Measuring device, measuring method, and measuring program

Abstract

To perform error correction in measurement on the basis of the actual measurement situation.SOLUTION: A measuring device 1 which measures an electrical characteristic value of a measurement object arranged in at least one measurement region, comprises: a storage unit 19 that stores, in association with measurement regions 101 to 110, deviation amounts between a reference value of an electrical characteristic of a reference measurement object 20S being a reference of the measurement object 20 and an electrical characteristic value of the reference measurement object 20S measured in the measurement regions 101 to 110; a measurement region information reception unit 181 that receives information specifying actual measurement regions 101 to 110 in measuring the electrical characteristic value of the measurement object 20; a deviation amount specifying unit 182 that specifies a deviation amount corresponding to the information specifying the measurement regions 101 to 110; a measurement unit 185 that measures the electrical characteristic value; and a correction unit 186 that corrects the electrical characteristic value according to the specified deviation amount.SELECTED DRAWING: Figure 1

Description

Technical Field

[0001] The present invention relates to a measuring device, a measuring method, and a measurement program.

Background Art

[0002] In a measuring device such as a battery tester that measures a value indicating an electrical characteristic (hereinafter referred to as "electrical characteristic value") such as the impedance of a device under test (DUT) such as a battery, when measuring the electrical characteristic value, due to the influence of other DUTs around the DUT or metal around the DUT, errors may occur in the measured electrical characteristic value due to the surrounding environment.

[0003] Prior to measurement, various corrections (adjustments) are performed, and one of them is zero adjustment correction (also called short correction) (see, for example, Patent Document 1).

Prior Art Documents

Patent Documents

[0004]

Patent Document 1

Summary of the Invention

Problems to be Solved by the Invention

[0005] However, zero adjustment correction is generally performed using an instrument for zero adjustment correction, such as what is generally called a zero adjustment board. Thus, in zero adjustment correction, the instrument used for error correction and the DUT are different objects, and since the shape and material of the metal part that affects the generation of eddy currents are different, the situation of the generation of eddy currents, which is a cause of measurement error, is different between the zero adjustment correction time and the measurement time of the DUT. That is, even if zero adjustment correction is performed to reduce errors caused by the surrounding environment in a resistance measuring device, it is hard to say that the error correction is being performed based on the actual measurement situation.

[0006] The present invention has been made in view of the above-described problems, and an object thereof is to provide a technique capable of correcting an error based on an actual measurement situation when measuring a value indicating an electrical characteristic.

Means for Solving the Problems

[0007] A measuring device according to a typical embodiment of the present invention is a measuring device that measures an electrical characteristic value of a measurement object disposed in at least one measurement area, and includes a reference value of an electrical characteristic of a reference measurement object that is a reference of the measurement object, and a deviation amount between the electrical characteristic value of the reference measurement object measured in the measurement area, a storage unit that stores the deviation amount in association with the measurement area, a measurement area information reception unit that receives information specifying the actual measurement area when measuring the electrical characteristic value of the measurement object, a deviation amount specifying unit that specifies the deviation amount corresponding to the information specifying the measurement area, a measurement unit that measures the electrical characteristic value, and a correction unit that corrects the electrical characteristic value according to the specified deviation amount.

Effects of the Invention

[0008] According to the measuring device of the present invention, it is possible to correct an error based on an actual measurement situation when measuring a value indicating an electrical characteristic.

Brief Description of the Drawings

[0009]

Figure 1

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Embodiments for Carrying Out the Invention

[0010] 1. Overview of the Embodiment First, an overview of typical embodiments of the invention disclosed in the present application will be described. In the following description, as an example, reference numerals in the drawings corresponding to the components of the invention are described with parentheses.

[0011] [1] A measuring device (1) for measuring the electrical characteristic values of a measurement object (20) arranged in at least one measurement area (101 to 110), comprising a storage unit (19) that stores, in association with the measurement area (101 to 110), the deviation amount between the reference value of the electrical characteristics of a reference measurement object (20S) that is the reference for the measurement object (20) and the electrical characteristic value of the reference measurement object (20S) measured in the measurement area (101 to 110); a measurement area information reception unit (181) that receives information specifying the actual measurement area (101 to 110) when measuring the electrical characteristic value of the measurement object (20); a deviation amount specifying unit (182) that specifies the deviation amount corresponding to the information specifying the measurement area; a measurement unit (185) that measures the electrical characteristic value; and a correction unit (186) that corrects the electrical characteristic value according to the specified deviation amount.

