Inspection Systems

Abstract

Some embodiments include an inspection system comprising: a radiation source; a radiation detector including an imaging array; a support structure configured to maintain a spatial relationship between the radiation source and the radiation detector; a motion control system configured to move an object relative to the radiation detector; control logic configured to control the motion control system to move the object relative to the radiation detector; and combining data from multiple frames from the radiation detector into a single image as the object moves relative to the radiation detector.

Description

[Background technology]

[0001] Welds in large structures, such as large diameter pipe welds, may be inspected by radiography. A source of radiation and a film or detector may be moved along the weld to produce overlapping images of the weld. The film may need to be developed before inspection. In addition, multiple images may be required, especially for large structures. [Brief description of the drawings]

[0002] [Figure 1A] FIG. 1 is a block diagram of an inspection system according to some embodiments.

[0003] [Figure 1B] 1A-1C are block diagrams of an inspection system at various positions relative to an object in accordance with some embodiments.

[0004] [Diagram 2] FIG. 1 is a block diagram of an inspection system with position feedback according to some embodiments.

[0005] [Diagram 3] FIG. 1 is a block diagram of an inspection system for large diameter pipes, according to some embodiments.

[0006] [Figure 4] FIG. 1 is a block diagram of a welding and inspection system for large diameter pipes, according to some embodiments.

[0007] [Diagram 5] FIG. 2 is a block diagram of an imaging array of an inspection system in accordance with some embodiments.

[0008] [Figure 6] 1 is a flowchart of a technique for inspecting an object, according to some embodiments.

[0009] [Figure 7] 1 is a flowchart of a technique for inspecting an object while it is being welded, according to some embodiments. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0010] Embodiments include an inspection system, some embodiments include large diameter weld inspection with assisted defect recognition using a photon counting detector, automated methods for faster inspection, and data collection using time-delay imaging techniques.

[0011] Large diameter welds may be inspected using film or computed radiography techniques. In some cases, digital radiography is used, but the total inspection time is relatively long. As one example, it may take nearly four hours to inspect a circumferential weld on a 9 meter (m) diameter large diameter pipe using a digital detector array (DDA). Inspection time using film may be much longer. The embodiments described herein may significantly reduce inspection time.

[0012] FIGURE 1A is a block diagram of an inspection system according to some embodiments. FIGURE 1B is a block diagram of an inspection system in various positions relative to an object according to some embodiments. With reference to FIGURES 1A and 1B, inspection system 100 includes a radiation source 110, a radiation detector 112, a support structure 114, a motion control system 116, and control logic 118.

[0013] The radiation source 110 may include an X-ray source (e.g., a 150 kilovolt (kV) X-ray tube), a radioisotope, such as Ir-192, or the like. The radiation detector 112 may include any type of detector corresponding to the type of the radiation source 110. The radiation detector 112 includes an imaging array 140. In some embodiments, the radiation detector 112 may include a direct conversion sensor configured to directly convert the radiation 111 into a signal, including cadmium telluride (CdTe), cadmium zinc telluride (CdZnTe or CZT), selenium, or the like. In some embodiments, the radiation detector 112 includes a conversion screen, a scintillator, or the like, to convert the radiation 111 into a wavelength detectable by the imaging array 140 of the detector 112. For example, the scintillator may include gadolinium oxysulfide (Gd2O2S; GOS; Gadox), terbium doped gadolinium oxysulfide (Gd2O2S:Tb), cesium iodide (CsI), etc. Although several materials of scintillator are used as examples, in other embodiments, the materials may vary depending on the particular radiation 111. In some embodiments, the radiation detector 112 includes a line, linear, or strip scanner or detector, where the width of the detector (e.g., along the Z axis or direction of motion) is 1 to 512 pixels wide, and the length of the detector (e.g., along the Y axis) has ten (10) or one hundred (100) times more pixels than the width. In some embodiments, the radiation detector 112 includes an area detector. For example, in an area detector, the number of pixels in one dimension (e.g., length or width) of a plane is less than ten times the number of pixels in the other dimension (e.g., width or length).

[0014] The support structure 114 is a structure configured to maintain a spatial relationship between the radiation source 110 and the radiation detector 112. A motion control system 116 is coupled to the support structure 114.

[0015] The motion control system 116 is configured to move the object 120 relative to the radiation detector 112. In some embodiments, the support structure 114 is stationary. The motion control system 116 is configured to move the object 120. In some embodiments, the motion control system 116 is configured to move the object 120, e.g., a tube or pipe, in a circular pattern in which the end position may return to the start position. In other embodiments, the support structure 114 is movable and the object 120 is stationary. In some embodiments, the support structure 114 moves in a circular pattern around a circular object 120, e.g., a tube or pipe. In other embodiments, both the support structure 114 and the object are movable by the motion control system 116. The motion control system 116 is configured to move the support structure 114 relative to the object 120.

