High temperature material property testing

Abstract

An apparatus for performing material property testing on a sample, including at least one high-temperature furnace including a furnace housing and a susceptor enclosed by the furnace-housing, the susceptor being adapted to receive therein a sample held in a testing unit and a heat source including a generally horizontally oriented heating coil defining an inner opening, the heat source being operative to heat the susceptor while the susceptor is generally horizontally disposed in the inner opening, and thereby to heat the sample therein, the testing unit being operative to perform material property testing on the sample, while the sample is being heated.

Description

[0001] HIGH TEMPERATURE MATERIAL PROPERTY TESTING

[0002] RELATED APPLICATIONS

[0003] Reference is hereby made to U.S. Patent Application No. 63 / 622,216 entitled ‘HIGH TEMPERATURE MATERIAL PROPERTY TESTING’, filed January 18, 2024, the disclosure of which is hereby incorporated by reference and priority of which is hereby claimed pursuant to 37 CFR 1.78(a)(4) and (5)(i).

[0004] FIELD OF THE INVENTION

[0005] The present invention relates generally to material property testing and more particularly to systems and methods for high temperature, rapid throughput material property testing.

[0006] BACKGROUND OF THE INVENTION

[0007] Various types of systems and methods for high temperature material property testing, are known in the art.

[0008] SUMMARY OF THE INVENTION

[0009] The present invention seeks to provide novel systems and methods for performing highly accurate testing of material properties, particularly non- conductive materials, at elevated temperatures and rapid throughput rates, in a variety of testing environments.

[0010] There is thus provided in accordance with a preferred embodiment of the present invention a method for performing material property testing on samples, including inserting a first sample in a first high temperature furnace, heating, by an inductive heat source, the first high temperature furnace, thereby heating the first sample therein, performing material property testing on the first sample while the first sample is being heated, inserting a second sample in a second high temperature furnace, upon completion of the performing the material property7testing on the first sample, heating, by the inductive heat source, the second high temperature furnace, thereby heating the second sample therein, and performing material property testing on the second sample while the second sample is being heated.

[0011] Preferably, the method also includes inserting a third sample in a third high temperature furnace, upon completion of the performing the material property testing on the second sample, heating, by the inductive heat source, the third high temperature furnace, thereby heating the third sample therein and performing the material property testing on the third sample while the third sample is being heated.

[0012] Preferably, the method also includes inserting a fourth sample in a fourth high temperature furnace, upon completion of the performing material property testing on the third sample, heating, by the inductive heat source, the fourth high temperature furnace, thereby heating the fourth sample therein and performing material property testing on the fourth sample while the fourth sample is being heated.

[0013] In accordance with a preferred embodiment of the present invention, the third high temperature furnace includes the first high temperature furnace, the method further including cooling the first high temperature furnace prior to the inserting the third sample therein and the fourth high temperature furnace includes the second high temperature furnace, the method further including cooling the second high temperature furnace prior to the inserting the fourth sample therein.

[0014] Preferably, the inserting the second sample in the second high temperature furnace is carried out prior to completing the perfonning material property testing on the first sample, the inserting the third sample in the third high temperature furnace is carried out prior to completing the performing material property testing on the second sample and the inserting the fourth sample in the fourth high temperature furnace is carried out prior to completing the performing matenal property testing on the third sample.

[0015] Preferably, the method also includes performing the inserting, the heating and the performing material property testing on additional samples.

[0016] Preferably, the material property testing is performed at a throughput rate of at least about one material property test per hour. Preferably, the inductive heat source is capable of heating each the sample to a temperature in a range of between about 1500°C - 2800°C.

[0017] Preferably, each the high temperature furnace includes a unitary' susceptor having a cavity' configured to receive therein the sample assembled in a testing unit.

[0018] Preferably, a longest dimension of the cavity is smaller than a longest dimension of the susceptor.

[0019] Preferably, each the high temperature furnace further includes a non-metallic furnace housing wrapped around an outer surface of the susceptor, at least for providing thermal insulation between the susceptor and the inductive heat source.

[0020] Preferably, the inductive heat source includes an inductive heating coil defining an inner opening, and the method further includes removably disposing each the high temperature furnace in the inner opening when being heated by the inductive heating coil.

[0021] Preferably, a longitudinal axis of the inductive heating coil is generally horizontally oriented and each the high temperature furnace is generally horizontally disposed in the inner opening when being heated by the inductive heating coil.

[0022] Preferably, the method also includes applying, by a load application system, a load to each the sample during performance of the material property testing and measuring displacement of each the sample responsive to the applying of the load.

[0023] Preferably, the method also includes measuring the displacement of each the sample by a deflectometer.

[0024] Preferably, the load application system and the deflectometer extend into each the high temperature furnace, through spaces between turns of the coil, when each the high temperature furnace is being heated by the inductive heat source.

[0025] In accordance with a preferred embodiment of the present invention, at least one of the load application system and the deflectometer includes a hybrid rod including a first refractory portion proximal to the sample and a second insulative portion distal from the sample.

[0026] Preferably, the method also includes controlling, within a modular environmental chamber, an environment in which the material property' testing is performed.

[0027] Preferably, the modular environmental chamber includes an upper sub-chamber housing electronic circuitry of the load application system, an intermediate sub-chamber housing at least a portion of the inductive heat source, and a lower sub-chamber housing electronic circuitry of the deflectometer.

[0028] Preferably, the intermediate sub-chamber of the modular environmental chamber includes thermal insulation, to prevent heating, by the inductive heat source, of the load application system and the deflectometer.

[0029] There is additionally provided, in accordance with another preferred embodiment of the present invention an apparatus for performing material property testing on samples, including a first high temperature furnace configured to receive therein a first sample held in a first testing unit, an inductive heat source, operative to heat the first high temperature furnace and thereby to heat the first sample therein, the first testing unit being operative to perform material property testing on the first sample while the first sample is being heated and at least a second high temperature furnace configured to receive therein a second sample held in a second testing unit, the inductive heat source being operative, upon completion of the performance of the material property testing on the first sample, to heat the second high temperature furnace, and thereby to heat the second sample therein, the second testing unit being operative to perform material property testing on the second sample while the second sample is being heated.

[0030] Preferably, the apparatus also includes a third high temperature furnace configured to receive therein a third sample held in a third testing unit, the inductive heat source being operative, upon completion of the performance of the material property' testing on the second sample, to heat the third high temperature furnace, and thereby to heat the third sample therein, the third testing unit being operative to perform material property testing on the third sample while the third sample is being heated.

[0031] Preferably, the apparatus also includes a fourth high temperature furnace configured to receive therein a fourth sample held in a fourth testing unit, the inductive heat source being operative, upon completion of the performance of the material property testing on the third sample, to heat the fourth high temperature furnace, and thereby to heat the fourth sample therein, the fourth testing unit being operative to perform material property testing on the fourth sample while the fourth sample is being heated.

[0032] In accordance with a preferred embodiment of the present invention, the third high temperature furnace includes the first high temperature furnace, the first high temperature furnace being cooled prior to receipt of the third sample therein and the fourth high temperature furnace includes the second high temperature furnace, the second high temperature furnace being cooled prior to receipt of the fourth sample therein.

[0033] Preferably, the second sample is received by the second high temperature furnace prior to completion of the performance of the material property testing on the first sample, the third sample is received by the third high temperature furnace prior to completion of the performance of the material property testing on the second sample, and the fourth sample is received by the fourth high temperature furnace prior to completion of the performance of the material property testing on the third sample.

[0034] Preferably, the apparatus also includes additional high temperature furnaces adapted to respectively receive additional samples.

[0035] Preferably, the apparatus is configured to perform the material property testing at a throughput rate of at least about one material property test per hour.

[0036] Preferably, the inductive heat source is configured to heat each the sample to a temperature in a range of between about 1500°C - 2800°C.

[0037] Preferably, each the high temperature furnace includes a unitary' susceptor having a cavity configured to receive the sample therein. Preferably, a longest dimension of the cavity is smaller than a longest dimension of the susceptor.

[0038] Preferably, each the high temperature furnace further includes a non-metallic furnace housing wrapped around an outer surface of the susceptor, at least for providing thermal insulation between the susceptor and the inductive heat source.

[0039] Preferably, the inductive heat source includes an inductive heating coil defining an inner opening, each the high temperature furnace being removably disposed in the inner opening when being heated by the inductive heating coil.

[0040] Preferably, a longitudinal axis of the inductive heating coil is generally horizontally oriented and each the high temperature furnace is generally horizontally disposed in the inner opening when being heated by the inductive heating coil.

[0041] Preferably, the apparatus also includes a load application unit operative to apply a load to each the sample during performance of the material property testing.

[0042] Preferably, the apparatus further includes a deflectometer operative to measure displacement of each the sample responsive to the applied load.

[0043] Preferably, the load application unit and the deflectometer extend into each the high temperature furnace, through spaces between turns of the coil, when each the high temperature furnace is being heated by the inductive heat source.

[0044] Preferably, at least one of the load application system and the deflectometer includes a hybrid rod including a first refractory portion proximal to the sample and a second insulative portion distal from the sample.

[0045] Preferably, a system for performing material property testing on samples includes a modular environmental chamber housing the apparatus of a preferred embodiment of the present invention.

[0046] Preferably, the modular environmental chamber includes an upper sub-chamber housing electronic circuitry of the load application unit, an intermediate sub-chamber housing at least a portion of the inductive heat source, and a lower sub-chamber housing electronic circuitry of the deflectometer.

[0047] Preferably, the intermediate sub-chamber of the modular environmental chamber includes thermal insulation, to prevent heating, by the inductive heat source, of the load application unit and the deflectometer.

[0048] There is further provided in accordance with yet another preferred embodiment of the present invention an apparatus for performing material property testing on a sample, including at least one high-temperature furnace including a furnace housing and a susceptor enclosed by the furnace-housing, the susceptor being adapted to receive therein a sample held in a testing unit and a heat source including a generally horizontally oriented heating coil defining an inner opening, the heat source being operative to heat the susceptor while the susceptor is generally horizontally disposed in the inner opening, and thereby to heat the sample therein, the testing unit being operative to perform material property testing on the sample, while the sample is being heated.

[0049] Preferably, the heat source is configured to heat the sample to a temperature in a range of between about 1500°C - 2800°C and the apparatus is operative to perform the material property testing at a throughput rate of at least about one material property test per hour.

[0050] Preferably, the susceptor includes a cavity adapted to receive therein the sample held in the testing unit.

[0051] Preferably, the cavity is a longitudinal cavity, a length of the longitudinal cavity being less than a length of the susceptor.

[0052] Preferably, the furnace housing includes a replaceable non- metallic furnace housing.

[0053] Preferably, the apparatus also includes a load-application unit operative to apply a force to the sample, during the material property testing.

[0054] Preferably, the apparatus further includes a deflectometer operative to measure displacement of the sample, during the material property testing.

[0055] Preferably, at least one of the load application unit and the deflectometer includes a hybrid rod including a first refractory portion positioned proximal to the sample during the testing and a second insulative portion positioned distal from the sample, during the testing.

[0056] Preferably, the at least one high temperature furnace includes a plurality of the high temperature furnaces, at least one of the plurality of the high temperature furnaces being heated by the heat source at least partially concurrently with a sample held in a test unit being inserted in at least another one of the plurality of high temperature furnaces.

[0057] Preferably, a system for performing material property testing on a sample, includes a modular environmental chamber housing the apparatus of a preferred embodiment of the present invention.

[0058] There is also provided in accordance with another preferred embodiment of the present invention a method for performing material property testing on a sample, including providing a heat source including a generally horizontally oriented heating coil defining an inner opening, disposing at least one high temperature furnace in a generally horizontal orientation in the inner opening, the at least one high temperature furnace including a furnace housing and a susceptor enclosed by the furnace-housing, the susceptor being adapted to receive therein a sample held in a testing unit, heating, by the heat source, the susceptor while the susceptor is disposed in the inner opening, thereby heating the sample therein and performing material property testing on the sample, using the testing unit, while the sample is being heated.

[0059] Preferably, the susceptor includes a cavity for receiving therein the sample held in the testing unit.

[0060] Preferably, an entirety of the sample is received within the cavity of the susceptor.

[0061] Preferably, the cavity is a longitudinal cavity, a length of the longitudinal cavity being less than a length of the susceptor.

[0062] Preferably, the heating the sample includes heating the sample to a temperature in a range of between about 1500°C - 2800°C and the performing material property testing includes performing material property testing at a throughput rate of at least about one test per hour. Preferably, the furnace housing is non-metallic and the method further includes replacing the non-metallic furnace housing following the material property testing of the sample and prior to performance of additional material property testing on an additional sample.

[0063] Preferably, the method also includes applying a force to the sample, during the material property testing and measuring displacement of the sample, during the material property testing.

[0064] Preferably, the method also includes applying the force to the sample by a load application system and the measuring the displacement of the sample by a deflectometer, wherein at least one of the load application system and the deflectometer includes a hybrid rod including a first refractory portion positioned proximal to the sample during the testing and a second insulative portion positioned distal from the sample, during the testing.

[0065] Preferably, the at least one high temperature furnace includes a plurality of the high temperature furnaces, the method including heating at least one of the plurality of the high temperature furnaces by the heat source at least partially concurrently with a sample held in a test unit being inserted in at least another one of the plurality of high temperature furnaces.

[0066] Preferably, the method also includes housing the heating coil in a modular environmental chamber.

[0067] There is additionally provided in accordance with yet another preferred embodiment of the present invention an apparatus for performing material property testing on a sample (AMPT), including a high-temperature furnace including a non-metallic furnace housing formed by at least two segments, the at least two segments combinedly bounding a space; and a susceptor at least partially disposed in the space, the susceptor being operative to heat the sample, a heat source operative to heat the susceptor while the susceptor is at least partially disposed in the space and a testing unit at least partially enclosed within the susceptor, for performing the material property testing on the sample.

[0068] There is also provided in accordance with still another preferred embodiment of the present invention an apparatus for performing material property testing on a sample (AMPT), including a high-temperature furnace including a non-metallic furnace housing formed by at least two segments, the at least two segments combinedly bounding a space and a susceptor at least partially disposed in the space, the susceptor being operative to heat the sample, a heat source operative to heat the susceptor while the susceptor is at least partially disposed in the space and a testing unit at least partially enclosed within the susceptor, for performing the material property testing on the sample, the AMPT being capable of heating the sample to a temperature in a range of between about 1500°C - 2800°C and of performing the testing at a throughput rate of at least about one test per hour.

[0069] Preferably, at least one of the at least two segments of the furnace housing includes multiple layers.

[0070] Preferably, the multiple layers include at least one layer of at least one of zirconia, hafnia, at least one high-temperature carbide and thoria interleaved with at least one additional layer of at least one of graphite paper, alumina felt and a ceramic material.

[0071] Preferably, at least one of the furnace housing and the susceptor is readily replaceable between subsequent ones of the at least one test.

[0072] Preferably, the heat source is an inductive heat source.

[0073] Preferably, the susceptor includes at least two parts combinedly forming an enclosure adapted to enclose the testing unit therein.

[0074] Preferably, the susceptor includes one of graphite and silicon carbide.

[0075] Preferably, the testing unit includes one of a three-point bend testing unit, a four-point bend testing unit, and a fracture toughness testing unit.

[0076] Preferably, the apparatus also includes a low-torque load unit operative to control application of a testing load to the sample.

[0077] There is further provided in accordance with an additional preferred embodiment of the present invention an apparatus for performing material property testing on a sample (AMPT) for performing material property testing on a sample, including a high-temperature furnace comprising, a non- metallic furnace housing formed by at least two segments, the at least two segments combinedly bounding a space and a susceptor at least partially disposed in the space, the susceptor being operative to heat the sample and the susceptor including at least two parts combinedly forming an enclosure adapted to hold a testing unit therein, the testing unit being operative to perform the material property testing on the sample when the sample is heated by the susceptor and a heat source operative to heat the susceptor while the susceptor is at least partially- disposed in the space.

[0078] There is yet further provided in accordance with yet an additional preferred embodiment of the present invention an apparatus for performing material property testing on a sample (AMPT) for performing material property testing on a sample, including a high-temperature furnace including a furnace housing bounding a space and a susceptor at least partially disposed in the space, the susceptor being operative to heat the sample and the susceptor including at least two parts combinedly forming an enclosure adapted to hold a testing unit therein, the testing unit being operative to perform the material property testing on the sample when the sample is heated by the susceptor and a heat source operative to heat the susceptor while the susceptor is at least partially disposed in the space, the AMPT being capable of heating the sample to a temperature in a range of between about 1500°C - 2800°C and of perfonning the testing at a throughput rate of at least about one test per hour.

[0079] Preferably, the furnace housing is formed by at least two segments combinedly bounding the space.

[0080] Preferably, at least one of the at least two segments of the furnace housing includes multiple layers.

[0081] Preferably, the multiple layers include at least one layer of at least one of zirconia, hafnia, at least one high-temperature carbide and thoria interleaved with at least one additional layer of at least one of graphite paper, alumina felt and a ceramic material.

[0082] Preferably, at least one of the furnace housing and the susceptor is readily replaceable betw een subsequent ones of the at least one test.

[0083] Preferably, the heat source is an inductive heat source.

[0084] Preferably, the susceptor includes one of graphite and silicon carbide. Preferably, the testing unit includes one of a three-point bend testing unit, a four-point bend testing unit and a fracture toughness testing unit.

[0085] Preferably, the apparatus also includes a low-torque load unit operative to control application of a testing load to the sample.

[0086] There is also provided in accordance with yet another preferred embodiment of the present invention a method for performing material property testing on a sample, including at least partially enclosing the sample and a testing unit within a susceptor of a high-temperature furnace, disposing the susceptor at least partially within a space bounded by at least two segments of a non-metallic furnace housing of the high-temperature furnace, placing the high-temperature furnace at least partially within a heat source, thereafter heating the susceptor using the heat source, thereby heating the sample and thereafter performing material property' testing on the sample, using the testing unit.

[0087] Preferably, the disposing the susceptor at least partially within the space bounded by the at least two segments of the non-metallic furnace housing precedes the placing the high-temperature furnace at least partially within the heat source.

[0088] Preferably, the placing the high-temperature furnace at least partially within the heat source precedes the disposing the susceptor at least partially within the space bounded by the at least two segments of the non-metallic furnace housing.

[0089] Preferably, the at least two segments of a non-metallic furnace housing include multiple layers.

[0090] Preferably, the heating the susceptor includes heating the susceptor using induction.

[0091] Preferably, the heating the sample includes heating the sample to a temperature in a range of between about 1500°C - 2800°C.

[0092] Preferably, the performing material property testing on the sample includes any of a three-point bend test, a four-point bend test, a three-point fracture toughness test and a four-point fracture toughness test.

[0093] Preferably, the performing material property testing on the sample includes using a low-torque load unit to apply a testing load to the sample. Preferably, at least one of the furnace housing and the susceptor is readily replaceable between subsequent ones of the at least one test.

[0094] Preferably, the material property testing on the sample is performed within an environmental chamber and the least partially enclosing the sample and the testing unit within the susceptor occurs outside of the environmental chamber.

[0095] Preferably, the disposing the susceptor at least partially within a space bounded by at least two segments of a non-metallic furnace housing of the high-temperature furnace occurs outside of the environmental chamber.

[0096] Preferably, the method is characterized by a throughput rate of at least about one test per hour.

[0097] BRIEF DESCRIPTION OF THE DRAWINGS

[0098] The present invention will be understood and appreciated more fully based on the following detailed description taken in conjunction with the drawings, in which:

[0099] Figs. 1A, IB, 1C and ID are simplified schematic respective assembled cutaway isometric, front planar, sectional and exploded view illustrations of a system including an apparatus for performing material property testing on a sample (AMPT) and an environmental chamber, constructed and operative in accordance with a preferred embodiment of the present invention. Fig. 1C being taken along line 1C - 1C of Fig. IB;

[0100] Figs. 2A, 2B, 2C and 2D are simplified schematic respective assembled isometric, side planar, sectional and exploded illustrations of the AMPT of Figs. 1A - ID, Fig. 2C being taken along line 2C - 2C of Fig. 2B;

[0101] Figs. 3A, 3B, 3C and 3D are simplified schematic respective assembled isometric, front planar, side planar and exploded view illustrations of a portion of the AMPT of Figs. 1A - 2D;

[0102] Figs. 4A, 4B, 4C, 4D and 4E are simplified schematic respective assembled isometric, side planar, partially exploded, top-facing fully exploded and bottom-facing fully exploded view illustrations of a first embodiment of a high temperature furnace (HTF) and a first embodiment of a testing unit, forming a portion of the AMPT of Figs. 1A - 3D; Fig. 5 is a simplified exploded view illustration of the HTF of Figs. 4A - 4E, and an additional embodiment of a testing unit, forming a portion of the AMPT of Figs. 1A - 3D;

[0103] Figs. 6A, 6B and 6C are simplified schematic respective assembled, first partially exploded and second partially exploded view illustrations of an additional embodiment of an HTF forming a portion of the AMPT of any of Figs. 1A - 3E;

[0104] Figs. 7A, 7B, 7C and 7D are simplified schematic respective assembled isometric, side planar, sectional and exploded view illustrations of a load application system, forming a portion of the AMPT of any of Figs. 1 A - 6C, Fig. 7C being taken along line 7C - 7C of Fig. 7B;

[0105] Figs. 8A, 8B, 8C and 8D are simplified schematic respective assembled isometric, front planar, sectional and exploded view illustrations of an embodiment of a first embodiment of a deflectometer, forming a portion of the AMPT of any of Figs. 1A - 7D, Fig. 8C being taken along line F - F of Fig. 8B;

[0106] Fig. 9A is a simplified schematic assembled isometric illustration of an additional embodiment of a deflectometer, forming a portion of the AMPT of any of Figs. 1A - 7D;

[0107] Figs. 9B. 9C and 9D are simplified schematic respective assembled front planar, side sectional and exploded illustrations of a portion of the deflectometer of Fig. 9A, Fig. 9C being taken along line 9C - 9C of Fig. 9B;

[0108] Figs. 10 A, 10B, 10C, 10D, 10E, 10F, 10G, 10H, 101, 10 J, 10K, 10L and 10M are simplified schematic illustrations showing successive steps in a preparation of a system of the type shown in any of Figs. 1 A - 9D for performing material property testing, in accordance with one preferred embodiment of the present invention, Figs. 10K - 10M all showing a single step and Fig. 10M being taken along line 10M - 10M of Fig. 10L;

[0109] Figs. 11 A, 1 IB, 11C and 1 ID are simplified schematic illustrations showing a use of a system of the type shown in any of Figs. 1A - 10M for performing material property7testing, in accordance with one preferred embodiment of the present invention. Figs. 11A and 11B showing a single step and Figs. 11C and 11D showing an additional single step. Fig. 11B being taken along line 1 IB - 1 IB of Fig. 11 A and Fig. 1 ID being taken along line 1 ID - 1 ID of Fig. 1 1C;

[0110] Fig. 12 is a simplified flow chart illustrating steps of a method of performing material property testing on a sample, in accordance with a preferred embodiment of the present invention.

[0111] Figs. 13A, 13B, 13C and 13D are simplified schematic respective assembled isometric, side planar, sectional and exploded view illustrations of a system including an apparatus for performing material property testing on a sample (AMPT) and an environmental chamber, constructed and operative in accordance with another preferred embodiment of the present invention, Fig. 13C being taken along line 13C - 13C of Fig. 13B;

[0112] Figs. 14A, 14B, 14C, 14D are simplified schematic respective assembled isometric, side planar, sectional and exploded view illustrations of the environmental chamber of Figs. 13A - 13D, Fig. 14C being taken along line 14C - 14C of Fig. 14B;

[0113] Fig. 14E is a simplified schematic partially exploded view illustration of a sub-chamber forming a portion of the environmental chamber of Figs. 14A - 14D, constructed and operative in accordance with a preferred embodiment of the present invention;

[0114] Figs. 14F, 14G, 14H, and 141 are simplified schematic respective first isometric, first cutaway isometric, second isometric, and second cutaway isometric view illustrations of a portion of the sub-chamber of Fig. 14E;

[0115] Figs. 14J and 14K are simplified schematic respective topside isometric and underside isometric view illustrations of a first component of another sub-chamber forming another portion of the environmental chamber of Figs. 14A - 14D; and

[0116] Figs. 14L and 14M are simplified schematic respective topside isometric and underside isometric view illustrations of a second component of the sub-chamber shown in Figs. 14J and 14K;

[0117] Figs. 15A, 15B, 15C and 15D are simplified schematic respective assembled isometric, side planar, sectional and exploded view illustrations of the AMPT of Figs. 13A - 13D, Fig. 15C being taken along line 15C - 15C of Fig. 15B;

[0118] Fig. 15E is a detailed exploded view illustration of a portion of the AMPT of Figs. 15A - 15D;

[0119] Figs. 16A, 16B, 16C, 16D, 16E and 16F are simplified schematic respective assembled isometric, front planar, first side planar, exploded, second side planar and sectional illustrations of a portion of the AMPT of Figs. 13A - 13D, Fig. 16F being taken along line 16F-16F of Fig. 16E;

[0120] Figs. 17A, 17B, 17C, 17D. 17E. 17F, 17G and 17H are simplified schematic respective assembled isometric, side planar, top-facing exploded, bottom-facing exploded, exploded, top-facing partially exploded, bottom-facing partially exploded and detailed exploded view illustrations of a high temperature furnace (HTF) and a first embodiment of a testing unit, forming a portion of the AMPT of Figs. 13A - 13D;

[0121] Fig. 18 is a simplified exploded view illustration of the HTF of Figs. 17A- 17H, and an additional embodiment of a testing unit, forming a portion of the AMPT of Figs. 13A - 13D;

[0122] Figs. 19A, 19B, 19C and 19D are simplified schematic respective assembled isometric, side planar, sectional and exploded view illustrations of a first embodiment of a load application system, forming a portion of the AMPT of any of Figs. 13A - 17H, Fig. 19C being taken along line 19C - 19C of Fig. 19B;

[0123] Figs. 20A and 20B are respective simplified schematic side planar and front planar view illustrations of an additional embodiment of a load application system, forming a portion of the AMPT of any of Figs. 13A - 14M;

[0124] Figs. 21A, 21B, 21C and 21D are simplified schematic respective assembled isometric, side planar, sectional and exploded view illustrations of an embodiment of a deflectometer, forming a portion of the AMPT of any of Figs. 13A - 20B, Fig. 21C being taken along line 21C - 21C of Fig. 21B;

[0125] Figs. 21E, 21F, 21G and 21H are simplified schematic respective assembled isometric, side planar, sectional and exploded illustrations of a portion of the deflectometer of Figs. 21 A - 2 ID, Fig. 21G being taken along line 21 G - 21 G of Fig. 21 F;

[0126] Figs. 22A, 22B, 22C, 22D, 22E, 22F, 22G, 22H, 221, 22J, 22K, 22L, 22M, 22N, 220 and 22P are simplified schematic illustrations showing successive steps in a preparation of a system of the type shown in any of Figs. 13 A - 21H for performing material property testing, in accordance with one preferred embodiment of the present invention, Figs. 22N - 22P all showing a single step and Fig. 22P being taken along line 22P - 22P of Fig. 220;

[0127] Figs. 23 A, 23B, 23C. 23D, 23E, 23F, 23G. 23H, 231, 23J and 23K, are simplified schematic illustrations showing a use of a system of the type shown in any of Figs. 13A - 22P for performing material property testing, in accordance wi th one preferred embodiment of the present invention, Figs. 23A - 23C showing a single step and Figs. 23D - 23E showing an additional single step, Fig. 23B being taken along line 23B - 23B of Fig. 23 A and Fig. 23E being taken along line 23E - 23E of Fig. 23D;

[0128] Fig. 24 is a simplified schematic illustration showing a use of a system of the type shown in any of Figs. 13A - 22P for performing material property testing, in accordance with another preferred embodiment of the present invention; and

[0129] Figs. 25A and 25B together form a simplified flow chart illustrating steps of a method of performing material property testing on a sample, in accordance with another preferred embodiment of the present invention.

[0130] DETAILED DESCRIPTION OF PREFERRED EMBODIMENTS

[0131] Material property testing, such as testing to ascertain how a sample responds to forces, is often performed under non-ambient conditions, such as at elevated temperatures and / or in environments containing a non-atmospheric mixture of gases. In such material property testing, it is desirable to reach testing conditions from an ambient condition, and to return to an ambient condition from testing conditions, quickly and reliably. Conventional systems for performing matenal property testing, such as systems to test any or all of a flexural modulus, a flexural stress, a flexural strain, a flexural stress-strain relationship and a fracture toughness of a sample, suffer from relatively long test cycles, resulting in a relatively low throughput, and typically require a day or longer to insert, test and remove a sample, mainly due to low heating and cooling rates. Therefore, it is an object of the present invention to provide improved systems and methods for performing material property testing, particularly material property testing under high temperatures and in the presence of non-atmospheric mixtures of gas, characterized by relatively high heating and cooling rates and thus by relatively short test cycles and high throughput.

