Distributed loop impedance measurement method and system

Abstract

A distributed loop impedance measurement method and system. The method comprises: in response to a received loop impedance measurement instruction, performing parsing on the basis of the loop impedance measurement instruction, so as to obtain loops to be measured (S101); sequentially performing impedance measurement on the loops to be measured, such that during the impedance measurement of each loop to be measured, a voltage excitation loop connected to the loop to be to measured is controlled to operate at a first frequency and a second frequency, so as to collect a first current and a second current of the loop to be measured which is at the first frequency until the first frequency and corresponding first current and the second frequency and corresponding second current of each loop to be measured are collected (S102); and on the basis of the first frequency and corresponding first current and the second frequency and corresponding second current of each loop to be measured, calculating the resistance and reactance of each loop to be measured (S103). The method solves the technical problem in the prior art of loop resistance measurement clamp meters only being capable of performing single-point measurement, but being incapable of implementing distributed measurement and incapable of measuring the resistance and reactance of each branch loop.

Description

A distributed loop impedance measurement method and system Technical Field

[0001] The present invention relates to the technical field of power system testing, and in particular to a distributed loop impedance measurement method and system. Background Art

[0002] In power engineering, it is extremely important to be able to conveniently, effectively, and contactlessly measure the resistance and reactance (including capacitive reactance or inductive reactance, the same below) parameters of multiple circuits.

[0003] The jaws of existing loop resistance clamp meters consist of a voltage coil and a current coil. The voltage coil provides the excitation signal and induces an electric potential in the circuit being measured. This potential, E, generates a current in the circuit being measured. The clamp meter measures both the electric potential and the current to calculate the resistance of the circuit being measured. However, because the induced electric potential in the circuit being measured does not directly measure the phase, the phase angle between the electric potential and the current cannot be calculated. Therefore, at a single measurement frequency, existing loop resistance clamp meters cannot measure the resistance and reactance of the circuit. Furthermore, existing loop resistance clamp meters can only perform single-point measurements and cannot achieve distributed measurement. Furthermore, they can only measure the total impedance, but not the resistance and reactance of each branch circuit. Summary of the Invention

[0004] The present invention provides a distributed loop impedance measurement method and system to solve the technical problem that loop resistance measurement clamp meters in the prior art can only perform single-point measurement but cannot achieve distributed measurement and cannot measure the resistance and reactance of each branch loop.

[0005] In order to solve the above technical problems, an embodiment of the present invention provides a distributed loop impedance measurement method, including:

[0006] In response to the received loop impedance measurement instruction, the circuit to be measured is obtained by parsing according to the loop impedance measurement instruction; wherein the number of the circuit to be measured is at least one;

[0007] Impedance measurements are sequentially performed on the circuits to be measured, such that during the impedance measurement of each circuit to be measured, a voltage excitation circuit connected to the circuit to be measured is controlled to operate at a first frequency, a first current of the circuit to be measured at the first frequency is collected, and after the first current is obtained, the voltage excitation circuit connected to the circuit to be measured is controlled to operate at a second frequency, a second current of the circuit to be measured at the second frequency is collected, until the first frequency and the corresponding first current and the second frequency and the corresponding second current are obtained for each circuit to be measured; wherein the first frequency and the second frequency are different in magnitude;

[0008] The resistance and reactance of each circuit to be measured are calculated based on the first frequency and the corresponding first current and the second frequency and the corresponding second current of each circuit to be measured, thereby completing the distributed measurement of the circuit impedance.

[0009] As a preferred solution, the test host executes, in response to the received loop impedance measurement instruction, parsing and obtaining the circuit to be tested according to the loop impedance measurement instruction, specifically:

[0010] generating a loop impedance measurement instruction in response to a click operation of a user, the received loop impedance measurement instruction;

[0011] The loop impedance measurement instruction is parsed to obtain the loop to be measured, and a gating connection is established in sequence for the loop to be measured so that the current coil and the voltage coil in the loop to be measured are both communicatively connected with the test host.

[0012] As a preferred solution, the gate connection is established in sequence for the circuit to be tested so that the current coil and the voltage coil in the circuit to be tested are both communicatively connected with the test host, specifically:

[0013] Generate a control instruction corresponding to each circuit to be measured according to the circuit to be measured and its measurement order obtained by analyzing the circuit impedance measurement instruction;

[0014] According to the measurement sequence, a gating connection is established for each circuit to be tested in turn, so that in the process of establishing the gating connection for each circuit to be tested, the current coil in the circuit to be tested is communicatively connected with the current gating module in the test host, and the voltage coil in the circuit to be tested is communicatively connected with the voltage gating module in the test host; wherein the current gating module is used to collect the current of the circuit to be tested, and the voltage gating module is used to control the voltage of the circuit to be tested.

