A CIRCUIT INTERRUPTION DEVICE FOR PROVIDING A FAIL-SAFE LOCKOUT TRIP MECHANISM OR A TEMPERATURE-ACTIVATED PERMANENT LOCKOUT TRIP MECHANISM IN RESPONSE TO A SELF-TEST

Abstract

A circuit-interrupting device comprises a heat-generating conductor and a temperature-activated, permanently locking trip mechanism. The mechanism includes a plunger, a compressed or extended spring, and a fusible metal to hold the plunger. The mechanism is located near the heat-generating conductor and is configured such that when the fusible metal melts when at least one heating element is energized, or a holding wire melts when energized in response to a failed self-test, the plunger is released. This allows the compressed or extended spring to convert its potential energy into kinetic energy, moving the plunger to generate a force that unlocks a latch by releasing a first spring to open a contactor switch, thereby removing energy from an electrical circuit.The constant force generated by the compressed or stretched spring on the plunger prevents the circuit-breaking device from resetting.

Description

A CIRCUIT INTERRUPTION DEVICE TO PROVIDE A FAIL-SAFE LOCKOUT TRIP MECHANISM OR A TEMPERATURE-ACTIVATED PERMANENT LOCKOUT TRIP MECHANISM IN RESPONSE TO A SELF-TEST BACKGROUND 1. Field The aspects of the present invention generally relate to a circuit interrupting device that provides a fail-safe lockout trip mechanism or a temperature-activated permanent lockout trip mechanism in response to a self-test. 2. Description of the related technique Electrical power is distributed to loads in buildings using insulated conductors of varying sizes, chosen to handle the current supplied to the load. The amount of current required for safe continuous operation of a particular wire gauge is known as the rated current. If the rated current is exceeded, the conductor will overheat to the point where the insulation melts, resulting in hazardous conditions of electric shock due to the exposed voltage energy and flame ignition due to the exposed thermal energy. Initially, fuses were implemented to prevent these dangerous conditions resulting from electrical circuit overload. Fuses were eventually replaced by circuit breakers, which function as resettable switches. The circuit breaker typically has a robust, spring-loaded main contactor, but is held in the closed switching position by a latch. For dangerous overload current situations exceeding approximately 800% to 1000% of the rated current in the electrical circuit, the dangerous overload current itself is used to generate a magnetic force to unlock the latch, releasing a spring to open the contactor switch and cutting power to the electrical circuit. For dangerous overload current situations exceeding 135% but less than approximately 800% to 1000%, a bimetallic device in series with the electrical current is positioned near the latch. The heat generated by the overload current causes the bimetallic device to deform, generating a force to unlock the latch, releasing a spring to open the contactor switch and cutting power to the electrical circuit. Currently, and in the very near future, alternative methods for detecting dangerous overload current are being developed. These methods use a solenoid or electromagnet to generate a magnetic force that unlocks the latch, releasing a spring to open the contactor switch and remove energy from the electrical circuit. In many applications, the solenoid or electromagnet is activated by a solid-state switch. Typically, the current used to activate the solenoid or electromagnet exceeds the rated capacity of the wire used in the solenoid or electromagnet winding. CQAcnn / C7n7 / e / YiAi The rated capacity of the solid-state circuit breaker could be exceeded, and the solenoid or electromagnet and the solid-state circuit breaker could be damaged if the release mechanism's response is slow and it fails to disconnect the power within a few cycles of activation, or worse, fails to disconnect the power at all. Therefore, a mechanism is needed to permanently disconnect the power from the electrical circuit in case the solenoid or electromagnet or the solid-state circuit breaker is damaged and / or becomes inoperative. Furthermore, electronic circuits are used to detect electrical circuit faults, such as overload faults, ground faults, and arcing faults. The electronic components that make up these detection circuits are subjected to normal operating and ambient stress, which can eventually lead to component and circuit failures. Self-testing or self-monitoring methods / circuits check or monitor the trip circuit, power supply, sensors, and detection circuits to ensure they are functioning correctly. Currently, the response to a malfunction has been to energize the trip circuit by opening the main contact switch, thus removing power from the electrical circuit. However, there are two problems. First, the circuit breaker may reset, and it can take a few seconds for a response from the self-test or self-monitoring process or circuit to trip the breaker, potentially allowing brief exposure to a hazardous condition. Second, if the malfunction is in the trip circuit, the main contact remains closed, potentially allowing exposure to a hazardous situation indefinitely. Therefore, there is a need for a better circuit-interrupting device. SYNTHESIS Briefly described, the aspects of the present invention relate to a circuit-interrupting device that provides a fail-safe lock-out tripping mechanism in response to a self-test. The invention solves the problem by using fusible metal, such as solder or a low-melting-point metal alloy, to hold a plunger in place. This plunger is subjected to a constant force exerted by a compressed or stretched spring. Ideally, the device is located near a heat-generating conductor and is configured so that when the fusible metal melts, the plunger is released, allowing a spring to convert its potential energy into kinetic energy. This movement of the plunger generates a force to unlock the latch, releasing a spring to open the contactor switch and remove energy from the electrical circuit.From there, the constant force generated by the spring on the plunger inhibits the resetting of a circuit breaker that permanently prevents the reconnection of energy to the electrical circuit. In one embodiment, the invention has fusible metal that is energized to generate heat in response to a malfunction in the trip circuit, power source, sensors, or electronic sensing circuits, which melts the fusible metal, releasing the plunger and allowing a spring to convert potential energy into kinetic energy, moving the plunger to generate a force that unlocks the latch, releasing a spring to open the contactor switch, removing energy from the CQRcnn / C7n7 / e / YiAi electrical circuit. From there, the constant force generated by the spring on the plunger inhibits the resetting of a circuit breaker that permanently prevents the reconnection of power to the electrical circuit. In another embodiment, the invention has heating elements surrounding the fusible metal, which is energized in response to a malfunction in the trip circuit, power source, sensors, or electronic detection circuits. This energized metal melts, releasing the plunger and allowing a spring to convert potential energy into kinetic energy. This movement of the plunger generates a force that unlocks the latch, releasing a spring to open the contactor switch and remove energy from the electrical circuit. The constant force generated by the spring on the plunger then inhibits the resetting of a circuit breaker, permanently preventing the reconnection of power to the electrical circuit. According to an illustrative embodiment of the present invention, a circuit-interrupting device comprises a conductor capable of generating heat and a temperature-activated permanent lock-up trip mechanism that includes: a plunger, a compressed or stretched spring, and a fusible metal for holding the plunger in place, which has a constant force exerted on it by the compressed or stretched spring.The temperature-activated permanent lockout trip mechanism is located near the heat-generating conductor and is configured so that when the fusible metal melts when at least one heating element is energized, or a clamping wire melts when energized in response to a failed self-test, the plunger is released. This allows the compressed or stretched spring to convert its potential energy into kinetic energy, moving the plunger to generate a force that unlocks a latch by releasing a first spring to open a contactor switch, thus removing power from an electrical circuit. The constant force generated by the compressed or stretched spring on the plunger prevents the circuit-interrupting device from resetting, permanently preventing power from being reconnected to the electrical circuit. According to an illustrative embodiment of the present invention, a method for providing a fail-safe lockout trip mechanism for a circuit-interrupting device in response to a self-test. The method comprises providing a conductor capable of generating heat and providing a temperature-activated permanent lockout trip mechanism that includes: a plunger, a compressed or stretched spring, and a fusible metal for holding the plunger in place, which has a constant force exerted on it by the compressed or stretched spring.The temperature-activated permanent lockout trip mechanism is located near the heat-generating conductor and is configured so that when the fusible metal melts when at least one heating element is energized, or a clamping wire melts when energized in response to a failed self-test, the plunger is released. This allows the compressed or stretched spring to convert its potential energy into kinetic energy, moving the plunger to generate a force that unlocks a latch by releasing a first spring to open a contactor