[0132] Reference is now made to Figs. 1A, IB, 1C and ID, which are simplified schematic respective assembled cutaway isometric, front planar, sectional and exploded view illustrations of a system 100 including an apparatus for performing material property testing on a sample (AMPT) 102, an environmental chamber 104 and an integrated computer system 106, constructed and operative in accordance with a preferred embodiment of the present invention, Fig. 1C being taken along line 1C - 1C of Fig. IB, constructed and operative in accordance with a preferred embodiment of the present invention. AMPT 102 is preferably housed within environmental chamber 104.

[0133] In a preferred embodiment of the present invention, integrated computer system 106 of system 100 includes an automated control system 108 and a data acquisition system 110. Integrated computer system 106 is operative to preferably store, and more preferably to create and store, testing profiles including some or all environmental test parameters, including, inter alia, a temperature profile, a gas mixture profile, a load profile and a sample deflection profile. Integrated computer system 106 preferably additionally automatically calculates material properties, such as any or all of a flexural modulus, a flexural stress, a flexural strain, a flexural stress-strain relationship, a Young’s modulus, an ultimate strength and a fracture toughness, using collected data. Thus, system 100 preferably employs computer system 106 to execute pre-programmed test programs, which sequence through each phase of testing, including heating, gas introduction and removal, temperature maintenance, sample testing, and cooling.

[0134] Environmental chamber 104 is preferably a vacuum chamber having a floor 112 and an interior space 114. Environmental chamber 104 is preferably formed with a force-application aperture 116, a heat-source aperture 122, a plurality of wiring apertures 123, a plurality of gas apertures 124, and at least one vacuum aperture 125. Environmental chamber additionally includes a door 126, which typically includes a viewport 128. In an embodiment of the present invention, environmental chamber 104 is formed of an aluminum body having internal passages (not shown), to enable continuous cooling of the environmental chamber body during extreme high temperature testing.

[0135] Gas apertures 124 and vacuum aperture 125 preferably receive corresponding gas and vacuum lines (not shown), respectively, thereby enabling interior space 114 of environmental chamber 104 to be characterized by any of a wide range of gas environments, including, inter alia, vacuum, inert gas, ambient air, environments containing one of a multiplicity of controlled gas mixtures, such as a predetermined percentage of oxygen, reducing gas mixtures and oxidizing gas mixtures. In a preferred embodiment of the present invention, vacuum aperture 125 is preferably in fluid communication with a vacuum pump (not shown), such as a roughing pump or an oil diffusion pump, to supply a rough vacuum or high vacuum environment, characterized by a pressure of approximately I O-2Torr to 10-5Torr, within interior space 114 of environmental chamber 104. Additionally, vacuum aperture 125 may be in fluid communication with a turbo-molecular pump (not shown) or an ion getter pump (not shown) to supply a vacuum environment, characterized by a pressure of less than 10'5Torr, within interior space 114 of environmental chamber 104.

[0136] Reference is now made to Figs. 2A, 2B. 2C and 2D, which are simplified schematic respective assembled isometric, side planar, sectional and exploded illustrations of AMPT 102, Fig. 2C being taken along line 2C - 2C of Fig. 2B. It is appreciated that AMPT 102 is operative to perform material property testing on a sample 130, seen particularly in Fig. 2C.

[0137] AMPT 102 includes a heat source 140, described hereinbelow with particular reference to Figs. 3 A - 3D; a high-temperature furnace (HTF) 150, such as an HTF 152, described hereinbelow with particular reference to Figs. 4A - 5, or an HTF 154, described hereinbelow with particular reference to Figs. 6A - 6C; a testing unit 160, such as a four-point bending (4PB) testing unit 162. described hereinbelow with particular reference to Figs. 4D - 4E, a 4PB fracture testing unit, a three-point bending (3PB) testing unit 166, described hereinbelow with particular reference to Fig. 5, or a 3PB fracture testing unit; a load application system 170, described hereinbelow with particular reference to Figs. 7A - 7D; a deflectometer 180, such as a deflectometer 182, described hereinbelow with particular reference to Figs. 8A - 8D, or a deflectometer 184, described hereinbelow with particular reference to Figs. 9A - 9D; a mounting base 190; and an insulating mat 192.

[0138] AMPT 102 further includes a left support wall 210, a right support wall 220, a first support rod 232 and a second support rod 234. First support rod 232 includes a left end 262 and a right end 264. Similarly, second support rod 234 includes a left end 266 and a right end 268. A plurality of fasteners, such as a plurality of screws 272, affixes respective left ends 262 and 266 of first and second support rods 232 and 234 to left support wall 210. Similarly, a plurality of fasteners, such as a plurality of screws 274, affixes respective right ends 264 and 268 of first and second support rods 232 and 234 to right support wall 220.

[0139] Left support wall 210 includes an upper surface 276, which is formed with a furnace recess 278 operative to receive HTF 150. As seen particularly in Fig. 2C, furnace recess 278 preferably includes a pin recess 282, operative to receive a guiding pin 284. Left support wall 210 further includes a lower portion 286, which is formed with a plurality of recesses 288 operative to receive a corresponding plurality of mounting pins 290, for removably mounting left support wall 210 onto mounting base 190.

[0140] Similarly, right support wall 220 includes an upper surface 292, which is formed with a furnace recess 294 operative to receive HTF 150. As seen particularly in Fig. 2C, furnace recess 294 preferably includes a pin recess 296, operative to receive a guiding pin 298. Similar to left support wall 210, right support wall 220 also includes a lower portion 302, which is formed with a plurality of recesses (not shown), operative to receive a corresponding plurality of mounting pins 306, for removably mounting right support wall 220 onto mounting base 190. Mounting pins 290 and 306 are preferably fixedly mounted in a corresponding plurality of recesses or apertures (not shown) formed in mounting base 190.

[0141] As seen particularly in Fig. 2C, furnace recesses 278 and 294 are shaped and positioned such that a longitudinal axis A of HTF 150 is preferably generally horizontally oriented, generally parallel to mounting base 192 and generally perpendicular to the force of gravity. It is a particular feature of the present invention that HTF 150 is generally horizontally, rather than vertically oriented, which gives rise to several advantages during operation of AMPT 102, as is detailed henceforth. In a preferred embodiment of the present invention, HTF 150 is horizontally oriented. Alternatively, HTF 150 may be approximately horizontally oriented, for example within ±30° to the horizontal.

[0142] Reference is now made to Figs. 3A, 3B, 3C and 3D, which are simplified schematic respective assembled isometric, front planar, side planar, and exploded view illustrations of heat source 140 and HTF 150. HTF 150 includes a non-metallic furnace housing (NMFH) 310, such as an NMFH 312, described hereinbelow with particular reference to Figs. 4A- 5, or an NMFH 314, described hereinbelow with particular reference to Figs. 6A - 6C, and a susceptor 320. Susceptor 320 is preferably inductively heated by heat source 140.

[0143] Heat source 140 is preferably an induction heat source, and more preferably an ultra-high frequency induction heat source, and includes a heater body 322 and a coil 324 having a plurality of turns 326. Coil 324 is preferably metallic, and is more preferably formed of copper. An exemplary heat source suitable for use as heat source 140 is an EKOHEAT 15 KW, commercially available from Ambrell Induction Heating Solutions of Rochester, NY, USA. It is appreciated that other types of heat source 140 of a variety' of powers are also possible and are included in the scope of the present invention.

[0144] As seen particularly in Fig. 3D. turns 326 of coil 324 define a space or inner opening 328, which is operative to receive HTF 150. In a preferred embodiment of the present invention, as seen particularly in Fig. 3B, a longitudinal axis A of coil 326 is generally horizontally oriented and HTF 150 is generally horizontally disposed in inner opening 328 when being heated by coil 326. In a preferred embodiment of the present invention, coil 326 is horizontally oriented. Alternatively, coil 326 may be approximately horizontally oriented, for example within ±30° to the horizontal. HTF 150 is preferably generally horizontally disposed along axis A when inserted in inner opening 328. It is appreciated that the orientation of coil 326 generally horizontally, rather than vertically, provides several advantages in operation of AMPT 100.

[0145] As a result of the generally horizontal orientation of HTF 150 and coil 324, turns 326 of coil 324 serve to help support susceptor 320, such that no additional mechanical support of susceptor 320 is required. Furthermore, at the high temperatures at which AMPT 102 is operative, a vertical susceptor would create a strong ‘chimney effect’, in which convection currents would carry heat away from the susceptor, thereby limiting maximum susceptor temperature, creating vertical thermal gradients and placing an additional heat load on sensitive load application system 170 and deflectometer 180. The generally horizontal orientation of susceptor 320 obviates this problem.

[0146] Additionally, the horizontal orientation of space 328 defined by coil 324 facilitates easy insertion and removal of horizontally orientated HTF 150, without interference with adjacent vertically oriented load application system 170 and deflectometer 180, thus allowing rapid throughput of system 100.

[0147] As seen particularly in Figs. 1 A - ID, heat-source aperture 122 in environmental chamber 104 preferably accommodates heat source 140 such that heater body 322 is housed fully or mostly outside of environmental chamber 104, while coil 324 is preferably housed fully within interior space 114 of environmental chamber 104. Preferably, a plurality of sealing components (not shown) form a substantially vacuum-tight seal between heat-source aperture 122 and an environment surrounding environmental chamber 104.

[0148] Coil 324 preferably has one or more turns 326. In a typical embodiment of the present invention, coil 324 has a size between 200 cm3- 2,000 cm3, and between 2 - 10 turns 326. It is appreciated that the formation of coil 324 with a plurality of turns 326 provides a more even heating, by coil 324, of HTF 150.

[0149] As seen particularly at enlargement B in Fig. 3C and in Fig. 3D, in a fully assembled operational state, sample 130 and testing unit 160 are both enclosed within HTF 150, which in turn is enclosed within coil 324 of heat source 140. Heat source 140 preferably heats susceptor 320 using induction heating. In turn, susceptor 320 heats sample 130 and testing unit 160, preferably using conduction heating, radiation heating, or a combination of conduction heating and radiation heating.

[0150] It is a particular feature of the present invention that only a relatively small portion of system 100 is heated to a testing temperature. More specifically, preferably only susceptor 320, testing unit 160 and sample 130 are heated to a testing temperature at which material properties of sample 130 are tested. Susceptor 320 is particularly designed to have a size similar to a size of sample 130, thereby reducing an amount of material required to be heated prior to, and cooled following, a testing of sample 130. In a typical embodiment of the present invention, susceptor 320 has a size between 40 cm3- 400 cm3. The relative smallness of material that is heated and cooled preferably contributes to relatively high heating and cooling rates of system 100, compared to conventional systems for material property testing.

[0151] It is appreciated that a heating rate and a cooling rate of a component, as well as an amount of time required to heat and / or cool a component, is directly proportional to an amount of material in the component, i.e., to a mass of the component. Thus, each of a heating rate, a cooling rate, a heating time and a cooling time of a component formed of a given material is directly proportional to a volume of the component. Preferably, in contrast with conventional material property testing systems, system 100 only heats and cools a relatively small mass and volume to test sample 130. Therefore, heating rates, cooling rates, heating times and cooling times of system 100 are lower, and preferably significantly lower, than those of conventional systems.

[0152] Reference is now made to Figs. 4A, 4B, 4C. 4D and 4E which are simplified schematic respective assembled isometric, side planar, partially exploded, top-facing fully exploded and bottom-facing fully exploded view illustrations of HTF 152, which is an embodiment of HTF 150, and 4PB testing unit 162. which is an embodiment of testing unit 160. Reference is additionally- made to Fig. 5. which is a simplified schematic exploded view illustration of HTF 152, which is an embodiment of HTF 150, and 3PB testing unit 166, which is an embodiment of testing unit 160. Reference is further made to Figs. 6A, 6B and 6C, which are simplified schematic respective assembled, first partially exploded and second partially exploded view illustrations of HTF 154, which is an alternative embodiment of HTF 150.

[0153] As described hereinabove, HTF 150 includes NMFH 310 and susceptor 320. NMFH 310 includes a plurality of shells 330, each of which is preferably cylindrical. However, it is appreciated that shells 330 may have any suitable shape operative to accommodate susceptor 320. When in an assembled operative orientation, shells 330 preferably define a load-rod aperture, a displaceable-rod aperture, and at least one temperature-reader aperture. It is a particular feature of the present invention that shells 330 are formed of any suitable number of shell segments.

[0154] As seen particularly in Figs. 4A - 5, in NMFH 312. plurality of shells 330 is embodied as a plurality of shells 332, which are preferably semi- cylindrical. Shells 332 preferably include a first upper shell segment 342, a first lower shell segment 344, a second upper shell segment 346 and a second lower shell segment 348.

[0155] As seen particularly in Figs. 4D, 4E and 5, first upper shell segment 342 is formed with a load-rod aperture 352, a pair of temperature-reader cut-outs 354, an inner surface 356 and an outer surface 358. Second upper shell segment 346 is similarly formed with a load-rod aperture 362, a pair of temperature-reader cut-outs 364, an inner surface 366 and an outer surface 368.

[0156] As seen particularly in Fig. 4C, when in an assembled operative state, first upper shell segment 342 nests within second upper shell segment 346, such that outer surface 358 of first upper shell segment 342 is substantially fully in contact with inner surface 366 of second upper shell segment 346. Additionally, in an assembled operative state, load-rod aperture 362 preferably overlies loadrod aperture 352 and each of temperature-reader cut-outs 364 is aligned with a corresponding one of temperature-reader cut-outs 354.

[0157] As seen particularly in Figs. 4D, 4E and 5, first lower shell segment 344 is formed with a displaceable-rod aperture 372, a pair of temperature-reader cut-outs 374, an inner surface 376 and an outer surface 378. Second lower shell segment 348 is similarly formed with a displaceable-rod aperture 382, a pair of temperature-reader cut-outs 384, an inner surface 386 and an outer surface 388.

[0158] As seen particularly in Fig. 4C, when in an assembled operative state, first lower shell segment 344 nests within second lower shell segment 348, such that outer surface 378 of first lower shell segment 344 is substantially fully in contact with inner surface 386 of second lower shell segment 348. Additionally, in an assembled operative state, displaceable-rod aperture 372 preferably overlies displaceable-rod aperture 382 and each of temperature-reader cut-outs 374 is aligned with a corresponding one of temperature-reader cut-outs 384. In a preferred embodiment of the present invention, in an assembled operative orientation, load-rod apertures 352 and 362 and displaceable-rod apertures 372 and 382 are all generally coaxial with one another along an axis 390.

[0159] As seen particularly in Fig. 4C, inner surfaces 356 and 376 of respective first upper and lower shell segments 342 and 344 together define a space 392 operative to receive susceptor 320. Thus, NMFH 312 is formed by at least two segments, such as first upper and lower shell segments 342 and 344, and the at least two segments combinedly bound a space, such as space 392, and susceptor 320 is disposed within space 392.

[0160] In another embodiment of the present invention, as seen particularly in Figs. 6A - 6C, in NMFH 314, plurality of shells 330 is embodied as a plurality of shells 393, and include a plurality of shell segments, which are preferably quarter-cylindrical. Shells 393 preferably include a set of first shell segments 394 and a set of second shell segments 396.

[0161] As seen particularly in Fig. 6C, each of first shell segments 394 has a pair of elongate edges 398, each of which is formed with a semi-circular cutout 400 in a central portion thereof. Additionally, each of first shell segments 394 includes an inner surface 401 and an outer surface 402.

[0162] Similarly, each of second shell segments 396 has a pair of elongate edges 403, each of which is formed with a semi-circular cutout 404 in a central portion thereof. Additionally, each of second shell segments 396 includes an inner surface 405 and an outer surface 406. When in an assembled orientation, each elongate edge 398 of each first shell segment 394 is substantially fully in contact with an elongate edge 398 of another one of first shell segments 394, and semi-circular cutouts 400 of adjacent first shell segments 394 align to define circular apertures. Similarly, in an assembled orientation, each elongate edge 403 of each second shell segment 396 is substantially fully in contact with an elongate edge 403 of another one of second shell segments 396, and semi-circular cutouts 404 of adjacent second shell segments 396 align to define circular apertures.

[0163] Additionally, when in an assembled operative orientation, first shell segments 394 nest within second shell segments 396, such that outer surfaces 402 of first shell segments 394 are substantially fully in contact with inner surfaces 405 of second shell segments 396.

[0164] Additionally, in an assembled operative state, each of the circular apertures defined by semi-circular cutouts 404 overlies a corresponding circular aperture defined by semi-circular cutouts 400, thereby defining a plurality of circular apertures analogous to load-rod apertures 362 and 352, displaceable-rod apertures 372 and 382, and apertures formed by temperature-reader cut-outs 364 and 354.

[0165] Inner surfaces 401 of first shell segments 394 together define a space 407 operative to receive susceptor 320. Thus, NMFH 310 is formed by at least two segments, such as four shell segments 394, and the at least two segments combinedly bound a space, such as space 407, and susceptor 320 is disposed within space 407.

[0166] Each of shells 330 is preferably composed completely or mainly of a rigid ceramic material, such as, inter alia, zirconia, hafnia, high-temperature carbides or thoria, or a flexible ceramic material, such as, inter aha, graphite paper or alumina felt. In a preferred embodiment of the present invention, different layers of shells are at least partly composed of mutually different materials.

[0167] For example, in an embodiment of the present invention, shells 330 of NMFH 310 include three layers of shell segments. In this exemplary' embodiment, a first set of shell segments is composed of zirconia, hafnia, high- temperature carbides or thoria, the second set of shell segments is composed of graphite paper or alumina felt, and a third set of shell segments is composed of the same material as the first set of shell segments. Thus, in this exemplary embodiment, NMFH 310 includes multiple layers of shells 330, which include two layers of at least one of zirconia, hafnia and thoria, interleaved with at least one layer of at least one of graphite paper, alumina felt and a ceramic material.

[0168] As described hereinabove, shells 330 include separate segments, such as shell segments 342 and 344 or shell segments 394, and separate layers, such as first shell segments 342 and 344 and second shell segments 346 and 348; or shell segments 394 and shell segments 396. The separate segments and layers of shells 330 preferably reduce a risk of mechanical damage of shells 330 due to thermal stress, relative to contiguous shells, which are non-segmented and nonlayered. Additionally, if one segment or layer of shells 330 does suffer mechanical damage, such as cracking, additional segments and layers of shells 330 may remain undamaged and are still available for use in NMFH 310.

[0169] Furthermore, since multiple layers of shells 330 are available for use in NMFH 310, a user or supplier is preferably able to select a customized pluarlity of shells 330 to form an NMFH 310 having a customized blend of material and a customized thickness. A number and composition of shells 330 included in NMFH 310 is preferably at least partially determined by an amount of thermal insulation desired to provide a relatively low amount of heat loss from susceptor 320, thereby increasing a heating efficiency thereof. Additionally, a number and composition of shells 330 included in NMFH 310 is preferably at least partially determined by an amount of thermal insulation desired to provide adequate thermal shielding between susceptor 320 and other components of system 100, most particularly coil 324, thereby preventing thermal damage to other components of system 100, most particularly to coil 324.

[0170] Furthermore, a number and composition of shells 330 included in NMFH 310 may be at least partially determined by a difference in respective sizes, particularly a difference in respective cross-sectional areas, between space 328 and susceptor 320. In other words, the number and composition of shells 330 included in NMFH 310 may be chosen to ensure that HTF 150 fits conveniently within space 328 defined by coil 324. Preferably, in addition to providing thermal insulation, some of shells 330 of NMFH 310 form a diffusion barrier, reducing undesired particle migration between different components of system 100. For example, a system may include a component formed of solid graphite that is physically in contact with or close to a component formed of solid zirconia. At high temperatures, graphite atoms from the solid graphite tend to diffuse into the solid zirconia.

[0171] Therefore, if susceptor 320 is formed of graphite, and first shell segments 342 and 344 or first shell segments 394 are formed of zirconia, NMFH 310 preferably includes an optional shell formed of graphite paper (not shown) between susceptor 320 and first shell segments 342 and 344 or first shell segments 394. The optional graphite paper shell acts as a diffusion barrier, fully or partially preventing an undesired migration of graphite particles from susceptor 320 into first shell segments 342 and 344 or first shell segments 394. Preferably, by reducing the migration of graphite atoms out of susceptor 320, the optional graphite paper shell prolongs a lifetime of susceptor 320. Additionally, by reducing the migration of graphite atoms into first shell segments 342 and 344 or first shell segments 394, the optional graphite paper shell preferably prolongs a lifetime of first shell segments 342 and 344 or first shell segments 394.

[0172] As described above, the insulation provided by NMFH 310 results in a relatively low amount of heat loss from susceptor 320. It is appreciated that the relatively low amount of heat loss from susceptor 320 results in a relatively efficient heating of susceptor 320, testing unit 160 and sample 130. characterized by a relatively short amount of time required to heat susceptor 320. testing unit 160 and sample 130 and a relatively high heating rate of susceptor 320, testing unit 160 and sample 130.

[0173] Additionally, the relatively low amount of heat loss from susceptor 320 results in a relatively low undesired heating of components other than susceptor 320, testing unit 160 and sample 130. The relatively low undesired heating, compared to conventional material property testing systems, in turn results in a relatively short amount of time required to cool system 100 following a testing of sample 130, since, relative to conventional material property testing systems, system 100 includes a low level of undesired heat that must be removed as part of a cooling process.

[0174] Susceptor 320 may have any suitable shape. In the embodiment shown in Figs. 1A - 11D, susceptor 320 is cylindrical and is formed of an electrically conductive material, such as inter alia, graphite or silicon carbide. In a preferred embodiment of the present invention, susceptor 320 includes an upper semi-cylindrical portion 408 and a lower semi-cylindrical portion 410. In the embodiment shown in Figs. 1 A - 1 ID, upper and lower semi-cylindrical portions 408 and 410 are identical to one another. In another embodiment of the present invention, upper and lower semi-cylindrical portions 408 and 410 are not identical to one another.

[0175] As seen particularly in Figs. 4D, 4E and 5, upper semi-cylindrical portion 408 includes a generally planar surface 412, a curved surface 414 formed with a pair of slots 415, a load-rod bore 416, a pair of pin recesses 418 and a testing-unit recess 420. In an assembled operative orientation, load-rod bore 416 is preferably coaxial with load-rod apertures 352 and 362 along axis 390.

[0176] Low er semi-cylindrical portion 410 similarly includes a generally planar surface 422, a curved surface 424, a displaceable-rod bore 426, a pair of pin recesses 428 and a testing-unit recess 430. In an assembled operative orientation, displaceable-rod bore 426 is preferably coaxial with displaceable-rod apertures 372 and 382 along axis 390. Each of pin recesses 418 and 428 is operative to receive a pin 432. Lower semi-cylindrical portion 410 additionally includes a left end 436, formed with a pin-receiving slot 438, and a right end 442, formed with a pin-receiving slot 444.

[0177] As seen particularly at enlargement detail C in Fig. 4B, testing-unit recesses 420 and 430 of respective upper and lower semi -cylindrical portions 408 and 410 together define an enclosure 450. Enclosure 450 is operative to receive testing unit 160. Thus, susceptor 320 includes at least two parts, such as upper and lower semi-cylindrical portions 408 and 410, which combinedly form an enclosure, such as enclosure 450 defined by testing-unit recesses 420 and 430, adapted to enclose testing unit 160 therein. In a preferred embodiment of the present invention, recess 450 can enclose a variety of types of testing units 160, such as any of, inter alia, 4PB testing unit 162, described herein with particular reference to Figs. 4D and 4E, a 4PB fracture testing unit, 3PB testing unit 166, described hereinbelow with particular reference to Fig. 5, or a 3PB fracture testing unit. Testing unit 160 is operative to perform material property testing of sample 130. Components of testing unit 160 are preferably formed of a temperature-resistant material, such as, inter alia, graphite or silicon carbide.

[0178] As seen particularly in Figs. 4D and 4E, and more particularly at enlargement D in Fig. 4D and enlargement E in Fig. 4E, respectively, in an embodiment of the present invention, testing unit 160 is embodied as 4PB testing unit 162 and includes an upper loading pin carrier (ULPC) 522, a lower support pin carrier (LSPC) 524 and four, preferably cylindrical, pins, including a pair of upper loading pins 526 and a pair of lower support pins 528. Upper loading pins 526 and lower support pins 528 preferably allow for load equalization across sample 130 during material property testing, as required by, for example, testing standards set forth by ASTM International and the International Organization for Standardization (ISO).

[0179] In the embodiment shown in Figs. 1A - HD, all of guiding pins 284 & 298, pins 432, upper loading pins 526 and lower support pins 528 are identical to one another. In another embodiment of the present invention, at least some of guiding pins 284 & 298, pins 432, upper loading pins 526 and lower support pins 528 are not identical to one another.

[0180] ULPC 522 includes an inner surface 530, which is formed with a pair of pin recesses 532, each operative to receive one of upper loading pins 526. ULPC 522 is preferably additionally formed with a pair of deformation cut-outs 534, which are operative to receive portions of sample 130 which may be deformed during testing. ULPC 522 further includes an outer surface 536, which is additionally preferably formed with a load-rod recess 538. In an assembled operative orientation, load-rod recess 538 is preferably coaxial with load-rod apertures 352 & 362 and load-rod bore 416 along axis 390. In another preferred embodiment of the present invention, load-rod recess 538 is obviated. Similarly to ULPC 522, LSPC 524 includes an inner surface 540, which is formed with a pair of pin recesses 542, each operative to receive one of lower support pins 528. Inner surface 540 of LSPC 524 is preferably additionally formed with a defonnation recess 546 operative to receive portions of sample 130 which may be deformed during testing. LSPC 524 is additionally formed with a displaceable-rod aperture 548. In an assembled operative orientation, displaceable-rod aperture 548 is preferably coaxial with displaceable-rod apertures 372 and 382 and displaceable-rod bore 426 along axis 390.

[0181] It is appreciated that the 4PB fracture testing unit is typically identical to 4PB testing unit 162. As is known in the art, unlike 4PB testing unit 162, which receives an unnotched sample 130, the 4PB fracture testing unit receives a sample having a notch, preferably in a lower central portion thereof.

[0182] As seen particularly in Fig. 5, and more particularly at enlargement F in Fig. 5. in an additional embodiment of the present invention, testing unit 160 is embodied as 3PB testing unit 166 and includes LSPC 524 and two lower support pins 528. Lower support pins 528 preferably allow for load equalization across sample 130 during material property testing, as required by, for example, testing standards set forth by ASTM International and the International Organization for Standardization (ISO). Each of lower support pins 528 is preferably received by one of pin recesses 542 formed in inner surface 540 of LSPC 524. In an assembled operative orientation, displaceable-rod aperture 548 of LSPC 524 is preferably coaxial with displaceable-rod apertures 372 and 382 and displaceable-rod bore 426 along axis 390.

[0183] It is appreciated that the 3PB fracture testing unit is typically identical to 3PB testing unit 166. As is known in the art, unlike 3PB testing unit 166, which receives an unnotched sample 130, the 3PB fracture testing unit receives a sample having a notch, preferably in a lower central portion thereof.

[0184] Reference is now made to Figs. 7A, 7B, 7C and 7D, which are simplified schematic respective assembled isometric, side planar, front sectional and exploded illustrations of load application system 170, Fig. 7C being taken along line 7C - 7C in Fig. 7B. Load application sy stem 170 is operative to control an application of a testing load to sample 130. It is appreciated that the particular embodiment of load application system, described herein with reference to Figs. 7A - 7D, is provided by way of example only and that other types of load application systems may be used within the present invention.

[0185] Load application system 170 typically includes a linear actuator 602, which includes a drive shaft 604, and a load rod 610. Linear actuator 602 is preferably a low-torque load unit operative to control application of a testing load to sample 130. More specifically, linear actuator 602 is preferably operative to drive load rod 610, which in turn applies a force constituting a testing load to sample 130 during testing thereof. Linear actuator 602 is preferably a low-torque precision linear actuator which drives and positions load rod 610 at a controlled rate, and may be any suitable linear actuator, such as, inter alia, a stepper motor or a DC gear box. Exemplary stepper motors suitable for use as linear actuator 602 include an 8K2105AF4-100SMSN-001 and an 4K4105AA4-150SUSEK112- DSI-001, both commercially available from Dings' Motion of Changzhou City, Jiangsu Province, China.

