SPECIMEN INSERTION AND POSITIONING APPARATUS AND MATERIAL TESTING SYSTEM COMPRISING THE SPECIMEN INSERTION AND POSITIONING APPARATUS - Patent application

Abstract

An exemplary disclosed apparatus for aligning a test sample in a universal test system includes a first sample grip attached to the universal test system and configured to hold the test sample in a first orientation relative to the universal test system and move the test sample toward a test axis of the universal test system, and a sample stop attached to the universal test system and configured to set a stop point for the test sample, wherein the first sample grip and the sample stop are configured to align the test sample with the test axis.

Description

[Technical Field]

[0001] [Related Applications] This application claims the benefit of U.S. Patent Application No. 63 / 426,613, filed November 29, 2022, entitled "SPECIMEN INSERTION AND ALIGNMENT DEVICES, AND MATERIAL TESTING SYSTEMS INCLUDING SPECIMEN INSERTION AND ALIGNMENT DEVICES," the entire contents of which are expressly incorporated herein by reference.

[0002] FIELD OF THE DISCLOSURE This disclosure relates generally to mechanical testing, and more particularly to a specimen insertion and alignment device and a materials testing system including the specimen insertion and alignment device. [Background technology]

[0003] Universal testing machines are used to perform mechanical tests, such as compressive or tensile strength tests, on materials or components. Typically, a sample is inserted into a load string and a force is applied to the sample by the universal testing machine while a load cell or other sensor measures the force. The test may be run to sample failure or other stopping point. Summary of the Invention

[0004] A sample insertion and alignment apparatus, and a materials testing system including the sample insertion and alignment apparatus, is disclosed as substantially illustrated by and described in connection with at least one of the drawings, as more fully set forth in the claims.

[0005] These and other features, aspects, and advantages of the present disclosure will be better understood when the following detailed description is read in conjunction with the accompanying drawings, in which like reference characters represent like parts throughout. [Brief explanation of the drawings]

[0006] [Figure 1] FIG. 1 illustrates an exemplary testing apparatus for performing mechanical property testing, according to aspects of the present disclosure.

[0007] [Figure 2] FIG. 2 is a block diagram of an exemplary embodiment of the test apparatus of FIG. 1.

[0008] [Figure 3] 3 is a perspective view of an exemplary embodiment of the test fixture and sample insertion device of FIG. 2, in which the sample insertion device has an arcuate path.

[0009] [Figure 4] 4 is a perspective view of the exemplary sample insertion device of FIG. 3 in a first position.

[0010] [Figure 5] 4 is a perspective view of the example sample insertion device of FIG. 3 in a second position in which the sample is aligned with the test axis of the testing device.

[0011] [Figure 6] FIG. 4 is a side view of the exemplary sample insertion device of FIG. 3.

[0012] [Figure 7] 4 is a top view of the exemplary sample insertion device of FIG. 3 in a first position.

[0013] [Figure 8A] 3 is a top view of the exemplary sample insertion device of FIG. 2 in a second position for samples having different widths. [Figure 8B] 3 is a top view of the exemplary sample insertion device of FIG. 2 in a second position for samples having different widths.

[0014] [Figure 9] 3 is a perspective view of another exemplary embodiment of the sample insertion device of FIG. 2 in a first position, wherein the sample insertion device has a linear path.

[0015] [Figure 10] 10 is a top view of the exemplary sample insertion device of FIG. 9 in a first position.

[0016] [Figure 11] 10 is a front view of the exemplary sample insertion device of FIG. 9 in a first position.

[0017] [Figure 12] FIG. 10 is a side view of the exemplary sample insertion device of FIG. 9.

[0018] [Figure 13A] 3A-3C show another exemplary sample grip that can be used to implement the sample insertion device of FIG. 2. [Figure 13B] 3A-3C show another exemplary sample grip that can be used to implement the sample insertion device of FIG. 2. [Figure 13C] 3A-3C show another exemplary sample grip that can be used to implement the sample insertion device of FIG. 2.

[0019] [Figure 14A] 3A-3C show another exemplary sample grip and sample stop that can be used to implement the sample insertion device of FIG. 2. [Figure 14B] 3A-3C show another exemplary sample grip and sample stop that can be used to implement the sample insertion device of FIG. 2. [Figure 14C] 3A-3C show another exemplary sample grip and sample stop that can be used to implement the sample insertion device of FIG. 2. DETAILED DESCRIPTION OF THE INVENTION

[0020] The drawings are not necessarily to scale. Where appropriate, like or identical reference numbers are used to refer to like or identical components.

