Optical measuring device

Abstract

The present invention relates to an optical measuring device. One embodiment of the present invention provides an optical measuring device comprising: a chamber unit having a first chamber for accommodating a sample and a second chamber for providing a space in which optical interference occurs on scattered light emitted from the first chamber; a light source unit for irradiating input light toward the chamber unit; a sensor unit for detecting speckles of output light emitted from the chamber unit; and a control unit for estimating information on target particles in the sample by using the detected speckles of the output light.

Description

optical measuring device

[0001] The present invention relates to an optical measuring device.

[0002] Humans coexist with a variety of living creatures. From visible to invisible, they coexist with us, directly and indirectly influencing us. Among these, microorganisms and other tiny creatures that affect human health are often invisible, yet they exist in our environment and cause various diseases.

[0003] To measure invisible microorganisms, traditional methods such as microbial culture, mass spectrometry, and unclear magnetic resonance (NMR) have been used. While these techniques can precisely measure specific types of bacteria, they require extensive preparation time for culturing the bacteria and require expensive, precise, and complex equipment.

[0004] Additionally, there are techniques that utilize optical techniques to measure microorganisms. For example, optical techniques such as Raman spectrometry and multispectral imaging utilize complex optical systems, requiring specialized knowledge and laboratory-level equipment to handle them. Furthermore, the lengthy measurement times hinder their general accessibility. In particular, optical techniques utilizing lasers pose a challenge: the wavelength of the laser can change due to external environmental factors, making accurate measurements difficult.

[0005] The above-described information disclosed in the background technology of this invention is only intended to improve understanding of the background of the present invention, and therefore may include information that does not constitute prior art.

[0006] The embodiments aim to provide an optical measuring device capable of precisely obtaining information about target particles included in a sample by using a light scattering effect or an optical interference effect.

[0007] The problems to be solved by the present invention are not limited to the problems mentioned above, and other problems and advantages of the present invention that are not mentioned can be understood through the following description and will be more clearly understood through embodiments of the present invention.

[0008] In addition, it will be appreciated that the problems and advantages to be solved by the present invention can be realized by the means and combinations thereof indicated in the patent claims.

[0009] An optical measurement device according to one embodiment of the present invention for solving the above technical problem may include a chamber unit having a first chamber for accommodating a sample and a second chamber for providing a space for optical interference of scattered light emitted from the first chamber, a light source unit for irradiating input light toward the chamber unit, a sensor unit for detecting speckle of output light output from the chamber unit, and a control unit for estimating information on target particles in the sample using the speckle of the detected output light.

[0010] According to another embodiment of the present invention for solving the above technical problem, an optical measuring device may include a light source unit that generates input light, a chamber unit that provides a space in which input light input from the light source unit can be multi-reflected or multi-scattered in multiple paths, a sensor unit that detects speckles of scattered light output from the chamber unit, a first polarizing unit that is disposed between the chamber unit and the light source unit and is disposed on an optical path of the input light, and a second polarizing unit that is disposed between the chamber unit and the sensor unit and is disposed on an optical path of the scattered light and has a polarizing axis that intersects the polarizing axis of the first polarizing unit.

[0011] According to embodiments, the optical measurement device has an effect in that the sensor unit can obtain high intensity light data by including a chamber portion that provides a space in which interference of light scattered by target particles occurs.

[0012] However, the effects that can be obtained through the present invention are not limited to the effects described above, and other technical effects that are not mentioned can be clearly understood by those skilled in the art from the description of the invention described below.

[0013] The following drawings attached to this specification illustrate preferred embodiments of the present invention, and together with the detailed description of the invention described below, serve to further understand the technical idea of ​​the present invention, and therefore, the present invention should not be interpreted as being limited to matters described in such drawings.

[0014] FIG. 1 is a schematic drawing of an optical measuring device according to one embodiment of the present invention.

[0015] FIG. 2 is a schematic drawing of an optical measuring device including a first light source and a second light source, according to one embodiment of the present invention.

[0016] FIG. 3 is a schematic diagram illustrating an optical measuring device including an optical distribution unit according to one embodiment of the present invention.

[0017] FIG. 4 is a schematic drawing of an optical measuring device including an angle adjustment unit according to one embodiment of the present invention.

[0018] FIG. 5 is a schematic diagram illustrating an optical measuring device including a polarizing unit according to one embodiment of the present invention.

[0019] FIG. 6 is a schematic diagram illustrating an optical measurement device including a magnetic field generating unit according to one embodiment of the present invention.

[0020] Figure 7 is a drawing for explaining the usage status of a control unit according to one embodiment of the present invention.

[0021] FIG. 8 is a schematic drawing of an optical measuring device according to another embodiment of the present invention.

[0022] An optical measurement device according to one embodiment of the present invention for solving the above technical problem may include a chamber unit having a first chamber for accommodating a sample and a second chamber for providing a space for optical interference of scattered light emitted from the first chamber, a light source unit for irradiating input light toward the chamber unit, a sensor unit for detecting speckle of output light output from the chamber unit, and a control unit for estimating information on target particles in the sample using the speckle of the detected output light.

[0023] In this embodiment, the chamber portion divides the interior of the first chamber and the interior of the second chamber, and may further include a partition portion through which scattered light can be transmitted.

[0024] In this embodiment, the input light irradiated from the light source unit includes first input light irradiated into the inside of the first chamber and second input light irradiated into the inside of the second chamber, the first input light and the target particle can collide inside the first chamber to generate scattered light, and the sensor unit can detect speckles of output light generated by optical interference between the scattered light and the second input light inside the second chamber.

[0025] In this embodiment, the apparatus further includes a light distribution unit that is arranged between the chamber unit and the light source unit and divides the input light irradiated from the light source unit into first input light and second input light, and the first input light and the second input light divided by the light distribution unit can have wavelengths within the same range.

[0026] In the present embodiment, an angle adjustment unit may be further included, which is disposed between the chamber unit and the light source unit and is capable of adjusting the angle of incidence of the first input light or the angle of incidence of the second input light to the chamber unit.

