Peeling force estimation method, peeling force estimation program, and peeling test apparatus

Abstract

To provide a peeling force estimation method and related others capable of estimating peeling force at various peeling angles using a simple method.SOLUTION: A peeling force estimation method estimates peeling force in peeling a test film from an adherend surface by pulling one end of the test film that has separated from the adherend surface, where the test film is in a state of being attached to the adherend surface along a surface length direction of the adherend surface. The peeling force estimation method includes: a step S1 of measuring the peeling force at a predetermined peeling angle (hereinafter, referred to as an actual measured angle) using a peel test apparatus to acquire an actual measured value of the peeling force, the peeling angle being defined as an angle formed between the test film and the adherend surface; and a step S3 of calculating the peeling force at a peeling angle other than the actual measured angle using the actual measured value and a predetermined calculation formula representing a relation between the peeling angle and the peeling force.SELECTED DRAWING: Figure 7

Description

[Technical Field]

[0001] The present invention relates to a peel force estimation method, a peel force estimation program, and a peel test device for estimating the peel force when peeling a test film from an adherend surface. [Background technology]

[0002] Generally, there is a peel test to measure the adhesive strength of adhesive tapes and sheets, or the peel adhesive strength of adhesives, etc., and the test method is specified in JIS Z 0237.

[0003] Incidentally, a test device for conducting a peel test is described, for example, in Patent Document 1. In this device, the test piece and the base are lifted up via a lifting table, so that the test piece is peeled off from the adhesive on the base while always maintaining a peel angle of 90 degrees. [Prior art documents] [Patent documents]

[0004] [Patent Document 1] Japanese Patent Application Laid-Open No. 2006-194599 Summary of the Invention [Problem to be solved by the invention]

[0005] It is also generally known that peel strength varies depending on the peel angle. For this reason, there is a desire to measure peel strength at various peel angles, not just at a 90-degree peel angle. However, measuring peel strength at various peel angles through testing alone is extremely time-consuming and can lead to problems with measurement accuracy.

[0006] Therefore, the present invention provides a peel force estimation method, a peel force estimation program, and a peel test device that are capable of estimating peel forces at various peel angles using a simple technique. [Means for solving the problem]

[0007] A peel force estimation method according to one embodiment of the present invention is a peel force estimation method for estimating the peel force when a test film is attached to a substrate surface along the surface length direction of the substrate surface and one end of the test film that is away from the substrate surface is pulled to peel the test film from the substrate surface.The method includes the steps of measuring the peel force at a predetermined peel angle (hereinafter referred to as the actual measured angle), which is the angle between the test film and the substrate surface, using a peel test device and obtaining the measured value of the peel force, and calculating the peel force at a peel angle other than the actual measured angle using the measured value and a predetermined calculation formula that shows the relationship between the peel angle and the peel force.

[0008] In the step of calculating the peel force of the peel force estimation method, when the peel angle is θ [degrees], an equation including "1 / {(1-cosθ)sinθ}" may be used as the calculation formula for calculating the peel force.

[0009] In the step of calculating the peel force of the peel force estimation method, the peel angle is θ [degrees], the film width, which is the dimension of the test film in the film width direction intersecting the surface length direction, is L [mm], the adhesive force of the test film is γ [N / mm], and a predetermined constant smaller than 1 is n. Then, the calculated value F of the peel force corresponding to the peel angle θ is c The following formula (1) is used to calculate [N], and the measured angle is calculated as θ m [degrees], and the measured value is F m [N], the calculated value of the peel force F in the formula (1) c The measured value F m and the peel angle θ is replaced with the measured angle θ m The calculated value F of the peel force at the peel angle is calculated by the following equation (2) obtained by substituting the above equation (1) and the following equation (3) derived from the above equation (1). c may be calculated. F c =γL / {(1-cosθ)sinθ} n ···(1) F m =γL / {(1-cosθm ) sinθ m} n ···(2) F c =F m ·[{(1-cosθ m ) sinθ m} / {(1-cosθ)sinθ}] n ···(3)

[0010] In the peel force estimation method, the peel angle θ (degrees), the film width L (mm) which is the dimension of the test film in the film width direction intersecting the surface length direction, the adhesive force γ (N / mm) of the test film, a predetermined constant n less than 1, and the measured angle θ m [degrees], the actual measured value F m [N], and the calculated value of the peel force F c may satisfy the following equation (3): F c =F m ·[{(1-cosθ m ) sinθ m} / {(1-cosθ)sinθ}] n ···(3)

[0011] In the peel force estimation method, the measured angle θ m may be 90 degrees.

[0012] In the peel force estimation method, the constant n may be set to be smaller when the peel angle θ is an arbitrary angle θ2 larger than θ1 than when the peel angle θ is an arbitrary angle θ1.

[0013] In the peel force estimation method, when a predetermined threshold value is defined as α [degrees], if the peel angle θ is in the range of α≦θ<180, the calculated value F of the peel force at the peel angle is calculated by a correction formula that adds correction to the formula (3). c may be calculated.

[0014] In the peel force estimation method, the correction formula may be the following formula (4) in which the constant n in formula (3) is changed to a smaller constant n1 compared to when the peel angle θ is in the range of 0<θ<α. F c =F m ·[{(1-cosθ m ) sinθ m} / {(1-cosθ)sinθ}] n1 ···(4)

[0015] In the peel force estimation method, the threshold value α may satisfy 90≦α<180.

[0016] In the peel force estimation method, the constant n may satisfy 0.4≦n≦0.7, and the constant n1 may satisfy 0.1≦n1≦0.4.

[0017] A peel force estimation program according to one embodiment of the present invention functions as a means for measuring the peel force at a predetermined peel angle (hereinafter referred to as the actual measured angle), which is the angle between the test film and the adherend surface, using a peel test device, and acquiring the measured value of the peel force, and a means for calculating the peel force at a peel angle other than the actual measured angle using the measured value and a predetermined calculation formula showing the relationship between the peel angle and the peel force, in order to estimate the peel force when a test film is attached to a adherend surface along the surface length direction of the adherend surface and one end of the test film that is away from the adherend surface is pulled to peel the test film from the adherend surface.

[0018] A peel test apparatus according to one aspect of the present invention is an apparatus for peeling a test film from an adherend surface extending in a surface length direction by pulling one end of the test film that is separated from the adherend surface, with the test film attached to the adherend surface along the surface length direction, the apparatus comprising: an adherend that forms the adherend surface; a base supporting the adherend; a test film holder disposed on the base and holding the one end of the test film; a translatory moving body disposed on the base and moving the adherend linearly relative to the base in a vertical direction in which the adherend approaches and moves away from the test film holder; and a translatory moving body interposed between the translatory moving body and the adherend so as to be rotatable relative to the translatory moving body about a rotation center axis that intersects the surface length direction and the vertical direction and extends in a height direction that is the film width direction of the test film attached to the adherend surface. a load measuring device that measures the load in the vertical direction when the test film is peeled from the adherend surface; and a control device that acquires an output signal from the load measuring device and is capable of estimating by calculation the peel force for each peel angle, which is the angle between the test film and the adherend surface.The control device has an actual measurement value acquisition unit that acquires the actual measurement value of the peel force at a predetermined peel angle (hereinafter referred to as the actual measurement angle), which is the angle between the test film and the adherend surface, based on data actually measured by the load measuring device; a calculation formula memory unit that stores a predetermined calculation formula showing the relationship between the peel angle and the peel force; and a peel force calculation unit that uses the actual measurement value and the calculation formula to calculate the peel force at a peel angle other than the actual measurement angle. [Effects of the Invention]

