Sample processing member

Abstract

To allow processing a sample while checking a portion to be analyzed, easier compared with conventional techniques.SOLUTION: A sample processing member (1) comprises: a processing section (12) whose tip (12a) comes into contact with a processing target portion (S1) of a sample (S) to process the sample (S); a processing holding section (2) that holds the processing section (12); an observation port (6) that is formed in the processing holding section (2) and is provided corresponding to a position of the tip (12a) of the processing section (12); and an optical member (7) that is installed in the observation port (6) and magnifies an image at the position of the tip (12a).SELECTED DRAWING: Figure 2

Description

[Technical Field]

[0001] The present invention relates to a sample processing member for processing a sample to be analyzed, and more particularly to a sample processing member for processing a sample by cutting or scraping out an analysis target of the sample or finishing the analysis target surface of the sample. [Background technology]

[0002] Before analyzing a sample using analytical equipment such as an electron microscope, optical microscope, or spectrometer, the sample may be processed into a shape that can be held in a sample holder (such as a block or thin film), a cross section of the sample to be analyzed may be cut out, or the surface to be analyzed may be smoothed by planing. As a member for processing a sample, the technology described in Patent Document 1 below is known.

[0003] Patent Document 1 (JP 2015-17910 A) describes a technology in which a thin plate-shaped or thin thread-shaped sample is sandwiched between two holders, the sample is held with its longitudinal direction at an angle to the optical axis, and the sample is cut with a cutting member along a guide surface perpendicular to the optical axis to form (process) an oblique cross section and observe the surface to be observed. [Prior art documents] [Patent documents]

[0004] [Patent Document 1] Japanese Patent Application Laid-Open No. 2015-17910 Summary of the Invention [Problem to be solved by the invention]

[0005] (Problems with the prior art) In the technology described in Patent Document 1, when cutting a sample, it was necessary to clamp and fix the sample with a holder while visually checking the cutting position, cutting location, and cutting surface of the sample. Therefore, it was difficult to check and specify the cutting position and other details precisely, and cutting at the desired cutting position required repeated fixing, which was a time-consuming process. In particular, when analyzing only a specific surface portion of a solid sample, such as by planing or scraping off a specific portion, processing (scraping off) the sample while checking the specific surface portion was time-consuming.

[0006] The present invention has a technical object to make it possible to easily process a sample while checking the portion to be analyzed, compared to the prior art. [Means for solving the problem]

[0007] In order to solve the above technical problem, the sample processing member of the invention described in claim 1 comprises: a processing unit whose tip contacts a processing target portion of the sample to process the sample; a processing holding part that holds the processing part; an observation port formed in the processing holding portion and provided corresponding to the tip position of the processing portion; an optical member that is installed in the observation port and that magnifies an image at the tip position; The present invention is characterized by the following.

[0008] The invention described in claim 2 is the sample processing member described in claim 1, a collection port connected to the observation port and configured to collect the sample piece excised by the processing unit; The present invention is characterized by the following features.

[0009] The invention described in claim 3 is the sample processing member described in claim 2, the collection port capable of introducing illumination light toward the tip position; The present invention is characterized by the following.

[0010] The invention described in claim 4 is the sample processing member described in claim 1, a mounting portion provided on the processing holding portion, to which an operating portion for operating the sample processing member can be attached and to which a light source for irradiating illumination light to the tip position can be attached; The present invention is characterized by the following features. [Effects of the Invention]

[0011] According to the invention of claim 1, compared to the prior art, the part to be analyzed can be easily processed while checking it from the sample. According to the invention of claim 2, sample pieces can be easily collected while being confirmed through the collection port without removing the sample processing member from the sample. According to the invention as set forth in claim 3, it is easier to observe the tip position and the part of the sample to be processed compared to when illumination light is not introduced through the collection port. According to the invention as set forth in claim 4, the operation unit and the light source for illumination can be attached to one attachment portion, thereby making the device compact. [Brief explanation of the drawings]

[0012] [Figure 1] FIG. 1 is an explanatory view of the entire sample processing member according to the first embodiment of the present invention. [Figure 2] 2A and 2B are explanatory diagrams of the sample processing member of Example 1, in which FIG. 2A is a side view, FIG. 2B is a top view, FIG. 2C is a bottom view, and FIG. 2D is a view seen from the direction of arrow IID in FIG. 2A. [Figure 3] FIG. 3 is an explanatory diagram of the adjusting plate of the first embodiment. DETAILED DESCRIPTION OF THE INVENTION

[0013] Next, examples that are specific examples of the embodiment of the present invention will be described with reference to the drawings, but the present invention is not limited to the following examples. In the following description using the drawings, illustrations of components other than those necessary for the description are omitted as appropriate to facilitate understanding. [Example]

[0014] FIG. 1 is an explanatory diagram of a sample processing member according to a first embodiment of the present invention. 2A and 2B are explanatory diagrams of the sample processing member of Example 1, in which FIG. 2A is a side view, FIG. 2B is a top view, FIG. 2C is a bottom view, and FIG. 2D is a view seen from the direction of arrow IID in FIG. 2A. FIG. 3 is an explanatory diagram of the adjusting plate of the first embodiment. 1 and 2, a sampling plane 1 as an example of a sample processing member of Example 1 has a main body 2 as an example of a processing holding part. The main body 2 has a lower surface 2a facing the surface S1 of the sample S.

