detachably attached to the microscope body. In other words, this allows for the retrofitting of position detection functionality. The component can also include the control unit. In this case, appropriate signal lines and power supply connections must be established between the component and the microscopy system.
[0068] However, it is also possible that the aforementioned components of the part, or at least part of them, are integrated into the microscope body. This results in a space-saving provision of reliable and accurate position detection, while also ensuring high-quality magnification, since the various beam paths do not affect the microscopic image or the tracking image.
[0069] A further proposed method for operating a microscopy system is described. The microscopy system can be configured according to one of the embodiments described in this disclosure. The method comprises: Determining lighting information by evaluating at least one image from the tracking camera and / or position information of the object relative to at least one lighting device and / or a working distance, adjusting the lighting by the tracking lighting devices and / or the image acquisition by the at least one tracking camera depending on the lighting information and / or the position information of the object and / or depending on the working distance.
[0070] As previously explained, the method enables the illumination and / or image acquisition to be adjusted such that the tracking camera, under the set illumination and with the set image acquisition, allows for a reliable and accurate determination of the object's position. The method can be carried out with a microscopy system according to one of the embodiments described in this disclosure. Thus, the microscopy system for carrying out the method is also designed.
[0071] In particular, the procedure can therefore include: Determining a working distance, adjusting the lighting by the tracking lighting devices and / or the image acquisition by the at least one tracking camera depending on the working distance.
[0072] This and the corresponding advantages have already been explained previously.
[0073] In another embodiment, but also independently of the previously mentioned process steps, the process may comprise: Setting a second detection range of the tracking camera, in particular by moving the movable optical element from a first to a second position, and / or setting a second illumination state and / or a second image acquisition state when the working distance increases and reaches a first predetermined threshold, in particular from a state with a set first detection range, from a set first illumination state and / or from a first image acquisition state; setting a first detection range of the tracking camera, in particular by moving the movable optical element from the second to the first position, and / or setting a first illumination state and / or a first image acquisition state when the working distance decreases and reaches a second predetermined threshold.which is smaller than the first threshold, in particular from a state with a set second detection range, from a set second illumination state and / or from a second image acquisition state.
[0074] This too was previously described with its corresponding advantages.
[0075] The invention is explained in more detail using exemplary embodiments. The figures show: Fig. 1 a schematic view of a microscopy system according to the invention in one embodiment, Fig. 2 a schematic cross-section through a part of a microscopy system according to the invention, Fig. 3 a schematic cross-section through a part of a microscopy system according to the invention in a further embodiment, Fig. 4 a schematic cross-section through a part of a microscopy system according to the invention in a further embodiment, Fig. 5 a schematic flowchart of a method according to the invention in a first embodiment, Fig. 6 a schematic flowchart of a method according to the invention in a further embodiment, Fig. 7 a schematic flowchart of a method according to the invention in a further embodiment, Fig. 8 a schematic representation of the relationship between working distance and illumination / image acquisition state, Fig. 9 a schematic view of various acquisition areas.
