Temperature measuring apparatus and method, computer device, and storage medium

Abstract

The present application relates to a temperature measurement apparatus and method, a computer device, and a storage medium. The temperature measurement apparatus includes a susceptor (100), an oscillator circuit (200), and a controller (300), in which the susceptor (100) is coupled to the oscillator circuit (200), and the controller (300) acquires electrical parameters of the oscillator circuit (200) and calculates the temperature of the susceptor (100) based on the electrical parameters.

Description

[Technical field]

[0001] (CROSS REFERENCE TO RELATED APPLICATIONS) This application claims priority to a Chinese patent application bearing application number 2022104620046 and entitled "Temperature Measuring Apparatus and Method" filed with the State Intellectual Property Office of the People's Republic of China on April 28, 2022, the entire contents of which are incorporated herein by reference.

[0002] The present application relates to the field of temperature measurement, and in particular to temperature measurement apparatus and methods, computer devices, and storage media. [Background technology]

[0003] Currently, non-combustion heated atomizers are increasingly becoming popular with consumers. Non-combustion heated atomizers generate aerosols by baking solid aerosol substrates at low temperatures, which are then inhaled by the user. The heating temperature is controlled by a precise electronic chip, allowing the aerosol generated by the non-combustion heated atomizer to contain the desired components.

[0004] Therefore, in a non-combustion heating type atomizing device, how to sense the temperature of the heating element is particularly important. Summary of the Invention

[0005] The temperature measuring device includes a susceptor, an oscillator circuit, and a controller, the susceptor being coupled to the oscillator circuit, and the controller acquiring electrical parameters of the oscillator circuit and calculating a temperature of the susceptor based on the electrical parameters.

[0006] In one embodiment, the electrical parameters include a current characteristic in the oscillator circuit.

[0007] In one embodiment, the electrical parameters include a voltage characteristic in the oscillator circuit.

[0008] In one embodiment, the controller obtains the electrical parameter at a monitoring point provided in the oscillator circuit.

[0009] In one embodiment, the susceptor is a ferromagnetic material.

[0010] In one embodiment, the oscillator circuit includes a first capacitor and a first inductor, the first capacitor being connected in series with the first inductor, and the susceptor being coupled to the first inductor.

[0011] In one embodiment, the oscillator circuit includes a first capacitor and a first inductor, the first capacitor is connected in parallel with the first inductor, and the susceptor is coupled to the first inductor.

[0012] In one embodiment, the device further comprises a power supply circuit, the oscillator circuit being connected to the power supply circuit.

[0013] In one embodiment, the power supply circuit includes a second capacitor, a first end of the second capacitor receiving electrical energy and connected to the oscillator circuit, and a second end of the second capacitor connected to ground.

[0014] In one embodiment, the temperature measuring device further includes a switching element, a first end of the switching element being connected to the power supply circuit or ground, and a second end of the switching element being connected to the oscillator circuit.

[0015] The temperature measurement method is obtaining electrical parameters of the oscillator circuit; and calculating a temperature of a susceptor coupled to the oscillator circuit based on the electrical parameters.

[0016] In one embodiment, the electrical parameters include a current characteristic in the oscillator circuit.

[0017] In one embodiment, the electrical parameters include a voltage characteristic in the oscillator circuit.

[0018] The computing device includes a memory and a processor, the memory stores a computer program, and the processor, when executing the computer program, obtaining electrical parameters of the oscillator circuit; and calculating a temperature of a susceptor coupled to the oscillator circuit based on the electrical parameter.

[0019] A computer-readable storage medium stores a computer program, which, when executed by a processor, obtaining electrical parameters of the oscillator circuit; and calculating a temperature of a susceptor coupled to the oscillator circuit based on the electrical parameter.

[0020] The details of one or more embodiments of the application are set forth in the drawings and description which follow. Other features, objects, and advantages of the application will become apparent from the description, drawings, and claims. [Brief description of the drawings]

[0021] In order to more clearly describe the technical solutions of the embodiments of the present application or the prior art, the drawings necessary for describing the embodiments or the prior art will be briefly described. Note that the drawings related to the following description are only specific embodiments described in this specification, and it is obvious that those skilled in the art can obtain drawings of other embodiments based on these drawings without creative efforts.

