Processing System

Abstract

To provide a processing system that can process a work-piece with good accuracy.SOLUTION: A processing system comprises: a tilt device that can tilt a rotating shaft 3a of a chuck 3 which holds a work-piece W1; a film thickness measurement device 7 that measures a film thickness of the work-piece W1 finely ground in a non-contact manner; and a control device that computes a shape of the work-piece W1 finely ground on the basis of a measured value by the film thickness measurement device 7 and calculates a tilt angle of the tilt device so that a difference between the maximum thickness and the minimum thickness in the work-piece W1 finely ground becomes small, and tilts the chuck 3 by the tilt angle, which is configured to re-process the work-piece W1 finely ground, while performing rough grinding, intermediate grinding and fine grinding in this order, with the chuck 3 tiled by the tilt angle.SELECTED DRAWING: Figure 4

Description

[Technical field]

[0001] The present invention relates to a machining system for machining a workpiece into a thin film. [Background technology]

[0002] In the field of semiconductor manufacturing, grinding devices are known for grinding semiconductor wafers such as silicon wafers (hereinafter referred to as "workpieces") into a thin and flat shape by pressing the grinding surface of a rotating grinding wheel against the workpiece to grind the workpiece.

[0003] Patent Document 1 discloses an apparatus that processes a workpiece through rough grinding and then fine grinding, cleans a protective tape and the back surface of the workpiece, and then measures the thickness of the workpiece with a capacitance sensor. [Prior art documents] [Patent documents]

[0004] [Patent Document 1] JP 2009-117648 A Summary of the Invention [Problem to be solved by the invention]

[0005] In order to accurately machine a workpiece, fine grinding of the workpiece may be temporarily stopped, the thickness of the workpiece may be measured, and the same workpiece may be finely ground again based on the measurement results. However, the grain size of grinding stones has become finer in recent years, and even if fine grinding is resumed after the thickness measurement, the grinding stone may not be sharpened sufficiently, causing the grinding stone to lose its cutting ability, and the shape of the workpiece after regrinding may become unstable or the surface may be burned.

[0006] Therefore, a technical problem arises that must be solved in order to machine a workpiece with high precision, and an object of the present invention is to solve this problem. [Means for solving the problem]

[0007] In order to achieve the above-mentioned object, the processing system of the present invention is a processing system that processes a workpiece in the order of pre-grinding and fine grinding, and is equipped with a tilt device that can tilt the rotation axis of a chuck that holds the workpiece, a measuring device that measures the film thickness of the workpiece after fine grinding in a non-contact manner, and a control device that calculates the shape of the workpiece after fine grinding based on the measurement values ​​of the measuring device, calculates the tilt angle of the tilt device so that the difference between the maximum thickness and minimum thickness of the workpiece after fine grinding is small, and tilts the chuck by said tilt angle, and re-processes the workpiece after fine grinding in the order of pre-grinding and fine grinding with the chuck tilted by said tilt angle.

[0008] With this configuration, the measuring device measures the film thickness of the workpiece after the first stage of processing, and the control device calculates the inclination angle of the chuck's rotation axis at which the workpiece can be processed approximately flat from the shape of the workpiece after the first stage of processing.With the chuck's rotation axis tilted by this inclination angle, pre-grinding and fine grinding are performed on the workpiece again.Even if the fine grinding wheel is fine, the fine grinding wheel is sharpened by the pre-grinding and the sharpness of the wheel is maintained, so that the workpiece can be processed efficiently and with high precision. Effect of the Invention

[0009] The present invention can machine a workpiece with high precision. [Brief description of the drawings]

[0010] [Figure 1] 1 is a plan view showing a processing system according to an embodiment of the present invention; [Diagram 2] FIG. 4 is a schematic diagram showing the positional relationship of measurement points of a measuring device on a workpiece. [Diagram 3] A schematic diagram showing the first stage of machining of a workpiece. [Figure 4] A schematic diagram showing the second stage of machining of the workpiece. [Diagram 5] Schematic diagram showing how the second workpiece is machined. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0011] An embodiment of the present invention will be described with reference to the drawings. In the following, when the number, numerical value, amount, range, etc. of components are mentioned, the number is not limited to the specific number, and may be more or less than the specific number, unless otherwise specified or when it is clearly limited to a specific number in principle.