[0012] [2] The measuring device (1) according to [1], further comprising a deviation amount calculation unit (180) that calculates the deviation amount.

[0013] [3] The deviation amount calculation unit (180) according to [2] calculates, as the deviation amount, a value obtained by adding or subtracting the reference value from the electrical characteristic value of the reference measurement object (20S) measured in the measurement area (101 to 110).

[0014] [4] The deviation amount calculation unit (180) according to [2] calculates, as the deviation amount, the ratio between the electrical characteristic value of the reference measurement object (20S) measured in the measurement area (101 to 110) and the reference value.

[0015] [5] The measuring device (1) according to any one of [1] to [4], further comprising an output unit (183) that outputs either the electrical characteristic value measured by the measurement unit (185) or the corrected electrical characteristic value corrected by the correction unit (186).

[0016] [6] The reference measurement object (20S) according to any one of [1] to [5] is an object having characteristics equivalent to those of the measurement object (20).

[0017] [7] The reference measurement object (20S) and the measurement object (20) are the measurement device (1) according to any one of [1] to [6], which is a battery.

[0018] [8] A measurement method for measuring the electrical characteristic value of a measurement object arranged in at least one measurement area, the method comprising: receiving information specifying an actual measurement area (101 to 110) when measuring the electrical characteristic value of the measurement object (20); specifying a deviation amount corresponding to the measurement area (101 to 110) from a storage unit (19) in which the deviation amount between the reference value of the electrical characteristic of the reference measurement object (20S) which is the reference of the measurement object (20) and the electrical characteristic value of the reference measurement object (20S) in the measurement area (101 to 110) is stored in association with the measurement area (101 to 110); measuring the electrical characteristic value; and correcting the electrical characteristic value according to the specified deviation amount.

[0019] [9] A measurement method according to [8], the method comprising: storing a reference value in the storage unit (19); and storing, in the storage unit (19) in association with the measurement area (101 to 110), the electrical characteristic value of the reference measurement object (20S) in the measurement area (101 to 110).

[0020]

[10] A measurement program for causing a computer (18) to execute a process of measuring the electrical characteristic value of a measurement object (20) arranged in at least one measurement area (101 to 110), the program causing the computer (18) to execute: receiving an actual measurement area (101 to 110) when measuring the electrical characteristic value of the measurement object (20); specifying the deviation amount corresponding to the measurement area (101 to 110) from a storage unit (19) in which the deviation amount between the reference value of the electrical characteristic of the reference measurement object (20S) which is the reference of the measurement object (20) and the electrical characteristic value of the reference measurement object (20S) in the measurement area (101 to 110) is stored in association with the measurement area (101 to 110); measuring the electrical characteristic value; and correcting the electrical characteristic value according to the specified deviation amount.

[0021]

[11] A step of storing a reference value in the storage unit (19), and a step of storing in the storage unit (19) the electrical characteristic value of the reference measurement object (20S) in the measurement regions (101 to 110) in association with the measurement regions (101 to 110), which are executed by the computer (18). The measurement program according to

[10] .

[0022] 2. Specific Examples of Embodiments Hereinafter, specific examples of embodiments of the present invention will be described with reference to the drawings. In the following description, the same reference numerals are given to the constituent elements common to each embodiment, and repeated descriptions are omitted.

[0023] FIG. 1 is a functional block diagram showing the configuration of a measurement device 1 according to an embodiment. The measurement device 1 shown in FIG. 1 is a device that measures the electrical characteristics of a device under test (DUT) 20. Examples of the measurement device 1 include an LCR meter, a capacitance meter, and a battery tester that can measure impedance, which is an example of electrical characteristics by the four-terminal method. In the embodiment, a case where the measurement device 1 is a battery tester that measures an impedance value as an electrical characteristic value will be taken as an example for description.

[0024] FIG. 2 is a diagram showing an example of an inspection process for measuring the impedance value of a measurement object 20 in the measurement method according to the embodiment. As shown in FIG. 2, in the embodiment, the measurement device 1 is used, for example, in an internal resistance inspection process in a production line of a cylindrical battery cell. In the embodiment, the mounting position of each battery cell on the tray 100 used in the production line is taken as an example of the measurement region of the impedance value. One or more, that is, N (N is a natural number of 1 or more) battery cells can be arranged on this tray 100. In the embodiment, one of the one or more battery cells on the tray 100 is used as the measurement object 20, and the measurement method by the measurement device 1 is executed in order to reduce errors caused by influences such as eddy currents generated from other battery cells when performing the internal resistance inspection. Note that in the embodiment, as shown in FIG. 5 and the like, an example in which the number of measurement regions is 10 measurement regions 101 to 110 which are natural numbers of 1 or more will be described.

