Metallic foreign material analysis system and metallic foreign material analysis method

Abstract

A metallic foreign material analysis system according to exemplary embodiments of the present invention comprises a foreign material analysis unit, wherein the foreign material analysis unit generates respective X-ray transmission images of a sample and a reference sample, image-processes the X-ray transmission image of the sample so as to generate mapping image data of the sample in which metallic foreign materials having a diameter of predetermined range are selectively displayed, and generates component analysis data for each of the metallic foreign materials identified in the mapping image data.

Description

Analysis system for metallic foreign matter and analysis method for metallic foreign matter

[0001] This application claims the benefit of priority from Republic of Korea Patent Application No. 10-2024-0039773, filed on March 22, 2024.

[0002] The present invention relates to a system and method for analyzing metallic foreign substances, which can detect only metallic foreign substances among various foreign substances scattered in electrode manufacturing equipment or manufacturing sites, analyze the components of the detected metallic foreign substances, quantitatively determine the distribution level of the metallic foreign substances, and qualitatively analyze the distribution level by type.

[0003]

[0004] Recently, rechargeable secondary batteries have been widely used as a power source for wireless mobile devices. Furthermore, secondary batteries are also attracting attention as a potential energy source for electric and hybrid electric vehicles, which are being proposed as a solution to air pollution caused by existing gasoline and diesel vehicles that use fossil fuels. Consequently, the applications that utilize secondary batteries are diversifying significantly due to their advantages, and it is expected that secondary batteries will be applied to a wider range of fields and products in the future.

[0005] These secondary batteries are classified into cylindrical and square batteries in which the electrode assembly is built into a cylindrical or square metal can, depending on the shape of the battery case, and pouch-type batteries in which the electrode assembly is built into a pouch-type case made of aluminum laminate sheet. The electrode assembly built into the battery case is a power generation device that is capable of charging and discharging, and is composed of a positive electrode, a negative electrode, and a separator structure interposed between the positive electrode and the negative electrode.

[0006] The above positive and negative electrodes are manufactured through a coating process in which a positive electrode slurry containing a positive electrode active material and a negative electrode slurry containing a negative electrode active material are applied to a positive electrode current collector and a negative electrode current collector, respectively, to form a positive electrode active material layer and a negative electrode active material layer, a rolling process in which the dried electrode is rolled, and a notching and cutting process in which electrode tabs are formed and punched into individual electrode sheets.

[0007] The various manufacturing facilities used in the electrode manufacturing process can contain various foreign substances, both metallic and non-metallic. These foreign substances can become incorporated into the electrodes during the manufacturing process, potentially degrading battery performance. In particular, metallic foreign substances can grow into dendrites, causing internal short-circuits in secondary batteries, leading to battery failure, damage, or even, in severe cases, fire.

[0008] Accordingly, among various types of foreign substances existing in manufacturing facilities such as coating facilities, drying facilities, rolling facilities, notching facilities, and slitting and cutting facilities, it is necessary to quantitatively identify the distribution level of metal foreign substances in particular and manage the level of foreign substances in manufacturing facilities. However, conventional technologies for detecting or analyzing metal foreign substances in the secondary battery field are limited to the detection and analysis of foreign substances existing in products (batteries), and there is currently no standardized method for quickly detecting and quantifying foreign substances, especially metal foreign substances, existing in electrode manufacturing facilities. In addition, conventional methods for detecting and analyzing foreign substances involve capturing foreign substances with tape and then analyzing them with a Scanning Electron Microscope (SEM) or X-Ray Fluorescence (XRF), which takes a very long time, makes it unclear to identify the metal component, and makes the size measurement of foreign substances inaccurate.

[0009] Therefore, there is a need for technological development for a standardized method for detecting metal foreign substances and an analysis method including the same to improve the quality of electrodes.

[0010] [Prior Art Literature]

[0011] (Patent Document 0001) Republic of Korea Patent Publication No. 10-2022-0111364

[0012]

[0013] The problem to be solved by the technical idea of ​​the present invention is to provide a standardized analysis system and analysis method for selectively detecting metallic foreign substances having a predetermined size range among various types of foreign substances existing in electrode manufacturing equipment or electrode manufacturing sites, quantifying the same, and analyzing the components of the detected foreign substances.

[0014] In addition, the present invention aims to provide an analysis system and analysis method that automates the process of detecting metallic foreign substances and performing quantitative / qualitative analysis.

