Electrical circuit with diagnostic functions for asics and method for diagnosing asics

Abstract

To provide a method for operating an electrical circuit with diagnostic functions for use in an encoder.SOLUTION: Parameter measuring devices 28, 38, and 48 are configured to detect a plurality of functional parameters of electronic circuits 24, 34, and 44 of subordinate ASICs 25, 35, and 45, and transmit the functional parameters via a data communication path 50 to a diagnostic device 16, and the diagnostic device 16 is configured to verify the functional performance of the electronic circuits 24, 34, and 44 of the respective subordinate ASICs 25, 35, and 45 by evaluating the functional parameters.SELECTED DRAWING: Figure 1

Description

[Technical field]

[0001] The invention relates to an electric circuit with diagnostic functions for an ASIC as claimed in claim 1 and to a method for diagnosing an ASIC as claimed in claim 8. Furthermore, the invention relates to an encoder as claimed in claim 15. [Background technology]

[0002] With the increasing digitalization of automation technology, as required by Industry 4.0, the measuring instruments of automation technology, such as rotary and linear encoders, are also becoming more complex. In order to minimize the space required for the resulting large electronic circuits, there is a tendency to integrate the functions of the electronic circuits in application specific integrated circuits (ASICs). Accordingly, DE 10 2008 051 083 A1 discloses a gear-type multi-turn rotary encoder with one single-turn stage with a single-turn scanning device for measuring the angular position of the shaft and multiple multi-turn stages, each with a multi-turn scanning device for detecting the number of rotations transmitted from the shaft. Both the single-turn scanning device and each multi-turn scanning device may include an ASIC.

[0003] Furthermore, Industry 4.0 requires the ability to autonomously check the functional performance of measuring equipment. For this purpose, ASICs are often equipped with a self-diagnosis function. The self-diagnosis function is based on measuring the functional parameters of the integrated electronic circuit and evaluating the results of the measurement. The results of the evaluation are then output from each individual ASIC of the circuit to a central part, and the overall functional performance of the circuit is then checked. However, to realize the self-diagnosis function of the ASIC, more circuit costs are required, which further increases the complexity of this component. [Prior art documents] [Patent documents]

[0004] [Patent Document 1] DE 102008051083 A1 Summary of the Invention [Problem to be solved by the invention]

[0005] SUMMARY OF THE PRESENT EMBODIMENT It is an object of the present invention to provide an improved electrical circuit for verifying the functional performance of a circuit having multiple ASICs. [Means for solving the problem]

[0006] This problem is solved by an electric circuit with diagnostic functions, in particular for use in an encoder, according to claim 1.

[0007] The electric circuit includes a higher-level ASIC having at least one electronic circuit for performing a predetermined function, and at least one lower-level ASIC having an electronic circuit for performing a predetermined function, where the at least one lower-level ASIC includes a parameter measuring device, and the higher-level ASIC includes a diagnostic device, where the parameter measuring device and the diagnostic device are connected to each other via a data communication path, where the parameter measuring device is configured to detect a plurality of functional parameters of the electronic circuit of the lower-level ASIC and transmit them to the diagnostic device via the data communication path, and where the diagnostic device is configured to verify the functional performance of the electronic circuit of each lower-level ASIC by evaluating the functional parameters.

[0008] It is a further object of the present invention to provide an improved method for verifying the functional performance of a circuit having multiple ASICs.

[0009] This problem is solved by a method for operating an electric circuit with diagnostic functions, in particular for use in an encoder, according to claim 8.

[0010] The electrical circuit according to the method includes a higher-level ASIC having at least one electronic circuit for performing a predetermined function and at least one lower-level ASIC having an electronic circuit for performing a predetermined function, where the at least one lower-level ASIC includes a parameter measuring device and the higher-level ASIC includes a diagnostic device, the parameter measuring device and the diagnostic device being connected to each other via a data communication path. According to the proposed method, a number of functional parameters of the electronic circuit of the lower-level ASIC are detected by the parameter measuring device and transmitted to the diagnostic device via the data communication path, and the functional performance of the electronic circuit of each lower-level ASIC is confirmed by the diagnostic device by evaluating the functional parameters.

[0011] It is another object of the present invention to provide an encoder having improved electronic circuitry for verifying functional performance.

[0012] This problem is solved by an encoder according to claim 15.

