Processor surface temperature power management based on multiple external sensors

Abstract

The processing device [110] manages temperature by correlating readings from multiple external temperature sensors [106, 107] with the surface temperature of the processing device, the correlation being based on characteristics of a computer chassis [223] containing the processing device. The processing device is mounted on a printed circuit board (PCB) [102] or other substrate located within the computer chassis. Multiple temperature sensors are each located at a different location on the PCB to provide temperature readings from various locations on the PCB. A temperature controller [115] of the processing device receives temperature readings from the multiple sensors and correlates the temperature measurements with the surface temperature of the processing device based on multiple correlation values ​​[118].

Description

[Background technology]

[0001] To improve efficiency and reduce power consumption, computing devices may use processors called Accelerated Processing Units (APUs), which include multiple heterogeneous processor cores. For example, some APUs include one or more central processing unit (CPU) cores and one or more graphics processing unit (GPU) cores. However, during operation, the multiple processor cores of an APU tend to generate a relatively large amount of heat, which can affect both the reliability and useful life of the APU. Thus, computer systems including APUs often use thermal management systems that use components such as heat pipes to move heat away from the APU toward a corresponding heat sink to dissipate thermal energy. However, conventional thermal management systems are relatively inflexible and have different effectiveness in different computing environments.

[0002] The present disclosure can be better understood, and its numerous features and advantages made apparent to those skilled in the art by reference to the following drawings, in which the use of the same reference numbers in different drawings indicates similar or identical items. [Brief description of the drawings]

[0003] [Figure 1] 1 is a block diagram of a processing system having a thermal management system that correlates temperature readings from multiple temperature sensors to manage the temperature of an accelerated processing unit (APU) in accordance with some embodiments. [Diagram 2] 2 is a diagram of a computer chassis that affects the temperature readings from the temperature sensor of FIG. 1 according to some embodiments. [Diagram 3] 2 is a block diagram of a system for generating a correlation value for the processing system of FIG. 1 based on a chassis profile that predicts thermal effects of a computer chassis, according to some embodiments. [Figure 4]2 is a flow diagram of a method for using multiple temperature sensors of a processing system to manage the temperature of an APU, according to some embodiments. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0004] 1-4 illustrate techniques for managing the temperature of one or more processing devices, such as an accelerated processing unit (APU) or other various processing devices, by correlating readings from a plurality of external temperature sensors (i.e., external to the processing device) with a surface temperature of the processing device, where the correlation is based on characteristics of a computer chassis that includes the processing device. For example, in some embodiments, the processing device is mounted to a printed circuit board (PCB) or other substrate that is disposed within a computer chassis (e.g., a laptop chassis). Each of a plurality of temperature sensors is disposed at different locations on the PCB to provide temperature readings from various locations on the PCB. A temperature controller of the processing device receives temperature readings from the plurality of sensors and correlates the temperature readings with an estimated or otherwise predicted surface temperature of the processing device based on a plurality of correlation values ​​that represent measured or predicted correspondences between temperatures at the sensors and the surface temperature of the processing device, where the correlation values ​​are based on characteristics of the computer chassis. In response to temperature readings indicating that the surface temperature may exceed a particular thermal threshold, the temperature controller takes corrective action, such as reducing the amount of power provided to the processing device.

[0005] Managing the temperature of a processing device based on correlated temperature readings from multiple external sensors, as described herein, supports more flexible and more accurate temperature management. In particular, an increase in temperature at different locations in a computing system causes a corresponding increase in the surface temperature of the processing device, but often such an increase is difficult or costly to detect using a temperature sensor attached to the surface of the processing device itself. Furthermore, a computer system may experience relatively large temperature differences at different locations in the system, resulting in an individual temperature sensor providing an inaccurate indication of the surface temperature of the processing device. Thus, by using multiple temperature sensors at different locations in the computer system and correlating measurements from the different temperature sensors with a predicted surface temperature of the processing device, the computer system can effectively manage the temperature of the processing device under a wide variety of conditions and system configurations.

