Test socket

Abstract

The present invention provides a test socket for testing electrical characteristics of an object to be tested, the test socket comprising: a floating part on which the object to be tested is mounted, and which can be lifted and lowered; an elastic part positioned below the floating part; a fixing part supporting the floating part with the elastic part interposed therebetween; and a shuttle key capable of supporting the floating part in the downward direction and capable of supporting the fixing part in the upward direction.

Description

test socket

[0001] The present invention relates to a test socket, and more specifically, to a test socket for testing the electrical characteristics of an object to be tested.

[0002] The electrical characteristics of manufactured semiconductor packages or semiconductor wafers, etc., are tested to confirm normal operation and reliability.

[0003] Inspection of an inspection object is performed by contacting an inspection device such as a test socket or probe card having a number of electrically conductive pins to an inspection object such as a semiconductor package or semiconductor wafer, thereby providing an electrical signal.

[0004] In particular, the test socket is equipped with electrically conductive pins to connect each semiconductor package and test board to transmit electrical signals between them, thereby enabling inspection to be performed.

[0005] In this regard, prior art document No. 10-1471652 discloses "an insert and a semiconductor package testing device including the same." The prior art document describes a structure in which a fastening means is inserted into a fastening hole of a multi-stage ball guide and bolted to the insert.

[0006] The step structure fastening hole in such a 'semiconductor package test device' has the problem that the manufacturing difficulty increases and the manufacturing time increases, and the repetitive force applied toward the bolt head causes the bolt fastening structure to break.

[0007] [Prior Art Literature]

[0008] [Patent Document]

[0009] (Patent Document 1) Patent Publication No. 10-1471652

[0010] In order to solve the above-described problems, the present invention aims to provide a test socket that facilitates the manufacture of a component having a hole such as a floating part and facilitates the fixing and assembly of the floating part.

[0011] In order to achieve the above-described purpose, a test socket according to an embodiment of the present invention may include a test socket for testing electrical characteristics of an object to be inspected, the test socket including: a floating part on which the object to be inspected is secured and which can be raised and lowered; an elastic part located below the floating part; a fixed part that supports the floating part with the elastic part interposed therebetween; and a shuttle key capable of supporting the floating part in a downward direction and supporting the fixed part in an upward direction.

[0012] Additionally, in an embodiment of the present invention, the shuttle key may be capable of switching between a first state in which the floating part is allowed to be detached and a second state in which the floating part is prevented from being detached.

[0013] Additionally, in an embodiment of the present invention, the shuttle key may be rotated about a central axis to enable switching between the first state and the second state.

[0014] In addition, in an embodiment of the present invention, the shuttle key may include a first support portion that extends in a first direction and supports the floating portion with a lower surface; a second support portion that extends in a second direction perpendicular to the first direction and supports the fixed portion with an upper surface; and a connecting portion that connects the first support portion and the second support portion.

[0015] In addition, the test socket according to an embodiment of the present invention may further include a rotation prevention part that is provided in contact with at least a portion of the first support part and prevents rotation of the shuttle key.

[0016] In addition, in an embodiment of the present invention, the fixed part may include a housing part constituting an upper portion of the fixed part and a base part constituting a lower portion of the fixed part, the floating part may include a first shuttle key hole formed to penetrate the floating part in the thickness direction and extend in a third direction, the housing part may include a second shuttle key hole formed to penetrate the housing part in the thickness direction and extend in a fourth direction perpendicular to the third direction, and the base part may include a third shuttle key hole formed to penetrate the base part in the thickness direction.

[0017] Additionally, in an embodiment of the present invention, the floating portion may include a first shuttle key hole that penetrates the floating portion in the thickness direction and maintains the same diameter from the upper surface to the lower surface of the floating portion.

[0018] In addition, the test socket according to an embodiment of the present invention may further include a heating part that generates heat between the upper surface and the lower surface of the fixing part and transmits the heat to the fixing part.

[0019] Additionally, in an embodiment of the present invention, the heating unit may include an integrated hole through which a plurality of electrically conductive pins positionable on the fixing unit pass.