[0015] As a preferred solution, the voltage excitation circuit connected to the circuit to be measured is controlled to operate at a first frequency, a first current of the circuit to be measured is collected at the first frequency, and after obtaining the first current, the voltage excitation circuit connected to the circuit to be measured is controlled to operate at a second frequency, and a second current of the circuit to be measured at the second frequency is collected, specifically:

[0016] By analyzing the control instruction by the voltage gating module and the current gating module, the voltage gating module and the current gating module are respectively connected to the voltage coil and the current coil in the current circuit to be tested;

[0017] Through the voltage gating module, the voltage coil connected to the circuit to be tested is controlled to operate at a first frequency so that the voltage coil generates a voltage excitation circuit in the circuit to be tested, and through the current gating module, the first current of the circuit to be tested at the first frequency is collected.

[0018] As a preferred solution, the resistance and reactance of each circuit to be measured are calculated based on the first frequency and the corresponding first current and the second frequency and the corresponding second current of each circuit to be measured, specifically:

[0019] When the first frequency is greater than the second frequency, if the first current of the current circuit to be measured is greater than the second current, the current circuit to be measured is an inductive circuit; if the first current of the current circuit to be measured is less than the second current, the current circuit to be measured is a capacitive circuit; if the first current of the current circuit to be measured is equal to the second current, the current circuit to be measured is a resistive circuit;

[0020] When the first frequency is less than the second frequency, if the first current of the current circuit to be measured is greater than the second current, the current circuit to be measured is a capacitive circuit; if the first current of the current circuit to be measured is less than the second current, the current circuit to be measured is an inductive circuit; if the first current of the current circuit to be measured is equal to the second current, the current circuit to be measured is a resistive circuit;

[0021] Through the preset calculation formulas for capacitive circuits, inductive circuits and resistive circuits, the resistance and reactance of the current circuit to be measured are calculated according to the first frequency and corresponding first current and the second frequency and corresponding second current of the current circuit to be measured, and then the resistance and reactance of each circuit to be measured are calculated.

[0022] As a preferred solution, the calculation formula of the inductive loop is:

[0023] The calculation formula of the capacitive loop is:

[0024] The calculation formula of the resistive loop is:

[0025] Wherein, Z1 and Z2 are the loop impedances of the inductive circuit at the first and second frequencies, respectively; Z3 and Z4 are the loop impedances of the capacitive circuit at the first and second frequencies, respectively; f1 is the first frequency, f2 is the second frequency, ω1 and ω2 are the phase angles of the first and second frequencies, respectively; L is the inductive reactance, C is the capacitive reactance, U0 is the voltage applied by the voltage coil in the circuit to be measured, I1 is the first current, I2 is the second current, and R is the resistance.

[0026] Accordingly, the present invention also provides a distributed loop impedance measurement system, comprising: a test host and at least one loop to be tested connected to the test host;

[0027] The test host is used to perform the distributed loop impedance measurement method as described in any one of the above;

[0028] The circuit to be tested includes a current coil and a voltage coil, and both the current coil and the voltage coil are connected to the test host.

[0029] As a preferred solution, the test host includes an MCU and a current gating module, a voltage gating module, a current acquisition unit and a voltage excitation unit connected to the MCU;

[0030] The current gating module is further connected to the current acquisition unit, and the voltage gating module is further connected to the voltage excitation unit;

[0031] The current gating module is connected to a current coil in at least one circuit to be measured, and the voltage gating module is connected to a voltage coil in at least one circuit to be measured.

[0032] Accordingly, the present invention also provides a terminal device, comprising a processor, a memory, and a computer program stored in the memory and configured to be executed by the processor, wherein when the processor executes the computer program, the distributed loop impedance measurement method as described in any one of the above items is implemented.

[0033] Accordingly, the present invention also provides a computer-readable storage medium, which includes a stored computer program, wherein when the computer program is running, the device where the computer-readable storage medium is located is controlled to execute any one of the distributed loop impedance measurement methods described above.

[0034] Compared with the prior art, the embodiments of the present invention have the following beneficial effects:

[0035] The technical solution of the present invention can more accurately calculate the resistance and reactance of the circuit to be measured by collecting current at different frequencies, so that the current at different frequencies reflects the response characteristics of the circuit at different frequencies, thereby obtaining more comprehensive impedance information, and simultaneously performing impedance measurement on multiple circuits. Compared with the method of measuring each circuit one by one, distributed measurement can improve measurement efficiency, save time and resources, and realize distributed impedance measurement of the circuit to be measured by controlling the operating frequency of the voltage excitation circuit, so that each circuit to be measured is measured at different frequencies, and its impedance information at different frequencies can be obtained. In addition, the distributed measurement method can better reflect the overall characteristics of the circuit and provide more comprehensive data support, and thus can adopt multi-frequency testing and multi-channel gating functions to realize distributed non-contact measurement of circuit resistance and reactance in engineering practice, thereby improving the efficiency, safety and universality of circuit resistance and reactance parameter measurement. BRIEF DESCRIPTION OF THE DRAWINGS

[0036] FIG1 is a flowchart of a distributed loop impedance measurement method according to an embodiment of the present invention;

[0037] FIG2 is a schematic structural diagram of a distributed loop impedance measurement system provided by an embodiment of the present invention;

[0038] FIG3 is a specific structural diagram of a distributed loop impedance measurement system provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0039] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. All other embodiments obtained by ordinary technicians in this field based on the embodiments of the present invention without making any creative efforts shall fall within the scope of protection of the present invention.