[0027] In the present embodiment, the sensor unit includes a first sensor disposed adjacent to the first chamber and detecting scattered light, and a second sensor disposed adjacent to the second chamber and measuring output light, and the luminous intensity of the output light obtained from the second sensor may be relatively greater than the luminous intensity of the scattered light obtained from the first sensor.

[0028] In the present embodiment, a polarizing unit may be further included, which is positioned on the optical path of the second input light and has a preset polarization axis.

[0029] According to another embodiment of the present invention for solving the above technical problem, an optical measuring device may include a light source unit that generates input light, a chamber unit that provides a space in which input light input from the light source unit can be multi-reflected or multi-scattered in multiple paths, a sensor unit that detects speckles of scattered light output from the chamber unit, a first polarizing unit that is disposed between the chamber unit and the light source unit and is disposed on an optical path of the input light, and a second polarizing unit that is disposed between the chamber unit and the sensor unit and is disposed on an optical path of the scattered light and has a polarizing axis that intersects the polarizing axis of the first polarizing unit.

[0030] In this embodiment, the polarization axis of the first polarization unit and the polarization axis of the second polarization unit may be perpendicular to each other.

[0031] In this embodiment, a driving unit capable of adjusting the polarization axis of the second polarization unit may be further included.

[0032] Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the attached drawings. Prior to this, terms or words used in this specification and claims should not be interpreted as limited to their typical or dictionary meanings, and should be interpreted with meanings and concepts that conform to the technical spirit of the present invention based on the principle that the inventor can appropriately define the concept of a term to best explain his or her own invention. Therefore, the embodiments described in this specification and the configurations illustrated in the drawings are only some of the most preferred embodiments of the present invention and do not represent all of the technical spirit of the present invention. Therefore, it should be understood that various equivalents and modified examples may exist as substitutes for them at the time of filing this application.

[0033] Additionally, when used herein, the terms "comprise", "include" and / or "comprising", "including" specify the presence of stated features, numbers, steps, operations, elements, elements and / or groups thereof, but do not preclude the presence or addition of one or more other features, numbers, operations, elements, elements and / or groups thereof.

[0034] Additionally, to facilitate understanding of the invention, the attached drawings are not drawn to scale and some components may be exaggerated in size. Furthermore, identical components may be assigned the same reference numbers in different embodiments.

[0035] The statement that two compared objects are "identical" means "substantially identical." Therefore, "substantially identical" may include deviations considered low in the art, such as deviations of less than 5%. Furthermore, uniformity of a parameter over a given region may imply uniformity on average.

[0036] Although terms like "first" and "second" are used to describe various components, these components are not limited by these terms. These terms are used merely to distinguish one component from another, and unless otherwise specified, a "first" component may also be a "second" component.

[0037] Throughout the specification, unless otherwise specifically stated, each element may be singular or plural.

[0038] Any configuration being placed “on top (or bottom)” of a component or “on top (or bottom)” of a component may mean not only that any configuration is placed in contact with the top (or bottom) of the component, but also that other configurations may be interposed between the component and any configuration placed on (or under) the component.

[0039] Additionally, when it is described that a component is “connected,” “coupled,” or “connected” to another component, it should be understood that the components may be directly connected or connected to one another, but that other components may also be “interposed” between the components, or that each component may be “connected,” “coupled,” or “connected” through another component. Furthermore, when it is said that a part is electrically coupled to another part, this includes not only cases where they are directly connected, but also cases where they are connected with another element in between.

[0040] When reference is made throughout the specification to “A and / or B,” this means A, B, or A and B, unless otherwise stated. In other words, “and / or” includes all or any combination of the listed items. When reference is made to “C through D,” this means C or more and D or less, unless otherwise stated.

[0041] The terminology used herein is for the purpose of describing embodiments of the present disclosure and is not intended to be limiting of the present disclosure.

[0042]

[0043] FIG. 1 is a schematic drawing of an optical measuring device according to one embodiment of the present invention.

[0044] Referring to FIG. 1, an optical measurement device (1) according to one embodiment of the present invention estimates information about target particles in a sample using speckles of light, and may include a chamber unit (100), a light source unit (200), and a sensor unit (300).

[0045] An optical measuring device (1) is a device that detects information about target particles, such as the presence or absence of target particles contained in a sample, using light. For example, the optical measuring device (1) can detect information about the size, shape, structure, etc. of target particles by detecting speckles of light scattered by interaction with target particles in a time series manner.

[0046] In this specification, a sample may include target particles to be detected and may be formed into a solution of a certain concentration using a solvent. The sample or target particles may be a chemical substance or a biological substance such as a microorganism.

[0047] Referring to FIG. 1, a chamber portion (100) according to one embodiment of the present invention accommodates a sample and may include a first chamber (110), a second chamber (120), and a partition portion (130).

[0048] The chamber (100) may be formed in the form of a polyhedron, sphere, ellipsoid, distorted sphere, distorted ellipsoid, cylinder, or inclined cylinder with a hollow interior, but is not necessarily limited thereto.

[0049] The first chamber (110) provides a space in which a sample is received, and the second chamber (120) can provide a space in which optical interference of scattered light (SL) emitted from the first chamber (110) occurs.

[0050] In this specification, the first chamber (110) and the second chamber (120) may be interpreted as different spaces partitioned by a partition wall (130) within the chamber portion (100), but are not limited thereto, and the first chamber (110) and the second chamber (120) may be interpreted as chambers formed as separate objects from each other.

[0051] An inlet (not shown in the drawing) may be formed on one side of the first chamber (110) through which input light (IL), specifically, first input light (IL1) irradiated from the light source unit (200), is input. The light source unit (200) may irradiate the first input light (IL1) into the interior of the first chamber (110) through the inlet located on one side of the first chamber (110), and the first input light (IL1) may collide with the inner surface of the first chamber (110) and target particles inside the first chamber (110) and be multi-reflected and multi-scattered.

[0052] In this specification, the area formed by the first chamber (110) is referred to as the 'first area', and the area formed by the second chamber (120) is referred to as the 'second area'.

