Method for processing substrate

Abstract

To provide a method for processing a substrate including depositing a boron-carbon film, and the boron-carbon film exhibits improved etch selectivity.SOLUTION: A method includes: exposing a substrate positioned in a processing area of a processing chamber to a hydrocarbon-containing gas mixture; exposing the substrate to a boron-containing gas mixture; and generating a radio frequency (RF) plasma in the processing area to deposit a boron-carbon film on the substrate. The hydrocarbon-containing gas mixture and the boron-containing gas mixture are caused to flow into the processing area at a precursor ratio of (boron-containing gas mixture / ((boron-containing gas mixture)+hydrocarbon-containing gas mixture) of about 0.38 to about 0.85. The boron-carbon hard mask film provides high modulus of elasticity, etch selectivity, and stress for high aspect-ratio features (for example, 10:1 or more) and smaller dimension devices (for example, 7 nm node or less).SELECTED DRAWING: Figure 2

Description

[Technical field]

[0001] TECHNICAL FIELD

[0001] Embodiments of the present disclosure relate generally to methods, and more specifically, to methods for processing substrates. [Background technology]

[0002]

[0002] The demand for higher integrated circuit density places demands on the process sequences used to manufacture integrated circuit components. For example, in a process sequence using conventional photolithography techniques, a layer of energy-sensitive resist is formed over a stack of material layers disposed on a substrate. The energy-sensitive resist layer is exposed to an image of a pattern to form a photoresist mask. An etching process is then used to transfer the mask pattern to one or more material layers of the stack. The chemical etchant used in the etching process is selected to have a higher etch selectivity to the material layers of the stack than to the mask of the energy-sensitive resist. The etch selectivity to one or more material layers of the stack over the resist layer prevents the energy-sensitive resist layer from being consumed before the pattern transfer is complete.

[0003]

[0003] As the dimensions of the patterns shrink, the thickness of the energy-sensitive resist is correspondingly reduced to control the resolution of the patterns. The above-mentioned thin resist layers may be insufficient to hide the underlying material layer during the pattern transfer process due to attack by chemical etchants. An intermediate layer called a hard mask is often used between the energy-sensitive resist layer and the underlying material layer to facilitate the pattern transfer, due to the high resistance of the hard mask to chemical etchants. As the critical dimension (CD) shrinks, current hard mask materials lack the desired etch selectivity compared to the underlying material.

[0004]

[0004] Therefore, there is a need for a method for depositing hardmask films with improved etch selectivity. Summary of the Invention

[0005]

[0005] Embodiments included herein include a method of processing a substrate, the method including depositing a boron-carbon film, the boron-carbon film exhibiting improved etch selectivity.

[0006] In one embodiment, a method for processing a substrate is provided. The method includes exposing a substrate positioned in a processing region of a processing chamber to a hydrocarbon-containing gas mixture, exposing the substrate to a boron-containing gas mixture, and generating a radio frequency (RF) plasma in the processing region to deposit a boron-carbon film on the substrate. The hydrocarbon-containing gas mixture and the boron-containing gas mixture are flowed into the processing region in a precursor ratio of about 0.38 to about 0.85 (boron-containing gas mixture / ((boron-containing gas mixture)+hydrocarbon-containing gas mixture). The boron-carbon film has about 55 atomic percent to about 95 atomic percent boron.

[0007] In another embodiment, a method of processing a substrate is provided. The method includes exposing a substrate positioned in a processing region of a processing chamber to a hydrocarbon-containing gas mixture, exposing the substrate to a boron-containing gas mixture, and generating a radio frequency (RF) plasma in the processing region to deposit a boron-carbon film on the substrate. The hydrocarbon-containing gas mixture and the boron-containing gas mixture are flowed into the processing region in a precursor ratio of about 0.38 to about 0.85 (boron-containing gas mixture / ((boron-containing gas mixture)+hydrocarbon-containing gas mixture). The boron-carbon film has about 35 atomic percent to about 55 atomic percent boron.

[0008] In yet another embodiment, a method of processing a substrate is provided. The method includes exposing a substrate positioned in a processing region of a processing chamber to a hydrocarbon-containing gas mixture, exposing the substrate to a boron-containing gas mixture, and generating a radio frequency (RF) plasma in the processing region to deposit a boron-carbon film on the substrate. The hydrocarbon-containing gas mixture and the boron-containing gas mixture are flowed into the processing region in a precursor ratio of about 0.38 to about 0.85 (boron-containing gas mixture / ((boron-containing gas mixture)+hydrocarbon-containing gas mixture). The hydrocarbon-containing gas mixture includes propylene (C3H6). The boron-carbon film has about 55 atomic percent to about 95 atomic percent boron.