[0022] [Figure 1] 1 is a schematic diagram showing a configuration of a temperature measuring device according to an embodiment; [Diagram 2] 2 is a schematic diagram of a process in which the magnetic permeability of a ferromagnetic material changes with temperature according to one embodiment. [Diagram 3] FIG. 1 is a schematic diagram illustrating an oscillator circuit according to an embodiment. [Figure 4] FIG. 2 is a schematic diagram showing a circuit for monitoring current characteristics in an oscillator circuit according to an embodiment. [Diagram 5] FIG. 2 is a schematic diagram showing a circuit for monitoring voltage characteristics in an oscillator circuit according to an embodiment. [Figure 6] FIG. 11 is a schematic diagram showing the configuration of a temperature measuring device according to another embodiment. [Figure 7] FIG. 2 is a schematic diagram showing a detailed circuit diagram of an oscillator circuit according to an embodiment. [Figure 8] FIG. 13 is a schematic diagram showing a detailed circuit of an oscillator circuit according to another embodiment. [Figure 9] FIG. 2 is a schematic diagram showing a detailed circuit of a power supply circuit according to an embodiment. [Figure 10] 2 is a schematic diagram showing a detailed circuit of a temperature measuring device according to an embodiment; [Figure 11] 4 is a flowchart of a temperature measurement method according to an embodiment. [Figure 12] FIG. 2 is a diagram illustrating the internal configuration of a computing device according to an embodiment. [Figure 13] FIG. 11 is a schematic diagram showing a circuit of a temperature measuring device according to another embodiment. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0023] In order to facilitate an understanding of the present application, the present application will now be described more fully with reference to the associated drawings, in which examples of the present application are shown. However, the present application may be embodied in many different forms and is not limited to the examples set forth herein. On the contrary, the purpose of providing these examples is to provide a more complete and thorough understanding of the present disclosure.

[0024] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terms used herein in the description of this application are for the purpose of describing specific examples only and are not intended to be limiting of the application.

[0025] It should be noted that the terms "first", "second", etc., used in this application are used to describe various elements in this specification, but these elements are not limited to these terms. These terms are used to distinguish a first element from other elements.

[0026] In addition, when one element is considered to be "connected" to another element, it may be directly connected to the other element, or may be connected to the other element via an intermediate element. Furthermore, "connection" in the following examples should be understood as "electrically connected" or "communicatively connected" if there is transmission of electrical signals or data between the connected objects.

[0027] As used herein, the singular forms "a", "an" and "said" are intended to include the plural forms unless the context dictates otherwise. It will be further understood that terms such as "comprising" or "having" specify the presence of stated features, integers, steps, operations, elements, components or groups thereof, but do not exclude the presence or addition of one or more other features, integers, steps, operations, elements, components or groups thereof.

[0028] In the prior art, the method of measuring the temperature of a heating element mainly involves attaching a temperature susceptor to an aerosol generating device and connecting it to a circuit. This method has significant limitations, as it is not possible to completely separate the heating element from the circuit, and the circuit is complex.

[0029] The temperature measuring device and method according to the present application can perform temperature measurement when the susceptor and the oscillation circuit are separated, the circuit is simple, and it is applicable to application scenes such as temperature measurement of an aerosol generating device or other devices. In one embodiment, the present application provides a temperature measuring device including a susceptor 100, an oscillation circuit 200, and a controller 300, the susceptor 100 is coupled to the oscillation circuit 200, and the controller 300 obtains electrical parameters of the oscillation circuit 200 and calculates the temperature of the susceptor 100 based on the electrical parameters. The above temperature measuring device can obtain the state change of the susceptor by obtaining the electrical parameters of the oscillation circuit based on the coupling effect between the susceptor and the oscillation circuit, and can obtain the temperature of the susceptor. The temperature measuring device can perform temperature measurement when the susceptor and the oscillation circuit are separated, and the circuit is simple and easy to implement. At the same time, the non-contact temperature measuring method is used, so the applicability of the temperature measurement is stronger and the restrictions are fewer.

[0030] In this embodiment, the susceptor 100 is coupled to the oscillation circuit 200. The coupling connection means that the susceptor 100 and the oscillation circuit 200 are not directly connected, but when the parameters of one of the susceptor 100 and the oscillation circuit 200 change, the parameters of the other change accordingly, which is also the principle of realizing non-contact temperature measurement between the oscillation circuit 200 and the susceptor 100. In this application, the configuration of the oscillation circuit 200 is not unique, and generally, the oscillation circuit 200 must include a capacitor and an induction coil, and the capacitor may be connected in series or in parallel to the induction coil. It should be noted that the connection method between the capacitor and the induction coil can be selected by those skilled in the art according to the actual needs. Furthermore, since there is a capacitor and an induction coil inside the oscillation circuit 200, when the oscillation circuit 200 receives an external current, the capacitor inside the oscillation circuit 200 is charged. The capacitor is discharged after charging is completed, and at this time, the current flowing through the induction coil flows in the reverse direction, and the induction coil is charged. When the voltage of the induction coil reaches a maximum, the capacitor is completely discharged, the induction coil starts to discharge, the capacitor starts to charge, and then goes back and forth repeatedly, the oscillator circuit 200 starts to oscillate, and an alternating current is generated in the oscillator circuit 200.

