Method and apparatus for processing chip testing data, computer device, readable storage medium, and program product

Abstract

The present application relates to a method and apparatus for processing chip testing data, a computer device, a computer-readable storage medium, and a computer program product. According to the method, when it is detected that a test machine has executed a chip testing task, chip testing data generated by the test machine executing the chip testing task is acquired, the chip testing data is statistically processed on the basis of a preset statistical index to obtain an index parameter corresponding to the statistical index, and the statistical index of the chip testing task and the corresponding index parameter are displayed in a preconfigured data display page; thus, due to the fact that a data processing terminal communicates with the test machine by means of a socket, real-time acquisition and observational analysis of the chip testing data can be implemented, so that a tester can intuitively learn about a test process of a chip without manual data recording, thereby improving data processing efficiency and timeliness.

Description

Methods, apparatus, computer equipment, readable storage media, and program products for processing chip test data

[0001] Related applications

[0002] This application claims priority to Chinese patent application filed on June 20, 2024, application number 2024108007784, entitled "Method, Apparatus, Computer Equipment, Readable Storage Medium and Program Product for Processing Chip Test Data", the entire contents of which are incorporated herein by reference. Technical Field

[0003] This application relates to the field of data processing technology, and in particular to a method, apparatus, computer equipment, computer-readable storage medium, and computer program product for processing chip test data. Background Technology

[0004] With the development of the semiconductor industry and the continuous expansion of industry demand, the chip testing industry is also booming. In semiconductor chip testing, test data can provide key quality indicators such as performance parameters, power consumption, and temperature. By analyzing this data, manufacturers can promptly identify and resolve anomalies in the production process, adjust production parameters, and optimize production processes, thereby improving the quality and yield of chip production. Furthermore, once abnormal data is found in the chip data, fault diagnosis and problem resolution can be carried out in a timely manner.

[0005] In traditional semiconductor chip testing, relevant data is typically recorded during the testing process and analyzed using external tools such as Excel after the test is completed. However, due to the large volume and complexity of the test data, Excel does not provide a clear overview of the changes in each data point and is also inefficient. Summary of the Invention

[0006] According to various embodiments of this application, a method, apparatus, computer device, computer-readable storage medium, and computer program product for processing chip test data are provided.

[0007] In a first aspect, this application provides a method for processing chip test data. The method is applied to a data processing terminal, which communicates with a test machine via a socket. The method includes:

[0008] When the test machine is detected to be performing a chip test task, the chip test data generated by the test machine performing the chip test task is collected;

[0009] Based on preset statistical indicators, the chip test data is statistically processed to obtain indicator parameters corresponding to the statistical indicators.

[0010] The pre-configured data display page shows the statistical indicators and corresponding indicator parameters of the chip testing task.

[0011] In one embodiment, the method further includes: collecting new chip test data generated during the chip test task performed by the test machine, and updating the indicator parameters in the data display page based on the new chip test data.

[0012] In one embodiment, the method further includes: displaying a layered visualization configuration window in response to a layered visualization configuration operation on the data display page; obtaining corresponding layered visualization configuration information based on the layered visualization configuration window, the layered visualization configuration information including a target statistical indicator to be displayed in layers, a first parameter range of the indicator parameters corresponding to the target statistical indicator, and a display style; and updating the data display page according to the layered visualization configuration information.

[0013] In one embodiment, the method further includes: in response to an indicator visualization configuration operation on a target statistical indicator in the data display page, obtaining corresponding indicator visualization configuration information, the indicator visualization configuration information including at least one of a second parameter range and a display method for the indicator parameters of the target statistical indicator; and updating the data display page according to the indicator visualization configuration information.

[0014] In one embodiment, the indicator visualization configuration operation includes at least one of filtering, sorting, and screening the indicator parameters in the target statistical indicator.

[0015] In one embodiment, the data display page is automatically generated after the test machine is configured with chip test tasks.

[0016] In one embodiment, the method further includes: in response to a chart configuration operation of a target statistical indicator in the data display page, obtaining corresponding chart configuration information, the chart configuration information including chart type, chart attributes, and the indicator range of the target statistical indicator; generating a target chart based on the chart configuration information, and displaying the target chart in the data display page.

