Waveform data processing system and waveform data processing method

Abstract

To enable waveforms to be appropriately compared with each other.SOLUTION: A waveform data processing system 10 includes an acquisition part 11 for acquiring a plurality of waveform data acquired by analysis to specify substances included in an analysis object, and information undergoing correspondence between the plurality of waveform data and showing a plurality of reference positions in a horizontal axis direction of each waveform data, a processing part 12 for deforming at least any waveform data between the plurality of waveform data so as to match a plurality of lengths in the horizontal axis direction between the reference positions of each waveform data acquired by the acquisition part 11 between the plurality of waveform data, and an output part 13 for outputting waveform data corresponding to deformation by the processing part 12.SELECTED DRAWING: Figure 1

Description

[Technical Field]

[0001] The present invention relates to a waveform data processing system and a waveform data processing method for processing waveform data obtained by an analysis for identifying a substance contained in an object to be analyzed. [Background technology]

[0002] Analyses to identify substances contained in an analyte include liquid chromatography (LC) / gas chromatography (GC) and Fourier transform infrared spectroscopy. The analytical instruments used for these analyses usually output waveform data as the analysis results. Waveform data, for example, has a horizontal axis representing time and a vertical axis representing intensity.

[0003] To analyze the analysis results, the analyst compares waveform data representing different analysis results. For example, to determine whether an object to be analyzed contains impurities, the analyst compares the waveform data of the object to be analyzed with reference waveform data to detect differences between these waveform data.

[0004] Conventionally, techniques have been proposed to make it easier to compare waveform data. For example, Patent Document 1 proposes a technique for displaying waveform data to be compared in an overlapping manner. Furthermore, Patent Document 2 proposes calculating a waveform magnification and offset so that the baselines and peak heights of the waveform data to be compared match. [Prior art documents] [Patent documents]

[0005] [Patent Document 1] Japanese Patent Application Publication No. 11-304787 [Patent Document 2] Japanese Patent Application Laid-Open No. 2011-169704 Summary of the Invention [Problem to be solved by the invention]

[0006] In analyses using the above-mentioned analytical instruments, fluctuations occur in the waveform data depending on the measurement conditions. Therefore, when comparing waveform data, it is desirable to absorb the fluctuations in the waveform data. The method shown in Patent Document 2 above is intended to absorb fluctuations in the vertical axis direction of the waveform data.

[0007] One method for absorbing fluctuations in the horizontal axis of waveform data is to correct the horizontal scale for each waveform data item using RRT (relative retention time). However, this method may not be able to fully absorb fluctuations in the horizontal axis. This is especially true in areas with slow retention times, which can result in peaks that should be at the same horizontal position across multiple waveform data items shifting.

[0008] The present invention has been made in view of the above, and has an object to provide a waveform data processing system and a waveform data processing method that enable appropriate comparison of waveform data. [Means for solving the problem]

[0009] In order to achieve the above object, the present invention has the following configuration. [1] An acquisition means for acquiring a plurality of waveform data obtained by an analysis for identifying a substance contained in an analyte, and information indicating correspondence between the plurality of waveform data and a plurality of reference positions in the horizontal axis direction for each waveform data; a processing means for transforming at least one of the plurality of waveform data pieces acquired by the acquisition means so that a plurality of lengths in the horizontal axis direction between reference positions for each of the plurality of waveform data pieces coincide with each other among the plurality of waveform data pieces; an output means for outputting waveform data according to the deformation by said processing means; A waveform data processing system comprising: [2] The waveform data processing system according to [1], wherein the acquisition means acquires information indicating the position of the peak of the waveform represented by the waveform data as information indicating multiple reference positions in the horizontal axis direction for each waveform data. [3] The waveform data processing system according to [1] or [2], wherein the acquisition means acquires a plurality of waveform data obtained by chromatography or infrared spectroscopy. [4] The processing means generates reference waveform data from values in the vertical axis direction for each position in the horizontal axis direction of a plurality of reference-calculation waveform data serving as a reference among the plurality of waveform data after transformation, and calculates a variation in values in the vertical axis direction for each position in the horizontal axis direction; The waveform data processing system according to any one of [1] to [3], wherein the output means outputs the reference waveform data generated by the processing means and information indicating the variation. [5] The waveform data processing system according to [4], wherein the acquisition means acquires the plurality of reference calculation waveform data according to the application. [6] A waveform data processing method that is a method for operating a waveform data processing system, comprising: an acquisition step of acquiring a plurality of waveform data obtained by an analysis for identifying a substance contained in an analyte, and information indicating correspondence between the plurality of waveform data and a plurality of reference positions in the horizontal axis direction for each waveform data; a processing step of transforming at least one of the plurality of waveform data pieces acquired in the acquisition step so that a plurality of lengths in the horizontal axis direction between reference positions for each of the plurality of waveform data pieces are the same among the plurality of waveform data pieces; an output step of outputting waveform data according to the deformation caused by the processing step; A waveform data processing method comprising: [Effects of the Invention]