[0031] When the current in the oscillation circuit 200 changes, a changing magnetic flux is generated, and at this time, the magnetic flux passing through the susceptor 100 changes, which causes an induced electromotive force to be generated in the susceptor 100, and an eddy current is generated inside the susceptor 100. When the eddy current in the susceptor 100 changes, the magnetic flux passing through the oscillation circuit 200 changes, and further an induced electromotive force is generated in the oscillation circuit 200, that is, mutual inductance is generated between the oscillation circuit 200 and the susceptor 100.

[0032] The susceptor 100 is usually made of a magnetic material. When the temperature of the susceptor 100 changes, the magnetic permeability of the susceptor 100 changes accordingly, that is, the magnetic permeability of the susceptor 100 can represent the temperature of the susceptor 100. Furthermore, since mutual inductance occurs between the oscillation circuit 200 and the susceptor 100, the magnetic permeability of the susceptor 100 changes, and the mutual inductance value between the susceptor 100 and the oscillation circuit 200 changes, and the change in the mutual inductance value changes the equivalent self-inductance value of the induction coil in the oscillation circuit 200, and further changes the electrical parameters of the oscillation circuit 200.

[0033] The controller 300 acquires electrical parameters of the oscillation circuit 200, and calculates the temperature of the susceptor based on the electrical parameters. In this embodiment, the controller 300 may include an MCU (Micro Control Unit) unit and an A / D sampling unit. Of course, the controller 300 may be realized by other units having corresponding functions and their peripheral circuits.

[0034] The method by which the controller 300 acquires the electrical parameters of the oscillator circuit 200 is not unique. In this embodiment, as shown in Fig. 1, the controller 300 is connected to the oscillator circuit 200, and the controller 300 acquires the electrical parameters by setting a monitoring point in the oscillator circuit 200. It should be noted that the controller 300 may acquire the electrical parameters of the oscillator circuit 200 in a wireless manner. Those skilled in the art can select the manner of acquiring the electrical parameters of the oscillator circuit 200 according to the actual situation.

[0035] The controller 300 realizes the temperature measurement by monitoring the electrical parameters of the oscillator circuit 200. The selection of the electrical parameters is not unique, and may be the voltage characteristic, the current characteristic, or the frequency characteristic of the monitoring point. The selection of the monitoring points is not unique. For example, the voltage value at both ends of the induction coil may be obtained by setting monitoring points at both ends of the induction coil, and the voltage value at both ends of the capacitor may be obtained by setting monitoring points at both ends of the capacitor. Note that other electrical parameters and monitoring points may be selected by those skilled in the art, and it is sufficient for those skilled in the art to consider that they can be realized.

[0036] The manner in which the controller 300 realizes temperature measurement based on the acquired electrical parameters is also not unique. For example, an artificial intelligence algorithm module is installed inside the controller 300 to learn the relationship between the historical electrical parameters of the oscillation circuit 200 and the historical temperature of the susceptor 100 to obtain a prediction model. During subsequent temperature measurements, the controller 300 inputs the acquired current electrical parameters into the prediction model to obtain a predicted result of the temperature of the susceptor 100, and this manner can greatly improve the degree of automation.

[0037] Exemplarily, as shown in FIG. 3, the oscillation circuit 200 includes a first capacitor 210 and a first inductor 220, a first end of the first capacitor 210 is connected to a first end of the first inductor 220, and a second end of the first capacitor 210 is connected to a second end of the first inductor 220. The oscillation circuit 200 receives an external current I and operates, and mutual inductance occurs between the susceptor 100 and the oscillation circuit 200. When the temperature of the susceptor 100 changes, the magnetic permeability of the susceptor 100 changes accordingly, and the equivalent self-inductance value of the oscillation circuit 200 also changes accordingly, so that the corresponding electrical parameters inside the oscillation circuit 200 also change. In this embodiment, the voltage characteristic is selected as the monitoring value, and monitoring points are set on both ends of the first inductor 220, respectively, and the controller 300 obtains the voltage value of each monitoring point within a certain period of time, and obtains the temperature of the susceptor 100 by a lookup table or regression fitting.

[0038] In one embodiment, the electrical parameters include the current characteristics of the oscillator circuit 200 .

