High-speed electrical testing system applied to printed display panel

Abstract

Disclosed in the present invention is a high-speed electrical testing system applied to a printed display panel. The high-speed electrical testing system comprises a first substrate including a conductive layer, and a test probe array arranged opposite the conductive layer. An anode end, a light-emitting layer and a cathode end of each light-emitting pixel of the printed display panel form a sandwich layered structure. The test probe array at least comprises one test probe, and the test probe array and the conductive layer are separately electrically connected to a high-frequency alternating-current power supply module. The high-frequency alternating-current power supply module is used for supplying power to the test probe array and the conductive layer, such that a first alternating electric field is formed between the test probe array and the conductive layer, the first alternating electric field being used for enabling electroluminescence in the printed display panel. An electrical signal measurement module is arranged beside the conductive layer, and an optical signal measurement module is arranged on one side of the first substrate. The high-speed electrical testing system further comprises an electrically controlled displacement module. The present invention can improve the testing efficiency while preventing a printed display panel from being damaged during testing.

Description

A high-speed electrical detection system for printed display panels Technical Field

[0001] The present invention relates to the technical field of printed display panel testing, and in particular to a high-speed electrical detection system applied to printed display panels. Background Art

[0002] Quantum dot light-emitting diode (QLED) and organic light-emitting diode (OLED) technologies have emerged as hot topics in flat panel display research in recent years. Their application value in display applications has garnered widespread attention from researchers in related fields, and major display manufacturers have released numerous high-end electronic products, including displays and smartphones, based on these technologies. When QLED and OLED are used in array displays, screen components, or even semiconductor lighting, unsorted QLED and OLED pixels can produce unevenness due to the human eye's sensitivity to color wavelength and brightness, impacting visual quality. Both wavelength and brightness unevenness can cause user discomfort, a phenomenon undesirable to major display device manufacturers and unacceptable to the public. Therefore, QLED and OLED pixels must be inspected before being used in display devices. Current inspection methods often rely on probe testing, or contact testing. However, probe testing requires contact between the probe and the QLED or OLED electrodes, potentially damaging them. As the individual chips used in display devices shrink, the number of QLED and OLED pixels required in a display is increasing. However, probe testing cannot meet the efficiency requirements for inspecting large quantities of QLED and OLED pixels. Furthermore, after QLED and OLED panels are manufactured, if bad pixels are found during inspection, they must be removed using laser stripping. Repair can only be performed after all bad pixels have been removed. This traditional inspection method significantly increases the time and material costs of the inspection process. Technical issues

[0003] In view of some of the above-mentioned deficiencies in the prior art, the technical problem to be solved by the present invention is to provide a high-speed electrical inspection system for printed display panels, aiming to avoid damage to the printed display panels during inspection while improving inspection efficiency. Technical Solutions

[0004] To achieve the above objectives, the present invention provides a high-speed electrical inspection system for printed display panels, comprising: a first substrate including a conductive layer, and an array of inspection probes disposed opposite the conductive layer; wherein, during inspection of a printed display panel, the printed display panel is disposed between the first substrate and the array of inspection probes; and the anode terminal, light-emitting layer, and cathode terminal of the light-emitting pixels of the printed display panel are formed into a sandwich-like structure.

[0005] The detection probe array includes at least one detection probe, and the detection probe array and the conductive layer are respectively electrically connected to the high-frequency AC power supply module; the high-frequency AC power supply module is used to supply power to the detection probe array and the conductive layer so as to form a first alternating electric field between the detection probe array and the conductive layer, and the first alternating electric field is used to cause the printed display panel to electroluminesce; wherein, when the first direction in which the anode end of the luminous pixel points to the cathode end is the same as the electric field direction of the first alternating electric field, the printed display panel electroluminesces;

[0006] An electrical signal measurement module for collecting electrical signal information corresponding to the printed display panel is provided next to the conductive layer, and an optical signal measurement module for collecting luminous information corresponding to the printed display panel is provided on one side of the first substrate. The high-speed electrical detection system also includes an electrically controlled displacement module, which is used to carry and transport the first substrate or the detection probe array so that the detection probe array matches the position of the printed display panel during the detection process.

[0007] The high-speed electrical detection system is configured to: in response to the anode end of each of the luminous pixels in the printed display panel being located on the upper side of the cathode end, control the optical signal measurement module to collect the luminous information in the half-cycle corresponding to the downward electric field direction of the first alternating electric field; otherwise, control the optical signal measurement module to collect the luminous information in the half-cycle corresponding to the upward electric field direction of the first alternating electric field.