[0006] In some embodiments, the correlation value used by the processing device is based on a virtual chassis value that reflects the predicted effect of a computer chassis on the correlation between temperature sensor readings and the surface temperature of the processing device. To illustrate, in many cases, PCBs and processing devices are intended to be placed within a computer chassis, such as a laptop chassis, to protect the PCB and associated components, connect the processing device to other components of the processing system, and the like. The computer chassis affects factors such as air currents and heat dissipation patterns, which affect the correlation between the temperature readings of a given temperature sensor on the PCB and the surface of the processing device. By incorporating these effects into the correlation value, the processing device improves the accuracy of the surface temperature measurements, thereby improving the effectiveness of thermal management.

[0007] In some embodiments, the predicted effect of the computer chassis is determined based on testing of the PCB and temperature sensors while the PCB is placed in the chassis (or a similar chassis) itself. However, in some cases, the cost of performing such testing is prohibitive. Therefore, in some embodiments, the correlation value is established based on a virtual model of the chassis that predicts the effect of the computer chassis on the correlation. This improves the accuracy of the correlation value while reducing the cost of developing the correlation value.

[0008] 1, a block diagram of a processing system 100 for implementing temperature control based on measurements from multiple temperature sensors is shown, according to some embodiments. The processing system 100 includes multiple components that together support the execution of computer instructions. Thus, in different embodiments, the processing system 100 is embedded in an electronic device (e.g., a desktop computer, a laptop computer, a server, a game console, a smartphone, a tablet, an automobile or other vehicle, etc.) and executes a set of instructions (e.g., a computer program) to perform tasks on behalf of the electronic device.

[0009] To execute instructions, processing system 100 includes APU 110 having multiple processor cores, each processor core executing instructions or operations assigned to the processor core. In some cases, the instructions are general purpose instructions for performing general purpose tasks (e.g., running an operating system and interfacing with one or more input / output devices (not shown)). In other cases, the operations are special purpose operations (e.g., graphics operations (e.g., operations performing drawing of objects for display), vector processing operations, machine learning or artificial intelligence operations, etc.). To efficiently execute different types of instructions and operations, APU 110 includes different types of processor cores. For example, in the embodiment of FIG. 1, APU 110 includes a central processing unit (CPU) core 112 that executes general purpose instructions and an integrated graphics processing unit (iGPU) core 114 that performs graphics operations. In other embodiments, APU 110 includes additional CPU cores, additional GPU cores, or any combination thereof. Instead of or in addition to one or more CPU cores or one or more GPU cores, in some embodiments, APU 110 includes other types of processor cores not shown in FIG 1 (e.g., one or more vector processing cores, digital signal processing (DSP) cores, artificial intelligence (AI) cores, inference engine cores, etc.), each of which performs a corresponding type or types of operations. Thus, reference to CPU core 112 or iGPU core 114 applies to other types of processor cores as well, unless explicitly stated otherwise.

[0010] To further support the execution of instructions, processing system 100 includes a discrete co-processor, such as a discrete GPU (dGPU) 116 that includes circuitry to perform graphics and vector processing operations based on commands received from APU 110 under at least some operational modes of processing system 100. For example, in some embodiments, processing system 100 can be placed into different modes depending on one or more factors, such as the power source provided to processing system 100 (e.g., battery power vs. grid power), the type of program being executed in processing system 100, and quality settings programmed by a user of processing system 100. For example, in some embodiments, processing system 100 uses iGPU core 114 for graphics operations when processing system 100 is powered by a battery source and uses dGPU 116 for graphics operations when processing system 100 is powered by the grid.

[0011] In the illustrated embodiment, APU 110 is powered by power source 104. In some embodiments, power source 109 draws power from a wired power source (i.e., a power source that provides power based on power provided by a power grid), a battery, or a combination thereof. In some embodiments, power source 109 provides a controllable amount of power to APU 110; that is, the amount of power provided by power source 109 is controllable based on control signaling provided to the power source. As described further below, regulating power source 109 supports controlling the temperature of APU 110 and dGPU 116, thereby protecting the reliability and lifespan of the device.

