Impact tester, impact test method, abnormality detector, and refractory thickness measurement method

Abstract

To provide an impact tester and an impact test method which can detect an abnormality of an impactor, an abnormality detector for the impactor, and a refractory thickness measurement method.SOLUTION: An impact tester of executing an impact test for an impact test object comprises: an impactor for vibrating the impact test object by impact; a surface wave receiver for measuring a surface wave signal generated in a surface of the impact test object by the vibration by the impact of the impactor; and a calculation device for collecting data on the surface wave signal measured by the surface wave receiver and calculating the collected data. The calculation device detects an abnormality of the impactor based on indicators of a normal state extracted from temporal changes of a waveform of the surface wave signal measured by the surface wave receiver.SELECTED DRAWING: Figure 2

Description

[Technical Field]

[0001] The present invention relates to an impact testing device and an impact testing method used, for example, to measure the thickness of furnace refractories, as well as an abnormality detection device for the impact device and a refractory thickness measurement method. [Background technology]

[0002] The furnace walls of industrial furnaces, such as blast furnaces, typically have a multi-layer structure consisting of, from the outside, a steel shell, monolithic refractories, and the primary refractory material, firebricks. The innermost firebricks wear away from the core, and cracks inside the firebricks shorten the furnace's lifespan. Therefore, measuring the thickness of the firebricks and clarifying their internal condition are extremely important for furnace maintenance. The hearth of a blast furnace, in particular, is constantly exposed to molten iron, even during refrigeration shutdowns, and therefore suffers from severe wear. Furthermore, direct repair is impossible during the decades the furnace is in operation. Accurately measuring the thickness of the refractory material during operation and clarifying the internal condition of the firebricks can enable the detection of abnormalities during operation, the optimization of furnace operation to extend the furnace's lifespan, and the accurate prediction of furnace lifespan and refurbishment timing.

[0003] As a method for measuring the thickness of refractory, Patent Document 1 describes a method for measuring the thickness of refractory by an impact elastic wave resonance method. The method described in Patent Document 1 involves frequency analysis of the measured signal and converting the peak frequency into the remaining thickness of the brick. [Prior art documents] [Patent documents]

[0004] [Patent Document 1] Japanese Patent Application Publication No. 8-219751 Summary of the Invention [Problem to be solved by the invention]

[0005] In the impact acoustic wave resonance method, the frequency characteristics of the input signal must correspond to the expected frequency band of the received signal, but the hammer used as the input device for the impact acoustic wave resonance method becomes deformed or damaged as measurements continue, causing changes in the frequency characteristics and excitation force. However, the method described in Patent Document 1 does not take into account changes in the frequency characteristics and excitation force of the impact device, and as measurements are repeated, the upper limit frequency of the input signal decreases, preventing the appearance of a peak corresponding to the remaining thickness, making it impossible to measure the remaining thickness.

[0006] Therefore, the present invention provides an impact testing device and an impact testing method that can detect an abnormality in an impact device, as well as an impact device abnormality detection device and a refractory thickness measurement method. [Means for solving the problem]

[0007] In order to solve the above problems, the present invention provides the following [1] to

[15] .

[0008] [1] An impact test device for performing an impact test on an impact test object, an impact device that impacts the impact test object to vibrate; a surface wave receiving device that measures a surface wave signal generated on the surface of the impact test object by vibration caused by impact of the impact device; a computing device that collects data of the surface wave signals measured by the surface wave receiving device and calculates the collected data; and The computing device detects an abnormality in the impact device based on an index of a normal state extracted from a time change in the waveform of the surface wave signal measured by the surface wave receiving device.

[0009] [2] The computing device is The impact testing device according to [1], wherein the index is the distance attenuation characteristic of the maximum amplitude of the surface wave measured by the surface wave receiving device.