[0053] In this specification, 'input light (IL)' means light irradiated from a light source unit (200) to a chamber unit (100), 'first input light (IL1)' means light irradiated from a light source unit (200) to a first chamber (110), and 'second input light (IL2)' means light irradiated from a light source unit (200) to a second chamber (120).

[0054] In one embodiment, a scattering layer may be applied to the inner surface of the first chamber (110). The scattering layer may include a scattering material, for example, the scattering layer may include hexagonal boron nitride (h-BN).

[0055] As an optional embodiment, the inner surface of the first chamber (110) may have a preset roughness, for example, the inner surface of the first chamber (110) may have a regular or irregular rough structure, thereby implementing a multiple scattering amplification function.

[0056] As an optional embodiment, a multi-scatterer (not shown in the drawing) that increases the optical path length of the first input light (IL1) may be placed inside the first chamber (110). The multi-scatterer may be placed on the optical path of the first input light (IL1), and the multi-scatterer may amplify the number of times the light source irradiated from the light source unit (200) to the first chamber (110) is multi-scattering, thereby increasing the optical path length of the first input light (IL1) inside the first chamber (110).

[0057] As a result, the first input light (IL1) irradiated from the light source (200) into the interior of the first chamber (110) can be effectively absorbed / reflected / scattered by the target particles in the first region, and through this, even if a small amount of target particles exists in the sample, sufficient scattered light (SL) or speckle of the scattered light (SL) can be output.

[0058] An outlet (not shown in the drawing) may be formed on one side of the first chamber (110) facing the sensor unit (300), and scattered light (SL) output from the first chamber (110) may be emitted to the outside of the chamber unit (100) through the outlet.

[0059] In this specification, 'scattered light (SL)' can be interpreted as light or light speckles scattered by target particles or the inner surface of the first chamber (110) among the first input light (IL1) irradiated to the first chamber (110), and the control unit (800) can use the speckles of the scattered light (SL) to infer / detect information about the presence, type, shape, size, etc. of target particles.

[0060] The sensor unit (300), specifically the first sensor (310), can detect scattered light (SL) output from the exit of the first chamber (110). However, the present invention is not limited thereto, and the first sensor (310) can also detect the first input light (IL1) that is not scattered in the first chamber (110) or the speckle of the first input light (IL1).

[0061] This has the effect that the control unit (800) can detect information about target particles included in the sample by receiving speckle information of scattered light (SL) and first input light (IL1) from the first sensor (310). The scattered light (SL) scattered inside the first chamber (110) can be output to the second chamber (120) through the partition wall (130).

[0062] An opening connecting the first chamber (110) and the second chamber (120) may be formed in the partition wall (130). Scattered light (SL) inside the first chamber (110) may be output to the second chamber (120) through the opening, and the scattered light (SL) output to the second chamber (120) and the second input light (IL2) irradiated to the second chamber (120) may cause optical interference in the second region, thereby generating output light (OL) in which the intensity of the scattered light (SL) is amplified.

[0063] In this specification, 'output light (OL)' can be interpreted as light or speckle of light generated by optical interference between the second input light (IL2) and scattered light (SL), and the control unit (800) can use the speckle of the output light (OL) to infer / detect information about the presence, type, shape, size, etc. of target particles.

[0064] Referring to FIG. 1, a second chamber (120) according to one embodiment of the present invention provides a space in which optical interference of scattered light (SL) emitted from the first chamber (110) occurs, and may be placed adjacent to the first chamber (110).

[0065] An inlet (not shown in the drawing) may be formed on one side of the second chamber (120) through which input light (IL), specifically, second input light (IL2) irradiated from the light source unit (200), is input. The light source unit (200) can irradiate the second input light (IL2) into the interior of the second chamber (120) through the inlet located on one side of the second chamber (120), and the second input light (IL2) may collide with the inner surface of the second chamber (120) in the second region and be multi-reflected and multi-scattered, and the multi-reflected and multi-scattered second input light (IL2) may cause optical interference with scattered light (SL) emitted from the first chamber (110) through the partition wall unit (130).

[0066] In one embodiment, the inner surface of the second chamber (120) may be formed of various shapes or materials to maximize or precisely control the interference between the scattered light (SL) and the second input light (IL2).

[0067] For example, the inner surface of the second chamber (120) may be formed of a CSMS (web) structure, a Chiral Sculptured Thin Films structure (CSTFs), a Photonic Crystal Structure, a Honeycomb Structure, an Isotropic and Anisotropic Structure, a Metamaterial Structure, a Polarization Maintaining Fiber, etc.

[0068] As an optional embodiment, a scattering layer may be applied to the inner surface of the second chamber (120). The scattering layer may include a scattering material, for example, the scattering layer may include hexagonal boron nitride (h-BN).

[0069] As an optional embodiment, the inner surface of the second chamber (120) may have a preset roughness, for example, the inner surface of the second chamber (120) may have a regular or irregular rough structure, thereby implementing a multiple scattering amplification function.

[0070] As an optional embodiment, a multi-scatterer may be placed inside the second chamber (120) to increase the optical path length of the second input light (IL2). The multi-scatterer may be placed on the optical path of the second input light (IL2), and the multi-scatterer may amplify the number of times the light source irradiated from the light source unit (200) to the second chamber (120) is multi-scattering, thereby increasing the optical path length of the scattered light (SL) to the second input light (IL2) inside the second chamber (120).

[0071] As a result, the scattered light (SL) emitted from the first chamber (110) may cause optical interference with the second input light (IL2) inside the second chamber (120), thereby generating output light (OL), and the output light (OL) with increased brightness, sensitivity, etc. compared to the scattered light (SL) may be emitted toward the second sensor (320) through one side of the second chamber (120), so that the second sensor (320) may obtain the scattered light (SL) with increased sensitivity, specifically, the output light (OL), and the control unit (800) may effectively detect optical information / speckle containing information about the target particle.