[0021] Conventional materials testing systems require an operator to manually position a sample while a fixture of the materials testing system engages the sample. For example, an operator may be required to hold a sample with one hand while controlling a manual or motorized grip with the other hand to engage a manually positioned sample. Such techniques are prone to operator error, which can result in invalid sample testing and reduced throughput in testing laboratories. In other cases, operators may use static guides or stops that provide limits to sample positioning, but may still require the operator to at least partially manually position the sample. Such guides or stops are intended for samples having specific dimensions, and changing the sample dimensions requires the removal and replacement of the corresponding guides.

[0022] The disclosed example specimen insertion and alignment device provides flexible and reliable specimen insertion and alignment with the load string to accommodate specimens of various lengths, widths, and / or thicknesses. In the disclosed example, the specimen is inserted into the specimen grip by an operator and then moved along a predetermined path to be aligned with the test axis of the test system. The disclosed example specimen insertion and alignment device then holds the specimen aligned with the test axis while the material fixture of the test system engages the specimen for testing.

[0023] The disclosed exemplary sample insertion and alignment device allows for samples of various sizes to be inserted and properly aligned without requiring modification by the operator. Additionally, the disclosed exemplary sample insertion and alignment device allows for the operator to completely remove the load string and fixture while the sample is still engaged by the fixture.

[0024] As used herein, the "test axis" of a test system or test frame refers to the axis or line along which the test system applies a load to a sample.

[0025] 1 illustrates an exemplary materials testing system 100 for performing mechanical property testing. The exemplary materials testing system 100 may be, for example, a general-purpose testing system capable of performing static mechanical tests. The materials testing system 100 may perform, for example, compressive strength tests, tensile strength tests, shear strength tests, flexural strength tests, flexural strength tests, tear strength tests, peel strength tests (e.g., adhesive bond strength), and / or any other compressive, tensile, torsional, thermal, and / or impact tests. Additionally or alternatively, the materials testing system 100 may perform dynamic tests.

[0026] The example materials testing system 100 includes a test fixture 102 and a computing device 104 communicatively coupled to the test fixture 102. The test fixture 102 applies a load to a material under test 106 and measures a mechanical property of the test, such as a displacement of the material under test 106 and / or a force applied to the material under test 106.

[0027] The example computing device 104 can be used to configure the test equipment 102, control the test equipment 102, and / or receive measurement results from the test equipment 102 for processing, displaying, reporting, and / or any other desired purpose.

[0028] Figure 2 is a block diagram of an example computing system 200 that can be used to implement the materials testing system 100 of Figure 1. The example materials testing system 100 of Figure 2 includes a test tool 102 and a computing device 104. The example computing device 104 can be a general purpose computer, a laptop computer, a tablet computer, a mobile device, a server, an all-in-one computer, and / or any other type of computing device.

[0029] The example computing system 200 of FIG. 2 includes a processor 202. The example processor 202 may be any general-purpose central processing unit (CPU) from any manufacturer. In some other examples, the processor 202 may include one or more special-purpose processing units, such as a RISC processor with an ARM core, a graphics processing unit, a digital signal processor, and / or a system-on-chip (SoC). The processor 202 executes machine-readable instructions 204, which may be stored locally in the processor (e.g., an internal cache or SoC), random access memory 206 (or other volatile memory), read-only memory 208 (or other non-volatile memory, such as flash memory), and / or a mass storage device 210. The example mass storage device 210 may be a hard drive, a solid-state storage drive, a hybrid drive, a RAID array, and / or any other mass data storage device.

[0030] The bus 212 allows communication between the processor 202 , the RAM 206 , the ROM 208 , the mass storage device 210 , the network interface 214 , and / or the input / output interface 216 .

[0031] The example network interface 214 includes hardware, firmware, and / or software that connects the computing system 200 to a communications network 218, such as the Internet. For example, the network interface 214 may include IEEE 802.X compliant wireless and / or wired communications hardware for transmitting and / or receiving communications.

[0032] 2 includes hardware, firmware, and / or software that couples one or more input / output devices 220 to the processor 202 to provide input to and / or output from the processor 202. For example, the I / O interface 216 may include a graphics processing unit for interfacing with a display device, a Universal Serial Bus port for interfacing with one or more USB-compliant devices, FireWire, Fieldbus, and / or any other type of interface. The example materials testing system 100 includes a display device 224 (e.g., an LCD screen) coupled to the I / O interface 216. Other example I / O device(s) 220 may include a keyboard, keypad, mouse, trackball, pointing device, microphone, audio speaker, display device, optical media drive, multi-touch touchscreen, gesture recognition interface, magnetic media drive, and / or any other type of input and / or output device.

