Resist material, pattern formation method, and patterned structure

Abstract

The purpose of the present invention is to provide: a novel resist material containing (A) a heteropoly acid salt having a modified defect site or a mixture of such heteropoly acid salts; a pattern formation method; and a patterned structure.

Description

Resist material, pattern forming method, and patterned structure

[0001] The present invention relates to a resist material, a patterning method, and a patterned structure.

[0002] Polyacids are those having the general formula [M ｘ O ｙ ] ｎ－ (wherein x, y, and n are all natural numbers). The metal atom M constituting the polyacid is called a polyatom, and examples thereof include Mo (hexavalent or pentavalent), W (hexavalent or pentavalent), V (pentavalent), Nb (pentavalent), and Ta (pentavalent). The polyacid is an isopolyacid composed of the polyatom M and an oxygen acid, or a polyacid containing a different type of heteroatom X (for example, P as the heteroatom X) in addition to the polyatom M and oxygen. ５＋ , Si ４＋ , Ge ４＋ , B ３＋ Heteropolyacids containing [X ｗ M ｘ O ｙ ] ｎ－ (wherein w, x, y, and n are all natural numbers)

[0003] The physicochemical properties of polyacids, such as oxidation-reduction ability, reactivity to actinic rays, and acidity, can be changed depending on the combination of their constituent elements, their structure, the type of counter cation, and the like.

[0004] It is also known that polyacids have multiple defect species in which a portion of the basic skeleton is missing. The terminal oxygen atoms at the defect sites, where a portion of the basic skeleton of a polyacid is missing, have a certain degree of negative charge density on the oxygen atoms, making them highly reactive and nucleophilic. Therefore, by reacting the terminal oxygen atoms with electrophilic atoms or molecules, various functional polyacid complexes and organic / inorganic hybrid structures can be formed.

[0005] Patent Document 1 discloses a polyoxometalate compound having a metal-substituted polyoxometalate, which comprises a polyoxometalate having defect sites, a substituting metal atom (divalent platinum or palladium) introduced into the defect sites, and an organic ligand.

[0006] U.S. Pat. No. 1,142,0871

[0007] An object of the present invention is to provide a novel resist material, a patterning method, and a patterned structure.

[0008] As a result of intensive research conducted by the present inventors to solve the above-mentioned problems, they have interestingly found that a heteropolyacid salt having a modified defect site or a mixture thereof can be used as a component of a resist material, and that a resist film can be formed using a resist material containing a heteropolyacid salt having a modified defect site or a mixture thereof, thereby completing the present invention.

[0009] That is, the present invention relates to the following inventions. <1> A resist material containing (A) a heteropolyacid salt having modified defect sites or a mixture thereof. <2> The resist material according to <1>, wherein the anion moiety of the (A) heteropolyacid salt having modified defect sites or the mixture thereof is a heteropolyacid anion having defect sites, in which the defect sites have been modified. <3> The resist material according to <2>, wherein the polyatom of the heteropolyacid anion is Mo, W, V, Nb, or Ta, and the heteroatom is P, Si, B, S, or Ge. <4> The resist material according to <2>, wherein the heteropolyacid anion having defect sites is a defective Keggin-type heteropolyacid anion or a defective Dawson-type heteropolyacid anion. <5> The resist material according to <2>, wherein the modification is achieved by bonding a group having one or more heteroatoms P, Si, Ge, or Sn, to which one or more organic groups are bonded, to the heteropolyacid anion having defect sites, via some or all of the heteroatoms. <6> The resist material according to <5>, wherein the organic group has one or more polar groups having an acid-dissociable group. <7> The resist material according to <6>, wherein the acid-dissociable group is a tertiary carbon-type acid-dissociable group, an allyl-type or benzyl-type acid-dissociable group, an acetal-type acid-dissociable group, or an aminocarbonyl-type acid-dissociable group. <8> The resist material according to <6>, wherein the cation moiety of the heteropolyacid salt or mixture thereof (A) whose defect sites have been modified is selected from the group consisting of H ＋ The resist material according to <1>, which contains one or more of a metal ion, an onium cation, or an onium dication. <9> The resist material according to <8>, wherein the onium cation or onium dication is an ammonium cation, an ammonium dication, a phosphonium cation, a phosphonium dication, a sulfonium cation, a sulfonium dication, or an iodonium cation. <10> The resist material according to <1>, wherein the (A) heteropolyacid salt having modified defect sites or a mixture thereof is a heteropolyacid salt having modified defect sites represented by general formula (I) or a mixture thereof. (A ｍ＋ ) ａ (C （ａｍ）－ ) (I) [wherein A ｍ＋ are each independently H＋ , a metal ion, an onium cation, or an onium dication; C （ａｍ）－ represents a heteropolyacid anion in which the defective sites have been modified in the heteropolyacid anion having defective sites; m is an integer of 1 to 5, and a is a real number greater than 0.] <11> The resist material according to <10>, wherein the heteropolyacid anion in which the defective sites have been modified in the heteropolyacid anion has one or more polar groups having an acid dissociable group. <12> The resist material according to <1>, wherein the (A) defective-site-modified heteropolyacid salt or mixture thereof is a defective-site-modified heteropolyacid salt represented by general formula (I') or a mixture thereof. (A' ｍ’＋ ) ａ’ (B ｎ＋ ) ｂ (C'(a'm'+bn)-) (I') [wherein A' ｍ’＋ are each independently H ＋ , a metal ion, an ammonium cation, an ammonium dication, a phosphonium cation, or a phosphonium dication; B ｎ＋each independently represent a sulfonium cation, a sulfonium dication, or an iodonium cation; C'(a'm'+bn)- represents a heteropolyacid anion having deficiency sites, in which the deficiency sites have been modified; m' is an integer of 1 to 5, n is an integer of 1 or 2, a' is a real number, and b is a real number greater than 0.] <13> The resist material according to <12>, wherein the heteropolyacid anion having deficiency sites, in which the deficiency sites have been modified, has one or more polar groups having an acid-dissociable group. <14> The resist material according to <1>, further comprising (B) an acid diffusion controller. <15> The resist material according to <14>, wherein the (B) acid diffusion controller is (B1) a photodegradable base. <16> The resist material according to <1>, further comprising an organic solvent. <17> The resist material according to any one of <1> to <16>, which is a resist material for electron beams or EUV. <18> A pattern forming method comprising: forming a resist film using the resist material according to any one of <1> to <16>, exposing the resist film to light, and developing the exposed resist film using a developer. <19> The step of exposing the resist film comprises exposing the resist film to light at a rate of 2 mC / cm ２ Electron beam or 200 mJ / cm ２ <18> A pattern forming method according to <18>, comprising a step of exposing to extreme ultraviolet light. <20> A patterned structure obtained by patterning the resist material according to any one of <1> to <16>.

[0010] <21> The resist material according to <4>, wherein the defective Keggin heteropolyacid anion is represented by general formula (II-1), (II-2), or (II-3). [XM １１ O ３９ ] ｃ１１－ (II-1) [XM １０ O ３６ ] ｃ１２－ (II-2) [XM ９ O ３４ ] ｃ１３－(II-3) (wherein X represents a heteroatom of P, Si, B, S, or Ge; M represents a polyatom of Mo, W, V, Nb, or Ta; c11- to c13- represent the number of negative charges, and c11 to c13 are natural numbers.) <22> The resist material according to <4>, wherein the deficient Dawson-type heteropolyacid anion is represented by general formula (III-1), (III-2), or (III-3). [X ２ M １７ O ６１ ] ｃ２１－ (III-1) [X ２ M １６ O ５８ ] ｃ２２－ (III-2) [X ２ M １５ O ５６ ] ｃ２３－ (III-3) (wherein X represents a heteroatom of P, Si, B, S, or Ge; M represents a polyatom of Mo, W, V, Nb, or Ta; c21- to c23- represent the number of negative charges, and c21 to c23 are natural numbers.)

[0011] <23> The resist material according to <2>, wherein the heteropolyacid anion having a modified defect site is a heteropolyacid anion having a modified defect site represented by any one of general formulas (VI-1) to (VI-12). [XM １１ O ３９ (R １Ａ X') ２ O] ｃ３１－ (VI-1) [XM １１ O ３９ (R １Ｂ１ R １Ｂ２ X') ２ ] ｃ３１－ (VI-2) [XM １１ O ３９ (R １Ｄ P=O) ２ ] ｃ３１－ (VI-3) [XM １１ O ３９ (R １Ｅ X'') ｃ３１－ (VI-4) [XM １０ O ３６ (R １Ａ X') ２ O]ｃ３２－ (VI-5) [XM １０ O ３６ (R １Ｂ１ R １Ｂ２ X') ２ ] ｃ３２－ (VI-6) [XM １０ O ３６ (R １Ｃ X'O) ４ ] ｃ３２－ (VI-7) [XM １０ O ３６ (R １Ｄ P=O) ２ ] ｃ３２－ (VI-8) [X ２ M １７ O ６１ (R １Ａ X') ２ O] ｃ３３－ (VI-9) [X ２ M １７ O ６１ (R １Ｂ１ R １Ｂ２ X') ２ ] ｃ３３－ (VI-10) [X ２ M １７ O ６１ (R １Ｄ P=O) ２ ] ｃ３３－ (VI-11) [X ２ M １７ O ６１ (R １Ｅ X'') ｃ３３－ (VI-12) (wherein, X represents a heteroatom of P, Si, B, S, or Ge; M represents a polyatom of Mo, W, V, Nb, or Ta; X' represents a heteroatom of Si or Ge; X'' represents a heteroatom of Si, Ge, or Sn; R １Ａ ~R １Ｅ are each independently a hydro group or an optionally substituted C １－１８ represents a hydrocarbyl group, a 3- to 18-membered non-aromatic heterocyclic group, or a 5- to 18-membered aromatic heterocyclic group, １Ａ ~R １ＥThe divalent carbon atom at any position excluding the terminal may be -O-, -C(=O)-, -C(=O)O-, -OCO-, -CONH-, -NHCO-, -NH(C=O)O-, -S- or -SO ２ - (provided that adjacent divalent carbon atoms are not simultaneously replaced), １Ａ ~R １Ｅ a hydrogen atom contained in may be substituted with, for example, (a) a halogen atom, (b) a haloalkyl group, (c) a hydroxy group, (d) a thiol group, (e) a nitro group, (f) a cyano group, (g) a carboxy group, (h) an amino group, (i) a sulfo group, (j) a vinyl group, (k) an allyl group, (l) a (meth)acryloyl group, (m) a (meth)acryloyloxy group, (n) a (meth)acrylamide group, (o) a styryl group, (p) an epoxy group, (q) a glycidyl group, (r) an amide group, (s) a hydroxy group or carboxy group having a protecting group, or (t) a polar group having an acid-dissociable group; and c31, c32, and c33 are natural numbers.

[0012] According to the present invention, it is possible to provide a novel resist material, pattern formation method, and patterned structure containing a heteropolyacid salt or a mixture thereof in which defect sites have been modified. Customizing the anion and cation moieties of the heteropolyacid salt or a mixture thereof in which defect sites have been modified makes it possible to provide resist materials with diverse functionality. For example, by introducing a polar group having an acid-dissociable group into the anion moiety of the heteropolyacid salt or a mixture thereof in which defect sites have been modified, it is possible to provide a resist material in which the solubility in a developer can be changed by the action of acid. Furthermore, by introducing a sulfonium cation, sulfonium dication, or iodonium cation into the cation moiety of the heteropolyacid salt or a mixture thereof in which defect sites have been modified, it is possible to provide a resist material that generates acid upon exposure to DUV, XUV, EUV, electron beam, or the like.

[0013] Preferred embodiments of the present invention will be described in detail below, but the present invention is not limited to the following embodiments.

[0014] In this specification, the term "(meth)acryloyl group" is used to mean both an acryloyl group and a methacryloyl group.

[0015] As used herein, the term "halogen atom" refers to a fluorine atom, a chlorine atom, a bromine atom, or an iodine atom.

[0016] In this specification, for example, "C １－６ " and other terms refer to the number of carbon atoms in the core group.

[0017] As used herein, "C １－１８ The term "hydrocarbylene group" refers to a divalent hydrocarbon group generated by removing two hydrogen atoms from a hydrocarbon having 1 to 18 carbon atoms. The hydrocarbylene group may be linear or branched, or may be partially or entirely cyclic. The hydrocarbylene group includes alkylene groups, arylene groups, etc. Also, "C １－１８ The divalent carbon atom at any position of the "hydrocarbylene group" may be -O-, -S-, -C(=O)-, -COO-, -OCO-, -CONH-, -NHCO-, -NH(C=O)O-, -S-, -SO-, or -SO ２ - may be substituted (however, adjacent divalent carbon atoms may not be substituted at the same time). １－１８ The "hydrocarbylene group" is not particularly limited, and examples thereof include "C" such as methylene group, ethylene group, n-propylene group, i-propylene group, cyclopentadiyl group, cyclohexanediyl group, oxyethane-1,1-diyl group, oxyethane-1,2-diyl group, oxypropane-1,3-diyl group, oxypropane-1,2-diyl group, 2-methylpropane-1,3-diyl group, and oxyethyleneoxyethane-1,1-diyl group. １－１８ alkylene group"; 1,4-phenylene group, 1,3-phenylene group, 1,2-phenylene group, 1,4-naphthylene group, 1,5-naphthylene group, 1,8-naphthylene group, 4,4'-biphenylene group, anthracenediyl group, phenanthrenediyl group, naphthacenediyl group, pyrenediyl group, perylenediyl group, chrysenediyl group, etc. ６－１８ arylene group" and the like.

[0018] As used herein, "C １－１８ The term "alkyl group" means a linear or branched alkyl group having 1 to 18 carbon atoms. １－１８ The divalent carbon atom at any position excluding the terminal contained in the "alkyl group" is -O-, -C(=O)-, -C(=O)O-, -OCO-, -CONH-, -NHCO-, -NH(C=O)O-, -S-, or -SO ２ However, adjacent divalent carbon atoms may not be replaced at the same time. １－１８ The "alkyl group" is not particularly limited, and examples thereof include a methyl group, an ethyl group, an n-propyl group, an i-propyl group, an n-butyl group, an i-butyl group, a sec-butyl group, a t-butyl group, an n-pentyl group, an i-pentyl group, a sec-pentyl group, a t-pentyl group, a neopentyl group, a 1-methylbutyl group, a 2-methylbutyl group, a 1,1-dimethylpropyl group, a 1,2-dimethylpropyl group, an n-hexyl group, an i-hexyl group, a 1-methylpentyl group, a 2-methylpentyl group, a 3-methylpentyl group, a 1 , 1-dimethylbutyl group, 1,2-dimethylbutyl group, 2,2-dimethylbutyl group, 1,3-dimethylbutyl group, 2,3-dimethylbutyl group, 3,3-dimethylbutyl group, 1-ethylbutyl group, 2-ethylbutyl group, 1,1,2-trimethylpropyl group, 1,2,2-trimethylpropyl group, 1-ethyl-1-methylpropyl group, 1-ethyl-2-methylpropyl group, n-heptyl group, n-octyl group, n-nonyl group, n-decyl group, n-undecyl group, n-dodecyl group, and the like. １－１８ The alkyl group may have a divalent carbon atom at any position excluding the terminal, and the divalent carbon atom may be -O-, -C(=O)-, -C(=O)O-, -OCO-, -CONH-, -NHCO-, -NH(C=O)O-, -S-, or -SO ２ The group substituted with - is not particularly limited, and examples thereof include a 2-methoxyethoxymethyl group, an ethoxycarbonylmethyl group, and the like.

[0019] As used herein, "C １－１８ The term "haloalkyl group" refers to "C １－１８ "C" means a group in which one or more hydrogen atoms of an "alkyl group" are substituted with halogen atoms.１－１８ The "haloalkyl group" is not particularly limited, and examples thereof include a dichloromethyl group, a trifluoromethyl group, a 2,2-difluoroethyl group, a 2,2,2-trifluoroethyl group, a pentafluoroethyl group, and a 3,3,3-trifluoropropyl group.

[0020] As used herein, "C ２－１８ The term "alkenyl group" refers to a group having two or more carbon atoms. １－１８ "C" means an alkenyl group having one or more double bonds, and includes alkadienyl groups, alkatrienyl groups, etc. ２－１８ The "alkenyl group" is not particularly limited, and examples thereof include a vinyl group (ethenyl group), an allyl group (2-propenyl group), a 1-propenyl group, an isopropenyl group (1-methylvinyl group), a 1-butenyl group, a 2-butenyl group, a 3-butenyl group, a pentenyl group, a hexenyl group, a heptenyl group, an octenyl group, a nonenyl group, a decenyl group, an undecenyl group, and a dodecenyl group.

[0021] As used herein, "C ２－１８ The term "alkynyl group" refers to a group having two or more carbon atoms. １－１８ "C" means an alkynyl group having one or more triple bonds in the "alkyl group." ２－１８ The "alkynyl group" is not particularly limited, and examples thereof include an ethynyl group, a 1-propynyl group, a 2-propynyl group, a pentynyl group, a hexynyl group, a heptynyl group, an octynyl group, a nonynyl group, a decynyl group, an undecynyl group, and a dodecynyl group.

[0022] As used herein, "C ３－１８ The term "alicyclic group" refers to a hydrocarbon group having, in whole or in part, a monocyclic or polycyclic structure having 3 to 18 carbon atoms. Alicyclic groups also include cycloalkyl groups, cycloalkenyl groups, cycloalkynyl groups, monocycloalkyl groups, polycycloalkyl groups, etc. ３－１８ A divalent carbon atom at any position excluding the terminals contained in the "alicyclic group" may be -O-, -C(=O)-, -C(=O)O-, -OCO-, -CONH-, -NHCO-, -NH(C=O)O-, -S-, or SO ２- may be substituted (however, adjacent divalent carbon atoms may not be substituted at the same time). ３－１８ The "cycloalkyl group" is not particularly limited, and examples thereof include a cyclopropyl group, a cyclobutyl group, a cyclopentyl group, a 1-i-propylcyclopentan-1-yl group, a cyclohexyl group, a t-butylcyclohexyl group, a tricyclodecanyl group, a cycloheptyl group, a cyclooctyl group, a cyclodecyl group, a 2-methyladamantan-2-yl group, a 2-i-propyladamantan-2-yl group, a bornyl group, a norbornyl group, a fenchyl group, a pinanyl group, an adamantyl group, a tricyclodecyl group, a tetracyclododecyl group, a cyclopropylmethyl group, a cyclobutylmethyl group, a cyclopentylmethyl group, a cyclohexylmethyl group, a bornylmethyl group, a norbornylmethyl group, an adamantylmethyl group, a 1-methylcyclopentyloxycarbonylmethyl group, a cyclopentenyl group, a cyclohexenyl group, and a cycloheptenyl group.

[0023] As used herein, the term "3- to 18-membered non-aromatic heterocyclic group" refers to a 3- to 18-membered non-aromatic heterocyclic group containing one or more heteroatoms selected from the group consisting of nitrogen atoms, oxygen atoms, and sulfur atoms, and may be a monocyclic, polycyclic, or fused ring, and may be saturated or partially unsaturated. The "3- to 18-membered non-aromatic heterocyclic group" is not particularly limited, and examples thereof include an aziridinyl group, an azetidyl group, a pyrrolidinyl group, a pyrrolyl group, a piperidinyl group, a piperazinyl group, a morpholinyl group, a thiomorpholinyl group, a tetrahydrofuryl group, a tetrahydropyranyl group, an oxetanyl group, a tetrahydrofuryl group, a tetrahydropyranyl group, an imidazolinyl group, an oxazolinyl group, a 2,5-diazabicyclo[2.2.1]heptyl group, a 2,5-diazabicyclo[2.2.2]octyl group, a 3,8-diazabicyclo[3.2.1]octyl group, a 1,4-diazabicyclo[4.3.0]nonyl group, a 1-azaadamantyl group, and a 2-azaadamantyl group.

[0024] As used herein, "C ２－１８The term "aryl group" means an aromatic hydrocarbon cyclic group having 6 to 18 carbon atoms or an aromatic heterocyclic group having 2 to 10 carbon atoms. In the case of an aromatic heterocyclic group, a ring is formed by a carbon atom having 2 to 10 carbon atoms and one or more heteroatoms selected from the group consisting of a nitrogen atom, an oxygen atom, and a sulfur atom, and each may be a monocyclic ring, a polycyclic ring, or a fused ring. ２－１８ The "aryl group" is not particularly limited, and examples thereof include a phenyl group, a 1-naphthyl group, a 2-naphthyl group, an azulenyl group, a pentalenyl group, a heptalenyl group, an indacenyl group, an acenaphthyl group, a phenanthrenyl group, an anthracenyl group, and the like.

[0025] As used herein, "C ７－１８ The term "aralkyl group" refers to "C １－１２ The substitutable portion of the "C alkyl group" is ２－１２ "C" means a group substituted with an "aryl group." ７－１８ The "aralkyl group" is not particularly limited, and examples thereof include a benzyl group, a phenethyl group, a 3-phenylpropyl group, a 4-phenylbutyl group, a 1-naphthylmethyl group, and a 2-naphthylmethyl group.

[0026] As used herein, "C １－１８ The term "hydrocarbyl group" refers to a monovalent group formed by removing one hydrogen atom from a hydrocarbon having 1 to 18 carbon atoms. Hydrocarbyl groups include alkyl groups, alkenyl groups, alkynyl groups, alicyclic groups, aryl groups, aralkyl groups, and the like. １－１８ A divalent carbon atom at any position excluding the terminal contained in the "hydrocarbyl group" may be -O-, -C(=O)-, -C(=O)O-, -OCO-, -CONH-, -NHCO-, -NH(C=O)O-, -S-, or -SO ２ - (however, adjacent divalent carbon atoms cannot be replaced at the same time). １－１８ The term "C" used in the definition of "hydrocarbyloxy group" and the like is used in the definition of "C" １－１８ The same applies to "hydrocarbyl group" and the like. １－１８ The "hydrocarbyl group" is not particularly limited, and examples thereof include "C １－１８alkyl group," "C ２－１８ alkenyl group," "C ２－１８ alkynyl group," "C ３－１８ Alicyclic group”, “C ２－１８ aryl group," "C ７－１８ aralkyl groups, etc.

[0027] As used herein, "C １－１８ The term "hydrocarbyloxy group" refers to a group consisting of "C １－１８ "C" means a group in which an oxygen atom (-O-) is bonded to a "hydrocarbyl group." １－１８ The "hydrocarbyloxy group" is not particularly limited, and examples thereof include a methoxy group, an ethoxy group, an n-propoxy group, an i-propoxy group, an n-butoxy group, an i-butoxy group, a sec-butoxy group, a t-butoxy group, an n-pentoxy group, an i-pentoxy group, a sec-pentoxy group, an n-hexoxy group, an i-hexoxy group, a 1,1-dimethylpropyloxy group, a 1,2-dimethylpropyloxy group, a 2,2-dimethylpropyloxy group, a 1-methyl- "C" groups such as 2-ethylpropyloxy group, 1-ethyl-2-methylpropyloxy group, 1,1,2-trimethylpropyloxy group, 1,2,2-trimethylpropyloxy group, 1,1-dimethylbutyloxy group, 1,2-dimethylbutyloxy group, 2,2-dimethylbutyloxy group, 2,3-dimethylbutyloxy group, 1,3-dimethylbutyloxy group, 2-ethylbutyloxy group, 2-methylpentyloxy group, and 3-methylpentyloxy group １－１８ alkoxy group"; cyclopropyloxy group, cyclobutyloxy group, cyclopentyloxy group, cyclohexyloxy group, cycloheptyloxy group, cyclooctyloxy group, 1-methylcyclopentyloxycarbonylmethoxy group, 1-ethylcyclohexyloxycarbonylmethoxy group, 1-methyladamantyloxycarbonylmethoxy group, etc. ３－１８ alicyclic oxy group"; phenyloxy group, 1-naphthyloxy group, 2-naphthyloxy group, azulenyloxy group, pentalenyloxy group, heptalenyloxy group, indacenyloxy group, acenaphthyloxy group, phenanthrenyloxy group, anthracenyloxy group, etc. ６－１８ aryloxy group."１－１８ The "hydrocarbyloxy group" includes "C １－１８ It is preferred that a divalent carbon atom at any position except the terminal contained in the "hydrocarbyl group" is replaced with -O-, -C(=O)-, and / or -C(=O)O-. １－１８ A "hydrocarbyloxycarbonylalkyloxy group" is more preferred, and from the viewpoint of solubility, it is even more preferred that the carbon bonded to the oxygen atom of the hydrocarbyloxy is a tertiary carbon. Specific examples of the hydrocarbyloxy include optionally substituted ethylcyclopentyloxy, methyladamantyloxy, ethyladamantyloxy, t-butyloxy, etc.

[0028] As used herein, "C １－１８ The term "hydrocarbyl carbonyl group" refers to a group consisting of "C １－１８ It means a group in which a carbonyl group (—C(═O)—) is bonded to a “hydrocarbyl group.” １－１８ The "hydrocarbyl carbonyl group" is not particularly limited, and examples thereof include "C" such as an acetyl group, a propionyl group, an isopropionyl group, a butyryl group, an isobutyryl group, a valeryl group, an isovaleryl group, a pentanoyl group, a 3-methylbutanoyl group, a pivaloyl group, a hexanoyl group, and a heptanoyl group. １－１８ alkylcarbonyl group"; cyclopropylcarbonyl group, cyclobutylcarbonyl group, cyclopentylcarbonyl group, 2-methylcyclopentylcarbonyl group, 3-methylcyclopentylcarbonyl group, cyclohexylcarbonyl group, 2-methylcyclohexylcarbonyl group, 3-methylcyclohexylcarbonyl group, 4-methylcyclohexylcarbonyl group, adamantylcarbonyl group, etc. ３－１８ alicyclic carbonyl group"; "C" such as benzoyl group, 1-naphthoyl group, 2-naphthoyl group, etc. ６－１８ arylcarbonyl group" and the like.

[0029] As used herein, "C １－１８ The term "hydrocarbylcarbonyloxy group" refers to a group consisting of "C １－１８ "C" means a group in which an oxygen atom (-O-) is bonded to a "hydrocarbyl carbonyl group." １－１８The "hydrocarbylcarbonyloxy group" is not particularly limited, and examples thereof include "C" such as a methylcarbonyloxy group, an ethylcarbonyloxy group, an n-propylcarbonyloxy group, an isopropylcarbonyloxy group, an n-butylcarbonyloxy group, an isobutylcarbonyloxy group, a t-butylcarbonyloxy group, an n-pentylcarbonyloxy group, an isopentylcarbonyloxy group, and a hexylcarbonyloxy group. １－１８ alkylcarbonyloxy group"; cyclopropylcarbonyloxy group, cyclobutylcarbonyloxy group, cyclopentylcarbonyloxy group, cyclohexylcarbonyloxy group, etc. ３－１８ alicyclic carbonyloxy group"; "C" such as a phenylcarbonyloxy group, a naphthylcarbonyloxy group, an acenaphthylcarbonyloxy group, a phenanthrenylcarbonyloxy group, an anthracenylcarbonyloxy group, etc. ６－１８ arylcarbonyloxy group" and the like.

[0030] As used herein, "C １－１８ The term "hydrocarbyloxycarbonyl group" refers to a group consisting of "C １－１８ It means a group in which a carbonyl group (—C(═O)—) is bonded to a “hydrocarbyloxy group.” １－１８ The "hydrocarbyloxycarbonyl group" is not particularly limited, and examples thereof include "C" such as a methoxycarbonyl group, an ethoxycarbonyl group, an n-propoxycarbonyl group, an i-propoxycarbonyl group, an n-butoxycarbonyl group, an i-butoxycarbonyl group, a sec-butoxycarbonyl group, a t-butoxycarbonyl group, an n-pentoxycarbonyl group, and a neopentyloxycarbonyl group. １－１８ alkoxycarbonyl group"; "C" such as a cyclopropyloxycarbonyl group, a cyclobutyloxycarbonyl group, a cyclopentyloxycarbonyl group, a cyclohexyloxycarbonyl group, a 2-methylcyclopentyloxycarbonyl group, a 3-methylcyclopentyloxycarbonyl group, a 2-methylcyclohexyloxycarbonyl group, a 3-methylcyclohexyloxycarbonyl group, and a 4-methylcyclohexyloxycarbonyl group; ３－１８alicyclic oxycarbonyl group"; "C" such as a phenoxycarbonyl group, a naphthoxycarbonyl group, an acenaphthyloxycarbonyl group, a phenanthrenyloxycarbonyl group, an anthracenyloxycarbonyl group, etc. ６－１８ aryloxycarbonyl group" and the like.

[0031] As used herein, "C １－１８ The term "hydrocarbyloxycarbonyloxy group" refers to a group consisting of "C １－１８ "C" means a group in which an oxygen atom (-O-) is bonded to a "hydrocarbyloxycarbonyl group." １－１８ The "hydrocarbyloxycarbonyloxy group" is not particularly limited, and examples thereof include "C" such as a methoxycarbonyloxy group, an ethoxycarbonyloxy group, an n-propyloxycarbonyloxy group, an i-propyloxycarbonyloxy group, an n-butoxycarbonyloxy group, an i-butoxycarbonyloxy group, a sec-butoxycarbonyloxy group, a t-butoxycarbonyloxy group, an n-pentyloxycarbonyloxy group, an i-pentyloxycarbonyloxy group, and an n-hexyloxycarbonyloxy group. １－１８ alkoxycarbonyloxy group"; "C" such as cyclopropyloxycarbonyloxy group, cyclobutyloxycarbonyloxy group, cyclopentyloxycarbonyloxy group, cyclohexyloxycarbonyloxy group, etc. ３－１８ alicyclic oxycarbonyloxy group"; "C" such as a phenoxycarbonyloxy group, a naphthoxycarbonyloxy group, an acenaphthyloxycarbonyloxy group, a phenanthrenyloxycarbonyloxy group, an anthracenyloxycarbonyloxy group, etc. ６－１８ aryloxycarbonyloxy group" and the like.