[0039] In this embodiment, as shown in FIG. 4, the oscillation circuit 200 includes a first capacitor 210 and a first inductor 220, and a first end of the first capacitor 210 is connected to a first end of the first inductor 220, and a second end of the first capacitor 210 is connected to a second end of the first inductor 220. The oscillation circuit 200 operates by receiving an external current I, and mutual inductance occurs between the susceptor 100 and the oscillation circuit 200, and an eddy current occurs inside the susceptor 100. When the temperature of the susceptor 100 changes, the magnetic permeability of the susceptor 100 changes accordingly, and further, the mutual inductance value between the susceptor 100 and the oscillation circuit 200 changes. This mutual inductance value is superimposed on the self-inductance value of the oscillation circuit 200, and thus the equivalent self-inductance value of the induction coil in the oscillation circuit 200 changes. As shown in Equation 1,

number

[0040] 4, the controller 300 can obtain a current value I1 flowing through the first inductor 220 within a certain time in the oscillation circuit 200 by setting a monitoring point at one end of the first inductor 220, and obtain a rate of change of the current value I1 flowing through the first inductor 220 at each time. The controller 300 obtains a relationship between the rate of change of the current value I1 and the temperature of the susceptor 100 by fitting the rate of change of the current value I1 flowing through the first inductor 220 at each time point in a plurality of sets of oscillation circuits 200 that have been conventionally measured and the temperature data of the susceptor 100, thereby realizing temperature measurement. The controller 300 can also obtain a current value I2 flowing through the entire oscillation circuit 200 within a certain time, calculate the current value I1 flowing through the first inductor 220 from the current value I2, and repeat the above operation to realize temperature measurement.

[0041] In one embodiment, the electrical parameters include the voltage characteristics of the oscillator circuit 200 .

[0042] In this embodiment, as shown in FIG. 5, the oscillation circuit 200 includes a first capacitor 210 and a first inductor 220, and a first end of the first capacitor 210 is connected to a first end of the first inductor 220, and a second end of the first capacitor 210 is connected to a second end of the first inductor 220. The oscillation circuit 200 operates by receiving an external current I, and mutual inductance occurs between the susceptor 100 and the oscillation circuit 200, and an eddy current occurs inside the susceptor 100. When the temperature of the susceptor 100 changes, the magnetic permeability of the susceptor 100 changes accordingly, and further, the mutual inductance value between the susceptor 100 and the oscillation circuit 200 changes, and the change in the mutual inductance value is superimposed on the self-inductance value of the oscillation circuit 200, so that the equivalent self-inductance value of the induction coil in the oscillation circuit 200 changes. As can be seen from Equation 1, the equivalent self-inductance value L of the oscillation circuit 200 is proportional to the voltage of the first inductor 220 in the oscillation circuit 200 at a certain time and is inversely proportional to the rate of change of the current flowing through the first inductor 220 at a certain time. That is, any change in the equivalent self-inductance value L of the oscillation circuit 200 is reflected by the voltage of the first inductor 220 in the oscillation circuit 200 at a certain time, so the voltage characteristic of the oscillation circuit 200 may include parameters such as the voltage of the first inductor 220 at each time in the oscillation circuit 200, the amplitude of the voltage of the first inductor 220, or the effective value of the voltage of the first inductor 220 within a certain time. By measuring a plurality of sets of voltage characteristics of the oscillation circuit 200 and temperature data of the susceptor 100, the relationship between the voltage characteristics of the oscillation circuit 200 and the temperature of the susceptor 100 can be obtained by means of regression analysis or the like.

[0043] 5, the controller 300 acquires the voltage U1 of the first inductor 220 at each time within a certain period of time in the oscillation circuit 200 by setting a monitoring point at both ends of the first inductor 220 or at both ends of the first capacitor 210. The controller 300 acquires the relationship between the voltage value U1 and the temperature of the susceptor 100 by fitting the voltage U1 of the first inductor 220 at each time in a plurality of sets of oscillation circuits 200 that have been conventionally measured to temperature data of the susceptor 100, thereby realizing temperature measurement.

[0044] In one embodiment, the susceptor 100 is a ferromagnetic material.

