Diagnostic instrument with multiple illumination sources and method thereof
The diagnostic instrument uses IR and NIR lights to protect photosensitive materials from UV damage by alternating illumination and optimizing exposure times, ensuring accurate imaging and analysis in diagnostic devices.
Patent Information
- Application Number
- JP2023562943
- Authority / Receiving Office
- JP · JP
- Patent Type
- Patents
- Current Assignee / Owner
- Priority Date
- 2021-04-14
- Filing Date
- 2022-03-25
- Publication Date
- 2025-09-29
- Estimated Expiration
- 2042-03-25
AI Technical Summary
Diagnostic devices face the challenge of damaging photosensitive materials, such as blood and serum, due to excessive exposure to certain light spectrums, particularly UV light, which can degrade or destroy these materials during imaging processes.
The diagnostic instrument employs multiple illumination sources, including IR and NIR lights, which are less destructive to photosensitive materials, alternating with UV or visible light for specific imaging needs, and uses a computer to analyze and determine the appropriate illumination time to minimize damage.
This approach effectively reduces the degradation of photosensitive materials by using less destructive light spectrums and optimizing illumination times, ensuring accurate imaging and analysis while protecting the integrity of specimens.
Smart Images

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Abstract
Description
[Technical Field]
[0001] CROSS-REFERENCE TO RELATED APPLICATIONS This application claims the benefit of U.S. Provisional Patent Application No. 63 / 175,005, filed April 14, 2021, entitled "DIAGNOSTIC INSTRUMENTS HAVING MULTIPLE ILLUMINATION SOURCES AND METHODS THEREOF," the disclosure of which is incorporated herein by reference in its entirety for all purposes.
[0002] SUMMARY OF THE INVENTION Embodiments of the present disclosure relate to diagnostic instruments that include multiple illumination sources and methods of operating diagnostic instruments. [Background technology]
[0003] Some clinical diagnostic equipment processes photosensitive materials, such as blood, plasma, and serum, that can be degraded by excessive exposure to light of specific wavelengths (e.g., spectrums). Some spectrums, such as those containing ultraviolet (UV) light, can be particularly harmful to some photosensitive materials. For example, exposure to UV light with a wavelength of 255 nm for as little as 30 seconds can damage DNA in blood to the point that it becomes undetectable during polymerase chain reaction (a common procedure for quantifying DNA). Another example of a photosensitive material that degrades during exposure to light of specific wavelengths is bilirubin in serum. In another example, certain wavelengths of light can accelerate the onset of hemolysis in vertebrate blood. Summary of the Invention [Problem to be solved by the invention]
[0004] During operation of a diagnostic device, some components and materials must be imaged using light of different spectrums. The light used during imaging can be damaging to photosensitive materials located within the diagnostic device. There is a need for a diagnostic device and method that reduces exposure of photosensitive materials to light of spectrums that can damage the photosensitive materials. [Means for solving the problem]
[0005] According to a first aspect, a method of operating a diagnostic instrument is disclosed, the method including illuminating an imaging location of the diagnostic instrument with a first light having a first spectrum for a first illumination period; capturing a first image of the imaging location illuminated by the first light; illuminating the imaging location of the diagnostic instrument with a second light having a second spectrum for a second illumination period, the second spectrum being more destructive to a chemical configured to be received by the diagnostic instrument than the first spectrum; and capturing a second image of the imaging location illuminated by the second light.
[0006] In another aspect, a method of operating a diagnostic device is disclosed that includes illuminating an imaging location of the diagnostic device with a first light having a first spectrum for a first time period; capturing a first image of the imaging location illuminated by the first light; analyzing the first image; determining, based on the analyzing, a second light to illuminate the imaging location, the second light having a second spectrum, the second spectrum being more destructive to analytes acceptable to the diagnostic device than the first spectrum; determining, based on the analyzing, a second time period for which the second light should illuminate the imaging location, the second time period being shorter than the first time period; illuminating the imaging location with the second light for the second time period; and capturing a second image of the imaging location illuminated by the second light.
[0007] In another aspect, a diagnostic instrument is provided that includes an imaging location; a first illumination source configured to illuminate the imaging location with a first light having a first spectrum for a first time period; a second illumination source configured to illuminate the imaging location with a second light having a second spectrum for a second time period, the second spectrum being more destructive to an analyte acceptable to the diagnostic instrument than the first spectrum and the second time period being shorter than the first time period; an imaging device configured to capture a first image of the imaging location illuminated by the first light and a second image of the imaging location illuminated by the second light; and a computer configured to execute instructions to analyze the first image; determine the second spectrum in response to analyzing the first image; and determine the second time period in response to analyzing the first image.
[0008] Further aspects, configurations, and advantages of the present disclosure will become readily apparent from the following description and illustration of numerous example embodiments, including the best mode contemplated for carrying out the disclosure. The present disclosure is also capable of other and different embodiments, and its several details can be modified in various respects, all without departing from the scope of the present disclosure. The present disclosure is intended to cover all modifications, equivalents, and alternatives that are within the scope of the claims.