[0040] Example 1

[0041] Referring to FIG. 1 , a distributed loop impedance measurement method provided by an embodiment of the present invention includes the following steps S101 to S103:

[0042] Step S101: In response to a received loop impedance measurement instruction, a loop to be measured is obtained by parsing according to the loop impedance measurement instruction; wherein the number of the loop to be measured is at least one.

[0043] As a preferred solution of this embodiment, the test host executes, in response to the received loop impedance measurement instruction, parsing and obtaining the circuit to be tested according to the loop impedance measurement instruction, specifically:

[0044] A loop impedance measurement instruction is generated in response to a user's click operation, and the loop impedance measurement instruction is received; the loop impedance measurement instruction is parsed to obtain a circuit to be tested, and a selection connection is established for the circuit to be tested in turn, so that the current coil and the voltage coil in the circuit to be tested are both communicatively connected to the test host.

[0045] In this embodiment, a user triggers the generation of a loop impedance measurement instruction by clicking on the interface. The system then generates a corresponding loop impedance measurement instruction based on the user's click. The test host receives the loop impedance measurement instruction, parses it, and extracts information about the circuit under test. Simultaneously, the test host establishes gated connections to the circuit under test, ensuring proper communication between the current coil and voltage coil and the test host.

[0046] In this embodiment, the loop impedance measurement instruction is quickly generated based on the user's click operation, and a communication connection with the test host is established to meet the user's needs. Furthermore, by parsing the loop impedance measurement instruction, the loop to be tested is automatically identified and a gating connection is established, reducing the need for manual intervention, improving work efficiency, and achieving automated processing. Furthermore, by establishing a gating connection, the communication connection between the current coil and voltage coil and the test host is stable and reliable, thereby improving the accuracy of the loop impedance measurement. This creates a user-friendly operating interface, allowing the user to complete the loop impedance measurement with a simple click, thus enhancing the user experience.

[0047] As a preferred solution of this embodiment, the gate connection is established in sequence for the circuit to be tested, so that the current coil and the voltage coil in the circuit to be tested are both communicatively connected with the test host, specifically:

[0048] Based on the circuit to be tested and its measurement sequence obtained by analyzing the loop impedance measurement instruction, a control instruction corresponding to each circuit to be tested is generated; according to the measurement sequence, a gating connection is established for each circuit to be tested in turn, so that in the process of establishing the gating connection for each circuit to be tested, the current coil in the circuit to be tested is communicatively connected with the current gating module in the test host, and the voltage coil in the circuit to be tested is communicatively connected with the voltage gating module in the test host; wherein the current gating module is used to collect the current of the circuit to be tested, and the voltage gating module is used to control the voltage of the circuit to be tested.

[0049] In this embodiment, the system parses the loop impedance measurement instruction, that is, based on the loop impedance measurement instruction input by the user, and extracts information about the circuit to be tested and its measurement sequence, thereby generating a control instruction. Specifically, based on the parsed circuit to be tested and its measurement sequence, the system generates a control instruction corresponding to each circuit to be tested. Ultimately, the circuits to be tested are gated and connected in sequence according to the measurement sequence. During the connection process, the current coil in the circuit to be tested is communicatively connected to the current gating module in the test host, and the voltage coil in the circuit to be tested is communicatively connected to the voltage gating module in the test host.

[0050] In this embodiment, the current gating module is used to collect current information of the circuit under test. The current gating module can obtain current data in the circuit under test through a communication connection with the current coil. The voltage gating module is used to control the voltage of the circuit under test. The voltage gating module can control and adjust the voltage in the circuit under test through a communication connection with the voltage coil.

[0051] In this embodiment, by analyzing the circuit to be tested and its measurement sequence, corresponding control instructions are automatically generated, which can flexibly adapt to the testing requirements of different circuits and then establish a stable selection connection, thereby ensuring the reliable communication connection between the current coil and the voltage coil and the test host, and improving the accuracy of the loop impedance measurement.