[0032] As used herein, "C １－１８ The term "hydrocarbylamino group" refers to a group consisting of one "C １－１８ "C" means a group bonded to an amino group. １－１８The "hydrocarbylamino group" is not particularly limited, and examples thereof include a "C hydrocarbylamino group" such as a methylamino group, an ethylamino group, an n-propylamino group, an i-propylamino group, an n-butylamino group, an i-butylamino group, a sec-butylamino group, a t-butylamino group, an n-pentylamino group, an i-pentylamino group, a neopentylamino group, and an n-hexylamino group. １－１８ alkylamino group"; cyclopropylamino group, cyclobutylamino group, cyclopentylamino group, 2-methylcyclopentylamino group, 3-methylcyclopentylamino group, cyclohexylamino group, 2-methylcyclohexylamino group, 3-methylcyclohexylamino group, 4-methylcyclohexylamino group, etc. ３－１８ alicyclic amino group"; phenylamino group, 1-naphthylamino group, 2-naphthylamino group, etc. ６－１８ arylamino group" and the like.

[0033] As used herein, "diC １－１８ The term "hydrocarbylamino group" refers to two identical or different "C １－１８ "DiC" means a group in which a "hydrocarbyl group" is bonded to an amino group. １－１８ The "hydrocarbylamino group" is not particularly limited, and examples thereof include a dimethylamino group, a diethylamino group, a di-n-propylamino group, a diisopropylamino group, a di-n-butylamino group, a diisobutylamino group, a di-t-butylamino group, a di-n-pentylamino group, a di-n-hexylamino group, an N-ethyl-N-methylamino group, an N-methyl-N-n-propylamino group, an N-isopropyl-N-methylamino group, an N-n-butyl-N-methylamino group, an N N-isobutyl-N-methylamino group, N-t-butyl-N-methylamino group, N-methyl-N-n-pentylamino group, N-n-hexyl-N-methylamino group, N-ethyl-N-n-propylamino group, N-ethyl-N-isopropylamino group, N-n-butyl-N-ethylamino group, N-ethyl-N-isobutylamino group, N-t-butyl-N-ethylamino group, N-ethyl-N-n-pentylamino group, N-ethyl-N-n-hexylamino group, and other "di-C １－１８alkylamino group"; "di-C" such as dicyclopropylamino group, dicyclobutylamino group, dicyclopentylamino group, dicyclohexylamino group, etc. ３－１８ alicyclic amino group"; "di-C" such as diphenylamino group, phenylnaphthylamino group, etc. ６－１８ "N-C arylamino group" such as N-methylcyclopentanamino group, N-methylcyclohexylamino group, etc. １－１８ Alkyl-N—C ３－１８ cycloalkylamino group"; "N-C cycloalkylamino group" such as N-methyl-2-phenylethylamino group, N-ethyl-N-(4-methylphenyl)amino group, etc. １－１８ Alkyl-N—C ６－１８ arylamino group" and the like.

[0034] As used herein, "C １－１８ The term "hydrocarbylaminocarbonyl group" refers to a group consisting of "C １－１８ It means a group in which a carbonyl group (—C(═O)—) is bonded to a “hydrocarbylamino group.” １－１８ The "hydrocarbylaminocarbonyl group" is not particularly limited, and examples thereof include "C" such as a methylaminocarbonyl group, an ethylaminocarbonyl group, an n-propylaminocarbonyl group, an i-propylaminocarbonyl group, an n-butylaminocarbonyl group, a sec-butylaminocarbonyl group, a t-butylaminocarbonyl group, an n-pentylaminocarbonyl group, a 2-pentylaminocarbonyl group, a neopentylaminocarbonyl group, a 4-methyl-2-pentylaminocarbonyl group, an n-hexylaminocarbonyl group, and a 3-methyl-n-pentylaminocarbonyl group. １－１８ alkylaminocarbonyl group"; cyclopropylaminocarbonyl group, cyclobutylaminocarbonyl group, cyclopentylaminocarbonyl group, cyclohexylaminocarbonyl group, 2-methylcyclopentylaminocarbonyl group, 3-methylcyclopentylaminocarbonyl group, 2-methylcyclohexylaminocarbonyl group, 3-methylcyclohexylaminocarbonyl group, 4-methylcyclohexylaminocarbonyl group, etc. ３－１８ alicyclic aminocarbonyl group"; phenylaminocarbonyl group, 1-naphthylaminocarbonyl group, 2-naphthylaminocarbonyl group, etc.６－１８ arylaminocarbonyl group.

[0035] As used herein, "diC １－１８ The term "hydrocarbylaminocarbonyl group" refers to a "diC １－１８ "DiC" means a group in which a carbonyl group (-C(=O)-) is bonded to a "hydrocarbylamino group." １－１８ The "hydrocarbylaminocarbonyl group" is not particularly limited, and examples thereof include a dimethylaminocarbonyl group, a diethylaminocarbonyl group, a di-n-propylaminocarbonyl group, a diisopropylaminocarbonyl group, a di-n-butylaminocarbonyl group, a diisobutylaminocarbonyl group, a di-t-butylaminocarbonyl group, a di-n-pentylaminocarbonyl group, a di-n-hexylaminocarbonyl group, an N-ethyl-N-methylaminocarbonyl group, an N-methyl-N-n-propylaminocarbonyl group, an N-isopropyl-N-methylaminocarbonyl group, an N-n-butyl-N-methylaminocarbonyl group, an "DiC" groups such as a carboxyl group, an N-isobutyl-N-methylaminocarbonyl group, an N-t-butyl-N-methylaminocarbonyl group, an N-methyl-N-n-pentylaminocarbonyl group, an N-n-hexyl-N-methylaminocarbonyl group, an N-ethyl-N-n-propylaminocarbonyl group, an N-ethyl-N-isopropylaminocarbonyl group, an N-n-butyl-N-ethylaminocarbonyl group, an N-ethyl-N-isobutylaminocarbonyl group, an N-t-butyl-N-ethylaminocarbonyl group, an N-ethyl-N-n-pentylaminocarbonyl group, and an N-ethyl-N-n-hexylaminocarbonyl group. １－１８ alkylamino group"; "di-C" such as dicyclopropylaminocarbonyl group, dicyclobutylaminocarbonyl group, dicyclopentylaminocarbonyl group, dicyclohexylaminocarbonyl group, etc. ３－１８ alicyclic aminocarbonyl group"; "di-C" such as diphenylaminocarbonyl group, phenylnaphthylaminocarbonyl group, etc. ６－１８ arylaminocarbonyl group" and the like.

[0036] As used herein, "C １－１８ The term "hydrocarbylcarbonylamino group" refers to a group consisting of "C １－１８"C" means a group in which an amino group is bonded to a "hydrocarbyl carbonyl group." １－１８ The "hydrocarbylcarbonylamino group" is not particularly limited, and examples thereof include "C" such as methylcarbonylamino group, ethylcarbonylamino group, n-propylcarbonylamino group, i-propylcarbonylamino group, n-butylcarbonylamino group, i-butylcarbonylamino group, sec-butylcarbonylamino group, t-butylcarbonylamino group, n-pentylcarbonylamino group, i-pentylcarbonylamino group, and n-hexylcarbonylamino group. １－１８ alkylcarbonylamino group"; cyclopropylcarbonylamino group, cyclobutylcarbonylamino group, cyclopentylcarbonylamino group, cyclohexylcarbonylamino group, etc. ３－１８ alicyclic carbonylamino group"; "C" such as phenylcarbonylamino group, naphthylcarbonylamino group, acenaphthylcarbonylamino group, phenanthrenylcarbonylamino group, anthracenylcarbonylamino group, etc. ６－１８ arylcarbonylamino group" and the like.

[0037] As used herein, "C １－１８ The term "hydrocarbylaminocarbonyloxy group" refers to a group consisting of "C １－１８ "C" means a group in which an oxygen atom (-O-) is bonded to a "hydrocarbylaminocarbonyl group." １－１８ The "hydrocarbylaminocarbonyloxy group" is not particularly limited, and examples thereof include "C" such as a methylaminocarbonyloxy group, an ethylaminocarbonyloxy group, and an n-propylaminocarbonyloxy group. １－１８ alkylaminocarbonyloxy group"; cyclopropylaminocarbonyloxy group, cyclohexylaminocarbonyloxy group, etc. ３－１８ alicyclic aminocarbonyloxy group"; phenylaminocarbonyloxy group, 1-naphthylaminocarbonyloxy group, etc. ６－１８ arylaminocarbonyloxy group" and the like.

[0038] As used herein, "diC １－１８ The term "hydrocarbylaminocarbonyloxy group" refers to a "diC １－１８"DiC" means a group in which an oxygen atom (—O—) is bonded to a "hydrocarbylaminocarbonyl group." １－１８ The "hydrocarbylaminocarbonyloxy group" is not particularly limited, and examples thereof include "diC" such as dimethylaminocarbonyloxy group, diethylaminocarbonyloxy group, and di-n-propylaminocarbonyloxy group. １－１８ alkylaminocarbonyloxy group, etc.

[0039] As used herein, "C １－１８ The term "hydrocarbylaminocarbonylamino group" refers to a group consisting of "C １－１８ "Hydrocarbylaminocarbonyl group" means a group bonded to an amino group. １－１８ The "hydrocarbylaminocarbonylamino group" is not particularly limited, and examples thereof include "C" such as methylaminocarbonylamino group, ethylaminocarbonyloxy group, and n-propylaminocarbonylamino group. １－１８ alkylaminocarbonylamino group"; cyclopropylaminocarbonylamino group, cyclohexylaminocarbonylamino group, etc. ３－１８ alicyclic aminocarbonylamino group"; phenylaminocarbonylamino group, 1-naphthylaminocarbonylamino group, etc. ６－１８ arylaminocarbonylamino group" and the like.

[0040] As used herein, "diC １－１８ The term "hydrocarbylaminocarbonylamino group" refers to a "diC １－１８ "Hydrocarbylaminocarbonyl group" means a group bonded to an amino group. １－１８ The "hydrocarbylaminocarbonylamino group" is not particularly limited, and examples thereof include "diC" such as dimethylaminocarbonylamino group, diethylaminocarbonylamino group, and di-n-propylaminocarbonylamino group. １－１８ alkylaminocarbonylamino group, etc.

[0041] As used herein, "C １－１８ The term "hydrocarbyloxycarbonylamino group" refers to a group consisting of "C １－１８"C" means a group in which a "hydrocarbyloxycarbonyl group" is bonded to an amino group. １－１８ The "hydrocarbyloxycarbonylamino group" is not particularly limited, and examples thereof include "C" such as a methoxycarbonylamino group, an ethoxycarbonylamino group, an n-propoxycarbonylamino group, an i-propoxycarbonylamino group, an n-butoxycarbonylamino group, and a t-butoxycarbonylamino group. １－１８ alkoxycarbonylamino group"; cyclopropyloxycarbonylamino group, cyclohexyloxycarbonylamino group, etc. ３－１８ alicyclic oxycarbonylamino group"; phenyloxycarbonylamino group, 1-naphthyloxycarbonylamino group, etc. ６－１８ aryloxycarbonylamino group" and the like.

[0042] As used herein, "C １－１８ The term "hydrocarbylthio group" refers to a group consisting of "C １－１８ "C" means a group in which a sulfur atom (-S-) is bonded to a "hydrocarbyl group." １－１８ The "hydrocarbylthio group" is not particularly limited, and examples thereof include a "C methylthio group, an ethylthio group, an n-propylthio group, an i-propylthio group, an n-butylthio group, an i-butylthio group, a t-butylthio group, an n-pentylthio group, an n-hexylthio group, etc. １－１８ alkylthio group"; cyclopropylthio group, cyclobutylthio group, cyclopentylthio group, cyclohexylthio group, 2-methylcyclopentylthio group, 3-methylcyclopentylthio group, 2-methylcyclohexylthio group, 3-methylcyclohexylthio group, 4-methylcyclohexylthio group, etc. ３－１８ alicyclic thio group"; "C" such as a phenylthio group, a 1-naphthylthio group, a 2-naphthylthio group, an acenaphthylthio group, a phenanthrenylthio group, an anthracenylthio group, etc. ６－１８ arylthio group" and the like.

[0043] As used herein, "C １－１８ The term "hydrocarbylsulfinyl group" refers to a group consisting of "C １－１８ "C" means a group in which a sulfinyl group (-S(=O)-) is bonded to a "hydrocarbyl group."１－１８ The "hydrocarbylsulfinyl group" is not particularly limited, and examples thereof include "C" such as methylsulfinyl group, ethylsulfinyl group, n-propylsulfinyl group, i-propylsulfinyl group, n-butylsulfinyl group, t-butylsulfinyl group, pentylsulfinyl group, and hexylsulfinyl group. １－１８ alkylsulfinyl group"; cyclopropylsulfinyl group, cyclobutylsulfinyl group, cyclopentylsulfinyl group, cyclohexylsulfinyl group, 2-methylcyclopentylsulfinyl group, 3-methylcyclopentylsulfinyl group, 2-methylcyclohexylsulfinyl group, 3-methylcyclohexylsulfinyl group, 4-methylcyclohexylsulfinyl group, etc. ３－１８ alicyclic sulfinyl group"; "C" such as a phenylsulfinyl group, a naphthylsulfinyl group, an acenaphthylsulfinyl group, a phenanthrenylsulfinyl group, an anthracenylsulfinyl group, etc. ６－１８ arylsulfinyl group" and the like.

[0044] As used herein, "C １－１８ The term "hydrocarbylsulfonyl group" refers to a group consisting of "C １－１８ The hydrocarbyl group may be a sulfonyl group (-SO ２ -) is bonded to the group. １－１８ The "hydrocarbylsulfonyl group" is not particularly limited, and examples thereof include "C" such as a methylsulfonyl group, an ethylsulfonyl group, an n-propylsulfonyl group, an i-propylsulfonyl group, an n-butylsulfonyl group, a t-butylsulfonyl group, and a pentylsulfonyl group. １－１８ alkylsulfonyl group"; "C" such as cyclopropylsulfonyl group, cyclobutylsulfonyl group, cyclopentylsulfonyl group, cyclohexylsulfonyl group, 2-methylcyclopentylsulfonyl group, 3-methylcyclopentylsulfonyl group, 2-methylcyclohexylsulfonyl group, 3-methylcyclohexylsulfonyl group, and 4-methylcyclohexyl group; ３－１８ alicyclic sulfonyl group"; "C" such as a phenylsulfonyl group, a naphthylsulfonyl group, an acenaphthylsulfonyl group, a phenanthrenylsulfonyl group, an anthracenylsulfonyl group, etc. ６－１８arylsulfonyl group" and the like.

[0045] As used herein, the term "acid-dissociable group" refers to a group that substitutes a hydrogen atom of a polar group, such as a hydroxy group (including a phenolic hydroxy group), a carboxy group, an amino group, or a sulfo group, and dissociates under the action of an acid. A compound having a polar group with an acid-dissociable group can increase the polarity of the compound by dissociating the acid-dissociable group under the action of an acid, thereby generating the polar group. This can change the solubility of the compound in a developer. More specifically, when a highly polar developer, such as an alkaline aqueous solution, is used as the developer, the solubility of the compound in the developer relatively increases, while when a less polar organic developer is used as the developer, the solubility of the compound in the developer relatively decreases. Preferred polar groups include a hydroxy group (including a phenolic hydroxy group) and a carboxy group.

[0046] The acid-dissociable group is not particularly limited, and any known and commonly used acid-dissociable group that can be used in chemically amplified resists can be used. Examples of the acid-dissociable group include an acid-dissociable group G for a polar group having an acid-dissociable group represented by the following general formulas (G-1) to (G-4).

[0047] The acid-dissociable group G is not particularly limited as long as it dissociates under the action of an acid, and any known and commonly used group can be used. Examples of the acid-dissociable group G include "tertiary carbon-type acid-dissociable groups G" represented by the following general formula (g-1): Ａ ", "allyl or benzyl acid-dissociable group G represented by the following general formula (g-2) Ｂ ", "acetal-type acid-dissociable group G represented by the following general formula (g-3) Ｃ ", "aminocarbonyl-type acid-dissociable group G represented by the following general formula (g-4) Ｄ Each of these will be explained in turn below.

[0048] <Tertiary carbon type acid dissociable group G Ａ The acid-dissociable group G is a "tertiary carbon-type acid-dissociable group G" represented by the following general formula (g-1): Ａ ", a carbon atom directly bonded to a polar group, and R Ａ ｇ１ ~R Ａ ｇ３ An acid-labile group in which the carbon atom to which the group is bonded is a tertiary carbon atom can be used.

[0049] "R Ａ ｇ１ " is an optionally substituted C １－１２ In a hydrocarbyl group, any divalent carbon atom excluding the terminal carbon atom may be —O—, —C(═O)—, —C(═O)O—, —OCO—, —CONH—, —NHCO—, —S—, or —SO ２ may be replaced by - (provided that adjacent divalent carbon atoms are not replaced at the same time).

[0050] R Ａ ｇ１ As the C １－１２ Alkyl group, C ３－１２ Alicyclic group, C ６－１２ an aryl group, or C ７－１２ An aralkyl group in which any divalent carbon atom excluding the terminal carbon atom is —O—, —C(═O)—, —C(═O)O—, —OCO—, —CONH—, —NHCO—, —S—, or —SO ２ - (provided that adjacent divalent carbon atoms are not simultaneously replaced), and １－１２ an alkyl group or C ３－１２ In an alicyclic group, any divalent carbon atom excluding the terminal carbon atom may be —O—, —C(═O)—, —C(═O)O—, —OCO—, —CONH—, —NHCO—, —S—, or —SO ２ It is more preferred that it may be substituted with - (provided that adjacent divalent carbon atoms are not substituted at the same time).

[0051] Also, "R Ａｇ２ " and "R Ａ ｇ３ " are each independently a C １－１２ A hydrocarbyl group in which a divalent carbon atom at any position except the terminal is —O—, —C(═O)—, —C(═O)O—, —OCO—, —CONH—, —NHCO—, —S—, or —SO ２ - (provided that adjacent divalent carbon atoms are not simultaneously replaced), or R Ａ ｇ２ and R Ａ ｇ３ are combined to form C which may have a substituent. ３－１８ An alicyclic group or a 3- to 18-membered non-aromatic heterocyclic group is formed, and a divalent carbon atom at any position except the terminal is -O-, -C(=O)-, -C(=O)O-, -OCO-, -CONH-, -NHCO-, -S-, or -SO ２ It may be substituted with - (provided that adjacent divalent carbon atoms are not substituted at the same time).

[0052] R Ａ ｇ２ and R Ａ ｇ３ As for R Ａ ｇ２ and R Ａ ｇ３ are combined to form C which may have a substituent. ３－１８ An alicyclic group or a 3- to 18-membered non-aromatic heterocyclic group is formed, and a divalent carbon atom at any position except the terminal is -O-, -C(=O)-, -C(=O)O-, -OCO-, -CONH-, -NHCO-, -S-, or -SO ２ - (provided that adjacent divalent carbon atoms are not simultaneously replaced), and ３－１８The alicyclic group or the 3- to 18-membered non-aromatic heterocyclic group contains a cyclopentane skeleton, a cyclohexane skeleton, a cycloheptane skeleton, a cyclooctane skeleton, a cyclononane skeleton, a cyclodecane skeleton, a cyclododecane skeleton, a cyclopentene skeleton, a cyclohexene skeleton, a cycloheptene skeleton, a cyclooctene skeleton, a cyclodecene skeleton, a norbornane skeleton, an adamantane skeleton, a tricyclodecane skeleton, a tetracyclododecane skeleton, a norbornene skeleton, or a tricyclodecene skeleton, and a divalent carbon atom at any position excluding a terminal is -O-, -C(=O)-, -C(=O)O-, -OCO-, -CONH-, -NHCO-, -S-, or -SO ２ It is more preferable that the group may be substituted with - (provided that adjacent divalent carbon atoms are not simultaneously substituted).

[0053] A tertiary carbon-type acid-dissociable group G represented by general formula (g-1): Ａ Examples of the aryl group include a t-butyl group, a t-amyl group, a 1,1-dimethylpropyl group, a 1-methyl-1-cyclopentyl group, a 1-ethyl-1-cyclopentyl group, a 1-methyl-1-cyclohexyl group, a 1-ethyl-1-cyclohexyl group, a 2-methyl-2-adamantyl group, a 2-ethyl-2-adamantyl group, a 1-(1-methoxy-2-methylpropan-2-yl)cyclopentyl group, and a 1-(1-ethoxy-2-methylpropan-2-yl)cyclopentyl group.

[0054] <<Tertiary carbon type acid dissociable group G Ａ１ and G Ａ２ >> Also, the "tertiary carbon-type acid-dissociable group G" represented by general formula (g-1) Ａ " In R Ａ ｇ２ and R Ａ ｇ３ are combined to form C which may have a substituent. ３－１８ In the case where an alicyclic group or a 3- to 18-membered non-aromatic heterocyclic group is formed, for example, a tertiary carbon-type acid-dissociable group G represented by the following general formula (g-1-1) is included: Ａ１ and a tertiary carbon-type oxygen-dissociating group G represented by (g-1-2): Ａ２ etc.

[0055] <<Tertiary carbon-type acid-dissociable group G represented by general formula (g-1-1) Ａ１ >> A tertiary carbon-type acid-dissociable group G represented by the above general formula (g-1-1): Ａ１ In this case, R Ａ ｇ１１ is a C which may have a substituent １－１２ Alkyl group, C ３－１２ Alicyclic group, C ６－１２ an aryl group, or C ７－１２ An aralkyl group in which any divalent carbon atom excluding the terminal carbon atom is —O—, —C(═O)—, —C(═O)O—, —OCO—, —CONH—, —NHCO—, —S—, or —SO ２ may be replaced by - (provided that adjacent divalent carbon atoms are not replaced at the same time).

[0056] Also Cy Ａ ｇ１ represents a C which may have a substituent together with the tertiary carbon atom. ３－１８ An alicyclic group or a 3- to 18-membered non-aromatic heterocyclic group is formed, and any divalent carbon atom is -O-, -C(=O)-, -C(=O)O-, -OCO-, -CONH-, -NHCO-, -S-, or -SO ２ may be replaced by - (provided that adjacent divalent carbon atoms are not replaced at the same time).

[0057] Cy Ａ ｇ１ The tertiary carbon atom may be, together with the tertiary carbon atom, a cyclopentane skeleton, a cyclohexane skeleton, a cycloheptane skeleton, a cyclooctane skeleton, a cyclononane skeleton, a cyclodecane skeleton, a cyclododecane skeleton, a cyclopentene skeleton, a cyclohexene skeleton, a cycloheptene skeleton, a cyclooctene skeleton, a cyclodecene skeleton, a norbornane skeleton, an adamantane skeleton, a tricyclodecane skeleton, a tetracyclododecane skeleton, a norbornene skeleton, or a tricyclodecene skeleton, and the divalent carbon atom at any position excluding the terminal may be -O-, -C(=O)-, -C(=O)O-, -OCO-, -CONH-, -NHCO-, -S-, or -SO ２It is preferably one which may be substituted with - (provided that adjacent divalent carbon atoms are not substituted at the same time).

[0058] A tertiary carbon-type acid-dissociable group G represented by general formula (g-1-1): Ａ１ Examples of the tertiary carbon-type acid-dissociable group include the following:

[0059]

[0060]

[0061]

[0062] <<Tertiary carbon-type acid-dissociable group G represented by general formula (g-1-2) Ａ２ >> In the above general formula (g-1-2), R Ａ ｇ２１ ~R Ａ ｇ２３ are each independently a hydro group or an optionally substituted C １－１２ In a hydrocarbyl group, any divalent carbon atom excluding the terminal carbon atom may be —O—, —C(═O)—, —C(═O)O—, —OCO—, —CONH—, —NHCO—, —S—, or —SO ２ - (provided that adjacent divalent carbon atoms are not simultaneously replaced), R Ａ ｇ２１ and R Ａ ｇ２２ , and / or R Ａ ｇ２２ and R Ａ ｇ２３ are directly connected to each other by a single bond or are divalently connected to each other by -O-, -S-, -C(=O)-, -S(=O)-, -S(=O) ２ -, -C(=O)O-, or C １－３ They may be linked via an alkylene group to form a ring.

[0063] R Ａ ｇ２１ and R Ａ ｇ２２ , and / or R Ａ ｇ２２ and R Ａｇ２３ Examples of the case where R 1 forms a ring together with the carbon atom contained in the ethylenically unsaturated double bond include the case where R 1 forms a cyclopentenyl group, a cyclohexenyl group, a cyclopentylideneethenyl group, a cyclohexylideneethenyl group, or the like, which may have a substituent.

[0064] Also Cy Ａ ｇ２ represents a C which may have a substituent together with the tertiary carbon atom. ３－１８ An alicyclic group or a 3- to 18-membered non-aromatic heterocyclic group is formed, and any divalent carbon atom is -O-, -C(=O)-, -C(=O)O-, -OCO-, -CONH-, -NHCO-, -S-, or -SO ２ may be replaced by - (provided that adjacent divalent carbon atoms are not replaced at the same time).

[0065] Cy Ａ ｇ２ The tertiary carbon atom may be, together with the tertiary carbon atom, a cyclopentane skeleton, a cyclohexane skeleton, a cycloheptane skeleton, a cyclooctane skeleton, a cyclononane skeleton, a cyclodecane skeleton, a cyclododecane skeleton, a cyclopentene skeleton, a cyclohexene skeleton, a cycloheptene skeleton, a cyclooctene skeleton, a cyclodecene skeleton, a norbornane skeleton, an adamantane skeleton, a tricyclodecane skeleton, a tetracyclododecane skeleton, a norbornene skeleton, or a tricyclodecene skeleton, and the divalent carbon atom at any position excluding the terminal may be -O-, -C(=O)-, -C(=O)O-, -OCO-, -CONH-, -NHCO-, -S-, or -SO ２ It is preferably one which may be substituted with - (provided that adjacent divalent carbon atoms are not substituted at the same time).

[0066] A tertiary carbon-type acid-dissociable group G represented by general formula (g-1-2): Ａ２ Examples of the tertiary carbon-type acid-dissociable group include the following:

[0067]

[0068] <Allyl or benzyl acid-dissociable group G ＢThe acid-dissociable group G is an allyl or benzyl acid-dissociable group G represented by the following general formula (g-2): Ｂ An acid-labile group in which the carbon atom directly bonded to the polar group is at an allylic or benzyl position, such as:

[0069] "R Ｂ ｇ１ " is an optionally substituted C １－１２ In a hydrocarbyl group, any divalent carbon atom excluding the terminal carbon atom may be —O—, —C(═O)—, —C(═O)O—, —OCO—, —CONH—, —NHCO—, —S—, or —SO ２ may be replaced by - (provided that adjacent divalent carbon atoms are not replaced at the same time).

[0070] R Ｂ ｇ１ As the C １－１２ Alkyl group, C ３－１２ Alicyclic group, C ６－１２ an aryl group, or C ７－１２ An aralkyl group in which any divalent carbon atom excluding the terminal carbon atom is —O—, —C(═O)—, —C(═O)O—, —OCO—, —CONH—, —NHCO—, —S—, or —SO ２ - (provided that adjacent divalent carbon atoms are not simultaneously replaced), and １－１２ an alkyl group or C ３－１２ In an alicyclic group, any divalent carbon atom excluding the terminal carbon atom may be —O—, —C(═O)—, —C(═O)O—, —OCO—, —CONH—, —NHCO—, —S—, or —SO ２ It is more preferred that it may be substituted with - (provided that adjacent divalent carbon atoms are not substituted at the same time).

[0071] Also, "R Ｂ ｇ２ " ~ "R Ｂ ｇ４ " are each independently a hydro group or an optionally substituted C １－１２In a hydrocarbyl group, any divalent carbon atom excluding the terminal carbon atom may be —O—, —C(═O)—, —C(═O)O—, —OCO—, —CONH—, —NHCO—, —S—, or —SO ２ may be replaced by - (provided that adjacent divalent carbon atoms are not replaced at the same time).

[0072] R Ｂ ｇ１ and R Ｂ ｇ２ , R Ｂ ｇ２ and R Ｂ ｇ３ , and / or R Ｂ ｇ３ and R Ｂ ｇ４ are directly connected to each other by a single bond or are divalently connected to each other by -O-, -S-, -C(=O)-, -S(=O)-, -S(=O) ２ -, -C(=O)O-, or C １－３ They may be linked via an alkylene group to form a ring.

[0073] An allyl or benzyl acid-dissociable group G represented by general formula (g-2): Ｂ In this case, R Ｂ ｇ１ and R Ｂ ｇ２ , R Ｂ ｇ２ and R Ｂ ｇ３ , and / or R Ｂ ｇ３ and R Ｂ ｇ４ forms a ring together with the carbon atom contained in the ethylenically unsaturated double bond, and examples thereof include a cyclopentenyl group, a cyclohexenyl group, a cyclopentylideneethenyl group, a cyclohexylideneethenyl group, a benzyl group, or a 2,3-dihydro-1H-indanyl group, which may have a substituent.

