Method and test device for detecting wear of an electronic component unit

Abstract

The invention relates to a method for detecting wear in an electronic component (2), in particular in a power electronic system having at least one electronic component (12), in particular a semiconductor component such as a capacitor, in which the component (2) is subjected to a test process in which at least two predeterminable electrical duty cycles are applied to the component (2), operating the component (2) for a predetermined period of time to simulate in each case at least one selected operating mode. [Solution] During a testing process of a component unit (2), electromagnetic waves (6) generated by an electrical load resulting from the application of at least two load cycles to the component unit (2) are detected for at least two of the load cycles, and the detected electromagnetic waves (6) of the at least two load cycles are compared with each other to detect wear of the component unit (2).

Claims

1. A method for detecting wear of an electronic component unit (2), wherein the component unit (2) is subjected to a test process, and in the test process, at least two predefined electrical load cycles are applied to the component unit (2) to operate the component unit (2) for a predetermined period of time to simulate at least one selected operating mode each time. In the method, during the test process of the component unit (2), electromagnetic waves (6) generated by the electrical load resulting from the application of the at least two load cycles to the component unit (2) are detected for at least two of the load cycles, and the detected electromagnetic waves (6) of the at least two load cycles are compared with each other to detect wear of the component unit (2). A method characterized in that the electromagnetic spectrum of each load cycle is detected from the electromagnetic waves (6) of the at least two load cycles, and the detected spectra are compared with each other to detect wear.

2. A method for detecting wear of an electronic component unit (2), wherein the component unit (2) is subjected to a test process, and in the test process, at least two predefined electrical load cycles are applied to the component unit (2) to operate the component unit (2) for a predetermined period of time to simulate at least one selected operating mode each time. In the method, during the test process of the component unit (2), electromagnetic waves (6) generated by the electrical load resulting from the application of the at least two load cycles to the component unit (2) are detected for at least two of the load cycles, and the detected electromagnetic waves (6) of the at least two load cycles are compared with each other to detect wear of the component unit (2). A method characterized in that at least one of the detected spectra is compared with a reference spectrum.

3. The method according to claim 2, characterized in that at least one first load cycle of the test process is executed as a reference cycle for detecting the reference spectrum. **Claim 4**: The method according to claim 3, characterized in that a plurality of reference cycles are sequentially executed, and in this case, an average reference spectrum to be compared with the detected spectrum is detected from the detected reference spectra. **Claim 5**: The method according to claim 1, characterized in that the load cycle is specified to operate the component unit (2) in a full load operation. **Claim 6**: The method according to claim 1, characterized in that the load cycle is set to operate the component unit (2) in a partial load operation, and the electrical load is specified to correspond to less than 70% of the electrical load in the full load operation. **Claim 7**: A method for detecting wear of an electronic component unit (2), wherein the component unit (2) is subjected to a test process, and in the test process, at least two predetermined electrical load cycles for operating the component unit (2) for a predetermined period to simulate at least one selected operation mode each time are applied to the component unit (2). In the method, during the test process of the component unit (2), electromagnetic waves (6) generated by the electrical load resulting from applying the at least two load cycles to the component unit (2) are detected for at least two of the load cycles, and the detected electromagnetic waves (6) of the at least two load cycles are compared with each other to detect wear of the component unit (2). The method, characterized in that the electromagnetic waves (6) are directly detected by a measuring device (5) at at least one electrical wiring (8) of the component unit (2). **Claim 8**: The method according to claim 1, characterized in that the electromagnetic waves (6) are detected by an antenna device (9) arranged spaced apart from the component unit (2).

9. A test device (1) for detecting wear of an electronic component unit (2), comprising at least one device (3) for applying at least two predefined electrical load cycles to the component unit (2), at least one measuring device (5) for detecting electromagnetic waves (6) of the component unit (2) generated by the at least two load cycles, and at least one controller (10) for controlling the test device (1) and evaluating the electromagnetic waves (6) detected by the measuring device (5). In the test device, the controller (10) is set to execute the method according to claim 1.

10. The test device according to claim 9, characterized in that the measuring device (5) has an antenna device (9) that can be directly conductively connected to or is conductively connected to the component unit (2) and / or can be or is arranged spaced apart from the component unit (2).

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