[0016] The support structure 114 is configured to position the radiation source 110 and the radiation detector 112 in a circumferential relationship to the object 120 such that a region of interest 122 of the object 120 may be inspected. Examples of the object 120 include walls, pipes, etc. The object 120 may include a variety of objects 120, such as planar structures, tubular structures, planar welds, any substantially continuous joint, etc. A substantially continuous joint is a joint that may have some discontinuous portions, but functions as a single joint.

[0017] The control logic 118 may include a general purpose processor, a digital signal processor (DSP), an application specific integrated circuit (ASIC), a microcontroller, a programmable logic device (e.g., a field programmable gate array (FPGA)), discrete circuits, a combination of such devices, etc. The control logic 118 may include interfaces that connect the control logic 118 to internal and external components, such as the radiation source 110, the radiation detector 112, the motion control system 116, etc. The control logic 118 may be configured to control various operations described herein.

[0018] The control logic 118 is configured to control the motion control system 116 to move the object 120 relative to the radiation detector 112. The control logic 118 is configured to acquire multiple frames from the radiation detector 112 as the object 120 moves relative to the radiation detector 112. The control logic 118 is configured to generate a single image 119 from the multiple frames as the object 120 moves relative to the radiation detector 112.

[0019] In some embodiments, the motion control system 116 is configured to move the radiation source 110 and the radiation detector 112 along the surface of the object 120. For example, the motion control system 116 may include tracks, pulleys, pistons, motors, gears, etc. to move the radiation source 110 and the radiation detector 112 in the YZ plane. In some embodiments, the surface of the object 120 may be curved, for example, a pipe or tube. The motion control system 116 may be configured to move the radiation source 110 and the radiation detector 112 so that the X axis is perpendicular to the surface of the object 120 or the YZ plane is tangential to the surface of the object 120.

[0020] The inspection system 100 is shown in three different positions (100-1, 100-2, and 100-3) relative to the object 120. The control logic 118 may cause the motion control system 116 to position the radiation source 110 and the radiation detector 112 in a position 100-1 on a region 124 of the object 120 outside a region of interest 122. For example, the region of interest 122 may include an inspection area, such as a welded joint. The region 124 of the object 120 outside the region of interest 122 may include a portion of the object 120 that is continuous, such as a wall of a pipe that has no welds, openings, or other structures.

[0021] The control logic 118 may be configured to perform an acquisition with the radiation source 110 and the radiation detector 112 on a region 124 of the object 120 outside the region of interest 122. For example, the control logic 118 may be configured to cause the motion control system 116 to move the radiation source 110 and the radiation detector 112 along the Y and Z axes to align with the region 124. The region 124 may be a predetermined position, a position designated by a user of the inspection system 100, etc. Once in the region 124, the control logic 118 may be configured to cause the radiation source 110 to emit radiation 111 that penetrates the region 124 of the object 120 and is detected by the radiation detector 112.

[0022] The control logic 118 may be configured to perform a calibration procedure based on an acquisition of a region 124 of the object 120 outside the region of interest 124. For example, the acquisition of the region 124 may be used to perform a gain calibration.

[0023] The control logic 118 may be configured to cause the motion control system 116 to move the radiation source 110 and the radiation detector 112 to a position 100-2, where the radiation source 110 and the radiation detector 112 are positioned to acquire frames based on a portion of the region of interest 122. The control logic 118 may be configured to cause the motion control system 116 to move the radiation source 110 and the radiation detector 112 to a different position 100-3, where the radiation source 110 and the radiation detector 112 are positioned to acquire frames based on a different portion of the region of interest 122. In this example, the movement from the position 100-2 to the position 100-3 is along the Z axis. However, the movement to the various positions may be along different axes, combinations of axes, include rotation, etc. Different location 100-3 is shown significantly offset from location 100-2; however, the offset may be on the order of a pixel pitch, multiple pixels, etc.

[0024] As described above, a calibration procedure may have been performed in region 124. Control logic 118 may be configured to adjust the frames of data from locations 100-2, 100-3, etc. For example, contributions from the thickness of object 120, variations in gain of imaging array 140, variations in intensity of radiation 111, etc. may be reduced or eliminated from the resulting image 119.

[0025] In some embodiments, the calibration procedure may be performed without removing the inspection system 100 from around the object 120. In some embodiments, the calibration procedure is performed without performing the calibration without the object 120 being between the radiation source 110 and the radiation detector 112; however, in some embodiments, the calibration process may use some data from the calibration procedure without the object 120 being present. For example, the radiation source 110 and the radiation detector 112 may be moved to a position 100-1 on the object 120 to perform the calibration. The radiation source 110 and the radiation detector 112 may then be moved to a position 100-2 to begin inspecting the region of interest 122. For inspection of large diameter pipes, it may be difficult, time consuming, etc. to pull the radiation detector 112, the radiation source 110, and / or the entire inspection system 100 outside the object 120 just for gain calibration.