[0015]

[0016] According to exemplary embodiments of the present invention, a system for analyzing metallic foreign matter is provided. The analysis system includes a foreign matter analysis unit, wherein the foreign matter analysis unit is configured to generate X-ray transmission images of each of a specimen and a reference specimen, and is configured to image process the X-ray transmission image of the specimen to generate mapping image data of the specimen in which metallic foreign matters having a diameter within a predetermined range are selectively displayed, and is configured to generate component analysis data for each of the metallic foreign matters identified in the mapping image data.

[0017] In exemplary embodiments, the foreign matter analysis unit may be configured to use X-ray transmission image information of a reference specimen in setting a numerical range of a diameter of a metal foreign matter to be detected in the specimen.

[0018] In exemplary embodiments, the foreign matter analysis unit may be configured to image process an X-ray transmission image of a specimen based on size information of the X-ray transmission image of the reference specimen.

[0019] In exemplary embodiments, the foreign matter analysis unit may be configured to filter out metal foreign matters having a diameter outside a predetermined range, based on size information of an X-ray transmission image of a reference specimen, from an X-ray transmission image of the specimen.

[0020] In exemplary embodiments, the foreign body analysis unit may be configured to generate high-magnification X-ray transmission image data or high-magnification mapping image data.

[0021] In exemplary embodiments, the foreign matter analysis unit may be configured to assign an identification code to each of the metal foreign matters selected and displayed in the mapping image data, and to generate the component analysis data for each identification code.

[0022] In exemplary embodiments, the foreign matter analysis unit may be configured to automatically calculate the number of metal foreign matters and / or the respective sizes of the metal foreign matters in the mapping image data.

[0023] In exemplary embodiments, the component analysis data may include an X-ray fluorescence spectrum.

[0024] In exemplary embodiments, the foreign body analysis unit,

[0025] A stage configured to hold the above-mentioned specimen and reference specimen;

[0026] An X-ray transmission image generation module configured to irradiate X-rays to a specimen and a reference specimen fixed on the stage, detect an X-ray transmission signal transmitted therethrough, and generate an X-ray transmission image based on the detection signal;

[0027] An image processing module configured to image process the X-ray transmission image to generate the above mapping image data; and

[0028] For each of the metal foreign substances displayed in the above mapping image data, a component analysis module configured to generate component analysis data based on X-ray fluorescence analysis may be included.

[0029] The analysis system according to exemplary embodiments may further include a database unit for storing various data received from the foreign matter analysis unit; an input unit configured to input various conditions for detection, image processing, component analysis, and data processing of metal foreign matters by the foreign matter analysis unit; and an output unit configured to output the mapping image data and component analysis data.

[0030] In exemplary embodiments, the reference specimen is a metal, the specimen is a trap paper on which foreign matter captured from an electrode manufacturing facility or manufacturing site is transferred, and the inspection can be performed while the reference specimen and the specimen are arranged on the same plane so as not to overlap each other.

[0031] According to other embodiments of the present invention, a method for analyzing a metallic foreign substance is provided. The method for analyzing a metallic foreign substance includes: a process of collecting foreign substances from an electrode manufacturing facility or manufacturing site to produce a specimen; a process of generating an X-ray transmission image of each of a reference specimen and the specimen using an X-ray foreign substance analysis system; a process of selecting metallic foreign substances having a diameter within a predetermined range from an X-ray transmission image of the specimen using information on the X-ray transmission image of the reference specimen and generating mapping image data in which the selected metallic foreign substances are identified; and a process of performing a component analysis on each of the metallic foreign substances identified in the mapping image data to collect component analysis data.

[0032] In exemplary embodiments, the process for manufacturing the specimen may include a first capturing process in which a dust cleaning roller is first rolled on the surface of the inspection object to capture foreign matter present on the surface of the inspection object with the dust cleaning roller; and a second capturing process in which the first-rolled dust cleaning roller is secondarily rolled on trap paper to transfer foreign matter attached to the dust cleaning roller to the trap paper. At this time, the adhesive component of the trap paper has a stronger adhesive strength than the adhesive component of the dust cleaning roller.

[0033] In exemplary embodiments, the foreign matter analysis system includes a foreign matter analysis unit, and the foreign matter analysis unit is configured to generate X-ray transmission images of each of a specimen and a reference specimen, and is configured to image-process the X-ray transmission images of the specimen to generate mapping image data in which metal foreign matters having a diameter within a predetermined range are selectively displayed, and can be configured to generate component analysis data for each of the metal foreign matters identified in the mapping image data.

[0034] In exemplary embodiments, the foreign matter analysis unit may be configured to image process an X-ray transmission image of a specimen based on size information of the X-ray transmission image of the reference specimen.

[0035] In exemplary embodiments, the component analysis data may include an X-ray fluorescence spectrum.