[0052] Step S102: Impedance measurements are performed on the circuits to be measured in sequence, so that in the process of performing impedance measurements on each circuit to be measured, the voltage excitation circuit connected to the circuit to be measured is controlled to operate at a first frequency, and a first current of the circuit to be measured at the first frequency is collected. After obtaining the first current, the voltage excitation circuit connected to the circuit to be measured is controlled to operate at a second frequency, and a second current of the circuit to be measured at the second frequency is collected, until the first frequency and the corresponding first current and the second frequency and the corresponding second current of each circuit to be measured are collected; wherein, the first frequency and the second frequency are different in frequency.

[0053] As a preferred solution of this embodiment, the voltage excitation circuit connected to the circuit to be measured is controlled to operate at a first frequency, a first current of the circuit to be measured is collected at the first frequency, and after obtaining the first current, the voltage excitation circuit connected to the circuit to be measured is controlled to operate at a second frequency, and a second current of the circuit to be measured at the second frequency is collected, specifically:

[0054] The control instruction is parsed by the voltage gating module and the current gating module, and a gating connection is established between the voltage gating module and the current gating module and the voltage coil and the current coil in the current circuit to be tested respectively; the voltage gating module is used to control the voltage coil connected to the circuit to be tested to operate at a first frequency so that the voltage coil generates a voltage excitation circuit in the circuit to be tested, and the current gating module is used to collect the first current of the circuit to be tested at the first frequency.

[0055] In this embodiment, the system analyzes the voltage and current gating modules primarily through control instructions. The system analyzes the voltage and current gating modules and determines the gating connection relationships between the modules and the voltage and current coils in the circuit under test. Based on the analyzed gating relationships, the system then establishes a gating connection between the voltage and current coils in the circuit under test, respectively.

[0056] In this embodiment, the voltage excitation circuit can be generated by controlling a voltage coil connected to the circuit under test to operate at a first frequency through a voltage gating module, so that the voltage coil generates a voltage excitation circuit in the circuit under test. Furthermore, the current gating module collects first current data generated in the circuit under test at the first frequency.

[0057] In this embodiment, by parsing the control instructions through the voltage gating module and the current gating module, a gating connection with the voltage coil and the current coil in the circuit to be measured can be automatically established, reducing the need for manual intervention. Thus, by controlling the voltage coil to operate at a first frequency through the voltage gating module, the voltage coil generates a voltage excitation circuit in the circuit to be measured, ensuring that the measured current data is an accurate value at a specific frequency, thereby improving the accuracy of the measurement. At the same time, this embodiment ensures the flexibility and scalability of impedance measurement, and different frequencies can be selected for operation as needed, thereby adapting to circuits to be measured of different types and sizes. At the same time, by adding more voltage gating modules and current gating modules, the measurement of more channels can be supported, thereby improving the flexibility and scalability of the system.

[0058] Furthermore, automated operation and accurate measurement improve test efficiency. The system quickly establishes gating connections and performs measurements, reducing manual operation time and potential errors. Because the system automatically performs measurements and collects data, the impact of human factors on measurement results is reduced, mitigating risks during the test process.

[0059] Step S103: Calculate the resistance and reactance of each circuit to be measured based on the first frequency and the corresponding first current and the second frequency and the corresponding second current of each circuit to be measured, thereby completing the distributed measurement of the circuit impedance.

[0060] As a preferred solution of this embodiment, the resistance and reactance of each circuit to be tested are calculated based on the first frequency and corresponding first current and the second frequency and corresponding second current of each circuit to be tested, specifically:

[0061] When the first frequency is greater than the second frequency, if the first current of the current circuit to be measured is greater than the second current, the current circuit to be measured is an inductive circuit; if the first current of the current circuit to be measured is less than the second current, the current circuit to be measured is a capacitive circuit; if the first current of the current circuit to be measured is equal to the second current, the current circuit to be measured is a resistive circuit; when the first frequency is less than the second frequency, if the first current of the current circuit to be measured is greater than the second current, the current circuit to be measured is a capacitive circuit; if the first current of the current circuit to be measured is less than the second current, the current circuit to be measured is an inductive circuit; if the first current of the current circuit to be measured is equal to the second current, the current circuit to be measured is a resistive circuit; through the preset calculation formulas for capacitive circuits, inductive circuits and resistive circuits, according to the first frequency and the corresponding first current of the current circuit to be measured and the second frequency and the corresponding second current, the resistance and reactance of the current circuit to be measured are calculated, and then the resistance and reactance of each circuit to be measured are calculated.

[0062] In this embodiment, by comparing the current magnitudes at different frequencies, it is possible to accurately determine whether the circuit under test is capacitive, inductive, or resistive, enabling a better understanding and analysis of the circuit's characteristics and behavior. Furthermore, a preset calculation formula can be used to quickly calculate the resistance and reactance values ​​based on the frequency and current values ​​of the circuit under test, improving computational efficiency and saving time and labor costs.

