Three-dimensional measurement apparatus

Abstract

To provide a configuration that can measure the three-dimensional shape of a measurement object at a higher speed by using event data.SOLUTION: An imaging unit 30 which images a measurement object R on which a prescribed stripe pattern is projected from a projection unit 20 includes an imaging element which outputs event data including two-dimensional point data in which the position of a pixel is specified in response to the pixel whose brightness changes when the light is received, and generates a photographed image from the event data output from the imaging element. The imaging element is configured to output the event data with the positive polarity in a case where brightness changes to be bright, and output the event data with the negative polarity in a case where brightness changes to be dark. A control unit 11 outputs a projection start signal S1 to a measurement unit 40 according to the projection start timing of the prescribed stripe pattern. The measurement unit 40 obtains brightness information on the basis of a time difference between the input time of the projection start signal S1 from the control unit 11 and the occurrence time of the event data output after the input time in a pixel unit in the photographed image.SELECTED DRAWING: Figure 7

Description

[Technical field]

[0001] The present invention relates to a three-dimensional measuring apparatus that measures the three-dimensional shape of a measurement object. [Background technology]

[0002] Conventionally, as a three-dimensional measuring device for measuring the three-dimensional shape of a measurement object, for example, a device using a phase shift method is known. The phase shift method is a technique for projecting a plurality of stripe pattern images with shifted phases, thereby performing three-dimensional measurement of the measurement object onto which the stripe pattern images are projected. As a technology for performing three-dimensional measurement using the phase shift method in this way, a three-dimensional measuring device disclosed in the following Patent Document 1 is known. This three-dimensional measuring device assigns stripes of each phase to light of different wavelengths, projects a stripe pattern image obtained by synthesizing the images onto the measurement object, and photographs the measurement object onto which the stripe pattern image is projected with a color camera. Then, each color component is extracted from the photographed image and the phase is calculated in one photograph, thereby shortening the time required to measure the three-dimensional shape. [Prior art documents] [Patent documents]

[0003] [Patent Document 1] Patent No. 3723057 [Patent Document 2] US Patent Application Publication No. 2016 / 0227135 Summary of the Invention [Problem to be solved by the invention]

[0004] Incidentally, the event camera disclosed in the above-mentioned Patent Document 2 is known as a technology for generating images of a measurement object at a higher speed. This event camera is a brightness value difference output camera developed inspired by the retinal structure of living organisms, and is configured to sense changes in brightness for each pixel and output the coordinates, time, and polarity of the brightness change. With this configuration, the event camera has the characteristic of not outputting pixel information without brightness changes, that is, redundant data (event data), as in conventional cameras, and therefore can generate images of the measurement object at a higher speed by realizing a reduction in the amount of data communication and a lighter image processing load.

[0005] However, in the captured image of the measurement object generated using the event data output from the event camera, even if the presence or absence of a luminance change on a pixel-by-pixel basis can be grasped from the captured image, the luminance value cannot be directly measured. Therefore, there is a problem that the 3D shape of the measurement object cannot be measured in a 3D measurement method such as the phase shift method that uses the luminance value.

[0006] The present invention has been made to solve the above-mentioned problems, and its object is to provide a configuration that can measure the three-dimensional shape of a measurement object more quickly by utilizing event data. [Means for solving the problem]