[0010] According to the present invention, it is possible to appropriately compare waveform data with each other. [Brief explanation of the drawings]

[0011] [Figure 1] 1 is a diagram showing a configuration of a waveform data processing system according to an embodiment of the present invention. [Figure 2] 1 is a graph showing an example of waveform data acquired by a waveform data processing system. [Figure 3] 10 is a graph for explaining deformation of waveform data in the vertical axis direction. [Figure 4] 10 is a graph showing an example of a reference position in waveform data. [Figure 5] 10 is a graph showing an example of two waveform data after deformation in the horizontal axis direction. [Figure 6] 10 is a display example of waveform data to be compared after transformation and reference waveform data. [Figure 7] 1 is a flowchart showing a waveform data processing method that is a process executed in a waveform data processing system according to an embodiment of the present invention. DETAILED DESCRIPTION OF THE INVENTION

[0012] Hereinafter, an embodiment of a waveform data processing system and a waveform data processing method according to the present invention will be described in detail with reference to the drawings. In the description of the drawings, the same elements are given the same reference numerals and duplicated explanations will be omitted.

[0013] FIG. 1 shows the configuration of a waveform data processing system 10 according to this embodiment. The waveform data processing system 10 is a system (apparatus) that processes waveform data obtained by analysis to identify substances contained in an object to be analyzed. The analysis is performed by an analytical instrument 20, and waveform data is output from the analytical instrument 20. The waveform data obtained by the analysis corresponds to the substances contained in the object to be analyzed.

[0014] The analysis is, for example, an analysis for identifying substances such as impurities contained in a drug substance (analyte). In this case, the analysis is used to determine whether or not a drug substance contains impurities that are not contained in other drug substances, i.e., whether or not the drug substance being analyzed is OOT (Out-of-Trend). The impurities may be either new impurities or known impurities. The determination is performed by an analyst comparing multiple waveforms. The processing of waveform data by the waveform data processing system 10 is intended to make it easier for an analyst to compare multiple waveforms.

[0015] The analyte related to the waveform data does not necessarily have to be an active pharmaceutical ingredient, but may be anything that can be analyzed to identify the substance contained therein to obtain waveform data. Furthermore, the purpose of processing the waveform data by the waveform data processing system 10 may be other than those described above.

[0016] Specifically, the waveform data processing system 10 is configured by a computer having hardware such as a CPU (Central Processing Unit) and memory. Each of the functions of the waveform data processing system 10, which will be described later, is performed by these components operating through programs or the like. Each of the functions of the waveform data processing system 10, which will be described later, may also be realized by dedicated application software. The waveform data processing system 10 may be realized by a single computer, or may also be realized by a computer system configured by multiple computers connected to each other via a network. The waveform data processing system 10 may have a communication function for obtaining information necessary for its own functions, and may be capable of sending and receiving information to and from other devices.

[0017] Next, a description will be given of the functions of the waveform data processing system 10 according to this embodiment. As shown in FIG.

[0018] The acquisition unit 11 is an acquisition means that acquires multiple waveform data obtained by analysis to identify substances contained in an analyte, and information indicating correspondences between the multiple waveform data and multiple reference positions in the horizontal axis direction for each waveform data. The acquisition unit 11 may acquire information indicating the positions of peaks of the waveform represented by the waveform data as information indicating multiple reference positions in the horizontal axis direction for each waveform data. The acquisition unit 11 may acquire multiple waveform data obtained by chromatography or infrared spectroscopy. The acquisition unit 11 may acquire multiple reference calculation waveform data according to the application.