[0013] Further advantages of the invention are set out in the claims dependent on independent claims 1 and 8 and in the description of embodiments below. [Brief description of the drawings]

[0014] [Figure 1] 1 shows a first embodiment of an electrical circuit of the present invention connected to a multi-turn rotary encoder. [Diagram 2] 1 is a flow chart of a method of the present invention. [Diagram 3] FIG. 1 is a block diagram of a parameter measuring device according to the present invention. [Figure 4] FIG. 2 is a block diagram of the diagnostic device of the present invention. [Diagram 5] 2 shows a second embodiment of an electrical circuit of the present invention connected to a multi-turn rotary encoder. [Figure 6]13 shows a third embodiment of an electrical circuit of the present invention connecting to a single-turn rotary encoder having an additional sensor. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0015] In the following description of the preferred embodiments, the reference numerals of the components whose functions have already been described on the basis of the figures remain the same. Each dashed line denotes a variation of an embodiment referred to in the description.

[0016] 1 shows a first embodiment of an electric circuit according to the invention connected to a multi-turn rotary encoder, which essentially comprises a single-turn measuring device for measuring position values ​​indicative of the angular position of a shaft W and a multi-turn measuring device for counting the revolutions transmitted from the shaft W.

[0017] The single-turn measuring device consists of a single-turn code disk 10, the center point M of which is fixedly connected to the shaft to be measured and which supports a ring-shaped code track 11 arranged concentrically with respect to said center point M. Furthermore, a single-turn position sensor 12 is provided for reading the code track 11 and determining an absolute position value corresponding to the angular position of the single-turn code disk 10. If an optical scanning principle is used for the position detection, the code track 11 consists, for example, of a line pattern consisting of a number of areas with different optical properties, for example translucency / non-translucency or reflective / non-reflective. Light from a light source is emitted in the direction of the code track 11, is modulated by the code track 11 and finally falls on a photodetector which is advantageously arranged in the single-turn position sensor 12. Here, for reasons of clarity, the light source is not shown. The code track 11 can be coded in an absolute and / or incremental manner and can consist of a number of memory section tracks arranged side by side, if necessary.

[0018] Alternatively, instead of the optical scanning principle, an inductive, magnetic or capacitive scanning principle may be used.

[0019] To measure rotational data suitable for determining the number of rotations transmitted from a shaft W, a multi-turn measuring device is used. In the illustrated example, this multi-turn measuring device comprises three multi-turn stages. Each of these multi-turn stages comprises a multi-turn code disk 20, 30, 40 with a respective code element 21, 31, 41 and a position sensor 22, 32, 42 for measuring the angular position of the code element 21, 31, 41. These multi-turn code disks 20, 30, 40 are driven by the shaft W to be measured via a three-stage reduction gear 23, 33, 43. In this case, during the rotation of the shaft W, the first multi-turn code disk 20 driven by the first gear stage 23 has the highest number of rotations and the third multi-turn code disk 40 driven by the third, i.e. last, gear stage 43 has the lowest number of rotations. The reduction ratio of the gear stages 23, 33, 43 is, for example, 16:1. That is, for every 16 revolutions of the input shaft, the output shaft rotates once.

[0020] To realize the multi-turn stages, a magnetic scanning principle is often used. In this case, the code elements 21, 31, 41 are fixedly connected to the multi-turn code disks 20, 30, 40 and consist of disk-shaped permanent magnets with one dipole each, i.e. a north and south magnetic pole. The scanning of the dipoles to detect the angular positions of the code elements 21, 31, 41 is carried out by magnet sensors (e.g. Hall sensors, MR sensors, ...) arranged in the respective multi-turn position sensors 22, 32, 42. The resolution of the multi-turn position sensors 22, 32, 42 is 8 bits, i.e. one revolution of the multi-turn code disks 20, 30, 40 is resolved by 256 absolute position values ​​and provided as a number of data words. The number of revolutions transmitted from the shaft W can then be detected by combining these data words.

[0021] Alternatively, instead of the magnetic scanning principle, an inductive, optical or capacitive scanning principle may be used.

[0022] The summation of the position values ​​of the single-turn measuring device and the data words of the multi-turn stages into one total position value which includes the angular position of the shaft W and the number of revolutions transmitted from the shaft W is carried out in the single-turn position sensor 12.

[0023] Additionally, the single-turn position sensor 12 is configured to communicate with the following electronics 80 via the external data communication path 52. Such communication may include, for example, outputting a total position value to the following electronics 80.

