Optoelectronic device and associated manufacturing process

The integration of a light confinement layer with porous alumina and reflective walls in optoelectronic devices addresses optical crosstalk and manufacturing complexity, enhancing light conversion efficiency and integration in display and projection systems.

FR3156994B1Active Publication Date: 2026-06-26COMMISSARIAT A LENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES

Patent Information

Authority / Receiving Office
FR · FR
Patent Type
Patents
Current Assignee / Owner
COMMISSARIAT A LENERGIE ATOMIQUE ET AUX ENERGIES ALTERNATIVES
Filing Date
2023-12-18
Publication Date
2026-06-26

AI Technical Summary

Technical Problem

Optical crosstalk phenomena and complex manufacturing processes are prevalent in existing optoelectronic devices with light-emitting diodes and light color converters, leading to inefficient light conversion and integration challenges.

Method used

The use of a light confinement layer with reflective walls and porous alumina structures above light-emitting diodes, optimized through anodization, to enhance light extraction and reduce crosstalk, combined with simplified manufacturing processes.

Benefits of technology

The solution significantly improves light conversion efficiency and reduces optical crosstalk while simplifying the manufacturing process, enabling easier integration of optoelectronic devices in display screens and image projection systems.

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Abstract

Title: Optoelectronic device and associated manufacturing method The invention relates essentially to an optoelectronic device 1 comprising: a stack 11 comprising: a plurality of light-emitting diodes 111 arranged at a distance from each other, and a plurality of electrically conductive pads 112 arranged between the diodes, a light confinement layer 12 extending over the stack and comprising reflective walls 121 defining spaces 10 located at the right of each diode, the device being such that the confinement layer further comprises porous alumina 122 in at least one of said spaces 10, the porous alumina having, in at least one space, preferably in at least two of said spaces, or even in each space, among said at least certain spaces, at least two pores 1221 open on a first face 12a of the confinement layer which is located opposite the stack.Optical crosstalk phenomena are thus advantageously reduced. Figure for the abbreviation: Fig.1.
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Description

Title of the invention: Optoelectronic device and associated manufacturing process technical field

[0001] The present invention relates to an optoelectronic device, in particular intended for use in a display screen or an image projection system. The present invention also relates to a method for manufacturing such an optoelectronic device. STATE OF THE ART

[0002] Optoelectronic devices exist that comprise a matrix of light-emitting diodes having an emission surface coated at least partially by light color converters. Such optoelectronic devices can form display screens or image projection systems comprising a matrix of luminous pixels of different colors.

[0003] Light-emitting diodes can be formed from a semiconductor material comprising elements from columns III and V of the periodic table, such as an IILV compound, in particular gallium nitride (GaN), indium gallium nitride (InGaN), or gallium aluminum nitride (AlGaN). They are arranged to form a matrix of light-emitting diodes having an emission surface through which the light emitted by the light-emitting diodes is transmitted.

[0004] In the case of a display screen or image projection system, the optoelectronic device may thus comprise a matrix of luminous pixels, each luminous pixel comprising one or more light-emitting diodes (LEDs). In order to obtain luminous pixels emitting light of different colors, for example blue, green, or red, the LEDs may be adapted to emit blue light, and some luminous pixels may be associated with light color converters, such as photoluminescent pads, adapted to absorb the blue light emitted by the LEDs and to emit, in response, green or red light. The photoluminescent pads are usually formed of a binding matrix, referred to below as a resin, comprising particles of a photoluminescent material such as yttrium aluminum garnet (YAG) activated by the cerium ion YAG:Ce..

[0005] The emission of light-emitting diodes, and therefore of pixels, is more or less angularly directional, and optical crosstalk phenomena can be generated between pixels or between diodes. electroluminescent. In addition, the use of light color converters, such as the photoluminescent pads introduced above, can accentuate these optical crosstalk phenomena.

[0006] To limit these phenomena, it has been proposed to optically isolate the pixels from each other, either by adding an absorbing matrix (or "black matrix" in English) between the pixels, or, more advantageously, by adding lateral mirrors, preferably made of aluminum or silver, on the sides of the photoluminescent pads. Manufacturing processes for said side mirrors are described in patent documents referenced FR3101130 Al, FR3061358 Al, FR3083370 Al, FR3087580 Al and US2023 / 0033031 Al. More specifically, these references propose various techniques for manufacturing cavities above blue pixels to fill them with a resin loaded with quantum dots (QDs) for converting the blue light emitted by the pixels into green or red light.However, these techniques require numerous technological steps (SiO2 deposition, lithography, atomic layer deposition (ALD), etching, disassembly, aligned transfer, etc.), making their integration complex. The article by Siontas et al. entitled "Broadband visible-to-telecom wavelength germanium quantum dot photodetectors," published in APPLIED PHYSICS LETTERS 113, 251901 (2018), describes a filling of the cavities using QDs suspended in a solvent, which then evaporates (drying), leaving only the QDs. It is specifically disclosed to deposit, in the cavities of a nanoporous alumina matrix, CsPbBr3-based perovskite QDs diluted in dimethyl sulfoxide (or DMSO) as a solvent, and to heat them in a second step to evaporate the dimethyl sulfoxide.

[0007] Furthermore, it is known from patent document referenced EP2708492 Bl, of a mesoporous layer comprising coupling aggregates of light absorbers and converters (or "J-aggregates" in English) and quantum boxes (or points) allowing to increase the energy transfer between fluorescent particles (or "Forster resonance energy transfer" or FRET in English) and therefore the emission rate of an assembly comprising such a mesoporous layer.

[0008] An objective of the present invention is to propose an optoelectronic device, in particular intended to equip a display screen or an improved image projection system, relative to existing optoelectronic devices, in particular by reducing optical crosstalk phenomena.

[0009] An objective of the present invention is to provide such a device with a better light conversion rate. As an alternative or complement, an objective The aim of the present invention is to propose such a device whose manufacturing process is simpler, or at least no more complex, than existing processes.

[0010] Another objective of the present invention is to propose an optoelectronic device and an associated manufacturing process that are of more immediate technological integration than the solutions of prior Part. SUMMARY

[0011] To achieve this objective, according to a first aspect of the invention, an optoelectronic device is provided comprising: a. a stack comprising: i. a plurality of PN junction light-emitting diodes arranged at a distance from each other, and ii. a plurality of electrically conductive pads arranged between the light-emitting diodes, the electrically conductive pads being electrically isolated from at least one p or n region of the PN junctions of the light-emitting diodes, b. a light confinement layer extending over the stack and comprising reflective walls defining or delimiting between themselves spaces or volumes each located at the right of at least one, preferably of each, light-emitting diode.

[0012] The optoelectronic device is essentially such that the light confinement layer further comprises porous alumina in at least some of said spaces, the porous alumina having, in at least one space, preferably at least two spaces, or even in each space, among said at least some of said spaces, at least two pores open on a first face of the confinement layer which is located opposite the stacking.