[0033] The exemplary computing system 200 can access non-transitory machine-readable medium 222 via I / O interface 216 and / or I / O device(s) 220. Examples of machine-readable medium 222 in Figure 2 include optical disks (e.g., compact discs (CDs), digital versatile / video discs (DVDs), Blu-ray® discs, etc.), magnetic media (e.g., floppy disks), portable storage media (e.g., portable flash drives, secure digital (SD) cards, etc.), and / or any other type of removable and / or attached machine-readable medium.

[0034] The example materials testing system 100 of Figure 1 further includes a test tool 102 coupled to a computing system 200. In the example of Figure 2, the test tool 102 is coupled to a computing device via an I / O interface 216, such as a USB port, a Thunderbolt port, a FireWire (IEEE 1394) port, and / or any other type of serial or parallel data port. In some other examples, the test tool 102 is coupled to a network interface 214 via a wired or wireless connection, either directly or via a network 218.

[0035] 2 includes a frame 228, a load cell 230, a displacement transducer 232, a cross member loader 234, a material fixture 236, a controller 238, and a sensor(s) 240. The test fixture 102 may include any number of other transducers based on the type(s) of mechanical test the test fixture 102 is capable of performing. The other test fixtures may be dynamic test fixtures and / or may include different test equipment, while including suitable transducers that can generate test data and be controlled via the computing device 104. The example test fixture 102 may include actuators, load strings, fixtures, structural members, and / or any other components to facilitate compressive strength testing, tensile strength testing, shear strength testing, flexural strength testing, flexural strength testing, tear strength testing, peel strength testing (e.g., adhesive bond strength), and / or any other compressive, tensile, torsional, thermal, and / or impact, and / or dynamic testing.

[0036] The frame 228 provides rigid structural support for the other components of the testing fixture 102 that perform the test. The load cell 230 measures the force applied to the material under test by a cross-member loader 234 (e.g., an electric motor, hydraulic pump, pneumatic actuator, and / or other actuator that may be supported by a crosshead, and / or other moving member(s) that couple the actuator to the sample) through a material fixture 236. The cross-member loader 234 applies the force to the material under test, while the material fixture 236 (e.g., a grip or other fixture) grasps or otherwise couples the material under test to the cross-member loader 234. Exemplary material fixtures 236 include grips, jaws, jigs, anvils, compression platens, or other types of fixtures, depending on the mechanical property and / or material being tested.

[0037] The example controller 238 communicates with the computing device 104, for example, receiving test parameters from the computing device 104 and / or reporting measurements and / or other results to the computing device 104. For example, the controller 238 may include one or more communication or I / O interfaces that allow communication with the computing device 104. The controller 238 may control the cross member loader 234 to increase or decrease the applied force, may control the fixture(s) 236 to grip or release the material under test, and / or may receive measurements from the displacement transducer 232, the load cell 230, and / or any other transducer(s).

[0038] The example test fixture 102 can further include a sample insertion device 240. The sample insertion device 240 can be attached to the test fixture 102 for stability and / or repeatability, improving the consistency and reliability of sample insertion and testing. As disclosed in more detail below, the sample insertion device 240 allows an operator or an automated system to place a sample into the sample insertion device 240 and then insert the sample insertion device 240 into position for the material fixture 236 (e.g., grips) to grasp the sample so that the sample is aligned with the test axis.

[0039] Figure 3 is a perspective view of one exemplary embodiment of a test fixture 102 and a sample insertion device 300 that may be used to implement the sample insertion device 240 of Figure 2 to position a sample 301 within the test fixture 102. Figure 4 is a perspective view of the exemplary sample insertion device 300 of Figure 3 in a first position. Figure 5 is a perspective view of the exemplary sample insertion device 300 of Figure 3 in a second position in which the sample is aligned with the test axis of the test fixture. Figure 6 is a side view of the exemplary sample insertion device 300 of Figure 3. Figure 7 is a top view of the exemplary sample insertion device 300 of Figure 3 in the first position.

[0040] The example sample insertion device 300 includes a first sample grip 302 and a sample stop 304. The sample grip 302 and the sample stop 304 are coupled to respective dowels 306, 308 for rotation of the sample grip 302 and the sample stop 304, respectively. The dowels 306, 308 are coupled to the frame 228 (e.g., stationary legs of the frame 228) to fix the rotational axes of the sample grip 302 and the sample stop 304 in a stationary position relative to the frame 228. The example dowels 306, 308 can be keyed or have a non-circular cross-section (e.g., square, hexagonal) to provide consistent relative rotation between the sample grip 302 and the sample stop 304 and / or define alignment between the arms of the sample grip 302 and the sample stop 304.