[0024] An important component of the single-turn position sensor 12 is an application specific integrated circuit (ASIC). An electronic circuit 14 of one of the important functional blocks of the single-turn position sensor 12 is integrated in the ASIC. In this respect, the photodetector, the evaluation electronics, the output interface, the internal interface and the combination device are exemplified. The electronic circuit 14 is used to perform the predetermined functions of the ASIC. Within the scope of this embodiment, this ASIC is called the higher-level ASIC 15.

[0025] In this embodiment, the default functionality of the upper ASIC 15 is, for example: - Absolute position detection, - Detecting the total position value, and Communication with subsequent electronic devices 80 It is.

[0026] Each multi-turn position sensor 22, 32, 42 also mainly consists of an application specific integrated circuit (ASIC). An electronic circuit 24, 32, 44 of one of the important functional blocks of each multi-turn position sensor 22, 32, 42 is integrated in the ASIC. In this example, the electronic circuit may be the magnet sensor, the evaluation electronics and the output interface. This electronic circuit 24, 34, 44 is used to perform the predefined function of the ASIC. Within the scope of this embodiment, this ASIC is referred to as a subordinate ASIC 25, 35, 45.

[0027] In this embodiment, the default function of the subordinate ASICs 25 , 35 , 45 is the detection of data words indicative of the absolute angular position of the respective multi-turn code discs 20 , 30 , 40 .

[0028] The upper ASIC 15 is connected to the lower ASICs 25, 35, 45 for said communication via at least one data channel 50. Any interface connection allowing bidirectional communication of digital data can be used as the data channel 50. Both point-to-point and bus interfaces are suitable. Serial or parallel data communication can be used. In a preferred embodiment, the data channel 50 is constituted by a bidirectional serial interface, in particular an I2C interface.

[0029] In accordance with the present invention, the upper ASIC 15 includes a diagnostic unit 16 and each of the lower ASICs 25, 35, 45 includes a parameter measuring unit 28, 38, 48. The diagnostic unit 16 is arranged to communicate with the parameter measuring units 28, 38, 48 via a data communication path 50.

[0030] Preferably, communication between the electronic circuit 14 of the upper ASIC 15 and the electronic circuits 24, 34, 44 of the lower ASICs 25, 35, 45 is also performed via a data communication path 50. As a result, only one interface connection needs to be provided for all communication between the upper ASIC 15 and the lower ASICs 25, 35, 45.

[0031] Each parameter measuring device 28, 38, 48 is configured to detect, in particular by measurement, a number of functional parameters Fn1, Fn2, Fn3 of the respective subordinate ASIC 25, 35, 45. In this case, the functional parameters are parameters that allow to deduce whether the functioning of the electronic circuit 24, 34, 44 of the subordinate ASIC 25, 35, 45 is correct or not, for example voltage values ​​for predetermined measuring points of the electronic circuit 24, 34, 44 of the subordinate ASIC 25, 35, 45, The power consumption of a part of the electronic circuit 24, 34, 44 of the subordinate ASIC 25, 35, 45 and / or the total power consumption of said circuit, Resistance value, -Digital signal characteristics such as edge interval, frequency, duty cycle, jitter, etc. The processing time of a part of the electronic circuit 24, 34, 44 of the lower ASIC 25, 35, 45.

[0032] For said detection of the functional parameters Fn1, Fn2, Fn3, the parameter measuring device 28, 38, 48 comprises suitable measuring units, for example A / D converters, timers (in particular counters), comparators. Furthermore, the parameter measuring device 28, 38, 48 may comprise signal generating units, for example current and / or voltage sources, clock generators, D / A converters. Furthermore, the parameter measuring device 28, 38, 48 may comprise switching means for connecting the measuring units and / or signal generating units to the nodes of the electronic circuit 24, 34, 44 of the subordinate ASIC 25, 35, 45. The measurement units, the signal generating units and the switching means may be assigned only to the parameter measuring devices 28, 38, 48, or at least some of the measurement units, the signal generating units and the switching means may be assigned to the parameter measuring devices 28, 38, 48 only for the purpose of performing the self-diagnosis function, and other measurement units, the signal generating units and the switching means may be used to perform the predetermined functions of the lower ASICs 25, 35, 45. The other measurement units, the signal generating units and the switching means are part of the electronic circuits 24, 34, 44.

