Measurement system, control method therefor, server apparatus, and storage medium

The measurement system addresses the challenge of transferring and storing waveform data by transmitting feature quantities, enhancing transfer speed and reducing server storage load while maintaining access to original data.

JP2026009769APending Publication Date: 2026-01-21YOKOGAWA TEST & MEASUREMENT CORP
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Patent Information

Application Number
JP2024109896
Authority / Receiving Office
JP · JP
Patent Type
Applications
Current Assignee / Owner
Filing Date
2024-07-08
Publication Date
2026-01-21

AI Technical Summary

Technical Problem

Conventional systems face challenges in transferring large amounts of waveform data from measuring instruments to servers, which is time-consuming and strains server storage capacity.

Method used

A measurement system that transmits feature quantities of waveform data instead of the data itself, using a gateway device to extract features and a server device to manage these features, reducing transfer time and storage load.

Benefits of technology

Enables high-speed transfer of feature quantities and reduces storage requirements on the server, allowing for efficient data management and access to original waveform data through identification information.

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Abstract

To improve a problem related to the transfer and storage of waveform data in a system for analyzing the waveform data.SOLUTION: In a measuring system including a gateway device, a server device, and a control device that can communicate with each other via a network, the gateway device includes a terminal that acquires a waveform datum indicating a waveform, extracts a feature quantity from the acquired waveform datum, and transmits the extracted waveform datum to the server device. The server device includes a control unit that stores the feature value received from the gateway device and transmits the stored feature value to the terminal in response to a request from the terminal.SELECTED DRAWING: Figure 2
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Description

[Technical Field]

[0001] The present disclosure relates to a measurement system, a control method thereof, a server device, and a program. [Background technology]

[0002] Patent Document 1 describes a technology that stores waveform data on a server and enables waveforms to be viewed anytime, anywhere by accessing the server from a terminal connected to a network. [Prior art documents] [Patent documents]

[0003] [Patent Document 1] Japanese Patent Application Laid-Open No. 2001-22607 Summary of the Invention [Problem to be solved by the invention]

[0004] However, in conventional configurations, if the waveform data is large, it takes a long time to transfer the waveform data from the measuring instrument to the server. Furthermore, storing large amounts of waveform data on the server puts a strain on the server's storage capacity. Thus, the conventional configuration leaves room for improvement in terms of transferring waveform data from the measuring instrument to the server and ensuring storage capacity on the server.

[0005] An object of the present disclosure is to improve upon the challenges associated with transferring and storing waveform data in systems for analyzing waveform data. [Means for solving the problem]

[0006] In some embodiments, the measurement system comprises: (1) A measurement system having a gateway device, a server device, and a terminal device that can communicate with each other via a network, The gateway device Obtaining waveform data representing a waveform; extracting features from the acquired waveform data; transmitting the extracted waveform data to the server device; A control unit is provided, The server device storing the feature amount of the waveform data received from the gateway device; transmitting the stored feature amount to the terminal device in response to a request from the terminal device; It has a control unit.

[0007] In this way, in the measurement system, the gateway device transmits the feature quantities of the waveform data, rather than the waveform data itself, to the server device, and the server device manages the feature quantities of the waveform data. Therefore, the measurement system enables high-speed transfer of the feature quantities of the waveform data and reduces the storage load on the server device.

[0008] In one embodiment, (2) In the measurement system of (1), the gateway device is communicably connected to a measuring instrument that generates the waveform data; the control unit of the gateway device further transmits identification information of the measuring instrument or the gateway device that holds the waveform data to the server device; The control unit of the server device may store, in association with the feature, the identification information of the measuring instrument or the gateway device that holds the waveform data from which the feature has been extracted.

[0009] In this way, the server device stores, in association with the feature, the identification information of the measuring instrument or gateway device that holds the waveform data from which the feature was extracted. Therefore, the measurement system makes it possible to access the original waveform data by referencing the identification information associated with the feature.

[0010] In one embodiment, (3) In the measurement system of (2), In response to the request from the terminal device, the control unit of the server device may transmit to the terminal device the identification information of the measuring instrument or the gateway device corresponding to the stored feature together with the feature.

[0011] In this way, in response to a request from a terminal device, the server device transmits to the terminal device, together with the feature amounts, the identification information of the measuring instrument or gateway device corresponding to the feature amounts. Therefore, by accessing the measuring instrument or gateway device identified by the identification information, the terminal device can download the waveform data from which the feature amounts have been extracted and perform detailed analysis.