[0009]

[0009] In order that the above-mentioned features of the present disclosure may be understood in detail, the above-summarized embodiments will now be more particularly described with reference to the embodiments, some of which are illustrated in the accompanying drawings, with the understanding that the accompanying drawings merely illustrate exemplary embodiments of the present disclosure and therefore should not be considered as limiting the scope of the embodiments, as the present disclosure may admit of other equally effective embodiments. [Brief description of the drawings]

[0010] [Figure 1] 1 is a schematic diagram illustrating a substrate processing system according to an embodiment; [Diagram 2] FIG. 2 is a flow diagram of method steps for depositing a boron-carbon film, according to one embodiment. [Diagram 3] 1 is a schematic cross-sectional view showing a substrate structure according to an embodiment; [Figure 4] 1 is a graph showing the ratio of boron (B) to precursor ratio (PR). DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0011]

[0014] The embodiments of the present disclosure generally relate to methods for processing substrates. The present disclosure describes techniques for depositing a hardmask (e.g., boron-carbon film) with high modulus and etch selectivity on a substrate. The method includes the production of a dense boron-carbon hardmask film with high boron concentration and low hydrogen content. The percentage of boron (B%) in the boron-carbon hardmask film increases as the flow rate of the hydrocarbon-containing gas source is reduced. The boron-carbon hardmask film provides high modulus, etch selectivity, and stress for high aspect ratio (e.g., 10:1 or more) features and smaller dimension (e.g., 7 nm node and below) devices. The embodiments described herein are compatible with current carbon hardmask process integration schemes. Thus, the introduction of the method into an existing device manufacturing line does not require substantial changes to upstream or downstream processing methods or associated equipment. The embodiments disclosed herein may be useful, but are not limited to, for the deposition of boron-carbon hardmasks.

[0012]

[0015] As used herein, the term "about" refers to a + / - 10% variation from the nominal value. It should be understood that such a variation can be included in any value provided herein.

[0013]

[0016] The embodiments described herein are described below with respect to a plasma enhanced chemical vapor deposition (PECVD) process that may be performed using any suitable thin film deposition system. Examples of suitable systems include the CENTURA® system, which may use a DxZ™ processing chamber, the PRECISION5000® system, the PRODUCER™ system, the PRODUCER GT™, and the PRODUCER SE™ processing chamber available from Applied Materials, Inc., Santa Clara, Calif. Other tools capable of performing PECVD processes may also be adapted to benefit from the embodiments described herein. Furthermore, any system that enables the PECVD processes described herein may be used to advantage. The apparatus descriptions described herein are exemplary and should not be construed or interpreted as limiting the scope of the embodiments described herein.

[0014]

[0017] 1 is a schematic diagram illustrating a substrate processing system 132 according to one embodiment. The substrate processing system 132 is configured to perform hard mask layer deposition. As shown, the substrate processing system 132 includes a process chamber 100 coupled to a gas panel 130 and a controller 110.

[0015]

[0018] The processing chamber 100 is configured to perform various processing methods on a substrate 190 disposed therein. For example, the processing chamber 100 is configured to deposit a hard mask on the substrate 190. As shown, the processing chamber 100 includes a top wall 124, one or more sidewalls 101, and a bottom wall 122 that define an interior processing region 126. A support pedestal 150 for supporting the substrate 190 is disposed in the interior processing region 126 of the processing chamber 100. The support pedestal 150 is supported by a stem 160, and the support pedestal 150 and / or the stem 160 may include any other suitable material, such as aluminum, ceramic, and stainless steel. The support pedestal 150 may move vertically within the processing chamber 100 using a displacement mechanism (not shown) (e.g., an actuator that raises and lowers the support pedestal). In some embodiments, the support pedestal 150 includes an electrostatic chuck (ESC). The ESC secures the substrate 190 during processing.

[0016]

[0019] The support pedestal 150 may include a heater element 170 embedded therein. The heater element 170 is configured to control a temperature of a substrate 190 supported on a surface 192 of the support pedestal 150. The support pedestal 150 may be resistively heated by applying a current to the heater element 170 from a power supply 106. The current provided by the power supply 106 is regulated by the controller 110 to control the heat generated by the heater element 170, thereby maintaining the substrate 190 and the support pedestal 150 at a substantially constant temperature during film deposition. The current provided is adjusted to selectively control the temperature of the support pedestal 150 between about 400° C. and about 700° C.

[0017]

[0020] A temperature sensor 172, such as a thermocouple, may be embedded in the support pedestal 150 to monitor the temperature of the support pedestal 150. The measured temperature is used by the controller 110 to control the power supplied to the embedded heater element 170 to maintain the substrate 190 at a desired temperature.

[0018]

[0021] A vacuum pump 102 is coupled to a port formed in a bottom wall 122 of the processing chamber 100. The vacuum pump 102 is used to maintain a desired gas pressure in the processing chamber 100. The vacuum pump 102 also evacuates post-processing gases and process by-products from the processing chamber 100.