[0033] Preferably, said detection of the functional parameters Fn1, Fn2, Fn3 is started after receipt of a self-diagnosis start command ST arriving at the subordinate ASIC 25, 35, 45 via the data communication path 50.

[0034] The detected functional parameters Fn1, Fn2, Fn3 can be transmitted to the ASIC 15 via the data communication path 50. Preferably, the transmission is not performed immediately after the reception, but a memory section is provided in the parameter measuring device 28, 38, 48, in which the functional parameters Fn1, Fn2, Fn3 can be stored. In this case, the transmission is performed as a result of the reception of a data request command RD1, RD2, RD3 transmitted from the higher-level ASIC 15 to the respective lower-level ASIC 25, 35, 45 via the data communication path.

[0035] The time point at which the detected functional parameters Fn1, Fn2, Fn3 are transmitted in each subordinate ASIC 25, 35, 45 can be set in the simplest case by waiting for a predefined period. Alternatively, special instructions can be provided, by which the superior ASIC 15 can request from the subordinate ASIC 25, 35, 45 the status of the detection of the functional parameters Fn1, Fn2, Fn3 via the data communication path 50 ("polling"). Alternatively, it can be proposed that the subordinate ASIC 25, 35, 45 telegraphs that it can transmit the functional parameters Fn1, Fn2, Fn3 by transmitting a completion message via the data communication path 50.

[0036] In the higher-level ASIC 15, the functional parameters Fn1, Fn2, Fn3 can be transmitted to a diagnostic device 16, which is suitably configured to evaluate the functional performance of each lower-level ASIC 25, 35, 45 by evaluating these functional parameters Fn1, Fn2, Fn3. The evaluation may include checking whether the individual and / or interdependent functional parameters are within preset limits. If each lower-level ASIC 25, 35, 45 is evaluated as usable, it is transferred to a normal mode, and if it is evaluated as unusable, it is transferred to an abnormal mode.

[0037] In a known manner, the higher-level ASIC 15 may likewise comprise a parameter measuring device 18, which is used to detect internal functional parameters of the higher-level ASIC 15, which are evaluated in a diagnostic device, as well as the functional parameters Fn1, Fn2, Fn3 of the lower-level ASICs 25, 35, 45. In this case, the higher-level ASIC 15 has a self-diagnostic function. This diagnostic device may also be a diagnostic device in which the functional parameters Fn1, Fn2, Fn3 of the lower-level ASICs 25, 35, 45 are also evaluated. However, for this purpose the higher-level ASIC 15 may comprise an additional diagnostic device.

[0038] The evaluation results of the function parameters Fn1, Fn2, Fn3 of the subordinate ASICs 25, 35, 45 and possibly of the superior ASIC 15 are stored as status information STAT, which can be output via the external data communication path 52 to subsequent electronics 80, by means of which the functional performance of the multi-turn rotary encoder can be displayed.

[0039] The subsequent electronics 80 is an external, independent device that is arranged spatially separated from the multi-turn rotary encoder of this embodiment. For example, it is a numerical control for a machine tool or another control device of the automation technology. The subsequent electronics 80 is not part of the present invention.

[0040] 2 is a flow chart of the method of the present invention. The method can be executed at any time during the operation of the multi-turn rotary encoder. To ensure the operation status, the execution is preferably executed immediately after the start of the device. Optionally, an initialization of the ASICs 15, 25, 35, 45 is performed before the start of the method.

[0041] In step S100, the upper ASIC 15 transmits a self-diagnosis start command ST to at least one of the lower ASICs 25, 35, 45. Depending on the diagnostic plan, i.e. when one of the lower ASICs 25, 35, 45 must be checked in particular, it may be beneficial to transmit the self-diagnosis start command ST only to this one ASIC. However, preferably, the self-diagnosis start command ST is transmitted to all the lower ASICs 25, 35, 45 configured according to the invention, so that the operational status of all the lower ASICs 25, 35, 45 can be checked approximately simultaneously.

[0042] In step S110, the lower ASIC 25, 35, 45 that has received the self-diagnosis start command ST detects a number of function parameters Fn1, Fn2, Fn3 required to check the operating status. The upper ASIC 15 waits until the detection of the function parameters Fn1, Fn2, Fn3 is completed. As described above, this can be done by waiting a predetermined period of time, by inquiring about the status of the detection of the function parameters Fn1, Fn2, Fn3, or by waiting for the arrival of a completion message from the lower ASIC 25, 35, 45.