[0012] The APU 110 and dGPU 116 are mounted on a printed circuit board (PCB) 102. In some embodiments, the PCB 102 is a computer motherboard or similar PCB on which additional components of the processing system 100 not specifically shown in FIG. 1 are mounted, including one or more memory modules, a network interface module, etc. The PCB 102 further includes connectors, buses, conductive traces, etc. for connecting components of the processing system 100, including connecting the APU 110 to one or more of the other components.

[0013] To support management of the different components, processing system 100 includes electronic controller (EC) 105. EC 105 is an integrated circuit controller device that manages aspects of processing system 100, such as aspects of temperature measurement and control, as described further below. In some embodiments, EC 105 performs other operations, such as implementing commands provided by basic input / output system (BIOS) firmware executing in APU 110. For example, in some embodiments, upon reset or other condition, APU 110 automatically executes a stored set of BIOS firmware (not shown in FIG. 1). During execution, BIOS firmware communicates commands to EC 105 for initialization of a storage system (e.g., a hard drive or flash memory drive), initialization of a network interface, initialization of communications with other processing systems, etc. EC 105 receives and interprets the commands and implements the commands by providing corresponding control signaling to the different components of processing system 100. In this manner, the EC 105 provides an interface between the components of the processing system 100 and the APU 110, allowing the APU 110 to be used in a wide variety of processing systems having different configurations and components.

[0014] As mentioned above, one aspect of the processing system 100 managed by the EC 105 is the surface temperature of the APU 110 and the dGPU 116. To illustrate, during operation of the processing system 100, different system components, including the APU 110 and the dGPU 116, generate heat. If the heat generated at or near the APU 110 or the dGPU 116 becomes too high for too long a period of time, the reliability or lifespan of the APU 110 or the dGPU 116 may be adversely affected. Thus, the processing system 100 uses a temperature control subsystem to manage the temperature of both the APU 110 and the dGPU 116, and in particular to maintain the surface temperature of each processing device below a corresponding threshold above which the corresponding processing device is likely to be damaged or otherwise adversely affected. The temperature control subsystem includes the EC 105, a number of temperature sensors 106, 107, 108, and a temperature control module 115.

[0015] Each of the temperature sensors 106-108 is a device that generates an electrical signal having a magnitude or other characteristic proportional to a temperature at or near the device. Examples of such devices include thermocouple sensors, resistance temperature detectors (RTDs), thermistor temperature sensors, integrated circuit (IC) temperature sensors, etc., or combinations thereof. The EC 105 receives the electrical signals from the temperature sensors 106-108 and generates a corresponding digital value for each temperature sensor based on the corresponding electrical signal. Thus, the EC 105 generates a digital value (referred to herein as a digital temperature value) for each of the temperature sensors 106-108 that represents the temperature at or near the corresponding sensor. In some embodiments, including the embodiment shown in FIG. 1, the temperature sensors 106-108 are disposed at different locations on the PCB 102. Thus, the digital temperature values ​​generated by the EC 105 represent the temperatures at various locations of the processing system 100.

[0016] It will be appreciated that the thermal characteristics at one location of the processing system 100 are based on heat sources, convection effects, and the like that generally affect the entire processing system 100. Thus, the thermal characteristics and temperature at one location of the processing system 100 generally correlate to the thermal characteristics and temperature at another location of the processing system 100. The temperature control subsystem of the processing system 100 uses this property to determine the surface temperature of the APU 110 and the surface temperature of the dGPU 116. In particular, the APU 110 includes a temperature control module 115 that stores sensor correlations 118, one subset of which indicates the correlation between the surface temperature of the APU 110 and the temperature at or near the temperature sensors 106-108, and another subset of which indicates the correlation between the surface temperature of the dGPU 116 and the temperature at or near the temperature sensors 106-108. The temperature control module 115 receives the digital temperature values ​​from the EC 105 and applies corresponding ones of the sensor correlations to the digital temperature values ​​to generate surface temperature values ​​for each of the APU 110 and the dGPU 116. For example, in some embodiments, the temperature control module 115 generates the surface temperature values ​​according to the following equation: SK1=m1x1+m2x2+...m n x n +C where SK1 is the surface temperature value, and x Y is the digital temperature value of sensor Y, and m Y is the digital temperature value x Y is the sensor correlation value, and C is a constant based on the characteristics of the PCB 102.