switch, thus removing power from an electrical circuit. The constant force generated by the compressed or stretched spring on the plunger prevents further operation. CQRcnn / C7n7 / e / YiAi that the circuit interrupting device is reset, which permanently prevents power from being reconnected to the electrical circuit. According to an illustrative embodiment of the present invention, a circuit-interrupting device comprises a conductor and a temperature-activated permanent-lock trip mechanism that includes: a plunger, a compressed or stretched spring, and a fusible metal for holding the plunger in place, which has a constant force exerted on it by the compressed or stretched spring. The temperature-activated permanent-lock trip mechanism is configured such that when the fusible metal melts, the plunger is released, allowing the compressed or stretched spring to convert its potential energy into kinetic energy, and moving the plunger to generate a force to unlock a latch that releases a first spring to open a contactor switch, thereby removing energy from an electrical circuit.The constant force generated by the compressed or stretched spring in the plunger prevents the circuit-breaking device from resetting, permanently preventing power from being reconnected to the electrical circuit. BRIEF DESCRIPTION OF THE FIGURES Figure 1 illustrates a circuit interrupting device that provides a fail-safe lockout tripping mechanism in response to a self-test according to an exemplary embodiment of the present invention. Figure 2 illustrates a circuit interruption device according to an alternative embodiment of the present invention. Figure 3 illustrates the embodiment in its mechanical form when the circuit interrupting device is in a “reset” state according to an exemplary embodiment of the present invention. Figure 4 illustrates the embodiment in its mechanical form when the circuit interrupting device is in an “activated” state according to an exemplary embodiment of the present invention. Figure 5 illustrates the embodiment in its mechanical form when the circuit interrupting device is in a “triggered” state according to an exemplary embodiment of the present invention. Figure 6 illustrates an empirical model of the temperature versus time characteristic of a conductor capable of generating heat in the section of a nominal 20A circuit breaker during various calibration tests according to an exemplary embodiment of the present invention. Figure 7 illustrates a temperature-activated permanent locking trigger mechanism according to an exemplary embodiment of the present invention. Figure 8 illustrates an alternative view of the temperature-activated permanent locking trigger mechanism with a base that is transparent according to an exemplary embodiment of the present invention. Figure 9 illustrates an alternative embodiment of the temperature-activated permanent lockout trip mechanism contained in this alternative embodiment of a circuit interrupting device according to an exemplary embodiment of the present invention. Figure 10 illustrates another alternative embodiment similar to that of Figure 2 according to an exemplary embodiment of the present invention. Figure 11 illustrates a circuit interrupting device similar to the embodiment shown in Figure 10 according to an exemplary embodiment of the present invention. Figure 12 illustrates another alternative embodiment of the temperature-activated permanent lockout trip mechanism contained in this alternative embodiment of a circuit interrupting device according to an exemplary embodiment of the present invention. Figure 13 illustrates another embodiment that does not include a section of a conductor that is intentionally configured to generate heat according to an exemplary embodiment of the present invention. Figure 14 illustrates a schematic view of a flowchart of a method for providing a fail-safe lockout tripping mechanism for a circuit interrupting device in response to a self-test according to an exemplary embodiment of the present invention. DETAILED DESCRIPTION To facilitate understanding of the embodiments, the principles and features of the present invention are explained below with reference to implementation in illustrative embodiments. In particular, they are described in the context of a circuit-interrupting device that provides a fail-safe lock-out tripping mechanism in response to a self-test. However, the embodiments of the present invention are not limited to use in the devices or methods described.This invention provides a method and apparatus for generating a force to unlock the latch by releasing a spring to open a contactor switch by removing energy from an electrical circuit within the calibration trip time limits specified in UL489 if a trip circuit solenoid or electromagnet or a solid-state switch is damaged and / or becomes inoperative, or if a current sensor or an overload current detection electronic circuit / apparatus is damaged or becomes inoperative. Furthermore, this invention provides a method and apparatus for generating a force to unlock the latch by releasing a spring to open the contactor switch by removing energy from the electrical circuit in response to a detected malfunction in a trip circuit, power source, sensors, or any of the detection electronic circuits.The invention also permanently prevents a circuit-interrupting device from resetting and re-energizing the electrical circuit. Ultimately, this invention provides a fail-safe backup mechanism to permanently remove power from the electrical circuit within the calibration trip time limits specified in UL489 if the trip circuit, current sensor, or overload current detection electronic circuit / apparatus becomes damaged or inoperative; or a fail-safe mechanism to permanently remove power from the electrical circuit in response to a malfunction of the trip circuit, power source, sensors, or any of the detection electronic circuits. CQRcnn / C7n7 / e / YiAi The components and materials described below as components of the various embodiments are intended to be illustrative and not restrictive. Many suitable components and materials that would perform the same or a similar function to the materials described herein are intended to be included within the scope of the embodiments of the present invention. These and other embodiments of the circuit-interrupting device according to this disclosure are described below with reference to Figures 1-14 herein. Similar reference numbers used in the drawings identify similar or identical elements throughout the various views. The drawings are not necessarily drawn to scale. According to one embodiment of the present invention, Figure 1 represents a circuit interrupting device 100 according to an exemplary embodiment of the present invention. Figure 1 illustrates the circuit interrupting device 100 providing a fail-safe lockout trip mechanism or a temperature-activated permanent lockout trip mechanism 109 in response to a self-test according to an exemplary embodiment of the present invention. The circuit-interrupting device 100 comprises a hot conductor 101, a main contactor switch 103 that is spring-loaded but held in a closed switching position by a latch, and an optional electromagnetic device 104 configured to instantaneously generate a magnetic force capable of unlocking the latch by releasing a spring to open the contactor switch 103, thereby removing power from an electrical circuit when a dangerous overload current exceeds 800% of the rated load current. The circuit-interrupting device 100 comprises a section of conductor 105 that generates heat, and a trip circuit 111 in the form of a solenoid or electromagnet 107 such that when a switch 110 is closed, the solenoid is arranged across a hot conductor 101 and a connection to a neutral conductor 102.A metal oxide varistor (MOV) 108 is also provided across a hot conductor and a neutral conductor where it protects the electronics from overvoltages. The circuit interruption device 100 comprises an electronic circuit for detecting overload current and / or ground fault and / or arc fault 114 with its corresponding sensor(s) 116, a self-test or self-monitoring module 115, a power supply 113, and the temperature-activated permanent lockout trip mechanism 109 located very close to the section of conductor 105 that generates heat. The power supply 113 provides suitable voltage and current to the electronic detection circuit 114 and the self-test module 115 and / or the sensor(s) 116 from the hot conductor 101. The sensors 116 are configured to detect vibration and / or heat, or to detect voltage and / or current in the hot conductor 101 and / or the neutral conductor 102, the output of which is coupled to the electronic detection circuit 114.The electronic detection circuit 114 is configured to receive the output from sensors 116. It processes the data to determine if there is an overload current fault, a ground fault, a grounded neutral fault, or an arc fault. Upon detecting a hazardous condition, a trip signal is sent to the trip circuit 111, which closes the switch 110, energizing the solenoid 107 and producing a magnetic force. CQAcnn / C7n7 / e / YiAi is capable of moving an armature that unlocks the latch by releasing a spring to open contactor switch 103, thus removing power from the electrical circuit. The temperature-activated permanent locking trip mechanism 109, upon reaching a predefined temperature, also generates a force capable of moving an armature that unlocks the latch by releasing a spring to open contactor switch 103, removing power from the electrical circuit. Once activated, the temperature-activated permanent locking trip mechanism 109 prevents the latch from locking, thus preventing a reset of the circuit interrupting device 100. Therefore, the circuit interrupting device 100 is permanently deactivated, and power can no longer