[0013] To take advantage of the optical scattering properties of (nano)porous alumina, the pores of the porous alumina preferably have transverse dimensions between 1 and 500 nm, and more preferably between 50 and 400 nm. Also to take advantage of the optical scattering properties of nanoporous alumina, as an alternative or complement to the previous preference, the pores of the porous alumina preferably have a periodicity between 200 and 700 nm. Thus, it is advantageous to have several pores above at least one, preferably above each, light-emitting diode, and therefore a fortiori per pixel, in order to maximize the optical properties of the optoelectronic device. Furthermore, the size of the pores is preferably larger than the size of the color conversion particles that one wishes to insert into them, so that at least one color conversion particle can be placed in each pore.

[0014] According to an example of the first aspect of the invention, the porous alumina has, in at least one space, preferably at least two spaces, or even in each space, among at least some of said spaces, at least eight pores open on the first face of the containment layer located opposite the stack. This results in better extraction of the light emitted by the underlying light-emitting diode(s).

[0015] According to an example of the first aspect of the invention, alternative to the previous one, the porous alumina has, in at least one space, preferably at least two spaces, or even in each space, among said at least some of said spaces, at least one pore every 2xX, where X represents the wavelength to be extracted and at least four pores per space (Ipm pixel case).

[0016] According to an example of the first aspect of the invention, at least one, preferably each, open pore on the first face of the containment layer located opposite the stack has a filling rate, in the light color conversion material, of substantially 30%. This optimizes the color conversion rate. More specifically, compared to the prior art, which consists of an Al2O3 pore above an LED, the conversion rate obtained here is significantly better.

[0017] According to a second aspect of the invention, a method for manufacturing an optoelectronic device is provided, the method comprising the following steps: a. Provide a stack comprising: i. a plurality of PN junction light-emitting diodes arranged at a distance from each other, and ii. a plurality of electrically conductive pads arranged between the light-emitting diodes, the electrically conductive pads being electrically isolated from at least one p or n zone of the PN junctions of the light-emitting diodes, b. to form, on the stack, a light confinement layer comprising reflective walls defining or delimiting between themselves spaces or volumes located each directly above at least one, preferably each, light-emitting diode, by: i. deposition of an aluminum-based layer on a main face of the stack by which the light-emitting diodes are configured to emit, then ii. anodizing of the aluminium-based layer at least outside areas located directly above the conductive pads of the stack.

[0018] The process is essentially such that the anodizing is parameterized so that porous alumina is formed in at least some of said spaces, presenting, in at least one space, preferably at least two spaces, or even in each space, among said at least some of said spaces, at least two pores open on a first face of the confinement layer which is located opposite the stacking.

[0019] According to a third aspect of the invention, a display screen or projection system for at least one image is provided, comprising at least one optoelectronic device as introduced above.

[0020] It is thus advantageous to take advantage of the preferentially anisotropic nature of aluminum anodization. Indeed, the optoelectronic device can include a space filled with porous alumina above each light-emitting diode, and since the porous alumina has pores with a high aspect ratio, the confinement of light by the confinement layer is improved, in particular by increasing the diffusion in each pore of the light emitted by the underlying light-emitting diode, and thereby reducing optical crosstalk phenomena beyond what reflective walls alone allow, especially when the pores of the porous alumina are filled with a light color conversion material.

[0021] It will subsequently become apparent that the optoelectronic device as introduced above can be an intermediate product intended for the manufacture of a more advanced optoelectronic device. In this context, it should be noted that the porous alumina filling the space above each light-emitting diode has at least the advantage of easily allowing deep and anisotropic etching of this space.

[0022] Considering the optoelectronic device as introduced above as an intermediate product, it is still advantageously possible, thanks to this intermediate product, to manufacture optoelectronic devices that are even more improved, or in a more convenient way, relative to existing ones. BRIEF DESCRIPTION OF THE FIGURES

[0023] The aims, objects, features and advantages of the invention will become clearer from the detailed description of an embodiment thereof, which is illustrated by the following accompanying drawings in which:

[0024] [Fig. 1] [Fig. 1] represents a cross-sectional view of part of an optoelectronic device according to a first embodiment of the invention or an intermediate product enabling obtaining an optoelectronic device according to the second embodiment shown in [Fig. 2].

[0025] [Fig.2] Fig.2 represents a cross-sectional view of part of a device optoelectronic according to a second embodiment of the invention.

[0026] [Fig.3] [Fig.3] represents a cross-sectional view of part of an optoelectronic device according to a third embodiment of the invention or an intermediate product enabling the obtaining of an optoelectronic device according to the fourth embodiment shown in [Fig.4].

[0027] [Fig. 4] Fig. 4 shows a cross-sectional view of part of a device optoelectronic according to a fourth embodiment of the invention.

[0028] [Fig.5] [Fig.5] represents a cross-sectional view of part of an optoelectronic device according to a variant of the first embodiment of the invention which is illustrated in [Fig.1].

[0029] [Fig.6] [Fig.6] represents a cross-sectional view of part of an optoelectronic device according to a variant of the second embodiment of the invention which is illustrated in [Fig.2].

[0030] [Fig. 7] Fig. 7 shows a cross-sectional view of part of a device optoelectronic according to a variant of the third embodiment of the invention which is illustrated in [Fig.3] or an intermediate product enabling an optoelectronic device to be obtained according to a variant of the fourth embodiment which is illustrated in [Fig.8].

[0031] [Fig.8] [Fig.8] represents a cross-sectional view of part of an optoelectronic device according to a variant of the third embodiment of the invention which is illustrated in [Fig.3].

[0032] [Fig. 9] Figures 9 to 12 schematically illustrate steps in a method of setting implementation of a manufacturing process for an optoelectronic device as illustrated in [Fig.1].

[0033] [Fig. 10]

[0034] [Fig.1 1]

[0035] [Fig. 12]

[0036] [Fig. 13] Figures 13 to 15 schematically illustrate steps in an implementation method of a manufacturing process for an optoelectronic device as illustrated in [Fig. 5].

[0037] [Fig. 14]

[0038] [Fig. 15]

[0039] [Fig. 16] The [Fig. 16] represents a cross-sectional view of part of an optoelectronic device according to a fifth embodiment of the invention.

[0040] [Fig. 17] [Fig. 17] represents a cross-sectional view of part of an optoelectronic device (where appropriate without the element referenced 2200) according to a first variant of the fifth embodiment of the invention which is illustrated in [Fig. 16]. Fig. 17 can alternatively be seen as a step in a manufacturing process of the optoelectronic device as illustrated in Fig. 18 from that illustrated in Fig. 16,

[0041] Fig. 18 Fig. 18 represents a cross-sectional view of part of an optoelectronic device according to a variant of the fifth embodiment of the invention which is illustrated in Fig. 16.

[0042] The drawings are given by way of example and are not limiting of the invention. They constitute schematic representations of principle intended to facilitate understanding of the invention and are not necessarily to scale in practical applications. In particular, the thicknesses and other dimensions of the various layers and other elements illustrated are not necessarily representative of reality, and are not necessarily to scale. DETAILED DESCRIPTION

[0043] Before proceeding with a detailed review of embodiments of the invention, optional features of the first aspect of the invention are stated below, which may be used in combination or alternatively:

[0044] According to one example, each of the spaces is filled with porous alumina.