[0015] The main body 2 is formed with an attachment hole (an example of an attachment portion) 3 extending from the upper right diagonal toward the lower left diagonal. The tip of the handle 4 of the sampling planer 1 is inserted into the attachment hole 3. A screw hole 2b extending in the front-to-rear direction (X direction) intersecting the longitudinal direction of the handle (an example of an operating portion) 4 is connected to the attachment hole 3. Therefore, the handle 4 and the main body 2 can be fastened and fixed with a screw (not shown) in the screw hole 2b. Note that the handle 4 can be, for example, the handle portion of U.S. Patent Publication No. 5,595,424 (US-A1-5,595,424), or can be attached to a commercially available device via a rod- or handle-shaped attachment.

[0016] In the first embodiment, an LED light 5, which is an example of a light source for illumination, is supported at the tip of the handle 4. The LED light 5 can be supported by the handle 4 or by the mounting hole 3. In other words, the mounting hole 3 can be used not only to attach the handle 4 but also as a portion for attaching a light source for illumination, thereby making the entire device more compact.

[0017] An observation hole (observation port) 6 extending in the vertical direction is formed in the center in the left-right direction of the main body part 2. The observation port 6 is formed to penetrate the main body part 2 in the vertical direction. Therefore, the surface S1 of the sample S (the part to be processed, the part to be analyzed) can be observed through the observation hole 6. An observation lens 7, which is an example of an optical element, is supported at the upper end of the observation hole 6. The observation lens 7 in Example 1 is formed of a convex lens, for example, and is capable of magnifying and observing the image of the surface S1 of the sample S at the lower end of the observation hole 6. Note that, although an example has been given in which a single convex lens is used as the optical element, this is not limiting. Depending on the magnification and other requirements, it is possible to use conventionally known optical elements, change the curvature as appropriate, or use an embodiment in which multiple lenses are combined.

[0018] The main body 2 is formed with a collection port 8 that extends in the front-to-rear direction so as to intersect with the observation hole 6. The collection port 8 penetrates the main body 2 in the front-to-rear direction. The collection port 8 is formed at a position closer to the lower side of the main body 2 in the up-down direction. In Example 1, illumination light from the LED light 5 is irradiated onto the surface S1 of the sample S at the lower end of the observation hole 6, enabling observation through the observation lens 7. However, external light from the collection port 8 can also be used as illumination light. When external light from the collection port 8 is used, a configuration without the LED light 5 is also possible. Here, the collection port 8 in Example 1 is connected to the observation hole 6, and even when the lower surface 2a is in close contact with the surface S1 of the sample S, external light or light from a light source such as an LED light installed in the collection port 8 can be introduced through the collection port 8 as illumination light. In a configuration without a collection port 8, when the lower surface 2a comes into close contact with the surface S1 of the sample S, the surface S1 may be shaded, making observation difficult, but by introducing illumination light through the collection port 8, it becomes easier to observe and check the surface S1 of the sample S and the tip portion (12a) of the cutting blade (12). In particular, in Example 1, the collection port 8 is positioned downward, near the bottom end of the observation hole 6, and illumination light can more easily reach the surface S1 and the tip portion (12a) than if the collection port 8 were positioned higher.

[0019] A blade support groove 11 is formed in the lower left part of the main body 2, extending diagonally from the upper left to the lower right. A cutting blade 12, which is an example of a processing part, is supported in the blade support groove 11. As the cutting blade 12 of Example 1, a so-called diamond blade, in which an industrial diamond is used at the tip, can be suitably used. As shown in FIG. 2A, the cutting blade 12 is arranged so as to be inclined obliquely with respect to the planar direction (front-back and left-right directions) of the lower surface 2a, and the tip 12a is arranged so as to slightly protrude from the lower surface 2a. A screw through hole 12b is formed in the cutting blade 12. The cutting blade 12 is supported on the main body 2 by a screw 13 that passes through the screw through hole 12b. The outer diameter of the screw 13 is smaller than the inner diameter of the screw through hole 12b. Therefore, even when the screw 13 is fastened, the cutting blade 12 can be adjusted (finely adjusted) in position along the blade support groove 11 by the difference between the outer diameter of the screw 13 and the inner diameter of the screw through hole 12b. By finely adjusting the cutting blade 12 along the blade support groove 11, the amount of downward protrusion of the tip 12a relative to the lower surface 2a can be finely adjusted. In other words, it is possible to adjust the cutting depth and cutting ability of the surface S1 of the sample S.