[0026] In some embodiments, the control logic 118 is configured to operate the radiation source 110 and the radiation detector 112 using a step-and-expose technique. For example, the control logic 118 may cause the motion control system 116 to move the radiation source 110 and the radiation detector 112 a step distance, e.g., a pixel width of the radiation detector 112, the width of a series of pixels, etc. While the radiation source 110 and the radiation detector 112 are moving, a frame may be acquired by the control logic 118. The control logic 118 may then cause the motion control system 116 to move the radiation source 110 and the radiation detector 112 the step distance and repeat the acquisition of the frame. The technique may be repeated such that frames are acquired from the entire region of interest 112 and may be combined into a single image 119.

[0027] In some embodiments, the control logic 118 is configured to control the motion control system 116 to move the object 120 substantially continuously relative to the radiation detector 112. Frames from the radiation detector 112 may be acquired while the object 120 moves substantially continuously relative to the radiation detector 112. The frames may be combined into a single image 119. That is, instead of stopping the motion of the radiation source 110 and the radiation detector 112 relative to the object 120 when a frame is acquired with the radiation detector 112, frames may be acquired as the object 120 moves relative to the radiation source 110 and the radiation detector 112. "Substantially" when used in reference to moving the object 120 continuously or at a constant speed may include some variation in speed, for example, about + / - 10% variation.

[0028] In a particular example, the radiation detector 112 is a photon-counting based direct conversion detector. The control logic 118 may be configured to operate the radiation detector 112 in a time delayed integration (TDI) mode. TDI, when applied to a photon-counting detector, may be referred to as time delayed summation (TDS). As the object 120 is moved substantially continuously relative to the radiation source 110 and the radiation detector 112, images may be acquired such that a subsequent image is acquired at a time substantially after the object 120 has moved in the direction of motion by the pitch of a pixel of the imaging array. "Substantially" when used with respect to image acquisition time may include latency processing delays. TDI is the process of adding or summing together multiple exposures of the same point on the object as it passes the detector. A multiple exposure is the readout from successive or subsequent rows of pixels along the direction of motion, which are added together (in a register) until all rows relating to the same point on the object are summed, which is then combined with other summed exposures to produce an image 119. Conventionally, 2 to 512 rows of pixels may be used in TDI. The TDI mode not only allows images to be taken of fast moving objects, but it also allows images of objects to be taken using low x-ray doses.

[0029] In some embodiments, the control logic 118 is not synchronized with the motion control system 116. For example, the motion control system 116 may be configured to move the object 120 relative to the radiation detector 112 at a velocity that is substantially constant but has some variation, for example, about + / - 10% variation. However, the control logic 118 may have no sensing or feedback related to the actual velocity. As described in more detail below, the control logic 118 may operate the detector in a manner that takes into account the uncertainty in the velocity. In some embodiments, the calibration procedure may be performed while the object 120 is in motion. A calibration feature, such as a washer, cylinder, etc., having known dimensions may be attached to the object 120. The control of the acquisition of the frames by the control logic 118 may be adjusted so that the dimensions of the features in the single image 119 are substantially proportional to the actual dimensions of the features. In some embodiments, the calibration performed using the region 124 as described above is performed with the object 120 stationary, but may be used for frames acquired when the object 120 is in motion. Substantially proportional includes variations within the mechanical tolerances of the resolution and features of the radiation detector 112.

[0030] In some embodiments, the radiation detector 112 used in TDI mode may achieve threshold image quality at a speed of 1 inch (25.4 mm) per second (in / s) or faster. Inspection at this speed may result in a desired image quality that is higher than the threshold. One example of threshold image quality is a desired basic spatial resolution (BSR), such as 100 microns (100 micrometers), 80 microns (80 micrometers), 50 microns (50 micrometers), etc.

[0031] In some embodiments, the inspection may be performed at a faster speed (e.g., 2 in / s (50.8 mm / s) or higher) using a two-step process. For example, the control logic 118 may be configured to cause the motion control system 116 to move the object 120 at a first speed. The first speed may be faster than a threshold speed. The threshold speed may include a speed above which an acquired image may have insufficient quality for inspection for defects. For example, the threshold speed may be about 1.5 in / s (38.1 mm / s) and the first speed may be 2 in / s (50.8 mm / s). The first speed may be a speed at which potential defects in the object 120 may still be identified but the image quality is lower than is desirable for inspection for defects.