[0074] An allyl or benzyl acid-dissociable group G represented by general formula (g-2): Ｂ Examples of the acid-dissociable group include the following allyl or benzyl acid-dissociable groups:

[0075]

[0076] <Acetal-type acid-dissociable group G Ｃ The acid-dissociable group G is an acetal-type acid-dissociable group G represented by the following general formula (g-3): Ｃ An acid-dissociable group in which an oxygen atom is bonded to a carbon atom directly bonded to a polar group, such as

[0077] "R Ｃ ｇ１ " and "R Ｃ ｇ３ " are each independently a hydro group or an optionally substituted C １－１２ In a hydrocarbyl group, any divalent carbon atom excluding the terminal carbon atom may be —O—, —C(═O)—, —C(═O)O—, —OCO—, —CONH—, —NHCO—, —S—, or —SO ２ may be replaced by - (provided that adjacent divalent carbon atoms are not replaced at the same time).

[0078] R Ｃ ｇ１ and R Ｃ ｇ３ is a hydro group or a C １－１２ Alkyl group or C ３－１２ In an alicyclic group, any divalent carbon atom excluding the terminal carbon atom may be —O—, —C(═O)—, —C(═O)O—, —OCO—, —CONH—, —NHCO—, —S—, or —SO ２ - (provided that adjacent divalent carbon atoms are not simultaneously replaced), and １－６ Alkyl group or C ３－８ In an alicyclic group, any divalent carbon atom excluding the terminal carbon atom may be —O—, —C(═O)—, —C(═O)O—, —OCO—, —CONH—, —NHCO—, —S—, or —SO ２ It is more preferred that it may be substituted with - (provided that adjacent divalent carbon atoms are not substituted at the same time).

[0079] Also, "RＣ ｇ２ " is an optionally substituted C １－１２ In a hydrocarbyl group, any divalent carbon atom excluding the terminal carbon atom may be —O—, —C(═O)—, —C(═O)O—, —OCO—, —CONH—, —NHCO—, —S—, or —SO ２ may be replaced by - (provided that adjacent divalent carbon atoms are not replaced at the same time).

[0080] R Ｃ ｇ２ As the C １－１２ Alkyl group or C ３－１２ In an alicyclic group, any divalent carbon atom excluding the terminal carbon atom may be —O—, —C(═O)—, —C(═O)O—, —OCO—, —CONH—, —NHCO—, —S—, or —SO ２ - (provided that adjacent divalent carbon atoms are not simultaneously replaced), and １－６ Alkyl group or C ３－８ In an alicyclic group, any divalent carbon atom excluding the terminal carbon atom may be —O—, —C(═O)—, —C(═O)O—, —OCO—, —CONH—, —NHCO—, —S—, or —SO ２ It is more preferred that it may be substituted with - (provided that adjacent divalent carbon atoms are not substituted at the same time).

[0081] An acetal-type acid-dissociable group G represented by general formula (g-3): Ｃ Examples of the alkoxy group include a methoxymethoxy group, an ethoxymethoxy group, an n-propoxymethoxy group, an n-butoxymethoxy group, a 2,2-dimethylpropoxymethoxy group, a 2,2-dimethylbutoxymethoxy group, a cyclohexyloxymethoxy group, a 1-ethoxyethoxy group, a 1-n-butoxyethoxy group, and a 1-cyclohexyloxyethoxy group.

[0082] <Aminocarbonyl-type acid-dissociable group G Ｄ The acid-dissociable group G is an aminocarbonyl-type acid-dissociable group G represented by the following general formula (g-4): ＤAn acid-dissociable group in which an aminocarbonyl group is bonded to a polar group, such as

[0083] "R Ｄ ｇ１ " and "R Ｄ ｇ２ " are each independently a hydro group or an optionally substituted C １－１２ In a hydrocarbyl group, any divalent carbon atom excluding the terminal carbon atom may be —O—, —C(═O)—, —C(═O)O—, —OCO—, —CONH—, —NHCO—, —S—, or —SO ２ may be replaced by - (provided that adjacent divalent carbon atoms are not replaced at the same time).

[0084] R Ｄ ｇ１ and R Ｄ ｇ２ is a hydro group or a C １－１２ Alkyl group or C ３－１２ In an alicyclic group, any divalent carbon atom excluding the terminal carbon atom may be —O—, —C(═O)—, —C(═O)O—, —OCO—, —CONH—, —NHCO—, —S—, or —SO ２ - (provided that adjacent divalent carbon atoms are not simultaneously replaced), and １－６ Alkyl group or C ３－８ In an alicyclic group, any divalent carbon atom excluding the terminal carbon atom may be —O—, —C(═O)—, —C(═O)O—, —OCO—, —CONH—, —NHCO—, —S—, or —SO ２ It is more preferred that it may be substituted with - (provided that adjacent divalent carbon atoms are not substituted at the same time).

[0085] An aminocarbonyl-type acid-dissociable group G represented by general formula (g-4): Ｄ Examples of the aminocarbonyl group include a dimethylaminocarbonyl group, a diethylaminocarbonyl group, a diisopropylaminocarbonyl group, and an N-phenyl-N-methyl-aminocarbonyl group.

[0086]

[0087] As used herein, the term "hydroxy group or carboxy group having a protecting group" refers to a hydroxy group (including a phenolic hydroxy group) or a carboxy group that is protected with an ether-based protecting group, a silyl ether-based protecting group, an acyl-based protecting group, or the like.

[0088] The ether-based protecting group is not particularly limited, and examples thereof include a methyl group, a benzyl group, a p-methoxybenzyl group, a t-butyl group, a triphenylmethyl group, a p-methoxyphenyldiphenylmethyl group, and a di(p-methoxyphenyl)phenylmethyl group. The silyl ether-based protecting group is not particularly limited, and examples thereof include a t-butyldimethylsilyl group (TBS), a triisopropylsilyl group (TIPS), a trimethylsilyl group (TMS), a triethylsilyl group (TES), and a t-butyldiphenylsilyl group (TBDPS). The acyl-based protecting group is not particularly limited, and examples thereof include an acetyl group, a pivaloyl group, and a benzoyl group.

[0089] In this specification, the term "optionally having a substituent" is not particularly limited as long as it is chemically permissible and has the effect of the present invention. Examples of the "substituent" include (1) a halogen atom, (2) a haloalkyl group, (3) a hydroxy group, (4) a thiol group, (5) a nitro group, (6) a cyano group, (7) a carboxy group, (8) an amino group, (9) a sulfo group, (10) a vinyl group, (11) an allyl group, (12) a (meth)acryloyl group, (13) a (meth)acryloyloxy group, (14) a (meth)acrylamide group, (15) a styryl group, (16) an epoxy group, (17) a glycidyl group, (18) an amide group, (19) a hydroxy group or a carboxy group having a protecting group, (20) a polar group having an acid-dissociable group, or (21) a C group in which at least a part of the hydrogen atoms may be substituted with the above (1) to (20). １－１８ Hydrocarbyl group, C １－１８ Hydrocarbyloxy group, C １－１８ Hydrocarbyl carbonyl group, C １－１８ Hydrocarbylcarbonyloxy group, C１－１８ Hydrocarbyloxycarbonyl group, C １－１８ Hydrocarbyloxycarbonyloxy group, C １－１８ Hydrocarbylamino group, diC １－１８ Hydrocarbylamino group, C １－１８ Hydrocarbylaminocarbonyl group, diC １－１８ Hydrocarbylaminocarbonyl group, C １－１８ Hydrocarbylcarbonylamino group, C １－１８ Hydrocarbylaminocarbonyloxy group, diC １－１８ Hydrocarbylaminocarbonyloxy group, C １－１８ Hydrocarbylaminocarbonylamino group, diC １－１８ Hydrocarbylaminocarbonylamino group, C １－１８ Hydrocarbyloxycarbonylamino group, C １－１８ Hydrocarbylthio group, C １－１８ Hydrocarbylsulfinyl group, C １－１８ A hydrocarbylsulfonyl group, in which a divalent carbon atom at any position except the terminal of the substituent is -O-, -C(=O)-, -C(=O)O-, -OCO-, -CONH-, -NHCO-, -NH(C=O)O-, -S-, or -SO ２ - may be substituted (provided that adjacent divalent carbon atoms are not substituted at the same time), etc.

[0090] [1. Resist Material] The resist material according to this embodiment contains (A) a heteropolyacid salt having modified defect sites or a mixture thereof. The resist material according to this embodiment may also contain (B) an acid diffusion controller, an organic solvent, or the like as optional components.

[0091] [1-1. (A) Heteropolyacid salt having modified defect sites or mixture thereof] (A) Heteropolyacid salt having modified defect sites or mixture thereof has an anion moiety composed of a heteropolyacid anion having defect sites, the defect sites being modified. In addition, the cation moiety of the heteropolyacid salt having modified defect sites or mixture thereof is composed of a heteropolyacid anion having modified defect sites, the heteropolyacid anion being modified by a heteropolyacid anion. ＋, a metal ion, an onium cation, or an onium dication.

[0092] [1-1-1. Anion Moiety of Heteropolyacid Salt or Mixture Thereof Having Modified Defect Sites] As a heteropolyacid anion having defect sites, in which the defect sites have been modified, a heteropolyacid anion having modified defect sites can be used, which is obtained by reacting a terminal oxygen atom at the defect site of a heteropolyacid anion having defect sites with a P, Si, Ge, or Sn compound having one or more organic groups and two or more leaving groups.

[0093] [1-1-1-1. Heteropolyacid anion having a defect site] The heteropolyacid anion having a defect site according to this embodiment is not particularly limited, and may be a defect species in which a part of the basic skeleton of the heteropolyacid anion is defective, and any of a one-defect species, a two-defect species, a three-defect species, etc. Examples of the heteropolyacid anion having a defect site include a defective Keggin-type heteropolyacid anion and a defective Dawson-type heteropolyacid anion.

[0094] [1-1-1-1-1. Deficient Keggin type heteropolyacid anion] Examples of the defective Keggin type heteropolyacid anion include a one-deficient Keggin type heteropolyacid anion represented by the following general formula (II-1), a two-deficient Keggin type heteropolyacid anion represented by the following general formula (II-2), and a three-deficient Keggin type heteropolyacid anion represented by the following general formula (II-3). [XM １１ O ３９ ] ｃ１１－ (II-1) [XM １０ O ３６ ] ｃ１２－ (II-2) [XM ９ O ３４ ] ｃ１３－ (II-3) (wherein, X represents a heteroatom of P, Si, B, S, or Ge; M represents a polyatom of Mo, W, V, Nb, or Ta; c11- to c13- represent the number of negative charges, and c11 to c13 are natural numbers.)

[0095] In the general formulas (II-1) to (II-3), the values ​​of c11 to c13 vary depending on the types of X and M. For example, in the general formula (II-1), when X is P and M is Mo or W, c11 is 7 ([PMo １１ O ３９ ] ７－ , [P.W. １１ O ３９ ] ７－ ) and when X is Si and M is Mo or W, c11 is 8 ([SiMo １１ O ３９ ] ８－ , [SiW １１ O ３９ ] ８－ ) and when X is S and M is Mo or W, c11 is 6 ([SMo １１ O ３９ ] ６－ , [SW １１ O ３９ ] ６－ ) and when X is B and M is Mo or W, c11 is 9 ([BMo １１ O ３９ ] ９－ , [B.W. １１ O ３９ ] ９－ ) and when X is Ge and M is Mo or W, c11 is 8 ([GeMo １１ O ３９ ] ８－ , [GeW １１ O ３９ ] ８－ In addition, in the general formula (II-2), when X is P and M is Mo or W, c12 is 7 ([PMo １０ O ３６ ] ７－ , [P.W. １０ O ３６ ] ７－ ) and when X is Si and M is Mo or W, c12 is 8 ([SiMo １０ O ３６ ] ８－ , [SiW １０ O ３６ ] ８－ ) and when X is B and M is Mo or W, c12 is 9 ([BMo １０ O ３６ ] ９－ , [B.W. １０ O３６ ] ９－ ) and when X is Ge and M is Mo or W, c12 is 8 ([GeMo １０ O ３６ ] ８－ , [GeW １０ O ３６ ] ８－ Furthermore, in the general formula (II-3), for example, when X is P and M is Mo or W, c13 is 9 ([PMo ９ O ３４ ] ９－ , [P.W. ９ O ３４ ] ９－ ) and when X is Si and M is Mo or W, c13 is 10 ([SiMo ９ O ３４ ] １０－ , [SiW ９ O ３４ ] １０－ ) and when X is S and M is Mo or W, c13 is 8 ([SMo ９ O ３４ ] ８－ , [SW ９ O ３４ ] ８－ ) and when X is Ge and M is Mo or W, c13 is 10 ([GeMo ９ O ３４ ] １０－ , [GeW ９ O ３４ ] １０－ )

[0096] The defect Keggin type heteropoly acid anion preferably has an isomeric structure of α-, β-, or γ-form. The isomeric structure of the one defect Keggin type heteropoly acid anion represented by the general formula (II-1) is preferably [α-PW １１ O ３９ ] ７－ , [β-PW １１ O ３９ ] ７－ , [γ-PW １１ O ３９ ] ７－ , [α-PMo １１ O ３９ ] ７－ , [β-PMo １１ O ３９ ] ７－, [γ-PW １１ O ３９ ] ７－ , [α-SiW １１ O ３９ ] ８－ , [β-SiW １１ O ３９ ] ８－ , [γ-SiW １１ O ３９ ] ８－ , [α-SiMo １１ O ３９ ] ８－ , [β-SiMo １１ O ３９ ] ８－ , [γ-SiW １１ O ３９ ] ８－ is preferred, and [α-PW １１ O ３９ ] ７－ , [α-PMo １１ O ３９ ] ７－ , [α-SiW １１ O ３９ ] ８－ , [α-SiMo １１ O ３９ ] ８－ The isomer structure of the two-deficient Keggin heteropoly acid anion represented by the general formula (II-1) is preferably [α-PW １０ O ３６ ] ７－ , [β-PW １０ O ３６ ] ７－ , [γ-PW １０ O ３６ ] ７－ , [α-PMo １０ O ３６ ] ７－ , [β-PMo １０ O ３６ ] ７－ , [γ-PW １０ O ３６ ] ７－ , [α-SiW １０ O ３６ ] ８－ , [β-SiW １０ O ３６ ] ８－ , [γ-SiW １０ O ３６] ８－ , [α-SiMo １０ O ３６ ] ８－ , [β-SiMo １０ O ３６ ] ８－ , [γ-SiW １０ O ３６ ] ８－ is preferred, and [γ-PW １０ O ３６ ] ７－ , [γ-PMo １０ O ３６ ] ７－ , [γ-SiW １０ O ３６ ] ８－ , [γ-SiMo １０ O ３６ ] ８－ Further, the isomeric structure of the 3-deficient Keggin type heteropoly acid anion represented by the general formula (III-1) is preferably [α-PW ９ O ３４ ] ９－ , [β-PW ９ O ３４ ] ９－ , [γ-PW ９ O ３４ ] ９－ , [α-PMo ９ O ３４ ] ９－ , [β-PMo ９ O ３４ ] ９－ , [γ-PW ９ O ３４ ] ９－ , [α-SiW ９ O ３４ ] １０－ , [β-SiW ９ O ３４ ] １０－ , [γ-SiW ９ O ３４ ] １０－ , [α-SiMo ９ O ３４ ] １０－ , [β-SiMo ９ O ３４ ] １０－ , [γ-SiW ９ O ３４ ] １０－ is preferred.

[0097] [1-1-1-1-2. Deficient Dawson type heteropolyacid anion] Examples of the deficient Dawson type heteropolyacid anion include a mono-deficient Dawson type heteropolyacid anion represented by the following general formula (III-1), a di-deficient Dawson type heteropolyacid anion represented by the following general formula (III-2), and a tri-deficient Dawson type heteropolyacid anion represented by the following general formula (III-3): [X ２ M １７ O ６１ ] ｃ２１－ (III-1) [X ２ M １６ O ５８ ] ｃ２２－ (III-2) [X ２ M １５ O ５６ ] ｃ２３－ (III-3) (wherein X represents a heteroatom of P, Si, B, S, or Ge; M represents a polyatom of Mo, W, V, Nb, or Ta; c21- to c23- represent the number of negative charges, and c21 to c23 are natural numbers.)

[0098] In the general formulas (III-1) to (III-3), the values ​​of c21 to c23 vary depending on the types of X and M. For example, in the general formula (III-1), when X is P and M is Mo or W, c21 is 10 ([P ２ Mo １７ O ６１ ] １０－ , [P ２ W １７ O ６１ ] １０－ ), and if X is S and M is W, c21 is 8([S ２ W １７ O ６１ ] ８－ In addition, in the general formula (III-2), when X is Ge and M is Mo, c22 is 12 ([Ge ２ Mo １６ O ５８ ] １２－ Furthermore, in the general formula (III-3), when X is P and M is Mo or W, c23 is 12 ([P ２ Mo １５ O５６ ] １２－ , [P ２ W １５ O ５６ ] １２－ )

[0099] The deficient Dawson type heteropoly acid anion preferably has an isomeric structure of α-, β-, or γ-form. The isomeric structures of the deficient Dawson type heteropoly acid anions represented by the general formulae (III-1) to (III-3) include [α-P ２ W １７ O ６１ ] １０－ , [α-P ２ W １５ O ５６ ] １２－ , [α-S ２ W １７ O ６１ ] ８－ etc. can be suitably used.

[0100] [1-1-1-2. Modification of Defect Sites] The defect sites of the heteropolyanion having defect sites according to this embodiment can be modified by reacting a terminal oxygen atom at the defect site with a P, Si, Ge, or Sn compound having one or more organic groups and two or more leaving groups to modify the defect site. Through this reaction, the terminal oxygen atom at the defect site of the heteropolyanion bonds to a group having a P, Si, Ge, or Sn heteroatom to which one or more organic groups are bonded, and the defect site is modified by bonding to some or all of the heteroatom.

[0101] [1-1-1-2-1. Bonding Form of Defect Site and Its Notation] In the heteropolyacid anion modified at a defect site according to this embodiment, the terminal oxygen atom at the defect site of the heteropolyacid anion having a defect site is modified with a group having a heteroatom of P, Si, Ge, or Sn bonded to one or more organic groups.

[0102] The bonding form between the terminal oxygen atom at the vacant site of the heteropolyacid anion and the group having a heteroatom P, Si, Ge, or Sn to which one or more organic groups are bonded is not particularly limited, and can be represented, for example, by the following general formulas (IV-1) to (IV-5). [In formulas (IV-1) to (IV-5), X′ represents Si or Ge; X″ represents a heteroatom of Si, Ge, or Sn; R １Ａ１ ~R １Ｅ１ each independently represents a C １－１８ represents a hydrocarbyl group, a 3- to 18-membered non-aromatic heterocyclic group, or a 5- to 18-membered aromatic heterocyclic group, １Ａ１ ~R １Ｅ１ The divalent carbon atom at any position excluding the terminal may be -O-, -C(=O)-, -C(=O)O-, -OCO-, -CONH-, -NHCO-, -NH(C=O)O-, -S- or -SO ２ - (provided that adjacent divalent carbon atoms are not simultaneously replaced), １Ａ１ ~R １Ｅ１ The hydrogen atoms contained in may be replaced by (a) halogen atoms, (b) haloalkyl groups, (c) hydroxy groups, (d) thiol groups, (e) nitro groups, (f) cyano groups, (g) carboxy groups, (h) amino groups, (i) sulfo groups, (j) vinyl groups, (k) allyl groups, (l) (meth)acryloyl groups, (m) (meth)acryloyloxy groups, (n) (meth)acrylamide groups, (o) styryl groups, (p) epoxy groups, (q) glycidyl groups, (r) amide groups, (s) hydroxy groups or carboxy groups having a protecting group, or (t) polar groups having an acid-dissociable group; * represents the terminal oxygen atom of the missing site.]

[0103] In this specification, for convenience, a heteropoly acid anion in which a deficiency site is modified by a group having a heteroatom Si or Ge bonded to one or more organic groups represented by general formula (IV-1) can be represented by the following general formula (V-1): [X ｗ M ｘ O ｙ (R １Ａ１ X') (R １Ａ２ X')O] ｃ－ (V-1) (wherein w, x, y, and c are all natural numbers, and X, M, X′, and R １Ａ１ and R１Ａ２ is the same as above.) Also, R １Ａ１ and R １Ａ２ If they are the same, call this R １Ａ can be expressed as in the following general formula (V-1'): [X ｗ M ｘ O ｙ (R １Ａ X') ２ O] ｃ－ (V-1′)

[0104] The heteropolyacid anion having a modified defect site represented by general formula (V-1) or (V-1′) is not particularly limited, and may be, for example, a heteropolyacid anion having a defect site and (R １Ａ ) X'Y ３ (Y represents a leaving group, for example, a halogen atom, a hydroxy group, an alkoxy group (C １－４ An alkoxy group is preferred, and C １－２ An alkoxy group is more preferred.), an alkylcarbonyloxy group (C １－４ alkylcarbonyloxy group), hydrocarbylsulfonyloxy group (C １－６ Alkyl or C ７－１０ An aralkylsulfonyloxy group is preferred. Examples include a methanesulfonyloxy group and a p-toluenesulfonyloxy group.

[0105] Similarly, in this specification, a heteropoly acid anion in which the vacant site is modified with a group having a heteroatom Si or Ge bonded to one or more organic groups represented by general formula (IV-2) can be represented for convenience as in the following general formula (V-2): [X ｗ M ｘ O ｙ (R １Ｂ１ R １Ｂ２ X') (R １Ｂ３ R １Ｂ４ Si)] ｃ－ (V-2) (wherein w, x, y, and c are all natural numbers, and X, M, X′, and R １Ｂ１ , R １Ｂ２ , R １Ｂ３ and R １Ｂ４is the same as above.) Also, R １Ｂ１ R １Ｂ２ and R １Ｂ３ R １Ｂ４ are the same, it can be expressed as in the following general formula (V-2'): ｗ M ｘ O ｙ (R １Ｂ１ R １Ｂ２ X') ２ ] ｃ－ (V-2′)

[0106] The heteropolyacid anion having a modified defect site represented by general formula (V-2) or (V-2′) is not particularly limited, and may be, for example, a heteropolyacid anion having a defect site and (R １Ｂ１ ) (R １Ｂ２ ) X'Y ２ (wherein Y represents a leaving group as above) to obtain the compound.

[0107] In this specification, for convenience, a heteropoly acid anion in which the vacant site is modified by a group having a heteroatom Si or Ge bonded to one or more organic groups represented by general formula (IV-3) can be represented by the following general formula (V-3): [X ｗ M ｘ O ｙ (R １Ｃ１ X'O) (R １Ｃ２ X'O) (R １Ｃ３ X'O) (R １Ｃ４ X'O)] ｃ－ (V-3) (wherein w, x, y, and c are all natural numbers, and X, M, X′, and R １Ｃ１ , R １Ｃ２ , R １Ｃ３ and R １Ｃ４ is the same as above.) Also, R １Ｃ１ , R １Ｃ２ , R １Ｃ３ and R １Ｃ４ If they are the same, call this R １Ｃ can be expressed as in the following general formula (V-3'): [X ｗ M ｘ O ｙ (R １Ｃ X'O) ４ ] ｃ－(V-3′)

[0108] The heteropoly acid anion having modified defect sites represented by general formula (V-3) or (V-3′) is not particularly limited, and may be, for example, a heteropoly acid anion of two defect Keggin type or Dawson type and R １Ｃ X'Y ３ (wherein Y represents a leaving group as above) to obtain the compound.

[0109] In this specification, for convenience, a heteropoly acid anion in which a deficiency site is modified by a group having a heteroatom P bonded to one or more organic groups represented by general formula (IV-4) can be represented by the following general formula (V-4): [X ｗ M ｘ O ｙ (R １Ｄ１ P=O)(R １Ｄ２ P=O)] ｃ－ (V-4) (wherein w, x, y, and c are all natural numbers, and X, M, and R １Ｄ１ and R １Ｄ２ is the same as above.) Also, R １Ｄ１ and R １Ｄ２ If they are the same, call this R １Ｄ can be expressed as in the following general formula (V-4'): [X ｗ M ｘ O ｙ (R １Ｄ P=O) ２ )] ｃ－ (V-4')

[0110] The heteropolyacid anion having a modified defect site represented by general formula (V-4) or (V-4′) is not particularly limited, and for example, a heteropolyacid anion having a defect site and R １Ｄ P(=O)Y ２ (wherein Y represents a leaving group as above) to obtain the compound.

[0111] In this specification, for convenience, a heteropoly acid anion in which the vacant site is modified by a group having a heteroatom Si, Ge, or Sn bonded to one or more organic groups represented by general formula (IV-5) can be represented by the following general formula (V-5): [Xｗ M ｘ O ｙ (R １Ｅ１ X'') ｃ－ (V-5) (wherein w, x, y, and c are all natural numbers, and X, M, X″, and R １Ｅ１ The above (V-5) may be expressed as the following general formula (V-5') in some cases. １Ｅ is R １Ｅ１ The same definition is used as for [X ｗ M ｘ O ｙ (R １Ｅ X'') ｃ－ (V-5')

[0112] The heteropolyacid anion having a modified defect site represented by general formula (V-5) or (V-5′) is not particularly limited, and for example, a heteropolyacid anion having a defect site and R １Ｅ X''Y ３ (wherein Y represents a leaving group as above) to obtain the compound.

[0113] Among the heteropolyacid anions having modified defect sites represented by the general formulae (V-1) to (V-5) and (V-1') to (V-5'), heteropolyacid anions having modified defect sites represented by the following general formulae (VI-1) to (VI-12) are preferred, from the viewpoint of being relatively stable and capable of controlling the reactivity. [XM １１ O ３９ (R １Ａ X') ２ O] ｃ３１－ (VI-1) [XM １１ O ３９ (R １Ｂ１ R １Ｂ２ X') ２ ] ｃ３１－ (VI-2) [XM １１ O ３９ (R １Ｄ P=O) ２ ] ｃ３１－ (VI-3) [XM １１ O ３９ (R １Ｅ X'') ｃ３１－ (VI-4) [XM１０ O ３６ (R １Ａ X') ２ O] ｃ３２－ (VI-5) [XM １０ O ３６ (R １Ｂ１ R １Ｂ２ X') ２ ] ｃ３２－ (VI-6) [XM １０ O ３６ (R １Ｃ X'O) ４ ] ｃ３２－ (VI-7) [XM １０ O ３６ (R １Ｄ P=O) ２ ] ｃ３２－ (VI-8) [X ２ M １７ O ６１ (R １Ａ X') ２ O] ｃ３３－ (VI-9) [X ２ M １７ O ６１ (R １Ｂ１ R １Ｂ２ X') ２ ] ｃ３３－ (VI-10) [X ２ M １７ O ６１ (R １Ｄ P=O) ２ ] ｃ３３－ (VI-11) [X ２ M １７ O ６１ (R １Ｅ X'') ｃ３３－ (VI-12) (wherein, X represents a heteroatom of P, Si, B, S, or Ge; M represents a polyatom of Mo, W, V, Nb, or Ta; X' represents a heteroatom of Si or Ge; X'' represents a heteroatom of Si, Ge, or Sn; R １Ａ ~R １Ｅ each independently represents a C １－１８ represents a hydrocarbyl group, a 3- to 18-membered non-aromatic heterocyclic group, or a 5- to 18-membered aromatic heterocyclic group, １Ａ ~R１Ｅ The divalent carbon atom at any position excluding the terminal may be -O-, -C(=O)-, -C(=O)O-, -OCO-, -CONH-, -NHCO-, -NH(C=O)O-, -S- or -SO ２ - (provided that adjacent divalent carbon atoms are not simultaneously replaced), １Ａ ~R １Ｅ The hydrogen atoms contained in may be replaced by, for example, (a) halogen atoms, (b) haloalkyl groups, (c) hydroxy groups, (d) thiol groups, (e) nitro groups, (f) cyano groups, (g) carboxy groups, (h) amino groups, (i) sulfo groups, (j) vinyl groups, (k) allyl groups, (l) (meth)acryloyl groups, (m) (meth)acryloyloxy groups, (n) (meth)acrylamide groups, (o) styryl groups, (p) epoxy groups, (q) glycidyl groups, (r) amide groups, (s) hydroxy groups or carboxy groups having a protecting group, or (t) polar groups having an acid-dissociable group; and c31, c32, and c33 are natural numbers.

[0114] In a heteropolyacid anion in which the vacant site is modified, four terminal oxygen atoms of the vacant site are modified, so that the value of c31 is usually c11 - 4, the value of c32 is c12 - 4, and the value of c33 is c21 - 4. On the other hand, for example, when the organic group contains an amino group which is protonated to form an ammonium cation, or when the organic group contains a carboxy group which is formed into a carboxy anion, the values ​​of c31 to c33 will differ from the above values.

