Test device and method for testing segments for the energy cell-producing industry

Abstract

Test device (1) for testing segments (2) which are suitable for forming a cell stack for the energy cell-producing industry, wherein a conveying device (3) having a plurality of receiving sections (4) for receiving and transporting a segment (2) in each case is provided, wherein the receiving sections (4) can be moved relative to a stationary part (5) of the test device (1) by movement of the conveying device, characterized in that the receiving sections (4) each comprise at least two contact areas (6, 7, 8) for making electrical and / or signal-transmitting contact with a segment (2) received in the respective receiving section (4), wherein at least two of the contact areas (6, 7, 8) of in each case one of the receiving sections (4) can be connected to at least one measuring device (10a, 10b, 10c, 10d) by means of a switching matrix (9).

Description

[0001] Test device and method for testing segments for the energy cell manufacturing industry

[0002] The present invention relates to a testing device having the features of the preamble of claim 1 and a corresponding method having the features of the preamble of claim 15.

[0003] Energy cells or energy storage cells, such as battery cells, are used for galvanic accumulators, for example in motor vehicles, other land vehicles, ships, and aircraft, where a significant amount of energy must be stored and available for long periods of time. For this purpose, such energy cells have a structure consisting of a large number of segments stacked together to form a stack, referred to as cell stacks. These segments are formed, for example, by monocells. Monocells each consist of alternating anode sheets and cathode sheets, also known as electrodes, which are separated from one another by separator sheets. A monocell therefore typically has the following layer sequence: separator - electrode (e.g. anode) - separator - electrode (e.g. cathode).

[0004] The segments are pre-cut during the manufacturing process and then stacked on top of each other in a predetermined sequence to form cell stacks and bonded together, for example, by lamination. Devices for producing battery cells are known, for example, from WO 2016 / 041713 A1 and DE 10 2017 216 213 A1.

[0005] It can happen that the segments become damaged during the manufacturing process. For example, with segments in the form of monocells, the separator may be damaged during production. If a monocell with a damaged separator is used to form the cell stack, this can negatively impact the functionality and service life of the cell stack.

[0006] Energy cells can also be fuel cells or solar cells, for example, where segments can also be damaged during production.

[0007] It is therefore known in principle from the state of the art to check segments before the stacking process and, if necessary, to remove them from the production process so that only flawless segments are used to form a cell stack.

[0008] Such testing procedures must be carried out taking into account the production output and conveyor speed of today's production systems. Therefore, it is generally known from the state of the art to provide test equipment that travels with the segments during the production process and tests the segments alternately. To do this, the test equipment actively contacts so-called conductor flags, which are part of the segment electrodes. However, with such testing procedures, the machine's performance is limited due to the discontinuous movements. Furthermore, the segments can be damaged when contacting the conductor flags.

[0009] The object of the present application is to provide an improved testing device for testing segments and a corresponding method.

[0010] The object is achieved by the features of the independent claims. Further preferred embodiments of the invention can be found in the dependent claims, the figures, and the associated description.

[0011] Accordingly, to achieve the object, a testing device for testing segments which are suitable for forming a cell stack for the energy cell producing industry is proposed, wherein a conveyor device with a plurality of receiving sections is provided for receiving and transporting a segment in each case, wherein the receiving sections are movable by a movement of the conveyor device relative to a stationary part of the testing device, wherein the receiving sections each comprise at least two contact surfaces for electrically and / or signal-technically contacting a segment received in the respective receiving section, wherein at least two of the contact surfaces of each of the receiving sections can be connected to at least one measuring device by means of a switching matrix.

[0012] The segments positioned in the receiving sections can be transported by means of the conveyor system, whereby the segments can be inspected during the transport process using the contact surfaces. If the receiving section comprises at least two contact surfaces, at least one separator can be measured.

[0013] Preferably, the receiving sections each comprise at least three contact surfaces, more preferably exactly three contact surfaces.

[0014] Preferably, the switching matrix is ​​configured to connect the at least two or three contact surfaces of one of the receiving sections differently, so that measurements can be carried out by means of the at least one measuring device in a predetermined electrical circuit or in different electrical circuits.

[0015] The switching matrix within the meaning of this application preferably comprises at least one input channel and several output channels that can be interconnected in predefined configurations. Furthermore, the switching matrix can be configured to interconnect two or more output channels.

[0016] By connecting the at least two contact surfaces of the receiving sections to the output channels of the switching matrix, these can be interconnected with the at least one measuring device connected to the at least one output channel. In principle, it is also possible to connect the at least one measuring device to the switching matrix via two or more input channels.