[0045] According to one example, the pores of porous alumina form channels opening on the first face of the containment layer. The pores of the porous alumina thus have a significantly strong form factor, so as to further increase the diffusion in each pore of the light emitted by the underlying light-emitting diode.

[0046] According to one example, the pores of the porous alumina form channels extending mainly in a direction perpendicular to the first surface of the confinement layer. The longitudinal dimensions of the pores are preferably greater than their transverse dimensions.

[0047] According to one example, at least some of the pores, preferably all of the pores, have a length dimension Lp, measured in projection along a direction perpendicular to the first face, strictly less than a thickness E12 of the confinement layer, and preferably less than 2 nm; thus, a few nm of alumina or aluminum remain at the bottom of the pores. The confinement layer may have a thickness E12 of between 500 nm and 10 pm or more.

[0048] According to one example, the pores extend substantially to the stack, potentially without reaching it, but preferably reaching it so as not to lose optical efficiency. The risk of delamination of the confinement layer from the stack is mechanically limited because the stability of the structure can be ensured by the non-porified Al pillars above the contacts, while taking advantage of an even stronger form factor of the pores of the porous alumina.

[0049] According to one example, at least one pore, preferably each pore, has a shape factor defined by transverse dimensions substantially between 40 nm and 800 nm, and / or a longitudinal dimension substantially between 500 nm and 10 pm or more, and preferably a longitudinal dimension substantially between 1 pm and 5 pm.

[0050] In addition or as an alternative, the pores open on the first face of the containment layer may occupy an area substantially equal to 30% of the total area of ​​this containment layer and / or the pores open above at least one light-emitting diode which are adjacent to each other may be separated in pairs, by their centers, by a distance substantially equal to a wavelength of the light emitted by the underlying light-emitting diode, this wavelength typically belonging to the blue light spectrum, i.e. for example between 380 and 450 nm. This allows us to take advantage of the fact that the anodization of aluminum can be parameterized in a known and controlled way to ensure that the pores formed have dimensions that allow them to be filled, in particular by different light color conversion materials.

[0051] According to one example, the stacking further comprises: a. a load-bearing substrate, b. an emissive structure matrix extending over the carrier substrate, the emissive structure matrix comprising the plurality of light-emitting diodes extending over the carrier substrate via an interfacing (or bonding) layer and the plurality of electrically conductive pads extending either directly over the carrier substrate or via an electrically insulating wall. At least one, preferably each, emissive structure comprises at least one light-emitting diode and at least a portion of each of the adjacent electrically conductive pads, with an electrically insulating wall separating, where appropriate, at least partially the light-emitting diode and each of the adjacent electrically conductive pads to avoid short-circuiting at least one p or n region of the PN junctions of the light-emitting diodes.

[0052] According to one example, at least one, preferably each, emissive structure further comprises at least one electrical insulation wall or dielectric wall, possibly partial: a. between at least one electrically conductive pad and at least one adjacent light-emitting diode, and / or b. between at least one electrically conductive pad and the supporting substrate.

[0053] According to one example, at least one, preferably each, emissive structure further comprises dielectric walls of which first dielectric walls extend between at least one, preferably each, conducting pad and the interfacing layer and second dielectric walls extend over at least a part of the lateral sides of each conducting pad, the first and second dielectric walls preferably being joined together, so that each conducting pad is electrically insulated over a part of its perimeter.

[0054] According to one example, the carrier substrate comprises at least one application-specific integrated circuit (ASIC) and at least one electrical connection pad between said integrated circuit and at least one, for example several, of the light-emitting diodes. In addition or alternatively, the stack further comprises an electrode layer based on a conductive and transparent material, such as indium tin oxide (ITO), the electrode layer extending, where appropriate continuously, between on the one hand the plurality of light-emitting diodes and electrically conductive pads and on the other hand the light-confinement layer.

[0055] According to one example, at least one, potentially each, reflective wall is aluminum-based.

[0056] According to one example, at least a part of an outer perimeter, in particular lateral, of at least one, preferably of each, reflective wall is based on or is made of aluminium.

[0057] According to one example, at least one electrically conductive pad is made of aluminum; where applicable, said at least one electrically conductive pad and the reflective wall located directly above said at least one electrically conductive pad form a homogeneous volume of material (or "bulk"). The electrically conductive pads can thus advantageously be made of the same material as that from which the reflective walls are made, which simplifies the device and its manufacturing process, in particular by avoiding a technological step of deposition, for example by electrodeposition, of electrically conductive pads made of a metallic material other than aluminum, for example copper.

[0058] According to one example, at least one, potentially each, reflective wall is based on porous alumina and a reflective material located in the pores of the porous alumina.

[0059] According to one example, the optoelectronic device further comprises a light color conversion material located in the pores of the porous alumina located opposite at least one light-emitting diode, preferably opposite each Light-emitting diode. Optical crosstalk is further advantageously reduced. In this example, the light-color conversion material is grafted onto the internal pore walls. This strengthens the surface / conversion particle interactions and improves pore filling with the particles. Furthermore, grafting the conversion particles onto the internal pore walls allows them to better withstand flux, potentially ensuring improved aging resistance of the optoelectronic device.

[0060] According to one example, the light color conversion material is located in, and where appropriate filled, at least one, for example at least some, preferably each, of the pores (or channels) formed by the porous alumina.

[0061] According to one example, the light confinement layer is free of porous alumina in at least one, potentially in several, of said spaces.

[0062] According to the preceding example, at least one, preferably each, space free of porous alumina is filled with a light color conversion material. It is thus possible to design an optoelectronic device with different configurations of its confinement layer depending on the light-emitting diode or group of light-emitting diodes considered, said group potentially constituting a pixel. The proposed optoelectronic device therefore advantageously exhibits modularity in this respect.

[0063] According to one example, the light color conversion material comprises at least the following: a. quantum dots, b. coupling aggregates of light absorbers and converters (or "J-aggregates" in English), c. phosphorescent (or fluorescent) nanoparticles, and d. perovskites, where appropriate, dissolved in a solvent or incorporated into a resin. Advantageously, the various light color conversion materials commonly used in display screens and other image projection systems can be inserted into the pores of porous alumina, and are therefore usable within the scope of the present invention.

[0064] According to one example, the light color conversion material filling at least one, preferably every, space free of porous alumina comprises at least one selected from: a. quantum dots, and b. coupling aggregates of light absorbers and converters (or "J-aggregates" in English).

[0065] According to one example, the light-emitting diodes are configured to emit light of a first determined wavelength, for example the color blue, in a direction substantially perpendicular to the first face of the confinement layer.

[0066] In addition or as an alternative, the light colour conversion material is suitable for converting the emitted light at the first wavelength into a light having a second wavelength different from the first, for example the first wavelength being located in the blue and the second wavelength being located in one of the green and the red.

[0067] It is understood that the optional features stated above can each qualify, as an alternative to the first aspect of the invention as introduced above, an optoelectronic device comprising: a. a stack comprising: i. a plurality of light-emitting diodes arranged at a distance from each other, and ii. a plurality of electrically conductive pads arranged between the light-emitting diodes, b. a light confinement layer extending over the stack and comprising reflective walls defining or delimiting between each other spaces or volumes located each at the right of a light-emitting diode.