[0009] The drawings described below are for illustrative purposes and are not necessarily drawn to scale. Accordingly, the drawings and descriptions should be regarded as illustrative in nature, and not as restrictive. The drawings are not intended to limit the scope of the present disclosure in any way. [Brief explanation of the drawings]
[0010] [Figure 1] 1 is a front isometric view of a diagnostic instrument coupled to a computer, the diagnostic instrument including multiple illumination sources, according to one or more embodiments. [Figure 2] FIG. 2 is a top view of a portion of the interior of a chamber of a diagnostic instrument according to one or more embodiments. [Figure 3] 1 is a side elevation view of a probe assembly and a partial cross-sectional view of a platform and dilution ring within a chamber of a diagnostic instrument according to one or more embodiments. FIG. [Figure 4] 1 is a side elevation view of a mixer and a partial cross-sectional view of a dilution ring within a chamber of a diagnostic instrument according to one or more embodiments. FIG. [Figure 5] 1 is a partial cross-sectional view of a reaction ring of a platform of a diagnostic instrument including an optical inspection system located below the reaction ring, according to one or more embodiments. [Figure 6A] FIG. 1 is a front elevation view of one embodiment of an imaging system configured to reside within a chamber of a diagnostic instrument, according to one or more embodiments. [Figure 6B] FIG. 6B is a side elevation view of the imaging system of FIG. 6A in accordance with one or more embodiments. [Figure 7A] 1 is a flowchart illustrating a method of operating a diagnostic device according to one or more embodiments. [Figure 7B] 1 is a flowchart illustrating a method of operating a diagnostic device according to one or more embodiments. [Figure 8] 1 is a flowchart illustrating a method of operating a diagnostic device according to one or more embodiments. [Figure 9] 10 is a flowchart illustrating another method of operating a diagnostic device according to one or more embodiments. DETAILED DESCRIPTION OF THE INVENTION
[0011] Diagnostic instruments perform analyses on samples obtained from a person, such as a patient. Examples of samples include, but are not limited to, blood, serum, plasma, sweat, nasal swab, urine, cerebrospinal fluid, or any other human bodily fluid. The analyses can include optical analyses in which the sample is illuminated with a preselected light intensity and spectrum (e.g., wavelength) for a preselected period of time. An imaging device within the instrument captures an image of the illuminated sample to determine the presence and / or concentration of one or more chemicals (e.g., analytes) in the sample.
[0012] In addition to the analyses described above, diagnostic instruments can also process specimens and / or specimen containers containing specimens. Diagnostic instruments can include components configured to aspirate specimens and reagents and dispense specimens and reagents into cuvettes or other containers used during analysis. In some examples, diagnostic instruments can include components that mix liquids, such as specimens and reagents. Diagnostic instruments can also include components configured to calibrate and / or monitor other components.
[0013] Some specimens are damaged or destroyed when exposed to light of certain spectrums. For example, ultraviolet (UV) light damages some specimens. In particular, UV light with a wavelength of 365 nm is particularly destructive to some specimens, including blood, plasma, and serum. In addition, visible light may be destructive to some specimens. Infrared (IR) and near-infrared (NIR) light are not destructive to some specimens or are less destructive than UV and visible light to some specimens. For example, IR and NIR light are less destructive to blood, plasma, and serum than UV and visible light. However, UV and visible light have advantages in instruments. For example, visible light can be useful for optically calibrating and diagnosing components in diagnostic instruments. UV light is useful for identifying spills, such as spills of specimens and reagents, in diagnostic instruments.
[0014] The diagnostic devices described herein include illumination sources (e.g., light sources) that emit light having different spectra to prevent or reduce damage to analytes and / or reagents located within the diagnostic device. In some embodiments, a first light emitted by the illumination source and having a first spectrum is less destructive to the analytes and / or reagents than a second light having a second spectrum. In some embodiments, the first light is IR light or NIR light, and the second light is UV light or visible light. The first light can be emitted by the first illumination source, and the second light can be emitted by the second illumination source.
[0015] In use, a first light can illuminate a component located at at least one imaging location within the diagnostic device. An image of the imaging location illuminated by the first light for a first period of time is captured and analyzed. Based on the analysis, a determination is made as to whether an image of the imaging location illuminated with a second light needs to be captured. Additionally, the analysis can determine a second period of time during which the imaging location is illuminated by the second light to minimize or eliminate damage to the specimen or other photosensitive material.
[0016] The above-described diagnostic devices and methods, along with other embodiments of the diagnostic devices and methods, are described in more detail herein with reference to Figures 1-9.
[0017] Reference is now made to FIG. 1, which shows a front isometric view of diagnostic instrument 100. Diagnostic instrument 100 may be a stand-alone instrument, or diagnostic instrument 100 may be a component of a larger laboratory analytical system, which may include multiple interconnected modules and instruments. Diagnostic instrument 100 is configured to receive a specimen (e.g., from a person or patient) and perform an analysis on the specimen to determine the presence and / or concentration of one or more chemicals (e.g., analytes and / or proteins) in the specimen. The specimen may include blood, serum, plasma, sweat, nasal swab, urine, cerebrospinal fluid, or any other human bodily fluid or liquid extracted from bodily tissue.
[0018] The diagnostic instrument 100 can include a chamber 102 in which a specimen is processed and / or analyzed (e.g., tested). Accordingly, the chamber 102 can include components (not shown in FIG. 1 ) configured to perform specimen processing and analysis as described herein. In some embodiments, optical analysis is performed in the chamber 102. In some embodiments, chemicals (e.g., reagents) are mixed with the specimen in the chamber 102 to perform the analysis or prepare the specimen for analysis. To perform an accurate analysis, the chamber 102 can block extraneous light having wavelengths that are destructive to the chemicals or specimens located in the chamber 102. For example, ambient light can be prevented from entering the chamber 102.
[0019] As discussed above, some analytes can be destroyed or damaged when exposed to one or more specific light spectrums. For example, with sufficient exposure, UV light (100 nm to 400 nm) can destroy blood, plasma, and serum, while near-infrared (NIR) light (750 nm to 2,500 nm) and infrared (IR) light (700 nm to 1 nm) have little effect on blood, plasma, and serum. In another example, bilirubin in serum decomposes, and the onset of hemolysis in vertebrate blood is accelerated by ambient room lighting (e.g., visible light between 750 nm and 2,500 nm). In the embodiment of FIG. 1, the chamber 102 can include a shutter 104, such as an opaque shutter, that blocks (e.g., filters or attenuates) some wavelengths of light entering the chamber 102. In some embodiments, the shutter 104 may be colored with a colored material, such as an amber material. In some embodiments, the shutter 104 can block light having a wavelength between about 10 nm and about 400 nm. Therefore, analyses taking place in the chamber 102 behind the shutter 104 are not exposed to harmful visible light, which is between 380 nm and 700 nm.