[0032] In response to the defect indication, the control logic 118 is configured to cause the motion control system 116 to move the object 120 at a second speed slower than the first speed. The second speed may be slower than a threshold speed. As a result, the object 120 may move relative to the radiation source 110 and the radiation detector 112 at a speed at which a desired image quality may be obtained. The faster first speed may be used for screening defects. Once a potential defect is identified, the specific area may be imaged at a slower second speed to obtain a final desired image quality. Although 2 in / s (50.8 mm / s) and 1 in / s (25.4 mm / s) were used as examples of inspection speeds and 1.5 in / s (38.1 mm / s) was used as one example of a threshold speed, the inspection speed and the threshold speed may vary. For example, the second speed may be faster and the first speed may be slower. In another example, the second speed setting may be slower and the first speed setting may be faster, where the second speed is still slower than the first speed.

[0033] In some embodiments, the inspection system 100 may operate in an automated mode to continuously acquire images 119 as the object 120 is in motion. For example, an operator may initiate the inspection process. The inspection system 100 may automatically take radiographs of the entire region of interest 122 without any manual intervention. Finally, the images 119 may be presented as a series of images or a single image that can be scrolled up, down, left, right, panned in multiple dimensions, etc. to inspect the entire image 119.

[0034] Other techniques, such as film, computed radiography, or a-Si (amorphous silicon) based indirect digital detector arrays, may have significantly longer inspection times compared to the various embodiments described herein. Area detectors using step-and-expose may take longer.

[0035] 2 is a block diagram of an inspection system with position feedback, according to some embodiments. The inspection system 100a may be similar to the inspection system 100, etc. However, the inspection system 100a includes a position sensor 150 configured to determine a position of the object 120 relative to the radiation detector 112. Although the position sensor 150 is illustrated as part of the motion control system 116, in other embodiments, the position sensor 150 may be a separate component, part of the support structure 114, or some other part of the inspection system 100a. Although the position sensor 150 is described as the only sensor, the position sensor 150 may be configured to sense the position and / or orientation of the radiation source 110 and the radiation detector 112 relative to the object 120.

[0036] Position sensor 150 may include any device capable of determining the relative position of radiation source 110 and radiation detector 112 with respect to object 120. For example, position sensor 150 may include encoders that are part of or attached to motors of motion control system 116 configured to move object 120. In some embodiments, position sensor 150 may include a sensor configured to detect regular indicia on object 120.

[0037] In some embodiments, the control logic 118 is configured to control the motion control system 116 based on the position sensor 150. In some embodiments, the control logic 118 may be configured to determine a position of the object 120 relative to the radiation source 110 and the radiation detector 112. The control logic 118 may trigger acquisition of a frame after the object has moved a predetermined distance. The predetermined distance may be based on the pixel pitch of the imaging array 140, a multiple of the pixel pitch, etc. In some embodiments, the control logic 118 may be configured to obtain a velocity from the position sensor 150. The control logic 118 may be configured to control a frequency of acquiring frames using the radiation detector 112 based on the velocity. The frequency may include a rate at which frames are acquired such that the features described above have substantially the same dimensions as in the image 119. In another example, the control logic 118 may be configured to obtain a position from the position sensor 150, convert the position to a velocity, and control acquisition of frames as described above.

[0038] In some embodiments, the relative velocity of the inspection system with respect to the object being scanned may not be controlled by feedback, may have significant variability, etc. For example, the object 120 may be moved, such as by being rotated. In one example where the object 120 is a pipe or tube or hollow cylinder, the object may be rotated by a roller mechanism. The linear velocity of the object moving past the imaging system may vary by only about + / - 10% or more. Accordingly, TDI may result in artifacts, reduced effective resolution, reduced contrast-to-noise ratio, or otherwise reduced image quality.

[0039] In some embodiments, a feedback loop may be created between the inspection system and the object such that the summation of data, the average of data, or other combination of data may be based on the relative velocity of the object. For example, the time at which a frame is acquired, the position of pixels that are combined, etc. may be modified based on the relative velocity.

[0040] FIG. 3 is a block diagram of an inspection system for large diameter pipes, according to some embodiments. In some embodiments, the inspection system 100b may be similar to the inspection systems 100, 100a, etc., as described above. The inspection system 100b may be used to inspect the weld 122a on the large diameter pipe 120a. The support structure 114 may include two telescopic sections 114a and 114b configured to adjust the height along the Y axis. The motion control system 116 may be configured to rotate the pipe 120a about a major axis of the pipe that extends parallel to the Y axis. The weld 122a may be substantially parallel to the XZ plane. Substantially parallel may include some variation along the length, for example, variation due to manufacturing the ends of the sections of the pipes 120a-1 and 120a-2. As the pipe 120a is rotated, a portion of the weld 122a may pass between the radiation source 110 and the radiation detector 112. The inspection may be performed along the entire circumference of the pipe 120a.