[0036]

[0037] According to the present invention, a foreign matter analysis system and analysis method are provided that automates the process of selecting metal foreign matters having a size within a predetermined range from among metal foreign matters having various sizes, generating mapping image data indicating their locations, and generating data analyzing the components of each metal foreign matter from the mapping image data.

[0038] According to the present invention, a standardized method is provided for quantifying the distribution level of metal foreign substances of various types and sizes existing in electrode manufacturing equipment or manufacturing sites and for identifying their components.

[0039] According to the present invention, since component analysis is performed only on metal foreign substances having a predetermined size range, the analysis can be completed quickly, which is advantageous for timely response when analyzing the cause of a defect.

[0040] According to the present invention, an identification code is assigned to each metal foreign substance identified in mapping image data, and component analysis data is generated and managed for each identification code, thereby facilitating data management.

[0041]

[0042] Figure 1 is a schematic diagram of an analysis system according to exemplary embodiments of the present invention.

[0043] FIG. 2 is a block diagram of a foreign matter analysis unit according to exemplary embodiments of the present invention.

[0044] Figure 3 is an X-ray transmission image of a reference specimen generated according to exemplary embodiments.

[0045] Figure 4 is an enlarged view of Figure 3.

[0046] Figure 5 illustrates mapping image data according to exemplary embodiments.

[0047] Figure 6 is a flowchart illustrating an analysis method according to exemplary embodiments of the present invention.

[0048] Figure 7 is a flowchart illustrating a process for manufacturing a specimen according to exemplary embodiments of the present invention.

[0049] FIG. 8 is a diagram illustrating a primary capture process according to exemplary embodiments of the present invention.

[0050] FIG. 9 is a diagram illustrating a secondary capture process according to exemplary embodiments of the present invention.

[0051] FIG. 10 is a drawing illustrating a method of mounting a specimen and a reference specimen on a stage according to exemplary embodiments of the present invention.

[0052] [Explanation of symbols]

[0053] 10: Psalm, Trap Paper

[0054] Psalm 20: Reference Psalm

[0055] 100: Metallic Foreign Matter Analysis System

[0056] 110: Foreign Matter Analysis Department

[0057] 120: Database Department

[0058] 130: Input section

[0059] 140: Output section

[0060]

[0061] Hereinafter, preferred embodiments of the present invention will be described in detail with reference to the attached drawings. Prior to this, it should be noted that the terms and words used in this specification and claims should not be construed as limited to their conventional or dictionary meanings. Based on the principle that the inventor can appropriately define the concepts of terms to best explain his or her invention, they should be interpreted in a way that aligns with the technical spirit of the present invention.

[0062] Accordingly, the embodiments described in this specification and the configurations illustrated in the drawings are merely the most preferred embodiments of the present invention and do not represent all of the technical ideas of the present invention. Therefore, it should be understood that there may be various equivalents and modified examples that can replace them at the time of filing this application.

[0063] In addition, when describing the present invention, if it is determined that a detailed description of a related known configuration or function may obscure the gist of the present invention, the detailed description is omitted.

[0064] Since the embodiments of the present invention are provided to more fully explain the present invention to those skilled in the art, the shapes and sizes of components in the drawings may be exaggerated, omitted, or schematically illustrated for clearer explanation. Accordingly, the sizes and proportions of each component do not fully reflect the actual sizes or proportions.

[0065]

[0066] Metallic foreign matter analysis system

[0067] Hereinafter, a system for analyzing metallic foreign matter according to the present invention (hereinafter referred to as “analysis system”) will be described in detail.

[0068] FIG. 1 is a schematic diagram of an analysis system according to exemplary embodiments of the present invention. Referring to FIG. 1, an analysis system (100) according to exemplary embodiments of the present invention may include a foreign substance analysis unit (110). The analysis system (100) may further include a database unit (120), an input unit (130), and an output unit (140).

[0069] The foreign matter analysis unit (110) may be configured to generate X-ray transmission images of each of the specimen (10) and the reference specimen (20). The foreign matter analysis unit (110) may be configured to image-process the X-ray transmission image of the specimen to generate mapping image data of the specimen in which metal foreign matters having a diameter of a predetermined range are selectively displayed. The foreign matter analysis unit (110) may be configured to generate component analysis data for each of the metal foreign matters identified in the mapping image data. Here, the specimen (10) may include foreign matters captured from an electrode manufacturing facility or manufacturing site.

[0070] As described above, the analysis system (100) according to the present invention can perform a series of integrated inspection processes for detecting metal foreign substances present in a specimen, quantitatively determining the distribution level of the detected metal foreign substances, and qualitatively analyzing each component of the metal foreign substances. In addition, since the analysis system (100) utilizes the transmission characteristics of X-rays, it can accurately detect metal foreign substances.

