Auto-sampler rail system with magnetic coupling for linear motion

Abstract

Systems and methods are described for preventing the release of metal particles from an autosampler that may be detected in a sample during sample analysis. In an embodiment, the autosampler system includes, but is not limited to, a sample probe support structure, a z-axis support, an outer shuttle coupled to an outer surface of the z-axis support, and an inner shuttle capable of linear motion within an interior volume of the z-axis support. The inner and outer shuttles are magnetically coupled to translate linear motion of the inner shuttle to the outer shuttle.

Description

Technical Field

[0001] (Cross - Reference to Related Applications) This application claims priority based on U.S. Provisional Patent Application No. 62 / 992,334, filed on March 20, 2020, entitled "Autosampler Rail System with Magnetic Coupling for Linear Motion". The content of U.S. Provisional Application No. 62 / 992,334 is incorporated herein by reference.

Background Art

[0002] In many laboratory environments, it may be necessary to analyze a large number of chemical or biochemical samples in individual sample containers. To streamline such processes, the handling of samples has been mechanized. Such mechanized sampling is generally referred to as autosampling and is performed using an automated sampling device or autosampler.

Summary of the Invention

[0003] An autosampler system is described that prevents the release of metal particles from the autosampler that could potentially be detected within a sample during sample analysis. Embodiments of the system include, but are not limited to, a sample probe support structure configured to hold a sample probe and transfer a fluid sample through the sample probe, a z - axis support coupled to the sample probe support structure, an outer shuttle coupled to the outer surface of the z - axis support and coupled to the sample probe support structure, and an inner shuttle linearly movable within the internal volume of the z - axis support, where the inner shuttle is magnetically coupled to the outer shuttle to convert the linear motion of the inner shuttle into linear motion of the outer shuttle to provide linear motion of the sample probe support structure.

[0004] In one aspect, an autosampler system includes, but is not limited to, a sample probe support structure configured to hold a sample probe and transfer a fluid sample through the sample probe, a z-axis support coupled to the sample probe support structure, an outer shuttle coupled to the z-axis support and to the sample probe support structure and including at least a first magnet, and an inner shuttle linearly movable within an inner volume of the z-axis support. The inner shuttle includes at least a second magnet, and the inner shuttle is magnetically coupled to the outer shuttle via a magnetic interaction between the first magnet and the second magnet to convert the linear motion of the inner shuttle into the linear motion of the outer shuttle to provide the linear motion of the sample probe support structure. The z-axis support includes a tube having a portion disposed between the outer shuttle and the inner shuttle, and the tube defines an inner volume through which the inner shuttle passes during linear motion.

[0005] This summary is provided to introduce a selection of concepts in a simplified form that are further described in the detailed description below. This summary is not intended to identify key features or essential features of the claimed subject matter, nor is it intended to be used as an aid in determining the scope of the claimed subject matter.

[0006] Details are set forth in the accompanying drawings, which are to be regarded in an illustrative sense only and not as restrictive. In the different illustrative examples in the description and the drawings, the same reference numerals may be used to indicate similar or identical items.

Brief Description of the Drawings

[0007]

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DETAILED DESCRIPTION OF THE INVENTION

[0008] An automatic sampling device or autosampler supports a sample probe with respect to a vertical rod and moves the sample probe along one or more moving directions or across one or more moving directions. For example, the sample probe is coupled to the vertically movable portion of the rod by a probe support arm or other device to move the probe vertically, whereby the probe can enter and exit a sample container (e.g., a tube or other container), a rinse container, a standard chemical container, a diluent container, etc. on the autosampler deck. In other situations, the rod can be rotated to facilitate the movement of the probe around the horizontal plane, whereby the probe can be placed on other sample containers and other containers arranged on the deck.