[0186] A force sensor 616 connects linear actuator 602 with load rod 610 and preferably measures a load applied to sample 130 by load application system 170. Force sensor 616 is typically embodied as a load cell, preferably a bidirectional load cell. Exemplary load cells each suitable for use as force sensor 616 include an LSP-1 and an LSP-10, both commercially available from Transducer Techniques of Temecula, CA, USA.

[0187] As seen particularly in Figs. 7C and 7D, load application system 170 further includes an actuator connector assembly 622 and a load rod connector assembly 624. Actuator connector assembly 622 includes an upper load cell connector 626 and an actuator connector rod 630. Upper load cell connector 626 is preferably formed with a pair of fastener apertures 632 and a connector-rod aperture 634. A pair of fasteners 636 are preferably mounted in fastener apertures 632 and fasten actuator connector assembly 622 to force sensor 616.

[0188] Load rod connector assembly 624 includes a lower load cell connector 646, which is preferably formed with a pair of fastener apertures 648, a load rod aperture 652 and a load rod fastener aperture 654. A plurality of fasteners 656 are preferably mounted in fastener apertures 648 and fasten load rod connector assembly 624 to force sensor 616. A fastener 658 is preferably mounted in load rod fastener aperture 654 and fastens load rod connector assembly 624 to load rod 610. Load rod 610 is preferably formed of a temperature-resistant material, such as, inter alia, graphite or silicon carbide.

[0189] Load application system 170 further includes a sealing connector 662, an actuator mount 664, and a mounting plate 670. Linear actuator 602 is fixedly mounted in actuator mount 664, which is in turn mounted on sealing connector 662. Mounting plate 670 is preferably formed with a seal housing aperture 672, operative to receive sealing connector 662, and a plurality of fastener apertures 676, operative to receive a plurality of fasteners for the fixed attachment of mounting plate 670 to an upper surface of environmental chamber 104. Mounting plate 670 preferably forms a substantially vacuum-tight seal between aperture 116 and an environment surrounding environmental chamber 104.

[0190] As seen particularly in Fig. 7C, a lower end 682 of actuator connector rod 630 is housed within sealing connector 662 and surrounded by an O-ring 684. Preferably, sealing connector 662 and O-ring 684 together form a substantially vacuum-tight seal between apertures 116 & 672 and an environment surrounding environmental chamber 104. Lower end 682 of actuator connector rod 630 is preferably mounted in connector-rod aperture 634 of upper load cell connector 626. An upper end 688 of actuator connector rod is preferably housed wi thin actuator mount 664 and affixed to drive shaft 604 of linear actuator 602.

[0191] Reference is now made to Figs. 8A, 8B, 8C and 8D, which are simplified schematic respective assembled isometric, front planar, side sectional and exploded illustrations of deflectometer 182, which is an embodiment of deflectometer 180, Fig. 8C being taken along line 8C - 8C in Fig. 8B; to Fig. 9A, which is a simplified schematic assembled isometric illustration of deflectometer 184, which is an alternative embodiment of deflectometer 180; and to Figs. 9B, 9C, 9D and 9E which are simplified schematic respective assembled enlarged detailed view, front planar, side sectional and exploded illustrations of a portion of deflectometer 184, Fig. 9D being taken along line 9D - 9D of Fig. 9C.

[0192] It is appreciated that the particular embodiments of deflectometer 180 described and shown herein, with reference to Figs. 8A - 9E, are by way of example only and that other types of deflectometers may alternatively be used within the present invention. For example, non-contact systems may be employed in the present invention for sensing deflection of a sample, such as, by way of nonlimiting example only, systems based on laser interferometry, ultrasonic distance sensing and confocal distance measurement.

[0193] Deflectometer 180 is a position sensor, preferably a high temperature linear variable differential transformer (LVDT) sensor, which is operative to measure a deflection of sample 130 during testing thereof.

[0194] Deflectometer 180 includes a displaceable rod 710 having a working end 712 and a mounting end 714. Working end 712 of displaceable rod 710 is typically tapered and a includes a generally planar top surface 716, which preferably remains in mechanical contact with sample 130 during testing thereof. Preferably, top surface 716 does not readily cut or notch sample 130. Displaceable rod 710 is preferably formed of a temperature-resistant material, such as, inter alia, graphite or silicon carbide.

[0195] As seen particularly in Fig. 8D, deflectometer 180 further includes a movable mounting platform 720, which is formed with a displaceable-rod aperture 722, in which mounting end 714 of displaceable rod 710 is fixedly mounted. Movable mounting platform 720 preferably further includes a supportrod aperture 724, which slidably receives a support rod 730 of deflectometer 180. Support rod 730 includes a mounting end 734, which is preferably housed within a hollow cylindrical support 736 and fixedly mounted within a suitable recess formed in mounting plate 190 of AMPT 102. Movable mounting platfonn 720 preferably further includes a core-rod slot 742 and a fastener aperture 744.

[0196] Deflectometer 180 preferably additionally includes a position transducer 750, which is preferably a high temperature LVDT transducer. An exemplary LVDT transducer suitable for use as position transducer 750 is a LVDT MHR 250 ASSY, commercially available from TE Connectivity of Schaffhausen, Switzerland. Position transducer 750 preferably includes a core rod 752, having a working end 754 and a mounting end 756. Mounting end 756 of core rod 752 is preferably fixedly mounted to a rod 760. Rod 760 includes an upper end 762, to which core rod 752 is mounted, and a lower end 764, which is mounted within core-rod slot 742 using a fastener 766, which is received by fastener aperture 744.

[0197] As seen particularly in Fig. 8C, working end 754 of core rod 752 is slidably mounted within a transducer body 768 of position transducer 750. Rod 760 and core rod 752 are fixedly mounted to one another, for example, by complementary threading (not shown) on mounting end 756 of core rod 752 and upper end 762 of rod 760.

[0198] Position transducer 750 is in turn fixedly housed at least partially within a transducer housing 770 by a plurality of fasteners 771. At least one of fasteners 771 is preferably resilient, preferably being formed of neoprene, allowing a relatively strong frictional engagement between transducer housing 770 and position transducer 750 without damaging or deforming position transducer 750.

[0199] A sidewall 772 of transducer housing 770 is formed with a plurality of, preferably two, air apertures 774 operative to receive a plurality of air fittings 775 for cooling at least a portion of deflectometer 180, preferably including position transducer 750. Air fittings 775 are preferably connected to an air supply (not shown) useful in cooling at least a portion of deflectometer 180.

[0200] A top wall 776 and a bottom wall 778 of transducer housing 770 are each preferably formed with a support-rod aperture 780, operative to fixedly receive support rod 730, a displaceable-rod aperture 782, operative to slidably receive displaceable rod 710, and a transducer aperture 784, operative to receive a portion of transducer 750, such as transducer body 768 or core rod 752. A plurality of fasteners 786 preferably fixedly attach transducer housing 770 to support rod 730.

[0201] It is appreciated that during a preferred use of system 100, support rod 730, body 768 of position transducer 750 and transducer housing 770 each remains fixed. Additionally, during a preferred use of system 100, each of displaceable rod 710 and rod 760 is fixedly mounted on moveable mounting platform 720. Moveable mounting platform 720 is preferably operative to move up and down, in directions indicated by an arrow 788. It is appreciated that displaceable rod 710 and rod 760 are each fixedly mounted on moveable mounting platform 720, and core rod 752 is fixedly mounted to rod 760. Therefore, when moveable mounting platform 720 moves in a direction indicated by arrow 788, displaceable rod 710, rod 760 and core rod 752 also move together with movable mounting platform 720. However, even during motion of movable mounting platfonn 720 in a direction indicated by arrow 788. each of body 768 of position transducer 750 and transducer housing 770 remains fixed relative to HTF 150 and mounting platform 190.

[0202] In an embodiment of the present invention, as seen particularly in Figs. 8A - 8D, deflectometer 182 further includes a spring 790 having an upper end 792 and a lower end 794. Upper end 792 of spring 790 preferably receives mounting end 714 of displaceable rod 710, and lower end 794 of spring 790 is preferably fixedly mounted within a suitable recess formed in mounting plate 190 of AMPT 102. Spring 790 preferably urges movable mounting platfonn 720 upward, against a force of gravity, preferably ensuring that upper surface 716 of displaceable rod 710 remains in contact with sample 130 during testing thereof.

[0203] In another embodiment of the present invention, as seen particularly in Figs. 9A - 9D, and particularly at enlargement G of Fig. 9A, deflectometer 184 does not include a spring, and instead includes a counterweight mechanism 810. Counterweight mechanism 810 includes a weighted bar 812 mounted partially within a counterweight support 814. As seen particularly in Figs. 9C and 9D, counterweight support 814 preferably includes a pair of pivot apertures 822, a mounting-rod bore 824, a fastener bore 826 and a weighted-bar slot 828. A fastener 832 received by fastener bore 826 preferably affixes a mounting rod 834 within mounting-rod bore 824 of counterweight support 814. Thus, counterweight support 814 is preferably fixedly mounted on mounting rod 834, which is in turn fixedly mounted within a suitable recess formed in mounting plate 190 of AMPT 102.

[0204] Weighted bar 812 has a first side 842 and a second side 844. First side 842 of weighted bar 812 is preferably formed with a w eight-bearing aperture 846. Weighted bar 812 is additionally formed with a pivot aperture 848. A weight 850 is preferably fixedly mounted onto weighted bar 812, using weight-bearing aperture 846. Moveable mounting platform 720 preferably rests on an upper surface 851 of second side 844 of weighted bar 812.

[0205] Weight 850 preferably has a mass sufficient to counteract a gravitational force exerted on moveable mounting platform 720, urging moveable mounting platform upward, and preferably ensuring that upper surface 716 of displaceable rod 710 remains in contact with sample 130 during testing thereof. In the embodiment shown in Figs. 8A - 8D, weight 850 includes a bolt 852, on which are mounted a plurality' of weighted elements 854, such as a plurality of nuts and a cap nut.

[0206] Counterweight mechanism 810 preferably further includes a pivot pin 860, about which is mounted a cylindrical bearing 862. Pivot pin 860 is preferably received by pivot apertures 822 of counterweight support 814 and by pivot aperture 848 of weighted bar 812. Cylindrical bearing 862 is preferably received by pivot aperture 848 of weighted bar 812. Together, pivot pin 860 and cylindrical bearing 862 pivotably affix weighted bar 812 to counterweight support 814, such that weighted bar 812 is able to rotate within weighted-bar slot 828.

[0207] It is appreciated that a downward force of gravity7on first side 842 of weighted bar 812 urges weighted bar 812 to rotate about pivot pin 860 in a direction indicated by an arrow 874, which in turn urges second side 844 of weighted bar 812 upward, against a force of gravity. In contrast, a downward force of gravity7acting on movable mounting platform 720 exerts a downward force on second side 844 of weighted bar 812, urging weighted bar 812 to rotate about pivot pin 860 in a direction indicated by an arrow 876.

[0208] In yet another embodiment of the present invention, deflectometer 180 is obviated. In an embodiment in which system 100 does not include a deflectometer 180, a deflection of sample 130 is preferably measured by a portion of system 100 other than deflectometer 180, such as by load application system 170, as described hereinbelow.

[0209] It is appreciated that system 100 includes suitable cooling systems, thermal shielding and electromagnetic shielding. For example, insulating mat 192, which is preferably formed of fiberglass, preferably lies between mounting plate 190 and floor of 112 environmental chamber 104. providing a level of thermal insulation between AMPT 102 and other portions of system 100. System 100 typically includes additional insulating components (not shown), in addition to insulating mat 192.

[0210] Reference is now made to Figs. 10A - 11D, which are simplified schematic illustrations showing successive steps in a preparation and use of system 100 for performing material property testing, in accordance with one preferred embodiment of the present invention, and to Fig. 12, which is a simplified flowchart illustrating steps in a preparation and use of system 100 for performing material property testing, in accordance with one preferred embodiment of the present invention. Figs. 10K- 10M all show a single step, and Fig. 10M is taken along line 10M - 10M of Fig. 10L. Fig. 1 IB is taken along line 11B 11B of Fig. 11A, and Fig. 11D is taken along line 11D 11D of Fig. 11C.

[0211] It is a particular feature of the present invention that system 100 allows both staging of sample 130 and a full or partial pre-assembly of HTF 150 outside of environmental chamber 104, thereby facilitating rapid transition between ones of sample tests, and resulting in a relatively high throughput.

[0212] Turning to Figs. 10A and 12, in a first step 1102, a user prepares susceptor 320 of HTF 150 to receive sample 130 and testing unit 160. As part of step 1102, a user places pins 432 in pin recesses 428 of lower semi-cylindrical portion 410 of susceptor 320. A user preferably additionally prepares lower semi- cylindrical portion 410 of susceptor 320 and some of shell segments of NMFH 310, such as first lower shell segment 344 and second lower shell segment 348, in respective operative orientations thereof.

[0213] As seen particularly in Fig. 10B, also at step 1102, a user prepares at least part of testing unit 160 for insertion into testing-unit recess 430. Preferably at the portion of step 1102 shown in Fig. 10B, a user prepares LSPC 524 and lower support pins 528 for insertion into testing-unit recess 430.

[0214] A user preferably then assembles lower semi-cylindrical portion 410 of susceptor 320 and some shell segments of NMFH 310, such as first lower shell segment 344 and second lower shell segment 348, in a partially assembled operative state thereof. In the partially assembled operative state, curved surface 424 of lower semi-cylindrical portion 410 is substantially fully in contact with inner surface 376 of first lower shell segment 344, and outer surface 378 of first lower shell segment 344 is substantially fully in contact with inner surface 386 of second lower shell segment 348.

[0215] As seen particularly in Figs. 10B, IOC and 12, at a next step 1104, a user then places at least part of testing unit 160 and sample 130 into testing-unit recess 430. In the embodiment shown in Figs. 10B and IOC, a user inserts LSPC 524 into testing-unit recess 430, such that inner surface 540, with pin recesses 542, is facing upward. A user additionally places each of lower support pins 528 into a pin recess 542. and places sample 130 on lower support pins 528.

[0216] If 4PB testing unit 162 or the 4PB fracture testing unit is being prepared for use, at step 1104, as seen particularly in Fig. 10D, a user also preferably orients upper semi-cylindrical portion 408 of susceptor 320 such that testing-unit recess 420 is facing upward, and prepares ULPC 522 and loading pins 526 for placement therein. A user then inserts ULPC 522 into testing-unit recess 420, such that inner surface 530, with pin recesses 532, is facing upward. A user then places each of upper loading pins 526 into a pin recess 532 of ULPC 522. A user may use a placement tool, such as tweezers or pliers, to aid in the placement of components, such as any or all of LSPC 524, support pins 528, sample 130, loading pins 526 and ULPC 522, in operative orientations thereof. Thereafter, a user preferably covers testing-unit recess 420, ULPC 522 and loading pins 526 with a thin, flexible planar object, such as a piece of cardstock 1110, and rotates upper semi-cylindrical portion 408 such that testing-unit recess 420 is facing downward. If 3PB testing unit 166 or the 3PB fracture testing unit is being prepared for use, the step shown in Fig. 10D is obviated.

[0217] As seen particularly in Figs. 10E, 10F and 12, still at steps 1102 and 1104, a user preferably places upper semi-cylindrical portion 408 onto lower semi-cylindrical portion 410, such that each of pin recesses 418 receives one of pins 432. As seen particularly in Fig. 10G, a user then preferably removes cardstock 1110 from between upper and lower semi-cylindrical portions 408 and 410 of susceptor 320, preferably by sliding cardstock 1110 in a direction generally parallel to planar surfaces 412 and 422 until cardstock 1110 is no longer in contact with susceptor 320, and generally planar surface 412 of upper semi-cylindrical portion 408 is substantially fully in contact with generally planar surface 422 of lower semi-cylindrical portion 410. Pins 432 preferably prevent an undesired relative longitudinal motion between upper and lower semi-cylindrical portions 408 and 410 of susceptor 320. Thus, pins 432 preferably assist in maintaining susceptor 320 in an operative orientation thereof.

[0218] It is appreciated that at step 1104, a user at least partially encloses sample 130 and testing unit 160 within susceptor 320, more particularly within enclosure 450 defined by testing-unit recesses 420 and 430 thereof. Thus, as shown particularly in Figs. 10A - 10G, a staging of sample 130 occurs outside of environmental chamber 104.

[0219] As seen particularly in Figs. 10H and 12, at a next step 1112, a user places some shell segments of NMFH 310, such as first upper shell segment 342 and second upper shell segment 346, in a partially assembled operative state thereof. In the partially assembled operative state, curved surface 414 of upper semi-cylindrical portion 408 of susceptor 320 is substantially fully in contact with inner surface 356 of first upper shell segment 342, and outer surface 358 of first upper shell segment 342 is substantially fully in contact with inner surface 366 of second upper shell segment 346.

[0220] Thus, at step 1112, a user disposes susceptor 320 at least partially within a space bounded by at least two segments of NMFH 310 of HTF 150. In the embodiment shown in Figs. 10A - 10M, at step 1112, a user places susceptor 320 at least partially within space 392 bounded by first upper and lower shell segments 342 and 344 of NMFH 312 of HTF 150. Alternatively, at step 1112, a user places susceptor 320 at least partially within space 407 bounded by first shell segments 394 of NMFH 314 of HTF 150.

[0221] In an embodiment in which shells 330 other than first upper shell segment 342, second upper shell segment 346, first lower shell segment 344 and second lower shell segment 348 are used in NMFH 310, the shells 330 being used in NMFH 310 are placed in respective operative orientations thereof in a manner similar to the placement of first upper shell segment 342, second upper shell segment 346, first lower shell segment 344 and second lower shell segment 348 described hereinabove with reference to Figs. 10A - 10H. Thus, in the embodiment shown in Figs. 10A - I OH. testing unit 160 and sample 130 are enclosed within susceptor 320, and susceptor 320 is partially enclosed within NMFH 310 outside of environmental chamber 104. Thus, in the embodiment shown in Figs. 10A - 10H, a full pre-assembly of HTF 150 occurs outside of environmental chamber 104.

[0222] At a next step 1114, seen particularly in Figs. 101, 10J and 12, a user places HTF 150, containing testing unit 160 and sample 130 within enclosure 450 thereof, inside of space 328 of coil 324 of heat source 140, typically by sliding HFT 150 therethrough. Preferably, prior to the step shown in Fig. 101, left support wall 210 has been mounted on mounting base 190. Additionally, prior to the step shown in Fig. 101, preferably first and second support rods 232 and 234 have been mounted on left support wall 210, and guiding pin 284 has also been mounted within pin recess 282 of left support w all 210. At the portion of step 1114 shown in Figs. 101 and 10J, a user places left end 436 of lower semi-cylindrical portion 410 of susceptor 320 within furnace recess 278 of left support wall 210. To help maintain a suitable rotational orientation of HTF 150, as a user finishes sliding HTF 150 through space 328 of coil 324, pin-receiving slot 438 of left end 436 of susceptor 320 slides along guiding pin 284 of left support wall 210.

[0223] As seen particularly in Figs. 10J and 10K, a user mounts guiding pin 298 within pin recess 296 of right support wall 220 and mounts right support wall 220 on mounting base 190 such that right end 442 of low er semi-cylindrical portion 410 of susceptor 320 rests within furnace recess 294 of right support wall 220. Typically, a user mounts right support wall 220 by sliding right support wall 220 between HTF 150 and mounting plate 190. To help maintain a suitable rotational orientation of HTF 150, as a user slides right support w all 220 between HTF 150 and mounting plate 190, guiding pin 298 mounted on right support wall 220 slides along pin-receiving slot 444 of right end 442 of susceptor 320.

[0224] It is appreciated that alternatively to the use case illustrated in Figs. 101 - 10K, a user may mount right support w all 220 on mounting base 190 prior to the step shown in step 101, and mount left support wall 210 on mounting base 190 after the step shown in step 101. In such a use case, as in the use case illustrated in Figs. 101 - 10K. left end 436 of lower semi-cylindrical portion 410 of susceptor 320 rests within furnace recess 278 of left support wall 210, with guiding pin 284 of left support wall 210 received by pin-receiving slot 438 of left end 436 of susceptor 320, and right end 442 of lower semi-cylindrical portion 410 of susceptor 320 rests within furnace recess 294 of right support wall 220, with guiding pin 298 of right support wall 220 received by pin-receiving slot 444 of right end 442 of susceptor 320.

[0225] In the embodiment of the method illustrated in Figs. 10A - 12, step 1112 precedes step 1114. In a further embodiment of the present invention, step 1114 precedes step 1112. Thus, in the further embodiment of the present invention, in contrast with the use case illustrated in Figs. 10A - 101, a user assembles upper and lower semi-cylindrical portions 408 and 410 of susceptor 320, testing unit 160 and sample 130 in a manner similar to that described with reference to steps 1102 and 1104. However, in the further embodiment, a user does not place shells 330 around susceptor 320 until after susceptor 320 has been placed inside of space 328 of coil 324 of heat source 140.

[0226] In other words, in the further embodiment, an order of steps 1114 and 1112 is reversed, and a user preferably first places susceptor 320, containing testing unit 160 and sample 130 within enclosure 450 thereof, inside of space 328 of coil 324 of heat source 140. Thereafter, a user inserts shells 330 of NMFH 310 between susceptor 320 and coil 324, thereby bringing HTF 150 into a fully assembled operative orientation thereof, arriving at the step shown in Fig. 10J.

[0227] Thus, in the further embodiment in which step 1114 precedes step 1112, a user encloses testing unit 160 and sample 130 within susceptor 320 while susceptor 320 is outside of environmental chamber 104. However, in the further embodiment, a user partially encloses susceptor 320 within NMFH 310 only after placing susceptor 320 within coil 324, which occurs inside of environmental chamber 104. Thus, in the further embodiment in which step 1114 precedes step 1112, a partial pre-assembly of HTF 150 occurs outside of environmental chamber 104.

[0228] As seen particularly in Figs. 10J and 10K, turns 326 of coil 324 prevent a disassembly of HTF 150. While HTF 150 is inside of space 328, turns 326 of coil 324 prevent a displacement of shells 330 and upper and lower semi- cylindrical portions 408 and 410 of susceptor 320 along axis 390, thereby ensuring that HTF 150 remains in an assembled operative orientation during a testing of sample 130. As seen particularly in Fig. 10M, pin-receiving slots 438 and 444 and guiding pins 284 and 298 assist in maintaining a suitable rotational operative orientation of HTF 150.

[0229] At the step of Figs. 10K - 10M, AMPT 102 is nearly in a fully assembled operative orientation thereof. At the step of Figs. 10K - 10M, as seen particularly in Fig. 10M and at enlargement H thereof, testing unit 160 and sample 130 are enclosed in HTF 150, which is in space 328 defined by coil 324. Additionally, left and nght support walls 210 and 220 are mounted on mounting base 190. However, as seen particularly in enlargement detail H of Fig. 10M, at the step of Figs. 10K - 10M, neither load rod 610 nor displaceable rod 710 have yet been brought into contact with testing unit 160 or sample 130.

[0230] Following the step of Figs. 10K- 10M. as seen particularly in Figs. 11 A - 1 IB and 12, at a next step 1116, a user prepares load application system 170 and a position measuring system for use during testing. At step 1116, load rod 610 is preferably brought into contact with testing unit 160 or sample 130. If 4PB testing unit 162 or the 4PB fracture testing unit is being prepared for use, load rod 610 is brought through load-rod apertures 352 and 362 and load-rod bore 416, such that load rod 610 contacts outer surface 536 of ULPC 522. In an embodiment wherein outer surface 536 of ULPC 522 is formed with load-rod recess 538, load rod 610 preferably contacts load-rod recess 538 at step 1116.

[0231] Alternatively, if 3PB testing unit 166 or the 3PB fracture testing unit is being prepared for use, load rod 610 is brought through load-rod apertures 352 and 362 and load-rod bore 416, such that load rod 610 contacts sample 130.

[0232] In an embodiment of the present invention, load application system 170 is used both to apply a force to sample 130 and to measure a position of sample 130. In such an embodiment, placement of load rod 610 at step 1116 serves to prepare both load application system 170 and a position measuring system, which is also embodied as load application system 170.

[0233] In an alternative embodiment of the present invention, deflectometer 180 is additionally or alternatively used as a position measuring system. As seen particularly in Fig. 1 IB, in such an embodiment, at step 1116, a user brings displaceable rod 710 into contact with sample 130. More particularly, displaceable rod 710 is brought through displaceable-rod apertures 372, 382 and 548 and bore 426, such that top surface 716 of displaceable rod 710 contacts sample 130.

[0234] It is appreciated that in addition to receiving load rod 610 for an application of force during testing of sample 130, load-rod apertures 352 and 362 and load-rod bore 416, together with load rod 610, assist in maintaining a suitable rotational operative orientation of HTF 150 during both sample preparation and sample testing. Similarly, in addition to receiving displaceable rod 710 for measurement of deflection during testing of sample 130, displaceable-rod apertures 372, 382 and 548 and displaceable-rod bore 426, together with displaceable rod 710, assist in maintaining a suitable rotational operative orientation of HTF 150 during both sample preparation and sample testing.

[0235] Preferably, a suitable rotational operative orientation of HTF 150 is further maintained by corresponding features on respective left and right ends 436 and 442 of lower semi-cylindrical portion 410 of susceptor 320 and left and right support walls 210 and 220. such as pin-receiving slots 438 and 444 and guiding pins 284 and 298. Additionally or alternatively to pin-receiving slots 438 and 444 and guiding pins 284 and 298, the corresponding features may include mechanical orientation indicators, such as matching protrusions and recesses and / or visual orientation indicators, such as visible arrows or other shapes to indicate a correct orientation of HTF 150. Additionally or alternatively, suitable portions of NMFH 310 are formed with features (not shown) to assist in maintaining a suitable rotational operative orientation of HTF 150.

[0236] Also following the step of Figs. 10K- 10M, as part of step 1116, a user preferably places one or more temperature probes (not shown), such as one or more of, inter alia, an optical pyrometer and a thermocouple, at or partially within at least one of temperature-reader cut-outs 354 & 364 and 374 & 384 for temperature measurement of susceptor 320. An exemplary' optical pyrometer suitable for use as the optical pyrometer is an METIS M3, commercially available from Process Sensors of Milford, MA. USA. An exemplary thermocouple suitable for use as the thermocouple is any of a Type R. Type C, Type K or Type S thermocouple, commercially available from Dynamic Systems Inc. of Poestenkill, NY, USA.

[0237] Typically, following step 1116, and before a testing of sample 130, a full or partial calibration of system 100 is performed. Partial calibration may be embodied as a '‘taring” of system 100, in which a position of each of load rod 610 and displaceable rod 710 is recorded and used to determine a zero position thereof. Additionally, during the full or partial calibration of system 100, a resistance of components of deflectometer 180 to a movement of sample 130 in a direction indicated by an arrow 1140 may be measured and stored by integrated computer system 106 for use as a calibration factor.

[0238] After the step shown in Figs. 11A - 11B, at a next step 1142, sample 130 is brought to test conditions, including inter alia, a desired temperature and gas environment, and system 100 may be calibrated. Heat source 140, particularly coil 324 thereof, preferably heats susceptor 320 while susceptor 320 is at least partially disposed in space 392 or 407 bounded by NMFH 310, and susceptor 320 in turn heats sample 130 and testing unit 160. More specifically, a voltage is supplied to heat source 140. causing coil 324 of heat source 140 to generate an electromagnetic field. The electromagnetic field generated by coil 324 of heat source 140 is preferably an ultra-high frequency electromagnetic field, preferably having a frequency of between 50,000 - 300,000 Hz. As is well known in the art, the electromagnetic field generated by coil 324 is particularly strong in space 328 defined by coil 324.

[0239] When in an operative orientation, susceptor 320 is partially disposed in space 328 defined by turns 326 of coil 324, and thus susceptor 320 is preferably generally centered with the electromagnetic field generated by coil 324. As described hereinabove, heat source 140 preferably uses induction heating to heat susceptor 320, which is preferably formed of an electrically conductive material. More specifically, the electromagnetic field generated by coil 324 induces an electric current within susceptor 320, and resistive heating converts the induced electric current in susceptor 320 to heat, thereby heating susceptor 320. Susceptor 320 in turn transfers heat to testing unit 160 and sample 130 through conduction heating and / or radiation heating.

[0240] Integrated computer system 106 preferably controls and monitors a temperature of susceptor 320. In various embodiments of the present invention, system 100 is operative to achieve a wide range of heating rates, ranging from 1 °C / second to greater than 100 °C / second. System 100 is preferably also operative to maintain susceptor 320 at a pre-selected temperature before, during and after a testing of sample 130, thereby allowing either or both of sample 130 and components of system 100 to achieve isothermal conditions and / or reach a thermal equilibrium state.

