Inspection unit and inspection device

Abstract

This invention provides an inspection unit that can improve the contact reliability between the battery electrode terminals and probe pins. [Solution] The inspection unit of the present disclosure is an inspection unit that inspects the performance of a battery by contacting the electrode terminals of the battery, and comprises a plurality of probe pins, a socket that houses the plurality of probe pins so as to be movable by a first distance in the axial direction, a housing that houses the socket so as to be movable by a second distance in the axial direction, a biasing member disposed inside the housing that biases the socket in the axial direction so that a part of the socket protrudes to the outside from an opening provided in the housing, and an elastic part disposed inside the socket that elastically deforms so that each probe pin moves independently in the axial direction.

Description

Technical Field

[0001] The present disclosure relates to an inspection unit that contacts an electrode terminal of a battery to inspect the performance of the battery, and an inspection device including the inspection unit.

Background Art

[0002] In recent years, rectangular secondary batteries capable of handling high currents (for example, 80 amperes or more), such as batteries for electric vehicles (hereinafter referred to as EVs), have been increasing. Therefore, there is a demand for inspection units that can handle high currents in inspection units as well.

[0003] Conventionally, as this type of inspection unit, for example, the inspection unit described in Patent Document 1 is known. Patent Document 1 discloses a technique that enables easy assembly even when a probe pin is composed of a plurality of members.

Prior Art Documents

Patent Documents

[0004]

Patent Document 1

Summary of the Invention

Problems to be Solved by the Invention

[0005] In the conventional inspection unit, there is still room for improvement from the viewpoint of improving the contact reliability between the electrode terminal of the battery and the probe pin.

[0006] Therefore, an object of the present disclosure is to solve the above problems and provide an inspection socket capable of improving the contact reliability between the electrode terminal of the battery and the probe pin.

Means for Solving the Problems

[0007] The inspection unit according to one aspect of the present disclosure is A test unit that tests the performance of a battery by contacting the electrode terminals of the battery, Multiple probe pins, A socket that houses the plurality of probe pins so that they can move axially by a first distance, A housing that houses the socket so that it can move by a second distance in the axial direction, A biasing member is disposed inside the housing and biases the socket in the axial direction such that a portion of the socket protrudes to the outside through an opening provided in the housing. An elastic part is disposed inside the socket and elastically deforms to move each probe independently in the axial direction, It is equipped with.

[0008] An inspection apparatus according to one aspect of the present disclosure comprises a plurality of inspection units according to the present aspect. [Effects of the Invention]

[0009] According to this disclosure, it is possible to provide an inspection socket that can improve the contact reliability between the electrode terminals of a battery and the probe pins. [Brief explanation of the drawing]

[0010] [Figure 1] This is a perspective view of the inspection unit according to the embodiment of this disclosure, viewed from diagonally above. [Figure 2] Figure 1 is a perspective view of the inspection unit, seen from a diagonal downward angle. [Figure 3] Figure 1 is an exploded perspective view of the inspection unit. [Figure 4] This is a perspective view showing the inspection unit in Figure 1 with some of its components removed. [Figure 5] Figure 4 is a plan view showing the configuration, with the tip of the probe pin in a protruding position. [Figure 6] This is a plan view showing the configuration of Figure 4, with the tip of the probe pin in the retracted position. [Figure 7] Figure 4 is an exploded perspective view showing the configuration. [Figure 8] It is an enlarged perspective view showing a partial cross-section of the configuration of FIG. 4. [Figure 9] It is a side view showing a state where the tip portions of a plurality of probe pins included in the inspection unit of FIG. 1 are in contact with the electrode terminals of the battery. [Figure 10] It is a perspective view showing an example of an inspection apparatus including the inspection unit according to the present embodiment. [Figure 11] It is a perspective view showing a modified example of the inspection unit of FIG. 1, in which some components are removed. [Figure 12] It is an exploded perspective view showing a modified example of a plurality of probe pins. [Figure 13] It is an enlarged perspective view of FIG. 12. [Figure 14] It is a plan view showing a modified example of a plurality of probe pins partially in a transparent state.

