Flatness measurement assembly

Abstract

Disclosed in the present utility model is a flatness measurement assembly. The flatness measurement assembly comprises two measurement guiding rulers, wherein each measurement guiding ruler comprises a guiding ruler main body, a first magnetic attraction assembly, a plurality of measurement probes and a processor, the guiding ruler main body comprising a side wall portion; and in a first state, the side wall portions of the two measurement guiding rulers come together under the magnetic attraction of the first magnetic attraction assemblies of the two measurement guiding rulers, so that the plurality of measurement probes of each measurement guiding ruler face the side wall portion of the other measurement guiding ruler; and the processor is configured to correct measurement data of the plurality of measurement probes in the first state. The present utility model solves the problems in the prior art of a flatness measurement method being highly dependent on manpower, having a large deviation in measurement data, and having inaccurate readings when the flatness of a high wall surface is measured, thereby accelerating the measurement speed, and ensuring the accuracy of flatness measurement.

Description

A flatness measurement component Technical Field

[0001] The utility model relates to the field of building construction, in particular to a flatness measuring component. Background Art

[0002] Automation of industrial equipment has become a growing trend across various industries in recent years. However, current flatness measurement still relies heavily on manual labor, with data required to be recorded manually. Furthermore, traditional surface flatness measurement instruments lack calibration methods and require the use of plug gauges for interpretation, resulting in low efficiency and potential accuracy errors due to manual measurement.

[0003] Utility Model Content

[0004] The utility model provides a flatness measurement component, which solves the technical problems of the prior art that the system is highly dependent on manpower and has low efficiency.

[0005] To solve the above technical problems, the present invention proposes a flatness measurement assembly, wherein the flatness measurement assembly includes two measuring rulers, each measuring ruler includes a ruler body, a magnetic assembly, multiple measuring probes and a processor, the ruler body includes a side wall portion, and in a first state, the side walls of the two measuring rulers are brought close to each other under the magnetic cooperation of the first magnetic assemblies of the two measuring rulers, so that the multiple measuring probes of each measuring ruler are directed towards the side wall portion of the other measuring ruler, and the processor is used to correct the measurement data of the multiple measuring probes in the first state.

[0006] Preferably, each measuring ruler further comprises a first communication contact, which is arranged on the side wall portion. In the first state, the first communication contacts of the two measuring rulers are connected to each other, thereby enabling data transmission between the two measuring rulers.

[0007] Preferably, each measuring ruler further comprises a human-machine interface for receiving user instructions, and the processor generates a correction instruction in response to a first user instruction received by the human-machine interface on the measuring ruler where it is located, and sends the correction instruction to another measuring ruler via the first communication contact.

[0008] Preferably, the processor is configured to perform correction based on measurement data of a plurality of measurement probes on the measuring scale on which the processor is located and measurement data of a plurality of measurement probes on another measuring scale obtained via the first communication contact.

[0009] Preferably, the first magnetic attraction component includes a first magnet and a second magnet arranged on the side wall portion at intervals along the length direction of the ruler body, the magnetic poles of the first magnet and the second magnet facing the outside of the ruler body have different polarities, and multiple measuring probes are arranged at intervals between the first magnet and the second magnet.

[0010] Preferably, the plurality of measuring probes are arranged at equal intervals between the first magnet and the second magnet, and the interval between the first magnet and adjacent measuring probes is different from the interval between the second magnet and adjacent measuring probes.

[0011] Preferably, each measuring ruler further includes a second magnetic assembly, and the ruler body further includes an end wall portion. In the second state, the end walls of the two measuring rulers are fixed to each other under the magnetic cooperation of the second magnetic assemblies of the two measuring rulers.

[0012] Preferably, the end wall portion includes a first end wall portion and a second end wall portion spaced apart along the length direction of the ruler body, and the second magnetic attraction component includes a third magnet respectively arranged on the first end wall portion and a fourth magnet arranged on the second end wall portion, and the magnetic poles of the third magnet and the fourth magnet facing the outside of the ruler body have different polarities.

[0013] Preferably, each measuring ruler further comprises a second communication contact, which is provided on the end wall portion. In the second state, the second communication contacts of the two measuring rulers are connected to each other, thereby enabling data transmission between the two measuring rulers.

[0014] Preferably, each processor generates a measurement data sharing instruction in response to a second user instruction received by the human-machine interface on the measuring ruler where it is located, sends the measurement data sharing instruction to another measuring ruler via the second communication contact, and receives the measurement data returned by the other measuring ruler in response to the measurement data sharing instruction, and further displays it on the human-machine interface of the measuring ruler.