be reconnected to the electrical circuit.The self-test module 115 generally generates output stimuli at node 115a coupled to sensors 116 and monitors the emission of an electronic detection circuit at node 115b in search of a malfunction, or monitors a trigger signal at node 115d while deactivating the trigger circuit 111. Alternatively, the self-test module 115 can monitor the health of sensor(s) 116 directly or by some other indirect means. Furthermore, the self-test module 115 can monitor the trip circuit 111 at node 115d for malfunction in response to a stimulus provided by the self-test module directly or indirectly through the electronic detection circuit 114, while ensuring that the trip circuit 111 does not fully energize and trip the circuit-interrupting device 100. Alternatively, the self-test module 115 can monitor the electronic detection circuit 114 directly or indirectly. The self-test module 115 typically monitors the output voltage of the power supply 113 and / or the current at node 115c for malfunctions. Regardless of the exact configuration, the self-test module 115 is configured to continuously or periodically verify the functionality of the trip circuit 111, power supply 113, sensors 116, and electronic detection circuits 114, and generates an output signal at node 115e coupled to the temperature-activated permanent locking trip mechanism 109 in response to a malfunction of the trip circuit 111, power supply 113, sensors 116, or electronic detection circuits 114. An optional monitoring circuit 199 can be configured to monitor the self-test module 115 and generate an output signal at node 115e coupled to the temperature-activated permanent locking trip mechanism in the event of the self-test module 115 ceasing to function or malfunctioning.This output signal at node 115e from the self-test module 115 is configured to energize a heating device contained in the temperature-activated permanent interlock trip mechanism 109. As described above, the temperature-activated permanent interlock trip mechanism 109, upon reaching a predefined temperature, generates a force capable of moving an armature that unlocks the latch, releasing a spring to open the contactor switch 103, thus removing energy from the electrical circuit. Once activated, the temperature-activated permanent interlock trip mechanism... CQRcnn / C7n7 / e / YiAi temperature 109 prevents the latch from locking, thus preventing a reset of the circuit interrupt device 100. Therefore, the circuit interrupt device 100 is permanently disabled and power can no longer be reconnected to the electrical circuit. With reference to Figure 2, a circuit-interrupting device 200 is illustrated according to an alternative embodiment of the present invention. The alternative embodiment shown in Figure 2 describes the circuit-interrupting device 200 comprising the hot conductor 101, the main contactor switch 103, which is spring-loaded but held in a closed switch position by a latch, and the optional electromagnetic device 104 configured to instantaneously generate a magnetic force capable of unlocking the latch by releasing a spring to open the main contactor switch 103, thereby removing power from an electrical circuit when a dangerous overload current exceeds 800% of the rated load current. The circuit breaker device 200 further comprises the heat-generating conductor section 105, the solenoid- or electromagnet-shaped trip circuit 111 107 such that when the switch 110 is closed, the solenoid 107 is arranged through the hot conductor 101 and a connection to a neutral conductor 102.The circuit-interrupting device 200 further comprises the electronic circuit for detecting overload current and / or earth fault detection and / or arc fault detection 114 with the corresponding sensor(s) 116, the self-monitoring or self-testing module 115 and the optional monitoring 199, the power supply 113, and the temperature-activated permanent lockout trip mechanism 109 located very close to the section of conductor 105 that generates heat, and a switch 117 which, when closed, provides a heat element 118 contained within the temperature-activated permanent lockout trip mechanism 109 through the hot conductor 101 and the neutral conductor 102. The power supply 113 provides suitable voltage and current to the electronic detection circuit 114 and the self-testing module 115 and / or the sensor(s) 116 from the hot conductor 101.Sensors 116 are configured to detect vibration and / or heat, or to detect voltage and / or current in the hot conductor 101 and / or the neutral conductor 102, whose output is coupled to the detection electronic circuit 114. The detection electronic circuit 114 is configured to receive the output of sensors 116, processes the data to determine if there is an overload current fault and / or a ground fault and / or a grounded neutral fault and / or an arc fault. Upon detection of a hazardous condition, a trip signal is sent to trip circuit 111, which closes switch 110. This energizes solenoid 107, producing a magnetic force that moves an armature, unlocking the latch and releasing a spring to open the main contactor switch 103, thus removing power from the electrical circuit. The temperature-activated permanent locking trip mechanism 109, upon reaching a predefined temperature, also generates a force that moves an armature, unlocking the latch and releasing a spring to open the main contactor switch 103, removing power from the electrical circuit. Once activated, the temperature-activated permanent locking trip mechanism 109 prevents the latch from locking, thus preventing a reset of the CQAcnn / C7n7 / e / YiAi circuit interrupt device 200. Therefore, circuit interrupt device 200 is permanently deactivated and power can no longer be reconnected to the electrical circuit. The self-test module 115 generally generates output stimuli at node 115a coupled to sensors 116 and monitors the output of an electronic detection circuit at node 115b for a malfunction, or monitors a trip signal at 115d while deactivating trip circuit 111. Alternatively, the self-test module 115 can monitor the health of sensor(s) 116 directly or by some other indirect means. Furthermore, the self-test module 115 can monitor the trip circuit at node 115d for malfunction in response to a stimulus provided by the self-test module 115 directly or indirectly through the electronic detection circuit 114, while ensuring that the trip circuit 111 does not fully energize and trip the circuit-interrupting device 200. Alternatively, the self-test module 115 can monitor the electronic detection circuit 114 directly or indirectly. The self-test module 115 typically monitors the output voltage of the power supply 113 and / or the current at node 115c for malfunctions. Regardless of the exact configuration, the self-test module 115 is configured to continuously or periodically verify the functionality of the trip circuit 111, power supply 113, sensors 116, and electronic detection circuits 114, and generates an output signal at node 115e coupled to switch 117 in response to a malfunction of the trip circuit 111, power supply 113, sensors 116, or electronic detection circuits 114. The optional monitoring circuit 199 can be configured to monitor the self-test module 115 and generate an output signal at node 115e coupled to switch 117 if the self-test module 115 stops working or malfunctions.The output signal at node 115e causes switch 117 to close, removing the heating element 118 contained in the temperature-activated permanent locking trip mechanism 109 between the hot conductor 101 and the neutral conductor 102. The now energized heating element 118 contained in the temperature-activated permanent locking trip mechanism 109 rapidly heats the temperature-activated mechanism. As described above, the temperature-activated permanent locking trip mechanism 109, upon reaching a predefined temperature, generates a force capable of moving an armature that unlocks the latch by releasing a spring to open the main contactor switch 103, thus removing power from the electrical circuit. Once activated, the temperature-activated permanent locking trip mechanism 109 prevents the latch from locking, thereby preventing a reset of the circuit interrupter device 200. Therefore, the circuit interrupter device 200 is permanently deactivated, and power can no longer be reconnected to the electrical circuit. Returning to Figure 3, the embodiment is illustrated in its mechanical form when the circuit interrupting device 100 is in a “reset” state according to an exemplary embodiment of the CQRcnn / C7n7 / e / YiAi present invention. In the reset state, the main contactor switch 103 is open and a latch 119 is engaged, loading a spring 120 of the main contactor. This is achieved by moving a handle 123 from the tripped position shown in Figure 5 to the “reset” position of Figure 3. A different spring 121 holds a trip armature 122 in place. Figure 4 illustrates the mechanical embodiment when the circuit-interrupting device 100 is in an “activated” state according to an exemplary embodiment of the present invention. In the activated state, the main contactor switch 103 is closed by moving handle 123. As shown in Figure 5, the mechanical embodiment is illustrated when the circuit-interrupting device 100 is in a “triggered” state according to an exemplary embodiment of the present invention. The circuit-interrupting device 100 is in the triggered state as a result of the activation of the temperature-activated permanent locking trip mechanism 109. The temperature-activated permanent locking trip mechanism 109 is shown exerting force on the trip armature 122, which unlocks the latch 119, releasing the spring 120 of the main contactor switch 103, which opens and moves the handle 123 to the triggered position.The continuous force exerted by the temperature-activated permanent locking