[0020] In some embodiments, diagnostic instrument 100 may include display 106. In some embodiments, display 106 may be a touchscreen that allows a user of diagnostic instrument 100 to input data via display 106. For example, display 106 may display one or more menus, etc., and a user may touch items in the menus to control diagnostic instrument 100, input data into diagnostic instrument 100, and / or obtain data from diagnostic instrument 100. In some embodiments, diagnostic instrument 100 may include one or more cameras (not shown in FIG. 1 ) located within chamber 102 and configured to capture images (e.g., digital pixelated images) of one or more imaging locations within chamber 102. Display 106 may display the captured images.
[0021] Diagnostic device 100 may include or be in communication with computer 108. Computer 108 may include processor 108A, memory 108B, and program 108C stored in memory 108B. Processor 108A may be configured to execute program 108C stored in memory 108B. Program 108C may include instructions that enable computer 108 or diagnostic device 100 to perform actions, such as illuminating with multiple light sources, making decisions, and performing analyses, as described herein. Computer 108 and program 108C stored therein may also perform other processes, such as operating diagnostic device 100.
[0022] Referring further to Figure 2, Figure 2 shows a top view of one embodiment of the interior of chamber 102. Chamber 102 may include a platform or chassis 212 (hereinafter "platform") to which one or more components within chamber 102 are mounted. For example, one or more components that test and / or prepare the sample for testing may be mounted to or placed on platform 212. As discussed above, these components may operate in the dark, illuminated by light (e.g., IR or NIR), or illuminated by some light in a sub-spectrum that does not damage the sample and / or reagents.
[0023] The chamber 102 shown in FIG. 2 includes a dilution ring 214 and a reaction ring 216 (sometimes referred to as an "incubation ring"). In the embodiment of FIG. 2, a plurality of cuvettes 218 (several are numbered) are present within both the dilution ring 214 and the reaction ring 216. Both the dilution ring 214 and the reaction ring 216 can be configured to move (e.g., rotate) relative to the platform 212 to move the cuvettes 218 relative to the platform 212. As described herein, each of the cuvettes 218 is configured to hold an analyte and / or a reagent used to perform an analysis on the analyte. In the embodiment of FIG. 2, a portion of one or more of the cuvettes 218 can extend below the platform 212.
[0024] One or more photometric devices (e.g., optical inspection system 538, FIG. 5), which may include an illumination source (such as one or more laser light sources) and an imaging device, may be positioned below platform 212 to capture images or take laser readings of the contents of cuvette 218. The images and / or signal readings may be used to analyze the specimen for the presence and / or concentration of one or more chemicals (e.g., analytes or proteins). In some embodiments, the analysis may be performed by comparing a current image or signal reading to a reference image or signal reading, which may have been previously acquired.
[0025] The diagnostic instrument 100 receives a sample and transports the sample to the chamber 102. In some embodiments, the chamber 102 can include one or more probe assemblies 220 configured to aspirate and dispense liquid into and from cuvettes 218 and other liquid-containing vessels, such as reagent containers (not shown). The embodiment of FIG. 2 includes four probe assemblies 220, individually referred to as first probe assembly 220A, second probe assembly 220B, third probe assembly 220C, and fourth probe assembly 220D. The probe assemblies 220 may all be identical or substantially similar. Other embodiments may include fewer or more probe assemblies 220.
[0026] Referring further to FIG. 3, FIG. 3 shows a side elevation view of first probe assembly 220A and a partial cross-sectional view of platform 212 and dilution ring 214. First probe assembly 220A may be similar or identical to all of probe assemblies 220. Probe assembly 220 may be configured to move relative to platform 212. In the embodiment shown in FIG. 2, probe assembly 220 is configured to rotate about an axis extending perpendicular to platform 212. For example, as shown in FIG. 3, first probe assembly 220A may rotate about axis A31. First probe assembly 220A, or one or more portions of first probe assembly 220A, may be configured to move in the Z direction toward and away from platform 212 and dilution ring 214. In some embodiments, first probe assembly 220A may be or operate as a robot.
[0027] The first probe assembly 220A may include a post 324 and an arm 326. The post 324 may pivot, or the arm 326 may pivot about axis A31 to move the arm 326 to a predetermined position. A coupler 328 may extend from the arm 326 and may be coupled to a probe 330. The coupler 328 may also be coupled to a pump 329 or the like to enable liquid to be dispensed or aspirated by the probe 330.
[0028] In the embodiment of FIG. 3 , probe 330 is shown positioned within cuvette 318, which may be one of the cuvettes 218 positioned within dilution ring 214. For example, post 324 may have rotated to a point where probe 330 is positioned above cuvette 318. A mechanism (e.g., a motor and drive, not shown) may move post 324 and / or probe 330 in the Z direction such that probe 330 enters or retracts from cuvette 318. Probe 330 may then aspirate and / or dispense liquid from or into cuvette 318. If there is an error in the aspirating or dispensing operation, liquid may spill from probe 330 onto surface 212S of platform 212 or onto other components within chamber 102, as described herein.
[0029] In the example of FIG. 2 , the first probe assembly 220A may be configured, for example, to transfer a specimen (not shown in FIG. 2 ) from a sample container in one or more racks (not shown) to a cuvette 218 in the dilution ring 214. The second probe assembly 220B may be configured to transfer a specimen (e.g., a diluted specimen) from a cuvette 218 in the dilution ring 214 to a cuvette 218 in the reaction ring 216. The third probe assembly 220C and the fourth probe assembly 220D may be configured to transfer a reagent (not shown in FIG. 2 ) to a cuvette 218 in the reaction ring 216. If an error occurs during an aspiration, dispensing, or transfer operation performed by any of the probe assemblies 220, liquid may spill onto the platform 212 or onto other components in the chamber 102. The probe assemblies 220 may be operated by a computer 108 ( FIG. 1 ) and a program 108C running on the computer 108.
