Method and device for determining geometric information of interfaces of an optical element

Abstract

The invention relates to a method (10) for determining information of an interface (103) of an optical element comprising several interfaces, the method being implemented by a device comprising at least one optical sensor (602) and at least one light source (612) for passing a beam (606) through at least one of the interfaces and being reflected by the interface to be measured, and for detecting an interference signal between the reflected beam and a reference beam; the method comprising: - positioning (12) a coherence zone at an interface; - at least two measurements (14, 16) of the interface to produce an interference image by measurement from respective interference signals; - rotation (15) of the optical element about a reference axis of the device between the measurements; - processing (17) of the at least two images to obtain information of the interface. Figure for abstract: [ Fig. 3 ]

Description

Title of the invention: Method and device for determining geometric information of interfaces of an optical element Technical field

[0001] The present invention relates to a method for determining geometric information of interfaces in an optical element comprising at least two interfaces. It also relates to a device for determining geometric information of interfaces in such an optical element.

[0002] The field of the invention is, in a non-limiting manner, that of optical control and measurement systems, in particular for the manufacture of optical elements. State of the art

[0003] Optical elements, such as optical assemblies or imaging lenses, generally consist of one or a plurality of lenses and possibly other components, such as plates or filters, for shaping optical beams. These components, or lenses, may be assembled as a stack along an axis in a support such as a barrel.

[0004] Each surface or interface of an optical element can be described by an optical axis, a vertex (apex) or the center of curvature of the surface. The optical axis is an axis of rotational symmetry in an approximation of revolution symmetry. The optical axis can be the axis passing through the apex and the center of curvature of a surface.

[0005] The optical performance of an optical element, for example an imaging lens, depends essentially on the manufacturing precision of the optical components (such as lenses) that compose it, and on the precision with which they are positioned in the assembly. When manufacturing optical elements or handling their components, it may be necessary to measure and control the alignment of the components with respect to a reference axis or to the other components.

[0006] Errors called centering errors are present when the optical axis of an interface and the reference axis or the axis of another interface do not coincide, that is to say they are different in position and direction.

[0007] It may also be necessary to measure thicknesses or positions of the components of the optical element, or even distances between them. The accuracy of the measurements of these geometric parameters depends on centering errors.

[0008] Methods for measuring centering errors are known. For example, the alignment of an optical measurement beam, constituting a reference axis, with an overall optical axis of a measured optical element is carried out by propagating a beam alignment optics through the components of the optical element, and by detecting the reflected beam on a CCD or PSD type optical sensor. The sensor makes it possible to indicate the displacement of the reflected beam, which follows a trajectory on the sensor when the optical element is rotated around an axis aligned with that of the measuring beam. The position of the optical element and its angular orientation relative to the beam are thus measured and can be corrected so as to minimize the extension of the trajectory of the reflected beam.

[0009] However, for assemblies of several lenses, when two interfaces are close or two centers of curvature are close, the measurement beam can be reflected simultaneously by these two interfaces for the same focal point on the camera. Thus, the measured trajectory represents a superposition of the two signals, thus leading to a mixed result. The discrimination power is fixed by the imaging optics, i.e. its depth of field. This problem increases with the reduction in size of the lenses, particularly for mobile objects, such as smartphones.

[0010] Furthermore, the measuring head is generally moved along the measuring axis to place the focal point of the measuring beam in the vicinity of the surface to be measured. These movements are often associated with variations in the axis of the measuring beam around the reference axis of the measuring system (these movements of the means for moving the measuring head being called tip, tilt, and yaw according to English terminology).

[0011] Consequently, it is necessary to be able to distinguish the different interfaces of an optical element reliably and efficiently. Statement of the invention

[0012] It is an object of the invention to propose a method and a measuring device for determining geometric information of interfaces or surfaces of an optical element comprising at least two interfaces, this device and this method allowing improved measurements of interfaces in an optical assembly.

[0013] Another object of the present invention is to propose a method and a measuring device allowing the evaluation and / or correction of decentering with a high power of discrimination, even for interfaces very close to an optical element.

[0014] It is also an object of the present invention to propose a method and a measuring device whose measurements can be directly used to obtain geometric parameters of the measured interfaces.

[0015] At least one of these aims is achieved with a measuring method, for determining geometric information of an interface to be measured of an optical element relative to a measuring axis, the optical element comprising at least two interfaces, the method being implemented by a measuring device having a reference axis and comprising interferometric measuring means with at least one optical sensor and at least one low coherence light source configured to direct a measuring beam along the measuring axis towards the optical element so as to pass through at least one of the at least two interfaces and to be reflected by the interface to be measured and generate a reflected measuring beam, and to selectively detect an interference signal resulting from interference between the reflected measuring beam and a reference beam, the device further comprising positioning means and digital processing means,

[0016] the method comprising the following steps: - relative positioning, by positioning means, of a coherence zone of the light source at the level of an interface to be measured; - at least a first measurement step and a second measurement step of the interface by the interferometric measurement means, so as to produce an interference image per measurement step from respective interference signals; - rotation of the optical element around the reference axis between the measurement steps; and - processing, by digital processing means, of the at least two interference images, so as to obtain information relating to the interface to be measured.