[0007] In order to achieve the above object, the invention described in claim 1 of the claims is as follows: a projection unit (20) that projects a predetermined stripe pattern onto a measurement object (R); an imaging unit (30) that images the measurement object onto which the predetermined stripe pattern is projected; a measurement unit (40) that measures a three-dimensional shape of the measurement object by a phase shift method using luminance information obtained from an image captured by the imaging unit; A control unit (11) that controls the projection unit; A three-dimensional measuring device (10) comprising: the imaging unit includes an imaging element that outputs event data including two-dimensional point data that identifies a position of a pixel corresponding to a pixel that has undergone a luminance change upon receiving light, and generates the captured image from the event data output from the imaging element; the imaging device is configured to output positive event data when the luminance changes to brighter, and to output negative event data when the luminance changes to darker; the control unit outputs a projection start signal (S1) to the measurement unit in accordance with a projection start timing of the predetermined stripe pattern; The measurement unit is characterized in that it calculates the brightness information on a pixel-by-pixel basis in the captured image based on the time difference between the input time of the projection start signal from the control unit and the occurrence time of event data output after the input time. The symbols in parentheses above indicate the corresponding relationship with the specific means described in the embodiments described later. Effect of the Invention

[0008] In the invention of claim 1, the imaging unit, which images the measurement target object onto which a predetermined stripe pattern is projected from the projection unit, includes an imaging element that outputs event data including two-dimensional point data that identifies the position of a pixel that has undergone a luminance change when light is received, and generates an image from the event data output from the imaging element. The imaging element is configured to output positive event data in the case of a brighter luminance change and output negative event data in the case of a darker luminance change. The control unit outputs a projection start signal to the measurement unit in accordance with the start timing of projection of the predetermined stripe pattern, and the measurement unit calculates luminance information for each pixel in the captured image based on the time difference between the input time of the projection start signal from the control unit and the occurrence time of the event data output after the input time.

[0009] In each pixel of the captured image, the higher the luminance value, the longer the time difference between the occurrence time of the positive polarity event data and the occurrence time of the negative polarity event data. Therefore, luminance information can be obtained based on the time difference between the occurrence time of the positive polarity event data and the occurrence time of the negative polarity event data in the captured image in pixel units. The occurrence time of the positive polarity event data coincides with the input time of the projection start signal, and the negative polarity event data is output after the input time of the projection start signal. Therefore, luminance information can be obtained in pixel units based on the time difference between the input time of the projection start signal when the above-mentioned predetermined stripe pattern is projected and the occurrence time of the event data output after the input time, and the three-dimensional shape of the measurement object can be measured by the phase shift method using the luminance information obtained in this way. In particular, since it is only necessary to obtain the occurrence time of the event data output after the input of the projection start signal without obtaining the occurrence times of both the positive polarity event data and the negative polarity event data for all pixels, the processing time can be shortened and the image generation of the measurement object can be further accelerated. In other words, the three-dimensional shape of the measurement object can be measured more quickly by using the event data. [Brief description of the drawings]

[0010] [Figure 1] 1 is a block diagram showing a schematic configuration of a three-dimensional measuring apparatus according to a first embodiment. [Diagram 2] FIG. 1 is an explanatory diagram illustrating a state in which a stripe pattern for a general phase shift method is projected onto a measurement object. [Diagram 3] 1A and 1B are diagrams illustrating three-dimensional measurement by a phase shift method. [Figure 4] 10 is an explanatory diagram illustrating the relationship between the time difference (ON time) between the occurrence time of positive polarity event data and the occurrence time of negative polarity event data, and the luminance value (luminance information). FIG. [Diagram 5]Figure 5(A) is an explanatory diagram explaining the R-color light emission state, the G-color light emission state, and the B-color light emission state at a certain pixel level when projecting a stripe pattern, and Figure 5(B) is an explanatory diagram explaining the R-color light emission state, the G-color light emission state, and the B-color light emission state at a pixel level different from that of Figure 5(A). [Figure 6] 11 is an explanatory diagram illustrating the relationship between the projection start timing, the projection end timing, the input timing of the projection start signal, the input timing of the projection end signal, and the imaging start timing and imaging end timing. FIG. [Figure 7] Figure 7(A) is an explanatory diagram illustrating an example of creating a stripe pattern in which pixels are shown on the horizontal axis and ON time is shown on the vertical axis, and Figure 7(B) is an explanatory diagram illustrating the time difference between the occurrence time of negative polarity event data obtained for each pixel when imaging the stripe pattern shown in Figure 7(A) and the input time of the projection start signal S1. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0011] [First embodiment] Hereinafter, a first embodiment of a three-dimensional measuring device according to the present invention will be described with reference to the drawings. The three-dimensional measuring device 10 according to the present embodiment is a device for measuring the three-dimensional shape of a measurement object R, and is configured to include a control unit 11 for overall control, a projection unit 20 for projecting a predetermined stripe pattern for the phase shift method onto the measurement object R, an imaging unit 30 for capturing an image of the measurement object R onto which the predetermined stripe pattern is projected, and a measurement unit 40 for measuring the three-dimensional shape of the measurement object R from the captured image, as shown in Figs. 1 and 2. The three-dimensional measuring device 10 configured in this manner measures the three-dimensional shape of the measurement object R, such as a workpiece, which is attached to the hand of a robot, for example, and moves relatively to the hand at high speed. Here, the relative movement refers to the relative movement between the movement of the three-dimensional measuring device 10 attached to the hand of the robot and the high-speed movement of the measurement object R. When the position of the three-dimensional measuring device 10 is fixed, the relative movement is the movement of the measurement object R.