MODE FOR CARRYING OUT THE INVENTION

[0011] (Knowledge on which the present disclosure is based) As a result of intensive studies to provide an inspection unit capable of improving the contact reliability between the electrode terminals of a battery and probe pins, the present inventors have obtained the following knowledge.

[0012] The probe pins of a conventional inspection unit are formed with a plurality of contact portions having pointed tips. In the conventional inspection unit, the probe pins are configured to be biased by a coil spring so as to maintain a state in which the plurality of contact portions are in contact with the electrode terminals of the battery. Further, in the conventional inspection unit, an attempt is made to improve the contact reliability between the electrode terminals and the probe pins by increasing the number of contact portions (for example, several hundreds).

[0013] However, the electrode terminals of the battery are not necessarily flat and may have stepped portions or irregularities. Therefore, even if a large number of contact portions are provided on the probe pins, the number of contact portions actually contacting the electrode terminals is extremely small (for example, three points). Since current flows only through the portions where the contact portions and the electrode terminals are in contact, if the number of contact portions contacting the electrode terminals is small, an arc may occur and the tips of the contact portions may melt.

[0014] Therefore, as a result of intensive studies, the inventors have found a configuration including an elastic portion that elastically deforms so as to independently move a plurality of probe pins in the axial direction. According to this configuration, it becomes possible for the plurality of probe pins to move so as to follow the stepped portions and irregularities of the electrode terminals, and the contact reliability between the electrode terminals and the probe pins can be improved. Based on this new finding, the inventors have arrived at the following invention.

[0015] Hereinafter, embodiments of the present disclosure will be described with reference to the accompanying drawings. The following description is merely illustrative in nature and is not intended to limit the present disclosure, the applications of the present disclosure, or the uses of the present disclosure. The drawings are schematic, and the ratios of each dimension etc. do not necessarily match the actual ones.

[0016] Also, hereinafter, for convenience of explanation, terms indicating directions such as "up", "down", etc. are used assuming the state during normal use. However, these terms do not mean to limit the use state etc. of the inspection unit and inspection apparatus of the present disclosure.

[0017] (Embodiment) The configuration of the inspection unit according to the embodiment of the present disclosure will be described. FIG. 1 is a perspective view of the inspection unit according to the embodiment of the present disclosure as viewed obliquely from above. FIG. 2 is a perspective view of the inspection unit of FIG. 1 as viewed obliquely from below.

[0018] As shown in Figures 1 and 2, the inspection unit 1 according to this embodiment is an inspection unit that inspects the performance of the battery 100 by contacting the electrode terminals 101 of the battery 100. In this embodiment, the battery 100 is a rectangular secondary battery. For example, the battery 100 is a lithium-ion battery for EVs. The dimensions of the battery 100 are, for example, 120 mm in height, 85 mm in width, and 12.5 mm in thickness. The inspection unit 1 is configured to perform, for example, charge / discharge tests, current-conducting tests, and voltage tests.

[0019] The battery 100 has two electrode terminals 101. One electrode terminal 101 is the positive terminal. The other electrode terminal 101 is the negative terminal. In this embodiment, the inspection unit 1 is configured to contact either of the two electrode terminals 101. Each of the two electrode terminals 101 has a stepped portion 101a formed thereon.

[0020] The inspection unit 1 comprises a housing 2, a socket 3, and a cable 4.

[0021] The housing 2 has a roughly rectangular parallelepiped shape and comprises a housing cover 21 and a housing base 22. When the housing cover 21 and the housing base 22 are combined, a housing space for accommodating the socket 3 and cable 4 is formed inside the housing 2.

[0022] Figure 3 is an exploded perspective view of inspection unit 1.