[0017] In the context of the present invention, an “optical element” may designate any type of optical object, intended for example to be inserted into an optical beam, to shape an optical beam, and / or to produce an image. It may designate for example: - a single optical component such as a lens or a blade; - an assembly of lenses and / or other optical components, such as an imaging lens, camera lens, or optical beam shaping device.

[0018] An optical element may in particular consist of, or comprise, refractive elements such as lenses. These components, or these lenses, may in particular be assembled in a barrel, this barrel also being able to contain other optical elements such as spacers and / or blades, such as for example filters.

[0019] An interference image can be a phase image, an amplitude image or a topography image. The term "interference image" thus designates an interference signal, or a set of interference signals, processed and represented as an image.

[0020] The method according to the present invention makes it possible to carry out measurements of interfaces of an optical element, and in particular of stacked interfaces, in order to deduce therefrom a information relating to each measured interface. These interfaces may, for example, include lens surfaces.

[0021] The measurements can be carried out with a measuring beam of an interferometric sensor illuminated by a low coherence light source. The measuring beam defines the measuring axis of the measuring device. A coherence zone of the light source is positioned relatively to at least one interface to be measured. The interface to be measured can be a “buried” interface, i.e., one of the interfaces inside the optical element. To arrive at such a buried interface, the measuring beam must therefore pass through other interfaces of the optical element.

[0022] By "coherence zone" is meant the zone in which interference between the measurement beam and a reference beam can form on the optical sensor. The coherence zone can be moved by varying the difference in the optical path length between the two beams, for example by changing the optical length of one or both of the beams. When the coherence zone is located at an interface, interference signals between the measurement beam reflected by this interface and the reference beam can be acquired, thereby obtaining an interference image.

[0023] By rotating the optical element, at least two interference images are acquired. These different images, for the same interface, make it possible to observe the differences between them, in order to deduce information relating to the measured interface.

[0024] The method according to the invention makes it possible to selectively obtain at least two interference images for each interface at which the coherence zone is positioned, i.e. for each surface located in the coherence zone. Indeed, the coherence length of the light source is adjusted so as to be shorter than a minimum optical distance between two adjacent interfaces of the optical element. Thus, for each measurement, only one interface is located in the coherence zone, and therefore, an acquired interference signal only comprises the contribution mainly from a single interface, or only comes from a single interface. The interference images can thus mainly or only be obtained for the interface at which the coherence zone is positioned, making it possible to perfectly discriminate the contribution of the measured interface.

[0025] Thus, by exploiting the interference images of the different interfaces, two interfaces of the same optical element, and in particular two adjacent interfaces, can be distinguished in a safe and reliable manner.

[0026] The interference measurements are carried out according to a field of view determined by the measuring means of the device. The measurements are preferably carried out in full field.

[0027] According to one embodiment, the processing step may comprise the identification of the same point of interest in each interference image.

[0028] This point of interest may be a characteristic point of the interface, for example a point of maximum height or a characteristic shape appearing from one image to another. The point of interest can then be followed during rotation between two measurement steps.

[0029] According to one embodiment, the processing step may comprise a step of determining information on the decentering of the interface.

[0030] This step makes it possible to determine the decentering, and in particular the alignment errors between the optical axes of the interfaces and the measurement axis.

[0031] By using the interference images of the different interfaces, no prior or additional measurement step, with different or additional measuring means, needs to be carried out for determining the centering errors. Indeed, the interference images can be simultaneously used to deduce other characteristics of the measured interfaces, and in particular geometric parameters of these interfaces, and this simultaneously with the determination of the centering errors.

[0032] The method according to the present invention makes it possible to determine information on the decentering of the interfaces of an optical element in a reliable and precise manner, and this for each interface independently.

[0033] The method according to the invention may further comprise a step of correcting the decentering of the interface.

[0034] According to one example, the correction step can be carried out by moving the optical element relative to the measuring beam in a plane perpendicular to the reference axis.

[0035] The alignment of the measuring beam is thus adjusted relative to an interface to be measured, for example when the measuring beam is not centered on the apex of the interface.

[0036] Alternatively or in addition, the correction step may be carried out by rotating the optical element in a plane containing the reference axis. In other words, the rotation of the optical element is carried out along two axes perpendicular to the reference axis.

[0037] The alignment of the measuring beam is thus adjusted angularly relative to an interface to be measured, for example when the optical element is inclined relative to the measuring axis.

[0038] These mechanical adjustments allow for more precise measurements.

[0039] According to one embodiment, the processing step may also comprise a step of digitally correcting the decentering of the interface.

[0040] Centering errors are calculated from the analysis of the interference images. The results of these calculations can then be used for the correction of subsequent measurements.

[0041] Advantageously, the processing step may further comprise a step of obtaining geometric information of the interface to be measured.

[0042] The measurements make it possible to determine, for example, geometric shapes and positions of the interfaces,

[0043] This geometric information may relate to the optical shape and / or the geometric shape of the interface to be measured, and / or optical or geometric distances representative of the shape and / or the position of the interface.

[0044] The geometric information may include geometric parameters of the interface such as: - the position of the apex, relative to an axis of the optical element, or relative to the position of the apex of another interface, - the center of curvature, relative to an axis of the optical element, or relatively to that of another interface, - the optical shape of the interface profile, and / or - the optical axis, represented, for example, by a normal to the interface at the apex point, relative to an axis of the optical element.