[0068] The following are optional features of the second aspect of the invention which may be used in combination or alternatively:

[0069] According to one example, the aluminum-based layer is deposited so as to have a thickness substantially between 500 nm and 10 pm, preferably substantially between 1 and 6 pm.

[0070] According to one example, the anodizing step of the aluminum-based layer is parameterized so that the porous alumina forms channels opening through the pores on the first face of the containment layer, and preferably so that at least one channel, for example each channel, has transverse dimensions substantially between 40 nm and 800 nm, and / or a longitudinal dimension substantially between 500 nm and 10 pm, preferably substantially between 1 and 6 pm.

[0071] According to one example, the anodizing step of the aluminum-based layer is parameterized so that at least some of the pores (or channels) have a length dimension Lp, taken in projection along a direction perpendicular to the first face, strictly greater than half of a thickness E12 of the containment layer.

[0072] According to one example, the anodizing step of the aluminum-based layer is parameterized so that at least some of the pores (or channels) have a length dimension Lp, measured in projection along a direction perpendicular to the first face, that is at most equal to, and preferably strictly less than, for example by 2 nm, the thickness of the aluminum-based layer. This limits the risk of delamination of the containment layer from the stack.

[0073] According to one example, the process further comprises, following the deposition of the aluminum-based layer and before its anodizing: a. Apply a mask to areas of the aluminum-based layer that are located approximately directly above the conductive pads of the stack, the mask having openings positioned directly above the light-emitting diodes, the anodizing of the aluminum-based layer being carried out through the openings of the applied mask. The mask may be based on silicon oxide or silicon nitride (SiN).

[0074] According to one example, the step of providing the stack includes the deposition of aluminum between the light-emitting diodes to form at least a portion of the plurality of electrically conductive pads in the stack, and this deposition step is extended to carry out the deposition of the aluminum-based layer. In this way, the formation of the electrically conductive pads and the formation of the aluminum layer can be implemented in a single technological step of aluminum deposition.

[0075] According to one example, the manufacturing process further comprises the deposition of a light-color conversion material in the pores of the porous alumina, at least in one, preferably some, for example, each of said spaces. According to this example, the conversion material and / or the internal pore walls are functionalized, prior to the deposition of the light-color conversion material in the pores of the porous alumina, so as to obtain a grafting of one or the other, for example by surface -OH bonds, created where appropriate by treatment with alkaline chemistry or by treatment with dry plasma or by adsorption of a ligand.

[0076] According to an alternative example to the previous one, the manufacturing process comprises removing, for example by etching, the porous alumina from at least one, for example some, of said spaces, and filling at least one of the spaces thus hollowed out with a light-color conversion material. This takes advantage of the known possibility of selectively etching the relatively porous alumina. to aluminum and the anisotropic nature of aluminum anodizing, to obtain reflective walls that are very flat and substantially perpendicular to the face of the stack through which the light-emitting diodes are configured to emit.

[0077] According to one example, the anodizing step includes anodizing a portion of the aluminum-based layer located over at least one electrically conductive pad and depositing a reflective material in the pores of the porous alumina located over said at least one electrically conductive pad.

[0078] A layer, wall, block or element based on a material A is understood to mean a layer, wall, block or element comprising that material A and possibly other materials, respectively.

[0079] A parameter "approximately equal to / greater than / less than" a given value means that this parameter is equal to / greater than / less than the given value, to within 20% or 10% of that value. A parameter "approximately between" two given values ​​means that this parameter is at least equal to the smaller of the given values, to within 20% or 10% of that value, and at most equal to the larger of the given values, to within 20% or 10% of that value.

[0080] It is specified that, within the framework of the present invention, the terms "on", "overcomes", "overhangs", "covers", "underlying" and their equivalents do not necessarily mean "in contact with". Thus, for example, the transfer, application or deposition of a first layer on a second layer does not necessarily mean that the two layers are directly in contact with each other, but means that the first layer at least partially covers the second layer by being either directly in contact with it, or by being separated from it by at least one other layer or at least one other element.

[0081] An element is said to be "microscopic" when it has dimensions equal to or less than a few micrometers. Thus, a microLED, for example, has dimensions equal to or less than a few micrometers.

[0082] In the following description, the substrate, film or layer thicknesses are generally measured along directions perpendicular to the principal extension plane of the substrate, film or layer.

[0083] With reference to figures 1 to 8 and 16 to 18, the first aspect of the invention relates to an optoelectronic device 1.

[0084] As illustrated in these figures, the optoelectronic device 1 according to the first aspect of the invention comprises a stack 11 and a light-confining layer 12. More particularly, each of these figures illustrates a cross-sectional view of a part of an optoelectronic device 1 according to an embodiment of the first aspect of the invention.

[0085] The invention also relates, according to a second aspect, to a method for manufacturing an optoelectronic device 1 according to the first aspect of the invention. Steps of different ways of implementing this method are illustrated in Figures 9 to 15.

[0086] A third aspect of the invention relates to a display screen or an image projection system comprising at least one optoelectronic device 1 according to the first aspect of the invention. The third aspect of the invention is not illustrated in the figures, but it is considered obvious to a person skilled in the art how the optoelectronic device 1 according to the first aspect of the invention is intended to be integrated into a display screen or an image projection system.

[0087] Stacking 11

[0088] Figure 9 illustrates one embodiment of the stack 11. It should be noted here that the illustration provided by Figure 9 is structurally simplified. However, it is considered sufficient to illustrate how the stack 11 is arranged relative to the other elements of each embodiment of the optoelectronic device 1. A person skilled in the art is presumed to know, by virtue of their general knowledge, at least one, or even several, of the complex structures that the stack 11 can take.

[0089] Particularly with reference to [Fig. 9], the stack 11 comprises a plurality of light-emitting diodes 111 and a plurality of electrically conductive pads 112. The light-emitting diodes 111 of the plurality are arranged at a distance from each other. The light-emitting diodes 111 of the plurality are preferably arranged on the same level of the optoelectronic device 1. The electrically conductive pads 112 of the plurality are arranged between the light-emitting diodes 111 and extend through an adhesive layer 114 which interfaces the PN junction of each light-emitting diode 111 with an underlying substrate 113, preferably directly. The electrically conductive pads 112 are preferably arranged on the same level of the optoelectronic device 1. Preferably, each electrically conductive pad 112 is surrounded by light-emitting diodes 111, or vice versa.Each pad 112 and / or each light-emitting diode 111 is, for example, in the form of a substantially rectangular parallelepiped or a substantially right-angled cylinder. The light-emitting diodes 111 and the electrically conductive pads 112 can, for example, be arranged in a checkerboard pattern, without requiring that the light-emitting diodes 111 and the electrically conductive pads 112 have the same dimensions, particularly transverse dimensions; the figures illustrate this. In an equally non-limiting manner, pads 112 may have a width dimension different from that of the light-emitting diodes 111. Furthermore, it should be noted here that the electrically conductive pads 112 may be based on, or even made of, a conductive metal such as copper or aluminum.