[0017] Preferably, all contact surfaces of the receiving sections are connected to the switching matrix on the output channel side. Further preferably, all measuring devices are also connected to the switching matrix on the input channel side. It goes without saying that the matrix can in principle comprise additional input channels and / or additional output channels that are not connected to the at least one measuring device or the contact surfaces. For example, additional input channels can be provided via which a voltage source is connected to the switching matrix.

[0018] At least two of the at least three contact surfaces of a receiving section can preferably be connected to the measuring device at the same time. For example, conclusions can be drawn about the system state of the respective segment based on the measurement of an impedance, an ohmic resistance, or the electrical capacitance between two of the at least three contact surfaces. The ohmic resistance can be measured with direct current or as the inverse of the real part of the complex admittance at an alternating voltage, for example with a frequency of 1 kHz, 10 kHz, or 1000 kHz. The capacitance can also be measured with alternating voltage. A breakdown measurement can be used, for example, to detect foreign bodies whose diameter or extent is smaller than the layer thickness of the separator.For example, if the segment to be tested is formed by a monocell as described above, the electrical resistance between two electrodes may decrease if the separator arranged between these electrodes is damaged.

[0019] The at least three, preferably exactly three, contact surfaces per receiving section enable a so-called 3-port measurement of the segment arranged in the receiving section. This has the advantage that the two separators of a monocell can be tested separately and / or together. Thus, not only the separator of the segment arranged between the first and second electrodes can be tested, but also the outer separator, which is only contacted by an electrode of a neighboring segment when the cell stack is formed. The corresponding measurements can be performed by intelligently interconnecting the contact surfaces with the at least one measuring device.

[0020] Furthermore, the at least three contact surfaces per receiving section offers the advantage of enabling extremely gentle electrical contact with the segment. By appropriately interconnecting two of the three contact surfaces, different measurements can be performed without having to remove the segment from the cut section. By avoiding transferring the segment to be tested to another receiving section or to another testing device, a particularly gentle measurement of the segment can be performed. In particular, the extremely sensitive conductor tabs of the electrodes, already mentioned at the beginning, do not need to be contacted multiple times.

[0021] Preferably, the conveying device is formed by a rotatably mounted drum, on whose radially outer surface the receiving sections are arranged. This allows the segments to be tested to be conveyed by a rotational movement, which is particularly simple and efficient. The conveying device is then formed by a testing drum. The receiving sections are firmly connected to the drum, meaning they can only be removed with the aid of a tool, or the receiving sections themselves form the drum.

[0022] Preferably, several measuring devices are provided, with the switching matrix being configured to electrically and / or signal-wise connect one or more of the contact surfaces of each of the receiving sections to different measuring devices. This allows the segments to be connected to different measuring devices without being removed from the respective receiving section, which allows for the measurement of different parameters in a particularly gentle way. For example, it is also possible to test segments stored in different receiving sections in parallel.

[0023] According to a preferred embodiment, it is proposed that the receiving sections each comprise a first and a second contact surface for electrically and / or signal-related contacting two electrodes of an inserted segment, and wherein a third contact surface is provided for electrically and / or signal-related contacting one of the separators of the inserted segment. Preferably, each of the receiving sections has contact surfaces arranged in this way. By arranging the contact surfaces in this way within a receiving section, the separators of a monocell can advantageously be tested separately from one another without the monocell having to be removed from the receiving section of the conveyor device. The third contact surface thus serves as a temporary electrode assigned to the testing device, by means of which an external separator of the segment can be tested.

[0024] Preferably, the third contact surface simultaneously forms a transport support for the respective segment or at least part of the transport support. The areal extent of the third contact surface corresponds to the area of ​​the electrodes of the respective segment without their conductor tabs; preferably, the areal extent of the third contact surface deviates from the areal extent of the electrodes by less than 50%, more preferably less than 25%, in particular less than 10%. The transport support thus simultaneously assumes the function of transporting a segment and the function of the electrical or signaling connection of a separator of the transported segment. If, for example, a segment in the form of a monocell is transported in the receiving section, the segment to be tested preferably rests with one of its separators on the transport support of the respective receiving section.The two electrodes of the segment are then contacted by the first and second contact surfaces by means of the aforementioned conductor tabs, which protrude beyond the base area of ​​the separators.

[0025] According to another preferred embodiment, a pure transport support can also be provided instead of the third contact surface. In this embodiment, the pure transport support preferably consists of an insulating material, for example, to reduce stray capacitances during measurement using the first and second contact surfaces.