[0017] In one embodiment, the method further includes: when the test machine has completed the chip test task, generating a PDF file corresponding to the chip test task based on the chip test data, corresponding statistical indicators, indicator parameters and target charts generated by the chip test task, and storing the PDF file corresponding to the chip test task in a specified location.

[0018] In one embodiment, the method further includes: when it is detected that the test machine has completed the chip test task, acquiring the data collected by the test machine during the execution of the chip test task; generating a PDF file based on the collected data, the PDF file corresponding to the chip test task.

[0019] In one embodiment, the method further includes storing the PDF file in a specified location.

[0020] In one embodiment, the data collected by the test machine during the execution of the chip test task includes at least one of the following: chip test data generated by the test machine during the execution of the chip test task, corresponding statistical indicators, indicator parameters, and target charts.

[0021] In one embodiment, the method further includes: acquiring historical chip test data for historical chip test tasks; performing statistical processing on the historical chip test data based on preset statistical indicators to obtain indicator parameters corresponding to the statistical indicators; and displaying the statistical indicators and corresponding indicator parameters of the historical chip test tasks on a pre-configured data display page.

[0022] Secondly, this application also provides a chip test data processing apparatus, which is applied to a data processing terminal. The data processing terminal communicates with a test machine via a Socket. The apparatus includes:

[0023] The data acquisition module is used to acquire chip test data generated by the test machine when it is detected that the test machine is performing a chip test task;

[0024] The data analysis module is used to perform statistical analysis on the chip test data based on preset statistical indicators to obtain indicator parameters corresponding to the statistical indicators.

[0025] The display module is used to display the statistical indicators and corresponding indicator parameters of the chip testing task on a pre-configured data display page.

[0026] Thirdly, this application also provides a computer device, including a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to implement the steps of the above-described method.

[0027] Fourthly, this application also provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the steps of the above-described method.

[0028] Fifthly, this application also provides a computer program product, including a computer program that, when executed by a processor, implements the steps of the above-described method.

[0029] Details of one or more embodiments of this application are set forth in the following drawings and description. Other features, objects, and advantages of this application will become apparent from the specification, drawings, and claims. Attached Figure Description

[0030] To more clearly illustrate the technical solutions in the embodiments of this application or the conventional technology, the drawings used in the description of the embodiments or the conventional technology will be briefly introduced below. Obviously, the drawings described below are only embodiments of this application. For those skilled in the art, other drawings can be obtained based on the disclosed drawings without creative effort.

[0031] Figure 1 is an application environment diagram of a chip test data processing method in one embodiment;

[0032] Figure 2 is a flowchart illustrating a chip test data processing method in one embodiment;

[0033] Figure 3 is a schematic diagram of the initial data display page in one embodiment;

[0034] Figure 4 is a schematic diagram of the configuration of the data display page in one embodiment;

[0035] Figure 5 is a schematic diagram of a real-time data display page in one embodiment;

[0036] Figure 6 is a schematic diagram of a layered visual configuration window in one embodiment;

[0037] Figure 7 is a schematic diagram of the indicator visualization configuration in one embodiment;

[0038] Figure 8 is a schematic diagram of the indicator visualization configuration window in one embodiment;

[0039] Figure 9 is a structural block diagram of a chip test data processing device in one embodiment;

[0040] Figure 10 is an internal structure diagram of a computer device in one embodiment. Detailed Implementation

[0041] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0042] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.

[0043] The chip test data processing method provided in this application embodiment can be applied to the application environment shown in Figure 1. The data processing terminal 102 communicates with the test machine 104 via a Socket (a network communication mechanism that allows bidirectional communication between application processes on different computers). Specifically, the data processing terminal 102 can be, but is not limited to, various personal computers, laptops, smartphones, tablets, IoT devices, and portable wearable devices. IoT devices can be smart speakers, smart TVs, smart in-vehicle devices, projection devices, etc. Portable wearable devices can be smartwatches, smart bracelets, etc. The test machine 104 includes a backplane and multiple test boards (such as board 1, board 2, ... board n) inserted into the backplane. The multiple test boards can perform functional tests on at least one chip under test connected to the backplane. In this embodiment, when the data processing terminal 102 detects that the test machine 104 is performing a chip test task, it can collect the chip test data generated by the test machine in real time through Socket, and perform statistical processing on the chip test data based on preset statistical indicators to obtain the indicator parameters corresponding to the statistical indicators. Then, the statistical indicators and corresponding indicator parameters of the chip test task are displayed on the pre-configured data display page to realize real-time observation and analysis of the chip test data.