[0010] [3] The surface wave receiving device includes a first surface wave detecting unit that detects surface waves at a first detection position that is a first distance from a position where the impact test object is impacted by the impact device, and a second surface wave detecting unit that detects surface waves at a second detection position that is a second distance from the impact position, The computing device a normal state index acquiring unit that detects a maximum amplitude of the surface waves measured by the first surface wave detecting unit and the second surface wave detecting unit when the impact device hits the impact test object at a predetermined impact speed in a normal state, and acquires the distance attenuation characteristic calculated from the maximum amplitude of the surface waves, the first distance, and the second distance as an index of the normal state; a storage unit that stores the distance attenuation characteristic in association with a set collision speed between the impact unit of the impact device and the impact test object; an abnormality detection unit that sets a threshold value for the maximum amplitude of the surface wave generated by the impact device in a normal state, which is predicted from the distance attenuation characteristics, at a third distance between an impact position when the impact test object is impacted at the impact speed by the impact device in an unknown state and the first detection position or the second detection position, and compares the maximum amplitude of the surface wave generated by the impact device in an unknown state with the threshold value to detect an abnormality; The impact test device according to [2],

[0011] [4] The impact test device described in [3], further comprising an abnormality prediction unit that calculates the time when an abnormality will occur in the impact device based on the time progression of the maximum amplitude of the surface wave when the impact device, the state of which is unknown, is caused to impact the impact test object at the collision speed.

[0012] [5] The impact testing device described in [4], wherein the arithmetic device further has a function setting unit that selects whether to execute processing by the normal state index acquisition unit or by the abnormality detection unit.

[0013] [6] The impact test device according to any one of [1] to [5], wherein the object to be impact tested has a refractory material, and the thickness of the refractory material is measured by vibrating the object to be impact tested.

[0014] [7] The impact testing device according to [6], wherein the thickness of the refractory material is measured by an impact elastic wave resonance method.

[0015] [8] A method for performing a hit test on a hit test object, comprising: vibrating the impact test object by impacting it with an impact device; measuring a surface wave signal generated on the surface of the impact test object by vibration caused by impact of the impact device with a surface wave receiving device; acquiring and storing an index of a normal state extracted from a time change in the waveform of the surface wave signal measured by the surface wave receiving device; Detecting an abnormality in the impact device based on the indicator; The impact test method has the following features.

[0016] [9] An impact test device that performs an impact test by vibrating an impact test object by impacting it with an impact device and measuring a surface wave signal generated on the surface of the impact test object by the impact vibration of the impact device with a surface wave receiving device, and an abnormality detection device that detects an abnormality in the impact device, An abnormality detection device that collects data on the surface wave signal measured by the surface wave receiving device, calculates the collected data, and detects an abnormality in the impact device based on an index of a normal state extracted from the change over time in the waveform of the surface wave signal measured by the surface wave receiving device.

[0017]

[10] The anomaly detection device according to [9], wherein the index is the distance attenuation characteristic of the maximum amplitude of the surface wave measured by the surface wave receiving device.

[0018]

[11] The surface wave receiving device includes a first surface wave detecting unit that detects surface waves at a first detection position that is a first distance from a position of impact by the impact device on the impact test object, and a second surface wave detecting unit that detects surface waves at a second detection position that is a second distance from the position of impact, a normal state index acquiring unit that detects a maximum amplitude of the surface waves measured by the first surface wave detecting unit and the second surface wave detecting unit when the impact device hits the impact test object at a predetermined impact speed in a normal state, and acquires the distance attenuation characteristic calculated from the maximum amplitude of the surface waves, the first distance, and the second distance as an index of the normal state; a storage unit that stores the distance attenuation characteristic in association with a set collision speed between the impact unit of the impact device and the impact test object; an abnormality detection unit that sets a threshold value for the maximum amplitude of the surface wave generated by the impact device in a normal state, which is predicted from the distance attenuation characteristics, at a third distance between an impact position when the impact test object is impacted at the impact speed by the impact device in an unknown state and the first detection position or the second detection position, and compares the maximum amplitude of the surface wave generated by the impact device in an unknown state with the threshold value to detect an abnormality;

[10] The anomaly detection device according to

[10] .

[0019]

[12] The anomaly detection device described in

[11] , further comprising an anomaly prediction unit that calculates the time when an abnormality will occur in the impact device based on the change over time in the maximum amplitude of the surface wave when the impact device, the state of which is unknown, is struck against the impact test object at the collision speed.