[0045] Geometric parameters can also be defined for each optical component or between the optical components of the optical element. It is therefore possible to define the following geometric parameters: - thickness of an optical component, i.e. the difference between the positions of the apices of the interfaces determined in relation to a measurement axis, - "air-gap" or empty space between the apices of two neighboring interfaces but of different optical components. This parameter can be determined as the thickness. - optical axes and / or inclinations of the interfaces after stacking of the optical component, and / or - centering of the apices of the interfaces after stacking.

[0046] Advantageously, the step of determining decentering information may further comprise a correction step taking into account optical propagation effects experienced by the measurement beam when crossing interfaces of the optical element.

[0047] Indeed, when measuring surfaces or interfaces “buried” in the optical element, the decentering information can also depend on the environments and geometric parameters of the interfaces crossed by the measurement beam before reaching these buried surfaces, in particular due to modifications of wavefronts. by refractive index jumps and different curvatures of the crossed interfaces, and possibly introduced aberrations. In this case, a correction must be applied to determine the actual decentering information of the interfaces.

[0048] To carry out this correction, it is possible to use a light propagation model and a priori knowledge or knowledge acquired during previous measurements on the optical element, such as refractive indices of materials and positions and shapes of interfaces crossed.

[0049] At least the step of positioning the coherence zone, the measuring steps and the at least one rotation step are implemented sequentially for determining the information relating to different interfaces to be measured.

[0050] Thus, all of the interfaces of an optical element can be measured, for example, starting with the upper interface and ending with the lower interface, passing through all the intermediate "buried" interfaces, without it being necessary to turn over or manipulate the optical element.

[0051] The processing of the interference images acquired for the successive interfaces can be carried out sequentially, between measurements on the different interfaces, or once all the interference images, for all the interfaces, have been acquired.

[0052] According to another aspect of the invention, a measuring device is proposed, for determining geometric information of an interface to be measured of an optical element relative to a measuring axis, the optical element comprising at least two interfaces, the device having a reference axis and comprising: - interferometric measuring means comprising at least one low coherence light source and at least one optical sensor, configured to: • form at least one measuring beam and at least one reference beam, • direct the measuring beam along the measuring axis towards the optical element so as to pass through at least one of the at least two interfaces and to be reflected by the interface to be measured and generate a reflected measuring beam, • selectively detecting a plurality of interference signals resulting from interference between the reflected measurement beam and the reference beam for a plurality of measurement points on the interface, to produce an interference image; - positioning means configured to relatively position a coherence zone of the light source at the interface to be measured; - angular displacement means configured to allow rotation of the optical element around the reference axis; and - digital processing means configured to determine information relating to the interface from at least two interference images produced at different angular positions of the optical element.

[0053] According to one embodiment, the interferometric measuring means may comprise an interferometric sensor, called a full-field interferometric sensor, configured to detect a full-field interference signal in the field of view.

[0054] The interface to be measured can then be imaged according to the field of view in a single measurement.

[0055] According to one example, the device may comprise an interferometric sensor with a Michelson interferometer.

[0056] According to another example, the device may comprise an interferometric sensor with a Mach-Zehnder interferometer.

[0057] The device according to the invention may further comprise displacement means configured to move the optical element relative to the measuring beam in a plane perpendicular to the reference axis.

[0058] According to one embodiment, the angular displacement means can further be configured to allow rotation of the optical element in a plane containing the reference axis.

[0059] The positioning means may be configured to position the coherence zone successively at different interfaces of the optical element.

[0060] This allows the acquisition and processing of interferometric signals for each interface sequentially and separately, in order to obtain information relating to all the interfaces of the optical element.

[0061] The method and the device according to the invention can be implemented, in particular, for the measurement of optical elements or optical assemblies during their production, for example objectives formed from lenses or microlenses such as smartphone lenses or for the automotive industry.

[0062] They make it possible in particular to obtain or construct characteristic geometric values ​​of great precision for interfaces of interest in an optical element, to compare expected and measured characteristic values ​​with threshold values ​​and thus to validate or reject an optical element component during the production process. Description of figures and embodiments

[0063] Other advantages and characteristics will appear on examining the detailed description of non-limiting examples, and the attached drawings in which: - [Fig.l] [Fig.l] is a schematic representation of an implementation of a measuring device according to the present invention; - [Fig.2] [Fig.2] is a schematic representation of an example of non-limiting embodiment of a measuring device which can be implemented within the framework of the present invention; - [Fig.3] [Fig.3] is a schematic representation of an example of non-limiting embodiment of a measuring method according to the present invention; - [Fig.4] [Fig.4] shows examples of interference images obtained with a method according to the present invention; and - [Fig.5] [Fig.5] shows examples of measurements obtained with the method according to the present invention.

[0064] It is understood that the embodiments which will be described below are in no way limiting. In particular, it will be possible to imagine variants of the invention comprising only a selection of characteristics described below isolated from the other characteristics described, if this selection of characteristics is sufficient to confer a technical advantage or to differentiate the invention compared to the state of the prior art. This selection comprises at least one preferably functional characteristic without structural details, or with only a part of the structural details if this part alone is sufficient to confer a technical advantage or to differentiate the invention compared to the state of the prior art.