[0045] In this embodiment, the susceptor 100 is a ferromagnetic material, that is, the susceptor 100 is manufactured from a ferromagnetic material, and as shown in FIG. 2, the magnetic permeability of the ferromagnetic material changes with temperature. When the temperature of the ferromagnetic material is sufficiently lower than the Curie temperature Tc, the temperature is measured by utilizing the characteristic that the magnetic permeability of the ferromagnetic material has a positive correlation with the temperature, and when the temperature of the ferromagnetic material is near the Curie temperature Tc, there are two regions near the Curie temperature Tc, a region where the temperature and magnetic permeability have a positive correlation and a region where the temperature and magnetic permeability have a negative correlation, and the temperature can be measured by the different characteristics of the different regions. That is, the magnetic permeability of the ferromagnetic material represents the temperature of the ferromagnetic material. Furthermore, the magnetic permeability of the ferromagnetic material changes greatly with temperature, and by using the ferromagnetic material as the susceptor 100, the measurement result becomes more intuitive. It should be noted that the susceptor 100 may be made of other magnetic materials, and the trends of the magnetic permeability of other magnetic materials with temperature changes are not necessarily the same as those shown in FIG. 2. Those skilled in the art can select the specific type of susceptor 100 according to actual needs.

[0046] In one embodiment, as shown in FIG. 6, the temperature measuring device further includes a power supply circuit 400, and the oscillator circuit 200 is connected to the power supply circuit 400.

[0047] The power supply circuit 400 supplies a voltage to the oscillator circuit 200 so that the oscillator circuit 200 generates an alternating current.

[0048] 7 , the oscillator circuit 200 includes a first capacitor 210 and a first inductor 220, the first capacitor 210 is connected in series with the first inductor 220, and the susceptor 100 is coupled to the first inductor 220. In this embodiment, a first end of the first capacitor 210 is connected to a first end of the first inductor 220, the susceptor 100 is coupled to the first inductor 220, and the controller 300 can monitor an electrical parameter across the first capacitor 210 or across the first inductor 220.

[0049] 8 , the oscillator circuit 200 includes a first capacitor 210 and a first inductor 220, the first capacitor 210 is connected in parallel to the first inductor 220, and the susceptor 100 is coupled to the first inductor 220. In this embodiment, a first end of the first capacitor 210 is connected to a first end of the first inductor 220, and a second end of the first capacitor 210 is connected to a second end of the first inductor 220, and the controller 300 can monitor electrical parameters across the first capacitor 210 or across the first inductor 220.

[0050] In addition, since any change in the equivalent self-inductance value of the oscillator circuit 200 is reflected by the voltage characteristics and current characteristics, the connection method between the first capacitor 210 and the first inductor 220 in the oscillator circuit 200 is not unique, and it is considered that a person skilled in the art can realize it.

[0051] In one embodiment, as shown in FIG. 9, the power supply circuit 400 further includes a second capacitor 410, a first end of the second capacitor 410 is connected to the oscillator circuit 200, and a second end of the second capacitor 410 is connected to ground.

[0052] In this embodiment, the power supply circuit 400 includes a second capacitor 410, a first end of the second capacitor 410 is connected to the oscillation circuit 200, and a second end of the second capacitor 410 is connected to ground. The second capacitor can effectively filter noise and AC components in the power supply circuit, avoid self-excitation, stabilize the working state of the power supply circuit, and store electrical energy.

[0053] In one embodiment, the temperature measuring device further includes a switching element 500, a first end of the switching element 500 is connected to the power supply circuit 400 or ground, and a second end of the switching element 500 is connected to the oscillation circuit 200. Exemplarily, the oscillation circuit 200 includes a first capacitor 210 and a first inductor 220. When the first capacitor 210 and the first inductor 220 use a parallel connection method, as shown in FIG. 10, the first end of the switching element 500 is connected to ground, and the second end of the switching element 500 is connected to the oscillation circuit 200, that is, connected to the first end of the first capacitor 210 and the first end of the first inductor 220. The switching element 500 controls whether the oscillation circuit 200 is connected to the power supply circuit 400 so that the oscillation circuit 200 generates an alternating current. Furthermore, the switching element 500 may be connected to the controller 300, and the controller 300 accurately controls the switching element 500 by controlling the on / off of the switching element 500.

[0054] As shown in FIG. 11, the temperature measuring method includes the following steps S100 to S200.

[0055] In step S100, electrical parameters of the oscillator circuit are obtained.

[0056] In this embodiment, by setting a monitoring point in the oscillator circuit, the controller can obtain the electrical parameters of the monitoring point, such as the current value flowing through a certain monitoring point or the voltage value between two certain monitoring points. It should be noted that those skilled in the art can set the monitoring points and select the corresponding electrical parameters according to the actual situation, and it is only necessary for those skilled in the art to realize it.

[0057] In step S200, the temperature of the susceptor coupled to the oscillation circuit is calculated based on the electrical parameters.

