Device test method and apparatus, and device

Abstract

Provided in the present disclosure are a device test method and apparatus, and a device. The method comprises: determining a test group, which comprises a plurality of power supply devices, at least one power consumption device group and a dummy load; on the basis of an active power of each power supply device and a power consumption power of each power consumption device group, generating test configuration information; and on the basis of the test configuration information, controlling the plurality of power supply devices to supply power to the at least one power consumption device group, so as to obtain a power supply test result corresponding to the test group. Therefore, the test efficiency for testing an electric power system is improved.

Description

[0001] This disclosure claims priority to Chinese patent application number 202410257827.4, filed with the China Patent Office on March 6, 2024, entitled "Device Testing Method, Apparatus, and Device," the entire contents of which are incorporated herein by reference. Technical Field: This disclosure relates to the field of computers, and more particularly to a device testing method, apparatus, and device. Background: When a computer room building is delivered, the power system in the building needs to be tested. The power system may include multiple power supply devices and multiple power consuming devices. In related art, when testing power supply devices in the power system, individual tests are typically performed on each power supply device. When testing power consuming devices, various tests are typically performed on multiple power consuming devices using mains power. However, in this approach, each power supply device is tested individually before multiple power consuming devices are tested, resulting in low testing efficiency for the power system. SUMMARY OF THE INVENTION Various aspects of the present disclosure provide a device testing method, apparatus, and device for improving the efficiency of testing a power system. In a first aspect, embodiments of the present disclosure provide a device testing method, comprising: determining a test group, the test group comprising multiple power supply devices, at least one power consumption device group, and a dummy load; generating test configuration information based on the active power of each power supply device and the power consumption of each power consumption device group; and controlling the multiple power supply devices to supply power to the at least one power consumption device group based on the test configuration information, thereby obtaining a power supply test result corresponding to the test group. In one possible implementation, generating the test configuration information based on the active power of each power supply device and the power consumption of each power consumption device group includes: determining, for any power supply device, the reactive power of the power supply device based on the active power of the power supply device; determining target operating parameters for the dummy load based on the active power of each power supply device and the power consumption of each power consumption device group; and determining that the test configuration information includes the reactive power of each power supply device and the target operating parameters of the dummy load. In a possible implementation, determining the reactive power of the power supply device according to the active power of the power supply device includes: determining a first preset ratio; and determining the reactive power as a product of the active power and the first preset ratio.In one possible implementation, determining target operating parameters of the dummy load based on the active power of each power supply device and the power consumption of each power consumption device group includes: determining a total active power based on the active power of each power supply device; determining a total power consumption based on the power consumption of each power consumption device group; and determining a load active power and a load reactive power of the dummy load based on the total active power and the total power consumption, wherein the target operating parameters include the load active power and the load reactive power. In one possible implementation, determining the load active power and the load reactive power of the dummy load based on the total active power and the total power consumption includes: determining the load active power as the difference between the total active power and the total power consumption; determining the first reactive power as the product of the total active power and a first preset ratio; determining the second reactive power as the product of the total power consumption and a second preset ratio; and determining the load reactive power as the difference between the first reactive power and the second reactive power. In one possible implementation, the test configuration information includes the reactive power of each power supply device and the target operating parameters of the dummy load; according to the test configuration information, controlling the multiple power supply devices to supply power to the multiple power consuming device groups, and obtaining the power supply test results corresponding to the test groups, including: configuring the parameters of the dummy load according to the target operating parameters; for any power supply device, configuring the parameters of the power supply device according to the reactive power of the power supply device; sending a startup instruction to the devices in the test group, wherein the startup instruction is used to start the devices in the test group; obtaining operating information of each device in the test group, and determining the power supply test results according to the operating information. In one possible implementation, configuring the parameters of the dummy load according to the target operating parameters includes: sending a first configuration instruction to the dummy load, wherein the first configuration instruction includes the target operating parameters, and the first configuration instruction is used to instruct the dummy load to set the operating parameters to the target operating parameters. In a possible implementation, configuring parameters of the power supply device according to the reactive power of the power supply device includes: sending a second configuration instruction to the power supply device, where the second configuration instruction includes the reactive power, and the second configuration instruction is used to instruct the power supply device to set the reactive power.In one possible implementation, the test group further includes a rectifier device corresponding to each power consuming device group. Determining the test group includes: determining a power supply device set and a power consuming device group set; determining the multiple power consuming device groups in the power consuming device group set, wherein a similarity between the multiple power consuming device groups is greater than or equal to a preset threshold; determining a first number of power supply devices based on a maximum processing power of a rectifier device corresponding to each power consuming device group in the multiple power consuming device groups and an active power of each power supply device; and determining the first number of power supply devices in the power supply device set as the multiple power supply devices. In a second aspect, embodiments of the present disclosure provide a device testing apparatus comprising: a determination module, a generation module, and a control module. The determination module is configured to determine a test group, wherein the test group includes multiple power supply devices, at least one power consumption device group, and a dummy load. The generation module is configured to generate test configuration information based on the active power of each power supply device and the power consumption of each power consumption device group. The control module is configured to control the multiple power supply devices to supply power to the at least one power consumption device group based on the test configuration information, thereby obtaining a power supply test result corresponding to the test group. In one possible implementation, the generation module is specifically configured to: determine the reactive power of any power supply device based on the active power of the power supply device; determine target operating parameters of the dummy load based on the active power of each power supply device and the power consumption of each power consumption device group; and determine that the test configuration information includes the reactive power of each power supply device and the target operating parameters of the dummy load. In one possible implementation, the generation module is specifically configured to: determine a first preset ratio; and determine the reactive power as the product of the active power and the first preset ratio. In one possible implementation, the generation module is specifically configured to: determine a total active power based on the active power of each power supply device; determine a total power consumption based on the power consumption of each power consumption device group; and determine a load active power and a load reactive power of the dummy load based on the total active power and the total power consumption, wherein the target operating parameter includes the load active power and the load reactive power. In one possible implementation, the generation module is specifically configured to: determine the load active power as the difference between the total active power and the total power consumption; determine the first reactive power as the product of the total active power and a first preset ratio; determine the second reactive power as the product of the total power consumption and a second preset ratio; and determine the load reactive power as the difference between the first reactive power and the second reactive power.In one possible implementation, the test configuration information includes the reactive power of each power supply device and the target operating parameters of the dummy load; the control module is specifically configured to: configure the parameters of the dummy load according to the target operating parameters; configure the parameters of any power supply device according to the reactive power of the power supply device; send a startup instruction to the devices in the test group, the startup instruction being