[0012] In addition, when referring to the shape or positional relationship of components, etc., this includes things that are substantially similar or approximate to those shapes, etc., unless otherwise specified or considered to be clearly different in principle.

[0013] In addition, the drawings may exaggerate characteristic parts to make the features easier to understand, and the dimensional ratios of the components may not be the same as the actual ones. In addition, in cross-sectional views, hatching of some components may be omitted to make the cross-sectional structure of the components easier to understand.

[0014] 1 is a plan view showing a basic configuration of a processing system 1. The processing system 1 continuously performs a plurality of grinding processes on a workpiece W. Note that the processing system 1 may perform only either the grinding process or the polishing process.

[0015] The machining system 1 is provided with four stages: a platform stage ST1, a rough grinding stage ST2, a medium grinding stage ST3, and a fine grinding stage ST4. Note that the number of stages (pre-grinding stages) that sequentially machine the workpiece W upstream of the fine grinding stage ST4 is not limited to two, the rough grinding stage ST2 and the medium grinding stage ST3, and may be one or three or more.

[0016] 1, and four chucks 3 arranged at equal intervals on a concentric circle centered on a rotation axis 2a of the index table 2. As the index table 2 rotates in 90° steps, the chucks 3 can move in the order of the platform stage ST1, the rough grinding stage ST2, the medium grinding stage ST3, and the fine grinding stage ST4.

[0017] The chuck 3 has an adsorption body 32 (described later) made of a porous material such as alumina embedded on the upper surface of a rotary table 31. The chuck 3 has a conduit (not shown) that runs through the inside and extends to the surface. The conduit is connected to a vacuum source, a compressed air source, or a water supply source via a rotary joint (not shown). When the vacuum source is activated, the workpiece W placed on the chuck 3 is adsorbed and held by the chuck 3. When the compressed air source or water supply source is activated, the adsorption between the workpiece W and the chuck 3 is released.

[0018] The rotary table 31 is connected to a chuck spindle (not shown). The chuck spindle is configured to be rotatable about a rotation axis perpendicular to the rotary table 31. The chuck 3 may be provided with a tilt mechanism (not shown) having a known configuration capable of tilting the rotary table 31.

[0019] On the platform stage ST1, the workpiece W before grinding is transported onto the chuck 3 by a transport arm (not shown). The workpiece W is previously aligned so that its orientation coincides with a predetermined direction. After grinding, the workpiece W is transported from the chuck 3 by the transport arm to a cleaning device (not shown).

[0020] The rough grinding stage ST2 is provided with a rough grinding device 4. The rough grinding device 4 includes a rough grinding wheel (not shown), a first spindle 41 to the lower end of which the rough grinding wheel is attached and which rotatably supports the rough grinding wheel, and a first spindle feed mechanism 42 which raises and lowers the first spindle 41 in the vertical direction.

[0021] For example, a #8000 cup-shaped grinding wheel is used as the rough grinding wheel. The first spindle feed mechanism 42 is composed of two linear guides 43 that guide the first spindle 41 in the moving direction, and a ball screw slider mechanism 44 that raises and lowers the first spindle 41.

[0022] The rough grinding device 4 is also provided with a first contact type thickness measuring device 45. The first contact type thickness measuring device 45 has a pair of detection arms 46, 47 each having a contact at its tip.