[0058] In this embodiment, the susceptor is coupled to the oscillator circuit, and when the current in the oscillator circuit changes, a changing magnetic flux is generated, and at this time, the magnetic flux passing through the susceptor changes, which generates an induced electromotive force in the susceptor, and an eddy current is generated inside the susceptor. When the eddy current in the susceptor changes, the magnetic flux passing through the oscillator circuit changes, and an induced electromotive force is generated in the oscillator circuit, that is, a mutual inductance is generated between the oscillator circuit and the susceptor. Furthermore, when the temperature of the susceptor changes, the permeability of the susceptor changes accordingly, and the change in the permeability of the susceptor changes the mutual inductance value between the susceptor and the oscillator circuit, and this mutual inductance value changes the equivalent self-inductance value of the induction coil in the oscillator circuit, and the electrical parameters of the oscillator circuit change, that is, the change in the temperature of the susceptor is reflected by the electrical parameters of the oscillator circuit, and the temperature of the susceptor can be obtained by a look-up table or fitting after measuring the corresponding electrical parameters.

[0059] For specific limitations of the temperature measuring method, reference may be made to the limitations of the temperature measuring device described above, and detailed description thereof will be omitted here.

[0060] In one embodiment, a computer device is further provided, and an internal structural diagram of the computer device may be configured as shown in FIG. 12. The computer device includes a processor, a memory, and a network interface connected via a system bus. The processor of the computer device provides calculation and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. An operating system, a computer program, and a database are stored in the non-volatile storage medium. The internal memory provides an environment for the execution of the operating system and the computer program in the non-volatile storage medium. The network interface of the computer device communicates with an external terminal via a network. When the computer program is executed by the processor, it realizes any one of the temperature measurement methods described above.

[0061] Those skilled in the art will understand that the structure shown in FIG. 12 is merely a block diagram of some structures related to the technical means of the present application, and does not limit the computer device to which the technical means of the present application can be applied, and that a specific computer device may include more or fewer components than those shown in the figure, may be a combination of some components, or may have a different component layout.

[0062] In one embodiment, a computing device is provided that includes a memory and a processor, the memory storing a computer program and the processor executing the computer program implementing the steps of each of the method embodiments described above.

[0063] In one embodiment, a computer readable storage medium is provided having a computer program stored thereon, which, when executed by a processor, implements the steps of each of the method embodiments described above.

[0064] Those skilled in the art can understand that all or part of the flow of the method of the above embodiments can be realized by giving instructions to relevant hardware by a computer program, and the computer program may be stored in a non-volatile computer readable storage medium, and the computer program may include the flow of each of the above embodiments when executed. Any reference to memory, storage, database, or other medium provided in this application and used in each embodiment may include at least one of non-volatile and volatile memory. Non-volatile memory may include Read-Only Memory (ROM), magnetic tape, flexible disk, flash memory, optical memory, etc. Volatile memory may include Random Access Memory (RAM) or external cache memory. By way of example and not limitation, RAM can be in various forms, such as Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM).

[0065] In order to better understand the above temperature measuring apparatus and method, a detailed description will now be given with reference to one specific embodiment.

[0066] In a non-combustion heating type atomization device, it is very important to sense the temperature of the heating element. However, in the prior art, the method for measuring the temperature of the heating element mainly involves attaching a temperature susceptor to the aerosol generating device and connecting it to a circuit. This method has significant limitations, as it is not possible to completely separate the heating element from the circuit, and the circuit is complicated.

[0067] Based on this, the temperature measuring device of the present application includes a susceptor 100, an oscillation circuit 200, a controller 300, a power supply circuit 400, and a switching element 500, in which the susceptor 100 is coupled to the oscillation circuit 200, which is connected to the power supply circuit 400, and the controller 300 obtains electrical parameters of the oscillation circuit 200 by setting monitoring points in the oscillation circuit 200, and calculates the temperature of the susceptor 100 based on the electrical parameters.

[0068] The power supply circuit 400 supplies a voltage to the oscillator circuit 200. The power supply circuit 400 includes a second capacitor 410, and the oscillator circuit 200 includes a first capacitor 210, a first inductor 220, and a diode 230. As shown in FIG. 13, in one exemplary embodiment, the first capacitor 210 is connected in series with the first inductor 220, the oscillator circuit 200 further includes a diode 230, and the switching element 500 is connected to the controller 300. A first end of the first inductor 220 and a cathode of the diode 230 are connected to a second end of the switching element 500, and the first end of the switching element 500 is connected to the power supply circuit 400. A second end of the first inductor 220 is connected to a first end of the first capacitor 210, and the second end of the first capacitor 210 and the anode of the diode 230 are all connected to ground. A first end of the second capacitor 410 receives electrical energy and is connected to the oscillation circuit 200 via the switching element 500, specifically, to a first end of the first inductor 220 and the cathode of the diode 230 in the oscillation circuit 200. A second end of the second capacitor 410 is connected to ground.