[0041] The dowels 306, 308 are attached or otherwise secured to the frame 228 of the test fixture 102 via upper and lower brackets 310, 312. The brackets 310, 312 allow the dowels 306, 308 to rotate but hold the dowels in a stationary position relative to the frame 228. In other examples, the specimen grips 302 and / or specimen stops 304 can be mounted to other portions of the test frame 228, such as the cross-member loader 234 and / or the base of the test fixture 102, to allow for adjustment of the height of the specimen grips 302 and specimen stops 304. In yet other examples, the sample grip 302 and / or sample stop 304 can be mounted to other structures that are stationary relative to the test fixture 102, such as a support surface (e.g., a floor, a table, etc.), a stationary side (e.g., a nearby wall), and / or a device that is removably mounted to the test fixture 102 (e.g., attached to or mounted to a removable material fixation device 236, such as a removable grip).

[0042] The example dowels 306, 308 of Figure 3 are geared to provide rotational control. In the example shown, the gears 314, 316 of the dowels 306, 308 are rotationally coupled to provide simultaneous and opposing rotation from a first (e.g., open, or unaligned) position to a second (e.g., closed, aligned with the test axis) position.

[0043] The actuator can actuate the pinion gears to move the sample grips 302 and sample stop 304 inward (e.g., toward each other and / or toward the test axis 326) or outward (e.g., away from each other and / or away from the test axis 326) via gears 314, 316 and dowels 306, 308. Additionally or alternatively, manual actuation (e.g., an operator pushing or pulling) of either the sample grips 302 or the sample stop 304 can simultaneously actuate the other of the sample grips 302 or sample stop 304 in the opposite direction.

[0044] The example specimen grip 302 holds a test specimen in a first orientation relative to the frame 228. For example, the specimen grip 302 includes a first arm 318 and a second arm 320. The example first arm 318 includes a first spring clip 322, and the second arm includes a second spring clip 324. The spring clips 322, 324 allow for easy specimen insertion into the specimen grip 302, sufficient holding strength to capture the specimen during positioning, and low enough holding strength to release the specimen when it is held in place by the grip. However, other specimen holding techniques can be used, such as spring-loaded clamps, one or more ball plungers, electrically controlled clamp(s) (e.g., electromagnetic relays), and / or any other holding device. Additionally or alternatively, the specimen grip 302 can be configured to hold a fixture for a non-rigid specimen so that the non-rigid specimen can be aligned within the test axis 326 in a manner similar to a rigid specimen. For example, a fixture for a non-rigid sample can be designed to hold the non-rigid sample in a desired position when attached (eg, magnetically coupled) to the sample grip 302.

[0045] In some examples, the arms 318, 320 may be interchangeable and / or changeable with arms configured to hold or capture samples of particular geometries. For example, the arms 318, 320 may be removed from the dowel 306 and replaced with arms 318, 320 having different holding shapes and / or holding feature(s).

[0046] Along the axis of rotation of the specimen grip 306 (e.g., in the direction of the dowel 306), the first arm 318 is aligned with the second arm 320, and the first spring clip 322 is aligned with the second spring clip 324. The specimen can be inserted into the first arm 318 and the second arm 320 by forcing the specimen into the spring clips 322, 324 until the specimen reaches the stop surfaces of each arm 318, 320, at which point the specimen is aligned in the same direction as the test axis 326 of the test frame 102.

[0047] After inserting the specimen into the specimen grip 302, the specimen grip 302 and specimen stop 304 are rotated (e.g., along a predetermined arcuate path 328) to align the specimen with the test axis 326. The specimen grip 302 rotates along the predetermined arcuate path 328 until the specimen contacts the specimen stop 304, which rotates along a second predetermined arcuate path 330 in the opposite direction from the specimen grip 302. The exemplary specimen stop 304 is configured to contact the specimen 301 at a location (e.g., along the length of the specimen 301) between the points where the arms 318, 320 grip the specimen 301. Once the specimen is fully engaged with both the specimen grip 302 and the specimen stop 304 (e.g., further rotation is prevented), the specimen is aligned with the test axis 326 and in position for engagement by the material fixture 236.

[0048] The example sample grip 302 and sample stop 304 can align samples having various heights (or lengths), various widths, and / or various thicknesses with the test axis 326. Figures 8A and 8B show top views of the example sample insertion device 300 of Figure 2 in a second position for samples having different widths. As shown in Figures 8A and 8B, the sample grip 302 may move further along the arcuate path 328 for narrower samples than for wider samples before the sample 301 contacts the sample stop 304.

[0049] When a sample is engaged (e.g., gripped) by the material fixture 236, the sample grip 302 can release the sample by moving the sample grip 302 (and sample stop 304) away from the test axis 326.

