Shower Head Purge Collar

Abstract

The method, system, and computer program are directed to a new showerhead purge collar structure for semiconductor manufacturing equipment. The showerhead purge collar includes a top portion and a bottom portion coupled to and concentric with the top portion. The top portion has a hollow center portion for introducing process gas and an inlet for purge gas on a side of the top portion. The bottom portion has a hollow center portion for introducing process gas toward the showerhead. A plenum for introducing purge gas is defined within the showerhead purge collar, and the bottom portion includes holes for exhausting the purge gas above the showerhead.

Description

[Technical field]

[0001] [Priority claim] This application claims the benefit of priority to Indian Patent Application No. 202031011832, filed March 19, 2020, which is incorporated herein by reference in its entirety.

[0002] The subject matter disclosed herein relates generally to showerhead purge collars in semiconductor manufacturing equipment. [Background technology]

[0003] The Background Art provided herein is provided to present the contents of the present disclosure generally, and the inventions of the presently named inventors are not admitted expressly or impliedly as prior art to the present disclosure to the extent that they are described in this Background Art section and in a descriptive manner that is not prior art at the time of filing.

[0004] In some semiconductor devices (e.g., atomic layer deposition (ALD) devices), problems may arise with material deposition on the backside of the showerhead: Unwanted particles formed on the showerhead may fall onto the substrate, causing damage to the substrate.

[0005] In some operations, a purge gas plenum exists between the showerhead stem and the inner diameter of the purge collar. This structure blocks the purge gas when the showerhead is tilted or not perfectly centered. This tilt and eccentricity causes the purge gas to be uneven, resulting in showerhead backside deposition and flaking particles.

[0006] What is needed to avoid backside deposition on the showerhead is a showerhead purge collar that provides good purge gas flow that is not affected by showerhead tilt or centering. Summary of the Invention

[0007] In one aspect, the showerhead purge collar is insensitive to tilt and eccentricity of the showerhead stem because it contains an internal plenum for the purge gas. The purge gas outlet holes are sized, located, and oriented to provide optimal backside showerhead purge uniformity.

[0008] In one embodiment, the showerhead purge collar is formed of a multi-layered ceramic structure. The ceramic structure can also be 3D printed to form an internal purge cavity without the need for integration of multiple ceramic pieces. The new showerhead purge collar makes the showerhead purge uniformity independent of stem concentricity and angle. The size, location, and orientation of the purge holes in this structure are selected based on depth flow modeling to produce optimal purge uniformity. This structure moves the purge plenum into the purge collar, making it insensitive to the tilt and concentricity of the showerhead stem.

[0009] Some benefits of shower head purge collars include:

[0010] Purge gas uniformity behind the showerhead is not affected by showerhead tilt or centering.

[0011] The structure is integrally formed and results in little or no change to the way the showerhead purge collar is assembled or attached to the tool during manufacturing.

[0012] The present structure reduces or eliminates deposition and resulting particles on the backside of the showerhead.

[0013] · There is very little impact to upgrading current users.

[0014] One general aspect includes a showerhead purge collar having a top and a bottom coupled to and concentric with the top. The top has a hollow center for introducing process gas and an inlet for purge gas on a side of the top. The bottom has a hollow center for introducing process gas toward the showerhead. A plenum for introducing purge gas is defined within the showerhead purge collar, and the bottom includes holes for exhausting the purge gas above the showerhead.

[0015] Another general aspect is a method for manufacturing a showerhead purge collar. The method includes an act for fabricating a top portion from a ceramic material, the top portion having a hollow center for introducing process gas and an inlet on a side of the top portion for a purge gas. The method further includes an act for fabricating a bottom portion from a ceramic material, the bottom portion having a hollow center for introducing process gas toward the showerhead. The method further includes an act for drilling holes in the bottom portion for exhausting purge gas above the showerhead, and an act for joining the top portion and the bottom portion. The bottom portion is concentric with the top portion, and a plenum for introducing purge gas is defined within the showerhead purge collar. [Brief description of the drawings]

[0016] The various accompanying drawings merely depict exemplary embodiments of the present disclosure and are not to be considered as limiting its scope.

[0017] [Figure 1] FIG. 1 illustrates an in-situ deposition system in accordance with an example embodiment.