[0076] In the following, identical reference symbols denote elements with the same or similar technical characteristics. Fig. 1 Figure 1 shows a microscopy system 1 according to the invention in an application within a surgical environment. The microscopy system 1 comprises a surgical microscope 2, which is arranged on a stand 3 for holding the microscope 2, in particular at a free end of the stand 3. The stand 3 allows movement of the microscope to change its position and / or orientation. The illustrated stand 3 represents an exemplary kinematic structure for holding and moving the microscope 2. It is of course known to those skilled in the art that other kinematic structures can also be used. Drive devices of the stand 3 (not shown) can enable rotational movement of movable parts of the stand 3 about axes of rotation 4, 5, 6. A control device 7, which serves to control the drive devices, is also shown.Furthermore, the control unit 7 can also be used to adjust operating and / or movement parameters of the microscope 2, for example, the zoom of the microscope 2. For this purpose, the control unit 7 can be connected to the microscope 2 and / or the drive units via signals and / or data transmission. A patient 13 lying on an operating table 14 is also shown. The microscope 2 includes an eyepiece 15 into which the user 8 looks to view a section of the patient 13 through the microscope 2, particularly at magnification. An optical axis 17 of the microscope 2 is also shown. The microscopy system 1 further includes a position detection device for detecting the position of an instrument 19, which can be held and moved by a user 8. The user 8 could, for example, be a surgeon.The position detection device comprises at least one target 9 with at least one marker and at least one tracking camera 30 for detecting the target 9. The position detection device can be used to determine the position of the target 9. Fig. 1 The figure shows that the target 9 is attached to the instrument 19, and the position of the instrument 19 can then be determined due to the fixed arrangement of the target 9 on the instrument 19. The tracking camera 30 is arranged in a microscope body 24 of the microscope 2, in particular in a housing of the microscope body 24. A detection area EB (see Fig. 7a) of the tracking camera 30 overlaps at least partially with a detection area of the microscope 2 for the magnified display of the patient or body regions of the patient 13. A signal and / or data connection 12 between the tracking camera 30 and the control unit 7 is also shown.By means of the control unit 7 or by means of an evaluation unit (not shown), which may, for example, be part of the position detection unit, a relative position between target 9 and tracking camera 30 can be determined in a three-dimensional coordinate system of the position detection unit. For example, the position of target 9 in a two-dimensional image coordinate system of the tracking camera 30 can be determined, and based on this position, a position in the coordinate system of the position detection unit can then be determined. Both a position and an orientation in the three-dimensional coordinate system of the position detection unit can be determined. This position can then be converted into the reference coordinate system via a known transformation, for example, one determined by registration. The determination of the position of target 9 can be carried out by evaluating exactly one two-dimensional image from the tracking camera 30.
[0077] Fig. 2 Figure 1 shows a schematic cross-section through a part of a microscopy system according to the invention. A cover glass 21 of the microscope 2 is shown, which is arranged between a beam path 22 for generating the microscopic image and an external area, for example, the room containing the patient 13. The cover glass 21 can be transparent to radiation, at least in the visible wavelength range, but protects the beam path 22 for generating the microscopic image from contamination. A field illumination device 23 is also shown, which, like the beam path 22, is integrated into a microscope body 24 of the microscope 2. The cover glass 21 covers both the beam path 22 and the field illumination device 23. A beam path 25 for generating the tracking image is also shown.This beam path 25 is also formed by the microscope body 24, but is different from the beam path 22 for generating the microscopic image, in particular separated by wall elements. Also shown is an end glass 26, which is arranged between the beam path 25 and the external environment. The end glass 26 can be transparent to light, at least in the near-infrared range, and can be different from the end glass 21. A tracking illumination device 27, which is also integrated into the microscope body 24 of the microscope 2 and can, for example, be designed as an LED, is also shown. The tracking illumination device 27 is different from the field-of-view illumination device 23. The tracking illumination device 27 can generate light in the near-infrared range. A lens element 28 is arranged between the tracking illumination device 27 and the external environment.The lens element 28 can be a lens element whose shape and / or position can be changed, whereby a change in shape and / or position can serve to adjust different lighting conditions. The shape and / or position can be adjustable by the control device 7. However, it is not mandatory that the lens element 28 be changeable in shape and / or position.
[0078] Also shown is a tracking camera 30 (see Fig. 1 ), comprising an image sensor 34 for generating an image, in particular a two-dimensional image, a movable optical element 32, and a closing lens 26. Also shown is a control device 7, which serves to control the movable optical element 32, e.g., designed as a lens. For this purpose, the control device 7 can be connected via a signal connection to a drive device for generating a driving force (not shown) that causes the movement. It is shown that the optical element 32 can be moved in a translational motion in a beam path 25 to generate the tracking image, in particular parallel to a central axis of the beam path. It is conceivable that the optical element 32 can be moved between two end stops, in particular with a linear motion. By moving the movable optical element 32, a detection area EB1, EB2 (see e.g. Fig. 9 ) of the tracking camera 30 can be changed, in particular a detection angle EW1, EW2 of the detection area EB. It is further possible that the in Fig. 2 The microscopy system 1 shown comprises exactly one or more tracking illumination devices 27. The operation of the tracking illumination device 27 can be controlled by the control unit 7, in particular an activation state and / or an intensity of the radiation generated by the tracking illumination device 27 in the activated state. By means of the control unit 7, which can also provide the function of an evaluation unit, illumination information can be determined by evaluating at least one image from the tracking camera 30, e.g., a brightness value of the generated image or brightness values in one or more sub-areas of the image. Alternatively or cumulatively, position information of the object, i.e., information about the position of a marker 31 relative to an illumination device, preferably relative to the field-of-view illumination device 23, can be determined by means of the control unit 7.Furthermore, the control unit 7 can be used to adjust the illumination by the tracking illumination devices 27 and / or the image acquisition by the at least one tracking camera 30 depending on the illumination information and / or the position information of the object. In other words, an illumination state and / or an image acquisition state can be set, whereby the setting of an illumination state can be achieved, for example, by setting at least one illumination parameter and / or the setting of an image acquisition state by setting at least one image acquisition parameter, e.g., the exposure time, and different states can differ in the value of at least one parameter.