[0063] In this embodiment, by calculating the resistance and reactance of each circuit to be tested, the characteristics of the circuit can be understood more comprehensively. Resistance and reactance are very important for circuit design and optimization, and can help users better select appropriate components and parameters to monitor the impedance of the entire large and small loops. At the same time, this embodiment can simultaneously measure the current and frequency of multiple circuits to be tested, and calculate the resistance and reactance according to the formula. Compared with the traditional one-by-one measurement method, the test efficiency is greatly improved, saving time and resources. At the same time, this embodiment is applicable to various types of circuits and loops, and has good scalability and applicability. Whether it is a simple electronic circuit or a complex power system, accurate measurement and analysis can be performed through this embodiment.

[0064] As a preferred solution of this embodiment, the calculation formula of the inductive loop is:

[0065] The calculation formula of the capacitive loop is:

[0066] The calculation formula of the resistive loop is:

[0067] Wherein, Z1 and Z2 are the loop impedances of the inductive circuit at the first and second frequencies, respectively; Z3 and Z4 are the loop impedances of the capacitive circuit at the first and second frequencies, respectively; f1 is the first frequency, f2 is the second frequency, ω1 and ω2 are the phase angles of the first and second frequencies, respectively; L is the inductive reactance, C is the capacitive reactance, U0 is the voltage applied by the voltage coil in the circuit to be measured, I1 is the first current, I2 is the second current, and R is the resistance.

[0068] It should be noted that, since the impedance of a certain loop must be measured, the corresponding voltage excitation loop and current acquisition loop must be controlled to be turned on at the same time, and the conduction time must be greater than the time of two measurements at the first frequency and the second frequency.

[0069] It is understood that the embodiments of the present invention can automatically measure the circuit under test, reducing the need for manual operation. Furthermore, through the automated process, human error can be effectively reduced, thereby improving the accuracy of the measurement results. Secondly, because this embodiment uses different frequencies for measurement, it can cover a wider frequency range, which is very beneficial for applications requiring broadband impedance measurement, such as RF circuit design and debugging.

[0070] The implementation of the above embodiment has the following effects:

[0071] The technical solution of the present invention can more accurately calculate the resistance and reactance of the circuit to be measured by collecting current at different frequencies, so that the current at different frequencies reflects the response characteristics of the circuit at different frequencies, thereby obtaining more comprehensive impedance information, and simultaneously performing impedance measurement on multiple circuits. Compared with the method of measuring each circuit one by one, distributed measurement can improve measurement efficiency, save time and resources, and realize distributed impedance measurement of the circuit to be measured by controlling the operating frequency of the voltage excitation circuit, so that each circuit to be measured is measured at different frequencies, and its impedance information at different frequencies can be obtained. In addition, the distributed measurement method can better reflect the overall characteristics of the circuit and provide more comprehensive data support, and thus can adopt multi-frequency testing and multi-channel gating functions to realize distributed non-contact measurement of circuit resistance and reactance in engineering practice, thereby improving the efficiency, safety and universality of circuit resistance and reactance parameter measurement.

[0072] Example 2

[0073] Please refer to FIG. 2 , which shows a distributed loop impedance measurement system provided by the present invention, including: a test host and at least one loop to be tested connected to the test host.

[0074] The test host is used to execute the distributed loop impedance measurement method as described in any one of the above embodiments.

[0075] The circuit to be tested includes a current coil and a voltage coil, and both the current coil and the voltage coil are connected to the test host.

[0076] As a preferred solution of this embodiment, the test host includes an MCU and a current gating module, a voltage gating module, a current acquisition unit and a voltage excitation unit connected to the MCU.

[0077] The current gating module is further connected to the current acquisition unit, and the voltage gating module is further connected to the voltage excitation unit.

[0078] The current gating module is connected to a current coil in at least one circuit to be measured, and the voltage gating module is connected to a voltage coil in at least one circuit to be measured.

[0079] In this embodiment, as shown in Figure 3, the test host also includes a power module, keyboard module, display module, and communication module, all of which are connected to the MCU. The MCU processor is the test host's logic and computational unit, coordinating the orderly operation of related modules. It issues D / A conversion instructions of varying bandwidths to the voltage excitation unit and filtering instructions of varying bandwidths to the current acquisition unit. Based on the current signal, it calculates the impedance, resistance, inductance, and capacitance of the measured circuit and performs data processing, display, and communication operations according to these instructions. The power module, powered by 220V mains electricity, provides operating power to the MCU, keyboard module, display module, communication module, voltage excitation unit, current acquisition unit, voltage gating module, and current gating module. The keyboard module handles parameter setting input, measurement range adjustment, and measurement data processing. The display module displays measurement parameters, data, and alarm signals. The communication module can interface with information systems or the Internet of Things (IoT) for remote calibration, control, and analysis.