[0017] The sensor correlation value applied to a given digital temperature value to determine the surface temperature of the APU 110 is a correlation coefficient indicating the correlation between the surface temperature of the APU 110 and the temperature sensor that generated the corresponding digital value. For example, in some embodiments, m1 is a sensor correlation indicating the correlation between the temperature at or near the temperature sensor 107 and the surface temperature of the APU 110, and x1 is a digital temperature value indicating the temperature measured by the temperature sensor 107. It will be appreciated that in some embodiments, the thermal properties of different locations of the processing system 100 vary due to, for example, variations in the surrounding materials and components, variations in air flow and convection, etc. Thus, the correlation between the temperatures measured by different temperature sensors and the surface temperature of the APU 110 is different, and therefore the values ​​of the sensor correlations are also different. For example, in some embodiments, the value of the sensor correlation m1 is different from the value of the sensor correlation m2. It will be further appreciated that in some embodiments, temperature control module 115 determines the surface temperature of dGPU 116 using the equations discussed above, but with a different set of correlation values ​​(i.e., different values ​​of m1 and m2, etc.) and a different constant C than those used for APU 110. The determination of sensor correlations 118 and constant C, as well as other values ​​used by temperature control module 115, are discussed further below.

[0018] In some embodiments, the SK1 value is relatively noisy for individual surface temperature measurements of a given processing device, and therefore in these embodiments, the temperature control module 115 applies an alpha filter to remove noise according to the following equation: SK α =SK1α+SK α-1 (1-α) During the ceremony, SK α is the filtered surface temperature value, α is the alpha filtering value determined during characterization, as further described below, and SK α-1 is the previous filtered surface temperature value.

[0019] The temperature control subsystem of the processing system 100 uses the filtered surface temperature values ​​to control the surface temperatures of the APU 110 and the dGPU 116. For example, in some embodiments, the temperature control module 115 periodically compares each of the filtered surface temperature values ​​to a temperature threshold 119 for each of the APU 110 and the dGPU 116. In response to the filtered surface temperature exceeding the temperature threshold 119, the temperature control module 115 reduces the power provided by the power supply 104 to the APU 110, thereby ensuring that the surface temperatures of the APU 110 and the dGPU 116 remain within certain safety limits. For example, in some embodiments, the temperature control module 115 reduces the power by a certain amount. In other embodiments, the temperature control module reduces the power based on an amount proportional to the amount the filtered surface temperature exceeds the temperature threshold 119. In some embodiments, the temperature control module 115 uses different temperature thresholds for the APU 110 and the dGPU 116.

[0020] As noted above, in some embodiments, the values ​​of the sensor correlations 118 (e.g., values ​​for each processing device, m1, m2, ... m n ), as well as the constant value C and the filter value α, are determined during a characterization process of the processing system 100. For example, in some embodiments, the PCB 102 (or a PCB of similar design and construction) is placed in a test environment with a temperature sensor disposed on the surface of an integrated circuit incorporating the APU 110. During characterization, the temperature sensor provides an indication of the surface temperature of the APU 110. Different test workloads are run on the APU 110, and for each running workload, a set of temperature readings is obtained from each of the temperature sensors 106-108. These temperature readings are correlated with measurements of the surface temperature of the APU 110 to determine a set of sensor correlations. A similar process is used to determine a set of sensor correlations or the dGPU 116.