[0018] [Diagram 2] FIG. 1 illustrates a location of a showerhead purge collar, according to some example embodiments.

[0019] [Diagram 3] FIG. 1 illustrates a flow rate around a showerhead and pedestal assembly according to some illustrative embodiments.

[0020] [Figure 4] FIG. 1 is a first structural view of a showerhead purge collar in accordance with some illustrative embodiments.

[0021] [Diagram 5] 1 is a diagram of a deposition formation on a showerhead, in accordance with some illustrative embodiments.

[0022] [Figure 6] FIG. 13 is a color diagram of an improved showerhead purge in accordance with some illustrative embodiments.

[0023] [Figure 7] FIG. 13 is a detailed view of the bottom of a showerhead purge collar, according to some illustrative embodiments.

[0024] [Figure 8] FIG. 13 is a bottom view of a showerhead purge collar, according to some illustrative embodiments.

[0025] [Figure 9] FIG. 1 illustrates a perspective view of a top of a showerhead purge collar, according to some illustrative embodiments.

[0026] [Figure 10] 4 is a diagram of a showerhead purge collar, according to some example embodiments.

[0027] [Figure 11] 1A is a cross-sectional view of a showerhead purge collar with some internal geometry detail according to some example embodiments.

[0028] [Figure 12A] 14A-14C show experimental results of showerhead purge collar structures, according to some illustrative embodiments. [Figure 12B] 14A-14C show experimental results of showerhead purge collar structures, according to some illustrative embodiments. [Figure 12C]14A-14C show experimental results of showerhead purge collar structures, according to some illustrative embodiments. [Figure 12D] 14A-14C show experimental results of showerhead purge collar structures, according to some illustrative embodiments.

[0029] [Figure 13] 1 is a flowchart of a method for manufacturing a showerhead purge collar, in accordance with some illustrative embodiments. DETAILED DESCRIPTION OF THE PREFERRED EMBODIMENTS

[0030] The illustrative methods, systems, and computer programs are directed to novel showerhead purge collar constructions, the examples merely representing possible variations.

[0031] FIG. 1 depicts an in-situ deposition system according to an exemplary embodiment. By way of example, the deposition techniques described herein may be performed in a plasma-enhanced chemical vapor deposition (PECVD) reactor or a conformal film deposition (CFD) reactor. Such reactors may take many forms and may be part of an apparatus with one or more chambers or reactors, each of which may contain multiple stations that can accommodate one or more wafers and be configured to perform various wafer operations. The one or more chambers may maintain the wafer in a defined position (with or without motion (e.g., rotation, vibration, or other motion) in that position). In an embodiment, prior to the operations performed in the disclosed embodiments, the wafer to be subjected to deposition may be transferred from one station to another within the reactor or chamber during the process. In other embodiments, the wafer may be transferred from chamber to chamber within the apparatus to perform different operations. The full deposition or a portion of the full thickness of any deposition step may be performed entirely in one station. During the process, each wafer may be held in place by a pedestal, a wafer chuck, and / or other wafer holding device. The apparatus may include a heater, such as a heating plate, in certain operations where the wafer is heated. Both the Vector™ (e.g., C3 Vector) reactor or the Sequel™ (e.g., C2 Sequel) reactor manufactured by Lam Research Corporation of Fremont, Calif., are examples of suitable reactors that may be used to practice the techniques described herein.

[0032] FIG. 1 provides a block diagram illustrating various reactor components arranged to perform the methods described herein. As shown, the reactor system 100 includes a process chamber 136 that, among other components, functions to contain a plasma generated by a capacitive discharge system including a showerhead 108 in cooperation with a grounded heater block 132. A high frequency (HF) radio frequency (RF) HFRF generator 102 and a low frequency (LF) radio frequency (RF) LFRF generator 104 are connected to a matching network 106 and the showerhead 108. The power and frequency provided by the matching network 106 may be sufficient to generate a plasma from process gases provided to the process chamber 136. For typical processes, the HFRF components may generally be between 5 MHz and 60 MHz (e.g., 13.56 MHz). For operation using LF components, the LF components may be between about 100 kHz and 2 MHz (e.g., 430 kHz).