[0080] Furthermore, the voltage excitation unit integrates a programmable D / A conversion module and a power amplifier circuit. It generates excitation voltage signals of one high and one low frequency according to customized instructions from the MCU. After power amplification, these signals are input into the voltage transformer coil of the jaw unit. The current acquisition unit integrates a programmable filtering circuit, an isolation amplifier circuit, and a D / A conversion module. It collects current signals from the current transformer coil of the jaw unit, filters and amplifies the corresponding current signals according to the excitation voltage bandwidth of the voltage excitation unit, and then transmits them to the MCU for logical calculations.

[0081] In this embodiment, the voltage gating module is a one-way to multiple-way voltage loop gating circuit, and the MCU issues an instruction to control the selection of a certain voltage loop. The current gating module is a multiple-way to one-way current loop gating circuit, and the MCU issues an instruction to control the selection of a certain current loop to be turned on.

[0082] For example, a distributed loop impedance measurement system consists of a host computer and several jaw coils. The host computer is powered by 220V and can be fixedly installed; the jaw coils are respectively placed on the circuit to be measured; and the host computer is connected to each jaw coil via a secondary cable. Each jaw coil integrates a voltage transformer coil and a current transformer coil with the same parameters. The voltage transformer coil is used to excite the voltage in the measured circuit, and the current transformer coil is used to collect the current signal of the measured circuit. For a system with n jaw coils, the loop selection control logic is as follows:

[0083] S1: MCU receives loop impedance measurement instruction.

[0084] S2: The MCU issues a command to simultaneously control the voltage excitation circuit of jaw 1 of the voltage gating module and the current acquisition circuit of jaw 1 of the current gating module to be turned on and remain turned on.

[0085] S3: The MCU issues a command to measure and collect the current value I1 at frequency f1 for jaw 1. Jaw 1 remains open.

[0086] S4: The MCU issues a command to complete the measurement and collection of the current value I2 at the frequency f2 for jaw 1.

[0087] S5: The MCU calculates the loop resistance and reactance of jaw 1 according to the impedance calculation logic, stores the calculated data, and sends it.

[0088] S6: The MCU issues a command to close the clamp 1 of the voltage gating module and the clamp 1 of the current gating module.

[0089] According to the above steps S1-S6, the control of jaw 2, ..., jaw n is repeated in sequence.

[0090] In this embodiment, by adopting multi-frequency testing and multi-channel gating functions, distributed non-contact measurement of multi-loop resistance and reactance is achieved in engineering practice. By using a programmable D / A conversion module and a programmable filter circuit, the excitation voltage of the voltage excitation unit with a large and a small frequency is customized and switched to output, so that the current acquisition unit can collect current signals with a large and a small frequency. The MCU calculates according to the impedance calculation logic, analyzes the loop impedance properties, and measures the impedance, resistance, inductance, and capacitance values ​​of the measured loop. By connecting to the voltage gating module and the current gating module, the voltage excitation loop and the current acquisition loop of the same jaw loop are controlled to be turned on, and the conduction holding time is controlled, thereby realizing distributed non-contact measurement of multi-loop resistance and reactance parameters, greatly improving the efficiency, safety, and universality of loop resistance and reactance parameter measurement.

[0091] It is understandable that in order to address the problems that the existing loop resistance measurement clamp meter can only perform single-point measurement and cannot realize measurement, and can only measure the total impedance but cannot measure the resistance and reactance of the loop, the embodiment of the present invention adopts multi-frequency testing and multi-channel gating functions to realize distributed non-contact measurement of multi-loop resistance and reactance in engineering practice. By connecting to the voltage gating module and the current gating module, according to the loop gating control logic, the control selection and conduction of the voltage excitation circuit and the current acquisition circuit of the same clamp circuit are realized, and the conduction holding time is controlled, thereby realizing distributed and non-contact measurement of the resistance and reactance parameters of multiple circuits.

[0092] The implementation of the above embodiment has the following effects:

[0093] The technical solution of the present invention can more accurately calculate the resistance and reactance of the circuit to be measured by collecting current at different frequencies, so that the current at different frequencies reflects the response characteristics of the circuit at different frequencies, thereby obtaining more comprehensive impedance information, and simultaneously performing impedance measurement on multiple circuits. Compared with the method of measuring each circuit one by one, distributed measurement can improve measurement efficiency, save time and resources, and realize distributed impedance measurement of the circuit to be measured by controlling the operating frequency of the voltage excitation circuit, so that each circuit to be measured is measured at different frequencies, and its impedance information at different frequencies can be obtained. In addition, the distributed measurement method can better reflect the overall characteristics of the circuit and provide more comprehensive data support, and thus can adopt multi-frequency testing and multi-channel gating functions to realize distributed non-contact measurement of circuit resistance and reactance in engineering practice, thereby improving the efficiency, safety and universality of circuit resistance and reactance parameter measurement.

[0094] Example 3

[0095] Accordingly, the present invention also provides a terminal device, comprising: a processor, a memory, and a computer program stored in the memory and configured to be executed by the processor, wherein when the processor executes the computer program, the distributed loop impedance measurement method as described in any one of the above embodiments is implemented.