[0019]

[0022] A gas distribution assembly 120 having a plurality of apertures 128 is disposed on top of the processing chamber 100 above the support pedestal 150. The gas distribution assembly 120 is configured to flow one or more process gases into the processing chamber 100. The apertures 128 may have different sizes, numbers, distributions, shapes, designs, and diameters to facilitate the flow of various process gases into the processing chamber 100. The gas distribution assembly 120 is connected to a gas panel 130 that supplies various gases to the interior processing region 126 during substrate processing. A plasma may be formed from the process gas mixture exiting the gas distribution assembly 120 to facilitate the thermal decomposition of the process gases, resulting in the deposition of material on a surface 191 of the substrate 190.

[0020]

[0023] The gas distribution assembly 120 and the support pedestal 150 may form a pair of spaced apart electrodes in the interior processing region 126. One or more radio frequency (RF) power sources 140 provide a bias potential to the gas distribution assembly 120 through a matching network 138 to facilitate the generation of a plasma between the gas distribution assembly 120 and the support pedestal 150. Alternatively, the RF power source 140 and the matching network 138 are coupled to the gas distribution assembly 120, the support pedestal 150, or both the gas distribution assembly 120 and the support pedestal 150, or to an antenna (not shown) located outside the processing chamber 100. In one embodiment, the RF power source 140 provides a power of about 100 W to about 3000 W at a frequency of about 50 kHz to about 13.6 MHz. In another embodiment, the RF power source 140 provides a power of about 500 W to about 1800 W at a frequency of about 50 kHz to about 13.6 MHz.

[0021]

[0024] As shown, the controller 110 includes a central processing unit (CPU) 112, a memory 116, and support circuits 114 configured to control process sequences and regulate gas flow from a gas panel 130. The CPU 112 is any form of general-purpose computer processor used in industrial environments. Software routines may be stored in the memory 116, such as random access memory, read-only memory, floppy or hard disk drive, or other form of digital storage. The support circuits 114 are conventionally coupled to the CPU 112 and may include cache, clock circuits, input / output systems, power supplies, etc. Bidirectional communication between the controller 110 and the various components of the substrate processing system 132 is handled through a number of signal cables collectively referred to as a signal bus 118.

[0022]

[0001] Figure 2 is a flow diagram of steps of a method 200 for depositing a boron-carbon film, according to one embodiment. Although the steps of the method 200 are described with reference to Figures 2 and 3, one skilled in the art will understand that any system configured to perform the steps of the method in any order is within the scope of the embodiments described herein. The method 200 may be stored on or accessible to the controller 110 as a computer-readable medium that includes instructions that, when executed by the CPU 112 of the controller, cause the system 132 and / or the processing chamber 100 to perform the method 200.

[0023]

[0025] The method 200 begins at step 210, where a substrate disposed in a processing region of a processing chamber is exposed to a hydrocarbon-containing gas. The processing chamber can be the processing chamber 100 shown in FIG. 1. FIG. 3 is a schematic cross-sectional view of a substrate structure 300 according to one embodiment. As shown, the substrate structure 300 includes a substrate 190. The substrate 190 can have a substantially planar surface 191 having structures formed thereon or therein at a desired height. Alternatively, the substrate 190 can have a surface having patterned structures, such as trenches, holes, or vias formed therein. Although the substrate 190 is shown in FIG. 3 as a unitary body, it is understood that the substrate 190 can include one or more materials used in the formation of semiconductor devices, such as metal contacts, trench isolation, gates, bitlines, or any other interconnect features. The substrate 190 can include any number or combination of metal, semiconductor, and / or insulating layers thereon.

[0024]

[0026] Substrate 190 may include one or more metal layers, one or more dielectric materials, semiconductor materials, and combinations thereof used to fabricate semiconductor devices. For example, substrate 190 may include oxide materials, nitride materials, polysilicon materials, etc., depending on the application. In one embodiment where a memory application is desired, substrate 190 includes silicon substrate materials, oxide materials, and nitride materials, with or without polysilicon sandwiched between them.

[0025]

[0027] In another embodiment, the substrate 190 includes a plurality of alternating oxide and nitride materials (i.e., oxide-nitride-oxide (ONO)) deposited on the surface 191 of the substrate 190. In various embodiments, the substrate 190 includes a plurality of alternating oxide and nitride materials, one or more oxide or nitride materials, polysilicon or amorphous silicon materials, oxide alternating with amorphous silicon, oxide alternating with polysilicon, undoped silicon alternating with doped silicon, undoped polysilicon alternating with doped polysilicon, or undoped amorphous silicon alternating with doped amorphous silicon. The substrate 190 can be any substrate or material surface on which film processing is performed. For example, the substrate 190 may include crystalline silicon, silicon oxide, silicon oxynitride, silicon nitride, strained silicon, silicon germanium, tungsten, titanium nitride, doped or undoped polysilicon, doped or undoped silicon wafers, and patterned or unpatterned wafers, silicon-on-insulator (SOI), carbon doped silicon oxide, silicon nitride, doped silicon, germanium, gallium arsenide, glass, sapphire, low-k dielectrics, and combinations thereof.