[0043] In step S120, the function parameters Fn1, Fn2, Fn3 are transmitted to the higher-level ASIC 15, in particular the diagnostic device 16, via the data communication path 50. The transmission may be initiated by transmitting a data request command RD1, RD2, RD3 to the respective lower-level ASIC 25, 35, 45.

[0044] In step S130, an evaluation of the function parameters Fn1, Fn2, Fn3 and the functional performance of the respective subordinate ASICs 25, 35, 45 is performed by the diagnostic device 16. The evaluation results are stored as status information STAT.

[0045] In step S140, it is determined based on the status information STAT whether a transition to the normal mode (S150A) or to the abnormal mode (S150B) can be made.

[0046] Fig. 3 is a block diagram of a parameter measurement device according to the present invention. Fig. 3 will be described based on the parameter measurement device 28 of Fig. 1. However, preferably, the parameter measurement devices 28, 38, 48 are identically constructed.

[0047] The parameter measurement device 28 includes a sequence control unit 280, a measurement unit 281, a memory unit 282, and an interface unit 283. Furthermore, the parameter measurement device 28 includes at least one signal generation unit 284.

[0048] The sequence control unit 280 controls the sequence of the self-diagnosis function. The sequence control unit 280 is preferably configured as a digital state machine. The sequence control unit 280 controls the measurement unit 281, the signal generation unit 284 and, in some cases, the memory unit 282 in response to instructions provided to the sequence control unit 280 from the upper ASIC 15 via the signal communication path 50 and the interface unit 283. Furthermore, the sequence control unit 280 is suitably configured to telegraph the completion of the self-diagnosis function or the provision of the function parameter Fn1 to the upper ASIC 15 via the interface unit 283 and the data communication path 50.

[0049] The measurement unit 281 is used to measure the functional parameter Fn1. To this end, the measurement unit 281 is connected to at least one measurement point MPx of the electronic circuit 24 of the subordinate ASIC 25. The measurement unit 281 may include an A / D converter, a time meter, or a comparator to perform the measurement. Furthermore, the measurement unit 281 may include a switch to connect multiple measurement points MPx to a device that performs the measurement for each period of the measurement.

[0050] The function parameter Fn 1 measured by the measurement unit 281 can be stored in the memory unit 283 , and can be transmitted from the interface unit 283 to the upper ASIC 15 via the data communication path 50 .

[0051] The signal generating unit 284 is suitably configured to generate and supply at least one electrical signal to at least one supply point EPx of the electronic circuit 24 of the subordinate ASIC 25. The signal generating unit 284 may be a device for generating a signal, such as a voltage source, a D / A converter, and a clock generator. Examples for the electrical signal are an AC voltage with any signal waveform, such as a constant voltage and / or a constant current, a sinusoidal voltage, a rectangular voltage, etc. A switch may be provided in the signal generating unit 284 to connect each of the multiple supply points EPx to a device for generating a signal to be supplied in the signal generating unit 284 for each period of measurement of the functional parameter Fn1.

[0052] The communication unit 283 is used for communication between the parameter measurement device 28 and the upper ASIC 15 via the data communication path 50. The communication is performed bidirectionally so that commands and / or data from the upper ASIC 15 can be received and data, in particular the function parameter Fn1, can be transmitted to the upper ASIC 15.

[0053] It is particularly advantageous if communication is also performed between the electronic circuit 24 of the lower ASIC 25 and the electronic circuit 14 of the upper ASIC 15 via an interface 283, as indicated by the dashed line. Thus, only one interface connection between the lower ASIC 25 and the upper ASIC 15 is necessary for the execution of the self-diagnosis and the normal operation of these ASICs.

[0054] 4 is a block diagram of the diagnostic device 16 of the present invention. The diagnostic device 16 includes a diagnostic control unit 160, an interface unit 162, and a device interface 163. The diagnostic device 16 may further include a memory unit 161.

[0055] The diagnostic control unit 160 controls the sequence of the self-diagnosis function. For this purpose, the diagnostic control unit 160 starts detection of the functional parameters Fn1, Fn2, Fn3 in the parameter measuring devices 28, 38, 48 of the subordinate ASICs 25, 35, 45 by transmitting a self-diagnosis start command ST, and starts transmission of the functional parameters Fn1, Fn2, Fn3 by transmitting a data request command RD1, RD2, RD3. The transmission of the command and data is executed via the interface unit 162, the data communication path 50, and the interface unit 283 of the self-diagnosis device 28, 38, 48 to be addressed, respectively.