[0026] The disclosure content of this application is also intended to explicitly include the proposed device together with one or more segments, for example in the form of monocells, which is or are mounted in the receiving sections.

[0027] Preferably, the switching matrix is ​​configured to connect the first and second contact surfaces simultaneously to the same measuring device; to connect the first and third contact surfaces simultaneously to the same measuring device; and / or to connect the second and third contact surfaces simultaneously to the same measuring device. For example, if a segment in the form of a monocell is stored in one of the receiving sections for testing, the three contact surfaces of a receiving section contact the inserted segment as follows:

[0028] The segment rests on the third contact surface with a first separator; a first electrode adjacent to the first separator, for example in the form of an anode, rests on the first contact surface; a second electrode, for example in the form of a cathode, separated from the first electrode by a second separator, is connected to the second contact surface.

[0029] If the first and second contact surfaces are connected to the at least one measuring device at the same time, the second separator arranged therebetween can be tested.

[0030] If the first and third contact surfaces are connected to at least one measuring device at the same time, then the separator arranged on the outside of the segment can be tested.

[0031] If the second and third contact surfaces are connected to a measuring device simultaneously, the first and second separators can be tested simultaneously. Depending on the switching configuration, the first and second separators are then arranged in a series or parallel circuit between the second and third contact surfaces. These switching configurations, which can be adjusted using the switching matrix, enable comprehensive testing of the segments to be tested.

[0032] According to a further preferred embodiment, it is proposed that the contact surfaces within one of the receiving sections be arranged so as to be electrically insulated from one another. Preferably, the contact surfaces are also electrically insulated from the rest of the conveyor device. For example, the electrical insulation of the contact surfaces from one another can also be achieved by making the conveyor device at least partially of an electrically non-conductive material.

[0033] Preferably, the switching matrix is ​​configured to connect the at least three contact surfaces of each of the receiving sections differently, so that measurements can be performed using the at least one measuring device in different electrical circuits. Depending on whether, for example, the first or second separator, or both separators, are to be tested, the switching configuration can vary. In this way, a multitude of measurements can be performed on the segment while it is being transported on the conveyor. For example, two or more contact surfaces of a receiving section can also be short-circuited together.

[0034] Preferably, the switching matrix is ​​configured to connect individual or multiple contact surfaces of each of the receiving sections to a voltage source and / or to ground. These types of connections enable additional switching configurations, thus expanding the measurement possibilities.

[0035] The switching matrix preferably comprises a plurality of relays for connecting the contact surfaces to one another and / or one or more of the contact surfaces to one or more measuring devices. The relays can be controlled or regulated, for example, by means of a control unit. Due to the large number of switching combinations, it has proven advantageous to operate the switching matrix with relays. The switching matrix and thus also the relays can, for example, be controlled based on the position of the conveyor device relative to the stationary part of the testing device. Of course, alternatively or additionally, further input parameters can be used to control or regulate the switching matrix or the relays. The switching of individual or more contact surfaces to ground and / or the connection to a voltage source is also preferably carried out using the relays.The main advantage of relays is their passive, galvanically isolated switching and their minimally invasive behavior with respect to changes in the measuring path. Furthermore, relays are capable of conducting both direct and alternating current; switching transistors have only limited capabilities in this regard. Furthermore, switching transistors significantly influence the measuring path.

[0036] Preferably, the switching matrix is ​​part of the conveyor system. This allows for efficient wiring on the conveyor system.

[0037] Preferably, the at least one measuring device is configured to measure an electrical capacitance and / or an ohmic resistance and / or to perform a breakdown measurement. Measuring devices and measuring methods for measuring ohmic resistance or electrical capacitance are well known and provide reliable measurement results. By testing the segments by measuring the ohmic resistance and / or the electrical capacitance, reliable conclusions can be drawn about the system status of the segments being tested.

[0038] Preferably, the at least one measuring device is part of the stationary part of the testing device. Thus, the at least one measuring device does not need to be moved with the conveyor. This is particularly advantageous when the testing device comprises multiple measuring devices. Furthermore, the measuring devices can also be advantageously connected to the contact surfaces of different receiving sections, thus requiring fewer measuring devices. In principle, however, it is also possible to integrate one or more of the measuring devices into the conveyor.

[0039] According to a further preferred embodiment, it is proposed that the electrical and / or signaling connection of the conveyor device to the stationary part be established by means of a sliding contact device. A sliding contact device has proven advantageous for electrically and / or signaling-related connection of the moving, for example, rotating, conveyor device to the stationary part of the testing device.