[0079] Fig. 3 shows a schematic cross-section through a part of a microscopy system 2 according to the invention in a further embodiment. In contrast to the one in Fig. 2 The embodiment shown includes the in Fig. 3 The microscopy system 2 shown comprises several tracking illumination devices 27a, 27b, 27c and several lens elements 28a, 28b, 28c. The lens elements 28a, 28b, 28c can have different optical properties, in particular different focal lengths. The radiation generated by the tracking illumination device 27a, 27b, 27c shines through the lens element 28a, 28b, 28c associated with that tracking illumination device 27a, 27b, 27c. The lens elements 28a, 28b, 28c can be formed by a lens assembly 29, wherein this lens assembly 29 comprises different sections that form the lens elements 28a, 28b, 28c. The tracking illumination devices 27a, 27b, 27c can be controlled independently of one another to adjust the illumination by means of the control device 7. The lens elements 28a, 28b, 28c can also be controlled independently of each other to adjust the lighting, for example.whose shape and / or position is changeable. It is also possible that the microscopy system 1 comprises groups of several tracking illumination devices 27, wherein the tracking illumination devices 27 may be configured as LEDs or may include one such LED. A group may comprise one or more so-called LED arrays, wherein each of the tracking illumination devices 27 of each group can be individually controlled. Different lens elements 28a, 28b, 28c may be assigned to different groups.
[0080] Fig. 4 shows a schematic cross-section through a part of a microscopy system 2 according to the invention in a further embodiment. In contrast to the one in Fig. 2 The embodiment shown includes the in Fig. 3 The microscopy system 2 shown includes a device 33 for determining a working distance D (see Fig. 9 This is connected to the control unit 7 for information transmission. Using the control unit 7, the illumination and / or image acquisition can then be additionally adjusted depending on the working distance D. Additionally, the position of the movable optical element 32 can also be adjusted depending on the working distance D.
[0081] Fig. 5 shows a schematic flowchart of a method according to the invention in a first embodiment. In a first step S1, a tracking camera (see e.g. Fig. 2 ) a picture is created. In a second step S2, this picture is then processed, in particular with an evaluation unit, e.g. the one in Fig. 2 The control unit 7 shown is evaluated and – as explained above – lighting information and / or position information of the object is determined. In a third step S3, lighting by the tracking lighting unit 27 and / or image acquisition by the at least one tracking camera 30 is set, for example, also using the control unit 7, depending on the lighting information and / or the position information of the object. The lighting can be achieved by controlling the tracking lighting unit(s) 27 and / or the lens element(s) 28. Exemplary settings of the lighting and / or image acquisition depending on the lighting information and / or the position information of the object have been explained above.
[0082] Fig. 6 shows a schematic flowchart of a further embodiment of a method according to the invention. In contrast to the one in Fig. 5 In the illustrated embodiment, the method comprises a step S11 for determining a working distance D. In the third step S3, the illumination by the tracking illumination device 27 and / or the image acquisition by the at least one tracking camera 30 can then be additionally adjusted depending on the working distance D. Furthermore, in the third step S3, the position of at least one optical element 32 (see Fig. 2 ) can be adjusted depending on the working distance.