[0071] In addition, the analysis system (100) according to the present invention can be configured to use X-ray transmission image information of a reference specimen in setting the numerical range of the diameter of metal foreign substances to be detected in the specimen. That is, the reference specimen (20) functions to provide a reference value for setting the diameter range of metal foreign substances to be detected in the specimen.

[0072] When the X-ray transmission image of the specimen (10) is not processed, the X-ray transmission image shows all metal foreign bodies of various types and diameters, but it is not necessary to know the distribution level or each component of the metal foreign bodies of all sizes. Rather, it is meaningful to know the distribution level or each component of metal foreign bodies of a certain size or larger or of metal foreign bodies of a certain size range.

[0073] The analysis system (100) according to the present invention detects metal foreign substances in a specimen based on the transmission signal of X-rays, selectively detects metal foreign substances larger than a certain size or having a size within a certain range, and performs component analysis only on these, so that the distribution level of significant metal foreign substances and each component thereof can be identified very quickly, and a standardized method for identifying the types and distribution levels of foreign substances existing in electrode manufacturing equipment or manufacturing sites can be provided.

[0074] In exemplary embodiments, the specimen (10) may be a trap paper onto which foreign matter captured from an electrode manufacturing facility or manufacturing site has been transferred. Specific details regarding the method for manufacturing the trap paper, etc. will be described later.

[0075] In exemplary embodiments, the reference specimen (20) is not particularly limited as long as it is a metal material. As a non-limiting example, the reference specimen (20) may be an alloy including one metal or two or more metals selected from the group consisting of iron (Fe), copper (Cu), chromium (Cr), nickel (Ni), manganese (Mn), cobalt (Co), and aluminum (Al).

[0076] In exemplary embodiments, the reference specimen (20) may include a metal having a diameter corresponding to a diameter range of metal foreign substances to be detected in the specimen (20). Specifically, when metal foreign substances having a diameter of 20 μm or more are to be detected in the specimen (10), the reference specimen (20) may include a metal having a diameter of 20 μm. Additionally, when metal foreign substances in the range of 15 to 20 μm are to be detected in the specimen, the reference specimen may include both a metal having a diameter of 15 μm and a metal having a diameter of 20 μm.

[0077] In exemplary embodiments, the analysis system (100) may be configured to perform the inspection while the reference specimen (20) and the specimen (10) are positioned on the same plane so as not to overlap each other.

[0078] FIG. 10 is a drawing showing a method of placing a specimen and a reference specimen on a stage according to exemplary embodiments of the present invention. Referring to FIG. 10, a specimen (10) and a reference specimen (20) are placed on a stage (111), and are placed on the same plane so that they do not overlap each other. The purpose of placing the specimen (10) and the reference specimen (20) in this manner is to simultaneously acquire X-ray transmission images of the reference specimen (20) and the specimen (10). Accordingly, the foreign matter analysis unit (110) can quickly filter out metal foreign matters that do not have a size to be detected from the X-ray transmission image of the specimen, based on the X-ray transmission image information of the reference specimen.

[0079] In exemplary embodiments, the foreign matter analysis unit (110) may be configured to generate the X-ray transmission image by a digital method that converts an X-ray transmission signal into an electrical signal to generate an image. Accordingly, the analysis system (100) of the present invention can quickly filter out metal foreign matters that do not have a size to be detected based on the number of pixels of the reference specimen in the digitized X-ray transmission image.

[0080] In exemplary embodiments, the foreign matter analysis unit (110) may be configured to image process the X-ray transmission image of the specimen based on size information of the X-ray transmission image of the reference specimen. Here, the size information of the X-ray transmission image of the reference specimen may be, for example, the number of pixels. Accordingly, mapping image data of the specimen in which metal foreign matters having a diameter within a predetermined range are selectively displayed may be generated. That is, the foreign matter analysis unit (110) may generate mapping image data in which metal foreign matters having a diameter within a predetermined range are selectively displayed through image processing that filters out metal foreign matters having a diameter outside a predetermined range based on size information of the X-ray transmission image of the reference specimen (20) in the X-ray transmission image of the specimen (10).

[0081] In exemplary embodiments, the foreign matter analysis unit (110) may be configured to generate high-magnification X-ray transmission images or high-magnification mapping image data. The size of the metal foreign matters to be detected is typically several micrometers to several tens of micrometers, making it difficult to identify with the naked eye, but the metal foreign matters can be identified through high-magnification images.

