MEASUREMENT DEVICE CONTROL METHOD AND MEASUREMENT DEVICE

Abstract

To provide a method of controlling a measurement device, and the measurement device for implementing the method.SOLUTION: A method disclosed herein comprises selecting a sample to be examined, creating conditions under which the sample is to be examined by a measurement device (100), and determining measured values regarding properties of the sample, where each step is autonomously controlled by a controller (110).SELECTED DRAWING: Figure 2

Description

[Technical Field]

[0001] The present invention relates to a method for controlling a measurement device and a measurement device. [Background technology]

[0002] Characterizing various materials is of great importance for many applications in research and industry. For this purpose, various measuring devices are used, which, depending on the application, sometimes provide very complex measurement processes.

[0003] To ensure the success of the desired measurement, the user must have a certain level of expertise to perform these measurements, since the technical and scientific background of each individual measurement process must be taken into account. Furthermore, in most laboratory environments, measurement equipment is used by several users or directly one after the other for a series of measurements.

[0004] Therefore, it is necessary to plan in advance which measurements to perform, since the measurement device may need to be reconfigured between different measurements. If an unforeseen event occurs during a measurement, it may be time-consuming to change the predetermined plan, such as repeating a measurement or scheduling a new measurement. This may result in a negative impact on the utilization efficiency of individual measurement devices, especially when users are physically absent, such as overnight. Summary of the Invention

[0005] Against this background, the object of the present invention is to design the use of measuring devices in a more efficient way.

[0006] This problem is solved by a method having the features of claim 1 and a measuring device having the features of claim 9.

[0007] Accordingly, there is provided a method for controlling a measurement device, the method comprising the steps of selecting a sample to be inspected, creating conditions under which the sample is inspected by the measurement device, and determining measurements relating to properties of the sample, the method steps being autonomously controlled by a controller.

[0008] Furthermore, a measurement device configured to carry out the method according to the invention is provided.

[0009] The basic idea of ​​the present invention is to automate the measuring device as autonomously as possible by means of a controller. As a result, the user of the measuring device is relieved of some of his workload, since fewer steps of the measurement process have to be prepared or carried out personally. The present invention also makes it possible to increase the efficiency of the measuring device even when there is no real user on site.

[0010] According to an exemplary embodiment of the method, the controller autonomously selects the sample to be tested, which provides additional peace of mind to the user of the measurement device, and in particular, as a result the measurement device can also perform measurements without a live user being present on-site.

[0011] According to a further development of the method, the controller selects the sample to be tested based on conditions previously determined by the measurement device, as a result of which the efficiency of the measurement device can be increased, for example by testing samples that have been tested under the same or similar conditions one after the other.

[0012] According to a further development of the method, the controller selects the sample to be examined based on measurement values ​​determined at a previous point in time by the measurement device, as a result of which the measurement device can advantageously handle individual measurement results.

[0013] According to an exemplary embodiment, the method further includes repeating the determination of the measurement value if the controller detects that the determined measurement value is outside a valid range, so that the potentially inaccurate measurement value can be advantageously corrected without causing additional burden to the user.

[0014] According to an exemplary embodiment of the method, the controller has access to a database, the control of the measurement device being advantageously supported by suitable configuration of the database.

[0015] According to a further development of the method, the database contains a plurality of pieces of information relating to material properties and measurement methods, and the controller autonomously controls the measurement device based on the plurality of pieces of information, as a result of which the controller can advantageously support a virtually unlimited number of measurements.

[0016] According to an exemplary embodiment of the method, the controller updates the database after determining the measurement, so that knowledge gained during the measurement can be used advantageously in future measurements. [Brief explanation of the drawings]

[0017] The present invention will now be described with reference to the drawings. [Figure 1] 1 is a schematic flow diagram of a method according to an exemplary embodiment of the present invention; [Figure 2] 1 is a schematic diagram of a measurement device according to an exemplary embodiment of the present invention; [Figure 3] 1 is a schematic diagram of a system with multiple measurement devices according to an exemplary embodiment of the present invention;

[0018] In the drawings, like reference numbers indicate identical or functionally identical elements unless otherwise indicated. DETAILED DESCRIPTION OF THE INVENTION

[0019] FIG. 1 is a schematic flow diagram of a control method M of a measurement device according to an exemplary embodiment of the present invention.

[0020] In a first method step M1, a sample to be inspected is selected. In a further method step M2, conditions are created under which the sample is inspected by the measuring device. In a further method step M3, measured values ​​for properties of the sample are determined. The method steps are autonomously controlled by a controller.

[0021] The following method M will be explained in detail with reference to FIGS.

[0022] FIG. 2 is a schematic diagram of a measurement device 100 according to an exemplary embodiment of the present invention.

[0023] The measurement device 100 includes a controller 110 , a database 120 , a sensor device 130 , an output device 140 , an input device 150 , and a sample receiving device 160 .

[0024] In the exemplary embodiment shown here, the controller 110 is integrated into the measurement device 100 and can be configured to autonomously select the sample to be tested. For this purpose, it can take into account both conditions previously determined by the measurement device 100 and measurements previously determined by the measurement device 100. If the conditions required for testing one sample are also required for testing another sample, it can be advantageous, for example, to test these two samples in successive measurements, thereby making the use of the measurement device 100 more efficient.

[0025] Alternatively or additionally, the sample to be tested may be selected by a user of measurement device 100, who communicates this selection to controller 110. This selection may be communicated to controller 110 by the user of measurement device 100, for example, via input device 150 of measurement device 100. Input device 150 may comprise, for example, a keyboard, a touchscreen, etc. Alternatively, this selection may be transmitted to controller 110 via an external interface.