[0241] Integrated computer system 106 preferably additionally at least partly controls and monitors a gas environment of interior space 114 of environmental chamber 104, ensuring that interior space 114 complies with predetermined gaseous conditions, including, inter alia, vacuum, inert gas, ambient air, environments containing one of a multiplicity of controlled gas mixtures, such as a predetermined percentage of oxygen, reducing environments and oxidizing environments.

[0242] During a preparation of environmental chamber 104 and susceptor 320 prior to a testing of sample 130, system 100 is preferably operative to precisely control a force applied to sample 130 by load application system 170 in a force application direction indicated by arrow 1140. For example, integrated computer system 106 is preferably operative to control load application system 170, thereby maintaining a predetermined force on sample 130 while system 100 brings sample 130 to a predetermined testing temperature. The predetermined force may be any suitable force, such as a user-specified force, and may have a value ranging between zero and a maximum load capacity' of system 100, inclusive. In a typical embodiment of the present invention, system 100 is operative to exert a force on sample 130 having a magnitude of between 0 - 100 N. Preferably, an actual force exerted by system 100 on sample 130 deviates from a predetermined force to be exerted by system 100 on sample 130 by no more than + / - 0.5%. It is appreciated that as used herein, “a downward motion,” "a downward force,” '‘a downward direction” and '‘a downward displacement” refer to a respective motion, force, direction and displacement in a direction indicated by arrow 1140.

[0243] At a next step 1150, one or more material properties of sample 130 are tested, using testing unit 160. During testing of sample 130, predetermined environmental conditions, particularly relating to gas environment and temperature of sample 130, are preferably maintained. At a beginning of a testing of sample 130 by system 100, load rod 610 of load application system 170 is typically in contact with ULPC 522 or sample 130 while exerting a net zero force thereon, as seen particularly in Figs. 11A - 11B and more particularly at enlargement I of Fig. 11B.

[0244] Thereafter, as part of step 1150, integrated computer system 106 preferably controls load application system 170, driving load rod 610 to apply a series of predetermined forces to sample 130 in a direction indicated by arrow 1140. It is appreciated that when load application system 170 exerts a relatively small force on sample 130, sample 130 experiences little to no visible deformation, as seen particularly at enlargement I in Fig. 1 IB.

[0245] To apply a series of predetermined forces to sample 130, integrated computer system 106 preferably provides a series of voltages to linear actuator 602, resulting in a downward motion of drive shaft 604 thereof. The motion of drive shaft 604 in turn results in a downward motion of actuator connector rod 630, which is connected thereto. The downward motion of actuator connector rod 630 causes a corresponding downward motion of upper load cell connector 626, force sensor 616 and lower load cell connector 646, which in turn drives load rod 610 in a downward direction.

[0246] If 4PB testing unit 162 or the 4PB fracture testing unit is being used, integrated computer system 106 provides a series of voltages to linear actuator 602, causing load rod 610 to exert a series of predetermined downward forces on outer surface 536 of ULPC 522. In an embodiment wherein outer surface 536 of ULPC 522 is formed with load-rod recess 538, load rod 610 preferably exerts a series of predetermined downward forces thereon. ULPC 522 transfers each downward force from load rod 610 to additional components of testing unit 160, namely upper loading pins 526, lower support pins 528 and LSPC 524, as well as sample 130.

[0247] Alternatively, if 3PB testing unit 166 or the 3PB fracture testing unit is being used, integrated computer system 106 provides a series of voltages to linear actuator 602, causing load rod 610 to exert a series of predetermined downward forces on sample 130. Sample 130 transfers each downward force from load rod 610 to components of testing unit 160, namely lower support pins 528 and LSPC 524.

[0248] It is appreciated that when load application system 170 exerts a relatively large force on sample 130, as in Figs. 11C and HD, sample 130 experiences visible deformation, as seen particularly in enlargement detail J of Fig. 11D. If 4PB testing unit 162 or the 4PB fracture testing unit is being used, and sample 130 undergoes exceptionally large visible deformation (not shown), at least some of deformation cut-outs 534 of ULPC 522 and deformation recess 546 of LSPC 524 preferably receive deformed portions of sample 130.

[0249] As is know n in the art, a response of sample 130 to a force exerted thereon by testing unit 160, particularly a defonuation thereof, and more particularly a downward displacement of a center of sample 130, provides data useful in calculating material properties of sample 130, such as a flexural modulus, a flexural stress, a flexural strain, a flexural stress-strain relationship, a Young’s modulus, an ultimate strength and a fracture toughness.

[0250] Preferably, as part of step 1150. integrated computer system 106, and more preferably, data acquisition system 110 thereof, monitors and records most, and more preferably all, of useful data relating to system 100 during use thereof. More specifically, integrated computer system 106 preferably monitors and records, inter aha, a temperature of susceptor 320. a voltage applied to heat source 140, a gas pressure of interior space 114 of environmental chamber 104, a force applied to sample 130 by load application system 170, a deflection of sample 130, a temperature of force sensor 616 and a temperature of displaceable rod 710. In a preferred embodiment of the present invention, the force applied to sample 130 by load application system 170 is indicated by data relating to load application system 170, including, inter alia, data relating to any or all of linear actuator 602, a position of load rod 610 and a force indicated by force sensor 616.

[0251] Although not a primary intended use case of system 100, the force applied to sample 130 by load application system 170 may be additionally or alternatively indicated by data relating to deflectometer 180, including, inter alia, data relating to any or all of deflectometer 180 components, such as a voltage output by position transducer 750, a position of displaceable rod 710 and a position of core rod 752. The use of data relating to deflectometer 180 to determine a force applied to sample 130 may be of particular interest in calibration processes or academic investigations, and typically rely on a sample 130 having known material properties.

[0252] Typically, readings from deflectometer 180, including, inter alia, data relating to any or all of deflectometer 180 components, such as a voltage output by position transducer 750, a position of displaceable rod 710 and a position of core rod 752 are preferably used to determine a deflection of sample 130 in a determination of material properties thereof.

[0253] Preferably, the monitoring and recording of useful data by integrated computer system 106 is effectively continuous during an entire use session of system 100, and the data is preferably made fully available for both control of system 100 and analysis of testing of sample 130. In a preferred embodiment of the present invention, integrated computer system 106 monitors and records some or all of useful data throughout use of system 100 with an effectively continuous sampling rate, such as. inter alia, a sampling rate of 50 Hz - 10,000 Hz, most typically a sampling rate of 100 Hz - 500 Hz.

[0254] Preferably, integrated computer system 106, and more preferably, automated control system 108 thereof, uses feedback control in the operation of system 100. Thus, integrated computer system 106 preferably controls components of system 100, such as, inter alia, heat source 140, load application system 170 and deflectometer 180, at least partially based on data monitored and recorded from some or all of a temperature of susceptor 320, a voltage applied to heat source 140, a gas pressure of interior space 114 of environmental chamber 104, a force applied to sample 130 by load application system 170 and a deflection of sample 130.

[0255] The feedback control of system 100 allows a wide variety of options for test protocol programming and alert options. For example, integrated computer system 106 may receive data from system 100 indicating that one or more components of system 100, such as, inter alia, one or more of force sensor 616, coil 324, linear actuator 602 and position transducer 750 are approaching one or more limits of recommended operating parameters thereof, such as temperature, position, force or voltage limits. In such a case, integrated computer system 106 preferably provides a signal, such as a warning, alert or command to a user and / or components of system 100, to maintain components of system 100 within recommended operating parameters thereof. For example, integrated computer system 106 may issue an alert and reduce a voltage supplied to heat source 140, reduce a voltage supplied to linear actuator 602 and / or change a gas composition of interior space 114 of environmental chamber 104.

[0256] Integrated computer system 106 is preferably operative to provide suitable warnings and alters prior to beginning testing, during testing and / or following testing of a sample 130. In a preferred embodiment of the present invention, a user may establish an operating envelope of system 100, including one or more thresholds or limits of any or all operating parameters of components of system 100, on a test-by-test basis. Thus system 100 preferably includes fully customizable feedback control and alerts.

[0257] Preferably, system 100 is operative to be controlled based on any of a multiplicity of control modes, including, inter alia, control modes partially or fully based on any or all of data collected by integrated computer system 106. Thus, for example, load application system 170 is operative to be controlled by integrated computer system 106 based on any or all of data relating to load application system 170, including, inter alia, data relating to any or all of linear actuator 602, such as a position of load rod 610 and a force indicated by force sensor 616, and data relating to deflectometer 180, including, inter alia, data relating to any or all of position transducer 750 components, such as a voltage output by position transducer 750, a position of displaceable rod 710 and a position of core rod 752. Preferably, a control mode is selected for use based on a user preference.

[0258] As seen particularly in Figs. 11 A - 1 ID, in an embodiment of the present invention, deflectometer 180 is operative to measure a linear deformation of a lower central portion of sample 130. As described hereinabove, prior to a testing of sample 130, displaceable rod 710 is positioned such that top surface 716 thereof is in contact with sample 130. Therefore, a deformation of sample 130 preferably results in a corresponding downward displacement of displaceable rod 710. The downward displacement of displaceable rod 710 in turn results in a downward displacement of movable mounting platform 720, and thus of rod 760 and core rod 752, against an upward urging of spring 790 or of counterweight mechanism 810. The downward displacement of rod 760 changes a position of core rod 752, and particularly a position of working end 754 thereof, within body 768 of position transducer 750, which results in a predicable change in a voltage output by position transducer 750 to integrated computer system 106.

[0259] Thus, in an embodiment of the present invention, integrated computer system 106 of system 100 preferably uses the voltage output by position transducer 750 of deflectometer 180 to ascertain a downward displacement of sample 130 corresponding to a particular value of force exerted on sample 130, either directly or indirectly, by load application system 170.

[0260] Additionally or alternatively to a measurement of deformation by deflectometer 180, load application system 170 is preferably operative to measure a linear deformation of an upper portion of sample 130. As described hereinabove, prior to a testing of sample 130, load rod 610 of load application system 170 is preferably placed in contact with ULPC 522 or with sample 130 while exerting a net zero force thereon. Thereafter, integrated computer system 106 preferably controls load application system 170, driving load rod 610 to apply a series of predetermined forces to sample 130, either directly or indirectly, in a direction indicated by arrow 1140.

[0261] As load application system 170 applies each force to sample 130, integrated computer system 106 preferably monitors a position of load rod 610. As seen particularly in Fig. 1 ID, a position of load rod 610 is directly related to a deformation of sample 130. As a central portion of sample 130 is deformed in a downward direction, a position of load rod 610 also moves downward in a predictable manner.

[0262] In a preferred embodiment of the present invention, linear actuator 602 is operative to displace actuator connector rod 630, and thus load rod 610. in countable increments of a known, uniform length. Linear actuator 602 preferably includes an encoder, which is operative to provide data indicating whether linear actuator 602 has displaced actuator connector rod 630 by an increment. A controller, in either or both of linear actuator 602 or in integrated computer system 106, counts the increments reported by the encoder of linear actuator 602, thereby calculating aposition of load rod 610. A compression of load rod 610 is optionally accounted for by system 100 in the calculation of the position of load rod 610.

[0263] Thus, in an additional embodiment of the present invention, integrated computer system 106 of system 100 preferably uses the position of load rod 610 to ascertain a downward displacement of sample 130 resulting from a particular value of force exerted on sample 130, either directly or indirectly, by load application system 170.

[0264] Integrated computer system 106 of system 100 preferably calculates and outputs to a user one or more matenal properties of sample 130 based on a testing thereof of by system 100. More specifically, integrated computer system 106 of system 100 ascertains material properties of sample 130, such as a flexural modulus, a flexural stress, a flexural strain, a flexural stressstrain relationship, a Young's modulus, an ultimate strength and a fracture toughness, at least partially based on a response of sample 130 to a force exerted thereon by testing unit 160, as a result of a particular value of force exerted on sample 130 by load application system 170, either directly or indirectly. Typically, integrated computer system 106 of system 100 ascertains material properties of sample 130 based particularly on a deformation thereof, and more particularly on a downward displacement of a central portion of sample 130, during a testing thereof by system 100.

[0265] After testing, integrated computer system 106 preferably controls system 100, to return environmental chamber 104 and AMPT 102 to ambient or near-ambient temperature and gas mixture conditions. Integrated computer system 106 preferably continues to control conditions of system 100 and to monitor and record most, and more preferably all, of useful data relating to system 100 during the return of environmental chamber 104 and AMPT 102 to ambient or nearambient temperature and gas mixture conditions.

[0266] The return of environmental chamber 104 and AMPT 102 to ambient or near-ambient conditions includes a cooling of susceptor 320, testing unit 160 and sample 130, using either natural cooling, without using a dedicated cooling system, or forced cooling, using a dedicated system. An exemplary’ cooling system provides a flow of gas, such, inter alia, as helium or argon, through at least some of gas apertures 124 to hasten a cooling of AMPT 102, testing unit 160 and sample 130. A temperature of susceptor 320 during the cooling thereof is preferably monitored and recorded by integrated computer system 106 using the temperature probes (not shown), such as one or more of, inter aha, the optical pyrometer and the thermocouple described hereinabove.

[0267] Preferably, the return of environmental chamber 104 and AMPT 102 to ambient conditions occurs relatively quickly, allowing a timely unloading of sample 130 and a rapid transition to an additional test, increasing throughput of system 100 relative to throughputs of conventional systems. For example, in a preferred embodiment of the present invention, an amount of time from an end of testing of a first sample 130 through an insertion of a different sample 130 is under one hour, and more preferably is under 20 minutes. In other words, system 100 is preferably operative to perform at least one sample test per hour, and is more preferably operative to perform at least one sample test per 20 minutes, including insertion of a sample 130 into system 100, heating of sample 130, testing of sample 130, and cooling of sample 130.

[0268] System 100 is operative to achieve a wide range of preferably relatively rapid cooling rates, ranging from 3 °C / sec to greater than 300 °C / sec, and is operative to heat susceptor 320, testing unit 160 and sample 130 to a temperature of 1,000 °C, more preferably to a temperature of 2,000 °C, yet more preferably to a temperature of 2,500 °C, and even more preferably to a temperature of 4,000 °C. By way of example, system 100 may be operative to heat susceptor 320, testing unit 160 and sample 130 to a temperature in a range of about room temperature to 2800 °C, or to a temperature in a range of about 1500 °C - 2800

[0269] As described hereinabove, the relatively rapid heating and cooling rates of system 100 are a result of technical features of system 100, such as, inter alia, a relatively small size of that portion of system 100 which is heated, more specifically, a similarity in size between susceptor 320 and sample 130; and a presence of customizable insulation around that portion of system 100 which is heated, more specifically, at least a partial disposition of susceptor 320 within space 392 of shells 330.

[0270] Furthermore, components of system 100, particularly any or all of susceptor 320 and shells 330 of NMFH 310, load rod 610, displaceable rod 710 and any or all components of testing unit 160, are typically both less expensive than components used by conventional material property testing systems, and have a relatively simple removal and installation process compared to components used by conventional material property testing systems.

[0271] Thus, in a preferred embodiment of the present invention, some or all of susceptor 320 and shells 330 of NMFH 310, load rod 610, displaceable rod 710 and any or all components of testing unit 160 are readily replaceable between subsequent ones of sample tests, i.e., are consumable. In an embodiment of the present invention, some or all of susceptor 320 and shells 330 of NMFH 310, load rod 610, displaceable rod 710 and any or all components of testing unit 160 are disposable and intended to be replaced between subsequent ones of sample tests.

[0272] Additionally, components of system 100, particularly any or all of susceptor 320 and shells 330 of NMFH 310, load rod 610, displaceable rod 710 and any or all components of testing unit 160, are typically more durable than components used by conventional material property testing systems.

[0273] Furthermore, system 100 preferably incorporates interchangeable parts, which reduces breakage concerns and increases setup speeds. For example, at least some of shells 330 are identical to others of shells 330; upper and lower semi-cylindrical portions 408 and 410 of susceptor 320 are preferably identical to one another; and at least some of guiding pins 284 & 298, pins 432, upper loading pins 526 and lower support pins 528 are identical to one another.

[0274] The relative low cost, simple removal and installation processes, and high durability' of system 100 components allow system 100 to be subjected to relatively rapid heating rates and cooling rates compared to those of conventional material property testing systems.

[0275] Each of relatively rapid heating rates and cooling rates cause relatively high thermal stress for components of system 100. However, the cost and the likelihood of broken components in system 100 due to high thermal stress are each lower than the cost and the likelihood of broken components in conventional material property testing systems due to high thermal stress. Therefore, system 100 can be subjected to relatively rapid heating rates and cooling rates compared to those of conventional material property testing systems, with a relatively low concern of breaking components of system 100.

[0276] The above-described embodiment of system 100, shown and described with reference to Figs. 1 A - 12, may suffer from certain disadvantages. For example, shells 330 may tend to crack during operation of AMPT 102. Additionally, heat transfer between components of AMPT 102 may tend to cause overheating of load application system 170 and / or deflectometer 180. There is therefore provided, and described hereinbelow; an alternative embodiment of a system 1300 and corresponding method for performing material property testing, particularly material property testing under high temperatures and in the presence of non-atmospheric mixtures of gas, characterized by relatively high heating and cooling rates and thus by relatively short test cycles and high throughput, in which certain disadvantages of system 100 are obviated.

[0277] It is appreciated that, although systems 100 and 1300 are described herein as separate embodiments of the present invention, any or all of components of systems 100 and 1300 may be interchangeable with one another and / or may be combined with one another within system 100 or system 1300.

[0278] Reference is now made to Figs. 13 A, 13B, 13C and 13D, which are simplified schematic respective assembled isometric, side planar, sectional and exploded view illustrations of a system 1300 including an apparatus for performing material property testing on a sample (AMPT) 1302. an environmental chamber 1304 and an integrated computer system 1306, constructed and operative in accordance with another preferred embodiment of the present invention, Fig. 13C being taken along line 13C - 13C of Fig. 13B. AMPT 1302 is preferably housed within environmental chamber 1304.

[0279] In a preferred embodiment of the present invention, integrated computer system 1306 of system 1300 includes an automated control system 1308 and a data acquisition system 1309. Integrated computer system 1306 is operative to preferably store, and more preferably to create and store, testing profiles including some or all environmental test parameters, including, inter alia, a temperature profile, a gas mixture profile, a load profile and a sample deflection profile. Integrated computer system 1306 preferably additionally automatically calculates material properties, such as any or all of a flexural modulus, a flexural stress, a flexural strain, a flexural stress-strain relationship, a Young’s modulus, an ultimate strength and a fracture toughness, using collected data. Thus, system 1300 preferably employs computer system 1306 to execute pre-programmed test programs, which sequence through each phase of testing, including heating, gas introduction and removal, temperature maintenance, sample testing, and cooling.

[0280] Environmental chamber 1304 preferably provides a desired gas environment within which AMPT 1302 is operative. Environmental chamber 1304 is preferably formed as a modular vacuum chamber comprising three interconnected sub-chambers : a main or intermediate sub-chamber 1310, an upper sub-chamber 1312 mounted on an upper surface 1314 of main sub-chamber 1310, and a lower sub-chamber 1316 attached to a lower surface 1318 of main subchamber 1310. As seen particularly in Fig. 13C, AMPT 1302 preferably extends through sub-chambers 1310, 1312 and 1316. Environmental chamber 1304 is preferably supported by an external frame (not shown). Environmental chamber 1304 is described hereinbelow with particular reference to Figs. 14A - 14M.

[0281] It is appreciated that although modular environmental chamber 1304 is shown and described herein the context of system 1300, environmental chamber 104 of system 100 may be adapted to be a modular environmental chamber, of a type similar to environmental chamber 1304. Alternatively, modular environmental chamber 1304 of system 1300 may be replaced by a unitary environmental chamber of the type of environmental chamber 104 of system 100.

[0282] Reference is now made to Figs. 14A, 14B, 14C, 14D, which are simplified schematic respective assembled isometric, side planar, sectional and exploded view illustrations of the environmental chamber 1304 of Figs. 13A - 13D, Fig. 14C being taken along line 14C - 14C of Fig. 14B; to Fig. 14E, which is a simplified schematic partially exploded view illustration of main sub-chamber 1310 forming a portion of the environmental chamber 1304 of Figs. 14A - 14D, constructed and operative in accordance with a preferred embodiment of the present invention; to Figs. 14F, 14G, 14H. and 141 which are simplified schematic respective first isometric, first cutaway isometric, second isometric, and second cutaway isometric view illustrations of a portion of main sub-chamber 1310 of Fig. 14E; to Figs. 14J and 14K which are simplified schematic respective topside isometric and underside isometric view illustrations of a first component of upper sub-chamber 1312 forming another portion of the environmental chamber 1304 of Figs. 14A - 14D; and to Figs. 14L and 14M which are simplified schematic respective topside isometric and underside isometric view illustrations of a second component of upper sub-chamber 1312.

[0283] The modular structure of environmental chamber 1304 preferably serves to reduce heat transfer between the sub-chambers 1310, 1312 and 1316, thereby preventing overheating of sensitive mechanical and electrical components of AMPT 1302.

[0284] As seen particularly in Fig. 14A and Figs. 14D - 141, main subchamber 1310 is preferably formed with a force-application aperture 1402, a deflection-measurement aperture 1404, a heat-source aperture 1406, at least one tooling aperture 1408, a pressure-measurement aperture 1410 and at least one vacuum aperture 1412. Main sub-chamber may additionally include one or more gas apertures (not shown) and a plurality’ of AMPT mounting apertures 1414, seen particularly in Fig. 14G.

[0285] Main sub-chamber 1312 preferably additionally includes a first door 1420 and a second door 1422. First door 1420 typically includes a viewport 1424 for observation of AMPT 1302. A pyrometer 1426 may be mounted on main sub-chamber 1310 and may measure an internal temperature of AMPT 1302 via a pyrometer window 1428. An exemplary optical pyrometer suitable for use as pyrometer 1426 is a METIS M311 or M322, commercially available from Process Sensors of Milford. MA. USA. It is appreciated, however, that any suitable pyrometer may be incorporated at any suitable location in environmental chamber 1304 for temperature measurement of AMPT 1302.

[0286] In an embodiment of the present invention, main sub-chamber 1310 is formed of an aluminum body having an interior surface 1430 defining an interior space 1432 and having internal passages 1434 to enable continuous cooling of the chamber body during extreme high temperature testing, as seen particularly in Figs. 14F - 141.

[0287] Heating, by AMPT 1302, is carried out in main sub-chamber 1310 via heat-source aperture 1406. Heat-source aperture 1406 is preferably sealed at a perimeter 1436 thereof. Main sub-chamber 1310 is preferably thermally insulated by thermal insulation 1440, in order to reduce heat transfer from main subchamber 1310 to neighboring sub-chambers 1312 and 1316 and thus prevent thennal damage to components of AMPT 1302 housed therein. An exemplary type of thermal insulation suitable for use as insulating material 1440 is graphite insulating board, commercially available from Ceramaterials of Dingmans Ferry, PA, USA.

[0288] It is appreciated that system 1300 may include additional or alternative cooling systems, thermal shielding and electromagnetic shielding in addition to or instead of those described herein.

[0289] As seen particularly in Fig. 14E, thermal insulation 1440 may include a first insulating board 1442 affixed to first door 1420, a second insulating board 1444 affixed to second door 1422, and a plurality of additional insulating boards 1446 affixed to and lining interior surface 1430. First insulating board 1442 may be formed with a viewport accommodating aperture 1448. Boards 1446 may be formed with a force application aperture accommodating cutout 1450, a deflection measurement aperture accommodating cutout 1452, a plurality of heatsource aperture accommodating cutouts 1454, a pyrometer window accommodating cutout 1456, at least one tooling aperture accommodating cutout 1457, a pressure-measurement aperture accommodating cutout 1458 and at least one vacuum aperture accommodating cutout 1459.

[0290] Thermal insulation 1440 is preferably affixed to the interior surface 1430 of main sub-chamber 1310 by a plurality' of insulation mounting assemblies 1460 received by a plurality of insulation mounting apertures, only several of which are indicated, by way of example, by reference number 1461 in Figs. 14G and 141. Each insulation mounting assembly 1460 preferably includes an insulation mounting screw 1462 and insulation mounting washer 1464. Insulation 1440 is preferably screwed into interior surface 1430 by screw 1462 and secured thereat by washer 1464. It is appreciated that washer 1464 has a relatively large surface area, in order to reduce pressure exerted thereby on insulation 1440 and prevent puncture and deformation of insulation 1440.

[0291] As seen particularly in Figs. 14F - 141, main sub-chamber 1310 is preferably formed by first - fourth plates 1470, 1472. 1474 and 1476 defining interior surface 1430 and bounding interior space 1432. First plate 1470 preferably has upper surface 1314. Force application aperture 1402 is preferably formed in first plate 1470. Deflection measurement aperture 1404 is preferably formed in second plate 1472. Heat-source aperture is preferably formed in third plate 1474. Pyrometer window 1428 is preferably formed in fourth plate 1476. It is understood that Fig. 14G corresponds to Fig. 14F, with first and fourth plates 1470 and 1476 being cut-away in Fig. 14G. It is further understood that Fig. 141 corresponds to Fig. 14H with second and third plates 1472 and 1474 being cut-away in Fig. 141.

[0292] Upper sub-chamber 1312 is preferably mounted on main subchamber 1310 and in atmospheric communication therewith via force-application aperture 1402. Upper sub-chamber 1312 preferably has a body portion 1480, seen particularly in Figs. 14J and 14K, and a lid portion 1482, seen particularly in Figs. 14L and 14M. Body portion 1480 is preferably formed with a lower cavity 1484 surrounded by a sealing groove 1486, positioned proximal to surface 1314 when upper sub-chamber 1312 is assembled together with main sub-chamber 1310.

[0293] Body portion 1480 also preferably includes an upper cavity' 1488, opposite lower cavity 1484 and surrounded by a sealing groove 1490. A central load application unit support bar 1492 preferably extends across and divides upper cavity 1488. Support bar 1492 preferably has a load application unit mounting hole 1494 formed therein.

[0294] Body portion 1480 is preferably additionally formed with a plurality of slots 1496. Each slot 1496 is adapted to receive a mounting screw 1498 therein, for screwing body portion 1480 to surface 1314 of first plate 1470 of main sub-chamber 1310, as seen particularly in Fig. 14D. Slots 1496 are formed with widened end portions 14100, in order to allow some freedom of movement of body portion 1480 when being mounted on surface 1314, for alignment purposes. Body portion 1480 is preferably further formed with a plurality of lid screw receiving bores 14102. Body portion 1480 preferably defines an interior space 14104. Interior space 14104 of body portion 1480 is preferably in atmospheric communication with interior space 1432 of main sub-chamber 1310 via an atmospheric passage formed by force application aperture 1402 and lower cavity 1484.

[0295] Body portion 1480 preferably includes a port 14110 operative to hold a removable panel 14112, seen particularly in Fig. 14D. Removable panel 14112 may be removed in order to conveniently perform maintenance activities on upper sub-chamber 1312. without requiring removal of lid portion 1482. Removable panel 14112 is preferably sealed to body portion 1480 by a seal 14114 and screwed thereto by a plurality of screws 14116.

[0296] Lid portion 1482 is preferably formed with a lower cavity 14120 proximal to body portion 1480 and a plurality of grooves 14122 providing access to screws 1498. A plurality of screw holes 14124 is preferably formed in lid portion 1482. Each screw hole 14124 is preferably operative receive a screw 14126, for screwing lid portion 1482 to body portion 1480, as seen particularly in Fig. 14D. Lid portion 1482 preferably defines an interior space 14128. Interior space 14128 of lid portion 1482 is preferably in atmospheric communication with interior space 14104 of body portion 1480 by way of an atmospheric passage formed by lower cavity 14120 of lid portion 1482 and upper cavity 1488 of body portion 1480.

[0297] Lower sub-chamber 1316 is preferably affixed to main subchamber 1310 and in atmospheric communication therewith via deflection measurement aperture 1404. Lower sub-chamber 1316 is preferably formed by a plurality of plates 14130 defining an interior space 14132 and sealed to a cube frame 14134, all components of which are commercially available from Ideal Vacuum Products, of New Mexico, USA. Lower sub-chamber 1316 is preferably formed with a threaded sub-chamber attachment aperture 14138 operative to receive a sub-chamber attachment assembly 14140. Sub-chamber attachment assembly 14140 preferably includes a vacuum flange 14142, a swing clamp 14144, a vacuum fitting 14146, a bulkhead clamp 14148, a pair of centering rings 14150 and a plurality of fasteners 14152. It is appreciated that sub-chamber attachment assembly 14140 preferably defines an inner hollow passage providing atmospheric communication between lower sub-chamber 1316 and main subchamber 1310.