[0033] Within the processing chamber 136, the pedestal 130 supports a substrate (e.g., wafer 128). The pedestal 130 includes a chuck, forks (not shown), or lift pins (not shown) for holding the wafer 128 and transferring the wafer 128 into and out of the processing chamber 136 during operation. The chuck may be an electrostatic chuck, a mechanical chuck, or various other types of chucks available for use and / or research in the industry.

[0034] Various gases may be introduced through the inlet 124. A number of source gas lines (e.g., gas line 118, gas line 120) are connected to the manifold 122. The gases may or may not be premixed. Corresponding valves and mass flow control mechanisms (e.g., valves 110, 116) may be used to ensure that the correct process gases are supplied during the deposition and plasma treatment stages of each operation in the process. If the chemical precursors are supplied in liquid form, liquid flow control mechanisms may be used. Such liquids may then be vaporized and mixed with the process gases during transport to the manifold, which is heated above the vaporization point of the chemical precursors supplied in liquid form, before reaching the processing chamber 136.

[0035] Dispenser 114 is connected to inlet 124. Dispenser 114 dispenses a chemical, such as TMA, zinc, magnesium, or fluorine, contained in a vial 126 coupled thereto. In an exemplary embodiment, the precursor in vial 126 contains a chemical (e.g., TMA) that coats the interior walls of processing chamber 136. These coatings prevent diffusion and / or release of substrate material (e.g., aluminum), prevent chemical erosion (e.g., fluorine), provide desired electrical properties, or repair damage to the surface (e.g., due to in-situ cleaning).

[0036] Process gases may exit the processing chamber 136 through the outlet 112. A vacuum pump 134 (e.g., a single-stage or two-stage mechanical dry pump and / or a turbomolecular pump) may be used to draw the process gases out of the processing chamber 136 and maintain a moderately low pressure within the processing chamber using a closed-loop controlled flow restriction device (not shown), such as a throttle valve or pendulum valve.

[0037] As noted above, the deposition techniques described herein may be performed in a multi-station or single-station tool. In some embodiments, a tool for processing 450 mm wafers may be used. In various embodiments, the wafer may be indexed for each deposition process, or after the etching step if the etching chamber or etching station is also part of the same tool, or if multiple depositions and processing are performed in a single station before indexing the wafer. In some embodiments, the wafer may be indexed after each layer is deposited (e.g., after an underlayer is deposited or after an atomically smooth layer is deposited).

[0038] In some embodiments, an apparatus configured to perform the techniques described herein may be provided. A suitable apparatus may include hardware for performing various process operations and a system controller 138 having instructions for controlling the process operations according to disclosed embodiments. The system controller 138 includes one or more memory devices and one or more processors communicatively coupled to various process control devices (e.g., valves, RF generators, wafer transport systems, etc.) and configured to execute instructions such that the apparatus performs the techniques according to disclosed embodiments. A machine-readable medium including instructions for controlling process operations according to the present disclosure may be coupled to the system controller 138. The system controller 138 may be communicatively coupled to various hardware devices (e.g., dispenser 114, mass flow controllers, valves, RF generators, vacuum pumps, etc.) to facilitate control of various process parameters associated with the deposition operations described herein.

[0039] In some embodiments, the system controller 138 controls all operations of the reactor system 100. The system controller 138 may execute system control software stored in a mass storage device, loaded into a memory device, and executed in a processor. Alternatively, the control logic may be hard-coded into the system controller 138. For these purposes, application specific integrated circuits, programmable logic devices (e.g., field programmable gate arrays (FPGAs)), and the like may be used. In the following description, where "software" or "code" is used, functionally equivalent hard-coded logic may be used. The system control software may include instructions for controlling the timing of dispensing chemicals from the vials 126, the timing of gas flows, wafer movement, activation of RF generators, and the like, as well as instructions for controlling the mixture of gases, chamber and / or station pressures, chamber and / or station temperatures, wafer temperatures, target power levels, RF power levels, substrate pedestal, chuck, and / or susceptor positions, and other parameters of a particular process being performed in the reactor system 100. The system control software may be configured in any suitable manner. For example, subroutines or control objects of the various process tool components may be written to control the operation of the process tool components necessary to perform the processes of the various process tools. The system control software may be coded in any suitable computer readable programming language.

[0040] The system controller 138 may typically include one or more memory devices and one or more processors configured to execute instructions such that the apparatus performs techniques according to the present disclosure. A machine-readable medium containing instructions for controlling process operations according to embodiments of the disclosure may be coupled to the system controller 138.