[0023] As shown in Figure 3, the housing cover 21 and the housing base 22 are fixed together by a plurality of fastening members 23, such as screws. The housing 2 is configured to accommodate the socket 3 so that it can move a distance L1 (second distance) in the axial direction X. The distance L1 is, for example, 15 mm. The housing 2 is formed such that the length in the width direction Y, which is perpendicular to the axial direction X, is longer than the length in the thickness direction Z, which is perpendicular to both the axial direction X and the width direction Y.

[0024] The socket 3 has a roughly rectangular parallelepiped shape and comprises a socket cover 31 and a socket base 32. When the socket cover 31 and the socket base 32 are combined, a storage space is formed inside the socket 3 for accommodating one end of the cable 4. The socket cover 31 and the socket base 32 are fixed together by a plurality of fastening members 33, such as screws. Similar to the housing 2, the socket 3 is formed so that its length in the width direction Y is longer than its length in the thickness direction Z.

[0025] Cable 4 is configured to extend in the axial direction X. One end of cable 4 is held inside socket 3. Socket 3 and cable 4 are configured to be integrally and relative to housing 2.

[0026] As shown in Figures 1 and 2, a ring terminal 41 is connected to the other end of the cable 4 for electrically connecting the cable 4 to an external device. In this embodiment, the cable 4 is a cable having a cross-sectional area (e.g., 22SQ) capable of carrying high current (e.g., 80 amperes or more).

[0027] As shown in Figure 3, a biasing member 5 is positioned inside the housing 2 to bias the socket 3 in the axial direction X such that a portion of the socket 3 protrudes outward from an opening 2a provided in the housing 2.

[0028] The biasing member 5 comprises a first spring member 51 that biases one end of the socket 3 in the width direction Y, and a second spring member 52 that biases the other end of the socket 3 in the width direction Y. In this embodiment, the first spring member and the second spring member 52 are made of coil springs. The biasing force (spring constant) of the first spring member and the second spring member 52 is the same as that of the other.

[0029] Figure 4 is a perspective view showing the configuration of the inspection unit 1 with the housing cover 21 and socket cover 31, which are some of the components, removed. Figure 5 is a plan view showing the configuration of Figure 4, with the tip 6a of the probe pin 6 in the protruding position. Figure 6 is a plan view showing the configuration of Figure 4, with the tip 6a of the probe pin 6 in the retracted position. Figure 7 is an exploded perspective view showing the configuration of Figure 4. Figure 8 is an enlarged perspective view showing a partial cross-section of the configuration of Figure 4.

[0030] Socket 3 is configured to accommodate multiple probe pins 6 so that they can move in the axial direction X by a distance L2 (first distance: see Figure 5). The distance L2 is, for example, 1 mm.

[0031] In this embodiment, as shown in Figures 4 to 8, the socket base 32 is provided with a recess 32a for accommodating three plate-shaped probe pins 6 stacked on top of each other in the thickness direction Z. Each probe pin 6 is configured to be movable within the recess 32a by a distance L2 in the axial direction X. The thickness of each probe pin 6 is, for example, 1 mm.

[0032] Inside the socket 3, there is an elastic part 7 that elastically deforms to move each probe pin 6 independently in the axial direction X. The elastic part 7 is in an inelastically deformed state when the tip 6a of each probe pin 6 is in a protruding position (see Figure 5) where it protrudes outward from the opening 3a provided in the socket 3. The elastic part 7 is also configured to elastically deform when the tip 6a of each probe pin 6 moves to a housing position (see Figure 6) where it is located inside the socket 3.

[0033] As shown in Figure 9, a pointed contact portion 6b is formed at the tip 6a of each probe pin 6. By moving each probe pin 6 independently in the axial direction X, each contact portion 6b can move along the stepped portion 101a of the terminal electrode 101 of the battery 100. In this embodiment, multiple contact portions 6 are formed at intervals in the longitudinal direction (width direction Y) at the tip 6a of each probe pin 6.

