Image Probe

Abstract

To provide an observation device, such as an image probe, that can be automatically attached to and detached from a processing device.SOLUTION: An image probe 100 is provided, comprising: an illumination device 110 for irradiating a workpiece 14 with illumination light; an image capturing device 140 for capturing an image of the workpiece 14; a focusing lens 132 for forming an image of the workpiece 14 in the image capturing device 140; an object lens 131 for guiding light to the focusing lens 132; power supply means for supplying power to at least either of the illumination device 110 and the image capturing device 140,; a cover 160 designed to accommodate the illumination device 110, the image capturing device 140, the focusing lens 132, and the power supply means; and an attachment mechanism coupled to the cover 160 and designed to enable automatic attachment to and detachment from a processing device.SELECTED DRAWING: Figure 3

Description

[Technical Field]

[0001] The present invention relates to an image probe that can be attached to a machining device such as an electric discharge machine. [Background technology]

[0002] When a workpiece is machined using a machining device such as an electric discharge machine, an observation device may be attached to the machining device to observe the shape of the workpiece after machining and measure its dimensions. Also, if the results of observation and measurement show that machining is not complete, the observation device may be removed from the machining device in order to machine the workpiece again. When machining and observation / measurement are repeated, this attachment and detachment process may be repeated. [Prior art documents] [Patent documents]

[0003] [Patent Document 1] Japanese Utility Model Application Publication No. 57-081032 Summary of the Invention [Problem to be solved by the invention]

[0004] If the above-mentioned attachment and detachment work is performed manually, it is time-consuming to attach and detach the observation device every time the work is required. Furthermore, there is a risk of dropping and damaging the observation device during the attachment and detachment work. However, if such an observation device can be attached and detached automatically, these problems can be solved.

[0005] However, in conventional observation devices, there are cases where a large number of power lines, etc. are drawn out from the observation device. In such cases, there is a risk that these power lines, etc. may get caught or tangled on the internal components of the processing device during automatic attachment / detachment, causing the power lines, etc. to break or damaging the processing device or observation device.

[0006] The present invention has been made in view of the above-mentioned problems, and has as its object to provide an observation device such as an image probe that can be automatically attached to and detached from a processing device. [Means for solving the problem]

[0007] An image probe according to one embodiment of the present invention is a cableless image probe comprising an illumination device that irradiates illumination light onto a workpiece, an imaging device that images the workpiece, a focusing lens that forms an image of the workpiece on the imaging device, an objective lens that directs light to the focusing lens, a power supply means that supplies power to at least one of the illumination device and the imaging device, a cover that houses the illumination device, the imaging device, the focusing lens, and the power supply means, and an attachment mechanism that is connected to the cover and can be automatically attached and detached to a processing device.

[0008] Such an imaging probe is cable-less and does not suffer from the above-mentioned problems.

[0009] The power supply means may generate at least one voltage suitable for at least one of the lighting device and the imaging device, and supply the voltage to at least one of the lighting device and the imaging device.

[0010] The power supply means may comprise a transformer for generating at least one voltage.

[0011] The power supply means may include a first electrode for power supply, and the first electrode may be connected to a second electrode for power supply provided on the processing device when the image probe is attached to the processing device.

[0012] The power supply means may include a wireless power receiving device.

[0013] The power supply means may comprise a battery. [Effects of the Invention]

[0014] With this configuration, it is possible to provide an imaging probe that can be automatically attached to and detached from a processing device. [Brief explanation of the drawings]

[0015] [Figure 1] FIG. 1 is a schematic front view showing the configuration of an electric discharge machine 10. [Figure 2] FIG. 1 is a schematic front view showing the configuration of an electric discharge machine 10. [Figure 3] FIG. 1 is a schematic diagram showing the configuration of an imaging probe 100. [Figure 4] FIG. 1 is a schematic side view showing the configuration of an image probe 100. [Figure 5] FIG. 1 is a schematic front view showing the configuration of an image probe 100. [Figure 6] FIG. 1 is a schematic top view showing the configuration of an image probe 100. [Figure 7] 2 is a schematic side view showing the configuration of the image probe 100 and the attachment mechanism 16. FIG. [Figure 8] 2 is a schematic side view showing the configuration of the image probe 100 and the attachment mechanism 16. FIG. [Figure 9] FIG. 10 is a schematic diagram showing the configuration of an image probe 200 according to a second embodiment. DETAILED DESCRIPTION OF THE INVENTION

[0016] Imaging probes according to some embodiments of the present invention will now be described.

[0017] In the following description, the same parts are denoted by the same reference numerals and the description thereof will be omitted.