[0041] The methods and apparatus described herein may be used in conjunction with lithographic patterning tools or processes (such as those described below for the fabrication or manufacture of semiconductor devices, displays, LEDs, photovoltaic panels, etc.) Typically, although not necessarily, such tools / processes will be used or carried out together in a common fabrication facility. Lithographic patterning of films typically includes some or all of the following steps, each of which may be performed in a number of possible tools: (1) applying a photoresist to a workpiece (e.g., a substrate or a multilayer stack as provided in the disclosed embodiments) using a spin-on or spray-on tool; (2) curing the photoresist using a hotplate, furnace, or UV curing tool; (3) exposing the photoresist to visible, UV, or X-ray light using a tool such as a wafer stepper; (4) developing the resist to selectively remove the resist using a tool such as a wet bench, thereby patterning the resist; (5) transferring the resist pattern to an underlying film or workpiece, such as an amorphous carbon underlayer, using a dry etching tool or a plasma-assisted etching tool; and (6) removing the resist using a tool such as an RF or microwave plasma resist stripper.

[0042] 2 shows the location of a showerhead purge collar 206 according to some exemplary embodiments. Gases flow into the chamber through a central opening 208 in the showerhead purge collar 206. In some exemplary embodiments, a showerhead 108 on the chamber top wall 202 reinforces the top of the chamber, and gases enter the chamber through the showerhead 108. The chamber bottom wall 204 holds a pedestal 210 that supports a substrate during operation of the semiconductor manufacturing equipment.

[0043] The showerhead purge collar 206 surrounds a central opening 208, and an inert gas (e.g., nitrogen) flows through the showerhead purge collar 206 above the showerhead 108 toward its bottom, where it is dispensed in an annular shape around the top of the showerhead and delivered to the bottom of the chamber. The showerhead purge collar 206 has slots that allow the inert gas to flow into the chamber top wall 202.

[0044] The purpose of using a purge gas is to prevent gases exiting the showerhead (e.g., deposition-type gases) from depositing on or above the showerhead. Without a good purge, the gases can recirculate above the showerhead and form undesirable particle buildup on the showerhead.

[0045] During operation of the semiconductor manufacturing equipment, the showerhead 108 may not be perfectly parallel to the pedestal 210. This means that the surface of the showerhead may not be perfectly parallel to the substrate. There is a mechanism to adjust the surface of the showerhead 108 (e.g., adjust the showerhead in 1° increments) so that it is parallel to the pedestal 210. Additionally, the showerhead 108 may not be perfectly centered on the pedestal 210.

[0046] However, these adjustments will often cause the purge gas to flow unevenly across the substrate: the purge gas may be blocked on one side and have a different flow rate around the perimeter of the showerhead purge collar 206. These small adjustments can result in large changes in purge gas flow, creating low flow areas that are susceptible to deposition on the backside of the showerhead 108.

[0047] Experiments have shown that a 1° tilt of the showerhead 108 can more than double the flow rate in some parts of the chamber top wall 202 than in others, creating undesirable non-uniformities. Sometimes some parts of the showerhead can receive very little purge gas.

[0048] 3 is a diagram illustrating the flow rates around the showerhead and pedestal assembly, according to some example embodiments. Purge inlet 302 is the entry point where purge gas enters the showerhead purge collar 206. The purge gas exits the showerhead purge collar 206 through a slot in the side and circulates around the showerhead to a gas outlet 306 that is connected to a gas vacuum pump for exhausting the purge gas and process gases.

[0049] In some exemplary embodiments, there are two gas outlets 306 at either end of the bottom of the chamber 204 near the pedestal. Gases flowing out of the showerhead purge collar 206 near one outlet 306 have a direct path and flow smoothly, but gases flowing out of the outlet at the other end must flow around the bottom near the showerhead to one of the outlets 306. This long flow path can create a problem area where the gas flow can recirculate and cause deposition material to build up above the showerhead.

[0050] In some exemplary embodiments, a baffle plate (not shown) is used at the bottom of the chamber to improve omnidirectional flow and make the flow uniform. The baffle plate is placed below the pedestal.