[0008] Optionally, the light-emitting pixels of the printed display panel include a deposited functional layer and the light-emitting layer, and the high-speed electrical detection system detects the printed display panel without evaporating metal electrodes.

[0009] Optionally, the light-emitting pixels of the printed display panel include a deposited functional layer and the light-emitting layer, the deposited functional layer includes an anode, and the high-speed electrical detection system detects the printed display panel without a cathode.

[0010] Optionally, the light-emitting pixels of the printed display panel include a deposited functional layer and the light-emitting layer, the deposited functional layer includes a cathode, and the high-speed electrical detection system detects the printed display panel without an anode.

[0011] Optionally, the distance between the detection probe array and the printed display panel during the detection process is maintained between 0.5 mm and 2 mm, and the supply voltage of the high-frequency AC power supply module is 4000V.

[0012] Optionally, the detection probe array includes a plurality of detection probes arranged in an array, each detection probe is provided with a corresponding detection switch and one detection probe corresponds to one luminous pixel; during the detection process, the detection probe array controls the detection switch so that adjacent detection probes start detection in different time periods.

[0013] Optionally, the electrically controlled displacement module is specifically configured to: after the printed display panel completes detection of the corresponding detection area, transport the first substrate or the detection probe array so that the next detection area corresponds to the first substrate or the detection probe array.

[0014] Optionally, the bottom area of ​​the detection probe is not less than the area of ​​a single luminous pixel of the first substrate to be detected, and the detection probe array detects at least one corresponding luminous pixel each time.

[0015] Optionally, the high-speed electrical detection system is in an anhydrous and oxygen-free environment.

[0016] Optionally, the detection probe is composed of a planar conductive substrate and a supporting structure thereof, and the area of ​​the planar conductive substrate is not less than the area of ​​a single luminous pixel of the first substrate to be detected. Beneficial effects

[0017] 1. The system of the present invention includes a first substrate including a conductive layer and a detection probe array arranged opposite to the conductive layer; the detection probe array includes at least one detection probe, and the detection probe array and the conductive layer are electrically connected to a high-frequency AC power supply module respectively; the high-frequency AC power supply module is used to supply power to the detection probe array and the conductive layer so as to form a first alternating electric field between the detection probe array and the conductive layer, and the first alternating electric field is used to cause the printed display panel to electroluminesce. The present invention guides the directional transport of carriers in the luminous pixels through the electric field, thereby detecting whether the luminous pixels are qualified by electroluminescence, thereby realizing contactless detection and avoiding the color loss caused by contact detection. At the same time, compared with the needle detection of the prior art, the present invention can detect multiple luminous pixels with one detection probe, which greatly improves the detection efficiency. The present invention has higher detection accuracy than optical microscopy detection and electroluminescence detection. 2. The high-speed electrical inspection system of the present invention is configured to: in response to the anode end of each luminescent pixel in the printed display panel being positioned above the cathode end, control the optical signal measurement module to collect luminescence information during the half-cycle corresponding to the downward direction of the first alternating electric field; otherwise, control the optical signal measurement module to collect luminescence information during the half-cycle corresponding to the upward direction of the first alternating electric field. By controlling the optical signal measurement module to collect luminescence information when the pixel is emitting light and not to collect luminescence information when it is not emitting light, the present invention effectively reduces energy waste caused by maintaining the acquisition state. Furthermore, by collecting optical signals at the correct luminescent pixel emission time, it is possible to troubleshoot luminescent pixels that erroneously emit light (a luminescent pixel that emits light at an incorrect time, which is a fault, is still mistakenly detected as qualified due to the fact that it emits light, effectively avoiding this situation). 3. The luminescent pixels of the printed display panel of the present invention include a deposited functional layer and a luminescent layer. The high-speed electrical inspection system inspects the printed display panel before metal electrodes are deposited. Inspecting the printed display panel when metal electrodes are required allows for the timely detection of faulty luminescent pixels, effectively reducing process and resource waste compared to troubleshooting errors after the pixels are fully manufactured. 4. The detection probe array of the present invention includes multiple detection probes arranged in an array, each equipped with a corresponding detection switch, with one detection probe corresponding to one luminescent pixel. During the detection process, the detection probe array controls the detection switches so that adjacent detection probes activate detection at different time periods. This invention enables adjacent luminescent pixels to emit light at different time periods, effectively avoiding interference caused by simultaneous illumination of adjacent luminescent pixels. This makes the optical signal measurement module more accurate and effectively improves the accuracy of detecting luminescent pixel failures.