[0023] During rough grinding, the contact of the detection arm 46 comes into contact with the upper surface of the workpiece W, and the contact of the detection arm 47 comes into contact with the upper surface of the chuck 3, making it possible to measure the thickness of the workpiece W from the difference in height detected by the contacts of the detection arms 46, 47. Note that the thickness of the workpiece W measured by the first contact type thickness measuring device 45 includes the thickness of a device formed on one surface of the workpiece W and a protective tape attached to one surface, etc.

[0024] The medium grinding stage ST3 is provided with a medium grinding device 5. The medium grinding device 5 includes a medium grinding wheel (not shown), a second spindle 51 to the lower end of which the medium grinding wheel is attached and which rotatably supports the medium grinding wheel, and a second spindle feed mechanism 52 which raises and lowers the second spindle 51 in the vertical direction.

[0025] For example, a #8000 cup-type grinding wheel is used as the medium grinding wheel. The second spindle feed mechanism 52 is composed of two linear guides 53 that guide the second spindle 51 in the moving direction, and a ball screw slider mechanism 54 that raises and lowers the second spindle 51.

[0026] The intermediate grinding device 5 is also provided with a second contact type thickness measuring device 55. The second contact type thickness measuring device 55 has a pair of detection arms 56, 57 with contacts at their tips.

[0027] During the intermediate grinding process, the contact of the detection arm 56 comes into contact with the upper surface of the workpiece W, and the contact of the detection arm 57 comes into contact with the upper surface of the chuck 3, making it possible to measure the thickness of the workpiece W from the difference in height detected by the contacts of the detection arms 56, 57. Note that the thickness of the workpiece W measured by the second contact type thickness measuring device 55 includes the thickness of a device formed on one surface of the workpiece W and a protective tape attached to the back surface, etc.

[0028] The precision grinding stage ST4 is provided with a precision grinding device 6. The precision grinding device 6 includes a precision grinding wheel 61, a third spindle 62 having the precision grinding wheel 61 attached to its lower end and rotatably supporting the precision grinding wheel 61, and a third spindle feed mechanism (not shown) that raises and lowers the third spindle 62 in the vertical direction.

[0029] The precision grinding wheel 61 is, for example, a #8000 cup-shaped grinding wheel. The precision grinding stage ST4 is also provided with a non-contact thickness measuring device 63, which will be described later. The non-contact thickness measuring device 63 measures the thickness (film thickness) of the workpiece W during precision grinding.

[0030] The processing system 1 is provided with a film thickness measuring device 7. The film thickness measuring device 7 measures the thickness (film thickness) of the workpiece W in a non-contact manner. Note that the film thickness of the workpiece W measured by the film thickness measuring device 7 does not include the thickness of a device formed on one surface of the workpiece W or a protective tape attached to one surface, etc. The film thickness measuring device 7 is, for example, a spectral interference type film thickness measuring instrument.

[0031] The film thickness measuring device 7 is fixed to a frame 1a installed in the processing system 1, and is installed above the index table 2. The measurement point at which the film thickness measuring device 7 measures the film thickness of the workpiece W is set on a rotational orbit O of the central axis of the chuck 3 when viewed from above.

[0032] 2 is a schematic diagram showing the positional relationship of the measurement points of the film thickness measuring device 7 on the workpiece W. FIG. 2 illustrates the positional relationship of the measurement points of the film thickness measuring device 7 when the rotation speed of the index table 2 is set to 20 deg / s, the rotation speed of the chuck 3 is set to 400 rpm, and the sampling period of the film thickness measuring device 7 is set to 4 msec. Since the workpiece W passes directly below the film thickness measuring device 7 while rotating, the trajectory of the measurement points of the film thickness measuring device 7 spreads over the entire surface of the workpiece W, including the center of the workpiece W. The trajectory of the measurement points of the film thickness measuring device 7 can be appropriately changed depending on the rotation speed of the index table 2, the rotation speed of the chuck 3, and the sampling period of the film thickness measuring device 7.