[0044] In an exemplary embodiment, as shown in FIG2, a method for processing chip test data is provided. Taking the application of this method to the data processing terminal in FIG1 as an example, the method may specifically include the following steps:

[0045] Step 202: When it is detected that the test machine is performing a chip test task, collect the chip test data generated by the test machine performing the chip test task.

[0046] Chip testing tasks are related to performing functional tests on the chip under test based on the test target, including but not limited to testing the chip's performance parameters, power consumption, and temperature. Chip testing data refers to the relevant data generated by the test machine during the execution of chip testing tasks, such as the chip's performance parameters, power consumption, and temperature.

[0047] In this embodiment, the data processing terminal communicates with the test machine via a Socket. Therefore, when the test machine performs a chip test task, the data processing terminal can detect the relevant dynamics of the test machine in real time and collect the chip test data generated by the chip under test during the chip test task.

[0048] Step 204: Based on preset statistical indicators, perform statistical processing on the chip test data to obtain the indicator parameters corresponding to the statistical indicators.

[0049] In this context, statistical indicators are concepts (or names) that reflect the quantitative characteristics of the overall phenomena in a chip testing task. In this embodiment, statistical indicators include, but are not limited to, the cumulative number of tests, maximum value, median value, minimum value, upper limit value, lower limit value, range value, standard deviation, process capability ratio (CP), and process capability index (CPK) for a specific chip testing task. Indicator parameters are the specific numerical values ​​of concepts reflecting the quantitative characteristics of the overall phenomena, i.e., the specific numerical values ​​of the statistical indicators. Examples include the specific number of tests, the specific value of the maximum value, the specific value of the median value, the specific value of the minimum value, the specific value of the upper limit value, the specific value of the lower limit value, the specific value of the range value, the specific value of the standard deviation, the specific value of the process capability ratio (CP), and the specific value of the process capability index (CPK). Statistical processing is the process of summarizing and calculating the collected chip testing data based on certain statistical indicators to obtain the corresponding indicator parameters.

[0050] Specifically, after the data processing terminal collects the chip test data generated by the chip under test during the chip test task performed by the test machine through the above steps, it performs statistical processing on the chip test data based on the pre-set statistical indicators to obtain the indicator parameters corresponding to the statistical indicators.

[0051] Step 206: Display the statistical indicators and corresponding indicator parameters of the chip test task on the pre-configured data display page.

[0052] The data display page can be a pre-configured visualization page for displaying statistical indicators and corresponding indicator parameters of chip testing tasks. In this embodiment, the data processing terminal can display the statistical indicators and corresponding indicator parameters of chip testing tasks on the pre-configured data display page. Specifically, the statistical indicators and corresponding indicator parameters of chip testing tasks can be displayed in tabular form on the data display page, allowing testers to intuitively understand the chip testing process.

[0053] In the above-mentioned chip test data processing method, when the chip test machine is detected to be performing a chip test task, the chip test data generated by the chip test machine is collected. Based on preset statistical indicators, the chip test data is statistically processed to obtain the indicator parameters corresponding to the statistical indicators. The statistical indicators and corresponding indicator parameters of the chip test task are displayed on a pre-configured data display page. Since the data processing terminal communicates with the test machine through Socket, real-time acquisition and observation analysis of chip test data can be realized, allowing testers to intuitively understand the chip test process without the need for manual data entry, thus improving the efficiency and timeliness of data processing.

[0054] In an exemplary embodiment, the method may further include: collecting new chip test data generated during the execution of chip testing tasks by the test machine, and updating the indicator parameters in the data display page based on the new chip test data. Here, new chip test data refers to chip test data newly generated during the execution of chip testing tasks by the test machine. It is understood that the process of the test machine executing chip testing tasks is continuous, the chip under test continuously generates chip test data, and the data processing terminal can continuously collect chip test data and update the indicator parameters in the data display page based on each collected chip test data, thereby achieving real-time collection, statistics, and updating of chip test data.