[0018] In summary, the present invention can effectively avoid damage to the printed display panel during detection while improving detection efficiency and detection accuracy. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] FIG1 is a schematic structural diagram of a high-speed electrical detection system for a printed display panel provided in accordance with a specific embodiment of the present invention;

[0020] FIG2 is a schematic structural diagram of a detection probe array provided in a specific embodiment of the present invention;

[0021] FIG3 is a schematic diagram of a single detection probe provided by a specific embodiment of the present invention;

[0022] FIG4 is a schematic structural diagram of a detection probe provided in a specific embodiment of the present invention;

[0023] 5 is a schematic diagram of the system structure when the optical signal measurement module is below the first substrate according to a specific embodiment of the present invention;

[0024] FIG6 is a schematic diagram of the structure of a detection probe in which an optical signal measurement module is provided in a detection probe according to a specific embodiment of the present invention;

[0025] FIG7 is a schematic diagram of the system structure of an optical signal measurement module in a detection probe according to a specific embodiment of the present invention;

[0026] FIG8 is a schematic structural diagram of a detection probe provided in a specific embodiment of the present invention;

[0027] FIG9 is a schematic structural diagram of a detection probe array provided in a specific embodiment of the present invention;

[0028] FIG10 is a schematic diagram of the structure of an OLED provided in a specific embodiment of the present invention;

[0029] FIG11 is a schematic diagram of the three-dimensional structure of a high-speed electrical detection system applied to a printed display panel provided in a specific embodiment of the present invention. Best Mode for Carrying Out the Invention

[0030] The present invention discloses a high-speed electrical detection system for printed display panels. Those skilled in the art may refer to the contents of this document and appropriately improve the technical details. It is particularly important to note that all similar substitutions and modifications that are obvious to those skilled in the art are considered to be included in the present invention. The methods and applications of the present invention have been described through preferred embodiments. It is obvious that relevant personnel can modify or appropriately change and combine the methods and applications described herein without departing from the content, spirit, and scope of the present invention to implement and apply the technology of the present invention.

[0031] The applicant's research has revealed that existing needle testing for printed display panels requires the probe to contact the electrodes of QLEDs and OLEDs, potentially damaging them. As the size of individual chips used in display devices decreases, the number of QLED and OLED pixels required on a display increases. The efficiency of needle testing cannot meet the requirements for high-volume QLED and OLED pixel testing. While contactless testing can address some of these issues, the continuous acquisition of optical signals can reduce detection accuracy. Modes for Carrying Out the Invention

[0032] Therefore, an embodiment of the present invention provides a high-speed electrical inspection system for a printed display panel 1000. As shown in Figures 1 to 11, the high-speed electrical inspection system includes: a first substrate 200 including a conductive layer 300, and a detection probe array 400 disposed opposite the conductive layer 300. During inspection of the printed display panel 1000, the printed display panel 1000 is disposed between the first substrate 200 and the detection probe array 400. The anode terminal, light-emitting layer, and cathode terminal of the light-emitting pixels of the printed display panel 1000 are sandwich-layered structures.

[0033] The detection probe array 400 includes at least one detection probe 900. The detection probe array 400 and the conductive layer 300 are respectively electrically connected to a high-frequency AC power supply module 800. The high-frequency AC power supply module 800 is used to supply power to the detection probe array 400 and the conductive layer 300 to form a first alternating electric field between the detection probe array 400 and the conductive layer 300. The first alternating electric field is used to cause the printed display panel 1000 to electroluminesce. When the first direction of the anode end of the luminescent pixel pointing to the cathode end is the same as the electric field direction of the first alternating electric field, the printed display panel 1000 electroluminesces.

[0034] An electrical signal measurement module 700 is provided adjacent to the conductive layer 300 for collecting electrical signal information corresponding to the printed display panel 1000. An optical signal measurement module 600 is provided on one side of the first substrate 200 for collecting luminous information corresponding to the printed display panel 1000. The high-speed electrical inspection system also includes an electrically controlled displacement module 500, which is used to carry and transport the first substrate 200 or the inspection probe array 400 so that the positions of the inspection probe array 400 and the printed display panel 1000 are aligned during the inspection process.