[0020] In addition, a test socket according to an embodiment of the present invention further includes a socket cover that surrounds the floating part and the fixed part; and the socket cover may include a fixing hole for fixing to a test board, a pusher guide hole for guiding the position of a pusher, and an insert hole for providing a space for the test object to be provided in the floating part.

[0021] The present invention enables the floating part to be fixed and assembled to the fixed part only with a shuttle key without any other configuration, thereby reducing process difficulty, process cost, and process time.

[0022] In addition, the present invention can reduce process difficulty, process cost, and process time by manufacturing the floating part so that it has only holes without steps.

[0023] FIG. 1 is a drawing showing a test socket according to an embodiment of the present invention.

[0024] FIG. 2 is a drawing showing a test socket in an embodiment of the present invention.

[0025] Figure 3 is a drawing showing a disassembled state of a test socket in an embodiment of the present invention.

[0026] Fig. 4 is a drawing showing a cross-section of a test socket in an embodiment of the present invention.

[0027] Fig. 5 is a drawing showing a cross-section of a test socket in an embodiment of the present invention.

[0028] Fig. 6 is a drawing showing a cross-section of a test socket in an embodiment of the present invention.

[0029] Fig. 7 is a drawing showing a cross-section of a test socket in an embodiment of the present invention.

[0030] Fig. 8 is a drawing showing the coupling and rotation of the shuttle key in an embodiment of the present invention.

[0031] Figure 9 is a drawing showing the first state of the shuttle key.

[0032] Figure 10 is a drawing showing the second state of the shuttle key.

[0033] Those skilled in the art will be able to develop various devices that embody the principles of the invention and fall within the scope and spirit of the invention, even if not explicitly described or illustrated in this specification. Furthermore, all conditional terms and embodiments listed herein are expressly intended, in principle, to facilitate understanding of the invention's concept and should be understood as being in no way limiting to the specifically listed embodiments and conditions.

[0034] The above-described objects, features and advantages will become more apparent through the following detailed description of the invention in conjunction with the accompanying drawings, so that those skilled in the art will be able to easily implement the technical idea of ​​the invention.

[0035] The embodiments described herein will be described with reference to cross-sectional and / or perspective views, which are ideal illustrations of the present invention. The dimensions of components depicted in these drawings may be exaggerated for the purpose of effectively explaining the technical content. The form of the illustrations may be altered due to manufacturing techniques and / or tolerances.

[0036] When describing various embodiments, components that perform the same function will be given the same names and reference numerals for convenience even if the embodiments are different. In addition, the expression 'at least one of A, B, and C' means composed of one, two, or three of A, B, and C. In addition, a cross-section or a cross-sectional area may mean a cross-section on the xy plane unless otherwise specified, and an outer diameter may mean an outer diameter of the cross-section. The thickness direction and the vertical direction mean the z-axis direction, and the horizontal direction means the direction perpendicular to the z-axis. Furthermore, for convenience, the configuration and operation already described in other embodiments will be omitted.

[0037] Below, a test socket (10) according to an embodiment of the present invention will be described.

[0038] FIG. 1 is a drawing showing a test socket (10) according to an embodiment of the present invention. FIG. 2 is a drawing showing a test socket (10) according to an embodiment of the present invention. FIG. 3 is a drawing showing an exploded state of a test socket (10) according to an embodiment of the present invention. FIG. 4 is a drawing showing a cross-section of a test socket (10) according to an embodiment of the present invention. FIG. 5 is a drawing showing a cross-section of a test socket (10) according to an embodiment of the present invention. FIG. 6 is a drawing showing a cross-section of a test socket (10) according to an embodiment of the present invention. FIG. 7 is a drawing showing a cross-section of a test socket (10) according to an embodiment of the present invention. FIG. 8 is a drawing showing the coupling and rotation of a shuttle key (400) according to an embodiment of the present invention. FIG. 9 is a drawing showing a first state of a shuttle key (400). FIG. 10 is a drawing showing a second state of a shuttle key (400).

[0039] Referring to FIGS. 1, 2, and 3, a test socket (10) according to an embodiment of the present invention may include a floating part (100) on which the test object is mounted and which can be raised and lowered; an elastic part (300) located at a lower portion of the floating part (100); a fixed part (200) that supports the floating part (100) with the elastic part (300) interposed therebetween; and a shuttle key (400) that can support the floating part (100) in a downward direction and can support the fixed part (200) in an upward direction. In addition, the test socket (10) may further include a socket cover (600).

