Temperature control for heat detector testing

Abstract

Methods for performing a compensation and heating process that compensates for the temperature of an environment around a heat detector (250) are provided. Corresponding heat detector testing devices (200) and non-transitory computer-readable mediums are also provided. In a further aspect, a method for calibrating a heat detector testing device is provided. A corresponding heat detector testing device and non-transitory computer-readable medium is also provided.

Description

[0001] Temperature Control for Heat Detector Testing

[0002] TECHNICAL FIELD

[0003] The present invention relates to testing the operation of hazard detectors and particularly compensating for the ambient environment that may affect the performance of a hazard detector testing device.

[0004] BACKGROUND

[0005] Hazard detection systems can utilise a variety of sensors to detect hazards, including smoke sensors, heat sensors, gas sensors, etc. Equipment to carry out functional testing of different types of hazard detector is already known. In such equipment, test stimulus can be designed to replicate the hazard in a non-hazardous fashion (e.g. heat, simulated smoke), so that the correct operation of the detector and / or the system can be verified without the risk of duplicating the real hazard (e.g. a real fire). Carrying out a functional test may normally require an operator to manually initiate a test on a hazard detector, determine whether a test was a success by manually checking for an output from the hazard detector under test, and then manually logging the result of the test before moving on to the next detector to be tested. This relies on an operator correctly carrying out an assessment and can be prone to errors. Whilst testing hazard detectors that rely on heat stimulus, the environment can affect the performance of the hazard detector testing device during a test.

[0006] SUMMARY OF THE INVENTION

[0007] The inventors have appreciated that the ambient temperature of an environment surrounding a hazard detector can affect the performance of the hazard detector tester when performing a functional test on a hazard detector such as a heat detector that relies on heat stimulus. The functional test is a type of test that may be carried out from outside of the heat detector in order to verify the correct operation of the heat detector. Such a test may be indicative of a real hazard condition such as a fire where heat may be present in the environment surrounding the hazard detector (outside the hazard detector). It is desirable to provide an improved heat detector testing device and method that compensates for the ambient temperature.

[0008] From a first aspect, the present invention provides a method comprising: obtaining predetermined data relating to a temperature of operation of a heat detector testing device wherein the predetermined data is determined prior to a functional test on a heat detector that is located in an environment within which a functional test is to be carried out; and performing a compensation and heating process that compensates for the temperature of an environment around the heat detector, the performing comprising: obtaining data relating to a temperature of operation of the heat detector testing device wherein the data is determined during a functional test on the heat detector; determining a compensation factor that compensates for a temperature of the environment around the heat detector using the predetermined data and the obtained data determined during the functional test on the heat detector; adjusting a first parameter relating to a temperature of operation of a heat detector testing device based on the compensation factor; and generating a control signal that controls heat output of the heat detector testing device based on the adjusted first parameter during the functional test.

[0009] From a second aspect, the present invention provides a device corresponding to the first aspect, the heat detector testing device comprising: a controller configured to: obtain predetermined data relating to a temperature of operation of a heat detector testing device wherein the predetermined data is determined prior to a functional test on a heat detector that is located in an environment within which a functional test is to be carried out; and perform a compensation and heating process that compensates for the temperature of an environment around the heat detector, the performing comprising: obtain data relating to a temperature of operation of the heat detector testing device wherein the data is determined during a functional test on the heat detector; determine a compensation factor that compensates for a temperature of the environment around the heat detector using the predetermined data and the obtained data determined during the functional test on the heat detector; adjust a first parameter relating to a temperature of operation of a heat detector testing device based on the compensation factor; and generate a control signal that controls heat output of the heat detector testing device based on the adjusted first parameter during the functional test.

[0010] From a third aspect, the present invention provides a non-transitory computer-readable medium corresponding to the first aspect, the non-transitory computer-readable medium storing instructions, the instructions, when executed by one or more controllers, causing the one or more controllers to perform operations comprising: obtaining predetermined data relating to a temperature of operation of a heat detector testing device wherein the predetermined data is determined prior to a functional test on a heat detector that is located in an environment within which a functional test is to be carried out; and perform a compensation and heating process that compensates for the temperature of an environment around the heat detector, the performing comprising: obtaining data relating to a temperature of operation of the heat detector testing device wherein the data is determined during a functional test on the heat detector; determining a compensation factor that compensates for a temperature of the environment around the heat detector using the predetermined data and the obtained data determined during the functional test on the heat detector; adjusting a first parameter relating to a temperature of operation of a heat detector testing device based on the compensation factor; and generating a control signal that controls heat output of the heat detector testing device based on the adjusted first parameter during the functional test.