[0090] With further reference to [Fig. 9], each light-emitting diode 111 can be a light source for a subpixel. More specifically, each light-emitting diode 111 can comprise a first-type semiconductor layer 111a, a light-emitting layer 111b, also called the active layer, and a second-type semiconductor layer 111e, which are stacked in that order. The light-emitting layer 111b is sandwiched between the first-type semiconductor layer 11e and the second-type semiconductor layer 111c. For example, the first type semiconductor layer 11 la is a P-type semiconductor, the second type semiconductor layer 11 le is an N-type semiconductor, and the electroluminescent layer 112 is preferably a multiple quantum well layer or MQW layer (for "multiple quantum well" in English), but this description is not limited to this example.Alternatively, the first type semiconductor layer 111a can be an N-type semiconductor, and the second type semiconductor layer 111c can be a P-type semiconductor.

[0091] Light-emitting diodes 111 are typically adapted to emit blue light, that is to say radiation whose wavelength is in the range from approximately 430 nm to 480 nm.

[0092] More specifically, the stack 11 may further comprise: a. a load-bearing substrate 113, b. an interface layer 114 extending over the carrier substrate 113 between the electrically conductive pads 112, and c. a matrix of emissive structures 1112 extending, preferably directly, over the interface layer 114 between the electrically conductive pads 112.

[0093] The carrier substrate 113 may include at least one application-specific integrated circuit (ASIC). The carrier substrate 113 may include at least one electrical connection pad 115 between said integrated circuit and at least one, for example several, of the light-emitting diodes 111. The interface layer 114 extends between pairs of adjacent assemblies formed by the electrically conductive pads 112 and lateral dielectric walls 117 (described in more detail below). The interface layer 114 may consist of at least one layer of metallic materials and, more typically, of a stack of layers of metallic materials.

[0094] Each light-emitting diode 111 extends over the interface layer 114. Each electrical connection pad 115 can form an electrical interconnection via 115 between the carrier substrate 113 and the light-emitting diode 111 above it, via the interface layer 114. The vias 115 are preferably located in an upper oxide layer (not shown in the figures) of the carrier substrate 113.

[0095] The carrier substrate may for example be of the CMOS type, and therefore, in this example, the vias 115 are preferably located above the last metallic levels of the CMOS.

[0096] The interface layer 114 preferably constitutes a conductive bonding interface between the carrier substrate 113 and the matrix of emissive structures 1112. The interface layer 114 ensures electrical conduction between the ASIC (located in the carrier substrate 113) and each light-emitting diode 111 via the vias 115.

[0097] The matrix of emissive structures 1112 comprises at least the plurality of light-emitting diodes 111 and the plurality of electrically conductive pads 112. This matrix 1112 preferably forms a level of each of the embodiments of the optoelectronic device 1 according to the first aspect of the invention.

[0098] At least one, preferably each, emitting structure 1112 comprises at least one light-emitting diode 111 and at least a portion of each of the electrically conducting pads 112 adjacent, insulated at least partially from each other electrically by the aforementioned dielectric wall 117.

[0099] The stack 11 may further comprise an electrode layer 116. This layer is preferably made of a material that is not only electrically conductive but also transparent, at least at the wavelengths emitted by the light-emitting diodes 111 that it covers. The electrode layer 116 is thus adapted to allow at least a significant portion of the electromagnetic radiation emitted, or equivalently the light emitted, by the light-emitting diodes 111 to pass through. The electrode layer 116 extends, optionally continuously, between, on the one hand, the light-confining layer 12, which will be described below (see, for example, [Fig. 1]), and, on the other hand, the plurality of light-emitting diodes 111 and electrically conductive pads 112.

[0100] The material forming the electrode layer 116 may be a transparent conductive material (TCM) that is a solid that does not absorb visible light (gap greater than 3 eV) and that exhibits good electrical conductivity, indium tin oxide (or ITO), aluminum- or gallium-doped zinc oxide, graphene, aluminum (preferably with a thickness of approximately 10 nm), aluminum-doped zinc oxide (AZO), or a combination of these materials. The thickness of the electrode layer 116 may be between 0.03 pm and 1 pm. It should be noted that the presence of an electrode layer 116 in the stack 11 is optional, particularly since a lateral electrical contact 1171 can be provided, which we will discuss later.

[0101] At least one, preferably each, emissive structure 1112 may further comprise at least one electrical insulation wall or dielectric wall 117. Where applicable, the dielectric wall 117 provides electrical insulation between the elements it separates, and in particular: a. between at least one electrically conductive pad 112 and the supporting substrate 113, and more particularly between at least one electrically conductive pad 112 and each adjacent interface layer 114, and / or b. between at least one electrically conductive pad 112 and at least one, preferably each, adjacent light-emitting diode 111, to avoid short-circuiting at least one p or n zone of the PN junctions of the light-emitting diodes.

[0102] The electrical insulation provided by the dielectric wall 117 may only be partial, particularly when the optoelectronic device 1 does not include the aforementioned electrode layer 116. It is indeed preferable that, in this case, a lateral electrical contact 1171 (see, for example, [Fig. 15]) remains between one, or even each, electrically conductive pad 112 of the plurality and the second-type semiconductor layer 111c of at least one, preferably each, of the adjacent light-emitting diodes 111.

[0103] More particularly, at least one, preferably each, emissive structure further comprises dielectric walls 117 of which first dielectric walls 117a extend between at least one, preferably each, conductive pad 112 and the carrier substrate 113 and second dielectric walls 117b, called lateral, extend over at least a part of the lateral sides of each conductive pad 112, the first and second dielectric walls 117a and 117b being preferably joined together, so that each conductive pad is electrically insulated over a part of its periphery.

[0104] The light confinement layer 12

[0105] With reference to figures 1 to 8 and 18, the light confinement layer 12 extends over the stack 11. It includes reflective walls 121. These are preferably located at the electrically conductive pads 112, and not at the light-emitting diodes 111, so as not to oppose the passage of the light emitted by the light-emitting diodes 111, and on the contrary so as to reflect the light emitted by the light-emitting diodes 111 and thus reduce optical crosstalk phenomena.

[0106] For example, at least one, potentially each, reflective wall 121 may be based on, or even made of, aluminum. Alternatively, it could be based on, or even made of, any material that reflects, in particular, the wavelengths emitted by the light-emitting diodes 111; it could, for example, be made of copper.Nevertheless, one of the advantages of the present invention is to reduce the number of technological steps required to manufacture an optoelectronic device compared to existing methods. As we will see below, one of the advantageous features of certain embodiments of the invention is the presence of porous alumina 122 in the containment layer 12. This alumina is generated on the stack 11 by local anodization of a prior aluminum deposit on the stack 11. This deposit can also be used to form the reflective walls 121 outside the anodized areas of the containment layer 12. It is envisaged that at least some of the reflective walls 121 may not be entirely made of aluminum. For example, only a portion of an outer, particularly lateral, perimeter of at least one, preferably of each, reflective wall 121 may be made of aluminum.As an alternative or in addition, and as illustrated in [Fig. 18], at least one, potentially each, reflective wall 121 can be based on porous alumina 1211 and a reflective or absorbing material 1212 located in the pores of the porous alumina 1211; this embodiment makes it possible to take advantage of the strongly anisotropic nature of the anodization of aluminum in nanoporous alumina to obtain walls 121 that are even more reflective and / or more absorbing, depending on the nature of the material filling the pores.