[0012] According to some embodiments, a method for controlling a measurement system includes: (4) A control method for a measurement system having a gateway device, a server device, and a terminal device that can communicate with each other via a network, comprising: a control unit of the gateway device, acquiring waveform data indicative of a waveform; extracting a feature amount from the acquired waveform data; transmitting the extracted waveform data to the server device; Including, a control unit of the server device, storing the feature amount of the waveform data received from the gateway device; transmitting the stored feature amount to the terminal device in response to a request from the terminal device; Includes:

[0013] In this way, in the measurement system, the gateway device transmits the feature quantities of the waveform data, rather than the waveform data itself, to the server device, and the server device manages the feature quantities of the waveform data. Therefore, according to the measurement system control method, the feature quantities of the waveform data can be transferred at high speed, and the storage load on the server device can be reduced.

[0014] In one embodiment, (5) In the method for controlling the measurement system of (4), the gateway device is communicably connected to a measuring instrument that generates the waveform data; the control unit of the gateway device further transmits identification information of the measuring instrument or the gateway device that holds the waveform data to the server device; The control unit of the server device may store, in association with the feature, the identification information of the measuring instrument or the gateway device that holds the waveform data from which the feature has been extracted.

[0015] In this way, the server device stores, in association with the feature, the identification information of the measuring instrument or gateway device that holds the waveform data from which the feature was extracted. Therefore, according to the measurement system control method, it is possible to access the original waveform data by referencing the identification information associated with the feature.

[0016] In one embodiment, (6) In the method for controlling the measurement system of (5), In response to the request from the terminal device, the control unit of the server device may transmit to the terminal device the identification information of the measuring instrument or the gateway device corresponding to the stored feature together with the feature.

[0017] In this way, in response to a request from a terminal device, the server device transmits to the terminal device, together with the feature amounts, the identification information of the measuring instrument or gateway device corresponding to the feature amounts. Therefore, by accessing the measuring instrument or gateway device identified by the identification information, the terminal device can download the waveform data from which the feature amounts have been extracted and perform detailed analysis.

[0018] In some embodiments, the server device (7) A server device capable of communicating with a gateway device and a terminal device via a network, receiving, from the gateway device, a feature extracted from waveform data indicating a waveform; storing the feature amount received from the gateway device; transmitting the stored feature amount to the terminal device in response to a request from the terminal device; It has a control unit.

[0019] In this way, the server device receives and manages the features of the waveform data, rather than the waveform data itself, from the gateway device. Therefore, the server device can transfer the features of the waveform data at high speed and reduce the storage load on the server device.

[0020] In one embodiment, (8) In the server device of (7), The control unit receiving, from the gateway device, identification information of the measuring instrument that holds the waveform data from which the feature amount has been extracted, or the gateway device, together with the feature amount; The identification information of the measuring instrument or the gateway device that holds the waveform data from which the feature is extracted may be stored in association with the feature.

[0021] In this way, the server device stores, in association with the feature, the identification information of the measuring instrument or gateway device that holds the waveform data from which the feature was extracted. Therefore, the server device can access the original waveform data by referencing the identification information associated with the feature.

[0022] In one embodiment, (9) In the server device of (8), In response to the request from the terminal device, the control unit may transmit to the terminal device the stored feature amount together with the identification information of the measuring instrument or the gateway device corresponding to the feature amount.

[0023] In this way, in response to a request from a terminal device, the server device transmits to the terminal device, together with the feature amounts, the identification information of the measuring instrument or gateway device corresponding to the feature amounts. Therefore, by accessing the measuring instrument or gateway device identified by the identification information, the terminal device can download the waveform data from which the feature amounts have been extracted and perform detailed analysis.

[0024] In some embodiments, the server device (10) A server device capable of communicating with a measuring device and a terminal device via a network, receiving, from the measuring device, feature amounts extracted from waveform data indicating a waveform; storing the feature amount received from the measuring device; transmitting the stored feature amount to the terminal device in response to a request from the terminal device; It has a control unit.

[0025] In this way, the server device receives and manages the feature quantities of the waveform data, rather than the waveform data itself, from the measuring instrument. This allows the server device to transfer the feature quantities of the waveform data at high speed and reduces the storage load on the server device.

[0026] In one embodiment, (11) In the server device of (10), The control unit receiving, from the measuring device, identification information of the measuring device that generated the waveform data from which the feature quantities were extracted, together with the feature quantities; The identification information of the measuring instrument that generated the waveform data from which the feature was extracted may be stored in association with the feature.