[0012] For convenience, a predetermined stripe pattern having up to 13 stripes is shown in a simplified form in Fig. 2. More specifically, since a typical stripe pattern is represented as a sine wave pattern, the light and dark parts of the stripe pattern have the same width, but for convenience, the dark parts are shown in Fig. 2 with a smaller width as lines. Also, the number of stripes is abbreviated to 13, although it is 13 or more in the embodiment.

[0013] The control unit 11 is mainly composed of a microcomputer and has a CPU, a system bus, an input / output interface, etc., and constitutes an information processing device together with a storage unit consisting of a ROM, a RAM, a non-volatile memory, etc. In addition to programs related to robot control, the storage unit stores in advance programs related to control of the projection unit 20 and programs for executing control processing using the three-dimensional measurement results by the measurement unit 40, etc., which are executable by the control unit 11.

[0014] The projection unit 20 is a so-called DLP projector, and is controlled by the control unit 11 to project a predetermined stripe pattern, which will be described later, by reflecting light from a light source with a DMD element. The DMD element is an array of fine mirrors, each corresponding to a pixel of an image projected on a screen, and is configured to change the angle of each mirror to turn on / off the light emitted to the screen in microsecond units. That is, the projection unit 20 functions to project a predetermined stripe pattern by controlling the ON / OFF of the reflection of incident light by the DMD, which is an array of multiple mirrors, for each mirror by the control unit 11. Therefore, by changing the gradation (brightness) of the reflected light depending on the ratio of the time each mirror is turned on and off, it becomes possible to display gradations based on the image data of the image to be projected.

[0015] In this configuration, the longer the light emission time of the single pulse light emitted once within the unit time secured for each light emission state, the brighter the light emission state becomes, so that the light emission state can be specified according to the light emission time. In FIG. 2, if the upper left pixel is (1, 1) and the lower right pixel is (k, l), the projection unit 20 is provided with mirrors corresponding to k×l pixels (for example, 1140×912). In addition, for example, when R (red), G (green), and B (blue) colors are prepared as light incident on the DMD element, an R light emission state in which R light is emitted by reflecting on the mirror, a G light emission state in which G light is emitted by reflecting on the mirror, and a B light emission state in which B light is emitted by reflecting on the mirror are repeated in a short predetermined cycle, and the light emission time of each is individually adjusted, so that a color image can be projected. For this reason, the control unit 11 functions to set the ON / OFF timing of reflection within the unit time for each mirror according to the above-mentioned predetermined stripe pattern.