[0025] As shown in FIG. 1, the measurement device 1 includes a high-side sense terminal 111, a high-side source terminal 112, a low-side sense terminal 121, a low-side source terminal 122, a signal generation circuit 13, a voltage detection circuit 14, a current detection circuit 15, an A / D conversion circuit 16, an A / D conversion circuit 17, a data processing control unit 18, a storage unit 19, an operation unit 21, and a display unit 22.

[0026] The high-side sense terminal 111, the high-side source terminal 112, the low-side sense terminal 121, and the low-side source terminal 122 are external terminals for connecting the measurement object 20. For example, one terminal of the measurement object 20 is connected to the high-side sense terminal 111 and the high-side source terminal 112, and the other terminal of the measurement object 20 is connected to the low-side sense terminal 121 and the low-side source terminal 122.

[0027] The measurement device 1 applies, for example, an AC signal or the like from the high-side source terminal 112 to the object under measurement 20 connected between the high-side sense terminal 111 and the high-side source terminal 112 and the low-side sense terminal 121 and the low-side source terminal 122, and measures the voltage generated between the high-side sense terminal 111 and the low-side sense terminal 121 via the object under measurement 20 at that time, and the current flowing from the high-side source terminal 112 to the low-side source terminal 122 via the object under measurement 20, and measures the electrical characteristics (impedance) of the object under measurement 20 based on the measured voltage and current. When the signal generation circuit 13 is a constant current circuit, the current value generated by the signal generation circuit 13 is known. In this case, the measurement device 1 may measure the impedance of the object under measurement 20 based on the measured voltage and the known current.

[0028] The signal generation circuit 13 is a circuit that generates an AC signal (for example, a sine wave AC signal) to be applied to the object under measurement 20 in order to measure the impedance of the object under measurement 20. The output terminal for outputting the AC signal of the signal generation circuit 13 is connected to the high-side source terminal 112.

[0029] The voltage detection circuit 14 is a circuit that is connected to the high-side sense terminal 111 and the low-side sense terminal 121 respectively, and detects the voltage between the high-side sense terminal 111 and the low-side sense terminal 121. The voltage detection circuit 14 has, for example, an operational amplifier, amplifies the detected voltage between the high-side sense terminal 111 and the low-side sense terminal 121 by the operational amplifier, and outputs it as a voltage signal.

[0030] The A / D conversion circuit 16 samples the voltage signal output from the voltage detection circuit 14 at a predetermined sampling period (for example, a period sufficiently shorter than the period of the AC signal output from the signal generation circuit 13), thereby converting the voltage signal into a digital signal and outputting it as voltage data.

[0031] The current detection circuit 15 is a circuit that is connected to the low-side source terminal 122 and detects the current flowing through the object to be measured 20. For example, when an AC signal is applied from the signal generation circuit 13 to the object to be measured 20, the current detection circuit 15 inputs the current flowing through the object to be measured 20 via the low-side source terminal 122, converts the input current into a voltage, and outputs it as a current signal.

[0032] Similar to the A / D conversion circuit 16, the A / D conversion circuit 17 samples the current signal output from the current detection circuit 15 at a predetermined sampling period, converts the current signal into a digital signal, and outputs it as current data.

[0033] The storage unit 19 is a functional unit for storing various programs for realizing the functions of the measuring device 1, various parameters used for calculations for measuring impedance, and data such as measurement results. The storage unit 19 is realized by a known storage device (storage medium) such as a ROM, a RAM, or a flash memory, for example. The various programs stored in the storage unit 19 include the measurement program according to the present invention.

[0034] The storage unit 19 is provided with a storage area for storing the reference impedance value of the reference object to be measured 20S of the object to be measured 20. The storage unit 19 is also provided with a storage area for storing the impedance values of the reference object to be measured 20S in the measurement areas 101 to 110 (hereinafter referred to as "impedance values for each measurement area"). The storage unit 19 is also provided with a storage area for storing the deviation amount between the reference impedance value of the reference object to be measured 20S and the impedance values for each measurement area. The storage unit 19 is also provided with a storage area for storing the impedance value measured by the measurement unit 185. Further, the storage unit 19 is provided with a storage area for storing the corrected impedance value corrected by the correction unit 186. Details of the reference impedance value of the reference object to be measured 20S, the impedance values for each measurement area, and the deviation amount will be described later.