[0027] In this way, the server device stores, in association with the feature, the identification information of the measuring instrument that generated the waveform data from which the feature was extracted. Therefore, the server device makes it possible to access the original waveform data by referencing the identification information associated with the feature.

[0028] In one embodiment, (12) In the server device of (11), In response to the request from the terminal device, the control unit may transmit the stored feature amount together with the identification information of the measuring device corresponding to the feature amount to the terminal device.

[0029] In this way, in response to a request from a terminal device, the server device transmits to the terminal device the identification information of the measuring device corresponding to the feature together with the feature, so that the terminal device can access the measuring device identified by the identification information, download the waveform data from which the feature has been extracted, and perform detailed analysis.

[0030] In some embodiments, the program (13) A program that causes a computer to operate as the server device according to any one of (7) to (12).

[0031] In this way, the computer operating based on the program receives and manages the feature quantities of the waveform data, rather than the waveform data itself, from the gateway device or the measuring instrument. Therefore, the program enables high-speed transfer of the feature quantities of the waveform data and reduces the storage load on the server device. [Effects of the Invention]

[0032] According to an embodiment of the present disclosure, problems associated with transferring and storing waveform data in a system for analyzing waveform data can be improved. [Brief explanation of the drawings]

[0033] [Figure 1] FIG. 1 is a diagram illustrating a configuration of a measurement system according to a comparative example. [Figure 2] FIG. 1 is a diagram illustrating an example of the configuration of a measurement system according to an embodiment. [Figure 3] 3 is a block diagram showing an example of the configuration of the server device in FIG. 2. FIG. [Figure 4] FIG. 3 is a block diagram showing an example of the configuration of the measuring device shown in FIG. 2. [Figure 5] FIG. 3 is a block diagram showing an example of the configuration of the gateway of FIG. 2. [Figure 6] 3 is a block diagram showing an example of the configuration of the terminal device of FIG. 2. [Figure 7] 3 is a flowchart showing an example of the operation of the measurement system 1 in FIG. 2. DETAILED DESCRIPTION OF THE INVENTION

[0034] <Comparative Example> 1 is a diagram showing the configuration of a measurement system 9 according to a comparative example. The measurement system 9 includes a server device 91, a measuring instrument 92, and a terminal device 93. The server device 91, the measuring instrument 92, and the terminal device 93 are connected to each other via a network N so that they can communicate with each other.

[0035] The measuring instrument 92 measures the physical quantity of the measurement target and acquires waveform data related to the measured value of the physical quantity. The measuring instrument 92 transmits the acquired waveform data to the server device 91 via the network N. The server device 91 stores the waveform data received from the measuring instrument 92 in a storage device and manages the waveform data. In response to a request from the terminal device 93, the server device 91 transmits an image showing a graph of the waveform data or the waveform data to the terminal device 93 via the network N.

[0036] Therefore, a user can use a terminal device 93 connected to the network N to view the waveform data stored in the server device 91 from anywhere and download the necessary waveform data.

[0037] On the other hand, the measurement system 9 according to the comparative example stores the waveform data directly in a server device 91 connected to the network N. Therefore, if the size of the waveform data is large, it takes a long time to transfer the waveform data from the measuring instrument 92 to the server device 91. When transferring a large amount of waveform data to the server device 91, the transfer process may not be able to keep up with the output of the waveform data in the measuring instrument 92, and the waveform data may be transferred intermittently to the server device 91. Furthermore, storing a large amount of waveform data in the server device 91 puts a strain on the storage capacity of the server device 91.

[0038] As described above, the configuration according to the comparative example has room for improvement in terms of transferring waveform data from measuring instrument 92 to server device 91 and ensuring storage capacity in server device 91.

[0039] <Embodiment> Hereinafter, an embodiment of the present disclosure will be described with reference to the drawings. In each drawing, parts having the same configuration or function are denoted by the same reference numerals. In the description of this embodiment, duplicated descriptions of the same parts may be omitted or simplified as appropriate.

[0040] FIG. 2 is a diagram showing an example configuration of a measurement system 1 according to one embodiment. The measurement system 1 includes a server device 10, a measuring device 20, a gateway 30, and a terminal device 40. The measuring device 20 and the gateway 30 are connected to each other so that they can communicate with each other. The server device 10, the gateway 30, and the terminal device 40 are connected to each other so that they can communicate with each other via a network N. The network N is any communication network that allows signals to be transmitted and received between devices, and may include, for example, the Internet, an intranet, a mobile network, or any combination thereof. In FIG. 2, the number of server device 10, measuring device 20, gateway 30, and terminal device 40 is each one, but the number of these may be any number.