[0030] The chamber 102 may include one or more wash stations configured to wash the cuvettes 218. In the embodiment of FIG. 2, a first wash station 222A is located proximate to the diluent ring 214 and is configured to wash the cuvettes 218 therein. In the embodiment of FIG. 2, a second wash station 222B is located proximate to the reaction ring 216 and is configured to wash the cuvettes 218 therein. The first wash station 222A and the second wash station 222B may include multiple probes (not shown in FIG. 2) that apply and remove liquid from the cuvettes 218 to wash them. If an error occurs during one or more of the wash processes, liquid may spill from the first wash station 222A and / or the second wash station 222B. The liquid may spill onto the platform 212 or onto other components within the chamber 102, as described herein. The operation of the first washing station 222A and the second washing station 222B may be controlled by the computer 108 (FIG. 1) and a program 108C running on the computer 108.
[0031] The chamber 102 may include one or more mixers configured to mix the liquids in the cuvettes 218. In the embodiment of Figure 2, the chamber 102 includes three mixers 226, including a dilution mixer 226A, a reagent mixer 226B, and a analyte mixer 226C. The dilution mixer 226A is configured to mix the liquids in the cuvettes 218 in the dilution ring 214. The reagent mixer 226B and the analyte mixer 226C are configured to mix the liquids in the cuvettes 218 in the reaction ring 216.
[0032] Referring further to FIG. 4, FIG. 4 shows a side elevation view of dilution mixer 226A and a partial cross-sectional view of dilution ring 214. Dilution mixer 226A may be similar to or identical to reagent mixer 226B and / or specimen mixer 226C. Dilution mixer 226A may include a motor 430 configured to rotate impeller 432. Computer 108 (FIG. 1) may be coupled to motor 430 and configured to generate signals or instructions to motor 430 to rotate impeller 432. Impeller 432 may be configured to move in the Z direction into and out of cuvette 418. The rotating impeller 432 mixes the liquid within cuvette 418. In some embodiments, impeller 432 may move in the Z direction independently of motor 430. In other embodiments, motor 430 may be configured to move in the Z direction, thereby moving impeller 432 in the Z direction.
[0033] Improper mixing by the mixer 226 can damage or distort the cuvette 218. Damage to the cuvette 218 can cause abnormal light absorption during optical analysis, which can invalidate the analysis. Improper mixing can occur if the impeller 432 is not properly aligned with the cuvette 418 in the Z direction. In other embodiments, the cuvette 418 can be damaged if the impeller 432 contacts the cuvette 418, such as by being misaligned in the Z direction, X direction, or Y direction (FIG. 1).
[0034] As discussed above, damage to the cuvette 418 can result in unexpected light scattering during optical analysis. In other embodiments, if the impeller 432 stops rotating, improper mixing of the liquid in the cuvette 418 can occur. Improper mixing can result in erroneous optical analysis. In some embodiments, uncontrolled mixing, such as mixing at a high or dangerous speed, can also cause liquid to spill from the cuvette onto the platform 212 or any other components in proximity to the cuvette 418. Liquid can also splash back onto the mixer motor 430 and impeller 432, which can damage the mixer 226.
[0035] The diagnostic instrument 100 (FIG. 1) can include an optical inspection system configured to perform optical analysis on analytes located in cuvettes 218 within the reaction ring 216. See FIG. 5, which shows a partial cross-sectional view of the reaction ring 216 of the platform 212 including an optical inspection system 538. The optical inspection system 538 can be located below the platform 212 and / or reaction ring 216 such that it is isolated from any extraneous light within the chamber 102 above the platform 212, as shown in FIG. 5.
[0036] In the embodiment of FIG. 5, the optical inspection system 538 can include an imaging device 540 and at least one illumination source. In the embodiment of FIG. 5, the optical inspection system 538 includes a front illumination source 542A and a back illumination source 542B. The front illumination is provided on the same side of the cuvette 514 as the imaging device 540, and the back illumination is provided on the opposite side of the cuvette 514 from the imaging device 540. The reaction ring 216 can rotate so that different ones of the cuvettes 218 ( FIG. 2 ) can be within the imaging position 541 of the imaging device 540. The imaging position can be the position at which the imaging device 540 is focused.
[0037] In the configuration of FIG. 5 , the cuvette 514 is positioned at an imaging position 541 of the imaging device 540 and / or the optical inspection system 538. During optical analysis, at least one of the front-illumination source 542A or the back-illumination source 542B illuminates the cuvette 514. Thus, the imaging position 541 may be a position where the cuvette 514 can be illuminated by at least the front-illumination source 542A or the back-illumination source 542B and where a focused image can be obtained. While the cuvette 514, and therefore the liquid located therein, is illuminated, the imaging device 540 captures an image of the cuvette 514 and the liquid located therein. The image captured by the imaging device 540 can be analyzed by a program 108C ( FIG. 1 ) running on the computer 108, as described herein. In some embodiments, the image captured by the imaging device 540 can be displayed on the display 106 ( FIG. 1 ).
[0038] The front-illumination source 542A and the back-illumination source 542B can each emit light of a specific and / or selectable wavelength or spectrum. The light emitted by the front-illumination source 542A can reflect off the liquid in the cuvette 514 and can be captured by the imaging device 540. The captured image includes image data that can be analyzed by the computer 108 (FIG. 1). The computer 108 or a program 108C running on the computer 108 can determine whether at least one analyte is present in the liquid and / or the concentration of at least one analyte in the liquid based on the image data. The back-illumination source 542B can emit light that passes through the cuvette 514 and the liquid 543 contained therein. The imaging device 540 can then capture an image of the liquid 543 in the cuvette 514 and perform the analysis described above.
[0039] In some embodiments, optical inspection system 538 may use a laser and laser light, which in some embodiments may be substantially single wavelength. For example, front-illumination source 542A and / or back-illumination source 542B may be lasers, and imaging device 540 may be a device that measures the laser light and generates a signal in response to receiving the laser light. In some embodiments, imaging device 540 may generate a laser reading based at least in part on the received laser light.
[0040] In some embodiments, when the optical inspection system 538 operates, the environment of the chamber 102 ( FIG. 2 ) is dark, so extraneous light cannot affect the optical inspection system 538. In some embodiments, the chamber 102 can operate with light of a wavelength or spectrum that is not destructive to the liquid 543 in the cuvette 514. In some embodiments, the chamber 102 can operate with light of a wavelength or spectrum that is not destructive to the liquid in the cuvette 514, but that cannot be imaged by the imaging device 540.