[0019] According to the peel force estimation method, peel force estimation program, and peel test device described above, peel forces at various peel angles can be estimated by a simple method. [Brief explanation of the drawings]

[0020] [Figure 1] 1 is a top view of an entire peel test device used in a peel force estimation method according to an embodiment of the present invention. FIG. [Figure 2] FIG. 2 is an overall top view of the peel test device, showing a state in which peeling of the test film has progressed further from the state shown in FIG. 1. [Figure 3] 2 is an overall top view of the peel test device, showing a state in which the set angle N is changed from the state shown in FIG. 1. FIG. [Figure 4] FIG. 2 is a side view of the entire peel test device, taken along the arrow I in FIG. [Figure 5] 5A and 5B are schematic diagrams showing the movement of the slide movement mechanism when the peel angle of the peel test device is changed, where (a) shows the case where the set angle N is the angle shown in FIG. 1, and (b) shows the case where the set angle N is the angle shown in FIG. 3. [Figure 6] FIG. 2 is a functional block diagram of a control device in the peel test device. [Figure 7] FIG. 3 is a control flow diagram of a control device in the peel test device. [Figure 8] FIG. 2 is an overall top view of a peel test device according to a first modified example of the peel test device. [Figure 9] FIG. 10 is a schematic diagram showing a slide movement mechanism of a peel tester according to a second modified example of the peel tester. [Figure 10] FIG. 10 is an overall top view of a third modified example of the peel test device. [Figure 11] 1A and 1B are diagrams showing schematic diagrams of a distance model test device using a magnetic sheet in Experiment 1, where (a) shows the device when the magnetic sheet is long, and (b) shows the device when the magnetic sheet is short. [Figure 12] FIG. 1 is a diagram illustrating a general method for calculating peel force when peeling is performed at a constant peel angle. [Figure 13] 1A and 1B are diagrams showing schematic diagrams of the angle model test equipment using a magnet sheet in Experiment 1, where (a) shows the equipment when the peel angle is small, and (b) shows the equipment when the peel angle is large. [Figure 14] 1 is a graph showing the results of Experiment 1, illustrating a comparison between the actual measured values, the calculated values ​​of peel force using the distance model, and the calculated values ​​of peel force using the distance-angle model. [Figure 15] Regarding Experiment 1, these are schematic diagrams showing the peeling process to explain the cause of the error in the calculated peel force value, where (a) shows a diagram when the peel angle is small, and (b) shows a diagram when the peel angle is large. [Figure 16] 10 is a graph showing the results of a comparison between the measured and calculated values ​​of peel force in Experiment 2, where the peel speed was set to 30 mm / min. [Figure 17] 10 is a graph showing the results of a comparison between the measured and calculated values ​​of peel force in Experiment 2, where the peel speed was set to 100 mm / min. [Figure 18] 10 is a graph showing the results of a comparison between the measured and calculated values ​​of peel force in Experiment 2, where the peel speed was set to 300 mm / min. [Figure 19] 10 is a graph showing the results of a comparison between the measured and calculated values ​​of peel force in Experiment 2, where the peel speed is set to 1000 mm / min. [Figure 20] 10 is a graph showing the results of a comparison between the measured and calculated values ​​of peel force in Experiment 2, where the peel speed was set to 3000 mm / min. [Figure 21] 10 is a graph showing the results of a comparison between the measured and calculated values ​​of peel force in Experiment 3, where the substrate thickness of the test film is 25 μm. [Figure 22] 10 is a graph showing the results of a comparison between the measured and calculated values ​​of peel force in Experiment 3, where the substrate thickness of the test film is 50 μm. [Figure 23] 10 is a graph showing the results of a comparison between the measured and calculated values ​​of peel force in Experiment 3, where the substrate thickness of the test film is 75 μm. [Figure 24] 10 is a graph showing the results of a comparison between the measured and calculated values ​​of peel force in Experiment 3, where the substrate thickness of the test film is 100 μm. [Figure 25]10 is a graph showing simulated results of a constant-speed peel test in Experiment 4, obtained by plotting the results of the constant-speed tensile test on a single graph. DETAILED DESCRIPTION OF THE INVENTION

[0021] An embodiment of the present invention will be described in detail below with reference to the drawings. An example of a peel test device used in the peel force estimation method of this embodiment will be described below. However, in the peel force estimation method described in detail below, any test device that can measure peel force at any peel angle can be used without any particular limitation. (Test equipment) As shown in FIG. 1 , the peel test apparatus 100 measures the peel strength (peel strength) of a test film T attached to a substrate surface 1x by pulling one end Ta of the test film T, which is separated from the substrate surface 1x. The peel test apparatus 100 includes an adherend 1 forming the substrate surface 1x to which the test film T is attached, a base 2 supporting the adherend 1, a test film holder 3 holding the test film T on the base 2, a load measuring device 4 measuring the load applied when the test film T is peeled from the adherend 1, a linearly movable body 5 and a rotary support 6 interposed between the adherend 1 and the base 2, a sliding mechanism 7 for sliding the adherend 1 relative to the linearly movable body 5 and the rotary support 6, and a peel phenomenon measuring sensor 8 provided on the rotary support 6. The test film T is, for example, an adhesive tape, and the surface facing one side in the thickness direction of the tape is the adhesive surface B.

[0022] (adherent) The adherend 1 is rod- or plate-shaped and forms a planar adherend surface 1x extending in its longitudinal direction. The adhesive surface B of the test film T can be adhered to the adherend surface 1x. Hereinafter, the longitudinal direction of the adherend 1 is defined as the surface length direction D1 of the adherend surface 1x. The test film T is attached to the adherend surface 1x along this surface length direction D1.

[0023] (Base) The base 2 is disposed on one side of the adherend 1 in a height direction D2 that intersects with the surface length direction D1 and is a direction along the adherend surface 1x. The base 2 supports the adherend 1 movably and rotatably via a linear moving body 5 and a rotary support body 6, which will be described in detail later.

[0024] In this embodiment, the height direction D2 may be, for example, a direction along the vertical direction or a direction along the horizontal direction, and the usage posture of the peel test apparatus 100 is not particularly limited. However, in the following description, it is assumed that the height direction D2 is a direction along the vertical direction, i.e., the base 2 is located at the lowest position of the peel test apparatus 100.

[0025] (Test membrane holder) The test film holder 3 is disposed on one side in a vertical direction D3 intersecting the surface length direction D1 and the height direction D2, i.e., on the side facing the adherend surface 1x of the adherend 1 (upper side as one faces the paper in FIG. 1). The test film holder 3 is disposed on the base 2 on the other side (upper side) in the height direction D2 relative to the base 2, and is connected to a load measuring instrument 4, which will be described in detail later. The test film holder 3 has a planar holding surface 3a facing one side in the surface length direction D1 (right side as one faces the paper in FIG. 1). The test film T is chucked to the test film holder 3 with the adhesive surface B of one end Ta of the test film T attached to this holding surface 3a, so that the test film holder 3 holds one end Ta of the test film T (the end not attached to the adherend 1).

[0026] The test membrane holder 3 is movable relative to the base 2 in both directions in the vertical direction D3, and its position on the base 2 is adjustable.

[0027] The configuration of the test film holder 3 is not particularly limited, and it may hold one end Ta of the test film T by clamping the one end Ta of the test film T, or by attaching it without chucking or clamping.