[0041] Measuring instrument 20 measures the physical quantity of the measurement target and acquires waveform data related to the measured value of the physical quantity. Measuring instrument 20 transmits the acquired waveform data to gateway 30. Note that in this embodiment, the waveform data acquired and transmitted by measuring instrument 20 is data related to the measured value of the physical quantity, but it may also be data related to values ​​that are not directly related to the physical quantity, such as the results of numerical analysis.

[0042] The gateway 30 analyzes the waveform data received from the measuring instrument 20 and extracts feature quantities from the waveform data. Feature quantities can be extracted, for example, by Peak-to-Peak compression, which extracts the maximum value (MAX value) and minimum value (MIN value) in a certain section, or by FFT (Fast-Fourier Transform), but are not limited to these. The gateway 30 transmits the extracted feature quantities to the server device 10 via the network N. In addition to the feature quantities, the gateway 30 may also transmit identification information for the waveform data and identification information for the measuring instrument 20 to the server device 10. The identification information for the waveform data may include information such as the file name, measurement time, type of measuring instrument 20, and type of measurement value. The identification information for the measuring instrument 20 may include information such as the IP address, URL (Uniform Resource Locator), or model information for the measuring instrument 20.

[0043] Server device 10 is a computer that manages the features of waveform data. Server device 10 is, for example, a personal computer (PC) or a workstation (WS), but may also be implemented as a cloud. Server device 10 stores the features of the waveform data, the identification information of the waveform data, and the identification information of measuring instrument 20 received from gateway 30 in a storage device (storage unit 12, described below with reference to FIG. 3).

[0044] Terminal device 40 is a computer operated by a user. Terminal device 40 is, for example, but not limited to, a PC, a tablet device, or a smartphone. Terminal device 40 requests waveform data features from server device 10 in response to a user instruction. The request from terminal device 40 may include information for identifying the waveform data (e.g., a file name, waveform data identification information, and identification information of measuring instrument 20).

[0045] In response to a request from the terminal device 40, the server device 10 transmits the feature quantities of the waveform data to the terminal device 40 via the network N. Upon receiving the feature quantities of the waveform data, the terminal device 40 may store or display the feature quantities.

[0046] In this way, the gateway 30 extracts features from the waveform data of the measuring instrument 20 and uploads the features to the server device 10, which is implemented, for example, by a cloud service. The terminal device 40 downloads the features from the server device 10 in response to a user instruction and displays the features so that they can be viewed on the client software. Therefore, the information exchanged between the gateway 30, the server device 10, and the terminal device 40 is not waveform data but features, which have a smaller data size, making it possible to reduce data transfer costs. Furthermore, because the server device 10 only needs to store features, which have a smaller data size, rather than the waveform data itself, it is possible to reduce data storage costs.

[0047] Furthermore, server device 10 may transmit, together with the feature amounts, identification information for the measuring device 20 that generated the waveform data from which the feature amounts were extracted to terminal device 40. In response to an instruction from a user who viewed the feature amounts, terminal device 40 may directly access measuring device 20 based on the identification information for measuring device 20 and download the waveform data from which the feature amounts were extracted. This allows the user to analyze the waveform data in detail as needed.

[0048] Fig. 3 is a block diagram showing an example of the configuration of the server device 10 in Fig. 2. The server device 10 is one or more computer devices that can communicate with each other. As shown in Fig. 3, the server device 10 includes a control unit 11, a storage unit 12, and a communication unit 13.

[0049] The control unit 11 includes one or more processors. In one embodiment, the "processor" may be, but is not limited to, a general-purpose processor or a dedicated processor specialized for a specific process. The control unit 11 is communicably connected to each component of the server device 10 and controls the operation of the entire server device 10.

[0050] The storage unit 12 includes any storage module, such as a hard disk drive (HDD), a solid state drive (SSD), a read-only memory (ROM), and a random access memory (RAM). The storage unit 12 may function as, for example, a main storage device, an auxiliary storage device, or a cache memory. The storage unit 12 stores any information used in the operation of the server device 10. For example, the storage unit 12 may store system programs, application programs, and various information received by the communication unit 13. The storage unit 12 may also store feature quantities of waveform data received from the measuring instrument 20 via the gateway 30, together with identification information of the measuring instrument 20 and the waveform data. The storage unit 12 is not limited to being built into the server device 10, but may be an external database or an external storage module.

[0051] The communication unit 13 includes any communication module that can communicate with other devices such as a scanner using any communication technology. The communication unit 13 may further include a communication control module for controlling communication with other devices, and a storage module for storing communication data such as identification information required for communication with other devices.