[0083] Fig. 7 shows a schematic flowchart of a further embodiment of a method according to the invention. In contrast to the one in Fig. 5 In the illustrated embodiment, the method includes a step S12 for identifying sub-areas in which markers 31 are depicted (see Fig. 2 In the second step S2, this sub-area of the image is then evaluated and – as explained previously – illumination information for this sub-area is determined. In a third step S3, illumination by the tracking illumination device 27 and / or image acquisition by the at least one tracking camera 30 is adjusted, for example also by means of the control unit 7, depending on the illumination information, in particular such that the markers 31 are imaged with a predetermined brightness after the adjustment.
[0084] Fig. 8 Figure 1 shows a schematic representation of the relationship between a working distance D and illumination states S1, S2, as well as detection states. In a first detection state, an optical element 32 is set to a first position L1 to define a detection range EB of the tracking camera 30. In a second detection state, the optical element 32 is set to a second position L2. It is shown that the optical element 32 moves from the first to the second position L1, L2, and a second illumination state S1 is set, when the working distance D increases and reaches or exceeds a first predetermined threshold th1. Furthermore, the movable optical element 32 is moved from this second position L2 back to the first position L1 and / or from this second illumination state S2.Image acquisition state is set to a first illumination state S1 and / or a first image acquisition state when the working distance D decreases and reaches or falls below a second predetermined threshold th2 that is smaller than the first threshold th1.
[0085] Fig. 9A schematic view of various detection areas EB1, EB2, which are set for different working distances D1, D2, is shown. The tracking camera 30 is also depicted, which may include a movable optical element 32 whose position can be changed to set a detection area EB of the tracking camera 30. However, other possibilities for setting different detection areas EB1, EB2 are also conceivable. For a first working distance D1 between a first focal plane SE1, in which, for example, a first target area (area of interest) with a first operating field SF may be arranged, and a terminal element of an objective system of the microscope along an optical axis of the microscope, a first detection area EB1 is set. This setting enables reliable detection of an instrument 19 with markers 31, which is located in the vicinity of the first operating field SF1.For a second, larger working distance D2 between a further focal plane SE2, in which, for example, another target area with a further operating field SF2 can be arranged, and the end element, a second detection area EB2 with a smaller detection angle than the detection angle of the first detection area EB1 is set. This ensures a sufficiently high resolution and thus high-quality imaging of, for example, markers 31 located in the vicinity of the further operating field SF2. A hatched box indicates a range of working distances D for which the first or the further detection area EB1, EB2 can be set, whereby the setting of the first or further detection area EB1, EB2 when the working distance D is changed to a value from this range depends on the initial value of the working distance D before the change. Reference symbol list
[0086] 1 Microscopy system 2 Microscope 3 Stand 4, 5, 6 Rotation axes 7 Control unit 8 User 9 Target 12 Signal connection 13 Patient 14 Operating table 15 Eyepiece 17 Optical axis 19 Instrument 21 End glass 22 Beam path for microscopic imaging 23 Field of view illumination device 24 Microscope body 25 Beam path for tracking image generation 26 End glass 27, 27a, 27b, 27c Tracking illumination device 28a, 28b, 28c Lens element 29 Lens assembly 30 Tracking camera 31 Marker 32 Movable optical element 33 Device for determining a working distance 34 Image sensor EB1, EB2 Detection range D, D1, D2 Working distance S1, S2, S3, S11, S12 Step th1, th2 Threshold L1, L2 Position S1, S2 - Illumination state
Claims
1. Microscopy system comprising at least one tracking camera (30) for detecting the pose of at least one object to be captured, the microscopy system (1) also comprising: - at least one tracking illumination device (27, 27a, 27b, 27c), - at least one control device (7) for controlling the at least one tracking illumination device (27, 27a, 27b, 27c) or the tracking camera (30), characterized in that information about the position and orientation of the object relative to at least one illumination device (30, 32) is determined, with the illumination by the tracking illumination device (27, 27a, 27b, 27c) or an image capture by the at least one tracking camera (30) being set on the basis of the information about the position and orientation of the object relative to the at least one illumination device (30, 32).