[0034] In this embodiment, the elastic portion 7 has elastic arms 71 and 72 that protrude from both sides of each probe pin 6 in the width direction Y. The elastic arms 71 and 72 are arranged in a U-shaped recess 32b provided in the socket base 32 and are configured to be elastically deformable in the axial direction X within the recess 32b. When the probe pin 6 is in the housing position (see Figure 6), the probe pin 6 contacts the side wall of the recess 32a, restricting its movement in the axial direction X against the biasing force of the biasing member 5. This reduces the load on the elastic arms 71 and 72 and suppresses excessive elastic deformation of the elastic arms 71 and 72. In this embodiment, the elastic arms 71 and 72 are integrally configured with the probe pin 6.

[0035] The elastic force of the elastic part 7 is set to be smaller than the biasing force of the biasing member 5. That is, when a load is applied to the inspection unit 1 in the axial direction X, the elastic part 7 is elastically deformed by a distance L2 before the biasing member 5 is compressed by a distance L1. The biasing force of the biasing member 5 is set to be, for example, 15 times or more greater than the elastic force of the elastic part 7.

[0036] Each probe pin 6 is stacked on top of each other in the thickness direction Z and is held between them by a clamping member 8 that is elastic in the thickness direction Z. As a result, each probe pin 6 is in close contact with each other in the thickness direction Z. Conductive grease or conductive gel is applied between adjacent probe pins 6, 6. This allows each probe 6 to move smoothly in the axial direction X independently.

[0037] As shown in Figure 7, each probe pin 6 has an elongated hole 6c that penetrates in the thickness direction Z and is elongated in the axial direction X. In this embodiment, the elongated hole 6c is elliptical. The elongated hole 6c may also be rectangular. The clamping member 8 includes a nut 81, a ring-shaped spacer 82, a cylindrical spacer 83 with a flange, a spring washer 84 which is an example of an elastic member having elasticity in the thickness direction Z, and a bolt 85 which is an example of a pin. A round terminal 42 is connected to one end of the cable 4.

[0038] The nut 81 is positioned on the probe pin 6 located on one side in the thickness direction Z (upper side in Figure 8) via the spacer 82 and the ring terminal 42 of the cable 4. The bolt 85 is inserted into the elongated hole 6c of each probe pin 6 from the other side in the thickness direction Z (lower side in Figure 8) via the spring washer 84 and spacer 83, and is screwed to the nut 81. As a result, each probe pin 6 is held tightly in contact with the thickness direction Z by the elastic force of the spring washer 84. The cable 4 also makes electrical contact with the probe pin 6 located on one side in the thickness direction Z (upper side in Figure 8) via the ring terminal 42.

[0039] Figure 10 is a perspective view showing an example of an inspection apparatus 200 equipped with the inspection unit 1 according to this embodiment.

[0040] The inspection device 200 is configured to simultaneously inspect the performance of multiple batteries 100 by comprising multiple inspection units 1. In Figure 10, the inspection device 200 has two inspection units 1 arranged adjacent to each other, and each inspection unit 1A has a housing 2A that integrates the housings 2 of the two units 1. The inspection device 200 also has multiple inspection units 1A arranged in parallel in the thickness direction Z. The size of the housing 2A is, for example, 57 mm in height, 125 mm in width, and 13.5 mm in thickness.

[0041] A through-hole 2Aa is provided in the center of the housing 2A in the axial direction X and width direction Y, extending in the thickness direction Z. A cylindrical shaft 201 is inserted into the through-hole 2Aa of each inspection unit 1A. Each inspection unit 1A is also held on both sides in the width direction Y by a pair of side plates 202, 202. Grooves 2Ab extending in the thickness direction Z are provided on the two sides of the housing 2A of each inspection unit 1A that are opposite to the width direction Y. Each side plate 202, 202 is provided with a rail 203 that extends in the thickness direction X and is inserted into the groove 2Ab. As a result, multiple inspection units 1A are held at predetermined intervals in the thickness direction Z.

[0042] Next, we will explain an example of how to perform performance testing on multiple batteries 100 using the testing device 200.