[0040] The test socket (10) can be utilized as a test means for examining the electrical characteristics of a test object (not shown). In addition, the test socket (10) can be utilized as a burn-in test means for examining the electrical characteristics while maintaining the test object at a high temperature.

[0041] The test socket (10) can be divided into a socket cover (600) and a socket body (100, 200). The socket cover (600) can include at least one of a fixing hole (630), a pusher guide hole (620), and an insert hole (610).

[0042] The fixing hole (630) can be combined with a bolt to fix the test socket (10) to a test board (not shown). The pusher guide hole (620) allows the pusher (not shown) to pass through the protruding guide means (not shown) of the pusher when the pusher presses the test object, thereby allowing the pusher to press the test object in the correct position.

[0043] An insert hole (610) may be provided in the central area of ​​the socket cover (600). The insert hole (610) may provide a space in which an insert (110) is accommodated. The insert hole (610) may provide a space in which a test object is provided to the test socket (10).

[0044] At least a portion of the inner wall of the insert hole (610) may be provided along the edge of the insert (110). The insert (110) provided in the floating part (100) to induce the inspection object to be properly positioned may be raised and lowered in the insert hole (610).

[0045] In the raised state of the floating part (100), the upper surface of the insert (110) may be positioned at the same height as the upper surface of the socket cover (600). In the lowered state of the floating part (100), the upper surface of the insert (110) may be positioned at a lower height than the upper surface of the socket cover (600).

[0046] The socket body may be configured as a test socket (10) with the socket cover (600) excluded, but for convenience, it is described as a test socket (10) unless otherwise specified.

[0047] The floating member (100) can be raised and lowered by being coupled with the fixed member (200). The floating member (100) may include an insert (110) that provides a space for the inspection object to be placed. The inserts (110) may be provided in multiple positions spaced apart from each other. The inspection object may be a semiconductor device or a semiconductor package, but is not limited thereto.

[0048] The inserts (110) spaced apart in multiple directions can guide the test object in a horizontal direction so that the test object can be positioned correctly. The inserts (110) have an inclined region inside them, thereby guiding the test object to move along the inclined region, thereby positioning the test object in the correct position.

[0049] Each insert (110) can be fixed to the floating part (100) by an insert fixing means (710). The insert fixing means (710) can fix the insert (110) by engaging with the insert (110) from the bottom to the top of the floating part (100).

[0050] After the test object is placed on the floating part (100), when the pusher presses the test object, the floating part (100) descends, and the electrode (or solder) of the test object and the electrically conductive pin (20) come into contact, so that an electrical signal can be transmitted.

[0051] Referring to FIGS. 3 and 4, the floating member (100) may include a plurality of pin exposure holes (101) through which a plurality of electrically conductive pins (20) pass, respectively. The electrically conductive pins (20) fixed to the fixed member (200) may be exposed upward through the pin exposure holes (101) as the floating member (100) descends. At this time, the electrically conductive pins (20) may come into contact with the inspection object, thereby transmitting an electrical signal.

[0052] The fixed part (200) can be combined with the floating part (100). The fixed part (200) can be combined with the floating part (100) so that the floating part (100) can rise and fall. The fixed part (200) can support the floating part (100) with the elastic part (300) interposed therebetween.

[0053] Even if the floating part (100) is lowered by pressure or raised by release of pressure, the fixed part (200) can be fixed on the test board. The fixed part (200) can include at least one fixed part hole (230) that allows the fixed part (200) to be fixed to the test board. The fixed part hole (230) can be combined with a bolt to fix the fixed part (200) to the test board.

[0054] The fixed part (200) may include a housing part (210) forming the upper part of the fixed part (200) and a base part (220) forming the lower part of the fixed part (200). The housing part (210) and the base part (220) may be coupled to each other by a fixed coupling means (240). The fixed coupling means (240) may be a bolt, but is not limited thereto.

[0055] The fixed part hole (230) may include a first fixed part hole (231) provided in the housing part (210) and a second fixed part hole (232) provided in the base part (220). The fixed part hole (230) may be provided in the fixed part (200) without a step.