[0035] The operation unit 21 is an input interface for the user to operate the measuring device 1. Examples of the operation unit 21 include various buttons and touch panels. For example, by the user operating the operation unit 21, various measurement conditions and the like for measuring the measurement object 20 can be set in the measuring device 1, and the execution and stop of the measurement can be instructed to the measuring device 1. Note that the operation unit 21 is not limited to the above-described buttons and touch panels, and it only needs to have a function of receiving an input for the user to operate the measuring device 1. The operation unit 21 may, for example, receive an operation by a command of a communication interface (LAN, USB, RS-232C, etc.), or may receive an operation by voice command input.

[0036] The display unit 22 is a functional unit for outputting various information such as measurement conditions and measurement results in the measuring device 1. The display unit 22 is, for example, a display device equipped with an LCD (Liquid Crystal Display) or an organic EL. Note that the display unit 22 may be a display device equipped with a touch panel that realizes some functions as the operation unit 21. Further, the display unit 22 may include a communication circuit or the like that outputs data such as measurement results to the outside by wire or wirelessly.

[0037] The data processing control unit 18 is a functional unit that comprehensively controls each functional unit in the measuring device 1. The data processing control unit 18 is configured to include, for example, a processor such as a CPU.

[0038] The data processing control unit 18 controls each functional unit in the measuring device 1 by executing various operations according to a program stored in the storage unit 19, for example.

[0039] The data processing control unit 18 inputs the voltage data and current data output from the A / D conversion circuits 16 and 17, and measures the electrical characteristics (impedance) of the measurement object 20 by executing each data process based on the input voltage data and current data, and stores the measurement result in the storage unit 19.

[0040] Also, by executing the stored program, the data processing control unit 18 realizes, as functional units for realizing the measurement method, a deviation amount calculation unit 180, a measurement area information reception unit 181, a deviation amount identification unit 182, an output unit 183, a measurement unit 185, and a correction unit 186.

[0041] The deviation amount calculation unit 180 calculates, as the deviation amount, the amount of deviation between the reference impedance value of the reference measurement object 20S and the impedance value for each measurement area measured corresponding to the measurement areas 101 to 110. The calculation process of the deviation amount will be described later.

[0042] When measuring the actual impedance value in the state where the measurement object 20 is mounted on the measurement areas 101 to 110, the measurement area information reception unit 181 receives information specifying the positions of the measurement areas 101 to 110, that is, the measurement area information. Specifically, for example, the measurement area information reception unit 181 receives the input of the measurement area information on the tray 100 of the measurement object 20 from the operation unit 21, specifically, the information specifying the measurement areas 101, 102,..., 110. Note that the measurement area information received by the measurement area information reception unit 181 is not limited to the information input from the operation unit 21.

[0043] The deviation amount identification unit 182 reads out the deviation amounts D1 to D10 corresponding to the measurement areas 101 to 110 specified by the measurement area information reception unit 181 from the storage unit 19. For example, when the measurement area information received by the measurement area information reception unit 181 is the measurement area 105, the deviation amount identification unit 182 identifies and reads out the deviation amount D5 corresponding to the measurement area 105 from the deviation amounts D1 to D10 corresponding to the measurement areas 101 to 110 stored in the storage unit 19.

[0044] The measurement unit 185 acquires the voltage value detected by the voltage detection circuit 14. The measurement unit 185 acquires the current value detected by the current detection circuit 15 or a known current value. The measurement unit 185 calculates the impedance of the measurement object 20 based on the acquired voltage value and current value. For example, the measurement unit 185 calculates the impedance value of the measurement object 20 by dividing the acquired voltage value by the current value.

[0045] The correction unit 186 corrects the impedance value calculated by the measurement unit 185 based on the deviation amounts D1 to D10 specified by the deviation amount specifying unit 182.

[0046] The output unit 183 outputs (displays) the impedance value for each measurement region corrected by the correction unit 186 to the display unit 22 as the measurement result of the measurement object 20. Note that the output unit 183 may output the deviation amount to the display unit 22.

[0047] A method for obtaining the reference impedance value P1 of the reference measurement object 20S, the impedance values M1 to M10 for each measurement region of the reference measurement object 20S in the measurement regions 101 to 110, and the deviation amounts D1 to D10 will be described.

[0048] FIG. 3 is a diagram showing an example of the reference impedance value P1, the impedance values M1 to M10 for each measurement region, and the deviation amount D of the reference measurement object 20S in the measurement method according to the embodiment.

