Scientific mass spectrometry instrument electrical diagnostic systems

Abstract

To provide scientific instrument support systems, as well as related methods, computing devices, and computer-readable media.SOLUTION: There is disclosed, in some embodiments, a scientific instrument support apparatus comprising first logic to generate an electrical signal in a first component of a scientific instrument, where the generated electrical signal induces, through capacitive coupling, an electrical response signal in a second component of the scientific instrument, second logic to monitor the electrical response signal induced in the second component, third logic to determine an operational status of the second component based on the monitored electrical response signal, where the operational status indicates that the second component is not functioning properly when the monitored electrical response signal is not within a predetermined signal range.SELECTED DRAWING: Figure 1

Description

[Technical Field]

[0001] (CROSS-REFERENCE TO RELATED APPLICATIONS) This application claims priority to U.S. Provisional Patent Application No. 63 / 653,304, filed May 30, 2024, entitled "SCIENTIFIC MASS SPECTROMETRY INSTRUMENT ELECTRICAL DIAGNOSTIC SYSTEMS," the entire disclosure of which is incorporated herein by reference in its entirety. [Background technology]

[0002] Scientific mass spectrometry instruments can contain complex arrangements of moving components, sensors, input and output ports, energy sources, and consumable components, and any failure or change in any part of this arrangement can result in a "down" instrument that is unable to perform its intended function.

[0003]

[0013] The embodiments will be readily understood by the following detailed description taken in conjunction with the accompanying drawings, in which:

[0014] To facilitate this description, like reference numerals refer to like structural elements;

[0015] The embodiments are illustrated in the figures of the accompanying drawings, by way of example, and not by way of limitation. [Brief explanation of the drawings]

[0004] [Figure 1] FIG. 1 is a schematic diagram of an exemplary mass spectrometer system, according to various embodiments. [Figure 2] FIG. 1 is a schematic diagram of an exemplary mass spectrometer system including a control system and multiple components connected to the control system, according to various embodiments. [Figure 3] FIG. 1 is a block diagram of an exemplary scientific instrument support module for performing support operations, according to various embodiments. [Figure 4] FIG. 1 is a flow diagram of an exemplary method for performing an assistive operation, according to various embodiments. [Figure 5] FIG. 1 is a flow diagram of an exemplary method for performing an assistive operation, according to various embodiments. [Figure 6] 10 is a graph illustrating an electrical response signal of a properly functioning component under test in accordance with various embodiments. [Figure 7] 10 is a graph illustrating an electrical response signal of a component under test that is not functioning properly, according to various embodiments. [Figure 8] 6A-6C are graphs illustrating electrical response signals of various tested components showing instances where each component is functioning properly and instances where each component is not functioning properly, according to various embodiments. [Figure 9] 10 is a graph illustrating electrical response signals of various components under test compared to corresponding reference values, according to various embodiments. [Figure 10] 6A-6C are graphs illustrating electrical response signals of various components under test varying the order in which electrical signals or pulses are generated in one or more other components, according to various embodiments. [Figure 11] 1 is an example of a graphical user interface that may be used in implementing some or all of the assistance methods disclosed herein, according to various embodiments. [Figure 12] FIG. 1 is a block diagram of an example computing device that may implement some or all of the scientific instrumentation methods disclosed herein, according to various embodiments. [Figure 13] FIG. 1 is a block diagram of an exemplary scientific instrument support system that may implement some or all of the scientific instrument support methods disclosed herein, according to various embodiments. DETAILED DESCRIPTION OF THE INVENTION

[0005] Disclosed herein are scientific instrument support systems, as well as related methods, computing devices, and computer-readable media. For example, in some embodiments, a scientific instrument support apparatus is disclosed, the scientific instrument support apparatus comprising: first logic for generating an electrical signal in a first component of the scientific instrument, the generated electrical signal inducing an electrical response signal in a second component of the scientific instrument through capacitive coupling; second logic for monitoring the induced electrical response signal in the second component; and third logic for determining an operational state of the second component based on the monitored electrical response signal, the operational state indicating that the second component is not functioning properly when the monitored electrical response signal is not within a predetermined signal range.

[0006] Scientific instruments, such as mass spectrometers, include many electrical components within the mass spectrometer that have various functions. These components can include, for example, ion source components, mass analyzer components, and / or detector components. Some of these components can include, for example, electrodes of various forms, configurations, and / or sizes that serve specific purposes in the mass spectrometer, such as modifying electromagnetic fields to manipulate analytes. Some of these components can include other forms of electrically connected components. One or more of the components can be configured to receive direct current (DC) and / or radio frequency (RF) signals from one or more corresponding power sources to energize the components in a desired manner, for example, to achieve a desired effect on the analytes. These signals can be conveyed, for example, via electrical leads, such as cables, and intervening circuitry between one or more power supply components and / or control system circuitry and the electrical components.

[0007] In some cases, the intervening circuitry, cables, and / or components themselves may wear out, fail, and / or deteriorate to the point where the components do not function properly. When a component is not functioning properly, it can cause one or more problems in the mass spectrometer's output signal, preventing the mass spectrometer from performing as intended. In at least one case, the ion signal may be completely absent when one or more of the components is not functioning properly. When cables and / or components are not functioning properly, it can be difficult for a mass spectrometer user to troubleshoot the problem. This may be because any one or more of the mass spectrometer's components can result in an erroneous output signal. The output signal cannot indicate which component is faulty.

[0008] In conventional approaches, mass spectrometers are vented (one or more of the components are contained within a vacuum chamber under normal operation) so that each of the components, circuits, and / or cables and cable connections to each component can be manually checked or tested and / or troubleshooted by a user. These approaches have many technical challenges and limitations. For example, this invasive diagnostic approach can shut down or disable the mass spectrometer for an extended period of time, potentially reducing laboratory and / or project efficiency. Such diagnostic approaches also require manual testing of components, introducing an element of human error into the diagnostic process. Therefore, there is a need for a method of checking the operational status of one or more of the components without venting the instrument so that one or more faulty components, circuits, and / or connections can be quickly and accurately identified so that the problem can be quickly located and corrected.

[0009] Embodiments of scientific instrument support disclosed herein may achieve improved performance compared to conventional approaches. For example, conventional approaches to diagnosing and / or troubleshooting electrical connections of one or more components of scientific instrumentation generally require venting the instrument and meticulous manual checking of each individual component, circuit configuration, and / or component connection. Accordingly, embodiments disclosed herein provide improvements to scientific instrument technology (e.g., improvements to computer technology supporting such scientific instrumentation, among other improvements).

[0010] In some cases, one or more of the components carry RF and DC signals that combine to produce a desired effect on the analyte. In such cases, such components may appear to be functioning properly as a mass spectrometer, and the control system may check component functionality by performing tests on only the RF subsystem, e.g., by ramping up and down the RF signal. Such components may appear to be fully operational when, in fact, the component is not functioning properly, e.g., if the DC line is disconnected and / or faulty. Therefore, it is also necessary to be able to diagnose components carrying both RF and DC signals that appear to be operating properly when the RF signal is checked, but are in fact not operating properly.

[0011] Various of the embodiments disclosed herein may improve upon conventional approaches to achieve the technical advantage of reducing instrument downtime and / or increasing instrument utilization efficiency by automating the troubleshooting process and / or eliminating the need to vent the instrument to troubleshoot instrument output signal problems. Such technical advantages are not achievable with routine conventional approaches, and all users of systems incorporating such embodiments benefit from these advantages (e.g., by assisting users in performing technical tasks such as identifying and / or troubleshooting problems with one or more components using a guided human-machine interaction process). Thus, the technical features of the embodiments disclosed herein, as well as combinations of features of the embodiments disclosed herein, are clearly unconventional in the field of scientific instruments, such as mass spectrometers. As discussed further herein, various aspects of the embodiments disclosed herein may improve the functionality of the computer itself. For example, the systems and methods disclosed herein may automate the troubleshooting and / or diagnostic process when an output signal of a scientific instrument indicates a problem with one or more of the instrument's components, provide a deeper analysis of the problem, and / or recommend a fix for the identified component problem. The computational and user interface features disclosed herein not only involve the collection and comparison of information, but also apply new analytical and technical techniques to alter the behavior of the troubleshooting process. Thus, the present disclosure introduces capabilities that could not be performed by conventional computing devices or humans.

[0012] The methods and systems disclosed herein may provide a way to accurately and efficiently determine the operational status of one or more components carrying at least a portion of a DC signal without venting the instrument. The methods and systems disclosed herein utilize capacitive coupling between one or more components of a mass spectrometer to induce one or more electrical response signals in a component or components under test through the capacitive coupling. In at least one case, the mass spectrometer is placed in a standby mode. In at least one case, the standby mode includes setting all of the components to a zero potential. An electrical signal or pulse is then generated in an adjacent component or components, inducing an electrical response signal in the component or components under test. The electrical signal generated in the adjacent component induces an electrical response signal in the component under test through the capacitive coupling. The electrical response signal is monitored, and the operational status of the component under test is determined based on the monitored response signal. For example, if the electrical response signal is within a predetermined signal range indicative of a fully operational component, the operational status of the component under test is determined to be operational. If the electrical response signal is outside a predetermined range, for example, the operational status of the component under test is determined to be not functioning properly. In at least one case, many electrical pulses are transmitted and the corresponding electrical response signals are monitored. In such cases, an average of the electrical response signals is utilized when determining whether the component under test is functioning properly. In at least one case, an adjacent component refers to a component that is sufficiently physically close to the component under test such that when an electrical signal is generated in the adjacent component, an electrical response signal can be generated in the component under test through capacitive coupling.

[0013] In at least one case, components that can be directly tested and / or used in testing other components using the methods and systems disclosed herein can include any of the components disclosed herein. In at least one case, the components include, for example, quadrupoles, ion traps, ion optical components, lenses, deflectors, ion guides, ion mirrors, detector components, and / or detectors. Any electrically connected component of a mass spectrometer can be capable of having an electrical response signal induced by one or more adjacent electrically connected components. The methods and systems disclosed herein can be extended to at least some or all of these components.

[0014] Thus, embodiments of the present disclosure may be useful for any of a number of technical purposes, such as controlling a particular technical system or process; determining how to control and / or modify a machine from measurements, for example, by identifying and displaying detected problems and / or potential fixes for equipment components; enhancing or analyzing digital audio, images, or video by presenting detected component problems to a user and providing the user with further analysis of the detected component problems.