[0082] In exemplary embodiments, the foreign matter analysis unit (110) may be configured to assign an identification code to each metal foreign matter identified in the mapping image data and generate component analysis data for each identification code. Accordingly, the analysis system can collect and manage component analysis data for each identification code, facilitating data processing.

[0083] In exemplary embodiments, the foreign matter analysis unit (110) may be configured to automatically calculate the number of metal foreign matters and / or the respective sizes of the metal foreign matters in the mapping image data. Specifically, when a range is specified in the mapping image data through the input unit (130), the foreign matter analysis unit (110) may be configured to automatically calculate the number of metal foreign matters and / or the respective sizes of the metal foreign matters included in the specified range. Here, the size of the metal foreign matter may be the area of ​​the metal foreign matter, which may be calculated by the number of pixels. However, the present invention is not limited thereto.

[0084] Fig. 2 is a block diagram of a foreign matter analysis unit (110) according to exemplary embodiments of the present invention. Referring to Fig. 2, the foreign matter analysis unit (110) according to exemplary embodiments may include a stage (111), an X-ray transmission image generation module (112), an image processing module (113), and a component analysis module (114).

[0085] In exemplary embodiments, the stage (111) may be configured to secure the specimen (10) and the reference specimen (20).

[0086] In exemplary embodiments, the X-ray transmission image generation module (112) may be configured to irradiate X-rays to both the specimen (10) and the reference specimen (20) fixed on the stage (111), detect X-ray transmission signals transmitted therethrough, and generate X-ray transmission images of each of the specimen (10) and the reference specimen (20) based on the detection signals.

[0087] In exemplary embodiments, the X-ray transmission image generation module (112) may include an X-ray generating device (not shown) that irradiates X-rays to both the specimen (10) and the reference specimen (20); and a detector (not shown) configured to receive X-rays transmitted through the specimen (10) and the reference specimen (20) and generate an X-ray transmission image, which is an image that displays the received energy corresponding to a position corresponding to a two-dimensional plane.

[0088] When X-rays are irradiated on the specimen (10) and the reference specimen (20), the X-rays pass through them, and the X-ray detector detects different energies depending on the type of material present in the specimen (10) and the reference specimen (20). Through the difference in intensity of the X-ray transmission signal, metal foreign substances can be detected in the specimen. In addition, the location, distribution form, etc. of the metal foreign substances can be identified through the X-ray transmission image that visualizes the detection results.

[0089] In some embodiments, the X-ray transmission image can distinguish metal foreign bodies through black and white contrast. In a preferred embodiment, the detector can generate the X-ray transmission image by a digital method that converts an X-ray transmission signal into an electrical signal to generate an image. Specifically, the detector can generate the X-ray transmission image by a digital radiography method.

[0090] Fig. 3 is an X-ray transmission image of a reference specimen produced according to exemplary embodiments, and Fig. 4 is an enlarged view of Fig. 3. The reference specimen is composed of two iron-chromium alloys each having a diameter of 15 μm, two iron-chromium alloys each having a diameter of 20 μm, and one iron-chromium alloy each having a diameter of 30 μm, and their X-ray transmission images are as shown in Fig. 4. The right triangle shape seen in the X-ray transmission images illustrated in Figs. 3 and 4 is a kind of marker for indicating the reference specimen with the naked eye.

[0091] In exemplary embodiments, the image processing module (113) may be configured to image-process the X-ray transmission image to generate the mapping image data. That is, the mapping image data may be an X-ray transmission image of the specimen that has been image-processed under appropriate conditions. In exemplary embodiments, the image processing module (113) may be configured to image-process the X-ray transmission image of the specimen based on X-ray transmission image information of the reference specimen. Accordingly, the foreign matter analysis unit (110) according to the present invention may generate mapping image data in which metal foreign matters having a diameter range within a predetermined range, or metal foreign matters having a size greater than the diameter of the reference specimen, are selectively displayed in the X-ray transmission image of the specimen. As a result, the image processing module (113) may generate mapping image data in which metal foreign matters that are not detection targets in the X-ray transmission image of the specimen are filtered out.

[0092] Additionally, in exemplary embodiments, the image processing module (113) may be configured to assign an identification code to each metal foreign body having a diameter within a predetermined range. The identification code may be a letter, number, symbol, or a combination of two or more thereof. Accordingly, the analysis system of the present invention can easily process and manage each component analysis data of the metal foreign bodies identified by the identification code in the mapping image data.

[0093] Figure 5 illustrates mapping image data according to exemplary embodiments.

[0094] Referring to Figure 5, each of the multiple squares represents a specimen. Specifically, Figure 5 depicts mapping image data for multiple specimens. Multiple points are marked within each specimen, each of which is assigned an identification code. Therefore, operators can collect and manage component analysis data based on each identification code.