[0050] Although the example sample grip 302 in FIG. 3 includes multiple arms, in other examples, the sample grip 302 may include a single arm with a bifurcated clip and / or a stop point, and / or a wider clip that reduces or prevents rotation of the sample within the sample grip 302.

[0051] Instead of an arm, the sample stop 304 can comprise one or more stationary surfaces positioned to abut the sample when the sample is moved into alignment with the test axis 326. For example, a surface (e.g., a rod, etc.) can be positioned adjacent the test axis 326 at a distance selected to abut the sample when the desired positioning and alignment is achieved. The sample stop 304 can be adjustable for various sample widths and fixed to provide consistent positioning of the sample in alignment with the test axis 326.

[0052] Although the illustrated sample grip 302 and sample stop 304 have axes of rotation parallel to the test axis 326, in other examples, one or both of the sample grip 302 and sample stop 304 may have different axes of rotation that define a predetermined arcuate path of movement toward the test axis 326.

[0053] FIG. 9 is a perspective view of another example sample insertion device 900 that can be used to implement the sample insertion device 240 of FIG. 2. In contrast to the example sample insertion device 300 of FIG. 3, the sample insertion device 900 moves the sample 901 along a linear path rather than an arcuate path between a first (e.g., open, or unaligned) position and a second (e.g., closed, aligned with the test axis) position. FIG. 10 is a bottom view of the example sample insertion device 900 of FIG. 9 in the first position. FIG. 11 is a front view of the example sample insertion device 900 of FIG. 9 in the first position. FIG. 12 is a side view of the example sample insertion device 900 of FIG. 9. The example sample insertion device 900 can avoid interference between the sample and the material fixation device (e.g., grip faces), which can occur when using an arcuate path for sample insertion if the sample is relatively wide and the grip faces are closely spaced.

[0054] The exemplary sample insertion device 900 includes a sample grip 902 and a sample stop 904. The sample grip 902 is attached to a dowel 906, which may have keyed and / or other alignment features to provide proper alignment of the sample grip 902 relative to the path of travel. The dowel 906 is supported by mounting blocks 908a, 908b, which are attached to a frame 910 via rails 912a, 912b that extend parallel to a linear path of travel 914 of the sample 901. The mounting blocks 908a, 908b are coupled to the rails 912a, 912b via bearings 916a, 916b. The frame 910 can be attached to the test fixture 102 in a manner similar to the sample insertion device 300 of FIG. 3 and / or via another method. For example, the sample grip 902 and / or the sample stop 904 can be mounted to other portions of the test frame 228, such as the cross member loader 234 and / or the base of the test fixture 102, to allow for adjustment of the height of the sample grip 902 and the sample stop 904.

[0055] Similarly, specimen stop 904 is attached to dowel 918, which may have keyed and / or other alignment features to provide proper alignment of specimen grip 902 relative to the path of travel. Dowel 918 is supported by mounting blocks 920a, 920b, which are attached to frame 910 via rails 912a, 912b. Mounting blocks 920a, 920b are coupled to rails 912a, 912b via bearings 922a, 922b.

[0056] The frame 910 is stationary relative to the test frame 102, and the specimen grips 902 move the test specimen 901 toward the test axis 924 of the test frame 102. The specimen stops 904 set a stop for the test specimen 901 so that the specimen grips 902 and specimen stop 904 align the specimen 901 with the test axis 924.

[0057] 9, the sample grip 902 is mechanically coupled to the sample stop 904 such that the sample grip 902 and the sample stop 904 are simultaneously actuated in opposing linear directions. For example, mounting block 908a and mounting block 920a are coupled via a pinion gear 925 and opposing rack gears 926, 928. An actuator can actuate the pinion gears to move the sample grip 902 and the sample stop 904 inward (e.g., toward each other and / or toward the test axis 924) or outward (e.g., away from each other and / or away from the test axis 924) via the mounting blocks 908a and 920a and the dowels 906, 918. Additionally or alternatively, manual actuation (e.g., an operator pushing or pulling) of either the sample grip 902 or the sample stop 904 can simultaneously actuate the other of the sample grip 902 or the sample stop 904 in the opposite direction.

[0058] The example dowels 906, 918 can be configured to rotate within the mounting blocks 908a, 908b, 920a, 920b to provide easier access to the sample grip 902 for insertion and / or removal of the sample 901. The dowels 906, 918, mounting blocks 908a, 908b, and / or mounting blocks 920a, 920b can include ball detents, other types of detents, and / or other types of position-retaining devices to hold the dowels 906, 918 in a desired angular position (e.g., open position, closed position). The rotation of the dowels 906, 918 can be independent to allow for uncoupled rotation or can be geared to provide simultaneous rotation.