[0072] An outlet (not shown in the drawing) may be formed on one side of the second chamber (120) facing the sensor unit (300), specifically the second sensor (320), and the output light (OL) output from the second chamber (120) may be emitted to the outside of the chamber unit (100) through the outlet. Through this, the second sensor (320) may obtain the output light (OL) output from the second chamber (120) or the speckle of the output light (OL), thereby allowing the control unit (800) to estimate information about the target particle.

[0073] Referring to FIG. 1, a partition wall (130) according to one embodiment of the present invention partitions the interior of the first chamber (110) and the interior of the second chamber (120), and can be placed between the first chamber (110) and the second chamber (120).

[0074] In one embodiment, the bulkhead (130) may be formed of a material with low light transmittance, and an opening (not shown in the drawing) may be formed on one side. Through this, scattered light (SL) generated in the first chamber (110) may enter the second chamber (120) through the opening.

[0075] In an optional embodiment, the partition wall (130) may be made of a material that allows light to pass through, and scattered light (SL) generated in the first chamber (110) may pass through the partition wall (130) and enter the second chamber (120). Through this, the scattered light (SL) that passes through the partition wall (130) and enters the second chamber (120) may cause optical interference with the second input light (IL2) irradiated into the second chamber (120), and output light (OL) may be generated inside the second chamber (120).

[0076] The partition wall (130) may be formed in the shape of a wall or plate that divides the first chamber (110) and the second chamber (120), but is not limited thereto, and the partition wall (130) may be formed in the shape of a passage or pipe that connects the first region and the second region.

[0077] Referring to FIG. 1, a light source unit (200) according to one embodiment of the present invention irradiates input light (IL) toward a chamber unit (100) and may be a laser source of an optical measurement device (1).

[0078] The light source unit (200) can irradiate monochromatic or multi-colored input light (IL). For example, the light source unit (200) may be formed of a source device that generates monochromatic light, such as a gas laser, a semiconductor laser, or a laser diode, or the light source unit (200) may be a device that can generate multi-colored input light (IL), such as a halogen lamp, a xenon lamp, or a white light-emitting diode.

[0079] In one embodiment, the light source unit (200) can generate input light (IL) of different wavelengths. For example, the light source unit (200) can include a plurality of optical filters that pass different wavelengths.

[0080] The light source unit (200) can irradiate the first input light (IL1) to the first chamber (110), and specifically, the light source unit (200) can irradiate the first input light (IL1) to the first area through an opening formed on one side of the first chamber (110).

[0081] In addition, the light source unit (200) can irradiate the second input light (IL2) to the second chamber (120), and specifically, the light source unit (200) can irradiate the second input light (IL2) to the second area through an opening formed on one side of the second chamber (120).

[0082] Referring to FIG. 1, a sensor unit (300) according to one embodiment of the present invention detects speckles of output light (OL) output from a chamber unit (100), and may include a first sensor (310) and a second sensor (320).

[0083] In one embodiment, the first sensor (310) is positioned on a path through which speckles of scattered light (SL) are output, and can detect speckles of scattered light (SL) in time series.

[0084] When the light source unit (200) irradiates input light (IL) in the visible light range, the first sensor (310) may be a CCD camera, which is a photographing device that takes images, and the first sensor (310) can acquire multiple images by taking pictures of speckles of scattered light (SL) in time series.

[0085] The first sensor (310) can detect a first image regarding a speckle of scattered light (SL) at least at a first time point, and capture a second image regarding a speckle of scattered light (SL) at a second time point and provide the captured image to the control unit (800). Meanwhile, the first time point and the second time point are only examples selected for convenience of explanation, and the first sensor (310) can capture multiple images at multiple time points more than the first time point and the second time point.

[0086] However, it is not limited thereto, and the first sensor (310) may be implemented as various types of image sensors capable of detecting scattered light (SL) or a speckle image of scattered light (SL).

[0087] The first sensor (310) may be positioned adjacent to the first chamber (110). For example, the first sensor (310) may be positioned on an area opposite to the second chamber (120) with respect to the first chamber (110), and may detect speckles of scattered light (SL) emitted from the opening of the first chamber (110).

[0088] In one embodiment, the second sensor (320) is positioned on a path along which speckles of the output light (OL) are output, and can detect speckles of the output light (OL) in time series.

[0089] When the light source unit (200) irradiates input light (IL) in the visible light range, the second sensor (320) may be a CCD camera, which is a photographing device that takes images, and the second sensor (320) can acquire multiple images by taking pictures of speckles of the output light (OL) in time series.

[0090] The second sensor (320) can detect a first image regarding the speckle of the output light (OL) at least at a first time point, and capture a second image regarding the speckle of the output light (OL) at a second time point and provide the captured image to the control unit (800). Meanwhile, the first time point and the second time point are only examples selected for convenience of explanation, and the second sensor (320) can capture multiple images at multiple time points more than the first time point and the second time point.

[0091] However, it is not limited thereto, and the second sensor (320) may be implemented as various types of image sensors capable of detecting output light (OL) or a speckle image of the output light (OL).

[0092] The second sensor (320) may be positioned closer to the second chamber (120) than the first sensor (310). For example, the second sensor (320) may be positioned on an area opposite to the first chamber (110) with respect to the second chamber (120), and may detect speckles of the output light (OL) emitted from the opening of the second chamber (120).

[0093]

[0094] FIG. 2 is a schematic drawing of an optical measuring device including a first light source and a second light source, according to one embodiment of the present invention.

[0095] Referring to FIG. 2, the light source unit (200) of the optical measurement device (1) according to one embodiment of the present invention may include a first light source (210) and a second light source (220).

[0096] The first light source (210) and the second light source (220) may be optical devices formed of stars, and the first light source (210) may irradiate the first input light (IL1) to the first chamber (110), and the second light source (220) may irradiate the second input light (IL2) to the second chamber (120).

[0097] The first light source (210) may be positioned closer to the first chamber (110) than the second light source (220). For example, the first light source (210) may be positioned to face the outer surface of the first chamber (110), and the first light source (210) may irradiate the first input light (IL1) to the first region through an inlet formed on one side of the first chamber (110).