[0055] In one exemplary embodiment, the data display page can be automatically generated after the chip test task is set on the test machine. Specifically, when the test machine needs to perform a chip test task, a corresponding test project can be created in the test machine, and a chip test task for the chip under test can be set. Then, the data processing terminal can automatically generate a data display page corresponding to the chip test task. In this embodiment, since the data processing terminal communicates with the test machine via Socket, after the chip test task is set on the test machine, the data processing terminal can obtain the corresponding chip test task through Socket and generate the initial data display page as shown in Figure 3. This page includes an operation area 310, a statistical indicator area 320, and a chart area 330.

[0056] The page shown in Figure 3 can be configured according to actual needs. Specifically, the configuration menu shown in Figure 4 can be displayed by clicking the mouse anywhere on the page to configure the statistical indicators to be displayed. It is understood that based on the configuration operation in Figure 4, the page in Figure 3 can be updated, that is, the statistical indicator section specifically displayed in the statistical indicator area 320 of the page in Figure 3 can be updated. Furthermore, when the test machine is performing chip testing tasks, the data processing terminal can collect the chip test data generated by the test machine in real time through Socket, and perform statistical processing on the collected chip test data based on the statistical indicators configured in Figure 4 to obtain the indicator parameters corresponding to the statistical indicators. The statistical indicators and corresponding indicator parameters of the chip testing task can then be displayed on the data display page, specifically in the form of Table 100 as shown in Figure 5. As the testing machine continuously executes chip testing tasks, the chip under test continuously generates chip test data. The data processing terminal continuously collects the chip test data and updates the index parameters in Table 100 shown in Figure 5 based on each collected chip test data, thereby realizing real-time collection, statistics and updating of chip test data, so that testers can intuitively understand the chip testing process in real time.

[0057] In an exemplary embodiment, the method may further include: displaying a layered visualization configuration window in response to a layered visualization configuration operation on the data display page; obtaining corresponding layered visualization configuration information based on the layered visualization configuration window; and updating the data display page according to the layered visualization configuration information. The layered visualization configuration operation is an operation used to request configuration of layered data display; specifically, it may be a click operation on the "FS" (Flag Statistics) control shown in Figure 5. The layered visualization configuration window is the window interface used to configure the layered data display; specifically, it may be the window interface shown in Figure 6, i.e., clicking the "FS" control in Figure 5 will jump to the window interface shown in Figure 6. The layered visualization configuration information may include the target statistical indicator to be displayed in layers, the first parameter range of the indicator parameters corresponding to the target statistical indicator, and the display style. Specifically, the target statistical indicator refers to the statistical indicator that needs to be displayed in layers, the first parameter range refers to the range of indicator parameters corresponding to the target statistical indicator that needs to be displayed in layers, and the display style includes, but is not limited to, specific background color, font color, font size, and font.

[0058] As shown in Figure 6, if the target statistical indicators to be displayed in layers are "Lower Limit" and "Range", and the first parameter range for "Lower Limit" is "Lower Limit > 0.2", the corresponding display style is red font, indicating that the statistical indicator parameters in "Lower Limit" that are greater than 0.2 are displayed in red font. If the first parameter range for "Range" is "Range > 0.5", the corresponding display style is yellow font, indicating that the statistical indicator parameters in "Range" that are greater than 0.5 are displayed in yellow font. The data processing device then updates the data display page based on the acquired layered visualization configuration information, that is, updates the display style of Table 100, as shown in Figure 6.

[0059] This embodiment displays different data ranges by customizing them and highlighting important data with different styles such as colors. By clearly showing key information and trend changes in the data and emphasizing the key points of data in different ranges, it can help testers quickly identify important data, meet the personalized needs of testers for data analysis, help testers make decisions more quickly, find problematic data, and improve the user experience.

[0060] In an exemplary embodiment, the method may further include: in response to a chart configuration operation for a target statistical indicator on a data display page, obtaining corresponding chart configuration information, generating a target chart based on the chart configuration information, and displaying the target chart on the data display page. The chart configuration operation is an operation used to request chart configuration. The chart configuration information includes chart type, chart attributes, and the indicator range of the target statistical indicator. Chart type includes, but is not limited to, line charts, bar charts, etc. Chart attributes refer to the definition and range of the x-axis and y-axis corresponding to a specific chart. The indicator range is the range corresponding to the statistical indicator to be displayed through the chart, such as which sites (i.e., which chip pins) for a certain statistical indicator need to be displayed in the same chart.