trip mechanism 109 on the trip armature 122 prevents the latch 119 from engaging when an attempt is made to reset the circuit-interrupting device 100 by moving the handle 123 to the reset position. Paragraph 7.1.2 in UL489 describes a calibration test for a circuit breaker. Therefore, for the 200 percent calibration test and the 135 percent calibration test, performed at an ambient temperature of 25°C, a 15A to 30A circuit breaker must trip within 2 minutes at 200% of its rated current and within 1 hour at 135% of its rated current. For the 100 percent calibration test, performed at an ambient temperature of 40°C, the circuit breaker will not trip while carrying 100 percent of its rated current until its temperature has stabilized. As shown in Figure 6, an empirical model of the temperature-versus-time characteristic of the heat-generating conductor in section 105 of a 20A rated circuit breaker is illustrated during various calibration tests according to an exemplary embodiment of the present invention. The predetermined threshold of the overload current detection electronic circuit 114 is set to correspond to a temperature of approximately 120°C to achieve a tripping time of approximately 55 seconds while carrying 200 percent of its rated current (25°C ambient), a tripping time of approximately 3.5 minutes while carrying 135 percent of its rated current (25°C ambient), and no tripping while carrying 100 percent of its rated current (40°C ambient), all of which are within the test limits described in UL489.The default threshold of the temperature-activated permanent lockout trip mechanism 109 is set at a higher temperature of approximately 157°C to achieve a trip time of approximately 81 seconds while carrying 200 percent of its rated current (25°C ambient), and a trip time of approximately 7.4 minutes while carrying 135 percent of its rated current. CQRcnn / C7n7 / e / YiAi its rated current (25 °C ambient) and without tripping while carrying 100 percent of its rated current (40 °C ambient), which are also well within the test limits described in UL489. Figure 7 illustrates the temperature-activated permanent locking trip mechanism 109 according to an exemplary embodiment of the present invention. The temperature-activated permanent locking trip mechanism 109 comprises a plunger 311, a spring 312, at least one solder clamping tube 313, a fusible metal as solder 316, a clamping cable 317, a heating element 118, and a base 315. The spring 312 is compressed by the plunger 311 against the base 315, which can be integrated into a housing of the circuit-interrupting device 100. The plunger 311 is held in place by the clamping cable 317, which is fixed to the base 315 by solder 316 on at least one solder clamping tube 313.The trip armature 122, as shown in Figure 3 and Figure 5, is configured to unlock the latch 119 when the plunger 311 applies a force that releases the spring 120 to open the main contactor switch 103, removing power from the electrical circuit. The base 315, which can be integrated into the enclosure for the circuit-interrupting device 100, holds the temperature-activated permanent locking trip mechanism 109 in place and provides a fixed-point reference for the spring force 312 in the temperature-activated permanent locking trip mechanism 109. A variety of fusible metals and metal alloys 316 are commercially available with various precise melting points ranging from approximately 90 °C to 450 °C. 'Indium 100' is the fusible metal selected for this embodiment because it has a precise melting point of 157 °C.When the temperature of the solder 316 reaches its melting point, the solder becomes liquid and no longer adheres to the clamping wire 317, allowing the plunger 311 to move in the direction of the trip armature 122. The force of the compressed spring 312 against the fixed reference of the housing or base 315 and the plunger cap 311 moves the plunger 311 in the direction of the trip armature 122 and applies a continuous force to the trip armature 122, as shown in Figure 4. The applied force moves the trip armature 122, which unlocks the latch 119, releasing the spring 120 to open the main contactor switch 103, thus removing power from the electrical circuit.The continuous force applied to the trip armature 122 inhibits the locking of the latch 119, permanently preventing a reset, which prevents the main contactor switch 103 from closing again and reconnecting power to the electrical circuit as shown in Figure 5. The top of the plunger cap 311 has a rounded protrusion 130, shown in Figure 4 and Figure 5, which allows a tangential plane to make contact with the trip armature 122 to apply a force normal to a plane. With regard to Figure 8, an alternative view of the temperature-activated permanent locking trip mechanism 109 with the transparent base 315 is illustrated, according to an exemplary embodiment of the present invention. As indicated earlier in the description of Figure 2, the self-test module 115 generates an output at node 115e coupled to the switch 117 in response to a malfunction of the trip circuit 111, the power supply 113, the sensors 116, or the electronic detection circuits 114. The output signal causes the switch 117 to close. CQAcnn / C7n7 / e / YiAi by removing the heating element 118 contained in the temperature-activated permanent locking trip mechanism 109 between the hot conductor 101 and the neutral conductor 102. The heating element 118, which can optionally be electrically insulated from the tube containing the solder 313 by means of electrical insulation 318, rapidly heats the solder 316 to its melting temperature of 157 °C, normally in less than one second. When the temperature of the solder 316 reaches its melting point, the solder becomes liquid and is no longer attached to the clamping wire 317, allowing the plunger 311 to move in the direction of the firing armature 122. The force of the compressed spring 312 against the fixed reference of the housing or base 315 and the plunger cap 311 moves the plunger 311 in the direction of the firing armature 122 and applies a continuous force on the firing armature 122 as shown in Figure 4.The applied force moves the trip armature 122, which unlocks the latch 119, releasing the spring 120 to open the main contactor switch 103 and remove power from the electrical circuit. The continued force applied to the trip armature 122 inhibits the locking of the latch 119, permanently preventing a reset. This prevents the main contactor switch 103 from closing again and reconnecting power to the electrical circuit, as shown in Figure 5. In both embodiments of the circuit-interrupting devices 100 and 200, the temperature-activated permanent-lock trip mechanism 109 is strategically located near the conductor section 105 that generates heat so that, in the event of a dangerous overload current condition in the electrical circuit and the failure of the current sensor 116 or the overload detection electronic circuit 114 and the failure of the self-test module 115 or the trip circuit 111, the solder 316 heats up and reaches its melting point. The solder 316 becomes liquid and no longer adheres to the clamping wire 317, allowing the plunger 311 to move in the direction of the trip armature 122.The force of the compressed spring 312 against the fixed reference of the housing or base 315 and the plunger cap 311 moves the plunger 311 in the direction of a trip armature 122 and applies a continuous force to the trip armature 122, as shown in Figure 4. The applied force moves the trip armature 122, which unlocks the latch 119, releasing the spring 120 to open the main contactor switch 103 and remove power from the electrical circuit. The continuous force applied to the trip armature 122 inhibits the locking of the latch 119, permanently preventing a reset. This prevents the main contactor switch 103 from closing again and reconnecting power to the electrical circuit, as shown in Figure 5. In this way, the circuit-interrupting device 100 remains compliant with UL489 even when the electronic components no longer function properly.See Figure 6 and the paragraph describing Figure 6 above. With respect to Figure 9, an alternative embodiment of the temperature-activated permanent locking trip mechanism 109 contained in this alternative embodiment of a circuit-interrupting device according to an exemplary embodiment of the present invention is illustrated. Figure 10 illustrates another alternative embodiment similar to that of Figure 2 according to an exemplary embodiment of the present invention. CQRcnn / C7n7 / e / YiAi Figures 7 and 8 describe a device such as the temperature-activated permanent lockout trip mechanism 109 in which there is at least one heating element when energized in response to a failed self-test that melts the solder 316 inside the clamping tube 313 that releases the clamping cable 317. Figure 9 describes the temperature-activated permanent lockout trip mechanism 109 in which there is no heating element present, but where the clamping cable 317 melts when energized in response to a failed self-test. Another alternative embodiment similar to that of Figure 2 is shown in Figure 10. In this alternative embodiment, the heating element 118 in the temperature-activated permanent locking trip mechanism 109 is replaced by a fusible device 124. Recall that the self-test module 115 is configured to continuously or periodically check the functionality of the trip circuit 111, the power supply 113, the sensors 116, and the electronic detection circuits 114, and generates an output signal at node 115e coupled to the switch 117 in response to a malfunction of the trip circuit 111, the power supply 113, the sensors 116, or the electronic detection circuits 114. The optional monitoring circuit 199 can be configured to monitor the self-test module 115 and generate an output signal at node 115e, coupled to