[0028] (Load measuring device) The load measuring device 4 is disposed on the base 2 on one side of the test film holder 3 in the vertical direction D3 (upper side as viewed in FIG. 1 ), and is supported by the base 2. The load measuring device 4 measures the load applied to the test film holder 3, i.e., the load (tensile force) in the vertical direction D3 required to peel the test film T from the adherend 1, i.e., the peel force. The load measuring device 4 in this embodiment has a load cell (not shown). The load measuring device 4 is electrically connected to a control device 200 provided in the base 2. An output signal from the load measuring device 4 is transmitted to the control device 200, and the output data signal acquired from the load measuring device 4 is converted into a value of the load required for peeling (peeling force). The control device 200 converts the output from the load measuring device 4 into a load required for peeling the test film T, taking into account the biasing force of the biasing member 20 (the force used to slide the adherend 1), which will be described in detail later.

[0029] Although detailed illustration of the hardware configuration of the control device 200 is omitted, the control device 200 includes, for example, a CPU and storage means such as a ROM, a RAM, and a hard disk. The configuration of the load measuring device 4 is not particularly limited, and may be, for example, a strain gauge type, a piezoelectric type, a capacitance type, an electromagnetic type, a tuning fork type, or the like, that measures the load.

[0030] The control device 200 may automatically adjust the position of the test film holder 3 and the position of the one-end support portion 18 that supports the transmission member 16, which will be described in detail later.

[0031] (Straight-line moving object) The linear moving body 5 is disposed on the other side (upper side) in the height direction D2 with respect to the base 2, and relatively moves the adherent body 1 linearly in the vertical direction D3 with respect to the base 2. More specifically, a guide member 10 extending in the vertical direction D3 is provided on the base 2, and the linear moving body 5 engages with the guide member 10. Thereby, the linear moving body 5 can move closer to and away from the test film holder 3 in the vertical direction D3. The linear moving body 5 is moved by a drive mechanism (such as a motor or an actuator, not shown) provided on the base 2. At this time, the drive mechanism is controlled by the control device 200, so that the linear moving body 5 can move at an arbitrary speed and can stop at an arbitrary position.

[0032] As shown in FIG. 3, the rotation support body 6 is interposed between the linear moving body 5 and the adherent body 1, and supports the adherent body 1 so that the adherent body 1 can rotate around a rotation center axis O1 extending in the device height direction D2 with respect to the linear moving body 5 (and the base 2). In the present embodiment, the rotation center axis O1 is disposed on the adherent surface 1x of the adherent body 1 as viewed from the device height direction D2.

[0033] The rotation support body 6 can be fixed in a state of being rotated at an arbitrary angle by, for example, a stopper not shown. In the present embodiment, by rotating the rotation support body 6, an angle N formed by a partial region of the test film T attached to the adherent surface 1x and the remaining region of the test film T held by the test film holder 3 and separated from the adherent surface 1x can be set to an arbitrary angle within the range of 0 degrees < N ≤ 180 degrees. Hereinafter, the "formed angle N" is referred to as the set angle N. The set angle N is a value obtained by subtracting 180 degrees from the so-called "peeling angle θ", which is the angle formed by the test film T and the adherent surface 1x.

[0034] Here, a peeling position P on the substrate surface 1x at which the test film T is peeled from the substrate surface 1x is located near the rotation center axis O1 (within 10 mm of the rotation center axis O1 in a plan view seen from the direction of the rotation center axis O1), preferably on the rotation center axis O1. The operation of the rotating support 6 may be controlled by the control device 200, and the rotating support 6 may be automatically operated to reach the set angle N set (input) by the user, for example.

[0035] (Slide movement mechanism) The slide movement mechanism 7 slides the adherend 1 in the surface length direction D1 relative to the linear moving body 5. More specifically, the slide movement mechanism 7 has a direction changing member 15 provided on the rotary support 6, a transmission member 16 wound around the direction changing member 15, and a slider 17 provided on the rotary support 6 and holding the adherend 1 so that it can slide.

[0036] The direction-changing member 15 of this embodiment is a pulley (flat pulley) and is disposed about a direction-changing axis O2 extending in the height direction D2. In this embodiment, the direction-changing axis O2 is disposed coaxially with the rotation center axis O1, i.e., it is disposed on the adherend surface 1x of the adherend 1 when viewed from the height direction D2. Furthermore, when the direction-changing member 15 is viewed from the height direction D2, the direction-changing axis O2 is always located between one end 1a and the other end 1b of the adherend 1 in the surface length direction D1, that is, the direction-changing member 15 is disposed at a position such that the direction-changing axis O2 does not always extend beyond the adherend 1 in the surface length direction D1.

[0037] As shown in FIGS. 4 and 5, the pulley diameter d, which is the nominal diameter of the direction-changing member 15 (diameter of the surface that contacts the transmission member 16: diameter of the changing member), is preferably 30 mm or less.

[0038] The transmission member 16 is a linear member that is bendable. In this embodiment, the transmission member 16 is a single metal wire, and one end 16a of the transmission member 16 is supported on the side of the base 2. More specifically, the one end 16a of the transmission member 16 is supported by a one-end support portion 18 provided on the base 2. The one-end support portion 18 is movable on both sides in the vertical direction D3 relative to the base 2; that is, the one end 16a of the transmission member 16 is movable in the vertical direction D3, making it possible to adjust the tension of the transmission member 16.

[0039] The other end 16b of the transmission member 16 is supported on the side of the adherend 1. More specifically, the other end 16b of the transmission member 16 is supported by a other-end support part 11 provided on the adherend 1. The other-end support part 11 is provided on the adherend 1 at a position closer to one end 1a in the surface length direction D1, i.e., at a position closer to the other end Tb of the test film T attached to the adherend surface 1x.

[0040] Although detailed illustration is omitted, the slider 17 has, for example, a rail extending in the face length direction D1, and the adherend 1 engages with this rail to slide the adherend 1 relative to the rotating support 6.

[0041] Due to the configuration of the sliding movement mechanism 7 described above, as the linearly moving body 5 moves the adherend 1 toward the side away from the test film holder 3, the tension acting on the transmission member 16 is transmitted to the adherend 1, the adherend 1 is pulled in the surface length direction D1, and the adherend 1 slides toward the other side in the surface length direction D1 (the left side as you face the paper in FIG. 1) where the test film T peels off from the adherend surface 1x. That is, the adherend 1 slides in the direction from the state shown in FIG. 1 to the state shown in FIG. 2. Hereinafter, the sliding movement by the sliding mechanism 7 toward the side where the test film T peels off is defined as sliding movement toward the positive side.

[0042] During the sliding movement, the peeling position P of the test film T is kept constant without moving in the surface length direction D1 relative to the base 2, and moves only in the vertical direction D3 relative to the base 2. During the sliding movement of the adherend 1, the test film T is always maintained in a state of extending in the vertical direction D3 in the region between the test film holder 3 and the direction changing member 15.

[0043] As shown in FIGS. 5(a) and 5(b), the transmission member 16 has a holding-side region 160, which is the region between one end 16a (see FIG. 3) and the position where the one end 16a contacts the direction-changing member 15; a sliding-side region 161, which is the region between the other end 16b (see FIG. 3) and the position where the other end 16b contacts the direction-changing member 15; and a conversion-member-facing region 162, which is the region wound around the direction-changing member 15 between the holding-side region 160 and the sliding-side region 161. When the rotation support 6 rotates the adherend 1 to reduce the set angle N from N1 degrees to N2 degrees, which is smaller than N1 degrees, the length of the conversion-member-facing region 162 increases by Lo1. This change Lo1 is expressed as Lo1 = πd × (N1 - N2) / 360. Therefore, the one-end support portion 18 can adjust at least Lo1 toward the other side of the longitudinal direction D3 (downward in the plane of FIG. 1). Conversely, when the set angle N is increased by the rotating support 6, the length of the conversion member facing region 162 of the transmission member 16 decreases, and therefore the position of the one-end support portion 18 is adjusted to one side in the vertical direction D3 (upward toward the paper surface of Figure 1).