[0041] The radiation source 110 may be located outside the pipe 120a. The radiation detector 112 may be located inside the pipe 120a, as shown by the dashed lines. However, in other embodiments, the positions of the radiation source 110 and the radiation detector 112 may be reversed.

[0042] In some embodiments, the inspection system may be used for any pipe 120a geometry-based inspection where the pipe 120a can be moved or rotated at a substantially constant speed with access to surfaces on both sides of the pipe 120a.

[0043] 4 is a block diagram of a welding and inspection system for large diameter pipes, according to some embodiments. In some embodiments, the welding and inspection system 100c may be similar to the inspection system 100b of FIG. 3, as described above, or the like. However, the welding and inspection system 100c includes a welder 130 that is supported by a support structure 114. Although the welder 130 is illustrated as being outside the pipe 120a, in other embodiments, the welder 130 may be located inside the pipe 120a or may include components both inside and outside the pipe 120a.

[0044] The welder 130 may include a device configured to weld the two sections of pipe 120a-1 and 120a-2 together. Examples of the welder 130 include a tungsten inert gas (TIG) welder, a metal inert gas (MIG) welder, an arc welder, etc.

[0045] The motion control system 116 is configured to move the radiation source 110 and the radiation detector 112 with the welder 130 such that the radiation detector 112 passes over the portion of the pipe 120a after the welder 130. As a result, the inspection of the weld 122a may be performed substantially concurrently with the welding to reduce the total time to form and inspect the weld 122a and reduce the total production time. Performed substantially concurrently includes at least some of the inspection being performed using the radiation source 110 and the radiation detector 112 while at least some of the portion is being welded by the welder 130.

[0046] As one example, desirable image quality on a weld radiograph may be obtained when the speed of motion of a large diameter pipe is set to rotate at 1 inch (25.4 mm) per second (in / s), which means that the inspection time for a 9 m diameter pipe may be reduced from 4 hours to about 20 minutes.

[0047] In some embodiments, inspection system speed and / or parallel processing of welding and inspection may reduce or eliminate the inspection process as a production bottleneck. The inspection operation may be comparable in speed to or faster than the actual welding process. However, even if the inspection process is slower than the welding process, the welding process may be slowed down but still run substantially in parallel with the inspection.

[0048] FIG. 5 is a block diagram of an imaging array of an inspection system according to some embodiments. Referring to FIGS. 1A, 1B, and 5, in some embodiments, TDI may be performed on a detector where the set of pixels used for TDI is smaller than the entire imaging array 140. For example, the imaging array may include pixel 142. Pixel 142 may be divided into two subsets 142a and 142b. The dimension of subset 142a of array 140 may be shorter in the direction of object motion relative to the overall length of array 140, where the direction of motion may be along the Z axis. The dimension of subset 142a along the Z axis is smaller than the dimension of pixel 142. The dimension may be the number of pixels, the physical length of the pixel, etc. For example, for an array having 512 pixels in the direction of motion, control logic 118 is configured to use data from only 60 pixels to generate the combined data together. As a result, the effect of variations in the speed of object motion on the contrast-to-noise ratio or other image quality factors may be reduced.

[0049] In some embodiments, the dimensions of the subset 142a in the direction of object 120 motion may be selected based on the desired image quality. As the dimensions increase, the number of pixels providing combined data increases, resulting in improved image quality. However, increasing the number of pixels in the subset 142a may increase the system's vulnerability to variations in the velocity of the object 120 relative to the radiation detector 112. In some embodiments, the number of pixels may be selected to achieve a contrast-to-noise ratio above a threshold, e.g., 2, 2.5, 10, or higher, in line with expected variations in velocity. In some embodiments, the number of pixels, the dimensions of the subset 142a of the imaging array 140 in the direction of object motion, and / or other parameters of the TDI operation may be selected based on a desired base spatial resolution (BSR), e.g., 100 microns (100 micrometers), 80 microns (80 micrometers), 50 microns (50 micrometers), etc., based on the velocity of the object 120 in the direction of motion, or based on other factors. The control logic 118 and / or the radiation detector 112 may determine the contrast-to-noise ratio and the BSR during calibration for imaging the object 120, and the control logic 118 may select a desired contrast-to-noise ratio and a desired BSR.

[0050] In some embodiments, the inspection system may reduce the time it takes for an inspector to interpret data and assign a PASS / FAIL disposition. In conventional inspection techniques, an inspector must inspect a series of images to cover an entire region of interest of the object 120, e.g., the complete circumference of the pipe 120a. This may be a time-consuming process. There may be some amount of redundancy in the inspected data due to overlap in areas between adjacent images. That is, adjacent images may overlap to ensure that the entire region of interest is imaged. Thus, the inspector may inspect the same portion of the region of interest twice.