[0298] When lower sub-chamber 1316 is affixed to main sub-chamber 1310, vacuum flange 14142 is preferably screwed into sub-chamber attachment aperture 14138 and sealed and clamped to vacuum fitting 14146 by swing clamp 14144 and centering ring 14150 respectively. Vacuum fitting 14146 is in turn sealed and clamped to deflection measurement aperture 1404 by bulkhead clamp 14148 and centering ring 14150 respectively and secured to lower surface 1318 with fasteners 14152. Interior space 14132 of lower sub-chamber 1316 is preferably in atmospheric communication with interior space 1432 of main subchamber 1310 via an atmospheric passage formed by deflection measurement aperture 1404, sub-chamber attachment aperture 14138 and sub-chamber attachment assembly 14140.

[0299] As explained hereinabove, and as seen particularly in Fig. 14C, lower sub-chamber 1316, main sub-chamber 1310 and upper sub-chamber 1312 are preferably in atmospheric communication with one another via a continuous passage formed between interior space 1432 of main sub-chamber 1310, interior spaces 14104 and 14128 of upper sub-chamber 1312 and interior space 14132 of lower sub-chamber 1316.

[0300] Vacuum aperture 1412 of main sub-chamber 1310 preferably receives a corresponding vacuum line (not shown), which vacuum line may also have built therein a gas feed, thereby enabling an interior space of modular vacuum chamber 1304, including interior space 1432 of main sub-chamber 1310, interior spaces 14104 and 14128 of upper sub-chamber 1312 and interior space 14132 of lower sub-chamber 1316, to be characterized by any of a wide range of gas environments. Alternatively, environmental chamber 1304 may include dedicated gas apertures, separate to vacuum aperture 1412, for suppling gas to environmental chamber 1304.

[0301] Gas environments characterizing environmental chamber 1304 may include, by way of non-limiting example only, vacuum, inert gas, ambient air. or other environments containing one of a multiplicity of controlled gas mixtures, such as a predetermined percentage of oxygen, reducing gas mixtures and oxidizing gas mixtures. In a preferred embodiment of the present invention, vacuum aperture 1412 is preferably in fluid communication with a vacuum pump (not show n), such as a roughing pump or an oil diffusion pump, to supply a rough vacuum or high vacuum environment, characterized by a pressure of approximately 10'2Torr to 10'5Ton, within environmental chamber 1304. Additionally, vacuum aperture 1412 may be in fluid communication with a turbo- molecular pump (not shown) or an ion getter pump (not shown) to supply a vacuum environment, characterized by a pressure of less than 10-5Torr, within environmental chamber 1304.

[0302] It is understood that, in some embodiments of the present invention, it may be desirable for the various sub-chambers of environmental chamber 1304, such as any ones or all of sub-chambers 1310, 1312 and 1316 to have mutually different gas environments, rather than sharing a common gas environment as described herein-above. In this case, individual ones of subchambers 1310, 1312 and 1316 may be sealed off with respect to one another and self-contained gas environments provided therefore. It is appreciated that the modular nature of environmental chamber 1304 advantageously renders environmental chamber 1304 readily adaptable to allow different gas environments to be provided for individual ones of the sub-chambers comprising environmental chamber 1304.

[0303] Reference is now made to Figs. 15A. 15B, 15C and 15D which are simplified schematic respective assembled isometric, side planar, sectional, and exploded view illustrations of AMPT 1302, Fig. 15C being taken along line 15C - 15C of Fig. 15B; and to Fig. 15E, which is a simplified schematic exploded view illustration of a portion of the AMPT 1302 of Figs. 15A - 15D. It is appreciated that AMPT 1302 is operative to perform material property testing on a sample 1500, seen particularly at enlargement K of Fig. 15C.

[0304] AMPT 1302 includes a heat source 1510, described hereinbelow with particular reference to Figs. 16A - 16F; a high-temperature furnace (HTF) 1520 described hereinbelow with particular reference to Figs. 17A - 18; a testing unit 1530, such as a four-point bending (4PB) testing unit 1532, described hereinbelow with particular reference to Figs. 17F - 17H or a three-point bending (3PB) testing unit 1534, described hereinbelow with particular reference to Fig. 18; a load application system 1540, such as a load application system 1542 described hereinbelow with particular reference to Figs. 19A - 19D, or a load application system 1544, described hereinbelow with particular reference to Figs. 20A and 20B; and a deflectometer 1550 described hereinbelow with particular reference to Figs. 21 A - 21H.

[0305] It is appreciated that although HTF 1520, testing unit 1530, such as testing unit 1532 and 1534, load application system 1540, such as load application system 1542 and load application system 1544, and deflectometer 1550 are described and shown herein in the context of system 1300, any or all of HTF 1520, testing unit 1530, such as testing unit 1532 and 1534, load application system 1540, such as load application system 1542 and load application system 1544, and deflectometer 1550 may be respectively interchanged with the corresponding components of system 100, namely HTF 150, testing unit 160, such as testing unit 162 and 166, load application system 170 and deflectometer 180, with appropriate modifications as may be understood by one skilled in the art.

[0306] AMPT 1302 further includes a mounting base 1560, a left support wall 1562, including a first lower portion 1564 and a first upper portion 1566, and a right support wall 1568, including a second lower portion 1570 and a second upper portion 1572. AMPT 1302 additionally includes a first support rod 1574 and a second support rod 1576. First support rod 1574 includes a left end 1578 and a right end 1580. Similarly, second support rod 1576 includes a left end 1582 and a right end 1584. A plurality of fasteners, such as a plurality of screws 1586, affixes respective left ends 1578 and 1582 of first and second support rods 1574 and 1576 to first lower portion 1564 of left support wall 1562. Similarly, a plurality of fasteners, such as a plurality of screws 1588, affixes respective right ends 1580 and 1584 of first and second support rods 1574 and 1576 to second lower portion 1570 of right support wall 1568.

[0307] First upper portion 1566 of left support wall 1562 includes an upper surface 1590, which is formed with a furnace recess 1592 operative to receive HTF 1520. As seen particularly in Fig. 15C. furnace recess 1592 preferably includes a pin recess 1594, operative to receive a guiding pin 1596 for fixing HTF 1520 in a correct orientation. First lower portion 1564 of left support wall 1562 is preferably formed with a plurality of recesses 1598 operative to receive a corresponding plurality of mounting posts 15100, for removably mounting first lower portion 1564 of left support wall 1562 onto mounting base 1560. It is understood that here, by way of example, three recesses 1598 are shown although only two of these recesses 1598 preferably receive a corresponding two mounting posts 15100. Alternative numbers and arrangements of recesses 1598 and mounting posts 15100 are also possible.

[0308] Similarly, second upper portion 1572 of right support wall 1568 includes an upper surface 15102, which is formed with a furnace recess 15104 operative to receive HTF 1520. Preferably, a single guiding pin 1596 on the lefthand side of AMPT 1302 is sufficient to fix HTF 1520 in a correct orientation, such that no additional guiding pin, similar to guiding pin 1596, need be included in right hand furnace recess 15104. It is appreciated, however, that in some embodiments of the present invention, furnace recess 15104 may be formed with a pin recess adapted to receive a guiding pin.

[0309] Similar to first lower portion 1564 of left support wall 1562, second lower portion 1570 of right support wall 1568 is also formed with a plurality of recesses (not shown), operative to receive a corresponding plurality of mounting pins 15110, for removably mounting second low er portion 1570 of right support wall 1568 onto mounting base 1560. Mounting pins 15100 and 15110 are preferably fixedly mounted in a corresponding plurality of recesses or apertures 15112 formed in mounting base 1560, seen particularly in Fig. 15F.

[0310] As seen particularly in Fig. 15C, furnace recesses 1592 and 15104 are preferably shaped and positioned such that a longitudinal axis A of HTF 1520 is preferably generally horizontally oriented, generally parallel to mounting base 1560 and generally perpendicular to the force of gravity. It is a particular feature of a preferred embodiment of the present invention that HTF 1520 is generally horizontally, rather than vertically, oriented, which gives rise to several advantages during operation of AMPT 1302. as is detailed henceforth. In a preferred embodiment of the present invention, HTF 1520 is horizontally oriented. Alternatively, HTF 1520 may be approximately horizontally oriented, for example within ±30° to the horizontal.

[0311] First lower portion 1564 of left support wall 1562 is preferably formed with a pair of v-shaped grooves 15120 operative to seat a pair of quartz rods 15122 therein. First upper portion 1566 of left support wall 1562 is also preferably formed with a corresponding pair of v-shaped grooves 15124 for seating quartz rods 15122 therein. A first pair of apertures 15126 and a second pair of apertures 15128 are preferably respectively formed in first lower portion 1564 and first upper portion 1566 of left support wall 1562. Apertures 15126 and 15128 are preferably adapted to receive alignment posts 15130, operative to align first lower portion 1564 and first upper portion 1566 with one another. Alignment posts 15130 are preferably ceramic.

[0312] Similarly, second lower portion 1570 of right support wall 1568 is preferably formed with a pair of v-shaped grooves 15132 operative to seat another pair of quartz rods 15134 therein. Second upper portion 1572 of right support wall 1568 is also preferably formed with a corresponding pair of v-shaped grooves 15136 for seating quartz rods 15134 therein. A third pair of apertures 15138 and a fourth pair of apertures 15140 are preferably respectively formed in second lower potion 1570 and second upper portion 1572 of right support wall 1568. Apertures 15138 and 15140 are adapted to receive alignment posts 15142, operative to align second lower portion 1570 and second upper portion 1572 with one another. Alignment posts 15142 are preferably ceramic. Quartz rods 15122 serve to create a thermal break between portions 1564 and 1566 of left support wall 1562. Similarly, quartz rods 15134 serve to create a thermal break between portions 1570 and 1572 of right support wall 1568. This reduces heat transfer from HTF 1520 to load application system 1540 and deflectometer 1550, thus preventing load application system 1540 and deflectometer 1550 from overheating during operation of AMPT 1302.

[0313] Mounting base 1560 is preferably additionally formed with a tubular deflectometer aperture 15150, a left support wall guide 15152 and a right support wall guide 15154. Mounting base 1560 preferably additional includes a plurality of mounting holes 15160 for receiving fasteners (not shown) for mounting AMPT 1302 to sub-chamber 1310.

[0314] It is appreciated that the particular configuration of AMPT 1302, including the particular configuration of support walls 1562 and 1568, is an exemplary configuration only and that other configurations of AMPT 1302 are also possible. By way of example, support walls 1562 and 1568 may be formed as unitary walls, similar to support walls 210 and 220 of AMPT 102.

[0315] Reference is now made to Figs. 16A, 16B, 16C, 16D, 16E and 16F, which are simplified schematic respective assembled isometric, front planar, first side planar, exploded, second side planar and sectional view illustrations of heat source 1510 and HTF 1520. HTF 1520 includes a non-metallic furnace housing (NMFH) 1600 described hereinbelow with particular reference to Figs. 17A - 18 and a susceptor 1610. Susceptor 1610 is preferably inductively heated by heat source 1510.

[0316] Heat source 1510 is preferably an induction heat source, and more preferably an ultra-high frequency induction heat source, and preferably includes a heater body 1620 and a coil 1622 having a plurality of turns 1624. Coil 1622 is preferably metallic, and is more preferably formed of copper. An exemplary heat source suitable for use as heat source 1510 is an EKOHEAT 15 KW, commercially available from Ambrell Induction Heating Solutions of Rochester, NY, USA. It is appreciated that the use of other ty pes of heat sources and / or heat sources of a variety of powers is also possible. As seen particularly in Fig. 16D, turns 1624 of coil 1622 define an inner space 1626, which is operative to receive HTF 1520. Turns 1624 are preferably distributed so as to define a central opening 1630 to allow access of load application system 1540 and deflectometer 1550, as seen particularly at enlargement L in Fig. 16C.

[0317] Coil 1622 is preferably generally horizontally oriented and preferably has a generally horizontal longitudinal axis A. In a preferred embodiment of the present invention, coil 1622 is horizontally oriented. Alternatively, coil 1622 may be approximately horizontally oriented, for example within ±30° to the horizontal. HTF 1520 is preferably generally horizontally oriented when disposed in coil 1622. HTF 1520 may he along longitudinal axis A when HTF 1520 is disposed (inserted) in coil 1622, as seen particularly in Fig. 16B. It is a particular feature of a preferred embodiment of the present invention that HTF 1520 and coil 1622 are generally horizontally oriented. As a result of the generally horizontal orientation of HTF 1520 and coil 1622, turns 1624 of coil 1622 serve to help support susceptor 1610, such that no additional mechanical support of susceptor 1610 is required. Furthermore, at the high temperatures at which AMPT 1302 may be operative, a vertical susceptor would create a strong ‘chimney effect’, in which convection currents would carry heat away from the susceptor, thereby limiting maximum susceptor temperature, creating vertical thermal gradients and placing an additional heat load on sensitive load application system 1540 and deflectometer 1550. The generally horizontal orientation of susceptor 1610 obviates this problem.

[0318] Additionally, the horizontal orientation of space 1626 defined by coil 1622 facilitates easy insertion and removal of horizontally orientated HTF 1520, without interference with adjacent vertically oriented load application system 1540 and deflectometer 1550, thus allowing rapid throughput of system 1300.

[0319] In accordance with standardized requirements for certain material property7tests, such as testing standards set forth by ASTM International and the International Organization for Standardization (ISO), sample 1500 is oriented horizontally during material property testing. The use of a generally horizontally oriented susceptor 1610 to hold horizontally oriented sample 1500 thus allows a smaller susceptor to be used than would be the case should a horizontally oriented sample 1500 be held in a non-horizontally oriented susceptor, such as a vertically oriented susceptor. This allows a relatively small susceptor 1610 having a relatively small mass to be used, thereby promoting relatively rapid heating and cooling rates and reducing replacement costs of susceptor 1610.

[0320] As seen particularly in Figs. 13A - 13D, heat-source aperture 1406 in environmental chamber 1304 preferably accommodates heat source 1510 such that heater body 1620 is housed fully or mostly outside of environmental chamber 1304, while coil 1622 is preferably housed fully within interior space 1432 of main sub-chamber 1310. Preferably, a plurality of sealing components (not shown), such as sealing components at perimeter 1436 of heat-source aperture 1406, form a substantially vacuum-tight seal between heat-source aperture 1406 and an environment surrounding environmental chamber 1304.

[0321] Coil 1622 preferably has one or more turns 1624. In a typical embodiment of the present invention, coil 1622 has a size between 200 cm3- 2,000 cm3, and between 2 - 10 turns 1624. It is appreciated that the formation of coil 1622 with a plurality of turns 1624 provides a more even heating, by coil 1624, of HTF 1520.

[0322] As seen particularly at enlargement M in Fig. 1 F, coil 1622 is preferably coated by an electrically insulating layer 1630. Water cooling (not shown) may be provided through an interior 1632 of coil 1622. Coil 1622 may be formed by copper 1634, although other suitable conductive materials are also possible.

[0323] As seen particularly in Fig. 16C, in a fully assembled operational state, sample 1500 and testing unit 1530 are inserted in HTF 1520, which in turn is enclosed within coil 1622 of heat source 1510. Heat source 1510 preferably heats susceptor 1610 using induction heating. In turn, susceptor 1610 heats sample 1500 and testing unit 1530, preferably using conduction heating, radiation heating, or a combination of conduction heating and radiation heating.

[0324] It is a particular feature of a preferred embodiment of the present invention that only a relatively small portion of system 1300 is heated to a testing temperature. More specifically, preferably only susceptor 1610, testing unit 1530 and sample 1500 are heated to a testing temperature at which material properties of sample 1500 are tested. Susceptor 1610 is particularly designed to have a size similar to a size of sample 1500, thereby reducing an amount of material required to be heated prior to, and cooled following, a testing of sample 1500. In a typical embodiment of the present invention, susceptor 1610 has a size between 40 cm3- 400 cm3. The relative smallness of material that is heated and cooled preferably contributes to relatively high heating and cooling rates of system 1300, compared to conventional systems for material property testing.

[0325] It is appreciated that a heating rate and a cooling rate of a component, as well as an amount of time required to heat and / or cool a component, is directly proportional to an amount of material in the component, i.e., to a mass of the component. Thus, each of a heating rate, a cooling rate, a heating time and a cooling time of a component formed of a given material is directly proportional to a volume of the component. Preferably, in contrast with conventional material property testing systems, system 1300 only heats and cools a relatively small mass and volume. Therefore, heating rates, cooling rates, heating times and cooling times of system 1300 are lower, and preferably significantly lower, than those of conventional systems.

[0326] Reference is now made to Figs. 17A, 17B, 17C, 17D, 17E, 17F, 17G and 17H, which are simplified schematic respective assembled isometric, side planar, sectional, top-facing exploded, bottom-facing exploded, top-facing partially exploded, bottom-facing partially exploded, and enlarged detailed exploded view illustrations of high temperature furnace HTF 1520 and 4PB testing unit 1532, which is an embodiment of testing unit 1530. Reference is additionally made to Fig. 18, which is a simplified schematic exploded view illustration of HTF 1520 and 3PB testing unit 1534, which is an alternative embodiment of testing unit 1530.

[0327] As described hereinabove, HTF 1520 includes NMFH 1600 and susceptor 1610. NMFH 1600 preferably includes a layer of graphite foil 1700 wrapped around susceptor 1610 and having a first end 1702 and a second end 1704. Graphite foil 1700 preferably serves to protect susceptor 1610 from degradation during operation of AMPT 1302. Graphite foil layer 1700 is preferably formed from Grafoil, commercially available from NeoGraf Solutions, of Lakewood, Ohio, USA. Grafoil 1700 is preferably adhered to a surface of susceptor 1610 by an adhesive.

[0328] NMFH 1600 preferably additionally includes a thennal insulation portion 1710, preferably including a first thermally insulating felt layer 1712 wrapped around first end 1702 of graphite foil 1700 and a second thermally insulating felt layer 1714 wrapped around second end 1704 of graphite foil 1700. First and second insulating felt layers 1712 and 1714 are preferably formed from Rayon graphite felt, commercially available from Ceramaterials, of Dingmans Ferry, PA, USA. Felt layers 1712 and 1714 are preferably adhered to a surface of graphite foil 1700 by an adhesive. By way of example, first and second insulating felt layers 1712 and 1714 may each be wrapped twice around susceptor 1610, although it is appreciated that a greater or fewer number of turns is possible, depending on design requirements.

[0329] The insulation provided by thermal insulation portion 1710 results in a relatively low amount of heat loss from susceptor 1610. It is appreciated that the relatively low amount of heat loss from susceptor 1610 results in a relatively efficient heating of susceptor 1610, testing unit 1530 and sample 1500, characterized by a relatively short amount of time required to heat susceptor 1610, testing unit 1530 and sample 1500 and a relatively high heating rate of susceptor 1610, testing unit 1530 and sample 1500.

[0330] Additionally, the relatively low amount of heat loss from susceptor 1610 results in a relatively low undesired heating of components other than susceptor 1610, testing unit 1530 and sample 1500. The relatively low undesired heating, compared to conventional material property testing systems, in turn results in a relatively short amount of time required to cool system 1300 following a testing of sample 1500, since, relative to conventional material property testing systems, system 1300 includes a low level of undesired heat that must be removed as part of a cooling process. As seen particularly in Figs. 17D and 17E. graphite foil 1700 is preferably formed with a sample aperture 1720, a displaceable-rod aperture 1722 and at least one temperature-reader aperture 1724.

[0331] Susceptor 1610 may have any suitable shape. In the embodiment shown in Figs. 13A - 24, susceptor 1610 is cylindrical and is formed of an electrically conductive material, such as inter alia, graphite or silicon carbide. In a particularly preferred embodiment of the present invention, susceptor 1610 is formed of the same material as NMFH 1600, such a graphite, whereby material interactions between NMFH 1600 and susceptor 1610 are prevented.

[0332] Susceptor 1610 is preferably formed as a unitary element having a sample-receiving cavity 1730, a displaceable-rod bore 1732, at least one temperature-reader bore 1734 and a pair of pin recesses 1736. In an assembled, operative state, sample receiving recess 1730 is aligned with sample aperture 1720, displaceable-rod bore 1732 is aligned with displaceable-rod aperture 1722, and temperature-reader bore 1734 is aligned with temperature-reader aperture 1724.

[0333] As appreciated particularly from consideration of Figs. 17C and 17F, a length of sample-receiving cavity 1730 is preferably less than an entire length of susceptor 1610. A length of sample-receiving cavity 1730 may be significantly less than an entire length of susceptor 1610. By way of example, a length of sample-receiving cavity may be in a range of between about a quarter of the length of susceptor 1610 to about a half of the length of susceptor 1610. It is appreciated that a size of susceptor 1610 and / or sample-receiving cavity 1730 maybe varied, based on a size of sample 1500. By way of example only, in one preferred embodiment of the present invention, sample-receiving cavity 1730 may have a length of 28.58 mm and an entire length of susceptor 1610 may be 125 mm. The relatively small length of sample-receiving cavity 1730 with respect to susceptor 1610 promotes relatively rapid and uniform heating of sample 1500 when inserted in sample-receiving cavity 1730.

[0334] Preferably, the entirety of sample 1500 is contained (enclosed) within sample-receiving cavity 1730. Formation of thermal gradients across sample 1500 is thereby prevented. Thermal gradients would be formed across sample 1500 should portions of sample 1500 extend out of sample-receiving cavity 1730.

[0335] In a preferred embodiment of the present invention, cavity 1730 may enclose a variety of types of testing units 1530, such as, by way of nonlimiting example only, 4PB testing unit 1532. described herein with particular reference to Figs. 17F - 17H and 3PB testing unit 1534, described hereinbelow with particular reference to Fig. 18. Testing unit 1530 is operative to perform material property testing of sample 1500. Components of testing unit 1530 are preferably formed of a temperature-resistant material, such as, inter alia, graphite or silicon carbide.

[0336] As seen particularly at enlargement N in Fig. 17F, at enlargement O in Fig. 17G and in Fig. 17H, in an embodiment of the present invention, testing unit 1530 is embodied as 4PB testing unit 1532 and includes an upper portion 1740 and a lower portion 1742. Upper portion 1740 preferably includes an upper loading pin carrier (ULPC) 1750 and lower portion 1742 preferably includes a lower support pin carrier (LSPC) 1752. Upper and lower portions 1740 and 1742 preferably also include five, preferably cylindrical, pins, including a loadapplication contact pin 1754, a pair of upper loading pins 1756 and a pair of lower support pins 1758. Load-application contact pin 1754 is preferably contacted by load-application system 1540 during testing of sample 1500.

[0337] Upper loading pins 1756 and lower support pins 1758 preferably allow for load equalization across sample 1500 during material property testing, as required by. for example, testing standards set forth by ASTM International and the International Organization for Standardization (ISO).

[0338] In the embodiment shown in Figs. 13A - 24, all of guiding pin 1596, load-application contact pin 1754, upper loading pins 1756 and lower support pins 1758 are identical to one another. In another embodiment of the present invention, at least some of guiding pm 1596, load-application contact pm 1754, upper loading pins 1756 and lower support pins 1758 are not identical to one another.

[0339] ULPC 1750 preferably includes an inner surface 1760, which is formed with a pair of pin recesses 1762, each operative to receive one of upper loading pins 1756. ULPC 1750 is preferably additionally formed with a pair of deformation cut-outs 1764, which are operative to receive portions of sample 1500 which may be deformed during testing. ULPC 1750 further includes an outer surface 1770, which is additionally preferably formed with a notch 1772 operative to receive load-application contact pin 1754.

[0340] LSPC 1752 preferably includes an inner surface 1776, upon which is formed a first protrusion 1778 and a second protrusion 1780, each operative to abut one of lower support pins 1758 in an assembled orientation. First and second protrusions 1778 and 1780 are each formed with a generally rectangular notch 1782 operative to receive sample 1500. Inner surface 1776 of LSPC 1752 is preferably additionally formed with a deformation recess 1786 operative to receive portions of sample 1500 which may be defonned during testing. LSPC 1752 is additionally formed with a displaceable-rod aperture 1788. In an assembled operative orientation, displaceable-rod aperture 1788 is preferably coaxial with displaceable-rod aperture 1722 and displaceable-rod bore 1732 along an axis 1790.

[0341] It is appreciated that a 4PB fracture testing unit is typically identical to 4PB testing unit 1532. As is known in the art, unlike 4PB testing unit 1532, which receives an unnotched sample 1500, the 4PB fracture testing unit receives a sample having a notch, preferably in a lower central portion thereof.

[0342] As seen particularly in Fig. 18, in an additional embodiment of the present invention, testing unit 1530 is embodied as 3PB testing unit 1534 and includes lower portion 1742, preferably in turn including LSPC 1752 and two lower support pins 1758. Lower support pins 1758 preferably allow for load equalization across sample 1500 during material property testing, as required by, for example, testing standards set forth by ASTM International and the International Organization for Standardization (ISO). Each of lower support pins 1758 is preferably positioned respectively abutting first protrusion 1778 and a second protrusion 1780 formed on inner surface 1776 of LSPC 1752. In an assembled operative orientation, displaceable-rod aperture 1788 of LSPC 1752 is preferably coaxial with displaceable-rod aperture 1722 and displaceable-rod bore 1732 along axis 1790. It is appreciated that a 3PB fracture testing unit is typically identical to 3PB testing unit 1534. As is known in the art, unlike 3PB testing unit 1534, which receives an unnotched sample 1500, the 3PB fracture testing unit receives a sample having a notch, preferably in a lower central portion thereof.

[0343] Reference is now made to Figs. 19A. 19B, 19C and 19D. which are simplified schematic respective assembled isometric, side planar, front sectional and exploded view illustrations of load application system 1542, which is a first embodiment of load application system 1540, Fig. 19C being taken along line 19C - 19C in Fig. 19B; to Figs. 20A and 20B which are respective simplified schematic side planar and front planar view illustrations of load application system 1544, which is an alternative embodiment of load application system 1540. It is appreciated that load application systems 1542 and 1544 are exemplary load application systems only and that other load application systems may alternatively be used in the present invention. Load application system 1540 may also be referred to as a load application unit. Load application system (unit) 1540 is operative to control an application of a testing load to sample 1500.

[0344] Load application system 1540 preferably includes a linear actuator 1902, which includes a drive shaft 1904, and a hybrid load rod 1910. Linear actuator 1902 is preferably a low-torque load unit operative to control application of a testing load to sample 1500. More specifically, linear actuator 1902 is preferably operative to drive load rod 1910, which in turn applies a force constituting a testing load to sample 1500 during testing thereof. Linear actuator 1902 is preferably a low-torque precision linear actuator which drives and positions load rod 1910 at a controlled rate, and may be any suitable linear actuator, such as, inter alia, a stepper motor or a DC gear box. Exemplary stepper motors suitable for use as linear actuator 1902 include hybrid stepper motor linear actuators commercially available from Dings Motion USA of Morgan Hill, California, USA, such as model no. 14K4105AA4-150SUSEK112.

[0345] A force sensor 1916 preferably connects linear actuator 1902 with load rod 1910 and preferably measures a load applied to sample 1500 by load application system 1540. Force sensor 1916 is typically embodied as a load cell, preferably a bidirectional load cell. Exemplary load cells each suitable for use as force sensor 1916 include Economical Single Point Bending Beam Force Sensors, commercially available from Transducer Techniques of Temecula, California, USA, such as model no. ESP-25.

[0346] As seen particularly in Figs. 19C and 19D, load application system 1540 further includes an actuator connector assembly 1922 and a load rod connector assembly 1924. Actuator connector assembly 1922 preferably includes an upper load cell connector 1926 and an actuator connector rod 1930. Upper load cell connector 1926 is preferably formed with a pair of fastener apertures 1932, a connector-rod aperture 1934, a connector-rod reinforcement opening 1936, and a wire guide aperture 1938. A pair of fasteners 1942 is preferably mounted in fastener apertures 1932 and fasten actuator connector assembly 1922 to force sensor 1916. An additional fastener 1944 is mounted in wire guide aperture 1938 to fasten a wire guide 1946 to upper load cell connector 1926. Another additional fastener 1950 is mounted in connector-rod reinforcement aperture 1936 and fastens actuator connector rod 1930 to upper load cell connector 1926.