[0033] The film thickness measuring devices 7 are provided on both the upstream side and downstream side of the precision grinding stage ST4 in the rotation direction of the index table 2. This is because, when the machined workpiece W is transferred from the precision grinding stage ST4 to the platform stage ST1, the index table 2 may rotate clockwise or counterclockwise on the paper surface of FIG. 1 due to the relationship with the rotation mechanism of the index table 2, and in order to correspond to each rotation direction of the index table 2, one film thickness measuring device 7 is provided on each the upstream side and downstream side of the precision grinding stage ST4.

[0034] The operation of the machining system 1 is controlled by a control device 8. The control device 8 controls each of the components constituting the machining system 1. The control device 8 is composed of, for example, a CPU, a memory, and the like. Note that the functions of the control device 8 may be realized by control using software, or may be realized by operation using hardware.

[0035] Next, a procedure for sequentially machining two workpieces W using the same chuck will be described. Hereinafter, when it is necessary to distinguish between the two workpieces W, they will be distinguished by assigning the symbols W1 and W2.

[0036] <First workpiece (first stage of processing)> On the platform stage ST1, the workpiece W1 is placed on the chuck 3. When the vacuum source is activated, negative pressure is supplied between the workpiece W1 and the chuck 3, and the workpiece W1 is attracted to and held by the chuck 3.

[0037] Next, the index table 2 rotates and the chuck 3 moves toward the rough grinding stage ST2.

[0038] The chuck 3 moves to the rough grinding stage ST2, and the workpiece W1 is subjected to rough grinding. In the rough grinding, the grinding surface of the rough grinding wheel is pressed against the workpiece W1 while the rough grinding wheel and the chuck 3 are rotating, and the workpiece W1 is roughly ground. When the measurement value of the first contact type thickness measuring device 45 reaches the desired thickness, the rough grinding device 4 stops the rotation of the rough grinding wheel and the chuck 3, and moves the rough grinding wheel upward to finish the rough grinding.

[0039] Next, the index table 2 rotates, and the chuck 3 moves toward the medium grinding stage ST3. In the medium grinding stage ST3, the workpiece W1 is subjected to medium grinding. In the medium grinding, the grinding surface of the medium grinding wheel is pressed against the workpiece W1 while the medium grinding wheel and the chuck 3 are rotating, and the workpiece W1 is medium ground. When the measurement value of the second contact type thickness measuring device 55 reaches the desired thickness, the medium grinding device 5 stops the rotation of the medium grinding wheel and the chuck 3, and retracts the medium grinding wheel upward, thereby completing the medium grinding.

[0040] Next, the index table 2 rotates, and the chuck 3 moves toward the precision grinding stage ST4. In the precision grinding stage ST4, precision grinding is performed on the workpiece W1. Specifically, as shown in FIG. 3(a)-(c), in the precision grinding, the grinding surface of the precision grinding wheel 61 is pressed against the workpiece W1 while the precision grinding wheel 61 and the chuck 3 are rotated, and the workpiece W1 is precision ground. When the measurement value of the non-contact thickness measuring device 63 reaches the desired thickness, the precision grinding device 6 stops the rotation of the precision grinding wheel 61 and the chuck 3, and retracts the precision grinding wheel 61 upward to end the precision grinding. The measurement value of the non-contact thickness measuring device 63 at the end of the precision grinding is set to the final target thickness plus a predetermined offset thickness.

[0041] Next, when the index table 2 rotates and the chuck 3 moves toward the platform stage ST1, as shown in Fig. 3(d), the film thickness measuring device 7 measures the film thickness of the workpiece W1 at a plurality of measurement points over the entire surface of the workpiece W. The number of measurement points of the film thickness measuring device 7 on the workpiece W1 is set to, for example, 200 points. The film thickness measuring device 7, whose measurement points are set on the rotational orbit O of the central axis of the chuck 3 when viewed from above, can measure the film thickness of the workpiece W1 without decreasing the throughput of the grinding process of the workpiece W1 while the workpiece W1 is returning to the platform stage ST1 as the workpiece W1 rotates around the central axis of the chuck 3.