[0051] In some embodiments, the images 119 are available to the operator as the scan is performed. Additionally, the inspector may review one large image 119 for a given object 120. A single image 119 may make data management easier. As one example, for a 9m diameter pipe 120a, only one image may need to be inspected, compared to 100 or more radiographs.

[0052] In some embodiments, the inspection system may be configured to provide a portion of the scanned object as the scan is being performed. For example, data that would contribute to a section of the weld may be obtained as a particular area of ​​the weld is scanned over time after a point in time but before the entire scan is completed. That data may be combined as described above and used to generate a partial image of the weld. That partial image may be provided to the inspector for interpretation. Thus, the inspector may not need to wait until the entire process is completed.

[0053] FIG. 6 is a flow chart of a technique for inspecting an object according to some embodiments. The inspection system 100 of FIG. 1A and FIG. 1B is used as an example. With reference to FIG. 1 and FIG. 6, in 602, the radiation source 110 is positioned adjacent to the object 120. In 606, the radiation detector 112 is positioned to receive radiation 111 from the radiation source that has been transmitted through the object 120. Examples of positioning the radiation source 110 and the radiation detector 112 in 602 and 606 include moving the radiation source 110 and the radiation detector 112 to a position 110-2 using the motion control system 116 and / or other components of the support structure 114. The radiation source 110 and the radiation detector 112 may be positioned to be on opposite sides of the region of interest 122, e.g., the weld 122a, from each other. The radiation source 110 and the radiation detector 112 may be positioned in other ways as described above.

[0054] At 610, the radiation source 110 and the radiation detector 112 are moved relative to the object 120. At 614, multiple frames are acquired from the radiation detector 112 as the radiation source 110 and the radiation detector 112 move relative to the object 120. For example, the object 120 and / or the radiation source 110 and the radiation detector 112 may be moved by the motion control system 116 and / or the support structure 114 and data may be acquired as described above.

[0055] At 618, the multiple frames are combined into a single image 119. The control logic 118 may be configured to combine the multiple frames as described above.

[0056] FIG. 7 is a flow chart of a technique for inspecting an object while welding the object, according to some embodiments. The welding and inspection system 100c of FIG. 4 is used as an example. With reference to FIGS. 3 and 7, the operation may be similar to that described above with respect to FIG. 6. However, at 612, welding is performed along the object 120 as the radiation source 110 and the radiation detector 112 move relative to the object 120. Although welding of a pipe 120a is used as an example, welding and inspection may be performed on other structures.

[0057] The inspection system comprises: a radiation source 110; a radiation detector 112 including an imaging array 140; a support structure 114 configured to maintain a spatial relationship between the radiation source 110 and the radiation detector 112; a motion control system 116 configured to move the object 120 relative to the radiation detector 112; control logic configured to control the motion control system 116 to move the object 120 relative to the radiation detector 112; and control logic configured to combine data from multiple frames from the radiation detector 112 into a single image 119 as the object 120 moves relative to the radiation detector 112.

[0058] In some embodiments, the frame rate of the radiation detector 112 is calibrated based on calibration features of the object 120 while the object 120 moves relative to the radiation detector 112 .

[0059] In some embodiments, the control logic controls the motion control system 116 to move the object 120 substantially continuously relative to the radiation detector 112; and is further configured to combine data from multiple frames from the radiation detector 112 into a single image 119 as the object 120 moves substantially continuously relative to the radiation detector 112.

[0060] In some embodiments, the support structure 114 is configured to support the welder 130; the motion control system 116 is configured to move the radiation detector 112 together with the welder 130 so that the radiation detector 112 passes over a portion of the object 120 behind the welder 130.

[0061] In some embodiments, the control logic is further configured to: combine data from the subsets of the imaging arrays 140 into a single image 119.

[0062] In some embodiments, the size of the subset of imaging array 140 in the direction of motion of object 120 is based on a threshold contrast-to-noise ratio.

[0063] In some embodiments, the size of the subset of imaging array 140 in the direction of object 120 motion is based on the variability in the velocity of object 120 in the direction of object 120 motion.

[0064] In some embodiments, the dimensions of the subset of imaging array 140 in the direction of motion of object 120 are based on at least one of a threshold contrast-to-noise ratio and a threshold fundamental spatial resolution.

[0065] In some embodiments, the control logic is asynchronous to the motion control system 116 .

[0066] In some embodiments, the control logic is configured to combine data from multiple frames from the radiation detectors 112 into a single image 119 based on the rate of motion of the object 120 .

[0067] In some embodiments, the control logic is further configured to combine data from the subsets of the imaging arrays 140 using time delay integration (TDI).