[0009] The autosampler can include metallic mechanical or structural parts that move relative to each other to facilitate one or more movements of the probe. When the parts begin to wear (e.g., due to repeated interactions based on friction), metal particles may be released into the autosampler deck or into containers arranged around the probe arm. For example, the metal particles may directly adhere to a sample container, a probe, or other containers used in the sample preparation process (e.g., a rinse container, a standard chemical container, a diluent container, etc.), whereby contaminants are introduced into the sample or other fluids. Such contaminants can be detected by analytical instruments, and with respect to the contents of the fluid introduced for analysis by the probe, the analysis measurements of the sample and other fluids may be distorted by providing untrustworthy or inaccurate data. Further, the metallic mechanical or structural parts may be exposed to strong chemicals present on the autosampler deck, such as corrosive acids, etc., whereby the release of metal particles may be promoted through the normal operation of the autosampler.

[0010] Accordingly, a system and method are disclosed for preventing the release of metal particles that may be detected within a sample from an autosampler during sample analysis. In one aspect, the system includes an inner shuttle that is magnetically coupled to an outer shuttle and configured to support a sample probe. To prevent metallic features from being exposed to the external environment during the operation of the autosampler, the inner shuttle is formed of or encapsulated within a tube formed or coated with a chemically inert material (e.g., fluoropolymer). The outer shuttle is formed of or coated with a chemically inert material (e.g., fluoropolymer). The inner shuttle moves within the tube, and its movement is translated to the outer shuttle via a magnetic coupling and then to a probe support structure. In embodiments, the tube defines surface features (e.g., splines) on the outer surface of the tube, and the outer shuttle has corresponding features on the inner surface. The interaction of the surface features of the tube and the outer shuttle translates the rotational movement of the tube to the outer shuttle and then that rotational movement to the probe support structure. The autosampler can facilitate multiple planes of motion of the sample probe such that there is no risk of metal particles being exposed to sample containers or other containers located on the deck of the autosampler.

[0011] (Example) Referring to FIGS. 1A through 8, an autosampler probe rail system ("System 100") for preventing the release of metal particles that may be detected within a sample during sample analysis from an autosampler is shown, which relates to an exemplary embodiment of the present disclosure. System 100 generally includes a probe support arm 102, an outer shuttle 104, an inner shuttle 106, and a z-axis support 108. One or more portions of System 100 are formed or coated with a chemically inert material to prevent the metal components of the system from being exposed to the external environment of 100, thereby preventing metal contaminants from mixing into the sample container or other liquid containers adjacent to the autosampler. In an embodiment, each of the probe support arm 102, the outer shuttle 104, and the z-axis support is formed or coated with a structure of a chemically inert material, such as a fluoropolymer such as polytetrafluoroethylene (PTFE). In an embodiment, all outer surfaces of System 100 include a chemically inert material, thereby preventing corrosion of System 100 or damage to other materials of System 100 when exposed to samples present on the deck or when exposed to the external environment.

[0012] The probe support arm 102 includes a probe support 110, which holds a sample probe and associated tubes for withdrawing fluid from, or introducing fluid into, a sample container disposed adjacent to the system 100, for example, on the deck of an autosampler system. The probe support arm 102 is coupled to the outer shuttle 104 via, for example, a friction fit interlock or a snap fit. At the coupling location, each of the probe support arm 102 and the outer shuttle 104 defines an opening, within which the upper portion 112 of the z-axis support 108 fits to couple the probe support arm 102 and the outer shuttle 104 to the z-axis support 108. For example, the upper portion 112 of the z-axis support 108 has a generally circular shape corresponding to the generally circular openings in each of the probe support arm 102 and the outer shuttle 104. Although a generally circular shape is shown, other shapes including, but not limited to, rectangular, triangular, irregular shapes, etc. can also be utilized in the system 100. The probe support arm 102 can be held in place with respect to the z-axis support 108 via a friction fit between the respective structures and a magnetic coupling between the outer shuttle 104 and an inner shuttle 106 disposed within the z-axis support. In an embodiment, the probe support arm 102 and the outer shuttle 104, or portions thereof, can be formed as an integral structure.