[0056] The floating part (100) may include at least one floating part hole (120). When a coupling means such as a bolt is coupled to the fixed part hole (230), the floating part hole (120) may provide a space through which the coupling means passes.

[0057] The floating part (100) may include at least one floating part hole (120). The fixed part (200) may include at least one fixed part hole (230). Specifically, the housing part (210) may include a first fixed part hole (231), and the base part (220) may include a second fixed part hole (232). The diameter of the floating part hole (120) may be larger than the diameter of the fixed part hole (230). The floating part hole (120) and the fixed part hole (230) may share the same central axis (z-axis).

[0058] The fixed part (200) may include a plurality of pin receiving holes (201) in which a plurality of electrically conductive pins (20) are each received. The electrically conductive pins (20) received in the pin receiving holes (201) may be exposed upward through the pin exposure holes (101) as the floating part (100) descends. The electrically conductive pins (20) may be exposed through the lower surface of the fixed part (200) to contact the test board, and may be exposed through the upper surface of the fixed part (200) and the upper surface of the descending floating part (100) to contact the electrodes (or solder) of the object to be inspected.

[0059] The test socket (10) according to an embodiment of the present invention may further include a heating part (500) that generates heat between the upper surface and the lower surface of the fixing part (200) and transmits the heat to the fixing part (200).

[0060] The heating unit (500) can transfer heat to the fixed unit (200). The heating unit (500) is located inside the fixed unit (200) and can transfer heat to the fixed unit (200). The heat transferred to the fixed unit (200) can be retransmitted to the inspection object mounted on the floating unit (100).

[0061] The heating unit (500) may include an integrated hole (501) in the center through which a plurality of electrically conductive pins (20) may be positioned or passed. The heating unit (500) may have a plurality of through holes through which a fixed coupling means (240) may pass. The housing unit (210) and the base unit (220) may be coupled with the heating unit (500) interposed therebetween, and may be coupled by a fixed coupling means (240) passing through the through holes of the heating unit (500).

[0062] The heating unit (500) can be accommodated in a heating unit groove (221) formed in the base unit (220). The heating unit groove (221) can be formed to be drawn in from the upper surface of the base unit (220) toward the lower surface and provided in the base unit (220).

[0063] Referring to FIG. 5, an elastic member (300) may be provided between a floating member (100) and a fixed member (200). The elastic member (300) is positioned below the floating member (100) and can provide an upward restoring force to the floating member (100) when the floating member (100) is lowered. The elastic member (300) is positioned above the fixed member (200) and can provide an upward restoring force to the floating member (100) when the floating member (100) is lowered.

[0064] The elastic member (300) can provide restoring force to the floating member (100) by having one end in contact with the lower end of the insert fixing means (710). The other end of the elastic member (300) can provide restoring force to the floating member (100) by having the other end in contact with the fixing member (200). Specifically, the elastic member (300) can pass through the housing member (210) and contact the base member (220). The elastic member (300) can be supported at both ends by the floating member (100) and the base member (220) and can pass through the integrated hole (501) of the heating member (500).

[0065] Referring to FIG. 6, the test socket (10) according to an embodiment of the present invention may further include a floating guide portion (720). The floating guide portion (720) may guide the rising and falling of the floating portion (100). The floating guide portion (720) may fix the horizontal position of the floating portion (100) when it rises and falls.

[0066] The floating guide part (720) may be provided to penetrate the floating guide hole (723) provided in the floating part (100) and the fixed part (200). The floating guide part (720) may include a first floating guide part (721) that can be positioned in the floating guide hole (723) and a second floating guide part (722) that can be positioned in the integrated hole (501).

[0067] The second floating guide part (722) can be positioned between the lower surface of the housing part (210) and the upper surface of the base part (220). The floating guide part (720) is fixed in the horizontal direction by the first floating guide part (721) and is fixed in the vertical direction by the second floating guide part (722), thereby allowing the floating part (100) to descend to the fixed position in the vertical direction.

[0068] Referring to Fig. 7, the shuttle key (400) can connect the floating part (100) and the fixed part (200). The shuttle key (400) can connect with the fixed part (200) so that the floating part (100) can be raised and lowered. The shuttle key (400) can support the floating part (100) by applying a force in a downward direction, and can support the fixed part (200) by applying a force in an upward direction.