[0020]

[13] The abnormality detection device according to

[12] , further comprising a function setting unit for selecting whether to execute processing by the normal state index acquisition unit or by the abnormality detection unit.

[0021]

[14] A method for measuring the thickness of a refractory material, comprising: vibrating an impact test object having a refractory material using the impact test apparatus according to any one of [1] to [5] above; and measuring the thickness of the refractory material.

[0022]

[15] The method for measuring the thickness of a refractory material according to

[14] , wherein the thickness of the refractory material is measured by an impact elastic wave resonance method. [Effects of the Invention]

[0023] According to the present invention, an impact test device and an impact test method capable of detecting an abnormality in an impact device, as well as an impact device abnormality detection device and a refractory thickness measurement method are provided. This allows for rapid detection of deterioration of the impact device and prevents measurement errors caused by deterioration of the impact device during an impact test. Furthermore, because the method uses surface waves generated by the impact device, it is possible to detect deterioration of impact devices that do not output signals like test hammers. [Brief explanation of the drawings]

[0024] [Figure 1] 1 is a functional block diagram showing an impact test device according to a first embodiment of the present invention. [Figure 2] 10 is a diagram showing an example of the positional relationship between the striking position of a normal striking device and the first and second surface wave detecting units in a surface wave receiving device. FIG. [Figure 3] FIG. 4 is a diagram illustrating an example of time signals of surface waves measured by each surface wave detector. [Figure 4] 10 is a diagram showing an example of a relationship between the distance between the impact position of an impact device that performs abnormality detection and a surface wave detection unit and the amplitude of a surface wave; FIG. [Figure 5] 10 is a diagram showing an example of the positional relationship between the impact position of an impact device that performs abnormality detection and a surface wave detection unit. FIG. [Figure 6] 10 is a diagram showing an example of the relationship between the distance attenuation characteristic output by the distance attenuation characteristic calculation unit, the distance d3, and the predicted amplitude value a3 of the surface wave measured by the surface wave detection unit. FIG. [Figure 7] FIG. 10 is a diagram showing an example of a time signal of a surface wave output by a surface wave detection unit when a striking test object is struck at a collision velocity v using a striking unit of a striking device that has softened due to deterioration. [Figure 8] 10 is a flowchart illustrating an example of the flow of a control process of the anomaly detection device. [Figure 9] FIG. 5 is a functional block diagram showing an impact test device according to a second embodiment of the present invention. [Figure 10] FIG. 10 is a diagram showing an example of the time progression of the maximum amplitude of the surface wave detected by the maximum surface wave detecting unit when the impact test object is impacted multiple times at a collision speed v using the impact unit of the impact device. [Figure 11] 1 is a schematic diagram showing an example of a usage mode of an abnormality detection device 1A in an impact test device 10 according to a first embodiment. [Figure 12] FIG. 10 is a diagram showing an example of a surface wave measured when striking a refractory material to measure its thickness by an impact acoustic wave resonance method. DETAILED DESCRIPTION OF THE INVENTION

[0025] Hereinafter, an embodiment of the present invention will be described with reference to the accompanying drawings.

[0026] First Embodiment [Overall configuration] FIG. 1 is a functional block diagram showing an impact testing device according to a first embodiment of the present invention. The impact testing device 10 measures the thickness of refractory materials in industrial furnaces such as blast furnaces, and includes an abnormality detection device 1A, an impact device 2, a surface wave receiving device 3, and a control device 4.

[0027] [Percussion Device 2] The impact device 2 has a drive unit 201 and an impact unit 202. The drive unit 201 drives the impact unit 202. The impact unit 202 may be, for example, a plastic hammer for work that does not output a vibration signal.

[0028] [Surface wave receiving device 3] The surface wave receiving device 3 measures the surface waves generated on the surface of the impact test object by impact with the impact device 2, and has a first surface wave detecting unit 301 and a second surface wave detecting unit 302 that detect surface waves generated from the impact position of the impact test object by the impact device 2 at different positions.