[0347] Load rod connector assembly 1924 preferably includes a lower load cell connector 1954, which is preferably formed with a pair of fastener apertures 1956 and a load rod fastener aperture 1958. A plurality of fasteners 1960 is preferably mounted in fastener apertures 1956 and fasten load rod connector assembly 1924 to force sensor 1916.

[0348] Load rod connector assembly 1924 additionally preferably includes a clamp 1962 operative to clamp load rod 1910 to lower load cell connector 1954. Clamp 1962 preferably includes a clamp base 1964 formed with a groove 1966 and a pair of clamp pieces 1968, each formed with a notch 1970. Clamp base 1964 and clamp pieces 1968 are preferably additionally formed with a plurality of fastener apertures 1972 operative to receive a corresponding plurality of fasteners 1974 to fasten load rod 1910 to clamp 1962 when clamped in notches 1966 and 1970. Clamp base 1966 is preferably additionally formed with a throughgoing fastener aperture 1976 operative to receive a fastener 1978. An additional fastener 1980 is preferably mounted in fastener aperture 1958 to affix lower load cell connector 1954 to clamp base 1964. Load rod 1910 is preferably embodied as a hybrid or composite rod, including a non-conductive portion 1990 and a refractor}' portion 1992. Non- conductive portion 1990 is preferably formed by a thermally and electrically insulating material, such as quartz glass. Refractory portion 1992 is preferably fonned by a material having high resistance to the high temperatures at which AMPT 1302 may be operative and having high stiffness at these temperatures. By way of example, refractory portion 1992 may be formed by graphite or silicon carbide. In accordance with a particularly preferred embodiment of the present invention, refractory portion 1992 is fonned by graphite. It is appreciated that refractory portion 1992 preferably contacts test unit 1530 or sample 1500 during operation of AMPT 1302 whereas non-conductive portion 1990 is preferably distal from test unit 1530 and sample 1500 and proximal to force sensor 1916 during operation of AMPT 1302, such that conduction of heat and electrical current from heat source 1510 to linear actuator 1902 and force sensor 1916 is minimized, thus preventing damage to these components. A circumference of non- conductive portion 1990 may be greater than a circumference of refractory portion 1992, in order to prevent bending or breakage of non-conductive portion 1990. Preferably, non-conductive portion 1990 additionally advantageously provides both thermal and electrical insulation to linear actuator 1902 and force sensor 1916.

[0349] Non-conductive portion 1990 is preferably fixedly mounted to refractory portion 1992 by a rod clamp assembly 1996. Rod clamp assembly 1996 preferably includes a clamp base 1998. a clamp connector 19100. a first pair of rod clamp pieces 19102 and a second pair of rod clamp pieces 19104. Clamp base 1998 is preferably formed with a notch 19108 in an upper segment 19110 thereof, sized to receive non-conductive portion 1990 of load rod 1910, a first plurality of fastener apertures 19114 located in upper segment 19110 and a second plurality of fastener apertures 19116 located in a lower segment 19118. Clamp connector 19100 is preferably formed with a groove 19120, sized to receive refractory portion 1992 of load rod 1910, a first plurality of outer fastener apertures 19122 and a second plurality of inner fastener apertures 19124. Fastener apertures 19116 and 19122 are preferably operative to receive therein a plurality of fasteners 19128, for mounting clamp connector 19100 to clamp base 1998.

[0350] Each of first pair of rod clamp pieces 19102 is preferably formed with a notch 19130 sized to receive non-conductive portion 1990 of load rod 1910 and a plurality’ of fastener apertures 19132 operative to receive a plurality of fasteners 19134. Similarly, each of second pair of rod clamp pieces 19104 is preferably formed with a notch 19138 sized to receive refractory’ portion 1992 of load rod 1910 and a plurality of fastener apertures 19140 operative to receive a plurality of fasteners 19142.

[0351] When assembled, a lower end 19150 of upper, non-conductive portion 1990 is clamped within notches 19108 and 19130 and an upper end 19152 of lower, refractory portion 1992 is clamped within notches 19120 and 19140. Lower end 19150 of non-conductive portion 1990 is thereby rigidly held in clamped contact with upper end 19152 of refractory portion 1992, thereby forming a composite rod 1910, as seen particularly in Fig. 19C.

[0352] A working end 19154 of refractory portion 1992 is preferably configured for application of a force on sample 1500 by load application system 1540 during material property testing of sample 1500. In one embodiment of load application system 1540, load application system 1542 shown in Figs. 19A - 19D may be used for performance of 4PB testing on sample 1500. For performance of 4PB testing, w orking end 19154 of refractory’ portion 1992 of load rod 1910 is preferably formed with a flat force-application surface 19156, as seen particularly in Figs. 19B and 19C.

[0353] In an additional embodiment of load application system 1540, load application system 1544 shown in Fig. 20A and 20B, may be used for performance of 3PB testing on sample 1500. As seen particularly at enlargement Q in Fig. 20A and enlargement R in Fig. 20B, in this embodiment working end 19154 of refractory portion 1992 may be formed with a rounded force-application surface 19157 having rounded edges 19158.

[0354] As described hereinabove, the provision of a hybrid, partly non- conductive, load rod 1910 serves to prevent overheating of and conduction of electrical current to linear actuator 1902 and force sensor 1916. In addition, overheating of linear actuator 1902 is further preferably prevented by provision of a heat pipe 19160 operative to transfer heat away from linear actuator 1902. Heat pipe 19160 may be any suitable type of heat pipe. For example, heat pipe 1960 may be a heat pipe of 6 mm diameter and 250 mm length, commercially available from McMaster-Carr, of Chicago. IL, USA.

[0355] Heat pipe 19160 is preferably mounted to linear actuator 1902 at a first end 19162 thereof by a first bracket 19166 including first and second clamp portions 19168 and 19169, each formed with a groove 19170 for receiving first end 19162 of heat pipe 19160 therein. Each of clamp portions 19168 and 19169 additionally preferably respectively includes a set of fastener apertures 19172 and 19173 operative to receive a set of fasteners 19174 therein. Heat pipe 19160 is preferably mounted to an inner wall of upper sub-chamber 1312 at a second end 19176 thereof by a second bracket 19178 including a first and second clamp portions 19180 and 19181, each formed with a groove 19182 for receiving second end 19176 of heat pipe 19160 therein. Each of clamp portions 19180 and 19181 additionally preferably respectively includes a set of fastener apertures 19184 and 19185 operative to receive a set of fasteners 19186 therein.

[0356] Load application system 1540 further preferably includes an actuator mount 19190, an actuator grip 19192 and an actuator mounting cap 19194. Linear actuator 1902 is fixedly mounted in actuator grip 19192, which is in turn mounted in actuator mount 19190 and secured thereto by mounting cap 19194. As seen particularly in Fig. 19C. a lower end 19198 of actuator connector rod 1930 is preferably mounted in connector-rod aperture 1934 of upper load cell connector 1926. An upper end 19200 of actuator connector rod 1930 is preferably housed within actuator mount 19190 and affixed to drive shaft 1904 of linear actuator 1902.

[0357] Reference is now made to Figs. 21A, 21B, 21C and 21D. which are simplified schematic respective assembled isometric, side planar, sectional and exploded view illustrations of deflectometer 1550, Fig. 21 C being taken along line 21C - 21C in Fig. 21B, and to Figs. 21E, 21F, 21G and 21H, which are simplified schematic respective isometric, side planar, sectional and exploded illustrations of a portion of deflectometer 1550 of Figs. 21A - 21D, Fig. 21G being taken along line 21G - 21G of Fig. 21F.

[0358] It is appreciated that the particular embodiment of deflectometer 1550 described and shown herein, with reference to Figs. 21A - 21G, is by way of example only and that other types of deflectometers may alternatively be used within the present invention. For example, non-contact systems may be employed in the present invention for sensing deflection of a sample, such as, by way of nonlimiting example only, systems based on laser interferometry, ultrasonic distance sensing and confocal distance measurement.

[0359] Deflectometer 1550 is preferably embodied as a position sensor, and particularly preferably as a high temperature linear variable differential transformer (LVDT) sensor, which is operative to measure a deflection of sample 1500 during testing thereof.

[0360] Deflectometer 1550 preferably includes a hybrid displaceable rod 2110 fixedly coupled to a position transducer 2112, which is preferably a high temperature LVDT transducer. An exemplary LVDT transducer suitable for use as position transducer 2112 is a LVDT MHR 250 ASSY, commercially available from TE Connectivity of Schaffhausen, Switzerland.

[0361] Hybrid displaceable rod 2110 is preferably similar, although not identical, to hybrid load rod 1910 of load application system 1 40 shown in Figs. 19A - 20B. Displaceable rod 2110 is preferably embodied as a hybrid or composite rod. including a non-conductive portion 2116 and a refractory' portion 2118. Non-conductive portion 2116 is preferably formed by a thennally and electrically insulating material, such as quartz glass. Refractory portion 2118 is preferably formed by a material resistant to the high temperatures at which AMPT 1302 may be operative and having high stiffness at these temperatures. By way of example, refractory portion 2118 may be formed by graphite or silicon carbide. In accordance with a particularly preferred embodiment of the present invention, refractory portion 2118 is formed by graphite. It is appreciated that refractory portion 2118 preferably contacts sample 1500 during operation of AMPT 1302 whereas non-conductive portion 2116 is preferably distal from sample 1500 and proximal to position transducer 2112 during operation of AMPT 1302, such that conduction of heat and electricity from heat source 1510 to position transducer 2112 is minimized.

[0362] A circumference of non-conductive portion 2116 may be greater than a circumference of refractory portion 2118, in order to prevent bending or breakage of non-conductive portion 2116. Non-conductive portion 2116 preferably advantageously provides both thermal and electrical insulation to position transducer 2112.

[0363] Refractory7portion 2118 is preferably fixedly mounted to non- conductive portion 2116 by clamp assembly 1996. Refractory portion 2118 preferably has a working end 2120 and non-conductive portion 2116 preferably has a mounting end 2122. Working end 2120 is typically tapered and preferably includes a generally planar top surface 2124, which preferably remains in mechanical contact with sample 1500 during testing thereof. Preferably, top surface 2124 does not readily cut or notch sample 1500.

[0364] Deflectometer 1550 preferably includes a deflectometer transducer assembly 2130. Deflectometer transducer assembly 2130 preferably incudes a rod clamp 2132, a linear slide 2134 and position transducer 2112. Deflectometer transducer assembly 2130 also preferably includes a transducer body 2138 housing position transducer 2112, a deflectometer transducer mounting plate 2140 and a deflectometer transducer assembly mounting bracket 2142.

[0365] As seen particularly in Figs. 21C and 21D, rod clamp 2132 preferably includes a rod clamp base 2144 and a pair of rod clamp pieces 2146. Each of rod clamp base 2144 and rod clamp pieces 2146 is preferably formed with a groove 2148 configured to receive mounting end 2122 displaceable rod 2110. In an assembled state, mounting end 2122 of displaceable rod 2110 is preferably clamped in groove 2148 between rod clamp pieces 2146 and rod clamp base 2144, and rod clamp pieces 2146 are fixedly attached to rod clamp base 2144 by a plurality of fasteners 2150. Rod clamp 2132 is preferably fixedly mounted to linear slide 2134 by a plurality of fasteners 2154. Displaceable rod 2110 is thus fixedly mounted to linear slide 2134 by way of rod clamp 2132.

[0366] Position transducer 2112 preferably includes a core rod 2160, having a working end 2162 and a mounting end 2164, seen particularly in Fig. 21C. Mounting end 2164 of core rod 2160 is preferably fixedly mounted to an additional rod 2170. Rod 2170 includes a lower end 2172, to which core rod 2160 is mounted, and an upper end 2174, which is mounted within an opening 2180 formed in transducer body 2138 and extends through a slot 2182 in rod clamp base 2144.

[0367] As seen particularly in Fig. 21C, working end 2162 of core rod 2160 is slidably mounted within transducer body 2138 housing position transducer 2112. Rod 2170 and core rod 2160 are fixedly mounted to one another, for example, by complementary threading (not shown) on mounting end 2164 of core rod 2160 and lower end 2172 of rod 2170.

[0368] Position transducer 2112 is preferably fixedly housed at least partially within transducer body 2138 by a plurality of fasteners 2184. At least one of fasteners 2184 is preferably resilient, preferably being formed of neoprene, allowing a relatively strong frictional engagement between transducer body 2138 and position transducer 2112 without damaging or deforming position transducer 2112.

[0369] Transducer body 2138 is preferably in turn mounted to linear slide 2134 by a plurality of fasteners 2188. Transducer body 2138 is preferably additionally mounted to deflectometer transducer assembly mounting bracket 2142 by another plurality of fasteners 2190. Deflectometer transducer assembly mounting bracket 2142 is in turn mounted to deflectometer assembly mounting plate 2140 by a plurality of fasteners 2192.

[0370] It is appreciated that during a preferred use of system 1300, displaceable rod 21 10 is fixedly mounted to linear slide 2134. Deflection of displaceable rod 2110 by sample 1500 causes linear slide to move up and down, in directions indicated by an arrow 2196. Furthermore, rod 2170 is fixedly mounted to linear slide 2134 and core rod 2160 is fixedly mounted to rod 2170. Therefore, when linear slide 2134 moves in a direction indicated by arrow 2196, rod 2170 and core rod 2160 also move together with linear slide 2134.

[0371] Deflectometer assembly mounting plate 2140 is preferably mounted to plate 14130 by a plurality of fasteners 21100 having a corresponding plurality of springs 21102 and washers 21104 threaded therealong. It is appreciated that plate 14130 preferably is a base plate of sub-chamber 1316. Springs 21 102 serve to allow for adjustment of deflectometer assembly mounting plate 2140, in order to level deflectometer 1550.

[0372] Deflectometer 1550 preferably additionally includes a counterweight mechanism 21120. seen particularly in Figs. 21 E - 21H. Counterweight mechanism 21120 preferably includes a weighted bar 21122 mounted partially within a counterweight support 21124. Counterweight support 21124 preferably includes a weighted-bar slot 21126 and a pair of pivot apertures 21130 and is preferably fixedly mounted, by a plurality of fasteners 21131, on deflectometer transducer mounting plate 2140.

[0373] Weighted bar 21122 has a first side 21132 and a second side 21134. First side 21132 of weighted bar 21122 is preferably formed with a weight-bearing aperture 21136. Weighted bar 21122 is additionally preferably formed with a pivot aperture 21138. A weight 21140 is preferably fixedly mounted onto weighted bar 21122, using weight-bearing aperture 21136. As seen particularly in Fig. 21C, deflectometer transducer assembly 2130 preferably rests on an upper surface 21142 of second side 21134 of weighted bar 21122.

[0374] Weight 21140 preferably has a mass sufficient to counteract a gravitational force exerted on deflectometer transducer assembly 2130, urging deflectometer transducer assembly 2130 upward, and preferably ensuring that top surface 2124 of displaceable rod 2110 remains in contact with sample 1500 during testing thereof. Weight 21140 preferably includes a bolt 21146, on which are mounted a plurality of weighted elements 21148, such as a plurality of nuts and a cap nut 21149.

[0375] Counterweight mechanism 21120 preferably further includes a pivot pin 21150, about which is mounted a cylindrical bearing 21152. Pivot pin 21150 is preferably received by pivot apertures 21130 of counterweight support 21124 and by pivot aperture 21 138 of weighted bar 21122. Cylindrical bearing 21152 is preferably received by pivot aperture 21138 of weighted bar 21122. Together, pivot pin 21150 and cylindrical bearing 21152 pivotably affix weighted bar 21122 to counterweight support 21124, such that w eighted bar 21122 is able to rotate within weighted-bar slot 21126. It is appreciated that a downward force of gravity on first side 21132 of weighted bar 21122 urges weighted bar 21122 to rotate about pivot pin 21150 in a direction indicated by an arrow 21160, which in turn urges second side 21134 of weighted bar 21122 upward, against a force of gravity. In contrast, a downward force of gravity acting on deflectometer transducer assembly 2130 exerts a downward force on second side 21134 of weighted bar 21122, urging weighted bar 21122 to rotate about pivot pin 21150 in a direction indicated by an arrow 21162.

[0376] Reference is now made to Figs. 22A - 23K, which are simplified schematic illustrations showing successive steps in a preparation and use of system 1300 for performing material property testing, in accordance with one preferred embodiment of the present invention; to Fig. 24, which is a simplified schematic illustration showing use of system 1300 for performing material property testing in accordance with another preferred embodiment of the present invention; and to Figs. 25A and 25B, which together form a simplified flowchart 2500 illustrating steps in a preparation and use of system 1300 for performing material property7testing, in accordance with a preferred embodiment of the present invention.

[0377] Figs. 22N - 22P all show a single step. Fig. 22P being taken along line 22P - 22P of Fig. 220. Figs. 23A - 23C all show a single step and Figs. 23D - 23E show an additional single step, Fig. 23B being taken along line 23B - 23B of Fig. 23A and Fig. 23E being taken along line 23E - 23E of Fig. 23D.

[0378] It is a particular feature of a preferred embodiment of the present invention that at least two HTFs 1520 are preferably in use at any given time during operation of system 1300, in an alternating manner. Preferably, during operation of system 1300, a first sample 1500, such as a first sample 1500A, is inserted in a first HTF 1520, such as a first HTF 1520A. The first HTF 1520A is heated, by heat source 1510, thereby heating the first sample 1500A. Material property testing is preferably performed on the first sample 1500A while the first sample 1500A is being heated, using a testing unit 1530, such as a first testing unit 1530A. A second sample 1500, such as a second sample 1500B, is preferably inserted in a second HTF 1520, such as a second HTF 1520B. Second sample 1520B may be inserted in second HTF 1520B prior to the completion of the performance of material property testing on first sample 1500A. Second sample 1500B may be inserted in second HTF 1520B prior to the commencement of, concurrently, or partially concurrently, with the heating and / or performance of material property testing on the first sample 1500A. Alternatively, second sample 1500B may be inserted in second HTF 1520B following the completion of performance of material property testing on the first sample 1500A.

[0379] Upon completion of performing material property testing on the first sample 1 00 A, second HTF 1520B is heated, by heat source 1510, thereby heating the second sample 1500B. Material property testing is preferably then performed on the second sample 1500B while the second sample 1500B is being heated, using a second testing unit 1530, such as a second testing unit 1530B.

[0380] A third sample 1500, such as a third sample 1500C, is preferably inserted in a third HTF 1520, such as a third HTF 1520C. Third sample 1500C may be inserted in third HTF 1520C prior to the completion of the performance of material property testing on second sample 1500B. Third sample 1500C may be inserted in third HTF 1520C prior to the commencement of the performance of material property testing on second sample 1500B. Additionally or alternatively, third sample 1500C may be inserted in third HTF 1520C even earlier in process 2500, prior to the commencement and / or completion of the performance of material property testing on first sample 1500A. Additionally or alternatively, third sample 1500C may be inserted in third HTF 1520C concurrently, or partially concurrently, with the heating and / or performance of material property testing on the second sample 1500B. Alternatively, third sample 1500C may be inserted in third HTF 1520C follow ing the completion of performance of material property’ testing on the second sample 1500B.

[0381] Upon completion of performing material property testing on the second sample 1500B, third HTF 1520C is heated, by heat source 1510, thereby heating the third sample 1500C. Material property testing is preferably perfonned on the third sample 1500C while the third sample 1500C is being heated, using a third testing unit 1530, such as a third testing unit 1530C.

[0382] A fourth sample 1500, such as a fourth sample 1500D, is preferably inserted in a fourth HTF 1520, such as a fourth HTF 1520D. Fourth sample 1500D may be inserted in fourth HTF 1520D prior to the completion of the performance of material property testing on third sample 1500C. Fourth sample 1500D may be inserted in fourth HTF 1520D prior to the commencement of the performance of material property testing on third sample 1500C. Additionally or alternatively, fourth sample 1500D may be inserted in fourth HTF 1520D even earlier in process 2500, prior to completion of the performance of material property testing on second sample 1500B and / or of first sample 1500A. Additionally or alternatively, fourth sample 1500D may be inserted in fourth HTF 1520D concurrently, or partially concurrently, with the performance of material property testing on the third sample 1500C. Alternatively, fourth sample 1500D may be inserted in fourth HTF 1520D following the completion of performance of material property testing on the third sample 1500C.

[0383] Upon completion of performing material property7testing on the third sample 1500C. fourth HTF 1520D is heated, by heat source 1510. thereby heating the fourth sample 1500D. Material property testing is preferably performed on the fourth sample 1500D while the fourth sample 1500D is being heated, using a fourth testing unit 1530, such as a fourth testing unit 1530D.

[0384] It is understood that the above-described process may be continued for testing a desired number of samples 1500 in a corresponding number of HTFs 1520, using a corresponding number of testing units 1530.

[0385] In one preferred embodiment of the present invention, shown in Figs. 23A - 23K, two HTFs 1520, such as first HTF 1520A and second HTF 1520B, are in alternating use during operation of system 1300. In this embodiment, first and second HTFs 1520A and 1520B may be cycled between for any desired number of sample tests, wherein a sample 1500 held in one HTF, such as one of HTF 1520A and 1520B, undergoes heating and material property7testing by a testing unit 1530 in AMPT 1302, whilst the other HTF, such as the other one of HTF 1520A and HTF 1520B, is cooled down and then receives a new sample 1500.

[0386] It is thus appreciated that concurrently, partially concurrently, prior to completion or immediately following completion of testing of first sample 1500A in first HTF 1520A in AMPT 1302, at least second sample 1500B is preferably readied for testing by being pre-filled in second HTF 1520B. Upon completion of testing of the first sample 1500A, the second HTF 1520B having the second sample 1500B inserted therein, is preferably relatively rapidly positioned in AMPT 1302 and heating and subsequently testing of the second sample 1500B relatively rapidly commenced. During testing of the second sample 1500B in the second HTF 1520B, the first HTF 1520A may be allowed to cool down and subsequently have an additional, third, sample 1500C inserted therein, readied for testing, and so forth.

[0387] It is appreciated that the alternating use of at least two HTF’s 1520 allows testing of a sample 1500 in one HTF 1520 to be performed during the cooling, following use thereof, of at least another HTF 1520. This allows a significantly higher testing rate than would be possible should a single HTF be used for consecutive tests, since there is no need to wait for a given HTF 1520 to completely cool down following use thereof prior to prepanng and commencing the next test, nor to first remove the sample and testing unit therein, prior to preparing and inserting a new sample and testing unit. This feature of a preferred embodiment of the present invention thus facilitates rapid transition between ones of sample tests, allowing a relatively high testing throughput by system 1300.

[0388] It is understood that, according to this embodiment, first HTF 1520A constitutes the same HTF as third HTF 1520C. In other words, first HTF 1520A is cyclically reused as third HTF 1520C, and is cooled down and filled with a new sample between uses thereof. Similarly, in this embodiment second HTF 1520B constitutes the same HTF as fourth HTG 1520D. In other words, third HTF 1520C is cyclically reused as fourth HTF 1520D and is cooled down and filled with a new' sample between uses thereof.

[0389] It is further understood that although a sequence of four sample tests is described and shown herein, a greater or fewer number of sample tests is possible. In the case that a greater number of sample tests are performed using system 1300, in this embodiment of the present invention, first HTF 1520 A and second HTF1 20B may continue to be alternately used (heated and have testing performed on a sample therein) and prepared (cooled and have new sample to be tested inserted therein).

[0390] In another preferred embodiment of the present invention, shown in Fig. 24, rather than repeatedly, cyclically and alternately using (heating, testing samples within) and preparing (cooling and having new sample to be tested inserted therein) a pair of first and second HTFs 1520A and 1520B, a multiplicity of HTFs 1520, such as first - fourth HTFs 1520A - 1520B, may be prepared, possibly in advance of commencement of a testing sequence, and each HTF 1520 pre-filled with a sample, such as first - fourth samples 1500A - 1500D, respectively. Samples 1500 in respective ones of HTFs 1520 may be successively heated and tested by system 1300. In this embodiment, each of first - fourth HTFs 1520A - 1520D constitutes a separate one of multiplicity of HTFs 1520 and is not re-used during the testing sequence. It is appreciated that although four HTFs 1520A - 1520D are shown in Fig. 24, a greater or fewer number of HTFs 1520, respectively pre-filled with a corresponding number of samples 1500, is also possible.

[0391] It is understood that the embodiment of Fig. 24 may be less cost efficient than the embodiment of Figs. 23A- 23K, since a greater number of HTFs 1520 is required. However, the embodiment of Fig. 24 may be advantageous in that samples for an entire testing sequence may be prepared in advance, in individual HTFs 1520, thus allowing a smoother, less laborious, operation of system 1300 during performance of material property testing thereby.

[0392] It is appreciated that a combination of these approaches is also possible, wherein during operation of system 1300, some of HTFs 1520 are reused for multiple tests and some are not.

[0393] It is further appreciated that although the use of multiple HTFs 1520, respectively pre-filled with corresponding samples 1500, is described herein and shown in the context of system 1300, system 100 may be operated in a similar manner to that described with reference to system 1300. by employing multiple HTFs 150, respectively pre-filled with corresponding samples 130, in the manner described herein with reference to Figs. 22A - 25B. The use of multiple pre-filled HTFs 150 may serve to increase the testing rate and throughput of system 100, in a similar manner to that described herein with reference to system 1300.

[0394] Turning now to Figs. 22A - 22P and 25A, in a first preparatory step 2502, a user inserts sample 1500 and testing unit 1530 in HTF 1520. Sample 1500 may be any of first - fourth samples 1500A - 1500D, testing unit 1530 may be any of first - fourth testing units 1530A - 1530D respectively, and HTF 1520 may be any of first - fourth HTFs 1520A - 1520D respectively. It is further appreciated that the steps shown in Figs. 22A - 22P may additionally or alternatively be carried out for other samples 1500, other testing units 1530 and other HTFs 1520.

[0395] As part of step 2502, a user may need to initially prepare HTF 1520 to receive sample 1500 and testing unit 1530. As seen particularly in Figs. 22A - 22C. in order to prepare HTF 1520 to receive sample 1500 and testing unit 1530, a user wraps graphite foil layer 1700 around an outer surface of susceptor 1610. By way of example, a user may wrap graphite foil layer 1700 twice around an outer surface of susceptor 1610. Graphite foil layer 1700 is preferably glued to susceptor 1610 by an adhesive (not shown).

[0396] As seen particularly in Figs. 22D and 22E, also as part of step 2502, a user then forms sample aperture 1720, displaceable-rod aperture 1722 and at least one temperature-reader aperture 1724 in graphite foil layer 1700, in respective alignment with sample-receiving cavity 1730, displaceable-rod bore 1732 and at least one temperature-reader bore 1734 of susceptor 1610. Sample aperture 1720, displaceable-rod aperture 1722 and at least one temperature-reader aperture 1724 may be formed by any suitable tool, such as, by way of example only, a suitable knife blade.

[0397] It is appreciated that during repeated use of HTF 1520, graphite foil layer 1700 may remain on susceptor 1610 and be re-used during subsequent testing cycles, such that preparation steps shown in Figs. 22A - 22E are not necessarily performed during each use of HTF 1520. Alternatively, graphite foil layer 1700 may be replaced prior to each use of HTF 1520 or may be replaced after several testing cycles of HTF 1520, as may be necessary due to degradation thereof during testing.

[0398] As seen particularly in Figs. 22F and 22G, also as part of step 2502, a user preferably prepares testing unit 1530 for insertion into sample-receiving cavity 1730 of susceptor 1610. Preferably at the portion of step 2502 shown in Figs. 22F and 22G, a user prepares lower portion 1742 of testing unit 1530 by adhering lower support pins 1758 adjacent to protrusions 1778 and 1780 of LSPC 1752 and inserts and adheres sample 1500 in notch 1782 of LSPC 1752. A user additionally prepares upper portion 1740 of testing unit 1530 by adhering loadapplication contact pin 1754 in notch 1772 of ULPC 1750 and upper loading pins 1756 in pin recesses 1762. A user preferably adheres upper portion 1740 to lower portion 1742 and places testing unit 1530, now including sample 1500, into sample-receiving cavity 1730 of susceptor 1610. A user may use a placement tool, such as tweezers or pliers, to aid in the placement of components, such as any or all of LSPC 1752, support pins 1758, load-application contact pin 1754, sample 1500, loading pins 1756 and ULPC 1750, in operative orientations thereof.

[0399] It is appreciated that testing unit 1530 may be used repeatedly , for performance of multiple tests, may be replaced by a new one of testing unit 1530 for each test, or may be replaced after several uses, as may be necessary due to degradation thereof. In the case that testing unit 1530 is used for more than one test, each of upper portion 1740 and lower portion 1742 may remain in an assembled state between tests. A new sample 1500, such as a second sample 1500B, a third sample 1500C, a fourth sample 1500D and so forth, is provided by a user for testing, and adhered between upper and lower portions 1740 and 1742. Alternatively, testing unit 1530 may be fully reassembled prior to each use thereof.