[0059] The example sample grip 902 is coupled to a dowel 906 and captures a sample 901 via arms 930, 932 extending from the dowel 906. The example first arm 930 includes a first spring clip 934, and the second arm 932 includes a second spring clip 936. The spring clips 934, 936 allow for easy insertion of the sample 901 into the sample grip 902, sufficient holding strength to capture the sample 901 during positioning, and low enough holding strength to release the sample 901 when the sample 901 is held in place by the grip. The example sample stop 904 is configured to contact the sample 901 at a location (e.g., along the length of the sample 901) between the points where the arms 930, 932 grip the sample 901.

[0060] The arms 930, 932 are aligned along the dowel 906 to hold the sample 901 parallel to the test axis 924. In some examples, the arms 930, 932 may be interchangeable and / or changeable with arms configured to hold or capture samples of specific geometries. For example, the arms 930, 932 may be removed from the dowel 906 and replaced with arms 930, 932 having different holding shapes and / or holding feature(s).

[0061] After inserting the specimen 901 into the specimen grip 902, the specimen grip 902 and specimen stop 904 are translated to align the specimen 902 with the test axis 924. The specimen grip 902 translates along the predetermined linear path 938 until the specimen 901 contacts the specimen stop 904, which rotates along a second predetermined linear path 940 in an opposite direction from the specimen grip 902. Once the specimen 902 is fully engaged with both the specimen grip 902 and the specimen stop 904 (e.g., further translation is prevented), the specimen 901 is aligned with the test axis 924 and in position for engagement by the material fixture 236.

[0062] By allowing the dowels 906, 918 and / or arms 930, 932 to rotate, the predetermined path can be partially arcuate (e.g., rotating the arms 930, 932 from a loaded position in which the sample 901 held by the sample grip 902 is not aligned with the test axis 924 to a closed position in which the sample 901 is aligned with the test axis 924) and partially linear (e.g., translating the aligned sample 901 along a linear path into alignment with the test axis 924).

[0063] When a sample is engaged (e.g., gripped) by the material fixture 236, the sample grip 902 can release the sample by moving the sample grip 902 (and sample stop 904) away from the test axis 924.

[0064] In some other examples, sliding or low friction surfaces may alternatively be used in place of bearings 916a, 916b, 922a, 922b.

[0065] 13A, 13B, and 13C illustrate another exemplary sample grip 1300 that can be used to implement the sample insertion device 240 of FIG. 2. For example, the sample grip 1300 can replace the sample grip 302 of FIG. 3. The sample grip 1300 can be implemented in conjunction with sample stops having opposing motions and / or paths and / or static sample stops. The exemplary sample grip 1300 can avoid interference between the sample and the material fixation device (e.g., grip faces), which can occur when using an arcuate path for sample insertion if the sample is relatively wide and the grip faces are closely spaced.

[0066] 13A shows the specimen grip 1300 in a closed position in which the specimen held by the specimen grip 1300 is aligned with the test axis. The specimen grip 1300 comprises a separable linkage 1302 and a non-separable linkage 1304. The separable linkage 1302 rotationally couples the jaw 1306 of the specimen grip 1300 to a first attachment point 1308 that is coupled to the test frame 102. Similarly, the non-separable linkage 1304 rotationally couples the jaw 1306 to a second attachment point 1310 that is coupled to the test frame 102.

[0067] The portion of the path of movement of the sample grip 1300 closest to the test axis (FIGS. 13A and 13B) is substantially linear due to the movement of the linkages 1302, 1304. As the sample grip 1300 moves farther from the test axis (FIGS. 13B and 13C), the separable linkage 1302 separates and extends, allowing rotation of the jaw 1306 (e.g., for receiving and / or removing a sample from the jaw 1306) along with continued movement of the jaw 1306.

[0068] Figures 14A, 14B, and 14C show another example sample grip 1400 and sample stop 1402 that can be used to implement the sample insertion device 240 of Figure 2. For example, the sample grip 1400 and sample stop 1402 can replace the sample grip 302 and sample stop 304 of Figure 3. The example sample grip 1400 and sample stop 1402 can avoid interference between the sample and the material fixation device (e.g., grip faces), which can occur when using an arcuate path for sample insertion if the sample is relatively wide and the grip faces are closely spaced.

[0069] The sample grip 1400 and sample stop 1402 each include a translation gear 1404a, 1404b coupled to a respective arm 1406a, 1406b. Movement of the arm 1406a, 1406b in the portion of the predetermined path nearest the test axis decouples the linear motion from the rotation of the arm by forcing the gears 1404a, 1404b to move along a linear path 1408 via gears 1410a, 1410b. When the gears 1404a, 1404b reach the distal end of the linear path 1408, the gears 1404a, 1404b rotate the arms 1406a, 1406b.