[0098] The second light source (220) can be placed closer to the second chamber (120) than the first light source (210), and the second light source (220) can irradiate the second input light (IL2) to the second region through an inlet formed on one side of the second chamber (120).

[0099] At least one of the first light source (210) and the second light source (220) can irradiate a monochromatic or multi-colored input light (IL). For example, at least one of the first light source (210) and the second light source (220) may be formed of a source device that generates monochromatic light, such as a gas laser, a semiconductor laser, or a laser diode, or at least one of the first light source (210) and the second light source (220) may be a device that can generate multi-colored input light (IL), such as a halogen lamp, a xenon lamp, or a white light emitting diode.

[0100] In one embodiment, the first light source (210) and the second light source (220) may generate input light (IL) of different wavelengths. For example, the first light source (210) and the second light source (220) may each include optical filters that allow different wavelengths to pass through them.

[0101] The positions and postures of the first light source (210) and the second light source (220) can be independently controlled, and by controlling the positions and postures of the first light source (210) and the second light source (220), depending on the type of target particle, the type of input light (IL), the size of the chamber part (100), etc., the intensity and incident angle of the first input light (IL1) irradiated to the first region, and the intensity and incident angle of the second input light (IL2) irradiated to the second region can be controlled, respectively.

[0102] The position and posture of the first light source (210) and the second light source (220) can be interpreted as the distance between the first light source (210) and the second light source (220) and the chamber part (100) or the angle formed by the first light source (210) and the second light source (220) and the chamber part (100).

[0103]

[0104] FIG. 3 is a schematic drawing of an optical measurement device (1) including an optical distribution unit according to one embodiment of the present invention.

[0105] Referring to FIG. 3, an optical measurement device (1) according to one embodiment of the present invention may include a light distribution unit (400).

[0106] The light distribution unit (400) according to one embodiment of the present invention is configured to split the first input light (IL1) and the second input light (IL2) irradiated from the light source unit (200), and may include a splitter (410) and a mirror unit (420).

[0107] Referring to FIG. 3, the light distribution unit (400) is placed between the light source unit (200) and the chamber unit (100), and can be placed on the optical path of the input light (IL).

[0108] The optical distribution unit (400) may be composed of various devices that receive input light (IL) from the light source unit (200) and split it into first input light (IL1) and second input light (IL2). For example, the optical distribution unit (400) may be composed of a beam splitter, a prism coupler, a wavelength division multiplexer (WDM), a fiber coupler, a dichroic mirror, etc.

[0109] The light distribution unit (400) can receive power from the outside and its position and angle can be adjusted, through which the brightness of each of the first input light (IL1) and the second input light (IL2), and the irradiation direction of the first input light (IL1) and the irradiation direction of the second input light (IL2) can be adjusted.

[0110] At this time, the optical distribution unit (400) provides the same optical conditions by dividing the input light (IL) into the first input light (IL1) and the second input light (IL2) or changing the optical path, so the properties of the first input light (IL1) and the second input light (IL2) are the same.

[0111] Therefore, the first input light (IL1) can be used as incident light to generate a speckle of scattered light (SL) containing information of the target particle, and the second input light (IL2) can be used as interference-induced light to amplify the scattered light (SL).

[0112] For example, the wavelengths of the first input light (IL1) and the second input light (IL2) split by the optical distribution unit (400) are in the same range, and thus, the scattered light (SL) generated when the first input light (IL1) is scattered by the target particle in the first region can also be in the same wavelength range as the second input light (IL2). This has the effect of allowing optical interference between the second input light (IL2) and the scattered light (SL) in the same wavelength range in the second region to occur more actively.

[0113] A splitter (410) is placed on the optical path of the input light (IL) and can split the input light (IL) into a first input light (IL1) and a second input light (IL2).

[0114] The splitter (410) may be composed of various devices capable of splitting one light beam into two light beams, and for example, the splitter (410) may be composed of a plate beam splitter, a cube beam splitter, a polarizing beam splitter (PBS), a dichroic beam splitter, a non-polarizing beam splitter (NPBS), a variable beam splitter, a hybrid beam splitter, etc.

[0115] The splitter (410) can be powered from the outside to adjust its position or angle, thereby controlling the direction in which the first input light (IL1) or the second input light (IL2) reflected by or passing through the splitter (410) is irradiated to the chamber section (100).

[0116] The mirror may be formed as a device that changes the optical path of the first input light (IL1) or the second input light (IL2), and for example, the mirror unit (420) may be formed as a micro electromechanical system (MEMS) mirror, a digital micromirror device (DMD), a beam reflector, etc.

[0117] The mirror unit (420) can receive power from the outside and adjust the angle it forms with the chamber unit (100), and through this, the light irradiation path of the first input light (IL1) or the second input light (IL2) whose light path is controlled by the mirror unit (420) can be adjusted.

[0118]

[0119] FIG. 4 is a schematic drawing of an optical measuring device (1) including an angle adjustment unit according to one embodiment of the present invention.

[0120] Referring to FIG. 4, an optical measurement device (1) according to one embodiment of the present invention may include an angle adjustment unit (500) that adjusts the light irradiation path of at least one of the first input light (IL1) and the second input light (IL2).

[0121] An angle adjustment unit (500) according to one embodiment of the present invention is arranged between a light source unit (200) and a chamber unit (100) and is capable of adjusting an incident angle (θ1, θ2) of input light (IL) to the chamber unit (100), and may include a first angle adjustment unit (510) and a second angle adjustment unit (520).

[0122] The first angle adjustment unit (510) can receive the first input light (IL1) from the light source unit (200) and adjust the incident angle (θ1) of the first input light (IL1) irradiated to the first region, and the second angle adjustment unit (520) can receive the second input light (IL2) from the light source unit (200) and adjust the incident angle (θ2) of the second input light (IL2) irradiated to the second region.

[0123] Accordingly, by adjusting the incident angle (θ1) of the first input light (IL1) irradiated to the first region by the first angle adjustment unit (510), the number of multiple reflections, the number of multiple scatterings, etc. of the first input light (IL1) by the target particles in the first region can be adjusted, so that the user can appropriately control the operation of the first angle adjustment unit (510) according to the type of sample received in the first region, the type of input light (IL), etc.