[0035] The high-speed electrical detection system is configured as follows: in response to the anode end of each luminous pixel in the printed display panel 1000 being located on the upper side of the cathode end, the optical signal measurement module 600 is controlled to collect luminous information in the half-cycle corresponding to the downward electric field direction of the first alternating electric field; otherwise, the optical signal measurement module 600 is controlled to collect luminous information in the half-cycle corresponding to the upward electric field direction of the first alternating electric field.

[0036] It should be noted that the side of the light-emitting layer used for vapor deposition of the anode is called the anode side. The anode side includes both the state where the anode and the functional layers on this side are completely prepared and the state where the anode and the functional layers on this side are not completely prepared. The anode side refers only to the direction and does not mean that the anode is completely prepared. The side of the light-emitting layer used for vapor deposition of the cathode is called the cathode side. The cathode side includes both the state where the cathode and the functional layers on this side are completely prepared and the state where the cathode and the functional layers on this side are not completely prepared. The cathode side refers only to the direction and does not mean that the cathode is completely prepared.

[0037] A sandwich structure refers to a multilayer structure consisting of multiple layers of organic and inorganic materials, like a sandwich. For example, the structure of an OLED typically includes the following layers, as shown in Figure 10:

[0038] Anode: This is the top electrode of the OLED, typically a transparent material such as glass or a polymer.

[0039] Hole injection layer: This is a thin layer between the anode and the electron transport layer, responsible for injecting holes into the electron transport layer.

[0040] Light-emitting layer: This is the core part of OLED, which contains different light-emitting materials to produce different colors of light.

[0041] Electron transport layer: This is the intermediate layer that transports electrons and is responsible for transporting electrons to the light-emitting layer.

[0042] Electron injection layer: This is a thin layer between the light-emitting layer and the cathode, responsible for injecting electrons into the light-emitting layer.

[0043] Cathode: This is the bottom electrode of the OLED, usually a metal material.

[0044] These layers work together to enable OLEDs to emit light. When voltage is applied between the anode and cathode, holes and electrons are injected into the light-emitting layer, where they combine to form excitons, which release energy and emit light.

[0045] This embodiment of the present invention generates a first alternating electric field to drive the directional transport of carriers in the pixels of the printed display panel 1000, thereby generating electroluminescence. The system then collects both electrical and optical signal information from the printed display panel 1000 to determine whether each pixel is qualified. This non-contact testing method avoids damage to the printed display panel 1000 and improves testing efficiency.

[0046] In a specific embodiment, the high-speed electrical detection system further includes a system base 100 for supporting various components.

[0047] In one embodiment, the electrical signal measurement module 700 collects electrical signal information corresponding to the printed display panel 1000, and the optical signal measurement module 600 collects luminous information corresponding to the printed display panel 1000. The electrical signal information and luminous information are used to determine whether the tested luminous pixels are qualified. The luminous information includes brightness, wavelength, half-peak width, and image quality, while the electrical signal information includes current, voltage, and frequency.

[0048] In one embodiment, the light-emitting pixels of the printed display panel 1000 include deposited functional layers and light-emitting layers, and the high-speed electrical inspection system performs electrical inspection on the printed display panel 1000 without evaporating metal electrodes.

[0049] It should be noted that if a pixel is detected after it has been completely processed, a large amount of resources and processes will be wasted. This embodiment allows the detection of the pixel before the metal electrode is evaporated, thereby promptly detecting the fault and avoiding the subsequent evaporation of the metal electrode for the faulty pixel, which wastes resources and processes.

[0050] Furthermore, the light-emitting pixels of the printed display panel 1000 include a deposited functional layer and a light-emitting layer, and the deposited functional layer includes an anode. The high-speed electrical detection system can realize electrical detection of the printed display panel 1000 without a cathode.

[0051] Furthermore, the light-emitting pixels of the printed display panel 1000 include a deposited functional layer and a light-emitting layer, the deposited functional layer includes a cathode, and the high-speed electrical detection system realizes electrical detection of the printed display panel 1000 without the need for an anode.

[0052] In a specific embodiment, the distance between the detection probe array and the printed display panel during the detection process is maintained between 0.5 mm and 2 mm, and the supply voltage of the high-frequency AC power supply module is 4000 V. The generated field strength is 2000 V / mm-8000 V / mm.

[0053] It should be noted that providing sufficient voltage and maintaining a reasonable distance can generate an electric field sufficient to guide the directional transport of carriers in the light-emitting pixel.