[0065] In particular, all the variants and all the embodiments described can be combined with each other if nothing prevents this combination from a technical point of view.

[0066] In the figures, elements common to several figures may retain the same reference.

[0067] [Fig.l] is a schematic representation allowing the principle of the present invention to be visualized.

[0068] A measuring device 6000 is arranged to carry out measurements of geometric parameters of an interface to be measured of an optical element 1000, comprising at least two interfaces, relative to a measuring axis M.

[0069] In the example shown in [Fig.l], the optical element 1000 is a lens 102 arranged in a barrel along an axis Z. Geometric parameters of one of the surfaces of the lens are shown: the apex A of the surface, the center of curvature CC and an axis of symmetry, called the optical axis O. The optical axis O is an axis of symmetry of revolution for the surface considered.

[0070] The optical element 1000 can be rotated about a reference axis R of the measuring device 6000 by angular displacement means. For example, the optical element 1000 can be placed on a rotation platform (not shown), such as a turntable, in order to be able to pivot the optical element 1000 around the rotation axis of the turntable.

[0071] The measuring device 6000 comprises an interferometer with at least one low-coherence light source and at least one optical sensor. A measuring beam produced by the light source is directed towards the optical element 1000 along the measuring axis M, so as to pass through the interfaces of the optical element 1000. The interferometer is configured to produce an interference signal originating from the interference between the measuring beam reflected by the interface to be measured and a reference beam. The interference signal is detected by the sensor. This interference signal contains a measurement of the topography of the interface from which the beam being measured is reflected, and therefore geometric and centering information thereof. One or more interference signals are thus acquired according to a field of view on the interface.

[0072] The device 6000 according to the invention also comprises positioning means for relatively positioning a coherence zone 100 of the interferometer at the interface to be measured of the optical element 1000.

[0073] The device 6000 further comprises digital processing means configured to determine information on the decentering of the interface from the interference images produced at different angular positions of the optical element. The processing means comprise at least one computer, a central or computing unit, a microprocessor, and / or suitable software means.

[0074] [Fig.2] is a schematic representation of an example of an interferometric device that can be implemented within the framework of the present invention.

[0075] In the example shown in [Fig.2], the optical element 1000, of the camera lens type, consists of a barrel in which lenses 102 are positioned. The lenses 102, aligned along an optical axis 104, have surfaces or interfaces 103.

[0076] The 6000 interferometer, shown in [Fig.2], is a low-frequency interferometer full-field consistency.

[0077] The device 6000 is based on a Michelson or Linnik interferometer formed by a splitter element 604, in the form of a cube or a splitter blade, with a measuring arm which directs a measuring beam 606 towards the optical element to be measured 1000, and a reference arm with a mirror 605 to form a reference beam 616.

[0078] The interferometer 6000 is illuminated by a low coherence source 612 by via a lighting splitter element 603 in the form of a cube or a splitter blade. The source 612 may comprise, for example, a superluminescent diode (SLD), a diode, a thermal light source (halogen lamp, etc.) or a supercontinuum source. The source 612 may also include a filtering device, for example with a grating and a slit, or interference filters, to adjust the coherence length to a few tens or a few hundreds of microns. The source 612 can be arranged to emit in visible or near infrared wavelengths, around one or more wavelengths.

[0079] Of course, the separating elements 603, 604 can be non-polarizing, or polarizing and associated with quarter-wave plates to make lossless couplers.

[0080] The measurement beam 606 and reference beam 616, reflected respectively in the two arms of the interferometer, are directed via the lighting splitter plate 603 towards a camera 601 with a sensor 602 comprising a detection matrix, for example of the CMOS or CCD type.

[0081] When the difference in optical paths between the measurement beam 606 and the reference beam 616 is less than the coherence length of the source 612, interference is obtained on the detector 602.

[0082] The device 6000, as shown in [Fig.2], also comprises a focusing lens or objective 607, and a tube lens 609, arranged to define a conjugate object plane of an image plane formed on the sensor 602. The reference arm further comprises an objective 610 which also defines, with the tube lens 609, a conjugate reference object plane of the image plane of the sensor 602.

[0083] The device 6000 is a full-field imaging device, which makes it possible to image interfaces 103 of the optical element 1000 according to a field of view 108 which is determined by the field of view of the imaging system and by its numerical aperture at the level of the focusing objective 607. Indeed, to obtain a measurement, it is necessary for the specular reflection of the measuring beam 606 on the interfaces 103 to be recoupled into the imaging system.

[0084] Typically, the device 6000 includes optical elements for focusing the illumination beam into the back focal plane of the focusing lens 607 and the reference arm lens 610. The illumination beams are not shown in the figure for clarity.

[0085] The device 6000 also comprises a first positioning or displacement means 611 for varying the length of the reference arm, for example in the form of a translation plate 611 moving the reference mirror 605. The objective 610 of the reference arm can also be adjustable to maintain the reference mirror 605 in an object plane conjugate to the image plane formed by the sensor 602.