[0051] 4 is a first configuration of a showerhead purge collar 206 according to some exemplary embodiments. The showerhead purge collar 206 is shown in FIGS. 2-3. Purge gas enters the showerhead purge collar 206 through inlets 302, flows down the showerhead purge collar 206, and exits through slots 402. In some exemplary embodiments, three rows of slots 402 are provided, with each row including four slots 402, although other embodiments may use a different number of rows and a different number of slots per row.

[0052] Process gases enter the showerhead purge collar 206 through a central opening 208 and flow down and out the bottom of the showerhead purge collar 206. Mounting holes 408 are used to attach a purge gas line. Three holes 410 on the top surface of the showerhead purge collar 206 are used to attach the showerhead purge collar 206 to an adjustment mechanism and a top plate.

[0053] 5 depicts deposition formation on a showerhead according to some example embodiments. FIG. 5 shows the left peripheral area of ​​the showerhead 108. After operation of the chamber, a buildup of deposition residue was found above the showerhead 108 and on the walls of the upper chamber wall 202. This is an indication that the upper chamber wall 202 is receiving precursors that recirculate, accumulate, and flake off and are transferred to the substrate surface.

[0054] The process gases are, in some examples, argon, oxygen, N at flow rates of 4,000–25,000 standard cubic centimeters per minute (SCCM). 2 O, and N 2 In some exemplary embodiments, the purge gas comprises one or more of 25000 SCCM N 2 However, other purge gases and other flow rates may be used.

[0055] One of the challenges of modifying the structure of the showerhead purge collar 206 is that users already have established deposition processes and do not want to redesign all of their processes. Also, users want a replacement part that fits into their existing configuration without costly chamber structure replacement operations. The goal is to modify the showerhead purge collar 206 so that it can be replaced without redesigning the chamber and improve purge gas flow.

[0056] 6 is a modified showerhead purge collar 602 according to some example embodiments. The showerhead purge collar 602 replaces the vent slots around the bottom with holes 608 located all along the side.

[0057] In some exemplary embodiments, there are four rows of holes 608, with each row having 12 holes evenly spaced around the circumference of the showerhead purge collar 602. That is, each hole is 30° apart from an adjacent hole in the same row. The 30° is measured from the center of the showerhead purge collar 602 when viewed from above. The holes in a row are vertically spaced apart between the holes in the rows above and below them. That is, the holes will be 15° apart when viewed from above.

[0058] Additionally, each hole 608 is a cylindrical hole that passes outward from the showerhead purge collar 602. However, the cylinder is angled downward and outward, such as -30°, when measured from a horizontal plane. Further details are provided with reference to FIG. 11 regarding the structure of holes 608.

[0059] In some exemplary embodiments, the holes 608 are 0.1 inches (2.54 mm) in diameter, although other embodiments may use other hole sizes. Additionally, the hole sizes may vary from row to row to control purge gas flow at different heights.

[0060] In another exemplary embodiment, each row had 18 holes and demonstrated adequate purge gas flow performance during experiments, however, increasing the number of holes increased manufacturing costs without significantly improving purge performance.

[0061] It should be noted that the embodiment shown in Figure 6 is an example and does not describe all possible embodiments. Other embodiments may use a different number of rows (e.g., 2-6 range or 1-10 range), a different number of holes per row (e.g., 4-50 range or 6-24 range), different hole sizes (e.g., 2mm-3mm range or 1mm-5mm range or 0.1mm-6mm range), and different hole angles (e.g., 0°-70° from horizontal). Thus, the embodiment shown in Figure 6 should not be construed as exclusive or limiting, but rather as illustrative.

[0062] The selection of the example configuration in Figure 6 is the result of testing and optimization carried out over several months to produce a suitable purge gas flow. For example, experiments showed that having different rows of holes arranged vertically produced poor purge gas flow.

[0063] In some exemplary embodiments, the showerhead purge collar 602 includes two portions, a bottom portion 702 and a top portion 902. Figure 7 is a detail of the bottom portion 702 of the showerhead purge collar 602 according to some exemplary embodiments. Figure 8 is a bottom view of the showerhead purge collar 602 according to some exemplary embodiments showing the dowel pin holes on the bottom surface of the top portion of the collar. Figure 9 is a perspective view of the top portion 902 of the showerhead purge collar 602 according to some exemplary embodiments.