[0049] As shown in FIG. 3, in the measuring device 1 according to the embodiment, the deviation amount calculation unit 180 calculates the deviation amount D calculated based on the reference impedance value P1 measured in a state where there is no metal around the measurement object 20 (a state where there is no influence of induced voltage and eddy current) from the impedance values M1 to M10 for each measurement region measured corresponding to the measurement regions 101 to 110 on the tray 100 in accordance with the inspection process. The deviation amounts D1 to D10 are, for example, values obtained by adding and subtracting the impedance values M1 to M10 for each measurement region from the reference impedance value P1. The deviation amounts D1 to D10 are stored in the storage area.

[0050] FIG. 4 is a diagram schematically showing a reference measurement object 20S.

[0051] First, using the measuring device 1, the reference impedance value P1 of the reference measurement object 20S is measured.

[0052] In the embodiment, the reference measurement object 20S is an object whose impedance value is known when measuring the impedance value of the measurement object 20. The reference measurement object 20S has electrical characteristics equivalent to those of the measurement object 20. Specifically, for example, when the measurement object 20 is a battery cell, the reference measurement object 20S is a product of the same type (model number, etc.) but a different individual from other battery cells in one or more battery cells.

[0053] The reference impedance value P1 is preferably measured, for example, without placing other batteries, metals, etc. around the reference measurement object 20S and without placing it on the metal tray 100 to exclude the influence of eddy currents from the surroundings. Here, before measuring the reference impedance value P1 of the reference measurement object 20S, zero adjustment correction of the measuring device 1 may be performed. As shown in FIG. 4, the reference impedance value P1 of the reference measurement object 20S is measured to be, for example, 1.000 mΩ.

[0054] The measuring device 1 stores the acquired reference impedance value P1 in the storage area of the storage unit 19.

[0055] FIGS. 5 to 7 are schematic diagrams showing steps of obtaining impedance values M1 to M10 for each measurement area corresponding to the measurement areas 101 to 110 of the reference measurement object 20S in the resistance measurement method according to the embodiment. In FIGS. 5 to 7, in order to associate the measurement areas 101 to 110 of the tray 100 with the measurement object 20, the measurement object 20 is labeled with reference numerals 20_1 to 20_10.

[0056] As shown in FIGS. 5, 6, and 7, the impedance values for each measurement area of the reference measurement object 20S corresponding to the measurement area are measured by mounting the reference measurement object 20S on one or more measurement areas defined at different positions on the tray 100. The impedance values for each measurement area are measured in a situation where other measurement objects 20_1 to 20_10 are mounted around the reference measurement object 20S on the tray 100, that is, in a situation similar to the inspection process during mass production of battery cells, and are affected by eddy currents from the surroundings.

[0057] In the storage area of the storage unit 19, the impedance values for each measurement area are stored in association with the information of the measurement areas 101 to 110 on the tray 100. The mounting positions of the batteries on the tray 100 are, for example, with the position at one end of the tray 100 (the left end of the paper in FIGS. 5, 6, and 7) as the measurement area 101, and in sequence toward the other end of the tray 100 (the right end of the paper in FIGS. 5, 6, and 7), the measurement areas 102,..., measurement area 105,..., measurement area 109, measurement area 110, and so on. Information is attached and stored so that the measurement areas of the measurement objects 20_1 to 20_10 and the reference measurement object 20S on the tray 100 can be specified.

[0058] As shown in FIG. 5, the impedance value M1 for each measurement area in the measurement area 101 is measured to be, for example, 1.001 mΩ. As shown in FIG. 6, the impedance value M5 for each measurement area in the measurement area 105 is measured to be, for example, 1.005 mΩ. As shown in FIG. 7, the impedance value M10 for each measurement area in the measurement area 110 is measured to be, for example, 1.010 mΩ.

[0059] As shown in FIGS. 5, 6, and 7, the measuring device 1 stores the impedance values for each measurement area acquired as described above in the storage area of the storage unit 19 in association with the information of the measurement areas 101 to 110. Specifically, in the storage area, the impedance values for each measurement area of the reference measurement object 20S in the measurement areas 101 to 110 are stored, for example, as the impedance value M1 for each measurement area measured in the measurement area 101, the impedance value M5 for each measurement area measured in the measurement area 105, and the impedance value M10 for each measurement area measured in the measurement area 110.

[0060] Using the reference impedance value P1 of the reference measurement object 20S and the impedance values M1 to M10 for each measurement area acquired as described above, the deviation amount calculation unit 180 calculates the deviation amounts D1 to D10. Specifically, as shown in FIGS. 5, 6, and 7, the impedance values M1,... M10 for each measurement area acquired are added or subtracted from the reference impedance value P1: 1.000 mΩ shown in FIG. 5 to calculate the deviation amounts D1 to D10.

