Conductive particle coating method for dielectric strength testing

Abstract

This invention relates to production and testing technologies for cells, particularly to a conductive particle coating type dielectric withstand voltage test method. The method includes the steps of: assembling a cell awaiting measurement by pressing an electrode protective cover plate onto the electrodes in the insulating layer of the cell; moving the cell awaiting measurement into a metal groove; filling the space between the metal groove and the insulating layer of the cell awaiting measurement with conductive particles; connecting the ground terminal of the dielectric withstand voltage testing equipment to the cell awaiting measurement with a conductor; and connecting the high-voltage terminal of the dielectric withstand voltage testing equipment to the metal groove with a second conductor. Testing the cell awaiting measurement with the dielectric withstand voltage testing equipment allows the insulating coating layer of the cell awaiting measurement to be sufficiently coated with conductive particles, thus avoiding the formation of gaseous portions (bubbles or gas gaps) between the conductive medium and the insulating coating layer, preventing the concealment of defects such as insufficient insulation in the cell coating layer due to excessive impedance in the gaseous portion, and preventing cells that fail the insulation test from being released.

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