[0016] The imaging unit 30 is a so-called event camera, and is equipped with an imaging element that outputs event data (specifically, two-dimensional point data, time, and polarity of brightness change) including two-dimensional point data that identifies the position of a pixel corresponding to a pixel that has undergone a brightness change when light is received, and is configured to be able to generate an image from the event data output from the imaging element. For this reason, the imaging unit 30 outputs event data of positive polarity (positive brightness change) when a brightness change occurs that makes the pixel brighter by receiving light, and outputs event data of negative polarity (negative brightness change) when a brightness change occurs that makes the pixel darker by extinguishing the light. Image data of the measurement object R can be generated by plotting the two-dimensional point data of a plurality of event data output within a certain period of time as points on a predetermined plane, and the imaging unit 30 is configured to output the image data or event data (two-dimensional point data, time, and polarity of brightness change) generated in this way to the measurement unit 40.

[0017] The measurement unit 40 is controlled by the control unit 11 and measures the three-dimensional shape of the measurement object R using a phase shift method based on an image captured by the imaging unit 30 of the measurement object R in a state where a predetermined stripe pattern is projected from the projection unit 20.

[0018] Generally, in the phase shift method, a sine wave pattern specified by the luminance value I(x,y,n) in the following formula (1) is adopted in order to obtain a phase value θ corresponding to a distorted value according to the surface shape of the measurement object R based on a lattice image (stripe image) captured by projecting a predetermined stripe pattern (a pattern in which the luminance changes periodically in a first direction and does not change in a second direction perpendicular to the first direction) onto the measurement object R. That is, when the number of phase shifts is N, the luminance values ​​I(x,y,n) of N phase-shifted lattice images (stripe images) are expressed by formula (1). I(x,y,n)=a(x,y)cos{θ(x,y)+2πn / N}+b(x,y) (1) Here, point (x, y) is a point in the lattice image, a(x, y) indicates the luminance amplitude, b(x, y) indicates the background luminance, and θ(x, y) indicates the phase value of the lattice where n=0. The distance z to point (x, y) is measured according to the phase value θ(x, y) calculated from the luminance values ​​I(x, y, n) of the N lattice images.

[0019] Specifically, for example, when three grating images are obtained in one period of the above-mentioned R, G, and B light emission states, the luminance value I(x, y, 0) in the R light emission state, the luminance value I(x, y, 1) in the G light emission state, and the luminance value I(x, y, 2) in the B light emission state are obtained from the captured image with N = 3. In this case, the predetermined stripe pattern for the phase shift method is configured such that the phases of a sine wave pattern consisting of only R, a sine wave pattern consisting of only G, and a sine wave pattern consisting of only B are shifted by 2π / 3.

[0020] When the luminance values ​​I(x,y,0), I(x,y,1), and I(x,y,2) at the point (x,y) in the captured image are obtained, the measurement unit 40 obtains the phase value θ(x,y) using the above formula (1) and measures the distance z to the point (x,y) according to the phase value θ(x,y) thus obtained. By measuring the distance z to each point (x,y) of the captured measurement object R in this manner, the three-dimensional shape of the measurement object R can be measured.

[0021] For example, when determining the distance z of point P1 in FIG. 3, the phase value θ of point P1 and information on which stripe the point P1 is located (stripe number) are obtained from N captured images of the imaging unit 30 in a state where a predetermined stripe pattern is shifted and projected by the projection unit 20 N times. When the angle θp1 at the projection unit 20 and the angle θc1 at the imaging unit 30 are obtained from the phase value θ and stripe number obtained in this way, the distance z of point P1 can be obtained by triangulation since the distance (parallax L) between the projection unit 20 and the imaging unit 30 is known. Similarly, the distance z of point P2 in FIG. 3 can be obtained by triangulation based on the angle θp2 at the projection unit 20 and the angle θc2 at the imaging unit 30 obtained from the phase value θ of point P2 obtained from the N captured images and the stripe number. By performing this calculation over the entire measurement area, three-dimensional measurement can be performed.