[0040] Preferably, the receiving sections each have openings to which a vacuum can be applied to hold the segments. Holding the segments, in particular the conductor flags, can be carried out particularly gently by means of vacuum because grippers and / or clamps, which can damage the conductor flags, can be dispensed with. The openings can be provided on the transport support, for example in the form of the third contact surface, and / or on at least one of the remaining contact surfaces. Furthermore, the openings can be formed, for example, by retaining holes or by the pores of an air-permeable material. Alternatively, however, it is also possible for the segments to be held in the receiving sections by mechanical means.

[0041] The object mentioned at the outset is further achieved by a method for testing segments which are intended to form a cell stack for the energy cell producing industry, wherein the segments are tested by the testing device as described above, wherein the segments to be tested are each positioned in one of the receiving sections.

[0042] Preferably, the testing of the segments takes place during the transport of the segments, i.e. while the conveyor device is moving relative to the stationary part of the testing device.

[0043] Further preferably, the detection of a damaged or inferior segment results in its removal from the manufacturing process. This can be done, for example, by the inspection device itself or, alternatively, by a separate device, such as an ejection drum.

[0044] Alternatively or additionally, it is also possible for the testing device to record quality parameters of the segments for later use without necessarily removing them from the process. In this way, for example, the resulting cell stack can be classified into different quality classes. Regarding the technical effects and advantages associated with the proposed method, reference is made to the preceding explanations in connection with the testing device.

[0045] The invention is explained below using preferred embodiments with reference to the accompanying figures.

[0046] Fig. 1 shows the arrangement of the test device in a system for forming cell stacks;

[0047] Fig. 2 a conveyor device in the form of a test drum;

[0048] Fig. 3 shows a receiving section with a segment arranged thereon in a first cross section orthogonal to the axis of rotation;

[0049] Fig. 4 shows a receiving section with a segment arranged thereon in a second cross section parallel to the axis of rotation;

[0050] Fig. 5 is a schematic representation of the test device;

[0051] Fig. 6 a sliding contact device;

[0052] Fig. 7 shows a schematic circuit network of a test drum;

[0053] Fig. 8 is an equivalent circuit diagram of a monocell; Fig. 9 is an equivalent circuit diagram of a monocell in a first

[0054] Switching configuration;

[0055] Fig. 10 an equivalent circuit diagram of a monocell in a second

[0056] Switching configuration;

[0057] Fig. 11 an equivalent circuit diagram of a monocell in a third

[0058] Switching configuration;

[0059] Fig. 12 an equivalent circuit diagram of a monocell in a fourth

[0060] Switching configuration;

[0061] Fig. 13 an equivalent circuit diagram of a monocell in a fifth

[0062] switching configuration; and

[0063] Fig. 14 an equivalent circuit diagram of a monocell in a sixth

[0064] Switching configuration.

[0065] Figure 1 shows a system 100 for forming cell stacks comprising a manufacturing device 17 for forming segments 2, a testing device 1 for testing the segments 2 and a plurality of cell stacking devices 18.

[0066] The manufacturing device 17 of this exemplary embodiment is configured to produce segments 2 in the form of monocells. The monocells are four-layered, with the following four layers following one another: a separator 21, a first electrode 22 in the form of an anode, a second separator 23, and a second electrode 24 in the form of a cathode. In the manufacturing device 17, these layers are placed on top of one another and bonded together by lamination, forming a four-layer continuous web 26. This continuous web 26 is cut into equally long sections orthogonal to the longitudinal direction by a cutting device 27, forming segments 2 of equal length. The segments 2 fed to the testing device 1 are so-called dry segments 2, i.e., they are not filled with an electrolyte fluid. The cut segments 2 are tested by the testing device 1 following the manufacturing device 17 in the production process.

[0067] In the manufacturing process, the test fixture 1 is followed by several cell stacking devices 18, each of which is configured to stack the segments 2 onto one another to form cell stacks. In this case, four cell stacking devices 18 are provided, with which the cell stacks can be formed in parallel.