[0061] Specifically, chart configuration operations can be performed on the chart areas shown in Figure 5. The TREND and HISTOGRAM chart areas are for configuring different types of charts, respectively. For example, the TREND chart area is used to configure line charts, and the HISTOGRAM chart area is used to configure bar charts. The "MAX" (maximum value) and "MIN" (minimum value) options allow setting the parameter range for the target statistical indicator, i.e., the parameter definition and interval range for the x-axis and y-axis of the specific chart. The "Legend" option allows setting the range corresponding to the statistical indicator to be displayed in the chart, such as which sites for a certain statistical indicator should be displayed in the same chart; multiple sites can be separated by commas. The target chart is the specific chart displayed based on the relevant chart configuration information, such as the line chart and bar chart in Figure 5. As shown in Figure 5, the line chart and bar chart not only display the trend of data changes, but also update the latest data in real time during the real-time data acquisition process. The line chart can intuitively show the changes in data with the number of chip tests. By observing the trend of the line chart, it is easier to identify the growth, decline, or stabilization trend of the data, thereby making corresponding analysis and decisions. Bar charts, on the other hand, can highlight outliers or specific data points. Each bar displays the value of a different site through different forms or colors, allowing for a quick understanding of the relative magnitude of the data without the need for in-depth analysis of data details. This enables rapid analysis and decision-making, improving the efficiency of data processing and analysis, and achieving diversified data display.

[0062] In an exemplary embodiment, the method may further include: in response to an indicator visualization configuration operation for a target statistical indicator on the data display page, obtaining corresponding indicator visualization configuration information, and updating the data display page according to the indicator visualization configuration information. The indicator visualization configuration information includes at least one of a second parameter range and a display method for the indicator parameters of the target statistical indicator. The indicator visualization configuration operation is an operation used to request configuration of the indicator visualization display. Specifically, it may be an operation on the "Section" control shown in Figure 5. For example, as shown in Figure 7, by checking the "Section" control, dragging the slider, or custom inputting data, the interval to be calculated is determined. Clicking "Cal" calculates and displays the data for the current interval, thus updating the data display page. Simultaneously, the line chart and bar chart are also updated synchronously. This embodiment allows testers to easily customize the display of specific data, improving user experience and enhancing users' understanding and control of the data, thereby helping users better cope with complex data analysis tasks and business challenges.

[0063] In one scenario, the indicator visualization configuration operation can also involve filtering, sorting, and selecting data in Table 100 as shown in Figure 5. Specifically, clicking (e.g., single-clicking or double-clicking) a target statistical indicator in the statistical indicators shown in Figure 5 will navigate to the indicator visualization configuration window shown in Figure 8. Here, AscendingOrder sorts the corresponding indicator parameters in ascending order, and DescendingOrder sorts them in descending order. Strings can be freely entered in the Filter field, separated by commas ','. When the input is a number, special characters such as a hyphen '-' can be added to indicate a range. For example, entering "100-" displays test data for indicators with parameters greater than or equal to 100, while entering "100-200" displays test data for indicators with parameters greater than or equal to 100 and less than or equal to 200, thus updating the data display page. This allows for customized display of specific data, improves user experience, enhances testers' understanding and control of the data, and helps them better handle complex data analysis tasks and business challenges.

[0064] In an exemplary embodiment, the above method may further include: upon detecting that the test machine has completed the chip testing task, generating a PDF file corresponding to the chip testing task based on the chip testing data, corresponding statistical indicators, indicator parameters, and target charts generated by the chip testing task, and storing the PDF file corresponding to the chip testing task in a specified location. Specifically, upon detecting that the test machine has completed the chip testing task, the data processing terminal may also support exporting and saving the data collected in real time during chip testing in PDF format after collection. For example, after the chip test is completed, the tester can click the "SAVE DATA" control as shown in Figure 5. Based on this operation, the data processing terminal generates a PDF file corresponding to the chip testing task based on the chip testing data, corresponding statistical indicators, indicator parameters, and target charts generated by the chip testing task, and stores the PDF file corresponding to the chip testing task in a specified location, thereby facilitating the tester to compare and view the data changes of each batch later.