[0026]

[0028] The hydrocarbon-containing gas mixture is flowed from the gas panel 130 through the gas distribution assembly 120 to the internal processing region 126. The gas mixture includes at least one hydrocarbon compound. The gas mixture may further include an inert gas, a diluent gas, or a combination thereof. The hydrocarbon may be any gas or liquid that may be vaporized to simplify the hardware required for metering, controlling, and delivering materials to the chamber. In one embodiment, the hydrocarbon source is a gaseous hydrocarbon, such as a linear hydrocarbon. In one embodiment, the hydrocarbon compound is represented by the general formula C x H y where x ranges from 1 to 20 and y ranges from 1 to 20. In one embodiment, the hydrocarbon compound is an alkane. Suitable hydrocarbon compounds include, for example, methane (CH), ethane (C2H6), propylene (C3H6), propane (C3H8), butane (C4H10 ) and its isomers isobutane, pentane (C5H 12 ), Hexane (CH 14 ) and its isomers isopentane, neopentane, and hexane (C 14 ), and its isomers 2-methylpentane, 3-methylpentane, 2,3-dimethylbutane, and 2,2-dimethylbutane, or combinations thereof. Additional suitable hydrocarbons include, for example, alkenes, such as acetylene, ethylene, propylene, butylene and its isomers, dienes, such as pentene and its isomers, butadiene, isoprene, pentadiene, hexadiene, or combinations thereof.

[0027]

[0029] Additional suitable hydrocarbons include halogenated alkenes such as, for example, monofluoroethylene, difluoroethylene, trifluoroethylene, tetrafluoroethylene, monochloroethylene, dichloroethylene, trichloroethylene, tetrachloroethylene, or combinations thereof. Additional suitable hydrocarbons include alkynes such as, for example, acetylene (C2H2), propyne (C3H4), butylene (C4H8), vinyl acetylene, or combinations thereof. Additional suitable hydrocarbons include aromatic hydrocarbons such as, for example, benzene, styrene, toluene, xylene, ethylbenzene, acetophenone, methyl benzoate, phenyl acetate, phenol, cresol, furan, alpha-terpinene, cymene, 1,1,3,3,-tetramethylbutylbenzene, t-butyl ether, t-butylethylene, methyl methacrylate, and t-butyl furfuryl ether, compounds having the formulas C3H2 and C5H4, monofluorobenzene, difluorobenzene, tetrafluorobenzene, hexafluorobenzene, or combinations thereof. In some instances, C3H6 has been found to be advantageous due to the formation of more stable intermediate species that have higher surface mobility.

[0028]

[0030] The flow rate of the hydrocarbon-containing gas mixture can be from about 2000 sccm to about 4500 sccm, for example, from about 2200 sccm to about 4000 sccm. In one embodiment where C3H6 is used as the hydrocarbon-containing gas source, the flow rate of the hydrocarbon-containing gas mixture is from about 2250 sccm to about 3000 sccm, for example, from about 2300 sccm to about 2800 sccm.

[0029]

[0031] A suitable diluent gas, such as helium (He), argon (Ar), hydrogen gas (H2), nitrogen gas (N2), ammonia (NH3), or combinations thereof, among others, can be added to the gas mixture as needed. Ar, He, and N2 are used to control the density and deposition rate of the amorphous carbon layer. Alternatively, no diluent gas is used during deposition.

[0030]

[0032] In some cases, a nitrogen-containing gas is supplied to the process chamber 100 along with the hydrocarbon-containing gas mixture to control the hydrogen ratio of the amorphous carbon layer. Suitable nitrogen-containing compounds include, for example, nitrogen gas, ammonia, pyridine, aliphatic amines, amines, nitriles, and similar compounds.

[0031]

[0033] An inert gas, such as argon (Ar) and / or helium (He), may be supplied to the process chamber 100 along with the hydrocarbon-containing gas mixture. Other inert gases, such as nitrogen gas (N2), may also be used to control the density and deposition rate of the amorphous carbon layer. Additionally, various other process gases may be added to the gas mixture to modify the properties of the amorphous carbon material. In one embodiment, the process gas includes a reactive gas, such as hydrogen gas (H2), ammonia (NH3), a mixture of hydrogen gas (H2) and nitrogen gas (N2) (also known as forming gas), or combinations thereof. The addition of H2 and / or NH3 is used to control the hydrogen ratio (e.g., carbon to hydrogen ratio) of the deposited amorphous carbon layer. The hydrogen ratio present in the amorphous carbon film provides control of the layer properties, such as reflectivity.

[0032]

[0034] In step 220, the substrate 190 is exposed to a boron-containing gas mixture. The boron-containing gas mixture is flowed from the gas panel 130 through the gas distribution assembly 120 to the interior processing region 126. In one embodiment, the boron-containing gas mixture includes a boron-containing compound and a diluent gas. Examples of boron-containing compounds include diborane (B2H6), trimethylborane [TMB] (B(CH3)3), triethylborane [TEB] (B(C2H5)3), methylborane, dimethylborane, ethylborane, diethylborane, ortho-carborane (CB2H6), ortho-carborane (CB2H5 ... 10 H 12 ), and similar compounds. Suitable diluent gases may be included, such as hydrogen gas (H2), helium (He), argon (Ar), nitrogen gas (N2), ammonia (NH3), or combinations thereof, among others. In one example, the boron-containing gas mixture includes B2H6 and H2.