[0021] In some embodiments, the sensor correlation for the APU 110 and the dGPU 116 is further adjusted based on the characteristics of the computer chassis in which the PCB 102 is intended to be placed. For illustrative purposes, the processing system 100 is often implemented in a computer chassis, such as a laptop chassis. An exemplary computer chassis 220 according to some embodiments is shown in FIG. 2. In the illustrated example, the computer chassis 220 includes a housing 223 that houses multiple components. Thus, in the exemplary configuration of FIG. 2, the PCB 102 is placed in a slot (e.g., a disk drive, a network interface card, a battery or other power component, and a mechanical component for securing the PCB 102 within the housing 223, etc.) near other computer components (e.g., component 222). In some cases, the housing 223 and other components of the computer chassis 220 affect the thermal behavior of the processing system 100, and in particular, affect the correlation between the temperature measurements at the temperature sensors 106-108 and the surface temperatures of the APU 110 and the dGPU 116. Therefore, to improve accurate surface temperature measurements by the temperature control module 115 , the sensor correlation 118 is based on the characteristics of the chassis 220 .

[0022] By way of example, in some embodiments, the predetermined sensor correlation m may be m based on the operation of the PCB in a testbed environment. test However, a test bed typically provides an environment that is very different from the computer chassis 220 and does not accurately mimic the thermal effects imposed by the computer chassis 220. Thus, as described further herein, m test The values ​​are adjusted based on the expected effects of the computer chassis 220, thereby improving the accuracy of the surface temperature values ​​generated by the temperature control module 115, which in turn improves the effectiveness of the temperature control subsystem.

[0023] 3 is a block diagram of a system 300 for generating correlation values ​​for a processing system 100 based on a chassis profile that predicts thermal effects of a computer chassis 220, according to some embodiments. In some embodiments, the system 300 is a computer system, such as a server or workstation, that is used during characterization of a PCB 102. The system 300 executes a PCB configuration tool 330 that generates sensor correlations 118, as described further below. In some embodiments, the PCB configuration tool 330 is a software tool that provides a graphical user interface (GUI) or other interface that allows a user to adjust individual sensor correlation values, test the PCB 102 with different sensor correlation values ​​to determine the effectiveness of different values ​​for temperature control, adjust other test parameters such as temperature thresholds 119, and the like.

[0024] To generate values ​​for sensor correlation 118, PCB configuration tool 330 uses chassis profile 332 and sensor profile 334. In some embodiments, sensor profile 334 is a data file that stores sensor correlation values ​​based on testing of PCB 102 in a test environment. For example, in some embodiments, sensor profile 334 stores temperature measurement information as follows: [Table 1] Each measurement in the above table represents a different set of temperature measurements under different workloads performed on PCB 102.

[0025] In some embodiments, PCB configuration tool 330 generates an initial sensor correlation value for each sensor based on an average or other statistical combination of the correlations between the APU surface temperature measurements and the corresponding temperature measurements of the corresponding sensors. For example, PCB configuration tool 330 generates an initial sensor correlation value for temperature sensor 106 based on an average of the correlation between temperatures T7 and T1 and the correlation between temperatures T8 and T4.