the switch 117, if the self-test module 115 fails or malfunctions. In this embodiment, the output signal at node 115e causes the switch 117 to close, bypassing the fuse 124 contained in the temperature-activated permanent interlock trip mechanism 109 between the hot conductor 101 and the neutral conductor 102. The now-energized fuse 124 in the temperature-activated permanent interlock trip mechanism 109 heats up and melts rapidly. An alternative embodiment of the temperature-activated permanent locking trip mechanism 109 contained in this alternative embodiment of the circuit-interrupting device 100 is described in Figure 9. The temperature-activated permanent locking trip mechanism 109 comprises the plunger 311, the spring 312, at least one solder clamping tube 313, fusible metal such as solder 316, the fusible clamping wire 319 which is the fusible device 124 shown in Figure 10, and the base 315. The spring 312 is compressed by the plunger 311 against the base 315, which can be integrated into the housing of the circuit-interrupting device 100. The plunger 311 is held in place by the fusible clamping wire 319, which is attached to the base 315 by solder 316 on at least one solder clamping tube 313. In this embodiment, the fusible clamping wire 319 shown in Figure 9 is made of a fusible metal such as stainless steel. When energized, the fusible clamping wire 319 melts rapidly, allowing the plunger 311 to move in the direction of the firing armature 122. The force of the compressed spring 312 against the fixed reference of the housing or base 315 and the plunger cap 311 moves the plunger 311 in the direction of the firing armature 122 and applies a continuous force to the firing armature 122, as shown in Figure 4. The applied force moves the The CQRcnn / C7n7 / e / YiAi trigger armature 122 unlocks the latch 119, releasing the spring 120 to open the main contactor switch 103, thus removing power from the electrical circuit. The continuous force applied to the trigger armature 122 inhibits the locking of the latch 119, permanently preventing a reset. This prevents the main contactor switch 103 from closing again and reconnecting power to the electrical circuit, as shown in Figure 5. As with the previous embodiment of the circuit-interrupting device 100, the temperature-activated permanent-lock trip mechanism 109 is strategically located near the section of conductor 105 that generates heat so that, in the event of a dangerous overload current condition in the electrical circuit and failure of the current sensor 116 or the overload detection electronic circuit 114 and failure of the self-test module 115 or the trip circuit 111, the solder 316 heats up and reaches its melting point. The solder 316 becomes liquid and no longer adheres to the clamping wire 317, allowing the plunger 311 to move in the direction of the trip armature 122.The force of the compressed spring 312 against the fixed reference of the housing or base 315 and the plunger cap 311 moves the plunger 311 in the direction of the trip armature 122 and applies a continuous force to the trip armature 122, as shown in Figure 4. The applied force moves the trip armature 122, which unlocks the latch 119, releasing the spring 120 to open the main contactor switch 103 and remove power from the electrical circuit. The continuous force applied to the trip armature 122 inhibits the locking of the latch 119, permanently preventing a reset. This prevents the main contactor switch 103 from closing again and reconnecting power to the electrical circuit, as shown in Figure 5. In this way, the circuit-interrupting device 100 remains compliant with UL489 even when the electronic components no longer function properly.See Figure 6 and the paragraph describing Figure 6 above. Figure 11 illustrates a circuit-interrupting device similar to the embodiment shown in Figure 10 according to an exemplary embodiment of the present invention. Figure 12 illustrates another alternative embodiment of the temperature-activated permanent lock-out trip mechanism 109 contained in this alternative embodiment of a circuit-interrupting device according to an exemplary embodiment of the present invention. Another alternative embodiment of the temperature-activated permanent lockout trip mechanism 109 contained in this alternative embodiment of the circuit-interrupting device 100 is described in Figure 12. The temperature-activated permanent lockout trip mechanism 109 consists of the plunger 311, the spring 312, the fusible metal such as solder 316, the fusible clamping wire 319 which is the fusible device 124 shown in Figure 10, and the base 315. The spring 312 is compressed by the plunger 311 against the base 315, which can be integrated into the housing of the circuit-interrupting device 100. The plunger 311 is held in place by the fusible clamping wire 319, one end of which is fixed to the base 315 by any means, and the other end passes freely through a hole / slot 320 in the base 315 and is fixed to the heat conductor section 105 by solder. 316. CQRcnn / cznz / e / YiAi In this embodiment, the fusible clamping wire 319 shown in Figure 12 is made of a fusible metal such as stainless steel. When energized, the fusible clamping wire 319 melts rapidly, allowing the plunger 311 to move in the direction of the trip armature 122. The force of the compressed spring 312 against the fixed reference of the housing or base 315 and the plunger cap 311 moves the plunger 311 in the direction of the trip armature 122 and applies a continuous force to the trip armature 122, as shown in Figure 4. The applied force moves the trip armature 122, which unlocks the latch 119, releasing the spring 120 to open the main contactor switch 103 and removing power from the electrical circuit.The continuous force applied to the trip armature 122 inhibits the locking of the latch 119, permanently preventing a reset, which prevents the main contactor switch 103 from closing again and reconnecting power to the electrical circuit as shown in Figure 5. Therefore, in this embodiment of the circuit-interrupting device 100, the fusible clamping wire 319 in the temperature-activated permanent-lock trip mechanism 109 is strategically soldered to the heat-generating conductor section 105 so that, in the event of a dangerous overload current condition in the electrical circuit and the failure of the current sensor 116 or the overload detection electronic circuit 114 and the failure of the self-test module 115 or the trip circuit 111, the solder 316 heats up and reaches its melting point. The solder 316 becomes liquid and no longer adheres to the fusible clamping wire 319, allowing the plunger 311 to move in the direction of the trip armature 122.The force of the compressed spring 312 against the fixed reference of the housing or base 315 and the plunger cap 311 moves the plunger 311 in the direction of the trip armature 122 and applies a continuous force to the trip armature 122, as shown in Figure 4. The applied force moves the trip armature 122, which unlocks the latch 119, releasing the spring 120 to open the main contactor switch 103 and remove power from the electrical circuit. The continuous force applied to the trip armature 122 inhibits the locking of the latch 119, permanently preventing a reset. This prevents the main contactor switch 103 from closing again and reconnecting power to the electrical circuit, as shown in Figure 5. In this way, the circuit-interrupting device 100 remains compliant with UL489 even when the electronic components no longer function properly.See Figure 6 and the paragraph describing Figure 6 above. The embodiment of the circuit-interrupting device 100 shown in Figure 11 is similar to the embodiment shown in Figure 10, except that the switch 117 for closing by disposing of the fuse device 124 contained in the temperature-activated permanent-locking trip mechanism 109 between the hot conductor 101 and the neutral conductor 102 is replaced with an electronic switch 125, optionally in series with a resistor 127. The electronic switch 125 can be various semiconductor or solid-state devices, such as a transistor, TRIAC, or SCR. In this embodiment, the electronic switch 125 is a TRIAC with part number Z0103NA5AL2 manufactured by STMicroelectronics. The resistor 127 is set to a value that adjusts the current to the desired amplitude for melting the fuse clamping wire 319 of Figure 9.The output signal from the self-test module 115 or the optional monitoring circuit 199 at node 115e is coupled to the TRIAC portal through a resistor 126 that typically has a value greater than 100 Ohms. Figure 13 illustrates another embodiment that does not include the conductor section 105 that is intentionally configured to generate heat, in accordance with an exemplary embodiment of the present invention. Therefore, in the event of a dangerous overload current and the trip circuit solenoid or electromagnet 107 or a solid-state switch being damaged and / or inoperative, or if the current sensor 116 or the overload current detection electronic circuit / apparatus 114 is damaged or inoperative, this embodiment may or may not generate a force to unlock the latch 119 by releasing the spring 120 to open the main contactor switch 103, removing power from the electrical circuit within the calibration trip time limits specified in UL489.This alternative embodiment shown in Figure 13 describes a circuit-interrupting device 300 comprising the hot conductor 101, the main contactor switch 103 which is spring-loaded but held in a closed switch position by the latch 119, the optional electromagnetic device 104 configured to instantaneously generate a magnetic force capable of unlocking the latch 119 by releasing the spring 120 to open the main contactor switch 103, thus removing power from the electrical circuit when a dangerous overload current exceeds 800% of the rated load current, and