[0086] The device 6000 also comprises a second displacement means 608 whose function is to move the object plane conjugated with the image plane formed by the sensor 602, so as, for example, to sequentially image the interfaces 103 successive on the sensor 602. This displacement means 608 may comprise a system for moving the focusing objective 607 or lenses of this objective, for example with a linear or helical translation device. Alternatively or in addition, this displacement means 608 may comprise a translation device or plate for moving the device 6000 relative to the optical element 1000, or vice versa.

[0087] The device 6000 further comprises transverse displacement means (not shown) for moving the optical element 1000 relative to the measurement beam 606 in the XY plane, as well as angular displacement means (not shown) allowing the rotation of the optical element 1000 around the reference axis R, as described with reference to [Fig. 1].

[0088] With the measuring device 6000, when a surface or an interface 103 of an optical element 1000 appears in the coherence zone, an interference structure is obtained on the sensor resulting from the interference between the measuring beam 606 and the reference beam 616 for the field of view 108. Geometric information of the interfaces can be deduced from these interference structures.

[0089] The device according to the invention, for example implementing an interferometer according to the embodiment shown in [Fig.2], can be used to implement the steps of the method according to the invention which will be described subsequently.

[0090] [Fig. 3] is a schematic representation of a non-limiting exemplary embodiment of a measuring method according to the invention.

[0091] The method 10, shown in [Fig. 3], comprises a step 11 of relative displacement of the measuring beam 606 with respect to the optical element 1000 to be measured. This step 11 makes it possible to make the optical axis O of the interface to be measured 103 coincide with the measuring axis M of the measuring device 6000, the measuring axis M being materialized by the measuring beam. This relative displacement can be carried out by the transverse displacement means of the device 6000.

[0092] Step 11 of relative displacement of the measuring beam 606 can be carried out prior to the off-centering measurements and possibly geometric information measurements.

[0093] This step 11 can also be carried out after having determined a centering error by implementing the method 10 according to the present invention, to correct this centering error of the interface to be measured 103 and repeat the following steps of the method 10.

[0094] During a step 12 of the method 10, a coherence zone is positioned relatively at the level of an interface to be measured 103 of the optical element 1000.

[0095] If the depth of field of the focusing lens 607 is sufficient to obtain a signal from all the interfaces 103 of the element to be measured, by modifying the length optical of the reference arm, for example by moving the reference mirror 605, the coherence zone is moved in which interference between the measurement beams 606 and the reference beams 616 can form on the sensor 602. When this coherence zone passes through an interface 103, interference signals can be acquired at all points of the measurable field of view 108.

[0096] The method 10 may also comprise a step (not shown) of relative positioning of an object plane conjugated to the image plane on the sensor 602 at the interface to be measured 103.

[0097] Indeed, it is preferable to position the interface 103 to be measured in an object plane conjugate with the image plane located on the sensor 602, by varying the focusing distance of the measuring beam 606 so that the measuring beam is focused on the interface considered. This makes it possible to optimize the power recoupled in the imaging system and to measure the interface according to a field of view 108 with greater local slopes, thanks to better exploitation of the numerical aperture of the focusing objective 607.

[0098] The movement of the coherence zone can be carried out, for example, by moving the reference mirror 605.

[0099] The displacement of the object plane, to position it on the successive interfaces, is carried out, for example, by varying the distance Z between the focusing objective 607 and the optical element to be measured 1000, and / or by varying the focusing distance of the focusing objective 607 or other optical elements inserted in the measuring beam 606. The detection of the optimal focusing distance can be carried out based, for example, on a criterion of maximum recoupled power, or maximum image contrast or interference fringes.

[0100] The two movements, of the coherence zone and of the object plane, must therefore be carried out in a coordinated manner, where appropriate, so as to superimpose the coherence zone on the object plane considered.

[0101] During a phase 13 of image acquisition of the method 10, interference images are produced for different angular positions of the interface to be measured 103.

[0102] During a first measurement step 14, an interference signal is acquired from the interface to be measured 103 for a first angular position of the optical element 1000.

[0103] Then, during a rotation step 15, the optical element 1000 is moved angularly around the reference axis of the measuring device implemented. The rotation can be carried out, for example, with a rotating table on which the optical element is placed. The coherence zone is then moved from a first to a second position on the interface to be measured. The rotation can be continuous or intermittent.

[0104] During a second measurement step 16, another interference signal is acquired from the interface to be measured 103 for this second angular position of the optical element 1000.

[0105] When the measurements are carried out with a full-field interferometer, as illustrated in [Fig.2], full-field interference structures resulting from interference between the measurement beam and the reference beam for the entire field of view 108 are obtained directly on the optical sensor.

[0106] From each interference signal, an interference image is produced. An interference image can thus be obtained for different rotation angles of the interface positioned in the coherence zone. The interference image can be a phase image, an amplitude image or a topography image. Different known methods can be used to obtain an interference image from the interference signal, such as profilometric or digital holography methods.

[0107] The steps of measuring and rotating the optical element are repeated as many times as desired or necessary. Preferably, at least three interference images are acquired for three angular positions of the optical element 1000. Indeed, for the same measurement point on the measured interface, the corresponding interference signal on the optical sensor follows a circular trajectory when the optical element is rotated. The trajectory can be defined by the circle circumscribed by the triangle formed by three points, therefore three interference signals corresponding to a measurement point for three different angular positions of the optical element.