[0041] Referring again to FIG. 2 , the chamber 102 may include one or more imaging systems 246 configured to capture images of imaging locations using light of different wavelengths or spectrums. In the embodiment of FIG. 2 , the chamber 102 may include seven imaging systems 246, individually referenced as a first imaging system 246A, a second imaging system 246B, a third imaging system 246C, a fourth imaging system 246D, a fifth imaging system 246E, a sixth imaging system 246F, and a seventh imaging system 246G. Other embodiments of the chamber 102 may include fewer or more imaging systems 246. Each of the imaging systems 246 may be configured to capture images of a specific imaging location within the chamber 102. In some embodiments, two or more imaging locations may overlap.
[0042] 2, each of the imaging systems 246 can illuminate their respective imaging locations. One or more of the imaging locations can include one or more components within the chamber 102. In some embodiments, one or more of the imaging locations can include one or more areas of the platform 212 where liquid may be spilled in response to a failure of a component configured to handle (e.g., transport) or process the liquid. In some embodiments, the imaging locations can include one or more components configured to process or analyze analytes. In other embodiments described herein, the chamber 102 can include one or more illumination sources that illuminate one or more imaging locations. The imaging system 246 can include components configured to conditionally illuminate the imaging locations with light of different wavelengths or spectrums, as described herein.
[0043] Further reference is made to FIG. 6A, which shows a front elevation view of one embodiment of a first imaging system 246A, which may be identical or substantially similar to all of the imaging systems 246. Reference is also made to FIG. 6B, which shows a side elevation view of the first imaging system 246A of FIG. 6A. The first imaging system 246A may be similar to a digital camera configured to capture images of an imaging location and convert the images into image data that can be analyzed by a program 108C (FIG. 1) running on the computer 108. The first imaging system 246A may be housed within a housing 650, which may include electronic components (not shown) that operate the first imaging system 246A and generate image data. All of the imaging systems 246 may be similar to or identical to the first imaging system 246A.
[0044] Housing 650 may include an aperture 652 that allows light to enter housing 650 and be converted into image data by electronics (not shown) located within housing 650. First imaging system 246A may have a field of view 654 defined by lines 654A and 654B when viewed from the side in FIG. 6B . Both lines 654A and 654B may extend to aperture 652. Field of view 654 defines the area that can be imaged by first imaging system 246A, and thus defines imaging location 541.
[0045] The housing 650 can include a first illumination source 656 (e.g., a first light source) and a second illumination source 658 (e.g., a second light source). The first illumination source 656 and the second illumination source 658 can emit light of different wavelengths or spectra. A spectrum of light, as used herein, can include a single wavelength of light or a frequency band of light. In some embodiments, the first illumination source 656 emits a first light comprising light of a first spectrum, and the second illumination source 658 emits a second light comprising light of a second spectrum. In some embodiments, the first light and the second light can have a narrow spectrum or a substantially single wavelength. Both the first illumination source 656 and the second illumination source 658 can emit light in a pattern configured to illuminate the field of view 654 that constitutes the imaging location 541. The illumination pattern as viewed from the side elevation view of FIG. 6B is defined by lines 660A and 660B. Other patterns are possible.
[0046] First imaging system 246A is configured to capture images of an item within field of view 654 illuminated by either or both of first illumination source 656 and second illumination source 658. In some embodiments, first illumination source 656 is configured to illuminate the imaging location with a first light having a first spectrum. The first spectrum may include or be a first wavelength of light. The first wavelength of the first spectrum of light may be, for example, between 900 nm and 1,100 nm. In some embodiments, second illumination source 658 is configured to illuminate the imaging location with a second light having a second spectrum. The second spectrum may include or be a second wavelength of light. The second light may include, for example, a second wavelength of light between 355 nm and 375 nm.
[0047] The second spectrum is more destructive than the first spectrum to the diagnostic instrument and / or the analyte configured to be received within chamber 102. In some embodiments, one or both of first illumination source 656 and second illumination source 658 can include one or more light sources, such as light emitting diodes (LEDs), that emit light at different wavelengths (e.g., different spectra). In some embodiments, first illumination source 656 and second illumination source 658 can be a single illumination device that emits all of the spectra described herein.
[0048] In some embodiments, first illumination source 656 is configured to emit light in the near-infrared spectrum (NIR), which may have a wavelength or wavelengths of approximately 800 nm in some embodiments, but may be anywhere between 750 nm and 2,500 nm in other embodiments. Second illumination source 658 is configured to emit ultraviolet (UV) light having a wavelength or wavelengths of approximately 365 nm in some embodiments, but may be anywhere between 100 nm and 400 nm in other embodiments.
[0049] NIR light may be less destructive than UV light to analytes, such as those in cuvette 218. UV light or other light emitted by second illumination source 658 may be used briefly to detect targets such as blood, serum, or plasma. First imaging system 246A may be configured to capture images of targets illuminated by a first spectrum (e.g., NIR light) and targets illuminated by a second spectrum (e.g., UV light).
[0050] 2, the imaging system 246 can capture images of different imaging locations throughout the chamber 102. An imaging location is a location that can be imaged by the imaging system 246. In the embodiment of FIG. 2, the first imaging system 246A can be configured to capture an image of the dilution mixer 226A. Thus, the imaging location 541 associated with the first imaging system 246A can include the dilution mixer 226A. In some embodiments, the imaging location 541 can also include an area proximate to the dilution mixer 226A.
[0051] 4 illustrates one embodiment of the configuration of the first imaging system 246A relative to the dilution mixer 226A. Other imaging systems located proximate to other ones of the mixers 226 may have similar configurations. The first imaging system 246A may be configured to capture images of the motor 430, the impeller 432, the top surface 214S of the dilution ring 214, and / or the top of the cuvette 418. Thus, one or more of these objects may be at the imaging position 541 or at an imaging position associated with the first imaging system 246A. In some embodiments, images captured by the first imaging system 246A may be displayed on the display 106 (FIG. 1).
