Inspection probe terminal

JP1796334SActive Publication Date: 2025-04-16LEENO IND INC
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Patent Information

Application Number
JP2024020519D
Authority / Receiving Office
JP · JP
Patent Type
Designs
Current Assignee / Owner
Filing Date
2024-10-02
Publication Date
2025-04-16
Estimated Expiration
2049-10-02

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Abstract

The article is the terminal of a test probe used to measure the electrical characteristics of semiconductors or wafers.
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