Parts sorting device

Abstract

To provide a component sorting device that is improved in accuracy in sorting a component.SOLUTION: A component sorting device 1, which inspects a component while conveying the component to sort out a good item, is provided with: a hopper 5 and a ball feeder 10 which supply a component; a linear feeder 20 that conveys the supplied component; a turn table 30 that conveys the conveyed component; a plurality of photographing devices 40 for inspection that respectively photograph a plurality of outer surfaces of the component on the turn table 30; an inspecting / sorting controller 70 that performs inspection of appearance of the component on the basis of photographed results by the plurality of photographing devices 40 for inspection and sorts a good item on the basis of a result of the inspection of the appearance; an ejecting mechanism 50 that ejects the good item sorted by the inspecting / sorting controller 70, from the turn table 30; and a photographing device 80 for confirmation that photographs the hopper 5 and the ball feeder 10 in order to confirm a remaining component, at the time of completing the inspection of the appearance and the sorting.SELECTED DRAWING: Figure 1

Description

[Technical field]

[0001] The present invention relates to a parts selection device. [Background technology]

[0002] There is a device that separates non-defective and defective surface-mount electronic components (also called chip components) such as multilayer ceramic capacitors. Patent Document 1 discloses an appearance inspection device as such a component separation device. The appearance inspection device disclosed in Patent Document 1 includes a linear feeder that conveys electronic components, a turntable that rotates and conveys the electronic components conveyed by the linear feeder, and a number of imaging devices that capture images of the electronic components on the turntable, and performs an appearance inspection of the electronic components while conveying them. This allows for separation and removal of non-defective and defective components.

[0003] The visual inspection device disclosed in Patent Document 1 charges electronic components by transporting them with vibration in a linear feeder, and then electrostatically attracts the electronic components on a turntable, which then rotates and transports them. The transport speed of the turntable is faster than that of the linear feeder. This allows the electronic components to be spaced apart on the turntable, making it possible to inspect the visual appearance of the end faces of the electronic components in the transport direction. [Prior art documents] [Patent documents]

[0004] [Patent Document 1] JP 2017-44579 A Summary of the Invention [Problem to be solved by the invention]

[0005] In such a component sorting device, different types of electronic components may be inspected and sorted for each production lot. For example, surface mount electronic components may have different characteristics even if they are the same size. More specifically, multilayer ceramic capacitors may have different capacitances even if they are the same size.

[0006] Furthermore, in such a component sorting device, electronic components from the previous lot may remain on the linear feeder or turntable. In such a case, if the type of electronic components in the current lot is different from that of the previous lot, the electronic components in the current lot may be mixed with the electronic components of the previous lot, which is a different type. If electronic components of the same size but different characteristics are mixed in this way, the sorting accuracy will decrease even if the accuracy of the appearance inspection is high.

[0007] An object of the present invention is to provide a parts selection device that improves the accuracy of parts selection. [Means for solving the problem]

[0008] (1) A part selection device according to the present invention is a part selection device that inspects parts as they are transported and selects non-defective parts, and includes at least one of a hopper and a ball feeder that supplies the parts, a linear feeder that transports the parts supplied by the ball feeder or the hopper, a turntable that transports the parts transported by the linear feeder, a plurality of inspection imaging devices that image a plurality of outer surfaces of the parts on the turntable, an inspection and selection controller that performs a visual inspection of the parts based on the imaging results from the plurality of inspection imaging devices and selects the non-defective parts based on the results of the visual inspection, a discharge mechanism that discharges the non-defective parts selected by the inspection and selection controller from the turntable, and a confirmation imaging device that images at least one of the hopper and the ball feeder to check for remaining parts when the visual inspection and selection are completed.

[0009] (2) In the part selection apparatus described in (1), the confirmation imaging device may scan at least one of the hopper and the bowl feeder.

[0010] (3) In the part selection apparatus described in (2), the scanning of the confirmation imaging device may be a serpentine scan or a spiral scan.

[0011] (4) In the part sorting device described in any one of (1) to (3), a recovery mechanism may be further provided that recovers remaining parts on at least one of the hopper and the bowl feeder when the visual inspection and sorting are completed.