used to start the devices in the test group; obtain operating information of each device in the test group, and determine the power supply test result based on the operating information. In one possible implementation, the control module is specifically configured to: send a first configuration instruction to the dummy load, the first configuration instruction including the target operating parameters, the first configuration instruction being used to instruct the dummy load to set its operating parameters to the target operating parameters. In one possible implementation, the control module is specifically configured to: send a second configuration instruction to the power supply device, the second configuration instruction including the reactive power, the second configuration instruction being used to instruct the power supply device to set the reactive power. In one possible implementation, the test group also includes a rectifier corresponding to each power-consuming device group; the determination module is specifically configured to: determine a power supply device set and a power-consuming device group set; determine the multiple power-consuming device groups in the power-consuming device group set, wherein the similarity of the multiple power-consuming device groups is greater than or equal to a preset threshold; determine a first number of power supply devices based on the maximum processing power of the rectifier corresponding to each power-consuming device group in the multiple power-consuming device groups and the active power of each power supply device; and determine the first number of power supply devices in the power supply device set as the multiple power supply devices. In a third aspect, embodiments of the present disclosure provide a test device comprising: a memory and a processor; the memory storing computer-executable instructions; the processor executing the computer-executable instructions stored in the memory, causing the processor to perform the method according to any one of the first aspects. In a fourth aspect, embodiments of the present disclosure provide a computer-readable storage medium storing computer-executable instructions, which, when executed by the processor, implement the method according to any one of the first aspects. In a fifth aspect, embodiments of the present disclosure provide a computer program product comprising a computer program, which, when executed by the processor, implements the method according to any one of the first aspects.Embodiments of the present disclosure provide a device testing method, apparatus, and device. The testing device can determine test groups and generate test configuration information based on the active power of each power supply device and the power consumption of each power consumption device group. Based on the test configuration information, the device can then control multiple power supply devices to supply power to at least one power consumption device group, obtaining power supply test results corresponding to the test group. Because multiple power supply devices and multiple power consumption devices in a power system can be divided into multiple test groups, test configuration information can be determined and tested based on the test groups. This improves the efficiency of power system testing compared to related art methods that test each power supply device individually and then test multiple power consumption devices. BRIEF DESCRIPTION OF THE DRAWINGS The drawings described herein are provided to provide a further understanding of the present disclosure and constitute a part of the present disclosure. The illustrative embodiments of the present disclosure and their description are provided to explain the present disclosure and are not intended to unduly limit the present disclosure. In the accompanying drawings: Figure 1 is a schematic diagram of a scenario provided by an exemplary embodiment of the present disclosure; Figure 2 is a flowchart of a device testing method provided by an exemplary embodiment of the present disclosure; Figure 3 is a schematic diagram of a test group provided by an exemplary embodiment of the present disclosure; Figure 4 is a flowchart of another device testing method provided by an exemplary embodiment of the present disclosure; Figure 5 is a schematic diagram of another test group provided by an exemplary embodiment of the present disclosure; Figure 6 is a schematic diagram of the overall testing steps provided by an exemplary embodiment of the present disclosure; Figure 7 is a flowchart of a pre-test verification provided by an exemplary embodiment of the present disclosure; Figure 8 is a flowchart of load adjustment for a rectifier device provided by an exemplary embodiment of the present disclosure; Figure 9 is a schematic diagram of the structure of a device testing apparatus provided by an exemplary embodiment of the present disclosure; Figure 10 is a schematic diagram of the structure of a test device provided by an exemplary embodiment of the present disclosure. It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, storage, and display, etc.) involved in this disclosure are all information and data authorized by the user or fully authorized by all parties. The collection, use, and processing of the relevant data must comply with relevant laws, regulations, and standards, and corresponding operation portals are provided for users to choose to authorize or reject. To further clarify the objectives, technical solutions, and advantages of this disclosure, the technical solutions of this disclosure will be described clearly and completely below in conjunction with specific embodiments of the disclosure and the corresponding drawings. Obviously, the described embodiments represent only a portion of the embodiments of this disclosure, and are not exhaustive. All other embodiments derived by persons of ordinary skill in the art based on the embodiments of this disclosure without inventive effort are intended to fall within the scope of protection of this disclosure.Figure 1 is a schematic diagram of a scenario provided by an exemplary embodiment of the present disclosure. See Figure h. A power system is installed in a computer building. The power system may include multiple power supplies, multiple dummy loads, and multiple power-consuming device groups. For example, the multiple power supplies may be Power Supply 1, Power Supply 2, ..., Power Supply N; the multiple dummy loads may be Dummy Load 1, Dummy Load 2, ..., Dummy Load K; and the multiple power-consuming device groups may be Power-consuming Device Group 1, Power-consuming Device Group 2, ..., Power-consuming Device Group M. N, K, and M are integers greater than or equal to 1. A dummy load is an electronic load device primarily used to provide a stable load in the power system to test and measure the performance and characteristics of other devices. In the power system, the multiple power supplies can supply power to the multiple dummy loads and multiple power-consuming device groups. During testing, parameters of the power supplies and dummy loads can be adjusted to ensure stable operation of the power system, thereby testing various devices in the power system. In related art, when testing power supply devices in a power system, individual tests are typically performed on each power supply device individually. When testing power consumption devices, various tests are typically performed on multiple power consumption devices using mains power. However, in this approach, each power supply device is tested individually before multiple power consumption devices are tested, resulting in low power system testing efficiency. In embodiments of the present disclosure, a test group can be determined, which may include multiple power supply devices, at least one power consumption device group, and a dummy load. Test configuration information can be generated based on the active power of each power supply device and the power consumption of each power consumption device group. Based on the test configuration information, multiple power supply devices can be controlled to supply power to at least one power consumption device group, thereby obtaining power supply test results corresponding to the test group. Because the multiple power supply devices and multiple power consumption devices in the power system can be divided into multiple test groups, and test configuration information is determined and tested according to the test groups, this improves power system testing efficiency compared to the related art approach of testing each power supply device individually before testing multiple power consumption devices. To facilitate understanding of the technical solutions of the present disclosure, the following first describes a device testing method in related technologies. Assume that the power system of a computer building includes 13 power supply devices, 10 computer rooms, and corresponding rectifier equipment for each computer room. Each computer room may include multiple cabinets, air conditioners, lighting, and other equipment. The HVAC system may include equipment such as air conditioners and lighting.In the related art, 13 power supply devices are individually tested at full load, followed by reactive power testing. Multiple power supply devices are then tested in parallel at load. The rectifier equipment and cabinets in the computer room are then fully loaded using the mains power supply, and finally the HVAC system is tested. Consequently, testing the power system in the computer room building in the related art is time-consuming and inefficient. In the technical solution disclosed herein, multiple devices in the power system are divided into multiple test groups. These devices are then jointly tested according to the test groups, meaning that multiple devices in the test groups can be tested simultaneously. Compared to the prior art method of testing each device individually, this shortens the testing time, improves test efficiency, and conserves the power resources required for full-load testing of the rectifier equipment and cabinets in the computer room using mains power. A comparison of the prior art and this solution is shown in Table 1: Table 1. The technical solutions presented in this disclosure are described in detail below through specific embodiments. It should be noted that the following embodiments may exist independently or in combination, and identical or similar content will not be repeated in different embodiments. FIG2 is a flow chart illustrating a device testing method provided by an exemplary embodiment of this disclosure. Referring to FIG2 , the method may include:

[0002] S201: Determine a test group. The execution entity of the embodiments of the present disclosure may be a test device or a device testing device within the test device. The device testing device may be implemented via software or a combination of software and hardware. The device testing device may be a processor within the test device. For ease of understanding, the following description uses the test device as an example. A test group may include multiple power supply devices, at least one power consumption device group, and a dummy load. The multiple power supply devices may have the same performance specifications. Optionally, the power supply device may be a diesel generator. Because a computer building may include multiple computer rooms, each computer room may contain multiple cabinets and other equipment. A power consumption device group refers to all power consumption devices within a computer room. The following describes a test group with reference to FIG3 . FIG3 is a schematic diagram of a test group provided in an exemplary embodiment of the present disclosure. Referring to FIG3 , test group 1 may include three power supply devices, two power consumption device groups, and one dummy load. The three power supply devices can be diesel generator 1, diesel generator 2, and diesel generator 3; the two power consumption equipment groups can be computer room 1 and computer room 2. Test group 1 can include two power sources: one for the three diesel generators and the other for the mains. Test group 1 primarily involves three types of loads: variable loads (primarily dynamic loads, carried by the mains), steady-state loads (primarily power consumption equipment group loads, carried by the power supply device), and regulating loads (primarily dummy loads, carried by the power supply device).

[0003] S202: Generate test configuration information based on the active power of each power supply device and the power consumption of each power consumption device group. For any power supply device, the power of the power supply device may include active power and reactive power. Active power refers to the actual effective power output by the power supply device, used to carry the electrical load. The unit of active power can be expressed in kilowatts (kW). Reactive power refers to the non-actual power output by the power supply device, mainly used to maintain voltage stability and reactive power balance in the power system. The unit of reactive power can be expressed in kilovars (kvar). In actual operation, there is a certain relationship between the active power and reactive power of the power supply device, which is called the power factor. The power factor is the ratio of active power to apparent power. Apparent power is the square root of the sum of the squares of active power and reactive power. The power factor value ranges between 0 and 1, and the closer it is to 1, the higher the power utilization efficiency of the power supply. The power consumption of the power consumption device group refers to the active power. For any power consuming device group, the power of the power consuming device group may include active power and reactive power. The active power of a power consuming device group is the sum of the active power of the multiple power consuming device groups in the group; the reactive power of a power consuming device group is the sum of the reactive power of the multiple power consuming device groups in the group. In an optional embodiment, test configuration information may be generated based on the active power of each power supply device and the power consumption of each power consuming device group in the following manner: for any power supply device, the reactive power of the power supply device is determined based on the active power of the power supply device; target operating parameters of a dummy load are determined based on the active power of each power supply device and the power consumption of each power consuming device group; and the test configuration information is determined to include the reactive power of each power supply device and the target operating parameters of the dummy load. Optionally, the test configuration information may include the reactive power of each power supply device and the target operating parameters of the dummy load. Optionally, the target operating parameters of the dummy load may include the load active power and load reactive power of the dummy load. For example, if test group 1 is as shown in FIG3 , the power supply equipment is a diesel generator. If the active power of diesel generator 1, diesel generator 2, and diesel generator 3 is all 1800 kW, the reactive power 1 of diesel generator 1 can be determined based on 1800 kW. Assume that the reactive power 1 of diesel generator 1 is 590 kvar. Similarly, the reactive power of diesel generator 2 and diesel generator 3 can be determined to be 590 kvar.If the power-consuming device group is a computer room, and if the power consumption of computer room 1 and computer room 2 is both 2400 kW, the target operating parameters for dummy load 1 can be determined based on the active power of the three diesel generators (1800 kW) and the power consumption of computer rooms 1 and 2 (2400 kW). Assuming that the target operating parameters for dummy load 1 include a load active power of 3000 kW and a load reactive power of 1073 kvar, the test configuration information 1 for test group 1 can include: a reactive power of 590 kvar for diesel generators 1, 2, and 3; and a load active power of 3000 kW and a load reactive power of 1073 kvar for dummy load 1.