[0044] (biasing member) 1 and 2, a biasing member 20 is provided between the rotating support 6 and the adherend 1 to bias the adherend 1 against sliding movement of the adherend 1 toward the side (positive side) where the test film T peels off. That is, the biasing member 20 biases the adherend 1 toward the side opposite the positive side. In this embodiment, the biasing member 20 is, for example, a coil spring extending in the surface length direction D1. One end 20a of the biasing member 20 is supported by a one-end biasing support portion 12 provided on the adherend 1 at a position closer to the other end 1b, and the other end 20b of the biasing member 20 is supported in the surface length direction D1 by an other-end biasing support portion 6x provided on the rotating support 6 at a position between the one end 1a and the other end 1b of the adherend 1 in the surface length direction D1. In this embodiment, the biasing member 20 is a "tension spring" that generates a biasing force when stretched, but is not limited to this and may be, for example, a "compression spring" that generates a biasing force when pressed. When the biasing member 20 is a compression spring, one end 20a of the biasing member 20 is supported by the adherend 1 on the side closer to one end 1a of the adherend 1 with respect to the other end side biasing support portion 6x of the pivot support 6.

[0045] If the longitudinal direction D3 is aligned with the vertical direction, that is, if the linearly moving body 5 is moved in the vertical direction, the biasing force of the biasing member 20 becomes greater than the gravity acting on the adherend 1.

[0046] (peeling phenomenon measurement sensor) The peeling phenomenon measuring sensor 8 is a sensor that non-contactly measures a physical quantity that occurs at a peeling position P on the adherend surface 1x when the test film T is peeled from the adherend surface 1x. Specifically, the peeling phenomenon measuring sensor 8 is, for example, an electrostatic sensor that measures static electricity that occurs during peeling, an optical sensor (such as an image sensor) that measures light emission during peeling, or a temperature sensor that measures heat generation during peeling. The peeling phenomenon measuring sensor 8 is fixed to the rotating support 6 and is disposed opposite the peeling position P. The distance (linear distance) dp from the peeling phenomenon measuring sensor 8 to the peeling position P is kept constant regardless of the position of the adherend 1.

[0047] Next, a peel force estimation method for estimating the peel force using the above-described peel test device 100 will be described. The peel force estimation method is executed by the control device 200. That is, the control device 200 stores a peel force estimation program and executes the peel force estimation method based on this program. Specifically, as shown in FIG. 6, the control device 200 has an actual measurement value acquisition unit 201, a calculation formula storage unit 202, a peel angle determination unit 203, and a peel force calculation unit 204.

[0048] The actual measurement value acquisition unit 201 acquires the actual measurement value F of the peel force based on the data measured by the load measuring device 4. m Obtain and record [N].

[0049] The calculation formula storage unit 202 stores the peel angle θ and the peel force (hereinafter referred to as the calculated value F c The following formula (1) is stored as a predetermined formula showing the relationship between the F c =γL / {(1-cosθ)(sinθ)} n ···(1)

[0050] In the above formula (1), "θ" is the peel angle (degrees) which is the angle between the test film T and the adherend surface, "L" is the film width (mm) which is the dimension of the test film T in the film width direction (corresponding to the height direction D2) which intersects with the surface length direction D1, "γ" is the adsorptive force (N / mm) of the test film T, and "n" is a predetermined constant less than 1 which is a value that depends on the material and film thickness of the test film T. The constant n should be a value that satisfies 0.4≦n≦0.7, and in this embodiment is set to, for example, n=0.58.

[0051] The peel angle determination unit 203 determines which range of values ​​the peel angle θ of the peel force to be calculated falls within. That is, when a predetermined threshold is defined as α [degrees], it determines whether the peel angle θ falls within the range of 0<θ<α or the range of α≦θ<180.

[0052] The peel force calculation unit 204 calculates the actual peel force F mUsing the above formula (1), the actual measured value F m The peel angle at m ) Calculated peel force F c As will be described in detail later, depending on the determination result of the calculated peel angle determination unit 203, the peel force calculation unit 204 calculates the peel force F using an equation in which the constant n in the above equation (1) is changed to a constant n1. c Calculate.

[0053] Next, the flow of the peel force estimation method will be described. As shown in FIG. 7, first, the peel force is measured using a peel force tester 100, and the measured value F m In step S1, at least one peel angle θ (actual measured angle θ m The peeling angle θ when actually measured is not particularly limited, but for example, θ m =90 degrees should be selected.

[0054] Then, step S2 is executed to determine whether the peel angle θ of the peel force to be calculated satisfies 0<θ<α. The threshold value α should be a value that satisfies 90≦α<180, and in this embodiment, α is set to 90 degrees.

[0055] In step S2, if the peel angle θ of the peel force to be calculated is in the range of 0<θ<α, the determination is "YES" and the process proceeds to step S3.

[0056] In step S3, the calculated value F of the peel force in the above formula (1) is c The actual measured value F m Substitute the peel angle θ into the actual measured angle θ m Then, the calculated value of the peel force F is obtained by the following equation (3) derived from the above equations (1) and (2). c Calculate. F m =γL / {(1-cosθ m ) sinθ m} n ···(2) F c =F m ·[{(1-cosθ m ) sinθ m} / {(1-cosθ)sinθ}] n ···(3)

[0057] On the other hand, in step S2, if the peel angle θ of the peel force to be calculated is in the range of α≦θ<180, the result is determined as "NO" and the process proceeds to step S4. In step S4, the peel force F is calculated by the following calculation formula (4) obtained by substituting the constant n1, which is smaller than the constant n in the above formula (1) when the peel angle θ is in the range of 0<θ<α, for the constant n in the above formula (1). c The constant n1 is preferably a value that satisfies 0.1≦n1≦0.4, and in this embodiment, it is set to n1=0.2, for example. F c =γL / {(1-cosθ)(sinθ)} n1 ···(4)

[0058] In step S4, similarly to step S3, the calculated value F of the peel force is calculated in the above formula (4). c The actual measured value F m Substitute the peel angle θ into the actual measured angle θ m Then, the calculated peel force F is calculated using the following correction formula (6) derived from the above formulas (4) and (5). c Calculate. F m =γL / {(1-cosθ m ) sinθ m} n1 ···(5) F c =F m ·[{(1-cosθ m ) sinθ m} / {(1-cosθ)sinθ}] n1 ···(6) (Action and effect) According to the peel force estimation method of the present embodiment described above, by using a predetermined calculation formula such as the above formula (1), it is possible to obtain the actual measured value F m If you measure the actual angle θ mPeel force F at any peel angle θ other than c Therefore, the peel force at various peel angles can be estimated using a simple method.

[0059] In addition, by using the above formula (1) as a formula for calculating the peel force, the actual measured value F m The calculated value F is close to c It is possible to calculate

[0060] The actual peel force F m The measured angle θ m By setting the angle to 90 degrees, the measured values ​​F m and the measured angle θ m The above equation (2) obtained by substituting F m =γL, and as a result, the above formula (3) becomes the following formula (7), which makes it very easy to calculate the calculated value Fc of the peel force. F c =F m 1 / {(1-cosθ)sinθ} n ···(7)

[0061] Furthermore, when the peel angle θ is in the range of α≦θ<180, that is, when the peel angle θ is large, the elongation of the test film T may affect the actual measured value. In particular, when α is 90 degrees or more, the peel angle θ becomes an obtuse angle, and this tendency becomes more pronounced. If the above formula (1) is uniformly applied to all peel angles θ to calculate the peel force, the calculated value F c is the actual test result F m In this regard, the calculated peel force F can be corrected by the above formula (6). c By calculating the calculated value F c The actual measured value F m It is possible to approximate it by:

[0062] The present invention is not limited to the above-described embodiment, and it goes without saying that various modifications can be made without departing from the spirit of the present invention.