the trip circuit 111 in the form of a solenoid or electromagnet 107 such that when the switch 110 is closed, the solenoid 107 is arranged through the hot conductor 101 and a connection to a neutral conductor 102. It also includes an electronic circuit for detecting overload current and / or ground fault and / or arc fault 114 with the corresponding sensor(s) 116, the self-test or self-monitoring module 115, the power supply 113, and the temperature-activated permanent lockout trip mechanism 109 located very close to the section of conductor 105 that generates heat. The power supply 113 provides suitable voltage and current to the electronic detection circuit 114 and the self-test module 115 and / or the sensor(s) 116 from the hot conductor 101. The sensors 116 are configured to detect vibration or heat, or to detect voltage or current in conductor 101 or conductor 102, whose output is coupled to the electronic detection circuit 114.The electronic detection circuit 114 is configured to receive the output from sensors 116, processes the data to determine if there is an overload current fault and / or a ground fault and / or a grounded neutral fault and / or an arc fault. Upon detection of a hazardous condition, a trip signal is sent to trip circuit 111, which closes switch 110. This energizes solenoid 107, producing a magnetic force that moves an armature, unlocking latch 119 and releasing spring 120. This opens the main contactor switch 103, removing power from the electrical circuit. The temperature-activated permanent locking trip mechanism 109, upon reaching a predefined temperature, also generates a force that moves an armature, unlocking latch 119 and releasing spring 120. This opens the main contactor switch 103, removing power from the electrical circuit. CQRcnn / C7n7 / e / YiAi Once activated, the temperature-activated permanent locking trip mechanism 109 prevents the latch 119 from locking, thus preventing a reset of the circuit interrupt device 300. Therefore, the circuit interrupt device 300 is permanently deactivated and power can no longer be reconnected to the electrical circuit. The self-test module 115 typically generates output stimuli at node 115a, coupled to sensors 116, and monitors the output of a detection electronic circuit 114 at node 115b for malfunction, or monitors a trip signal at node 115d while deactivating the trip circuit 111. Alternatively, the self-test module 115 can monitor the health of sensor(s) 116 directly or indirectly. Furthermore, the self-test module 115 can monitor the trip circuit 111 at node 115d for malfunction in response to a stimulus provided by the self-test module 115 directly or indirectly through the detection electronic circuit 114, while ensuring that the trip circuit 111 does not fully energize and trip the circuit-interrupting device 300. Alternatively, the self-test module 115 can monitor the electronic detection circuit 114 directly or indirectly. The self-test module 115 typically monitors the output voltage of the power supply 113 and / or the current at node 115c for malfunctions. Regardless of the exact configuration, the self-test module 115 is configured to continuously or periodically check the functionality of the trigger circuit 111, power source 113, sensors 116, and electronic detection circuits 114, and generate an output signal at node 115e coupled to the solid-state switch 125 in response to a malfunction of the trigger circuit 111, power source 113, sensors 116, or electronic detection circuits 114. The optional monitoring circuit 199 can be configured to monitor the self-test module 115 and generate an output signal at node 115e, coupled to the solid-state switch 125, in the event of a failure or malfunction of the self-test module 115. This output signal at node 115e from the self-test module 115 is configured to energize a heating element contained in the temperature-activated permanent interlock trip mechanism 109. As described above, the temperature-activated permanent interlock trip mechanism 109, upon reaching a predefined temperature, generates a force capable of moving an armature that unlocks the latch 119, releasing the spring 120 to open the main contactor switch 103 and remove power from the electrical circuit.Once activated, the temperature-activated permanent locking trip mechanism 109 prevents the latch 119 from locking, thus preventing a reset of the circuit interrupt device 300. Therefore, the circuit interrupt device 300 is permanently deactivated and power can no longer be reconnected to the electrical circuit. The circuit-interrupting device 100 comprises a conductor capable of generating heat and the CQRcnn / C7n7 / e / YiAi Temperature-Actuated Permanent Locking Trigger Mechanism 109. The temperature-activated permanent locking trigger mechanism 109 includes: a plunger, a compressed or stretched spring, and a fusible metal to hold the plunger in place, which has a constant force exerted on it by the compressed or stretched spring. The temperature-activated permanent locking trigger mechanism is located near the heat-generating conductor and is configured such that when the fusible metal melts, the plunger is released: allowing the compressed or stretched spring to convert its potential energy into kinetic energy and moving the plunger to generate a force to unlock a latch by releasing a first spring to open a contactor switch, removing energy from an electrical circuit.The constant force generated by the compressed or stretched spring in the plunger prevents the circuit-breaking device from resetting, permanently preventing power from being reconnected to the electrical circuit. In one embodiment, the temperature-activated permanent locking trip mechanism 109 comprises at least one solder clamping tube, a clamping cable, a heating element, and a base. The compressed or extended spring is compressed by the plunger against the base, which is integrated into a circuit breaker housing. The plunger is held in place by the clamping cable, which is attached to the base by fusible metal in at least one solder clamping tube. The base provides a fixed-point reference for the force of the compressed or extended spring in the temperature-activated permanent locking trip mechanism. The circuit-interrupting device 100 further comprises the trip armature 122 configured to unlock the latch 119 when the plunger 311 applies force, releasing the first spring 120 to open the contactor switch 103, thereby removing energy from the electrical circuit. When the temperature of the fusible metal 316 reaches its melting point, the fusible metal becomes liquid and is no longer attached to the retaining wire, allowing the plunger to move in the direction of the trip armature. The force of the compressed or stretched spring against the fixed-point reference of the housing or base and a plunger cap moves the plunger in the direction of the trip armature and applies a continuous force to the trip armature such that the continuously applied force moves the trip armature, unlocking the latch and releasing the first spring to open the contactor switch, thereby removing energy from the electrical circuit.The continuous force applied to the trip armature inhibits the latch locking, permanently preventing a reset and thus preventing the contactor switch from closing and reconnecting power to the electrical circuit. The top of the plunger cap has a rounded protrusion that allows a tangential plane to make contact with the trip armature, applying a force normal to that plane. The temperature-activated permanent locking trip mechanism is configured to generate a force to unlock the latch by releasing the first spring to open the contactor switch, removing power from the electrical circuit in response to a malfunction detected in a trip circuit or power source, or sensors, or any of the electronic sensing circuits, such that the temperature-activated permanent locking trip mechanism CQRcnn / C7n7 / e / YiAi permanently prevents the 100 circuit breaker from re-energizing and reapplying power to the electrical circuit. The temperature-activated permanent lockout trip mechanism is configured to generate a force to unlock the latch by releasing the first spring to open the contactor switch, removing power from the electrical circuit within the UL489 specified calibration trip time limits if a trip circuit solenoid or electromagnet or solid-state switch is damaged or becomes inoperative, or if a current sensor or overload current sensing circuit / electronic device is damaged or becomes inoperative, or if a self-test module or watch circuit becomes inoperative. The circuit-interrupting device further comprises the heating elements 118 surrounding the fusible metal which is energized in response to a malfunction in the trip circuit, a power source, sensors or electronic detection circuits, which melt the fusible metal releasing the plunger allowing the compressed or stretched spring to convert potential energy into kinetic energy, moving the plunger to generate a force that unlocks the latch releasing the first spring to open the contactor switch removing energy from the electrical circuit.The fusible metal is energized to generate heat in response to a malfunction in the trip circuit, a power source, sensors, or electronic detection circuits, which melts the fusible metal, releasing the plunger and allowing the compressed or stretched spring to convert potential energy into kinetic energy, moving the plunger to generate a force that unlocks the latch, releasing the first spring to open the contactor switch, removing energy from the electrical circuit. The circuit interruption device further comprises a fail-safe backup mechanism to permanently remove power from the electrical circuit within the calibration trip time limits specified in UL489 if a trip circuit, current sensor, or overload current detection electronic