[0011] From a fourth aspect, the present invention provides a method for calibrating a heat detector testing device, the method comprising: measuring a temperature at a reference point where a heat detector is to be located during a functional test; adjusting a first parameter relating to a temperature of operation of the testing device such that the measured temperature at the reference point corresponds to a predefined reference temperature, wherein the predefined reference temperature is representative of a temperature at which the heat detector is to be activated during the functional test; and storing the adjusted first parameter of the testing device.

[0012] From a fifth aspect, the present invention provides a system for calibrating a heat detector testing device corresponding to the fourth aspect, the system comprising: a heat sensor configured to measure a temperature at a reference point where the heat detector is to be located during a functional test; a controller configured to: adjust a first parameter relating to a temperature of operation of the testing device such that the measured temperature at the reference point corresponds to a predefined reference temperature, wherein the predefined reference temperature is representative of a temperature at which a heat detector is to be activated during the functional test; and a storage unit configured to store the adjusted first parameter of the testing device.

[0013] From a sixth aspect, the present invention provides a non-transitory computer-readable medium corresponding to the fourth aspect, the non-transitory computer-readable medium storing instructions, the instructions, when executed by one or more controllers, causing the one or more controllers to perform operations comprising: obtaining a temperature at a reference point where a heat detector is to be located during a functional test; adjusting a first parameter relating to a temperature of operation of the testing device such that the measured temperature at the reference point corresponds to a predefined reference temperature, wherein the predefined reference temperature is representative of a temperature at which the heat detector is to be activated during the functional test; and storing the adjusted first parameter of the testing device.

[0014] From a seventh aspect, the present invention provides a method comprising: obtaining predetermined data relating to a temperature of operation of a heat detector testing device and predetermined data relating to a temperature of an environment around a heat detector that is located in an environment within which a functional test is to be carried out wherein the predetermined data is determined prior to a functional test on the heat detector; and perform a compensation and heating process that compensates for the temperature of an environment around the heat detector, the performing comprising: obtaining data relating to a temperature of an environment around a heat detector that is located in an environment within which a functional test is to be carried out; determining a compensation factor that compensates for a temperature of the environment around the heat detector using the predetermined data obtained and the obtained data; adjusting a first parameter relating to the temperature of an operation of the heat detector testing device based on the compensation factor; and generating a control signal that controls heat output of the heat detector testing device based on the adjusted first parameter during the functional test.

[0015] From an eighth aspect, the present invention provides a device corresponding to the seventh aspect, the heat detector testing device comprising: a controller configured to: obtain predetermined data relating to a temperature of operation of a heat detector testing device and predetermined data relating to a temperature of an environment around a heat detector that is located in an environment within which a functional test is to be carried out wherein the predetermined data is determined prior to a functional test on the heat detector; and perform a compensation and heating process that compensates for the temperature of an environment around the heat detector, the performing comprising: obtain data relating to a temperature of an environment around a heat detector that is located in an environment within which a functional test is to be carried out; determine a compensation factor that compensates for a temperature of the environment around the heat detector using the predetermined data obtained and the obtained data; adjust a first parameter relating to the temperature of an operation of the heat detector testing device based on the compensation factor; and generate a control signal that controls heat output of the heat detector testing device based on the adjusted first parameter during .

[0016] From a ninth aspect, the present invention provides a non-transitory computer-readable medium storing instructions corresponding to the seventh aspect, the non-transitory computer- readable medium storing instructions, the instructions, when executed by one or more controllers, causing the one or more controllers to perform operations comprising: obtain predetermined data relating to a temperature of operation of a heat detector testing device and predetermined data relating to a temperature of an environment around a heat detector that is located in an environment within which a functional test is to be carried out wherein the predetermined data is determined prior to a functional test on the heat detector; and performing a compensation and heating process that compensates for the temperature of an environment around the heat detector, the performing comprising: obtaining data relating to a temperature of an environment around a heat detector that is located in an environment within which a functional test is to be carried out; determining a compensation factor that compensates for a temperature of the environment around the heat detector using predetermined data obtained and the obtained data; adjusting a first parameter relating to the temperature of an operation of the heat detector testing device based on the compensation factor; and generating a control signal that controls heat output of the heat detector testing device based on the adjusted first parameter during the functional test.

[0017] Further optional features relating to these aspects are provided in the appended dependent claims.

[0018] BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Examples of the invention will now be described with reference to the accompanying drawings in which:

[0020] Figure 1 shows a schematic diagram of an example of the heat detector testing device;

[0021] Figure 2 shows a schematic diagram of the heat detector testing device according to a first example of the invention;

[0022] Figure 3 shows a schematic diagram of the system for calibrating the heat detector testing device of Figure 2;

[0023] Figure 4 shows a flow diagram of an example method for compensating ambient temperature during a test on the heat detector using the heat detector testing device of Figure 2;

[0024] Figure 5 shows a flow diagram of the method for determining the compensation factor;

[0025] Figure 6 shows a flow diagram of the method for calibrating the heat detector testing device using the system of Figure 3;

[0026] Figure 7 shows a flow diagram of an example of the method for compensating ambient temperature during a test on the heat detector using the heat detector testing device.