[0026] PCB configuration tool 330 then adjusts the initial sensor correlation values ​​based on chassis profile 332. In some embodiments, chassis profile 332 is a data profile generated by testing thermal characteristics of chassis 220 or another computer chassis. In other embodiments, chassis profile is based on computer modeling of chassis 220. In still other embodiments, chassis profile is based on testing or simulation of aspects of chassis 220, such as one or more of the shape of housing 223 and components expected to be used with computer chassis 220 (e.g., the number of PCBs to be placed in slots of chassis 220). Thus, chassis profile 332 represents the predicted effects of computer chassis 220 on the sensor correlation values ​​of PCB 102. In some embodiments, chassis profile 332 stores these predicted effects as adjustment factors for each of temperature sensors 106-108. An example is shown in the table below. [Table 2] A1, A2, and A3 are adjustment factors for the initial correlation values ​​corresponding to the temperature sensors 106, 107, and 108, respectively. To determine the sensor correlation value for a given temperature sensor, the PCB configuration tool 330 multiplies the initial correlation value for the sensor by the corresponding adjustment factor. Thus, m 106-I is the initial sensor correlation value of the temperature sensor 106, the PCB configuration tool 330 calculates the product A*m 106-I The PCB configuration tool 330 generates a final correlation value based on the correlation coefficients 112 and 113. The PCB configuration tool 330 stores the final correlation value in the sensor correlation 118 for use during operation of the PCB 102.

[0027] It will be appreciated that in some cases, the thermal effect of the computer chassis 220 is different for different locations on the PCB 102. Thus, the computer chassis 220 has a different effect on the correlation between the surface temperature of the APU 110 and the temperatures at different ones of the temperature sensors 106-108. Thus, in some embodiments, the configured adjustment factors represented by the chassis profile 332 are different. For example, in some embodiments, adjustment factor A1 is different from adjustment factor A2.

[0028] In some embodiments, the sensor correlation values ​​for the dGPU116 are generated in a manner similar to that described above for the APU110 using a temperature sensor mounted on the exterior, i.e., surface, of the dGPU116.

[0029] By using the chassis profile 332 to generate the sensor correlation 118, the PCB configuration tool 330 improves the accuracy of temperature measurements and thermal management during operation of the PCB 102. Additionally, in some embodiments, the chassis profile 332 is generated based on computer modeling of the computer chassis 220 or based on thermal testing of a test PCB having a different configuration than the PCB 102. The chassis profile 332 may thereby be generated relatively inexpensively without the need to place the PCB 102 in the computer chassis 220 for testing, thereby facilitating an efficient characterization process.

[0030] 4 is a flow diagram of a method 400 for determining a surface temperature of a processing device based on computer chassis information, according to some embodiments. The method 400 is described with respect to an exemplary implementation in the APU 110 of FIG. 1. In block 402, the temperature control module 115 of the APU 110 receives digital temperature values ​​for each of the temperature sensors 106-108 from the EC 105. In block 404, the temperature control module 115 correlates the digital temperature values ​​with the surface temperature of the APU 110 using the sensor correlation 118 to generate a surface temperature value. As described above, the sensor correlation 118 is based on the predicted thermal effect of the computer chassis 220.

[0031] At block 406, the temperature control module 115 determines whether the surface temperature value exceeds the temperature threshold 119. If not, method flow returns to block 402 where the temperature control module 115 continues to monitor the surface temperature of the APU 110. In response to the surface temperature value exceeding the temperature threshold 119, method flow proceeds to block 408 where the temperature control module 115 indicates a temperature control event to the EC 105. In response, the temperature control module reduces the power provided by the power supply 104 to the APU 110, thereby maintaining the surface temperature of the APU 110 within specified limits. Method flow returns to block 402.

[0032] In some embodiments, the method includes receiving, at a first processing device disposed within a computer chassis, a first temperature reading from a first temperature sensor external to the processing device, adjusting the first temperature reading based on a first correlation value, the first correlation value being based on predicted thermal behavior of the computer chassis, and adjusting power provided to the first processing device based on the adjusted first temperature reading. In one aspect, the method includes receiving, at the first processing device, a second temperature reading from a second temperature sensor external to the first processing device, adjusting the second temperature reading based on a second correlation value, the second correlation value being based on predicted thermal behavior of the computer chassis, and adjusting power provided to the second processing device based on the adjusted second temperature reading. In another aspect, the second correlation value is different from the first correlation value.