[0400] It is appreciated that, as seen in Figs. 22F and 22G, a user places sample 1500 and testing unit 1520 within susceptor 1610. Thus, as shown particularly in Figs. 22A - 22G, a staging of sample 1500 occurs outside of environmental chamber 1304.

[0401] In order to complete preparation of HTF 1520, also as part of step 2502 and as seen particularly in Figs. 22H - 22K, a user preferably wraps thermal insulation portion 1710 of HTF 1520 around susceptor 1610. Preferably, a user wraps first thermally insulating felt layer 1712 around first end 1702 of graphite foil 1700 and second thermally insulating felt layer 1714 around second end 1704 of graphite foil 1700. Each of first thermally insulating felt layer 1712 and second thermally insulating felt layer 1714 is preferably wrapped at least twice around graphite foil layer 1700 on susceptor 1610 and adhered thereto by an adhesive. Each of first thermally insulating felt layer 1712 and second thermally insulating felt layer 1714 preferably partially overlaps with sample-receiving cavity 1730 but does not obscure displaceable-rod bore 1732 and at least one temperaturereader bore 1734 of susceptor 1610.

[0402] It is appreciated that during repeated use of HTF 1520, first thermally insulating felt layer 1712 and second thermally insulating felt layer 1714 may be re-used for multiple tests, may be replaced prior to each use of HTF 1520 or may be replaced after several testing cycles of HTF 1520, as may be necessary due to degradation thereof during testing.

[0403] It is appreciated that once a user has performed the steps shown in Figs. 22H - 22K, NMFH 1600, including graphite foil layer 1700 and thermally insulating layer 1710, has been assembled. Thus, in the embodiment shown in Figs. 22A - 22K, NMFH 1600 is prepared and testing unit 1530 and sample 1500 are placed in susceptor 1610 of HTF 1520 outside of environmental chamber 1304. Thus, in the embodiment shown in Figs. 22A - 22K, a full pre-assembly of HTF 1520 occurs outside of environmental chamber 1304.

[0404] As seen particularly in Figs. 22L and 22M, in order to prepare HTF 1520 for heating, a user places HTF 1520, containing testing unit 1530 and sample 1500 in susceptor 1610 of HTF 1520, inside of space 1626 of coil 1622 of heat source 1510, typically by sliding HTF 1520 therethrough. Preferably, prior to the step shown in Fig. 22L, left support wall 1562, including upper portion 1566 mounted on lower portion 1564 by quartz rods 15122 and aligned therewith by alignment posts 15130, has been mounted on mounting base 1560. Additionally, prior to the step shown in Fig. 22L, preferably first and second support rods 1574 and 1576 have been mounted on lower portion 1564 of left support wall 1562, and guiding pin 1596 has also been mounted within pin recess 1594 of upper portion 1566 of left support wall 1562. At the portion of step 2502 shown in Figs. 22L and 22M, a user places a left end of susceptor 1610 within furnace recess 1592 of left support wall 1562. To help maintain a suitable rotational orientation of HTF 1520, as a user finishes sliding HTF 1520 through space 1626 of coil 1622, pin recess 1736 of the left end of susceptor 1610 slides along guiding pin 1596 of left support wall 1562.

[0405] As seen particularly in Figs. 22M and 22N, a user mounts right support wall 1568 on mounting base 1560 such that the right end of susceptor 1610 rests within furnace recess 15104 of upper portion 1572 of right support wall 1568. Typically, a user mounts right support wall 1568 by sliding right support wall 1568 between HTF 1520 and mounting base 1560. In mounting right support wall 1568 on mounting base 1560, a user preferably mounts lower portion 1570 of right support wall 1568 on mounting base 1560 by inserting mounting posts 15100 in recesses 1598 in lower portion 1570 of right support wall 1568, mounts upper portion 1572 on lower portion 1570 by quartz rods 15134 and aligns upper portion 1572 with lower portion 1570 using alignment posts 15142. Right support wall 1568 is preferably affixed to left support wall 1562 by fastening first support rod 1574 and a second support rod 1576 to right support wall 1568.

[0406] As seen particularly in Figs. 22M and 22N, turns 1624 of coil 1622 support susceptor 1610 when HTF 1520 is inserted in coil 1622, such that no separate lower support of susceptor 1610 is required. HTF 1520 is preferably generally horizontally orientated within generally horizontally oriented coil 1622. Furthermore, sample 1500 is preferably horizontally oriented within HFT 1520, as seen particularly at enlargement S in Fig. 22P. Pin-recess 1736 and guiding pin 1596 assist in maintaining a suitable rotational operative orientation of HTF 1520.

[0407] At the step of Figs. 22N - 22P, AMPT 1302 is nearly in a fully assembled operative orientation thereof. At the step of Figs. 22N - 22P, as seen particularly at enlargement S in Fig. 22P. testing unit 1530 and sample 1500 are held in susceptor 1610 within HTF 1520, which is in space 1626 defined by coil 1622. Additionally, left and right support walls 1562 and 1568 are mounted on mounting base 1560. However, as seen particularly at enlargement S in Fig. 22P, at the step of Figs. 22N - 22P, neither load rod 1910 nor displaceable rod 2110 have yet been brought into contact with testing unit 1530 or sample 1500. Following the step of Figs. 22N - 22P, as seen particularly in Figs. 23A - 23B and even more particularly at enlargement T in Fig. 23B, a user prepares load application system 1540 and a position measuring system for use during testing. Refractory portion 1992 of load rod 1910 is preferably brought into contact with testing unit 1530 or sample 1500. If 4PB testing unit 1532 is being prepared for use, refractory portion 1992 of load rod 1910 is brought through sample aperture 1720 into sample-receiving cavity 1732, such that refractory portion 1992 contacts load-application contact pin 1754.

[0408] Alternatively, if 3PB testing unit 1534 is being prepared for use, refractory portion 1992 of load rod 1910 is brought through sample aperture 1720 into sample-receiving cavity 1732, such that refractory portion 1992 contacts sample 1500.

[0409] In an embodiment of the present invention, load application system 1540 is used both to apply a force to sample 1500 and to measure a position of sample 1500. In such an embodiment, placement of load rod 1910 serves to prepare both load application system 1540 and a position measuring system, which is also embodied as load application system 1540.

[0410] In an alternative embodiment of the present invention, deflectometer 1550 is additionally or alternatively used as a position measuring system. As seen particularly in Fig. 23B, in such an embodiment, a user brings refractory portion 2118 of displaceable rod 2110 into contact with sample 1500. More particularly, refractory portion 2118 of displaceable rod 2110 is brought through displaceable-rod aperture 1722 and displaceable-rod bore 1732, such that top surface 2124 of conductive portion 2218 of displaceable rod 2110 contacts sample 1500.

[0411] It is appreciated that in addition to receiving load rod 1910 for an application of force during testing of sample 1500, sample aperture 1720 and sample-receiving cavity 1732, together with load rod 1910, assist in maintaining a suitable rotational operative orientation of HTF 1520 during both sample preparation and sample testing. Similarly, in addition to receiving displaceable rod 2110 for measurement of deflection during testing of sample 1500, displaceable- rod aperture 1722 and displaceable-rod bore 1732, together with displaceable rod 2110, assist in maintaining a suitable rotational operative orientation of HTF 1520 during both sample preparation and sample testing.

[0412] Preferably, a suitable rotational operative orientation of HTF 1520 is further maintained by corresponding features on respective left and right ends of susceptor 1610 and left and right support walls 1562 and 1568, such as pinrecess 1736 and guiding pin 1596. Additionally or alternatively to pin-recess 1736 and guiding pin 1596, the corresponding features may include mechanical orientation indicators, such as matching protrusions and recesses and / or visual orientation indicators, such as visible arrows or other shapes to indicate a correct orientation of HTF 1520. Additionally or alternatively, suitable portions of NMFH 1600 are formed with features (not shown) to assist in maintaining a suitable rotational operative orientation of HTF 1520.

[0413] Also following the steps of Figs. 22N - 22P, a user preferably places one or more temperature probes such as one or more of, inter alia, optical pyrometer 1426 and a thermocouple, at or partially within at least one of temperature-reader openings 1724 and 1734 for temperature measurement of susceptor 1610. An exemplary thermocouple suitable for use as the thermocouple is any of a Type R, Type C, Type K or Type S thermocouple, commercially available from Dynamic Systems Inc. of Poestenkill, NY, USA.

[0414] Typically, following the steps of Figs. 22N - 22P and before a testing of sample 1500, a full or partial calibration of system 1300 is performed. Partial calibration may be embodied as a “taring” of system 1300, in which a position of each of load rod 1910 and displaceable rod 2110 is recorded and used to determine a zero position thereof. Additionally, during the full or partial calibration of system 1300, a resistance of components of deflectometer 1550 to a movement of sample 1500 in a direction indicated by an arrow 2504 may be measured and stored by integrated computer system 1306 for use as a calibration factor.

[0415] After the step shown in Figs. 23A - 23C, at a next step 2506, sample 1500 is brought to test conditions, including inter alia, a desired temperature and gas environment. Heat source 1510, particularly coil 1622 thereof, preferably heats HTF 1520. More particularly, coil 1622 heats susceptor 1610 of HTF 1520 while susceptor 1610 is disposed in space 1626 and susceptor 1610 in turn heats sample 1500 and testing unit 1530. More specifically, a voltage is supplied to heat source 1510, causing coil 1622 of heat source 1510 to generate an electromagnetic field. The electromagnetic field generated by coil 1622 of heat source 1510 is preferably an ultra-high frequency electromagnetic field, preferably having a frequency of between 50,000 - 300,000 Hz. As is well known in the art, the electromagnetic field generated by coil 1622 is particularly strong in space 1626 defined by coil 1622.

[0416] When in an operative orientation, susceptor 1610 is partially disposed in space 1626 defined by turns 1624 of coil 1622, and thus susceptor 1610 is preferably generally centered with the electromagnetic field generated by coil 1622. As described hereinabove, heat source 1510 preferably uses induction heating to heat susceptor 1610, which is preferably formed of an electrically conductive material. More specifically, the electromagnetic field generated by coil 1622 induces an electric current within susceptor 1610, and resistive heating converts the induced electric current in susceptor 1610 to heat, thereby heating susceptor 1610. Susceptor 1610 in turn transfers heat to testing unit 1530 and sample 1500 through conduction heating and / or radiation heating.

[0417] Integrated computer system 1306 preferably controls and monitors a temperature of susceptor 1610. In various embodiments of the present invention, system 1300 is operative to achieve a wide range of heating rates, ranging from about 1 °C / second to greater than about 100 °C / second. System 1300 is preferably also operative to maintain susceptor 1610 at a pre-selected temperature before, during and after a testing of sample 1500, thereby allowing either or both of sample 1500 and components of system 1300 to achieve isothermal conditions and / or reach a thermal equilibrium state.

[0418] Preferably, during heating by system 1300 of HTF 1520 and prior to the commencement of material property testing of sample 1500, the adhesive present at various locations in HTF 1520, such as the adhesive adhering sample 1500 to test unit 1530 is preferably burned away.

[0419] Integrated computer system 1306 preferably additionally at least partly controls and monitors a gas environment of the interior space of modular environmental chamber 1304, ensuring that the interior space complies with predetermined gaseous conditions, including, inter alia, vacuum, inert gas, ambient air, environments containing one of a multiplicity of controlled gas mixtures, such as a predetermined percentage of oxygen, reducing environments and oxidizing environments.

[0420] During a preparation of environmental chamber 1304 and susceptor 1610 prior to a testing of sample 1500, system 1300 is preferably operative to precisely control a force applied to sample 1500 by load application system 1540 in a force application direction indicated by arrow 2504. For example, integrated computer system 1306 is preferably operative to control load application system 1540, thereby maintaining a predetermined force on sample 1500 while system 1300 brings sample 1500 to a predetermined testing temperature. The predetermined force may be any suitable force, such as a user- specified force, and may have a value ranging between zero and a maximum load capacity of system 1300, inclusive. In a typical embodiment of the present invention, system 1300 is operative to exert a force on sample 1500 having a magnitude of between 0 - 100 N. Preferably, an actual force exerted by system 1300 on sample 1500 deviates from a predetermined force to be exerted by system 1300 on sample 1500 by no more than + / - 0.5%.

[0421] It is appreciated that as used herein, “a downward motion,” “a downward force,” “a downward direction” and “a downward displacement” refer to a respective motion, force, direction and displacement in a direction indicated by arrow 2504.

[0422] At a next step 2508, one or more material properties of sample 1500 are tested, using testing unit 1530. During testing of sample 1500, predetermined environmental conditions, particularly relating to gas environment and temperature of sample 1500. are preferably maintained. At a beginning of a testing of sample 1500 by system 1300, refractory portion 1992 of load rod 1910 of load application system 1540 is typically in contact with testing unit 1530 or sample 1500 while exerting a net zero force thereon, as seen particularly in Figs. 23A - 23C. Thereafter, as part of step 2508, integrated computer system 1306 preferably controls load application system 1540, driving load rod 1910 to apply a series of predetermined forces to sample 1500 in a direction indicated by arrow 2504. It is appreciated that when load application system 1540 exerts a relatively small force on sample 1500, sample 1500 experiences little to no visible deformation, as seen particularly at enlargement T in Fig. 23B.

[0423] To apply a series of predetermined forces to sample 1500, integrated computer sy stem 1306 preferably provides a series of voltages to linear actuator 1902, resulting in a downward motion of drive shaft 1904 thereof. The motion of dnve shaft 1904 in turn results in a downward motion of actuator connector rod 1930, which is connected thereto. The downward motion of actuator connector rod 1930 causes a corresponding dow nw ard motion of upper load cell connector 1926, force sensor 1916 and lower load cell connector 1954, which in turn drives load rod 1910 in a downward direction.

[0424] If 4PB testing unit 1532 is being used, integrated computer system 1306 provides a series of voltages to linear actuator 1902, causing load rod 1910 to exert a series of predetermined downward forces on load-application contact pin 1754. Load-application contact pin 1754 preferably transfers each downward force from load rod 1910 to additional components of testing unit 1530, namely ULPC 1750, upper loading pins 1756, lower support pins 1758 and LSPC 1778, as well as sample 1500.

[0425] Alternatively, if 3PB testing unit 1534 is being used, integrated computer system 1306 provides a series of voltages to linear actuator 1902, causing load rod 1910 to exert a series of predetermined downward forces on sample 1500. Sample 1500 transfers each downward force from load rod 1510 to components of testing unit 1530, namely lower support pins 1758 and LSPC 1778.

[0426] It is appreciated that when load application system 1540 exerts a relatively large force on sample 1500, as in Figs. 23D - 23E, sample 1500 experiences visible deformation, as seen particularly at enlargement U in Fig. 23E. If 4PB testing unit 1532 is being used, and sample 1500 undergoes exceptionally large visible deformation (not shown), at least some of deformation cut-outs 1764 of ULPC 1750 and deformation recess 1786 of LSPC 1778 preferably receive deformed portions of sample 1500.

[0427] As is know n in the art, a response of sample 1500 to a force exerted thereon by testing unit 1530, particularly a deformation thereof, and more particularly a downward displacement of a center of sample 1500. provides data useful in calculating material properties of sample 1500, such as a flexural modulus, a flexural stress, a flexural strain, a flexural stress-strain relationship, a Young’s modulus, an ultimate strength and a fracture toughness.

[0428] Preferably, as part of step 2508, integrated computer system 1306, and more preferably, data acquisition system 1309 thereof, monitors and records most, and more preferably all, of useful data relating to system 1300 during use thereof. More specifically, integrated computer system 1306 preferably monitors and records, inter alia, a temperature of susceptor 1610, a voltage applied to heat source 1510. a gas pressure of the interior space of environmental chamber 1304, a force applied to sample 1500 by load application system 1540, a deflection of sample 1500, atemperature of force sensor 1916 and atemperature of displaceable rod 2110. In a preferred embodiment of the present invention, the force applied to sample 1500 by load application system 1540 is indicated by data relating to load application system 1540, including, inter alia, data relating to any or all of linear actuator 1902, a position of load rod 1910 and a force indicated by force sensor 1916.

[0429] Although not a primary intended use case of system 1300, the force applied to sample 1500 by load application system 1540 may be additionally or alternatively indicated by data relating to deflectometer 1550, including, inter alia, data relating to any or all of deflectometer 1550 components, such as a voltage output by position transducer 2112, a position of displaceable rod 2110 and a position of core rod 2160. The use of data relating to deflectometer 1550 to determine a force applied to sample 1500 may be of particular interest in calibration processes or academic investigations, and typically rely on a sample 1500 having known material properties.

[0430] Typically, readings from deflectometer 1550, including, inter alia, data relating to any or all of deflectometer 1550 components, such as a voltage output by position transducer 2112, a position of displaceable rod 2110 and a position of core rod 2160 are preferably used to determine a deflection of sample 1500 in a determination of material properties thereof.

[0431] Preferably, the monitoring and recording of useful data by integrated computer system 1306 is effectively continuous during an entire use session of system 1300, and the data is preferably made fully available for both control of system 1300 and analysis of testing of sample 1500. In a preferred embodiment of the present invention, integrated computer system 1306 monitors and records some or all of useful data throughout use of system 1300 with an effectively continuous sampling rate, such as, inter alia, a sampling rate of 50 Hz - 10,000 Hz, most typically a sampling rate of 100 Hz - 500 Hz.

[0432] Preferably, integrated computer system 1306, and more preferably, automated control system 1308 thereof, uses feedback control in the operation of system 1300. Thus, integrated computer system 1306 preferably controls components of system 1300, such as, inter alia, heat source 1510, load application system 1540 and deflectometer 1550, at least partially based on data monitored and recorded from some or all of a temperature of susceptor 1610, a voltage applied to heat source 1510, a gas pressure of the interior space of environmental chamber 1304, a force applied to sample 1500 by load application system 1540 and a deflection of sample 1500.

[0433] The feedback control of system 1300 allows a wide variety of options for test protocol programming and alert options. For example, integrated computer system 1306 may receive data from system 1300 indicating that one or more components of system 1300, such as, inter alia, one or more of force sensor 1916, coil 1622, linear actuator 1902 and position transducer 2112 are approaching one or more limits of recommended operating parameters thereof, such as temperature, position, force or voltage limits. In such a case, integrated computer system 1306 preferably provides a signal, such as a warning, alert or command to a user and / or components of system 1300, to maintain components of system 1300 within recommended operating parameters thereof. For example, integrated computer system 1306 may issue an alert and reduce a voltage supplied to heat source 1510, reduce a voltage supplied to linear actuator 1902 and / or change a gas composition of environmental chamber 1304.

[0434] Integrated computer system 1306 is preferably operative to provide suitable warnings and alters prior to beginning testing, during testing and / or following testing of a sample 1500. In a preferred embodiment of the present invention, a user may establish an operating envelope of system 1300, including one or more thresholds or limits of any or all operating parameters of components of system 1300, on a test-by-test basis. Thus system 1300 preferably includes fully customizable feedback control and alerts.

[0435] Preferably, system 1300 is operative to be controlled based on any of a multiplicity of control modes, including, inter alia, control modes partially or fully based on any or all of data collected by integrated computer system 1306. Thus, for example, load application system 1540 is operative to be controlled by integrated computer system 1306 based on any or all of data relating to load application system 1540, including, inter alia, data relating to any or all of linear actuator 1902, such as a position of load rod 1910 and a force indicated by force sensor 1916, and data relating to deflectometer 1550, including, inter alia, data relating to any or all of position transducer 2112 components, such as a voltage output by position transducer 2112, a position of displaceable rod 2110 and a position of core rod 2160. Preferably, a control mode is selected for use based on a user preference.

[0436] As seen particularly in Figs. 23A - 23E, in an embodiment of the present invention, deflectometer 1550 is operative to measure a linear deformation of a lower central portion of sample 1500. As described hereinabove, prior to a testing of sample 1500, displaceable rod 2110 is positioned such that top surface 2124 of conductive portion 2118 of displaceable rod 2110 is in contact with sample 1500. Therefore, a deformation of sample 1500 preferably results in a corresponding downward displacement of displaceable rod 2110. The downw ard displacement of displaceable rod 2110 in turn results in a dow nward displacement of deflectometer transducer assembly 2130, and thus of rod 2170 and core rod 2160, against an upward urging of counterweight mechanism 21120. The downward displacement of rod 2170 changes a position of core rod 2160. and particularly a position of working end 2162 thereof, within transducer body 2138, which results in a predicable change in a voltage output by position transducer 2112 to integrated computer system 1306.

[0437] Thus, in an embodiment of the present invention, integrated computer system 1306 of system 1300 preferably uses the voltage output byposition transducer 21 12 of deflectometer 1550 to ascertain a downward displacement of sample 1500 corresponding to a particular value of force exerted on sample 1500, either directly or indirectly, by load application system 1540.

[0438] Additionally or alternatively to a measurement of deformation bydeflectometer 1550, load application system 1540 is preferably operative to measure a linear deformation of an upper portion of sample 1500. As described hereinabove, prior to a testing of sample 1500, load rod 1910 of load application system 1540 is preferably placed in contact with load-application contact pin 1754 or with sample 1500 while exerting a net zero force thereon. Thereafter, integrated computer system 1306 preferably controls load application system 15400, driving load rod 1910 to apply a series of predetermined forces to sample 1500, either directly or indirectly, in a direction indicated by arrow 2504.

[0439] As load application system 1540 applies each force to sample 1500, integrated computer system 1306 preferably monitors a position of load rod 1910. As seen particularly in Fig. 23E, a position of load rod 1910 is directly related to a deformation of sample 1500. As a central portion of sample 1500 is deformed in a downward direction, a position of load rod 1910 also moves downward in a predictable manner.

[0440] In a preferred embodiment of the present invention, linear actuator 1902 is operative to displace actuator connector rod 1930, and thus load rod 1910, in countable increments of a known, uniform length. Linear actuator 1902 preferably includes an encoder, which is operative to provide data indicating whether linear actuator 1902 has displaced actuator connector rod 1930 by an increment. A controller, in either or both of linear actuator 1902 or in integrated computer system 1306, counts the increments reported by the encoder of linear actuator 1902, thereby calculating a position of load rod 1910. A compression of load rod 1910 is optionally accounted for by system 1300 in the calculation of the position of load rod 1910.

[0441] Thus, in an additional embodiment of the present invention, integrated computer system 1306 of system 1300 preferably uses the position of load rod 1910 to ascertain a downward displacement of sample 1500 resulting from a particular value of force exerted on sample 1500, either directly or indirectly, by load application system 1540.

[0442] Integrated computer system 1306 of system 1300 preferably calculates and outputs to a user one or more material properties of sample 1500 based on a testing thereof of by system 1300. More specifically, integrated computer system 1306 of system 1300 ascertains material properties of sample 1500, such as a flexural modulus, a flexural stress, a flexural strain, a flexural stress-strain relationship, a Young’s modulus, an ultimate strength and a fracture toughness, at least partially based on a response of sample 1500 to a force exerted thereon by testing unit 1530, as a result of a particular value of force exerted on sample 1500 by load application system 1540, either directly or indirectly. Typically, integrated computer system 1306 of system 1300 ascertains material properties of sample 1500 based particularly on a deformation thereof, and more particularly on a downward displacement of a central portion of sample 1500, during a testing thereof by system 1300.

[0443] In the steps shown in Figs. 23 A - 23E, HTF 1520 inserted in coil 1622 is show n to be embodied as first HTF 1520A and sample 1500 undergoing material property testing, to be embodied as first sample 1500 A undergoing material property testing using first testing unit 1530A.

[0444] As seen particularly in Figs. 23A and 23C, and at a step 2510 in Fig. 25A, second sample 1500B held in second test unit 1530B may be inserted in second HTF 1520B prior to the completion of the performance of material property testing on first sample 1500A. Second sample 1500B may be inserted in second HTF 1520B concurrently, or partially concurrently, with the heating and / or performance of material property7testing on the first sample 1500A. Alternatively, second sample 1500B may be inserted in second HTF 1520B following the completion of performance of material property testing on the first sample 1500A. It is thus understood that although step 2510 is shown in Fig. 25 A to follow steps 2502, 2506 and 2508 respectively relating to insertion, heating and testing of first sample 1500A by first test unit 1530A in first HTF 1520A, step 2510 may be performed prior to, concurrently with, or following steps 2502, 2506 and 2508.

[0445] It is appreciated that the insertion of second sample 1500B and second test unit 1530B in second HTF 1520B may involve some or all of the steps shown in Figs. 221 - 22K.

[0446] After testing of first sample 1500A, integrated computer system 1306 preferably controls system 1300, to return environmental chamber 1304 and AMPT 1302 to ambient or near-ambient temperature and gas mixture conditions. Integrated computer system 1306 preferably continues to control conditions of system 1300 and to monitor and record most, and more preferably all, of useful data relating to system 1300 during the return of environmental chamber 1304 and AMPT 1302 to ambient or near-ambient temperature and gas mixture conditions.

[0447] The return of environmental chamber 1304 and AMPT 1302 to ambient or near-ambient conditions includes a cooling of susceptor 1610, first testing unit 1530A and first sample 1500A, using either natural cooling, without using a dedicated cooling system, or forced cooling, using a dedicated system. An exemplary cooling system provides a flow of gas, such, inter alia, as helium or argon, to hasten a cooling of AMPT 1302, first testing unit 1530A and first sample 1500 A. A temperature of susceptor 1610 during the cooling thereof is preferably monitored and recorded by integrated computer system 1306 using the temperature probes (not shown), such as one or more of, inter alia, the optical pyrometer 1426 and the thermocouple described hereinabove.

[0448] As seen particularly in Fig. 23F, upon completion of the testing of first sample 1500A and following the return of environmental chamber 1304 and AMPT 1302 to ambient conditions, a user preferably removes first HTF 1520 A from AMPT 1302 and places second HTF 1520B, having second testing unit 1530B and second sample 1500B inserted therein as seen in Fig. 23C, in coil 1622. The return of environmental chamber 1304 and AMPT 1302 to environmental conditions preferably occurs relatively quickly, allowing a timely unloading of first sample 1500A and a rapid transition to an additional test of second sample 1500B in second HTF 1520B, thereby increasing throughput of system 1300 relative to throughputs of conventional systems.

[0449] For example, in a preferred embodiment of the present invention, an amount of time from an end of testing of a first sample 1500A through an insertion of a second sample 1500B is under one hour, and more preferably is under 20 minutes. In other words, system 1300 is preferably operative to perform at least about one sample test per hour, and is more preferably operative to perform at least one sample test per 20 minutes, including insertion of a sample 1500 into system 1300, heating of sample 1500, testing of sample 1500, and cooling of sample 1500.

[0450] In one embodiment of the present invention, in order to remove first HTF 1520A from AMPT 1302, a user may remove right support wall 1568 from mounting base 1560 and may slidingly remove first HTF 1520A from coil 1622. Before replacing right support wall 1568, a user may then slidingly insert second HTF 1520B into coil 1622. In order to insert second HTF 1520B into coil 1622, a user may ca - out the steps described hereinabove in relation to Figs. 22L - 22N.

[0451] In another embodiment of the present invention, in order to remove first HTF 1520A from AMPT 1302, a user may not be required to remove right support wall 1568 and may simply slide first HTF 1520A out of coil 1622. This may be possible since the glue adhering thermal insulation portion 1710 to susceptor 1610 is burned off during heating of firsts HTF 1520A, such that following testing, a user may simply remove thermal insulation portion 1710 and slide susceptor 1610 out of coil 1622. Alternatively, a user may remove only upper portion 1572 of right support wall 1568, while leaving the rest of right support wall 1568 intact.

[0452] At a next step, as seen at Fig. 23G and steps 2512 and 2514 in Fig. 25 A, upon completion of testing of the first sample 1520 A, the second HTF 1520B is preferably heated by coil 1622 of heat source 1510, thereby heating the second sample 1500B and material property' testing of one or more material properties of the second sample 1500B is performed, while the second sample 1500B is being heated. The various steps involved in heating and material property testing of second sample 1500B are preferably as shown, and described hereinabove, with reference to Figs. 23A - 23E.