[0013] The system 100 controls the positioning of the sample probe held by the probe support arm 102 by controlling the positioning of the outer shuttle 104 and the rotation of the z-axis support 108. For example, FIG. 1B shows the movement of the outer shuttle 104 along the z-axis support 108 (e.g., along the z-axis 114), which moves the probe support arm 102 via the interaction between the outer shuttle 104 and the inner shuttle 106. FIG. 1C shows the rotational movement of the probe support arm 102 due to the rotation of the z-axis support 108, which is further described herein.

[0014] Referring to FIG. 2, a cross-section of the system 100 according to an embodiment of the present disclosure is shown. The z-axis support 108 is shown to have an outer tube 200 that defines an internal volume 202, and the inner shuttle 106 is configured to pass through the internal volume 202 and affect the vertical movement of the outer shuttle 104. The system 100 can move the inner shuttle 106 within the tube 200 through various mechanisms. These various mechanisms include, but are not limited to, a linear actuator (e.g., a pneumatic actuator) with a push rod, a spline screw rail, or a combination thereof. In the illustrated embodiment, the system 100 has a spline screw rail 204 (e.g., as shown in FIGS. 2 to 5). The spline screw rail 204 includes a screw 206 disposed along the z-axis 114, and a structural rail 208 is disposed around a portion of the screw 206. The structural rail 208 is fixedly attached to the base, and the screw 206 is rotatably coupled within the tube 200. For example, the system 100 can include a first drive device (e.g., the pulley drive device 500 shown in FIG. 5) that generates a rotational movement of the screw 206 within the tube 200. The inner shuttle 106 includes threads corresponding to the inner surface of the inner shuttle 106 so as to mesh with the threads of the screw 206. When the screw 206 is rotationally driven, the inner shuttle 106 moves vertically along the z-axis 114 within the tube 200 (e.g., through the internal volume 202) via the interaction between the respective threads. Alternatively or additionally, the system 100 includes a pneumatic actuator that vertically presses the inner shuttle 106 within the internal volume 202. In an embodiment, the inner shuttle 106 defines one or more openings corresponding to the shape of the structural rail 208, such that when the inner shuttle 106 moves within the tube 200, the structural rail 208 passes through the openings of the inner shuttle 106. For example, in the exemplary embodiment shown in FIG. 3, the inner shuttle 106 has a "C"-shaped opening that conforms to the "C"-shaped structural rail 208.

[0015] Each of the outer shuttle 104 and the inner shuttle 106 includes one or more magnets that magnetically couple with the respective shuttle, such that when the inner shuttle 106 is driven along the z-axis 114 (e.g., via the operation of the spline screw rail 204 and the first drive device, or the operation of a pneumatic actuator, etc.), the outer shuttle 104 will move vertically correspondingly along the outer surface of the z-axis support 108. For example, the inner shuttle 106 is shown to have two magnets 210 disposed within the outer structure 212 of the inner shuttle 106. The outer structure 212 includes, but is not limited to, a polyvinylidene difluoride (PVDF) material that covers around the body structure 214 of the inner shuttle 106. In an embodiment, the body structure 214 defines corresponding threads to mate with the threads of the screw 206. The magnets 210 are shown to have a circular or annular shape with an opening in the center, and the structure of the spline screw rail 204 can pass through the magnets 210. For example, the magnets 210 surround the z-axis 114, and the spline screw rail 204 passes through the opening of the magnets 210. The inner shuttle 106 is shown such that a spacer structure 216 is disposed between the two magnets 210. The outer structure 212 and the body structure 214 can press each magnet 210 against the spacer structure 216 to control the separation between the magnets 210. Thereby, during the operation of the system 100, a substantially uniform distance between the magnets 210 is maintained. The magnets 210 are aligned such that the same poles face each other (e.g., the same poles interface with the spacer structure 216). For example, as shown in FIG. 2, the N poles of each magnet 210 face each other, with the spacer structure 216 disposed therebetween, and the S poles are oriented away from each other. Alternatively, the S poles of the magnets 210 may face each other, and the N poles may be oriented away from each other.