circuit / apparatus is damaged or inoperative, or if a self-test module or monitoring circuit becomes inoperative, and / or the fail-safe backup mechanism permanently removes power from the electrical circuit in response to a malfunction of the trip circuit, power source, sensors, or any of the detection electronic circuits. In one embodiment, a self-test is provided for an overload current fault detection circuit and / or sensors. A self-test is also provided for an earth fault detection circuit and / or sensors, and for an arc fault detection circuit and / or sensors. Additionally, a self-test is provided for a trip circuit. The circuit-interrupting device further comprises a switch for disposing of the fusible metal 316 across the hot conductor 105 and the neutral conductor 102. The switch can be a solid-state device such as a Triac or an SCR. Figure 14 illustrates a schematic view of a flowchart of a method 1400 for providing a fail-safe lockout tripping mechanism for the circuit interrupting device 100 in response to a self-test in accordance with an exemplary embodiment of the present CQAcnn / C7n7 / e / YiAi invention. Reference is made to the elements and features described in Figures 1-13. It should be noted that some steps do not need to be performed in any particular order, and some steps are optional. Method 1400 comprises step 1405 for providing a heat-generating conductor. Method 1400 further comprises step 1410 for providing a temperature-activated, permanent lock-out trip mechanism. The temperature-activated, permanent lock-out trip mechanism includes a plunger, a compressed or stretched spring, and a fusible metal to hold the plunger in place, which has a constant force exerted on it by the compressed or stretched spring. The temperature-activated, permanent lock-out trip mechanism is located near the heat-generating conductor and is configured such that when the fusible metal melts, the plunger is released, allowing the compressed or stretched spring to convert its potential energy into kinetic energy and move the plunger to generate a force to unlock a latch by releasing a first spring to open a contactor switch, thereby removing energy from an electrical circuit.The constant force generated by the compressed or stretched spring in the plunger prevents the circuit-breaking device 100 from resetting, permanently preventing power from being reconnected to the electrical circuit. Although a helical compression spring of an elastic body or device is described herein, the present invention also contemplates a range of one or more elastic bodies or devices. For example, other mechanisms, such as any elastic body or device that recovers its original shape when released after being deformed, can be implemented based on one or more of the features presented above without departing from the spirit of the present invention. The techniques described herein can be particularly useful for different types of circuit breakers or circuit interrupting devices. While specific implementations are described in terms of AFCI and GFCI circuit breakers, the techniques described herein are not limited to these breakers and can also be used with other types of circuit breakers. Although embodiments of the present invention have been disclosed in exemplary forms, it will be evident to those skilled in the art that many modifications, additions, and deletions can be made without departing from the spirit and scope of the invention and its equivalents, as set forth in the following claims. The embodiments and their various advantageous features and details are explained in greater detail with reference to the non-restrictive embodiments illustrated in the accompanying drawings and detailed in the following description. Descriptions of well-known starting materials, processing techniques, components, and equipment are omitted so as not to unnecessarily obscure the embodiments in detail. However, it should be understood that the detailed description and specific examples, although indicating preferred embodiments, are provided only by way of illustration and not in a restrictive manner. Various substitutions, modifications, additions, and / or rearrangements within the spirit and / or scope of the underlying inventive concept will be apparent to those skilled in the art from this disclosure. CQRcnn / C7n7 / e / YiAi As used herein, the terms comprise, comprising, include, having, or any other variation thereof are intended to encompass a non-exclusive inclusion. For example, a process, article, or apparatus comprising a list of elements is not necessarily limited to only those elements but may include other elements not expressly listed or inherent in that process, article, or apparatus. Furthermore, the examples or illustrations provided herein should not be considered in any way as restrictions, limitations, or express definitions of any term or terms with which they are used. Rather, these examples or illustrations should be considered as describing a particular embodiment and for illustrative purposes only. Those skilled in the art will appreciate that any term or terms with which these examples or illustrations are used will encompass other embodiments that may or may not be provided herein or elsewhere in this specification, and it is intended that all such embodiments are included within the scope of that term or those terms. In the preceding description, the invention has been described with reference to specific embodiments. However, a person skilled in the art would appreciate that various modifications and changes can be made without departing from the scope of the invention. Therefore, the description and figures should be considered illustrative rather than restrictive, and all modifications should be included within the scope of the invention. Although the invention has been described with respect to specific embodiments thereof, these embodiments are merely illustrative and do not limit the invention. The present description of illustrated embodiments of the invention is not intended to be exhaustive, nor to limit the invention to the precise forms disclosed herein (and, in particular, the inclusion of any particular embodiment, feature, or function is not intended to limit the scope of the invention to such embodiment, feature, or function). Rather, the description is intended to describe illustrative embodiments, features, and functions so that a person of ordinary skill in the context of the art may understand the invention without limiting the invention to any particularly described embodiment, feature, or function.Although the specific embodiments and examples of the invention are described herein for illustrative purposes only, various equivalent modifications are possible within the spirit and scope of the invention, as will be recognized and appreciated by those skilled in the relevant art. As indicated, these modifications may be applied to the invention by virtue of the foregoing description of the illustrated embodiments of the invention and must be included within the spirit and scope of the invention. Therefore, although the invention has been described herein with reference to its particular embodiments, a latitude of modification is permitted. Various changes and substitutions to the foregoing disclosures are intended, and it will be appreciated that in some cases certain features of the embodiments of the invention will be employed without the corresponding use of other features without departing from the scope and spirit of the invention as set forth.Therefore, many modifications can be made to adapt a particular situation or material to the scope and essential spirit of the invention. CQRcnn / C7n7 / e / YiAi The expressions "in one embodiment," "in another embodiment," or "in a specific embodiment," or similar terminology used in various places throughout this specification, do not necessarily refer to the same embodiment. Furthermore, the features, structures, or characteristics of any particular embodiment may be combined in any suitable manner with one or more additional embodiments. It should be understood that other variations and modifications of the embodiments described and illustrated herein are possible by virtue of the teachings herein and should be regarded as part of the spirit and scope of the invention. In this description, numerous specific details, such as examples of components and / or methods, are provided to provide a complete understanding of the embodiments of the invention. However, a person skilled in the relevant art will recognize that an embodiment can be practiced without one or more of the specific details, or with other apparatus, systems, assemblies, methods, components, materials, parts, and / or the like. In other cases, well-known structures, components, systems, materials, or operations are not shown or described in detail to avoid obscuring aspects of the embodiments of the invention. Although the invention can be illustrated using a particular embodiment, this does not limit the invention to any particular embodiment, and a person of ordinary knowledge in the art will recognize that additional embodiments are readily understandable and form part of this invention. It will also be appreciated that one or more of the elements represented in the drawings / figures may also be implemented in a more separate or integrated manner, or even removed or represented as inoperable in certain cases, as may be useful according to a particular request. The benefits, other advantages, and solutions to problems have been described above with respect to specific implementations. However, the benefits, advantages, solutions to problems, and any component(s) that may cause any benefit, advantage, or solution to occur or become more pronounced should not be interpreted as a critical, required, or essential feature or component.