[0029] [Control device 4] The control device 4 controls the operation of the abnormality detection device 1A and the impact device 2, and has an input unit 401, a speed setting unit 402 that sets the collision speed between the impact unit 202 and the impact test object, a trigger unit 403 that triggers the drive unit 201 to impact, a position setting unit 404 that sets the impact position of the impact device 2, and a function selection unit 405 that selects the functions of the abnormality detection device 1A.

[0030] [Anomaly detection device 1A] The abnormality detection device 1A collects data of the surface wave signal measured by the surface wave receiving device 3 and performs calculations on the collected data. The abnormality detection device 1A also detects an abnormality in the impact device 2 using an index extracted from a change over time in the waveform of the surface wave signal measured by the surface wave receiving device 3. As shown in FIG. 1 , the abnormality detection device 1A includes a function setting unit 101, a normal state index acquisition unit 102, an abnormality detection processing unit 103, and a storage unit 104, and functions as a calculation device. The abnormality detection device 1A may be part of the calculation device.

[0031] 1, the anomaly detection device 1A is configured independently of the control device 4, but this is not limiting, and the anomaly detection device 1A and the control device 4 may be configured as a single device. For example, the anomaly detection device 1A and the control device 4 may be configured as a personal computer (PC) or the like.

[0032] (Function setting unit 101) The function setting unit 101 selects whether to execute processing by the normal state index acquiring unit 102 or by the abnormality detection processing unit 103, depending on the information received from the control device 4. Details of the normal state index acquiring unit 102 and the abnormality detection processing unit 103 will be described below.

[0033] (Normal state index acquisition unit 102) The normal state index acquiring unit 102 acquires, as an index of the normal state of the impact device 2, an index extracted from a time change in the waveform of the surface wave signal measured by the surface wave receiving device 3 when the impact device 2 impacts the impact test object at the impact speed specified by the speed setting unit 402. Specifically, the normal state index acquiring unit 102 acquires (calculates) a distance attenuation characteristic as the index from the maximum amplitude of the surface wave signal output by the surface wave receiving device 3. In one aspect, the normal state index acquiring unit 102 includes a surface wave maximum amplitude detecting unit 1021 that detects the maximum amplitude of the surface waves output by the first surface wave detecting unit 301 and the second surface wave detecting unit 302, and a distance attenuation characteristic calculating unit 1022 that calculates the distance attenuation characteristic of the maximum amplitude of the surface waves. The normal state index acquiring unit 102 acquires the distance attenuation characteristic of the maximum amplitude of the surface waves when the impact test object is impacted by the impact device 2 from the maximum amplitude of the surface wave signals measured by the first surface wave detecting unit 301 and the second surface wave detecting unit 302. The acquired information is stored in a storage unit 104, which will be described later.

[0034] (Abnormality detection processing unit 103) The anomaly detection processing unit 103 detects an anomaly in the impact device 2 based on an index of the normal state of the impact device 2 extracted from the time change in the waveform of the surface wave signal acquired by the normal state index acquisition unit 102. More specifically, the anomaly detection processing unit 103 receives as input the distance attenuation characteristics of the surface wave output from the normal state index acquisition unit 102 and stored in the memory unit 104, and the distance between the impact position of the impact device 2, the state of which is unknown and output by the control unit 4, and the installation position of the surface wave receiving device 3, and determines an anomaly in the impact device 2, as will be described later. In one aspect, the anomaly detection processing unit 103 includes a detection threshold setting unit 1031 that sets a detection threshold, a surface wave amplitude comparison unit 1032 that compares surface waves, and an anomaly determination unit 1033 that determines an anomaly in the impact device 2.