[0019] The acquisition unit 11 acquires multiple pieces of waveform data obtained by analysis by the analytical instrument 20. The analytical instrument 20 is a device that performs analysis to identify substances contained in an object to be analyzed and outputs waveform data as the analysis result. For example, the analytical instrument 20 is a device that performs analysis by chromatography (e.g., LC or GC) or infrared spectroscopy as the analysis. The analytical instrument 20 may be the same as a conventional one. However, the analytical instrument 20 may also be a device that performs analysis to identify substances contained in an object to be analyzed by a method other than chromatography or infrared spectroscopy and outputs waveform data.

[0020] FIG. 2 shows an example of waveform data obtained by chromatography. Note that the examples of waveform data shown in the drawings in this embodiment are not necessarily based on the same waveform data and the same waveform data. For example, the horizontal axis (x-axis) of the waveform related to the waveform data is time (e.g., RT (retention time) in minutes), and the vertical axis (y-axis) is signal intensity. However, the horizontal and vertical axes of the waveform may be other than those described above depending on the analysis. Note that all of the multiple waveform data acquired by the acquisition unit 11 have the same horizontal and vertical axes and are comparable to each other.

[0021] The waveform data output from the analytical instrument 20 is, for example, text data (e.g., a CSV (Comma Separated Values) file) in which corresponding horizontal and vertical axis values are written in text. The text data may be converted from a measurement chart output from the analytical instrument 20. Note that the format of the waveform data does not have to be the above, and any format that can represent a waveform may be used.

[0022] The waveform peaks of the waveform data correspond to substances contained in the analyte. By comparing the peaks of multiple waveforms, an analyst can understand the differences in the substances contained in the analyte. For example, an analyst can compare multiple waveforms to determine whether the waveforms contain abnormal peaks, i.e., whether the analyte contains impurities corresponding to the abnormal peaks. The shapes of the waveform data output by the analytical instrument 20 will differ from one another even when analyzing the same analyte due to differences in analytical (measurement) conditions. For example, the positions of peaks corresponding to the same substance will be different from one another on the horizontal axis. Analysis conditions that can cause waveform deviations include the analytical instrument 20, the column used in the analysis (lot, change over time or temperature of the liquid phase), or the carrier gas used in the analysis (flow rate or flow velocity). The multiple waveform data acquired by the acquisition unit 11 may contain such differences.

[0023] The plurality of waveform data acquired by the acquiring unit 11 may be obtained by analyzing different analytes. However, the different analytes are meaningful for comparison between the same type of analytes (e.g., the same type of drug substance). Furthermore, the plurality of waveform data acquired by the acquiring unit 11 may include data obtained by different analytical instruments 20.

[0024] The acquiring unit 11 may acquire multiple waveform data for reference calculation that serve as a reference for comparison, and one waveform data to be compared. For example, the multiple waveform data for reference calculation are waveform data when each of past normal batches (e.g., tens to hundreds of batches) of active pharmaceutical ingredients is used as the analysis target. The single waveform data to be compared is waveform data when a newly manufactured active pharmaceutical ingredient is used as the analysis target. By comparing these, it is possible to confirm whether the newly manufactured active pharmaceutical ingredient has any problems compared to the active pharmaceutical ingredient of the past normal batch. Furthermore, the acquiring unit 11 may acquire multiple waveform data for reference calculation according to the intended use. The intended use may be selected in advance by the analyst. This is because waveform data may differ depending on differences in active pharmaceutical ingredient manufacturing equipment, such as a small experimental machine and an actual machine, or differences in analytical equipment. The intended use may be one that corresponds to these differences. Note that the multiple waveform data acquired by the acquiring unit 11 may be for purposes other than those described above.

[0025] The acquiring unit 11 acquires the waveform data output by the analytical instrument 20 by any method. For example, the acquiring unit 11 reads and acquires the waveform data from a database that stores the waveform data output by the analytical instrument 20. The database may be stored on the cloud.

[0026] The acquisition unit 11 also acquires information that indicates multiple reference positions in the horizontal axis direction for each waveform data piece, which correspond to each other among the multiple waveform data pieces to be acquired. The information indicating the reference positions is information used for transforming the waveform data, which will be described later. For example, the reference positions are information that indicate the positions of specific peaks that are set in advance in the waveform represented by the waveform data. In this case, the peaks that serve as the reference positions correspond to, for example, known substances contained in the object to be analyzed. Note that the multiple reference positions may be positions other than the positions of waveform peaks, as long as they correspond to each other among the multiple waveform data pieces to be acquired and are positions in the horizontal axis direction for each waveform data piece.