[0069] The shuttle key (400) can prevent the floating part (100) from being separated from the fixed part (200) when the restoring force of the elastic part (300) is applied to the fixed part (200) and the floating part (100). The shuttle key (400) can couple the floating part (100) to the fixed part (200) while allowing the floating part (100) to rise and fall.

[0070] The shuttle key (400) can pass through the first shuttle key hole (441) and the second shuttle key hole (442), and can pass through at least a portion of the third shuttle key hole (443). That is, the shuttle key (400) can connect the floating part (100) and the fixed part (200) in a state where it passes through the first shuttle key hole (441) and the second shuttle key hole (442), and in a state where it passes through a portion of the third shuttle key hole (443).

[0071] When the elastic part (300) applies an upward force to the floating part (100), the shuttle key (400) can support the floating part (100) in a downward direction, and when the elastic part (300) applies a downward force to the fixed part (200), the shuttle key (400) can support the fixed part (200) in an upward direction.

[0072] Referring to Fig. 8, the shuttle key (400) can be switched between a first state in which the separation of the floating part (100) from the fixed part (200) is permitted and a second state in which the separation of the floating part (100) from the fixed part (200) is prevented. The shuttle key (400) can be switched between the first state and the second state by rotating around the central axis (z-axis).

[0073] The first direction is the extension direction of the first support member (410), and the third direction is the extension direction of the first shuttle key hole (441). The second direction is the extension direction of the second support member (420), and the fourth direction is the extension direction of the second shuttle key hole (442). The first and second directions are perpendicular to each other, and the third and fourth directions are perpendicular to each other. The first to fourth directions may be directions on the same plane.

[0074] The first state may refer to a state in which the first direction and the third direction are aligned. In the first state, the floating part (100) may be detachable from the fixed part (200) (see FIG. 9). The second state may refer to a state in which the first direction and the third direction are inconsistent. In the second state, the floating part (100) may be incapable of detaching from the fixed part (200) (see FIG. 10). Details will be described later.

[0075] The shuttle key (400) may include a first support portion (410), a second support portion (420), and a connecting portion (430).

[0076] The first support portion (410) may be formed to extend in a first direction. The first support portion (410) may support the floating portion (100) with its lower surface. The first support portion (410) may support the floating portion (100) that rises due to the restoring force of the elastic portion (300). Here, the first direction is not limited to a specific direction. The length in the extension direction of the first support portion (410) is referred to as the long width of the first support portion (410), and the length in the direction perpendicular to the extension direction of the first support portion (410) is referred to as the short width of the first support portion (410).

[0077] The second support member (420) may be formed to extend in a second direction. The second direction may mean a direction perpendicular to the first direction. The second support member (420) may support the fixed member (200) with its upper surface. The second support member (420) may support the fixed member (200) that is lowered relatively to the floating member (100). The length in the extension direction of the second support member (420) is referred to as the long width of the second support member (420), and the length in the direction perpendicular to the extension direction of the second support member (420) is referred to as the short width of the second support member (420).

[0078] The second support member (420) may include an inlet groove (421) that is introduced upward along the longitudinal direction of the single width. The inlet groove (421) allows a rotating means such as a driver to enter and easily rotate the shuttle key (400).

[0079] The connecting portion (430) can connect the first support portion (410) and the second support portion (420) between the first support portion (410) and the second support portion (420). The connecting portion (430) can include a first connecting portion (431) and a second connecting portion (432).

[0080] The first connecting portion (431) may have one end connected to the first support portion (410) and the other end connected to the second connecting portion (432). The first connecting portion (431) may extend in a direction perpendicular to the first direction and the second direction. The size of the outer diameter (or diameter) of the first connecting portion (431) may be the same as the size of the width of the first support portion (410).

[0081] The second connecting portion (432) may have one end connected to the first connecting portion (431) and the other end connected to the second support portion (420). The second connecting portion (432) may extend in a direction perpendicular to the first direction and the second direction. The size of the outer diameter (or diameter) of the second connecting portion (432) may be equal to or larger than the size of the width of the second supporting portion (420). The size of the outer diameter (or diameter) of the second connecting portion (432) may be larger than the size of the outer diameter of the first connecting portion (431).