[0054] In a specific embodiment, the detection probe array 400 includes a plurality of detection probes 900 arranged in an array, each detection probe 900 is provided with a corresponding detection switch and one detection probe 900 corresponds to one luminous pixel; during the detection process, the detection probe array 400 controls the detection switch so that adjacent detection probes 900 start detection at different time periods.

[0055] It should be noted that this embodiment can effectively prevent adjacent light-emitting pixels from interfering with each other during the detection process due to being too close to each other and emitting light at the same time, thereby affecting light information collection.

[0056] In a specific embodiment, the electric displacement module 500 is specifically used to: after the printed display panel 1000 completes the inspection of the corresponding inspection area, transport the first substrate 200 or the inspection probe array 400 so that the next inspection area corresponds to the first substrate 200 or the inspection probe array 400.

[0057] It should be noted that the printed display panel 1000 is often relatively large, and it is difficult to cover the entire luminous pixel area with one detection probe array 400 . Therefore, it is necessary to detect each luminous pixel one by one through the electrically controlled displacement module 500 .

[0058] In a specific embodiment, the bottom area of ​​the detection probe 900 is not less than the area of ​​a single luminous pixel of the first substrate 200 to be detected, and the detection probe array 400 detects at least one corresponding luminous pixel each time.

[0059] It should be noted that the bottom area of ​​the detection probe 900 is not less than the area of ​​a single luminous pixel of the first substrate 200 to be detected, which can effectively cover the luminous pixel and avoid missed detection and erroneous detection caused by incomplete coverage.

[0060] In one embodiment, the high-speed electrical detection system is in an oxygen-free environment.

[0061] It should be noted that the anhydrous oxygen environment can prevent the first alternating electric field from being affected by moisture in the air.

[0062] In a specific embodiment, the detection probe 900 is composed of a planar conductive substrate and a supporting structure thereof, and the area of ​​the planar conductive substrate is not less than the area of ​​a single light-emitting pixel of the first substrate 200 to be detected.

[0063] In a specific embodiment, a high-speed electrical detection system for printed display has the following steps: (1) placing the display panel to be tested on the upper surface of the conductive layer 300; (2) the detection probe array 400 and the first substrate 200 are driven by the electrically controlled displacement module 500 so that the detection probe array 400 maintains a certain distance from the printed display panel 1000 and couples the pixel array on the printed display panel 1000 with a maximum coupling area; (3) the high-frequency AC power supply module 800 applies a high-frequency electrical signal between the electrodes on the conductive layer 300 or the display panel to be tested and the detection probe array 400, so that multiple pixels coupled with the detection probe array 400 generate electroluminescence, and the optical signal measurement module records the light. The light emitting information of the detected pixels is recorded, and the electrical signal measurement module 700 records the electrical signals of the detected pixels; (4) the vertical distance between the detection probe array 400 and the display panel to be tested is kept unchanged by the electrically controlled displacement module 500, and the detection probe array 400 is ensured to be coupled with the printed display panel 1000 at the maximum coupling area, and then the detection probe array 400 is moved in a certain direction and kept coupled with the printed display panel 1000 until the detection probe array 400 moves to the adjacent undetected area, the light signal measurement module records the light emitting information of the detected pixels in the area to be detected, and the electrical signal measurement module 700 records the electrical signals of the detected pixels; (5) steps (3) and (4) are repeated until all pixels on the surface of the display panel to be tested are detected.

[0064] In one specific embodiment, the optical lens assembly and optical fiber (optical signal measurement module 600) used for optical signal measurement can be located within the detection probe array 400. The planar conductive substrate of the detection probe 900 has a transmittance of 30% to 90% in the visible light range. It should be noted that sufficient transmittance ensures that light information can be better collected, thereby increasing detection accuracy.

[0065] In a specific embodiment, the optical signal measurement module and the detection probe array 400 are respectively located on the same side of the display panel to be detected, or on different sides.

[0066] In a specific embodiment, the detection probe array 400 may be covered with a functional layer, and the functional layer may be a conductive material, a semiconductor material, an insulating material, or a composite structure thereof.

[0067] In a specific embodiment, the bottom surface of the detection probe 900 can be a regular shape such as a square, a rectangle, a circle, or any polygonal shape that can be coupled with multiple QLED or OLED pixels on the printed display panel 1000. The area range of the flat conductive substrate of the detection probe 900 is 1 μm. 2 Up to 50cm 2 .