[0027] Peaks in the waveform data corresponding to known substances can be identified by a conventional method, and the information indicating the reference positions is prepared in advance by the method. For example, the information indicating the reference positions is previously stored in a database in association with the waveform data, and the acquisition unit 11 acquires the information together with the waveform data. The acquisition unit 11 outputs the acquired plurality of waveform data and information indicating the plurality of reference positions of the plurality of waveform data to the processing unit 12.

[0028] Processing unit 12 is a processing means that transforms at least any of the plurality of waveform data acquired by acquisition unit 11 so that multiple lengths in the horizontal axis direction between reference positions for each waveform data are consistent among the plurality of waveform data. Processing unit 12 may generate reference waveform data from vertical axis values for each position in the horizontal axis direction of multiple reference-calculation waveform data that serve as references among the plurality of waveform data after transformation, and may also calculate the variation in the vertical axis values for each position in the horizontal axis direction.

[0029] The processing unit 12 processes the waveform data using a pre-stored method, for example, as follows: The processing unit 12 receives, from the acquisition unit 11, a plurality of waveform data and information indicating a plurality of reference positions of the plurality of waveform data.

[0030] The processing unit 12 performs vertical axis correction for each of the multiple input waveform data. The vertical axis correction is based on the baseline (reference line) of the waveform. The baseline is the vertical axis position that serves as the reference for the waveform peak. The baseline is, for example, a value for each position on the horizontal axis. The baseline of the waveform data may vary with each analysis performed by the analytical instrument 20. The vertical axis correction is performed to compare waveform data while excluding variations in the vertical axis with each analysis. However, in cases where it is expected that there will be no difference in baseline between waveform data, vertical axis correction is not necessarily required.

[0031] The processing unit 12 calculates the baseline value for each horizontal axis position of each waveform data as follows. As shown in FIG. 3(a), the processing unit 12 sets a horizontal axis range R (window) for the horizontal axis position P for which the baseline value is to be calculated. FIG. 3(a) shows a zoomed-in view of the range 16 to 22 on the horizontal axis in FIG. 2 to make the waveform easier to see and explain. The range R is, for example, a range of a predetermined size (e.g., 30 seconds) centered on the position P. Next, as shown in FIG. 3(b), the processing unit 12 sorts the vertical axis values of the waveform data in the range R in ascending order. As shown in FIG. 3(c), the processing unit 12 determines the value in a predetermined order (e.g., the eighth value (the 8th percentile value)) among the sorted values as the baseline value. The processing unit 12 calculates the baseline value as described above for each horizontal axis position (e.g., while moving the horizontal axis range R (window)). The processing unit 12 subtracts the calculated baseline value from the vertical axis value of the waveform data, and sets the obtained value as the vertical axis value of the waveform data after correction in the vertical axis direction.

[0032] Furthermore, the processing unit 12 performs horizontal axis correction on the plurality of waveform data after vertical axis correction. For the horizontal axis correction, information indicating a plurality of reference positions in the horizontal axis direction for each waveform data is used. Figure 4 shows an example of the reference positions of the waveform. In Figure 4, the position in the horizontal axis direction indicated by the arrow is the reference position.

[0033] The processing unit 12 uses one of the input waveform data as reference waveform data. For example, the reference waveform data is one of the reference calculation waveform data. The processing unit 12 transforms the other waveform data so that the multiple lengths in the horizontal axis direction between reference positions of the reference waveform data and the other waveform data match.

[0034] Specifically, the processing unit 12 calculates the length in the horizontal axis direction between corresponding reference positions for the reference waveform data and the other waveform data. In this case, the start position of the waveform data (the position where the horizontal axis direction is 0) may also be used as the reference position. The processing unit 12 linearly scales the other waveform data by multiplying the value in the horizontal axis direction between the reference positions by a coefficient so that the length between the reference positions in the other waveform data becomes the same as the length between the reference positions in the reference waveform data. In this case, the processing unit 12 may also standardize the reference waveform data in the horizontal axis direction using, for example, RRT (relative retention time). The processing unit 12 performs the above transformation for all of the reference positions between the other waveform data.