[0015] Preferably, each measuring ruler further comprises a data acquisition module, the data acquisition module is used to acquire identification marks of the structural member to be measured, and the processor associates the identification marks with the measurement data of the multiple measuring probes.

[0016] Preferably, each measuring ruler further includes a communication module for transmitting the associated identification mark and measurement data to the cloud.

[0017] The utility model discloses a flatness measurement assembly, comprising two measuring rulers, each comprising a ruler body, a first magnetic assembly, a plurality of measuring probes, and a processor. The ruler body comprises a sidewall portion. In a first state, the sidewall portions of the two measuring rulers are brought together by the magnetic attraction of the first magnetic assemblies of the two measuring rulers, so that the plurality of measuring probes of each measuring ruler face the sidewall portion of the other measuring ruler. The processor is configured to calibrate measurement data from the plurality of measuring probes in the first state. The utility model solves the problems of prior art flatness measurement methods, such as high reliance on manpower, large deviations in measurement data, and inaccurate readings when measuring the flatness of higher walls, thereby accelerating measurement speed and ensuring accurate flatness measurement. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] In order to more clearly illustrate the technical solutions in the embodiments of the application, the following briefly introduces the drawings required for describing the embodiments. Obviously, the drawings described below are only some embodiments of the application. Those skilled in the art can also derive other drawings based on these drawings without inventive work, among which:

[0019] FIG1 is a schematic structural diagram of a flatness measurement assembly in a first state according to the present invention;

[0020] FIG2 is a schematic structural diagram of a perspective view of an embodiment of a single measuring assembly shown in FIG1 ;

[0021] FIG3 is a schematic structural diagram of a front view of an embodiment of a single measurement component shown in FIG1 ;

[0022] FIG4 is a schematic structural diagram of a left side view of an embodiment of a single measurement assembly shown in FIG1 ;

[0023] FIG5 is a schematic structural diagram of a right side view of an embodiment of a single measurement assembly shown in FIG1 ;

[0024] FIG6 is a schematic structural diagram of the flatness measurement assembly shown in FIG1 in a second state. Specific embodiments

[0025] The following will be combined with the drawings in the embodiments of this application to clearly and completely describe the technical solutions in the embodiments of this application. Obviously, the embodiments described are only part of the embodiments of this application, not all of the embodiments. Based on the embodiments of this application, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of this application.

[0026] It should be noted that if the embodiments of the present application involve directional indications (such as up, down, left, right, front, back, etc.), the directional indications are only used to explain the relative position relationship, movement status, etc. between the various components under a certain specific posture (as shown in the accompanying drawings). If the specific posture changes, the directional indications will also change accordingly.

[0027] In addition, if there are descriptions involving "first", "second", etc. in the embodiments of this application, the descriptions of "first", "second", etc. are only for descriptive purposes and cannot be understood as indicating or implying their relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features specified as "first" or "second" may explicitly or implicitly include at least one of such features. In addition, the technical solutions between the various embodiments can be combined with each other, but this must be based on the fact that they can be implemented by ordinary technicians in this field. When the combination of technical solutions is contradictory or cannot be implemented, it should be deemed that such combination of technical solutions does not exist and is not within the scope of protection required by this application.

[0028] Please refer to Figure 1, which is a schematic diagram of the structure of a flatness measurement assembly in a first state according to the present invention. The present invention discloses a flatness measurement assembly 100, comprising a measuring ruler 101 and a measuring ruler 102. Each measuring ruler comprises a ruler body 101, a first magnetic assembly 7, a plurality of measuring probes 6, a handle 1, and a processor 2. The ruler body includes a sidewall 5. In the first state, the sidewall 5 of measuring ruler 101 and the sidewall 5 of measuring ruler 102 are brought together by the magnetic attraction of the first magnetic assembly 7 of the two measuring rulers, so that the plurality of measuring probes 6 of measuring ruler 101 face the sidewall 5 of the other measuring ruler 102. The processor 2 is configured to correct the measurement data of the plurality of measuring probes 6 in the first state.

[0029] Specifically, in the first combined state, the first magnet 31 and the second magnet 32 ​​of the first magnetic attraction component 7 on the side wall portion 5 of the measuring ruler 101 and the side wall portion 5 of the measuring ruler 102 are close to each other through magnetic attraction, and the first magnet 31 and the second magnet 32 ​​are facing the outside of the ruler body 101, with different magnetic polarities. After the first communication contacts 41 contact each other, the processor 2 generates a measurement correction instruction. After the human-machine interface on the measuring ruler 101 receives the correction instruction, it sends the correction instruction to the other measuring ruler 102 through the first communication contact 41, and receives the correction instruction sent back by the other measuring ruler 102, and further corrects the measurement data of multiple measuring probes 6. Finally, the communication module transmits the identification mark and measurement data to the cloud.