[0027] Figure 8 shows a schematic diagram of the heat detector testing device according to a second example of the invention; Figure 9 shows a flow diagram of an example method for compensating ambient temperature during a test on the heat detector using the heat detector testing device of Figure 8;

[0028] Figure 10 shows a schematic diagram of a dispensing tool that includes some or all of the elements of the heat detector testing device of Figure 1 , Figure 2, Figure 3 or Figure 8;

[0029] DETAILED DESCRIPTION

[0030] Examples described herein relate to a real-time compensation for ambient temperatures or conditions surrounding a hazard detector particularly by a heat detector testing device or apparatus which is used to test a heat detector which is a type of hazard detector that relies on heat stimulus to be activated. The ambient environment within which a heat detector is located can affect the performance of a heat detector testing device. Examples of the detrimental effect on the performance of the heat detector testing device and / or the heat detector include one or more of the following: causing false results (e.g., false positives or negatives) such that the heat detector is perceived as faulty because of failing a test when it was, in fact, operating correctly resulting in early unnecessary replacement of the heat detector; reducing battery life of the heat detector testing device due to inefficient use of the battery power; and causing the need for repeat testing in colder environments and damaging heat detector housing due to overheating in warmer environments. Ambient temperature conditions that are not taken into account can decrease the accuracy and efficiency of a heat detector testing device which may result in early replacement of the device and wasted physical resources.

[0031] According to some examples in the present disclosure, one or more of the aforementioned detrimental effects are addressed and there is provided an improved heat detector testing device with an improved accuracy and efficiency by compensating in real-time for ambient temperature conditions, over a wide ambient temperature range, during a test on the heat detector.

[0032] The compensation that compensates for the ambient or surrounding environment temperature may be achieved through a number of different techniques. In one example, the real-time compensation is achieved without a heat sensor that measures the temperature representative of the ambient temperature of an environment surrounding a heat detector directly. There is a determination of a compensation factor based on predetermined data obtained prior to the test on the heat detector, for example, during a calibration process, and based on data obtained during the test. The output then results in changing the temperature output of the testing device such that it takes into account the surrounding ambient temperature of the environment. In another example, the real-time compensation is achieved by the heat detector testing device comprising a heat sensor that measures the ambient temperature surrounding the heat detector during the testing process, such a heat sensor forming part of the testing device or located elsewhere in the environment surrounding the heat detector. A compensation factor is determined based on the ambient temperature measurement. The temperature output of the testing device is adjusted such that it takes into account the temperature of the environment surrounding the heat detector.

[0033] Referring to figure 1 , there is shown a heat detector testing device 100.

[0034] In this example, the heat detector testing device 100 comprises a controller 110. The controller

[0035] 110 may comprise a plurality of components, some of which are described below according to an example. The controller 110 may be a microcontroller or other processing or computing device such as a programmable logic device (PLD) that can carry out instructions. The controller 110 may include multiple processing elements that are integrated in a single device as described in the example below or distributed across devices.

[0036] The controller 110 of the heat detector testing device 100 may comprise a controller data input / output unit 111 to receive input data from external components including, but not limited to, a storage unit 113 and a sensing arrangement 130. The controller data input / output unit

[0037] 111 may also output data from the controller to other external components including, but not limited to, a heating device that may include a heating element 150.

[0038] The controller 110 of the heat detector testing device 100 may further comprise a processor

[0039] 112 to manage all the components within the controller 110 and process all data flow between the components within the controller 110.

[0040] The controller 110 of the heat detector testing device 100 may further comprise a storage unit

[0041] 113 to store data or instructions which may need to be accessed at a later stage. The time extent to which the data is stored in the memory unit 113 may vary depending on the various data requirements of the controller 110. In an example, the stored data may comprise predefined measured parameters such as the ambient temperature, the temperature of operation of the testing device and the power applied to the heating element that was measured prior to the testing process. In some examples, the temperature of operation of the testing device may correspond specifically to the temperature of the heating element. The stored data may also comprise data related to the resistivity curve of the material (e.g., an alloy) that is heated in the heating element 150. This resistivity curve comprises the relationship between the resistance of the material and the temperature of the material. Certain types of alloys can have a property that as they heat up, their resistance changes. The resistivity curve can be used to derive the temperature of the heating element. The voltage and / or current applied to the element may be sensed to determine the resistance.

[0042] The controller 110 may be configured to determine a difference between the predetermined data that was determined prior to a functional test on a heat detector and the obtained data that was determined during the functional test; and calculate the compensation factor based, at least in part, on the determined difference wherein the determined difference is proportional to a temperature offset caused by the temperature of the environment around the heat detector.

