AE sensor mounting structure

By placing AE sensors on individual members aligned with the processing force direction, the invention addresses the challenge of identifying multiple AE wave sources within the same propagation range, achieving precise location and waveform detection.

JP2026098956AActive Publication Date: 2026-06-18NICHIDAI
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Patent Information

Authority / Receiving Office
JP · JP
Patent Type
Applications
Current Assignee / Owner
NICHIDAI
Filing Date
2024-12-06
Publication Date
2026-06-18

AI Technical Summary

Technical Problem

Conventional AE sensor mounting structures struggle to accurately identify the location and waveform characteristics of multiple AE wave sources within the same propagation range due to interference and noise, requiring specialized time measurement and analysis technologies.

Method used

The solution involves positioning AE sensors on individual members constituting each processing part in the direction of the applied processing force, allowing for independent detection of AE waves and their characteristics from adjacent processing parts.

Benefits of technology

This approach enables clear identification of the source and waveform of each AE wave even when multiple sources generate waves simultaneously, reducing interference and enhancing accuracy in detecting device abnormalities.

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Abstract

For each of the AE wave sources within the same propagation range, the location and waveform characteristics can be obtained without interference. [Solution] The AE sensor mounting structure of the present invention is located in a processing apparatus 1 in which a plurality of independent processing parts 2 are arranged adjacent to each other, and AE waves generated in each of these processing parts 2 propagate toward each other in the direction in which each processing part 2 is located. Each AE sensor S is placed on an individual member constituting each processing part 2 in the direction in which the processing force is applied to each processing location (each molding part P) of each processing part 2. [Effect] Even though multiple AE waves propagate intertwined within the AE propagation range from adjacent processing parts, it is possible to individually detect which processing part generated which AE wave and what its waveform is.
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