[0015] Accordingly, the embodiments disclosed herein provide improvements to scientific instrument technology (e.g., improvements to computer technology supporting scientific instruments such as mass spectrometers, among other improvements).

[0016] In the following detailed description, reference is made to the accompanying drawings that form a part hereof, where like numerals refer to like parts throughout and which show, by way of illustration, embodiments that may be practiced. It is to be understood that other embodiments may be utilized and structural or logical changes may be made without departing from the scope of the present disclosure. Therefore, the following detailed description is not to be taken in a limiting sense.

[0017] Various operations may be described as multiple separate actions or operations, in the order most helpful in understanding the subject matter disclosed herein. However, the order of description should not be construed as implying that these operations are necessarily order dependent. In particular, these operations may not be performed in the order presented. The operations described may be performed in a different order than in the described embodiment. Various additional operations may be performed and / or described operations may be omitted in additional embodiments.

[0018] For purposes of this disclosure, the phrases “A and / or B” and “A or B” mean (A), (B), or (A and B). For purposes of this disclosure, the phrases “A, B, and / or C” and “A, B, or C” mean (A), (B), (C), (A and B), (A and C), (B and C), or (A, B, and C). Although some elements may be referred to in the singular (e.g., “processing device”), any suitable element may be represented by multiple instances of that element, and vice versa. For example, a set of operations described as being performed by a processing device may be implemented with different ones of the operations performed by different processing devices. As used herein, the phrase “based on” should be understood to mean “based at least in part on,” unless otherwise specified.

[0019] This description uses the phrases "one embodiment," "various embodiments," and "some embodiments," each of which may refer to one or more of the same or different embodiments. Furthermore, terms such as "comprising," "including," and "having," when used with respect to embodiments of the present disclosure, are synonymous. When used to describe a range of dimensions, the phrase "between X and Y" represents a range that includes X and Y. As used herein, an "apparatus" may refer to any individual device, a collection of devices, a portion of a device, or a collection of portions of devices. The drawings are not necessarily drawn to scale.

[0020] Figure 1 illustrates an exemplary environment 100 for the scientific instrument support system and method disclosed herein. Figure 1 includes many features not discussed in detail herein for clarity of explanation, but the purpose and operation of these features will be understood by those skilled in the art and may take any suitable form. Any of the features of Figure 1 may be used in combination with any suitable features of the other accompanying drawings and / or in combination with any suitable features of the embodiments disclosed herein.

[0021] 1 illustrates an exemplary environment 102 including an exemplary mass spectrometer system 104 for use with the scientific instrumentation systems and methods disclosed herein and a computing device 106 configured to control the operation of the mass spectrometer system 104 and / or perform post-processing on detector data generated therefrom. Note that the present disclosure is not limited to the environment of FIG. 1 and that in some embodiments, the environment 100 may include different types of systems configured to manipulate and / or otherwise interrogate ions.

[0022] 1 illustrates an exemplary mass spectrometer system 104 as being a hybrid mass spectrometer 110 that includes two or more types of mass analyzers. Specifically, the mass spectrometer system 104 includes a quadrupole ion trap mass analyzer 108 and an electrostatic trap mass analyzer 112 (e.g., an ORBITRAP™ analyzer). However, it should be understood that different combinations of mass analyzers may be desirable for different applications, and thus, according to embodiments of the present disclosure, the mass spectrometer system 104 may include fewer or more mass analyzers and / or different combinations of mass analyzers.

[0023] In operation of the exemplary mass spectrometer system 104, an electrospray ion source 114 provides ions of a sample to be analyzed to the opening of a heated ion transport tube 116, where the ions enter a first vacuum chamber 118. After entry, the ions are trapped and focused into a tight beam by an ion collimating device 120 (e.g., a stacked ring ion guide, an ion lens, an ion funnel, etc.). The exemplary mass analyzer 110 is further shown as including a plurality of ion optical transport components 122 configured to allow ions to pass between intermediate vacuum regions of the mass analyzer during their travel. The exemplary mass analyzer 110 is illustrated as including a curved beam guide 124 that separates most remaining neutral molecules and undesired ion clusters (e.g., solvated ions, environmental contaminants, etc.) from the ion beam.

[0024] The quadrupole mass filter 126 of the mass spectrometer system 110 is used in its conventional sense as a tunable mass filter, so as to pass only ions within a selected m / z range. The subsequent ion optical transport component 122 delivers the filtered ions to a curved ion trap ("C-trap") component 128. The C-trap 128 is capable of transporting ions along a path between the quadrupole mass filter 126 and the ion trap mass analyzer 108. The C-trap 128 also has the ability to temporarily collect and store a population of ions and then deliver the ions as pulses or packets into the mass analyzer 112.

[0025] 1 further illustrates a multipole ion guide 130 and optical transport components 122 as useful in guiding ions between the C-trap 128 and the ion trap mass analyzer 108. The multipole ion guide 130 may provide temporary ion storage capability so that ions generated in a first processing step of an analytical method can be later removed for processing in a subsequent step. The multipole ion guide 130 may also serve as a fragmentation cell and ion trap (i.e., an ion-routing multipole). Various ion optics along the path between the C-trap 128 and the ion trap mass analyzer 108 may be controllable so that ions can be transported in either direction, depending on the sequence of ion processing steps required in a particular analytical method.

[0026] The ion trap mass analyzer 108 is illustrated in FIG. 1 as a dual-pressure linear ion trap 132 (i.e., a two-dimensional trap) comprising a high-pressure linear trapping cell 134 and a low-pressure linear trapping cell 136, the two cells being positioned adjacent to each other and separated by a plate lens with a small aperture that allows ion transfer between the two cells and also acts as a pump restriction that allows different pressures to be maintained within the two traps.

[0027] The use of either electron transfer dissociation or proton transfer reactions in mass spectrometry requires the ability to perform controlled ion-ion reactions within the mass spectrometer. Ion-ion reactions require the ability to generate reagent ions and mix the reagent ions with sample ions. The exemplary mass spectrometer system 110 is depicted as including a reagent ion source 140 disposed between the stacked ring ion guide 120 and the curved beam guide 124. However, within this disclosure, one or more additional reagent ion sources may be included within the exemplary mass spectrometer system 104. FIG. 1 further illustrates the exemplary spectrometer 110 as including one or more additional components 142. Such additional components may include various combinations of one or more ion guides, ion traps, lenses, detectors, reactant ion sources, etc. Those skilled in the art will appreciate that the exemplary spectrometer 110 is merely an exemplary configuration of a system capable of enabling / implementing the systems and methods for low Mathieu q dissociation of precursor ions disclosed herein.

[0028] The environment 100 is also shown as including one or more computing devices 106. Those skilled in the art will appreciate that the computing device 106 depicted in FIG. 1 is illustrative only and is not intended to limit the scope of the present disclosure. Computing systems and devices may include any combination of hardware or software capable of performing the indicated functions, such as computers, network devices, Internet appliances, PDAs, wireless telephones, controllers, oscilloscopes, amplifiers, etc. The computing device 106 may be connected to other devices not illustrated, or may alternatively operate as a stand-alone system.

[0029] It should also be noted that one or more of the computing devices 106 may be components of the exemplary mass spectrometer 104, may be separate devices from the exemplary mass spectrometer 104 that communicate with the exemplary mass spectrometer 104 via a network communication interface, or may be a combination thereof. For example, the exemplary mass spectrometer 104 may include a first computing device 106 that is a component part of the exemplary mass spectrometer 104 and that operates as a controller to drive operation of the exemplary mass spectrometer 104 (e.g., adjusting the scan position on the sample by operating a scan coil, etc.). In such an embodiment, the exemplary mass spectrometer 104 may also include a second computing device 106 that is a desktop computer separate from the exemplary microscope system 104 and that is executable to process data received from the detector system 138 to generate a representation of a spectrum based on the detector data (e.g., a chromatogram, an extracted ion current (EIC), etc.) and / or perform other types of analysis or post-processing of the detector data. The computing device 106 may further be configured to receive user selections via a keyboard, mouse, touchpad, touchscreen, wireless device, other user interface, and the like.

[0030] Additionally, computing device 106 is configured to control exemplary mass spectrometer 104 to enable mass analysis to be performed on a sample. For example, one or more user selections, an automated program, or a combination thereof may enable computing device 110 to cause mass spectrometer 104 and / or its components to perform any of the methods described in this disclosure, using any of the parameters described herein, or that would be generally understood by one of skill in the art to be part of performing such a method.

[0031] User selection, an automated program, or a combination thereof may then cause the computing device 110 to generate analytical detector data from the mass spectrometer 104 related to the sample and / or create one or more chromatograms associated with the mass spectrometric analysis performed on the sample.

[0032] FIG. 1 also includes a schematic diagram illustrating an exemplary computing architecture 150 of a computing device 105. The exemplary computing architecture 150 illustrates additional details of hardware and software components that may be used to implement the techniques described in this disclosure. Those skilled in the art will appreciate that the computing architecture 150 may be implemented in a single computing device 106 or across multiple computing devices. For example, individual modules and / or data structures depicted in the computing architecture 150 may be executed by and / or stored on different computing devices 106. In this manner, different process steps of the inventive methods disclosed herein may be executed and / or performed by separate computing devices 106 and in various orders within the scope of the present disclosure. In other words, functionality provided by the illustrated components may be combined into fewer components or distributed among additional components in some implementations. Similarly, in some implementations, functionality of some of the illustrated components may not be realized and / or other additional functionality may be available.

[0033] In the exemplary computing architecture 150, the computing device includes one or more processors 152 and memory 154 communicatively coupled to the one or more processors 152. While not intended to be limiting, the exemplary computing architecture 150 is shown as including a control module 166 stored in the memory 154. As used herein, the term “module” is intended to represent an exemplary division of executable instructions for purposes of illustration and is not intended to represent any type of requirement or required method, manner, or organization. Accordingly, while various “modules” are described, their functionality and / or similar functionality may be arranged differently (e.g., combined into fewer modules, divided into more modules, etc.). Furthermore, while certain functions and modules are described herein as being implemented by software and / or firmware executable on a processor, in other cases, any or all modules may be implemented in whole or in part by hardware (e.g., specialized processing units, etc.) to perform the described functions. As discussed above, in various implementations, the modules described herein in connection with the exemplary computing architecture 150 may be executed across multiple computing devices 106.