[0068] During the inspection of QLED and OLED pixels:

[0069] The detection probe array 400 is parallel to the printed display panel 1000 and coupled with the printed display panel 1000 at a maximum coupling area, which can simultaneously cause multiple QLED and OLED pixels to generate electroluminescence.

[0070] Furthermore, the optical signal measurement module is required to be able to obtain specific data such as brightness, wavelength, and half-peak width of the QLED and OLED panels being tested; the electrical signal measurement module 700 is required to be able to obtain current and voltage data of the QLED and OLED panels being tested.

[0071] Furthermore, the outer surface of the planar conductive substrate of the detection probe 900 may be covered with a functional layer, and the functional layer may be a conductive material, a semiconductor material, or an insulating material.

[0072] Furthermore, the area of ​​the planar conductive substrate of the detection probe 900 is 1 μm 2 -50 cm 2 .

[0073] Furthermore, the area of ​​the pixel array inspected by the inspection probe array 400 during one inspection may be larger than the area of ​​the printed display panel 1000 , or smaller than the area of ​​the printed display panel 1000 .

[0074] Furthermore, the electrically controlled displacement module 500 is required to be able to selectively move and rotate the detection probe array 400 in a three-dimensional space.

[0075] Furthermore, the electrical signal applied by the high-frequency alternating current power supply module 800 between the conductive layer 300 and the detection probe array 400 is an alternating voltage.

[0076] Furthermore, the conductive layer 300 may be disposed on the upper surface of the substrate or on the lower surface of the substrate.

[0077] Furthermore, the QLED and OLED panels tested may include but are not limited to QLEDs and OLED panels arranged on a sapphire surface, QLEDs and OLED panels arranged on other transitional substrates, and QLEDs and OLED panels arranged on a driving backplane.

[0078] Furthermore, after the detection probe array 400 completes detection of a certain planarly distributed QLED or OLED pixel array, the high-frequency AC power supply module 800 can continue to supply power until all pixels on the surface of the printed display panel 1000 are detected; after the detection probe array 400 completes detection of a certain planarly distributed QLED or OLED pixel array, the high-frequency AC power supply module 800 can also interrupt power supply and resume power supply after the detection probe array 400 moves to another undetected area.

[0079] Furthermore, the bottom surface of the detection probe 900 may be a regular shape such as a square, a rectangle, a circle, or any other polygonal shape that can be coupled with multiple QLED or OLED pixels on the printed display panel 1000 .

[0080] In the embodiment of the present invention, the detection probe array 400 is driven by the electric-controlled displacement module 500 to couple with multiple QLED and OLED pixels on the surface of the printed display panel 1000 with a maximum coupling area. The QLED and OLED pixels can be detected simultaneously without the need for evaporation electrodes, thereby achieving the purpose of efficient detection.

[0081] In one embodiment, the shape of the detection probe 900 is not fixed and can be a regular geometric shape such as a cuboid (as shown in FIG. 2 ) or a cylinder (as shown in FIG. 9 ), or any irregular geometric shape that can couple with multiple QLED or OLED pixels on the printed display panel 1000. In this embodiment, a cuboid conductive material is preferably used as the detection probe 900.

[0082] During the test, the printed display panel 1000 is placed on the upper surface of the conductive layer 300, and the detection probe 900 is placed above the printed display panel 1000 at a certain distance. In this embodiment, the detection probe 900 preferably has a long side D, a wide side L, and a height H of 50 μm, 50 μm, and 100 μm, respectively (as shown in FIG3 ).

[0083] To ensure that each detection probe 900 can illuminate one or more QLED or OLED pixels, the detection probe 900 is composed of a planar conductive substrate 901 and its supporting structure 902, the bottom area of ​​which is not less than the area of ​​a single pixel of the printed display panel 1000 (as shown in FIG4 ).

[0084] The optical signal measurement module 600 is integrated with the detection probe 900. The optical signal measurement module can be placed inside the detection probe 900. In this case, the planar conductive substrate 901 of the detection probe 900 has a transmittance of 30% to 90% for visible light (as shown in FIG5 ).

[0085] The detection probe array 400 integrated with the optical signal measurement module 600 is disposed above the printed display panel 1000 to achieve the function of coupling with multiple pixels on the display panel to be tested and collecting optical signals (as shown in FIG6 ).