[0061] As shown in FIG. 5, the deviation amount D1 in the measurement area 101 is calculated, for example, as 0.001 mΩ. As shown in FIG. 6, the deviation amount D5 in the measurement area 105 is calculated, for example, as 0.005 mΩ. As shown in FIG. 7, the deviation amount D10 in the measurement area 110 is calculated, for example, as 0.010 mΩ.

[0062] FIG. 8 is a schematic diagram showing an example of the storage area of the deviation amounts D1 to D10 in the measurement method according to the embodiment. As shown in FIG. 8, the calculated deviation amounts D1 to D10 are associated with the measurement areas on the tray 100 of the reference measurement object 20S, that is, the measurement areas 101 to 110, in the form of the measurement area 101 and the deviation amount D1,..., the measurement area 105 and the deviation amount D5,..., the measurement area 110 and the deviation amount D10, and are stored in the storage area of the storage unit 19.

[0063] The correction unit 186 corrects the influence of induced voltage and eddy current caused by other battery cells or metals in the measurement regions 101 to 110 on the tray 100 when measuring the impedance value of the measurement object 20 by the measuring device 1 in the inspection process of the battery cell using the deviation amounts D1 to D10. That is, in the inspection process of the battery cell, when measuring the impedance value of the measurement object 20 by the measuring device 1, the measured impedance value is corrected using the deviation amount D. By doing so, according to the measuring device 1, it is possible to obtain the impedance value of the measurement object 20 with the influence of induced voltage and eddy current reduced regardless of the measurement region on the tray 100. Therefore, by using the measuring device 1, the sorting in the inspection process of the battery cell can be carried out more accurately.

[0064] Conventionally, the zero adjustment correction, which has been performed using an instrument for zero adjustment correction such as a zero adjustment board for adjusting the battery tester, has been performed on the premise that the arrangement of the test leads and the metal environment around the measurement object 20 do not change. On the other hand, in the measuring device 1, different from the zero adjustment correction that attempts to reduce the error caused by the surrounding environment, the error correction can be performed based on the actual measurement situation.

[0065] FIG. 9 is a flowchart showing an example of the deviation amount calculation process in the measurement method according to the embodiment. Referring to the flowchart shown in FIG. 9, the calculation process of the deviation amount used in the measurement method according to the embodiment will be described.

[0066] As shown in FIG. 4, the measuring device 1 stores the reference impedance value of the reference measurement object 20S in the storage unit 19 (step S101).

[0067] As shown in FIGS. 5 to 7, the measuring device 1 measures the impedance values of the reference measurement object 20S in the measurement regions 101 to 110 corresponding to the measurement regions 101 to 110, and stores the results in the storage region of the storage unit 19 as the impedance values M1 to M10 for each measurement region (step S102).

[0068] The measuring device 1 calculates the deviation amounts D1 to D10 between the reference impedance value P1 and the impedance values M1 to M10 for each measurement region by the deviation amount calculation unit 180 (step S103).

[0069] As shown in FIG. 8, the measuring device 1 stores the calculated deviation amounts in the storage area of the storage unit 19 in association with the measurement regions 101 to 110 (step S104).

[0070] FIG. 10 is a flowchart showing an example of the impedance value measurement process of the measurement object in the measurement method according to the embodiment. Referring to the flowchart shown in FIG. 10, the measurement method according to the embodiment will be described.

[0071] In the measuring device 1, the measurement region information receiving unit 181 receives the position information of the measurement regions 101 to 110, that is, the measurement region information, when measuring the actual impedance value of the measurement object 20 (step S201).

[0072] In the measuring device 1, the deviation amount specifying unit 182 specifies the deviation amounts D1 to D10 corresponding to the input measurement region information from the deviation amounts D1 to D10 corresponding to the measurement regions 101 to 110 stored in the storage region (step S202).

[0073] In the measuring device 1, the measurement unit 185 calculates the impedance of the measurement object 20 based on the acquired voltage value and current value (step S203).

[0074] In the measuring device 1, the correction unit 186 corrects the impedance value calculated by the measurement unit 185 based on the deviation amounts D1 to D10 specified by the deviation amount specifying unit 182 (step S204).

[0075] In the measuring device 1, the output unit 183 outputs the corrected impedance value to the display unit 22 (step S205).

[0076] 3. Effects of the Embodiment According to the measurement method executed by the measuring device 1 according to the embodiment described above, the following effects can be achieved.