[0042] Next, the control device 8 calculates the shape of the workpiece W1 after precision grinding based on the measurement value of the film thickness measuring device 7. For example, the workpiece W1 shown in FIG. 3(d) has a concave shape with the periphery being thicker than the center. The control device 8 calculates the tilt angle of the tilt mechanism so that the difference between the maximum and minimum film thicknesses of the first machined workpiece W1 is small. The relationship between the shape of the workpiece W1 and the tilt angle of the tilt mechanism is preset by experiment or the like.

[0043] <First workpiece (second stage processing)> Next, the workpiece W1 after fine grinding is subjected to rough grinding, medium grinding and fine grinding again.

[0044] Specifically, the chuck 3 holding the workpiece W1 after fine grinding moves in the order of rough grinding stage ST2, medium grinding stage ST3 and fine grinding stage ST4, similar to the first stage of processing described above, and the workpiece W1 after fine grinding is subjected to rough grinding, medium grinding and fine grinding in that order.

[0045] In the second stage of processing of the workpiece W1 after fine grinding in the rough grinding stage ST2, medium grinding stage ST3 and fine grinding stage ST4, as shown in Figures 4(a) and (b), rough grinding, medium grinding and fine grinding are performed with the rotation axis 3a of the chuck 3 tilted by the tilt angle of the tilt mechanism calculated based on the shape of the workpiece W1 after the first stage of fine grinding.

[0046] 4(c), when the measurement value of the non-contact type thickness measuring device 63 reaches the desired thickness, the precision grinding is terminated. The measurement value of the non-contact type thickness measuring device 63 at the end of the precision grinding is set to the final target thickness.

[0047] Next, when the index table 2 rotates and the chuck 3 moves toward the platform stage ST1, the film thickness measuring device 7 measures the film thickness at multiple measurement points over the entire surface of the workpiece W1, as shown in FIG. 4(d).

[0048] Then, the control device 8 calculates the shape of the workpiece W1 after precision grinding based on the measurement value of the film thickness measuring device 7. For example, the workpiece W1 shown in Fig. 4(d) is formed substantially flat with a smaller difference between the maximum and minimum thickness than the workpiece W1 after the first stage of precision grinding. Furthermore, the control device 8 calculates the tilt angle of the tilt mechanism so that the difference between the maximum and minimum film thicknesses of the workpiece W1 after the second stage of processing is smaller.

[0049] In this way, when the surface roughness of the fine grinding wheel 61 is set to a finer value (approximately 3 to 4 nm) than the conventional value (approximately 10 to 13 nm), if the second stage of processing is performed using the fine grinding wheel 61 on the workpiece W1 after the first stage of processing as in the conventional method, the fine grinding wheel 61 will not cut well, and there is a risk that the shape of the workpiece W1 after the second stage of processing will become unstable or the surface will burn. However, by performing the second stage of processing on the workpiece W1 after the first stage of processing in the order of rough grinding, medium grinding, and fine grinding, the fine grinding wheel 61 will be sharpened and its sharpness will be maintained, so that the workpiece W1 can be processed stably.

[0050] Then, on the platform stage ST1, the suction hold between the workpiece W1 and the chuck 3 is released, and the workpiece W1 is transferred from the chuck 3 to the cleaning device.

[0051] <Second work> Next, the second workpiece W2 is suction-held by the same chuck 3 as the first workpiece W1, and the rough grinding and medium grinding are performed on the second workpiece W2 in the same manner as the rough grinding and medium grinding of the first workpiece W1 described above. Note that in the rough grinding stage ST2 and the medium grinding stage ST3, the inclination angle of the rotation axis 3a of the chuck 3 is set to be approximately the same as when the first workpiece W1 was processed.

[0052] Thereafter, the index table 2 rotates and the chuck 3 moves toward the precision grinding stage ST4. In the precision grinding stage ST4, precision grinding is performed on the workpiece W1.