[0108] For example, between three and about 30 interference images per interface can be acquired.

[0109] [Fig.4] shows examples of topography images obtained by digital holographic microscopy (DHM). Images (a), (b) and (c) represent three interfaces placed one below the other in an optical objective, the interface imaged in image (a) being the upper interface. A vertex of each interface is identified and represented by a cross for each image. The vertices correspond to points of maximum height, and their coordinates are obtained in the reference frame of the optical sensor.

[0110] The center of each image is represented by the intersection of a vertical axis and a horizontal axis, respectively.

[0111] In the example of [Fig.4], it appears that the interfaces have centering errors, that is to say that the optical axis of one interface and the reference axis of the measuring device and / or the axis of another interface are different in position and direction. Indeed, the vertices of the interfaces appear off-center on the images. In a situation of perfect alignment of the axes, the vertex of the interfaces must be aligned with the intersection point indicated in the center of each image. For the implementation of the measurements shown in [Fig.4], the reference axis R is aligned with this intersection point.

[0112] During a processing phase 17, the acquired interference images are analyzed for each measured interface.

[0113] Processing phase 17 includes a step 18 of determining decentering information for the interface considered.

[0114] According to an exemplary implementation, this determination step 18 can be carried out by identifying the same point of interest in each interference image of the interface. This point of interest is a characteristic point, such as for example a point of maximum height or a characteristic shape appearing from one interference image to another. This point of interest is then tracked in all the images corresponding to different angles of rotation of the optical element around the reference axis R.

[0115] [Fig.5] shows an example of implementation of step 18 for determining the inclination of the optical axis of the interface and the decentering of the measurement axis relative to the measured interface.

[0116] [Fig.5] shows the examples of topography images of [Fig.4] representing three interfaces placed one under the other, in which the displacement of the vertices during rotation of the optical element, i.e. all of its angular displacements, is indicated by circles.

[0117] It should be noted that the point of greatest height of an interface does not necessarily correspond to its apex. Indeed, when the interface is inclined relative to the measurement axis (for example an inclined lens), the top of the interface can lower to leave room for a new point of maximum height. This deviation causes precision errors in the measurement of the positions of the apexes.

[0118] The circles visualize the alignment errors between the optical axis O of each interface with respect to the measurement axis M.

[0119] For the upper interface shown in [Fig.5](a), the center of the circle corresponds to the intersection of the rotation axis R with this upper interface, and the radius of the circle corresponds to the offset of the point of maximum height of this interface relative to this axis R.

[0120] For the buried interfaces shown in Figures 5(b) and (c), i.e., the interfaces that are "seen" by the measurement beam 606 through other optical interfaces, the parameters of the circle obtained include the displacements of the measurement beam due to the decentering errors of the previous interfaces, as well as the radius of the circle. The interpretation of the parameters of the circles must therefore take into account the propagation of the measurement beam to and from the measured interface.

[0121] According to another example of implementation of step 18 of determining decentering information, a possible misalignment between the measuring beam and the reference axis of the measuring device can be identified and determined. Indeed, to move the object plane on the successive interfaces, the distance between the focusing objective 607 and the optical element to be measured 1000 can be varied by moving one or the other in the Z direction. This translation can introduce alignment errors, and the measuring beam 606 may no longer coincide with the reference axis R of the measuring device 6000.

[0122] As a result, the centers of the circles as described previously no longer correspond to the rotation axis O of the optical element 1000. Thus, for each interface 103, a different circle center is obtained by acquiring the interference images according to the different rotation angles. The position of the origin of the circle depends on the centering error provided by the relative displacement between the focusing objective 607 of the measuring device 6000 and the optical element 1000. Knowledge of the relative positions of the origins of the circles makes it possible to obtain information on these centering errors.

[0123] In the embodiment of the method 10 shown in [Fig.3], the step 18 of determining decentering information is carried out after the phase 13 of image acquisition. According to another embodiment, the step of determining decentering information can also be carried out simultaneously with the image acquisition phase. Indeed, each interference image can be analyzed directly after it has been obtained.

[0124] According to the embodiment of the method 10 shown in [Fig.3], the processing phase 17 further comprises a step 19 of correcting the centering errors determined in the previous step 18. This correction step 19 aims to make the optical axis O of the interface considered coincide with the measurement axis M.

[0125] According to one embodiment, correction step 19 can be carried out digitally.

[0126] The centering errors are calculated from the analysis of the interference images, as described above for step 18 of method 10.

[0127] With reference to the example shown in [Fig.5], the centers of the circles may be referenced relative to a reference point on the optical sensor (e.g. its center) or relative to the center of a circle on another surface. The diameters of the circles may also be evaluated with known methods, taking into account the distances and relative alignments between the elements of the measuring device and, if necessary, the propagation of the measuring beam and the reflected beam through the interfaces upstream of the measured interface.

[0128] The centering errors can thus be calculated and used to correct measured values, such as geometric information of the interface considered, or to place them in a common reference frame to be able to compare or manipulate them with those of other measured interfaces of the optical element.