[0004] S203: Control multiple power supply devices to supply power to at least one power consuming device group based on the test configuration information, and obtain a power supply test result corresponding to the test group. Since the test configuration information includes the reactive power of each power supply device and the target operating parameters of the dummy load, the reactive power of each power supply device in the test group and the operating parameters of the dummy load can be adjusted based on the test configuration information to control the multiple power supply devices to supply power to the at least one power consuming device group, ensuring stable operation of the test group and obtaining a power supply test result corresponding to the test group. For example, if test group 1 is as shown in Figure 3, and if test configuration information 1 includes: a reactive power of 590 kvar for diesel generators 1, 2, and 3, and a load active power of 3000 kW and a load reactive power of 1073 kvar for dummy load 1, the reactive power of diesel generators 1, 2, and 3 can be adjusted to 590 kvar, and the load active power of dummy load 1 can be adjusted to 3000 kW and a load reactive power of 1073 kvar to ensure stable operation of test group 1, thereby obtaining power supply test results corresponding to the three diesel generators. In embodiments of the present disclosure, a test group can be determined, and test configuration information can be generated based on the active power of each power supply device and the power consumption of each power consumption device group. Based on the test configuration information, multiple power supply devices can be controlled to supply power to at least one power consumption device group, thereby obtaining a power supply test result corresponding to the test group. Because multiple power supply devices and multiple power consumption devices in the power system can be divided into multiple test groups, test configuration information is determined and tested according to the test groups. This improves the efficiency of testing the power system compared to the related art of testing each power supply device individually and then testing multiple power consumption devices. The device testing method described above will be further described in detail below, based on the embodiment shown in FIG2 and in conjunction with FIG4. FIG4 is a flowchart of another device testing method provided by an exemplary embodiment of the present disclosure. Referring to FIG4, the method may include:

[0005] S401: Determine a test group. The test group may include multiple power supply devices, at least one power consumption device group, and a dummy load. Optionally, it may also include a rectifier device corresponding to each power consumption device group. The rectifier device may be used to convert AC power into DC power. For example, the rectifier device may be a Panamax device. The Panamax device may include a transformer, a rectifier cabinet, and an AC cabinet. In an optional embodiment, the test group may be determined by: determining a power supply device set and a power consumption device group set; determining multiple power consumption device groups within the power consumption device group set; determining a first number of power supply devices based on the maximum processing power of the rectifier device corresponding to each power consumption device group in the multiple power consumption device groups and the active power of each power supply device; and determining the first number of power supply devices within the power supply device set as multiple power supply devices. If n=[(2600*2) / 1800*1=3], then three power supply devices can be identified in the power supply device set. Assume they are diesel generator 1, diesel generator 2, and diesel generator 3. Test group 1 can then be as shown in Figure 5. Figure 5 is a schematic diagram of another test group provided in an example embodiment of the present disclosure. Referring to Figure 5, test group 1 can include three power supply devices, one dummy load, two power consumption device groups, and rectifier devices corresponding to the two power consumption device groups. The three power supply devices can be diesel generator 1, diesel generator 2, and diesel generator 3; the two power consumption device groups can be computer room 1 and computer room 2; computer room 1 has corresponding rectifier device 1, and computer room 2 has corresponding rectifier device 2. Test group 1 can include two power sources: one for the three diesel generators and the other for the mains.

[0006] S402. For any power supply device, determine the reactive power of the power supply device based on the active power of the power supply device. In an optional embodiment, the reactive power of the power supply device can be determined based on the active power of the power supply device in the following manner: determining a first preset ratio; and multiplying the active power by the first preset ratio to determine the reactive power. Optionally, the first preset ratio can be a preset constant. The first preset ratio can be represented by a. For example, the first preset ratio a can be 0.328. If the active power of the power supply device is represented by P and the first preset ratio is a, then the reactive power Q of the power supply device is Q = P*a. oFor example, if the power supply device is a diesel generator, if the active power P of the diesel generator is 1800 kW, and the first preset ratio a is 0.328, then the reactive power Q of the diesel generator can be determined to be 1800*0.328=590 kvar.

[0007] S403. Determine target operating parameters for the dummy load based on the active power of each power supply device and the power consumption of each power consumption device group. In an optional embodiment, the target operating parameters for the dummy load can be determined based on the active power of each power supply device and the power consumption of each power consumption device group in the following manner: determine the total active power based on the active power of each power supply device; determine the total power consumption based on the power consumption of each power consumption device group; and determine the load active power and load reactive power of the dummy load based on the total active power and the total power consumption. The target operating parameters include the load active power and the load reactive power. For example, if test group 1, as shown in FIG5 , includes three diesel generators, and the active power P of each of the three diesel generators is 1800 kW, the total active power can be determined to be 1800 kW * 3 = 5400 kW. If there are two power-consuming device groups, each consuming 2400 kW, the total power consumption can be determined as 2400 kW * 2 = 4800 kW. Optionally, the load active power and load reactive power of the dummy load can be determined based on the total active power and the total power consumption in the following manner: the difference between the total active power and the total power consumption is determined as the load active power; the product of the total active power and a first preset ratio is determined as the first reactive power; the product of the total power consumption and a second preset ratio is determined as the second reactive power; and the difference between the first reactive power and the second reactive power is determined as the load reactive power. The first reactive power is the total reactive power of the multiple power supply devices in the test group. The second reactive power is the total reactive power of the multiple power-consuming device groups in the test group. Optionally, the second preset ratio can be manually preset. The second preset ratio can be represented by b. For example, the second preset ratio may be 0.291. For example, if test group 1 is shown in FIG5 , with a total active power of 5400 kW and a total power consumption of 4800 kW, the load active power may be determined to be 5400-4800 = 600 kW, the first reactive power may be 5400*0.328 = 1771 kvar, and the second reactive power may be 4800*0.291 = 1397 kvar. The difference of 374 kvar between the first reactive power of 1771 kvar and the second reactive power of 1397 kvar may be determined as the load reactive power. The target operating parameters of dummy load 1 in test group 1 may then be determined to include a load active power of 600 kW and a load reactive power of 374 kvar.