[0030] Please also refer to Figure 2, which is a schematic diagram of a perspective view of an embodiment of a single measuring assembly shown in Figure 1. In one specific embodiment, each measuring ruler 101 further includes a first communication contact 41 disposed on the side wall portion 5. In a first state, the first communication contacts 41 of the measuring rulers 101 and 102 are mated with each other, thereby enabling data transmission between the two measuring rulers.

[0031] Please refer to Figures 3, 4, and 5. Figure 3 is a schematic diagram of the front view of an embodiment of a single measuring assembly shown in Figure 1; Figure 4 is a schematic diagram of the left view of an embodiment of a single measuring assembly shown in Figure 1; and Figure 5 is a schematic diagram of the right view of an embodiment of a single measuring assembly shown in Figure 1. In one specific embodiment, the measuring ruler 101 further includes a human-machine interface for receiving user instructions. The processor 2 generates a correction instruction in response to a first user instruction received by the human-machine interface on the measuring ruler 101 on which the processor 2 resides, and transmits the correction instruction to the other measuring ruler 102 via the first communication contact 41.

[0032] In a specific embodiment, the processor 2 is configured to perform calibration based on measurement data of multiple measuring probes 6 on the measuring scale 101 on which the processor 2 is located and measurement data of multiple measuring probes on another measuring scale 102 obtained via the first communication contact 41 .

[0033] In a specific embodiment, the first magnetic attraction component 7 includes a first magnet 31 and a second magnet 32 ​​spaced apart on the side wall portion 5 along the length direction of the ruler body. The first magnet 31 and the second magnet 32 ​​have different magnetic poles facing the outside of the ruler body, and a plurality of measuring probes 6 are spaced apart between the first magnet 31 and the second magnet 32.

[0034] In a specific embodiment, the plurality of measuring probes 6 are arranged at equal intervals between the first magnet 31 and the second magnet 32 ​​, and the interval between the first magnet 31 and adjacent measuring probes 6 is different from the interval between the second magnet 32 ​​and adjacent measuring probes 6 .

[0035] Please also refer to Figure 6, which is a schematic diagram of the flatness measurement assembly shown in Figure 1 in its second state. In one specific embodiment, each measuring ruler 101 further includes a second magnetic assembly 8, and the ruler body 101 further includes end walls. In the second state of the flatness measurement assembly 100, the end walls of the two measuring rulers are secured to each other by the magnetic attraction of the second magnetic assemblies 8 of the two measuring rulers. The number of end walls can be at least one, for example, one, two, three, four, etc., and can be an odd or even number depending on the needs, and is not limited here.

[0036] In a specific embodiment, the end wall portion includes a first end wall portion 61 and a second end wall portion 62 spaced apart along the length direction of the ruler body 101, and the second magnetic attraction component 8 includes a third magnet 33 respectively arranged on the first end wall portion 61 and a fourth magnet 34 respectively arranged on the second end wall portion 62, and the magnetic poles of the third magnet 33 and the fourth magnet 34 facing the outside of the ruler body have different polarities.

[0037] In one specific embodiment, each measuring ruler 101 further includes a second communication contact 42 and a third communication contact 43. The second communication contact 42 is disposed on the first end wall portion 61, and the third communication contact is disposed on the second end wall portion 62. In the second state of the flatness measurement assembly 100, the third communication contact 43 of the measuring ruler 101 and the second communication contact 42 of the measuring ruler 102 mate with each other, enabling data transmission between the two measuring rulers. The second communication contact 42 and the third communication contact 43 are located above the third magnet 33 and the fourth magnet 34, respectively.

[0038] In a specific embodiment, each processor 2 generates a measurement data sharing instruction in response to a second user instruction received by the human-machine interface on the measuring ruler 101 where it is located, and sends the measurement data sharing instruction to another measuring ruler 102 via the second communication contact 42, and receives the measurement data returned by the other measuring ruler 102 in response to the measurement data sharing instruction, and further displays it on the human-machine interface of the measuring ruler.

[0039] In a specific embodiment, each measuring ruler 101 further includes a data acquisition module, which is used to acquire identification marks of the structural component to be measured, and the processor 2 associates the identification marks with the measurement data of multiple measuring probes.

[0040] In a specific embodiment, each measuring ruler 101 further includes a communication module for transmitting the associated identification mark and measurement data to the cloud.