[0129] According to one embodiment, the method according to the invention may further comprise a step of correcting the centering errors carried out mechanically. This step may be carried out alternatively or in addition to the step 19 of digital correction described above. In the embodiment of the method 10 shown in [Fig. 3], the mechanical correction step is visualized by the step 11 of relative displacement of the measuring beam with respect to the optical axis of the interface to be measured. Indeed, the mechanical correction step is particularly of interest for repeating the steps of the method, with the objective of determining geometric information of interfaces as accurately as possible.

[0130] According to one example, the optical element 1000 can be moved relative to the measuring beam 606 in a plane perpendicular to the reference axis R. The alignment of the measuring beam 606 is thus adjusted relative to an interface to be measured, for example when the measuring beam is not centered on the apex of the interface.

[0131] According to another example, the correction step 19 can be carried out by rotating the optical element 1000 in a plane containing the reference axis R. The alignment of the measurement beam 606 is thus adjusted angularly relative to an interface to be measured, for example when the optical element is inclined relative to the measurement axis.

[0132] Of course, these translational and rotational movements can also be carried out cumulatively.

[0133] With reference to the example presented in [Fig.5], each circle can be centered by translation of the optical element 1000 in the plane perpendicular to the reference axis R, and by rotation in a plane passing through this reference axis R so that its center coincides with or approaches a reference point of the image. This reference point of the image can correspond to an average of the intersections of the rotation axis R with the different coherence zones of the beam moved by the positioning means. Thus, it is preferable to align the reference axis R with the axis M of the measurement beam 606 so that these intersections of the rotation axis R with the different coherence zones of the measurement beam directly form only one point.

[0134] Still with reference to the example presented in [Fig.5], the diameter of each circle can be reduced by rotation of the optical element 1000 along a plane perpendicular to the reference axis R so that the optical axis O of the interface considered and the reference axis R are aligned in the same direction and brought together by translation to preferably coincide.

[0135] When all the maximum height points of the interference images overlap at or sufficiently close to the center of the optical sensor, the summit or apex of the interface has been identified. The height of the summit can then be obtained accurately in a reference frame of the measuring device.

[0136] Thus, ideally, the measuring device is aligned prior to measurements of the optical element, in particular to determine geometric information, so that the measuring axis M coincides with the axis of rotation of the optical element.

[0137] According to one example, the beam thus reflected by a reference plane interface can be detected by the optical sensor, the latter being able to be adjusted relatively to place the reflected beam centered on the sensor.

[0138] According to another example, a transparent ball can be used to carry out this preliminary alignment. The ball is translated on a rotation table to minimize the radius of the circle obtained at the top point of the ball (called H). Then, the measurement axis M is aligned by rotation so that the radius of the circle (during rotation) described by the bottom point B, seen through the ball, is canceled. Preferably, and if necessary, the focusing objective of the device can also be translated to bring the points H and B towards the center of the image in order to keep the largest possible observation area for the interface circles to be measured. The point H can be memorized as the center of the measuring device for the next steps of rotation and translation of the optical element 1000.

[0139] According to the embodiment of the method 10 shown in [Fig. 3], the processing phase 17 comprises a step 20 of determining geometric information of the measured interface. This determination step 20 is carried out using the correction of the centering errors carried out in the previous step 19. During this step 20, all or a subset of the interference images for an interface to be measured are digitally processed in order to deduce geometric information of this interface.

[0140] From interference images, positional information (or topography) can be obtained. A characteristic measurement designating the raw position for each interface is produced.

[0141] According to one example, this characteristic measurement may be the relative position of the measured interface. The relative position may be indicated, for example, by the positions of positioning motors or relative displacement of the interface relative to the focusing lens, in the three directions X, Y and Z.

[0142] According to a second example, the characteristic measurement can be the amplitude of the peaks corresponding to envelopes of interferograms obtained for all of the measured interfaces.

[0143] For the digital processing of the interference signals obtained on the optical sensor, known methods can be implemented, such as algorithms based on phase-shift interferometry (PSI) or vertical scan interferometry (VSI), or digital holography microscopy (DHM).

[0144] Determination step 20 thus provides a set of geometric information on the measured interfaces: - coordinates in the reference frame of the measuring device, these coordinates being able to include, for each interface, the positions of points of interest such as apices, summits, valleys, etc., - relative positions by comparing the coordinates of points of interest belonging to different interfaces, - distances between apices.

[0145] According to a non-limiting embodiment (not shown), the processing phase 17 of the method according to the invention may comprise a correction step to take into account the media crossed by the measuring beam. This correction may be applied to the optical or geometric distances and positions obtained previously.

[0146] According to a first example, this correction step can be carried out by using models of propagation of electromagnetic waves through the different materials and interfaces up to the interface considered, including all the optical components of the measuring device and the interfaces of the optical element to be measured 1000 crossings.

[0147] According to a second example, the correction step can be carried out by calculating a point spread function (PSF) or an optical transfer function (in the Fourier domain) of the optical system crossed by the measuring beam up to the interface considered, including all the optical components of the measuring device and the interfaces of the optical element to be measured crossed.

[0148] The correction step can also be performed using design information on the optical element, when available.

[0149] Advantageously, the correction step can be implemented prior to steps 18, 19 and 20 of the processing phase 17 described above, so that these steps can be carried out on data corrected for optical propagation effects.