[0124] The second angle adjustment unit (520) adjusts the incident angle (θ2) of the second input light (IL2) irradiated to the second region, thereby adjusting the number of multiple reflections of the second input light (IL2) in the second region, the number of multiple scatterings, and the degree of constructive interference between the scattered light (SL) and the second input light (IL2). Through this, the user can appropriately control the operation of the first angle adjustment unit (510) according to the type of sample accommodated in the first region, the type of input light (IL), the size of the incident angle (θ1) of the first input light (IL1), etc., and thereby appropriately detect the speckle of the output light (OL).

[0125] In one embodiment, the angle adjustment unit (500), specifically, the first angle adjustment unit (510) and the second angle adjustment unit (520), may be configured with various devices capable of adjusting the light path, and for example, the angle adjustment unit (500) may be configured with a galvanometer mirror, a piezoelectric tilt mirror, a micro-electro-mechanical systems mirror (MEMS mirror), a motorized stage, a rotary stage, a goniometer, a tilting optic, an electro-optic deflector, an acusto-optic deflector, a parallel kinematic machine (PKM), etc.

[0126]

[0127] FIG. 5 is a schematic drawing of an optical measuring device (1) including a polarizing unit according to one embodiment of the present invention.

[0128] Referring to FIG. 5, an optical measurement device (1) according to one embodiment of the present invention may include a polarizing unit (600) disposed on an optical path of a second input light (IL2) and having a preset polarization axis.

[0129] A polarizing unit (600) according to one embodiment of the present invention may include a first polarizing unit (610) disposed between a light source unit (200) and a chamber unit (100) and a second polarizing unit (620) disposed between the chamber unit (100) and a sensor unit (300).

[0130] The first polarizing unit (610) is placed on the light path of the second input light (IL2) irradiated from the light source (200) to the second chamber (120), and the second input light (IL2) can be polarized along the polarization axis of the first polarizing unit (610) and irradiated to the second chamber (120).

[0131] In one embodiment, the polarization axis of the first polarization unit (610) and the polarization axis of the second polarization unit (620) may be perpendicular to each other.

[0132] A portion of the second input light (IL2) irradiated into the second region can be multi-reflected and multi-scattered without interfering with the scattered light (SL) and while maintaining its original properties, and the second input light (IL2) maintaining its original properties can be emitted to the outside of the second chamber (120) and acquired by the second sensor (320).

[0133] In embodiments of the present invention, the second sensor (320) detects information on a target particle by obtaining output light (OL) generated by interference between the second input light (IL2) and scattered light (SL), and therefore it is required to prevent the second input light (IL2) that is not interfered and maintains its original properties from being emitted to the second sensor (320).

[0134] In contrast, when the second input light (IL2) polarized by the first polarizing unit (610) and irradiated to the second region interferes with the scattered light (SL) to generate output light (OL), the second input light (IL2) converted into output light (OL) loses its original property of being polarized by the first polarizing unit (610).

[0135] The second polarizing unit (620) is disposed between the second chamber (120) and the second sensor (320), and is disposed on the optical path of the output light (OL), and the polarization axis of the second polarizing unit (620) can be perpendicular or nearly perpendicular to the polarization axis of the first polarizing unit (610).

[0136] In this case, the second input light (IL2) polarized by the first polarization unit (610) while maintaining its original properties and the output light (OL) that has lost its polarization properties are both emitted toward the second sensor (320) through the exit of the second chamber (120), but the second input light (IL2) emitted without interference with the scattered light (SL) is still polarized by the first polarization unit (610), and therefore may not pass through the second polarization unit (620) having a polarization axis perpendicular to the polarization axis of the first polarization unit (610) and may not reach the second sensor (320). In contrast, the output light (OL) that is not polarized in one direction due to interference with the scattered light (SL) may pass through the second polarization unit (620) and reach the second sensor (320).

[0137] Accordingly, the second polarization unit (620) has the effect of reducing noise in data acquired by the control unit (800) by alleviating / preventing the phenomenon of uninterrupted light reaching the second sensor (320) and selectively passing only the output light (OL) necessary for detecting information on target particles to the second sensor (320), thereby enabling precise detection / estimation of information on target particles.

[0138]

[0139] FIG. 6 is a schematic drawing of an optical measurement device (1) including a magnetic field generating unit according to one embodiment of the present invention.

[0140] An optical measurement device (1) according to one embodiment of the present invention may include a magnetic field generating unit (700).

[0141] In one embodiment, the target particle may be a fluorescent material, such as a microorganism, that absorbs light of a certain wavelength and emits light of a different wavelength.

[0142] The light source unit (200) can irradiate the first input light (IL1) of a preset wavelength to the first chamber (110). In this case, the first input light (IL1) can be light such as visible light, ultraviolet light, infrared light, or electron beam corresponding to the fluorescence characteristics of the target particle, and the target particle can absorb the first input light (IL1) and emit excitation light (SL).

[0143] The sensor unit (300) may include a detection means corresponding to the first input light (IL1) or the fluorescence characteristics of the target particle. For example, when the light source unit (200) uses a laser in the visible light wavelength band, the sensor unit (300) may use a CCD camera, which is a photographing device that takes images, and when the sensor unit (300) uses a laser in the light wavelength band suitable for the fluorescent material, the sensor unit (300) may use a fluorescence detector.

[0144] Referring to FIG. 6, a magnetic field generating unit (700) according to one embodiment of the present invention is arranged to face one side of the first chamber (110) and can apply a magnetic force to target particles accommodated inside the first chamber (110).

[0145] The magnetic field generating unit (700) may be composed of various devices capable of applying a magnetic force to the inside of a sample or a first region including target particles, and for example, the magnetic field generating unit (700) may be composed of a permanent magnet, an electromagnet, a superconducting electromagnet, a Helmholtz coil, a solenoid, a magnetic stirrer, a magnetic trap, neodymium, etc.

[0146] Accordingly, the magnetic field generating unit (700) can maximize the size of the excitation light (SL) emitted from the target particle by changing the magnetic field applied to the first region.