[0035] (Acquisition of distance attenuation characteristics of surface waves in the normal state index acquisition unit 102) The acquisition of the distance attenuation characteristics of the surface wave by the normal state indicator acquisition unit 102 will be described with reference to FIGS. 2 to 4. FIG. 2 is a diagram showing an example of the positional relationship between the impact position 501 of a normal impact device 2 and the first surface wave detection unit 301 and the second surface wave detection unit 302 in the surface wave receiving device 3. In the example shown in FIG. 2, the distance between the impact position 501 and the detection position of the first surface wave detection unit 301 is a first distance d1, and the distance between the impact position 501 and the detection position of the second surface wave detection unit 302 is a second distance d2. When the impact device 2 impacts the impact test object, a surface wave is generated on the surface of the impact test object. FIG. 3(a) is a diagram showing an example of a time signal of the surface wave measured by the first surface wave detection unit 301. FIG. 3(b) is a diagram showing an example of a time signal of the surface wave measured by the second surface wave detection unit 302. 2 and 3, the second distance d2 is longer than the first distance d1, and the amplitude of the surface waves detected by the first surface wave detection unit 301 is greater than the amplitude of the surface waves detected by the second surface wave detection unit 302. FIG. 4 is an example of a diagram showing the relationship between the distance between the impact position 501 and the surface wave detection unit and the amplitude of the surface waves. The distance attenuation characteristic calculation unit 1022 calculates the distance attenuation characteristic of the maximum amplitude of the surface waves generated when the impact test object is impacted by a normal impact device 2, from the first distance d1, the maximum amplitude a1 of the surface waves detected by the first surface wave detection unit 301, the second distance d2, and the maximum amplitude a2 of the surface waves detected by the second surface wave detection unit 302. The distance attenuation characteristic to be calculated may be calculated by finding the coefficient of a curve (proportional to the root of the distance) connecting two points, or by installing surface wave detection units at two or more points at different distances and recording the amplitude at each distance to create a database.

[0036] (Detection of abnormality in impact device 2 by abnormality detection processing unit 103) The method of detecting an abnormality in the impact device 2 by the abnormality detection processor 103 will be described with reference to FIGS. 5 to 7. FIG. 5 is a diagram illustrating an example of the positional relationship between the impact position 601 of the impact device 2, whose state is unknown and for which abnormality detection is to be performed, and the first surface wave detector 301. In the example illustrated in FIG. 5, the distance between the impact position 601 and the first surface wave detector 301 is a third distance d3. FIG. 6 is a diagram illustrating an example of the relationship between the distance attenuation characteristic output by the distance attenuation characteristic calculator 1022, the third distance d3, and the predicted value of the maximum amplitude a3 of the surface wave measured by the first surface wave detector 301. As illustrated in FIG. 6, when the distance attenuation characteristic and the third distance d3 are obtained, the detection threshold setting unit 1031 predicts the value of the maximum amplitude a3 of the surface wave generated by a normal impact device from these and sets this as the detection threshold. Note that the distance between the impact position 601 and the second surface wave detector 302 may also be used as the third distance d3. 7 is a diagram showing an example of a time signal of a surface wave output by the first surface wave detection unit 301 when an impact test object is impacted at a collision speed v using the impact unit 202 of the impact device 2 that has softened due to deterioration. As shown in FIG. 7, when the impact unit 202 of the impact device 2 softens, the excitation force decreases and the amplitude of the generated surface wave also decreases. The detection threshold setting unit 1031 predicts the value of the maximum amplitude a3 of the surface wave and sets this value as a threshold, and the surface wave amplitude comparison unit 1032 compares the maximum amplitude a of the surface wave when the deteriorated impact device 2 impacts the impact test object with the maximum amplitude a3. The abnormality determination unit 1033 determines an abnormality in the impact device 2 using the following equation (1):

number

[0037] (Storage unit 104) The memory unit 104 stores the distance attenuation characteristics of the maximum amplitude of the surface wave when the impact test object is impacted by the impact device 2 in a normal state, which are acquired (detected) by the normal state indicator acquisition unit 102. At this time, this distance attenuation characteristic is stored in association with the impact speed. The memory unit 104 also stores various other data used in processing. The memory unit 104 can be configured with a storage device such as a RAM (Random Access Memory) or a hard disk.

[0038] [Control process by abnormality detection device 1A] Next, the control process of the abnormality detection device 1A will be described with reference to Fig. 8. Fig. 8 is a flowchart showing an example of the flow of the control process of the abnormality detection device 1A.

[0039] First, in step S100, the function setting unit 101 of the abnormality detection device 1A sets the abnormality detection device 1A to a normal state index acquisition state.