[0082] The shuttle key (400) can fix the floating part (100) and the fixed part (200) by penetrating the upper and lower surfaces of the floating part (100), and can fix the floating part (100) and the fixed part (200) by penetrating the upper surface of the fixed part (200) (or a part of the housing part (210) and the base part (220)).

[0083] The floating portion (100) may include a first shuttle key hole (441) penetrating the floating portion (100) in the thickness direction. The first shuttle key hole (441) may extend in a third direction. The third direction may be a direction perpendicular to the thickness direction. The first shuttle key hole (441) may be provided so as to maintain the same cross-section from the upper surface to the lower surface of the floating portion (100).

[0084] The housing portion (210) may include a second shuttle key hole (442) penetrating the housing portion (210) in the thickness direction. The second shuttle key hole (442) may extend in a fourth direction. The fourth direction may be a direction perpendicular to the thickness direction and the third direction. The second shuttle key hole (442) may be provided so as to maintain the same cross-section from the upper surface to the lower surface of the housing portion (210).

[0085] The base portion (220) may include a third shuttle key hole (443) penetrating the base portion (220) in the thickness direction. The third shuttle key hole (443) may be provided to maintain the same diameter from the upper surface to the lower surface of the base portion (220).

[0086] The third shuttle key hole (443) may have a diameter larger than the width of the second support member (420). Since the diameter of the third shuttle key hole (443) is larger than the width of the second support member (420), the second support member (420) can rotate in the third shuttle key hole (443) without interference even when the shuttle key (400) rotates.

[0087] Referring to FIGS. 9 and 10, the shuttle key (400) can be positioned in the third shuttle key hole (443) or pass through the third shuttle key hole (443) regardless of the rotation direction with respect to the central axis.

[0088] The shuttle key (400) can be located in the second shuttle key hole (442) or pass through the second shuttle key hole (442) when the first direction, which is the direction in which the first support member (410) extends, matches the fourth direction, which is the direction in which the second shuttle key hole (442) extends.

[0089] The shuttle key (400) can be positioned in the first shuttle key hole (441) or pass through the first shuttle key hole (441) when the first direction, which is the direction in which the first support member (410) extends, matches the third direction, which is the direction in which the first shuttle key hole (441) extends (first state).

[0090] The first support part (410) of the shuttle key (400) can pass through the second shuttle key hole (442) of the housing part (210) when the first direction and the fourth direction are aligned, and in this case, the second support part (420) of the shuttle key (400) cannot pass through the second shuttle key hole (442) of the housing part (210) because the second direction and the fourth direction are not aligned.

[0091] The first support part (410) of the shuttle key (400) can pass through the first shuttle key hole (441) of the floating part (100) in a state where the first direction and the third direction are aligned (first state). In this case, the second support part (420) of the shuttle key (400) can pass through the second shuttle key hole (442) of the housing part (210) because the second direction and the fourth direction are aligned.

[0092] When at least a part of the shuttle key (400) (or the first support member (410)) passes through the first shuttle key hole (441) and rotates at least 90 degrees, the first direction becomes different from (or perpendicular to) the third direction (second state), and the first support member (410) can support the floating member (100).

[0093] When at least a part of the shuttle key (400) (or the first support member (410)) passes through the first shuttle key hole (441) and rotates at least 90 degrees, the second direction may not coincide with (or be perpendicular to) the fourth direction, and the second support member (420) may support the fixed member (200).

[0094] When the first direction, which is the extension direction of the first support part (410), and the third direction, which is the extension direction of the first shuttle key hole (441), become inconsistent (second state), and the second direction, which is the extension direction of the second support part (420), and the fourth direction, which is the extension direction of the second shuttle key hole (442), become inconsistent, the shuttle key (400) connects the floating part (100) and the fixed part (200) while penetrating the first shuttle key hole (441) and the second shuttle key hole (442). At this time, the floating part (100) can descend and ascend together with the compression and extension of the elastic part (300) located between the floating part (100) and the fixed part (200).

[0095] According to an embodiment of the present invention, a test socket (10) can be coupled to a fixed part (200) so that the floating part (100) can be raised and lowered only by a rotation of at least 90 degrees of the shuttle key (400).