[0065] In an exemplary embodiment, the method may further include: acquiring historical chip test data for historical chip test tasks; performing statistical processing on the historical chip test data based on preset statistical indicators to obtain indicator parameters corresponding to the statistical indicators; and displaying the statistical indicators and corresponding indicator parameters of the historical chip test tasks on a pre-configured data display page. The historical chip test data refers to the chip test data generated by the tester after testing the chip for historical chip test tasks in a historical period. In this embodiment, historical chip test data can also be imported into the data processing terminal. Specifically, this can be done by clicking the "LOAD STDF" (import file) control as shown in Figure 5 to import the historical chip test data in STDF format. This allows the data processing terminal to perform statistical processing on the imported historical chip test data based on preset statistical indicators to obtain indicator parameters corresponding to the statistical indicators, and to display the statistical indicators and corresponding indicator parameters of the historical chip test tasks on a pre-configured data display page, thereby enabling the analysis and comparison of historical chip test data.

[0066] It should be understood that although the steps in the flowcharts of the embodiments described above are shown sequentially according to the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless explicitly stated herein, there is no strict order restriction on the execution of these steps, and they can be executed in other orders. Moreover, at least some steps in the flowcharts of the embodiments described above may include multiple steps or multiple stages. These steps or stages are not necessarily completed at the same time, but can be executed at different times. The execution order of these steps or stages is not necessarily sequential, but can be performed alternately or in turn with other steps or at least some of the steps or stages of other steps.

[0067] Based on the same inventive concept, this application also provides a chip test data processing apparatus for implementing the chip test data processing method described above. The solution provided by this apparatus is similar to the implementation described in the above method; therefore, the specific limitations in one or more chip test data processing apparatus embodiments provided below can be found in the limitations of the chip test data processing method described above, and will not be repeated here.

[0068] In an exemplary embodiment, as shown in FIG9, a chip test data processing device is provided, applied to a data processing terminal. The data processing terminal communicates with a test machine via a Socket. The device includes: a data acquisition module 902, a data analysis module 904, and a display module 906, wherein:

[0069] The data acquisition module 902 is used to acquire chip test data generated by the test machine when it is detected that the test machine is performing a chip test task;

[0070] The data analysis module 904 is used to perform statistical analysis on the chip test data based on preset statistical indicators to obtain indicator parameters corresponding to the statistical indicators.

[0071] Display module 906 is used to display the statistical indicators and corresponding indicator parameters of the chip testing task in a pre-configured data display page.

[0072] In one exemplary embodiment, the device further includes an update module for collecting new chip test data generated during the chip testing process performed by the test machine, and updating the indicator parameters in the data display page based on the new chip test data.

[0073] In an exemplary embodiment, the update module is further configured to: display a layered visualization configuration window in response to a layered visualization configuration operation on the data display page; obtain corresponding layered visualization configuration information based on the layered visualization configuration window, wherein the layered visualization configuration information includes a target statistical indicator to be displayed in layers, a first parameter range of the indicator parameters corresponding to the target statistical indicator, and a display style; and update the data display page according to the layered visualization configuration information.

[0074] In an exemplary embodiment, the update module is further configured to: in response to an indicator visualization configuration operation on the target statistical indicator in the data display page, obtain corresponding indicator visualization configuration information, wherein the indicator visualization configuration information includes at least one of a second parameter range and a display method for the indicator parameters of the target statistical indicator; and update the data display page according to the indicator visualization configuration information.

[0075] In an exemplary embodiment, the display module is further configured to: in response to a chart configuration operation of a target statistical indicator in the data display page, obtain corresponding chart configuration information, the chart configuration information including chart type, chart attributes and indicator range of the target statistical indicator; generate a target chart based on the chart configuration information, and display the target chart in the data display page.

[0076] In an exemplary embodiment, the device further includes a data export module, configured to generate a PDF file corresponding to the chip test task based on the chip test data, corresponding statistical indicators, indicator parameters, and target charts generated by the chip test task when the test machine has completed the chip test task, and store the PDF file corresponding to the chip test task in a specified location.