[0034] The control module 168 may be executable by the processor 152 to cause the computing device 110 and / or the exemplary mass spectrometer 104 to take one or more actions and / or perform system functions or maintenance. In some embodiments, the control module 168 may cause the exemplary mass spectrometer 104 to perform mass analysis on a sample. More specifically, in accordance with the present disclosure, the exemplary control module 168 may be executable to cause the mass spectrometer 104 and / or its components to perform any of the methods described in this disclosure, using any of the parameters described herein or that would be generally understood by one of skill in the art to be part of performing such methods.

[0035] As discussed above, computing device 106 includes one or more processors 152 configured to execute instructions, applications, or programs stored in memory 154 accessible to the one or more processors. In some embodiments, one or more processors 152 may include a hardware processor, including, but not limited to, a hardware central processing unit (CPU), a graphics processing unit (GPU), etc. While in many cases the techniques are described herein as being performed by one or more processors 152, in some cases the techniques may be implemented by one or more hardware logic components, such as a field programmable gate array (FPGA), a complex programmable logic device (CPLD), an application specific integrated circuit (ASIC), a system-on-chip (SoC), or a combination thereof.

[0036] Memory 154 accessible to one or more processors 152 is an example of a computer-readable medium. Computer-readable media can include two types of computer-readable media: computer storage media and communication media. Computer storage media can include volatile and nonvolatile, removable and non-removable media implemented in any method or technology for storage of information such as computer-readable instructions, data structures, program modules, or other data. Computer storage media includes, but is not limited to, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EEPROM), flash memory or other memory technology, compact disc read-only memory (CD-ROM), digital versatile disk (DVD) or other optical storage, magnetic cassettes, magnetic tape, magnetic disk storage or other magnetic storage devices, or any other non-transmission medium that can be used to store the desired information and that can be accessed by a computing device. Generally, computer storage media may include computer-executable instructions that, when executed by one or more processing units, cause the various functions and / or operations described herein to be performed. In contrast, communication media embodies computer-readable instructions, data structures, program modules, or other data in a modulated data signal such as a carrier wave or other transmission mechanism. As defined herein, computer storage media does not include communication media.

[0037] Those skilled in the art will also recognize that items or portions of items may be transferred between memory 154 and other storage devices for purposes of memory management and data integrity. Alternatively, in other implementations, some or all software components may execute in memory on another device and communicate with computing device 106. Some or all of the system components or data structures may also be stored on a non-transitory computer-accessible medium or in a portable product readable by an appropriate drive (e.g., as instructions or structured data), various examples of which are described above. In some implementations, instructions stored on a computer-accessible medium separate from computing device 106 may be transmitted to computing device 106 via a transmission medium or signal, such as an electrical, electromagnetic, or digital signal conveyed over a communications medium such as a wireless link. Various implementations may further include receiving, sending, or storing instructions and / or data implemented in accordance with the preceding description of a computer-accessible medium.

[0038] The mass spectrometer system 104 can further include one or more power supplies and corresponding circuits connected to one or more of the mass spectrometer components discussed herein. The one or more power supplies and corresponding circuits can be coupled to the computing device 106 to control the one or more power supplies and thus the mass spectrometer components, and to receive output from the corresponding circuits to, for example, monitor one or more electrical parameters (e.g., voltage and / or current) within the circuits, mass spectrometer components, and / or power supplies. In at least one instance, the corresponding circuits include one or more feedback circuits to provide electrical signal monitoring circuits for measuring and monitoring one or more electrical parameters across one or more of the components. These electrical parameters can be monitored and recorded by a computing device such as those disclosed herein.

[0039] 2 is a block diagram of an exemplary scientific instrument system 200 for use with the support systems, scientific instruments, and / or methods disclosed herein. The scientific instrument system 200 may include any suitable type of scientific instrument system, such as, for example, a mass spectrometer system such as those disclosed herein. The scientific instrument system 200 comprises a control system 210 and a plurality of instrument components 230 connected to the control system 210. The control system 210 includes one or more power sources 212, one or more feedback circuits 214, and a computing device 216. The control system 210 is configured to control various parameters of the components 230, such as, for example, electrical signal parameters (e.g., current, voltage, DC signal, RF signal). The one or more power sources 212 are connected to one or more of the components 230 to provide electrical signals during normal use and / or during the performance of the methods and systems disclosed herein, such as, for example, the electrical diagnostic methods disclosed herein. Feedback circuitry 214 is connected to (and / or is a part of) one or more power sources 212 and / or one or more power supply circuits, computing device 216, and component 230 so as to provide circuitry for monitoring and / or measuring electrical signals at the output of one or more power sources 212 (corresponding to electrical signals delivered to component 230) during normal use and / or during implementation of the methods and systems disclosed herein, such as, for example, the electrodiagnostic methods disclosed herein.

[0040] In at least one case, the feedback circuit may be part of a power supply, with a portion of the power supply's output being consumed by the feedback circuit (e.g., via a resistive voltage divider) for monitoring and / or measurement. In such cases, the power supply's actual output (e.g., voltage and / or current) to a particular component can be calculated based on a known relationship. In at least one case, each component is powered by its own power supply. In at least one case, each component is connected to one or more distribution boards. In either case, the voltage potential of each component's circuit can be monitored, allowing for monitoring of the current induced in each component through capacitive coupling, as discussed herein. In at least one case, one or more feedback circuits and / or measurement devices allow for monitoring of each component's electrical signal during normal operation. The feedback circuits and / or measurement devices may include, for example, circuitry and devices for measuring the potential within a circuit including the component and the power supply. The feedback circuits and / or measurement devices may be connected to a computing device to monitor, record, and display the feedback. The feedback may then be used to further control the component. These one or more feedback circuits may also be used to monitor, for example, electrical potentials within circuits including components and power sources induced during the diagnostic methods discussed herein.

[0041] Components 230 include a first component 240, a second component 250, and a third component 260. Components 230 may include any of the components of scientific instruments discussed herein, such as, for example, components of a mass spectrometer. Each of components 230 is connected to control system 210 via electrical circuitry 220, which may include subcircuits, cables, and / or electrical leads. In at least one case, electrical circuitry 220 comprises a single cable, electrical lead, and / or wire (e.g., carrying analog and / or digital signals) connecting each component to control system 210. First component 240 is connected to control system 210 via electrical circuitry 222, second component 250 is connected to control system 210 via electrical circuitry 224, and third component 260 is connected to control system 210 via electrical circuitry 226. More or fewer components are contemplated. The proximity of components 230 may vary positionally and / or the order of components 230 may vary operationally. In at least one case, components 230 include components positioned sequentially in the operation of a scientific instrument, such as, for example, a mass spectrometer. In at least one case, components 230 include components positioned proximate to one another, such that one or more of components 230 can induce an electrical response signal in one or more others of components 230 through capacitive coupling. As discussed in more detail herein, circuitry 220 and / or components 230 may fail, become disconnected, or wear out over time, and the methods and systems disclosed herein enable, for example, identification of such failures or problems. As seen in FIG. 2 , components 230 are positioned within a vacuum chamber, such as vacuum chamber 118, and during at least a portion of the operation of instrument system 200, components 230 remain under vacuum within the vacuum chamber (as is the case during normal instrument operation). As discussed herein, the methods and systems disclosed herein enable diagnosis of connection and / or circuitry problems of components 220 without venting vacuum chamber 118 .

[0042] 3 is a block diagram of a scientific instrument support module 300 for performing support operations, according to various embodiments. The scientific instrument support module 300 may be implemented by circuitry (e.g., including electrical and / or optical components) such as a programmed computing device. The logic of the scientific instrument support module 300 may be contained in a single computing device or may be distributed across multiple computing devices that communicate with each other as needed. An example of a computing device that may implement the scientific instrument support module 300, alone or in combination, is discussed herein with reference to the computing device 4000 of FIG. 12, and an example of a system of interconnected computing devices in which the scientific instrument support module 300 may be implemented across one or more of the computing devices is discussed herein with reference to the scientific instrument support system 5000 of FIG. 13.

[0043] The scientific instrument support module 1000 may include signal generation logic 302, signal monitoring logic 304, and decision logic 306. As used herein, the term "logic" may include an apparatus that performs a set of operations associated with the logic. For example, any of the logic elements included in the support module 300 may be implemented by one or more computing devices programmed with instructions that cause one or more processing devices of the computing devices to perform the associated set of operations. In particular embodiments, a logic element may include one or more non-transitory computer-readable media having instructions that, when executed by one or more processing devices of one or more computing devices, cause the one or more computing devices to perform the associated set of operations. As used herein, the term "module" may refer to a collection of one or more logic elements that together perform the function associated with the module. Different logic elements within a module may take the same form or different forms. For example, some logic within a module may be implemented by a programmed general-purpose processing device, while other logic within the module may be implemented by an application-specific integrated circuit (ASIC). In another example, different ones of the logic elements in a module may be associated with different sets of instructions executed by one or more processing devices. A module may not include all of the logic elements depicted in an associated figure; for example, a module may include a subset of the logic elements depicted in an associated figure when the module performs a subset of the operations discussed herein with reference to that module.

[0044] The signal generation logic 302 is configured to generate one or more electrical signals or pulses in one or more components of a scientific instrument, such as a mass spectrometer.

[0045] In at least one case, the electrical signal is generated by one or more power sources connected to one or more components, and in at least one case, the characteristics of the electrical signal are user-defined, predefined, and / or determined by a computing device.

[0046] The signal monitoring logic 304 is configured to monitor one or more electrical response signals induced in one or more other components under test as a result of the electrical signals or pulses generated by the signal generation logic 302. The signal monitoring logic 304 monitors the electrical response signals via one or more feedback circuits and / or measurement devices connected to the one or more other components under test.

[0047] In at least one instance, the signal monitoring logic 304 further monitors the generated electrical signal in circuitry connected to one or more components involved in inducing current in one or more other components under test to ensure that the generated electrical signal is generated as expected. For example, various characteristics of the generated electrical signal may be monitored and compared to input characteristics.