[0068] The inspection device 1 serves to detect defective or damaged segments 2 so that they are not used to form the cell stacks with the cell stacking devices 18. For the sake of simplicity, the term defective segments 2 is used below, meaning all segments 2 that do not meet the specified quality requirements. In this exemplary embodiment, the inspection device 1 is not itself designed to remove defective segments 2 from the production process. In this exemplary embodiment, this is done by an ejection drum 25, which ejects the defective segments into a reject reservoir (not shown). In this case, the inspection device 1 comprises a conveyor device 3 in the form of a test drum mounted so as to be rotatable about a rotation axis 14. A transport drum 20 is provided between the conveyor device 3 and the ejection device 25.The direction of rotation of the drums is indicated by arrows 28, only two of which are provided with the corresponding reference symbol. Ejecting defective segments 2 by means of the ejection drum 25 ensures that only flawless segments 2 are used to form the cell stacks with the cell stacking devices 18.

[0069] Figure 2 shows the conveyor device 3 in the form of a testing drum, which is mounted so as to be rotatable about the rotation axis 14. The conveyor device 3 has a plurality of receiving sections 4a, 4b, 4c on a radially outer surface 19, for example between 3 and 19, further for example between 10 and 16, which are each designed to receive and transport a segment 2. The conveyor device 3 shown here comprises exactly twelve of the receiving sections 4. The conveyor device 3 rotates relative to a stationary part 5 of the testing device 1, which is shown schematically in Figure 4. The receiving sections 4a, 4b, 4c visible here can be subjected to a negative pressure, so that the segments 2 are held on the receiving sections 4a, 4b, 4c by the effect of the negative pressure. In this way, the segments 2 can be picked up and released in a way that is gentle on the product.

[0070] Each of the receiving sections 4a, 4b, 4c has a first contact surface 6, a second contact surface 7, and a third contact surface 8, which are electrically insulated from one another and from the rest of the conveyor device 3. The receiving section 4b is covered by a segment 2, so that the third contact surface 8 of the receiving section 4b is concealed by the segment 2. However, it can be seen that a first electrode 22 contacts the first contact surface 6 by means of its conductor tab 11. Furthermore, it can be seen that a second electrode 24 contacts the second contact surface 7 by means of its conductor tab 12. The contacting of the segment 2 with the third contact surface 8 of the receiving section 4b is described below with reference to Figure 3.

[0071] Figure 3 shows a sectional view of a segment 2 arranged on the conveyor device 3, wherein the section is arranged in a plane orthogonal to the axis of rotation 14 (cf. Figure 2) of the conveyor device 3. The sectional view in Figure 3 shows the receiving section 4b from Figure 2. The receiving section 4b comprises the third contact surface 8, which is electrically insulated from the rest of the receiving section 4b and thus also from the rest of the conveyor device 3 by means of an insulator 16. The segment 2 rests with the first separator 21 on the third contact surface 8, which simultaneously forms a suitable transport support for the segment 2. It can also be seen that the planar extent of the third contact surface 8 coincides with the base area of ​​the first and second electrodes 22 and 24, without taking into account the conductor lugs 11, 12 (not shown here).In this way, the third contact surface 8, together with the first electrode 22 arranged above the first separator 21, can form an electrode pair suitable for testing the first separator 21 arranged therebetween. The first electrode 22 is then contacted via the first contact surface 6, as shown in Figure 2.

[0072] Furthermore, Figure 3 shows that the first electrode 22 is followed by the second separator 23 and the second electrode 24. The first electrode 22 and the second electrode 24 thus form an electrode pair that is suitable for testing the second separator 23 arranged between them. Figure 4 shows a further sectional view of the segment 2 arranged on the conveyor device 3, wherein the section is arranged in a plane parallel to the axis of rotation 14 (cf. Figure 2) of the conveyor device 3. In this view, it can be seen that the first electrode 22 contacts the first contact surface 6 by means of its conductor tab 11. It can also be seen that the second electrode 24 contacts the second contact surface 7 by means of its conductor tab 12.In order to prevent the conductor lugs 11, 12 from kinking, the contact surfaces 6, 7 have a correspondingly adjusted height in the radial direction; the height in the radial direction of the contact surface 6 is thus less than the height of the contact surface 7.

[0073] Figure 5 shows a schematic representation of the testing device 1 comprising the conveyor device 3, which is rotatably mounted relative to the stationary part 5. The arrow 28 represents the rotational mobility of the conveyor device 3 in the form of a test drum, which can be effected by an actuator 31. The actuator 31 is controlled or regulated by a control unit 30. Both the control unit 30 and the actuator 31 are assigned to the stationary part 5. Also shown schematically are the twelve receiving sections 4a, 4b, ..., 4I, whose three contact surfaces 6, 7, 8 are each electrically and / or signal-wise connected to a switching matrix 9 via three lines 33. Thus, each of the receiving sections 4a, 4b, ..., 4I is connected to the switching matrix 9 via three lines 33.