[0453] As seen particularly at enlargement V in Fig. 23G, and at a step 2516 in Fig. 25B, third sample 1500C held in third test unit 1530C may be inserted in a third HTF 1520, here preferably embodied as first HTF 1520A. Third sample 1500C may be inserted in first HTF 1520A concurrently, or partially concurrently, with the heating and / or performance of material property7testing on the second sample 1500B. Third sample 1500C may be inserted in first HTF 1520A prior to the completion of the performance of material property testing on second sample 1500B. Alternatively, third sample 1500C may be inserted in first HTF 1520A following the completion of performance of material property7testing on the second sample 1500B. It is thus understood that although step 2516 is shown in Fig. 25B to follow steps 2512 and 2514 of Fig. 25 A, step 2516 may be performed at least partially concurrently with, or following steps 2512 and 2514.

[0454] Prior to insertion of third sample 1500C in first HTF 1520A, first HTF 1520A is preferably fully cooled and first sample 1500A and first test unit 1530A removed therefrom. A user may remove first sample 1500A and first test unit 1530A from susceptor 1610 of first HTF 1520A by turning susceptor 1610 upside down, such that the first test unit 1530A and first sample 1500A fall from sample-receiving cavity71730, or may use a tool to remove first test unit 1530A and first sample 1500A from first HTF 1520 A.

[0455] It is appreciated that the insertion of third sample 1500C and third test unit 1530C in first HTF 1520A may involve some or all of the steps shown in Figs. 221 - 22K.

[0456] As seen in Fig. 23H, upon completion of the testing of second sample 1500B and following the return of environmental chamber 1304 and AMPT 1302 to ambient conditions, a user preferably removes second HTF 1520B from AMPT 1302 and places first HTF 1520A, now having third testing unit 1530C and third sample 1500C inserted therein, in coil 1622. Steps involved in the removal of second HTF 1520B from AMPT 1302 and replacement therein of first HTF 1520A are generally as described above in relation to Fig. 23F. At a next step, as seen at Fig. 231 and steps 2518 and 2520 in Fig. 25B, upon completion of testing of the second sample 1520B, the third HTF 1520, here preferably embodied as first HTF 1520 A, is preferably heated by coil 1622 of heat source 1510, thereby heating the third sample 1500C and material property testing of one or more material properties of the third sample 1500C is performed, while the third sample 1500C is being heated.

[0457] The various steps involved in heating and material property testing of third sample 1500C are preferably as shown, and described hereinabove, with reference to Figs. 23A - 23E.

[0458] As seen particularly at enlargement W of Fig. 231, and at a step 2522 in Fig. 25B, fourth sample 1500D held in fourth test unit 1530D may be inserted in a fourth HTF 1520, here preferably embodied as second HTF 1520B. Fourth sample 1500D may be inserted in second HTF 1520B concurrently, or partially concurrently, with the heating and / or performance of material property testing on the third sample 1500C. Fourth sample 1500D may be inserted in second HTF 1520B prior to the completion of performance of material property testing on third sample 1500C. Alternatively, fourth sample 1500D may be inserted in second HTF 1520B following the completion of performance of material property testing on the third sample 1500C. It is thus understood that although step 2522 is shown in Fig. 25B to follow steps 2518 and 2520, step 2522 may be performed at least partially concurrently with, or following steps 2518 and 2520.

[0459] Prior to insertion of fourth sample 1500D in second HTF 1520B, second HTF 1520B is preferably fully cooled and second sample 1500B and second test unit 1530B removed therefrom, as described hereinabove with reference to Fig. 231.

[0460] It is appreciated that the insertion of fourth sample 1500D and fourth test unit 1530D in second HTF 1520B may involve some or all of the steps shown in Figs. 221 - 22K.

[0461] As seen particularly in Fig. 23J, upon completion of the testing of third sample 1500C and following the return of environmental chamber 1304 and AMPT 1302 to ambient conditions, a user preferably removes first HTF 1520A from AMPT 1302 and places second HTF 1520B, now having fourth testing unit 1530D and fourth sample 1500D inserted therein, in coil 1622. Steps involved in the removal of first HTF 1520A from AMPT 1302 and replacement therein of second HTF 1520B are generally as described above in relation to Fig. 23F.

[0462] At a next step, as seen at Fig. 23K and steps 2524 and 2526 in Fig. 25B, upon completion of testing of the third sample 1520C, the fourth HTF 1520, here preferably embodied as second HTF 1520B, is preferably heated by coil 1622 of heat source 1510, thereby heating the fourth sample 1500D and material property testing of one or more material properties of the fourth sample 1500D is performed, while the fourth sample 1500D is being heated.

[0463] The various steps involved in heating and material property testing of fourth sample 1500D are preferably as shown, and described hereinabove, with reference to Figs. 23A - 23E.

[0464] It is appreciated that the above-described sequence of sample tests shown in Figs. 23A - 23J, in which one of first and second HTFs 1520A and 1520B is in use in AMPT 1302 for heating and testing of a sample 1500 therein concurrently with the other one of first and second HTFs 1520A and 1520B being cooled and pre-filled with an additional sample, for subsequent testing, may be continued for any desired number of samples. Thus, as seen at enlargement X in Fig. 23K, first HTF 1520A may receive yet an additional sample, here embodied as a fifth sample 1500E in a fifth test unit 1530E for subsequent testing, and so forth.

[0465] Turning now to Fig. 24. in an alternative embodiment of the present invention, method 2500, including steps 2502 - 2526, may be carried out using a first - fourth HTFs 1520A - 1520D, respectively pre-filled outside of environmental chamber 1304 with first - fourth samples 1500A - 1500D respectively held in first - fourth testing units 1530A - 1530D. According to this embodiment of the present invention, rather than first and second HTFs 1520A and 1520B being alternately employed in system 1300, a multiplicity of individual HTFs 1520, such as HTFs 1520A - 1520D, may be pre-filled in advance and successively employed in system 1300 during a testing sequence, as described hereinabove. System 1300 is preferably operative to achieve a wide range of preferably relatively rapid cooling rates, ranging from 3 °C / sec to greater than 300 °C / sec, and is operative to heat susceptor 1610, testing unit 1530 and sample 1500 to a temperature of 1,000 °C, more preferably to a temperature of 2,000 °C, yet more preferably to a temperature of 2,500 °C, and even more preferably to a temperature of 4,000 °C.

[0466] As described hereinabove, the relatively rapid heating and cooling rates of system 1300 are a result of technical features of system 1300, such as, inter alia, a relatively small size of that portion of system 1300 which is heated, more specifically, a similarity in size between susceptor 1610 and sample 1500; and a presence of insulation around that portion of system 1300 which is heated.

[0467] Furthermore, components of system 1300, particularly any or all of susceptor 1610, NMFH 1600, load rod 1910, displaceable rod 2110 and any or all components of testing unit 1530, are typically both less expensive than components used by conventional material property testing systems, and have a relatively simple removal and installation process compared to components used by conventional material property testing systems.

[0468] Thus, in a preferred embodiment of the present invention, some or all of susceptor 1610, NMFH 1600, load rod 1910, displaceable rod 2110 and any or all components of testing unit 1530 are readily replaceable between subsequent ones or several subsequent ones of sample tests, i.e., are consumable and replaceable.

[0469] Additionally, components of system 1300, particularly any or all of susceptor 1610, NMFH 1600, load rod 1910, displaceable rod 2110 and any or all components of testing unit 1530, are typically more durable than components used by conventional material property testing systems.

[0470] Furthermore, system 1300 preferably incorporates interchangeable parts, which reduces breakage concerns and increases setup speeds.

[0471] The relative low cost, simple removal and installation processes, and high durability' of system 1300 components allow system 1300 to be subjected to relatively rapid heating rates and cooling rates compared to those of conventional material property testing systems. Each of relatively rapid heating rates and cooling rates cause relatively high thermal stress for components of system 1300. However, the cost and the likelihood of broken components in system 1300 due to high thermal stress are each lower than the cost and the likelihood of broken components in conventional material property testing systems due to high thermal stress. Therefore, system 1300 can be subjected to relatively rapid heating rates and cooling rates compared to those of conventional material properly7testing systems, with a relatively low concern of breaking components of system 1300.

[0472] It is a particular feature of the present invention that systems 100 and 1300, including all sub-components thereof, preferably comply with standards set forth by relevant organizations, such as ASTM International and ISO. Additionally, systems 100 and 1300 preferably include uses which comply with standards set forth by relevant organizations, such as ASTM International and ISO.

[0473] Exemplary standards with which the present invention preferably complies are found in, inter alia, ASTM C1211-18R23, Standard Test Methods for Flexural Strength of Advanced Ceramics at Elevated Temperatures, February' 15. 2023; ASTM C1161-18R23, Standard Test Methods for Flexural Strength of Advanced Ceramics at Ambient Temperatures, February' 23, 2023; ASTM C1421- 18, Standard Test Methods for Determination of Fracture Toughness of Advanced Ceramics at Ambient Temperature, January' 18, 2018; ASTM B406-96R21, Standard Test Method for Transverse Rupture Strength of Cemented Carbides, May 10, 2021; ISO 14704:2016, Test method for flexural strength of monolithic ceramics at room temperature, April 2016; ISO 17565:2003, Test method for flexural strength of monolithic ceramics at elevated temperature, December 2003; ISO 3327:2009, Determination of transverse rupture strength of hardmetals, May 2009, the entireties of which are hereby incorporated by reference.

[0474] It will be appreciated by persons skilled in the art that the present invention is not limited by what has been particularly claimed hereinbelow'. Rather, the scope of the invention includes various combinations and subcombinations of the features described hereinabove as well as modifications and variations thereof as would occur to persons skilled in the art upon reading the forgoing description with reference to the drawings and which are not in the prior art.

Claims

CLAIMS1. A method for performing material property testing on samples, comprising: inserting a first sample in a first high temperature furnace; heating, by an inductive heat source, said first high temperature furnace, thereby heating said first sample therein; performing material property testing on said first sample while said first sample is being heated; inserting a second sample in a second high temperature furnace; upon completion of said performing said material property testing on said first sample, heating, by said inductive heat source, said second high temperature furnace, thereby heating said second sample therein; and performing material property testing on said second sample while said second sample is being heated.

2. A method according to claim 1, and also comprising: inserting a third sample in a third high temperature furnace; upon completion of said performing said material property testing on said second sample, heating, by said inductive heat source, said third high temperature furnace, thereby heating said third sample therein; and performing said material property testing on said third sample while said third sample is being heated.

3. A method according to claim 2, and also comprising: inserting a fourth sample in a fourth high temperature furnace; upon completion of said performing material property testing on said third sample, heating, by said inductive heat source, said fourth high temperature furnace, thereby heating said fourth sample therein; and performing material property testing on said fourth sample while said fourth sample is being heated.

4. A method according to claim 3, wherein: said third high temperature furnace comprises said first high temperature furnace, said method further comprising cooling said first high temperature furnace prior to said inserting said third sample therein; and said fourth high temperature furnace comprises said second high temperature furnace, said method further comprising cooling said second high temperature furnace prior to said inserting said fourth sample therein.

5. A method according to 3 or claim 4, wherein: said inserting said second sample in said second high temperature furnace is carried out prior to completing said performing material property testing on said first sample; said inserting said third sample in said third high temperature furnace is carried out prior to completing said performing material property testing on said second sample; and said inserting said fourth sample in said fourth high temperature furnace is carried out prior to completing said performing material property testing on said third sample.

6. A method according to any one of the preceding claims, and also comprising performing said inserting, said heating and said performing material property testing on additional samples.

7. A method according to any one of the preceding claims, wherein said material property testing is performed at a throughput rate of at least about one material property' test per hour.

8. A method according to any one of the preceding claims, wherein said inductive heat source is capable of heating each said sample to a temperature in a range of between about 1500°C - 2800°C.Ill9. A method according to any one of the preceding claims, wherein each said high temperature furnace comprises a unitary susceptor having a cavity configured to receive therein said sample assembled in a testing unit.

10. A method according to claim 9, wherein a longest dimension of said cavity’ is smaller than a longest dimension of said susceptor.

11. A method according to claim 9 or claim 10, wherein each said high temperature furnace further comprises a non-metallic furnace housing wrapped around an outer surface of said susceptor, at least for providing thermal insulation between said susceptor and said inductive heat source.

12. A method according to any one of the preceding claims, wherein said inductive heat source comprises an inductive heating coil defining an inner opening, and said method further comprises removably disposing each said high temperature furnace in said inner opening when being heated by said inductive heating coil.

13. A method according to claim 12, wherein a longitudinal axis of said inductive heating coil is generally horizontally oriented and each said high temperature furnace is generally horizontally disposed in said inner opening when being heated by said inductive heating coil.

14. A method according to claim 12 or claim 13, and also comprising: applying, by a load application system, a load to each said sample during performance of said material property7testing; and measuring displacement of each said sample responsive to said applying of said load.

15. A method according to claim 14, and also comprising measuring said displacement of each said sample by a deflectometer.

16. A method according to claim 15, wherein said load application system and said deflectometer extend into each said high temperature furnace, through spaces between turns of said coil, when each said high temperature furnace is being heated by said inductive heat source.

17. A method according to claim 15 or claim 16, wherein at least one of said load application system and said deflectometer comprises a hybrid rod comprising a first refractory portion proximal to said sample and a second insulative portion distal from said sample.

18. A method according to any one of claims 15 - 17, and also comprising controlling, within a modular environmental chamber, an environment in which said material property testing is performed.

19. A method according to claim 18, wherein said modular environmental chamber comprises an upper sub-chamber housing electronic circuitry of said load application system, an intermediate sub-chamber housing at least a portion of said inductive heat source, and a lower sub-chamber housing electronic circuitry of said deflectometer.

20. A method according to claim 18 or claim 19, wherein said intermediate sub-chamber of said modular environmental chamber comprises thermal insulation, to prevent heating, by said inductive heat source, of said load application system and said deflectometer.

21. An apparatus for performing material property testing on samples, comprising: a first high temperature furnace configured to receive therein a first sample held in a first testing unit; an inductive heat source, operative to heat said first high temperature furnace and thereby to heat said first sample therein, said first testing unit being operative to perform material property testing on said first sample while said first sample is being heated; andat least a second high temperature furnace configured to receive therein a second sample held in a second testing unit, said inductive heat source being operative, upon completion of said performance of said material property testing on said first sample, to heat said second high temperature furnace, and thereby to heat said second sample therein, said second testing unit being operative to perform material property testing on said second sample while said second sample is being heated.

22. An apparatus according to claim 21, and also comprising: a third high temperature furnace configured to receive therein a third sample held in a third testing unit; said inductive heat source being operative, upon completion of said performance of said material property testing on said second sample, to heat said third high temperature furnace, and thereby to heat said third sample therein; said third testing unit being operative to perform material property testing on said third sample while said third sample is being heated.

23. An apparatus according to claim 22, and also comprising: a fourth high temperature furnace configured to receive therein a fourth sample held in a fourth testing unit; said inductive heat source being operative, upon completion of said performance of said material property' testing on said third sample, to heat said fourth high temperature furnace, and thereby to heat said fourth sample therein; said fourth testing unit being operative to perform material property testing on said fourth sample while said fourth sample is being heated.

24. An apparatus according to claim 23. wherein: said third high temperature furnace comprises said first high temperature furnace, said first high temperature furnace being cooled prior to receipt of said third sample therein; andsaid fourth high temperature furnace comprises said second high temperature furnace, said second high temperature furnace being cooled prior to receipt of said fourth sample therein.

25. An apparatus according to 23 or claim 24. wherein: said second sample is received by said second high temperature furnace prior to completion of said performance of said material property testing on said first sample; said third sample is received by said third high temperature furnace prior to completion of said performance of said material property testing on said second sample; and said fourth sample is received by said fourth high temperature furnace prior to completion of said perfbmiance of said material property' testing on said third sample.

26. An apparatus according to any one of claims 21 - 25, and also comprising additional high temperature furnaces adapted to respectively receive additional samples.

27. An apparatus according to any one of claims 21 - 26, wherein said apparatus is configured to perform said material property' testing at a throughput rate of at least about one material property' test per hour.

28. An apparatus according to any one of claims 21 - 27, wherein said inductive heat source is configured to heat each said sample to a temperature in a range of between about 1500°C - 2800°C.

29. An apparatus according to any one of claims 21 - 28, wherein each said high temperature furnace comprises a unitary susceptor having a cavity' configured to receive said sample therein.

30. An apparatus according to claim 29, wherein a longest dimension of said cavity is smaller than a longest dimension of said susceptor.

31. An apparatus according to claim 29 or claim 30, wherein each said high temperature furnace further comprises a non-metallic furnace housing wrapped around an outer surface of said susceptor, at least for providing thermal insulation between said susceptor and said inductive heat source.

32. An apparatus according to any one of claims 21 - 31, wherein said inductive heat source comprises an inductive heating coil defining an inner opening, each said high temperature furnace being removably disposed in said inner opening when being heated by said inductive heating coil.

33. An apparatus according to claim 32, wherein a longitudinal axis of said inductive heating coil is generally horizontally oriented and each said high temperature furnace is generally horizontally disposed in said inner opening when being heated by said inductive heating coil.

34. An apparatus according to claim 32 or claim 33, and also comprising: a load application unit operative to apply a load to each said sample during performance of said material property testing.

35. An apparatus according to claim 34, and also comprising a deflectometer operative to measure displacement of each said sample responsive to said applied load.

36. An apparatus according to claim 35, wherein said load application unit and said deflectometer extend into each said high temperature furnace, through spaces between turns of said coil, when each said high temperature furnace is being heated by said inductive heat source.

37. An apparatus according to claim 35 or claim 36, wherein at least one of said load application system and said deflectometer comprises a hybrid rodcomprising a first refractory portion proximal to said sample and a second insulative portion distal from said sample.

38. A system for performing material property testing on samples, comprising a modular environmental chamber housing said apparatus of any one of claims 35 - 37.

39. A system according to claim 38, wherein said modular environmental chamber comprises an upper sub-chamber housing electronic circuitry of said load application unit, an intermediate sub-chamber housing at least a portion of said inductive heat source, and a lower sub-chamber housing electronic circuitry of said deflectometer.

40. A system according to claim 38 or claim 39, wherein said intermediate sub-chamber of said modular environmental chamber comprises thermal insulation, to prevent heating, by said inductive heat source, of said load application unit and said deflectometer.

41. An apparatus for performing material property' testing on a sample, comprising: at least one high-temperature furnace comprising: a furnace housing; and a susceptor enclosed by said furnace-housing, said susceptor being adapted to receive therein a sample held in a testing unit; and a heat source comprising a generally horizontally oriented heating coil defining an inner opening, said heat source being operative to heat said susceptor while said susceptor is generally horizontally disposed in said inner opening, and thereby to heat said sample therein, said testing unit being operative to perform material property testing on said sample, while said sample is being heated.

42. An apparatus according to claim 41, wherein said heat source is configured to heat said sample to a temperature in a range of between about 1500°C - 2800°C and said apparatus is operative to perform said material property testing at a throughput rate of at least about one material property test per hour.

43. An apparatus according to claim 41 or claim 42, wherein said susceptor comprises a cavity adapted to receive therein said sample held in said testing unit.

44. An apparatus according to claim 43, wherein said cavity is a longitudinal cavity, a length of said longitudinal cavity being less than a length of said susceptor.

45. An apparatus according to any one of claims 41 - 44, wherein said furnace housing comprises a replaceable non-metallic furnace housing.

46. An apparatus according to any one of claims 41 - 45, and also comprising: a load-application unit operative to apply a force to said sample, during said material property testing.

47. An apparatus according to claim 46, and also comprising a deflectometer operative to measure displacement of said sample, during said material property testing.

48. An apparatus according to claim 47, wherein at least one of said load application unit and said deflectometer comprises a hybrid rod comprising a first refractory portion positioned proximal to said sample during said testing and a second insulative portion positioned distal from said sample, during said testing.

49. An apparatus according to any one of claims 41 - 48, wherein said at least one high temperature furnace comprises a plurality of said high temperature furnaces, at least one of said plurality of said high temperaturefurnaces being heated by said heat source at least partially concurrently with a sample held in a test unit being inserted in at least another one of said plurality of high temperature furnaces.

50. A system for performing material property testing on a sample, comprising a modular environmental chamber housing said apparatus of any one of claims 41 - 49.

51. A method for performing material property testing on a sample, comprising: providing a heat source comprising a generally horizontally oriented heating coil defining an inner opening; disposing at least one high temperature furnace in a generally horizontal orientation in said inner opening, said at least one high temperature furnace comprising: a furnace housing; and a susceptor enclosed by said furnace-housing, said susceptor being adapted to receive therein a sample held in a testing unit; heating, by said heat source, said susceptor while said susceptor is disposed in said inner opening, thereby heating said sample therein; and performing material property testing on said sample, using said testing unit, while said sample is being heated.

52. A method according to claim 51, wherein said susceptor comprises a cavity for receiving therein said sample held in said testing unit.

53. A method according to claim 51 or claim 52. wherein an entirety of said sample is received within said cavity of said susceptor.

54. A method according to any one of claims 51 - 53, wherein said cavity is a longitudinal cavity, a length of said longitudinal cavity being less than a length of said susceptor.

55. A method according to any one of claims 51 - 54, wherein said heating said sample comprises heating said sample to a temperature in a range of between about 1500°C - 2800°C and said performing material property testing comprises performing material property testing at a throughput rate of at least about one test per hour.

56. A method according to any one of claims 51 - 55, wherein said furnace housing is non-metallic and said method further comprises replacing said non- metallic furnace housing following said material property testing of said sample and prior to performance of additional material property testing on an additional sample.

57. A method according to any one of claims 51 - 56. and also comprising: applying a force to said sample, during said material property testing; and measuring displacement of said sample, during said material property testing.

58. A method according to claim 57, and also comprising said applying said force to said sample by a load application system and said measuring said displacement of said sample by a deflectometer, wherein at least one of said load application system and said deflectometer comprises a hybrid rod comprising a first refractory portion positioned proximal to said sample during said testing and a second insulative portion positioned distal from said sample, during said testing.

59. A method according to any one of claims 51 - 58, wherein said at least one high temperature furnace comprises a plurality of said high temperature furnaces, said method comprising heating at least one of said plurality of said high temperature furnaces by said heat source at least partially concurrently with asample held in a test unit being inserted in at least another one of said plurality of high temperature furnaces.

60. A method according to any one of claims 51 - 59, and also comprising housing said heating coil in a modular environmental chamber.

61. An apparatus for performing material property testing on a sample (AMPT), comprising: a high-temperature furnace comprising: a non-metallic furnace housing formed by at least two segments, said at least two segments combinedly bounding a space; and a susceptor at least partially disposed in said space, said susceptor being operative to heat said sample; a heat source operative to heat said susceptor while said susceptor is at least partially disposed in said space; and a testing unit at least partially enclosed within said susceptor, for performing said material property testing on said sample.

62. An apparatus for performing material property testing on a sample (AMPT), comprising: a high-temperature furnace comprising: a non-metallic furnace housing formed by at least two segments, said at least two segments combinedly bounding a space; and a susceptor at least partially disposed in said space, said susceptor being operative to heat said sample; a heat source operative to heat said susceptor while said susceptor is at least partially disposed in said space; and a testing unit at least partially enclosed within said susceptor, for performing said material property testing on said sample, said AMPT being capable of heating said sample to a temperature in a range of between about 1500°C - 2800°C and of performing said testing at a throughput rate of at least about one test per hour.

63. An AMPT according to claim 61 or claim 62, wherein at least one of said at least two segments of said furnace housing comprises multiple layers.

64. An AMPT according to claim 63, wherein said multiple layers comprise: at least one layer of at least one of zirconia, hafhia, at least one high-temperature carbide and thoria; interleaved with at least one additional layer of at least one of graphite paper, alumina felt and a ceramic material.

65. An AMPT according to claim 62, wherein at least one of said furnace housing and said susceptor is readily replaceable between subsequent ones of said at least one test.

66. An AMPT according to any one of claims 61 - 65, wherein said heat source is an inductive heat source.

67. An AMPT according to any one of claims 61 - 66, wherein said susceptor comprises at least two parts combinedly forming an enclosure adapted to enclose said testing unit therein.

68. An AMPT according to any one of claims 61 - 67, wherein said susceptor comprises one of graphite and silicon carbide.

69. An AMPT according to any one of claims 61 - 68, wherein said testing unit comprises one of a three-point bend testing unit, a four-point bend testing unit, and a fracture toughness testing unit.

70. An AMPT according to any one of claims 61 - 69, and also comprising a low-torque load unit operative to control application of a testing load to said sample.

71. An apparatus for performing material property testing on a sample (AMPT) for performing material property' testing on a sample, comprising: a high-temperature furnace comprising: a non-metallic furnace housing formed by at least two segments, said at least two segments combinedly bounding a space; and a susceptor at least partially disposed in said space, said susceptor being operative to heat said sample and said susceptor comprising at least two parts combinedly forming an enclosure adapted to hold a testing unit therein, said testing unit being operative to perform said material property testing on said sample when said sample is heated by' said susceptor; and a heat source operative to heat said susceptor while said susceptor is at least partially disposed in said space.

72. An apparatus for performing material property testing on a sample (AMPT) for performing material property7testing on a sample, comprising: a high-temperature furnace comprising: a furnace housing bounding a space; and a susceptor at least partially disposed in said space, said susceptor being operative to heat said sample and said susceptor comprising at least two parts combinedly forming an enclosure adapted to hold a testing unit therein, said testing unit being operative to perfonn said material property testing on said sample when said sample is heated by said susceptor; and a heat source operative to heat said susceptor while said susceptor is at least partially disposed in said space, said AMPT being capable of heating said sample to a temperature in a range of between about 1500°C - 2800°C and of performing said testing at a throughput rate of at least about one test per hour.

73. An AMPT according to claim 71 or claim 72, wherein said furnace housing is formed by at least two segments combinedly bounding said space.

74. An AMPT according to claim 73, wherein at least one of said at least two segments of said furnace housing comprises multiple layers.

75. An AMPT according to claim 74, wherein said multiple layers comprise: at least one layer of at least one of zirconia, hafhia, at least one high-temperature carbide and thoria; interleaved with at least one additional layer of at least one of graphite paper, alumina felt and a ceramic material.

76. An AMPT according to claim 72, wherein at least one of said furnace housing and said susceptor is readily replaceable between subsequent ones of said at least one test.

77. An AMPT according to any one of claims 71 - 76, wherein said heat source is an inductive heat source.

78. An AMPT according to any one of claims 71 - 77, wherein said susceptor comprises one of graphite and silicon carbide.

79. An AMPT according to any one of claims 71 - 78, wherein said testing unit comprises one of a three-point bend testing unit, a four-point bend testing unit and a fracture toughness testing unit.

80. An AMPT according to any one of claims 71 - 79, and also comprising a low-torque load unit operative to control application of a testing load to said sample.

81. A method for performing material property testing on a sample, comprising: at least partially enclosing said sample and a testing unit within a susceptor of a high-temperature furnace;disposing said susceptor at least partially within a space bounded by at least two segments of a non-metallic furnace housing of said high- temperature furnace; placing said high-temperature furnace at least partially within a heat source; thereafter heating said susceptor using said heat source, thereby heating said sample; and thereafter performing material property testing on said sample, using said testing unit.

82. A method according to claim 81 and wherein: said disposing said susceptor at least partially within said space bounded by said at least two segments of said non-metallic furnace housing precedes said placing said high-temperature furnace at least partially within said heat source.

83. A method according to claim 81 and wherein: said placing said high-temperature furnace at least partially within said heat source precedes said disposing said susceptor at least partially within said space bounded by said at least two segments of said non-metallic furnace housing.

84. A method according to any of claims 81 - 83 and wherein said at least two segments of a non-metallic furnace housing comprise multiple layers.

85. A method according to any of claims 81 - 84 and wherein said heating said susceptor comprises heating said susceptor using induction.

86. A method according to any of claims 81 - 85 and wherein said heating said sample comprises heating said sample to a temperature in a range of between about 1500°C - 2800°C.

87. A method according to any of claims 81 - 86 and wherein said performing material property7testing on said sample comprises any of: a three-point bend test; a four-point bend test; a three-point fracture toughness test; and a four-point fracture toughness test.

88. A method according to any of claims 81 - 87 and wherein said performing material property testing on said sample comprises using a low-torque load unit to apply a testing load to said sample.

89. A method according to any of claims 81 - 88 and wherein at least one of said furnace housing and said susceptor is readily replaceable between subsequent ones of said at least one test.

90. A method according to any of claims 81 - 89 and wherein: said material property testing on said sample is performed within an environmental chamber; and said least partially enclosing said sample and said testing unit within said susceptor occurs outside of said environmental chamber.

91. A method according to claim 90 and wherein disposing said susceptor at least partially within a space bounded by at least tw o segments of a non-metallic furnace housing of said high-temperature furnace occurs outside of said environmental chamber.

92. A method according to any of claims 81 - 91 and wherein said method is characterized by a throughput rate of at least about one test per hour.

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