[0077] In an exemplary embodiment, the device further includes a data import module for acquiring historical chip test data for historical chip test tasks; performing statistical processing on the historical chip test data based on preset statistical indicators to obtain indicator parameters corresponding to the statistical indicators; and displaying the statistical indicators and corresponding indicator parameters of the historical chip test tasks on a pre-configured data display page.

[0078] Each module in the aforementioned chip test data processing device can be implemented entirely or partially through software, hardware, or a combination thereof. These modules can be embedded in or independent of the processor in a computer device, or stored in the memory of a computer device as software, so that the processor can call and execute the operations corresponding to each module.

[0079] As used herein, the terms “component,” “module,” and “system,” etc., are intended to refer to a computer-related entity that can be hardware, a combination of hardware and software, software, or software in execution. For example, a component can be, but is not limited to, a process running on a processor, a processor, an object, executable code, an executing thread, a program, and / or a computer. For illustration, an application running on a server and the server itself can both be components. One or more components may reside in a process and / or an executing thread, and components may be located within a single computer and / or distributed across two or more computers.

[0080] In an exemplary embodiment, a computer device is provided, which may be a terminal, and its internal structure diagram is shown in Figure 10. The computer device includes a processor, memory, input / output interface, communication interface, display unit, and input device. The processor, memory, and input / output interface are connected via a system bus, and the communication interface, display unit, and input device are also connected to the system bus via the input / output interface. The processor of the computer device provides computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and internal memory. The non-volatile storage medium stores an operating system and computer programs. The internal memory provides an environment for the operation of the operating system and computer programs in the non-volatile storage medium. The input / output interface of the computer device is used for exchanging information between the processor and external devices. The communication interface of the computer device is used for wired or wireless communication with external terminals; wireless communication can be achieved through Wi-Fi, mobile cellular networks, Near Field Communication (NFC), or other technologies. When the computer program is executed by the processor, it implements a method for processing chip test data. The display unit of the computer device is used to form a visually visible image and may be a display screen, a projection device, or a virtual reality imaging device. The display screen can be an LCD screen or an e-ink screen. The input device of the computer device can be a touch layer covering the display screen, or buttons, trackballs, or touchpads set on the casing of the computer device, or external keyboards, touchpads, or mice, etc.

[0081] Those skilled in the art will understand that the structure shown in Figure 10 is merely a block diagram of a portion of the structure related to the present application and does not constitute a limitation on the computer device to which the present application is applied. Specific computer devices may include more or fewer components than those shown in the figure, or combine certain components, or have different component arrangements.

[0082] In one exemplary embodiment, a computer device is provided, including a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to implement the steps in the above-described method embodiments.

[0083] In one embodiment, a computer-readable storage medium is provided having a computer program stored thereon, which, when executed by a processor, implements the steps in the above method embodiments.

[0084] In one embodiment, a computer program product is provided, including a computer program that, when executed by a processor, implements the steps in the above method embodiments.

[0085] It should be noted that the user information (including but not limited to user device information, user personal information, etc.) and data (including but not limited to data used for analysis, data stored, data displayed, etc.) involved in this application are all information and data authorized by the user or fully authorized by all parties, and the collection, use and processing of the relevant data must comply with relevant regulations.

[0086] Those skilled in the art will understand that all or part of the processes in the methods of the above embodiments can be implemented by a computer program instructing related hardware. The computer program can be stored in a non-volatile computer-readable storage medium, and when executed, it can include the processes of the embodiments of the above methods. Any references to memory, databases, or other media used in the embodiments provided in this application can include at least one of non-volatile memory and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, optical memory, high-density embedded non-volatile memory, resistive random access memory (ReRAM), magnetic random access memory (MRAM), ferroelectric random access memory (FRAM), phase change memory (PCM), graphene memory, etc. Volatile memory can include random access memory (RAM) or external cache memory, etc. By way of illustration and not limitation, RAM can take many forms, such as Static Random Access Memory (SRAM) or Dynamic Random Access Memory (DRAM). The databases involved in the embodiments provided in this application may include at least one type of relational database and non-relational database. Non-relational databases may include, but are not limited to, blockchain-based distributed databases. The processors involved in the embodiments provided in this application may be general-purpose processors, central processing units, graphics processing units, digital signal processors, programmable logic devices, quantum computing-based data processing logic devices, artificial intelligence (AI) processors, etc., and are not limited to these.