[0016] The outer shuttle 104 includes corresponding magnets that interact with the magnets 210 of the inner shuttle 106. For example, the outer shuttle 104 is shown to have two corresponding magnets 218 held within a body structure 220. Similar to the inner shuttle 106, the outer shuttle 104 can include a spacer structure 222 disposed between the magnets 218 within the body structure 220. In an embodiment, the body structure 220 includes an upper portion 224 coupled to a bottom portion 226, and a cavity for accommodating the magnets 218 and the spacer structure 222 is defined between the upper portion 224 and the bottom portion 226. The upper portion 224 and the bottom portion 226 can be fixed together to position the magnets 218 facing the spacer structure 222. The two magnets 218 are aligned such that the same poles face each other, and the magnets 218 are arranged such that the poles opposite to those of the adjacent magnets 210 of the inner shuttle 106 face each other. For example, as shown in FIG. 2, the N pole of the magnet 218 faces the S pole of the magnet 210 (e.g., with the tube 200 disposed therebetween), and the S pole of the magnet 218 faces the N pole of the magnet 210 (e.g., with the tube 200 disposed therebetween). By having opposite poles facing each other, the magnetic field couples the inner shuttle 106 to the outer shuttle 104 such that linear movement of the inner shuttle 106 causes corresponding linear movement of the outer shuttle 104. The system 100 is shown with each of the outer shuttle 104 and the inner shuttle 106 having two magnets, but the system 100 is not limited to having two magnets, and each shuttle can include fewer or more magnets (e.g., depending on the desired attractive force between the respective shuttles).

[0017] In an implementation, the tube 200 defines surface features on the outer surface of the tube 200 to facilitate the rotational movement of the outer shuttle 104 when the tube 200 rotates. For example, the tube 200 is shown as having a plurality of splines 300 longitudinally oriented along the outer surface of the tube 200. The outer shuttle 104 includes corresponding features on its inner surface, and the corresponding features can interact with the surface features of the tube 200. For example, the outer shuttle 104 has corresponding splines 302 that can engage with the gaps between the splines 300 of the tube 200. The surface features of the tube 200 and the outer shuttle 104 interact to convert the rotational movement of the tube 200 to the outer shuttle 104, and the rotational movement is further converted to the probe support structure 102 to rotate the probe support structure 102 about the z-axis 114. In an embodiment, the tube 200 is rotated by the operation of a second drive device (e.g., the pulley drive device 502 shown in FIG. 5) that generates the rotational movement of the tube 200. For example, the system 100 can include a bushing 504 coupled between a fixed drive base 506 and a rotary drive structure 508. The rotary drive structure 508 is coupled to the pulley drive device 502, and when the pulley drive device 502 operates, the rotary drive structure 508 rotates around the z-axis 114. The tube 200 is coupled to the rotary drive structure 508 and rotates correspondingly when the pulley drive device 502 operates. Then, the rotation of the tube 200 rotates the outer shuttle 104 and the probe support structure 102 through the interaction of corresponding surface features (e.g., splines 300 and splines 302).

[0018] The outer shuttle 104 can be attached to the z-axis support 108 by arranging the body structure 220 adjacent to the upper part 112 of the z-axis support 108. The end 228 of the body structure 220 that houses the magnet 218 is arranged to correspond to the end 230 of the body structure 214 that houses the magnet 210, enabling the magnetic coupling of the respective shuttles by allowing interaction between the respective magnetic fields of the inner shuttle 106 and the outer shuttle 104. When the outer shuttle 104 is positioned downward along the z-axis support 108 until the magnet 218 is coupled to the magnet 210, the surface features of the outer shuttle 104 and the tube 200 (e.g., the respective splines 302 and 300) can slide adjacent to each other. In practice, the system 100 includes a key structure that aligns the probe support structure 102 in a predetermined direction when the probe support structure 102 is attached to the z-axis support 108, thereby providing a specific position of the probe held by the probe support structure 102 as indicated by the rotation of the tube 200. For example, FIG. 6 shows a tube 200 that defines a key structure 600 (e.g., a spline having a larger cross-section than other splines 300). The outer shuttle 104 defines a corresponding key structure 602 (e.g., an opening for receiving the key structure 600). The probe support structure 102 and the outer shuttle 104 can also include corresponding key structures to provide a desired orientation of the probe support structure 102 with respect to the tube 200. For example, the outer shuttle 104 is shown to include a key structure 604, and the probe support structure 102 includes a corresponding key structure 606 (e.g., an opening for receiving the key structure 604). In practice, the probe support structure 102 is removably coupled to the outer shuttle 104. This allows different probe support structures 102 to be coupled to the outer shuttle 104. Alternatively or additionally, different outer shuttles can be arranged on the z-axis support 108 to apply different styles of probe support structures to the z-axis support (e.g., facilitating the application of septum-penetrating probes, etc.).