[0012] (5) In the part selecting device described in (4), the recovery mechanism may scan at least one of the hopper and the bowl feeder.

[0013] (6) In the part selection device described in (5), the scanning of the collection mechanism may be serpentine scanning or spiral scanning. Effect of the Invention

[0014] According to the present invention, it is possible to improve the accuracy of part selection in a part selection device. [Brief description of the drawings]

[0015] [Figure 1] 1 is a schematic plan view of an example of a part selection device according to an embodiment of the present invention, viewed from above; [Diagram 2] 2 is a schematic plan view showing an enlarged view of a portion II in the part selection device shown in FIG. [Diagram 3] 2 is a schematic side view of the part selection device shown in FIG. 1, seen from the side, and is a schematic side view in which a portion II is enlarged. FIG. [Figure 4] 4 is a diagram showing an example of confirmation of parts remaining on a hopper by a confirmation imaging device in the part selection device shown in FIG. 1. [Diagram 5]4 is a diagram showing an example of confirmation of remaining parts on a hopper and a bowl feeder by a confirmation imaging device in the part selecting device shown in FIG. 1. [Figure 6] 4 is a diagram showing an example of recovery of remaining parts on a hopper by a recovery mechanism in the part selecting device shown in FIG. 1. [Figure 7] 4 is a diagram showing an example of confirmation of remaining parts on a hopper and a bowl feeder by a recovery mechanism in the part selecting device shown in FIG. 1. [Figure 8] FIG. 2 is a schematic perspective view of the exterior of the component. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0016] Hereinafter, an embodiment of the present invention will be described with reference to the accompanying drawings, in which the same or corresponding parts are designated by the same reference numerals.

[0017] Fig. 1 is a schematic plan view of an example of a part sorting device according to this embodiment, seen from above, Fig. 2 is a schematic plan view enlarging part II in the part sorting device shown in Fig. 1, and Fig. 3 is a schematic side view of the part sorting device shown in Fig. 1, seen from the side, and is a schematic side view enlarging part II. Note that an XY orthogonal coordinate system is shown in Figs. 1 to 3.

[0018] 1 to 3 is an apparatus that inspects and selects non-defective electronic components 3 while sequentially conveying the electronic components 3. The component selection apparatus 1 includes a hopper 5, a bowl feeder 10, a linear feeder 20, a turntable 30, a plurality of inspection imaging devices 40, a discharge mechanism 50, an inspection and selection controller 70, a confirmation imaging device 80, and a recovery mechanism 90.

[0019] The electronic component 3 is a surface-mount electronic component (also called a chip component) such as a multilayer ceramic capacitor. As shown in Fig. 8, the electronic component 3 includes a laminate 3a in which a plurality of dielectric layers and one or a plurality of conductor layers made of a ceramic material are laminated, and two external electrodes 3b arranged on each of two end faces of the laminate 3a. The laminate 3a, i.e., the electronic component 3, is in the shape of a rectangular parallelepiped and has two main faces TS1 and TS2 facing each other in the lamination direction, two side faces WS1 and WS2 facing each other in a width direction intersecting with the lamination direction, and two end faces LS1 and LS2 facing each other in a length direction intersecting with the lamination direction and the width direction.

[0020] The dimensions of the electronic component 3 are not particularly limited, but may be, for example, a lengthwise dimension of 3.2 mm or more and 0.1 mm or less, a widthwise dimension of 1.6 mm or more and 0.05 mm or less, and a stacking direction dimension of 1.6 mm or more and 0.05 mm or less. Note that these dimensions may vary depending on the tolerance.

[0021] The electronic component 3 is not limited to the multilayer ceramic capacitor using the above-mentioned dielectric ceramic, but may be various other electronic components such as a piezoelectric component using a piezoelectric ceramic, a thermistor using a semiconductor ceramic, or an inductor using a magnetic ceramic.

[0022] As shown in Figs. 1 to 3, hopper 5 supplies a plurality of electronic components 3 to ball feeder 10. For example, hopper 5 is funnel-shaped, with an inlet having a circular opening and an outlet having an opening narrower than the inlet. Hopper 5 is a device that detects a shortage of electronic components 3 in ball feeder 10 and automatically replenishes ball feeder 10 with electronic components 3, thereby maintaining the number of electronic components 3 in ball feeder 10 at a constant level.