[0095] In exemplary embodiments, the component analysis module (114) may be configured to generate component analysis data based on X-ray fluorescence analysis for each of the metal foreign substances identified in the mapping image data.

[0096] X-ray fluorescence analysis is a technology that utilizes the unique interaction between elementary X-rays and matter, and is an analytical technique used in various fields such as metal and alloy analysis, forensics, food analysis, and environmental analysis. This is called XRF analysis. X-ray fluorescence analysis can analyze matter at the elemental level. When a specimen is analyzed using X-ray fluorescence analysis, each element present emits a unique X-ray signal in the form of a spectrum. Specific X-rays of various elements can be separated into a complete fluorescence energy spectrum. Therefore, the above elemental analysis data can include each X-ray fluorescence spectrum of metal foreign substances.

[0097] The above database unit (120) may be configured to store various data received from the foreign matter analysis unit. The various data include mapping image data of the specimen and component analysis data of each metal foreign matter. The component analysis data may be an X-ray fluorescence energy spectrum matched with each identification code of the metal foreign matter.

[0098] In addition, in exemplary embodiments, the database unit (120) may store X-ray fluorescence energy spectra of various types of metal elements as reference data. Accordingly, by comparing the X-ray fluorescence spectra of each metal foreign substance detected in the specimen with the reference data, the constituent elements of the metal foreign substances can be determined.

[0099] The above input unit (130) may be configured to input various conditions for detection of metal foreign substances, image processing, component analysis, and data processing by the foreign substance analysis unit. For example, the input unit may be a keyboard, mouse, etc., but is not limited thereto.

[0100] The above output unit (140) may be configured to output mapping image data and component analysis data. For example, the output unit may be a monitor, but is not limited thereto.

[0101] The analysis system according to the present invention offers a simple analysis process and can provide a standardized analysis method for determining the distribution level of metal foreign matter among foreign matter scattered in electrode manufacturing facilities or on-site. Furthermore, rather than analyzing all foreign matter, component analysis is performed only on metal foreign matter within a certain size range, enabling rapid completion of the analysis, facilitating timely response when analyzing the cause of a defect.

[0102]

[0103] Method for analyzing metallic foreign matter

[0104] FIG. 6 is a flowchart for explaining a method for analyzing metallic foreign matter (hereinafter referred to as “analysis method”) according to exemplary embodiments of the present invention.

[0105] Referring to FIG. 6, an analysis method according to exemplary embodiments of the present invention may include a process of producing a specimen (P110), a process of generating X-ray transmission images of each of the specimen and the reference specimen (P120), a process of generating mapping image data of the specimen (P130), and a process of collecting component analysis data (P140).

[0106] The process of manufacturing a specimen (P110) may be a process of manufacturing a specimen so that foreign substances can be easily detected by capturing foreign substances from the inspection object. The inspection object may refer to an electrode manufacturing facility or an electrode manufacturing site. The electrode manufacturing facility refers to various facilities for manufacturing an electrode, and may include, but is not limited to, facilities for manufacturing electrode slurry, facilities for coating electrode slurry, facilities for transporting a current collector sheet, facilities for drying an electrode, facilities for rolling an electrode, facilities for notching an electrode, and facilities for cutting an electrode.

[0107] Figure 7 is a flowchart illustrating a process for producing a specimen according to exemplary embodiments of the present invention. Referring to Figure 7, the process (P110) for producing a specimen may include a first capture process (P111); and a second capture process (P112).

[0108] The first capturing process (P111) may be a process of first rolling a dust cleaning roller on the surface of the inspection object to capture foreign substances present on the surface of the inspection object with the dust cleaning roller.

[0109] FIG. 8 is a diagram illustrating a first capturing process according to exemplary embodiments of the present invention. Referring to FIG. 8, in order to capture foreign substances present in an inspection object, a worker rolls a foreign substance cleaning roller (2) positioned on the surface of the inspection object (1). The foreign substance cleaning roller (2) may be configured to be able to attach to the surface of the foreign substance cleaning roller (2) present on the surface of the inspection object by rolling. For example, the surface of the foreign substance cleaning roller (2) may be coated with an adhesive material, so that foreign substances present on the rolling portion of the inspection object can be attached to the surface of the foreign substance cleaning roller (2).

[0110] The secondary capture process (P112) may be a process of rolling the primary rolled foreign matter cleaning roller a second time on trap paper to transfer foreign matter attached to the foreign matter cleaning roller to the trap paper.