[0074] The switching matrix 9 comprises a plurality of relays 29a, 29b, and 29c, which are configured to connect the lines 33 to input lines 34. In Figure 5, only the three relays 29a, 29b, and 29c are shown as representative of a multitude of relays. By means of a sliding contact device 13, the input lines 34, which rotate with the conveyor device 3, are transferred electrically and / or signal-wise to the stationary part 5.

[0075] The stationary part 5 comprises four measuring devices 10a, 10b, 10c, 10d, each of which is electrically and / or signal-wise connected to the sliding contact device 13 via a pair of lines 35. In this way, each of the measuring devices 10a, 10b, 10c, 10d can be connected in different configurations to the contact surfaces 6, 7, 8 (see Figure 2) of the various receiving sections 4a, 4b, ..., 4I via the sliding contact device 13 and the switching matrix 9.

[0076] For a better understanding, we will first consider only the interconnection of the three lines 33, each assigned to one of the receiving sections 4a, 4b, ..., 4I, with line pairs 35, each assigned to one of the measuring devices 10a, 10b, 10c, 10d. In order to interconnect the measuring devices 10a, 10b, 10c, 10d in all combinations with the three contact surfaces 6, 7, 8 of the receiving sections 4a, 4b, ..., 4I, the switching matrix 9 must have 12 x 3 = 36 connections on the side assigned to the receiving sections 4a, 4b, ..., 4I, because each of the twelve receiving sections 4a, 4b, ..., 4I comprises three contact surfaces connected via the lines 33. Furthermore, the switching matrix 9 on the side assigned to the sliding contact device 13 must have 4 x 2 = 8 connections, because each of the four measuring devices 10a, 10b, 10c, 10d is equipped with a pair of lines 35.

[0077] This discussion does not yet take into account a power supply 36, which originates from the control unit 30, which in turn comprises a voltage source. The power supply 36 is looped through to the switching matrix 9 via a sliding contact device 13. In this way, certain contact surfaces 6, 7, 8 can be energized to perform measurements.

[0078] Furthermore, the previous discussion did not consider a data transmission line 37, which also originates from the control unit 30. The data transmission line 37 is connected to the switching matrix 9 via the sliding contact device 13, so that the relays 29a, 29b, 29c can be controlled by means of the control signals transmitted from the control unit 30 to the switching matrix 9. The relays 29a, 29b, 29c are configured to interconnect the terminals of the switching matrix 9 on the side of the receiving sections 4a, 4b, ..., 4d and / or to the terminals of the switching matrix 9 on the side of the sliding contact device 13.

[0079] Furthermore, another line 38 was not taken into account in the previous discussion. This line serves for grounding or switching individual or multiple contact surfaces 6, 7, 8 to ground. This line 38 is also connected to the switching matrix 9 via the sliding contact device 13.

[0080] Furthermore, the measuring devices 10a, 10b, 10c, 10d are also connected to the control unit 30 via a line 39. This line can be used, for example, to control the measuring devices 10a, 10b, 10c, 10d. Furthermore, the values ​​determined by the measuring devices 10a, 10b, 10c, 10d can also be stored in a data memory of the control unit 30. If, for example, a defective segment 2 is detected by one of the measuring devices 10a, 10b, 10c, 10d, the control unit 30 can output a corresponding signal to the ejection drum 25 shown in Figure 1, so that the corresponding segment 2 can be removed from the production process.

[0081] Figure 6 shows a schematic representation of a sliding contact device 13 comprising a stator 40 and a rotor 41. The stator 40 is connected here only as an example to two pairs of lines 35, which are connected to the measuring devices 10a and 10b (see Figure 5). The corresponding input lines 34 for the switching matrix 9 (see Figure 5) are assigned to the rotor 41. Several slip rings—not visible in this illustration—are provided inside the sliding contact device 13, which can be contacted or are in contact with sliding brushes (also not visible). Thus, electrical and / or signaling lines can be connected separately between the stator 40 and the rotor 41.

[0082] Figure 7 schematically shows a switching network of the test device 1. Four measuring devices 10a, 10b, 10c, 10d are shown here, although the network can in principle be expanded to include further measuring devices. Furthermore, it can be seen that each measuring device 10, 10b, 10c, 10d can in principle be connected to each receiving section 4a to 4e using the switching matrix 9. For the sake of clarity, only five of the twelve receiving sections 4a,...,4e are shown here. Furthermore, it can be seen that the receiving sections 4a,...,4e are each occupied by a segment 2. Furthermore, a detailed view of the contact surfaces 6, 7, 8 of the first receiving section 4a and their interconnectability using the switches 42, ..., 47 is shown on the right.