[0043] First, as shown in Figure 10, the inspection device 200 is positioned opposite the electrode terminals 101, 101 of each battery 100.

[0044] Subsequently, each inspection unit 1A is moved axially X (downward in the drawing), and the contact portion 6b of each probe pin 6 is brought into contact with the corresponding electrode terminals 101, 101 of the battery 100. As a result, the elastic portion 7 of each probe pin 6 is elastically deformed, and the tip portion 6a of each probe pin 6 moves from the protruding position (see Figure 5) to the retracted position (see Figure 6). At this time, each probe pin 6 moves independently axially X, and as shown in Figure 9, each contact portion 6b moves along the stepped portion 101a of the terminal electrode 101.

[0045] Subsequently, the biasing member 5 of each inspection unit 1A is compressed in the axial direction X. At this time, even if the axial positions of the multiple batteries 100 differ by a distance L1 or less, the compression length of each biasing member 5 adjusts accordingly, so that the contact portion 6b of all inspection units 1A makes contact with the terminal electrode 101 of the corresponding battery 100. In this state, the inspection device 200 performs various tests on the multiple batteries 100.

[0046] According to the inspection unit 1,1A of this embodiment, an elastic part 7 is provided that elastically deforms to move each of the multiple probe pins 6 independently in the axial direction X. This configuration makes it possible for the multiple probe pins 6 to move in accordance with the stepped portion 101a of the electrode terminal 100. As a result, the contact portion 6b that contacts the electrode terminal 100 can be increased, and the contact reliability between the electrode terminal 100 and the probe pins 6 can be improved. In addition, the generation of arcs can be suppressed, and the durability of the probe pins 6 can be improved.

[0047] Furthermore, according to the inspection units 1 and 1A of this embodiment, the distance L2 is set to be shorter than the distance L1. This configuration reduces the load on the elastic part 7, and allows the elastic part 7 to have a simple structure such as elastic arms 71 and 72.

[0048] Furthermore, according to the inspection units 1 and 1A of this embodiment, the elastic force of the elastic part 7 is set to be smaller than the biasing force of the biasing member 5. This configuration allows the elastic part 7 to have a simpler structure, such as elastic arms 71 and 72, compared to the biasing member 5.

[0049] Furthermore, according to the inspection units 1 and 1A of this embodiment, the elastic part 7 is configured to be in an inelastically deformed state when the tip portion 6a of each probe pin 6 is in a protruding position, and to be elastically deformed when the tip portion 6a of each probe pin 6 moves to a retracted position. With this configuration, when the tip portion 6a of each probe pin 6 is not in contact with the electrode terminal 100, no load is placed on the elastic part 7, and the elastic part 7 can be made into a simple structure such as elastic arms 71 and 72. In addition, when the tip portion 6a of each probe pin 6 moves to a retracted position, the elastic deformation of the elastic part 7 improves the contact reliability between the probe pin 6 and the electrode terminal 100.

[0050] Furthermore, according to the inspection units 1 and 1A of this embodiment, each probe pin 6 is a plate-shaped probe pin, stacked on top of each other in the thickness direction, and the elastic part 7 has elastic arms 71 and 72 that protrude from both sides of each probe pin 6 in the width direction Y. This configuration makes it possible to integrally construct the elastic part 7 and the probe pins 6, thereby reducing the number of parts.

[0051] Furthermore, according to the inspection unit 1,1A of this embodiment, each probe pin 6 is a plate-shaped probe pin, stacked on top of each other in the thickness direction Z, and held between them by a clamping member 8 that is elastic in the thickness direction Z. With this configuration, each probe pin 6 can be in close contact with each other in the thickness direction Z and make contact with the terminal electrode 101.

[0052] Furthermore, according to the inspection unit 1,1A of this embodiment, each probe pin 6 has an elongated hole 6c that penetrates in the thickness direction Z and is elongated in the axial direction X, and the clamping member 8 is equipped with a bolt 85 that is inserted into the elongated hole 6c. With this configuration, the clamping member 8 can clamp multiple probe pins 6 in a compact configuration.