[0019] The probe support structure 102 and the outer shuttle 104 can include a locking structure for fixing the probe support structure 102 to the outer shuttle 104. For example, the outer shuttle 104 shown in FIG. 8 defines a groove 800 in the outer surface 802 of the body structure 220. The groove 800 is sized and dimensioned to receive a protrusion 804 provided on the inner surface 806 of the probe support structure 102 (shown, for example, in FIG. 7). Alternatively or additionally, the probe support structure 102 can define a groove and corresponding protrusions can be provided on the outer shuttle 104. When attaching the probe support structure 102 to the outer shuttle 104, the protrusion 804 engages the groove 800, providing a lock-fit arrangement between the probe support structure 102 and the outer shuttle 104 to securely hold the probe support structure 102 against the outer shuttle 104 and the z-axis support 108. For example, the mere frictional fit between the probe support structure 102 and the outer shuttle 104 giving way to vertical forces, causing the probe support structure 102 to become detached from the outer shuttle 104, can be prevented by the interaction between the groove 800 and the protrusion 804.

[0020] In an embodiment, the outer shuttle 104 can define segments at the upper portion of the outer shuttle 104 to receive the probe support structure 102. The probe support structure 102 can push on the segments, thereby providing a conforming fixation of the z-axis support 108 facing the tube 200 and providing a secure fixation between the outer shuttle 104 and the z-axis support 108. For example, the outer shuttle 104 shown in FIG. 8 includes a plurality of vertical cuts 808 passing through the upper portion 810 of the outer shuttle 104, and the upper portion 810 is divided into a plurality of segments 812. When the probe support structure 102 is introduced into the outer shuttle 104, the probe support structure 102 can apply an inward force to the segments 812. This can press against the z-axis support (e.g., against the spline 300) to fix the outer shuttle 104 in place. FIG. 8 shows the upper portion 810 divided into four segments 812, but the present disclosure is not limited to such a configuration. For example, the upper portion 810 can be divided into less than four segments 812, more than four segments 812, segments 812 of equal size, segments 812 of unequal size, etc.

[0021] (Conclusion) The subject matter has been described in terms of specific terms of structural features and / or process operations, but it should be understood that the subject matter defined in the appended claims is not necessarily limited to the specific features or operations described above. Rather, the above specific features and operations are disclosed as exemplary forms of implementing the claims.

Claims

1. A sample probe support structure configured to hold a sample probe and transfer a fluid sample through the sample probe, a z-axis support coupled to the sample probe support structure, an outer shuttle coupled to an outer surface of the z-axis support and to the sample probe support structure, an inner shuttle linearly movable within an internal volume of the z-axis support, comprising: The inner shuttle is magnetically coupled to the outer shuttle, and converts the linear motion of the inner shuttle to the outer shuttle to provide linear motion of the sample probe support structure. An autosampler system.

2. The z-axis support, includes a tube extending along the z-axis support and defining the internal volume, The tube includes a portion disposed between the outer shuttle and the inner shuttle. The autosampler system according to claim 1.

3. The tube defines one or more surface features on an outer surface of the tube, The outer shuttle defines one or more corresponding surface features on an inner surface of the outer shuttle, such that rotational movement of the tube is converted to the outer shuttle through interaction between the one or more surface features and the one or more corresponding surface features. The autosampler system according to claim 2.