[0008] S404. Determine that the test configuration information includes the reactive power of each power supply device and the target operating parameters of the dummy load. For example, if test group 1 is as shown in FIG5 , it can be determined that the test configuration information 1 of test group 1 may include the reactive power Q of each diesel generator being 590 Kvar, and the load active power of dummy load 1 being 600 KW and the load reactive power being 374 Kvar. Optionally, a dynamic ring platform may be provided in the test device. The maximum processing power of the rectifier device and the power consumption of the power-consuming device group may be set in the dynamic ring platform, and the test configuration information is calculated through steps S402 and S403. Optionally, according to the active power of each power supply device and the power consumption of each power-consuming device group, the following parameters may be obtained, as shown in Table 2: Table 2 Apparent power is equal to the square root of the sum of the squares of active power and reactive power. Power factor is equal to the ratio of active power to apparent power.

[0009] S405. Configure the dummy load parameters according to the target operating parameters. In an optional embodiment, the dummy load parameters can be configured according to the target operating parameters by sending a first configuration instruction to the dummy load. The first configuration instruction may include the target operating parameters and may be used to instruct the dummy load to set its operating parameters to the target operating parameters. For example, if test group 1 is shown in FIG5 , and the target operating parameters of dummy load 1 include a load active power of 600 kW and a load reactive power of 374 kvar, a first configuration instruction may be sent to dummy load 1. The first configuration instruction may include a load active power of 600 kW and a load reactive power of 374 kvar. Based on the first configuration instruction, dummy load 1 may set its load active power to 600 kW and its load reactive power to 374 kvar.

[0010] S406. For any power supply device, configure the power supply device parameters based on the reactive power of the power supply device. In an optional embodiment, the power supply device parameters can be configured based on the reactive power of the power supply device in the following manner: a second configuration instruction is sent to the power supply device. The second configuration instruction may include reactive power, and the second configuration instruction may be used to instruct the power supply device to set the reactive power. For example, if test group 1 is shown in Figure 5, and the power supply device is a diesel generator, then for any diesel generator, a second configuration instruction may be sent to the diesel generator. The second configuration instruction may include a reactive power of 590 kvar. The diesel generator may set the reactive power to 590 kvar according to the second configuration instruction.

[0011] S407. Send a startup instruction to the devices in the test group. The startup instruction can be used to start the devices in the test group. Optionally, the test device can send the startup instruction to the devices in the test group in response to a staff member's startup operation. For example, if test group 1 is shown in Figure 5, the test device can send a startup instruction to each device in test group 1 in response to a staff member's startup operation to start the devices in test group 1. Because the parameters of the power supply devices and dummy loads in the test group have been configured according to the test configuration information, the load of the test group has been properly allocated. Therefore, in the technical solution of the present disclosure, after starting each device in the test group, a joint test can be performed on multiple power supply devices, multiple rectifier devices, and dummy loads in the test group. The combined operation of multiple power supply devices can simultaneously meet the full-load test conditions for a single power supply device, the reactive function test conditions for a power supply device, and the parallel load test conditions for a power supply device. Furthermore, the operation of the rectifier device and the power consumption device group can meet the full-load test conditions for the rectifier device and the full-load test conditions for the power consumption device group. Therefore, after each device in the test group is started, the five tests can be performed simultaneously, shortening the test period and saving power resources.

[0012] S408. Obtain operating information for each device in the test group and determine the power supply test result based on the operating information. Optionally, the test device can obtain the operating information of each device in the test group in real time through the dynamic environment platform and determine the power supply test result based on the operating information. Optionally, the operating information may include operating parameters such as voltage and power of each device in the test group during operation. The power supply test result may include test results for multiple devices in the test group, and the test results may include normal or abnormal. If the operating information of each device in the test group is within a corresponding reasonable range, the test results of each device in the test group can be determined to be normal. If the operating information of a device in the test group exceeds the corresponding reasonable range, the test result of the device can be determined to be abnormal. It should be emphasized that the technical solution of the present disclosure allows for parallel operation of multiple power supply devices and joint testing of rectifier devices and power consumption groups. This differs from independent testing in related technologies and achieves full-link testing. Furthermore, due to the full-link testing, parameters such as active power and reactive power can be configured for the power supply devices, enabling joint testing of both active and reactive power. This is more comprehensive than testing only active power and improves test reliability. Furthermore, stress testing of rectifier devices, HVAC systems, and supporting weak current systems can be performed, minimizing testing time and enabling rapid and stable testing. In the embodiments of the present disclosure, the testing device can determine test groups. For any power supply device, the reactive power of the power supply device can be determined based on its active power. Furthermore, the target operating parameters of the dummy load can be determined based on the active power of each power supply device and the power consumption of each power consumption group. Furthermore, the test configuration information can include the reactive power of each power supply device and the target operating parameters of the dummy load. The testing device can configure the parameters of the dummy load based on the target operating parameters and, for any power supply device, configure the parameters of the power supply device based on the reactive power of the power supply device. The testing device can send a startup command to the devices in the test group, obtain operating information for each device in the test group, and determine the power supply test results based on the operating information. Because the multiple power supply devices and power consumption devices in the power system can be divided into multiple test groups, test configuration information can be determined based on the test groups, and multiple devices in the test groups can be jointly tested. This improves the efficiency of power system testing compared to the related art of testing power supply devices individually and then testing multiple power consumption devices. The following describes the overall test steps for testing the power system with reference to Figure 6. Figure 6 is a schematic diagram of the overall test steps provided by an embodiment of the present disclosure.Referring to Figure 6, the overall test steps for testing a power system may include pre-test verification, determining and configuring test configuration information, parallel operation, load adjustment of rectifier equipment, and normal load testing. Before implementing the technical solution of the present disclosure, pre-test verification is required. The following describes pre-test verification with reference to Figure 7. Figure 7 is a schematic flow chart of a pre-test verification process provided by an embodiment of the present disclosure. Referring to Figure 7, pre-test verification includes electrical verification, HVAC verification, and weak current verification. Optionally, electrical verification may be performed first. If verification fails, corrections must be made until verification succeeds. If verification succeeds, the next verification step, HVAC verification, can be performed. For HVAC verification, if verification fails, corrections must be made until verification succeeds. If verification succeeds, the next verification step, weak current verification, can be performed. If verification fails, corrections must be made until verification succeeds. If verification succeeds, the pre-test verification can be concluded. Optionally, electrical verification may include the following:

[0013] 1. The electrical link equipment such as dummy load, medium voltage cabinet, power supply equipment, rectifier equipment, and terminal cabinet has completed startup and debugging.

[0014] 2. The feeder cabinets and incoming line cabinets of power supply equipment have been set with formal fixed values, and the relay protection test has been verified and passed.

[0015] 3. The single-machine process inspection, alarm function, and sudden increase or decrease performance of the power supply equipment have been tested and passed.

[0016] 4. The power supply equipment logic, mains logic, and five-choose-two logic have been verified.

[0017] 5. The battery switch box in the computer room has been disconnected. Optionally, the HVAC verification may include the following:

[0018] 1. The environment of high-configuration computer rooms and distribution rooms has been kept clean and meets the standards.

[0019] 2. HVAC equipment such as air conditioners, chillers, and water pumps have been started up and debugged.

[0020] 3. The air conditioners, refrigeration machines and water pumps have all completed individual machine process inspections and functional tests.

[0021] 4. The filters at the terminal and in the cold station have been cleaned at least twice. Optionally, the weak current verification may include the following:

[0022] 1. The test logic of the medium voltage cabinet feeder test position is completed.

[0023] 2. The dynamic ring data has the function of real-time viewing and can store the test data.

[0024] 3. The dynamic environment platform has the function of implementing data recording, and the alarm information has been verified. Only when the above pre-checks are met can the power system be tested. It should be noted that according to the technical solution of the present disclosure, after determining the test configuration information and configuring the parameters of the power supply equipment and the dummy load, the staff can also perform parallel operations on the power system. In parallel operation, the corresponding staff are required to perform corresponding actions in different areas according to the standard operating procedure (SOP), and each area has a clear test operation SOP. Optionally, parallel operation may include the following: 1. High-voltage room and power supply equipment area test SOP:

[0025] 1. The mains busbar is disconnected and one mains power supply is cut off.

[0026] 2. Start three power supply devices, connect them to the bus section of the power supply devices, and connect them to the mains power.

[0027] 3. Start the power-consuming device group for loading.

[0028] 4. While the power-consuming equipment group is being loaded, manually put the dummy load into the test bus section medium-voltage cabinet and energize the dummy load.

[0029] 5. After the load of the power-consuming equipment group is stable and the rectifier equipment is fully loaded, configure the parameters of the dummy load according to the test configuration information.

[0030] 6. Start recording test data through the power quality meter. 2. Power consumption equipment group test SOP:

[0031] 1. Remove the battery switch box under the rectifier cabinet in advance.

[0032] 2. Test and check the load, and adjust the load in advance.

[0033] 3. Complete the corresponding column loading work and fine-tune the corresponding load of the column head cabinet and rectifier cabinet. III. Dummy load control SOP:

[0034] 1. After the power consumption equipment group is loaded and stabilized, power compensation is performed for the insufficient part. 4. Monitoring Center:

[0035] 1. Pay attention to the load changes of each node and perform power compensation between packets.

[0036] 2. Issuance of centralized load instructions for high-voltage distribution rooms, power-consuming equipment groups, and centralized loads. After the multiple power supply devices in the test group are paralleled, power can be delivered to the medium-voltage-low-voltage system. Because the technical solution of this disclosure performs joint testing on multiple power supply devices and rectifiers, load adjustment of the rectifiers is also required. The load adjustment process for the rectifiers is described below with reference to Figure 8. Figure 8 is a schematic diagram of the load adjustment process for the rectifiers according to an embodiment of the present disclosure. Referring to Figure 8, it includes:

[0037] S801. Determine the capacity of each rectifier device. Optionally, the capacity of the rectifier device can be represented by the maximum processing power. For example, the capacity of rectifier device 1 and rectifier device 2 can both be 2600KWo.

[0038] 5802. Determine the power transmission capacity of each power supply device. Optionally, the power transmission capacity of the power supply device can be represented by active power. For example, the active power of the three diesel generators in test group 1 can all be 1800KWo.

[0039] 5803. Determine the load of each power-consuming device group. Optionally, the load of the power-consuming device group can be represented by power consumption. For example, it can be determined that the load of both computer room 1 and computer room 2 in test group 1 is 2400KWo.

[0040] S804. Match the power factor. For example, the power factor of the three diesel generators in test group 1 may be matched to 0.95; the power factor of the power-consuming device group may be matched to 0.96.