[0077] The measurement method executed by the measuring device 1 calculates the deviation amount between the reference impedance value of the reference measurement object 20S and the impedance value for each measurement region, associates the impedance value for each measurement region with one or a plurality of measurement regions where the impedance value for each measurement region is measured, and stores this deviation amount in the storage region. The deviation amount is obtained by receiving, from the operation unit 21, the measurement region information that specifies the position on the tray 100 of the measurement object 20 when measuring the actual impedance value in the measurement region of the measurement object 20, and a value corresponding to the measurement region information is specified. The measuring device 1 outputs, from the output unit 183, a value obtained by adding or subtracting the specified deviation amount from the actual impedance value in the state where the measurement object 20 is mounted on the tray 100 of the measurement object 20.

[0078] As a measurement object of the measuring device 1, another measurement object 20 is mounted on the tray 100 adjacent to the measurement object 20. Here, the reference measurement object 20S and the measurement object 20 have different impedance values due to the influence of the induced voltage and eddy current caused by the presence or absence of other measurement objects 20. Further, the reference measurement object 20S is a product having the same characteristics as the measurement object 20.

[0079] According to the measuring device 1 as described above, the influence of the induced voltage and eddy current due to the difference in the measurement regions 101 to 110 in the measurement region (on the tray 100 in the inspection process) can be reflected in the impedance value of the measurement object 20 acquired during actual measurement (during the inspection process). That is, according to the measuring device 1, an impedance value with reduced influence of the induced voltage and eddy current can be obtained regardless of the measurement regions 101 to 110 on the tray 100. Therefore, by using the measuring device 1 in the inspection process of the battery cell, the sorting of the battery cell can be carried out more accurately.

[0080] ≪Expansion of the Embodiment≫ As described above, the invention made by the inventors of the present application has been specifically described based on the embodiments. However, the present invention is not limited thereto, and it goes without saying that various modifications can be made without departing from the gist thereof.

[0081] FIG. 11 is a diagram showing a first modification of the inspection process for measuring the impedance value of a measurement object in the measurement method according to the embodiment. FIG. 12 is a diagram showing a second modification of the inspection process for measuring the impedance value of a measurement object in the measurement method according to the embodiment.

[0082] In the above-described embodiment, an example of the measurement device 1 used in the inspection process of the internal resistance in the production line of the cylindrical battery cell shown in FIG. 2 has been described. However, the battery cell that becomes the measurement object 20 of the measurement device 1 is not limited to the cylindrical battery cell. For example, it may be used in the inspection process of the internal resistance in the production line of a square battery cell as in the first modification shown in FIG. 11, or a laminated pouch-type battery cell as in the second modification shown in FIG. 12.

[0083] For example, in the above embodiment, an example in which the measurement device 1 is used in the inspection process of the internal resistance in the production line of the battery cell has been described. However, the measurement device 1 may be used for measuring the internal resistance even outside the production line.

[0084] For example, in the above embodiment, an example in which the number of measurement objects 20 mounted on the tray 100 is 10 has been described. However, the number of measurement objects 20 is not limited to the above example. Also, for the measurement objects 20 on the tray 100, an example in which 10 are mounted in a row has been described, but the measurement objects 20 may be mounted in two or more rows. Furthermore, the measurement objects 20 on the tray 100 do not have to be arranged in a row as long as the measurement regions 101 to 110 can be specified.

[0085] For example, in the above embodiment, the reference impedance value and the impedance values for each measurement region were obtained by measuring the impedance value of the reference measurement object 20S using the measuring device 1 as shown in FIGS. 4 to 7. However, the reference impedance value and the impedance values for each measurement region may be set by input from the operation unit 21.

[0086] For example, in the above embodiment, the measurement region information, the impedance values for each measurement region, and the numbers specifying the deviation amounts were numbers starting from 1. However, they may be a combination of characters and numbers indicating columns. Specifically, when 20 measurement objects are arranged in two columns of 12 each on the tray 100, for example, it is conceivable to set the first column as A1 to A12 and the second column as B1 to B12.

[0087] For example, in the above embodiment, the deviation amount calculation unit 180 calculates the deviation amount by addition and subtraction between the reference impedance value and the impedance values for each measurement region measured corresponding to one or a plurality of measurement regions, and the correction unit 186 corrects the measured impedance value by adding and subtracting the deviation amount. However, the present disclosure is not limited thereto. For example, the deviation amount calculation unit 180 may calculate a correction coefficient from the ratio between the reference impedance value and the impedance values for each measurement region corresponding to one or a plurality of measurement regions. In this case, the correction unit 186 multiplies and divides this correction coefficient from the actually measured impedance value.