[0053] Furthermore, according to the inspection unit 1,1A of this embodiment, the biasing member 5 includes a first spring member 51 that biases one end of each probe pin 6 in the width direction Y, and a second spring member 52 that biases the other end of each probe pin 6 in the width direction Y. With this configuration, even if the terminal electrode 101 has an inclination or step in the width direction Y, the contact reliability between each probe pin 6 and the terminal electrode 101 in the width direction Y can be improved.

[0054] Furthermore, the inspection device 200 according to this embodiment includes multiple inspection units 1A. This configuration allows multiple batteries 100 to be inspected simultaneously, thereby shortening the total inspection time.

[0055] This disclosure is not limited to the embodiments described above, and can be implemented in various other forms. For example, in the above description, the housing 2 has a closed structure except for the opening 2a and the hole into which the cable 4 is inserted, but this disclosure is not limited thereto. The housing 2 may be provided with, for example, slits or holes for cooling the internal space.

[0056] Furthermore, although the above description assumes that the inspection unit 1 includes a cable 4, this disclosure is not limited thereto. The inspection unit 1 may include, instead of the cable 4, a component capable of transmitting current flowing through the probe pins 6 to an external device. For example, the inspection unit 1 may include a conductor comprising a metal rod and a connector fitted to the rod.

[0057] Furthermore, although the above description assumes that the socket 3 is configured to accommodate three plate-shaped probe pins 6, the disclosure is not limited thereto. For example, the socket 3 may be configured to accommodate two or four or more plate-shaped probe pins 6.

[0058] Furthermore, although the above assumes that each probe pin 6 has an elongated hole 6c, the disclosure is not limited thereto. For example, one of the multiple probe pins 6 may have a round hole corresponding to the diameter of a cylindrical spacer 83 or bolt 85. In this case, the movement of the probe pin 6 having the round hole is restricted in the axial direction X, but the contact reliability between the electrode terminal 100 and the probe pins 6 can be improved by allowing the other probe pins 6 having the elongated holes to move in the axial direction X.

[0059] Furthermore, although the elastic arms 71 and 72 of the elastic part 7 were shown above as projecting linearly from both sides of each probe pin 6 in the width direction Y (see, for example, Figure 5), the disclosure is not limited thereto. The elastic arms 71 and 72 only need to be arranged in a U-shaped recess 32b provided in the socket base 32 and configured to be elastically deformable in the axial direction X within the recess 32b. The elastic arms 71 and 72 may also be formed in a meander shape, for example, as shown in Figure 11.

[0060] Furthermore, although the tip portion 6a of each probe pin 6 is shown to be generally flat in the above illustrations (see, for example, Figures 4 to 8), the present invention is not limited thereto. The tip portion of each probe pin 6 may be wavy, as shown in Figure 11.

[0061] Furthermore, although all probe pins 6 were illustrated above as being flat plate-shaped members (see Figure 7), this disclosure is not limited to this. As shown in Figure 12, one of two adjacent probe pins 6 may be provided with an elastic piece 6d that biases the other adjacent probe pin 6 in the thickness direction Z. As shown in Figure 12, the elastic piece 6d is the portion surrounded by a U-shaped through hole 6e provided in a part of the probe pin 6. As shown in Figure 13, the elastic piece 6d is formed by bending it so as to protrude from the main surface (XY plane) of the probe pin 6 in the thickness direction Z and extend in the X direction. Two elastic pieces 6d are provided on one probe pin 6 at positions symmetrical with respect to the axial direction X. Also, when elastic pieces 6d are provided on both adjacent probe pins 6, as shown in Figure 14, each elastic piece 6d is provided at a position that does not overlap in the thickness direction. According to the structures shown in Figures 12 to 14, adjacent probe pins 6 can be made to contact each other more reliably and current can be passed between them.