[0040] Next, in step S101, the normal state index acquisition unit 102 of the abnormality detection device 1A receives the surface wave time signal from the surface wave receiving device 3, the surface wave maximum amplitude detection unit 1021 detects the surface wave maximum amplitude, and the distance attenuation characteristic calculation unit 1022 calculates the distance attenuation characteristic.

[0041] Next, in step S102, the function setting unit 101 of the abnormality detection device 1A sets the abnormality detection device 1A to an abnormality detection state.

[0042] Next, in step S103, the abnormality detection processing unit 103 of the abnormality detection device 1A receives the time signal of the surface wave generated by the impact device 2, and compares the maximum amplitude of the surface wave at that time with the predicted maximum amplitude of the surface wave.

[0043] In step S104, it is determined whether the maximum amplitude of the surface wave at the time of impact is less than the predicted value by the abnormality determination unit 1033. If the maximum amplitude of the surface wave at the time of impact is less than the predicted value (YES in step S104), the process proceeds to step S105, and if the maximum amplitude is equal to or greater than the predicted value (NO in step S104), the process proceeds to step S106.

[0044] In step S105, the abnormality determination unit 1033 of the abnormality detection device 1A outputs an abnormality.

[0045] In step S106, the abnormality detection device 1A determines whether or not to end the display process. If the abnormality determination process is to be continued without ending (NO in step S106), the process returns to step S103 and the abnormality determination process described above is repeated. If the abnormality determination process is to be ended (YES in step S106), all processes are ended.

[0046] In addition, when index acquisition and abnormality detection are always performed in pairs, it is not necessary to switch between the normal state index acquisition state and the abnormality detection state (steps S100 and S102).

[0047] As described above, the abnormality detection device of this embodiment evaluates the impact device using the surface waves generated by the impact device, and therefore can easily detect an abnormal state of the impact device that does not output a vibration signal.

[0048] <Second embodiment> FIG. 9 is a functional block diagram showing an impact test device according to a second embodiment of the present invention. In this embodiment, an impact testing device 10' includes an abnormality detection device 1B, an impact device 2, a surface wave receiving device 3, and a control device 4. The impact device 2, the surface wave receiving device 3, and the control device 4 are configured in the same manner as in the first embodiment. The abnormality detection device 1B further includes an abnormality prediction unit 105 in addition to the configuration of the abnormality detection device 1A of the first embodiment.

[0049] (Method for predicting abnormality in impact device 2 using abnormality prediction unit 105) The method of predicting an abnormality of the impact device 2 in the abnormality prediction unit 105 will be described with reference to Fig. 10. Fig. 10 is a diagram showing an example of the time transition of the maximum amplitude of the surface wave detected by the maximum amplitude detection unit 1021 when the impact test object is hit multiple times at a collision speed v using the impact unit 202 of the impact device 2. In Fig. 10, maxis the maximum amplitude of the surface wave under normal conditions, a min is the minimum value of the maximum amplitude of the surface wave in the normal state. n The maximum amplitude of the surface wave up to the time of use is the actual measured value. L The maximum amplitude of the surface wave at is a predicted value. L The predicted value of the maximum amplitude of the surface wave in the normal state is the minimum value a min At this time, the number of times of use is N L is the time when the abnormality occurs.

[0050] The predicted value of the maximum amplitude of the surface wave at the number of uses n is n The maximum amplitude of the surface wave at the number of uses n is calculated from the maximum amplitude of the surface wave up to the h (n), and the maximum amplitude of the surface wave under normal conditions is a man Then, the prediction formula for the maximum amplitude of the surface wave at the number of uses n is the function f(n) that minimizes the following equation (2):

number

[0051] Also, the inverse function of the function f(n) is f -1 (n), the predicted minimum value of the maximum amplitude of the surface wave is a min Number of uses less than N L is calculated using the following formula (3).

number

[0052] <Example of use of an anomaly detection device> FIG. 11 is a schematic diagram showing an example of a usage mode of the abnormality detection device 1A in the impact test device 10 according to the first embodiment. The impact testing device 10 includes an abnormality detection device 1A, an impact device 2, a surface wave receiving device 3, and a control device 4. The abnormality detection device 1A is a device that detects abnormalities in the impact device, which serves as an input signal source when measuring the thickness of the refractory in a furnace having a furnace wall composed of a steel shell and refractory. The refractory thickness is measured, for example, by an impact acoustic wave resonance method. Examples of furnaces having furnace walls composed of a steel shell and refractory include industrial furnaces such as blast furnaces, gasification melting furnaces, and RH furnaces.