[0088] For example, in the above embodiment, as shown in FIG. 4, in order to measure excluding the influence of eddy currents from the surroundings, the reference impedance value P1 was measured without placing other batteries or metals around the reference measurement object 20S and without placing it on the metal tray 100. However, the present disclosure is not limited thereto. For example, the reference impedance value P1 may be measured with the reference measurement object 20S placed on the metal tray 100 and with other batteries or metals around it.

Explanation of Reference Numerals

[0089] 1... Measuring device, 111... High-side sense terminal, 112... High-side source terminal, 121... Low-side sense terminal, Low-side source terminal 122, 13... Signal generation circuit, 14... Voltage detection circuit, 15... Current detection circuit, 16, 17... A / D conversion circuit, 18... Data processing control unit, 19... Memory unit, 20... Device under test (DUT), 20S... Reference measurement object, 21... Operation unit, 22... Display unit, 100... Tray, 101, 102, 105, 109, 110... Measurement areas, 180... Deviation amount calculation unit, 181... Measurement area information reception unit, 182... Deviation amount specification unit, 183... Output unit, 185... Measurement unit, 186... Correction unit

Claims

1. A measuring device for measuring an electrical characteristic value of a measurement object disposed in at least one measurement area, a storage unit that stores, in association with the measurement area, a deviation amount between a reference value of an electrical characteristic of a reference measurement object that is a reference for the measurement object and an electrical characteristic value of the reference measurement object measured in the measurement area; a measurement area information reception unit that receives information specifying an actual measurement area when measuring the electrical characteristic value of the measurement object; a deviation amount specifying unit that specifies the deviation amount corresponding to the information specifying the measurement area; a measurement unit that measures the electrical characteristic value; a correction unit that corrects the electrical characteristic value according to the specified deviation amount; comprising a measuring device.

2. The measuring device according to claim 1, further comprising a deviation amount calculation unit that calculates the deviation amount. The measuring device according to claim 1.

3. The measuring device according to claim 2, wherein the deviation amount calculation unit calculates, as the deviation amount, a value obtained by adding or subtracting the reference value from the electrical characteristic value of the reference measurement object measured in the measurement area. The measuring device according to claim 2.

4. The measuring device according to claim 2, wherein the deviation amount calculation unit calculates, as the deviation amount, a ratio of the electrical characteristic value of the reference measurement object measured in the measurement area to the reference value. The measuring device according to claim 2.

5. The measuring device according to claim 1 or 2, further comprising an output unit that outputs either the electrical characteristic value measured by the measurement unit or the corrected electrical characteristic value corrected by the correction unit. The measuring device according to claim 1 or 2.

6. The measuring device according to claim 1, wherein the reference measurement object is one of the measurement objects. The measuring device according to claim 1.

7. The measuring device according to claim 1, wherein the reference measurement object and the measurement object are batteries. The measuring device according to claim 1.

8. A measuring method for measuring an electrical characteristic value of a measurement object disposed in at least one measurement area, the method comprising: receiving information specifying an actual measurement area when measuring the electrical characteristic value of the measurement object; specifying, from a storage unit that stores, in association with the measurement area, a deviation amount between a reference value of an electrical characteristic of a reference measurement object that is a reference for the measurement object and an electrical characteristic value of the reference measurement object measured in the measurement area, the deviation amount corresponding to the measurement area; measuring the electrical characteristic value; correcting the electrical characteristic value according to the specified deviation amount; executing a measuring method.

9. storing the reference value in the storage unit; A step of storing, in the storage unit, the electrical characteristic value of the reference measurement object in the measurement area in association with the measurement area; executing; The measurement method according to claim 8.

10. A measurement program for causing a computer to execute a process of measuring an electrical characteristic value of a measurement object disposed in at least one measurement area, a step of receiving information for specifying an actual measurement area when measuring the electrical characteristic value of the measurement object; a step of specifying the deviation amount corresponding to the measurement area from a storage unit in which the deviation amount between the reference value of the electrical characteristic of the reference measurement object, which is the reference of the measurement object, and the electrical characteristic value of the reference measurement object in the measurement area is stored in association with the measurement area; a step of measuring the electrical characteristic value; a step of correcting the electrical characteristic value according to the specified deviation amount; A measurement program for causing the computer to execute.

11. a step of storing the reference value in the storage unit; a step of storing, in the storage unit, the electrical characteristic value of the reference measurement object in the measurement area in association with the measurement area; causing the computer to execute; The measurement program according to claim 10.

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