[0053] 5(a), first, the rotation axis 3a of the chuck 3 is tilted by the tilt angle of the tilt mechanism calculated based on the shape of the workpiece W1 after the second grinding stage. That is, in the rough grinding stage ST2 and the medium grinding stage ST3 where the rough shape of the workpiece W is determined, machining is performed with the tilt angle of the rotation axis 3a of the chuck 3 set to be substantially the same with respect to the workpiece W, whereas in the fine grinding stage ST4 where the detailed shape of the workpiece W is determined, when machining the second workpiece W2, the tilt angle of the rotation axis 3a of the chuck 3 is set taking into consideration the machining result of the first workpiece W1.

[0054] Next, as shown in FIG. 5(b), while the precision grinding wheel 61 and the chuck 3 are both rotated, the grinding surface of the precision grinding wheel 61 is pressed against the workpiece W2 to perform precision grinding of the workpiece W2.

[0055] Then, when the measurement value of the non-contact thickness measuring device 63 reaches the desired thickness, as shown in FIG. 5(c), the precision grinding device 6 stops the rotation of the precision grinding wheel 61 and the chuck 3, moves the precision grinding wheel 61 upward, and ends the precision grinding.

[0056] In this way, the film thickness measuring device 7 quickly measures the film thickness of the workpiece W1 that has been processed first after processing, for the workpieces W1 and 2 that are processed successively using the same chuck 3, the control device 8 calculates the inclination angle of the rotation axis 3a of the chuck 3 at which the workpiece W1 can be processed approximately flat from the shape of the workpiece W1, and the precision grinding device 6 fine-grinds the workpiece W2 with the rotation axis 3a of the chuck 3 tilted by this inclination angle, thereby allowing the workpiece W2 to be processed efficiently and with high precision based on the processing results of the workpiece W1.

[0057] Furthermore, in the rough grinding stage ST2 and medium grinding stage ST3, where the general shape of the workpiece W is determined, all workpieces W are processed under the same conditions, and in the fine grinding stage ST4, where the detailed shape of the workpiece W is determined, the workpiece W to be processed subsequently is fine-ground in an inclined state, taking into account the shape of the previously processed workpiece W, so that multiple workpieces W can be processed stably and with high precision.

[0058] Next, when the index table 2 rotates and the chuck 3 moves toward the platform stage ST1, the film thickness measuring device 7 measures the film thickness of the workpiece W2 at a plurality of measuring points over the entire surface of the workpiece W2, as shown in Fig. 5(d). The number of measuring points on the workpiece W2 by the film thickness measuring device 7 is set to, for example, 200 points.

[0059] Then, the control device 8 calculates the shape of the workpiece W2 after precision grinding based on the measurement value of the film thickness measuring device 7. For example, the workpiece W2 shown in Fig. 5(d) is formed substantially flat with a smaller difference between the maximum thickness and the minimum thickness than the workpiece W1.

[0060] Similarly, for the third and subsequent workpieces W, if necessary, the tilt angle of the rotation axis 3a of the chuck 3 that can be used to process the workpiece W so that the difference between the maximum thickness and the minimum thickness of the most recently processed workpiece W is small is calculated based on the shape of the workpiece W most recently processed with the same chuck 3, and the immediately preceding workpiece W is ground with the rotation axis 3a of the chuck 3 tilted by that tilt angle.

[0061] In this way, the processing system 1 of the present invention is a processing system 1 that processes the workpiece W in the order of rough grinding, medium grinding and fine grinding, and is equipped with a tilt device that can tilt the rotation axis 3a of the chuck 3 that holds the workpiece W, a film thickness measuring device 7 that measures the film thickness of the workpiece W after fine grinding in a non-contact manner, and a control device 8 that calculates the shape of the workpiece W after fine grinding based on the measurement value of the film thickness measuring device 7, calculates the tilt angle of the tilt device so that the difference between the maximum thickness and the minimum thickness of the workpiece W after fine grinding is small, and tilts the chuck 3 by the tilt angle, and is configured to re-process the workpiece W after fine grinding in the order of rough grinding, medium grinding and fine grinding with the chuck 3 tilted by the tilt angle.