[0063] The above formulas (1) to (6) are merely examples and are not limited to the above cases. For example, formulas (4) to (6) are not limited to replacing the constant n in formulas (1) to (3) with n1, and the corrected calculated value F can be calculated by various formulas such as multiplying formulas (1) to (3) by a correction coefficient. cx It is also possible to calculate the amount of peeling F c The calculation process of F is not limited to the above case, and it is necessary to calculate F so as to ultimately satisfy the above formulas (3) and (6). c It is preferable that the following be calculated.

[0064] The peel test apparatus 100 is not limited to the above. For example, as shown in FIG. 8, the peel position P at which the test film T peels from the adherend surface 1x may be located at a position different from (away from) the rotation center axis O1. In this case, when the set angle N is reduced from N1 to N2, the test film T shortens by Lo2 and sags. However, by configuring the test film holder 3 to be movable at least in the vertical direction D3 by Lo2, the sag of the test film T can be easily corrected. Furthermore, when the set angle N is increased, the test film T becomes too taut, but the position of the test film T can be adjusted by moving the test film holder 3 in the same way.

[0065] Furthermore, the rotation center axis O1 of the rotating support 6 and the direction change axis O2 of the direction change member 15 do not necessarily have to be arranged coaxially, but it is preferable that the distance between the rotation center axis O1 and the direction change axis O2 be 5 mm or less. In this case, it is possible to minimize positional deviation (deflection or excessive tension) of the transmission member 16 when the set angle N is changed, and it becomes easy to adjust the position of the one-end support part 18 that supports one end 16a of the transmission member 16.

[0066] In addition, instead of adjusting the position of the one-end support portion 18 that supports one end 16a of the transmission member 16, or in addition to adjusting the position of the one-end support portion 18, the position of the other-end support portion 11 that supports the other end 16b of the transmission member 16 may be adjustable in the face length direction D1.

[0067] Not only a metal wire but also a linear member such as a fiber thread or a resin thread (fishing line) may be used for the transmission member 16. Also, not only a flat pulley but also other types of pulleys such as a V-pulley may be used for the direction change member 15.

[0068] Furthermore, as shown in Fig. 9, the transmission member 16A may be a timing belt and the direction changing member 15A may be a timing pulley. In this case, it is possible to control the position of the adherend 1 with high precision. Similarly, the transmission member 16A may be a chain and the direction changing member 15A may be a gear. Like the direction changing member 15 which is a pulley, the pitch circle diameter (diameter of the changing member) of the direction changing member 15A which is a timing pulley or gear is preferably 30 mm or less.

[0069] The peel phenomenon measuring sensor 8 may also be provided on the linearly moving body 5, but in this case, in order to keep the distance dp between the peel phenomenon measuring sensor 8 and the peel position P completely constant regardless of the position of the adherend 1, it is desirable that the peel position P be located near the rotation center axis O1, preferably on the rotation center axis O1. The peeling phenomenon measuring sensor 8 can also be applied to peeling test devices having slide movement mechanisms with configurations other than those described above, and the load when the test film T peels from the adherend surface 1x can be calculated from the physical quantity measured by the peeling phenomenon measuring sensor 8 without using the load measuring device 4.

[0070] In the above-described embodiment, the constant n in the above formulas (1) to (3) and the constant n1 in the above formulas (4) to (6) are set with the boundary being the case where the peel angle θ is equal to the threshold value α, thereby changing the exponent of each formula once with the threshold value α as the boundary, but for example, the constant n (exponent) may be changed multiple times as the peel angle θ changes. In other words, when an arbitrary peel angle θ1 and an arbitrary peel angle θ2 larger than the peel angle θ1 are selected, it is sufficient that the constant n for the peel angle θ2 is smaller than the constant n for the peel angle θ1.

[0071] In addition, the control device 200 calculates the actual peel force F at at least two points, for example, a peel angle smaller than the threshold value α and a peel angle larger than the threshold value α. m may be obtained and the constants n and n1 may be determined by curve fitting.

[0072] 10, the peel test apparatus 100A may be an apparatus that operates using a rack and pinion. Specifically, the slide movement mechanism 7A of the peel test apparatus 100A has a first conversion mechanism 62 that converts the linear motion of the linearly moving body 5 into rotational power and outputs it, a second conversion mechanism 64 that converts the rotational power output from the first conversion mechanism 62 into linear motion of the adherend 1 relative to the rotatable support 6 and the linearly moving body 5, and a transmission mechanism 66 that transmits the rotational power output from the first conversion mechanism 62 to the second conversion mechanism 64.

[0073] The first conversion mechanism 62 is composed of a first rack 62a, which is a linear gear arranged on the base 2 along the movement direction of the linear moving body 5, and a first pinion 62c, which is a gear that is rotatably arranged on the linear moving body 5 via a first rotation shaft 62b and meshes with the first rack 62a. The second conversion mechanism 64 is composed of a second rack 64a, which is a linear gear provided on the adherend 1 along the movement direction of the adherend 1 relative to the rotating support 6, and a second pinion 64c, which is a gear that is rotatably arranged on the rotating support 6 via a second rotating shaft 64b and meshes with the second rack 64a. The transmission mechanism 66 is a belt transmission mechanism and includes a first pulley 66a connected to the first rotating shaft 62b together with the first pinion 62c, a second pulley 66b connected to the second rotating shaft 64b together with the second pinion 64c, and a toothed belt (timing belt) 66c wound around the first pulley 66a and the second pulley 66b. The transmission mechanism 66 also has a tension pulley 66d that is linearly movable and disposed on the linear moving body 5 as a tension adjustment mechanism for the toothed belt 66c. The tension pulley 66d is provided on the linear moving body 5 via a guide rail 66e and a slider 66f, and its position on the linear moving body 5 relative to the first rotating shaft 62b and the second rotating shaft 64b is changeable. [Example]

[0074] Here, we will explain the peel simulation experiments that led to the above formulas (1) to (6). It is generally known that when an adhesive tape is peeled (peeled) while maintaining a constant peel angle θ, the peel force is proportional to "1 / (1-cosθ)". However, the inventors of the present invention found that the peel force is also related to a normal component force in a direction perpendicular to the adhesive surface of the adhesive tape, and conducted the following experiment 1.

[0075] [Step 1: Distance model] First, to simulate peeling, we considered a model (distance model) in which a non-bending magnet sheet 302 was attached to a rigid stainless steel substrate 301 as shown in Figures 11(a) and 11(b), one end 302a of the magnet sheet 302 in the extension direction was rotatably fixed to a fulcrum PF on the substrate 301, and the other end 302b of the magnet sheet 302 was pulled in a direction away from the substrate 301 with the peeling angle θ kept constant (90 degrees).

[0076] At this time, the adhesive force (magnetic force) of the magnet sheet 302 was changed by changing the distance from the fulcrum PF to the other end 302b of the magnet sheet 302, i.e., the length Lm, and the peel force F (peak value) was measured when the magnet sheet 302 with different lengths Lm was pulled. In this way, the difference in adhesive force due to the difference in length Lm of the magnet sheet 302 simulates the difference in the area of ​​the region where the flexible film is attached to the substrate 301 during peeling.