[0020] 1 and 3, an adjustment plate 16 is supported on the upper left of the main body 2. The adjustment plate 16 is fixed to the main body 2 with screws 17 that pass through two fixing holes 16a. A fine adjustment screw hole 16b is formed in the lower part of the adjustment plate 16. The fine adjustment screw hole 16b is provided on an extension of the outer end 12c of the cutting blade 12. A fine adjustment tap 18 (see FIG. 1) is attached to the fine adjustment screw hole 16b. By rotating the fine adjustment tap 18, the outer end 12c of the cutting blade 12 can be pressed, thereby finely adjusting the position of the cutting blade 12 in the direction in which it protrudes along the blade support groove 11. Therefore, the amount of protrusion of the tip 12a of the cutting blade 12 can be finely adjusted. In addition, if you want to reduce the amount of protrusion of the tip 12a of the cutting blade 12 (if you want to move it in the direction of retracting it from the underside 2a), you can do so by reversing the rotation of the fine adjustment tap 18, loosening the screw 13, and manually moving the position of the cutting blade 12.

[0021] (Function of Example 1) With the sampling planer 1 of Example 1 having the above configuration, when scraping or planing (cutting finish) the surface S1 of the sample S, the surface S1 to be processed and analyzed can be confirmed through the observation hole 6 and the observation lens 7. Then, while visually observing through the observation hole 6, the cutting blade 12 can be placed at a desired position on the surface S1, and the handle 4 can be manually operated to move the cutting blade 12 along the surface S1, thereby scraping or planing the desired position on the sample S with the cutting blade 12. The sample piece cut out by the cutting blade 12 can be extracted and collected with tweezers or the like while visually observing it through the observation hole 6 through the collection port 8, without removing the sampling plane 1 from the sample S. The extracted sample piece can be held in a separate sample holder (not shown) and analyzed with an analytical device such as an electron microscope. Therefore, when cutting out a sample piece from the sample S, it is possible to cut it out while checking the area to be analyzed through the observation hole 6, and then extract it through the collection port 8.

[0022] As described in U.S. Patent Publication No. 5,595,424 (US-A1-5,595,424), when using a knife-like tool such as a commercially available microtome to cut a block of sample into thin films or to smooth the surface of the sample, even if the block of sample is firmly fixed in place, the knife-like tool's operation can cause the sample surface to become uneven, making it difficult to achieve a smooth surface. In contrast, the sampling planer 1 of Example 1 has a lower surface 2a of the main body 2 around the cutting blade 12, ensuring a contact area significantly larger than the tip 12a of the cutting blade 12. Therefore, when cutting with the cutting blade 12, the lower surface 2a presses against the periphery of the cut portion of the sample S, making it easier to cut a smooth sample piece or to smooth the surface S1.

[0023] When finishing (planing) is performed with the cutting blade 12, the planing chips can be removed by moving the sampling planer 1 away from the sample S, or can be collected by a dust collector through the collection port 8. Furthermore, in the first embodiment, the observation lens 7 that magnifies the image is provided, and it is possible to check in more detail than when the observation lens 7 is not provided. Furthermore, in the first embodiment, the protrusion amount of the cutting blade 12 can be easily finely adjusted using the fine adjustment tap 18, and the cutting ability of the sampling planer 1 can be easily adjusted.

[0024] (Example of change) Although the embodiments of the present invention have been described above in detail, the present invention is not limited to the above embodiments and various modifications can be made within the scope of the gist of the present invention as set forth in the claims. Modifications (H01) to (H03) of the present invention are exemplified below. (H01) In the above embodiment, a diamond blade is used as an example of the processing part, but this is not limiting. Depending on the type of sample S, any conventionally known configuration capable of processing the sample S can be adopted.

[0025] (H02) In the above embodiment, the present invention is not limited to visual confirmation through the observation hole 6. For example, it is possible to install a camera outside the observation lens 7, and further enlarge and display the image of the camera on a monitor or the like, so that the work can be performed while checking the surface S1 of the sample S on the monitor. Therefore, it is also possible to use an embodiment in which the sampling plane of Example 1 is attached to the tip of the camera unit. (H03) In the above embodiment, it is desirable to provide a collection port 8 for introducing lighting and collecting sample pieces, but it is also possible to configure it without providing one. That is, it is possible to ensure lighting by using an LED light 5 or by installing a light source (such as an LED light) inside the observation hole 6, and it is also possible to extract the cut-out sample piece by moving the sampling plane 1 away from the surface of the sample S. [Explanation of symbols]

[0026] 1...Sample processing member, 2...Processing holding part, 3...Mounting part, 6...observation port, 7...Optical components, 8...Collection port, 12...Processing department, 12a...tip, S...sample, S1...Area to be processed.

Claims

1. a processing unit whose tip contacts a processing target portion of the sample to process the sample; a processing holding part that holds the processing part; an observation port formed in the processing holding portion and provided corresponding to the tip position of the processing portion; an optical member that is installed in the observation port and that magnifies an image at the tip position; A sample processing member comprising:

2. a collection port connected to the observation port and configured to collect the sample piece excised by the processing unit; 2. The sample processing member according to claim 1, further comprising:

3. the collection port capable of introducing illumination light toward the tip position; 3. The sample processing member according to claim 2, further comprising:

4. a mounting portion provided on the processing holding portion, to which an operating portion for operating the sample processing member can be attached and to which a light source for irradiating illumination light to the tip position can be attached; 2. The sample processing member according to claim 1, further comprising:

Images