[0043] The heat detector testing device 100 as shown in figure 1 may further comprise a sensing arrangement 130. The sensing arrangement may be configured to measure a second parameter relating to a temperature of operation of the heat detector testing device. In an example, the sensing arrangement 130 may comprise a heat sensor configured to detect the temperature of operation of the testing device (which may correspond to the temperature of the heat emitted from heating element 150). The second parameter may be the temperature of the heating element. In an example, the heat sensor may be a thermistor. In another example, the sensing arrangement 130 may comprise a current sensor and / or voltage sensor to measure the current flowing through a sense resistor (or the voltage) that has been applied to the heating element 150. The sensing arrangement 130 is not limited to the above- mentioned sensor(s). The hazard detector that is being tested using the heat detector testing device relies on a heat stimulus which the heat detector testing device provides through the heating element 150. Any sensing element which may be configured to measure the temperature and / or power (or voltage) of the heating element may be implemented as the sensing arrangement 130.

[0044] The heat detector testing device 100 as shown in figure 1 may further comprise a heating element 150. The heating element 150 is configured to heat air passing through the heat detector testing device 100 before it is emitted from the device 100 towards an outer housing of and into the hazard (heat) detector to carry out a functional test of the hazard detector from the outside of the hazard detector housing and to activate an alarm state of the hazard detector. The controller 110 may be configured to selectively control the activation and / or the temperature of the heating element 150. The heating element 150 is configured to emit heat from the testing device based on a control signal that is generated by the controller 110. The heat stimulus is to replicate a hazard in a non-hazardous fashion. In an example, heat may be generated through the process of joule heating of the heating element such as a wire coil, or flat ribbon resistive medium. The temperature that the heater heating element outputs may be controlled via pulse width modulation, PWM, or DC voltage or another appropriate control mechanism whilst monitoring the heating element resistance.

[0045] Referring to figure 2 (and figure 1 when referencing the example heat detector testing device 100), there is shown an example of a heat detector testing device 200 and a heat detector 250 located within a portion of the heat detector testing device 200. The heat detector testing device can be a device which blows hot air onto a heat detector to test alarm activation.

[0046] The heat detector testing device 200 may comprise a fan or a blower 201 that is configured to create an airflow in the testing device 200. This airflow is to help circulate the air within the testing device 200 and blow heated air from the testing device 200 onto a hazard detector 250 to test alarm activation such that the heated air from the heating element 150 reaches a reference point, which is the position in the testing device where the heat detector 250 is to be located during a test on the heat detector 250. Hence the fan is also configured to direct heated air towards the reference point. By blowing air from outside the testing device to within the testing device, the air blown into the testing device may be affected by ambient conditions (e.g., ambient temperature).

[0047] The heat detector testing device 200 may further comprise a heater block enclosure 202. The heater block enclosure 202 is configured to help the airflow to be directed towards the heating element 150 such that the air can be heated to provide a heat stimulus for the heat detector 250. The heater block enclosure 202 may be connected to and located at one end of a heater duct assembly 206 and the other end of the heater duct assembly 206 may comprise the blower 201 to draw in ambient air to be heated into the testing device 200. The testing device 200 encloses the hazard detector 250 within a cup 205 forming part of the testing device 200.

[0048] The heat detector testing device 200 may further comprise a heating element 203 that may correspond to the heating element 150 in figure 1. In an example, the heating element 203 may comprise a heater wire.

[0049] The heat detector testing device 200 may further comprise a heat sensor 204 that may correspond to an example of the sensing arrangement 130 in figure 1. In an example, the heat sensor 204 may comprise a hot air temperature sensor. The heat detector testing device 200 may further comprise a controller 210 that may correspond to an example of the controller 110 in figure 1.

[0050] Referring to figure 3, there is shown a system 300 for calibrating a heat detector testing device 200 that occurs prior to testing the heat detector. In this example, the heat detector testing device is that the same as that in figure 2 and like reference numerals are used where appropriate. The system 300 comprises the heat detector testing device 200 as well as a heat sensor 301. The heat sensor 301 is configured to measure a temperature at a reference point which is representative of a position where a corresponding sensor of a heat detector is located relative to a testing device during a functional test. This heat sensor 301 is representative of a sensor of a heat detector that is to detect heat and cause activation of the alarm condition when heat to cause the alarm condition is detected. The heat sensor is a separate device to the heat detector testing device 200 and may be built into a test fixture in a factory test environment (compared to an environment in the field). The purpose of the heat sensor 301 is to ensure that the temperature at the reference point equates (or at least as closely as possible corresponds) to a predefined reference temperature that is representative of a temperature at which a heat detector is to be activated during a test. This is because the heat detector testing device does not have heat sensor at the reference point during a functional test as the heat detector to be tested occupies this space during a functional test. The heat sensor 204 within the testing device 200 is located near the heating element 203 of the testing device 200. The positional difference between the position of the heat sensor 204 and the position of the reference point may result in a temperature error due to the influence of the ambient temperature of the environment where a test is to be carried out (e.g. in the field). This temperature error (or temperature offset) is compensated for according to examples disclosed herein, as discussed further below.