[0070] In some examples, the sample grip and / or sample stop may include handles, knobs, or other features to enhance gripping by an operator, such as on top of arms, mounting blocks, and / or other features of the sample grip and / or sample stop.

[0071] In some examples, the arms of the sample grip and / or sample stop have predetermined positions and / or relationships. For example, the arms 318, 320 can be geared so that the arms 318, 320 move toward or away from each other simultaneously and / or are consistently equidistant from the same point along the dowel 306.

[0072] Additionally or alternatively, the dowels 306, 308 and / or gears 314, 316 can have predetermined positions along the paths 328, 330 at which the sample grip 302 and / or sample stop 304 can be set or secured. For example, the dowels 306, 308 and / or gears 314, 316 can have detents to hold the sample grip 302 and / or sample stop 304 in an open (e.g., sample loading) position.

[0073] In some examples, the test system 100 may include a physical barrier or shield to reduce or prevent intrusion of an operator's hands and / or other objects into the load string. Such a physical barrier or shield may include a notch, gap, hole, or other space through which the sample insertion device disclosed herein, and the sample carried by the sample insertion device, may pass through the barrier and be inserted into the test system.

[0074] In some examples, the actuators controlling the sample insertion device 300, 900 can be controlled by software that controls the testing system 100. For example, the testing system 100 can include software that 1) controls the sample insertion device 300, 900 to move the held sample into alignment with the test axis 326, 924, 2) controls the fixture 236 to grip the sample, 3) controls the sample insertion device 300, 900 to move away from the test axis 326, 924, and 4) controls the testing system to apply a load to the sample and measure displacement, load, and / or any other desired parameters.

[0075] In some examples, the materials testing system 100 can include one or more sensors that determine the position(s) of the sample grips 302, 902 and / or sample stop(s) 304, 904. For example, the sensors can include proximity sensors or switches that determine whether the sample grips 302, 902 and / or sample stop(s) 304, 904 are in a particular position, and / or encoders or other position sensors that determine the position of the sample grips 302, 902 and / or sample stop(s) 304, 904 along a corresponding predetermined path. A controller of the materials testing system 100 can control a test sequence based on the position of the sample grips 302, 902 and / or sample stop(s) 304, 904, for example, by actuating a material clamping device when the sample grips 302, 902 and / or sample stop(s) 304, 904 are in a closed position.

[0076] In some examples, the materials testing system 100 can include one or more sensors that determine whether a sample is loaded into the sample insertion device. For example, the materials testing system can include a contact sensor that determines whether a sample is held by a clip or other holding device in the sample grips 302, 902, and / or any other type of sensor that determines whether a sample is present in the sample insertion device. A controller of the materials testing system 100 can trigger the start of a test or measurement procedure based on the presence of a sample.

[0077] In some examples, materials testing system 100 can include one or more sensors that determine whether an operator is manipulating or otherwise holding specimen grips 302, 902 and / or specimen stops 304, 904. For example, a controller of materials testing system 100 can deactivate material clamping devices and / or other actuators of materials testing system 100 in response to determining that an operator is in contact with the specimen insertion device.

[0078] The methods and systems can be implemented in hardware, software, and / or a combination of hardware and software. The methods and / or systems can be implemented centrally in at least one computing system, or distributed, with different elements distributed across several interconnected computing systems. Any type of computing system or other device adapted to perform the methods described herein is suitable. A typical combination of hardware and software can include a general-purpose computing system, along with a program or other code that, when loaded and executed, controls the computing system to perform the methods described herein. Another typical embodiment can include an application-specific integrated circuit or chip. Some embodiments can include a non-transitory machine-readable (e.g., computer-readable) medium (e.g., a flash drive, optical disk, magnetic storage disk, etc.) that stores one or more lines of machine-executable code, thereby causing the machine to perform a process as described herein. As used herein, the term "non-transitory machine-readable medium" is defined to include all types of machine-readable storage media and to exclude propagating signals.