[0107] As illustrated in particular by [Fig. 1], the reflective walls 121, whatever their constitution, define or delimit between themselves spaces 10, or equivalently volumes, each located at the right of at least one light-emitting diode 111. More particularly, each space 10 can be located at the right of a pixel comprising, where applicable, several light-emitting diodes 111 or of a sub-pixel comprising, for example, a single light-emitting diode 111. And the reflective walls 121 defining said space 10 extend at the right of at least some, preferably each, of the electrically conductive pads 112 adjacent to said at least one light-emitting diode 111 at the right of which the space 10 is located.

[0108] It is in at least some of the spaces 10, potentially in each of these spaces 10, that porous alumina 122 is formed.

[0109] The optoelectronic device 1, according to some of its various embodiments illustrated in Figures 1, 2, 5, 6, 17 and 18, is such that the light-confining layer 12 effectively comprises porous alumina 122 in at least some of said spaces 10, the porous alumina 122 having, in at least one space, preferably at least two spaces, or even in each space, among said at least some of said spaces, at least two pores 1221 open on a first face 12a of the confinement layer 12 which is located opposite the stacking 11. Note that the embodiments which are illustrated in figures 1, 2, 5, 6, 17 and 18 constitute all or part of final products, as opposed to intermediate products.

[0110] The embodiments of the first aspect of the invention, which are illustrated in Figures 3, 4, 7 and 8, can also be considered as final products and may not include porous alumina 122 in some of said spaces 10. These embodiments are preferably made from optoelectronic devices according to the first aspect of the invention such as those illustrated in Figures 1, 3, 7, and 17, as intermediate products, the porous alumina 122 of these intermediate products having the advantage of being easy to etch in order to remove it in whole or in part, locally or everywhere.

[0111] The pores 1221 of the porous alumina 122 located at the spaces 10, whether those of the aforementioned end products or intermediate products, preferably have transverse dimensions between 1 and 500 nm and preferably between 50 and 400 nm. As an alternative or in addition to the previous preference, the pores 1221 of the porous alumina 122 preferably have a periodicity between 200 and 700 nm. Furthermore, the pore size is preferably larger than the size of the color conversion particles that one wishes to insert into them, so that at least one color conversion particle can be in each pore.The transverse dimension of the pores 1221 can therefore depend on the size of the particles of the light color conversion material that are intended to be introduced into them; the parameters of the anodization of the aluminium layer to form the porous alumina are preferably defined accordingly.

[0112] The porous alumina 122 located where appropriate at the electrically conductive pads 112 may have the same characteristics as those stated above to qualify the porous alumina 122 located in at least some of the spaces 10.

[0113] Various materials are capable of constituting said particles of the light color conversion material. For example: a. quantum dots, b. coupling aggregates of light absorbers and converters (or "J-aggregates"), c. phosphorescent (or fluorescent) nanoparticles, and d. perovskites, These particles, if applicable, are dissolved in a solvent or incorporated into a resin and are considered to be made of a light-color conversion material. These particles may have different characteristic sizes, and a person skilled in the art is expected to know how to parameterize the anodizing process by which the porous alumina 122 is formed to obtain open pores 1221 that allow the introduction of at least one such particle, preferably several such particles. It should be noted that the solvent in which said particles can be put into solution may only be present at the time of the deposition of these particles in the pores 1221, because a subsequent drying step may advantageously allow said solvent to evaporate, which is then no longer in the optoelectronic device 1 according to the first aspect of the invention.

[0114] The light color conversion material 123 is preferably grafted onto the internal walls of pores 1221. The aforementioned solvent or resin can play an advantageous role in the formation of such grafts. But, more generally, the particles of the light color conversion material 123 and / or the internal walls of pores 1221 can be functionalized, before or even during the deposition of the light color conversion material 123 into the pores 1221 of the porous alumina 122, so as to obtain grafting of one to the other, for example by surface hydrogen bonds -OH, created where appropriate by treatment with alkaline chemistry or by treatment with dry plasma or by adsorption of a ligand.

[0115] At least one, preferably each, pore 1221 open on the first face 12a of the containment layer 12 which is located opposite the stack 11 preferably has a filling rate, in the light color conversion material, substantially equal to 30%. Achieving such a filling can be made easy by the aforementioned grafting.

[0116] The optoelectronic device 1

[0117] Layer 12 is called a light confinement layer because that is its main function, but, as we have seen above, it can also perform a color conversion function; so it could have been called, for at least some of the embodiments of the first aspect of the invention, which are illustrated in particular in Figures 2, 4, 6, 8 and 18, "light confinement and conversion layer 12".

[0118] The light-emitting diodes 111 can be configured to emit light of a first determined wavelength, for example the color blue, in a direction substantially perpendicular to the first face 12a of the confinement layer 12.

[0119] In addition or as an alternative, the light color conversion material 123 may be suitable for converting the emitted light at the first wavelength into light having a second wavelength different from the first, for example, the first wavelength being in the blue range and the second wavelength being in either green or red. In one embodiment, the green light thus converted has a wavelength in the range of approximately 510 nm to 570 nm. In another embodiment, the red light thus converted has a wavelength in the range of approximately 600 nm to 720 nm.

[0120] As illustrated in Figures 1, 2, 5, 6 and 18, the pores 1221 of the porous alumina 122 form channels 122a opening onto the first face 12a of the confinement layer 12. The channels 122a extend preferably mainly in a direction perpendicular to the first surface 12a of the confinement layer 12; they can more particularly extend over a distance Lp, taken in projection in a direction perpendicular to the first face 12a, strictly greater than half of a thickness E12 of the confinement layer 12.More specifically, the pores 1221 can extend substantially up to the stack 11, preferably without actually reaching it (except in the presence of aluminum pads above the conductive pads, these aluminum pads preventing delamination of the structure), so as to limit any risk of delamination, to present a maximized internal wall surface, and thus maximize the aforementioned grafting, and consequently the filling of the pores by the light color conversion material 123. Thus, at least one, preferably each, pore 1221 can have a form factor defined by transverse dimensions substantially between 40 nm and 800 nm, and / or a longitudinal dimension substantially between 500 nm and 10 pm, preferably substantially between 1 pm and 5 pm.

[0121] The combination of said at least two pores 1221, or even said at least eight pores 1221, or at least one pore every 2xX, where X represents the wavelength to be extracted and at least four pores per space (case pixel of Ipm), at the right of the same light-emitting diode 111, and of a filling of the pores 1221 with a light color conversion material 123 makes it possible to achieve an increase in the conversion rate by synergy with the increase in diffusion caused by the plurality of pores at the right of the same light-emitting diode 111, while benefiting from a reduction of optical crosstalk phenomena by synergy with the reflective walls 121.