[0022] Here, the three-dimensional measurement process performed by the measurement unit 40 when measuring the three-dimensional shape of the measurement object R using the phase shift method will be described in detail with reference to FIGS. In this embodiment, an event camera is used as an imaging unit for accurately capturing an image of a measurement target R that moves relatively at high speed. In such a configuration, event data corresponding to pixels where a luminance change occurs is output, but the event data does not include a luminance value, so that it is not possible to directly obtain the luminance values ​​(I(x,y,0), I(x,y,1), I(x,y,2)) required for the phase shift method.

[0023] On the other hand, since positive event data is output at the timing of the start of light emission, and then negative event data is output at the timing of the end of light emission, the longer the time difference between the output of positive event data and the output of negative event data, the brighter the image becomes. That is, in each pixel of the captured image, the higher the luminance value, the longer the time difference between the occurrence time of positive event data and the occurrence time of negative event data. Therefore, as shown in FIG. 4, the luminance value (luminance information) can be obtained based on the time difference between the occurrence time of positive event data and the occurrence time of negative event data in pixel units in the captured image (see ON time in FIG. 4). Note that in FIG. 4 and FIG. 5 described later, the output of positive event data is illustrated by an upward arrow, and the output of negative event data is illustrated by a downward arrow.

[0024] For example, assume that, at a certain pixel level, an R-light emitting state, a G-light emitting state, and a B-light emitting state are repeated at a predetermined cycle 3T (unit time T) as illustrated in FIG. 5(A). In such a light emitting state, positive polarity event data is generated and output at the timing of the start of R-light emission (see t11 in FIG. 5(A)), and negative polarity event data is generated and output at the timing of the end of R-light emission (see t12 in FIG. 5(A)). Thereafter, positive polarity event data is generated and output at the timing of the start of G-light emission (see t13 in FIG. 5(A)), and negative polarity event data is generated and output at the timing of the end of G-light emission (see t14 in FIG. 5(A)). Thereafter, positive polarity event data is generated and output at the timing of the start of B-light emission (see t15 in FIG. 5(A)), and negative polarity event data is generated and output at the timing of the end of B-light emission (see t16 in FIG. 5(A)).

[0025] Also, for example, at a pixel level different from that of the pixel in FIG. 5(A), as illustrated in FIG. 5(B), positive polarity event data is generated and output at the timing of the start of R-color emission (see t21 in FIG. 5(B)), and negative polarity event data is generated and output at the timing of the end of R-color emission (see t22 in FIG. 5(B)). After that, positive polarity event data is generated and output at the timing of the start of G-color emission (see t23 in FIG. 5(B)), and negative polarity event data is generated and output at the timing of the end of G-color emission (see t24 in FIG. 5(B)). After that, positive polarity event data is generated and output at the timing of the start of B-color emission (see t25 in FIG. 5(B)), and negative polarity event data is generated and output at the timing of the end of B-color emission (see t26 in FIG. 5(B)).

[0026] Here, since the longer the time from the start of R light emission to the end of R light emission, the brighter the R light becomes, the R luminance value can be calculated based on the time from the start of R light emission to the end of R light emission. Similarly, the G luminance value can be calculated based on the time from the start of G light emission to the end of G light emission, and the B luminance value can be calculated based on the time from the start of B light emission to the end of B light emission.

[0027] Therefore, the luminance value (luminance information) can be obtained based on the time difference between the occurrence time of positive polarity event data and the occurrence time of negative polarity event data in pixel units in the captured image. In the example of FIG. 5(A), the luminance value I(x,y,0) in the R-color light emission state can be obtained based on t12-t11, which is the time difference between the occurrence time of positive polarity event data and the occurrence time of negative polarity event data in the R-color light emission state. Similarly, the luminance value I(x,y,1) in the G-color light emission state and the luminance value I(x,y,2) in the B-color light emission state can be obtained based on the time difference t14-t13 and the time difference t16-t15. Using each luminance value obtained in this way, the three-dimensional shape of the measurement object R can be measured by the phase shift method. That is, the three-dimensional shape of the measurement object R can be measured using the event data.