[0033]

[0035] In one embodiment, the percentage of the boron-containing compound in the total boron-containing gas mixture is about 1 weight percent (wt%) to about 20 wt%, for example, about 2 wt% to about 18 wt%, for example, about 5 wt% to about 12 wt%, for example, about 7 wt% to about 12 wt%. Exemplary boron-containing gas mixtures include, for example, 6 wt% B2H6 / 94 wt% H2, 7 wt% B2H6 / 93 wt% H2, 8 wt% B2H6 / 92 wt% H2, 9 wt% B2H6 / 91 wt% H2, 10 wt% B2H6 / 90 wt% H2, 11 wt% B2H6 / 89 wt% H2, or 12 wt% B2H6 / 88 wt% H2. The hydrogen gas in these illustrative examples can be replaced with He, Ar, or N2. It is believed that when boron-containing gas mixtures of different concentrations are used, the flow rates required to achieve particular film properties may vary accordingly.

[0034]

[0036] In various embodiments in which C3H6 is used as the hydrocarbon-containing gas source and 9 wt. % B2H6 diluted with H2 is used as the boron-containing gas source, the ratio of flow rates of the hydrocarbon-containing gas source to the boron-containing gas source (hereinafter, ratio) can range from about 0.05:1 to about 0.13:1, such as from about 0.07:1 to about 0.12:1, such as from about 0.9:1 to about 0.11:1.

[0035]

[0037] In one embodiment where 9% by weight diborane diluted with H2 is used as the boron-containing gas source, the flow rate of the boron-containing gas mixture varies from about 1000 sccm to about 10000 sccm, for example, from about 1800 sccm to about 3500 sccm, for example, about 2300 sccm. In another embodiment where 6% diborane diluted with H2 is used as the boron-containing gas source, the flow rate of the boron-containing gas mixture is from about 5000 sccm to about 15000 sccm, for example, about 13000 sccm. In yet another embodiment where 12% diborane diluted with H2 is used as the boron-containing gas source, the flow rate of the boron-containing gas mixture is from about 2000 sccm to about 8000 sccm, for example, from about 2200 sccm to about 7500 sccm.

[0036]

[0038] The hydrocarbon-containing gas mixture may be introduced into the inner processing region 126 for about 3 seconds to about 30 seconds, for example, about 15 seconds, depending on the size of the substrate. Flowing the hydrocarbon-containing gas mixture before the introduction of the boron-containing gas may provide continued thermal and pressure stabilization of the inner processing region 126. The boron-containing gas mixture is then flowed into the inner processing region 126 for about 0.5 seconds to about 5 seconds, for example, about 1 second to about 2 seconds (the flow time can be varied as long as the flow is long enough that the boron-containing gas mixture begins to reach the inner processing region 126 before the RF plasma strikes). It is contemplated that step 210 may be performed simultaneously, before, after, or partially overlapping with the process of step 220.

[0037]

[0039] In step 230, an RF plasma is generated in the inner processing region 126 to deposit a boron-carbon film 304 on the substrate 190. The plasma may be formed by capacitive or inductive means and may be excited by coupling RF power to the precursor gas mixture. The RF power may be dual frequency RF power using a frequency ranging from about 0.4 MHz to about 300 MHz. For example, the RF power is dual frequency RF power having high frequency and low frequency components. The RF power is typically applied at a power level of about 50 W to about 2500 W, which may be all high frequency RF power, for example, at a frequency of about 13.56 MHz, or may be a mixture of high frequency and low frequency power, for example, a high frequency of about 13.56 MHz and a low frequency of about 0.35 kHz.

[0038]

[0040] It has been observed that increasing the boron doping in the boron-carbon film can increase the etch selectivity and film transparency while reducing the stress of the boron-carbon film. By increasing the flow of the boron-containing gas mixture (e.g., B2H6) during deposition, the amount of boron in the boron-carbon film can be increased, but the hydrogen content in the resulting boron-carbon film will inevitably increase as well. Due to the presence of a large amount of hydrogen in the boron-carbon film, the mechanical strength and etch selectivity of the film can be affected. However, it has been surprisingly discovered that decreasing the hydrocarbon-containing gas mixture during deposition can increase the boron content and decrease the hydrogen content of the boron-carbon film 304 compared to conventionally deposited amorphous carbon layers (e.g., APF™ hardmask).

[0039]

[0041] Table 1 below shows various flow combinations of the hydrocarbon-containing gas source and the boron-containing gas source used to form the amorphous carbon film reference (baseline) and the boron-carbon films (cases 1-4). Case 1 is an example where only the hydrocarbon-containing gas source is reduced compared to the baseline. Case 2 is an example where the hydrocarbon-containing gas source is reduced and the boron-containing gas source is increased compared to the baseline. Case 3 is an example where only the boron-containing gas source is increased compared to the baseline. Case 4 is an example where the hydrocarbon-containing gas source is reduced and the boron-containing gas source is increased compared to the baseline. Table 2 below shows the boron-carbon film properties of the amorphous carbon film reference and the boron-carbon films (cases 1-4) formed according to the flow combinations shown in Table 1. The percentage of boron content in the boron-carbon film is calculated as follows: ((B / (B+C)%).