[0052] The functions of the server device 10 can be realized by executing a computer program (program) according to this embodiment on a processor included in the control unit 11. That is, the functions of the server device 10 can be realized by software. The computer program causes a computer to execute the processing of steps included in the operation of the server device 10, thereby causing the computer to realize the functions corresponding to the processing of each step. That is, the computer program is a program for causing a computer to function as the server device 10 according to this embodiment. The computer program may be recorded on a computer-readable recording medium. Programs include information used for processing by an electronic computer that is equivalent to a program. For example, data that is not a direct instruction to a computer but has properties that define computer processing falls under the category of "something equivalent to a program."

[0053] Some or all of the functions of the server device 10 may be realized by a dedicated circuit included in the control unit 11. That is, some or all of the functions of the server device 10 may be realized by hardware. Furthermore, the server device 10 may be realized by a single computer or by multiple computers working together.

[0054] Fig. 4 is a block diagram showing an example configuration of measuring device 20 in Fig. 2. Measuring device 20 is a device installed in, for example, a plant or factory, that measures the physical quantity of a measurement target. Measuring device 20 may be configured as one device or multiple devices that can communicate with each other. As shown in Fig. 4, measuring device 20 includes control unit 21, storage unit 22, communication unit 23, input unit 24, output unit 25, and measurement unit 26.

[0055] The configurations of the control unit 21, memory unit 22, and communication unit 23 of the measuring device 20 are similar to the configurations of the control unit 11, memory unit 12, and communication unit 13 of the server device 10, and therefore detailed description thereof will be omitted.

[0056] The input unit 24 includes one or more input interfaces that receive input operations from an operator and acquire input information based on the operator's operations. For example, the input unit 24 may be, but is not limited to, a physical key, a capacitance key, a pointing device, a touch screen integrated with the display of the output unit 15, or a microphone that receives voice input.

[0057] Output unit 25 includes one or more output interfaces that output information to the operator and notify the operator. For example, output unit 25 may be, but is not limited to, a display that outputs information as an image or a speaker that outputs information as sound. Such a display may be, for example, a liquid crystal panel display or an organic EL (Electro Luminescence) display. At least one of input unit 24 and output unit 25 may be configured integrally with measuring instrument 20 or may be provided separately.

[0058] The measurement unit 26 includes one or more sensors that measure the physical quantity of the measurement target, such as, but not limited to, a sensor that measures voltage, current, vibration, pressure, flow rate, temperature, and various levels.

[0059] Fig. 5 is a block diagram showing an example configuration of the gateway 30 in Fig. 2. The gateway 30 is one or more computer devices that can communicate with each other. As shown in Fig. 5, the gateway 30 includes a control unit 31, a storage unit 32, and a communication unit 33. The configurations of the control unit 31, storage unit 32, and communication unit 33 of the gateway 30 are similar to the configurations of the control unit 11, storage unit 12, and communication unit 13 of the server device 10, and therefore detailed description thereof will be omitted.

[0060] 6 is a block diagram showing an example configuration of terminal device 40 of FIG. 2. Terminal device 40 may be configured as one device or multiple devices capable of communicating with each other. As shown in FIG. 4, terminal device 40 includes a control unit 41, a storage unit 42, a communication unit 43, an input unit 44, and an output unit 45. The configurations of control unit 41, storage unit 42, and communication unit 43 of terminal device 40 are similar to those of control unit 11, storage unit 12, and communication unit 13 of server device 10, and therefore detailed description thereof will be omitted. The configurations of input unit 44 and output unit 45 of terminal device 40 are similar to those of input unit 24 and output unit 25 of measuring instrument 20, and therefore detailed description thereof will be omitted.

[0061] The operation of the measurement system 1 will be described with reference to Fig. 7. Fig. 7 is a flowchart showing an example of the operation of the measurement system 1. The operation of the measurement system 1 described with reference to Fig. 7 may correspond to one of the control methods of the measurement system 1. The operations of steps S1 to S3 in Fig. 7 may be performed under the control of the control unit 31 of the gateway 30. The operations of steps S4 to S6 may be performed under the control of the control unit 11 of the server device 10.

[0062] In step S1 , the control unit 31 of the gateway 30 acquires waveform data from the measuring instrument 20 .

[0063] In step S2, the control unit 31 of the gateway 30 extracts feature quantities from the waveform data acquired in step S1. For example, the control unit 31 may acquire, as feature quantities, the maximum and minimum values ​​in a certain section of the waveform data or the results of a Fourier transform, but this is not limitative.