[0122] As already mentioned above, and as will be the case for the final products illustrated in Figures 3, 4 and 8, the light-confining layer 12 can be free of porous alumina 122 in at least one, potentially in several, of the aforementioned spaces 10, porous alumina 122 is nevertheless located in at least one of the spaces 10. Therefore, at least one, preferably each, space 10 free of porous alumina 122 can be left 'empty', as illustrated in [Fig. 3], or, conversely, advantageously filled with a light color conversion material 123, as illustrated in [Fig. 4]. The light color conversion material 123 can, in the latter case, be chosen from those mentioned above to fill the pores 1221.

[0123] As seen above, at least one electrically conductive pad 112 and the reflective wall 121 located at the right of said at least one electrically conductive pad can be based on, or even made of, aluminum; they can then together form a volume of homogeneous material (or "bulk"), in particular in the absence of the electrode layer 116, as illustrated in Figures 5, 6, 7 and 8. The electrically conductive pads 121 can thus advantageously be made of the same material as that from which the reflective walls 121 are made, which simplifies the device 1 and its manufacturing process, in particular by avoiding a technological step of deposition, for example by electrodeposition, of electrically conductive pads 121 based on a metallic material other than aluminum, for example based on copper.

[0124] Manufacturing process

[0125] Characteristics related to the implementation of the manufacturing process according to the second aspect of the invention of an embodiment of an optoelectronic device according to the first aspect of the invention have already been introduced above.

[0126] However, it should be noted that the manufacturing process according to the second aspect of the invention comprises the following steps: a. provide a stacking 11, for example as illustrated in [Fig.9], comprising: i. a plurality of PN junction light-emitting diodes 111 arranged at a distance from each other, and ii. a plurality of electrically conductive pads 112 arranged between the light-emitting diodes, the electrically conductive pads 112 being electrically isolated from at least one p or n zone of the PN junctions of the light-emitting diodes 111, to prevent a short circuit, b. to form, on the stack 11, a light-confining layer 12 comprising reflective walls 121 defining spaces 10 between them, each located directly above a light-emitting diode 111, by depositing an aluminum-based layer 1000, 2000, as illustrated in the figures 10 and 13, on a main face 1 of the stack 11 by which the light-emitting diodes 111 are configured to emit, then c. anodizing the aluminium-based layer 1000, 2000 at least outside areas located at the right of the conductive pads 112 of the stack 11, to obtain for example the structures illustrated in figures 11 and 12, and 14 and 15, respectively, the manufacturing process according to the second aspect of the invention being essentially such that the anodizing is, as already stated above, parameterized so that porous alumina 122 is formed in at least some of said spaces 10, presenting, in at least one space, preferably at least two spaces, or even in each space, among said at least some of said spaces 10, at least two pores 1221 open on a first face 12a of the containment layer 12 which is located opposite the stack 11.

[0127] A first implementation of the manufacturing process according to the second aspect of an embodiment of the optoelectronic device 1 according to the first aspect of the invention, which is illustrated in [Fig. 1], is described below by way of illustration with reference to Figures 10 to 12. There, we observe respectively the deposition of the aluminum layer 1000 of thickness E12 on the stack 11, and more particularly on the electrode layer 116 of the stack 11, then the localized anodization, by means of masks 1100, of the areas of the aluminum layer 1000 which are located at the right of the light-emitting diodes 111, to obtain an optoelectronic device as illustrated in [Fig. 12], from which it is sufficient to remove the masks 1100 to obtain the optoelectronic device as illustrated in [Fig. 1].The pores 1221 thus formed can then be filled with a light-color conversion material 123 as detailed above to obtain the optoelectronic device as illustrated in [Fig. 2]. Note that anodizing also occurs partially under the mask. Consequently, the size of the mask is preferably smaller than the dimension of the nanoporous cavity; the greater the thickness to be anodized, the more pronounced this effect will be.

[0128] A second implementation of the manufacturing process according to the second aspect of the invention of an embodiment of the optoelectronic device 1 according to the first aspect of the invention, which is illustrated in [Fig. 5], is described below by way of illustration with reference to Figures 13 to 15. These figures show, respectively, the deposition of electrically conductive pads 112 between the light-emitting diodes 111 to finalize the stack 11, which is free of an electrode layer 116. Next, this deposition is extended to form the aluminum layer 2000 of thickness E12 on the stack 11, followed by localized anodizing, using masks 2100, of the areas of The aluminum layer 2000, located directly above the light-emitting diodes 111, is used to create an optoelectronic device as illustrated in [Fig. 15]. Removing the masks 2100 yields the optoelectronic device as illustrated in [Fig. 5]. The pores 1221 thus formed can then be filled with a light-color conversion material 123, as detailed above, to obtain the optoelectronic device as illustrated in [Fig. 6].

[0129] It should be noted, echoing what has already been described above, that the aforementioned anodizing step may further include the anodizing, preferably simultaneous, of a portion of the aluminum-based layer 1000, 2000 which is located over at least one electrically conductive pad 112. The manufacturing process according to this example may therefore further include the deposition of a reflective (or absorbent) material 1212 in the pores of the porous alumina 1211 located over said at least one electrically conductive pad 112.

[0130] The invention is not limited to the embodiments or implementations described above and extends to all embodiments and implementations covered by the invention.

Claims

Demands

1. Optoelectronic device (1) comprising: • a stack (11) comprising: i. a plurality of PN junction light-emitting diodes (111) arranged at a distance from each other, and ii. a plurality of electrically conductive pads (112) arranged between the light-emitting diodes (111), the electrically conductive pads (112) being electrically isolated from at least one p or n zone of the PN junctions of the light-emitting diodes, and • a light-confinement layer (12) extending over the stack (11) and comprising reflective walls (121) defining spaces (10) each located directly above at least one, preferably each, light-emitting diode (111), the optoelectronic device (1) being such that the light-confinement layer (12) further comprises porous alumina (122) in at least some of said spaces (10), the porous alumina (122) having,in at least one space, preferably at least two spaces, or even in each space, among said at least some of said spaces, at least two pores (1221) open on a first face (12a) of the confinement layer (12) which is located opposite the stack (11), the optoelectronic device (1) being characterized at least in that at least one, potentially each, reflective wall (121) is based on porous alumina (1211) and a reflective material (1212) located in the pores of the porous alumina (1211).

2. Optoelectronic device (1) according to the preceding claim, wherein the pores (1221) of the porous alumina (122) have transverse dimensions between 1 and 500 nm and preferably between 50 and 400 nm.

3. Optoelectronic device (1) according to any one of the preceding claims, wherein the pores (1221) of the alumina porous (122) exhibit a periodicity between 200 and 700

4. llili. Optoelectronic device (1) according to any one of the preceding claims, wherein the porous alumina (122) has, in at least one space, preferably at least two spaces, or even in each space, among said at least some of said spaces, at least eight pores (1221) open on the first face (12a) of the confinement layer (12) which is located opposite the stacking.