[0115] [1-1-1-2-2. Organic group] The above R １Ａ , R １Ｂ１ Or R １Ｂ２ , R １Ｃ , R １Ｄ , and R １ＥThe organic group represented by the formula (I) is not particularly limited, and any known or commonly used organic group can be used. From the viewpoint of providing a functional building block, it is preferable to use, as the organic group, an organic group having one or more substituents such as a hydroxy group, a halogen atom, or an epoxy group, an organic group having one or more ethylenically unsaturated double bonds, or an organic group having one or more polar groups having an acid-dissociable group.

[0116] <Organic group having one or more substituents such as a hydroxy group, a halogen atom, an epoxy group, etc.> １Ａ , R １Ｂ１ Or R １Ｂ２ , R １Ｃ , R １Ｄ , and R １Ｅ As the organic group represented by R １Ａ ~R １Ｅ C which may have a substituent １－１８ is a hydrocarbyl group; １Ａ ~R １Ｅ Any divalent carbon atom excluding the terminal may be —O—, —C(═O)—, —C(═O)O—, —OCO—, —CONH—, —NHCO—, —NH(C═O)O—, —S—, or —SO ２ - (provided that adjacent divalent carbon atoms are not simultaneously replaced); １Ａ ~R １Ｅ and one or more hydrogen atoms contained in the group represented by the formula (I) are replaced by (a) a halogen atom, (b) a haloalkyl group, (c) a hydroxy group, (d) a thiol group, (e) a nitro group, (f) a cyano group, (g) a carboxy group, (h) an amino group, (i) a sulfo group, (p) an epoxy group, (q) a glycidyl group, or (r) an amide group. １－１８ Alkyl group, C ３－１８ Alicyclic group, C ７－１８ an aralkyl group; １Ａ１ ~R １Ｅ１ Any divalent carbon atom excluding the terminal may be —O—, —C(═O)—, —C(═O)O—, —OCO—, —CONH—, —NHCO—, —NH(C═O)O—, —S—, or —SO ２- (provided that adjacent divalent carbon atoms are not simultaneously replaced); １Ａ ~R １Ｅ More preferably, one or more of the hydrogen atoms contained in the above formula (I) are replaced with (a) a halogen atom, (b) a haloalkyl group, (c) a hydroxy group, (d) a thiol group, (e) a nitro group, (f) a cyano group, (g) a carboxy group, (h) an amino group, (i) a sulfo group, (p) an epoxy group, (q) a glycidyl group, or (r) an amide group.

[0117] The above R １Ａ ~R １Ｅ Specific examples of the group include, but are not limited to, a 1-glycidyloxypropan-3-yl group, a 1-glycidyloxy-n-octan-8-yl group, a 1-aminopropan-3-yl group, a 1-(2-aminoethylamino)-propan-3-yl group, a 3,3,3-trifluoropropan-1-yl group, a chloromethyl group, a 1-chloropropan-3-yl group, a 1-bromopropan-3-yl group, and a 1-iodopropan-3-yl group.

[0118] <Organic group having one or more ethylenically unsaturated double bonds> The above R １Ａ , R １Ｂ１ Or R １Ｂ２ , R １Ｃ , R １Ｄ , and R １Ｅ In order to have a building block reactive to actinic rays, the organic group represented by the formula (I) preferably contains one or more ethylenically unsaturated double bonds.

[0119] In the above case, R １Ａ ~R １Ｅ C which may have a substituent １－１８ is a hydrocarbyl group; １Ａ ~R １Ｅ Any divalent carbon atom excluding the terminal may be —O—, —C(═O)—, —C(═O)O—, —OCO—, —CONH—, —NHCO—, —NH(C═O)O—, —S—, or —SO ２ - (provided that adjacent divalent carbon atoms are not simultaneously replaced);１Ａ ~R １Ｅ and one or more hydrogen atoms contained in the group represented by the formula (I) are replaced by a (j) vinyl group, a (k) allyl group, a (l) (meth)acryloyl group, a (m) (meth)acryloyloxy group, a (n) (meth)acrylamide group, or a (o) styryl group. １－１８ Alkyl group, C ３－１８ Alicyclic group, C ７－１８ an aralkyl group; １Ａ ~R １Ｅ Any divalent carbon atom excluding the terminal may be —O—, —C(═O)—, —C(═O)O—, —OCO—, —CONH—, —NHCO—, —NH(C═O)O—, —S—, or —SO ２ - (provided that adjacent divalent carbon atoms are not simultaneously replaced); １Ａ ~R １Ｅ More preferred are those in which one or more hydrogen atoms contained in the above are substituted with (j) a vinyl group, (k) an allyl group, (l) a (meth)acryloyl group, (m) a (meth)acryloyloxy group, (n) a (meth)acrylamide group, or (o) a styryl group.

[0120] The organic group R having an ethylenically unsaturated double bond １Ａ ~R １Ｅ Specific examples of the alkyl group include, but are not limited to, a vinyl group, an allyl group, a 5-hexen-1-yl group, a 6-hepten-1-yl group, a 7-octen-1-yl group, a 1-acryloyloxypropan-3-yl group, a 1-methacryloyloxypropan-3-yl group, and a 1-vinylbenzene-4-yl group.

[0121] <Organic group having one or more polar groups having an acid-dissociable group> １Ａ , R １Ｂ１ Or R １Ｂ２ , R １Ｃ , R １Ｄ , and R １Ｅ From the viewpoint of providing a building block whose solubility in a developer can be changed by the action of an acid or the like, it is preferable that the organic group represented by the formula (I) contains one or more polar groups having an acid-dissociable group.

[0122] The organic group R having one or more polar groups having the acid-dissociable group １Ａ ~R １Ｅ The C １－１８ is a hydrocarbyl group; １Ａ ~R １Ｅ The divalent carbon atom at any position excluding the terminal may be -O-, -C(=O)-, -C(=O)O-, -OCO-, -CONH-, -NHCO-, -NH(C=O)O-, -S- or -SO ２ - (provided that adjacent divalent carbon atoms are not simultaneously replaced); １Ａ ~R １Ｅ a hydrogen atom contained in the above R may be substituted with (a) a halogen atom, (b) a haloalkyl group, (c) a hydroxy group, (d) a thiol group, (e) a nitro group, (f) a cyano group, (g) a carboxy group, (h) an amino group, (i) a sulfo group, (j) a vinyl group, (k) an allyl group, (l) a (meth)acryloyl group, (m) a (meth)acryloyloxy group, (n) a (meth)acrylamide group, (o) a styryl group, (p) an epoxy group, (q) a glycidyl group, (r) an amide group, (s) a hydroxy group or a carboxy group having a protecting group, or (t) a polar group having an acid-dissociable group; １Ａ , R １Ｂ１ Or R １Ｂ２ , R １Ｃ , R １Ｄ , and R １Ｅ In the formula (I), at least one hydrogen atom is replaced by a hydroxy group, a carboxy group, an amino group, or a sulfo group having an acid-dissociable group (t), and C optionally having a substituent is preferred. １－１８ Alkyl group, C ３－１８ Alicyclic group, C ６－１８ an aryl group, or C ７－１８ an aralkyl group; １Ａ ~R １Ｅ The divalent carbon atom at any position excluding the terminal may be -O-, -C(=O)-, -C(=O)O-, -OCO-, -CONH-, -NHCO-, -NH(C=O)O-, -S- or -SO ２- (provided that adjacent divalent carbon atoms are not simultaneously replaced); １Ａ ~R １Ｅ a hydrogen atom contained in the above R may be substituted with (a) a halogen atom, (b) a haloalkyl group, (c) a hydroxy group, (d) a thiol group, (e) a nitro group, (f) a cyano group, (g) a carboxy group, (h) an amino group, (i) a sulfo group, (j) a vinyl group, (k) an allyl group, (l) a (meth)acryloyl group, (m) a (meth)acryloyloxy group, (n) a (meth)acrylamide group, (o) a styryl group, (p) an epoxy group, (q) a glycidyl group, (r) an amide group, (s) a hydroxy group or a carboxy group having a protecting group, or (t) a polar group having an acid-dissociable group; １Ａ , R １Ｂ１ Or R １Ｂ２ , R １Ｃ , R １Ｄ , and R １Ｅ In the formula (I), at least one hydrogen atom is replaced by a polar group having an acid-dissociable group (t), and C １－１８ Alkyl group, C ６－１８ an aryl group, or C ７－１８ an aralkyl group; １Ａ ~R １Ｅ The divalent carbon atom at any position excluding the terminal may be -O-, -C(=O)-, -C(=O)O-, -OCO-, -CONH-, -NHCO-, -NH(C=O)O-, -S- or -SO ２ - (provided that adjacent divalent carbon atoms are not simultaneously replaced); １Ａ , R １Ｂ１ Or R １Ｂ２ , R １Ｃ , R １Ｄ , and R １Ｅ More preferably, at least one hydrogen atom of the formula (I) is replaced by a polar group having an acid-dissociable group.

[0123] The above R １Ａ , R １Ｂ１ Or R １Ｂ２ , R １Ｃ , R １Ｄ , and R１Ｅ is characterized by having one or more polar groups having an acid-dissociable group, and for example, a polar group such as a hydroxy group, a carboxy group, an amino group, or a sulfo group having an acid-dissociable group is introduced. Examples of the acid-dissociable group include a tertiary carbon-type acid-dissociable group G Ａ , an allyl or benzyl acid-dissociable group G Ｂ , acetal-type acid-dissociable group G Ｃ , aminocarbonyl-type acid-dissociable group G Ｄ R having one or more polar groups having the above acid-dissociable group １Ａ , R １Ｂ１ Or R １Ｂ２ , R １Ｃ , R １Ｄ , and R １Ｅ For example, the following can be exemplified:

[0124] [* denotes a bond to a heteroatom P, Si, Ge, or Sn to which an organic group having a polar group having one or more acid-dissociable groups is bonded.]

[0125] [1-1-2. Cation Moiety of Heteropolyacid Salt or Mixture Thereof Having Modified Defect Sites] The cation moiety of the heteropolyacid salt or mixture thereof having modified defect sites according to this embodiment may contain H ＋ , metal ions, onium cations or onium dications can be used.

[0126] [1-1-2-1. Metal Ion] The metal ion that can be used as the cation moiety of the heteropolyacid salt or mixture thereof whose defect site is modified is not particularly limited, and for example, Li ＋ , Na ＋ , K. ＋ , Rb ＋ , Cs ＋ , Be ２＋ , Mg ２＋ , Ca ２＋ , Sr ２＋ , Ba ２＋ , Al ３＋ , Co ３＋ , Bi ３＋ , Zr ４＋ , Hf ４＋ , Bi ５＋Metal ions include Li ＋ , Na ＋ , K. ＋ , Rb ＋ , Cs ＋ , Mg ２＋ , Ca ２＋ , Sr ２＋ , Ba ２＋ , Al ３＋ , Co ３＋ is preferred, and Na ＋ , K. ＋ , Rb ＋ , Cs ＋ , Ca ２＋ , Al ３＋ , Co ３＋ These metal ions may be used alone or in combination of two or more.

[0127] [1-1-2-2. Onium Cation or Onium Dication] The onium cation or onium dication that can be used as the cation moiety of the heteropolyacid salt or mixture thereof whose defect sites have been modified is not particularly limited, and known and commonly used ones can be used. Examples of the onium cation or onium dication include ammonium cation, ammonium dication, phosphonium cation, phosphonium dication, sulfonium cation, sulfonium dication, and iodonium cation. These onium cations or onium dications may be used alone or in combination of two or more.

[0128] The onium cation or onium dication is preferably a sulfonium cation, a sulfonium dication, or an iodonium cation, from the viewpoint of providing a building block that generates an acid when exposed to DUV, XUV, EUV, an electron beam, or the like.

[0129] [1-1-2-2-1. Ammonium cation] The ammonium cation is not particularly limited, and known and commonly used ammonium cations can be used. The ammonium cation is not particularly limited, and examples thereof include ammonium ion (NH ４ ＋), primary ammonium cation (NH ３ (R ２Ａ ) ＋ )), secondary ammonium cation (NH ２ (R ２Ａ ) (R ２Ｂ )) ＋ ), tertiary ammonium cation (NH(R ２Ａ ) (R ２Ｂ ) (R ２Ｃ ) ＋ ), quaternary ammonium cation (N(R ２Ａ ) (R ２Ｂ ) (R ２Ｃ ) (R ２Ｄ ) ＋ ) can be mentioned. ２Ａ ~R ２Ｄ shall represent the same as defined below.

[0130] The ammonium cation is ammonium ion (NH ４ ＋ ), and quaternary ammonium cations are preferred, and in particular, ammonium ions (NH ４ ＋ ), and organic quaternary ammonium cations represented by the following general formula (VII-1) are more preferred.

[0131] In general formula (VII-1), R ２Ａ ~R ２Ｄ each independently represents a C １－１８ represents a hydrocarbyl group, a 3- to 18-membered non-aromatic heterocyclic group, or a 5- to 18-membered aromatic heterocyclic group, ２Ａ ~R ２Ｄ The divalent carbon atom at any position excluding the terminal may be -O-, -C(=O)-, -C(=O)O-, -OCO-, -CONH-, -NHCO-, -NH(C=O)O-, -S- or -SO ２ - (provided that adjacent divalent carbon atoms are not simultaneously replaced), ２Ａ ~R ２ＤThe hydrogen atoms contained in the formula (I) are selected from the group consisting of (a) halogen atoms, (b) haloalkyl groups, (c) hydroxy groups, (d) thiol groups, (e) nitro groups, (f) cyano groups, (g) carboxy groups, (h) amino groups, (i) sulfo groups, (j) vinyl groups, (k) allyl groups, (l) (meth)acryloyl groups, (m) (meth)acryloyloxy groups, (n) (meth)acrylamide groups, (o) styryl groups, (p) epoxy groups, (q) glycidyl groups, (r) amide groups, (s) hydroxy groups or carboxy groups having a protecting group, (t) polar groups having an acid-dissociable group, and (u) C groups in which at least a portion of the hydrogen atoms may be substituted with any of the above (a) to (t). １－１８ Hydrocarbyl group, C １－１８ Hydrocarbyloxy group, C １－１８ Hydrocarbyl carbonyl group, C １－１８ Hydrocarbylcarbonyloxy group, C １－１８ Hydrocarbyloxycarbonyl group, C １－１８ Hydrocarbyloxycarbonyloxy group, C １－１８ Hydrocarbylamino group, diC １－１８ Hydrocarbylamino group, C １－１８ Hydrocarbylaminocarbonyl group, diC １－１８ Hydrocarbylaminocarbonyl group, C １－１８ Hydrocarbylcarbonylamino group, C １－１８ Hydrocarbylaminocarbonyloxy group, diC １－１８ Hydrocarbylaminocarbonyloxy group, C １－１８ Hydrocarbylaminocarbonylamino group, diC １－１８ Hydrocarbylaminocarbonylamino group, C １－１８ a hydrocarbyloxycarbonylamino group, or C １－１８ The divalent carbon atom at any position of these substituents, excluding the terminals, may be replaced by a hydrocarbylthio group, and may be —O—, —C(═O)—, —C(═O)O—, —OCO—, —CONH—, —NHCO—, —NH(C═O)O—, —S—, or —SO ２ - (provided that adjacent divalent carbon atoms are not simultaneously replaced); ２Ａ ~R ２ＤAny two of these are directly connected to each other by a single bond, or are connected to each other by a divalent linking group -O-, -S-, -C(=O)-, -S(=O)-, -S(=O) ２ -, -C(=O)O-, or C １－３ They may be linked via an alkylene group to form a ring together with the nitrogen atom in formula (VII-1).

[0132] <Organic Quaternary Ammonium Cation Having One or More Substituents> From the viewpoint of providing a functional building block, the organic quaternary ammonium cation represented by the general formula (VII-1) is preferably an organic quaternary ammonium cation having one or more substituents, R ２Ａ ~R ２Ｄ each independently represents an optionally substituted C １－１８ represents a hydrocarbyl group, a 3- to 18-membered non-aromatic heterocyclic group, or a 5- to 18-membered aromatic heterocyclic group; ２Ａ ~R ２Ｄ The divalent carbon atom at any position excluding the terminal may be -O-, -C(=O)-, -C(=O)O-, -OCO-, -CONH-, -NHCO-, -NH(C=O)O-, -S- or -SO ２ - (provided that adjacent divalent carbon atoms are not simultaneously replaced); ２Ａ ~R ２Ｄ It is more preferable that at least one hydrogen atom contained in the optionally substituted C is replaced by (a) a halogen atom, (b) a haloalkyl group, (c) a hydroxy group, (d) a thiol group, (e) a nitro group, (f) a cyano group, (g) a carboxy group, (h) an amino group, (i) a sulfo group, (j) a vinyl group, (k) an allyl group, (l) a (meth)acryloyl group, (m) a (meth)acryloyloxy group, (n) a (meth)acrylamide group, (o) a styryl group, (p) an epoxy group, (q) a glycidyl group, (r) an amide group, (s) a hydroxy group or carboxy group having a protecting group, or (t) a polar group having an acid-dissociable group. １－１８ Alkyl group, C ３－１８ Alicyclic group, C ６－１８ an aryl group, or C ７－１８ an aralkyl group; ２Ａ ~R ２ＤThe divalent carbon atom at any position excluding the terminal may be -O-, -C(=O)-, -C(=O)O-, -OCO-, -CONH-, -NHCO-, -NH(C=O)O-, -S- or -SO ２ - (provided that adjacent divalent carbon atoms are not simultaneously replaced); ２Ａ ~R ２Ｄ At least one hydrogen atom of the formula (I) is (a) a halogen atom, (b) C １－３ It is more preferable that the substituted group is a haloalkyl group, (c) a hydroxy group, (d) a thiol group, (e) a nitro group, (f) a cyano group, (g) a carboxy group, (h) an amino group, (i) a sulfo group, (j) a vinyl group, (k) an allyl group, (l) a (meth)acryloyl group, (m) a (meth)acryloyloxy group, (n) a (meth)acrylamide group, (o) a styryl group, (p) an epoxy group, (q) a glycidyl group, (r) an amide group, (s) a hydroxy group or carboxy group having a protecting group, or (t) a polar group having an acid-dissociable group.

[0133] R having one or more substituents ２Ａ ~R ２Ｄ is not particularly limited, and examples thereof include C alkyl groups having a hydroxy group or a glycidyl group, such as a 2-trifluoromethylbenzyl group, a 2-hydroxyethyl group, a 3-hydroxypropyl group, or a 1-glycidyloxypropan-3-yl group. １－１８ Hydrocarbyl groups: C groups having an ethylenically unsaturated group such as a vinyl group, an allyl group, a vinylbenzyl group, a propenyl group, a butenyl group, a pentenyl group, a hexenyl group, a heptenyl group, an acryloylethyl group, an acryloylpropyl group, a methacryloylethyl group, a methacryloylpropyl group, an acryloyloxyethyl group, an acryloyloxypropyl group, a methacryloyloxyethyl group, a methacryloyloxypropyl group, an acryloylaminoethyl group, an acryloylaminopropyl group, a methacryloylaminoethyl group, a methacryloylaminopropyl group, or a styryl group １－１８Hydrocarbyl groups: C groups having an acid-dissociable group such as a 4-methoxymethoxyphenyl group, a methoxymethyl group, an ethoxyethyl group, a methoxyethoxymethyl group, a t-butoxycarbonyl group, a 1-methylcyclopentyl group, a 1-ethylcyclopentyl group, a 1-phenylcyclopentyl group, a 1-tolylcyclopentyl group, a 1-methylcyclohexyl group, a 1-ethylcyclohexyl group, a 1-phenylcyclohexyl group, a 1-tolylcyclohexyl group, a 1-(naphthalen-2-yl)cyclohexyl group, a 1-(1-methoxy-2-methylpropan-2-yl)cyclopentyl group, a 1-(1-ethoxy-2-methylpropan-2-yl)cyclopentyl group, a 2-methyladamantan-2-yl group, a 2-ethyladamantan-2-yl group, a 2-phenyladamantan-2-yl group, a diethylaminocarbonyl group, or a diisopropylaminocarbonyl group １－１８ Hydrocarbyl groups and the like.

[0134] <Examples of Organic Quaternary Ammonium Cations> Specific examples of the organic quaternary ammonium cation include diallyldimethylammonium cation, (3-acrylamidopropyl)trimethylammonium cation, trimethyl-2-methacryloyloxyethylammonium cation, N-(2-acryloyloxyethyl)-N-benzyl-N,N-dimethylammonium cation, trimethylvinylammonium cation, N-4-vinylbenzyltriallylammonium cation, 3-hydroxypropyltriallylammonium cation, 2-trifluoromethylbenzyltriallylammonium cation, di-2-(N-methylacrylamido)ethyldimethylammonium cation, allyltrimethylammonium cation, butyl(2-methacryloyloxyethyl)dimethylammonium cation, ethoxycarbonylmethyltriethylammonium cation, 2-hydroxyethyltrimethylammonium cation, 2-acetylethyltrimethylammonium cation, (4-((diisopropylcarbamoyl)oxy)phenyl)trimethylammonium cation, (4-(methacryloyloxy)phenyl)trimethylammonium cation, and trimethyl(4-(nonanoyloxy)phenyl)ammonium cation.

[0135] [1-1-2-2-2. Ammonium dication] The ammonium dication is not particularly limited, and any known or commonly used ammonium dication can be used. Examples of the ammonium dication include organic quaternary ammonium dications represented by the following general formula (VII-2):

[0136] In general formula (VII-2), R ３Ａ ~R ３Ｆ each independently represents a C １－１８ represents a hydrocarbyl group, a 3- to 18-membered non-aromatic heterocyclic group, or a 5- to 18-membered aromatic heterocyclic group, ３Ａ ~R ３Ｆ The divalent carbon atom at any position excluding the terminal may be -O-, -C(=O)-, -C(=O)O-, -OCO-, -CONH-, -NHCO-, -NH(C=O)O-, -S- or -SO ２ - may be substituted (provided that adjacent divalent carbon atoms are not substituted at the same time); ３ is an optionally substituted C １－１８ represents a hydrocarbylene group, ３ The divalent carbon atom at any position in ２ - (provided that adjacent divalent carbon atoms are not simultaneously replaced); ３Ａ ~R ３Ｆ and L ３The hydrogen atoms contained in the formula (I) are selected from the group consisting of (a) halogen atoms, (b) haloalkyl groups, (c) hydroxy groups, (d) thiol groups, (e) nitro groups, (f) cyano groups, (g) carboxy groups, (h) amino groups, (i) sulfo groups, (j) vinyl groups, (k) allyl groups, (l) (meth)acryloyl groups, (m) (meth)acryloyloxy groups, (n) (meth)acrylamide groups, (o) styryl groups, (p) epoxy groups, (q) glycidyl groups, (r) amide groups, (s) hydroxy groups or carboxy groups having a protecting group, (t) polar groups having an acid-dissociable group, and (u) C groups in which at least a portion of the hydrogen atoms may be substituted with any of the above (a) to (t). １－１８ Hydrocarbyl group, C １－１８ Hydrocarbyloxy group, C １－１８ Hydrocarbyl carbonyl group, C １－１８ Hydrocarbylcarbonyloxy group, C １－１８ Hydrocarbyloxycarbonyl group, C １－１８ Hydrocarbyloxycarbonyloxy group, C １－１８ Hydrocarbylamino group, diC １－１８ Hydrocarbylamino group, C １－１８ Hydrocarbylaminocarbonyl group, diC １－１８ Hydrocarbylaminocarbonyl group, C １－１８ Hydrocarbylcarbonylamino group, C １－１８ Hydrocarbylaminocarbonyloxy group, diC １－１８ Hydrocarbylaminocarbonyloxy group, C １－１８ Hydrocarbylaminocarbonylamino group, diC １－１８ Hydrocarbylaminocarbonylamino group, C １－１８ a hydrocarbyloxycarbonylamino group, or C １－１８ The divalent carbon atom at any position of these substituents, excluding the terminals, may be replaced by a hydrocarbylthio group, and may be —O—, —C(═O)—, —C(═O)O—, —OCO—, —CONH—, —NHCO—, —NH(C═O)O—, —S—, or —SO ２ - may be substituted (provided that adjacent divalent carbon atoms are not substituted at the same time); R ３Ａ ~R ３ＦAny two of these are directly connected to each other by a single bond, or are connected to each other by a divalent linking group -O-, -S-, -C(=O)-, -S(=O)-, -S(=O) ２ -, -C(=O)O-, or C １－３ They may be linked via an alkylene group to form a ring together with the nitrogen atom in formula (VII-2).

[0137] The organic quaternary ammonium dication represented by general formula (VII-2) is not particularly limited, and examples thereof include 1,4-diallyl-1,4-diazabicyclo[2.2.2]octane-1,4-diium, 1,4-di(2-(meth)acryloyloxyethyl)-1,4-diazabicyclo[2.2.2]octane-1.4-diium, and 1,4-bis(2-(meth)acrylamidoethyl)-1,4-diazabicyclo[2.2.2]octane-1,4-diium.

[0138] [1-1-2-2-3. Phosphonium Cation] The phosphonium cation is not particularly limited, and any known or commonly used phosphonium cation can be used. Examples of the phosphonium cation include organic quaternary phosphonium cations represented by the following general formula (VII-3):

[0139] In general formula (VII-3), R ４Ａ ~R ４Ｄ each independently represents a C １－１８ represents a hydrocarbyl group, a 3- to 18-membered non-aromatic heterocyclic group, or a 5- to 18-membered aromatic heterocyclic group; ４Ａ ~R ４Ｄ The divalent carbon atom at any position excluding the terminal may be -O-, -C(=O)-, -C(=O)O-, -OCO-, -CONH-, -NHCO-, -NH(C=O)O-, -S- or -SO ２ - (provided that adjacent divalent carbon atoms are not simultaneously replaced); ４Ａ ~R ４ＤThe hydrogen atoms contained in the formula (I) are selected from the group consisting of (a) halogen atoms, (b) haloalkyl groups, (c) hydroxy groups, (d) thiol groups, (e) nitro groups, (f) cyano groups, (g) carboxy groups, (h) amino groups, (i) sulfo groups, (j) vinyl groups, (k) allyl groups, (l) (meth)acryloyl groups, (m) (meth)acryloyloxy groups, (n) (meth)acrylamide groups, (o) styryl groups, (p) epoxy groups, (q) glycidyl groups, (r) amide groups, (s) hydroxy groups or carboxy groups having a protecting group, (t) polar groups having an acid-dissociable group, and (u) C groups in which at least a portion of the hydrogen atoms may be substituted with any of the above (a) to (t). １－１８ Hydrocarbyl group, C １－１８ Hydrocarbyloxy group, C １－１８ Hydrocarbyl carbonyl group, C １－１８ Hydrocarbylcarbonyloxy group, C １－１８ Hydrocarbyloxycarbonyl group, C １－１８ Hydrocarbyloxycarbonyloxy group, C １－１８ Hydrocarbylamino group, diC １－１８ Hydrocarbylamino group, C １－１８ Hydrocarbylaminocarbonyl group, diC １－１８ Hydrocarbylaminocarbonyl group, C １－１８ Hydrocarbylcarbonylamino group, C １－１８ Hydrocarbylaminocarbonyloxy group, diC １－１８ Hydrocarbylaminocarbonyloxy group, C １－１８ Hydrocarbylaminocarbonylamino group, diC １－１８ Hydrocarbylaminocarbonylamino group, C １－１８ a hydrocarbyloxycarbonylamino group, or C １－１８ The divalent carbon atom at any position of these substituents, excluding the terminals, may be replaced by a hydrocarbylthio group, and may be —O—, —C(═O)—, —C(═O)O—, —OCO—, —CONH—, —NHCO—, —NH(C═O)O—, —S—, or —SO ２ - (provided that adjacent divalent carbon atoms are not simultaneously replaced); ４Ａ ~R ４ＤAny two of these are directly connected to each other by a single bond, or are connected to each other by a divalent linking group -O-, -S-, -C(=O)-, -S(=O)-, -S(=O) ２ -, -C(=O)O-, or C １－３ They may be linked via an alkylene group to form a ring together with the phosphorus atom in formula (VII-3).

[0140] <Organic Quaternary Phosphonium Cation Having One or More Substituents> From the viewpoint of providing a functional building block, the organic quaternary phosphonium cation represented by the general formula (VII-3) is preferably an organic quaternary phosphonium cation having one or more substituents, R ４Ａ ~R ４Ｄ each independently represents an optionally substituted C １－１８ represents a hydrocarbyl group, a 3- to 18-membered non-aromatic heterocyclic group, or a 5- to 18-membered aromatic heterocyclic group; ４Ａ ~R ４Ｄ The divalent carbon atom at any position excluding the terminal may be -O-, -C(=O)-, -C(=O)O-, -OCO-, -CONH-, -NHCO-, -NH(C=O)O-, -S- or -SO ２ - (provided that adjacent divalent carbon atoms are not simultaneously replaced); ４Ａ ~R ４Ｄ at least one hydrogen atom of the optionally substituted C is preferably replaced by (a) a halogen atom, (b) a haloalkyl group, (c) a hydroxy group, (d) a thiol group, (e) a nitro group, (f) a cyano group, (g) a carboxy group, (h) an amino group, (i) a sulfo group, (j) a vinyl group, (k) an allyl group, (l) a (meth)acryloyl group, (m) a (meth)acryloyloxy group, (n) a (meth)acrylamide group, (o) a styryl group, (p) an epoxy group, (q) a glycidyl group, (r) an amide group, (s) a hydroxy group or carboxy group having a protecting group, or (t) a polar group having an acid-dissociable group; １－１８ Alkyl group, C ３－１８ Alicyclic group, C ６－１８ an aryl group, or C ７－１８ an aralkyl group; ４Ａ ~R ４ＤThe divalent carbon atom at any position excluding the terminal may be -O-, -C(=O)-, -C(=O)O-, -OCO-, -CONH-, -NHCO-, -NH(C=O)O-, -S- or -SO ２ - (provided that adjacent divalent carbon atoms are not simultaneously replaced); ４Ａ ~R ４Ｄ At least one hydrogen atom of the formula (I) is (a) a halogen atom, (b) C １－３ It is more preferable that the substituted group is a haloalkyl group, (c) a hydroxy group, (d) a thiol group, (e) a nitro group, (f) a cyano group, (g) a carboxy group, (h) an amino group, (i) a sulfo group, (j) a vinyl group, (k) an allyl group, (l) a (meth)acryloyl group, (m) a (meth)acryloyloxy group, (n) a (meth)acrylamide group, (o) a styryl group, (p) an epoxy group, (q) a glycidyl group, (r) an amide group, (s) a hydroxy group or carboxy group having a protecting group, or (t) a polar group having an acid-dissociable group.