[0051] In an example, the factory calibration process includes adjustment of heat output from the testing device to equal the reference temperature at the reference point. The heating element 203 temperature and power values or setpoints (otherwise known as the element temperature and element power setpoints) are recorded and stored in a storage unit of the testing device 200 (which may be equivalent to the storage unit 113 of figure 1).

[0052] The reference temperature is determined by a typical heat detector product specification of a heat detector that may be located in the field such as heat detector 250 from figure 2. As heat detectors may each have different activation temperatures, the heat detector testing device may have two settings: a first standard setting which has a maximum threshold of 90°C and a second high heat setting which has a maximum threshold of 115°C. The heat detector testing device is capable of activating heat detectors that have an activation temperature which is lower than these thresholds. Generally, a default setting of the testing device is the standard setting, which has a lower limit. An advantage of having two settings (a lower setting and a higher setting) is that it prevents the heat detector testing device from damaging a heat detector by overheating it. In an example, the high heat setting may be used in an industrial kitchen environment. The setting can be determined and selected on the testing device prior to the testing, for example, if the setting needs to be changed from a default setting. In an example, the heat sensor 301 may be a thermocouple sensor which provides a higher precision compared to thermistors (that may be typically used in the testing device 200) when measuring the reference temperature.

[0053] Referring to figure 4, there is shown a flow diagram of one example of a method 400 for compensating ambient temperatures during a test on a heat detector using the heat detector testing device 100, 200. The method 400 starts with obtaining 410 predetermined data relating to a temperature of operation of a heat detector testing device wherein the predetermined data is determined prior to a functional test on a heat detector that is located in an environment within which a functional test is to be carried out.

[0054] In block 410, the controller 110 may obtain predetermined data relating to a temperature of operation of a heat detector testing device from the storage unit 113. The predetermined data obtained may correspond to one or more predetermined parameters relating to a temperature of operation of the testing device that were measured prior to testing the heat detector and stored in the storage unit 113. In an example, the predetermined parameters may have been measured during a calibration process, which occurs before testing the heat detector. Further discussion in relation to an example calibration process will be provided later when referring to figure 6. In an example, the predetermined parameters may correspond to any and / or all of the following: the temperature of operation of the testing device measured using the heat sensor 204, the power applied to the heating element 150, 203, the voltage applied to the heating element and / or the temperature of the environment (the ambient temperature) measured using the heat sensor 301 (see fig. 3). 11 n some cases, the temperature of operation of the testing device may be determined by measuring the current flowing through the heating element using a sensing arrangement (such as a current sensor), the voltage applied to the heating element and data relating to a resistivity curve of the material of the heating element stored in the storage unit. Similarly, the measured current and applied voltage may be used to derive the power applied to the heating element. The predetermined data may be parameters of certain values in a given ambient environment that results in the temperature at the reference point corresponding to the reference temperature. The predetermined data may correspond to any of the predetermined parameters listed above and are not limited to those listed above.

[0055] Blocks 420 to 450 may then perform a compensation and heating process that compensates for the temperature of an environment around the heat detector. In block 420 of method 400, the controller 110 processes, via the processor 112, the data received from the sensing arrangement 130, wherein the data relates to a temperature of operation of the heat detector testing device. The controller 110 may obtain data relating to a temperature of operation of the heat detector testing device wherein the data is determined during a functional test on the heat detector. The data obtained may correspond to one or more parameters relating to a temperature of operation of the testing device that is measured during a test of a heat detector using a sensing arrangement. In an example, the parameters obtained during the test on a heat detector may correspond to any / or all of the following: the temperature of operation of the testing device measured using the heat sensor 204 and / or the power applied to the heating element 150, 203. During a functional test on the heat detector, the temperature of operation of the testing device is controlled and maintained at a stored setpoint temperature. This stored setpoint temperature is a predefined temperature. In an example, the setpoint temperature may be the predetermined temperature of operation of the testing device that is obtained in block 410. The power applied to the heating element is adjusted in order to maintain the stored setpoint temperature. The power applied and the temperature of operation of the testing device are examples of the data obtained or measured during a test on a heat detector. Other examples may be the voltage applied to the heating element and the temperature of operation of the testing device. In some cases, the temperature of operation of the testing device may be determined by measuring the current flowing through the heating element using a sensing arrangement (a current sensor), the voltage applied to the heating element and data relating to a resistivity curve of the material of the heating element stored in the storage unit. Similarly, the measured current and applied voltage may be used to derive the power applied to the heating element. The data obtained during a test on a heat detector may correspond to any of the parameters listed above and are not limited to those listed above.