[0077] As shown in Figure 12, when a flexible film Tx is peeled off a rigid plane by a distance Δx at a peel angle θ, the end point Txa of the film Tx generally moves a distance s in the pulling direction (the direction of the arrow in Figure 12). In this case, the work Fs, which is the product of the film's pulling force F and the distance s, is given by the following equation (8). K is a physical property of the film and is a constant determined by the film width and the energy required to peel a unit area of ​​the film off the rigid plane. Fs=KΔx (8)

[0078] Here, the following equation (9) is derived from the geometric relationship between the distance s and Δx. s = Δx(1-cosθ) (9) The following equation (10) can be derived from the above equations (8) and (9), and it is generally known that the peel force (pulling force) F is proportional to "1 / (1-cosθ)". F = K / (1-cosθ) (10)

[0079] In this experiment 1, the actual measured values ​​F of the peeling force when 11 magnet sheets 302 with different lengths Lm were peeled from the substrate 301 were m The length Lm of the 11 magnet sheets 302 is as follows: Pattern 1: 61.45 (mm) Pattern 2: 39.75 mm Pattern 3: 28.00 (mm) Pattern 4: 19.40 (mm) Pattern 5: 14.50 (mm) Pattern 6: 11.10 (mm) Pattern 7: 10.00 (mm) Pattern 8: 9.70 (mm) Pattern 9: 8.60 (mm) Pattern 10: 7.45 (mm) Pattern 11: 6.45 (mm)

[0080] In Experiment 1, the length Lm of the magnet sheet 302 was standardized to obtain the standardized distance when the length Lm of the magnet sheet 302 was 11.10 mm (Pattern 6). That is, the length of the magnet sheet 302 was set to 11.10 mm (Pattern 6), and the standardized distances for each pattern are shown in Table 1 below. [Table 1]

[0081] When the normalized distance of the magnetic sheet 302 is "1" (pattern 6), the converted angle θ k [degrees] is assumed to be 90 degrees. k is the peel angle estimated from the normalized distance. Specifically, based on the above formula (10), the peel force F of the magnetic sheet 302 is assumed to be proportional to "1 / (1-cosθ)", and for each pattern, the peel angle θ is calculated (converted) as normalized distance = 1 / (1-cosθ), and this is used as the converted angle θ. k are listed in Table 1 above.

[0082] Here, the converted angle θ k Measured peel force F when = 90 degrees (Pattern 6) m F 90 Then, from the above equation (10), F 90 =K, so θ k When the angle is other than 90 degrees, that is, in the case of patterns 1 to 5 and 7 to 11, the calculated value of the peel force F is c is calculated by the following formula (11). F c =F 90 / (1-cosθ) (11) Then, using the above formula (11), the calculated peel force F for patterns 1 to 5 and 7 to 11 is c The calculated results are shown in Table 1 as Comparative Example 0-2.

[0083] [Step 2: Angle model] Furthermore, to simulate experiments using magnet sheet 302 under conditions even closer to peeling, a model (angle model) such as that shown in Figures 13(a) and 13(b) was devised. Specifically, the distance from fulcrum PF of the other end 302b of magnet sheet 302, i.e., the length of magnet sheet 302, was kept constant, and the other end 302b of magnet sheet 302 was pulled at various peel angles θ. This model verifies the difference in peel force (peak value) F due to differences in peel angle θ under the condition that the adhesive force of magnet sheet 302 is constant. The peel force (pulling force) F of magnet sheet 302 is calculated from the following equation (12) based on geometric relationships. Note that in equation (12) below, "M" represents the adhesive force [N] of magnet sheet 302. F=M / sinθ (12) From the above formula (12), it can be confirmed that the peel force F is also proportional to "1 / sinθ".

[0084] [Step 3: Distance-Angle Model] The inventors then considered that it would be possible to simulate the case where peeling is performed by changing the peel angle θ using a model (distance-angle model) that combines the distance model shown in Figures 11(a) and (b) and the angle model shown in Figures 13(a) and (b). Therefore, the length Lm and peel angle θ (converted angle θ) of the magnetic sheet 302 in each of the above patterns were calculated. k ) The actual measured peel force F obtained by performing tests under the conditions m is listed in Table 1 above as Comparative Example 0-1.

[0085] Furthermore, in the distance-angle model, which combines the distance model and the angle model, the peel force F is proportional to "1 / (1-cosθ)" and "1 / sinθ" based on the above equations (11) and (12), and the calculated value F of the peel force F is calculated using the following equation (13): c As mentioned above, K is a physical property of the film and is a constant determined by the film width and the energy required to peel a unit area of ​​the film from a rigid plane. F c =K / {(1-cosθ)sinθ} (13)

[0086] And the peel angle θ (converted angle θ k ) = 90 degrees (Pattern 6) m F 90 Then, from the above equation (13), F 90 =K, so when θ is an angle other than 90 degrees, that is, in the cases of patterns 1 to 5 and 7 to 11, the calculated peel force F is F c is calculated by the following formula (11). F c =F 90 / {(1-cosθ)sinθ}···(14) Then, using the above formula (14), the calculated peel force F for patterns 1 to 5 and 7 to 11 is c The calculated results are shown in Table 1 above as Example 0-1.

[0087] And the actual measured value F m (Comparative Example 0-1) and calculated value F c (Comparative Example 0-2) and calculated value F c As a result of comparison with Example 0-1, as shown in FIG. 14, which is a graph of Table 1, the calculated value F c The calculated value F in Example 0-1 is c is closer to the actual measured value F m In other words, by conducting Experiment 1, it was confirmed that it is preferable to calculate the peel force using Equation (14) rather than Equation (11) above.

[0088] [Step 4: Error correction] 15(a) and 15(b), in actual peeling, unlike the magnet sheet 302, the test film Tx deforms so as to be curved when peeled. Therefore, when a tensile force F is applied, the test film Tx deforms so as to be curved from the fulcrum PF, and the actual application point PAm of the tensile force F at this time is located at a position farther from the fulcrum PF than the calculated application point PAc, and the calculated value F of the peel force calculated by the above formula (14) c Rather than the actual measured value F m Therefore, the inventor came up with the idea of ​​raising the "{(1-cosθ)sinθ}" on the right side of the above formula (14) to the power of a predetermined constant n smaller than 1, and arrived at the above formulas (1) to (3).

[0089] Incidentally, this tendency for the actual point of action PAm to deviate from the calculated point of action PAc is more pronounced when the peel angle θ is large (for example, equal to or greater than 90 degrees) as shown in Figure 15(b) than when the peel angle θ is small (for example, smaller than 90 degrees) as shown in Figure 15(a). Therefore, the inventors came up with the idea of ​​raising "{(1-cosθ)sinθ}" on the right-hand side of the above equation (14) to the power of a predetermined constant n1 that is smaller than 1 and even smaller than the constant n when the peel angle θ is large, and arrived at the above equations (4) to (6).

[0090] (Experiment 2) Next, the calculated peel force F calculated using the above formulas (1) to (3) c , and the calculated peel force F calculated using the above formulas (4) to (6) when the peel angle θ is in the range of 90≦θ<180. c (The following is the corrected calculated value F cx ) is the actual measured value F of a constant speed peel test using a peel tester. m The results of Experiment 2 compared with the above are explained below.