[0056] The diagnostic control unit 160 is suitably configured to check whether the function parameters Fn1, Fn2, Fn3 arriving from the subordinate ASICs 25, 35, 45 comply with limit values, to evaluate the functional performance of the subordinate ASICs 25, 35, 45 and to decide whether to switch to a normal mode or to an abnormal mode. The limit values ​​may include upper and / or lower limit values ​​of the individual function parameters, but also dependencies between two or more function parameters, for example the ratio of the input signal to the output signal of an amplifier or the dependency of the instantaneous values ​​of signals that are phase shifted from one another, in particular the dependency of sinusoidal sensor signals that are phase shifted from one another by 90°, which are frequently found in position measurement technology.

[0057] The result of this check can be stored as status information STAT and can be output to the subsequent electronics 80 via the device interface 163 and the external data communication path 52. It is particularly advantageous if communication is also performed between the electronic circuit 14 of the upper ASIC 15 and the electronic circuit 24, 34, 44 of the respective lower ASIC 25, 35, 45 via the interface part 162, as indicated by the dashed line and described above on the basis of the interface part 283 of the lower ASIC 25.

[0058] It is also particularly advantageous if the device interface 163 is suitably configured to perform not only diagnostic device 16 communication but also communication between the electronic circuit 14 of the higher-level ASIC 15 and the subsequent electronic device 80 .

[0059] The memory unit 161 may be used to store the functional parameters Fn1, Fn2, Fn3 before these are evaluated by the diagnostic control unit 160. Furthermore, it may be proposed that the functional parameters Fn1, Fn2, Fn3 can be transmitted from the memory unit 161 to the subsequent electronic device 80 so that further analysis of the abnormal condition is possible in the subsequent electronic device 80.

[0060] In another preferred configuration, it can be proposed that limit values ​​and possibly further rules for evaluating the function parameters Fn1, Fn2, Fn3 in the diagnostic control unit 160 can be stored in the memory unit 161. Furthermore, if the memory unit 161 is configured to be writeable, the diagnostic device 16 can be adapted to different subordinate ASICs and a self-diagnosis can be performed.

[0061] As another preferred feature, it may be proposed that the memory portion 282 of the underlying ASIC is writable and / or erasable by the diagnostic device 16 via the data communication path 50. Thus, it is possible to check the functionality of the memory portion 282.

[0062] 5 shows a second embodiment of an electrical circuit according to the invention connected to a multi-turn rotary encoder, but unlike the first embodiment, the multi-turn measuring device of the multi-turn rotary encoder does not have a gear-type revolution counter, but an electronic revolution counter.

[0063] The single-turn measuring arrangement corresponds to the single-turn measuring arrangement according to Fig. 1. It is pointed out that in this case the electronic circuit 14 of the superordinate ASIC 15 may differ from the electronic circuit according to Fig. 1.

[0064] The multi-turn measuring device comprises a multi-turn code disk 200 with a code element 210 and a multi-turn position sensor 220 for measuring the number of rotations transmitted from the shaft W by measuring and evaluating the angular position of the code element 210 which is fixedly connected to the shaft W. The measurement principle is therefore the same as for the multi-turn stage of the multi-turn rotary encoder according to FIG. 1. The multi-turn position sensor 220 mainly consists of an ASIC 225 which performs the given functions and in particular incorporates an electronic circuit 224 used to detect the number of rotations transmitted from the shaft W (rotation data) and to transmit said number of rotations (rotation data) via the data communication path 50 to the ASIC single-turn position sensor 12. This ASIC is therefore the subordinate ASIC 225 of the invention.

[0065] To be able to measure the number of revolutions even in disconnected situations of the multi-turn rotary encoder, a battery may be integrated into the multi-turn position sensor 220, supplying power to at least a part of the electronic circuitry 224. Instead of using a battery, the multi-turn position sensor 220 may be constructed according to the principle of energy harvesting, for example using Wiegand wires.

[0066] In this case, the lower ASIC 225 comprises a parameter measuring device 228 suitably configured to detect a number of function parameters Fn4 and transmit them to the diagnostic device 16 in the higher ASIC 15 via the data communication path 50. To this end, the parameter measuring device 228 may be configured similarly to the parameter measuring device described with reference to FIG.