5. Optoelectronic device (1) according to any one of the preceding claims, wherein at least one, preferably each, pore (1221) open on the first face (12a) of the containment layer (12) which is located opposite the stack (11) has a filling rate, in the light color conversion material, substantially equal to 30%.

6. Optoelectronic device (1) according to any one of the preceding claims, wherein the pores (1221) of the porous alumina (122) form channels (122a) opening onto the first face (12a) of the containment layer (12).

7. Optoelectronic device (1) according to any one of the preceding claims, wherein the pores (1221) of the porous alumina (122) form channels (122a) extending mainly in a direction perpendicular to the first surface (12a) of the containment layer (12).

8. Optoelectronic device (1) according to any one of the preceding claims, wherein at least some of the pores (1221) have a dimension Lp in length, taken in projection along a direction perpendicular to the first face (12a), at most equal to, and preferably strictly less than, for example by 2 nm, a thickness of the aluminum-based layer.

9. Optoelectronic device (1) according to any one of the preceding claims, wherein the pores (1221) extend substantially up to the stack (11).

10. An optoelectronic device (1) according to any one of the preceding claims, wherein at least one pore (1221) has a form factor defined by transverse dimensions substantially between 40 nm and 800 nm, and / or a dimension longitudinal approximately between 500 nm and 10 pm, preferably approximately between 1 pm and 5 pm.

11. Optoelectronic device (1) according to any one of the preceding claims, wherein the open pores (1221) on the first face of the confinement layer (12) occupy an area substantially equal to 30% of the total area of ​​this confinement layer and / or the open pores (1221) above at least one light-emitting diode (111) which are adjacent to each other are separated in pairs, by their centers, by a distance substantially equal to a wavelength of the light emitted by the underlying light-emitting diode (111), this wavelength typically belonging to the blue light spectrum, i.e. for example between 380 and 450 nm.

12. Optoelectronic device (1) according to any one of the preceding claims, wherein the stack (11) further comprises: • a carrier substrate (113) and • an emissive structure matrix (1112) extending over the carrier substrate (113), the emissive structure matrix (1112) comprising the plurality of light-emitting diodes (111) extending over the carrier substrate (113) via an interfacing layer (114) and the plurality of electrically conductive pads optionally extending over the carrier substrate (113) via an electrical insulation wall (117).

13. Optoelectronic device (1) according to any one of the preceding claims, wherein at least one, potentially each, reflective wall (121) is aluminum-based.

14. Optoelectronic device (1) according to the preceding claim, wherein at least one electrically conductive pad (112) is aluminum-based, where applicable said at least one electrically conductive pad (112) and the reflective wall (121) located at the right of said at least one electrically conductive pad (112) form a homogeneous volume of material.

15. An optoelectronic device (1) according to any one of the preceding claims, further comprising a material of light colour conversion (123) located in the pores (1221) of the porous alumina (122) located at least one light-emitting diode (111), preferably at each light-emitting diode.

16. Optoelectronic device (1) according to the preceding claim, wherein the light colour conversion material (123) is grafted to the internal pore walls (1221).

17. Optoelectronic device (1) according to any one of the two preceding claims, wherein the light confinement layer (12) is free of porous alumina (122) in at least one, potentially in several, of said spaces (10).

18. Optoelectronic device (1) according to the preceding claim, wherein at least one, preferably each, space (10) free of porous alumina (122) is filled with a light color conversion material (123).

19. Optoelectronic device (1) according to any one of the three preceding claims, wherein the light color conversion material (123) comprises at least one of: • quantum dots, • coupling clusters of light absorbers and converters, • phosphorescent nanoparticles, and • perovskites, optionally dissolved in a solvent or incorporated in a resin.

20. A method for manufacturing an optoelectronic device (1) comprising the following steps: • providing a stack (11) comprising: i. a plurality of PN junction light-emitting diodes (111) arranged at a distance from each other, and ii. a plurality of electrically conductive pads (112) arranged between the light-emitting diodes,

21. the electrically conductive pads being electrically isolated from at least one p or n zone of the PN junctions of the light-emitting diodes, • to form, on the stack (11), a light-confining layer (12) comprising reflective walls (121) defining spaces (10) between them, each located directly above a light-emitting diode (111), by i. deposition of an aluminum-based layer (1000, 2000) on a main face (1la) of the stack (11) by which the light-emitting diodes (111) are configured to emit, then ii. anodizing of the aluminium-based layer (1000, 2000) at least outside areas located directly above the conductive pads (112) of the stack (11), • the anodizing being parameterized so that porous alumina (122) is formed in at least some of said spaces (10), presenting, in at least one space, preferably at least two spaces, or even in each space, among said at least some of said spaces (10), at least two pores (1221) open on a first face (12a) of the confinement layer (12) which is located opposite the stacking (11), • wherein the anodizing step includes the anodizing of a portion of the aluminium-based layer (1000, 2000) which is located over at least one electrically conductive pad (112) and further includes the deposition of a reflective material (1212) in the pores of the porous alumina (1211) located over said at least one electrically conductive pad (112). A manufacturing method according to the preceding claim, wherein the anodizing step of the aluminum-based layer (1000, 2000) is parameterized such that the porous alumina (122) forms channels (122a) opening through pores (1221) on the first face (12a) of the containment layer (12), and preferably such that at least one channel (122a), for example Each channel has transverse dimensions approximately between 40nm and 800nm, and / or a longitudinal dimension approximately between 500nm and 10pm, preferably approximately between 1pm and 6pm.

22. A manufacturing method according to any one of the two preceding claims, further comprising, following the deposition of the aluminium-based layer (1000, 2000) and before its anodization: • depositing a mask (1100, 2100) on areas of the aluminium-based layer which are located substantially at the conductive pads (112) of the stack (11), the mask having openings located at the light-emitting diodes (111), the anodization of the aluminium-based layer (1000, 2000) being carried out through the openings of the mask (1100) deposited.

23. A manufacturing method according to any one of the three preceding claims, wherein the step of providing the stack (11) includes the deposition, between the light-emitting diodes (111), of aluminium to form at least a part of the plurality of electrically conductive pads (112) of the stack (11) and this deposition step is extended to carry out the deposition of the aluminium-based layer (1000, 2000).

24. A manufacturing method according to any one of the four preceding claims, further comprising the deposition of a light colour conversion material (123) in the pores (1221) of the porous alumina (122), at the level of at least one of said spaces (10).

25. A manufacturing method according to the preceding claim, wherein the light color conversion material (123) and / or the internal pore walls (1221) are functionalized, prior to the deposition of the light color conversion material (123) in the pores (1221) of the porous alumina (122), so as to obtain a grafting of the one to the other, for example by surface -OH bonds, created where appropriate by treatment with an alkaline chemistry or by treatment by dry plasma or by adsorption of a ligand.

26. A manufacturing method according to any one of claims 20 to 25, comprising the removal, for example by etching, of the porous alumina (122) at the level of at least one, for example some,

27. of said spaces (10), and the filling of at least one of the spaces (10) thus hollowed out by a light colour conversion material (123). Display screen or projection system for at least one image comprising at least one optoelectronic device (1) according to any one of claims 1 to 19.