[0096] Since the shuttle key (400) supports the floating part (100) by making surface contact with the upper surface of the floating part (100) through the lower surface of the first support part (410) and supports the fixed part (200) by making surface contact with the lower surface of the housing part (210) through the upper surface of the second support part (420), the floating part (100) and the fixed part (200) can be joined more stably despite repeated rising and falling of the floating part (100).

[0097] Since the floating part (100) is fixed while the shuttle key (400) penetrates both the upper and lower surfaces of the floating part (100) and the upper and lower surfaces of the housing part (210), the floating part (100) can be provided with a first shuttle key hole (441) in which the shape and width of the cross section are maintained (stepless). The stepless first shuttle key hole (441) can reduce the manufacturing difficulty, manufacturing cost, and manufacturing time of the floating part (100).

[0098] Additionally, the housing portion (210) may be provided with a second shuttle key hole (442) without a step. The second shuttle key hole (442) without a step may reduce the manufacturing difficulty, manufacturing cost, and manufacturing time of the housing portion (210).

[0099] In addition, since the second support portion (420) of the shuttle key (400) provides a rotatable space, the base portion (220) can be provided with a third shuttle key hole (443) without a step. The third shuttle key hole (443) without a step can reduce the manufacturing difficulty, manufacturing cost, and manufacturing time of the base portion (220).

[0100] With continued reference to FIG. 10, the test socket (10) according to an embodiment of the present invention may further include a rotation prevention portion (730) that is provided to be in contact with at least a portion of the first support portion (410) and prevents rotation of the shuttle key (400). The floating portion (100) may include a floating rotation prevention hole (733) through which the rotation prevention portion (730) passes. The housing portion (210) may include a housing rotation prevention hole (734) through which at least a portion of the rotation prevention portion (730) passes.

[0101] The anti-rotation part (730) may be provided one or more times for each shuttle key (400). At least one floating anti-rotation hole (733) and one housing anti-rotation hole (734) may be provided. A first shuttle key hole (441) may be located between a pair of floating anti-rotation holes (733). A second shuttle key hole (442) may be located between a pair of housing anti-rotation holes (734).

[0102] The anti-rotation part (730) may include an exposed anti-rotation part (731) and a through-rotation part (732). The exposed anti-rotation part (731) may refer to an area exposed through the upper surface of the floating part (100) when the anti-rotation part (730) is fixed to the floating part (100). The through-rotation part (732) may refer to an area where the anti-rotation part (730) passes through the floating anti-rotation hole (733) when the anti-rotation part (730) is fixed to the floating part (100).

[0103] The shuttle key (400) connects the floating part (100) and the fixed part (200) in the first state, and a pair of anti-rotation parts (730) can be connected to the floating part (100) with the shuttle key (400) interposed therebetween. The pair of anti-rotation parts (730) are provided so as to be in contact with both sides forming the width of the shuttle key (400) so as to prevent rotation of the shuttle key (400).

[0104] The exposed rotation prevention part (731) prevents rotation of the shuttle key (400) by contacting the first support part (410) and blocks a part of the first shuttle key hole (441) from above so that the first support part (410) cannot pass through the first shuttle key hole (441). The exposed rotation prevention part (731) can cover a part of the long width of the first shuttle key hole (441) and close a part of the first shuttle key hole (441) from above.

[0105] When the floating part (100) descends, at least a portion of the through-rotation preventing part (732) can move along the housing rotation preventing hole (734). The through-rotation preventing part (732) can move within the housing rotation preventing hole (734) to prevent the floating part (100) from being misaligned in the horizontal direction when descending.

[0106] The floating portion (100) may be provided with a stepless floating anti-rotation hole (733). The housing portion (210) may be provided with a stepless housing anti-rotation hole (734). The stepless floating anti-rotation hole (733) and the housing anti-rotation hole (734) may reduce the manufacturing difficulty, manufacturing cost, and manufacturing time of the floating portion (100) and the housing portion (210), respectively.

[0107] The test object according to the embodiment of the present invention can be manufactured using a simple processing method because each of the various holes provided in at least one of the floating part (100), the housing part (210), and the base part (220) is manufactured without steps.