[0062] Furthermore, while the above description states that the inspection device 200 comprises an inspection unit 1A having a housing 2A that integrates two inspection units 1 arranged adjacent to each other and the respective housings 2, the disclosure is not limited thereto. The inspection device 200 may also comprise multiple inspection units 1 separately. This allows, for example, batteries 100 with different distances between two electrode terminals 101 to be inspected using the same inspection unit 1, thereby improving versatility.

[0063] Having described in detail various embodiments of this disclosure with reference to the drawings above, we will now conclude by describing various aspects of this disclosure. Reference numerals are also included in the following description as an example.

[0064] According to a first aspect of this disclosure, an inspection unit 1 that contacts the electrode terminals 101 of a battery 100 to inspect the performance of the battery 101, Multiple probe pins 6, A socket 3 that houses the plurality of probe pins 6 so that they can move axially by a first distance L2, A housing 2 that houses the socket 3 so that it can move by a second distance L1 in the axial direction X, A biasing member 5 is positioned inside the housing 2 and biases the socket 3 in the axial direction X such that a portion of the socket 3 protrudes outward from an opening 2a provided in the housing 2, An elastic part 7 is positioned inside the socket 3 and elastically deforms to move each probe pin 6 independently in the axial direction X, An inspection socket 1 is provided, which includes the following features.

[0065] According to a second aspect of this disclosure, the inspection socket 1 according to the first aspect is provided, wherein the first distance L2 is shorter than the second distance L1.

[0066] According to a third aspect of this disclosure, the inspection socket 1 according to the first or second aspect is provided, wherein the elastic force of the elastic portion 7 is smaller than the biasing force of the biasing member 5.

[0067] According to a fourth aspect of the present disclosure, the inspection unit 1 according to any one of the first to third aspects is provided, wherein the elastic portion 7 is in an inelastically deformed state when the tip portion 6a of each probe pin 6 is in a protruding position that protrudes outward from an opening 3a provided in the socket 3, and is elastically deformed when the tip portion 6a of each probe pin 6 moves to a housing position located inside the socket 3.

[0068] According to a fifth aspect of this disclosure, each probe pin 6 is a plate-shaped probe pin, stacked on top of each other in the thickness direction Z, The inspection unit 1 according to the fourth embodiment is provided, wherein the elastic portion 7 has elastic arms 71 and 72 that protrude from both sides of each probe pin 6 in the width direction Y which is perpendicular to the axial direction X and the thickness direction Z.

[0069] According to a sixth aspect of this disclosure, the inspection unit described in the fourth aspect is provided, wherein each probe pin 6 is a plate-shaped probe pin, stacked on top of each other in the thickness direction, and held between them by a clamping member 8 having elasticity in the thickness direction Z.

[0070] According to a seventh aspect of this disclosure, at least one of the plurality of probe pins 6 has an elongated hole 6c that penetrates in the thickness direction Z and is elongated in the axial direction X, The inspection unit 1 according to the sixth embodiment is provided, wherein the clamping member 8 includes a pin 85 that is inserted into the elongated hole 6c.

[0071] According to the eighth aspect of this disclosure, each probe pin 6 is a plate-shaped probe pin, which is stacked on top of each other in the thickness direction. The inspection unit 1 according to the fourth embodiment is provided, wherein the biasing member 5 comprises a first spring member 51 that biases one end of each probe pin 6 in the width direction Y which is perpendicular to the axial direction X and the thickness direction Z, and a second spring member 52 that biases the other end of each probe pin 6 in the width direction Y.

[0072] According to the ninth aspect of this disclosure, each probe pin 6 is a plate-shaped probe pin, which is stacked on top of each other in the thickness direction. The present invention provides an inspection unit 1 according to the first embodiment, wherein one of the adjacent probe pins 6 is provided with an elastic piece 6d that biases the other adjacent probe pin 6 in the thickness direction Z.