[0091] <Experimental conditions> The test film was a 25 μm thick PET resin substrate with a 30 μm thick adhesive. The peel speed was as follows: Five patterns (comparative examples), and for each of the five comparative examples, tests were performed at peel angles of 30°, 45°, 60°, 75°, 90°, 105°, 120°, 135°, 150°, 165°, and 175°. Comparative Example 1-1: Peeling speed 30 [mm / min] Comparative Example 1-2: Peeling speed 100 [mm / min] Comparative Example 1-3: Peeling speed 300 [mm / min] Comparative Example 1-4: Peeling speed 1000 [mm / min] Comparative Example 1-5: Peeling speed 3000 [mm / min]

[0092] <Calculated value> Examples corresponding to the above comparative examples are as follows. In the following examples, the constant n in the above formula (1) is set to 0.58, and the calculated value F of the peel force for each peel angle is c The measured value F was substituted into the above formula (1) m is the value when the peel angle θ is 90 degrees. Example 1-1: Peeling speed 30 [mm / min] Example 1-2: Peeling speed 100 [mm / min] Example 1-3: Peeling speed 300 [mm / min] Example 1-4: Peeling speed 1000 [mm / min] Example 1-5: Peeling speed 3000 [mm / min]

[0093] <Calculated value after correction> In the following examples, when the peel angle θ is in the range of 90≦θ<180, the constant n1 in the above formula (4) is set to 0.2, and the corrected calculated value F of the peel force for each peel angle is calculated. cx In addition, when the peel angle θ is in the range of 0<θ<90, the calculated peel force F was calculated using the above formula (1) with the constant n = 0.58. c Therefore, in this range, the corrected calculated value F cx is the calculated value F c Matches. Example 1-6: Peeling speed 30 [mm / min] Example 1-7: Peeling speed 100 [mm / min] Example 1-8: Peeling speed 300 [mm / min] Example 1-9: Peeling speed 1000 [mm / min] Example 1-10: Peeling speed 3000 [mm / min]

[0094] Furthermore, in the following examples, when the peel angle θ is in the range of 90≦θ<180, the constant n1 in the above formula (4) is set to 0.2, and the right side of formula (4) is multiplied by a correction coefficient β of 0.9 to obtain the corrected calculated value F of the peel force for each peel angle using the following formula (7). cx´ In addition, when the peel angle θ is in the range of 0<θ<90, the calculated peel force F was calculated using the above formula (1) with the constant n = 0.58. c Therefore, in this range, the corrected calculated value F cx´ is the calculated value F c Matches. F c =γL / {(1-cosθ)(sinθ)} 0.2 ×0.9 (4) Example 1-11: Peeling speed 30 [mm / min] Example 1-12: Peeling speed 100 [mm / min] Example 1-13: Peeling speed 300 [mm / min] Example 1-14: Peeling speed 1000 [mm / min] Example 1-15: Peeling speed 3000 [mm / min]

[0095] FIG. 16 shows the values ​​for Comparative Example 1-1, Example 1-1, Example 1-6, and Example 1-11 at a peel speed of 30 mm / min for each peel angle. FIG. 17 shows the values ​​for Comparative Example 1-2, Example 1-2, Example 1-7, and Example 1-12 at a peel speed of 100 mm / min for each peel angle. FIG. 18 shows the values ​​for Comparative Example 1-3, Example 1-3, Example 1-8, and Example 1-13 at a peel speed of 300 mm / min for each peel angle. FIG. 19 shows the values ​​for Comparative Example 1-4, Example 1-4, Example 1-9, and Example 1-14 at a peel speed of 1000 mm / min for each peel angle. FIG. 20 shows the values ​​for Comparative Example 1-5, Example 1-5, Example 1-10, and Example 1-15 at which the peel speed is 3000 [mm / min] for each peel angle.

[0096] <Comparative study> As shown in Figures 16 to 20, at any peeling speed, the calculated value F c is the actual measured value F m However, when the peel angle θ is in the range of 90≦θ<180, the calculated value F after correction using the above formula (4) cx By calculating the calculated value F c Compared to the corrected calculated value F cx It was confirmed that the calculated value Fm after correction using the above formula (7) is closer to the measured value Fm. cx´ By calculating the corrected calculated value F cx Compared to the corrected calculated value F cx´ The actual measured value F m It was confirmed that it was closer to

[0097] (Experiment 3) Next, the results of Experiment 3, in which a peeling experiment similar to Experiment 2 above was conducted with the peeling speed kept constant and the thickness of the test film varied, will be described.

[0098] <Experimental conditions> The peeling speed was a constant 300 mm / min, and the thickness of the test film was as follows: Comparative Example 2-1: 25 μm thick substrate + 30 μm thick adhesive Comparative Example 2-2: 50 μm thick substrate + 30 μm thick adhesive Comparative Example 2-3: 75 μm thick substrate + 30 μm thick adhesive Comparative Example 2-4: 100 μm thick substrate + 30 μm thick adhesive

[0099] <Calculated value> Examples corresponding to the above comparative examples are as follows. In the following examples, the constant n in the above formula (1) is set to 0.58, and the calculated value F of the peel force for each peel angle is c The measured value F was substituted into the above formula (1) m is the value when the peel angle θ is 90 degrees. Example 2-1: 25 μm thick substrate + 30 μm thick adhesive Example 2-2: 50 μm thick substrate + 30 μm thick adhesive Example 2-3: 75 μm thick substrate + 30 μm thick adhesive Example 2-4: 100 μm thick substrate + 30 μm thick adhesive

[0100] <Calculated value after correction> In the following examples, when the peel angle θ is in the range of 90≦θ<180, the constant n1 in the above formula (4) is set to 0.2, and the corrected calculated value F of the peel force for each peel angle is calculated. cx In addition, when the peel angle θ is in the range of 0<θ<90, the calculated peel force F was calculated using the above formula (1) with the constant n = 0.58. c Therefore, in this range, the corrected calculated value F cx is the calculated value F c Matches. Example 2-5: 25 μm thick substrate + 30 μm thick adhesive Example 2-6: 50 μm thick substrate + 30 μm thick adhesive Example 2-7: 75 μm thick substrate + 30 μm thick adhesive Example 2-8: 100 μm thick substrate + 30 μm thick adhesive

[0101] FIG. 21 shows the values ​​for Comparative Example 2-1, Example 2-1, and Example 2-5, where the substrate thickness is 25 μm, for each peel angle. FIG. 22 shows the values ​​for Comparative Example 2-2, Example 2-2, and Example 2-6, where the substrate thickness is 50 μm, for each peel angle. FIG. 23 shows the values ​​for Comparative Example 2-3, Example 2-3, and Example 2-7, where the substrate thickness is 75 μm, for each peel angle. FIG. 24 shows the values ​​for Comparative Example 2-4, Example 2-4, and Example 2-8, where the substrate thickness is 100 μm, for each peel angle.

[0102] <Comparative study> As shown in Figures 21 to 24, the calculated value F according to the above formula (1) was c is the actual measured value F m However, when the peel angle θ is in the range of 90≦θ<180, the calculated value F after correction using the above formula (4) cx Calculate the value F by calculating c Compared to the corrected calculated value F cx The actual measured value F m It was confirmed that the equation can be approximated by

[0103] (Experiment 4) Next, we will explain Experiment 4, in which a constant-speed peel test was simulated by conducting a constant-speed tensile test for peeling in the following seven patterns, and the above formulas (1) and (4) were verified based on the results.