[0052] In the embodiment of FIG. 2, the seventh imaging system 246G is configured to capture images of the first probe assembly 220A, further shown in FIG. 3. Other imaging systems may be configured to capture similar images for others of the probe assemblies 220. The seventh imaging system 246G may be configured to capture images of the probe 330, the coupler 328, the top surface 214S of the dilution ring 214, and / or the top of the cuvette 318. Thus, one or more of these objects may be at the imaging location 341 or at an imaging location associated with the seventh imaging system 246G. Images captured by the seventh imaging system 246G may be displayed on the display 106 (FIG. 1).
[0053] 2, the second imaging system 246B is configured to capture images of the first cleaning station 222A, and the third imaging system 246C is configured to capture images of the second cleaning station 222B. In some embodiments, the second imaging system 246B and the third imaging system 246C can also be configured to capture images of areas proximate the first cleaning station 222A and the second cleaning station 222B, respectively. Images captured by the second imaging system 246B and / or the third imaging system 246C can be displayed on the display 106 (FIG. 1).
[0054] During operation of the diagnostic instrument 100 (FIG. 1), the chamber 102 can be closed to prevent ambient light from entering the chamber 102. Ambient light can damage the specimen and / or reagents located within the chamber 102. Referring to FIG. 2, the specimen can be located within the cuvette 218 and / or the probe assembly 220. The interior of the chamber 102 can be illuminated in a monitoring mode with a first light that is not destructive to the specimen and / or reagents. The first light can be light of a first spectrum. In some embodiments, the first light can be, for example, IR or NIR light. In other embodiments, light of other spectrums that are non-destructive to the specimen can be used. The first light can illuminate one or more of the imaging locations for a first period of time, which can be indefinite, such as when the first light is used for monitoring purposes.
[0055] The first light may not provide enough illumination for the visual inspection system to accurately analyze the object at the imaging location. If it is determined that additional analysis is necessary, such as if a liquid spill is suspected, the diagnostic instrument 100 (FIG. 1) or computer 108 (FIG. 1) can determine a second spectrum of light that can be used to illuminate the imaging location 341, 541. If the second spectrum of light is destructive to the analyte or other liquid, the diagnostic instrument 100 or computer 108 can determine the duration for which the second spectrum is used to illuminate the imaging location.
[0056] 7A and 7B, which form a flowchart illustrating one embodiment of a method 700 for operating a diagnostic instrument, such as diagnostic instrument 100 (FIG. 1). Method 700 begins at block 702 with initiating a visual inspection. Initiating the visual inspection may include determining that it is necessary to capture images of one or more of the imaging locations. Reasons for capturing images may include maintenance and diagnostics, such as determining the cause of an error in the operation of diagnostic instrument 100. Another reason for capturing an image may be the detection of a liquid spill in chamber 102. In some embodiments, initiating the visual inspection occurs when diagnostic instrument 100 begins operating in a monitoring mode, as described above.
[0057] Processing continues to decision block 704, where a determination is made whether the diagnostic instrument 100 is operating at a normal runtime. Normal runtime includes the time that the diagnostic instrument 100 is operating with a sample located therein or with a sample located in chamber 102. Normal runtime can include the time that the diagnostic instrument 100 is operating with at least one reagent located in chamber 102. In some embodiments, normal runtime is when the diagnostic instrument 100 is analyzing a sample, such as when a sample is being analyzed in chamber 102.
[0058] If the result of decision block 704 is negative, the diagnostic instrument 100 may be in a state where the chamber 102 can be accessed without damaging the specimen or reagents. For example, because no specimen and / or reagents are present in the chamber 102, the chamber 102 may be exposed to light of any of the spectrums. Processing then proceeds to block 706, where any spectrum of light for visual inspection can be selected. The spectrum of light can be optimized, by way of example, based on the type of visual inspection being performed. For example, if spilled blood, plasma, or serum is being imaged during visual inspection, UV light can be used to illuminate the imaging location being inspected. Processing proceeds to 708, where the imaging location is illuminated using the spectrum selected in block 706.
[0059] 6A , at least one of first illumination source 656 or second illumination source 658 can generate light of a selected spectrum. Processing then proceeds to block 710, where one or more images are captured of the imaging locations illuminated in block 708. For example, at least one of imaging systems 246 ( FIG. 1 ) can be used to capture the one or more images. In block 712, the one or more images are analyzed. For example, the image data of the imaging locations can be analyzed by computer 108 and / or program 108C. In some embodiments, the captured images can be displayed on display 106. In some embodiments, the analysis in 712 can detect spills or analyze operating characteristics of components within chamber 102.
[0060] Returning again to decision block 704, if the result is positive, the diagnostic instrument 100 is operating in runtime. In such a situation, a specimen may be located in the chamber 102 to be analyzed and / or a reagent may be located in the chamber 102 to be mixed with the specimen. In such a situation, if any visual inspection using a destructive spectrum is performed, the specimen and / or reagent may be exposed to visible light or light in a spectrum that is damaging to the specimen and / or reagent.
[0061] If so, processing proceeds to block 714 in response to the diagnostic instrument 100 operating in runtime. At block 714, a determination is made regarding a non-destructive first spectrum of light that can be used for optical monitoring within the chamber 102. In some embodiments, one or more programs 108C executing within the computer 108 determine the analytes and / or reagents present within the chamber 102 during runtime. The programs 108C can also determine the specific locations of the analytes and / or reagents within the chamber 102 during runtime. Based at least in part on the analytes and / or reagents that may be present within the chamber 102 at the time that monitoring is to be performed during runtime, the programs 108C can search for or determine a non-destructive first spectrum that can be used for monitoring. For example, if a blood, serum, or plasma analyte is present within the chamber 102, an IR or NIR spectrum can be selected for monitoring, provided that the IR or NIR spectrum does not damage reagents that may be exposed to the IR or NIR spectrum. Other first spectra can be used for other analyte types and the respective reagents used to analyze these other analyte types. A first time period during which the first spectrum is used to illuminate the imaging location may also be selected.