[0023] The ball feeder 10 aligns and conveys a plurality of electronic components 3 supplied by the hopper 5. The ball feeder 10 is provided with a vibration mechanism 12 that supplies vibration to the ball feeder 10. An example of the vibration mechanism 12 is a piezoelectric element that generates vibrations at a frequency corresponding to a voltage. The outer shape of the ball feeder 10 is circular. The ball feeder 10 conveys the electronic components 3 in a spiral alignment while causing them to move in a circular motion from the center of the circle to the outside by vibration.

[0024] The linear feeder 20 sequentially and linearly conveys the electronic components 3 aligned and conveyed by the ball feeder 10. The linear feeder 20 is provided with a vibration mechanism 22 that supplies vibration to the linear feeder 20. An example of the vibration mechanism 22 is a piezoelectric element that generates vibrations at a frequency corresponding to a voltage. It is preferable that the linear feeder 20 is inclined with respect to the horizontal plane. The linear feeder 20 conveys the electronic components 3 by vibration.

[0025] The linear feeder 20 is preferably made of a material such as SUS, etc. This allows the electronic components 3 to be charged when the linear feeder 20 conveys the electronic components 3 by vibration.

[0026] The turntable 30 sequentially rotates and conveys the plurality of electronic components 3 conveyed by the linear feeder 20. As shown in Fig. 1 and Fig. 2, the turntable 30 has a guide mechanism 32 on the upstream side, which guides the electronic components 3 from the linear feeder 20 to a rotational conveyance path (rotational conveyance trajectory) 31. The turntable 30 conveys the electronic components 3 along the rotational conveyance path 31.

[0027] 3, an electrostatic adsorption mechanism 34 is preferably provided below the turntable 30. This makes it possible to electrostatically adsorb and transport the charged electronic components 3 in the linear feeder 20.

[0028] The conveying speed of the turntable 30 is faster than the conveying speed of the linear feeder 20. This allows the electronic components 3 to be spaced apart, as shown in Figures 2 and 3, making it possible to perform visual inspection of the end face sides of the electronic components 3.

[0029] The turntable 30 is made of a material such as glass or resin and has transparency, which allows visual inspection of the back surface of the electronic component 3.

[0030] 1, the inspection imaging device 40 is, for example, a camera or an image sensor. Six inspection imaging devices 40 are provided along the rotational transport path 31 of the turntable 30. The six inspection imaging devices 40 respectively capture images of six outer surfaces of the electronic component 3 on the turntable 30, i.e., two main surfaces TS1 and TS2, two side surfaces WS1 and WS2, and two end surfaces LS1 and LS2. Each of the inspection imaging devices 40 may be provided with an illumination device, such as a ring illumination or a dome illumination, that illuminates the imaging surface of the electronic component 3.

[0031] 1, the discharge mechanism 50 discharges non-defective products selected by the inspection and sorting controller 70 (described later) based on the results of the appearance inspection from the turntable 30 and stores them in a case or the like. The method of discharging non-defective products by the discharge mechanism 50 is not particularly limited, but examples include air blowing, air suction, physical contact extrusion, and the like. For example, when a non-defective product is transported, the discharge mechanism 50 discharges the non-defective product from the turntable 30 and stores it in a case or the like by blowing air onto the non-defective product on the turntable 30 in accordance with a command from the inspection and sorting controller 70.

[0032] Upon completion of the visual inspection and sorting, the confirmation imaging device 80 captures images of the hopper 5 and the bowl feeder 10 in order to confirm the remaining parts. The confirmation imaging device 80 may be, for example, a camera or an image sensor. Alternatively, it may be a laser sensor, such as a line sensor.

[0033] Fig. 4 is a diagram showing an example of confirmation of remaining parts on a hopper by a confirmation imaging device. As shown in Fig. 4, confirmation imaging device 80 scans hopper 5 to confirm the remaining parts on hopper 5. Similarly, confirmation imaging device 80 scans bowl feeder 10 to confirm the remaining parts on bowl feeder 10. There are no particular limitations on the scanning method, but examples include serpentine scanning and spiral scanning. This makes it possible to confirm all remaining parts on hopper 5 and bowl feeder 10 without omission.