[0048] The decision logic 306 is configured to determine the operational state of one or more of the other components under test in which the electrical response signals were induced (or assumed to be induced) based on one or more electrical response signals induced and monitored in the one or more other components under test. In at least one case, the monitored electrical response is compared to an operational threshold. In at least one case, the monitored electrical response is an average of many monitored electrical response signals induced via many generated test pulses, and the average monitored electrical response is used to determine the operational state of the one or more components under test.

[0049] In some cases, additional logic may be used, such as analysis logic that may perform additional analysis of the monitored electrical response signals, decision logic that may determine potential modifications to a component under test that is determined to be not operating properly based on the monitored electrical response signals, and / or display logic that may display results of a method or system disclosed herein to a user to help identify a problem with the component and / or determine next steps to resolve the identified problem.

[0050] In at least one case, the assistance module 300 is configured to sequentially perform tests on many or all of the components of the scientific instrument. For example, the assistance module 300 may walk through a predetermined set, some, or all of the components of the instrument, inducing electrical response signals in all of the components and monitoring those electrical response signals in an attempt to determine the operational status of each component. A resulting report may be displayed to the user, identifying components that may have been identified as failed, malfunctioning, not fully operational, and / or disconnected, for example. In at least one case, further analysis of the report may be performed by one or more computing devices to determine potential fixes and next steps. In at least one case, additional logic may be included that may attempt to self-correct and / or verify detected issues. For example, if generating an electrical signal in a first component does not induce an expected electrical response signal in a second component, the assistance module 3000 may automatically initiate a double-check or verification test by generating an electrical signal in a third component and inducing a second expected electrical response signal in the second component under test. If the electrical response signal in the second component still does not meet expectations, the assistance module 300 can determine that the second component and / or its subcomponents may be disconnected or not functioning properly. On the other hand, if the electrical response signal in the second component indicates that the second component is functioning properly, the assistance module 300 can determine that the first component and / or its subcomponents may have failed.

[0051] In at least one case, the assistance module 300 further includes equipment test logic that places the equipment in standby and automatically runs diagnostic tests on any and all components, for example, upon equipment shutdown and / or startup. In at least one case, the diagnostic tests can be initiated by a user on demand. In at least one case, the diagnostic tests are performed multiple times for each component during a single diagnostic test run. Pulses can be sent thousands of times per second and corresponding signals monitored. Thus, diagnostics can be performed quickly and in the background while the equipment is running, for example.

[0052] 4 is a flow diagram of a method 400 for performing support operations, according to various embodiments. The operations of method 400 may be illustrated with reference to particular embodiments disclosed herein (e.g., the scientific instrument support module 300 discussed herein with reference to FIG. 3, the GUI 3000 discussed herein with reference to FIG. 11, the computing device 4000 discussed herein with reference to FIG. 12, and / or the scientific instrument support system 5000 discussed herein with reference to FIG. 13), but method 400 may be used in any suitable setting to perform any suitable support operations. Although the operations are illustrated in FIG. 4 in a particular order, each one once, the operations may be rearranged, modified, and / or repeated as desired and appropriate (e.g., different operations performed may be performed in parallel, as appropriate).

[0053] Generating a test pulse (DC) at a first component may be performed at 402. For example, generating logic 302 of support module 300 may perform the operation of 402. The operation of 402 may include, for example, generating a test pulse at the first component using one or more power supplies of a mass spectrometer to induce an electrical response signal in a second component under test.

[0054] Monitoring electrical parameters of the second component under test may be performed at 404. For example, monitoring logic 304 of assistance module 300 may perform the operation of 404. The operation of 404 may include monitoring, through a feedback circuit connected to the second component under test, an electrical response signal (e.g., voltage and / or current) induced in the second component under test as a result of generating the test pulse in the first component.

[0055] At 406, determining an operational state of the second component under test based on the monitored electrical response signal of the second component under test may be performed. For example, the decision logic 306 of the assistance module 300 may perform the operation of 406. Determining the operational state of the second component under test may include comparing the monitored electrical response signal to a predetermined response signal having predetermined characteristics (e.g., a threshold value, a spectral composition, etc.), and if the monitored electrical response signal is within a predetermined range indicating that the second component under test is functioning properly, the operational state is determined to be fully operational or properly functioning, and if the monitored electrical response signal is outside the predetermined range (below or above the predetermined range), the operational state is determined to be, for example, faulty or not functioning properly.

[0056] At 408, outputting the determined operational status may be performed. Such output may include, for example, displaying the results to a user or any of the other subsequent steps disclosed herein, such as, for example, outputting the operational status and / or corresponding results to decision logic that determines what the problem is with the second component under test. In at least one instance, method 400 may further include steps for logging, monitoring, and predicting trends after cycling through many test sequences to predict that the component and / or its cables, connections, and circuitry may fail in the near future. This analysis may be performed, for example, by logging changes in the electrical response signal over time and comparing the changes over time to previous failure events. Based on the threshold similarity, assistance module 300 may determine, for example, that the component and / or its subcomponents are likely to fail in the near future or to fail and / or be disconnected. This information may be communicated to the user along with supporting evidence that module 300 used to make this determination.

[0057] FIG. 5 is a flow diagram of a method 410 for performing an assistive operation, according to various embodiments. In at least one instance, method 410 is performed in conjunction with method 400. While the operations of method 410 may be illustrated with reference to particular embodiments disclosed herein (e.g., the scientific instrument assistive module 300 discussed herein with reference to FIG. 3, the GUI 3000 discussed herein with reference to FIG. 11, the computing device 4000 discussed herein with reference to FIG. 12, and / or the scientific instrument assistive system 5000 discussed herein with reference to FIG. 13), method 400 may be used in any suitable setting to perform any suitable assistive operation. Although the operations are illustrated in FIG. 5 in a particular order, each one once, the operations may be rearranged, modified, and / or repeated as desired and appropriate (e.g., different operations performed may be performed in parallel, as appropriate). The operations may also be combined with other methods and systems disclosed herein.

[0058] At 412, the method determines whether the monitored electrical response signal is within a predetermined range. For example, the decision logic 306 of the assistance module 300 may perform the operation of 412. The operation of 412 may include comparing the electrical response signal to a predetermined range to determine whether the component under test is functioning properly or not. In at least one case, an average of the electrical response signal is compared to a single reference value. If the average of the electrical response signal is within a predefined percentage of the single reference value, the component is determined to be fully operational. If the average of the electrical response signal is outside the predefined percentage of the single reference value, the component is determined to have failed or not functioning properly. In at least one case, the monitored single electrical response signal is determined to be within a predefined reference range, for example. If the signal is within the predefined reference range, the component is determined to be fully operational. If the signal is outside the predefined reference range, the component is determined to have failed or not be fully operational. In at least one case, the average of the electrical response signal is compared to a predefined reference range.

[0059] In at least one case, for example, predetermined values ​​or reference ranges to which monitored electrical response signals are compared are determined by the manufacturer. In at least one case, the values ​​and / or ranges are determined locally by the device and are based on normal operating conditions for that particular device. In another case, the values ​​and / or ranges are selected by a user. In at least one case, artificial intelligence and / or machine learning is used to determine what the reference values ​​and / or ranges are for each component.

[0060] At 414, it is determined that the monitored electrical response signal is within a predetermined range indicating that the component under test is fully operational. In at least one instance, this determination is displayed to a user. In at least one instance, this determination is not displayed to a user, but rather, testing of another component is automatically initiated.

[0061] At 416, it is determined that the monitored electrical response signal is outside a predetermined range, indicating that the component under test is not fully operational or functioning properly. At 418, the problem can be determined by the assistance module 300, for example, based on the monitored electrical response signal. In other words, one or more characteristics of the electrical response signal can provide insight into what is wrong with the component under test. These characteristics and corresponding signal response profiles indicative of specific problems can be learned over time by a machine learning algorithm and / or predefined by the manufacturer. In at least one case, the electrical signal response profile can indicate, for example, that the component is completely disconnected. In another case, the electrical signal response profile can indicate, for example, that one or more components of a subcircuit configuration of the component under test have failed and / or are, for example, defective. In at least one case, the electrical response signal can indicate precisely which circuit component has failed based on previous test results in other laboratories with the same problem.

[0062] The determined problem and / or a recommended fix for the problem may be displayed or otherwise communicated to the user and / or service provider (e.g., manufacturer) at 420. In at least one case, steps on how to fix the problem are obtained by assistance module 300 and communicated to the user.

[0063] 6 and 7 illustrate example graphs of monitored electrical signal responses of a component under test. FIG. 6 is a graph 500 depicting the monitored electrical signal response of a properly functioning component under test. As can be seen in graph 500, the electrical response signal includes a spike 502. The spike 502 was induced by an electrical test pulse generated in one or more other components of the scientific instrument.

[0064] 7 is a graph 510 depicting an example of a monitored electrical signal response of the component under test of FIG. 6 that is disconnected when an electrical test pulse is sent to one or more other components of the scientific instrument. As can be seen in graph 510, the electrical response signal does not include any significant spikes (e.g., above a threshold and / or within a predetermined range), indicating that the component under test is not functioning properly. In this case, the component under test is disconnected. The measured response signal may, for example, include only noise and / or interference.

[0065] FIG. 8 is a graph 600 illustrating an example of electrical response signals for various different components under test when the components are connected compared to when the components are disconnected (one or more electrical test pulses are generated at one or more other components of the instrument). Each component illustrated in graph 600 includes a connected pulse response signal (left bar) and a disconnected pulse response signal (right bar). As can be seen in graph 600, the magnitude of the electrical signal response (which may be, for example, a specific signal magnitude, a peak magnitude, and / or an average magnitude) differs between the connected and disconnected components. As can be seen in FIG. 8, the voltage of the electrical signal response is monitored and recorded. Other characteristics of the electrical signal response, such as current, may be monitored in addition to or instead of voltage.

[0066] 9 is a graph 700 comparing example ion trap electrical response signals of various different components of an ion trap compared to reference data (reference data that exhibits fully operational magnitude values). Each component illustrated in graph 700 includes reference data (left bar) and response signal data (right bar). The response signal (right-most bar for each component on the x-axis) can be compared to the reference data (left-most bar for each component on the x-axis) to determine if the component is functioning properly. As can be seen in FIG. 9, the measured response signal is a current.

[0067] In at least one case, electrical signals or pulses can be simultaneously generated in one or more components to induce, through capacitive coupling, electrical response signals in one or more other components under test. In at least one case, multiple components can be simultaneously monitored for induced electrical response signals while one or more electrical signals or pulses are being generated in one or more other components.