Claims

1. A circuit-interrupting device, characterized in that it comprises: a conductor capable of generating heat; and a temperature-activated permanent lock-out trip mechanism including: a plunger; a compressed or stretched spring; and a fusible metal for holding the plunger in place having a constant force exerted on it by the compressed or stretched spring, wherein the temperature-activated permanent lock-out trip mechanism is located near the heat-generating conductor and is configured such that when the fusible metal melts when at least one heat element is energized or a clamping wire melts when energized in response to a failed self-test, the plunger is released, allowing the compressed or stretched spring to convert its potential energy into kinetic energy.and moving the plunger to generate a force to unlock a latch by releasing a first spring to open a contactor switch, removing energy from an electrical circuit, where the constant force generated by the compressed or stretched spring in the plunger prevents the circuit-interrupting device from resetting, permanently preventing energy from being reconnected to the electrical circuit.

2. The circuit-breaking device of claim 1, characterized in that the temperature-activated permanent lock-up trip mechanism comprises: at least one solder clamping tube, the clamping cable, and at least one heating element; and a base, wherein the compressed or stretched spring is compressed by the plunger against the base, which is integrated into a housing of the circuit-breaking device, wherein the plunger is held in place by the clamping cable, which is fixed to the base by fusible metal in at least one solder clamping tube, and wherein the base provides a fixed-point reference for the force of the compressed or stretched spring in the temperature-activated permanent lock-up trip mechanism.

3. The circuit-interrupting device of claim 2, characterized in that it further comprises: a trigger armature configured to unlock the latch when the plunger applies force, releasing the first spring to open the contactor switch, thereby removing energy from the electrical circuit, wherein when the temperature of the fusible metal reaches its melting point, the fusible metal becomes liquid and is no longer adhered to the holding wire, allowing the plunger to move in the direction of the trigger armature,where the force of the compressed or stretched spring against the fixed point reference of the housing or base and a plunger cap moves the plunger in the direction of the CQRcnn / C7n7 / e / YiAi trip armature and applies a continuous force on the trip armature such that the applied continuous force moves the trip armature which unlocks the latch releasing the first spring to open the contactor switch thereby removing energy from the electrical circuit.

4. The circuit-breaking device of claim 3, characterized in that the continuous force applied to the trip armature inhibits the latch locking, permanently preventing a reset, thereby preventing the contactor switch from closing again and reconnecting power to the electrical circuit.

5. The circuit-breaking device of claim 4, characterized in that the top portion of the plunger cap has a rounded protrusion that allows a tangential plane to come into contact with the firing armature to apply a force normal to a plane.

6. The circuit-breaking device of claim 1, characterized in that the temperature-activated permanent lock-up trip mechanism generates a force to unlock the latch by releasing the first spring to open the contactor switch, removing power from the electrical circuit in response to a malfunction detected in a trip circuit or power source, or sensors, or any of the electronic detection circuits, such that the temperature-activated permanent lock-up trip mechanism permanently prevents the circuit-breaking device from being re-energized and reapplying power to the electrical circuit.

7. The circuit-breaking device of claim 1, characterized in that it further comprises: heating elements surrounding the fusible metal that is energized in response to a malfunction in the trip circuit, a power source, sensors or electronic detection circuits, which melt the fusible metal releasing the plunger allowing the compressed or stretched spring to convert potential energy into kinetic energy, moving the plunger to generate a force that unlocks the latch releasing the first spring to open the contactor switch removing energy from the electrical circuit.

8. The circuit interruption device of claim 1, characterized in that the temperature-activated permanent locking trip mechanism generates a force to unlock the latch by releasing the first spring to open the contactor switch, removing power from the electrical circuit within the UL489 specified calibration trip time limits if a trip circuit solenoid or electromagnet or a solid-state switch is damaged or becomes inoperative, or if a current sensor or an overload current detection electronic circuit / apparatus is damaged or becomes inoperative, or if a self-test module or a watchdog circuit becomes inoperative.

9. The circuit interruption device of claim 8, characterized in that it further comprises: a fail-safe backup mechanism for permanently removing power from the electrical circuit within the calibration trip time limits specified in UL489 if a CQAcnn / C7n7 / e / YiAi trip circuit, a current sensor, or an overload current detection electronic circuit / apparatus is damaged or inoperative, or if a self-test module or a monitoring circuit becomes inoperative; and / or the fail-safe backup mechanism permanently removes power from the electrical circuit in response to a malfunction of the trip circuit, a power source, sensors, or any of the detection electronic circuits.

10. The circuit-interrupting device of claim 1, characterized in that the fusible metal is energized to generate heat in response to a malfunction in the trip circuit, a power source, sensors, or electronic detection circuits, which melts the fusible metal, releasing the plunger and allowing the compressed or stretched spring to convert potential energy into kinetic energy, moving the plunger to generate a force that unlocks the latch, releasing the first spring to open the contactor switch, removing energy from the electrical circuit.

11. The circuit interruption device of claim 1, characterized in that a circuit self-test and / or overload current fault detection sensors are provided.

12. The circuit interruption device of claim 1, characterized in that a circuit self-test and / or earth fault detection sensors are provided and wherein a circuit self-test and / or arc fault detection sensors are provided.

13. The circuit interruption device of claim 1, characterized in that a self-test of a trip circuit is provided.

14. The circuit-interrupting device of claim 1, characterized in that it further comprises: a switch for arranging the fusible metal across the heat-generating conductor and a neutral conductor.

15. The circuit interruption device of claim 14, characterized in that the switch is a solid-state device comprising a Triac or an SCR.

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