[0041] S805. Start the test. After the rectifier device is loaded and the circuit is operating stably, the test can be started. Figure 9 is a schematic diagram of the structure of a device testing apparatus provided in an embodiment of the present disclosure. Referring to Figure 9, the device testing apparatus 10 includes a determination module 11, a generation module 12, and a control module 13. The determination module 11 is configured to determine a test group, wherein the test group includes multiple power supply devices, at least one power consumption device group, and a dummy load; the generation module 12 is configured to generate test configuration information based on the active power of each power supply device and the power consumption of each power consumption device group; and the control module 13 is configured to control the multiple power supply devices to supply power to the at least one power consumption device group based on the test configuration information, thereby obtaining the power supply test results corresponding to the test group. The device testing apparatus provided in an embodiment of the present disclosure can implement the technical solutions shown in the above-mentioned method embodiments. Its implementation principles and beneficial effects are similar and will not be further described here. In one possible implementation, the generation module 12 is specifically configured to: determine, for any power supply device, the reactive power of the power supply device based on the active power of the power supply device; determine target operating parameters of the dummy load based on the active power of each power supply device and the power consumption of each power consumption device group; and determine that the test configuration information includes the reactive power of each power supply device and the target operating parameters of the dummy load. In one possible implementation, the generation module 12 is specifically configured to: determine a first preset ratio; and determine the reactive power as the product of the active power and the first preset ratio. In one possible implementation, the generation module 12 is specifically configured to: determine a total active power based on the active power of each power supply device; determine a total power consumption based on the power consumption of each power consumption device group; and determine the load active power and load reactive power of the dummy load based on the total active power and the total power consumption, wherein the target operating parameters include the load active power and the load reactive power. In one possible implementation, the generating module 12 is specifically configured to: determine a difference between the total active power and the total power consumption as the load active power; determine a first reactive power by multiplying the total active power by a first preset ratio; determine a second reactive power by multiplying the total power consumption by a second preset ratio; and determine a difference between the first reactive power and the second reactive power as the load reactive power.In one possible implementation, the test configuration information includes the reactive power of each power supply device and the target operating parameters of the dummy load; the control module 13 is specifically configured to: configure the parameters of the dummy load according to the target operating parameters; configure the parameters of any power supply device according to the reactive power of the power supply device; send a startup instruction to the devices in the test group, wherein the startup instruction is used to start the devices in the test group; obtain operating information of each device in the test group, and determine the power supply test result based on the operating information. In one possible implementation, the control module 13 is specifically configured to: send a first configuration instruction to the dummy load, wherein the first configuration instruction includes the target operating parameters and is used to instruct the dummy load to set the operating parameters to the target operating parameters. In one possible implementation, the control module 13 is specifically configured to: send a second configuration instruction to the power supply device, wherein the second configuration instruction includes the reactive power and is used to instruct the power supply device to set the reactive power. In one possible implementation, the test group also includes a rectifier corresponding to each power-consuming device group; the determination module 11 is specifically configured to: determine a power supply device set and a power-consuming device group set; determine multiple power-consuming device groups within the power-consuming device group set, wherein the similarity of the multiple power-consuming device groups is greater than or equal to a preset threshold; determine a first number of power supply devices based on the maximum processing power of the rectifier corresponding to each power-consuming device group within the multiple power-consuming device groups and the active power of each power supply device; and determine the first number of power supply devices within the power supply device set as the multiple power supply devices. The device testing apparatus provided in the embodiments of the present disclosure can implement the technical solutions described in the above-described method embodiments. The implementation principles and beneficial effects are similar and are not further described here. An exemplary embodiment of the present disclosure provides a structural diagram of a test device, as shown in FIG10 . The test device 20 may include a processor 21 and a memory 22. Exemplarily, the processor 21 and the memory 22 are interconnected via a bus 23. The memory 22 stores computer-executable instructions; the processor 21 executes the computer-executable instructions stored in the memory 22, causing the processor 21 to perform the method described in the above method embodiment. Accordingly, an embodiment of the present disclosure provides a computer-readable storage medium storing computer-executable instructions. When the computer-executable instructions are executed by the processor, the method described in the above method embodiment is implemented.Accordingly, embodiments of the present disclosure may also provide a computer program product, including a computer program. When executed by a processor, the computer program can implement the methods described in the above method embodiments. Those skilled in the art will appreciate that embodiments of the present disclosure may be provided as methods, systems, or computer program products. Therefore, the present disclosure may take the form of entirely hardware embodiments, entirely software embodiments, or embodiments combining software and hardware. Furthermore, the present disclosure may take the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to magnetic disk storage, CD-ROMs, optical storage, etc.) containing computer-usable program code. The present disclosure is described with reference to flowcharts and / or block diagrams of methods, devices (systems), and computer program products according to embodiments of the present disclosure. It should be understood that each process and / or block in the flowcharts and / or block diagrams, as well as combinations of processes and / or blocks in the flowcharts and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing device to produce a machine, such that the instructions, when executed by the processor of the computer or other programmable data processing device, produce means for implementing the functions specified in one or more flows in the flowchart and / or one or more blocks in the block diagram. These computer program instructions can also be stored in a computer-readable memory capable of directing the computer or other programmable data processing device to operate in a specific manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instruction means, which implement the functions specified in one or more flows in the flowchart and / or one or more blocks in the block diagram. These computer program instructions can also be loaded onto a computer or other programmable data processing device, such that a series of operational steps are executed on the computer or other programmable device to produce a computer-implemented process, such that the instructions executed on the computer or other programmable device provide steps for implementing the functions specified in one or more flows in the flowchart and / or one or more blocks in the block diagram. In a typical configuration, a computing device includes one or more processors (CPUs), input / output interfaces, network interfaces, and memory. Memory may include non-persistent storage in a computer-readable medium, in the form of random access memory (RAM) and / or non-volatile memory, such as read-only memory (ROM) or flash RAM. oMemory is an example of computer-readable media. Computer-readable media includes both permanent and non-permanent, removable and non-removable media that can implement information storage using any method or technology. Information can be computer-readable instructions, data structures, program modules, or other data. Examples of computer storage media include, but are not limited to, phase-change RAM (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technologies, compact disc read-only memory (CD-ROM), digital versatile disc (DVD) or other optical storage, magnetic cassettes, magnetic tape, magnetic disk storage or other magnetic storage devices, or any other non-transmitting medium that can be used to store information accessible by a computing device. As defined herein, computer-readable media does not include transitory computer-readable media, such as modulated data signals and carrier waves. It should also be noted that the terms "comprise," "include," or any other variations thereof are intended to encompass non-exclusive inclusion, such that a process, method, product, or apparatus comprising a list of elements may include not only those elements but also other elements not explicitly listed, or elements inherent to such process, method, product, or apparatus. Without further limitation, the phrase "comprises a..." does not preclude the presence of additional identical elements in the process, method, product, or apparatus comprising the recited elements. The foregoing description is merely an example of the present disclosure and is not intended to limit the present disclosure. Various modifications and variations of the present disclosure will readily occur to those skilled in the art. Any modifications, equivalent substitutions, improvements, and the like made within the spirit and principles of the present disclosure are intended to be encompassed by the claims of the present disclosure.