[0062] With this configuration, the film thickness measuring device 7 quickly measures the film thickness of the workpiece W1 after the first stage of processing, and the control device 8 calculates the inclination angle of the rotation axis 3a of the chuck 3 at which the workpiece W1 can be processed approximately flat from the shape of the workpiece W1. With the rotation axis 3a of the chuck 3 tilted by this inclination angle, rough grinding, medium grinding and fine grinding are performed again on the workpiece W1. Even if the grinding wheel of the fine grinding device 6 is fine, the sharpness of the fine grinding wheel 61 is maintained by going through the rough grinding and medium grinding, so that the workpiece W1 can be processed efficiently and with high precision.

[0063] Furthermore, by performing processing on the same workpiece W1 in two stages, there is a risk that the thermal expansion and thermal contraction of the chuck 3 and other parts due to the processing heat during grinding has not yet converged when the film thickness is measured in the first stage, whereas the thermal expansion and thermal contraction of the chuck 3 and other parts due to the processing heat during grinding has converged when the film thickness is measured in the second stage, so that the shape of the workpiece W1 can be calculated with high accuracy.

[0064] In addition, the processing system 1 according to the present invention further includes an index table 2 that rotates and moves the chuck 3 on an orbit O, and the film thickness measuring device 7 is configured to be installed on the orbit O when viewed from above.

[0065] With this configuration, the measurement point of the film thickness measuring device 7 is set on the orbit O of the index table 2 when viewed from a plane, so that the film thickness of the workpiece W can be measured without reducing the throughput of the grinding process of the workpiece W.

[0066] Furthermore, the present invention can be modified in various ways other than those described above without departing from the spirit of the present invention, and it goes without saying that the present invention extends to such modifications. [Explanation of symbols]

[0067] 1: Processing system 2: Index table 2a: Rotation axis (of index table 2) 3: Zipper 3a: (chuck) rotation axis 31: Rotating table 32: Adsorbent 4: Rough grinding device 41: First spindle 42: First spindle feed mechanism 43: Linear guide (for rough grinding equipment) 44: Ball screw slider mechanism (for rough grinding equipment) 45: First contact type thickness measuring device 46, 47: Detection arms 5: Medium grinding device 51: Second spindle 52: Second spindle feed mechanism 53: Linear guide (for medium grinding equipment) 54: Ball screw slider mechanism (for medium grinding equipment) 55: Second contact type thickness measuring device 56, 57: Detection arm 6: Precision grinding device 61: Fine grinding wheel 62: Third spindle 63: Non-contact thickness measuring device 7: Film thickness measuring device 8: Control device ST1: Platform stage ST2: Rough grinding stage ST3: Medium grinding stage ST4: Precision grinding stage W, W1, W2: Work

Claims

1. A processing system for processing a workpiece in the order of pre-grinding and fine grinding, A tilt device capable of tilting a rotation axis of a chuck that holds the workpiece; a measuring device for non-contactly measuring the film thickness of the workpiece after precision grinding; a control device that calculates a shape of the workpiece after the precision grinding based on the measurement value of the measuring device, calculates a tilt angle of the tilt device so that a difference between a maximum thickness and a minimum thickness of the workpiece after the precision grinding is reduced, and tilts the chuck by the tilt angle; Equipped with a machining system for re-machining the workpiece after the fine grinding in the order of pre-grinding and fine grinding with the chuck tilted by the tilt angle.

2. An index table is further provided for rotating and moving the chuck on a predetermined track, The processing system according to claim 1 , wherein the measuring device is installed on the track when viewed from above.

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