[0069] When the controller 300 controls the switching element 500 to be turned on, the oscillation circuit 200 is connected to the power supply circuit 400, and when the switching element 500 is turned on, the first capacitor 210 and the first inductor 220 are charged simultaneously. After the charging of the first capacitor 210 and the first inductor 220 is completed, the switching element 500 is turned off, and at this time, the first capacitor 210 starts to discharge after the charging is completed, and the current flowing through the first inductor 220 flows in the reverse direction, and when the discharging of the first capacitor 210 is completed, the first inductor 220 starts to discharge, and the first capacitor 210 starts to charge, and repeats back and forth. During the repeated back and forth, the oscillation circuit 200 starts to oscillate, and an alternating current is generated in the oscillation circuit 200. The susceptor 100 is made of a ferromagnetic material, and when the current in the oscillation circuit 200 changes, a changing magnetic flux is generated, and at this time, the magnetic flux passing through the susceptor 100 changes, which causes an induced electromotive force to be generated in the susceptor 100, and an eddy current is generated inside the susceptor 100. When the eddy current in the susceptor 100 changes, at this time, the magnetic flux passing through the oscillation circuit 200 changes, and further an induced electromotive force is generated in the oscillation circuit 200, that is, mutual inductance is generated between the oscillation circuit 200 and the susceptor 100.

[0070] 2, when the temperature of the susceptor 100 changes, the magnetic permeability of the susceptor 100 changes accordingly. Furthermore, the self-inductance value of the oscillation circuit 200 can be obtained from Equation 2.

[0071]

number

[0072] Mutual inductance occurs between the oscillator circuit 200 and the susceptor 100, and this mutual inductance is superimposed on the self-inductance of the oscillator circuit 200. Therefore, when the magnetic permeability of the susceptor 100 changes, the mutual inductance occurring between the oscillator circuit 200 and the susceptor 100 changes, and the mutual inductance coefficient between the oscillator circuit 200 and the susceptor 100 is obtained from Equation 3.

[0073]

number

[0074] In other words, the mutual inductance coefficient M between the oscillation circuit 200 and the susceptor 100 is the self-inductance value L 自 and the self-inductance value L of the susceptor 100 感 It is related to the relative permeability of air μ 0 Since the coil cross-sectional area S of the first inductor 220, the number of coil turns n of the first inductor 220, and the coil length l of the first inductor 220 are known, the self-inductance value L of the initial oscillation circuit 200 can be calculated as follows: 自 is determined, so that when the magnetic permeability of the susceptor 100 changes, the self-inductance value L of the susceptor 100 感 changes, the mutual inductance coefficient M between the oscillator circuit 200 and the susceptor 100 changes accordingly, and the equivalent self-inductance value L of the oscillator circuit 200 changes.

[0075] Furthermore, the mutual inductance coefficient M between the oscillation circuit 200 and the susceptor 100 changes, and at this time, the equivalent self-inductance value of the oscillation circuit 200 is L. As can be seen from Equation 1, the equivalent self-inductance value L of the oscillation circuit 200 is proportional to the voltage of the first inductor 220 in the oscillation circuit 200 at a certain time, and is inversely proportional to the rate of change of the current flowing through the first inductor 220 at a certain time. In other words, any change in the equivalent self-inductance value L of the oscillation circuit 200 is reflected by the voltage characteristics and current characteristics of the oscillation circuit 200. The voltage characteristics or current characteristics of the oscillation circuit 200 are acquired, and the temperature of the susceptor 100 is acquired by table lookup or linear fitting. Furthermore, compared to using parameters such as the frequency characteristics of the oscillator circuit 200, the above-mentioned temperature measuring device and method express the magnetic permeability of the susceptor 100 by the voltage characteristics or current characteristics of the oscillator circuit 200, and further express the temperature of the susceptor 100, so that high monitoring speed and monitoring accuracy are not required, and the voltage characteristics or current characteristics of the oscillator circuit 200 can be monitored with high flexibility. For example, the temperature may be reflected by the height of the peak in a single cycle of the voltage or current, or the temperature may be indirectly reflected by a change in the effective value of the voltage or current, and the performance requirements for the controller 300 can be lowered to some extent.