[0068] The component being tested for an operational condition can be a group of components. In at least one case, the methods and systems disclosed herein sequentially test adjacent components by generating an electrical signal or pulse in a first component and monitoring an electrical response signal induced by the pulse in a second component downstream of the first component. The methods and systems disclosed herein may then generate an electrical signal or pulse in the second component and monitor an electrical response signal induced by the pulse in a third component downstream of the second component. In at least one case, the electrical response signal can be further monitored in a first component upstream of the second component when the test pulse is generated in the second component. In such a case, the methods and systems disclosed herein can monitor each component adjacent to the component receiving the test pulse (the first upstream component and the first downstream component).

[0069] In at least one instance, a mass spectrometer system may exhibit signal problems within one or more general sections of the instrument (containing one or more components) before, during, and / or after normal use. In such instances, the general sections of components may be targeted by the diagnostic methods and systems disclosed herein. The general sections of components may be selected by a user and / or automatically by the methods disclosed herein. In at least one instance, a signal output problem in a particular section of the instrument may enable the diagnostic methods and systems disclosed herein to quickly and directly target components within that section of the instrument.

[0070] In at least one instance, one or more of the diagnostic methods disclosed herein can be performed automatically by the mass spectrometer, whether triggered by a specific event or performed at regular intervals. For example, one or more of the diagnostic methods can be initiated as soon as a signal problem is detected by the mass spectrometer. In at least one instance, one or more diagnostic methods can be initiated during an experiment while the mass spectrometer is still under vacuum. In at least one instance, one or more diagnostic methods can be initiated before a shutdown and / or immediately following a startup sequence. In at least one instance, one or more diagnostic methods can be performed before the instrument achieves vacuum and / or immediately following a transition from vacuum. One or more diagnostic methods can be performed at regular intervals, such as, for example, once daily and / or once weekly.

[0071] The generated electrical signal or pulse can be any suitable type of electrical signal, such as, for example, a DC potential, a voltage pulse, and / or a current pulse. The electrical response signal can be measured in any suitable manner, such as, for example, by measuring a DC voltage potential or current in a connection between a power source and the component under test. This circuit configuration is sometimes referred to as a feedback circuit. Any suitable measurement technique can be used so that the electrical response signal induced in the component under test can be quantified.

[0072] In at least one case, the generated electrical signal or pulse can be predefined according to the specifications of the component under test and / or the component from which the pulse is being generated. In at least one case, capacitive coupling characteristics between various components can be pre-determined. In at least one case, the capacitive coupling characteristics are learned for one or more of the components in the mass spectrometer to select the most appropriate characteristics of the generated electrical signal or pulse to maximize the electrical response signal in the desired component being tested. In at least one case, the characteristics of the electrical pulse are selected to maximize the electrical response signal in the device under test. In at least one case, several components are tested simultaneously. In at least one case, a series of electrical signals or pulses is generated in a single component under test over a period of time, and the average induced electrical response signal is observed and compared to reference data. In at least one case, the series of electrical signals or pulses is generated in several different components over a period of time. In at least one case, the characteristics of the electrical signal or pulse are selected to, for example, reduce the effects of noise on the test, particularly the electrical response signal.

[0073] In at least one instance, the generated electrical signals or pulses are not uniform in width, amplitude, and / or waveform between tests and / or within a single test. In at least one instance, a series of electrical signals or pulses having different characteristics are cycled through various components of the instrument, and based on the desired outcome of the electrical response signals induced in the test components as a result of the series of different electrical pulses (e.g., maximum induced electrical response signal strength), the assistance module automatically selects pulse characteristics for subsequent tests.

[0074] In at least one instance, one or more of the sub-circuits of a component of an equipment includes circuitry that includes a resistor that may fail over time. The methods and systems disclosed herein can identify the failed component (e.g., resistor, etc.) and thus the failed circuit, including, for example, a broken resistor.

[0075] In at least one case, the generated electrical pulse is, for example, approximately −150 V to +150 V. However, as discussed herein, any suitable pulse characteristics can be selected. In at least one case, when generating a pulse in some components, the pulse is not instantaneous, but rather there can be a delay (e.g., 30 microseconds) in the time it takes for the pulse to occur in the desired component. As discussed herein, multiple components can be pulsed simultaneously to test adjacent components. In at least one case, each lens in a dual-pressure linear ion trap is pulsed to induce an electrical response signal in each section of the high-pressure trap and each section of the low-pressure trap. These sections can include, for example, end cap electrodes and ring electrodes. The front section of each trap can include end cap electrodes, the rear section of each trap can include end cap electrodes, and the central section of each trap can include a ring electrode. FIG. 10 shows a graph 800 illustrating the electrical response signals of the front, middle, and rear sections of the high-pressure trap and the low-pressure trap when pulses are sent simultaneously (with a slight delay as discussed herein, although embodiments with no delay, lesser delay, or more delay are contemplated) to three lenses (one positioned before the high-pressure trap (TL1), one positioned between the two traps (TL2), and one positioned after the low-pressure trap (TL3)). As can be seen in graph 800, the order in which pulses are generated in the three lenses TL1, TL2, and TL3 to test each trap section changes the magnitude of the electrical response signal in each trap section. In at least one instance, the assistance module disclosed herein automatically sequences all possible sequences for each trap section to maximize the electrical response signal for each trap section. In another instance, the assistance module disclosed herein retrieves an optimal pulsing order from a database based on the component being tested and uses that order when testing the component.

[0076] Four different lens pulse sequences are illustrated in Figure 10 for each trap section. The left bar of the graph for each section is TL1-TL2-TL3, the center left bar of the graph for each section is TL2-TL1-TL3, the center right bar of the graph for each section is TL2-TL3-TL1, and the right bar of the graph for each section is TL3-TL2-TL1. In at least one instance, the center left bar, representing the TL2-TL1-TL3 sequence, may be comprised of an overall higher signal amplitude than the other sequences illustrated.

[0077] In at least one case, the assistance module disclosed herein selects the component that generates the electrical signal based on the physical distance to the component under test and / or the capacitive coupling relationship between the two. In at least one case, the physical distance is included in a database, and the assistance module disclosed herein selects the test component based on this information, e.g., to maximize the electrical response signal.

[0078] In at least one instance, the support module disclosed herein compares the results of several different components for a single component under test. For example, the support module may run several different tests on the single component under test by generating electrical pulses in various different components of a scientific instrument. The support module disclosed herein may then compare the results of each of the tests and / or view the aggregate of the results to determine the operational state of the component under test. Such an arrangement can serve as a multiple-check verification of the determined operational state of the component under test.

[0079] In at least one instance, the methods and systems disclosed herein are also implemented to test, for example, a quadrupole: Components surrounding the quadrupole can be pulsed while the DC electrical response signal of the quadrupole is monitored.

[0080] In at least one case, Fourier analysis is applied to the electrical response signal by the analysis logic to decompose the signal. Such decomposition can help determine what, exactly, is the problem with respect to a particular component. In at least one case, a more comprehensive analysis of the electrical response signal can help distinguish from noise and / or interference signals induced by capacitive coupling with the methods and systems disclosed herein.

[0081] In at least one instance, the profile of the electrical test pulse is automatically updated over time to maximize the electrical response signal strength in the component under test. In at least one instance, the pulse profile is selected based on the desired electrical response signal of the component under test. The desired electrical response signal may vary depending on the type of problem being detected and / or determined.

[0082] In at least one case, the component to be tested and the component to be pulsed are selected based on their relative capacitive coupling capacitance. In other words, two adjacent components (a first component to be tested and a second component to be pulsed) may provide a combination of components that are closest in physical distance to each other. However, if a third component is farther from the first component than the second component but is larger than the second component, pulsing the third component may induce a larger response signal in the first component due to a combination of its proximity in addition to its size, and therefore its relative capacitive coupling capacitance.

[0083] In at least one case, inductive coupling is used to transfer electrical energy between components.

[0084] The scientific instrument assistance methods disclosed herein may include interactions with a human user (e.g., via a user local computing device 5020 discussed herein with reference to Figure 13). These interactions may include providing the user with information (e.g., information about the operation of the scientific instrument, such as the scientific instrument 5010 of Figure 13, information about a sample being analyzed or other tests or measurements performed by the scientific instrument, information retrieved from a local or remote database, or other information), or providing options for the user to enter commands (e.g., to control the operation of the scientific instrument, such as the scientific instrument 5010 of Figure 13, or to control the analysis of data generated by the scientific instrument), queries (e.g., to a local or remote database), or other information. In some embodiments, these interactions may be implemented through a graphical user interface (GUI) that includes a visual display on a display device (e.g., display device 4010 discussed herein with reference to FIG. 12 ) that provides output to the user and / or prompts the user to provide input (e.g., via one or more input devices, such as a keyboard, mouse, trackpad, or touchscreen included in other I / O devices 4012 discussed herein with reference to FIG. 12 ). The scientific instrument support systems disclosed herein may include any suitable GUI for interaction with a user.

[0085] 11 depicts an exemplary GUI 3000 that may be used in implementing some or all of the assistance methods disclosed herein, according to various embodiments. As noted above, the GUI 3000 may be provided on a display device (e.g., the display device 4010 discussed herein with reference to FIG. 12 ) of a computing device (e.g., the computing device 4000 discussed herein with reference to FIG. 12 ) of a scientific instrument assistance system (e.g., the scientific instrument assistance system 5000 discussed herein with reference to FIG. 13 ), and a user may interact with the GUI 3000 using any suitable input device (e.g., any of the input devices included in the other I / O devices 4012 discussed herein with reference to FIG. 12 ) and input technique (e.g., cursor movement, motion capture, facial recognition, gesture detection, voice recognition, button activation, etc.).

[0086] GUI 3000 may include a data display area 3002, a data analysis area 3004, a scientific instrument control area 3006, and a settings area 3008. The particular number and arrangement of areas depicted in Figure 11 are merely exemplary, and any number and arrangement of areas containing any desired features may be included in GUI 3000.

[0087] The data display area 3002 may display data generated by a scientific instrument (e.g., the scientific instrument 5010 discussed herein with reference to FIG. 13). For example, the data display area 3002 may display potential instrument signal problems, determined component corrections, determined component status, monitored electrical response signals, and / or generated electrical test pulses that trigger diagnostic methods, such as the methods and systems disclosed herein.