[0064] In step S3, the control unit 31 of the gateway 30 transmits the feature acquired in step S2 to the server device 10. In addition to the feature, the control unit 31 may also transmit identification information of the waveform data and identification information of the measuring instrument 20 to the server device 10.

[0065] In step S4, the control unit 11 of the server device 10 stores the feature amount transmitted from the gateway 30 in step S3 in a storage device such as the storage unit 12. The control unit 11 may store the feature amount in association with the identification information of the waveform data and the identification information of the measuring instrument 20, etc.

[0066] In step S5, control unit 11 of server device 10 determines whether a request for waveform data feature quantities has been received from terminal device 40. Specifically, control unit 11 may determine that a request for waveform data feature quantities has been received when control unit 11 receives from terminal device 40 a request for feature quantities specified by, for example, the identification information of the waveform data or the identification information of measuring instrument 20. If control unit 11 has received a request for waveform data feature quantities (YES in step S5), control unit 11 proceeds to step S6; if not (NO in step S5), control unit 11 performs the process of step S5 again after a certain period of time.

[0067] In step S6, control unit 11 of server device 10 transmits the feature quantities of the waveform data to terminal device 40 that requested the feature quantities. As a result, terminal device 40 can present the received feature quantities to the user, for example by displaying them on the display of output unit 45. Control unit 11 of server device 10 may also transmit identification information for the waveform data and identification information for measuring instrument 20 to terminal device 40 in addition to the feature quantities of the waveform data. As a result, terminal device 40 may request waveform data from measuring instrument 20 in response to an instruction from the user. By downloading the waveform data, terminal device 40 can perform detailed analysis of the waveform data.

[0068] Next, more detailed examples of use (Examples 1 to 3) of the measurement system 1 according to this embodiment will be described.

[0069] (Usage example 1) For example, in a device that moves a drill at 10 s (10 seconds) intervals, the measuring device 20 acquires vibration data of the drill at 10 kS / s for 10 s and saves it in a 200 kB (= 10 kS / s × 2 bytes × 10 s) file to detect an abnormality in the drill. Note that kS / s is kilos per second (10 3 ) is the number of samples. For example, the gateway 30 may transmit 1 kB (250 points × 4 byte FloatData) of spectral data obtained by FFT calculation at 250 FFT points in a file created every 10 seconds to the server device 10 and store it. The terminal device 40 monitors such spectral data.

[0070] The measuring instrument 20 is, for example, an oscilloscope or a data logger. The data size per point of the vibration data acquired by the measuring instrument 20 is 2 bytes. The sampling rate of the measuring instrument 20 may be, for example, 100 kS / s or more, up to 200 MS / s. However, MS / s stands for megabits per second (10 6 ) is the number of samples. The capacity of one file of the original data from measuring instrument 20 may be 1 MB or more (sometimes exceeding 1 GB). In this case, the size of one file of waveform data for one minute of measurement time (sample rate x data size x measurement time) is, for example, 100 kS x 2 bytes x 60 s = 12 MB.

[0071] The feature extraction method may be simple thinning (extracting one point per fixed interval), Peak to Peak compression (extracting two points, the maximum and minimum values ​​per fixed interval), FFT data (spectral data obtained by FFT calculation per fixed interval), etc. In this case, the size of the feature extracted from one file related to waveform data of 12 MB in size will be about 1 kB.

[0072] (Usage example 2) For example, the measuring instrument 20 observes electrical modulation caused by lightning striking a facility. Specifically, when lightning strikes the facility, the measuring instrument 20 records frequency fluctuations at the facility. The waveform data acquired by the measuring instrument 20 is managed by remote cloud monitoring.

[0073] The measuring instrument 20 is, for example, a data logger. The measuring instrument 20 measures modulation of an electrical signal caused by a lightning strike. The type of original data of the measuring instrument 20 is, for example, a binary file in a measuring instrument format. The capacity of one file of waveform data of the measuring instrument 20 is, for example, about 10 MB. Here, the sampling rate of the measuring instrument 20 is assumed to be 1 MS / s.

[0074] The feature extraction method may be, for example, Peak to Peak compression (dividing the original waveform data into fixed intervals and extracting the maximum and minimum values ​​for each interval). The type of feature extraction data may be, for example, a binary file in a format for cloud display. The capacity of one file of feature waveform data may be, for example, about 1 kB. The measurement time may be, for example, about 60 minutes. The number of measurements per day may be, for example, one time.