[0018] In the following description, an example will be described in which the optical axis direction of the objective lens of the image probe and the mounting direction of the image probe to the processing device coincide with the Z direction. However, this configuration is merely an example for the purpose of explanation, and the specific configuration etc. can be adjusted as appropriate.

[0019] In the following description, an electric discharge machine is exemplified as a machining device to which an image probe is attached, but the machining device to which an image probe is attached does not have to be an electric discharge machine.

[0020] [First embodiment] 1 and 2 are schematic front views showing the configuration of an electric discharge machine 10. Fig. 1 shows the state during machining of a workpiece 14. Fig. 2 shows the state during observation and measurement of the workpiece 14.

[0021] 1, the electric discharge machine 10 includes a base 11 and a machining tank 12 provided on the base 11. Machining fluid 13 and a workpiece 14 are provided in the machining tank 12. The electric discharge machine 10 also includes an attachment mechanism 16 configured to be able to attach a machining electrode 15, a Z-axis drive mechanism 17 capable of adjusting the positional relationship between the attachment mechanism 16 and the machining tank 12 in the Z direction, an X-axis drive mechanism 18 capable of adjusting the positional relationship between the attachment mechanism 16 and the machining tank 12 in the X direction, and a Y-axis drive mechanism 19 capable of adjusting the positional relationship between the attachment mechanism 16 and the machining tank 12 in the Y direction.

[0022] 1, when machining a workpiece 14, a machining electrode 15 is attached to a mounting mechanism 16. The entire workpiece 14 and at least a part of the machining electrode 15 are immersed in the machining liquid 13.

[0023] 2, when observing and measuring the workpiece 14, the image probe 100 is attached to the attachment mechanism 16. Furthermore, at least the upper surface of the workpiece 14 and the image probe 100 are not immersed in the machining liquid 13.

[0024] 3 is a schematic diagram showing the configuration of the image probe 100. The image probe 100 includes an epi-illumination device 110, a dark-field illumination device 120, an optical system 130, an imaging device 140, a power supply device 150, and a cover 160 that houses at least a portion of these components.

[0025] The epi-illumination device 110 is, for example, an illumination device such as an LED, etc. The epi-illumination device 110 may be housed in a cover 160, for example.

[0026] The dark field illumination device 120 is, for example, an illumination device such as an LED. The dark field illumination device 120 may be, for example, a ring illumination device. The dark field illumination device 120 may be, for example, configured to be detachable from the cover 160.

[0027] The optical system 130 includes, for example, an objective lens 131 facing the workpiece 14, and a focusing lens 132 that forms an image of the workpiece 14 on the imaging surface of the imaging device 140 based on light incident through the objective lens 131. The optical system 130 also includes a mirror 133 that reflects light irradiated from the epi-illumination device 110, and a half mirror 134 that reflects the light reflected by the mirror 133 and guides it to the workpiece 14 via the objective lens 131, and that transmits the light reflected by the workpiece 14 and incident through the objective lens 131. The objective lens 131 may be configured to be detachable from the cover 160, for example. The focusing lens 132, the mirror 133, and the half mirror 134 may be housed in the cover 160, for example.

[0028] The imaging device 140 is, for example, an imaging device such as a CMOS image sensor or a CCD image sensor. The imaging device 140 may be housed in, for example, a cover 160. The imaging device 140 inputs and outputs data signals to and from the electric discharge machine 10 via, for example, a data signal input / output terminal 171. The data signals include, for example, a control signal for controlling the imaging device 140 and a signal of image data acquired by the imaging device 140.

[0029] The power supply device 150 receives power from the electric discharge machine 10 via, for example, power supply terminals 172 and 173, and steps down this voltage to generate a voltage suitable for driving the epi-illumination device 110, a voltage suitable for driving the dark-field illumination device 120, and a voltage suitable for driving the image capture device 140. The power supply device 150 also supplies these voltages to the epi-illumination device 110, the dark-field illumination device 120, and the image capture device 140, respectively. The power supply device 150 includes, for example, a transformer.

[0030] Fig. 4 is a schematic side view showing the configuration of the image probe 100. Fig. 5 is a schematic front view showing the configuration of the image probe 100. Fig. 6 is a schematic top view showing the configuration of the image probe 100. Figs. 7 and 8 are schematic side views showing the configurations of the image probe 100 and the attachment mechanism 16.

[0031] As shown in FIG. 4, the cover 160 includes a main body 161 and a clamp shaft 162 provided at the upper end of the main body 161.

[0032] The main body 161 accommodates the epi-illumination device 110 , the focusing lens 132 , the mirror 133 , the half mirror 134 , the imaging device 140 , and the power supply device 150 .