2. Microscopy system comprising at least one tracking camera (30) for detecting the pose of at least one object to be captured and a microscope with a working distance (D, D1; D2) of the microscope, the microscopy system (1) also comprising: - at least one tracking illumination device (27, 27a, 27b, 27c), - at least one control device (7) for controlling the at least one tracking illumination device (27, 27a, 27b, 27c), characterized in that a working distance (D, D1, D2) of the microscope is determined, with the illumination by the tracking illumination device (27, 27a, 27b, 27c) being set on the basis of the working distance (D, D1, D2) of the microscope, with a second illumination state (S2) being set if the working distance (D) of the microscope increases and reaches a first predetermined threshold value (th1), with a first illumination state (S1) being set if the working distance (D) of the microscope reduces and reaches a second predetermined threshold value (th2) which is less than the first threshold value (th1).
3. Microscopy system comprising at least one tracking camera (30) for detecting the pose of at least one object to be captured, the microscopy system (1) also comprising: - at least one tracking illumination device (27, 27a, 27b, 27c), - at least one control device (7) for controlling the at least one tracking illumination device (27, 27a, 27b, 27c) and / or the tracking camera (30), characterized in that illumination information is determinable by evaluating at least one image representation from the tracking camera (30) and / or pose information of the object is determinable relative to at least one illumination device (30, 32) and / or a working distance (D, D1, D2) is determinable, with the illumination by the tracking illumination device (27, 27a, 27b, 27c) and / or an image capture by the at least one tracking camera (30) being able to be set on the basis of the illumination information and / or on the basis of the pose information of the object and / or on the basis of the working distance (D, D1, D2), with the microscopy system (1) comprising a plurality of groups of tracking illumination devices (27, 27a, 27b, 27c), with one group comprising at least one tracking illumination device (27, 27a, 27b, 27c), and with the microscopy system (1) comprising at least two optical elements for beam guidance which are assigned to different groups.
4. Microscopy system comprising at least one tracking camera (30) for detecting the pose of at least one object to be captured, the microscopy system (1) also comprising: - at least one tracking illumination device (27, 27a, 27b, 27c), - at least one control device (7) for controlling the at least one tracking illumination device (27, 27a, 27b, 27c) or the tracking camera (30), characterized in that pose information of the object is determined relative to at least one illumination device (30, 32), with the illumination by the tracking illumination device (27, 27a, 27b, 27c) or an image capture by the at least one tracking camera (30) being set on the basis of the pose information of the object, with the pose information of the object being information about the pose of the object to be captured relative to at least one field of view illumination device (32) with an intensity distribution in its illumination region that is known in advance, with the illumination and / or the image capture additionally being able to be set on the basis of a pose-specific intensity generated by the field of view illumination device (32).
5. Microscopy system according to Claim 3, characterized in that an overexposure and / or an underexposure of the image representation or of a partial region of the image representation is detectable by evaluating the at least one image representation, with the illumination and / or the image capture being able to be set such that the overexposure and / or the underexposure is reduced, with preferably evaluation of the at least one image representation rendering identifiable at least one partial region in which the object to be captured is imaged, with the illumination and / or the image capture being able to be set such that the object to be captured is imaged with a predetermined brightness.
6. Microscopy system according to Claim 1 or 3, characterized in that the pose information of the object is information about the pose of the object to be captured, relative to at least one field of view illumination device (32) with an intensity distribution in its illumination region that is known in advance, with the illumination and / or the image capture additionally being able to be set on the basis of a pose-specific intensity generated by the field of view illumination device (32).
7. Microscopy system according to Claim 3 or any of the claims referring back to this Claim 3, characterized in that spatial regions imaged into different partial regions of the image representation are illuminated differently, wherein preferably different spatial regions in which different objects to be captured are arranged and which are imaged into different partial regions of the image representation are illuminated such that each object is imaged with a predetermined brightness and / or spatial regions which are imaged into different partial regions of the image representation are illuminated to such a different extent that the difference between the resultant intensity generated in a first spatial region and the resultant intensity generated in a further spatial region is reduced in comparison with a difference between the intensity generated in the first spatial region by the field of view illumination device (32) and the intensity generated in the further spatial region by the field of view illumination device (32).