[0028] Next, a configuration for further speeding up three-dimensional measurement by utilizing a projection start signal output from control unit 11 to measurement unit 40 in synchronization with the projection start timing of a predetermined stripe pattern, which is a characteristic configuration of this embodiment, will be described using projection per unit time as an example. Note that in this embodiment, when projection of a predetermined stripe pattern starts, all DMD elements of projection unit 20 are in the ON state, and the darker the DMD element that projects, the shorter the time it takes to change from the ON state to the OFF state.

[0029] In this embodiment, the control unit 11 outputs a start light emission instruction signal to the projection unit 20 to start the projection of a predetermined stripe pattern, and the projection unit 20, to which this start light emission instruction signal is input, starts projecting the predetermined stripe pattern. At this time, the control unit 11 outputs a projection start signal S1 to the measurement unit 40 and the imaging unit 30 as a synchronization signal synchronized with the start light emission instruction signal, as shown in Fig. 6. The control unit 11 also outputs a stop light emission instruction signal to the projection unit 20 to end the projection of the predetermined stripe pattern, and the projection unit 20, to which this stop light emission instruction signal is input, ends the projection of the predetermined stripe pattern. At this time, the control unit 11 outputs a projection end signal S2 to the measurement unit 40 and the imaging unit 30 as a synchronization signal synchronized with the stop light emission instruction signal.

[0030] The imaging unit 30 starts imaging at the timing when the projection start signal S1 is input from the control unit 11, and ends imaging when the projection end signal S2 is input thereafter. Therefore, in the imaging unit 30, positive polarity event data is generated and output in all pixels at the timing when the projection start signal S1 is input. Thereafter, in the imaging unit 30, negative polarity event data is generated and output later for brighter pixels until the projection end signal S2 is input. Note that the imaging unit 30 may end imaging after a specified time has elapsed since the input time of the projection start signal S1, without using the projection end signal S2.

[0031] Therefore, in the measurement unit 40, at the timing when the projection start signal S1 is input from the control unit 11, positive polarity event data is input from the imaging unit 30 for all pixels, and then, negative polarity event data is input from the imaging unit 30 at different timings for each pixel.

[0032] That is, the occurrence time of the positive polarity event data coincides with the input time of the projection start signal S1, and the negative polarity event data is output after the input time of the projection start signal S1. Therefore, it is possible to obtain luminance information for each pixel based on the time difference between the input time of the projection start signal S1 when the above-mentioned predetermined stripe pattern is projected and the occurrence time of the event data output after that input time.

[0033] For example, when a stripe pattern created as shown in FIG. 7(A) is projected from the projection unit 20, the measurement unit 40 to which the projection start signal S1 is input can determine brightness information on a pixel-by-pixel basis based on the time difference (ON time in FIG. 7(B)) between the input time of the projection start signal S1 and the occurrence time of the negative polarity event data output after that input time, without obtaining the input time of the positive polarity event data from the imaging unit 30, as can be seen from FIG. 7(B).

[0034] 5A, since the unit time T is known, it is not necessary to acquire the input time t11 of positive polarity event data at the timing of starting R-color emission, the input time t13 of positive polarity event data at the timing of starting G-color emission, and the input time t15 of positive polarity event data at the timing of starting B-color emission. Then, based on the time difference between the input time of the projection start signal S1 and the input time t12 of negative polarity event data at the timing of starting R-color emission, the input time t14 of negative polarity event data at the timing of starting G-color emission, and the input time t16 of negative polarity event data at the timing of starting B-color emission, it is possible to obtain luminance information in pixel units.