[0073] According to a tenth aspect of this disclosure, an inspection device 200 is provided, comprising inspection units 1,1A described in any one of the first to ninth aspects.

[0074] By appropriately combining any embodiment or modification from the various embodiments or modifications described above, the effects of each can be achieved. Furthermore, combinations of embodiments with each other, combinations of examples with each other, and combinations of embodiments with examples are possible, as well as combinations of features from different embodiments or examples.

[0075] While this disclosure is adequately described in relation to preferred embodiments with reference to the accompanying drawings, various variations and modifications will be obvious to those skilled in the art. Such variations and modifications should be understood to be included within the scope of this disclosure as defined by the attached claims. [Industrial applicability]

[0076] The inspection unit and inspection apparatus of this disclosure can improve the contact reliability between the electrode terminals of a battery and the probe pins, and are therefore particularly useful as an inspection unit and inspection apparatus for inspecting prismatic batteries for electric vehicles. [Explanation of Symbols]

[0077] 1,1A Inspection Unit 2.2A Housing 2a opening 2Aa Through hole 2Ab Groove 3 sockets 3a opening 4 Cables 5. Biasing member 6 probe pins 6a Tip 6b Contact area 6c long hole 6d elastic piece 6e Through hole 7 Elastic part 8 Holding member 21 Housing Cover 22 Housing Base 23 Fastening members 31 Socket Cover 32 Socket Base 33 Fastening members 41, 42 Ring terminals 51 First spring member 52 Second spring member 71,72 Elastic arm 81 Nut 82,83 Spacer 84 Spring Washer 85 volts 100 batteries 101 Electrode terminal 101a Stepped section 200 Inspection Equipment 201 Shaft 202 Side Plate 203 Rail

Claims

1. A test unit that tests the performance of a battery by contacting the electrode terminals of the battery, Multiple probe pins, A socket that houses the plurality of probe pins so that they can move axially by a first distance, A housing that houses the socket so that it can move by a second distance in the axial direction, A biasing member is disposed inside the housing and biases the socket in the axial direction such that a portion of the socket protrudes to the outside through an opening provided in the housing. An elastic part is disposed inside the socket and elastically deforms to move each probe pin independently in the axial direction, An inspection unit equipped with the following features.

2. The inspection unit according to claim 1, wherein the first distance is shorter than the second distance.

3. The inspection unit according to claim 1, wherein the elastic force of the elastic part is smaller than the biasing force of the biasing member.

4. The inspection unit according to claim 1, wherein the elastic portion is in an inelastically deformed state when the tip of each probe pin is in a protruding position where it protrudes outward from an opening provided in the socket, and is elastically deformed when the tip of each probe pin moves to a housing position where it is located inside the socket.

5. Each probe pin is a plate-shaped probe pin, stacked on top of each other in the thickness direction. The inspection unit according to claim 4, wherein the elastic portion has elastic arms that protrude from both sides of each probe pin in a width direction perpendicular to the axial direction and the thickness direction.

6. The inspection unit according to claim 4, wherein each probe pin is a plate-shaped probe pin, stacked on top of each other in the thickness direction, and held together by a clamping member having elasticity in the thickness direction.

7. At least one of the plurality of probe pins has an elongated hole that penetrates in the thickness direction and is elongated in the axial direction, The inspection unit according to claim 6, wherein the clamping member comprises a pin inserted into the elongated hole.

8. Each probe pin is a plate-shaped probe pin, stacked on top of each other in the thickness direction. The inspection unit according to claim 4, wherein the biasing member comprises a first spring member that biases one end of each probe pin in the width direction perpendicular to the axial direction and the thickness direction, and a second spring member that biases the other end of each probe pin in the width direction.

9. Each probe pin is a plate-shaped probe pin, stacked on top of each other in the thickness direction. The inspection unit according to claim 1, wherein one of the adjacent probe pins is provided with an elastic piece that biases the other adjacent probe pin in the thickness direction.

10. An inspection device comprising an inspection unit according to any one of claims 1 to 9.

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