[0083] The switches 42, ..., 47 are part of the switching matrix 9 and can be formed, for example, by relays 29a, 29b, 29c (see Figure 5). Depending on the switching position of the switches 42, ..., 47, the contact surfaces 6, 7, 8 can be interconnected and / or with one of the measuring devices 10a, 10b, 10c, 10d and / or otherwise. In principle, it is also possible to connect one or more of the recording sections 4a, ..., 4l in parallel to different measuring devices 10a, 10b, 10c, 10d in order to parallelize the measuring process. The recording sections 4a, ..., 4l can also be interconnected sequentially with several measuring devices 10a, 10b, 10c, 10d.

[0084] Possible switching positions are explained below with reference to Figures 9 to 13.

[0085] Figure 8 shows a replacement diagram 32 of the segment 2 mounted in the receiving cutout 4b; see Figure 2. To improve clarity, the first electrode 22 in the form of the anode is identified by an A, the second electrode 24 in the form of the cathode 24 by a K, and the third contact surface 8 forming a transport support by a T. This designation is also retained in the circuit diagrams of Figures 9 to 13.

[0086] The equivalent diagram 32 of Figure 8 includes series resistances R S , A , R S ,K and R S ,T, which describe the line and contact resistances at anode A, cathode K and the transport support T formed by the third contact surface 8. Furthermore, a resistance R P ,AK is provided, which represents the insulation resistance between anode A and cathode K and a resistance R P.AT, which represents the insulation resistance between the anode A and the transport support T. The resistances R p AK and R P ,AT thus characterize the electrical conductivity of the separators 21 and 23. Furthermore, the capacitors C A K, C A T which occur between the anode A and the cathode K as well as between the anode A and the transport support T.

[0087] The equivalent circuit diagram 32 of Figure 8 is used as the basis for the circuit configurations explained in Figures 9 to 13. As an example, the measuring device 10a is used, which is configured to measure an ohmic resistance; however, in principle, any other measuring devices can also be used.

[0088] If it is subsequently stated that a contact surface 6, 7, 8 is connected to ground, then in this exemplary embodiment this is done by connecting the corresponding contact surface 6, 7, or 8 to the grounding line or the ground point of the circuit. In principle, however, other possibilities for connecting to ground are also conceivable, for example, by connecting to the drum of the conveyor device 3 if this is grounded. If it is subsequently stated that a contact surface 6, 7, 8 is not connected, then the corresponding contact surface 6, 7, or 8 is electrically insulated from the electrical lines of the remaining switching network.

[0089] Figure 9 shows a first circuit configuration used to test the second separator 23 (see Figure 3). The measuring device 10a is connected to the first and second contact surfaces 6, 7, and thus to the anode A and the cathode K. The contact surface 8, i.e., the transport support T, is not connected and is therefore not shown.

[0090] Figure 10 shows a second circuit configuration, which is also used to test the second separator 23 (see Figure 3). The measuring device 10a is connected to the first and second contact surfaces 6, 7, and thus to the anode A and the cathode K. The contact surface 8, i.e., the transport support T, is connected to ground.

[0091] Figure 11 shows a third circuit configuration used to test the first separator 21 (see Figure 3). The measuring device 10a is connected to the first contact surface 6 and, via this, also to the anode A and to the third contact surface 8, i.e., to the transport support T. The second contact surface 7, to which the cathode K rests, is not connected and is therefore not shown.

[0092] Figure 12 shows a fourth circuit configuration, which is also used to test the first separator 21 (see Figure 3). The measuring device 10a is connected to the first contact surface 6 and, via this, to the anode A and to the third contact surface 8, i.e., the transport support T. The second contact surface 7, to which the cathode K is connected, is connected to ground.

[0093] Figure 13 shows a fifth circuit configuration with which the separators 21 and 23 can be tested together. The measuring device 10a is connected to the first contact surface 6 via a first measuring connection 48 and, via thereto, to the anode A. Furthermore, the measuring device 10a is connected to the second contact surface 7 and the third contact surface 8 via a second measuring connection 49. In this fifth circuit configuration, the two separators 21 and 23 are connected in parallel to the measuring device 10a.