[0079] As used herein, the terms "circuit" and "circuitry" refer to physical electronic components (i.e., hardware) and any software and / or firmware ("code") that can comprise, be executed by, and / or otherwise be associated with hardware. As used herein, for example, a particular processor and memory can include a first "circuit" when executing a first one or more lines of code, and can include a second "circuit" when executing a second one or more lines of code. As used herein, "and / or" refers to any one or more of the items in the list connected by "and / or." As an example, "x and / or y" refers to any element of the triplet {(x), (y), (x, y)}. In other words, "x and / or y" means "one or both of x and y." As another example, "x, y, and / or z" means any element of the seven-element set {(x), (y), (z), (x,y), (x,z), (y,z), (x,y,z)}. In other words, "x, y, and / or z" means "one or more of x, y, and z." As used herein, the term "exemplary" means serving as a non-limiting example, instance, or illustration. As used herein, the term "for example" begins a list of one or more non-limiting examples, instances, or illustrations. As used herein, circuitry is "operable" to perform a function whenever it includes the necessary hardware and code (if either is necessary) to perform that function, regardless of whether implementation of that function is disabled or enabled (e.g., by a user-configurable setting, factory trim, etc.).

[0080] Although the present method and / or system has been described with reference to certain specific embodiments, those skilled in the art will recognize that various modifications and equivalent substitutions may be made without departing from the scope of the present method and / or system. For example, blocks and / or components of the disclosed examples may be combined, divided, rearranged, and / or otherwise modified. In addition, many modifications may be made to adapt a particular situation or material to the teachings of the present disclosure without departing from the scope of the present disclosure. Therefore, the present method and / or system is not limited to the particular embodiments disclosed. Instead, the present method and / or system includes all embodiments falling within the scope of the appended claims, both literally and under the doctrine of equivalents.

Claims

1. 1. An apparatus for aligning a test specimen in a universal testing system, comprising: a first specimen grip configured to be attached to a universal testing system, to hold a test specimen in a first orientation relative to the universal testing system, and to move the test specimen toward a test axis of the universal testing system; a specimen stop configured to be attached to the universal testing system and to set a stop point for the test specimen, the first specimen grip and the specimen stop configured to align the test specimen with the test axis; An apparatus comprising:

2. 10. The apparatus of claim 1, wherein the first specimen grip is configured to move the test specimen along a predetermined path toward and away from the test axis.

3. 3. The apparatus of claim 2, wherein the sample stop is configured to move toward and away from the test axis along a second predetermined path.

4. 4. The apparatus of claim 3, wherein the specimen stop and the first specimen grip are coupled to move simultaneously toward the test axis and simultaneously away from the test axis.

5. The apparatus of claim 2 , wherein the predetermined path is an at least partially arcuate path.

6. The apparatus of claim 2 , wherein the predetermined path is an at least partially linear path.

7. 10. The apparatus of claim 1, wherein the first sample grip comprises a first holding device and a second holding device configured to hold the test sample at a first point and a second point.

8. 8. The apparatus of claim 7, wherein the sample stop is configured to contact the test sample at a location along the length of the test sample between the first point and the second point.

9. 8. The apparatus of claim 7, wherein the first and second holding devices and the sample stop are configured to align test samples having various heights, various widths, and various thicknesses with the test axis.

10. 10. The apparatus of claim 1, further comprising an actuator configured to actuate the first specimen grip to move the test specimen toward the test axis.

11. 10. The apparatus of claim 1, wherein the first specimen grip is configured to hold the test specimen at a predetermined fixed height relative to the test axis.

12. 10. The apparatus of claim 1, wherein the position of at least one of the first sample grip or the sample stop is adjustable along the length of the test sample.

13. 1. A materials testing system comprising: A test frame; a crosshead coupled to the test frame; a plurality of grips coupled to the crosshead, the grips configured to hold test samples; an actuator configured to actuate the crosshead along a test axis to apply a force to the test specimen along the test axis via the grips; a first specimen grip coupled to the test frame, the first specimen grip configured to hold the test specimen in a first orientation relative to the universal test system and to move the test specimen toward a test axis of the universal test system; a specimen stop configured to be coupled to the test frame and to set a stop point for the test specimen, the first specimen grip and the specimen stop configured to align the test specimen with the test axis; A materials testing system comprising:

14. 14. The materials testing system of claim 13, wherein the first specimen grip is configured to move the test specimen along a predetermined path toward and away from the test axis.

15. 15. The materials testing system of claim 14, wherein the specimen stop is configured to move toward and away from the test axis along a second predetermined path.

16. 16. The materials testing system of claim 15, wherein the specimen stop and the first specimen grip are coupled to move toward the test axis and move away from the test axis simultaneously.

17. 17. The materials testing system of claim 16, further comprising a second actuator configured to actuate the first specimen grip and the specimen stop.

18. The materials testing system of claim 14 , wherein the predetermined path is an at least partially linear path.

19. The materials testing system of claim 14 , wherein the predetermined path is an at least partially arcuate path.

20. 14. The materials testing system of claim 13, wherein the first specimen grip and the specimen stop are configured to align test specimens having various heights, various widths, and various thicknesses with the test axis.

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