[0104] <Experimental conditions> As a test film, cellophane tape (tape width 18 mm, tape thickness 0.05 mm) was attached to a SUS304 substrate, and a constant-speed tensile peel test was performed for each of the following patterns. Pattern 1: Peel speed 0.67 mm / s, peel angle 30 degrees Pattern 2: Peel speed 1.45 mm / s, peel angle 45 degrees Pattern 3: Peel speed 2.5 mm / s, peel angle 60 degrees Pattern 4: Peel speed 5.0 mm / s, peel angle 90 degrees Pattern 5: Peel speed 7.5 mm / s, peel angle 120 degrees Pattern 6: Peel speed 8.54 mm / s, peel angle 135 degrees Pattern 7: Peel speed 9.33 mm / s, peel angle 150 degrees

[0105] <Experimental Results> The actual peel force F obtained in each of the above patterns m The results of plotting these on a single graph are shown in Figure 25. Figure 25 shows the results of simulating a constant speed peel test with a peel speed of 5 mm / s. From Figure 19, it was confirmed that the peel force was smallest when the peel angle θ was 120 degrees. In this regard, the calculated peel force F c is minimized, the calculated value F c It is considered possible to calculate the above without any problems. [Industrial Applicability]

[0106] According to the peel force estimation method of the present invention, peel forces at various peel angles can be estimated by a simple method. [Explanation of symbols]

[0107] 1...Adherend 1x...Surface to be adhered to 2...Foundation 3...Test membrane holder 3a…Holding surface 4...Load measuring device 5...Straight moving object 6...Rotating support 7...Slide movement mechanism 8...Sensor for measuring peeling phenomenon 11...Other end side support part 15, 15A...Direction change member 16, 16A...Transmission member 18...One end support part 20... Urging member 100...Peel test device 200...Control device 201...Actual measurement value acquisition unit 202…Calculation formula storage unit 203...Peeling angle determination unit 204...Peeling force calculation unit D1: Face length direction D2: Height direction D3: Vertical O1: Rotation center axis O2: Direction change axis P…Peeling position T...Test membrane

Claims

1. A peel force estimation method for estimating a peel force when a test film is attached to a surface to be adhered along the surface length direction of the surface to be adhered, and one end of the test film separated from the surface to be adhered is pulled to peel the test film from the surface to be adhered, comprising: a step of measuring the peel force at a predetermined peel angle (hereinafter referred to as an actual measurement angle) between the test film and the adherend surface using a peel test device, and acquiring the actual measurement value of the peel force; calculating a peel force at a peel angle other than the actually measured angle using the actually measured value and a predetermined calculation formula that indicates the relationship between the peel angle and the peel force; A peel force estimation method comprising:

2. 2. The peel force estimation method according to claim 1, wherein in the step of calculating the peel force, an equation including "1 / {(1-cos θ) sin θ}" is employed as the calculation formula for calculating the peel force, where θ is the peel angle (degrees).

3. In the step of calculating the peel force, The peel angle is θ [degrees], the film width, which is the dimension of the test film in the film width direction intersecting the surface length direction, is L [mm], the adhesive force of the test film is γ [N / mm], and a predetermined constant smaller than 1 is n. The calculated value F of the peel force corresponding to the peel angle θ is ｃ The following formula (1) is used as the calculation formula for calculating [N], and The measured angle is θ ｍ [degrees], and the measured value is F ｍ [N], the calculated value of the peel force F in the formula (1) ｃ The actual measured value F ｍ and the peel angle θ is replaced with the measured angle θ ｍ The calculated value F of the peel force at the peel angle is calculated by the following equation (2) obtained by substituting the above equation (1) and the following equation (3) derived from the above equation (1). ｃ The peel force estimation method according to claim 1 , wherein the following equation is calculated: F ｃ =γL / {(1-cosθ)sinθ} ｎ ・・・(1) F ｍ =γL / {(1-cosθ ｍ )sinθ ｍ } ｎ ・・・(2) F ｃ =F ｍ ・[{(1-cosθ ｍ )sinθ ｍ } / {(1-cosθ)sinθ}] ｎ ・・・(3)

4. The peel angle θ (degrees), the film width L (mm) which is the dimension of the test film in the film width direction intersecting the surface length direction, the adsorption force γ (N / mm) of the test film, a predetermined constant n less than 1, and the measured angle θ ｍ [degrees], the actual measured value is F ｍ [N], and the calculated value of the peel force F ｃ The peel force estimation method according to claim 1 , wherein the following formula (3) is satisfied: F ｃ =F ｍ ・[{(1-cosθ ｍ )sinθ ｍ } / {(1-cosθ)sinθ}] ｎ ・・・(3)

5. The measured angle θ ｍ 5. The peel force estimation method according to claim 3, wherein the angle is 90 degrees.

6. 5. The peel force estimation method according to claim 3, wherein the constant n is set to be smaller when the peel angle θ is an arbitrary angle θ2 larger than θ1 than when the peel angle θ is an arbitrary angle θ1.

7. When the predetermined threshold value is defined as α [degrees], if the peel angle θ is in the range of α≦θ<180, the calculated value F of the peel force at the peel angle is calculated by a correction formula obtained by adding correction to the formula (3). ｃ The peel force estimation method according to claim 3 or 4, wherein the following is calculated:

8. The peel force estimation method according to claim 7, wherein the correction formula is the following formula (4) in which the constant n in formula (3) is changed to a smaller constant n1 compared to when the peel angle θ is in the range of 0 < θ < α: F ｃ =F ｍ ・[{(1-cosθ ｍ )sinθ ｍ } / {(1-cosθ)sinθ}] ｎ１ ・・・(4)

9. The peel force estimation method according to claim 7 , wherein the threshold value α satisfies 90≦α<180.

10. The peel force estimation method according to claim 8, wherein the constant n satisfies 0.4≦n≦0.7, and the constant n1 satisfies 0.1≦n1≦0.

4.

11. A computer is configured to estimate a peel force when a test film is attached to a surface to be adhered along the surface length direction of the surface to be adhered and one end of the test film separated from the surface to be adhered is pulled to peel the test film from the surface to be adhered, a means for measuring the peel force at a predetermined peel angle (hereinafter referred to as the actual measurement angle) between the test film and the adherend surface using a peel test device, and acquiring the actual measurement value of the peel force; and a means for calculating the peel force at a peel angle other than the actually measured angle using the actually measured value and a predetermined calculation formula showing the relationship between the peel angle and the peel force; A peel force estimation program that functions as a

12. A peel test device for peeling a test film from an adherend surface by pulling one end of the test film that is separated from the adherend surface, the end being attached along the length of the adherend surface, the device comprising: an adherend that forms the adherend surface; a base for supporting the adherend; a test membrane holder disposed on the base and holding the one end of the test membrane; a linear moving body disposed on the base and configured to linearly move the adherend relative to the base in a vertical direction in which the adherend approaches and moves away from the test membrane holder; a rotary support interposed between the linearly moving body and the adherend, which allows the adherend to rotate relative to the linearly moving body about a rotary center axis that intersects the surface length direction and the longitudinal direction and extends in a height direction that is the membrane width direction of the test membrane attached to the adherend surface; a slide movement mechanism that slides the adherend in the surface length direction relative to the linearly moving body and the rotary support; a load measuring device for measuring the load in the vertical direction when the test film is peeled off from the adherend surface; a control device that acquires an output signal from the load measuring device and is capable of estimating by calculation the peel force for each peel angle, which is the angle between the test film and the adherend surface; Equipped with The control device a measurement value acquisition unit that acquires a measurement value of the peel force at a predetermined peel angle (hereinafter referred to as the measurement angle) that is the angle between the test film and the adherend surface based on data measured by the load measuring device; and a calculation formula storage unit that stores a predetermined calculation formula that indicates the relationship between the peel angle and the peel force; a peel force calculation unit that calculates the peel force at the peel angle other than the actual measurement angle using the actual measurement value and the calculation formula; A peel test device having:

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