[0041] The utility model discloses a flatness measurement assembly, comprising two measuring rulers, each comprising a ruler body, a first magnetic assembly, a plurality of measuring probes, and a processor. The ruler body comprises a sidewall portion. In a first state, the sidewall portions of the two measuring rulers are magnetically attracted by the first magnetic assemblies of the two measuring rulers, so that the plurality of measuring probes of each measuring ruler face the sidewall portion of the other measuring ruler. The processor is configured to correct measurement data from the plurality of measuring probes in the first state. The utility model solves the problems of prior art flatness measurement methods, such as high reliance on manpower, large deviations in measurement data, and inaccurate readings when measuring the flatness of higher walls, thereby accelerating measurement speed and ensuring accurate flatness measurement.

Claims

1. A flatness measurement assembly, characterized in that: The flatness measurement assembly includes two measuring rulers, each of the measuring rulers includes a ruler body, a first magnetic attraction assembly, a plurality of measuring probes and a processor, and the ruler body includes a side wall portion; in a first state, the side wall portions of the two measuring rulers are brought close to each other under the magnetic attraction cooperation of the first magnetic attraction assemblies of the two measuring rulers, so that the plurality of measuring probes of each measuring ruler are oriented toward the side wall portion of the other measuring ruler, and the processor is used to correct the measurement data of the plurality of measuring probes in the first state.

2. The flatness measurement assembly according to claim 1, characterized in that: Each of the measuring rulers further comprises a first communication contact, which is arranged on the side wall portion. In the first state, the first communication contacts of the two measuring rulers are connected to each other, thereby enabling data transmission between the two measuring rulers.

3. The flatness measuring assembly according to claim 2, characterized in that: Each measuring ruler also includes a human-machine interface for accepting user instructions. The processor generates a correction instruction in response to a first user instruction accepted by the human-machine interface on the measuring ruler, and sends the correction instruction to another measuring ruler via the first communication contact.

4. The flatness measurement assembly according to claim 2, characterized in that: The processor is configured to perform correction based on measurement data of the multiple measurement probes on the measurement scale on which the processor is located and measurement data of the multiple measurement probes on another measurement scale obtained via the first communication contact.

5. The flatness measurement assembly according to claim 1, characterized in that: The first magnetic attraction component includes a first magnet and a second magnet which are arranged on the side wall portion at intervals along the length direction of the ruler body, the first magnet and the second magnet have different magnetic poles facing the outside of the ruler body, and the multiple measuring probes are arranged at intervals between the first magnet and the second magnet.

6. The flatness measuring assembly according to claim 5, characterized in that: The plurality of measuring probes are arranged at equal intervals between the first magnet and the second magnet, and the interval between the first magnet and adjacent measuring probes is different from the interval between the second magnet and adjacent measuring probes.

7. The flatness measurement assembly according to claim 1, characterized in that: Each measuring ruler further includes a second magnetic attraction component, and the ruler body further includes an end wall portion. In the second state, the end walls of the two measuring rulers are fixed to each other under the magnetic attraction cooperation of the second magnetic attraction components of the two measuring rulers.

8. The flatness measuring assembly according to claim 7, characterized in that: The end wall portion includes a first end wall portion and a second end wall portion spaced apart along the length direction of the ruler body, and the second magnetic attraction component includes a third magnet respectively arranged on the first end wall portion and a fourth magnet arranged on the second end wall portion, and the third magnet and the fourth magnet have different magnetic poles facing the outside of the ruler body.

9. The flatness measurement assembly according to claim 8, characterized in that: Each of the measuring rulers further comprises a second communication contact, which is arranged on the end wall portion. In the second state, the second communication contacts of the two measuring rulers are connected to each other, thereby enabling data transmission between the two measuring rulers.

10. The flatness measurement assembly according to claim 9, characterized in that: Each of the processors generates a measurement data sharing instruction in response to a second user instruction received by the human-machine interface of the measuring ruler on which it is located, sends the measurement data sharing instruction to another measuring ruler via the second communication contact, receives the measurement data returned by the other measuring ruler in response to the measurement data sharing instruction, and further displays the measurement data on the human-machine interface of the measuring ruler.

11. The flatness measurement assembly according to claim 10, characterized in that: Each of the measuring rulers further includes a data acquisition module, which is used to acquire identification marks of the structural parts to be measured, and the processor associates the identification marks with the measurement data of the multiple measurement probes.

12. The flatness measurement assembly according to claim 11, characterized in that: Each of the measuring rulers also includes a communication module for transmitting the associated identification mark and measurement data to the cloud.

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