[0086] In one embodiment, the optical signal measurement module 600 and the detection probe 900 are not integrated. Instead, the optical signal measurement module 600 and the detection probe array 400 are positioned on either side of the printed display panel 1000, respectively implementing the functions of optical signal collection and coupling to multiple pixels on the display panel under test (as shown in FIG7 ).

[0087] In a specific embodiment, the detection probe 900 has a micro-nano structure 903 on the planar conductive substrate 901. The micro-nano structure 903 changes the electric field distribution between the detection probe 900 and the conductive layer 300 to obtain more accurate detection results (as shown in FIG8 ).

[0088] In a specific embodiment, the geometric shape of the detection probe 900 is set to be a cylinder (as shown in FIG9 ), and the cylindrical detection probe 900 should have the function of coupling with one or more QLED or OLED pixels on the printed display panel 1000 .

[0089] The system of the present embodiment includes a first substrate 200 including a conductive layer 300 and a detection probe array 400 disposed opposite the conductive layer 300. The detection probe array 400 includes at least one detection probe 900. The detection probe array 400 and the conductive layer 300 are each electrically connected to a high-frequency AC power supply module 800. The high-frequency AC power supply module 800 is configured to supply power to the detection probe array 400 and the conductive layer 300, thereby forming a first alternating electric field between the detection probe array 400 and the conductive layer 300. This first alternating electric field is used to induce electroluminescence in the printed display panel 1000. The present embodiment uses an electric field to guide the directional transport of charge carriers within the luminescent pixels, thereby detecting the conformity of the luminescent pixels through electroluminescence. This achieves contactless detection and avoids the color loss associated with contact testing. Furthermore, compared to conventional needle testing, the present embodiment can detect multiple luminescent pixels with a single detection probe 900, significantly improving detection efficiency. The present embodiment also offers higher detection accuracy than optical microscopy and electroluminescence testing.

[0090] The high-speed electrical detection system of an embodiment of the present invention is configured to: in response to the anode end of each luminescent pixel in the printed display panel 1000 being positioned above the cathode end, control the optical signal measurement module 600 to collect luminescent information during the half-cycle corresponding to the downward direction of the first alternating electric field; otherwise, control the optical signal measurement module 600 to collect luminescent information during the half-cycle corresponding to the upward direction of the first alternating electric field. By controlling the optical signal measurement module 600 to collect luminescent information when the pixel is emitting light and not to collect information when it is not emitting light, the embodiment of the present invention can effectively reduce the energy waste caused by maintaining the collection state. Furthermore, by collecting optical signals at the correct luminescent pixel emission time, it is possible to troubleshoot luminescent pixels that are erroneously emitting light (a luminescent pixel emitting light at an unsuitable time, which is a fault, but is still mistakenly detected as qualified because it is emitting light), effectively avoiding this situation.

[0091] The luminescent pixels of the printed display panel 1000 according to the embodiment of the present invention include deposited functional layers and a luminescent layer. A high-speed electrical testing system performs electrical testing on the printed display panel 1000 before metal electrodes are deposited. Electrical testing of the printed display panel 1000, even when metal electrodes are required, allows for the timely detection of faulty luminescent pixels. This significantly reduces process steps and resource waste, compared to troubleshooting errors after the pixels are fully manufactured.

[0092] The detection probe array 400 of this embodiment of the present invention includes multiple detection probes 900 arranged in an array. Each detection probe 900 is equipped with a corresponding detection switch, and each detection probe 900 corresponds to a light-emitting pixel. During the detection process, the detection probe array 400 controls the detection switches so that adjacent detection probes 900 are activated for detection at different time periods. This embodiment of the present invention enables adjacent light-emitting pixels to emit light at different time periods, effectively avoiding interference caused by simultaneous illumination of adjacent light-emitting pixels. This makes the detection of the optical signal measurement module 600 more accurate, effectively improving the accuracy of detecting light-emitting pixel failures.

[0093] In summary, the embodiments of the present invention can effectively avoid damage to the printed display panel 1000 during inspection while improving inspection efficiency and inspection accuracy.

[0094] It should be noted that, in this document, relational terms such as first and second, etc., are used only to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations. Moreover, the terms "comprises," "comprising," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or device comprising a series of elements includes not only those elements, but also other elements not explicitly listed, or elements inherent to such process, method, article, or device. In the absence of further limitations, an element defined by the phrase "comprising a ..." does not exclude the presence of other identical elements in the process, method, article, or device comprising the element.