[0040]

[0042] [Table 1]

[0041]

[0043] [Table 2]

[0042]

[0044] As can be seen from Table 2, the boron content was increased by three different conditions: (a) only decreasing CH only (e.g., case 1); (b) only increasing BH / H only (e.g., case 3); (c) a combination of (1) and (2) (e.g., cases 2 and 4). If the flow rate of the hydrocarbon-containing gas source is further decreased (e.g., case 2), the boron content in the final boron-carbon film increases accordingly. However, if the flow rate of the boron-containing gas source is significantly increased (e.g., case 3), the boron content in the final boron-carbon film decreases instead. In particular, the decrease in the refractive index and the increase in the film stress suggest that the high hydrogen content may etch or consume boron, resulting in an inefficient increase in boron in the final boron-carbon film.

[0043]

[0045] FIG. 4 is a graph 400 showing the percentage of boron (B) versus precursor ratio (PR). Graph 400 is based on an example where CH is used as the hydrocarbon-containing gas source and 9 wt% BH diluted with H is used as the boron-containing gas source. The PR in FIG. 4 is calculated as follows: PR=(9 wt% BH in H / ((9 wt% BH in H)+CH). As can be seen, the PR increases as the flow rate of the hydrocarbon-containing gas source decreases (e.g., cases 1 and 2), resulting in increased boron doping (B%) in the boron-carbon film. The precursor ratios described herein are believed to be equally applicable to other hydrocarbon-containing and boron-containing gas mixtures mentioned in this disclosure. Additionally, the PR can vary from 0.3 to 0.55. Although the PR is shown to be increased, lower or higher PR is contemplated depending on the desired boron content in the final boron-carbon film. In various examples, the PR may range from 0.38 to 0.85, such as from about 0.45 to about 0.75. It is proposed that as the PR of the plasma increases, the generated RF plasma becomes more uniform. The uniformity of the RF plasma corresponds to the uniformity of the deposited film. Thus, unexpectedly, increasing the B% of the RF plasma results in a more uniform deposited film.

[0044]

[0046] Since the boron content is directly related to PR, any amount / percentage of boron in the as-deposited boron-carbon film 304 can be achieved by adjusting the PR. In either case, the atomic percent of boron incorporation into the film can be calculated as follows: ((B / (B+C)%). In various embodiments of the present disclosure, the boron-carbon film 304 includes at least 50, 55, 60, 65, 70, 75, 80, 85, or 90 atomic percent boron. In one embodiment, the boron-carbon film 304 includes about 45 to about 95 atomic percent boron. In another embodiment, the boron-carbon film includes about 55 to about 90 atomic percent boron. In yet another embodiment, the boron-carbon film includes about 60 to about 85 atomic percent boron. Similarly, the source of carbon incorporation into the film can be calculated as follows: ((B / (B+C)%). In one embodiment, the boron-carbon film includes about 45 to about 95 atomic percent boron. In another embodiment, the boron-carbon film includes about 55 to about 90 atomic percent boron. In yet another embodiment, the boron-carbon film includes about 60 to about 85 atomic percent boron. The percent carbon may be calculated as follows: ((C / (B+C)%). In various embodiments of the present disclosure, the boron-carbon film 304 comprises at least 10, 15, 20, 25, 30, 35, 40, 45, or 50 atomic percent carbon. In one embodiment, the boron-carbon film 304 comprises about 15 to about 55 atomic percent carbon. In another embodiment, the boron-carbon film 304 comprises about 25 to about 45 atomic percent carbon. In various embodiments, the boron-carbon film 304 comprises less than about 10, 15, or 20 atomic percent hydrogen. The boron-carbon film 304 may be crystalline or amorphous.

[0045]

[0047] In step 240, a determination is made regarding whether the deposited boron-carbon film 304 has reached a target thickness. The boron-carbon film 304 may have a target thickness that corresponds to the subsequent etching requirements of the substrate 190. Flowing a hydrocarbon-containing gas mixture into the processing region (step 210), flowing a boron-containing gas mixture into the processing region (step 220), and generating an RF plasma in the processing region to deposit a boron-carbon film (step 230) may be repeated until the target thickness is reached. In one embodiment, the boron-carbon film is deposited to a thickness of about 100 Å to about 30,000 Å (e.g., about 1,000 Å to about 18,000 Å; about 100 Å to about 20,000 Å; about 300 Å to about 5,000 Å; or about 1,000 Å to about 2,000 Å).