[0075] (Usage example 3) The measurement system 1 may be applied to power system monitoring. In this case, the measurement device 20 may be used to monitor a remote power system and investigate the propagation and effects of power events. The following use cases 1 and 2 are considered as specific examples of use case 3.

[0076] (Use case 1) In the first example (Use Case 1) of Use Case 3, the measuring instrument 20 used is, for example, a high-speed data logger. In this case, the measurement target of the measuring instrument 20 may be approximately 30 channels of voltage, current, and power values ​​of a power system. In this case, the type of original data of the measuring instrument 20 is, for example, a binary file in measuring instrument format. The sampling rate of the measuring instrument 20 is, for example, 100 kS / s or less.

[0077] The feature values ​​extracted by the gateway 30 may be, for example, power values, RMS, peak-to-peak compression, maximum values, and minimum values. The capacity of one file of waveform data of feature values ​​may be, for example, about 1 kB. The measurement time may be continuous. The data is recorded when a power event occurs, and a trigger function may be used.

[0078] (Use case 2) In a second example (Use Case 2) of Use Case 3, the measuring instrument 20 used is, for example, an oscilloscope / data logger / power meter. In this case, the data size per point of the measuring instrument 20 is, for example, 2 bytes or more. The sample rate of the measuring instrument 20 may be, for example, 100 kS / s or more. The main sample rate may be 1 MS / s or more, up to a maximum of 200 MS / s (scope coder) / 1 GHz (oscilloscope). The capacity per file of the original data of the measuring instrument 20 may be 1 MB or more (sometimes exceeding 1 GB). In this case, the size of the waveform data is, for example, 100 kS x 2 bytes x 60 s = 12 MB, calculated as the sample rate x data size x measurement time.

[0079] The feature extracted by the gateway 30 may be, for example, simple thinning (extraction of one point per fixed interval), Peak-to-Peak compression (extraction of two points, the maximum and minimum values ​​per fixed interval), FFT data (spectral data obtained by FFT calculation per fixed interval), or high-precision power values. In this case, the capacity of one file of waveform data of feature may be, for example, about 1 kB. The measurement period may be, for example, from several hours to an unlimited period. In this case, high-speed measured waveforms can be recorded for a long period without loss. The measurement event may be, for example, a trigger measurement, which allows recording only when an event occurs.

[0080] As described above, the measurement system 1 stores data obtained by extracting feature quantities from waveform data, rather than the waveform data itself, in a server device 10 such as cloud storage. Therefore, compared to the measurement system 9 according to the comparative example, the upload time can be shortened and the storage capacity used in the server device 10 can be reduced. Furthermore, because only a small amount of data obtained by extracting feature quantities is transferred to the server device 10, data can be transferred without interruption, compared to the comparative example in which large amounts of waveform data are transferred as is.

[0081] A user of terminal device 40 can view the waveforms of feature quantities uploaded to server device 10 on client software. The user can also select feature quantities stored in the cloud storage associated with server device 10 and save them to terminal device 40. As described above, feature quantities may be stored in association with information (identification information) that can uniquely identify the waveform data, which is the original data from which the feature quantities were extracted. By referencing this unique identification information, the user can identify the measuring instrument 20 that acquired the waveform data and download the original waveform data from that measuring instrument 20.

[0082] As described above, in this embodiment, the waveform data to be processed by the measurement system 1 is waveform data relating to measured values ​​of physical quantities, but the type of waveform data is not limited to this. For example, the waveform data may be data relating to values ​​that are not directly related to physical quantities, such as the results of numerical analysis. Furthermore, the server device 10 may store the waveform data in any storage device. For example, the storage device may be cloud storage or any device on a local network.

[0083] In addition, in this embodiment, an example has been described in which the gateway 30 extracts features from the waveform data and uploads them to the server device 10. However, for example, the measuring instrument 20 may extract features from the waveform data and upload them to the server device 10.

[0084] Furthermore, in the present embodiment, an example has been described in which the measuring instrument 20 stores the waveform data from which feature quantities have been extracted, but the gateway 30 may also store the waveform data. In this case, the server device 10 may store the identification information of the gateway 30 that stores the original waveform data in association with the feature quantities, instead of the identification information of the measuring instrument 20. When the terminal device 40 wishes to access waveform data from which feature quantities have been extracted, it can download the waveform data from the gateway 30 identified by the identification information associated with the feature quantities.