[0108] As described above, the present invention has been described with reference to preferred embodiments thereof, but it will be apparent to those skilled in the art that various modifications or variations may be made to the present invention without departing from the spirit and scope of the present invention as set forth in the following claims.

[0109] [Explanation of symbols]

[0110] 10: Test socket

[0111] 20: Electrically conductive pin

[0112] 100: Floating part

[0113] 101: Pin exposure hole

[0114] 110: Insert

[0115] 120: Floating hole

[0116] 200: Fixed part

[0117] 201: Pin receiving hole

[0118] 210: Housing Department

[0119] 220: Bass section

[0120] 221: Heat generation home

[0121] 230: Fixed hole

[0122] 231: 1st Fixed Government Hall

[0123] 232: Second Fixed Government Hall

[0124] 240: Fixed coupling means

[0125] 300: Elasticity

[0126] 400: Shuttle key

[0127] 410: First Support Division

[0128] 420: Second Support Division

[0129] 421: Inlet home

[0130] 430: Connection

[0131] 431: First connector

[0132] 432: Second connector

[0133] 440: Shuttle keyhole

[0134] 441: 1st Shuttle Keyhole

[0135] 442: Second Shuttle Keyhole

[0136] 443: Third Shuttle Keyhole

[0137] 500: Heating unit

[0138] 501: Integrated Hall

[0139] 600: Socket cover

[0140] 610: Insert hole

[0141] 620: Pusher guide hole

[0142] 630: Fixed hole

[0143] 710: Insert fixing means

[0144] 720: Floating guide section

[0145] 721: First floating guide section

[0146] 722: Second floating guide section

[0147] 723: Floating guide hole

[0148] 730: Anti-rotation part

[0149] 731: Exposure rotation prevention part

[0150] 732: Penetrating rotation prevention part

[0151] 733: Floating rotation prevention hole

[0152] 734: Housing rotation prevention hole

Claims

1. In a test socket for testing the electrical characteristics of the test object, A floating part on which the above test object is placed and which can be raised and lowered; An elastic member located at the bottom of the floating member; A fixed part that supports the floating part with the elastic part in between; A test socket including a shuttle key capable of supporting the floating part in a downward direction and supporting the fixed part in an upward direction.

2. In paragraph 1, The above shuttle key is, A test socket capable of switching between a first state in which the floating part is allowed to detach and a second state in which the floating part is prevented from detaching.

3. In paragraph 2, The above shuttle key is, A test socket capable of switching between the first state and the second state by rotating around a central axis.

4. In paragraph 1, The above shuttle key is, A first support member formed to extend in the first direction and support the floating member with the lower surface; A second support member extending in a second direction perpendicular to the first direction and supporting the fixed member with an upper surface; and A test socket, comprising a connecting portion connecting the first support portion and the second support portion.

5. In paragraph 4, A test socket further comprising a rotation prevention part that is provided in contact with at least a portion of the first support part and prevents rotation of the shuttle key.

6. In paragraph 1, The above fixed part, It includes a housing part constituting the upper part of the above fixed part and a base part constituting the lower part of the above fixed part, The floating part includes a first shuttle key hole formed to penetrate the floating part in the thickness direction and extend in a third direction, The housing part includes a second shuttle key hole formed to penetrate the housing part in the thickness direction and extend in a fourth direction perpendicular to the third direction, A test socket, wherein the base portion includes a third shuttle key hole penetrating the base portion in the thickness direction.

7. In paragraph 1, A test socket, wherein the floating portion includes a first shuttle key hole that penetrates the floating portion in the thickness direction and maintains the same diameter from the upper surface to the lower surface of the floating portion.

8. In paragraph 1, A test socket further comprising a heating member that generates heat between the upper and lower surfaces of the fixing member and transmits the heat to the fixing member.

9. In paragraph 8, The above heating part, A test socket comprising an integrated hole through which a plurality of electrically conductive pins positionable on the above-mentioned fixed portion pass.

10. In paragraph 1, Further comprising a socket cover covering the floating part and the fixed part; The above socket cover, A test socket comprising a fixing hole for fixing to a test board, a pusher guide hole for guiding the position of a pusher, and an insert hole for providing a space for the test object to be provided to the floating part.

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