8. Microscopy system according to Claim 2 or 3 or any of the claims referring back to these Claims 2 or 3, characterized in that the microscopy system (1) comprises at least one movable optical element (32), the pose of which is changeable so as to set a capture region (EB1, EB2) of the tracking camera (30), with the pose of the movable optical element (32) being able to be set on the basis of the working distance (D, D1, D2) of the microscope, wherein preferably exactly two poses (L1, L2) of the movable optical element (32) are able to be set repeatably, and / or the movable optical element (32) is movably mounted between two end stop elements, with a first end stop element having or forming a first bearing element for static support and a further end stop element having or forming a further bearing element for static support, with the bearing elements repeatably defining the stop poses of the optical element.
9. Microscopy system according to Claim 2 or any of the claims referring back to this Claim 2, characterized in that the microscopy system (1) comprises at least one control device (7) for controlling the tracking camera (30), with a second capture region (EB2) of the tracking camera (30) and / or a second image capture state being set if the working distance (D) of the microscope increases and reaches a first predetermined threshold value (th1), with a first capture region (EB1) and / or a first image capture state being set if the working distance (D) of the microscope reduces and reaches a second predetermined threshold value (th2) which is less than the first threshold value (th1).
10. Microscopy system according to Claim 3 or any of the claims referring back to this Claim 3, characterized in that a second capture region (EB2) of the tracking camera (30) and / or a second illumination state (S2) and / or a second image capture state is set if the working distance (D) of the microscope increases and reaches a first predetermined threshold value (th1), with a first capture region (EB1) and / or a first illumination state (S1) and / or a first image capture state being set if the working distance (D) of the microscope reduces and reaches a second predetermined threshold value (th2) which is less than the first threshold value (th1).
11. Microscopy system according to Claim 3 or 9 or any of the claims referring back to Claim 3, characterized in that a first capture angle (EW1) of the tracking camera (30) is set for a first working distance (D1) of the microscope and a further capture angle (EW2) of the tracking camera (30) is set for at least one further working distance (D2) of the microscope, with the first working distance (D1) of the microscope being less than the further working distance (D2) of the microscope and the first capture angle (EW1) being greater than the further capture angle (EW2).
12. Microscopy system according to Claim 1, 2 or 4 or any of the claims referring back to these Claims 1, 2 or 4, characterized in that the microscopy system (1) comprises a plurality of groups of tracking illumination devices (27, 27a, 27b, 27c), with one group comprising at least one tracking illumination device (27, 27a, 27b, 27c), and with the microscopy system (1) comprising at least two optical elements for beam guidance which are assigned to different groups.
13. Method for operating a microscopy system (1) according to Claim 1 or any of the claims referring back to this Claim 1, comprising: - the determination of information about the position and orientation of the object relative to at least one illumination device (30, 32), - the setting of an illumination by the tracking illumination device (27) or an image capture by the at least one tracking camera (30) on the basis of the information about the position and orientation of the object relative to the at least one illumination device (30, 32).
14. Method for operating a microscopy system (1) according to Claim 2 or any of the claims referring back to this Claim 2, comprising: - the determination of a working distance (D, D1, D2) of the microscope, - the setting of an illumination by the tracking illumination device (27) on the basis of the working distance (D, D1, D2) of the microscope, the setting of the illumination comprising: - setting a second illumination state (S2) if the working distance (D, D1, D2) of the microscope increases and reaches a first predetermined threshold value (th1), - setting a first illumination state (S1) if the working distance (D, D1, D2) of the microscope reduces and reaches a second predetermined threshold value (th2) which is less than the first threshold value (th1).
15. Method for operating a microscopy system (1) according to Claim 3 or any of the claims referring back to this Claim 3, comprising: - the determination of illumination information by evaluating at least one image representation from the tracking camera (30) and / or of pose information of the object relative to at least one illumination device (30, 32) and / or of a working distance (D, D1, D2), the setting of an illumination by the tracking illumination device (27) and / or of an image capture by the at least one tracking camera (30) on the basis of the illumination information and / or on the basis of the pose information of the object and / or on the basis of the working distance (D, D1, D2).
16. Method for operating a microscopy system (1) according to Claim 4 or any of the claims referring back to this Claim 4, comprising: - the determination of pose information of the object relative to at least one illumination device (30, 32), - the setting of an illumination by the tracking illumination device (27) or an image capture by the at least one tracking camera (30) on the basis of the pose information of the object.