[0046]

[0048] In optional step 250, additional processing is performed on the substrate structure 300. For example, a patterned photoresist (not shown) is formed on the boron-carbon film 304. The boron-carbon film 304 may be etched in a pattern corresponding to the patterned photoresist layer, followed by etching the substrate 190 in the pattern. Material may be deposited on the etched portions of the boron-carbon film 304. The boron-carbon film 304 may be removed using a solution containing hydrogen peroxide and sulfuric acid, or any etching chemistry containing oxygen and a halogen (e.g., fluorine or chlorine). The boron-carbon film 304 may be removed by a chemical mechanical polishing (CMP) process.

[0047]

[0049] B doping is generally used to describe sp 3 It reduces the carbon-hydrogen (CH) bond. B dopants form at interstitial sites. Adjacent H atoms bond to produce hydrogen gas (H2) and leave the film. The remaining C and B atoms then form C-B bonds. sp 3 It is theorized that C-H bonds cause lattice relaxation, resulting in tensile stress. B doping generally increases the C=C and C≡C bonds in boron-carbon films, increasing the C / H ratio. 3 The CH bonds are also reduced, resulting in compressive stress. The increase in flow in B2H6 requires more sp 3 C-H bonds may be included, resulting in a high H content. To prevent the formation of C-C polymer chains in the film, shorter chain C molecules are preferred.

[0048]

[0050] Current low-temperature boron-containing carbon hardmasks achieve better etch selectivity, mechanical strength, and transparency compared to previous amorphous carbon hardmask films. However, the amorphous nature, higher hydrogen content, and lower elastic modulus (~100 GPa) of low-temperature boron-containing hardmask films limit the fabrication of high aspect ratio features and smaller dimension devices. To enable next generation integrated circuit chipsets, embodiments of the present disclosure provide fabrication of dense boron-carbon hardmask films with high boron concentration and low hydrogen content at higher temperatures (e.g., 400 degrees Celsius or higher).

[0049]

[0051] The boron-carbon film as deposited has a strongly bonded boron-carbon (BC) network that protects the boron carbide film from the etchant. Thus, the boron carbide film shows high selectivity to the substrate (either oxide or nitride substrate) for further etching processes. The BC bonds are shorter than the carbon-carbon (CC) bonds, shifting the stress of the boron-carbon film to tensile stress. The boron-carbon film has lower stress and less substrate warpage. The boron-carbon film has a high elastic modulus and hardness, so the boron-carbon film is mechanically robust. Furthermore, the BC bonds increase the band gap of the film. Thus, the boron-carbon film is transparent to at least some of the frequencies of light used in photolithography. The reduction in the boron-containing gas mixture also leads to a reduction in the cost of ownership, since it reduces the need for boron-containing gases (e.g., diborane) without degrading the desired properties of the film.

[0050]

[0052] In general, the following exemplary deposition process parameters are used to form a boron-containing amorphous carbon layer. The process parameters can range from about 400° C. to about 700° C. (e.g., about 450° C. to about 650° C.) substrate temperature. The chamber pressure can range from about 1 Torr to about 20 Torr (e.g., about 2 Torr to about 10 Torr). The flow rate of the hydrocarbon-containing gas (e.g., C3H6) can range from about 150 sccm to about 400 sccm, e.g., about 160 sccm to about 260 sccm. The flow rates of the dilution gases (e.g., He) can range individually from about 0 sccm to about 3000 sccm (e.g., about 1200 sccm to about 2000 sccm). The flow rates of the inert gases (e.g., Ar) can range individually from about 0 sccm to about 10000 sccm (e.g., about 2500 sccm to about 4000 sccm). The flow rate of the boron-containing gas mixture (e.g., about 6% to about 10% by weight B2H6 diluted with H2) can be about 1000 sccm to about 3500 sccm, e.g., about 1500 sccm to about 2300 sccm. The high frequency RF power can be 1000 W to 3000 W, e.g., about 2000 W. The low frequency RF power can be about 0 W to about 1500 W, e.g., about 800 W. The spacing between the surface 191 (e.g., top surface) of the substrate 190 and the gas distribution assembly 120 can be about 100 mm to about 600 mm (e.g., about 150 mm to about 400 mm). The power supply voltage of the ESC can be about 0 V to about 1000 V, e.g., about 600 V to about 750 V. The boron-carbon film may be deposited to a thickness of about 100 Å to about 30,000 Å, for example, about 1,000 Å to about 18,000 Å. The above process parameters provide typical deposition rates for boron-containing amorphous carbon layers in the range of about 100 Å / min to about 10,000 Å / min and may be implemented on a 300 mm substrate in a deposition chamber commercially available from Applied Materials, Inc. of Santa Clara, Calif.

[0051]

[0053] The as-deposited boron-carbon film 304 may have a refractive index (n) of greater than about 2, e.g., about 2.34, at a 633 nm wavelength. The as-deposited boron-carbon film 304 may have an extinction coefficient (k) of less than about 0.1, e.g., 0.04 or less, at a 633 nm wavelength. The as-deposited boron-carbon film 304 may have an elastic modulus of about 150 MPa to about 400 MPa. The as-deposited boron-carbon film 304 may have a stress of about -200 MPa to about 200 MPa (e.g., about -50 MPa to about 100 MPa). The as-deposited boron-carbon film 304 may have a density of greater than 1.5 g / cc, e.g., about 1.85 g / cc.