[0033] In one aspect, the first correlation value is further based on a determined temperature correlation between a location of the first sensor and a location on the surface of the first processing device. In another aspect, the location of the first sensor is a first location of the printed circuit board. In yet another aspect, the second correlation value is further based on a determined temperature correlation between a second location of the second sensor and a location on the surface of the processing device, the second location being a second location of the printed circuit board different from the first location. In yet another aspect, the method includes adjusting the first temperature reading based on the second correlation value to determine a surface temperature associated with the second processing device, the second correlation value being different from the first correlation value, and adjusting power supplied to the first processing device based on the determined surface temperature associated with the second processing device.

[0034] In some embodiments, a method includes receiving, at a first processing device, a plurality of temperature readings from a plurality of sensors external to the processing device, determining a surface temperature of the first processing device by adjusting each of the plurality of temperature readings based on a first plurality of correlation values, the first plurality of correlation values ​​being based on predicted thermal behavior of a computer chassis, and adjusting a power supply to the first processing device based on the determined surface temperature of the first processing device. In one aspect, the plurality of correlation values ​​includes a first correlation value and a second correlation value, the second correlation value being different from the first correlation value. In another aspect, each of the plurality of correlation values ​​is further based on a determined temperature correlation between a location of the sensor and a corresponding location on the surface of the processing device.

[0035] In one aspect, the multiple sensors are at different locations on the printed circuit board. In another aspect, determining the surface temperature includes filtering the surface temperature based on a previous surface temperature value. In yet another aspect, the method includes determining a surface temperature of the second processing device by adjusting each of the multiple temperature readings based on a second multiple correlation value different from the first multiple correlation value, and adjusting power supplied to the first processing device based on the determined surface temperature of the second processing device.

[0036] In some embodiments, a processing device comprises a plurality of processor cores and a temperature control module, the temperature control module receiving a first temperature reading from a first temperature sensor external to the processing device, adjusting the first temperature reading based on a first correlation value, the first correlation value being based on a predicted thermal behavior of the computer chassis, and initiating an adjustment of power supplied to the processing device based on the adjusted first temperature measurement. In one aspect, the temperature control module is configured to receive a second temperature reading from a second temperature sensor external to the processing device and adjusting the second temperature reading based on the second correlation value, the second correlation value being based on a predicted thermal behavior of the computer chassis, and requesting an adjustment of power includes requesting an adjustment of power based on the adjusted second temperature reading.

[0037] In one aspect, the second correlation value is different from the first correlation value. In another aspect, the first correlation value is further based on a determined temperature correlation between a location of the first sensor and a location on the surface of the processing device. In yet another aspect, the location of the first sensor is a first location of a printed circuit board. In yet another aspect, the second correlation value is further based on a determined temperature correlation between a second location of the first sensor and a location on the surface of the processing device, the second location being a second location of the printed circuit board different from the first location. In yet another aspect, the predicted temperature behavior is a simulated behavior of a computer chassis.

[0038] In some embodiments, some aspects of the above techniques may be implemented by one or more processors of a processing system executing software. The software includes one or more sets of executable instructions stored in or tangibly embodied on a non-transitory computer-readable storage medium. The software may include instructions and specific data that, when executed by one or more processors, operate the one or more processors to perform one or more aspects of the above techniques. The non-transitory computer-readable storage medium may include, for example, a magnetic or optical disk storage device, a solid-state storage device such as a flash memory, a cache, a random access memory (RAM), or one or more other non-volatile memory devices, etc. The executable instructions stored on the non-transitory computer-readable storage medium may be source code, assembly language code, object code, or other instruction formats that can be interpreted or executed by one or more processors.

[0039] In addition to the above, it should be noted that not all activities or elements described in the summary description are required, some of the specific activities or devices may not be required, one or more additional activities may be performed, and one or more additional elements may be included. Furthermore, the order in which the activities are listed is not necessarily the order in which they are performed. Also, the concepts have been described with reference to specific embodiments. However, those skilled in the art will appreciate that various changes and modifications can be made without departing from the scope of the invention as set forth in the claims. Thus, the specification and drawings should be regarded in an illustrative rather than a restrictive sense, and all such modifications are intended to be included within the scope of the invention.