[0062] Processing then proceeds to block 716, where the imaging locations are illuminated using the first spectrum. In the embodiment shown in FIGS. 2-4, the imaging systems 246 may illuminate their respective imaging locations with light of the first spectrum. In some embodiments, only selected ones of the imaging systems 246 or other illumination systems may illuminate their respective imaging locations. In some embodiments, the imaging locations are illuminated for a first period of time.
[0063] 3, for example, an illumination source in seventh imaging system 246G can illuminate probe 330, cuvette 318, and / or top surface 214S of dilute ring 214 with light of a first spectrum. As another example, referring to FIG. 4, an illumination source in first imaging system 246A can illuminate portions of dilution mixer 226A, such as impeller 432 or motor 430, cuvette 418, and / or top surface 214S of dilute ring 214. Other imaging locations can be illuminated by their respective illumination sources.
[0064] 7A and 7B, processing then proceeds to block 718, where one or more images of the imaging locations illuminated by the first spectrum are captured. Referring again to FIG. 3 as an example, an imaging device in seventh imaging system 246G can capture one or more images of coupler 328, probe 330, cuvette 318, and / or top surface 214S of diluent ring 214. Referring again to FIG. 4 as another example, an imaging device in first imaging system 246A can capture one or more images of one or more portions of diluent mixer 226A, such as motor 430 or impeller 432, cuvette 418, and / or top surface 214S of diluent ring 214. Other imaging locations can be captured by other imaging devices. One or more images captured by the imaging devices can be displayed on display 106 (FIG. 1).
[0065] Processing then proceeds to block 720, where one or more of the captured images are analyzed. The analysis at 720 may identify one or more objects within the captured images. In some embodiments, the images captured at block 718 may be video images, and the analysis at block 720 may include analysis of the video images. Alternatively, or in addition, still images may be captured. With reference to FIG. 3, the analysis at block 720 may include analysis of the position of the probe 330 using a first spectrum (e.g., an IR or NIR spectrum). For example, the analysis may determine the position of the probe 330 relative to the cuvette 318 and / or the diluent ring 214. In some embodiments, the position of the probe 330 in the Z direction is determined by the analysis at block 720. With reference to FIG. 4, the analysis at block 720 may determine the position and / or alignment of the impeller 432 relative to the cuvette 418 and / or the diluent ring 214. The analysis in block 720 may be performed by one or more of programs 108C or by a user of diagnostic equipment 100 viewing the captured images, such as on display 106. Again, the images may be video images and / or one or more still images.
[0066] Processing may then proceed to block 722, where a determination is made as to whether light of a second spectrum for a second analysis is needed, and if so, light of the second spectrum for additional analysis is determined in block 722. In some embodiments, if a liquid spill is detected or suspected at the imaging location based on the analysis in block 720, a second analysis using light of the second spectrum may better analyze the imaging location. In situations where blood, plasma, or serum spill is suspected based on the analysis, the determination in block 722 may be that IR light (second spectrum) may provide more appropriate illumination for a more accurate analysis.
[0067] For example, the suspected liquid spill may have occurred as a result of an error in mixing using one or more of the mixers (e.g., mixer 226A). In another embodiment, a collision of one or more items in chamber 102 may prompt computer 108 to further analyze chamber 102 to determine whether liquid 543 has spilled. In other embodiments, an error in the operation of one or more of probe assemblies 220 may have caused the liquid spill. In other embodiments, an error in the operation of first cleaning station 222A and / or second cleaning station 222B may have caused the liquid spill. In other embodiments, an error in mixer motor 430 may have caused the liquid spill as described above.
[0068] Referring now to FIG. 7B , processing proceeds to decision block 724, where a determination is made as to whether the objects at the imaging locations are damaged by the light of the second spectrum. In some embodiments, decision block 724 can determine the degree to which the objects at the imaging locations are damaged. If the result of decision block 724 is negative, or the degree of damage is less than a predetermined threshold, processing proceeds to block 728, where the imaging locations are now illuminated using light of the second spectrum. A negative result of decision block 724 means that the light of the second spectrum does not damage the objects at one or more imaging locations. Processing can then proceed to block 730, where one or more images of the imaging locations illuminated by the second spectrum are captured. Processing can then proceed to block 732, where the captured images are analyzed. In some embodiments, display 106 ( FIG. 1 ) can display one or more of the images. In some embodiments, one or more imaging systems 246 capture video images that are analyzed. Alternatively, or in addition, a still image may be captured.
[0069] In response to a positive (YES) outcome at decision block 724, processing proceeds to block 736, where an illumination period for illuminating the imaging location with light of the second spectrum is determined. This illumination period may be referred to as a second period or second illumination period. In some embodiments, computer 108 may execute the determination made at block 736. The illumination period is a period during which the object in chamber 102 can be exposed to light of the second spectrum without damaging the object, or with only slight or less than a predetermined amount of damage to the object. In some embodiments, the second illumination period may be less than 150 ms, such as about 100 ms, which may be sufficient time to capture an image of the object (e.g., blood, serum, or plasma) without any significant damage to the object. In some embodiments, the second spectrum may allow for a longer second illumination period, such as 100 ms to 200 ms, without damaging the object, thereby allowing for more accurate image capture. In some embodiments, the second imaging period may be even shorter than 100 ms, since even slight exposure to the second spectrum can be damaging to the subject, hi some embodiments, the second illumination period may be, for example, about 150 μs.
[0070] Processing proceeds to block 738, where the imaging location is illuminated using the second spectrum for the second illumination period determined in block 736. Processing then proceeds to block 740, where one or more images are captured of the imaging location illuminated with light of the second spectrum for the second illumination period. The one or more images can then be analyzed as described herein in block 742.