[0052]

[0054] As described above, a method for processing a substrate is provided, which includes producing a dense boron-carbon hardmask film having a high concentration of boron and low hydrogen content. Reducing the flow rate of the hydrocarbon-containing gas source increases the B% of the boron-carbon hardmask film.

[0053]

[0055] Boron-carbon hardmask films provide high modulus, etch selectivity, and stress for high aspect ratio (e.g., 10:1 or greater) features and smaller dimension (e.g., 7 nm node and below) devices. The embodiments described herein are compatible with current carbon hardmask process integration schemes. Thus, introduction of the methods into existing device manufacturing lines does not require substantial modifications of upstream or downstream processing methods or associated equipment.

[0054]

[0056] While the forgoing is directed to embodiments of the present disclosure, other and further embodiments of the present disclosure may be devised without departing from the basic scope thereof, which scope is determined by the following claims.

Claims

1. 1. A method for processing a substrate, comprising: exposing the substrate positioned in a processing region of a processing chamber to a hydrocarbon-containing gas mixture; exposing the substrate to a boron-containing gas mixture, wherein the hydrocarbon-containing gas mixture and the boron-containing gas mixture are flowed into the processing region at a precursor ratio of (boron-containing gas mixture / ((boron-containing gas mixture)+hydrocarbon-containing gas mixture)) of about 0.38 to about 0.85; generating a radio frequency (RF) plasma in the processing region to deposit a boron-carbon film on the substrate, the boron-carbon film having about 55 atomic percent to about 95 atomic percent boron; The method includes:

2. The method of claim 1 , wherein the hydrocarbon-containing gas mixture comprises an alkane.

3. The hydrocarbon-containing gas mixture is propylene (C ３ H ６ 3. The method of claim 2, comprising:

4. The boron-containing gas mixture is preferably hydrogen gas (H ２ Approximately 9 weight percent (wt%) of diborane (B ２ H ６ 2. The method of claim 1 , comprising:

5. 2. The method of claim 1, wherein the ratio of said hydrocarbon-containing gas mixture to said boron-containing gas mixture is in the range of about 0.7:1 to about 0.12:

1.

6. 10. The method of claim 1, wherein generating the RF plasma comprises applying a high frequency of about 12 MHz to about 14 MHz and a low frequency of about 0.1 kHz to about 1 kHz.

7. 7. The method of claim 6, wherein the high and low frequency applications are applied at a power level of about 50W to about 2500W.

8. 1. A method for processing a substrate, comprising: exposing the substrate positioned in a processing region of a processing chamber to a hydrocarbon-containing gas mixture; exposing the substrate to a boron-containing gas mixture, wherein the hydrocarbon-containing gas mixture and the boron-containing gas mixture are flowed into the processing region at a precursor ratio of (boron-containing gas mixture / ((boron-containing gas mixture)+hydrocarbon-containing gas mixture)) of about 0.38 to about 0.85; generating a radio frequency (RF) plasma in the processing region to deposit a boron-carbon film on the substrate, the boron-carbon film having about 35 atomic percent to about 55 atomic percent boron; The method includes:

9. 10. The method of claim 8, wherein generating the RF plasma comprises applying a high frequency of about 12 MHz to about 14 MHz and a low frequency of about 0.1 kHz to about 1 kHz.

10. 10. The method of claim 9, wherein the high and low frequency applications are applied at a power level of about 50W to about 2500W.

11. The method of claim 8 , wherein the substrate is affixed to an electrostatic chuck (ESC).

12. A non-transitory computer readable medium, comprising: exposing a substrate positioned in a processing region of a processing chamber to a hydrocarbon-containing gas mixture; exposing the substrate to a boron-containing gas mixture, wherein the hydrocarbon-containing gas mixture and the boron-containing gas mixture are flowed into the processing region at a precursor ratio of (boron-containing gas mixture / ((boron-containing gas mixture)+hydrocarbon-containing gas mixture)) of about 0.38 to about 0.85; generating a radio frequency (RF) plasma in the processing region to deposit a boron-carbon film on the substrate, the boron-carbon film having about 55 atomic percent to about 95 atomic percent boron; A non-transitory computer readable medium comprising program instructions for causing a computer to perform the method of claim 1.

13. 13. The non-transitory computer readable medium of claim 12, wherein the hydrocarbon-containing gas mixture comprises an alkane.

14. The boron-containing gas mixture is preferably hydrogen gas (H ２ Approximately 9 weight percent (wt%) of diborane (B ２ H ６ 13. The non-transitory computer readable medium of claim 12, comprising:

15. 13. The non-transitory computer readable medium of claim 12, wherein a ratio of the hydrocarbon-containing gas mixture to the boron-containing gas mixture is in a range from about 0.7:1 to about 0.12:1.

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