[0064] The top 902 has the shape of a short hollow cylinder with a portion cut away by a straight cut. The resulting flat surface contains the purge inlet 302 and the purge gas line attachment holes. The bottom 702 is also a hollow cylinder and includes holes 608.

[0065] In some exemplary embodiments, the top 902 and bottom 702 are ceramic parts that combine to form the showerhead purge collar 602. The two parts are diffusion bonded to form a plenum for the purge gas, as shown in Figure 11. Because the parts are ceramic, adding more holes increases the cost of the manufacturing process.

[0066] In another exemplary embodiment, the showerhead purge collar 602 is 3D printed, so no bonding of ceramic parts is required.

[0067] 10 is a diagram of a showerhead purge collar 602, according to some example embodiments. FIG 10 shows how the holes are angled downward and positioned between the inner surface of the central hole and the exterior of the showerhead purge collar 602.

[0068] 11 shows a cross section of a showerhead purge collar 602 with some detailed interior geometry, according to some example embodiments. A plenum 604 is formed inside the showerhead purge collar 602 adjacent to the central opening 208 through which process gases flow. FIG. 11 also shows how the holes are angled downward (only a few holes are shown for simplicity).

[0069] Because the plenum 604 is inside the showerhead purge collar 602, tilting or centering the showerhead does not affect the purge gas flow, i.e., movement of the showerhead does not interrupt the purge gas flow.

[0070] Experiments have shown that angling the holes downwards allows the purge gas to flow at high velocity towards the ends of the showerhead, which is important for maintaining proper purging.

[0071] 12A-12D show experimental results of showerhead purge collar configurations according to some example embodiments. FIG. 1202 shows the N 2 The top view of the O mass fraction is shown. Different colors represent different N / O mass fractions in m / s. 2 This corresponds to the O mass fraction.

[0072] Region 1210 is a low N 2 Region 1212 shows high N 2 O mass fraction, indicating poor purging.

[0073] 12C also corresponds to the first showerhead purge collar 206, where region 1230 shows where the purge gas has a velocity of at least 1 m / s. Region 1232 can be seen to not have a purge gas flow of at least 1 m / s.

[0074] 12B and 12D correspond to an improved construction of the showerhead purge collar 602, which uses angled holes instead of horizontal slots. 2 The O mass fraction indicates that the purge gas is N despite the 1° inclination. 2 This means that the purging gas is working to prevent O from entering this region. Similarly, table 1208 shows a region 1240 surrounding the holes above the showerhead where the purge gas flows at 2 m / s or more.

[0075] 13 is a flowchart of a method for manufacturing a showerhead purge collar according to some example embodiments. Although the various operations of this flowchart are presented and described chronologically, one of ordinary skill in the art will appreciate that some or all of the operations may be performed in a different order, may be combined or omitted, or may be performed in parallel.

[0076] Operation 1302 is to fabricate a top portion from a ceramic material. The top portion has a hollow center for introducing process gases and an inlet for a purge gas on the side of the top portion.

[0077] The method moves from operation 1302 to operation 1304 for fabricating the base from a ceramic material. The base has a hollow center for introducing process gases toward the showerhead.

[0078] In operation 1306, holes are drilled in the bottom to exhaust purge gas above the showerhead. Other methods of hole formation are also possible.

[0079] From operation 1306, the method moves to operation 1308 where the top and bottom are joined. The bottom is concentric with the top, and a plenum for introducing a purge gas is defined within the showerhead purge collar.

[0080] In one example, a number of holes in the base extend in a row from a hollow center of the base to an outer surface of the base, the holes being oriented downward at an angle from the horizontal.

[0081] In one example, the holes have a diameter in the range of 2 mm to 3 mm, and in another example, the holes have a diameter in the range of 1 mm to 5 mm.

[0082] In one example, the holes are arranged in rows around the periphery of the base.

[0083] In one example, the holes in one row are equally spaced vertically between the holes in the row above or below.

[0084] In one example, each row includes a number of holes ranging from 6 to 24.

[0085] In one example, the plurality of rows includes four rows, each row including 12 holes.

[0086] In one example, the plurality of rows includes a number of rows ranging from 2 to 6.

[0087] In one example, the plurality of rows includes four rows of holes.

[0088] In one example, the top and bottom are ceramic.