[0033] The clamp shaft 162 constitutes an attachment mechanism that can be automatically attached to and detached from the electric discharge machine 10. The clamp shaft 162 has a generally cylindrical shape extending in the Z direction. The clamp shaft 162 has a recess 163 with a relatively small radius, and a protrusion 164 that is provided above the recess 163 and has a larger radius than the recess 163.

[0034] 7 includes a base 21 capable of accommodating a clamp shaft 162, a plurality of balls 22 that abut against recesses 163 of the clamp shaft 162, a plurality of restraining members 23 that restrain the radial movement of the balls 22, and a coil spring 24 that imparts elastic force to the restraining members 23. The base 21 includes a hole 31 capable of accommodating the clamp shaft 162. The hole 31 extends in the Z direction. The base 21 also includes a hole 32 that accommodates the balls 22 so that they are movable in the radial direction. The hole 32 communicates with the hole 31 and extends in the radial direction. The base 21 also includes a housing 33 that accommodates the restraining members 23 so that they are movable in the Z direction. The housing 33 communicates with the hole 32. The base 21 also includes a hole 34 that communicates with the housing 33.

[0035] When the imaging probe 100 is attached to the attachment mechanism 16, the position of the restraining member 23 in the Z direction is fixed by the coil spring 24. In this state, the position of the ball 22 in the radial direction is restrained by the restraining member 23, and the ball 22 abuts against the recess 163 of the clamp shaft 162.

[0036] When removing the image probe 100 from the attachment mechanism 16, air is injected through the hole 34. This presses the restraining member 23 downward, allowing the ball 22 to move in the radial direction. In this state, the image probe 100 is removed from the attachment mechanism 16 by pulling it out downward.

[0037] When attaching the image probe 100 to the attachment mechanism 16, air is also injected through the hole 34. This presses the restraining member 23 downward, allowing the ball 22 to move in the radial direction. In this state, the image probe 100 is moved from below to above to accommodate the clamp shaft 162 in the hole 31, and the injection of air into the hole 34 is stopped in this state, whereby the image probe 100 is attached to the attachment mechanism 16.

[0038] 6, a data signal input / output terminal 171 and power supply terminals 172 and 173 are arranged in an annular region centered on the clamp shaft 162. The data signal input / output terminal 171 and the power supply terminals 172 and 173 are connected to electrodes 41 and 42 provided on the attachment mechanism 16 when the image probe 100 is attached to the attachment mechanism 16, as shown in Fig. 8, for example. The electrode 42 may be an electrode that supplies machining power to the machining electrode 15 (Fig. 1), for example.

[0039] Here, as described above, when the workpiece 14 is machined by the electric discharge machine 10, the machining electrode 15 may be removed from the attachment mechanism 16 of the electric discharge machine 10 and an observation device may be attached in order to observe and measure the shape and the like of the machined workpiece 14. Furthermore, if the result of the observation and measurement indicates that machining is not complete, the observation device may be removed from the attachment mechanism 16 and the machining electrode 15 may be attached. When machining and observation and measurement are repeated, this attachment and detachment operation may be repeated.

[0040] If the above-mentioned attachment and detachment work is performed manually, it is time-consuming to attach and detach the observation device every time the work is required. Furthermore, there is a risk of dropping and damaging the observation device during the attachment and detachment work. However, if such an observation device can be attached and detached automatically, these problems can be solved.

[0041] However, in conventional observation devices, there are cases where multiple power lines are drawn out from the observation device. In such cases, there is a risk that these power lines may get caught or tangled in the internal components of the machining device during automatic attachment / detachment, causing the power lines to break or damaging the machining device or observation device. In particular, when using the electric discharge machine 10, there is a risk that the observation device may be dropped into the machining fluid 13.

[0042] Here, the image probe 100 according to the first embodiment is cable-less, so the above-mentioned problems do not occur, and therefore it is possible to provide an image probe that can be automatically attached to and detached from a processing device.

[0043] [Second embodiment] Next, an image probe 200 according to a second embodiment will be described with reference to Fig. 9. Fig. 9 is a schematic diagram showing the configuration of the image probe 200.

[0044] The image probe 200 is basically configured in the same manner as the image probe 100 according to the first embodiment. However, the image probe 200 does not include a data signal input / output terminal 171 and power supply terminals 172 and 173. The image probe 200 also includes a data signal transmitting / receiving device 201, a wireless power receiving device 202, a battery 203, and a switch circuit 204. These components are housed in a cover 160.

[0045] The data signal transmitting / receiving device 201 is connected to the imaging device 140. The imaging device 140 inputs and outputs data signals to and from an external device (not shown), for example, via the data signal transmitting / receiving device 201. The input and output of data signals is performed by wireless communication.