[0040] Benefits, other advantages, and solutions to problems have been described above with regard to specific embodiments. However, the benefits, advantages, solutions to problems, and features from which any benefit, advantage, or solution may arise or be manifested are not to be construed as critical, essential, or essential features of any or all of the claims. Moreover, the specific embodiments described above are illustrative only, as the disclosed invention may be modified and practiced in different but similar manners apparent to those skilled in the art having the benefit of the teachings herein. No limitations are intended to the details of construction or design herein shown, other than as described in the appended claims. It is therefore apparent that the specific embodiments described above may be altered or modified, and all such variations are considered to be within the scope of the disclosed invention. Accordingly, the protection sought herein is set forth in the appended claims.

Claims

1. receiving a first temperature reading from a first temperature sensor [106] external to a first processing device [110] located on a computer chassis [223]; adjusting the first temperature reading based on a first correlation value [118] to generate an adjusted first temperature reading corresponding to a surface temperature of the first processing device, the first correlation value being based on a predicted thermal behavior of the computer chassis; and and adjusting power supplied to the first processing device based on the adjusted first temperature reading exceeding a threshold. method.

2. receiving, at the first processing device, a second temperature reading from a second temperature sensor [107] external to the first processing device; adjusting the second temperature reading based on a second correlation value to generate an adjusted second temperature reading corresponding to a second surface temperature of the first processing device, the second correlation value being based on a predicted temperature behavior of the computer chassis; adjusting the power supplied to the first processing device includes adjusting the power supplied based on the adjusted second temperature reading.

2. The method of claim 1.

3. the second correlation value is different from the first correlation value; The method of claim 2.

4. the first correlation value is further based on a determined temperature correlation between a position of the first sensor and a position on a surface of the first processing device. The method of claim 2 or 3.

5. the first sensor location is a first location on a printed circuit board [102]; The method of claim 4.

6. the second correlation value is further based on a determined temperature correlation between a second location of a second sensor and a location on the surface of the first processing device, the second location being a second location of the printed circuit board different from the first location. The method of claim 5.

7. adjusting the first temperature reading based on a second correlation value to determine a surface temperature associated with a second processing device, the second correlation value being different from the first correlation value; and adjusting power supplied to the first processing device based on the determined surface temperature associated with the second processing device.

2. The method of claim 1.

8. A processing device [100] comprising: A plurality of processor cores [112, 114]; a temperature control module [115]; The temperature control module includes: receiving a first temperature reading from a first temperature sensor [106] external to the processing device; adjusting the first temperature reading based on a first correlation value [118] to generate an adjusted first temperature reading corresponding to a surface temperature of the processing device, the first correlation value being based on a predicted temperature behavior of a computer chassis [223]; and initiating an adjustment of power supplied to the processing unit based on the adjusted first temperature reading exceeding a threshold. A processing device [110].

9. The temperature control module includes: receiving a second temperature measurement from a second temperature sensor [107] external to the processing device; adjusting the second temperature reading based on a second correlation value to generate an adjusted second temperature reading corresponding to a second surface temperature of the processing device, the second correlation value being based on a predicted thermal behavior of the computer chassis; and requesting an adjustment of power includes requesting an adjustment of power based on the adjusted second temperature measurement. The processing device of claim 8.

10. the second correlation value is different from the first correlation value; The processing device of claim 9.

11. the first correlation value is further based on a determined temperature correlation between a position of the first sensor and a position on a surface of the processing device.

11. The processing device of claim 9 or 10.

12. the first location is a first location on a printed circuit board [102]; The processing device of claim 11.

13. the second correlation value is further based on a determined temperature correlation between a second location of the first sensor and a location on the surface of the processing device, the second location being a second location on the printed circuit board different from the first location. The processing device of claim 12.

14. the predicted temperature behavior is a simulated behavior of the computer chassis; The processing device of claim 8.

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