[0111] FIG. 9 is a diagram illustrating a secondary capturing process according to exemplary embodiments of the present invention. Referring to FIG. 9, when the first rolled foreign matter cleaning roller (2) is rolled on the trap paper (3), foreign matters attached to the foreign matter cleaning roller (2) are transferred to the trap paper (3) by the adhesive component of the trap paper (3). At this time, the foreign matters are transferred as a single layer (mono-layer) on the trap paper (3).

[0112] The surface of the trap paper (3) is coated with an adhesive component so that foreign substances attached to the surface of the foreign substance cleaning roller (2) can be transferred to the trap paper (3). The adhesive component has a stronger adhesive strength than the adhesive component of the foreign substance cleaning roller. Therefore, when the foreign substance cleaning roller (2) rolls on the surface of the trap paper (3), foreign substances attached to the foreign substance cleaning roller (2) can be transferred to the trap paper (3). The trap paper (3) on which foreign substances have been transferred can be closed and stored with a trap cap (4), thereby preventing contamination of the trap paper. The trap cap (4) may be provided with a transparent window (4a) made of a transparent film.

[0113] The process of generating the above X-ray transmission image (P120) may be a process of generating each X-ray transmission image of the reference specimen and the specimen using an X-ray-based foreign matter analysis system.

[0114] The foreign matter analysis system may be the foreign matter analysis system described above. For example, the foreign matter analysis system (100) may include the foreign matter analysis unit (110). In addition, the foreign matter analysis unit (110) is configured to generate X-ray transmission images of each of a specimen and a reference specimen including foreign matters captured from an electrode manufacturing facility or a manufacturing site, and is configured to image-process the X-ray transmission image of the specimen to generate mapping image data of the specimen in which metal foreign matters having a diameter within a predetermined range are selectively displayed, and may be configured to generate component analysis data for each of the metal foreign matters identified in the mapping image data.

[0115] The above foreign substance analysis system (100) may further include the database unit (120), input unit (130), and output unit (130) described above.

[0116] The foreign matter analysis unit (110) can be configured to irradiate X-rays to the specimen (10) and the reference specimen (20), detect X-ray transmission signals transmitted therethrough, and generate X-ray transmission images of each of the specimen (10) and the reference specimen (20) based on the detection signals. A method of detecting metal foreign matters using X-ray transmission images has the effect of enabling accurate / rapid detection.

[0117] The process of generating the above mapping image data (P130) may be a process of selecting metal foreign substances having a diameter within a predetermined range from the X-ray transmission image of the specimen using information on the X-ray transmission image of the reference specimen, and generating mapping image data in which the selected metal foreign substances are identified.

[0118] In exemplary embodiments, the foreign matter analysis unit (110) may be configured to image process an X-ray transmission image of a specimen based on size information of an X-ray transmission image of a reference specimen. That is, the foreign matter analysis unit (110) may generate mapping image data in which metal foreign matters having a diameter within a predetermined range are selectively displayed through image processing that filters out metal foreign matters having a diameter outside a predetermined range in the X-ray transmission image of the specimen.

[0119] The process of collecting the above component analysis data (P140) may be a process of collecting component analysis data by performing component analysis on each metal foreign substance identified in the mapping image data. The component data may include an X-ray fluorescence spectrum.

[0120] Since the above foreign substance analysis system has been described in detail above, redundant description will be omitted.

[0121] The method for analyzing metallic foreign matter according to the present invention provides a standardized method for quantitatively determining the distribution level of metallic foreign matter among foreign matters existing in electrode manufacturing equipment or manufacturing sites. In addition, since X-ray transmission images of each of a specimen and a reference specimen are generated, and mapping image data of the specimen in which metallic foreign matters having a size to be detected are selectively displayed using information on the X-ray transmission image of the reference specimen, the distribution level of significant metallic foreign matters can be quickly and accurately detected. In addition, component analysis data is generated for each metallic foreign matter identified in the mapping image data, an identification code is assigned to each metallic foreign matter identified in the mapping image data, and component analysis data is generated and managed for each identification code, making data management easy.

[0122]

[0123] The present invention has been described in more detail through drawings and examples. However, the configurations described in the drawings or examples described in this specification are merely embodiments of the present invention and do not represent all of the technical ideas of the present invention. Therefore, it should be understood that various equivalents and modified examples may exist as of the time of this application.

Claims

1. A metallic foreign matter analysis system including a foreign matter analysis unit configured to generate X-ray transmission images of each of a specimen and a reference specimen, configured to image-process the X-ray transmission images of the specimen to generate mapping image data of the specimen in which metallic foreign matters having a diameter of a predetermined range are selectively displayed, and configured to generate component analysis data for each of the metallic foreign matters identified in the mapping image data.