[0095] Each embodiment in this specification is described in a related manner. Similar parts between the various embodiments can be referred to in conjunction with each other. Each embodiment focuses on the differences between the other embodiments. In particular, the system embodiment is generally similar to the method embodiment, so the description is relatively simple. For related parts, refer to the description of the method embodiment.

[0096] The above are only preferred embodiments of the present invention and are not intended to limit the scope of protection of the present invention. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principles of the present invention are included in the scope of protection of the present invention.

Claims

1. A high-speed electrical detection system for printed display panels, characterized in that: The high-speed electrical testing system includes: a first substrate including a conductive layer, and an array of testing probes disposed opposite the conductive layer; wherein, when testing a printed display panel, the printed display panel is disposed between the first substrate and the array of testing probes; and the anode terminal, the light-emitting layer, and the cathode terminal of the light-emitting pixel of the printed display panel are sandwich-layered structures; The detection probe array includes at least one detection probe, and the detection probe array and the conductive layer are respectively electrically connected to the high-frequency AC power supply module; the high-frequency AC power supply module is used to supply power to the detection probe array and the conductive layer so as to form a first alternating electric field between the detection probe array and the conductive layer, and the first alternating electric field is used to cause the printed display panel to electroluminesce; wherein, when the first direction in which the anode end of the luminous pixel points to the cathode end is the same as the electric field direction of the first alternating electric field, the printed display panel electroluminesces; An electrical signal measurement module for collecting electrical signal information corresponding to the printed display panel is provided next to the conductive layer, and an optical signal measurement module for collecting luminous information corresponding to the printed display panel is provided on one side of the first substrate. The high-speed electrical detection system also includes an electrically controlled displacement module, which is used to carry and transport the first substrate or the detection probe array so that the detection probe array matches the position of the printed display panel during the detection process. The high-speed electrical detection system is configured to: in response to the anode end of each of the luminous pixels in the printed display panel being located on the upper side of the cathode end, control the optical signal measurement module to collect the luminous information in the half-cycle corresponding to the downward electric field direction of the first alternating electric field; otherwise, control the optical signal measurement module to collect the luminous information in the half-cycle corresponding to the upward electric field direction of the first alternating electric field.

2. The high-speed electrical detection system for printed display panels according to claim 1, characterized in that: The light-emitting pixels of the printed display panel include a deposited functional layer and the light-emitting layer, and the high-speed electrical detection system detects the printed display panel without evaporating metal electrodes.

3. The high-speed electrical detection system for printed display panels according to claim 2, characterized in that: The light-emitting pixels of the printed display panel include a deposited functional layer and the light-emitting layer, the deposited functional layer includes an anode, and the high-speed electrical detection system detects the printed display panel without a cathode.

4. The high-speed electrical detection system for printed display panels according to claim 2, characterized in that: The light-emitting pixels of the printed display panel include a deposited functional layer and the light-emitting layer, the deposited functional layer includes a cathode, and the high-speed electrical detection system detects the printed display panel without an anode.

5. The high-speed electrical detection system for printed display panels according to claim 1, characterized in that: The distance between the detection probe array and the printed display panel is maintained between 0.5 mm and 2 mm during the detection process, and the supply voltage of the high-frequency alternating current power supply module is 4000V.

6. The high-speed electrical detection system for printed display panels according to claim 1, characterized in that: The detection probe array includes a plurality of detection probes arranged in an array, each of the detection probes is provided with a corresponding detection switch and one detection probe corresponds to one luminous pixel; during the detection process, the detection probe array controls the detection switches so that adjacent detection probes start detection in different time periods.

7. The high-speed electrical detection system for printed display panels according to claim 1, characterized in that: The electrically controlled displacement module is specifically configured to: after the printed display panel completes the inspection of the corresponding inspection area, transport the first substrate or the inspection probe array so that the next inspection area corresponds to the first substrate or the inspection probe array.

8. The high-speed electrical detection system for printed display panels according to claim 1, characterized in that: The bottom area of ​​the detection probe is not less than the area of ​​a single luminous pixel of the first substrate to be detected, and the detection probe array detects at least one corresponding luminous pixel each time.

9. The high-speed electrical detection system for printed display panels according to claim 1, characterized in that: The high-speed electrical detection system is in an environment free of water and oxygen.

10. The high-speed electrical detection system for printed display panels according to claim 1, characterized in that: The detection probe is composed of a planar conductive substrate and a supporting structure thereof, and the area of ​​the planar conductive substrate is not less than the area of ​​a single luminous pixel of the first substrate to be detected.

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