[0067] 6 shows a third embodiment of the electrical circuit of the invention in connection with a single-turn rotary encoder with an additional sensor. The additional sensor is then used if the measuring device, in addition to the main measuring task, in automation technology for example the measurement of the angular position and / or the number of rotations transmitted from the axis W or the measurement of the linear movement of a machine part, has to measure further additional parameters inside and / or outside the measuring device. Typical examples for such parameters are temperature, acceleration, vibration and air humidity.

[0068] The single-turn measuring arrangement corresponds to the single-turn measuring arrangement according to Fig. 1. It is noted that in this case the electronic circuit 14 of the superordinate ASIC 15 may differ from the electronic circuit according to Fig. 1, since this has a different predefined functionality.

[0069] For detecting measurements of at least one additional sensor, a sensor data recorder 320 is provided. At least one, and preferably several, additional sensors 330, 331, 332 are connectable to this sensor data recorder.

[0070] Likewise, the sensor data recorder 320 mainly consists of an ASIC 325 in which an electronic circuit 324 is integrated, which is used to carry out the predetermined functions of this ASIC, in particular to request and possibly process measurement data of the additional sensors 330, 331, 332 and to transmit said measurement data to the single-turn position sensor 12 via the data communication path 50.

[0071] In this case, the lower ASIC 325 also comprises a parameter measuring device 328 suitably configured to detect a number of function parameters Fn5 and transmit them to the diagnostic device 16 in the higher ASIC 15 via the data communication path 50. To this end, the parameter measuring device 328 may be configured similarly to the parameter measuring device 28 described with reference to FIG.

[0072] It is pointed out that the embodiment described on the basis of figures 1 and 5 can also be supplemented by a sensor data recorder 320. This means that the invention is also suitable for electrical circuits containing several different subordinate ASICs.

[0073] It would therefore be particularly advantageous if the upper ASIC 15, and in particular the electronic circuitry 14 of the upper ASIC 15, were configured so that it could be used in connection with various lower ASICs in multiple device variations, for example in the embodiments of Figures 1, 5 and 6, and in combination with these.

[0074] Naturally, the invention is not limited to the described embodiments but can be suitably modified by those skilled in the art within the scope of protection of the claims.

Claims

1. a high-level ASIC (15) having at least one electronic circuit (14) for carrying out a predetermined function; At least one subordinate ASIC (25, 35, 45, 225, 325) having electronic circuitry (24, 34, 44, 224, 324) for carrying out predetermined functions; An electric circuit with diagnostic capabilities, particularly for use with an encoder, comprising: the at least one lower ASIC (25, 35, 45, 225, 325) includes a parameter measuring device (28, 38, 48, 228, 328), the upper ASIC (15) includes a diagnostic device (16), the parameter measuring device (28, 38, 48, 228, 328) and the diagnostic device (16) are connected to each other via a data communication path (50); the parameter measuring device (28, 38, 48, 228, 328) is configured to detect a plurality of functional parameters (Fn1, Fn2, Fn3, Fn4, Fn5) of the electronic circuit (24, 34, 44, 224, 324) of the subordinate ASIC (25, 35, 45, 225, 325) and transmit them to the diagnostic device (16) via the data communication path (50); - the diagnostic device (16) is configured to verify the functional performance of the electronic circuits (24, 34, 44, 224, 324) of each of the subordinate ASICs (25, 35, 45, 225, 325) by evaluating the functional parameters (Fn1, Fn2, Fn3, Fn4, Fn5).

2. The electrical circuit according to claim 1, wherein the parameter measuring device (28, 38, 48, 228, 328) includes a sequence control unit (280) for controlling a sequence of a self-diagnosis function, a measurement unit (281) for detecting the functional parameters (Fn1, Fn2, Fn3, Fn4, Fn5) by measuring at least one measurement point (MPx) of the electronic circuit (24, 34, 44, 224, 324), and an interface unit (283) for communicating with a higher-level ASIC (15) via the data communication path (50).

3. 3. The electrical circuit according to claim 1, wherein the parameter measuring device (28, 38, 48, 228, 328) comprises a memory portion (282) in which the functional parameters (Fn1, Fn2, Fn3, Fn4, Fn5) can be stored.

4. 4. The electrical circuit of claim 3, wherein the memory portion (282) is writable and / or erasable by the diagnostic device (16).

5. The electrical circuit according to any one of claims 1 to 4, wherein the parameter measuring device (28, 38, 48, 228, 328) comprises at least one signal generating section (284) for generating at least one electrical signal and supplying said electrical signal to at least one supply point (EPx) of the electronic circuit (24, 34, 44, 224, 324).