[0089] Throughout this specification, examples may include components, operations, or structures that are described as one example. Although individual operations of one or more methods are depicted and described as separate operations, one or more of the individual operations may be performed simultaneously, and the operations need not be performed in the order illustrated. Structures and functions presented as separate components in an example configuration may be implemented as a unitary structure or component. Similarly, structures and functions presented as a single component may be implemented as separate components. These and other variations, modifications, additions, and improvements fall within the scope of the subject matter of this specification.

[0090] The embodiments described herein are described in sufficient detail to enable those skilled in the art to practice the teachings of the disclosure. Other embodiments may be used and derived therefrom, such that structural and logical substitutions and changes may be made without departing from the scope of the disclosure. Thus, the detailed description should not be construed as limiting, and the scope of the various embodiments is defined only by the appended claims, and the full scope of equivalents to which such claims are entitled.

[0091] The term "or" as used herein may be interpreted in either an inclusive or exclusive sense. Also, multiple examples may be provided for a resource, operation, or structure described herein as a single example. Moreover, the boundaries between various resources, operations, modules, engines, and data stores are somewhat arbitrary, and specific operations are described in specific example configurations. Other allocation functions are contemplated and may fall within the scope of various embodiments of the disclosure. In general, structures and functions presented as separate resources in an example configuration may be implemented as an integral structure or combined resources. Similarly, structures and functions presented as a single resource may be implemented as separate resources. These and other variations, modifications, additions, and improvements fall within the scope of the embodiments of the disclosure as represented by the appended claims. Accordingly, the specification and drawings should be regarded as illustrative rather than restrictive. The present disclosure includes the following application examples: [Application example 1] 1. A shower head purge collar, comprising: a hollow central section for introducing process gases and a top section having an inlet on the side for purging gases; a bottom coupled to the top and concentric with the top, the bottom having a hollow center for introducing the process gas toward a showerhead, a plenum for introducing the purge gas being defined within the showerhead purge collar, the bottom including a plurality of holes for exhausting the purge gas above the showerhead; Equipped with a shower head purge collar. [Application example 2] 10. The showerhead purge collar of claim 1, the plurality of holes in the base extend in a row from the hollow center of the base to an outer surface of the base, the row of holes extending at an angle oriented downward from a horizontal plane defined by a surface of the showerhead through which the process gases enter a chamber. [Application example 3] 3. The showerhead purge collar of claim 2, The showerhead purge collar, wherein the holes have a diameter in the range of 2 mm to 3 mm. [Application example 4] 3. The showerhead purge collar of claim 2, The showerhead purge collar, wherein the holes have a diameter in the range of 1 mm to 5 mm. [Application example 5] 10. The showerhead purge collar of claim 1, The plurality of holes are arranged in a plurality of rows around the periphery of the base. [Application Example 6] 6. The showerhead purge collar of claim 5, The showerhead purge collar, wherein the holes in one row are equally spaced vertically between the holes in the row above or below. [Application Example 7] 6. The showerhead purge collar of claim 5, A showerhead purge collar, wherein each row of the plurality of rows includes a plurality of holes ranging from 6 to 24. [Application Example 8] 6. The showerhead purge collar of claim 5, The showerhead purge collar, wherein the plurality of rows includes four rows, each row including 12 holes. [Application Example 9] 6. The showerhead purge collar of claim 5, The showerhead purge collar, wherein the plurality of rows comprises a plurality of rows ranging from 2 to 6. [Example 10] 6. The showerhead purge collar of claim 5, The showerhead purge collar, wherein the plurality of rows includes four rows of holes. [Application Example 11] 10. The showerhead purge collar of claim 1, The showerhead purge collar, wherein the top and bottom portions comprise a ceramic material. [Application Example 12] 1. A method for manufacturing a showerhead purge collar, comprising: fabricating a top portion from a ceramic material, said top portion having a hollow center for introducing process gases and an inlet for a purge gas on a side of said top portion; fabricating a base from the ceramic material, the base having a hollow center for introducing the process gas toward the showerhead; drilling a plurality of holes in the bottom for exhausting the purge gas above the showerhead; joining the top and bottom sections, the bottom section being concentric with the top section, and a plenum for introducing the purge gas is defined within the showerhead purge collar; A method comprising: [Application Example 13] 13. The method of claim 12, wherein the plurality of holes in the base extend in a row from the hollow center of the base to an outer surface of the base, the plurality of holes being oriented downward at an angle from a horizontal plane. [Example 14] 13. The method of claim 12, The plurality of holes have a diameter in the range of 2 mm to 3 mm. [Example 15] 13. The method of claim 12, The method, wherein the plurality of holes are arranged in a plurality of rows around a periphery of the base. [Example 16] 16. The method of claim 15, The method wherein the holes in one row are equally spaced vertically between the holes in the row above or below. [Application Example 17] 16. The method of claim 15, Each row includes a plurality of holes ranging from 6 to 24. [Example 18] 16. The method of claim 15, The method, wherein the plurality of rows includes four rows, each row including 12 holes. [Example 19] 16. The method of claim 15, The method, wherein the plurality of rows comprises a plurality of rows ranging from 2 to 6. [Example 20] 16. The method of claim 15, The method, wherein the plurality of rows comprises four rows of holes.