[0046] The wireless power receiving device 202 is connected to the battery 203 via a switch circuit 204. The wireless power receiving device 202 is supplied with power by wireless power feeding from an external device (not shown), for example, and charges the battery 203 with this power.

[0047] The battery 203 is connected to the power supply device 150 and the wireless power receiving device 202 via a switch circuit 204. The power supply device 150 is supplied with power from the battery 203, for example, and adjusts the voltage of the battery 203 to generate a voltage suitable for driving the epi-illumination device 110, a voltage suitable for driving the dark-field illumination device 120, and a voltage suitable for driving the imaging device 140.

[0048] [Other embodiments] The imaging probes 100 and 200 according to the first and second embodiments of the present invention have been described above. However, the above configurations are merely examples, and the specific configurations can be adjusted as appropriate.

[0049] For example, the image probe 100 according to the first embodiment is configured to transmit and receive data signals and to supply power via the attachment mechanism 16 of the electric discharge machine 10. Also, for example, the image probe 200 according to the second embodiment is configured to transmit and receive data signals and to supply power by wireless communication and wireless power supply. However, such configurations are merely examples, and specific configurations can be provided as appropriate.

[0050] For example, in the image probe 100 according to the first embodiment, only the supply of power may be performed via the attachment mechanism 16 of the electric discharge machine 10, and the transmission and reception of data signals may be performed by wireless communication. In such a case, the image probe 100 may be provided with a data signal transmission and reception device 201 instead of the data signal input / output terminal 171.

[0051] Furthermore, in the image probe 200 according to the second embodiment, only the supply of power may be performed wirelessly, and the transmission and reception of data signals may be performed via the attachment mechanism 16 of the electric discharge machine 10. In such a case, the image probe 200 may be provided with a data signal input / output terminal 171 instead of the data signal transmitting / receiving device 201.

[0052] Also, for example, the image probe 200 according to the second embodiment includes the wireless power receiving device 202 as a configuration for charging the battery 203. However, the image probe 200 may include a power supply terminal for charging the battery 203 instead of the wireless power receiving device 202. [Explanation of symbols]

[0053] 100...imaging probe, 110...epi-illumination device, 120...dark-field illumination device, 130...optical system, 140...imaging device, 150...power supply device, 160...cover.

Claims

1. an illumination device that irradiates illumination light onto the workpiece; an imaging device that images the workpiece; a focusing lens that forms an image of the workpiece on the imaging device; an objective lens that guides light to the focusing lens; a power supply unit for supplying power to at least one of the illumination device and the imaging device; a cover that houses the illumination device, the imaging device, the focusing lens, and the power supply means; an attachment mechanism connected to the cover that can be automatically attached to and detached from the electric discharge machining device; 1. A cableless imaging probe comprising: The power supply means includes a first electrode for supplying power. With the image probe attached to the electric discharge machining apparatus, the first electrode is connected to a second electrode of the electric discharge machining apparatus, the second electrode supplying electric power for machining to the machining electrode; The power supply means generates a voltage suitable for the lighting device based on the voltage supplied from the second electrode, and supplies the voltage suitable for the lighting device to the lighting device. Image probe.

2. The power supply means generates a voltage suitable for the imaging device based on the voltage supplied from the second electrode, and supplies the voltage suitable for the imaging device to the imaging device. The imaging probe of claim 1 .

3. An illumination device that irradiates illumination light onto a workpiece; an imaging device that images the workpiece; a focusing lens that forms an image of the workpiece on the imaging device; an objective lens that guides light to the focusing lens; a power supply unit for supplying power to at least one of the illumination device and the imaging device; a cover that houses the illumination device, the imaging device, the focusing lens, and the power supply means; an attachment mechanism connected to the cover that can be automatically attached to and detached from the electric discharge machining device; 1. A cableless imaging probe comprising: The power supply means includes a first electrode for supplying power. With the image probe attached to the electric discharge machining apparatus, the first electrode is connected to a second electrode of the electric discharge machining apparatus, the second electrode supplying electric power for machining to the machining electrode; The power supply means generates a voltage suitable for the imaging device based on the voltage supplied from the second electrode, and supplies the voltage suitable for the imaging device to the imaging device. Image probe.

4. The power supply means includes a transformer that generates a voltage suitable for the lighting device based on the voltage supplied from the second electrode. The imaging probe of claim 1 .

5. The power supply means includes a transformer that generates a voltage suitable for the imaging device based on the voltage supplied from the second electrode.

4. The imaging probe according to claim 2 or 3.

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