[0147] The target particles accommodated in the first chamber (110) can emit excitation light (SL) when illuminated by the first light source (210), and the excitation light (SL) can be emitted into the second chamber (120) through the partition wall (130).

[0148] The light source unit (200) can irradiate the second input light (IL2) to the second chamber (120), and the excitation light (SL) emitted from the first chamber (110) and the second input light (IL2) cause optical interference in the second region. Speckles of the output light (OL) that change in time series can be generated by the optical interference of the excitation light (SL) and the second input light (IL2), and the sensor unit (300) can detect information about the target particle by detecting the speckles of the output light (OL).

[0149]

[0150] Figure 7 is a drawing for explaining the usage status of a control unit according to one embodiment of the present invention.

[0151] Referring to FIG. 7, an optical measurement device (1) according to one embodiment of the present invention may include a control unit (800) that estimates information about target particles in a sample by using a speckle of output light (OL) detected by a sensor unit (300).

[0152] The control unit (800) can acquire speckle images of light detected by the sensor unit (300) in a time series manner.

[0153] For example, the control unit (800) can acquire a speckle image of the first input light (IL1) or a speckle image of the scattered light (SL) in a time series manner from the first sensor (310), and the control unit (800) can acquire a speckle image of the second input light (IL2) or a speckle image of the output light (OL) in a time series manner from the second sensor (320).

[0154] The control unit (800) can acquire speckle images of light detected from the sensor unit (300) in a time series manner to estimate / acquire information about whether a target particle exists in a sample accommodated inside the first chamber (110) or about the target particle.

[0155] Referring to FIGS. 1 and 7, the control unit (800) can control the operation of the light source unit (200). For example, the control unit (800) can control the operation of the light source unit (200) so that the brightness, irradiation direction, wavelength, frequency, etc. of the input light (IL) irradiated from the light source unit (200) are adjusted according to a user's command or an image of a light speckle detected by the sensor unit (300).

[0156] Referring to FIGS. 3 and 7, the control unit (800) can control the operation of the light distribution unit (400). For example, the control unit (800) can control the operation of the light distribution unit (400) according to a user's command or an image of a light speckle detected by the sensor unit (300), thereby adjusting the brightness, irradiation direction, etc. of each of the first input light (IL1) and the second input light (IL2), thereby adjusting the degree of light scattering / reflection / interference occurring inside the chamber unit (100).

[0157] Referring to FIGS. 4 and 7, the control unit (800) can control the operation of the angle adjustment unit (500). For example, the control unit (800) can control the operation of the first angle adjustment unit (510) or the second angle adjustment unit (520) according to a user's command or an image of a light speckle detected by the sensor unit (300), thereby adjusting the brightness, irradiation direction, etc. of each of the first input light (IL1) and the second input light (IL2), thereby adjusting the degree of light scattering / reflection / interference occurring inside the chamber unit (100).

[0158] Referring to FIGS. 5 and 7, the control unit (800) can control the operation of the polarizing unit (600). For example, the control unit (800) can control the type of light acquired from the second sensor (320) by adjusting the position, posture, or polarization axis of the first polarizing unit (610) or the second polarizing unit (620) according to a user's command or an image of a light speckle detected by the sensor unit (300), thereby effectively reducing noise of the speckle of the light detected by the second sensor (320).

[0159] Referring to FIGS. 6 and 7, the control unit (800) can control the operation of the magnetic field generating unit (700) to appropriately change the size of the magnetic field applied to the first region. This has the effect of amplifying the size of the excitation light (SL) due to the change in the magnetic field, or appropriately detecting the speckle of the output light (OL) caused by the excitation light (SL).

[0160]

[0161] FIG. 8 is a schematic drawing of an optical measuring device according to another embodiment of the present invention.

[0162] Referring to FIG. 8, an optical measurement device (1`) according to another embodiment of the present invention may include a chamber unit (100`), a light source unit (200`), a sensor unit (300`), and a polarizing unit (600`).

[0163] The light source unit (200`) and the sensor unit (300`) of the optical measurement device (1`) according to another embodiment of the present invention have the same operating principles and effects as the light source unit (200) and the sensor unit (300) of the optical measurement device (1) according to one embodiment of the present invention, so redundant descriptions are omitted.

[0164] Referring to FIG. 8, a chamber unit (100`) according to another embodiment of the present invention can provide a space in which input light (IL) input from a light source unit (200`) can be multi-reflected or multi-scattered in multiple paths.

[0165] An entrance through which input light (IL) can pass may be formed on one side of the chamber portion (100`) facing the light source portion (200`), and an exit through which output light (OL) or input light (IL) can be emitted to the outside may be formed on one side of the chamber portion (100`) facing the sensor portion (300`).

[0166] Target particles can be accommodated inside the chamber part (100`), and input light (IL) irradiated into the inside of the chamber part (100`) can be multi-scattered and multi-reflected when colliding with the inner surface of the chamber part (100`) or target particles, thereby generating scattered light (SL) or scattered light (SL) speckles.

[0167] The chamber part (100`) can be formed in the shape of a housing with a hollow interior, and the inner surface of the chamber part (100`) can be formed of a shape or material that can maximize multiple reflection and multiple scattering of input light (IL).

[0168] For example, the inner surface of the chamber portion (100`) may be formed of a CSMS (web) structure, a Chiral Sculptured Thin Films structure (CSTFs), a Photonic Crystal Structure, a Honeycomb Structure, an Isotropic and Anisotropic Structure, a Metamaterial Structure, a Polarization Maintaining Fiber, etc.

[0169] As an optional embodiment, a scattering layer may be applied to the inner surface of the chamber portion (100`). The scattering layer may include a scattering material, for example, the scattering layer may include hexagonal boron nitride (h-BN).

[0170] As an optional embodiment, the inner surface of the chamber portion (100`) may have a preset roughness, for example, the inner surface of the chamber portion (100`) may have a regular or irregular rough structure, thereby implementing a multiple scattering amplification function.