[0096] The terminal device of this embodiment includes: a processor, a memory, and a computer program or computer instructions stored in the memory and executable on the processor. When the processor executes the computer program, it implements the steps of the first embodiment described above, such as steps S101 to S103 shown in FIG1 . Alternatively, when the processor executes the computer program, it implements the functions of the modules / units of the system embodiment described above.

[0097] Exemplarily, the computer program may be divided into one or more modules / units, which are stored in the memory and executed by the processor to implement the present invention. The one or more modules / units may be a series of computer program instruction segments capable of performing specific functions, and the instruction segments are used to describe the execution process of the computer program in the terminal device.

[0098] The terminal device may be a computing device such as a desktop computer, laptop, PDA, or cloud server. The terminal device may include, but is not limited to, a processor and memory. Those skilled in the art will appreciate that the schematic diagram is merely an example of a terminal device and does not limit the terminal device. The terminal device may include more or fewer components than shown, or a combination of certain components, or different components. For example, the terminal device may also include input / output devices, network access devices, buses, and the like.

[0099] The processor may be a central processing unit (CPU), other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The general-purpose processor may be a microprocessor or any conventional processor, etc. The processor is the control center of the terminal device, connecting various parts of the entire terminal device using various interfaces and lines.

[0100] The memory can be used to store the computer programs and / or modules, and the processor realizes various functions of the terminal device by running or executing the computer programs and / or modules stored in the memory, and calling the data stored in the memory. The memory can mainly include a program storage area and a data storage area, wherein the program storage area can store an operating system, at least one application required for a function, etc.; the data storage area can store data created according to the use of the mobile terminal, etc. In addition, the memory can include a high-speed random access memory, and can also include a non-volatile memory, such as a hard disk, a memory, a plug-in hard disk, a smart memory card (Smart Media Card, SMC), a secure digital (Secure Digital, SD) card, a flash card (Flash Card), at least one disk storage device, a flash memory device, or other volatile solid-state storage device.

[0101] Wherein, if the module / unit integrated in the terminal device is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the present invention implements all or part of the process in the above-mentioned embodiment method, and can also be completed by a computer program to instruct the relevant hardware. The computer program can be stored in a computer-readable storage medium. When the computer program is executed by a processor, it can implement the steps of each of the above-mentioned method embodiments. Wherein, the computer program includes computer program code, and the computer program code can be in source code form, object code form, executable file or some intermediate form. The computer-readable medium may include: any entity or device capable of carrying the computer program code, recording medium, USB flash drive, mobile hard disk, magnetic disk, optical disk, computer memory, read-only memory (ROM), random access memory (RAM), electric carrier signal, telecommunication signal and software distribution medium. It should be noted that the content contained in the computer-readable medium can be appropriately increased or decreased according to the requirements of legislation and patent practice in the jurisdiction. For example, in some jurisdictions, according to legislation and patent practice, computer-readable media do not include electric carrier signals and telecommunication signals.

[0102] Example 4

[0103] Accordingly, the present invention also provides a computer-readable storage medium, which includes a stored computer program, wherein when the computer program is running, the device where the computer-readable storage medium is located is controlled to execute the distributed loop impedance measurement method described in any one of the above embodiments.

[0104] The specific embodiments described above further illustrate the objectives, technical solutions, and beneficial effects of the present invention. It should be understood that the above descriptions are merely specific embodiments of the present invention and are not intended to limit the scope of protection of the present invention. In particular, it should be noted that any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present invention should be included within the scope of protection of the present invention for those skilled in the art.

Claims

1. A distributed loop impedance measurement method, characterized in that Including: In response to the received loop impedance measurement instruction, parsing the received loop impedance measurement instruction to obtain the loop to be measured; wherein the number of loops to be measured is at least one; Performing impedance measurement on the loops to be measured in sequence, so that during the impedance measurement of each loop to be measured, controlling the voltage excitation loop connected to the loop to be measured to operate at a first frequency, collecting the first current of the loop to be measured at the first frequency, and after obtaining the first current, controlling the voltage excitation loop connected to the loop to be measured to operate at a second frequency, collecting the second current of the loop to be measured at the second frequency, until the first frequency and the corresponding first current and the second frequency and the corresponding second current of each loop to be measured are collected; wherein the magnitudes of the first frequency and the second frequency are different; Calculating the resistance and reactance of each loop to be measured according to the first frequency and the corresponding first current and the second frequency and the corresponding second current of each loop to be measured, thereby completing the distributed measurement of the loop impedance.

2. The distributed loop impedance measurement method according to claim 1, wherein Executed by the test host, the step of parsing the received loop impedance measurement instruction to obtain the loop to be measured, specifically: Generating a loop impedance measurement instruction in response to the user's click operation, and receiving the loop impedance measurement instruction; Parsing the loop impedance measurement instruction to obtain the loop to be measured, and establishing a gated connection to the loop to be measured in sequence, so that the current coil and the voltage coil in the loop to be measured are both communicatively connected to the test host.