2. In paragraph 1, A metallic foreign matter analysis system characterized in that the foreign matter analysis unit is configured to use X-ray transmission image information of a reference specimen in setting a numerical range of the diameter of the metallic foreign matter to be detected in the specimen.

3. In paragraph 1, A metallic foreign matter analysis system characterized in that the above foreign matter analysis unit is configured to image process an X-ray transmission image of a specimen based on size information of an X-ray transmission image of a reference specimen.

4. In paragraph 1, A metallic foreign matter analysis system characterized in that the foreign matter analysis unit is configured to filter out metallic foreign matters having a diameter outside a predetermined range based on size information of an X-ray transmission image of a reference specimen in an X-ray transmission image of the specimen.

5. In paragraph 1, A metallic foreign matter analysis system characterized in that the foreign matter analysis unit is configured to generate high-magnification X-ray transmission image or high-magnification mapping image data.

6. In paragraph 1, A metallic foreign matter analysis system characterized in that the foreign matter analysis unit is configured to assign an identification code to each of the metallic foreign matters selected and displayed in the mapping image data and to generate the component analysis data for each identification code.

7. In paragraph 1, A metallic foreign matter analysis system characterized in that the foreign matter analysis unit is configured to automatically calculate the number of metallic foreign matters and / or the respective sizes of the metallic foreign matters from the mapping image data.

8. In paragraph 1, A system for analyzing metallic foreign matter, characterized in that the above component analysis data includes an X-ray fluorescence spectrum.

9. In paragraph 1, The above foreign substance analysis unit, A stage configured to hold the above-mentioned specimen and reference specimen; An X-ray transmission image generation module configured to irradiate X-rays to a specimen and a reference specimen fixed on the stage, detect an X-ray transmission signal transmitted therethrough, and generate an X-ray transmission image based on the detection signal; An image processing module configured to image process the X-ray transmission image to generate the above mapping image data; and A metallic foreign matter analysis system including a component analysis module configured to generate component analysis data based on X-ray fluorescence analysis for each of the metallic foreign matters displayed in the above mapping image data.

10. In paragraph 1, A database section for storing various data received from the foreign substance analysis section; An input unit configured to input various conditions for detection, image processing, component analysis and data processing of metal foreign substances by the foreign substance analysis unit; and A metallic foreign matter analysis system further comprising an output unit configured to output the above mapping image data and component analysis data.

11. In paragraph 1, The above reference specimen is metal, The above specimen is a trap paper on which foreign matter captured from the electrode manufacturing facility or manufacturing site has been transferred. A system for analyzing metallic foreign matter, characterized in that the inspection is performed while the reference specimen and the specimen are placed on the same plane so that they do not overlap each other.

12. A process of producing a specimen by collecting foreign substances from the electrode manufacturing facility or manufacturing site; A process of creating X-ray transmission images of a reference specimen and a specimen using an X-ray foreign body analysis system; A process of selecting metal foreign bodies having a diameter of a predetermined range from the X-ray transmission image of the specimen using information on the X-ray transmission image of the reference specimen, and generating mapping image data of the specimen in which the selected metal foreign bodies are identified; and A method for analyzing metallic foreign matter, comprising a process of performing component analysis on each metallic foreign matter identified in mapping image data and collecting component analysis data.

13. In paragraph 12, The process of making the above psalm is: A primary collection process in which a dust cleaning roller is first rolled on the surface of the inspection object to collect foreign substances present on the surface of the inspection object using the dust cleaning roller; and A secondary capturing process in which the first rolled foreign matter cleaning roller is rolled a second time on trap paper to transfer foreign matter attached to the foreign matter cleaning roller to the trap paper; A method for analyzing metallic foreign matter, characterized in that the adhesive component of the trap paper has a greater adhesive strength than the adhesive component of the foreign matter cleaning roller.

14. In paragraph 12, The above foreign substance analysis system, A method for analyzing metallic foreign matter, characterized by comprising a foreign matter analysis unit configured to generate X-ray transmission images of each of a specimen and a reference specimen, configured to image-process the X-ray transmission image of the specimen to generate mapping image data in which metallic foreign matters having a diameter of a predetermined range are selectively displayed, and configured to generate component analysis data for each of the metallic foreign matters identified in the mapping image data of the specimen.

15. In paragraph 11, A method for analyzing a metallic foreign matter, characterized in that the foreign matter analysis unit is configured to image-process an X-ray transmission image of a specimen based on size information of the X-ray transmission image of a reference specimen.

16. In paragraph 11, A method for analyzing a metallic foreign body, characterized in that the above component analysis data includes an X-ray fluorescence spectrum.

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