[0088] The data analysis area 3004 may display the results of a data analysis (e.g., the results of analyzing the data illustrated in the data display area 3002 and / or other data). For example, the data analysis area 3004 may display, for example, an analysis of an electrical response signal. In some embodiments, the data display area 3002 and the data analysis area 3004 may be combined in the GUI 3000 (e.g., to include data output from a scientific instrument and some analysis of the data in a common graph or area).

[0089] The scientific instrument control area 3006 may include options that allow a user to control the scientific instrument (e.g., the scientific instrument 5010 discussed herein with reference to FIG. 13). For example, the scientific instrument control area 3006 may include component test functionality corresponding to the methods and systems disclosed herein. The control area 3006 may include options, for example, to start a specific component test, to start an overall instrument test in which all components are tested, to select which components to test, to select pulse characteristics, and / or to select a result format.

[0090] Settings area 3008 may include options that allow a user to control features and functions of GUI 3000 (and / or other GUIs) and / or perform common computing operations (e.g., saving data on a storage device such as storage device 4004 discussed herein with reference to FIG. 12 , transmitting data to another user, labeling data, etc.) with respect to data display area 3002 and data analysis area 3004. For example, settings area 3008 may include, for example, setting certain pulse characteristics.

[0091] As noted above, the scientific instrument support module 1000 can be implemented by one or more computing devices. Figure 12 is a block diagram of a computing device 4000 that can implement some or all of the scientific instrument support methods disclosed herein, according to various embodiments. In some embodiments, the scientific instrument support module 1000 can be implemented by a single computing device 4000 or by multiple computing devices 4000. Furthermore, as discussed below, the computing device 4000 (or multiple computing devices 4000) that implements the scientific instrument support module 1000 can be part of one or more of the scientific instrument 5010, user local computing device 5020, service local computing device 5030, or remote computing device 5040 of Figure 13.

[0092] 12 is shown as having many components, any one or more of these components may be omitted or duplicated as appropriate for the application and configuration. In some embodiments, some or all of the components included in computing device 4000 may be mounted on one or more motherboards and enclosed in a housing (e.g., comprising plastic, metal, and / or other materials). In some embodiments, several of these components may be fabricated on a single system-on-chip (SoC) (e.g., an SoC may include one or more processing devices 4002 and one or more storage devices 4004). 12 , but may include interface circuitry (not shown) for coupling to one or more components using any suitable interface (e.g., a Universal Serial Bus (USB) interface, a High-Definition Multimedia Interface (HDMI) interface, a Controller Area Network (CAN) interface, a Serial Peripheral Interface (SPI) interface, an Ethernet interface, a wireless interface, or any other suitable interface). For example, computing device 4000 may not include display device 4010, but may include display device interface circuitry (e.g., connector and driver circuitry) to which display device 4010 may be coupled.

[0093] The computing device 4000 may include a processing device 4002 (e.g., one or more processing devices). As used herein, the term "processing device" may refer to any device or portion of a device that processes electronic data from registers and / or memory and converts the electronic data into other electronic data that may be stored in registers and / or memory. The processing device 4002 may include one or more digital signal processors (DSPs), application specific integrated circuits (ASICs), central processing units (CPUs), graphics processing units (GPUs), cryptographic processors (dedicated processors that execute cryptographic algorithms in hardware), server processors, or any other suitable processing devices.

[0094] The computing device 4000 may include a storage device 4004 (e.g., one or more storage devices). The storage device 4004 may include one or more memory devices, such as random access memory (RAM) (e.g., a static RAM (SRAM) device, a magnetic RAM (MRAM) device, a dynamic RAM (DRAM) device, a resistive RAM (RRAM) device, or a conductive-bridging RAM (CBRAM) device), a hard drive-type memory device, a solid-state memory device, a networked drive, a cloud drive, or any combination of memory devices. In some embodiments, the storage device 4004 may include memory that shares a die with the processing device 4002. In such embodiments, the memory may be used as cache memory and may include, for example, embedded dynamic random access memory (eDRAM) or spin transfer torque magnetic random access memory (STT-MRAM). In some embodiments, storage device 4004 may include a non-transitory computer-readable medium having instructions that, when executed by one or more processing devices (e.g., processing device 4002), cause computing device 4000 to perform any appropriate method or portion thereof of the methods disclosed herein.

[0095] The computing device 4000 may include an interface device 4006 (e.g., one or more interface devices 4006). The interface device 4006 may include one or more communication chips, connectors, and / or other hardware and software for managing communications between the computing device 4000 and other computing devices. For example, the interface device 4006 may include circuitry for managing wireless communications for data transfer to and from the computing device 4000. The term "wireless" and its derivatives may be used to describe circuits, devices, systems, methods, techniques, communication channels, etc. that may communicate data through the use of modulated electromagnetic radiation over a non-solid medium. This term does not imply that the associated devices do not include any wiring, although in some embodiments they may not. The circuitry included in the interface device 4006 for managing wireless communications may implement any of a number of wireless standards or protocols, including, but not limited to, Wi-Fi (IEEE 802.11 family), the IEEE 802.16 standard (e.g., the IEEE 802.16-2005 amendment), Institute for Electrical and Electronic Engineers (IEEE) standards including the Long-Term Evolution (LTE) project with any amendments, updates, and / or revisions (e.g., the Advanced LTE project, the Ultra Mobile Broadband (UMB) project (also referred to as "3GPP2"), etc.).In some embodiments, the circuitry included in the interface device 4006 for managing wireless communications may operate in accordance with a Global System for Mobile Communications (GSM), General Packet Radio Service (GPRS), Universal Mobile Telecommunications System (UMTS), High Speed ​​Packet Access (HSPA), Evolved HSPA (E-HSPA), or LTE network. In some embodiments, the circuitry included in the interface device 4006 for managing wireless communications may operate in accordance with an Enhanced Data for GSM Evolution (EDGE), GSM EDGE Radio Access Network (GERAN), Universal Terrestrial Radio Access Network (UTRAN), or Evolved UTRAN (E-UTRAN). In some embodiments, the circuitry included in interface device 4006 for managing wireless communications may operate in accordance with Code Division Multiple Access (CDMA), Time Division Multiple Access (TDMA), Digital Enhanced Cordless Telecommunications (DECT), Evolution-Data Optimized (EV-DO), and derivatives thereof, as well as any other wireless protocols designated as 3G, 4G, 5G, and beyond. In some embodiments, interface device 4006 may include one or more antennas (e.g., one or more antenna arrays) for receiving and / or transmitting wireless communications.

[0096] In some embodiments, the interface device 4006 may include circuitry for managing wired communications, such as electrical, optical, or any other suitable communications protocol. For example, the interface device 4006 may include circuitry supporting communications according to Ethernet technology. In some embodiments, the interface device 4006 may support both wireless and wired communications and / or multiple wired and / or wireless communications protocols. For example, a first set of circuitry in the interface device 4006 may be dedicated to short-range wireless communications, such as Wi-Fi or Bluetooth, and a second set of circuitry in the interface device 4006 may be dedicated to long-range wireless communications, such as global positioning system (GPS), EDGE, GPRS, CDMA, WiMAX, LTE, EV-DO, or others. In some embodiments, the first set of circuitry in the interface device 4006 may be dedicated to wireless communications and the second set of circuitry in the interface device 4006 may be dedicated to wired communications.

[0097] Computing device 4000 may include battery / power circuitry 4008. Battery / power circuitry 4008 may include one or more energy storage devices (e.g., batteries or capacitors) and / or circuitry for coupling components of computing device 4000 to an energy source (e.g., AC line power) separate from computing device 4000.

[0098] The computing device 4000 may include a display device 4010 (e.g., multiple display devices). The display device 4010 may include any visual indicator, such as a heads-up display, a computer monitor, a projector, a touchscreen display, a liquid crystal display (LCD), a light-emitting diode display, or a flat panel display.

[0099] The computing device 4000 may include other input / output (I / O) devices 4012. The other I / O devices 4012 may include, for example, one or more audio output devices (e.g., speakers, headsets, earphones, alarms, etc.), one or more audio input devices (e.g., microphones or microphone arrays), a location device (e.g., a GPS device that communicates with a satellite-based system to receive the location of the computing device 4000, as is known in the art), an audio codec, a video codec, a printer, sensors (e.g., thermocouples or other temperature sensors, humidity sensors, pressure sensors, vibration sensors, accelerometers, gyroscopes, etc.), an image capture device such as a camera, a keyboard, a cursor control device (e.g., a mouse, stylus, trackball, or touchpad, etc.), a barcode reader, a Quick Response (QR) code reader, or a radio frequency identification (RFID) reader.

[0100] The computing device 4000 may have any form factor suitable for its application and configuration, such as a handheld or mobile computing device (e.g., a mobile phone, smartphone, mobile internet device, tablet computer, laptop computer, netbook computer, ultrabook computer, personal digital assistant (PDA), ultra-mobile personal computer, etc.), a desktop computing device, or a server computing device or other networked computing component.

[0101] One or more computing devices implementing any of the scientific instrument support modules or methods disclosed herein may be part of a scientific instrument support system. Figure 13 is a block diagram of an exemplary scientific instrument support system 5000 in which some or all of the scientific instrument support methods disclosed herein may be implemented, according to various embodiments. The scientific instrument support modules and methods disclosed herein (e.g., scientific instrument support module 300 of Figure 3 and processes 400 and / or 410 of Figures 4 and 5) may be implemented by one or more of the scientific instruments 5010, user local computing devices 5020, service local computing devices 5030, or remote computing devices 5040 of the scientific instrument support system 5000.

[0102] Any of the scientific instrument 5010, the user local computing device 5020, the service local computing device 5030, or the remote computing device 5040 may include any of the embodiments of the computing device 4000 discussed herein with reference to FIG. 12, and any of the scientific instrument 5010, the user local computing device 5020, the service local computing device 5030, or the remote computing device 5040 may take the form of any suitable embodiment of the embodiments of the computing device 4000 discussed herein with reference to FIG. 12.