[0035] As described above, in the three-dimensional measuring device 10 according to the present embodiment, the imaging unit 30, which images the measurement target R on which a predetermined stripe pattern is projected from the projection unit 20, includes an imaging element that outputs event data including two-dimensional point data that identifies the position of a pixel that has undergone a luminance change when light is received, and generates an image from the event data output from the imaging element. This imaging element is configured to output positive event data in the case of a brightening luminance change, and output negative event data in the case of a darkening luminance change. The control unit 11 outputs a projection start signal S1 to the measurement unit 40 in accordance with the start timing of projection of the predetermined stripe pattern, and the measurement unit 40 calculates luminance information for each pixel in the captured image based on the time difference between the input time of the projection start signal S1 from the control unit 11 and the occurrence time of the event data output after the input time.

[0036] In this way, luminance information can be obtained for each pixel based on the time difference between the input time of the projection start signal S1 when a predetermined stripe pattern is projected and the occurrence time of the event data output after the input time, and the luminance information obtained in this way can be used to measure the three-dimensional shape of the measurement object R by the phase shift method. In particular, since it is not necessary to obtain the occurrence times of both positive and negative event data for all pixels, but only the occurrence time of the event data output after the input of the projection start signal S1, the processing time can be shortened and the image generation of the measurement object R can be further accelerated. In other words, by using the event data, the three-dimensional shape of the measurement object R can be measured more quickly.

[0037] The present invention is not limited to the above-described embodiment, and may be embodied as follows, for example. (1) The luminance information (luminance value) is not limited to being calculated on a pixel-by-pixel basis based on the time difference (ON time) between the input time of the projection start signal S1 and the occurrence time of event data output after the input time, but may be calculated on a pixel-by-pixel basis based on the OFF time. That is, on the premise that all the DMD elements of the projection unit 20 change from the ON state to the OFF state at the same timing when the projection of a predetermined stripe pattern starts, the luminance information (luminance value) may be calculated on a pixel-by-pixel basis based on the time difference (OFF time) between the input time of the projection start signal S1 and the occurrence time of positive polarity event data output after the input time.

[0038] (2) The three-dimensional measuring device 10 is not limited to being attached to the hand of a robot and moving to measure the three-dimensional shape of a measurement object that moves relative to the robot. For example, it may be used in a fixed state to measure the three-dimensional shape of a measurement object that moves on a conveyor line.

[0039] (3) The three-dimensional measuring device 10 may be configured such that the projection unit 20, the imaging unit 30 and the measurement unit 40 are separate entities, and the measurement unit 40 is configured as an information processing terminal capable of wireless or wired communication with the projection unit 20 and the imaging unit 30.

[0040] (4) The predetermined stripe pattern projected by shifting N times from the projection unit 20 is not limited to being composed of R, G, and B light emission states assuming N=3, but may be composed of, for example, periodically changing light and dark portions. [Explanation of symbols]

[0041] 10...3D measuring device 11...Control section 20…Projection section 30…Imaging unit 40…Measuring section R: Measurement target S1…Projection start signal

Claims

【Claim 1】 A projection unit that projects a predetermined stripe pattern onto an object to be measured, An imaging unit that images the object to be measured onto which the predetermined stripe pattern has been projected, A measurement unit that measures the three-dimensional shape of the object to be measured using luminance information obtained from an image captured by the imaging unit, A control unit that controls the projection unit, A three-dimensional measurement device comprising: The imaging unit includes an image sensor that outputs event data including two-dimensional point data in which the position of a pixel is specified corresponding to a pixel having a luminance change when receiving light, and generates the captured image from the event data output from the image sensor. The image sensor is configured to output positive-polarity event data in the case of a luminance change to bright and negative-polarity event data in the case of a luminance change to dark. The control unit outputs a projection start signal to the measurement unit in accordance with the projection start timing of the predetermined stripe pattern. The measurement unit obtains the luminance information based on the time difference between the input time of the projection start signal from the control unit and the generation time of the event data output after the input time, in terms of pixels in the captured image. A three-dimensional measurement device characterized by this.

Images