[0053] 11 shows how the steel shell Z is struck by the striking device 2 based on the impact speed set by the control device 4, the surface waves generated during the striking are measured by the surface wave receiving device 3, and received by the abnormality detection device 1A, which then compares the maximum amplitude of the surface wave during the striking with the predicted maximum amplitude of the surface wave to determine whether there is an abnormality. Fig. 12 is a diagram showing an example of the surface wave measured during striking when measuring the thickness of refractory material by the impact acoustic wave resonance method.

[0054] In the example shown in FIG. 11 , the anomaly detection device 1A, the impacting device 2, the surface wave receiving device 3, and the control device 4 operate as follows. First, the control device 4 transmits a set impact speed to the impacting device 2. The impacting device 2 impacts the surface of the steel shell Z at the set impact speed. The surface wave receiving device 3 receives surface waves generated by the impact of the impacting device 2, as shown in FIG. 12 . The surface waves received by the surface wave receiving device 3 are transmitted to the anomaly detection device 1A, which analyzes the surface waves to detect an anomaly in the impacting device 2. The surface wave receiving device 3 may also serve as a signal receiving device for measuring the thickness of the refractory using the impact acoustic wave resonance method, and the anomaly detection device 1A may also serve as a measuring device for measuring the thickness of the refractory using the impact acoustic wave resonance method. In the example shown in FIG. 12 , the components up to time t0 are considered to be surface wave components and are used to detect an anomaly in the impacting device, and the components after time t0 are considered to be reflection components from the refractory and are used to measure the thickness of the refractory.

[0055] In this embodiment, the case where the anomaly detection device 1A and the control device 4 are performed on different terminals is described, but this embodiment is not limited to this, and these processes may be performed on the same terminal, or some of these processes may be performed on a server. [Explanation of symbols]

[0056] 1A, 1B Abnormality detection device (arithmetic device) 2. Percussion device 3. Surface wave receiving device 4. Control device 101 Function setting section 102 Normal state indicator acquisition unit 103 Abnormality detection processing unit 104 Storage section 105 Abnormality Prediction Department 201 Drive unit 202 Striking section 301, 302 Surface wave detector 1021 Surface wave maximum amplitude detector 1022 Distance attenuation characteristic calculation unit 1031 detection threshold setting unit 1032 Surface wave amplitude comparison unit 1033 Abnormality determination section

Claims

1. An impact test device for performing an impact test on an impact test object, an impact device that impacts the impact test object to vibrate; a surface wave receiving device that measures a surface wave signal generated on the surface of the impact test object by vibration caused by impact of the impact device; a computing device that collects data of the surface wave signals measured by the surface wave receiving device and calculates the collected data; and The computing device detects an abnormality in the impact device based on an index of the normal state of the impact device extracted from the time change in the waveform of the surface wave signal measured by the surface wave receiving device.

2. The computing device 2. The impact testing device according to claim 1, wherein the index is a distance attenuation characteristic of the maximum amplitude of the surface wave measured by the surface wave receiving device.

3. the surface wave receiving device includes a first surface wave detecting unit that detects surface waves at a first detection position that is a first distance from a position where the impact test object is impacted by the impact device, and a second surface wave detecting unit that detects surface waves at a second detection position that is a second distance from the impact position, The computing device a normal state index acquiring unit that detects a maximum amplitude of the surface waves measured by the first surface wave detecting unit and the second surface wave detecting unit when the impact device hits the impact test object at a predetermined impact speed in a normal state, and acquires the distance attenuation characteristic calculated from the maximum amplitude of the surface waves, the first distance, and the second distance as an index of the normal state; a storage unit that stores the distance attenuation characteristic in association with a set collision speed between the impact unit of the impact device and the impact test object; an abnormality detection unit that sets a threshold value for the maximum amplitude of the surface wave generated by the impact device in a normal state, which is predicted from the distance attenuation characteristics, at a third distance between an impact position when the impact test object is impacted at the impact speed by the impact device in an unknown state and the first detection position or the second detection position, and compares the maximum amplitude of the surface wave generated by the impact device in an unknown state with the threshold value to detect an abnormality; The impact test device according to claim 2 , further comprising:

4. 4. The impact test device according to claim 3, wherein the computing device further comprises an abnormality prediction unit that calculates a time when an abnormality will occur in the impact device based on the transition over time of the maximum amplitude of the surface wave when the impact device, the state of which is unknown, is caused to impact the impact test object at the impact velocity.

5. The impact testing device according to claim 3 , wherein the arithmetic device further comprises a function setting unit that selects whether to execute the process by the normal state index acquisition unit or the process by the abnormality detection unit.

6. The impact test device according to claim 1 , wherein the object to be impact tested has a refractory material, and the thickness of the refractory material is measured by vibrating the object to be impact tested.

7. 7. The impact testing device according to claim 6, wherein the thickness of the refractory material is measured by an impact elastic wave resonance method.

8. An impact test method for performing an impact test on an impact test object, comprising: vibrating the impact test object by impacting it with an impact device; measuring a surface wave signal generated on the surface of the impact test object by vibration caused by impact of the impact device with a surface wave receiving device; acquiring and storing an index of a normal state extracted from a time change in the waveform of the surface wave signal measured by the surface wave receiving device; Detecting an abnormality in the impact device based on the indicator; The impact test method has the following features.

9. An impact testing device for performing an impact test by vibrating an impact test object by impacting an impact device and measuring a surface wave signal generated on the surface of the impact test object by the impact vibration of the impact device with a surface wave receiving device, comprising: An abnormality detection device that collects data on the surface wave signal measured by the surface wave receiving device, calculates the collected data, and detects an abnormality in the impact device based on an index of a normal state extracted from the time change in the waveform of the surface wave signal measured by the surface wave receiving device.

10. The anomaly detection device according to claim 9 , wherein the index is a distance attenuation characteristic of the maximum amplitude of the surface wave measured by the surface wave receiving device.

11. the surface wave receiving device includes a first surface wave detecting unit that detects surface waves at a first detection position that is a first distance from a position where the impact test object is impacted by the impact device, and a second surface wave detecting unit that detects surface waves at a second detection position that is a second distance from the impact position, a normal state index acquiring unit that detects a maximum amplitude of the surface waves measured by the first surface wave detecting unit and the second surface wave detecting unit when the impact device hits the impact test object at a predetermined impact speed in a normal state, and acquires the distance attenuation characteristic calculated from the maximum amplitude of the surface waves, the first distance, and the second distance as an index of the normal state; a storage unit that stores the distance attenuation characteristic in association with a set collision speed between the impact unit of the impact device and the impact test object; an abnormality detection unit that sets a threshold value for the maximum amplitude of the surface wave generated by the impact device in a normal state, which is predicted from the distance attenuation characteristics, at a third distance between an impact position when the impact test object is impacted at the impact speed by the impact device in an unknown state and the first detection position or the second detection position, and compares the maximum amplitude of the surface wave generated by the impact device in an unknown state with the threshold value to detect an abnormality; The anomaly detection device according to claim 10 , further comprising:

12. 12. The anomaly detection device according to claim 11, further comprising an anomaly prediction unit that calculates a time when an abnormality will occur in the impact device based on the transition over time of the maximum amplitude of the surface wave when the impact device, the state of which is unknown, is caused to impact the impact test object at the impact velocity.

13. The abnormality detection device according to claim 12 , further comprising a function setting unit that selects whether to execute the process by the normal state index acquisition unit or the process by the abnormality detection unit.

14. A method for measuring the thickness of a refractory material, comprising: vibrating an impact test object having a refractory material using the impact test apparatus according to any one of claims 1 to 5; and measuring the thickness of the refractory material.

15. The method for measuring the thickness of a refractory material according to claim 14, wherein the thickness of the refractory material is measured by an impact elastic wave resonance method.

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