[0034] Fig. 5 is a diagram showing an example of confirmation of remaining parts on the hopper and ball feeder by the confirmation imaging device. As shown in Fig. 5, a linear guide 82 is disposed above the hopper 5, ball feeder 10, and linear feeder 20, and a linear actuator 84 is disposed on the linear guide 82. The confirmation imaging device 80 is disposed on the linear actuator 84, and scans over the hopper 5, ball feeder 10, and linear feeder 20 to confirm remaining parts on the hopper 5, ball feeder 10, and linear feeder 20. This makes it possible to confirm all remaining parts on the hopper 5, ball feeder 10, and linear feeder 20.

[0035] Upon completion of the visual inspection and sorting, the recovery mechanism 90 recovers the remaining parts on the hopper 5, the bowl feeder 10, and the linear feeder 20. The recovery mechanism 90 may be, for example, a magnet such as a permanent magnet or an electromagnet, or a suction mechanism such as air suction.

[0036] FIG. 6 is a diagram showing an example of collection of remaining parts on a hopper by the collection mechanism. As shown in FIG. 4, the collection mechanism 90 scans the hopper 5 to collect the remaining parts on the hopper 5. Similarly, the collection mechanism 90 scans the ball feeder 10 to collect the remaining parts on the ball feeder 10. The collection mechanism 90 also scans the linear feeder 20 to collect the remaining parts on the linear feeder 20. The scanning method is not particularly limited, and examples thereof include serpentine scanning and spiral scanning. This allows the remaining parts on the hopper 5 and the ball feeder 10 to be collected without omission.

[0037] Fig. 7 is a diagram showing an example of confirmation of remaining parts on the hopper and ball feeder by the collection mechanism. As shown in Fig. 7, a linear guide 82 is disposed above the hopper 5, ball feeder 10, and linear feeder 20, and a linear actuator 84 is disposed on the linear guide 82. A collection mechanism 90 is disposed on the linear actuator 84, and scans over the hopper 5, ball feeder 10, and linear feeder 20 to collect remaining parts on the hopper 5, ball feeder 10, and linear feeder 20. This allows remaining parts on the hopper 5, ball feeder 10, and linear feeder 20 to be collected without omission.

[0038] Here, the electronic components include metals. In particular, laminated ceramic electronic components include ferromagnetic materials such as Ni. Such electronic components can be collected by using magnets. Furthermore, even if the hopper 5, the bowl feeder 10, and the linear feeder 20 are covered with, for example, a transparent cover, the magnets can attract and collect the electronic components through the cover.

[0039] The inspection and selection controller 70 controls the entire component selection apparatus 1. Specifically, the inspection and selection controller 70 performs an appearance inspection of the electronic components 3 on the turntable 30 based on the imaging results from the inspection imaging device 40, and selects non-defective and defective components based on the results of the appearance inspection.

[0040] Further, the inspection and sorting controller 70 controls the discharge of non-defective products by the discharge mechanism 50. For example, the inspection and sorting controller 70 calculates the timing for discharging non-defective products from the discharge mechanism 50 based on information such as the conveying speed (or the rotation speed, and the length or radius of the rotation conveying path) of the turntable 30 and the position of the inspection imaging device 40 on the turntable 30, and issues a command to the discharge mechanism 50.

[0041] In addition, upon completion of the visual inspection and sorting, the inspection and sorting controller 70 controls the scanning of the confirmation imaging device 80, as shown in Figure 4 or Figure 5, and checks for remaining parts on the hopper 5 and bowl feeder 10 based on the imaging results from the confirmation imaging device 80.

[0042] If remaining parts are found, the inspection and sorting controller 70 may vibrate the ball feeder 10 and the linear feeder 20, and may also vibrate the hopper 5 using a knocker or the like, to discharge the remaining parts on the hopper 5 and the ball feeder 10 onto the turntable 30. The vibration used to discharge the remaining parts may be stronger than the vibration used during normal inspection and sorting.