[0056] In block 430 of method 400, the controller 110 may determine a compensation factor that compensates for a temperature of the environment around the heat detector using the predetermined data obtained in block 410 prior to a functional test on the heat detector and the obtained data determined during the functional test on the heat detector in block 420. The compensation factor is determined in real-time during the test on the heat detector. Further discussion in relation to the details of how the compensation factor is determined will be provided later when referring to figure 5. In block 440 of method 400, the controller 110 adjusts a first parameter relating to a temperature of operation of a heat detector testing device based on the compensation factor. In an example, the adjusted first parameter may correspond to the setpoint temperature (the temperature at which the temperature of operation of the testing device is maintained). The first parameter can be dynamically adjusted in real-time during the test on the heat detector.

[0057] In block 450 of method 400, the controller 110 generates a control signal that controls heat output of the heat detector testing device based on the adjusted first parameter during the functional test. This involves generating an output that will cause a change in the heat output of the heating element such that the ambient conditions are compensated for. The control signal may be transmitted to and received by the heating element. Based on the received control signal, the heating element may then either increase or decrease the power applied dependent on the adjusted first parameter in order to account for ambient temperatures. This causes the heating element outputting a certain amount of heat such that the temperature at the reference point is equal to the reference temperature in order to accurately activate the alarm of the heat detector and test it. In an example, based on the modified setpoint temperature, the controller may generate a control signal to change the power applied to the heating element such that the temperature of operation of the testing device may be equal to the modified setpoint temperature. A control signal can be generated in real-time during the test on the heat detector.

[0058] In an example, generating a control signal that controls heat output of the heat detector testing device based on the adjusted first parameter during a functional test may comprise comparing a second parameter from the obtained data that was determined during the functional test with the adjusted first parameter, where the second parameter from the obtained data and the adjusted first parameter are the same type of parameter. An example of this may be where the second parameter is the temperature of the heating element determined during the functional test and the first adjusted parameter is the modified setpoint temperature. These two parameters are comparable as they are the same type of parameters where both these parameters are concerning the temperature of the heating element. The control signal is configured to selectively change the heat output of the testing device where if the second parameter is larger than the first parameter, the control signal is generated to decrease the heat output of the testing device. Whereas, if the second parameter is smaller than the first parameter, the control signal is generated to increase the heat output of the testing device. If the second parameter is equal to the first parameter, a control signal is generated to maintain the heat output of the testing device. In the last case, either the heat output has already been adjusted to compensate for ambient temperature or the ambient temperature has a negligible effect but either way, it is ensured that ambient temperatures are taken into account.

[0059] Once the control signal is generated and is sent to the corresponding receiving device (e.g., heating element) that will adjust the heat output, the controller will wait for a predetermined amount of time. This predetermined amount of time can be determined by a user prior to the testing. The purpose of waiting for this process time is to provide time for the control signal to be processed, for the heat output of the heating element to be adjusted and for the heat sensor 204 to recognise and reflect the adjusted heat output sent by the control signal.

[0060] Once the process time has passed, the controller will determine if the test has ended. One example of when a test ends is if the heat detector has been activated. In this case, the test has been completed. Another example is whether a certain predefined amount of time has passed from the start of the test without the heat detector activating. This may occur if the heat detector is faulty. This predefined amount of time can be determined by the person using the testing device prior to the testing or may be prestored in the testing device. If it is determined that the test has ended, then no further action will be taken. If it has been determined that the test has not ended, the controller will repeat steps 420 to 450 in a feedback loop. The purpose of this feedback loop is to enable the ambient temperature to be compensated whilst a functional test is taking place. This enables any fluctuations in the temperature of the environment to be taken into account during a test which results in improving the accuracy of the test.

[0061] Referring to figure 5, there is shown a flow diagram of a method 500 that shows further detail of how a compensation factor may be determined in block 430.

[0062] In block 510 of method 500, the controller 110 may determine a difference between the predetermined data that was determined prior to a functional test on a heat detector and the obtained data that was determined during the functional test. In an example, the predetermined data and the data determined during the test may correspond to the same parameter. In a further example, the parameter may be the power applied to the heating element. In this example, the controller may determine a difference between the predetermined power applied to the heating element, that was determined prior to the test on the heat detector, and the power that was applied to the heating element during the test on the heat detector. In another example, the parameter may be the voltage applied to the heating element. In this example, the controller may determine a difference between a predetermined voltage applied to the heating element, that was determined prior to the test on the heat detector, and the voltage that was applied to the heating element during the test on the heat detector. The parameter is not limited to those listed above.