[0035] As a result of the above-described deformation of the waveform data, multiple lengths (lengths indicated by arrows) in the horizontal direction between reference positions of the reference waveform data and the other waveform data match, as shown in Figure 5. In Figure 5, the two waveform data are respectively indicated by a solid line and a dashed line. The processing unit 12 performs the above-described deformation on all other waveform data. Note that the deformation of the waveform data in the horizontal direction may be performed by a method other than the above, as long as the multiple lengths in the horizontal direction between reference positions of each waveform data match among the multiple waveform data.

[0036] Next, processing unit 12 generates reference waveform data from the multiple reference calculation waveform data after transformation, which serve as a reference for comparison. For example, processing unit 12 calculates the average value of the vertical axis values of the multiple reference calculation waveform data after transformation for each position in the horizontal axis direction, and sets the waveform data having this average value as the vertical axis value as one reference waveform data. Processing unit 12 also calculates the variation in the vertical axis values of the multiple reference calculation waveform data after transformation for each position in the horizontal axis direction. For example, processing unit 12 calculates the standard deviation as the variation. The variation varies greatly depending on the reference calculation waveform data (for example, differences between a small experimental machine and an actual machine, etc., of a drug substance manufacturing device). Note that the calculated variation in the vertical axis values may be something other than the standard deviation, as long as it indicates variation.

[0037] Processing unit 12 outputs the processed waveform data obtained by processing the waveform data to output unit 13. For example, processing unit 12 outputs one piece of processed waveform data to be compared and the reference waveform data to output unit 13. Furthermore, when processing unit 12 calculates the variation in the values in the vertical axis direction of multiple pieces of reference-calculation waveform data, processing unit 12 also outputs the value of the variation to output unit 13.

[0038] The output unit 13 is an output means that outputs waveform data according to the deformation by the processing unit 12. The output unit 13 may output the reference waveform data generated by the processing unit 12 and information indicating the variation.

[0039] The output unit 13 receives information on the processing results from the processing unit 12. The output unit 13 outputs the plurality of waveform data received from the processing unit 12. As described above, at least one of the plurality of waveform data received from the processing unit 12 has been transformed in the horizontal axis direction by the processing unit 12. For example, the output unit 13 displays, after processing, one waveform data to be compared and one reference waveform data on a display device provided in the waveform data processing system 10. The display may be performed on the same coordinate axis so that the analyst can easily compare these waveform data.

[0040] Furthermore, when the processing unit 12 calculates the variation in the vertical axis values of multiple reference-calculation waveform data, the output unit 13 may also display this variation. For example, the output unit 13 may display the length of the variation (e.g., the length of 3 times the standard deviation) at the vertical axis position of one reference waveform data. An example of such a display is shown in FIG. 6. In FIG. 6, the waveform data to be compared is shown by a solid line, and the reference waveform data is shown by a dashed line. The range of variation relative to the reference waveform data is also shown by a gray area.

[0041] The output unit 13 may output the information input from the processing unit 12 in a manner other than display. For example, the output unit 13 may output and store each piece of information in a database so that it can be referenced from outside. The database may be on the cloud. The functions of the waveform data processing system 10 according to this embodiment have been described above.

[0042] Next, a waveform data processing method, which is processing executed by the waveform data processing system 10 according to this embodiment (the operating method performed by the waveform data processing system 10), will be described using the flowchart of FIG.

[0043] In this process, first, the acquisition unit 11 acquires a plurality of waveform data obtained by analysis for identifying substances contained in an analyte, and information indicating correspondences between the plurality of waveform data and a plurality of reference positions in the horizontal axis direction for each waveform data (S01, acquisition step). Subsequently, the processing unit 12 processes each waveform data (S02, processing step). The processing of the waveform data includes, at least, a process of transforming at least one of the plurality of waveform data so that a plurality of lengths in the horizontal axis direction between the reference positions for each waveform data coincide among the plurality of waveform data.

[0044] Next, the processing unit 12 generates reference waveform data from the vertical axis values for each horizontal axis position of the multiple reference-calculation waveform data after transformation, and calculates the variation in the vertical axis values for each horizontal axis position (S03, processing step). Next, the output unit 13 outputs the waveform data after processing by the processing unit 12 (S04, output step). For example, one waveform data to be compared and one reference waveform data are displayed. In addition, the variation in the vertical axis values of the multiple reference-calculation waveform data may also be displayed. This completes the waveform data processing method according to this embodiment.