[0141] R having one or more substituents ４Ａ ~R ４Ｄ is not particularly limited, and examples thereof include C alkyl groups having a halogen atom, a hydroxy group, a glycidyl group, etc., such as a 2-trifluoromethylbenzyl group, a 2-hydroxyethyl group, a 3-hydroxypropyl group, and a 1-glycidyloxypropan-3-yl group. １－１８ Hydrocarbyl groups: C groups having an ethylenically unsaturated double bond such as a vinyl group, an allyl group, a propenyl group, a butenyl group, a pentenyl group, a hexenyl group, a heptenyl group, an acryloylethyl group, an acryloylpropyl group, a methacryloylethyl group, a methacryloylpropyl group, an acryloyloxyethyl group, an acryloyloxypropyl group, a methacryloyloxyethyl group, a methacryloyloxypropyl group, an acryloylaminoethyl group, an acryloylaminopropyl group, a methacryloylaminoethyl group, a methacryloylaminopropyl group, or a styryl group; １－１８Hydrocarbyl groups: C having an acid-dissociable group such as a methoxymethyl group, an ethoxyethyl group, a methoxyethoxymethyl group, a t-butoxycarbonyl group, a 1-methylcyclopentyl group, a 1-ethylcyclopentyl group, a 1-phenylcyclopentyl group, a 1-tolylcyclopentyl group, a 1-methylcyclohexyl group, a 1-ethylcyclohexyl group, a 1-phenylcyclohexyl group, a 1-tolylcyclohexyl group, a 1-(naphthalen-2-yl)cyclohexyl group, a 1-(1-methoxy-2-methylpropan-2-yl)cyclopentyl group, a 1-(1-ethoxy-2-methylpropan-2-yl)cyclopentyl group, a 2-methyladamantan-2-yl group, a 2-ethyladamantan-2-yl group, a 2-phenyladamantan-2-yl group, a diethylaminocarbonyl group, or a diisopropylaminocarbonyl group １－１８ Hydrocarbyl groups and the like.

[0142] <Examples of organic quaternary phosphonium cations> The organic quaternary phosphonium cation represented by the general formula (VII-3) is not particularly limited, and examples thereof include a tributylcyanomethylphosphonium cation, a methyltriphenylphosphonium cation, an ethyltriphenylphosphonium cation, a cyanomethyltriphenylphosphonium cation, a formylmethyltriphenylphosphonium cation, a methoxymethyltriphenylphosphonium cation, a chloromethyltriphenylphosphonium cation, an acetonyltriphenylphosphonium cation, a tributyl-1,3-dioxan-2-ylmethylphosphonium cation, a triphenylpropargylphosphonium cation, an allyltriphenyl Examples of such cations include phosphonium cation, cyclopropyltriphenylphosphonium cation, benzyltriphenylphosphonium cation, tetrakis(hydroxymethyl)phosphonium cation, 2-carboxyethyltriphenylphosphonium cation, methoxycarbonylmethyltriphenylphosphonium cation, t-butoxycarbonylmethyltriphenylphosphonium cation, (4-((diisopropylcarbamoyl)oxy)phenyl)triphenylphosphonium cation, (4-(methacryloyloxy)phenyl)triphenylphosphonium cation, and triphenyl(4-(nonanoyloxy)phenyl)phosphonium cation.

[0143] [1-1-2-2-4. Phosphonium dication] The phosphonium dication is not particularly limited, and any known or commonly used phosphonium dication can be used. Examples of the phosphonium dication include organic quaternary phosphonium dications represented by the following general formula (VII-4):

[0144] In general formula (VII-4), R ５Ａ ~R ５Ｆ each independently represents a C １－１８ represents a hydrocarbyl group, a 3- to 18-membered non-aromatic heterocyclic group, or a 5- to 18-membered aromatic heterocyclic group, ５Ａ ~R ５ＦThe divalent carbon atom at any position excluding the terminal may be -O-, -C(=O)-, -C(=O)O-, -OCO-, -CONH-, -NHCO-, -NH(C=O)O-, -S- or -SO ２ - (provided that adjacent divalent carbon atoms are not simultaneously replaced), L ５ is an optionally substituted C １－１８ represents a hydrocarbylene group, ５ The divalent carbon atom at any position in ２ - (provided that adjacent divalent carbon atoms are not simultaneously replaced); ５Ａ ~R ５Ｆ and L ５ The hydrogen atoms contained in the formula (I) are selected from the group consisting of (a) halogen atoms, (b) haloalkyl groups, (c) hydroxy groups, (d) thiol groups, (e) nitro groups, (f) cyano groups, (g) carboxy groups, (h) amino groups, (i) sulfo groups, (j) vinyl groups, (k) allyl groups, (l) (meth)acryloyl groups, (m) (meth)acryloyloxy groups, (n) (meth)acrylamide groups, (o) styryl groups, (p) epoxy groups, (q) glycidyl groups, (r) amide groups, (s) hydroxy groups or carboxy groups having a protecting group, (t) polar groups having an acid-dissociable group, and (u) C groups in which at least a portion of the hydrogen atoms may be substituted with any of the above (a) to (t). １－１８ Hydrocarbyl group, C １－１８ Hydrocarbyloxy group, C １－１８ Hydrocarbyl carbonyl group, C １－１８ Hydrocarbylcarbonyloxy group, C １－１８ Hydrocarbyloxycarbonyl group, C １－１８ Hydrocarbyloxycarbonyloxy group, C １－１８ Hydrocarbylamino group, diC １－１８ Hydrocarbylamino group, C １－１８ Hydrocarbylaminocarbonyl group, diC １－１８ Hydrocarbylaminocarbonyl group, C １－１８ Hydrocarbylcarbonylamino group, C１－１８ Hydrocarbylaminocarbonyloxy group, diC １－１８ Hydrocarbylaminocarbonyloxy group, C １－１８ Hydrocarbylaminocarbonylamino group, diC １－１８ Hydrocarbylaminocarbonylamino group, C １－１８ a hydrocarbyloxycarbonylamino group, or C １－１８ The divalent carbon atom at any position of these substituents, excluding the terminals, may be replaced by a hydrocarbylthio group, and may be —O—, —C(═O)—, —C(═O)O—, —OCO—, —CONH—, —NHCO—, —NH(C═O)O—, —S—, or —SO ２ - may be substituted (provided that adjacent divalent carbon atoms are not substituted at the same time); R ５Ａ ~R ５Ｆ Any two of these are directly connected to each other by a single bond, or are connected to each other by a divalent linking group -O-, -S-, -C(=O)-, -S(=O)-, -S(=O) ２ -, -C(=O)O-, or C １－３ They may be linked via an alkylene group to form a ring together with the phosphorus atom in formula (VII-4).

[0145] The organic quaternary phosphonium dication represented by general formula (VII-4) is not particularly limited, and examples thereof include trans-2-butene-1,4-bis(triphenylphosphonium) dication, ethylenebis(triphenylphosphonium) dication, and pentamethylenebis(triphenylphosphonium) dication.

[0146] [1-1-2-2-5. Sulfonium Cation] The sulfonium cation is not particularly limited, and any known or commonly used sulfonium cation can be used. Examples of the sulfonium cation include organic sulfonium cations represented by the following general formula (VII-5):

[0147] In general formula (VII-5), R ６Ａ , R ６Ｂ and R ６Ｃ each independently represents a C １－１８represents a hydrocarbyl group, a 3- to 18-membered non-aromatic heterocyclic group, or a 5- to 18-membered aromatic heterocyclic group, ６Ａ , R ６Ｂ and R ６Ｃ The divalent carbon atom at any position excluding the terminal may be -O-, -C(=O)-, -C(=O)O-, -OCO-, -CONH-, -NHCO-, -NH(C=O)O-, -S- or -SO ２ - (provided that adjacent divalent carbon atoms are not simultaneously replaced); ６Ａ , R ６Ｂ and R ６Ｃ The hydrogen atoms contained in the formula (I) are selected from the group consisting of (a) halogen atoms, (b) haloalkyl groups, (c) hydroxy groups, (d) thiol groups, (e) nitro groups, (f) cyano groups, (g) carboxy groups, (h) amino groups, (i) sulfo groups, (j) vinyl groups, (k) allyl groups, (l) (meth)acryloyl groups, (m) (meth)acryloyloxy groups, (n) (meth)acrylamide groups, (o) styryl groups, (p) epoxy groups, (q) glycidyl groups, (r) amide groups, (s) hydroxy groups or carboxy groups having a protecting group, (t) polar groups having an acid-dissociable group, and (u) C groups in which at least a portion of the hydrogen atoms may be substituted with any of the above (a) to (t). １－１８ Hydrocarbyl group, C １－１８ Hydrocarbyloxy group, C １－１８ Hydrocarbyl carbonyl group, C １－１８ Hydrocarbylcarbonyloxy group, C １－１８ Hydrocarbyloxycarbonyl group, C １－１８ Hydrocarbyloxycarbonyloxy group, C １－１８ Hydrocarbylamino group, diC １－１８ Hydrocarbylamino group, C １－１８ Hydrocarbylaminocarbonyl group, diC １－１８ Hydrocarbylaminocarbonyl group, C １－１８ Hydrocarbylcarbonylamino group, C １－１８ Hydrocarbylaminocarbonyloxy group, diC １－１８ Hydrocarbylaminocarbonyloxy group, C １－１８ Hydrocarbylaminocarbonylamino group, diC １－１８Hydrocarbylaminocarbonylamino group, C １－１８ a hydrocarbyloxycarbonylamino group, or C １－１８ The divalent carbon atom at any position of these substituents, excluding the terminals, may be replaced by a hydrocarbylthio group, and may be —O—, —C(═O)—, —C(═O)O—, —OCO—, —CONH—, —NHCO—, —NH(C═O)O—, —S—, or —SO ２ - (provided that adjacent divalent carbon atoms are not simultaneously replaced); ６Ａ , R ６Ｂ and R ６Ｃ Any two of these are directly connected to each other by a single bond, or are divalent linking groups -O-, -S-, -C(=O)-, -S(=O)-, -S(=O) ２ -, -C(=O)O-, or C １－３ They may be linked via an alkylene group to form a ring together with the sulfur atom in formula (VII-5).

[0148] The above R ６Ａ , R ６Ｂ and R ６Ｃ Each of the C groups independently has a substituent. １－１８ is a hydrocarbyl group; ６Ａ , R ６Ｂ and R ６Ｃ The divalent carbon atom at any position excluding the terminal may be -O-, -C(=O)-, -C(=O)O-, -OCO-, -CONH-, -NHCO-, -NH(C=O)O-, -S- or -SO ２ - (provided that adjacent divalent carbon atoms are not simultaneously replaced); ６Ａ , R ６Ｂ and R ６ＣThe hydrogen atoms contained in the formula (I) are selected from the group consisting of (a) halogen atoms, (b) haloalkyl groups, (c) hydroxy groups, (d) thiol groups, (e) nitro groups, (f) cyano groups, (g) carboxy groups, (h) amino groups, (i) sulfo groups, (j) vinyl groups, (k) allyl groups, (l) (meth)acryloyl groups, (m) (meth)acryloyloxy groups, (n) (meth)acrylamide groups, (o) styryl groups, (p) epoxy groups, (q) glycidyl groups, (r) amide groups, (s) hydroxy groups or carboxy groups having a protecting group, (t) polar groups having an acid-dissociable group, and (u) C groups in which at least a portion of the hydrogen atoms may be substituted with any of the above (a) to (t). １－１８ Hydrocarbyl group, C １－１８ Hydrocarbyloxy group, C １－１８ Hydrocarbyl carbonyl group, C １－１８ Hydrocarbylcarbonyloxy group, C １－１８ Hydrocarbyloxycarbonyl group, C １－１８ a hydrocarbyloxycarbonyloxy group, or C １－１８ The divalent carbon atom at any position of these substituents, excluding the terminals, may be replaced by a hydrocarbylthio group, and may be —O—, —C(═O)—, —C(═O)O—, —OCO—, —CONH—, —NHCO—, —NH(C═O)O—, —S—, or —SO ２ - (provided that adjacent divalent carbon atoms are not simultaneously replaced), and １－１８ Alkyl group, C ３－１８ Alicyclic group, C ６－１８ an aryl group, or C ７－１８ an aralkyl group; ６Ａ , R ６Ｂ and R ６Ｃ The divalent carbon atom at any position excluding the terminal may be -O-, -C(=O)-, -C(=O)O-, -OCO-, -CONH-, -NHCO-, -NH(C=O)O-, -S- or -SO ２ - (provided that adjacent divalent carbon atoms are not simultaneously replaced); ６Ａ , R ６Ｂ and R ６ＣThe hydrogen atoms contained in the formula (I) are selected from the group consisting of (a) halogen atoms, (b) haloalkyl groups, (c) hydroxy groups, (d) thiol groups, (e) nitro groups, (f) cyano groups, (g) carboxy groups, (h) amino groups, (i) sulfo groups, (j) vinyl groups, (k) allyl groups, (l) (meth)acryloyl groups, (m) (meth)acryloyloxy groups, (n) (meth)acrylamide groups, (o) styryl groups, (p) epoxy groups, (q) glycidyl groups, (r) amide groups, (s) hydroxy groups or carboxy groups having a protecting group, (t) polar groups having an acid-dissociable group, and (u) C groups in which at least a portion of the hydrogen atoms may be substituted with any of the above (a) to (t). １－１８ Hydrocarbyl group, C １－１８ Hydrocarbyloxy group, C １－１８ Hydrocarbyl carbonyl group, C １－１８ Hydrocarbylcarbonyloxy group, C １－１８ Hydrocarbyloxycarbonyl group, C １－１８ a hydrocarbyloxycarbonyloxy group, or C １－１８ The divalent carbon atom at any position of these substituents, excluding the terminals, may be replaced by a hydrocarbylthio group, and may be —O—, —C(═O)—, —C(═O)O—, —OCO—, —CONH—, —NHCO—, —NH(C═O)O—, —S—, or —SO ２ It is more preferred that it may be substituted with - (provided that adjacent divalent carbon atoms are not substituted at the same time).

[0149] Also R ６Ａ , R ６Ｂ and R ６Ｃ Any two of these are directly connected to each other by a single bond, or are divalent linking groups -O-, -S-, -C(=O)-, -S(=O)-, -S(=O) ２ -, -C(=O)O-, or C １－３Examples of the case where R is linked via an alkylene group to form a ring together with the sulfur atom in formula (VII-5) include those having a thian-1-ium skeleton, a thiophen-1-ium skeleton, a 1,4-oxathiane-4-ium skeleton, a 1,4-dithian-1-ium skeleton, a 1H-thiophen-1-ium skeleton, a benzo[b]thiophen-1-ium skeleton, a dibenzothiophenium skeleton, a 9,10-dihydrothioxanthylium skeleton, a 10H-phenoxathiane-10-ium skeleton, and a 5H-thianthren-5-ium skeleton, and the following can be mentioned as examples. Note that * indicates that R is not involved in ring formation. ６Ａ , R ６Ｂ or R ６Ｃ It means the junction with.

[0150]

[0151] Examples of the organic sulfonium cation include dibutyl(pentyl)sulfonium cation, triethylsulfonium cation, (2-carboxyethyl)dimethylsulfonium cation, trimethylsulfonium cation, dimethylphenacylsulfonium cation, 1-(4-hydroxynaphthalen-1-yl)hexahydrothiopyrylium cation, dimethylphenylsulfonium cation, triphenylsulfonium cation, tris(4-methylphenyl)sulfonium cation, 4-methoxyphenyldiphenylsulfonium cation, 4-iodophenyldiphenylsulfonium cation, tris(4-fluorophenyl)sulfonium cation, 1-phenylhexahydrothiopyrylium cation, di(naphthalen-1-yl)(phenyl)sulfonium cation, phenylbis(2-(trifluoromethyl)phenyl)sulfonium cation, mesitylbis(2-(trifluoromethyl)phenyl)sulfonium cation, bis(3,5-difluorophenyl)(phenyl)sulfonium cation, tris(3,5-difluorophenyl)sulfonium cation, (4-(dodecanoyloxy-3,5-dimethylphenyl))diphenylsulfonium cation, diphenyl(3-(trifluoromethoxy)phenyl)sulfonium cation, (4-(1-adamantylcarbonyloxy)phenyl)diphenylsulfonium cation, (4-phenylthiophenyl)diphenylsulfonium cation, 5-phenyl-5H-thianthren-5-ium cation, 5-(2,5-dimethylphenyl)thianthren-5-ium cation, 5-phenyl-5H-dibenzo[b,d]thiophen-5-ium cation, 5-(3-(trifluoromethyl)phenyl)-5H-dibenzo[b,d]thiophen-5-ium cation, 1-(4-(t-butyl)phenyl)-1H-benzo[b]thiophen-1-ium cation, methyldiphenylsulfonium cation, (2-bromoethyl)diphenylsulfonium cation, (3-chloropropyl)diphenylsulfonium cation, benzyl(4-hydroxyphenyl)methylsulfonium cation, (4-hydroxyphenyl)methyl(2-methylbenzyl)sulfonium cation, 4-hydroxyphenyldimethylsulfonium cation, diphenyl(methyl)sulfonium cation, diphenyl(4-(phenylthio)phenyl)sulfonium cation, (2-bromoethyl)diphenylsulfonium cation, dimesityl(trifluoromethyl)sulfonium cation, tri-p-tolyl sulfonium cation, and the like.

[0152] The sulfonium dication is not particularly limited, and any known or commonly used sulfonium dication can be used. Examples of the sulfonium dication include organic sulfonium dications represented by the following general formula (VII-6):

[0153] In general formula (VII-6), R ７Ａ , R ７Ｂ , R ７Ｃ and R ７Ｄ each independently represents a C １－１８ represents a hydrocarbyl group, a 3- to 18-membered non-aromatic heterocyclic group, or a 5- to 18-membered aromatic heterocyclic group, ７Ａ , R ７Ｂ , R ７Ｃ and R ７Ｄ The divalent carbon atom at any position excluding the terminal may be -O-, -C(=O)-, -C(=O)O-, -OCO-, -CONH-, -NHCO-, -NH(C=O)O-, -S- or -SO ２ - may be substituted (provided that adjacent divalent carbon atoms are not substituted at the same time); K ７Ａ , K. ７Ｂ and L ７ each independently represents a C １－１８represents a hydrocarbylene group, ７Ａ , K. ７Ｂ and L ７ The divalent carbon atom at any position in ２ - (provided that adjacent divalent carbon atoms are not simultaneously replaced); ７Ａ , R ７Ｂ , R ７Ｃ , R ７Ｄ , K. ７Ａ , K. ７Ｂ and L ７ The hydrogen atoms contained in the formula (I) are selected from the group consisting of (a) halogen atoms, (b) haloalkyl groups, (c) hydroxy groups, (d) thiol groups, (e) nitro groups, (f) cyano groups, (g) carboxy groups, (h) amino groups, (i) sulfo groups, (j) vinyl groups, (k) allyl groups, (l) (meth)acryloyl groups, (m) (meth)acryloyloxy groups, (n) (meth)acrylamide groups, (o) styryl groups, (p) epoxy groups, (q) glycidyl groups, (r) amide groups, (s) hydroxy groups or carboxy groups having a protecting group, (t) polar groups having an acid-dissociable group, and (u) C groups in which at least a portion of the hydrogen atoms may be substituted with any of the above (a) to (t). １－１８ Hydrocarbyl group, C １－１８ Hydrocarbyloxy group, C １－１８ Hydrocarbyl carbonyl group, C １－１８ Hydrocarbylcarbonyloxy group, C １－１８ Hydrocarbyloxycarbonyl group, C １－１８ Hydrocarbyloxycarbonyloxy group, C １－１８ Hydrocarbylamino group, diC １－１８ Hydrocarbylamino group, C １－１８ Hydrocarbylaminocarbonyl group, diC １－１８ Hydrocarbylaminocarbonyl group, C １－１８ Hydrocarbylcarbonylamino group, C １－１８ Hydrocarbylaminocarbonyloxy group, diC １－１８ Hydrocarbylaminocarbonyloxy group, C １－１８ Hydrocarbylaminocarbonylamino group, diC１－１８ Hydrocarbylaminocarbonylamino group, C １－１８ a hydrocarbyloxycarbonylamino group, or C １－１８ A divalent carbon atom at any position excluding the terminal of these substituents may be replaced by -O-, -C(=O)-, -C(=O)O-, -OCO-, -CONH-, -NHCO-, -NH(C=O)O-, -S-, or -SO ２ - may be substituted (provided that adjacent divalent carbon atoms are not substituted at the same time); R ７Ａ , R ７Ｂ and K. ７Ａ and / or R ７Ｃ , R ７Ｄ and K. ７Ｂ Any two of these are directly connected to each other by a single bond, or are connected to each other by a divalent linking group -O-, -S-, -C(=O)-, -S(=O)-, -S(=O) ２ -, -C(=O)O-, or C １－３ They may be linked via an alkylene group to form a ring together with the sulfur atom in formula (VII-6).

[0154] The above R ７Ａ ~R ７Ｄ Each of the C groups independently has a substituent. １－１８ is a hydrocarbyl group; ７Ａ ~R ７Ｄ The divalent carbon atom at any position excluding the terminal may be -O-, -C(=O)-, -C(=O)O-, -OCO-, -CONH-, -NHCO-, -NH(C=O)O-, -S- or -SO ２ - (provided that adjacent divalent carbon atoms are not simultaneously replaced); ７Ａ ~R ７ＤThe hydrogen atoms contained in the formula (I) are selected from the group consisting of (a) halogen atoms, (b) haloalkyl groups, (c) hydroxy groups, (d) thiol groups, (e) nitro groups, (f) cyano groups, (g) carboxy groups, (h) amino groups, (i) sulfo groups, (j) vinyl groups, (k) allyl groups, (l) (meth)acryloyl groups, (m) (meth)acryloyloxy groups, (n) (meth)acrylamide groups, (o) styryl groups, (p) epoxy groups, (q) glycidyl groups, (r) amide groups, (s) hydroxy groups or carboxy groups having a protecting group, (t) polar groups having an acid-dissociable group, and (u) C groups in which at least a portion of the hydrogen atoms may be substituted with any of the above (a) to (t). １－１８ Hydrocarbyl group, C １－１８ Hydrocarbyloxy group, C １－１８ Hydrocarbyl carbonyl group, C １－１８ Hydrocarbylcarbonyloxy group, C １－１８ Hydrocarbyloxycarbonyl group, C １－１８ a hydrocarbyloxycarbonyloxy group, or C １－１８ The divalent carbon atom at any position of these substituents, excluding the terminals, may be replaced by a hydrocarbylthio group, and may be —O—, —C(═O)—, —C(═O)O—, —OCO—, —CONH—, —NHCO—, —NH(C═O)O—, —S—, or —SO ２ - (provided that adjacent divalent carbon atoms are not simultaneously replaced), and １－１８ Alkyl group, C ３－１８ Alicyclic group, C ６－１８ an aryl group, or C ７－１８ an aralkyl group; ７Ａ ~R ７Ｄ The divalent carbon atom at any position excluding the terminal may be -O-, -C(=O)-, -C(=O)O-, -OCO-, -CONH-, -NHCO-, -NH(C=O)O-, -S- or -SO ２ - (provided that adjacent divalent carbon atoms are not simultaneously replaced); ７Ａ ~R ７ＤThe hydrogen atoms contained in the formula (I) are selected from the group consisting of (a) halogen atoms, (b) haloalkyl groups, (c) hydroxy groups, (d) thiol groups, (e) nitro groups, (f) cyano groups, (g) carboxy groups, (h) amino groups, (i) sulfo groups, (j) vinyl groups, (k) allyl groups, (l) (meth)acryloyl groups, (m) (meth)acryloyloxy groups, (n) (meth)acrylamide groups, (o) styryl groups, (p) epoxy groups, (q) glycidyl groups, (r) amide groups, (s) hydroxy groups or carboxy groups having a protecting group, (t) polar groups having an acid-dissociable group, and (u) C groups in which at least a portion of the hydrogen atoms may be substituted with any of the above (a) to (t). １－１８ Hydrocarbyl group, C １－１８ Hydrocarbyloxy group, C １－１８ Hydrocarbyl carbonyl group, C １－１８ Hydrocarbylcarbonyloxy group, C １－１８ Hydrocarbyloxycarbonyl group, C １－１８ a hydrocarbyloxycarbonyloxy group, or C １－１８ The divalent carbon atom at any position of these substituents, excluding the terminals, may be replaced by a hydrocarbylthio group, and may be —O—, —C(═O)—, —C(═O)O—, —OCO—, —CONH—, —NHCO—, —NH(C═O)O—, —S—, or —SO ２ It is more preferred that it may be substituted with - (provided that adjacent divalent carbon atoms are not substituted at the same time).

[0155] Above K ７Ａ , K. ７Ｂ and L ７ Each of the C groups independently has a substituent. １－１８ Alkylene group or C １－１８ represents an arylene group; ７Ａ , K. ７Ｂ and L ７ The divalent carbon atom at any position in ２ - may be substituted (provided that adjacent divalent carbon atoms are not substituted at the same time); ７Ａ , K. ７Ｂand L ７ Preferably, the hydrogen atoms contained in the above may be substituted with (a) a halogen atom, (b) a haloalkyl group, (c) a hydroxy group, (d) a thiol group, (e) a nitro group, (f) a cyano group, (g) a carboxy group, (h) an amino group, (i) a sulfo group, (j) a vinyl group, (k) an allyl group, (l) a (meth)acryloyl group, (m) a (meth)acryloyloxy group, (n) a (meth)acrylamide group, (o) a styryl group, (p) an epoxy group, (q) a glycidyl group, (r) an amide group, (s) a hydroxy group or carboxy group having a protecting group, or (t) a polar group having an acid-dissociable group.

[0156] [1-1-2-2-7. Iodonium cation] The iodonium cation is not particularly limited, and any known or commonly used iodonium cation can be used. Examples of the iodonium cation include organic iodonium cations represented by the following general formula (VII-7):

[0157] In general formula (VII-7), R ８Ａ and R ８Ｂ each independently represents a C １－１８ represents a hydrocarbyl group, a 3- to 18-membered non-aromatic heterocyclic group, or a 5- to 18-membered aromatic heterocyclic group, ８Ａ and R ８Ｂ The divalent carbon atom at any position excluding the terminal may be -O-, -C(=O)-, -C(=O)O-, -OCO-, -CONH-, -NHCO-, -NH(C=O)O-, -S- or -SO ２ - (provided that adjacent divalent carbon atoms are not simultaneously replaced); ８Ａ and R ８ＢThe hydrogen atoms contained in the formula (I) are selected from the group consisting of (a) halogen atoms, (b) haloalkyl groups, (c) hydroxy groups, (d) thiol groups, (e) nitro groups, (f) cyano groups, (g) carboxy groups, (h) amino groups, (i) sulfo groups, (j) vinyl groups, (k) allyl groups, (l) (meth)acryloyl groups, (m) (meth)acryloyloxy groups, (n) (meth)acrylamide groups, (o) styryl groups, (p) epoxy groups, (q) glycidyl groups, (r) amide groups, (s) hydroxy groups or carboxy groups having a protecting group, (t) polar groups having an acid-dissociable group, and (u) C groups in which at least a portion of the hydrogen atoms may be substituted with any of the above (a) to (t). １－１８ Hydrocarbyl group, C １－１８ Hydrocarbyloxy group, C １－１８ Hydrocarbyl carbonyl group, C １－１８ Hydrocarbylcarbonyloxy group, C １－１８ Hydrocarbyloxycarbonyl group, C １－１８ Hydrocarbyloxycarbonyloxy group, C １－１８ Hydrocarbylamino group, diC １－１８ Hydrocarbylamino group, C １－１８ Hydrocarbylaminocarbonyl group, diC １－１８ Hydrocarbylaminocarbonyl group, C １－１８ Hydrocarbylcarbonylamino group, C １－１８ Hydrocarbylaminocarbonyloxy group, diC １－１８ Hydrocarbylaminocarbonyloxy group, C １－１８ Hydrocarbylaminocarbonylamino group, diC １－１８ Hydrocarbylaminocarbonylamino group, C １－１８ a hydrocarbyloxycarbonylamino group, or C １－１８ The divalent carbon atom at any position of these substituents, excluding the terminals, may be replaced by a hydrocarbylthio group, and may be —O—, —C(═O)—, —C(═O)O—, —OCO—, —CONH—, —NHCO—, —NH(C═O)O—, —S—, or —SO ２ - (provided that adjacent divalent carbon atoms are not simultaneously replaced); ８Ａ and R ８Ｂare directly connected to each other by a single bond, or are connected to each other by a divalent linking group, -O-, -S-, -C(=O)-, -S(=O)-, -S(=O) ２ -, -C(=O)O-, or C １－３ They may be linked via an alkylene group to form a ring together with the iodine atom in formula (VII-7).