[0063] In block 520 of method 500, the controller 110 may calculate the compensation factor based, at least in part, on the determined difference wherein the determined difference is proportional to a temperature offset caused by the temperature of the environment around the heat detector. This proportional relationship between the difference determined in step 510 and the temperature offset caused by the ambient temperature enables one to calculate the compensation factor. Moreover, this proportional relationship between the difference and the offset enables the compensation factor to be calculated without having an additional heat sensor in a testing device to measure the temperature of the environment (the ambient temperature). This is advantageous as the testing device requires fewer components or resources. In an example, the difference that was determined between the predetermined power applied to the heating element and the power that was applied during the test is proportional to the difference in temperature at the reference point that is due to the ambient environment. The same applies for the difference determined between the voltage applied to the heating element, before and during the test. The compensation factor is then used in step 440 of figure 4.

[0064] Referring to figure 6, there is shown a flow diagram of a method 600 that shows how the predetermined data that may be stored and then obtained during a test on a heat detector in the field may be determined in a (factory) calibration process prior to the field test. The calibration process activates a heat sensor and / or a device that is representative of a heat sensor of a heat detector. Additionally, the calibration process may determine data relating to the temperature of operation of the heat detector testing device when a temperature at a position where a heat detector is to be located during a functional test is a temperature that activates the heat detector. The calibration process can enable the ambient environment to be compensated for without using a heat sensor in the testing device to measure the ambient temperature. Method 600 can be carried out prior to testing the heat detector in the field. In an example, this process can be done in a factory or manufacturing environment, where the heat detector testing device is made and / or tested before it is used in the field to test heat detectors. Method 600 may be carried out using system 300.

[0065] In block 610 of method 600, the heat sensor 301 may measure a temperature at a reference point where a heat detector is to be located during a functional test. This initial temperature may be stored in the storage unit 113 as the predetermined ambient temperature. In block 620 of method 600, the controller 110 may adjust a first parameter relating to a temperature of operation of the testing device such that the measured temperature at the reference point corresponds to a predefined temperature. This predefined reference temperature corresponds to the temperature that activates the heat detector during a test. The reference temperature is determined by the heat detector product specification. As the activation temperature of heat detectors can vary between types of heat detectors, the heat detector testing device may have two settings: a standard setting which has a maximum threshold of 90°C and a high heat setting which has a maximum threshold of 115°C. The setting may be determined and selected based on the activation temperature of the heat detector to be tested prior to the testing. It will be appreciated that other maximum temperature threshold settings may be provided or the testing device may have a single maximum temperature threshold setting. In an example, the setting may be manually chosen based on user interaction such as by a user who is using the testing device and is undertaking the test. In another example, the setting may be automatically determined and selected based on information included in machine-readable indicia associated with the heat detector to be tested and read by the heat detector testing device. The machine-readable indicia may comprise a RFID chip and / or a quick response (QR) code which is then scanned by a corresponding reading device on the testing device prior to testing. Upon scanning, the activation temperature of the heat detector, along with other information and / or parameters, may be received by the testing device and based on the activation temperature, an appropriate maximum temperature threshold setting will be selected on the testing device. In an example, the first parameter relating to a temperature of operation of the testing device may be the power applied to the heating element. In this case, the power is adjusted such that the temperature at the reference point measured by the heat sensor 301 reaches the reference temperature. In another example, the adjusted first parameter may be the voltage applied to the heating element.

[0066] In block 630 of method 600, the controller 110 may store the adjusted first parameter of the testing device in the storage unit 113. In an example, the controller may store the predetermined power applied to the heating element such that the temperature measured at the reference point is the reference temperature. The controller may also store the predetermined temperature of operation of the testing device (which may be the temperature of the heating element) measured by the heat sensor 204 at the point in time when the temperature at the reference point was equal to the reference temperature. In another example, the controller may store the current flowing through the heating element and / or the voltage applied to the heating element such that the temperature at the reference point was equal to the reference temperature. Referring to figure 7, there is shown a flow diagram of a method 700 that shows one embodiment of the process to compensate for the ambient temperature during a test on a heat detector using a heat detector testing device that has one heat sensor. This embodiment comprises the following.

[0067] In block 710, the predetermined parameters are obtained. In an example this can be done by reading stored factory calibration settings where factory calibration settings can be the predetermined parameters obtained from the calibration process shown in figure 6. In an example, the predetermined power applied to the heating element and the corresponding predetermined temperature of operation of the testing device, that was determined prior to the test of the heat detector (such as during the calibration process) is obtained from the storage unit. These predetermined parameters provide certain values for the power applied and the corresponding temperature of operation of the testing device such that the temperature at the reference point is the reference temperature for a given ambient temperature.