[0171] As an optional embodiment, a multi-scatterer that increases the optical path length of the input light (IL) may be placed inside the chamber portion (100`). The multi-scatterer may be placed on the optical path of the input light (IL), and the multi-scatterer may amplify the number of times the light source irradiated from the light source portion (200`) to the chamber portion (100`) is multi-scattering, thereby increasing the optical path length of the scattered light (SL) or the input light (IL) inside the chamber portion (100`).

[0172] The polarizing unit (600`) may include a first polarizing unit (610`) and a second polarizing unit (620`). The first polarizing unit (610`) is disposed between the chamber unit (100`) and the light source unit (200`) and may be disposed on the optical path of the input light (IL), and the second polarizing unit (620`) is disposed between the chamber unit (100`) and the sensor unit (300`) and may be disposed on the optical path of the scattered light (SL).

[0173] In one embodiment, the polarization axis of the first polarization unit (610`) and the polarization axis of the second polarization unit (620`) may be perpendicular to each other.

[0174] A portion of the input light (IL) irradiated into the interior of the chamber (100`) can be multi-reflected and multi-scattered without interfering with the scattered light (SL) and while maintaining its original properties, and the input light (IL) maintaining its original properties can be emitted toward the sensor (300`) through the exit of the chamber (100`).

[0175] Since the sensor unit (300`) detects the speckle of the scattered light (SL) generated by the scattered input light (IL) and estimates information on the target particle, if the sensor unit (300`) detects the input light (IL) that maintains its original properties without interference with the speckle of the scattered light (SL), it may be difficult to precisely detect the speckle of the scattered light (SL).

[0176] In contrast, when the input light (IL) polarized by the first polarizing unit (610`) and irradiated into the chamber section (100`) generates scattered light (SL) through interaction with target particles, the scattered light (SL) loses its original polarized properties.

[0177] The second polarizing unit (620`) is placed between the chamber unit (100`) and the sensor unit (300`), and is placed on the optical path of the scattered light (SL), and the polarization axis of the second polarizing unit (620`) can be perpendicular or nearly perpendicular to the polarization axis of the first polarizing unit (610`).

[0178] In this case, both the input light (IL) polarized by the first polarization unit (610`) while maintaining its original properties and the scattered light (SL) that has lost its polarization properties are emitted toward the sensor unit (300`) through the exit of the chamber unit (100`), but the input light (IL) emitted without being scattered is still polarized, and thus may not pass through the second polarization unit (620`) having a polarization axis perpendicular to the polarization axis of the first polarization unit (610`) and thus may not reach the second sensor (320`). In contrast, the scattered light (SL) may pass through the second polarization unit (620`) and reach the second sensor (320`).

[0179] Accordingly, the second polarization unit (620`) selectively passes only the scattered light (SL) generated by interacting with the target particle to the sensor unit (300`), thereby reducing the noise of the data acquired by the control unit, thereby enabling precise detection / estimation of the information on the target particle.

[0180] Although the present invention has been described above with reference to limited embodiments and drawings, the present invention is not limited thereto, and it is obvious that various modifications and variations are possible within the scope of the technical idea of ​​the present invention and the equivalent scope of the patent claims to be described below by a person having ordinary skill in the art to which the present invention pertains.

[0181] According to one embodiment of the present invention, an optical measuring device is provided. Furthermore, embodiments of the present invention can be applied to devices for detecting particles or the like using optics used in industry.

Claims

1. A chamber section having a first chamber for accommodating a sample and a second chamber providing a space in which optical interference of scattered light emitted from the first chamber occurs; A light source unit that irradiates input light toward the chamber unit; A sensor unit that detects speckle of the output light output from the chamber unit; and An optical measurement device, comprising a control unit that estimates information about target particles in the sample using speckles of the detected output light.

2. In paragraph 1, The above chamber part, An optical measuring device further comprising a partition wall that divides the interior of the first chamber and the interior of the second chamber and allows transmission of the scattered light.

3. In paragraph 1, The input light irradiated from the above light source unit is It includes a first input light irradiated into the inside of the first chamber and a second input light irradiated into the inside of the second chamber, and the first input light and the target particle can collide inside the first chamber to generate the scattered light. An optical measuring device in which the sensor unit detects a speckle of the output light generated by optical interference between the scattered light and the second input light inside the second chamber.

4. In paragraph 3, It further includes a light distribution unit that is arranged between the chamber unit and the light source unit and divides the input light irradiated from the light source unit into the first input light and the second input light; An optical measuring device, wherein the first input light and the second input light split by the optical distribution unit have wavelengths within the same range.

5. In paragraph 3, An optical measuring device further comprising an angle adjusting unit disposed between the chamber unit and the light source unit, the angle adjusting unit being capable of adjusting the angle of incidence of the first input light or the angle of incidence of the second input light with respect to the chamber unit.

6. In paragraph 3, The above sensor part, A first sensor disposed adjacent to the first chamber and detecting the scattered light; and A second sensor is provided, which is positioned adjacent to the second chamber and measures the output light, rather than the first sensor; An optical measuring device, wherein the luminous intensity of the output light obtained from the second sensor is relatively greater than the luminous intensity of the scattered light obtained from the first sensor.

7. In paragraph 3, An optical measuring device further comprising a polarizing unit disposed on the optical path of the second input light and having a preset polarization axis.

8. A light source unit that generates input light; A chamber section that provides a space in which input light input from the light source section can be multi-reflected or multi-scattered in multiple paths; A sensor unit that detects speckles of scattered light output from the chamber unit; and A first polarizing unit disposed between the chamber portion and the light source portion and disposed on the optical path of the input light; and An optical measuring device comprising: a second polarizing unit disposed between the chamber portion and the sensor portion, disposed on the optical path of the scattered light, and having a polarizing axis intersecting the polarizing axis of the first polarizing unit.

9. In paragraph 8, An optical measuring device, wherein the polarization axis of the first polarization unit and the polarization axis of the second polarization unit are perpendicular to each other.

10. In paragraph 8, An optical measuring device further comprising a driving unit capable of adjusting the polarization axis of the second polarizing unit.

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