[0043] Alternatively, if remaining parts are identified, the inspection and sorting controller 70 may control the scanning of a recovery mechanism 90 over the hopper 5 and the ball feeder 10 to recover the remaining parts on the hopper 5 and the ball feeder 10, as shown in FIG. 6 or FIG. 7.

[0044] Alternatively, the inspection and sorting controller 70 may perform both the above-mentioned ejection of the remaining parts by vibration and the above-mentioned collection of the remaining parts by the collection mechanism 90. An example will be described below.

[0045] For example, when the visual inspection and sorting are completed (for example, the end of the visual inspection and sorting is determined when no electronic components 3 are transported to the turntable 30 for a predetermined period of time), the inspection and sorting controller 70 controls the scanning of the confirmation imaging device 80 on the hopper 5 and the ball feeder 10, and checks for remaining components on the hopper 5 and the ball feeder 10 based on the imaging results from the confirmation imaging device 80.

[0046] If remaining parts are found, first, the inspection and sorting controller 70 vibrates the ball feeder 10 and the linear feeder 20, and also vibrates the hopper using a knocker or the like, to discharge the remaining parts on the hopper 5 and the ball feeder 10 onto the turntable 30. Next, the inspection and sorting controller 70 controls the scanning of the recovery mechanism 90 over the hopper 5 and the ball feeder 10 to recover the remaining parts on the hopper 5 and the ball feeder 10.

[0047] Thereafter, the inspection and sorting controller 70 again controls the scanning of the confirmation imaging device 80 to check for remaining parts. If remaining parts are again found, the inspection and sorting controller 70 repeats the above-mentioned ejection of the remaining parts by vibration, collection of the remaining parts by the collection mechanism 90, and confirmation of the remaining parts by the confirmation imaging device 80 until no remaining parts are found.

[0048] The inspection and sorting controller 70 described above is composed of an arithmetic processor such as a PLC (Programmable Logic Controller), a DSP (Digital Signal Processor), or an FPGA (Field-Programmable Gate Array). The various functions of the inspection and sorting controller 70 are realized, for example, by executing a predetermined software (program) stored in a storage unit. The various functions of the inspection and sorting controller 70 may be realized by a combination of hardware and software, or may be realized only by hardware (electronic circuits).

[0049] The storage unit in the inspection and sorting controller 70 is a rewritable memory such as an EEPROM. The storage unit stores predetermined software (programs) for executing various functions of the sorting controller. The storage unit also stores various set values ​​input from the outside, for example. The various set values ​​include information on the conveying speed of the linear feeder 20, the conveying speed of the turntable 30 (or the rotation speed, and the length or radius of the rotary conveying path), the position of the inspection imaging device 40, and the position of the discharge mechanism 50, as well as criteria for determining whether a product is good or bad, and the like.

[0050] As described above, the component selection device 1 of this embodiment includes a hopper 5 that supplies electronic components 3, a ball feeder 10 that aligns the electronic components 3 supplied by the hopper 5, a linear feeder 20 that linearly transports the electronic components 3 aligned by the ball feeder 10, a transparent turntable 30 that rotates and transports the electronic components 3 transported by the linear feeder 20, six inspection imaging devices 40 that respectively capture images of six outer surfaces of the electronic components 3 on the turntable 30, an inspection and selection controller 70 that performs a visual inspection of the electronic components 3 based on the imaging results from the inspection imaging devices 40 and selects non-defective products based on the results of the visual inspection, and a discharge mechanism 50 that discharges the non-defective products selected by the inspection and selection controller 70 from the turntable 30. This makes it possible to perform a visual inspection of a plurality of electronic components 3 while transporting them, and to select non-defective products.

[0051] In such a component sorting device, different types of electronic components may be inspected and sorted for each production lot. For example, surface-mount electronic components may have different characteristics even if they are the same size. More specifically, multilayer ceramic capacitors may have different capacitances even if they are the same size.

[0052] Furthermore, in such a component sorting device, electronic components from the previous lot may remain in the hopper or bowl feeder. In such a case, if the type of electronic components in the current lot is different from that of the previous lot, the electronic components in the current lot may be mixed with the electronic components of the previous lot, which is a different type. If electronic components of the same size but different characteristics are mixed in this way, the sorting accuracy will decrease even if the accuracy of the appearance inspection is high.