Claims

Claims 1. A device testing method, wherein: include: Determining a test group, where the test group includes a plurality of power supply devices, at least one power consumption device group, and a dummy load; Generate test configuration information based on the active power of each power supply device and the power consumption of each power consumption device group; According to the test configuration information, the multiple power supply devices are controlled to supply power to the at least one power consuming device group, and a power supply test result corresponding to the test group is obtained.

2. The method according to claim 1, wherein: Generating test configuration information based on the active power of each power supply device and the power consumption of each power consuming device group includes: determining, for any power supply device, the reactive power of the power supply device based on the active power of the power supply device; determining target operating parameters of the dummy load based on the active power of each power supply device and the power consumption of each power consuming device group; and determining that the test configuration information includes the reactive power of each power supply device and the target operating parameters of the dummy load.

3. The method according to claim 2, wherein: Determining the reactive power of the power supply device according to the active power of the power supply device includes: determining a first preset ratio; and determining the reactive power as a product of the active power and the first preset ratio.

4. The method according to claim 2 or 3, wherein: Determining target operating parameters of the dummy load based on the active power of each power supply device and the power consumption of each power consuming device group includes: determining a total active power based on the active power of each power supply device; determining a total power consumption based on the power consumption of each power consuming device group; and determining a load active power and a load reactive power of the dummy load based on the total active power and the total power consumption, wherein the target operating parameters include the load active power and the load reactive power.

5. The method according to claim 4, wherein: Determining the load active power and load reactive power of the dummy load based on the total active power and the total power consumption includes: determining the difference between the total active power and the total power consumption as the load active power; determining the first reactive power by multiplying the total active power by a first preset ratio; determining the second reactive power by multiplying the total power consumption by a second preset ratio; and determining the difference between the first reactive power and the second reactive power as the load reactive power.

6. The method according to any one of claims 1 to 5, wherein: The test configuration information includes the reactive power of each power supply device and the target operating parameters of the dummy load; According to the test configuration information, controlling the multiple power supply devices to supply power to the multiple power consuming device groups to obtain power supply test results corresponding to the test groups includes: configuring parameters of the dummy load according to the target operating parameters; For any power supply device, configure the parameters of the power supply device according to the reactive power of the power supply device; send a start instruction to the devices in the test group, the start instruction is used to start the devices in the test group Get the operating information of each device in the test group, and determine the power supply test results based on the operating information O 7. The method according to claim 6, wherein: Configuring parameters of the dummy load according to the target operating parameter includes: sending a first configuration instruction to the dummy load, where the first configuration instruction includes the target operating parameter, and the first configuration instruction is used to instruct the dummy load to set an operating parameter to the target operating parameter.

8. The method according to claim 6 or 7, wherein: Configuring parameters of the power supply device according to the reactive power of the power supply device includes: sending a second configuration instruction to the power supply device, where the second configuration instruction includes the reactive power, and the second configuration instruction is used to instruct the power supply device to set the reactive power.

9. The method according to any one of claims 1 to 8, wherein: The test group also includes a rectifier device corresponding to each power consumption device group; determining the test group includes: determining a power supply device set and a power consumption device group set; determining the multiple power consumption device groups in the power consumption device group set, wherein the similarity of the multiple power consumption device groups is greater than or equal to a preset threshold; determining a first number of power supply devices based on the maximum processing power of the rectifier device corresponding to each power consumption device group in the multiple power consumption device groups and the active power of each power supply device; and determining the first number of power supply devices in the power supply device set as the multiple power supply devices.

10. A device testing apparatus, wherein: include: a determination module, a generation module, and a control module, wherein the determination module is configured to determine a test group including multiple power supply devices, at least one power consumption device group, and a dummy load; and the generation module is configured to generate test configuration information based on the active power of each power supply device and the power consumption of each power consumption device group. The control module is configured to control the multiple power supply devices to supply power to the at least one power consuming device group according to the test configuration information, and obtain a power supply test result corresponding to the test group.

11. A test device, wherein: include: at least one processor; and a memory communicatively connected to the at least one processor; wherein the memory stores instructions executable by the at least one processor, and the instructions are executed by the at least one processor to enable the test device to perform the method according to any one of claims 1 to 9.

12. A computer-readable storage medium, wherein: The computer-readable storage medium stores computer-executable instructions, and when the processor executes the computer-executable instructions, the method according to any one of claims 1 to 9 is implemented.

13. A computer program product, comprising a computer program, wherein: When the computer program is executed by a processor, the method according to any one of claims 1 to 9 is implemented.

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