6. The electric circuit according to any one of claims 1 to 5, wherein the diagnostic device (16) includes a diagnostic control unit (160) for controlling a sequence of a self-diagnosis function, an interface unit (162) for communicating with each of the parameter measuring devices (28, 38, 48, 228, 328) via the data communication path (50), and an equipment interface (163) for communicating with a subsequent electronic device (80) via an external data communication path (52).

7. The electric circuit according to any one of claims 1 to 6, wherein the diagnostic device (16) comprises a memory portion (161) in which the functional parameters (Fn1, Fn2, Fn3, Fn4, Fn5) and / or limit values ​​for evaluating the functional parameters (Fn1, Fn2, Fn3, Fn4, Fn5) and / or further rules for evaluating the functional parameters (Fn1, Fn2, Fn3, Fn4, Fn5) can be stored.

8. a high-level ASIC (15) having at least one electronic circuit (14) for carrying out a predetermined function; At least one subordinate ASIC (25, 35, 45, 225, 325) having electronic circuitry (24, 34, 44, 224, 324) for carrying out predetermined functions; 1. A method for operating an electrical circuit with diagnostic capabilities, particularly for use with an encoder, comprising: the at least one lower ASIC (25, 35, 45, 225, 325) includes a parameter measuring device (28, 38, 48, 228, 328), the upper ASIC (15) includes a diagnostic device (16), the parameter measuring device (28, 38, 48, 228, 328) and the diagnostic device (16) are connected to each other via a data communication path (50); a plurality of functional parameters (Fn1, Fn2, Fn3, Fn4, Fn5) of the electronic circuit (24, 34, 44, 224, 324) of the subordinate ASIC (25, 35, 45, 225, 325) being detected by the parameter measuring device (28, 38, 48, 228, 328) and transmitted to the diagnostic device (16) via the data communication path (50); The method, wherein the functional performance of the electronic circuits (24, 34, 44, 224, 324) of each of the subordinate ASICs (25, 35, 45, 225, 325) is verified by the diagnostic device (16) by evaluating the functional parameters (Fn1, Fn2, Fn3, Fn4, Fn5).

9. The parameter measurement device (28, 38, 48, 228, 328) includes a sequence control unit (280), a measurement unit (281), and an interface unit (283), The sequence of the self-diagnosis function is controlled by the sequence control unit (280), the functional parameters (Fn1, Fn2, Fn3, Fn4, Fn5) are detected at at least one measurement point (MPx) of the electronic circuit (24, 34, 44, 224, 324) by measurement of the measurement unit (281); and The method according to claim 8, wherein the data is transmitted to the higher-level ASIC (15) via the interface section (283) and the data communication path (50).

10. 10. The method according to claim 8 or 9, wherein the parameter measuring device (28, 38, 48, 228, 328) comprises a memory portion (282) in which the functional parameters (Fn1, Fn2, Fn3, Fn4, Fn5) are stored.

11. The method of claim 10, wherein the memory portion (282) is written and / or erased by the diagnostic device (16).

12. The method according to any one of claims 8 to 11, wherein the parameter measuring device (28, 38, 48, 228, 328) comprises at least one signal generating unit (284), and at least one electrical signal is generated from the signal generating unit (284) and supplied to at least one measuring point (MPx) of the electronic circuit (24, 34, 44, 224, 324).

13. The diagnostic device (16) includes a diagnostic control unit (160), an interface unit (162) and an equipment interface (163), The sequence of the self-diagnosis function is controlled by the diagnostic control unit (160); and transmitted to each of the parameter measuring devices (28, 38, 48, 228, 328) via the interface unit (162) and the data communication path (50); and The method according to any one of claims 8 to 12, wherein the method is transmitted to a subsequent electronic device (80) via an instrument interface (163) and an external data communication path (52).

14. The method according to any one of claims 8 to 13, wherein the diagnostic device (16) comprises a memory portion (161) in which the functional parameters (Fn1, Fn2, Fn3, Fn4, Fn5) and / or limit values ​​for evaluating the functional parameters (Fn1, Fn2, Fn3, Fn4, Fn5) and / or further rules for evaluating the functional parameters (Fn1, Fn2, Fn3, Fn4, Fn5) are stored.

15. An encoder comprising an electric circuit according to any one of claims 1 to 7.

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