[0085] The present disclosure is not limited to the above-described embodiments. For example, multiple blocks shown in the block diagrams may be integrated, or one block may be divided. Multiple steps shown in the flowcharts may be executed in parallel or in a different order depending on the processing capabilities of the device executing each step, or as needed, instead of being executed in chronological order as described. Other modifications are possible without departing from the spirit of the present disclosure. [Explanation of symbols]

[0086] 1. Measurement System 10 Server device 11 Control section 12 Storage section 13 Communications Department 20 Measuring instruments 21 Control section 22 Memory section 23 Communications Department 24 Input section 25 Output section 26 Measuring part 30 Gateway 31 Control Unit 32 Storage section 33 Communications Department 40 Terminal Equipment 41 Control Unit 42 Storage section 43 Communications Department 44 Input section 45 Output section 9 Measurement System 91 Server equipment 92 Measuring instruments 93 Terminal Equipment N Network

Claims

1. A measurement system having a gateway device, a server device, and a terminal device that can communicate with each other via a network, The gateway device Obtaining waveform data representing a waveform; extracting features from the acquired waveform data; transmitting the extracted waveform data to the server device; A control unit is provided, The server device storing the feature amount of the waveform data received from the gateway device; transmitting the stored feature amount to the terminal device in response to a request from the terminal device; A control unit is provided. Measurement system.

2. the gateway device is communicably connected to a measuring instrument that generates the waveform data; the control unit of the gateway device further transmits identification information of the measuring instrument or the gateway device that holds the waveform data to the server device; the control unit of the server device stores the identification information of the measuring instrument or the gateway device that holds the waveform data from which the feature amount has been extracted, in association with the feature amount. The measurement system of claim 1 .

3. 3. The measurement system according to claim 2, wherein the control unit of the server device transmits, in response to the request from the terminal device, the stored feature amount together with the identification information of the measuring instrument or the gateway device corresponding to the feature amount to the terminal device.

4. A control method for a measurement system having a gateway device, a server device, and a terminal device that can communicate with each other via a network, comprising: a control unit of the gateway device, acquiring waveform data indicative of a waveform; extracting a feature amount from the acquired waveform data; transmitting the extracted waveform data to the server device; Including, a control unit of the server device, storing the feature amount of the waveform data received from the gateway device; transmitting the stored feature amount to the terminal device in response to a request from the terminal device; Including, How to control the measurement system.

5. the gateway device is communicably connected to a measuring instrument that generates the waveform data; the control unit of the gateway device further transmits identification information of the measuring instrument or the gateway device that holds the waveform data to the server device; the control unit of the server device stores the identification information of the measuring instrument or the gateway device that holds the waveform data from which the feature amount has been extracted, in association with the feature amount. The method for controlling a measurement system according to claim 4.

6. 6. The measurement system control method according to claim 5, wherein the control unit of the server device transmits, in response to the request from the terminal device, the stored feature amount together with the identification information of the measuring instrument or the gateway device corresponding to the feature amount to the terminal device.

7. A server device capable of communicating with a gateway device and a terminal device via a network, receiving, from the gateway device, a feature extracted from waveform data indicating a waveform; storing the feature amount received from the gateway device; transmitting the stored feature amount to the terminal device in response to a request from the terminal device; A server device comprising a control unit.

8. The control unit receiving, from the gateway device, identification information of the measuring instrument that holds the waveform data from which the feature amount has been extracted, or the gateway device, together with the feature amount; storing the identification information of the measuring instrument or the gateway device that holds the waveform data from which the feature amount has been extracted, in association with the feature amount; The server device according to claim 7.

9. 9. The server device according to claim 8, wherein the control unit transmits, in response to the request from the terminal device, the stored feature amount together with the identification information of the measuring instrument or the gateway device corresponding to the feature amount to the terminal device.

10. A server device capable of communicating with a measuring device and a terminal device via a network, receiving, from the measuring device, feature amounts extracted from waveform data indicating a waveform; storing the feature amount received from the measuring device; transmitting the stored feature amount to the terminal device in response to a request from the terminal device; A server device comprising a control unit.

11. The control unit receiving, from the measuring device, identification information of the measuring device that generated the waveform data from which the feature quantities were extracted, together with the feature quantities; storing the identification information of the measuring instrument that generated the waveform data from which the feature amount was extracted, in association with the feature amount; The server device according to claim 10.

12. The server device according to claim 11 , wherein the control unit transmits the stored feature amount together with the identification information of the measuring device corresponding to the feature amount to the terminal device in response to the request from the terminal device.

13. A program that causes a computer to operate as the server device according to any one of claims 7 to 12.

Citation Information

Patent Citations

  • Network type waveform display device

    JP2001022607A