[0087] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0088] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this patent application should be determined by the appended claims.

Claims

1. A method for processing chip test data, characterized in that, The method is applied to a data processing terminal, which communicates with a test machine via a Socket. The method includes: When the test machine is detected to be performing a chip test task, the chip test data generated by the test machine performing the chip test task is collected; Based on preset statistical indicators, the chip test data is statistically processed to obtain indicator parameters corresponding to the statistical indicators. The pre-configured data display page shows the statistical indicators and corresponding indicator parameters of the chip testing task.

2. The method according to claim 1, characterized in that, The method further includes: New chip test data generated during the chip test task performed by the test machine is collected, and the indicator parameters in the data display page are updated based on the new chip test data.

3. The method according to claim 1, characterized in that, The method further includes: In response to the hierarchical visualization configuration operation of the data display page, the hierarchical visualization configuration window is displayed; Based on the layered visualization configuration window, obtain the corresponding layered visualization configuration information, which includes the target statistical indicators to be displayed in layers, the first parameter range of the indicator parameters corresponding to the target statistical indicators, and the display style. The data display page is updated based on the hierarchical visualization configuration information.

4. The method according to claim 1, characterized in that, The method further includes: In response to the indicator visualization configuration operation of the target statistical indicator in the data display page, the corresponding indicator visualization configuration information is obtained. The indicator visualization configuration information includes at least one of the second parameter range and display method of the indicator parameters for the target statistical indicator. The data display page is updated based on the visualization configuration information of the aforementioned indicators.

5. The method according to claim 4, characterized in that, The indicator visualization configuration operation includes at least one of filtering, sorting, and screening of indicator parameters in the target statistical indicator.

6. The method according to any one of claims 1 to 5, characterized in that, The data display page is automatically generated after the chip test task is configured on the test machine.

7. The method according to any one of claims 1 to 5, characterized in that, The method further includes: In response to the chart configuration operation of the target statistical indicator in the data display page, the corresponding chart configuration information is obtained, including the chart type, chart attributes and the indicator range of the target statistical indicator; The target chart is generated based on the chart configuration information and displayed on the data display page.

8. The method according to claim 7, characterized in that, The method further includes: Obtain historical chip test data for historical chip test tasks; Based on preset statistical indicators, the historical chip test data is statistically processed to obtain indicator parameters corresponding to the statistical indicators. The pre-configured data display page shows the statistical indicators and corresponding indicator parameters of the historical chip test tasks.

9. The method according to any one of claims 1 to 5, characterized in that, The method further includes: If the test machine has completed the chip test task, the data collected during the execution of the chip test task by the test machine will be acquired. A PDF file is generated based on the collected data, and the PDF file corresponds to the chip testing task.

10. The method according to claim 9, characterized in that, The method further includes: Store the PDF file in the specified location.

11. The method according to claim 9, characterized in that, The data collected by the testing machine during the chip testing task includes: The test machine generates at least one of the following during the execution of the chip test task: chip test data, corresponding statistical indicators, indicator parameters, and target charts.

12. A chip test data processing device, characterized in that, The device is applied to a data processing terminal, which communicates with a testing machine via a Socket. The device includes: The data acquisition module is used to acquire chip test data generated by the test machine when it is detected that the test machine is performing a chip test task; The data analysis module is used to perform statistical analysis on the chip test data based on preset statistical indicators to obtain indicator parameters corresponding to the statistical indicators. The display module is used to display the statistical indicators and corresponding indicator parameters of the chip testing task on a pre-configured data display page.

13. A computer device comprising a memory and a processor, wherein the memory stores a computer program, characterized in that, When the processor executes the computer program, it implements the steps of the method according to any one of claims 1 to 11.

14. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by a processor, it implements the steps of the method according to any one of claims 1 to 11.

15. A computer program product, comprising a computer program, characterized in that, When the computer program is executed by a processor, it implements the steps of the method according to any one of claims 1 to 11.

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