[0150] Of course, the invention is not limited to the examples which have just been described and numerous adjustments can be made to these examples without departing from the scope of the invention.

Claims

1. Claims A measuring method (10) for determining geometric information of an interface (103) to be measured of an optical element (1000) relative to a measuring axis (M), the optical element (1000) comprising at least two interfaces, the method (10) being implemented by a measuring device having a reference axis (R) aligned with the measuring axis (M) and comprising interferometric measuring means (6000) with at least one optical sensor (602) and at least one low-coherence light source (612) configured to direct a measuring beam (606) along the measuring axis (M) towards the optical element (1000) so as to pass through at least one of the at least two interfaces and to be reflected by the interface (103) to be measured and generate a reflected measuring beam, and to selectively detect an interference signal resulting from interference between the reflected measuring beam and a reference beam (616), the device further comprising positioning means (608,611) and digital processing means, characterized in that said method (10) comprises the following steps:, relative positioning (12), by means of positioning (608, 611) of a coherence zone of the light source (612) at an interface (103) to

2.

3.

4. measure; - at least a first measuring step (14) and a second measuring step (16) of the interface (103) by the interferometric measuring means, so as to produce an interference image per measuring step from respective interference signals; - rotation (15) of the optical element (1000) around the reference axis (R) between the measuring steps (14, 16); - processing (17), by the digital processing means, of the at least two interference images, so as to obtain information relating to the interface (103), the processing step (17) comprising a step (18) of determining information on the decentering of the interface (103), the decentering corresponding to an alignment error between an optical axis (O) of the interface (103) to be measured and the measurement axis (M); and - correction of the interface decentering by making the optical axis (O) of the interface to be measured coincide with the measurement axis (M), - reiteration of the steps of relative positioning (12), measurement (14, 16), rotation (15) and processing (17), - the processing step (17) further comprising a step (20) of obtaining geometric information of the interface to be measured using the decentering correction. Method (10) according to claim 1, characterized in that the processing step (17) comprises the identification of the same point of interest in each interference image. Method (10) according to claim 1 or 2, characterized in that the correction step is carried out by a displacement of the optical element (1000) relative to the measuring beam in a plane perpendicular to the reference axis (R). Method (10) according to any one of the preceding claims, characterized in that the correction step is carried out by a rotation of the optical element (1000) in a plane containing the reference axis (R).

5. Method (10) according to any one of the preceding claims, characterized in that the processing step (17) further comprises a step (19) of digital correction of the decentering of the interface.

6. Method (10) according to any one of the preceding claims, characterized in that the step (18) of determining decentering information further comprises a propagation correction step taking into account optical propagation effects undergone by the measurement beam when crossing interfaces of the optical element (1000).

7. Method (10) according to any one of the preceding claims, characterized in that at least the step (12) of positioning the coherence zone, the steps (14, 16) of measurement and the at least one step (15) of rotation are implemented sequentially for the determination of the information relating to different interfaces to be measured.

8. A method (10) according to any preceding claim, characterized in that the interference image comprises one of a phase image, an amplitude image and a topography image.

9. Measuring device, for determining geometric information of an interface (103) to be measured of an optical element (1000) relative to a measurement axis (M), the optical element (1000) comprising at least two interfaces, the device having a reference axis (R) aligned with the measurement axis (M) and comprising: interferometric measuring means (6000) comprising at least one low coherence light source (612) and at least one optical sensor (602), configured to: • form at least one measuring beam (606) and at least one reference beam (616), • direct the measuring beam (606) along the measuring axis (M) towards the optical element so as to pass through at least one of the at least two interfaces and to be reflected by the interface (103) to be measured and generate a reflected measuring beam, • selectively detecting a plurality of interference signals resulting from interference between the reflected measurement beam and the reference beam (616) for a plurality of measurement points on the interface (103), to produce an interference image; positioning means (608, 611) configured to relatively position a coherence zone of the light source at the interface (103) to be measured; angular displacement means configured to allow rotation of the optical element (1000) around the reference axis (R); and digital processing means configured to determine information relating to the interface (103) from at least two interference images produced at different angular positions of the optical element (1000), the digital processing means being configured to determine information on the decentering of the interface (103), the decentering corresponding to an alignment error between an optical axis (O) of the interface (103) to be measured and the measurement axis (M); and means for correcting the decentering of the interface by making the optical axis (O) of the interface to be measured coincide with the measurement axis (M); - the device being configured to repeat the relative positioning, the measurements, the rotation and the processing, - the digital processing means being further configured to obtain geometric information of the interface to be measured using the decentering correction.

10. Device according to claim 9, characterized in that the interferometric measuring means (6000) comprise an interferometric sensor, called a full-field interferometric sensor, configured to detect a full-field interference signal in the field of view.

11. Device according to claim 9 or 10, characterized in that it further comprises displacement means configured to move the optical element (1000) relative to the measuring beam in a plane perpendicular to the reference axis (R).

12. Device according to any one of claims 9 to 11, characterized in that the angular displacement means are further configured to allow rotation of the optical element (1000) in a plane containing the reference axis (R).

13. Device according to any one of claims 9 to 12, characterized in that the positioning means (608, 611) are configured to position the coherence zone successively at different interfaces of the optical element.

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