Claims

1. 1. A shower head purge collar, comprising: a top portion having a hollow central portion for introducing a process gas and an inlet for a purge gas in a side of the top portion; a bottom coupled to the top and concentric with the top, the bottom having a hollow center for introducing the process gas toward a showerhead, a plenum for introducing the purge gas being defined within the showerhead purge collar, the bottom including a plurality of holes for exhausting the purge gas above the showerhead; Equipped with the plurality of holes in the base extend in a row from the hollow center of the base to an outer surface of the base, the row of holes extending at an angle oriented downward from a horizontal plane defined by a surface of the showerhead through which the process gases enter a chamber.

2. 10. The showerhead purge collar of claim 1, The plurality of holes have a diameter in the range of 2 mm to 3 mm.

3. 10. The showerhead purge collar of claim 1, The plurality of holes have a diameter in the range of 1 mm to 5 mm.

4. 10. The showerhead purge collar of claim 1, The plurality of holes are arranged in a plurality of rows around the periphery of the base.

5. 5. The showerhead purge collar of claim 4, The holes in one row are equally spaced vertically between the holes in the row above or below.

6. 5. The showerhead purge collar of claim 4, A showerhead purge collar, wherein each row of the plurality of rows includes a plurality of holes ranging from 6 to 24.

7. 5. The showerhead purge collar of claim 4, The showerhead purge collar, wherein the plurality of rows includes four rows, each row including twelve holes.

8. 5. The showerhead purge collar of claim 4, The showerhead purge collar, wherein the plurality of rows comprises a plurality of rows ranging from 2 to 6.

9. 5. The showerhead purge collar of claim 4, The showerhead purge collar, wherein the plurality of rows includes four rows of holes.

10. 10. The showerhead purge collar of claim 1, The showerhead purge collar, wherein the top and bottom portions comprise a ceramic material.

11. 1. A method for manufacturing a showerhead purge collar, comprising: fabricating a top portion from a ceramic material, said top portion having a hollow center for introducing process gases and an inlet for a purge gas on a side of said top portion; fabricating a base from the ceramic material, the base having a hollow center for introducing the process gas toward the showerhead; drilling a plurality of holes in the bottom for exhausting the purge gas above the showerhead; joining the top and bottom sections, the bottom section being concentric with the top section, and a plenum for introducing the purge gas is defined within the showerhead purge collar; Including, wherein the plurality of holes in the base extend in a row from the hollow center of the base to an outer surface of the base, the plurality of holes being oriented downward at an angle from a horizontal plane.

12. 12. The method of claim 11, The method, wherein the plurality of holes have a diameter in the range of 2 mm to 3 mm.

13. 12. The method of claim 11, The method, wherein the plurality of holes are arranged in a plurality of rows around a periphery of the base.

14. 14. The method of claim 13, The method wherein the holes in one row are equally spaced vertically between the holes in the row above or below.

15. 14. The method of claim 13, Each row includes a plurality of holes ranging from 6 to 24.

16. 14. The method of claim 13, The method, wherein the plurality of rows includes four rows, each row including 12 holes.

17. 14. The method of claim 13, The method, wherein the plurality of rows comprises a plurality of rows in the range of 2 to 6.

18. 14. The method of claim 13, The method, wherein the plurality of rows comprises four rows of holes.

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