[0045] According to the above-described embodiment, waveform data is transformed so that multiple lengths along the horizontal axis between reference positions are consistent across multiple waveform data. This transformation reduces the deviation along the horizontal axis between waveform data at any location where waveforms are to be compared. Fluctuations, particularly in portions with slow retention times, can be fully absorbed, preventing deviations between peaks that should be at the same horizontal axis position across multiple waveform data. Therefore, according to this embodiment, waveform data can be appropriately compared. As a result, abnormal peaks can be discovered early, improving the efficiency of data analysis work. Furthermore, abnormal peaks can be easily detected even if the analyst does not have the personal skill of comparing waveform data.

[0046] Furthermore, as in this embodiment, the information indicating multiple reference positions along the horizontal axis for each waveform data may be information indicating the peak positions of the waveform represented by the waveform data. The peak positions of the waveform can be easily detected as reference positions using conventional methods. Therefore, this configuration allows for easy and appropriate deformation of waveform data, thereby enabling easy and appropriate comparison of waveform data. However, the reference positions do not necessarily have to be peak positions, and may be any positions that correspond between waveform data.

[0047] As in the present embodiment, the plurality of waveform data may be obtained by chromatography or infrared spectroscopy, but the plurality of waveform data may be obtained by a method other than the above, as long as the data is obtained by analysis for identifying a substance contained in the analyte.

[0048] Furthermore, as in the present embodiment, reference waveform data may be generated from a plurality of reference-calculation waveform data, the variation in the vertical axis value for each horizontal axis position may be calculated, and the reference waveform data and information indicating the variation may be output. With this configuration, when it is desired to use a plurality of reference-calculation waveform data for comparison, the plurality of reference-calculation waveform data may be handled in a unified manner, enabling more appropriate comparison of the waveform data. However, this configuration is not necessarily required.

[0049] Furthermore, as in the present embodiment, the plurality of reference calculation waveform data may be different depending on the application. With this configuration, it is possible to compare waveform data according to the application. [Explanation of symbols]

[0050] 10...waveform data processing system, 11...acquisition unit, 12...processing unit, 13...output unit, 20...analysis equipment

Claims

1. an acquisition means for acquiring a plurality of waveform data obtained by an analysis for identifying a substance contained in an analyte, and information indicating correspondence between the plurality of waveform data and a plurality of reference positions in the horizontal axis direction for each waveform data; a processing means for transforming at least one of the plurality of waveform data pieces acquired by the acquisition means so that a plurality of lengths in the horizontal axis direction between reference positions for each of the plurality of waveform data pieces coincide with each other among the plurality of waveform data pieces; an output means for outputting waveform data according to the deformation by said processing means; A waveform data processing system comprising:

2. 2. The waveform data processing system according to claim 1, wherein the acquiring means acquires information indicating peak positions of a waveform represented by the waveform data as information indicating a plurality of reference positions in the horizontal axis direction for each waveform data.

3. 3. The waveform data processing system according to claim 1, wherein the acquisition means acquires a plurality of waveform data obtained by chromatography or infrared spectroscopy.

4. the processing means generates reference waveform data from values in the vertical axis direction for each position in the horizontal axis direction of a plurality of reference-calculation waveform data serving as a reference among the plurality of waveform data after transformation, and calculates a variation in values in the vertical axis direction for each position in the horizontal axis direction; 4. The waveform data processing system according to claim 1, wherein the output means outputs the reference waveform data generated by the processing means and information indicating the variation.

5. 5. The waveform data processing system according to claim 4, wherein said acquisition means acquires the plurality of reference calculation waveform data according to the intended use.

6. A waveform data processing method that is a method for operating a waveform data processing system, comprising: an acquisition step of acquiring a plurality of waveform data obtained by an analysis for identifying a substance contained in an analyte, and information indicating correspondence between the plurality of waveform data and a plurality of reference positions in the horizontal axis direction for each waveform data; a processing step of transforming at least one of the plurality of waveform data pieces acquired in the acquisition step so that a plurality of lengths in the horizontal axis direction between reference positions for each of the plurality of waveform data pieces are the same among the plurality of waveform data pieces; an output step of outputting waveform data according to the deformation caused by the processing step; A waveform data processing method comprising:

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