[0076] As described above, after entering a stable operating state, the temperature measuring device obtains the voltage characteristics of the oscillator circuit 200 or the current characteristics of the oscillator circuit 200 to obtain the equivalent self-inductance value L of the oscillator circuit 200, and further obtains the mutual inductance coefficient M from the equivalent self-inductance value L, and calculates the self-inductance value L of the susceptor 100 based on the mutual inductance coefficient M. 自 In addition, the magnetic permeability of the susceptor 100 and the temperature of the susceptor 100 can be obtained.

[0077] In the above temperature measuring device and method, the temperature measuring device includes a susceptor, an oscillation circuit, and a controller, the susceptor is coupled to the oscillation circuit, and the controller obtains the electrical parameters of the oscillation circuit and calculates the temperature of the susceptor based on the electrical parameters. The above temperature measuring device and method can obtain the state change of the susceptor by obtaining the electrical parameters of the oscillation circuit based on the coupling effect between the susceptor and the oscillation circuit, and can also obtain the temperature of the susceptor, and can perform temperature measurement when the susceptor and the oscillation circuit are separated, and the circuit is simple and easy to implement. At the same time, the use of a non-contact temperature measuring method makes the applicability of temperature measurement stronger and has fewer restrictive conditions.

[0078] In the present description, references to terms such as "one embodiment," "another embodiment," or "ideal embodiment" mean that the specific features, structures, materials, or characteristics described in connection with that embodiment or example are included in at least one embodiment or example of the present application. In the present description, general references to such terms do not necessarily refer to the same embodiment or example.

[0079] The technical features of the above embodiments can be combined in any manner. For the sake of brevity, all possible combinations of the technical features in the above embodiments have not been described. However, as long as there is no contradiction in the combinations of these technical features, they should all be considered to be within the scope described in this specification.

[0080] The above examples show some embodiments of the present application, and the description is more specific and detailed, and therefore should not be understood as limiting the scope of the claims of the present application. However, those skilled in the art may make various modifications and improvements without departing from the spirit of the present application, and both of these modifications and improvements belong to the scope of protection of the present application. Therefore, the scope of protection of the patent of the present application should be based on the scope of the attached claims.

Claims

1. 1. A temperature measuring device, comprising: A temperature measurement device comprising a susceptor, an oscillator circuit, and a controller, the susceptor being coupled to the oscillator circuit, the controller acquiring electrical parameters of the oscillator circuit, and calculating a temperature of the susceptor based on the electrical parameters.

2. The temperature measurement device of claim 1 , wherein the electrical parameters include a current characteristic in the oscillator circuit.

3. The temperature measurement device of claim 1 , wherein the electrical parameters include a voltage characteristic in the oscillator circuit.

4. 4. The temperature measuring device according to claim 2, wherein a monitoring point is provided in the oscillator circuit, and the controller acquires the electrical parameter at the monitoring point.

5. The temperature measurement device of claim 1 , wherein the susceptor is a ferromagnetic material.

6. The temperature measurement device of claim 1 , wherein the oscillator circuit includes a first capacitor and a first inductor, the first capacitor being connected in series with the first inductor, and the susceptor being coupled to the first inductor.

7. The temperature measurement device of claim 1 , wherein the oscillator circuit includes a first capacitor and a first inductor, the first capacitor connected in parallel with the first inductor, and the susceptor is coupled to the first inductor.

8. The temperature measuring device according to claim 1 , further comprising a power supply circuit, the oscillator circuit being connected to the power supply circuit.

9. 9. The temperature measuring device according to claim 8, wherein the power supply circuit includes a second capacitor, a first end of the second capacitor receiving electrical energy and connected to the oscillator circuit, and a second end of the second capacitor connected to ground.

10. The temperature measuring device according to claim 8 , further comprising a switching element, a first end of the switching element being connected to the power supply circuit or ground, and a second end of the switching element being connected to the oscillator circuit.

11. A method for measuring temperature, comprising: obtaining electrical parameters of the oscillator circuit; and calculating a temperature of a susceptor coupled to the oscillator circuit based on the electrical parameter.

12. The temperature measurement method of claim 11 , wherein the electrical parameters include a current characteristic in the oscillator circuit.

13. The temperature measurement method of claim 11 , wherein the electrical parameters include a voltage characteristic in the oscillator circuit.

14. A computing device including a memory and a processor, A computer program is stored in the memory, and when the processor executes the computer program, obtaining electrical parameters of the oscillator circuit; and calculating a temperature of a susceptor coupled to the oscillator circuit based on the electrical parameters. Computer device.

15. A computer-readable storage medium on which a computer program is stored, When the computer program is executed by a processor, obtaining electrical parameters of the oscillator circuit; and calculating a temperature of a susceptor coupled to the oscillator circuit based on the electrical parameters. A computer-readable storage medium.

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