[0158] R ８Ａ and R ８Ｂ As the C １－１８ is a hydrocarbyl group; ８Ａ and R ８Ｂ The divalent carbon atom at any position excluding the terminal may be -O-, -C(=O)-, -C(=O)O-, -OCO-, -CONH-, -NHCO-, -NH(C=O)O-, -S- or -SO ２ - (provided that adjacent divalent carbon atoms are not simultaneously replaced); ８Ａ and R ８Ｂ The hydrogen atoms contained in the formula (I) are selected from the group consisting of (a) halogen atoms, (b) haloalkyl groups, (c) hydroxy groups, (d) thiol groups, (e) nitro groups, (f) cyano groups, (g) carboxy groups, (h) amino groups, (i) sulfo groups, (j) vinyl groups, (k) allyl groups, (l) (meth)acryloyl groups, (m) (meth)acryloyloxy groups, (n) (meth)acrylamide groups, (o) styryl groups, (p) epoxy groups, (q) glycidyl groups, (r) amide groups, (s) hydroxy groups or carboxy groups having a protecting group, (t) polar groups having an acid-dissociable group, and (u) C groups in which at least a portion of the hydrogen atoms may be substituted with any of the above (a) to (t). １－１８ Hydrocarbyl group, C １－１８ Hydrocarbyloxy group, C １－１８ Hydrocarbyl carbonyl group, C １－１８ Hydrocarbylcarbonyloxy group, C １－１８ Hydrocarbyloxycarbonyl group, C １－１８ a hydrocarbyloxycarbonyloxy group, or C １－１８The divalent carbon atom at any position of these substituents, excluding the terminals, may be replaced by a hydrocarbylthio group, and may be —O—, —C(═O)—, —C(═O)O—, —OCO—, —CONH—, —NHCO—, —NH(C═O)O—, —S—, or —SO ２ - (provided that adjacent divalent carbon atoms are not simultaneously replaced), and １－１８ Alkyl group, C ３－１８ Alicyclic group, C ６－１８ an aryl group, or C ７－１８ an aralkyl group; ８Ａ and R ８Ｂ The divalent carbon atom at any position excluding the terminal may be -O-, -C(=O)-, -C(=O)O-, -OCO-, -CONH-, -NHCO-, -NH(C=O)O-, -S- or -SO ２ - (provided that adjacent divalent carbon atoms are not simultaneously replaced); ８Ａ and R ８Ｂ The hydrogen atoms contained in the formula (I) are selected from the group consisting of (a) halogen atoms, (b) haloalkyl groups, (c) hydroxy groups, (d) thiol groups, (e) nitro groups, (f) cyano groups, (g) carboxy groups, (h) amino groups, (i) sulfo groups, (j) vinyl groups, (k) allyl groups, (l) (meth)acryloyl groups, (m) (meth)acryloyloxy groups, (n) (meth)acrylamide groups, (o) styryl groups, (p) epoxy groups, (q) glycidyl groups, (r) amide groups, (s) hydroxy groups or carboxy groups having a protecting group, (t) polar groups having an acid-dissociable group, and (u) C groups in which at least a portion of the hydrogen atoms may be substituted with any of the above (a) to (t). １－１８ Hydrocarbyl group, C １－１８ Hydrocarbyloxy group, C １－１８ Hydrocarbyl carbonyl group, C １－１８ Hydrocarbylcarbonyloxy group, C １－１８ Hydrocarbyloxycarbonyl group, C １－１８ a hydrocarbyloxycarbonyloxy group, or C １－１８The divalent carbon atom at any position of these substituents, excluding the terminals, may be replaced by a hydrocarbylthio group, and may be —O—, —C(═O)—, —C(═O)O—, —OCO—, —CONH—, —NHCO—, —NH(C═O)O—, —S—, or —SO ２ It is more preferred that it may be substituted with - (provided that adjacent divalent carbon atoms are not substituted at the same time).

[0159] [1-1-3. Heteropolyacid salt having modified defect sites or mixture thereof] <Heteropolyacid salt having modified defect sites represented by general formula (I) or mixture thereof> As the heteropolyacid salt having modified defect sites or mixture thereof according to this embodiment, a heteropolyacid salt having modified defect sites represented by the following general formula (I) or mixture thereof can be used. (A ｍ＋ ) ａ (C （ａｍ）－ ) (I) [wherein A ｍ＋ are each independently H ＋ , a metal ion, an onium cation or an onium dication; （ａｍ）－ represents a heteropolyacid anion in which the defective site is modified in a heteropolyacid anion having the defective site; m is an integer of 1 to 5, and a is a real number greater than 0.

[0160] In the heteropolyacid salt having modified defect sites represented by the above general formula (I) or a mixture thereof, the "metal ion," the "onium cation or onium dication," and the "heteropolyacid anion having defect sites and in which the defect sites have been modified" may be any of those described above, as appropriate.

[0161] In the heteropolyacid anion having a modified deficiency site represented by the general formula (I), it is preferable to have one or more polar groups having an acid-dissociable group, from the viewpoint of imparting a function of changing the solubility in a developer by the action of an acid or the like. Examples of the acid-dissociable group include a tertiary carbon-type acid-dissociable group G Ａ , an allyl or benzyl acid-dissociable group G Ｂ , acetal-type acid-dissociable group G Ｃ, aminocarbonyl-type acid-dissociable group G Ｄ etc.

[0162] The mixture of heteropolyacid salts having modified defect sites represented by general formula (I) contains a plurality of types of A ｍ＋ In the above case, multiple types of A may be included. ｍ＋ The content ratio can be determined by, for example, NMR analysis, XRF analysis, XPS analysis, or the like.

[0163] <Heteropolyacid salt having modified defect sites represented by general formula (I') or a mixture thereof> As another heteropolyacid salt having modified defect sites or a mixture thereof according to this embodiment, a heteropolyacid salt having modified defect sites represented by the following general formula (I') or a mixture thereof can be used. (A' ｍ’＋ ) ａ’ (B ｎ＋ ) ｂ (C'(a'm'+bn)-) (I') [wherein A' ｍ’＋ are each independently H ＋ , a metal ion, an ammonium cation, an ammonium dication, a phosphonium cation, or a phosphonium dication; B ｎ＋ each independently represents a sulfonium cation, a sulfonium dication, or an iodonium cation; C'(a'm'+bn)- represents a heteropolyacid anion having a defect site, the defect site of which has been modified; m' is an integer of 1 to 5, n is an integer of 1 or 2, a' is a real number, and b is a real number greater than 0.

[0164] In the heteropolyacid salt having modified defect sites represented by the above general formula (I') or a mixture thereof, the "metal ion," "ammonium cation," "ammonium dication," "phosphonium cation," "phosphonium dication," "sulfonium cation," "sulfonium dication," "iodonium cation," and "heteropolyacid anion having defect sites and in which the defect sites have been modified" can be appropriately selected from those described above.

[0165] The heteropolyacid salt or mixture thereof in which the deficiency sites represented by the above general formula (I') have been modified has a sulfonium cation, a sulfonium dication, or an iodonium cation in the cation moiety, and therefore can be given the function of generating an acid by exposure to DUV, XUV, EUV, an electron beam, or the like.

[0166] The mixture of heteropolyacid salts having modified defect sites represented by general formula (I') contains A' ｍ’＋ and B ｎ＋ In this case, the values ​​of a′ and b can be determined by, for example, NMR analysis, XRF analysis, XPS analysis, or the like.

[0167] The ratio of a' to b is as follows: A' is a heteropoly acid anion whose defect site is modified; ｍ’＋ , B ｎ＋ Although it depends on the types of compounds, a':b is preferably 0-8:1-12, more preferably 0-4:2-8, and even more preferably 0-2:1-4. In particular, when the value of a'm'+bn is an integer of 2-8 and m' and n are 1, it is preferable that a' is a real number of 0-7 and b is a real number of 1-8, and it is more preferable that a' is a real number of 0-4 and b is a real number of 2-8.

[0168] [1-1-4. Content of Component (A)] There are no particular limitations on the content of component (A) in the resist material, and it can be set appropriately depending on the method for applying the resist material to a substrate or the like, the thickness of the applied film, etc. The content of component (A) in the resist material is preferably 0.01 to 20 mass%, more preferably 0.1 to 15 mass%, and even more preferably 0.2 to 10 mass%, based on the resist material being 100 mass%.

[0169] [1-2. (B) Acid Diffusion Controller] The resist material according to this embodiment contains (B) an acid diffusion controller that traps acid generated by exposure.

[0170] The acid diffusion controller is not particularly limited, and any known or commonly used acid diffusion controller can be used. Examples of the acid diffusion controller include (B1) a photodecomposable base that decomposes upon exposure to light and loses its acid diffusion control ability, and (B2) a nitrogen-containing organic compound that does not fall under the category of component (B1). These may be used alone or in combination of two or more.

[0171] [1-2-1. (B1) Photodegradable base] The photodegradable base (B1) loses its ability to control acid diffusion by decomposing upon exposure, but acts as a quencher in unexposed areas, thereby controlling acid diffusion. Therefore, by incorporating the photodegradable base (B1) into a resist material, it is possible to improve properties such as increased sensitivity, reduced roughness, and suppression of coating defects.

[0172] The photodegradable base is not particularly limited, and any known or commonly used base can be used. Examples of the photodegradable base include "carboxylate compound B" represented by the following general formula (VIII-1): Ａ ", "sulfonate compound B" represented by the following general formula (VIII-2) Ｂ ", "sulfonyl amide salt compound B represented by the following general formula (VIII-3) Ｃ ", etc. In the following, carboxylate anions, sulfonate anions, sulfonylamide anions, onium cations or onium dications (D ｐ＋ ) will be explained in this order.

[0173] [1-2-1-1. Carboxylate compound B Ａ The photodegradable base (B1) is a carboxylate compound B represented by the following general formula (VIII-1): Ａ ", a carboxylate anion and an onium cation or an onium dication (D ｐ＋ ) can be used as a salt.

[0174] "R Ａ ｂ１ " is an optionally substituted C １－１８A hydrocarbyl group, a 3- to 18-membered non-aromatic heterocyclic group, or a 5- to 18-membered aromatic heterocyclic group, in which any divalent carbon atom excluding the terminal carbon atom is -O-, -C(=O)-, -C(=O)O-, -OCO-, -CONH-, -NHCO-, -S-, or -SO ２ may be replaced by - (provided that adjacent divalent carbon atoms are not replaced at the same time).

[0175] R Ａ ｂ１ As the C １－１８ In a hydrocarbyl group, any divalent carbon atom excluding the terminal carbon atom may be —O—, —C(═O)—, —C(═O)O—, —OCO—, —CONH—, —NHCO—, —S—, or —SO ２ - (provided that adjacent divalent carbon atoms are not simultaneously replaced), and １－１８ Alkyl group, C ３－１８ Alicyclic group, C ６－１８ an aryl group, or C ７－１８ An aralkyl group in which any divalent carbon atom excluding the terminal carbon atom is —O—, —C(═O)—, —C(═O)O—, —OCO—, —CONH—, —NHCO—, —S—, or —SO ２ It is more preferred that it may be substituted with - (provided that adjacent divalent carbon atoms are not substituted at the same time).

[0176] <Carboxylate Compound B Ａ１ Carboxylate compound B represented by the above general formula (VIII-1) Ａ is a carboxylate compound B represented by the following general formula (VIII-1-1): Ａ１ may be.

[0177] "X Ａ " is an optionally substituted C １－１８ Alkyl group, C ３－１８ Alicyclic group, C ６－１８ an aryl group, or C ７－１８An aralkyl group in which any divalent carbon atom excluding the terminal carbon atom is —O—, —C(═O)—, —C(═O)O—, —OCO—, —CONH—, —NHCO—, —S—, or —SO ２ may be replaced by - (provided that adjacent divalent carbon atoms are not replaced at the same time).

[0178] X Ａ As the C ３－１８ Alicyclic group, C ６－１８ an aryl group, or C ７－１８ An aralkyl group in which any divalent carbon atom excluding the terminal carbon atom is —O—, —C(═O)—, —C(═O)O—, —OCO—, —CONH—, —NHCO—, —S—, or —SO ２ - (provided that adjacent divalent carbon atoms are not simultaneously replaced), and ３－１８ an alicyclic group, or C ６－１８ In an aryl group, any divalent carbon atom excluding the terminal carbon atom may be —O—, —C(═O)—, —C(═O)O—, —OCO—, —CONH—, —NHCO—, —S—, or —SO ２ It is more preferred that it may be substituted with - (provided that adjacent divalent carbon atoms are not substituted at the same time).

[0179] "L Ａ " is X Ａ and-COO － and a group linking L Ａ -1) to (L Ａ A linking group represented by the formula (I)-7) can be used. [In the formula, L Ａ ｂ１ and L Ａ ｂ２ represents a single bond or an optionally substituted C １－８ represents a hydrocarbylene group, and *1 represents X Ａ The connecting part with *2 is -COO－ represents the connection between

[0180] L Ａ ｂ１ and L Ａ ｂ２ is a single bond or C which may have a substituent. １－８ Alkylene group or C ６－８ An arylene group is preferred, and C １－８ An alkylene group is more preferred.

[0181] <Examples of carboxylate anions> Carboxylate compound B Ａ or B Ａ１ The carboxylate anion is not particularly limited, and examples thereof include trifluoroacetate anion, pentafluoropropionate anion, 2-methoxyacetate anion, 2-methoxy-2-methylpropionate anion, 2-hydroxyacetate anion, 2-hydroxy-2-methylpropionate anion, 2-acetoxyacetate anion, adamantane-1-carboxylate anion, 9,10-dihydro-9,10-ethanoanthracene-11-carboxylate anion, 9,10-dihydro-9,10-[1,2]benzenoanthracene-9-carboxylate anion, benzoate anion, salicylate anion, 3-hydroxybenzoate anion, and 3-trifluoromethylbenzoate anion.

[0182]

[0183]

[0184]

[0185] [1-2-1-2. Sulfonate compound B Ｂ The photodegradable base (B1) is a sulfonate compound B represented by the following general formula (VIII-2): Ｂ ", a sulfonate anion and an onium cation or an onium dication (D ｐ＋ ) can be used as a salt.

[0186] "R Ｂｂ１ " is an optionally substituted C １－１８ A hydrocarbyl group, a 3- to 18-membered non-aromatic heterocyclic group, or a 5- to 18-membered aromatic heterocyclic group, in which any divalent carbon atom excluding the terminal carbon atom is -O-, -C(=O)-, -C(=O)O-, -OCO-, -CONH-, -NHCO-, -S-, or -SO ２ may be replaced by - (provided that adjacent divalent carbon atoms are not replaced at the same time).

[0187] R Ｂ ｂ１ As the C １－１８ In a hydrocarbyl group, any divalent carbon atom excluding the terminal carbon atom may be —O—, —C(═O)—, —C(═O)O—, —OCO—, —CONH—, —NHCO—, —S—, or —SO ２ - (provided that adjacent divalent carbon atoms are not simultaneously replaced), and １－１８ Alkyl group, C ３－１８ Alicyclic group, C ６－１８ an aryl group, or C ７－１８ An aralkyl group in which any divalent carbon atom excluding the terminal carbon atom is —O—, —C(═O)—, —C(═O)O—, —OCO—, —CONH—, —NHCO—, —S—, or —SO ２ It is more preferred that it may be substituted with - (provided that adjacent divalent carbon atoms are not substituted at the same time).

[0188] Sulfonate Compound B Ｂ１ Sulfonate compound B represented by the above general formula (VIII-2) Ｂ is a sulfonate compound B represented by the following general formula (VIII-2-1): Ｂ１ may be.

[0189] "X Ｂ " is an optionally substituted C １－１８ Alkyl group, C ３－１８ Alicyclic group, C ６－１８ an aryl group, or C ７－１８An aralkyl group in which any divalent carbon atom excluding the terminal carbon atom is —O—, —C(═O)—, —C(═O)O—, —OCO—, —CONH—, —NHCO—, —S—, or —SO ２ may be replaced by - (provided that adjacent divalent carbon atoms are not replaced at the same time).

[0190] X Ｂ As the C ３－１８ Alicyclic group, C ６－１８ an aryl group, or C ７－１８ An aralkyl group in which any divalent carbon atom excluding the terminal carbon atom is —O—, —C(═O)—, —C(═O)O—, —OCO—, —CONH—, —NHCO—, —S—, or —SO ２ - (provided that adjacent divalent carbon atoms are not simultaneously replaced), and ３－１８ an alicyclic group, or C ６－１８ In an aryl group, any divalent carbon atom excluding the terminal carbon atom may be —O—, —C(═O)—, —C(═O)O—, —OCO—, —CONH—, —NHCO—, —S—, or —SO ２ It is more preferred that it may be substituted with - (provided that adjacent divalent carbon atoms are not substituted at the same time).

[0191] "L Ｂ " is X Ｂ and -SO ２ -O － and a group linking L Ｂ -1) to (L Ｂ A linking group represented by the formula (I)-7) can be used. [In the formula, L Ｂ ｂ１ and L Ｂ ｂ２ represents a single bond or an optionally substituted C １－８ represents a hydrocarbylene group, and *1 represents X ＢThe connection part with *2 is -SO ２ -O － represents the connection between

[0192] L Ｂ ｂ１ and L Ｂ ｂ２ is a single bond or C which may have a substituent. １－８ Alkylene group or C ６－８ An arylene group is preferred, and C １－８ An alkylene group is more preferred.

[0193] <Examples of sulfonate anions> Sulfonate compound B Ｂ or B Ｂ１ The sulfonate anion is not particularly limited, and examples thereof include camphorsulfonate anion, (adamantan-1-yl)methanesulfonate anion, (adamantane-1-carbonyloxy)ethane-1-sulfonate anion, cyclohexanesulfonate anion, 2-(cyclohexanecarbonyloxy)ethane-1-sulfonate anion, bicyclo[2.2.1]heptane-2-sulfonate anion, benzenesulfonate anion, and 4-methylbenzenesulfonate anion.

[0194]

[0195] [1-2-1-3. Sulfonylamide salt compound B Ｃ The photodegradable base (B1) is a sulfonylamide salt compound B represented by the following general formula (VIII-3): Ｃ ", a sulfonyl amide anion and an onium cation or an onium dication (D ｐ＋ ) can be used as a salt.

[0196] "R Ｃ ｂ１ " is an optionally substituted C １－１８A hydrocarbyl group, a 3- to 18-membered non-aromatic heterocyclic group, or a 5- to 18-membered aromatic heterocyclic group, in which any divalent carbon atom excluding the terminal carbon atom is -O-, -C(=O)-, -C(=O)O-, -OCO-, -CONH-, -NHCO-, -S-, or -SO ２ - may be substituted (however, adjacent divalent carbon atoms are not substituted at the same time). Ｃ ｂ２ " is an optionally substituted C １－１８ In a hydrocarbyl group, any divalent carbon atom excluding the terminal carbon atom may be —O—, —C(═O)—, —C(═O)O—, —OCO—, —CONH—, —NHCO—, —S—, or —SO ２ may be replaced by - (provided that adjacent divalent carbon atoms are not replaced at the same time).

[0197] R Ｃ ｂ１ As the C １－１８ In a hydrocarbyl group, any divalent carbon atom excluding the terminal carbon atom may be —O—, —C(═O)—, —C(═O)O—, —OCO—, —CONH—, —NHCO—, —S—, or —SO ２ - (provided that adjacent divalent carbon atoms are not simultaneously replaced), and １－１８ Alkyl group, C ３－１８ Alicyclic group, C ６－１８ an aryl group, or C ７－１８ An aralkyl group in which any divalent carbon atom excluding the terminal carbon atom is —O—, —C(═O)—, —C(═O)O—, —OCO—, —CONH—, —NHCO—, —S—, or —SO ２ It is more preferred that it may be substituted with - (provided that adjacent divalent carbon atoms are not substituted at the same time).

[0198] R Ｃ ｂ２ As the C １－１８ Alkyl group, C ３－１８In an alicyclic group, any divalent carbon atom excluding the terminal carbon atom may be —O—, —C(═O)—, —C(═O)O—, —OCO—, —CONH—, —NHCO—, —S—, or —SO ２ - may be substituted (provided that adjacent divalent carbon atoms are not simultaneously substituted), and １－１２ More preferably, it is a haloalkyl group, and C １－５ A fluorinated alkyl group is more preferred.

[0199] <Sulfonylamide salt compound B Ｃ１ Sulfonylamide salt compound B represented by the above general formula (VIII-3) Ｃ is a sulfonylamide salt compound B represented by the following general formula (VIII-3-1): Ｃ１ may be.

[0200] "X Ｃ " is an optionally substituted C １－１８ Alkyl group, C ３－１８ Alicyclic group, C ６－１８ an aryl group, or C ７－１８ An aralkyl group in which any divalent carbon atom excluding the terminal carbon atom is —O—, —C(═O)—, —C(═O)O—, —OCO—, —CONH—, —NHCO—, —S—, or —SO ２ may be replaced by - (provided that adjacent divalent carbon atoms are not replaced at the same time).

[0201] X Ｃ As the C ３－１８ Alicyclic group, C ６－１８ an aryl group, or C ７－１８ An aralkyl group in which any divalent carbon atom excluding the terminal carbon atom is —O—, —C(═O)—, —C(═O)O—, —OCO—, —CONH—, —NHCO—, —S—, or —SO ２ - (provided that adjacent divalent carbon atoms are not simultaneously replaced), and ３－１８ an alicyclic group, or C ６－１８In an aryl group, any divalent carbon atom excluding the terminal carbon atom may be —O—, —C(═O)—, —C(═O)O—, —OCO—, —CONH—, —NHCO—, —S—, or —SO ２ It is more preferred that it may be substituted with - (provided that adjacent divalent carbon atoms are not substituted at the same time).

[0202] "L Ｃ " is X Ｃ and -N － -SO ２ -R Ｃ ｂ２ and a group linking L Ｃ -1) to (L Ｃ A linking group represented by the formula (I)-7) can be used. [In the formula, L Ｃ ｂ１ and L Ｃ ｂ２ represents a single bond or an optionally substituted C １－１２ represents a hydrocarbylene group, and *1 represents X Ｃ The connection part with *2 is -N － -SO ２ -R Ｃ ｂ２ represents the connection between

[0203] L Ｃ ｂ１ and L Ｃ ｂ２ is a single bond or C which may have a substituent. １－１２ Alkylene group, C １－１２ Cycloalkylene group or C ６－１２ An arylene group is preferred, and C １－８ Alkylene group or C １－８ A cycloalkylene group is more preferred.

[0204] <Examples of sulfonylamide anions> The above sulfonylamide salt compound B Ｃ or B Ｃ１The sulfonylamide anion is not particularly limited, and examples thereof include methyl((trifluoromethyl)sulfonyl)amide anion, i-propyl((trifluoromethyl)sulfonyl)amide anion, methacryloyloxy((trifluoromethyl)sulfonyl)amide anion, 2-(methacryloyloxy)ethyl((trifluoromethyl)sulfonyl)amide anion, cyclohexyl((trifluoromethyl)sulfonyl)amide anion, 2-((cyclopentanecarbonyl)oxy)ethyl((trifluoromethyl)sulfonyl)amide anion, 2-((cyclohexanecarbonyl)oxy)ethyl((trifluoromethyl)sulfonyl)amide anion, bicyclo[2.2.1 ]heptan-2-ylmethyl((trifluoromethyl)sulfonyl)amide anion, bicyclo[2.2.1]heptan-7-ylmethyl((trifluoromethyl)sulfonyl)amide anion, 2-((adamantane-1-carbonyl)oxy)ethyl((trifluoromethyl)sulfonyl)amide anion, 2-(adamantane-1-carboxamido)ethyl((trifluoromethyl)sulfonyl)amide anion, 2-(4-((adamantane-1-carbonyl)oxy)cyclohexyl)ethyl((trifluoromethyl)sulfonyl)amide anion, 4-((adamantane-1-carbonyl)oxy)phenyl((trifluoromethyl)sulfonyl)amide anion, and the like.

[0205]

[0206]

[0207]

[0208] [1-2-1-4. Onium cation or onium dication (D ｐ＋ The cation moiety of the photodegradable base (B1) is an onium cation or an onium dication (D ｐ＋ Here, "(D)" represented by general formulas (VIII-1) to (VIII-3) can be used. ｐ+ ) １／ｐ", D represents an onium cation or an onium dication, and p represents an integer of 1 or 2. The onium cation or onium dication is not particularly limited, and examples that can be used include organic sulfonium cations, organic sulfonium dications, organic iodonium cations, organic quaternary ammonium cations, organic quaternary ammonium dications, organic phosphonium cations, and organic phosphonium dications.

[0209] The onium cation or onium dication (D ｐ＋ As the sulfonium cation, for example, an organic sulfonium cation represented by the following general formula (IX-1) can be used.

[0210] In general formula (IX-1), R Ｄ １Ａ , R Ｄ １Ｂ and R Ｄ １Ｃ each independently represents a C １－１８ represents a hydrocarbyl group, a 3- to 18-membered non-aromatic heterocyclic group, or a 5- to 18-membered aromatic heterocyclic group, Ｄ １Ａ , R Ｄ １Ｂ and R Ｄ １Ｃ The divalent carbon atom at any position excluding the terminal may be -O-, -C(=O)-, -C(=O)O-, -OCO-, -CONH-, -NHCO-, -NH(C=O)O-, -S- or -SO ２ - may be substituted (provided that adjacent divalent carbon atoms are not substituted at the same time); R Ｄ １Ａ , R Ｄ １Ｂ and R Ｄ １Ｃ Any two of these are directly connected to each other by a single bond, or are divalent linking groups -O-, -S-, -C(=O)-, -S(=O)-, -S(=O) ２ -, -C(=O)O-, or C １－３ They may be linked via an alkylene group to form a ring together with the sulfur atom in formula (IX-1).

[0211] The onium cation or onium dication (D ｐ＋ As the sulfonium dication, for example, an organic sulfonium dication represented by the following general formula (IX-2) can be used.

[0212] In general formula (IX-2), R Ｄ ２Ａ , R Ｄ ２Ｂ , R Ｄ ２Ｃ and R Ｄ ２Ｄ each independently represents a C １－１８ represents a hydrocarbyl group, a 3- to 18-membered non-aromatic heterocyclic group, or a 5- to 18-membered aromatic heterocyclic group, Ｄ ２Ａ , R Ｄ ２Ｂ , R Ｄ ２Ｃ and R Ｄ ２Ｄ The divalent carbon atom at any position excluding the terminal may be -O-, -C(=O)-, -C(=O)O-, -OCO-, -CONH-, -NHCO-, -NH(C=O)O-, -S- or -SO ２ - may be substituted (provided that adjacent divalent carbon atoms are not substituted at the same time); K Ｄ ２Ａ , K. Ｄ ２Ｂ and L Ｄ each independently represents a C １－１８ represents a hydrocarbylene group, Ｄ ２Ａ , K. Ｄ ２Ｂ and L Ｄ The divalent carbon atom at any position in ２ - may be substituted (provided that adjacent divalent carbon atoms are not substituted at the same time); R Ｄ ２Ａ , R Ｄ ２Ｂ and K.Ｄ ２Ａ and / or R Ｄ ２Ｃ , R Ｄ ２Ｄ and K. Ｄ ２Ｂ Any two of these are directly connected to each other by a single bond, or are connected to each other by a divalent linking group -O-, -S-, -C(=O)-, -S(=O)-, -S(=O) ２ -, -C(=O)O-, or C １－３ They may be linked via an alkylene group to form a ring together with the sulfur atom in formula (IX-2).

[0213] The onium cation or onium dication (D ｐ＋ As the iodonium cation, for example, an organic iodonium cation represented by the following general formula (IX-3) can be used.

[0214] In general formula (IX-3), R Ｄ ３Ａ and R Ｄ ３Ｂ each independently represents a C １－１８ represents a hydrocarbyl group, a 3- to 18-membered non-aromatic heterocyclic group, or a 5- to 18-membered aromatic heterocyclic group, Ｄ ３Ａ and R Ｄ ３Ｂ The divalent carbon atom at any position excluding the terminal may be -O-, -C(=O)-, -C(=O)O-, -OCO-, -CONH-, -NHCO-, -NH(C=O)O-, -S- or -SO ２ - may be substituted (provided that adjacent divalent carbon atoms are not substituted at the same time); R Ｄ ３Ａ and R Ｄ ３Ｂ are directly connected to each other by a single bond, or are connected to each other by a divalent linking group -O-, -S-, -C(=O)-, -S(=O)-, -S(=O) ２ -, -C(=O)O-, or C １－３ They may be linked via an alkylene group to form a ring together with the iodine atom in formula (IX-3).

[0215] [1-2-2. (B2) Nitrogen-Containing Organic Compound] As the other (B) acid diffusion controller, (B2) may be contained a nitrogen-containing organic compound that does not fall under (B1). The nitrogen-containing organic compound is not particularly limited, and examples thereof include aliphatic amines, aromatic amines, and heterocyclic amines.