[0053] In this regard, according to the part selection apparatus 1 of this embodiment, when the visual inspection and selection are completed, the confirmation imaging device 80 captures images of the hopper 5 and the bowl feeder 10. This makes it possible to check the remaining parts on the hopper 5 and the bowl feeder 10 based on the imaging results from the confirmation imaging device 80. Furthermore, if remaining parts are confirmed, the remaining parts on the hopper 5 and the bowl feeder 10 can be discharged, collected, or removed. This makes it possible to improve the accuracy of part selection.

[0054] For example, according to the part sorting device 1 of this embodiment, when the visual inspection and sorting are completed, the collecting mechanism 90 collects the remaining parts on the hopper 5 and the bowl feeder 10. This makes it possible to discharge, collect, and remove the remaining parts on the hopper 5 and the bowl feeder 10. This makes it possible to improve the accuracy of part sorting.

[0055] Although the embodiment of the present invention has been described above, the present invention is not limited to the above-mentioned embodiment, and various changes and modifications are possible. In the above-mentioned embodiment, the component sorting device 1 including both the hopper 5 and the ball feeder 10 has been exemplified. However, the present invention is not limited to this, and the component sorting device may be in a form including either the hopper or the ball feeder. When the ball feeder is not included, the hopper may sequentially supply electronic components to the linear feeder.

[0056] In this case, the confirmation imaging device 80 may scan either the hopper 5 or the ball feeder 10 to capture an image of either the hopper 5 or the ball feeder 10. The inspection and sorting controller 70 may check for remaining parts on either the hopper 5 or the ball feeder 10 based on the imaging result from the confirmation imaging device 80.

[0057] In this case, the recovery mechanism 90 may scan over either one of the hopper 5 or the ball feeder 10 to recover the remaining parts on either one of the hopper 5 or the ball feeder 10. That is, the inspection and sorting controller 70 may control the scanning of the recovery mechanism 90 to recover the remaining parts on either one of the hopper 5 or the ball feeder 10. [Explanation of symbols]

[0058] 1 Parts sorting device 3. Electronic Components 5. Hopper 10. Bowl Feeder 12 Vibration mechanism 20 Linear feeder 22 Vibration mechanism 30 Turntable 31 Rotational transport path (rotational transport trajectory) 32 Guide mechanism 34 Electrostatic Adsorption Mechanism 40 Inspection imaging device 50 Ejection mechanism 70 Inspection and sorting controller 80 Confirmation imaging device 82 Linear Guide 84 Linear Actuator 90 Collection Mechanism

Claims

1. A parts sorting device that inspects parts while transporting them and selects non-defective parts, At least one of a hopper and a bowl feeder for supplying the parts; a linear feeder that conveys the parts fed by the bowl feeder or the hopper; a turntable that conveys the parts conveyed by the linear feeder; a plurality of inspection imaging devices for imaging a plurality of outer surfaces of the component on the turntable, respectively; an inspection and selection controller that performs an appearance inspection of the component based on the imaging results from the plurality of inspection imaging devices and selects the non-defective component based on the result of the appearance inspection; a discharge mechanism that discharges the non-defective product selected by the inspection and selection controller from the turntable; an imaging device for confirmation, which images at least one of the hopper and the bowl feeder, and the linear feeder, in order to confirm remaining parts when the visual inspection and sorting are completed; Equipped with the verification imaging device scans over at least one of the hopper and the bowl feeder, and the linear feeder; Parts sorting device.

2. 2. The part sorting apparatus according to claim 1, wherein the scanning of the confirmation imaging device is a serpentine scan or a spiral scan.

3. 3. The part sorting device according to claim 1, further comprising a collection mechanism that collects remaining parts on at least one of the hopper and the bowl feeder when the visual inspection and sorting are completed.

4. The part selecting device according to claim 3 , wherein the collection mechanism scans over at least one of the hopper and the bowl feeder.

5. The part selecting device according to claim 4 , wherein the scanning of the collection mechanism is a serpentine scan or a spiral scan.

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