[0068] In some embodiments, the control logic is further configured to: perform acquisition for a region of the object 120 outside the region of interest; and perform a calibration procedure based on the acquisition of the region of the object 120 outside the region of interest.

[0069] In some embodiments, the control logic is further configured to: set a frame rate of the detection acquisition based on a proportional dimension of the calibration feature in the calibration procedure.

[0070] In some embodiments, the control logic is further configured to: control the movement of the object 120 to move at a first velocity; and in response to an indication of a defect, control the movement of the object 120 to move at a second velocity slower than the first velocity.

[0071] In some embodiments, the inspection system further comprises a position sensor 150 configured to determine a position of the object 120 relative to the radiation detector 112; wherein the control logic is configured to control the motion control system 116 based on the position sensor 150.

[0072] The method comprises the steps of: positioning a radiation source 110 adjacent to an object 120; positioning a radiation detector 112 to receive radiation from the radiation source 110 that has passed through the object 120; moving the radiation source 110 and the radiation detector 112 relative to the object 120; and acquiring multiple frames from the radiation detector 112 as the radiation source 110 and the radiation detector 112 move relative to the object 120; and combining the multiple frames into a single image 119.

[0073] In some embodiments, moving the radiation source 110 and the radiation detector 112 relative to the object 120 includes moving the radiation source 110 and the radiation detector 112 substantially continuously relative to the object 120; acquiring multiple frames from the radiation detector 112 as the radiation source 110 and the radiation detector 112 move relative to the object 120 includes acquiring multiple frames from the radiation detector 112 as the radiation source 110 and the radiation detector 112 move substantially continuously relative to the object 120.

[0074] In some embodiments, the method further comprises welding along the object 120 as the radiation source 110 and the radiation detector 112 move relative to the object 120 .

[0075] In some embodiments, acquiring multiple frames from the radiation detector 112 as the radiation source 110 and the radiation detector 112 move relative to the object 120 includes acquiring the multiple frames using a subset of the imaging array 140 of the radiation detector 112.

[0076] In some embodiments, combining multiple frames into a single image 119 includes combining multiple acquisitions using time delay integration (TDI).

[0077] 1. An inspection system comprising: a means for generating radiation; a means for detecting radiation from the means for generating radiation that has passed through an object; a means for moving the means for generating radiation and the means for detecting radiation relative to the object; a means for acquiring a plurality of frames from the means for detecting radiation as the means for generating radiation and the means for detecting radiation move relative to the object; and a means for combining data from the plurality of frames into a single image as the object moves relative to the means for detecting radiation.

[0078] An example of a means for generating radiation includes a radiation source 110 .

[0079] An example of a means for detecting radiation transmitted through an object from a means for generating radiation includes a radiation detector 112 .

[0080] Examples of means for moving the means for generating radiation and the means for detecting radiation relative to the object include a support structure 114 and a motion control system 116 .

[0081] Examples of the means for generating radiation and the means for acquiring multiple frames from the means for detecting radiation as the means for detecting radiation moves relative to the object include the radiation detector 112 and the control logic 118.

[0082] An example of a means for combining data from multiple frames into a single image as an object moves relative to the means for detecting radiation includes the radiation detector 112 and control logic 118 .

[0083] In some embodiments, the inspection system further comprises a means for performing time delay integration using multiple acquisitions. An example of a means for performing time delay integration using multiple acquisitions includes the radiation detector 112 and the control logic 118.

[0084] Although structures, devices, methods, and systems have been described in accordance with specific embodiments, one skilled in the art will readily recognize that many variations to the specific embodiments are possible, and thus any variations should be considered within the spirit and scope of the disclosure herein. Accordingly, many modifications may be made by one skilled in the art without departing from the spirit and scope of the appended claims.

[0085] The claims following this written disclosure are hereby expressly incorporated into this written disclosure, with each claim standing on its own as a separate embodiment. This disclosure includes all permutations of independent claims with their dependent claims. Furthermore, additional embodiments that may be derived from the independent and dependent claims described below are also expressly incorporated into this written specification. These additional embodiments are determined by replacing the dependency of a given dependent claim with the words "any one of the claims beginning with claim [x] and ending with the claim that immediately precedes this claim," where the bracketed term "[x]" is replaced with the number of the most recently described independent claim. For example, with respect to a first claim set beginning with independent claim 1, claim 4 may depend on either claim 1 or claim 3, with these separate dependencies resulting in two separate embodiments; claim 5 may depend on either claim 1, claim 3 or claim 4, with these separate dependencies resulting in three separate embodiments; claim 6 may depend on either claim 1, claim 3, claim 4 or claim 5, with these separate dependencies resulting in four separate embodiments; and so on.