[0216] Examples of nitrogen-containing organic compounds include aliphatic amines such as n-hexylamine, n-heptylamine, diethylamine, di-n-propylamine, di-n-butylamine, triethylamine, tri-n-propylamine, tri-n-butylamine, tri-n-pentylamine, and tri-n-octylamine; aromatic amines such as aniline, N-methylaniline, N-ethylamine, N,N-dimethylaniline, 4-methylaniline, and pyrrole; and heterocyclic amines such as pyridine, imidazole, benzimidazole, piperidine, piperazine, 1,5-diazabicyclo[4.3.0]-5-nonene, 1,8-diazabicyclo[5.4.0]-7-undecene, hexamethylenetetramine, and 1,4-diazabicyclo[2.2.2]octane. These nitrogen-containing organic compounds may be used alone or in combination of two or more.

[0217] [1-2-3. Amount] There are no particular limitations on the amount of acid diffusion controller (B) contained in the resist material according to this embodiment, and this can be selected appropriately depending on the amount and type of component (A). The amount of component (B) in the resist material is preferably 0.1 to 30 parts by mass, more preferably 0.2 to 25 parts by mass, and even more preferably 0.5 to 20 parts by mass, per 100 parts by mass of component (A).

[0218] [1-3. Organic Solvent] The resist material according to this embodiment may further contain an organic solvent. The organic solvent is not particularly limited, and any known or commonly used organic solvent can be used. The organic solvent is preferably an organic solvent that can uniformly dissolve or disperse (A) the heteropolyacid salt having modified defect sites or a mixture thereof when prepared.

[0219] Examples of the organic solvent include polar solvents such as alcohol solvents, ether solvents, ketone solvents, amide solvents, ester solvents, nitrile solvents, and aprotic polar solvents, and nonpolar solvents such as hydrocarbon solvents. These organic solvents may be used alone or in combination of two or more.

[0220] Specific examples of the polar solvent include: alcohol-based solvents such as methanol, ethanol, isopropyl alcohol (IPA), diacetone alcohol (DAA), 3-methoxybutanol, 3-methyl-3-methoxybutanol, 1-methoxy-2-propanol, 4-methyl-2-pentanol, ethylene glycol, diethylene glycol, propylene glycol, dipropylene glycol, and propylene glycol monomethyl ether (PGME); ether-based solvents such as diethyl ether, dipropyl ether, dibutyl ether, diisoamyl ether, tetrahydrofuran, anisole, propylene glycol monoethyl ether, ethylene glycol monomethyl ether, and ethylene glycol monoethyl ether; ketone-based solvents such as acetone, methyl ethyl ketone, cyclopentanone, cyclohexanone, methyl-n-pentyl ketone, methyl isopentyl ketone, 2-heptanone, acetophenone, propylene carbonate, and furfural; Amide-based solvents such as N,N-dimethylformamide, N,N-diethylformamide, acetamide, N-methylpyrrolidone, 1-ethyl-2-pyrrolidone, and 1-butyl-2-pyrrolidone; ester-based solvents such as methyl lactate, ethyl lactate (EL), methyl acetate, ethyl acetate, methyl pyruvate, ethyl pyruvate, methyl methoxypropionate, and propylene glycol monomethyl ether acetate (PGMEA); nitrile-based solvents such as acetonitrile, propionitrile, and benzonitrile; aprotic polar solvents such as γ-butyrolactone, δ-valerolactone, γ-lactam, δ-lactam, dimethyl sulfoxide (DMSO), sulfolane, 1,3-dimethyl-2-imidazolidinone, and tetramethylurea; and nonpolar solvents such as hydrocarbon solvents such as n-pentane, n-hexane, toluene, and xylene. The above organic solvents may be used alone or in combination of two or more.

[0221] The organic solvent contained in the resist material according to this embodiment is preferably a polar solvent in terms of coatability, and more preferably an amide solvent, an ester solvent, an alcohol solvent, or a ketone solvent in terms of solubility. The amide solvent is preferably at least one selected from the group consisting of N,N-dimethylformamide, N,N-diethylformamide, acetamide, and N-methylpyrrolidone. Furthermore, the ester solvent or alcohol solvent preferably has an ester bond and / or a hydroxyl group in terms of solubility, and among the above, at least one selected from the group consisting of propylene glycol monomethyl ether, methyl lactate, ethyl lactate, methyl acetate, ethyl acetate, methyl pyruvate, ethyl pyruvate, and propylene glycol monomethyl ether acetate is preferred.

[0222] The amount of organic solvent in the resist material is not particularly limited and can be set appropriately depending on the method for applying the resist material to a substrate, the thickness of the applied film, etc. The amount of organic solvent in the resist material is preferably such that the solids concentration of the resist material is 0.01 to 20 mass%, more preferably 0.1 to 15 mass%, and even more preferably 0.2 to 10 mass%.

[0223] [1-4. Others] The resist material according to this embodiment may further contain, as desired, miscible additives, such as additional resins for improving the performance of the resist film, dissolution inhibitors, plasticizers, stabilizers, colorants, antihalation agents, dyes, etc. Preferably, the resist material according to this embodiment does not contain an epoxy resin. It is also preferable that the resist material does not contain hydrogen peroxide.

[0224] [2. Pattern Forming Method] The pattern forming method according to this embodiment includes the steps of applying a resist material to a substrate, exposing the resist film formed by the application step, and developing the exposed resist film.

[0225] [2-1. Coating Step] The pattern forming method according to this embodiment includes a step of coating a substrate with a resist material.

[0226] <Substrate> The substrate used in this embodiment is not particularly limited, and known and commonly used substrates can be used. For example, a substrate for electronic components or a substrate on which a predetermined wiring pattern is formed may be used. The material of the substrate is not particularly limited, and examples thereof include silicon wafers, metal substrates such as copper, chromium, iron, and aluminum, and inorganic substrates such as glass, titanium oxide, and silicon dioxide. The size, shape, and the like of the substrate are not particularly limited, and the surface of the substrate may be smooth, curved, or uneven, or may be a flake-shaped substrate.

[0227] The surface of the substrate may be subjected to a surface treatment as necessary. In the case of a substrate having hydroxyl groups on its surface layer, the surface of the substrate is treated with a silane coupling agent capable of reacting with the hydroxyl groups, thereby changing the surface layer of the substrate from hydrophilic to hydrophobic, thereby improving the adhesion between the substrate and the metal compound-containing film. Examples of the silane coupling agent include hexamethyldisilazane (HMDS).

[0228] <Coating Method> The method for applying the resist material onto the substrate is not particularly limited, and any known or commonly used method can be used. Examples of dry coating methods include CVD (chemical vapor deposition) methods such as thermal CVD, plasma CVD, and photo-CVD; and PVD (physical vapor deposition) methods such as vacuum deposition, plasma-assisted deposition, sputtering, and ion plating. Examples of wet coating methods include spin coating, bar coating, roll coating, flow coating, dip coating, spray coating, inkjet printing, and screen printing.

[0229] As a method for applying the resist material according to this embodiment to a substrate, a wet method such as spin coating or screen printing is preferably used, and spin coating is more preferable, from the viewpoint of forming a uniform film thickness, etc. After forming the coating film, a backside rinse, an edge bead removal step, etc. may be performed to remove the edge bead.

[0230] The method for drying the resist film formed by applying a resist material to a substrate is not particularly limited, and can be performed using, for example, a heating device such as a hot plate (post-applied bake (PAB)), a pressure reducing device, or the like. The baking conditions are not particularly limited, and can be set appropriately depending on the type of resist film, application, etc. The baking temperature is preferably 80 to 300°C, more preferably 80 to 200°C, and even more preferably 80 to 130°C. The baking time is preferably 10 to 300 seconds, more preferably 20 to 180 seconds, and even more preferably 30 to 120 seconds.

[0231] The thickness of the resist film after drying is not particularly limited, but is preferably 0.5 to 100 nm, more preferably 1 to 75 nm, and even more preferably 1 to 60 nm.

[0232] [2-2. Exposure Step] The pattern formation method according to this embodiment includes a step of exposing the resist film formed in the above-described coating step.

[0233] As an exposure apparatus in the exposure step of the resist film, for example, an ArF exposure apparatus, an electron beam lithography apparatus, an EUV exposure apparatus, etc. Furthermore, in the exposure step, exposure may be performed through a mask (mask pattern) on which a predetermined pattern is formed, or selective exposure may be performed by lithography using direct irradiation with an electron beam without using a mask pattern.

[0234] The wavelength used for exposure is not particularly limited, and examples thereof include ArF excimer laser (wavelength 193 nm), KrF excimer laser (248 nm), F ２ Radiation such as excimer laser (wavelength 157 nm), EUV (extreme ultraviolet), VUV (vacuum ultraviolet), EB (electron beam), X-ray, or soft X-ray may also be used.

[0235] The exposure dose on the resist film is 1 to 200 mJ / cm in the case of an ArF excimer laser or a KrF excimer laser. ２ is preferably 20 to 60 mJ / cm ２In the case of extreme ultraviolet rays, the exposure dose is, for example, 500 mJ / cm ２ or less, and 0.1 to 200 mJ / cm ２ is preferably 3 to 100 mJ / cm ２ More preferably, it is 5 to 50 mJ / cm ２ In the case of an electron beam, it is more preferable that the concentration is 3 μC / cm at 50 kV. ２ ~2mC / cm ２ It is preferable to expose with a dose of 10 μC / cm ２ ~1.5mC / cm ２ It is more preferable to expose at a dose of 1000 ppm.

[0236] After the resist film is exposed to light, it may or may not be baked (post-exposure bake (PEB)). The baking conditions are not particularly limited and can be set appropriately depending on the type of resist film, its intended use, etc. The baking temperature is preferably 80 to 300°C, more preferably 80 to 200°C, and even more preferably 80 to 130°C, using a heating device such as a hot plate. The baking time is preferably 10 to 300 seconds, more preferably 20 to 180 seconds, and even more preferably 30 to 120 seconds.

[0237] [2-3. Development Step] The pattern formation method according to this embodiment includes a step of developing the exposed resist film. In the development step, a pattern can be formed by developing the exposed resist film with a developer. A negative pattern formation process is one in which the exposed region remains as a pattern after development, while a positive pattern formation process is one in which the exposed region is removed after development. Whether a positive or negative pattern is formed can be appropriately selected depending on the resist material or the developer. After the development, the resist film may be washed with a rinse solution and then dried, and in some cases, a baking treatment may be further performed.

[0238] The developer used in this embodiment may be an alkaline developer for an alkaline development process, or a developer containing an organic solvent (organic developer) for an organic solvent development process.

[0239] <Alkaline Development Process> The alkaline developer used in the alkaline development process is not particularly limited, and any known or commonly used one can be used. Examples of the alkaline developer include aqueous solutions containing one or more of quaternary ammonium salts such as tetramethylammonium hydroxide and (2-hydroxyethyl)trimethylammonium hydroxide, inorganic alkalis such as sodium hydroxide and potassium hydroxide, and alkanolamines such as dimethylethanolamine and triethanolamine.

[0240] Furthermore, pure water can be used as a rinse liquid in the alkaline development process.

[0241] <Organic Solvent Development Process> Examples of developers used in the organic solvent development process include developers containing one or more organic solvents such as polar solvents, such as ketone-based solvents, ester-based solvents, alcohol-based solvents, nitrile-based solvents, amide-based solvents, and ether-based solvents, and hydrocarbon-based solvents.

[0242] Specific examples of organic solvents include: ketone-based solvents such as acetone, methyl ethyl ketone, cyclopentanone, cyclohexanone, methyl-n-pentyl ketone, methyl isopentyl ketone, 2-heptanone, acetophenone, propylene carbonate, and furfural; ester-based solvents such as methyl lactate, ethyl lactate (EL), methyl acetate, ethyl acetate, methyl pyruvate, ethyl pyruvate, methyl methoxypropionate, and propylene glycol monomethyl ether acetate (PGMEA); alcohol-based solvents such as methanol, ethanol, isopropyl alcohol (IPA), diacetone alcohol (DAA), 3-methoxybutanol, 3-methyl-3-methoxybutanol, 1-methoxy-2-propanol, 4-methyl-2-pentanol, ethylene glycol, diethylene glycol, propylene glycol, dipropylene glycol, and propylene glycol monomethyl ether (PGME); and nitrile-based solvents such as acetonitrile, propionitrile, and benzonitrile. Examples of the solvent include amide-based solvents such as N,N-dimethylformamide, N,N-diethylformamide, acetamide, N-methylpyrrolidone, 1-ethyl-2-pyrrolidone, and 1-butyl-2-pyrrolidone; ether-based solvents such as diethyl ether, dipropyl ether, dibutyl ether, diisoamyl ether, tetrahydrofuran, anisole, propylene glycol monoethyl ether, ethylene glycol monomethyl ether, and ethylene glycol monoethyl ether; and hydrocarbon-based solvents such as n-pentane, n-hexane, toluene, and xylene. These may be used alone or in combination of two or more.

[0243] Among these, the organic solvent used in the developer is preferably a polar solvent, and preferably contains an amide solvent, an alcohol solvent, or an ester solvent, and more preferably contains an amide solvent or an ester solvent and an alcohol solvent. The amide solvent is preferably at least one selected from the group consisting of N,N-dimethylformamide, N,N-diethylformamide, acetamide, and N-methylpyrrolidone. The ester solvent is preferably at least one selected from the group consisting of methyl lactate, ethyl lactate (EL), methyl acetate, ethyl acetate, methyl pyruvate, ethyl pyruvate, methyl methoxypropionate, and propylene glycol monomethyl ether acetate. The alcohol solvent is preferably at least one selected from the group consisting of ethanol, isopropyl alcohol (IPA), diacetone alcohol (DAA), 3-methoxybutanol, 3-methyl-3-methoxybutanol, 1-methoxy-2-propanol, 4-methyl-2-pentanol, benzyl alcohol, and 4-methylbenzyl alcohol.

[0244] When the developer contains both an amide solvent or an ester solvent and an alcohol solvent, the blending ratio (weight ratio) of the amide solvent or the ester solvent to the alcohol solvent is preferably 5:95 to 95:5, and more preferably 10:90 to 90:10.

[0245] The method for developing the exposed resist film using the developer is not particularly limited, and any known or commonly used method can be used. Examples of the method for developing using the developer include a method of immersing a substrate having an exposed resist film in the developer for a certain period of time (dip method), a method of spraying the developer onto the surface of the exposed resist film (spray method), and a method of discharging the developer at a constant speed from a discharge nozzle toward the surface of the exposed resist film on a substrate rotating at a constant speed (dynamic dispense method).

[0246] After development with the developer, a step of washing with a rinse liquid may be included. The rinse liquid is not particularly limited, and any known or commonly used liquid may be used. As the rinse liquid, water or an organic solvent contained in the developer that does not easily dissolve the resist pattern may be appropriately selected and used.

[0247] The rinse liquid is not particularly limited, and may be, for example, at least one organic solvent selected from the group consisting of hydrocarbon solvents, ketone solvents, ester solvents, alcohol solvents, amide solvents, and ether solvents. Among these, it is preferable to use at least one organic solvent selected from the group consisting of hydrocarbon solvents, ketone solvents, ester solvents, alcohol solvents, and amide solvents as the rinse liquid, it is more preferable to use at least one solvent selected from the group consisting of alcohol solvents and ester solvents, and it is even more preferable to use at least one alcohol solvent.

[0248] The alcohol-based solvent used in the rinse solution is preferably a monohydric alcohol having 2 to 8 carbon atoms, and the monohydric alcohol may be linear, branched, or cyclic. Specific examples of the monohydric alcohol include ethanol, isopropyl alcohol (IPA), butanol, 1-hexanol, 1-heptanol, 1-octanol, 2-hexanol, 2-heptanol, 2-octanol, 3-hexanol, 3-heptanol, 3-octanol, 4-octanol, and benzyl alcohol. These organic solvents may be used alone or in combination of two or more.

[0249] The method for cleaning the resist pattern with the rinse liquid is not particularly limited, and any known or commonly used method can be used. Examples of the cleaning method using the rinse liquid include a method of immersing the resist pattern in the rinse liquid for a certain period of time (dip method), a method of spraying the rinse liquid onto the surface of the resist pattern (spray method), and a method of discharging the rinse liquid at a constant speed from a discharge nozzle toward the surface of the resist pattern that is rotating at a constant speed (dynamic dispense method).

[0250] 3. Patterned Structure The patterned structure according to this embodiment can be obtained by forming a pattern of the resist material on a substrate using the pattern formation method described above.

[0251] The average thickness of part or all of the patterned structure according to this embodiment is not particularly limited and can be set appropriately depending on the intended use, etc. The patterned structure preferably has portions with an average thickness of 1 to 100 nm, more preferably 5 to 75 nm, and even more preferably 10 to 60 nm.

[0252] The pitch of part or all of the patterned structure according to this embodiment is not particularly limited and can be set appropriately depending on the purpose of use, etc. In the patterned structure, it is preferable to have a part with a pitch of 100 nm or less, more preferably a part with a pitch of 50 nm or less, and even more preferably a part with a pitch of 20 nm or less. By patterning the resist material according to this embodiment using the above-mentioned pattern formation method, it is possible to create parts with pitches of 50 nm, 20 nm, or 15 nm in part or all of the patterned structure.

[0253] [4. Resist Material for Electron Beam or EUV] The resist material according to this embodiment contains a heteropolyacid salt or a mixture thereof in which vacant sites have been modified. The vacant site-modified heteropolyacid salt or the mixture thereof has a heteropolyacid anion in which the vacant sites have been modified introduced into the anion moiety. This allows the vacant site-modified heteropolyacid salt or the mixture thereof to have good sensitivity to light sources such as electron beams and EUV, making it suitable for use as a resist material compatible with these exposure light sources.

[0254] Furthermore, by introducing a polar group having an acid-dissociable group into the anion moiety of the heteropolyacid salt or a mixture thereof whose deficiency sites have been modified, it is possible to impart the salt with the function of changing its solubility in a developer by the action of an acid, etc. For this reason, a resist material containing the heteropolyacid salt or a mixture thereof whose deficiency sites have been modified can be suitably used as a resist material for electron beams or EUV radiation.

[0255] Furthermore, by introducing a sulfonium cation, a sulfonium dication, or an iodonium cation into the cation moiety of the heteropolyacid salt or a mixture thereof having modified deficiencies, it is possible to impart the ability to generate acid upon exposure to electron beams and EUV. Thus, a resist material containing the heteropolyacid salt or a mixture thereof having modified deficiencies can be suitably used as a resist material for electron beams or EUV.

[0256] EXAMPLES The present invention will be specifically explained below by showing examples, but the present invention is not limited to these examples.

[0257] [1. Synthesis of heteropolyacid salts (polyacid salts) with modified defect sites] Polyacid salts (A-1) to (A-20) were each synthesized by the following method.

[0258] <Production Example 1: Potassium undecatungstosilicate (α-K ８ [SiW １１ O ３９ ])>Tungstosilicic acid hydrate (manufactured by Nippon Inorganic Chemical Industry Co., Ltd.: H ４ [SiW １２ O ４０ ]・xH ２ To 63 g of 1M acetic acid (C10), 380 g was added, and the reaction solution was heated to 45 ° C. Potassium bicarbonate (52 g) was added so that the pH was 6.0. The reaction solution was then cooled to room temperature and filtered off by suction, yielding 56 g of a crude product. 216 g of purified water was added to the resulting crude product, which was then redissolved by heating to 73 ° C. The solution was cooled at 4 ° C. for 16 hours to recrystallize, which was then filtered off by suction and dried in vacuo to yield 34 g of the target compound. ２９ Si-NMR (119.22MHz, D２ O): δ (ppm) = -84.6 (s, 1Si). １８３ W-NMR (20.84MHz, D ２ O): δ (ppm) = -101.85 (s, 2W), -116.26 (s, 2W), -119.29 (s, 1W), -125.62 (s, 2W), -140.85 (s, 2W), -174.53 (s, 2W).

[0259] <Synthesis Example 1: Tetrakis(bis(2-trifluoromethylphenyl)phenylsulfonium)(1,3-di(4-methoxymethoxyphenyl)disiloxane-1,1,3,3-tetrayl)undecatungstosilicate (Polyacid Salt (A-1))> 2.8 g (10.9 mmol) of 4-methoxymethoxyphenyltrimethoxysilane was added to a mixed solvent of 402 g of acetonitrile and 184 g of pure water to form the mono-defective Keggin-type potassium undecatungstosilicate (α-K ８ [SiW １１ O ３９ ]) was added. The pH was adjusted to 1.8 using 1 M hydrochloric acid. After stirring for 2 hours, the unreacted powder was filtered off by suction, and the filtrate was concentrated to approximately 200 g using a rotary evaporator. A solution of 9.9 g (18.2 mmol) of bis(2-trifluoromethylphenyl)phenylsulfonium chloride dissolved in 40 g of pure water was added to this concentrated solution to precipitate a powder. The precipitated powder was filtered off by suction and washed three times each with 180 mL of pure water, 180 mL of methanol, and 180 mL of methyl t-butyl ether. The obtained powder was then dispersed and washed with 160 g of methanol for 3 hours, filtered off by suction again, and washed three times with 160 g of methanol. Further thorough vacuum drying afforded 15.8 g of the target compound, polyacid salt (A-1), as a white powder. １ H-NMR (400MHz, DMSO-d6): δ (ppm) = 3.37 (s, 6H), 5.22 (s, 4H), 7.05 (d, 4H), 7.65-8.35 (m, 56H). ２９Si-NMR (119.22 MHz, DMSO-d6): δ (ppm) = -64.72 (s, 2Si), -85.02 (s, 1Si). ESI-MS: POSITIVE m / z 399.1 ([C ２０ H １３ F ６ S] ＋ ) NEGATIVE m / z 755.1 (median) ([C １６ H １８ O ４４ Si ３ W １１ ] ４－ )

[0260] <Synthesis Example 2: Tetrakis(bis(2-trifluoromethylphenyl)phenylsulfonium)(1,3-di(2-((1-methylcyclopentyl)oxycarbonyl)ethyl)disiloxane-1,1,3,3-tetrayl)undecatungstosilicate (Polyacid Salt (A-2))> The target compound, polyacid salt (A-2), was obtained in the same manner as in Synthesis Example 1, except that 2-((1-methylcyclopentyl)oxycarbonyl)ethyltrimethoxysilane was used instead of 4-methoxymethoxyphenyltrimethoxysilane as the raw material compound. １ H-NMR (400MHz, DMSO-d6): δ (ppm) = 0.77-0.81 (m, 4H), 1.49-1.84 (m, 22H), 2.37-2.42 (m, 4H), 7.65-8.35 (m, 52H), ２９ Si-NMR (119.22MHz, DMSO-d6): δ (ppm) = -53.12 (s, 2Si), -85.01 (s, 1Si). ESI-MS: POSITIVE m / z 399.1 ([C ２０ H １３ F ６ S] ＋ ) NEGATIVE m / z 764.4 (median) ([C １８ H ３０ O ４４ Si ３ W １１ ] ４－ )

[0261] <Production Example 2: 3-(2-(1-methylcyclopentyloxycarbonyl)ethylthio)propyltrimethoxysilane> 20 mL of methyl ethyl ketone was added to 7.7 g of 1-methylcyclopentyl acrylate and 9.8 g of 3-mercaptopropyltrimethoxysilane, and 0.3 g of 1,1'-azobis(cyclohexane-1-carbonitrile) was added and stirred uniformly. Next, nitrogen was blown in for 30 minutes, and nitrogen bubbling was performed. Thereafter, the reaction solution was heated from room temperature to 90°C over 30 minutes in nitrogen. It was maintained at 90°C for 7 hours. The reaction solution was then distilled off methyl ethyl ketone using a rotary evaporator. Further thorough vacuum drying yielded 16.6 g of the target compound as a colorless liquid. １ H-NMR (400MHz, DMSO-d6): δ (ppm) = 0.56 (t, 2H), 1.39 (s, 3H), 1.56-1.81 (m, 10H), 2.42 (t, 2H), 2.58 (t, 2H), 2.83 (t, 2H), 3.55 (s, 9H).

[0262] <Synthesis Example 3: Tetrakis(bis(2-trifluoromethylphenyl)phenylsulfonium)(1,3-di(3-(2-(1-methylcyclopentyloxycarbonyl)ethylthio)propyl)disiloxane-1,1,3,3-tetrayl)undecatungstosilicate (Polyacid Salt (A-3))> The target compound, polyacid salt (A-3), was obtained in the same manner as above, except that in Synthesis Example 1, 3-(2-(1-methylcyclopentyloxycarbonyl)ethylthio)propyltrimethoxysilane was used as the raw material compound instead of 4-methoxymethoxyphenyltrimethoxysilane. １ H-NMR (400MHz, DMSO-d6): δ (ppm) = 0.67 (t, 4H), 1.49 (s, 6H), 1.54-1.71 (m, 16H) , 1.99-2.08 (m, 4H), 2.49 (t, 4H), 2.58 (t, 4H), 2.67 (t, 4H), 7.65-8.35 (m, 52H), ２９Si-NMR (119.22 MHz, DMSO-d6): δ (ppm) = -53.02 (s, 2Si), -85.04 (s, 1Si). ESI-MS: POSITIVE m / z 399.1 ([C ２０ H １３ F ６ S] ＋ ) NEGATIVE m / z 801.1 (median) ([C ２４ H ４２ O ４４ S ２ Si ３ W １１ ] ４－ )

[0263] <Synthesis Example 4: Tetrakis((4-(2-((1-ethylcyclopentyl)oxy)-2-oxoethoxy)-3,5-dimethylphenyl)diphenylsulfonium)(1,3-di(4-methoxymethoxyphenyl)disiloxane-1,1,3,3-tetrayl)undecatungstosilicate (Polyacid Salt (A-4))> The target compound, polyacid salt (A-4), was obtained in the same manner as above, except that in Synthesis Example 1, (4-(2-((1-ethylcyclopentyl)oxy)-2-oxoethoxy)-3,5-dimethylphenyl)diphenylsulfonium bromide was used instead of bis(2-trifluoromethylphenyl)phenylsulfonium chloride as the raw material compound. １ H-NMR (400MHz, DMSO-d6): δ (ppm) = 0.77-0.81 (t, 12H), 1.48-1.75 (m, 24H), 1.90-1.93 (m, 16H), 2.29 (m, 24H), 3.37 (s, 6H), 4.55 (s, 8H), 5.22 (s, 4H), 7.05 (d, 4H), 7.59 (s, 8H), 7.66 (d, 4H), 7.75-7.82 (m, 40H). ２９ Si-NMR (119.22 MHz, DMSO-d6): δ (ppm) = -64.72 (s, 2Si), -85.02 (s, 1Si). ESI-MS: POSITIVE m / z 461.2 ([C ２９ H ３３ O ３ S] ＋) NEGATIVE m / z 755.1 (median) ([C １６ H １８ O ４４ Si ３ W １１ ] ４－ )

[0264] <Synthesis Example 5: Tetrakis((4-(2-((1-ethylcyclopentyl)oxy)-2-oxoethoxy)-3,5-dimethylphenyl)diphenylsulfonium)(1,3-di(2-((1-methylcyclopentyl)oxycarbonyl)ethyl)disiloxane-1,1,3,3-tetrayl)undecatungstosilicate (Polyacid Salt (A-5))> The target compound, polyacid salt (A-5), was obtained in the same manner as above, except that in Synthesis Example 1, (4-(2-((1-ethylcyclopentyl)oxy)-2-oxoethoxy)-3,5-dimethylphenyl)diphenylsulfonium bromide was used instead of bis(2-trifluoromethylphenyl)phenylsulfonium chloride and 2-((1-methylcyclopentyl)oxycarbonyl)ethyltrimethoxysilane was used instead of 4-methoxymethoxyphenyltrimethoxysilane as raw materials. １ H-NMR (400MHz, DMSO-d6): δ (ppm) = 0.77-0.81 (m, 16H), 1.48-1.93 (m, 62H), 2. 29 (m, 24H), 2.37-2.42 (m, 4H), 4.55 (s, 8H), 7.59 (s, 8H), 7.76-7.82 (m, 40H). ２９ Si-NMR (119.22MHz, DMSO-d6): δ (ppm) = -53.12 (s, 2Si), -85.01 (s, 1Si). ESI-MS: POSITIVE m / z 461.2 ([C ２９ H ３３ O ３ S] ＋ ) NEGATIVE m / z 764.4 (median) ([C １８ H ３０ O ４４ Si ３ W １１ ] ４－ )

[0265] <Synthesis Example 6: Tetrakis((4-(2-((1-ethylcyclopentyl)oxy)-2-oxoethoxy)-3,5-dimethylphenyl)diphenylsulfonium)(1,3-di(2-((2-methyl-2-adamantyl)oxycarbonyl)ethyl)disiloxane-1,1,3,3-tetrayl)undecatungstosilicate (Polyacid Salt (A-6))> The target compound, polyacid salt (A-6), was obtained in the same manner as above, except that in Synthesis Example 1, (4-(2-((1-ethylcyclopentyl)oxy)-2-oxoethoxy)-3,5-dimethylphenyl)diphenylsulfonium bromide was used instead of bis(2-trifluoromethylphenyl)phenylsulfonium chloride and 2-((2-methyl-2-adamantyl)oxycarbonyl)ethyltrimethoxysilane was used instead of 4-methoxymethoxyphenyltrimethoxysilane as raw materials. １ H-NMR (400MHz, DMSO-d6): δ (ppm) = 0.76-0.81 (t, 16H), 1.45-2.00 (m, 74H), 2. 29 (m, 24H), 2.38-2.44 (m, 4H), 4.55 (s, 8H), 7.59 (s, 8H), 7.76-7.82 (m, 40H). ２９ Si-NMR (119.22 MHz, DMSO-d6): δ (ppm) = -53.07 (s, 2Si), -85.03 (s, 1Si). ESI-MS: POSITIVE m / z 461.2 ([C ２９ H ３３ O ３ S] ＋ ) NEGATIVE m / z 797.1 (median) ([C ２８ H ４２ O ４４ Si ３ W １１ ] ４－ )