[0103] The scientific instrument 5010, the user local computing device 5020, the service local computing device 5030, or the remote computing device 5040 may each include a processing device 5002, a storage device 5004, and an interface device 5006. The processing device 5002 may take any suitable form, including any form of the processing device 4002 discussed herein with reference to Figure 12, and the processing devices 5002 included in different ones of the scientific instrument 5010, the user local computing device 5020, the service local computing device 5030, or the remote computing device 5040 may take the same form or different forms. The storage device 5004 may take any suitable form, including any form of the storage device 4004 discussed herein with reference to Figure 12, and the storage devices 5004 included in different ones of the scientific instrument 5010, the user local computing device 5020, the service local computing device 5030, or the remote computing device 5040 may take the same form or different forms. The interface device 5006 may take any suitable form, including any of the forms of the interface device 4006 discussed herein with reference to FIG. 12, and the interface devices 5006 included in different ones of the scientific instrument 5010, the user local computing device 5020, the service local computing device 5030, or the remote computing device 5040 may take the same or different forms.

[0104] The scientific instruments 5010, the user local computing device 5020, the service local computing device 5030, and the remote computing device 5040 may communicate with other elements of the scientific instrument support system 5000 via communication paths 5008. The communication paths 5008 may communicatively couple the interface devices 5006 of different ones of the elements of the scientific instrument support system 5000, as shown, and may be wired or wireless communication paths (e.g., according to any of the communication techniques discussed herein with reference to the interface device 4006 of the computing device 4000 of FIG. 12 ). While the particular scientific instrument support system 5000 depicted in FIG. 13 includes communication paths between each pair of the scientific instruments 5010, the user local computing device 5020, the service local computing device 5030, and the remote computing device 5040, this “fully connected” implementation is merely illustrative, and in various embodiments, various ones of the communication paths 5008 may not be present. For example, in some embodiments, the service local computing device 5030 may not have a direct communication path 5008 between its interface device 5006 and the interface device 5006 of the scientific instrument 5010, but instead may communicate with the scientific instrument 5010 via a communication path 5008 between the service local computing device 5030 and the user local computing device 5020, and a communication path 5008 between the user local computing device 5020 and the scientific instrument 5010.

[0105] The scientific instrument 5010 may include any suitable scientific instrument, such as a mass spectrometer and / or associated environment as disclosed herein.

[0106] The user local computing device 5020 may be a computing device that is local to the user of the scientific instrument 5010 (e.g., according to any of the embodiments of the computing device 4000 discussed herein). In some embodiments, the user local computing device 5020 may also be local to the scientific instrument 5010, but need not be; for example, a user local computing device 5020 in a user's home or office may be remote from but communicate with the scientific instrument 5010 such that the user may use the user local computing device 5020 to control and / or access data from the scientific instrument 5010. In some embodiments, the user local computing device 5020 may be a laptop, smartphone, or tablet device. In some embodiments, the user local computing device 5020 may be a portable computing device.

[0107] The servicing local computing device 5030 may be a computing device (e.g., according to any of the embodiments of computing device 4000 discussed herein) that is local to an entity that provides services to the scientific instrument 5010. For example, the servicing local computing device 5030 may be local to the manufacturer of the scientific instrument 5010 or a third-party service company. In some embodiments, the servicing local computing device 5030 may communicate with the scientific instrument 5010, the user local computing device 5020, and / or the remote computing device 5040 (e.g., via a direct communication path 5008 or via multiple “indirect” communication paths 5008, as discussed above) to receive data regarding the operation of the scientific instrument 5010, the user local computing device 5020, and / or the remote computing device 5040 (e.g., results of self-tests of the scientific instrument 5010, calibration coefficients used by the scientific instrument 5010, measurements of sensors associated with the scientific instrument 5010, etc.). In some embodiments, the service local computing device 5030 may communicate with the scientific instrument 5010, the user local computing device 5020, and / or the remote computing device 5040 (e.g., via a direct communication path 5008 or via multiple "indirect" communication paths 5008, as discussed above) and transmit data to the scientific instrument 5010, the user local computing device 5020, and / or the remote computing device 5040 (e.g., to update programmed instructions such as firmware in the scientific instrument 5010, to initiate the performance of a test or calibration sequence in the scientific instrument 5010, to update programmed instructions such as software in the user local computing device 5020 or the remote computing device 5040, etc.).A user of the scientific instrument 5010 may use the scientific instrument 5010 or the user local computing device 5020 to communicate with the service local computing device 5030 to report a problem with the scientific instrument 5010 or the user local computing device 5020, to request a technician visit to improve the operation of the scientific instrument 5010, to order consumables or replacement parts associated with the scientific instrument 5010, or for other purposes.

[0108] The remote computing device 5040 may be a computing device (e.g., according to any of the embodiments of computing device 4000 discussed herein) that is remote from the scientific instrument 5010 and / or the user local computing device 5020. In some embodiments, the remote computing device 5040 may be included in a data center or other large-scale server environment. In some embodiments, the remote computing device 5040 may include network-attached storage (e.g., as part of the storage device 5004). The remote computing device 5040 may store data generated by the scientific instrument 5010, perform analysis of the data generated by the scientific instrument 5010 (e.g., according to programmed instructions), facilitate communications between the user local computing device 5020 and the scientific instrument 5010, and / or facilitate communications between the service local computing device 5030 and the scientific instrument 5010.

[0109] In some embodiments, one or more of the elements of the scientific instrument support system 5000 illustrated in Figure 13 may not be present. Furthermore, in some embodiments, more than one of various of the elements of the scientific instrument support system 5000 of Figure 13 may be present. For example, the scientific instrument support system 5000 may include multiple user local computing devices 5020 (e.g., different user local computing devices 5020 associated with different users or in different locations). In another example, the scientific instrument support system 5000 may include multiple scientific instruments 5010 that all communicate with a servicing local computing device 5030 and / or a remote computing device 5040; in such embodiments, the servicing local computing device 5030 may monitor these multiple scientific instruments 5010, or the servicing local computing device 5030 may trigger updates or other information to the multiple scientific instruments 5010 simultaneously. Different ones of the scientific instruments 5010 in the scientific instrument support system 5000 may be located near each other (e.g., in the same room) or far from each other (e.g., on different floors of a building, in different buildings, in different cities, etc.). In some embodiments, the scientific instruments 5010 may be connected to an Internet-of-Things (IoT) stack that enables command and control of the scientific instruments 5010 through web-based applications, virtual or augmented reality applications, mobile applications, and / or desktop applications. Any of these applications may be accessed by a user operating a user local computing device 5020 that communicates with the scientific instruments 5010 by way of an intervening remote computing device 5040. In some embodiments, the scientific instruments 5010 may be sold by a manufacturer as part of a local scientific instrument computing unit 5012, along with one or more associated user local computing devices 5020.

[0110] In some embodiments, different ones of the scientific instruments 5010 included in the scientific instrument support system 5000 may be different types of scientific instruments 5010, for example, one scientific instrument 5010 may be a mass spectrometer and another scientific instrument 5010 may include any instrument within electrically coupled components capable of inducing an electrical response signal in one or more other components. In some such embodiments, the remote computing device 5040 and / or the user local computing device 5020 may combine data from different types of scientific instruments 5010 included in the scientific instrument support system 5000. [Example]

[0111] The following paragraphs provide various examples of the embodiments disclosed herein.

[0112] Example 1 is a scientific instrument support device comprising: first logic for generating an electrical signal in a first component of the scientific instrument, the generated electrical signal inducing an electrical response signal in a second component of the scientific instrument through capacitive coupling; second logic for monitoring the induced electrical response signal in the second component; third logic for determining an operating state of the second component based on the monitored electrical response signal, the operating state indicating that the second component is not functioning properly when the monitored electrical response signal is not within a predetermined signal range; and fourth logic for displaying the determined operating state of the second component to a user.

[0113] Example 2 may include the subject matter of Example 1 and may further specify that the scientific instrument support device comprises fifth logic for receiving an input to enable a standby mode of the instrument before generating the electrical signal.

[0114] Example 3 may include the subject matter of example 1 or 2, and may further specify that enabling the standby mode includes setting the first component and the second component to a zero potential before generating the electrical signal.

[0115] Example 4 may include the subject matter of any one of Examples 1-3, and may further specify that when the scientific instrument support device determines that the operational status of the second component indicates that the second component is not functioning properly, the scientific instrument support device comprises: fifth logic for determining a problem with the second component, the problem being based on the monitored electrical response signal; and sixth logic for displaying the determined problem and a recommended fix for the determined problem to a user.

[0116] Example 5 may include the subject matter of any one of Examples 1-4, further wherein the characteristics of the generated electrical signal are selected based on the component type being tested.

[0117] Example 6 may include the subject matter of any one of examples 1-5, and may further specify that the characteristic is one of a signal magnitude, a signal width, or a signal frequency.

[0118] Example 7 may include the subject matter of any one of Examples 1-6, and may further specify that the electrical signal includes an electrical pulse.

[0119] Example 8 may include the subject matter of any one of Examples 1 to 7, and may further specify that the first component includes a plurality of first components.

[0120] Example 9 may include the subject matter of any one of Examples 1 to 8, and may further specify that the second component includes a plurality of second components.

[0121] Example 10 may include the subject matter of any one of Examples 1-9, and may further specify that the electrical signal includes a voltage pulse of about -150V to 150V.

[0122] Example 11 may include the subject matter of any one of Examples 1-10, and may further specify that the first logic generates a second electrical signal in a third component of the scientific instrument; the generated second electrical signal induces a second electrical response signal in a second component of the scientific instrument through capacitive coupling; the second logic monitors the second electrical response signal in the second component; and the third logic determines an operational state of the second component based on the monitored electrical signal and the monitored second electrical response signal.

[0123] Example 12 may include the subject matter of any one of Examples 1-11, and may further specify that the first logic generates a second electrical signal in a second component of the scientific instrument, the generated second electrical signal inducing a second electrical response signal in a third component of the scientific instrument through capacitive coupling, the second logic monitors the second electrical response signal in the third component, and the third logic determines an operational state of the third component based on the monitored second electrical response signal.

[0124] Example 13 may include the subject matter of any one of Examples 1-12, and may further specify that the electrical signal includes a plurality of electrical signals, and the third logic determines the operational state of the second component of the scientific instrument based on an average of monitored currents induced in the second component by the series of electrical test pulses.

[0125] Example 14 may include the subject matter of any one of Examples 1-13, and may further specify that the scientific instrument includes a mass spectrometer, the first component comprises a first ion optical device, and the second component comprises a second ion optical device.