3. The distributed loop impedance measurement method according to claim 2, characterized in that, The step of establishing a gated connection to the loop to be measured in sequence, so that the current coil and the voltage coil in the loop to be measured are both communicatively connected to the test host, specifically: Generating a control instruction corresponding to each loop to be measured according to the loop to be measured and its measurement sequence parsed from the loop impedance measurement instruction; Establishing a gated connection to each loop to be measured in sequence according to the measurement sequence, so that during the establishment of the gated connection to each loop to be measured, communicatively connecting the current coil in the loop to be measured to the current gating module in the test host, and communicatively connecting the voltage coil in the loop to be measured to the voltage gating module in the test host; wherein the current gating module is used to collect the current of the loop to be measured, and the voltage gating module is used to control the voltage of the loop to be measured.

4. The distributed loop impedance measurement method according to claim 3, wherein The step of controlling the voltage excitation loop connected to the loop to be measured to operate at a first frequency, collecting the first current of the loop to be measured at the first frequency, and after obtaining the first current, controlling the voltage excitation loop connected to the loop to be measured to operate at a second frequency, collecting the second current of the loop to be measured at the second frequency, specifically: Through the parsing of the control instruction by the voltage gating module and the current gating module, communicatively connecting the voltage gating module and the current gating module to the voltage coil and the current coil in the current loop to be measured respectively; Through a voltage gating module, control the voltage coil connected to the circuit under test to operate at a first frequency, so that the voltage coil generates a voltage excitation circuit in the circuit under test, and through a current gating module, collect the first current of the circuit under test at the first frequency.

5. The distributed loop impedance measurement method according to claim 4, wherein Calculating the resistance and reactance of each circuit under test according to the first frequency and corresponding first current, and the second frequency and corresponding second current of each circuit under test, specifically: When the first frequency is greater than the second frequency, if the first current of the current circuit under test is greater than the second current, the current circuit under test is an inductive circuit; if the first current of the current circuit under test is less than the second current, the current circuit under test is a capacitive circuit; if the first current of the current circuit under test is equal to the second current, the current circuit under test is a resistive circuit; When the first frequency is less than the second frequency, if the first current of the current circuit under test is greater than the second current, the current circuit under test is a capacitive circuit; if the first current of the current circuit under test is less than the second current, the current circuit under test is an inductive circuit; if the first current of the current circuit under test is equal to the second current, the current circuit under test is a resistive circuit; Through the preset calculation formulas for capacitive circuits, inductive circuits and resistive circuits, calculate the resistance and reactance of the current circuit under test according to the first frequency and corresponding first current, and the second frequency and corresponding second current of the current circuit under test, and then calculate the resistance and reactance of each circuit under test.

6. The distributed loop impedance measurement method according to claim 5, characterized in that, The calculation formula of the inductive circuit is as follows: The calculation formula for the capacitive circuit is as follows: The calculation formula for the resistive loop is as follows: Wherein, Z1 and Z2 are the loop impedances of the inductive circuit at the first frequency and the second frequency respectively, Z3 and Z4 are the loop impedances of the capacitive circuit at the first frequency and the second frequency respectively, f1 is the first frequency, f2 is the second frequency, ω1 and ω2 are the phase angles of the first frequency and the second frequency respectively, L is the inductive reactance, C is the capacitive reactance, U0 is the voltage applied by the voltage coil in the circuit under test, I1 is the first current, I2 is the second current, and R is the resistance.

7. A distributed loop impedance measurement system, characterized in that, Comprising: A test host and at least one circuit under test connected to the test host; The test host is configured to execute the distributed loop impedance measurement method according to any one of claims 1-6; The circuit under test includes a current coil and a voltage coil, and both the current coil and the voltage coil are connected to the test host.

8. A distributed loop impedance measurement system according to claim 7, wherein The test host includes an MCU and a current gating module, a voltage gating module, a current acquisition unit and a voltage excitation unit connected to the MCU; The current gating module is further connected to the current acquisition unit, and the voltage gating module is further connected to the voltage excitation unit; The current gating module is connected to the current coils in at least one circuit under test, and the voltage gating module is connected to the voltage coils of at least one circuit under test.

9. A terminal device, characterized in that, Comprising a processor, a memory, and a computer program stored in the memory and configured to be executed by the processor, wherein the processor implements the distributed loop impedance measurement method according to any one of claims 1 to 6 when executing the computer program.

10. A computer-readable storage medium, characterized in that, The computer-readable storage medium includes a stored computer program, wherein when the computer program runs, it controls the device where the computer-readable storage medium is located to execute the distributed loop impedance measurement method according to any one of claims 1 to 6.

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