4. One or more of the surface features include one or more splines. The autosampler system according to claim 3.

5. Further comprising a drive system coupled to the tube, The drive system provides rotational movement of the tube when the drive system is actuated. The autosampler system according to claim 3.

6. Further comprising a second drive system coupled to the inner shuttle to provide the linear motion of the inner shuttle within the internal volume of the tube. The autosampler system according to claim 5.

7. Further comprising a drive system coupled to the inner shuttle to provide the linear motion of the inner shuttle within the internal volume of the tube. The autosampler system according to claim 2.

8. The inner shuttle includes one or more magnets housed within an outer structure of the inner shuttle, The outer shuttle includes one or more magnets housed within a body structure of the outer shuttle. One or more of the magnets of the inner shuttle and one or more of the magnets of the outer shuttle are magnetically coupled. The autosampler system according to claim 1.

9. One or more of the magnets of the inner shuttle include a first magnet vertically spaced from a second magnet via a spacer structure. The autosampler system according to claim 8.

10. A first pole of the first magnet and a first pole of the second magnet are each arranged to face the spacer structure. The first pole of the first magnet and the first pole of the second magnet are the same magnetic pole. The autosampler system according to claim 9.

11. One or more of the magnets of the outer shuttle include a first magnet vertically spaced from a second magnet via a second spacer structure. The autosampler system according to claim 9.

12. A first pole of the first magnet of the outer shuttle and a first pole of the second magnet of the outer shuttle are each arranged to face the second spacer structure. The first pole of the first magnet of the outer shuttle and the first pole of the second magnet of the outer shuttle are the same magnetic pole. The autosampler system according to claim 11.

13. At least a part of each of the z-axis support, the outer shuttle, and the sample probe support structure includes a chemically inert material. The autosampler system according to claim 1.

14. The outer surface of the z-axis support defines a key structure. The key structure is configured to engage with a corresponding key structure disposed on the inner surface of the outer shuttle. The autosampler system according to claim 1.

15. The outer shuttle defines a second key structure disposed on the outer surface of the outer shuttle. The second key structure is configured to align the orientation of the sample probe support structure with respect to the outer shuttle by engaging with a corresponding second key structure disposed on the sample probe support structure. The autosampler system according to claim 14.

16. The outer shuttle defines at least two segments disposed at the upper part of the outer shuttle. The sample probe support structure provides an inward force against at least two of the segments to press at least two of the segments against the z-axis support. The autosampler system according to claim 1.

17. The outer shuttle defines a groove on the outer surface of the outer shuttle, The sample probe support structure defines a protrusion on the inner surface of the sample probe support structure, The protrusion is configured to be introduced into the groove, The autosampler system according to claim 1.

18. A sample probe support structure configured to hold a sample probe and transfer a fluid sample through the sample probe; A z-axis support coupled to the sample probe support structure; An outer shuttle coupled to the outer surface of the z-axis support and coupled to the sample probe support structure, the outer shuttle including at least a first magnet; An inner shuttle linearly movable within the internal volume of the z-axis support, the inner shuttle including at least a second magnet; Comprising The inner shuttle is magnetically coupled to the outer shuttle via magnetic interaction between the first magnet and the second magnet, and converts the linear motion of the inner shuttle into the outer shuttle to provide linear motion of the sample probe support structure. The z-axis support includes a tube having a portion disposed between the outer shuttle and the inner shuttle, the tube defining the internal volume through which the inner shuttle passes during the linear motion. Autosampler system.

19. The tube defines one or more surface features on the outer surface of the tube, and the outer shuttle defines one or more corresponding surface features on the inner surface of the outer shuttle, The rotational motion of the tube is converted into the outer shuttle via the interaction between one or more of the surface features and one or more of the corresponding surface features. The autosampler system according to claim 18.

20. Further comprising a first drive system coupled to the inner shuttle to provide the linear motion of the inner shuttle within the internal volume of the tube. The autosampler system according to claim 19.

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