[0094] Figure 14 shows a sixth circuit configuration with which separators 21 and 23 can also be tested together. The measuring device 10a is connected to the second contact surface 7 and, via this, also to the cathode K and to the third contact surface 8, i.e., the transport support T. The first contact surface 6, to which the anode A is connected, is not connected and therefore not shown. In this sixth circuit configuration, the two separators 21 and 23 are connected in series to the measuring device 10a.

[0095] The switching configurations shown in Figures 9 to 14 allow suitable measuring bridges to be formed, by means of which the state of the segment located in the receiving section 4 (see Figures 2, 3, 4 and 5) can be determined in a reliable manner.

Claims

Claims:

1. Test device (1) for testing segments (2) suitable for forming a cell stack for the energy cell manufacturing industry, wherein - a conveying device (3) with several receiving sections (4) for receiving and transporting one segment (2) at a time is provided, wherein - the receiving sections (4) are movable by a movement of the conveying device relative to a stationary part (5) of the test device (1), characterized in that - the recording sections (4) each comprise at least two contact surfaces (6, 7, 8) for electrical and / or signal-related contacting of a segment (2) recorded in the respective recording section (4), wherein - at least two of the contact surfaces (6, 7, 8) can each be connected to one of the recording sections (4) by means of a switching matrix (9) with at least one measuring instrument (10a, 10b, 10c, 10d).

2. Test device (1) according to claim 1 , characterized in that - the recording sections (4) each comprise at least three contact surfaces (6, 7, 8).

3. Test device (1) according to one of the preceding claims, characterized in that - the conveying device (3) is formed by a rotatably mounted drum, on the radially outer surface (19) of which the receiving sections (4) are arranged. Test device (1) according to one of the preceding claims, characterized in that - several measuring devices (10a, 10b, 10c, 10d) are provided, wherein - the switching matrix (9) is configured to electrically and / or signal-wise connect one or more of the contact surfaces (6, 7, 8) of each of the recording sections (4) to different measuring devices (10a, 10b, 10c, 10d). Test device (1) according to one of the preceding claims with reference to claim 2, characterized in that - the receiving sections (4) each comprise a first and a second contact surface (6, 7) for electrical and / or signal contacting of two electrodes (22, 24) of an inserted segment (2), and wherein - a third contact surface (8) is provided for electrical and / or signal-related contacting of a separator (21) of the inserted segment (2). Test device (1) according to claim 5, characterized in that the switching matrix (9) is configured to - to connect the first and second contact surfaces (6, 7) simultaneously to the same measuring device (10a, 10b, 10c, 10d); - to connect the first and third contact surfaces (6, 8) simultaneously to the same measuring device (10a, 10b, 10c, 10d); and / or - to connect the second and third contact surfaces (7, 8) simultaneously to the same measuring device (10a, 10b, 10c, 10d).

7. Test device (1) according to one of the preceding claims, characterized in that - the contact surfaces (6, 7, 8) within one of the receiving sections (4) are arranged in an electrically isolated manner from each other.

8. Test device (1) according to one of the preceding claims with reference to claim 2, characterized in that - the switching matrix (9) is configured to connect the at least three contact surfaces (6, 7, 8) of each of the recording sections (4) differently, so that measurements can be carried out using the at least one measuring device (10a, 10b, 10c, 10d) in different electrical circuits.

9. Test device (1) according to one of the preceding claims, characterized in that - the switching matrix (9) is configured to connect one or more of the contact surfaces (6, 7, 8) of each of the recording sections (4) to a voltage source and / or to ground.

10. Test device (1) according to one of the preceding claims, characterized in that - the switching matrix (9) is part of the conveying device (3).

11. Test device (1) according to one of the preceding claims, characterized in that - at least one measuring device (10a, 10b, 10c, 10d) for measuring electrical capacitance and / or ohmic resistance and / or for performing a breakdown- The measurement device is set up. Test device (1) according to one of the preceding claims, characterized in that - that at least one measuring device (10a, 10b, 10c, 10d) is a component of the stationary part (5) of the test device (1). Test device (1) according to one of the preceding claims, characterized in that - the electrical and / or signal connection of the conveying device (3) to the stationary part (5) is made by means of a sliding contact device (13). Test device (1) according to one of the preceding claims, characterized in that - the receiving sections (4) each have openings which can be subjected to a vacuum to hold the segments (2). Method for testing segments intended for forming a cell stack for the energy cell manufacturing industry, characterized in that - the segments are tested by the test device according to one of the preceding claims, wherein the segments to be tested are each positioned in one of the receiving sections.

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