[0026] Furthermore, the measurement device 100 is configured to create the conditions under which the sample is examined, particularly under autonomous control by the controller 110. In particular, the sample receiving device 160 may be suitably configured for this purpose and may include components such as temperature control devices, voltage sources, gripper arms, conveyor belts, etc.

[0027] Furthermore, the measurement device 100 is configured to determine measurements related to properties of the sample. For this purpose, a sensor device 130 having corresponding sensors, such as a temperature measuring device, a current measuring device, a voltage measuring device, a force measuring device, etc., may be used. These sensors or sensor devices 130 may be configured as subcomponents of the sample receiving device 160.

[0028] The measurement device 100, and in particular the controller 110, may be configured to repeat the determination of a measurement if the determined measurement is detected by the controller 110 to be outside a valid range. As a result, the measurement device 100 can detect the possibility that the measurement has been performed incorrectly and can repeat the measurement to confirm this possibility or to enable the correct measurement to be determined.

[0029] The controller 110 may be configured to access a database 120 for controlling the measurement device 100, which in this exemplary embodiment is configured in the form of an internal memory of the measurement device 100. The database 120 may include a plurality of pieces of information related to material properties and measurement methods. In this case, the controller 110 autonomously controls the measurement device 100 based on this plurality of pieces of information.

[0030] The measurement device may further be configured to output the determined measurements of the properties of the sample to a user of the measurement device 100. For example, the output device 140 of the measurement device 100 may be used for this purpose. The output device 140 may, for example, comprise a screen and / or a speaker for this purpose. For example, the output device 140 and the input device 150 may be combined into a touchscreen. Alternatively or additionally, individual components of the measurement device 100, such as the input device 150 and the sample receiving device 160, may be highlighted, for example by illuminating a switch field that should be activated.

[0031] In particular, the controller 110 may be configured to update the database 120 after a measurement value has been determined. The measurement results regarding the material properties of the sample used in the measurement are then recorded, for example, in the database 120 and made available for future measurements and measurement scheduling. The information required for this regarding the performed measurements may be transferred to the controller 110 by a user of the measurement device 100. Alternatively or additionally, the controller 110 may receive the relevant information directly from the measurement device 100, in particular from the sensor device 130.

[0032] The measurement device 100 may be configured, inter alia, as a device for thermal analysis of materials. Specifically, the measurement device 100 may be configured to perform differential thermal analysis, dynamic differential calorimetry, dynamic mechanical analysis, thermomechanical analysis, etc. In such measurement processes, user assistance by the controller 110 is particularly advantageous.

[0033] FIG. 3 is a schematic diagram of a system 10 including multiple measurement devices 100 according to an exemplary embodiment of the present invention.

[0034] In the illustrated exemplary embodiment, the system 10 includes a total of two measurement devices 100 , a controller 200 , and a database 300 .

[0035] The individual components of the system 10 can in principle be configured exactly the same as the corresponding components described with reference to Figure 2. In the exemplary embodiment shown here, only the controller 200 and the database 300 are configured as independent devices external to the two measurement devices 100. However, in principle, the database 300 could also be configured as a subcomponent of the controller 200.

[0036] The controller 200 is configured as a standalone device and can therefore be configured for use with either of the two measurement devices 100. This allows, for example, for a sample to be first inspected by one of the measurement devices 100 and then inspected completely autonomously by the other measurement device 100. Suitable transport means, not shown, can be provided for this purpose.

[0037] 3 shows two measurement devices 100. However, in practice any number of measurement devices 100 may be provided. In particular, it is also conceivable to use individual measurement devices 100 with external controllers 200 and / or external databases 300.

[0038] The measurement device 100 can be configured to have the same functionality or to perform different measurements in each case. Depending on the application, each measurement process can be performed simultaneously or sequentially.

[0039] Database 300 is shown here as a specific component of system 10. However, it is also contemplated that controller 200 and / or database 300 may be connected to an extended network, in particular the Internet, and may obtain relevant information directly via this network instead of storing it locally. [Explanation of symbols]

[0040] 10 Systems 100 Measuring Device 110 Controller 120 databases 130 Sensor Device 140 Output Device 150 Input Device 160 Sample receiving device 200 Controller 300 databases M method M1 Method Step M2 Method Steps M3 Method Steps

Claims

1. selecting a sample to be tested; creating conditions under which the sample is inspected by a measurement device; determining a measurement related to a property of the sample; Including, Each of the steps is autonomously controlled by a controller; the controller autonomously selecting the sample to be tested; A method of controlling a measurement device, wherein the controller selects the sample to be inspected based on conditions previously determined by the measurement device.

2. selecting a sample to be tested; creating conditions under which the sample is inspected by a measurement device; determining a measurement related to a property of the sample; Including, Each of the steps is autonomously controlled by a controller; the controller autonomously selecting the sample to be tested; A method of controlling a measurement device, wherein the controller selects the sample to be inspected based on measurements determined at an earlier time by the measurement device.

3. 3. A method according to claim 1 or 2, comprising repeating establishing said measurements if the determined measurements are detected by the controller to be outside a valid range.

4. The method of claim 1 or 2, wherein the controller accesses a database.

5. The method according to claim 4 , wherein the database includes a plurality of pieces of information relating to material properties and measurement methods, and the controller autonomously controls the measurement device based on the plurality of pieces of information.

6. The method of claim 4 , wherein the controller updates the database after determining the measurements.

7. A measuring device configured to carry out the method according to claim 1 or 2.

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