[0071] In other embodiments, manual monitoring may be performed, for example, by a user with limited experience inspecting objects illuminated by light in a first spectrum (e.g., NIR). In such embodiments, illumination with only the first spectrum may not provide adequate illumination for capture and / or analysis. To overcome this problem, the imaging location may be illuminated with a second spectrum, which may be more disruptive than the first spectrum, for a short period of time. For example, when a video image is captured, the video image captured using illumination at the first spectrum may be interleaved with short, strobe-like flashes using illumination at the second spectrum. In some embodiments, illumination at the second spectrum may occur at regular intervals. In some embodiments, illumination at the second spectrum may occur for a second illumination period of, for example, 100 ms. Other second illumination periods may also be used. The use of the second spectrum interleaved with the first spectrum may allow a human to better see and identify objects in the captured video.
[0072] Reference is now made to FIG. 8, which is a flow chart illustrating a method 800 of operating a diagnostic instrument (e.g., diagnostic instrument 100). Method 800 includes, at block 802, illuminating an imaging location of the diagnostic instrument with a first light having a first spectrum for a first illumination period. Method 800 includes, at block 804, capturing a first image of the imaging location illuminated by the first light. Method 800 includes, at block 806, illuminating the imaging location of the diagnostic instrument with a second light having a second spectrum for a second illumination period, the second spectrum being more destructive to chemicals accepted by the diagnostic instrument than the first spectrum. Method 800 includes, at block 808, capturing a second image of the imaging location illuminated by the second light.
[0073] Reference is now made to FIG. 9 , which is a flowchart illustrating a method 900 for operating a diagnostic device (e.g., diagnostic device 100). Method 900 includes, at 902, illuminating an imaging location of the diagnostic device with a first light having a first spectrum for a first period of time. Method 900 includes, at 904, capturing a first image of the imaging location illuminated by the first light. Method 900 includes, at 906, analyzing the first image. Method 900 includes, at 908, determining, based on the analyzing, a second light to illuminate the imaging location, the second light having a second spectrum, the second spectrum being more destructive to analytes acceptable to the diagnostic device than the first spectrum. Method 900 includes, at 910, determining, based on the analyzing, a second period of time during which the second light should illuminate the imaging location, the second period of time being shorter than the first period of time. The method 900 includes illuminating the imaging location with a second light for a second period of time, at 912. The method 900 includes capturing a second image of the imaging location illuminated by the second light, at 914.
[0074] While the disclosure is susceptible to various modifications and alternative forms, specific method and apparatus embodiments have been shown by way of example in the drawings and are herein described in detail. It is to be understood, however, that the particular methods and apparatus disclosed herein are not intended to limit the disclosure, but on the contrary, the disclosure is intended to cover all modifications, equivalents, and alternatives falling within the scope of the claims.
Claims
1. 1. A diagnostic device comprising: Imaging position; a first illumination source configured to illuminate the imaging location with first light having a first spectrum for a first time period; a second illumination source configured to illuminate the imaging location with second light having a second spectrum for a second time period, the second spectrum being more destructive to analytes acceptable to the diagnostic equipment than the first spectrum, the second time period being shorter than the first time period; an imaging device configured to capture a first image of the imaging location illuminated by a first light and a second image of the imaging location illuminated by a second light; A computer comprising: Analyzing the first image; determining a second spectrum in response to analyzing the first image; Determining a second time period in response to analyzing the first image. a computer configured to execute instructions; The diagnostic device comprising:
2. 10. The diagnostic instrument of claim 1, wherein the computer is configured to identify one or more objects in the first image and determine whether the one or more objects will be damaged by exposure to the second light.
3. A method of operating the diagnostic device of claim 1, comprising: illuminating an imaging location of a diagnostic instrument with first light having a first spectrum for a first illumination period; capturing a first image of an imaging location illuminated by the first light; illuminating an imaging location of the diagnostic instrument with second light having a second spectrum for a second illumination period, the second spectrum being more destructive to chemicals acceptable to the diagnostic instrument than the first spectrum; capturing a second image of the imaging location illuminated by a second light; The analyzing includes identifying one or more objects in the first image and determining the extent to which the one or more objects are damaged by exposure to the second light; The method comprising:
4. 4. The method of claim 3, comprising analyzing the first image, and wherein illuminating the imaging location of the diagnostic equipment with the second light comprises illuminating the imaging location of the diagnostic equipment with the second light in response to the analyzing.
5. 5. The method of claim 4, wherein analyzing includes identifying one or more objects in the first image and determining whether the one or more objects will be damaged by exposure to the second light.
6. The method of claim 4 , wherein analyzing includes determining a second illumination period.
7. The method of claim 3 , wherein the first light is infrared or near-infrared light.
8. The method of claim 3 , wherein the first light comprises a wavelength between 900 nm and 1,100 nm.
9. The method of claim 4 , wherein the second light is ultraviolet light.
10. The method of claim 4 , wherein the second light comprises a wavelength between 355 nm and 375 nm.
11. The method of claim 3 , wherein the second illumination period is less than 150 ms.
12. The method of claim 3 , wherein the second illumination period is about 100 ms.
13. The method of claim 3 , wherein the imaging location includes a component configured to process the specimen.
14. The method of claim 3 , comprising receiving a specimen, the specimen being positioned at an imaging location.
15. A method of operating the diagnostic device of claim 1, comprising: illuminating an imaging location of a diagnostic instrument with first light having a first spectrum for a first illumination period; capturing a first image of an imaging location illuminated by the first light; analyzing the first image; determining, based on the analyzing, a second light illuminating the imaging location, the second light having a second spectrum, the second spectrum being more destructive to an analyte acceptable to the diagnostic instrument than the first spectrum; determining a second illumination period during which the second light should illuminate the imaging location based on the analyzing, the second illumination period being shorter than the first illumination period; illuminating the imaging location with a second light for a second illumination period; capturing a second image of the imaging location illuminated by the second light; The analyzing includes identifying one or more objects in the first image and determining the extent to which the one or more objects are damaged by exposure to the second light; The method comprising:
16. 16. The method of claim 15, wherein analyzing includes identifying one or more objects in the first image and determining whether the one or more objects will be damaged by exposure to the second light.
17. 16. The method of claim 15, wherein the one or more subjects is at least one specimen.
18. The method of claim 15 , wherein the first light is infrared or near-infrared light.
19. The method of claim 15 , wherein the second light is ultraviolet light.
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