[0126] Example 15 is a method for scientific instrument support, comprising: setting a first component of a scientific instrument and a second component of the scientific instrument to a zero potential; generating a plurality of electrical pulses in the first component to induce an electrical potential in the second component through capacitive coupling; monitoring the electrical potential of the second component induced by the plurality of electrical pulses; determining an operational state of the second component based on the monitored electrical potential of the second component, wherein the operational state is operational when an average of the monitored electrical potentials of the second component induced by the plurality of electrical pulses is within a predetermined range and the operational state is inoperable when the average of the monitored electrical potentials of the second component induced by the plurality of electrical pulses is not within the predetermined range; and providing the determined operational state to a user.

[0127] Example 16 may include one or more non-transitory computer-readable media having instructions that, when executed by one or more processing devices of a scientific instrument support apparatus, cause the scientific instrument support apparatus to perform the method of Example 15.

[0128] Example 17 is a scientific instrument support device comprising: first logic for generating an electrical signal in a first component of the scientific instrument, the generated electrical signal inducing an electrical response signal in a second component of the scientific instrument through capacitive coupling; second logic for monitoring the induced electrical response signal in the second component; third logic for determining an operating state of the second component based on the monitored electrical response signal, the operating state indicating that the second component is not functioning properly when the monitored electrical response signal is not within a predetermined response signal range; and fourth logic for displaying the determined operating state of the second component to a user.

[0129] Example 18 may include the subject matter of Example 17, further comprising: fifth logic for receiving an input for enabling a standby mode of the device before generating the electrical signal.

[0130] Example 19 may include the subject matter of example 17 or 18, wherein enabling the standby mode includes setting the first component and the second component to a zero potential before generating the electrical signal.

[0131] Example 20 may include the subject matter of any one of Examples 17-19, and further includes: upon determining that the operational status of the second component indicates that the second component is not functioning properly, fifth logic for determining a problem with the second component, the problem being based on the monitored electrical response signal; and sixth logic for displaying the determined problem and a recommended fix for the determined problem to a user.

[0132] Example 21 may include the subject matter of any one of Examples 17-20, wherein the characteristics of the generated electrical signal are selected based on the component type being tested.

[0133] Example 22 may include the subject matter of example 21, wherein the characteristic is one of a signal magnitude, a signal width, or a signal frequency.

[0134] Example 23 may include the subject matter of any one of Examples 17-22, wherein the electrical signal includes an electrical pulse generated by a power source connected to the first component.

[0135] Example 24 may include the subject matter of any one of Examples 17 to 23, wherein the first component includes a plurality of the first components.

[0136] Example 25 may include the subject matter of Example 24, wherein the second component includes a plurality of second components.

[0137] Example 26 can include the subject matter of any one of Examples 17-25, wherein the electrical signal includes a voltage pulse of about -150V to about 150V.

[0138] Example 27 may include the subject matter of any one of Examples 17-26, wherein the first logic generates a second electrical signal in a third component of the scientific instrument, the generated second electrical signal inducing a second electrical response signal in the second component of the scientific instrument through capacitive coupling, the second logic monitors the second electrical response signal in the second component, and the third logic determines an operational state of the second component based on the monitored electrical signal and the monitored second electrical response signal.

[0139] Example 28 may include the subject matter of any one of Examples 17-27, wherein the first logic generates a second electrical signal in a second component of the scientific instrument, the generated second electrical signal inducing a second electrical response signal in a third component of the scientific instrument through capacitive coupling, the second logic monitors the second electrical response signal in the third component, and the third logic determines an operational state of the second component based on the monitored second electrical response signal.

[0140] Example 29 may include the subject matter of any one of Examples 17-28, wherein the electrical signal includes a plurality of electrical signals, and the third logic determines an operational state of the second component of the scientific instrument based on an average of monitored electrical response signals induced in the second component by the plurality of electrical signals.

[0141] Example 30 may include the subject matter of any one of Examples 17-29, wherein the scientific instrument includes a mass spectrometer, the first component includes a first ion optical device, and the second component includes a second ion optical device.

[0142] Example 31 is a method for scientific instrument support, the method including: setting a first component of a scientific instrument and a second component of the scientific instrument to a zero potential; generating a plurality of electrical pulses in the first component to induce an electrical response signal in the second component through capacitive coupling; monitoring the electrical response signal of the second component induced by the plurality of electrical pulses; determining an operational state of the second component based on the monitored electrical response signal of the second component, the operational state being operable when an average of the monitored electrical response signals of the second component induced by the plurality of electrical pulses is within a predetermined operating range, and the operational state being inoperable when an average of the monitored electrical response signals of the second component induced by the plurality of electrical pulses is not within the predetermined operating range; and providing the determined operational state.

[0143] Example 32 is one or more non-transitory computer-readable media having instructions that, when executed by one or more processing devices of a scientific instrument support apparatus, cause the scientific instrument support apparatus to perform the method of Example 31.

[0144] Example 33 may include the subject matter of Example 31 or 32, wherein the first component includes a plurality of the first components.

[0145] Example 34 may include the subject matter of any one of Examples 31 to 33, wherein the second component includes a plurality of second components.

[0146] Example 35 is a scientific instrument support device comprising: generating logic for generating an electrical signal in a first component of the scientific instrument; monitoring logic for monitoring an electrical response signal in a second component of the scientific instrument induced by the electrical signal; and determining logic for determining an operational state of the second component based on the monitored electrical response signal.

[0147] Example 36 may include the subject matter of example 35, wherein the at least one characteristic of the electrical signal is selected based on at least one of a component type of the first component or a component type of the second component.

[0148] Example A includes any of the scientific instrument support modules disclosed herein.

[0149] Example B includes any of the methods disclosed herein.

[0150] Example C includes any of the GUIs disclosed herein.

[0151] Example D includes any of the scientific instrument-assisted computing devices and systems disclosed herein.

Claims

1. A scientific instrument support device, comprising: first logic for generating an electrical signal in a first component of a scientific instrument, the generated electrical signal inducing an electrical response signal in a second component of the scientific instrument through capacitive coupling; second logic for monitoring the electrical response signal induced in the second component; third logic for determining an operational state of the second component based on the monitored electrical response signal, the operational state indicating that the second component is not functioning properly when the monitored electrical response signal is not within a predetermined response signal range; and and fourth logic for displaying the determined operational state of the second component to a user.

2. 10. The scientific instrument support device of claim 1, further comprising fifth logic for receiving an input for enabling a standby mode of the instrument before generating the electrical signal.

3. 3. The scientific instrument support system of claim 2, wherein enabling the standby mode comprises setting the first component and the second component to a zero potential before generating the electrical signal.

4. fifth logic that, upon determining that the operational status of the second component indicates that the second component is not functioning properly, determines a problem with the second component, the problem being based on the monitored electrical response signal; and 10. The scientific instrument support apparatus of claim 1, further comprising sixth logic for displaying to a user the determined problem and a recommended fix for the determined problem.

5. 10. The scientific instrument support system of claim 1, wherein characteristics of the generated electrical signal are selected based on the type of component being tested.

6. 6. The scientific instrument support system of claim 5, wherein the characteristic is one of a signal magnitude, a signal width, or a signal frequency.

7. 10. The scientific instrument support system of claim 1, wherein the electrical signal comprises an electrical pulse generated by a power source connected to the first component.

8. The scientific instrument support system of claim 1 , wherein the first component comprises a plurality of first components.

9. The scientific instrument support system of claim 8 , wherein the second component comprises a plurality of second components.

10. 10. The scientific instrument support system of claim 1, wherein the electrical signal comprises a voltage pulse of about -150V to about 150V.

11. the first logic generates a second electrical signal in a third component of the scientific instrument, the generated second electrical signal inducing, through capacitive coupling, a second electrical response signal in the second component of the scientific instrument; the second logic monitors the second electrical response signal in the second component; 10. The scientific instrument support system of claim 1, wherein the third logic determines the operational state of the second component based on the monitored electrical signal and the monitored second electrical response signal.

12. the first logic generates a second electrical signal in the second component of the scientific instrument, the generated second electrical signal inducing, through capacitive coupling, a second electrical response signal in a third component of the scientific instrument; the second logic monitors the second electrical response signal in the third component; 10. The scientific instrument support system of claim 1, wherein the third logic determines the operational state of the second component based on the monitored second electrical response signal.

13. 2. The scientific instrument support device of claim 1, wherein the electrical signal comprises a plurality of electrical signals, and wherein the third logic determines an operational state of the second component of the scientific instrument based on an average of the monitored electrical response signals induced in the second component by the plurality of electrical signals.

14. 10. The scientific instrument support apparatus of claim 1, wherein the scientific instrument comprises a mass spectrometer, the first component comprises a first ion optical device, and the second component comprises a second ion optical device.

15. 1. A method for scientific instrument support, comprising: setting a first component of a scientific instrument and a second component of the scientific instrument to a zero potential; generating a plurality of electrical pulses in the first component to induce an electrical response signal in the second component through capacitive coupling; monitoring the electrical response signals of the second component induced by the plurality of electrical pulses; determining an operational state of the second component based on the monitored electrical response signals of the second component, the operational state being an operable state when an average of the monitored electrical response signals of the second component induced by the plurality of electrical pulses is within a predetermined operating range, and the operational state being an inoperable state when the average of the monitored electrical response signals of the second component induced by the plurality of electrical pulses is not within the predetermined operating range; and providing said determined operating state.

16. 16. One or more non-transitory computer-readable media having instructions thereon that, when executed by one or more processing devices of a scientific instrument support apparatus, cause the scientific instrument support apparatus to perform the method of claim 15.

17. 16. The method for scientific instrument support of claim 15, wherein the first component comprises a plurality of first components.

18. 16. The method for scientific instrument support of claim 15, wherein the second component comprises a plurality of second components.

19. A scientific instrument support device, comprising: generation logic for generating an electrical signal in a first component of the scientific instrument; monitoring logic for monitoring an electrical response signal in a second component of the scientific instrument induced by the electrical signal; and decision logic for determining an operational state of the second component based on the monitored electrical response signal.

20. 20. The scientific instrument support apparatus of claim 19, wherein at least one characteristic of the electrical signal is selected based on at least one of a component type of the first component or a component type of the second component.

Images