[0086] The recitation in a claim of the term "first" with respect to a feature or element does not necessarily imply the presence of a second or additional such feature or element. Elements specifically described in means-plus-function form are intended to be construed to include the corresponding structure, material, or acts described herein, if present, and their equivalents pursuant to 35 U.S.C. §112(f). The embodiments of the invention in which an exclusive property or privilege is claimed are defined as follows:

Claims

1. radiation source; a radiation detector including an imaging array; a support structure configured to maintain a spatial relationship between the radiation source and the radiation detector; a motion control system configured to move an object relative to the radiation detector; controlling the motion control system to move the object relative to the radiation detector; Combining data from multiple frames from the radiation detector into a single image as the object moves relative to the radiation detector. The control logic is configured as follows: An inspection system comprising:

2. calibrating a frame rate of the radiation detector based on calibration features of the object while the object is moving relative to the radiation detector; The inspection system of claim 1 .

3. The control logic includes: controlling the motion control system to substantially continuously move the object relative to the radiation detector; Combining the data from multiple frames from the radiation detector into a single image as the object moves substantially continuously relative to the radiation detector. The inspection system of claim 1 , further configured to:

4. the support structure configured to support a welder; the motion control system is configured to move the radiation detector with the welder such that the radiation detector passes over a portion of the object behind the welder. The inspection system of claim 1 .

5. The control logic: Combining data from a subset of said imaging arrays into said single image. The inspection system of claim 1 , further configured to:

6. The inspection system of claim 5 , wherein a dimension of the subset of the imaging arrays in the direction of the object's motion is based on a threshold contrast-to-noise ratio.

7. The inspection system of claim 5 , wherein a dimension of the subset of the imaging arrays in a direction of motion of the object is based on a variability in a velocity of the object in the direction of motion of the object.

8. The inspection system of claim 5 , wherein a dimension of the subset of the imaging arrays in a direction of the object's motion is based on at least one of a threshold contrast-to-noise ratio and a threshold fundamental spatial resolution.

9. The inspection system of claim 8 , wherein the control logic is asynchronous to the motion control system.

10. The inspection system of claim 1 , wherein the control logic is configured to combine data from the multiple frames from the radiation detector into the single image based on a velocity of the object's motion.

11. The control logic: Combining data from a subset of said imaging arrays using time delay integration (TDI) The inspection system of claim 1 , further configured to:

12. The control logic: performing an acquisition on a region of the object outside a region of interest; performing a calibration procedure based on the acquisition of the region of the object outside the region of interest. The inspection system of claim 1 , further configured to:

13. The control logic: Setting the frame rate of the detection acquisition based on the proportional dimensions of the calibration features in the calibration procedure The inspection system of claim 11 further configured to:

14. The control logic: Controlling movement of the object to move at a first velocity; In response to an indication of a defect, the movement of the object is controlled to move at a second speed that is slower than the first speed. The inspection system of claim 1 , further configured to:

15. a position sensor configured to determine a position of the object relative to the radiation detector; Further comprising: the control logic is configured to control the motion control system based on the position sensor. The inspection system of claim 1 .

16. Positioning a radiation source adjacent to the object; positioning a radiation detector to receive radiation from the radiation source that has passed through the object; moving the radiation source and the radiation detector relative to the object; and acquiring a plurality of frames from the radiation detector as the radiation source and the radiation detector move relative to the object; and Combining the multiple frames into a single image. A method comprising:

17. moving the radiation source and the radiation detector relative to the object comprises moving the radiation source and the radiation detector substantially continuously relative to the object; acquiring the plurality of frames from the radiation detector as the radiation source and the radiation detector move relative to the object comprises acquiring the plurality of frames from the radiation detector as the radiation source and the radiation detector move substantially continuously relative to the object.

17. The method of claim 16.

18. welding along the object as the radiation source and the radiation detector move relative to the object. The method of claim 16 further comprising:

19. acquiring the plurality of frames from the radiation detector as the radiation source and the radiation detector move relative to the object comprises acquiring the plurality of frames using a subset of an imaging array of the radiation detector.

17. The method of claim 16.

20. combining the multiple frames into a single image includes combining the acquired multiple frames using time delay integration (TDI).

17. The method of claim 16.

21. means for generating radiation; means for detecting radiation from said means for producing radiation that has passed through an object; means for moving the means for generating radiation and the means for detecting radiation relative to the object; means for acquiring a plurality of frames from the means for detecting radiation as the means for generating radiation and the means for detecting radiation move relative to the object; and means for combining data from the multiple frames into a single image as the object moves relative to the means for detecting radiation An inspection system comprising:

22. means for performing time delay integration using said acquired plurality of frames; 22. The inspection system of claim 21 further comprising:

Images