[0266] <Synthesis Example 7: Tetrakis(benzyltriethylammonium)(1,3-di(3-(2-(1-methylcyclopentyloxycarbonyl)ethylthio)propyl)disiloxane-1,1,3,3-tetrayl)undecatungstosilicate (Polyacid Salt (A-7))> The target compound, polyacid salt (A-7), was obtained in the same manner as above, except that in Synthesis Example 1, benzyltriethylammonium chloride was used instead of bis(2-trifluoromethylphenyl)phenylsulfonium chloride and 3-(2-(1-methylcyclopentyloxycarbonyl)ethylthio)propyltrimethoxysilane was used instead of 4-methoxymethoxyphenyltrimethoxysilane as raw materials. １ H-NMR (400MHz, DMSO-d6): δ (ppm) = 0.67 (t, 4H), 1.34 (t, 36H), 1.49 (s, 6H), 1.54-1.71 (m, 16H), 1. 99-2.08 (m, 4H), 2.49 (t, 4H), 2.58 (t, 4H), 2.67 (t, 4H), 3.20 (q, 24H), 4.49 (s, 8H), 7.52 (m, 20H). ２９ Si-NMR (119.22 MHz, DMSO-d6): δ (ppm) = -53.02 (s, 2Si), -85.04 (s, 1Si). ESI-MS: POSITIVE m / z 192.2 ([C １３ H ２２ N] ＋ ) NEGATIVE m / z 801.1 (median) ([C ２４ H ４２ O ４４ S ２ Si ３ W １１ ] ４－ )

[0267] <Synthesis Example 8: Tetrakis(benzyltrimethylammonium)(1,3-di(2-((1-methylcyclopentyl)oxycarbonyl)ethyl)disiloxane-1,1,3,3-tetrayl)undecatungstosilicate (Polyacid Salt (A-8))> The target compound, polyacid salt (A-8), was obtained in the same manner as above, except that in Synthesis Example 1, benzyltrimethylammonium chloride was used instead of bis(2-trifluoromethylphenyl)phenylsulfonium chloride and 2-((1-methylcyclopentyl)oxycarbonyl)ethyltrimethoxysilane was used instead of 4-methoxymethoxyphenyltrimethoxysilane as raw materials. １H-NMR (400MHz, DMSO-d6): δ (ppm) = 0.77-0.81 (m, 4H), 1.49-1.84 (m, 22 H), 2.37-2.42 (m, 4H), 3.04 (s, 36H), 4.53 (s, 8H), 7.50-7.57 (m, 20H). ２９ Si-NMR (119.22MHz, DMSO-d6): δ (ppm) = -53.12 (s, 2Si), -85.01 (s, 1Si). ESI-MS: POSITIVE m / z 150.1 ([C １０ H １６ N] ＋ ) NEGATIVE m / z 764.4 (median) ([C １８ H ３０ O ４４ Si ３ W １１ ] ４－ )

[0268] <Synthesis Example 9: Tetrakis(hexyltriethylammonium)(1,3-di(4-methoxymethoxyphenyl)disiloxane-1,1,3,3-tetrayl)undecatungstosilicate (Polyacid Salt (A-9))> The target compound, polyacid salt (A-9), was obtained in the same manner as above, except that hexyltriethylammonium chloride was used as a raw material compound instead of bis(2-trifluoromethylphenyl)phenylsulfonium chloride in Synthesis Example 1. １ H-NMR (400MHz, DMSO-d6): δ (ppm) = 0.88 (t, 12H), 1.17-1.21 (m, 36H), 1.31 (br, 24H), 1.58 (b r, 8H), 3.10-3.14 (m, 8H), 3.26 (q, 24H), 3.37 (s, 6H), 5.22 (s, 4H), 7.05 (d, 4H), 7.66 (d, 4H). ２９ Si-NMR (119.22 MHz, DMSO-d6): δ (ppm) = -64.72 (s, 2Si), -85.02 (s, 1Si). ESI-MS: POSITIVE m / z 186.2 ([C １２ H ２８ N] ＋ ) NEGATIVE m / z 755.1 (median) ([C １６ H１８ O ４４ Si ３ W １１ ] ４－ )

[0269] <Synthesis Example 10: Tetrakis((2-trifluoromethylbenzyl)triallylammonium)(1,3-diphenyldisiloxane-1,1,3,3-tetrayl)undecatungstosilicate (Polyacid Salt (A-10))> The target compound, polyacid salt (A-10), was obtained in the same manner as above, except that in Synthesis Example 1, (2-trifluoromethylbenzyl)triallylammonium bromide was used instead of bis(2-trifluoromethylphenyl)phenylsulfonium chloride and phenyltrimethoxysilane was used instead of 4-methoxymethoxyphenyltrimethoxysilane as raw material compounds. １ H-NMR (400MHz, DMSO-d6): δ (ppm) = 4.04 (d, 24H), 4.73 (s, 8H), 5.65 (d, 12H), 5.73 (d, 12H), 6.02-6.12 (m, 12H), 7.38-7.45 (m, 6H), 7.74-7.88 (m, 16H), 7.94 (d, 4H). ２９ Si-NMR (119.22MHz, DMSO-d6): δ (ppm) = -65.54 (s, 2Si), -84.97 (s, 1Si). ESI-MS: POSITIVE m / z 296.2 ([C １７ H ２１ F ３ N] ＋ ) NEGATIVE m / z 725.1 (median) ([C １２ H １０ O ４０ Si ３ W １１ ] ４－ )

[0270] <Synthesis Example 11: Tetrakis(cyanomethyltriphenylphosphonium)(1,3-di(4-methoxymethoxyphenyl)disiloxane-1,1,3,3-tetrayl)undecatungstosilicate (Polyacid Salt (A-11))> The target compound, polyacid salt (A-11), was obtained in the same manner as above, except that cyanomethyltriphenylphosphonium chloride was used instead of bis(2-trifluoromethylphenyl)phenylsulfonium chloride as the raw material compound in Synthesis Example 1. １ H-NMR (400MHz, DMSO-d6): δ (ppm) = 3.37 (s, 6H), 5.22 (s, 4H), 6.32 (d, 8H), 7.05 (d, 4H), 7.66 (d, 4H), 7.81-8.01 (m, 60H). ２９ Si-NMR (119.22 MHz, DMSO-d6): δ (ppm) = -64.72 (s, 2Si), -85.02 (s, 1Si). ESI-MS: POSITIVE m / z 302.1 ([C ２０ H １７ NP] ＋ ) NEGATIVE m / z 755.1 (median) ([C １６ H １８ O ４４ Si ３ W １１ ] ４－ )

[0271] <Synthesis Example 12: Tetrakis(allyltriphenylphosphonium)(1,3-di(3-mercaptopropyl)disiloxane-1,1,3,3-tetrayl)undecatungstosilicate (Polyacid Salt (A-12))> The target compound, polyacid salt (A-12), was obtained in the same manner as above, except that in Synthesis Example 1, allyltriphenylphosphonium chloride was used instead of bis(2-trifluoromethylphenyl)phenylsulfonium chloride and 3-mercaptopropyltrimethoxysilane was used instead of 4-methoxymethoxyphenyltrimethoxysilane as raw material compounds. １ H-NMR (400MHz, DMSO-d6): δ (ppm) = 0.67 (t, 4H), 1.70-1.83 (m, 4H), 2.14 (t, 2H), 2.53- 2.61 (m, 4H), 4.89 (dd, 8H), 5.38-5.42 (m, 4H), 5.64-5.74 (m, 8H), 7.69-7.88 (m, 60H). ２９Si-NMR (119.22 MHz, DMSO-d6): δ (ppm) = -53.06 (s, 2Si), -85.20 (s, 1Si). ESI-MS: POSITIVE m / z 303.1 ([C ２１ H ２０ P] ＋ ) NEGATIVE m / z 724.1 (median) ([C ６ H １４ O ４０ S ２ Si ３ W １１ ] ４－ )

[0272] <Synthesis Example 13: Tetrakis(bis(2-trifluoromethylphenyl)phenylsulfonium)(1,3-divinyldisiloxane-1,1,3,3-tetrayl)undecatungstosilicate (Polyacid Salt (A-13))> The target compound, polyacid salt (A-13), was obtained in the same manner as in Synthesis Example 1, except that vinyltrimethoxysilane was used as the raw material compound instead of 4-methoxymethoxyphenyltrimethoxysilane. １ H-NMR (400MHz, DMSO-d6): δ (ppm) = 5.94 (dd, 2H), 6.08 (dd, 2H), 6.13 (dd, 2H), 7.65-8.35 (m, 52H). ２９ Si-NMR (119.22 MHz, DMSO-d6): δ (ppm) = -66.56 (s, 2Si), -85.29 (s, 1Si). １８３ W-NMR (20.84MHz, DMSO-d6): δ (ppm) = -105.52 (s, 2W), -107.54 (s, 2W), -112.04 (s, 1W), -126.08 (s, 2W), -170.95 (s, 2W), -247.66 (s, 2W). ESI-MS: POSITIVE m / z 399.1 ([C ２０ H １３ F ６ S] ＋ ) NEGATIVE m / z 700.3 (median) ([C ４ H ６ O ４０ Si ３ W １１ ] ４－)

[0273] <Synthesis Example 14: Tetrakis(triphenylsulfonium)silicotungstate (polyacid salt (A-14))> 25.6 g of triphenylsulfonium chloride was dissolved in 50 g of cyclohexanone, and silicotungstic acid (H ４ [SiW １２ O ４０ ]・26H ２ 41.06 g of methyl 2-hydroxybenzoate (A-14) was added, and the reaction solution was stirred at room temperature for 2 hours. The reaction solution was filtered, and the obtained powder was dried under reduced pressure at room temperature for 18 hours. The dried powder was crystallized at room temperature using dichloromethane and acetonitrile to obtain the target compound, polyacid salt (A-14). １ H-NMR (400MHz, DMSO-D6): δ (ppm) = 7.74-7.90 (m, 60H). １８３ W-NMR (20.84 MHz, DMSO-D6): δ (ppm) = -92.7 (s, 12 W). ESI-MS: NEGATIVE m / z 718.5 (median) ([SiW １２ O ４０ ] ４－ )

[0274] <Synthesis Example 15: Tetrakis(bis(4-t-butylphenyl)iodonium)(1,3-di(4-methoxymethoxyphenyl)disiloxane-1,1,3,3-tetrayl)undecatungstosilicate (Polyacid Salt (A-15))> The target compound was obtained in the same manner as above, except that in Synthesis Example 1, bis(4-t-butylphenyl)iodonium methylsulfate was used as the raw material compound instead of bis(2-trifluoromethylphenyl)phenylsulfonium chloride. １ H-NMR (400MHz, DMSO-D6): δ (ppm) = 1.25 (s, 72H), 3.37 (s, 6H), 5.22 (s, 4H), 7.05 (d, 4H), 7.56 (d, 16H), 7.66 (d, 4H), 8.18 (d, 16H). ２９Si-NMR (119.22 MHz, DMSO-d6): δ (ppm) = -64.72 (s, 2Si), -85.02 (s, 1Si). ESI-MS: POSITIVE m / z 393.1 ([C ２０ H ２６ I] ＋ ) NEGATIVE m / z 755.1 (median) ([C １６ H １８ O ４４ Si ３ W １１ ] ４－ )

[0275] <Synthesis Example 16: Tetrakis(bis(mesityl)iodonium)(1,3-dimethyldisiloxane-1,1,3,3-tetrayl)undecatungstosilicate (Polyacid Salt (A-16))> The target compound was obtained in the same manner as above, except that in Synthesis Example 1, a methanol solution of bis(mesityl)iodonium triflate was used instead of bis(2-trifluoromethylphenyl)phenylsulfonium chloride and methyltrimethoxysilane was used instead of 4-methoxymethoxyphenyltrimethoxysilane as raw materials. １ H-NMR (400MHz, DMSO-D6): δ (ppm) = 0.04 (s, 6H), 2.29 (s, 24H), 2.47 (s, 48H), 7.19 (s, 16H). ２９ Si-NMR (119.22MHz, DMSO-d6): δ (ppm) = -51.15 (s, 2Si), -85.08 (s, 1Si). ESI-MS: POSITIVE m / z 365.1 ([C １８ H ２２ I] ＋ ) NEGATIVE m / z 694.1 (median) ([C ２ H ６ O ４０ Si ３ W １１ ] ４－ )

[0276] <Production Example 3: 3-(2-(2-cyclopentenyloxycarbonyl)ethylthio)propyltrimethoxysilane> The target compound was obtained in the same manner as above, except that 2-cyclopentenyl acrylate was used as the starting compound instead of 1-methylcyclopentyl acrylate in Production Example 2. １ H-NMR (400MHz, DMSO-d6): δ (ppm) = 0.56 (t, 2H), 1.62 (quint, 2H), 2.02-2.33 ( m, 4H), 2.42 (t, 2H), 2.62 (t, 2H), 2.83 (t, 2H), 3.55 (s, 9H), 5.45-5.60 (m, 3H).

[0277] <Synthesis Example 17: Tetrakis(bis(2-trifluoromethylphenyl)phenylsulfonium)(1,3-di(3-(2-((2-cyclopentenyl)oxycarbonyl)ethylthio)propyl)disiloxane-1,1,3,3-tetrayl)undecatungstosilicate (Polyacid Salt (A-17))> The target compound was obtained in the same manner as above, except that 3-(2-(2-cyclopentenyloxycarbonyl)ethylthio)propyltrimethoxysilane was used instead of 4-methoxymethoxyphenyltrimethoxysilane as the raw material compound in Synthesis Example 1. １ H-NMR (400MHz, DMSO-d6): δ (ppm) = 0.67 (t, 4H), 1.62 (quint, 4H), 2.02-2.33 ( m, 8H), 2.42 (t, 4H), 2.62-2.67 (m, 8H), 5.45-5.60 (m, 6H), 7.65-8.35 (m, 52H). ２９ Si-NMR (119.22 MHz, DMSO-d6): δ (ppm) = -53.02 (s, 2Si), -85.04 (s, 1Si). ESI-MS: POSITIVE m / z 399.1 ([C ２０ H １３ F ６ S] ＋ ) NEGATIVE m / z 793.1 (median) ([C ２２ H ３４ O ４４ S ２ Si ３ W １１ ] ４－ )

[0278] <Production Example 4: 3-(2-(2-cyclohexenyloxycarbonyl)ethylthio)propyltrimethoxysilane> The target compound was obtained in the same manner as above, except that 2-cyclohexenyl acrylate was used as the raw material compound instead of 1-methylcyclopentyl acrylate in Production Example 2. １ H-NMR (400MHz, DMSO-d6): δ (ppm) = 0.56 (t, 2H), 1.60-2.08 (m, 8H), 2.42 (t, 2H), 2.62 (t, 2H), 2.83 (t, 2H), 3.55 (s, 9H), 5.13 (m, 1H), 5.59-5.65 (m, 2H).

[0279] <Synthesis Example 18: Tetrakis(bis(2-trifluoromethylphenyl)phenylsulfonium)(1,3-di(3-(2-((2-cyclohexenyl)oxycarbonyl)ethylthio)propyl)disiloxane-1,1,3,3-tetrayl)undecatungstosilicate (Polyacid Salt (A-18))> The target compound was obtained in the same manner as above, except that in Synthesis Example 1, 3-(2-((2-cyclohexenyl)oxycarbonyl)ethylthio)propyltrimethoxysilane was used as the raw material compound instead of 4-methoxymethoxyphenyltrimethoxysilane. １ H-NMR (400MHz, DMSO-d6): δ (ppm) = 0.67 (t, 4H), 1.60-2.08 (m, 16H), 2.42 (t, 4H), 2.62-2.67 (m, 8H), 5.13 (m, 2H), 5.59-5.65 (m, 4H), 7.65-8.35 (m, 52H). ２９ Si-NMR (119.22 MHz, DMSO-d6): δ (ppm) = -53.02 (s, 2Si), -85.04 (s, 1Si). ESI-MS: POSITIVE m / z 399.1 ([C ２０ H １３ F ６ S] ＋ ) NEGATIVE m / z 800.1 (median) ([C ２４ H ３８ O ４４ S ２ Si ３ W１１ ] ４－ )

[0280] <Production Example 5: 3-(2-((3-methyl-2-cyclohexenyl)oxycarbonyl)ethylthio)propyltrimethoxysilane> The target compound was obtained in the same manner as above, except that 3-methyl-2-cyclohexenyl acrylate was used as the raw material compound instead of 1-methylcyclopentyl acrylate in Production Example 2. １ H-NMR (400MHz, DMSO-d6): δ (ppm) = 0.56 (t, 2H), 1.60-2.01 (m, 11H), 2.42 (t, 2H), 2.62 (t, 2H), 2.83 (t, 2H), 3.55 (s, 9H), 5.13 (m, 1H), 5.37 (d, 1H).

[0281] <Synthesis Example 19: Tetrakis(bis(2-trifluoromethylphenyl)phenylsulfonium)(1,3-di(3-(2-((3-methyl-2-cyclohexenyl)oxycarbonyl)ethylthio)propyl)disiloxane-1,1,3,3-tetrayl)undecatungstosilicate (Polyacid Salt (A-19))> The target compound was obtained in the same manner as above, except that in Synthesis Example 1, 3-(2-((3-methyl-2-cyclohexenyl)oxycarbonyl)ethylthio)propyltrimethoxysilane was used as the raw material compound instead of 4-methoxymethoxyphenyltrimethoxysilane. １ H-NMR (400MHz, DMSO-d6): δ (ppm) = 0.67 (t, 4H), 1.60-2.01 (m, 22H), 2.42 (t, 4H), 2.62-2.67 (m, 8H), 5.13 (m, 2H), 5.37 (d, 2H), 7.65-8.35 (m, 52H). ２９ Si-NMR (119.22 MHz, DMSO-d6): δ (ppm) = -53.02 (s, 2Si), -85.04 (s, 1Si). ESI-MS: POSITIVE m / z 399.1 ([C ２０ H １３ F ６ S] ＋ ) NEGATIVE m / z 807.1 (median) ([C２６ H ４２ O ４４ S ２ Si ３ W １１ ] ４－ )

[0282] <Production Example 6: 3-(2-(1-indanyloxycarbonyl)ethylthio)propyltrimethoxysilane> The target compound was obtained in the same manner as above, except that 1-indanyl acrylate was used as the starting compound instead of 1-methylcyclopentyl acrylate in Production Example 2. １ H-NMR (400MHz, DMSO-d6): δ (ppm) = 0.56 (t, 2H), 2.15-2.42 (m, 6H), 2.62 (t, 2H) , 2.83 (t, 2H), 3.11-3.21 (m, 2H), 3.55 (s, 9H), 6.08 (t, 1H), 7.06-7.26 (m, 4H).

[0283] <Synthesis Example 20: Tetrakis(bis(2-trifluoromethylphenyl)phenylsulfonium)(1,3-di(3-(2-(1-indanyloxycarbonyl)ethylthio)propyl)disiloxane-1,1,3,3-tetrayl)undecatungstosilicate (Polyacid Salt (A-20))> The target compound was obtained in the same manner as above, except that in Synthesis Example 1, 3-(2-(1-indanyloxycarbonyl)ethylthio)propyltrimethoxysilane was used as the raw material compound instead of 4-methoxymethoxyphenyltrimethoxysilane. １ H-NMR (400MHz, DMSO-d6): δ (ppm) = 0.67 (t, 4H), 2.15-2.42 (m, 12H), 2.62-2.67 (m, 8H), 3.11-3.21 (m, 4H), 6.08 (t, 2H), 7.06-7.26 (m, 8H), 7.65-8.35 (m, 52H). ２９ Si-NMR (119.22 MHz, DMSO-d6): δ (ppm) = -53.02 (s, 2Si), -85.04 (s, 1Si). ESI-MS: POSITIVE m / z 399.1 ([C ２０ H １３ F ６ S]＋ ) NEGATIVE m / z 818.1 (median) ([C ３０ H ３８ O ４４ S ２ Si ３ W １１ ] ４－ )

[0284] [2. Preparation of Test Resist Materials and Formation of Resist Films] Test resist materials (R-1) to (R-19) were prepared by blending the polyacid salts (A-1) to (A-13) and (A-15) to (A-20) synthesized above with an organic solvent in the amounts (unit: parts by mass) shown in Table 1 below.

[0285]

[0286] Resist materials (R-1) to (R-19) were each applied using a spinner to an 8-inch silicon substrate that had been treated with hexamethyldisilazane (HMDS), and then post-applied bake (PAB) was performed on a hot plate at 120°C for 60 seconds, followed by drying to produce a resist film with a thickness of 50 nm. The thickness of the formed film was measured using a film thickness measuring device (J.A. Woollam's "M-2000D").

[0287] It was confirmed that when any of the resist materials (R-1) to (R-19) was used, a uniform resist film without any defects was formed.

[0288] [3. Formation of LS Pattern] Test resist materials (R'-1) to (R'-17) were prepared by blending the polyacid salts (A-1) to (A-6), (A-14), (A-15), and (A-17) to (A-20) synthesized above, an acid diffusion controller, and an organic solvent in the amounts (unit: parts by mass) shown in Table 2 below.

[0289] The acid diffusion controllers (B) shown in Table 2 were the following acid diffusion controllers (B-1) to (B-3): Acid diffusion controller (B-1): a salt of a triphenylsulfonium cation represented by the following formula (B-1) and a salicylic acid anion. Acid diffusion controller (B-2): an acid diffusion controller which is a salt of (4-(2-((1-ethylcyclopentyl)oxy)-2-oxoethoxy)-3,5-dimethylphenyl)diphenylsulfonium cation represented by the following formula (B-2) and salicylic acid anion Acid diffusion controller (B-3): an acid diffusion controller which is a salt of a triphenylsulfonium cation represented by the following formula (B-3) and a heptafluorobutyrate anion

[0290]

[0291] Each of the resist materials (R'-1) to (R'-17) was applied using a spinner to an 8-inch silicon substrate that had been treated with hexamethyldisilazane (HMDS), and then post-applied bake (PAB) treatment was performed on a hot plate at 120°C for 60 seconds, followed by drying to prepare a resist film with a thickness of 50 nm. The thickness of the formed film was measured using a film thickness measuring device (J.A. Woollam's "M-2000D").

[0292] The resist film was subjected to writing (exposure) using an electron beam lithography system F7000S-VD2 (manufactured by Advantest Corporation) at an acceleration voltage of 50 kV, with a target size of a 1:1 line and space pattern (hereinafter also referred to as "LS pattern") with a line width of 50 nm. Thereafter, a post-exposure bake (PEB) treatment was performed at 90°C for 60 seconds. Next, development was performed for 60 seconds at 23°C using a developer (NMD-W (manufactured by Tokyo Ohka Kogyo Co., Ltd.)), and then rinsing was performed with pure water for 15 seconds. As a result, a 1:1 LS pattern with a line width of 50 nm was formed, and LS patterns (LS-1) to (LS-17) corresponding to the test resist materials (R'-1) to (R'-17) were obtained. Note that the LS patterns (LS-1) to (LS-17) are all positive-tone patterns.

[0293] [4. Evaluation of the Shape of LS Pattern] The shapes of the above LS patterns (LS-1) to (LS-17) were observed using a length-measuring SEM (scanning electron microscope, accelerating voltage 10 kV, product name: SU-5000, manufactured by Hitachi High-Technologies Corporation), and the shapes were evaluated according to the following criteria. The results are shown in Table 3. A: Almost no trailing was observed in the LS pattern in the SEM image, and the resolution was excellent. B: Slight trailing was observed in part of the LS pattern in the SEM image. C: No LS pattern was formed (not resolved) in the entire SEM image.

[0294]

[0295] The results in Table 3 above show that by using resist materials (R'-1) to (R'-10) or (R'-13) to (R'-17) containing the polyacid salts (A-1) to (A-6), (A-15), or (A-17) to (A-20), which are heteropolyacid salts with modified defect sites, LS patterns with a line width of 50 nm and little or no trailing edge can be obtained with good resolution ((LS-1) to (LS-10) and (LS-13) to (LS-17)). Furthermore, when comparing the pattern resolution of (LS-1) and (LS-2) with that of (LS-5) and (LS-6), it is found that, compared to the case where resist material (R'-1) or (R'-5) containing polyacid salt (A-1) or (A-4), which is a heteropolyacid salt with modified defect sites, using resist material (R'-2) or (R'-6) which further contains acid diffusion controller (B-1) further improves resolution, and an LS pattern with a line width of 50 nm and almost no trailing edge can be obtained ((LS-2) and (LS-6)).

Claims

1. A resist material containing a heteropolyacid salt in which a defective site is modified or a mixture thereof.

2. The resist material according to claim 1, wherein the anion part of the (A) heteropolyacid salt in which the defective site is modified or a mixture thereof is a heteropolyacid anion in which the defective site is modified in the heteropolyacid anion having the defective site.

3. The resist material according to claim 2, wherein the polyatom of the heteropolyacid anion is Mo, W, V, Nb or Ta, and the heteroatom is P, Si, B, S or Ge.

4. The resist material according to claim 2, wherein the heteropolyacid anion having the defective site is a defective Keggin type heteropolyacid anion or a defective Dawson type heteropolyacid anion.

5. The resist material according to claim 2, wherein the modification is made by bonding a group having one or more heteroatoms P, Si, Ge or Sn to which one or more organic groups are bonded to the heteropolyacid anion having the defective site through a part or all of the heteroatoms.

6. The resist material according to claim 5, wherein the organic group has one or more polar groups having an acid dissociable group.

7. The resist material according to claim 6, wherein the acid dissociable group is a tertiary carbon type acid dissociable group, an allyl type or benzyl type acid dissociable group, an acetal type acid dissociable group, or an aminocarbonyl type acid dissociable group.

8. The cation part of the heteropolyacid salt or its mixture in which the (A) defective part is modified is H ＋ , a resist material according to claim 1, having one or more metal ions, onium cations or onium dications.

9. The resist material according to claim 8, wherein the onium cation or onium dication is an ammonium cation, an ammonium dication, a phosphonium cation, a phosphonium dication, a sulfonium cation, a sulfonium dication, or an iodonium cation.

10. The resist material according to claim 1, wherein the (A) heteropolyacid salt or a mixture thereof having a modified defect site is a heteropolyacid salt or a mixture thereof having a modified defect site represented by the general formula (I). (A ｍ＋ ). ａ (C （ａｍ）－ ). (I) [In formula (I), A ｍ＋ each independently represents H ＋ , a metal ion, an onium cation, or an onium dication; C （ａｍ）－ represents a heteropolyacid anion in which the defect site in the heteropolyacid anion having the defect site is modified; m is an integer of 1 to 5, and a is a real number greater than 0.] 11. The resist material according to claim 10, wherein the heteropolyacid anion in which the defective site is modified in the heteropolyacid anion having the defective site has one or more polar groups having an acid dissociable group.

12. The resist material according to claim 1, wherein the (A) heteropolyacid salt or a mixture thereof having a modified defect site is a heteropolyacid salt or a mixture thereof having a modified defect site represented by the general formula (I'). (A' ｍ’＋ ). ａ’ (B ｎ＋ ). ｂ (C' （ａ’ｍ’＋ｂｎ）－ ) (I') [In the formula (I'), A' ｍ’＋ each independently represents H ＋ , a metal ion, an ammonium cation, an ammonium dication, a phosphonium cation, or a phosphonium dication; B ｎ＋ each independently represents a sulfonium cation, a sulfonium dication, or an iodonium cation; C' （ａ’ｍ’＋ｂｎ）－ represents a heteropolyacid anion in which the defect site in the heteropolyacid anion having the defect site is modified; m' is an integer of 1 to 5, n is an integer of 1 or 2, a' is a real number, and b is a real number greater than 0.] 13. The resist material according to claim 12, wherein the heteropolyacid anion in which the defective site is modified in the heteropolyacid anion having the defective site has one or more polar groups having an acid dissociable group.

14. The resist material according to claim 1, further containing (B) an acid diffusion control agent.

15. The resist material according to claim 14, wherein the (B) acid diffusion control agent is (B1) a photo-dissociable base.

16. The resist material according to claim 1, further containing an organic solvent.

17. The resist material according to any one of claims 1 to 16, which is a resist material for electron beams or EUV.

18. A pattern forming method comprising: a step of forming a resist film using the resist material according to any one of claims 1 to 16; a step of exposing the resist film; and a step of developing the exposed resist film using a developer.

19. The step of exposing the resist film is a step of exposing the resist film with an electron beam having a dose of 2 mC / cm ２ or less or extreme ultraviolet light having a dose of 200 mJ / cm ２ or less. The pattern forming method according to claim 18 20. A patterned structure obtained by forming a pattern using the resist material according to any one of claims 1 to 16.

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