[0068] The following blocks (blocks 720 to 780) comprise performing a compensation and heating process that compensates for the temperature of an environment around the heat detector. In block 720, the data relating to a temperature of operation of the heat detector testing device wherein the data is determined during a functional test on the heater is obtained. In an example, this can be obtained by reading a heater temperature sensing means where the temperature of operation of the testing device is measured using the heat sensor 204 during the test on the heat detector. This temperature of operation is obtained by the controller 110.

[0069] In block 730, the power applied to the heating element during the test on the heat detector is also obtained. In an example, it can be obtained by reading the heater power. During a test on a heat detector, the temperature of operation of the testing device is controlled in a feedback loop. This is done by obtaining the temperature of operation of the testing device and the power applied to the heating element and adjusting the power applied to the heating element to maintain the temperature of operation of the testing device at a stored setpoint temperature. In this case, the stored setpoint temperature is initially the predetermined temperature of operation of the testing device.

[0070] Whilst this testing process accurately controls the temperature of operation of the testing device, the temperature of the air that is blown within the testing device (from the heating element to the reference point) can vary and be affected. This is due to the ambient temperature of the air prior to heating. In an example, if the ambient environment is at a temperature lower than expected (the expected temperature may correspond to the predefined reference temperature or the predetermined temperature of the environment at which the testing device was calibrated), this will result in the temperature at the reference point being lower than the reference temperature. This then leads to problems of inefficiency and inaccuracy due to longer test times and / or false results (an apparent failure to activate the alarm of the heat detector). False results, such as obtaining a false negative result may result in earlier (than needed) replacement of the heat detector and increased waste of materials.

[0071] In another example, if the ambient temperature is higher than expected (the expected temperature may correspond to the predefined reference temperature or the predetermined temperature of the environment at which the heat detector testing device was calibrated), this may cause damage to the heat detector as well as the testing device due to overheating the materials. This may lead to increasing waste of materials.

[0072] Thus, a compensation factor is determined in order to compensate for the ambient environment, resulting in improved efficiency and accuracy of the testing device, over a wide ambient temperature range. Efficiency can be improved by reducing the need for repeat testing and / or providing shorter higher power tests in colder environments and reducing the power required in warmer environments. Accuracy can be improved by reducing the number of false results.

[0073] In block 740, the compensation factor is determined in real-time, during the test on the heat detector. In an example, the compensation factor (otherwise known as an Ambient Drift Compensation) can be applied to the setpoint temperature. The compensation factor may be determined by determining a difference between the predetermined power applied and the power applied during the test. As this difference in power is proportional to the offset temperature (the difference in the temperature due to the ambient environment), the difference in power is used to calculate the compensation factor. The compensation factor is then applied to adjust the stored setpoint temperature within a defined boundary such that this setpoint temperature now takes into account the ambient conditions.

[0074] In block 750 and 760, the temperature of operation of the testing device (otherwise known as temperature of the heating element or the heater temperature) from the obtained data, that was determined during the functional test, is compared with the adjusted setpoint temperature. These two parameters are comparable as they are the same type of parameters where both these parameters are concerning the temperature of the heating element. Blocks 755 and 765 generates a control signal that changes the heat output of the testing device (heating element) depending on the outcome of the comparison in blocks 750 and 760. In block 750, the controller determines whether the temperature of the heating element (heater temperature) is greater than the adjusted setpoint temperature. If the temperature of the heating element is greater than the adjusted setpoint temperature, then in block 755, a control signal is generated to decrease the heat output of the testing device (decrease the heater duty). Block 755 then goes to block 770. If the temperature of the heating element is not greater than the adjusted setpoint temperature, then in block 760, the controller determines whether the temperature of the heating element is smaller than the adjusted setpoint temperature. If the temperature of the heating element is smaller than the adjusted setpoint temperature, then in block 765, a control signal is generated to increase the heat output of the testing device (increase heater duty). Block 765 then goes to block 770. If the temperature of the heating element is not smaller than the adjusted setpoint temperature, then block 760 goes to block 770. The control signal causing the power applied to the heating element to either increase or decrease will result in the heating element outputting a certain amount of heat such that the temperature at the reference point will be equal to the predefined reference temperature in order to activate the alarm of the heat detector and test it accurately and efficiently.

[0075] In block 770, the controller will wait for a predetermined amount of time (process time). This predetermined amount of time can be determined by a user prior to the testing. The purpose of waiting for this process time is to provide time for the control signal to be processed, for the heat output of the heating element to be adjusted and for the heat sensor 204 to recognise and reflect the adjusted heat output sent by the control signal.

[0076] Once the process time has passed, in block 780, the controller will determine if the test has ended. If it is determined that the test has not ended, the controller will return to block 720 and repeat blocks 720 to 780 in a feedback loop until the test ends. This comprises the compensation and heating process that includes the steps from the step of measuring the temperature of operation of the testing device using the heat sensor 204 during the test on the heat detector to the step of waiting for a predefined amount of time are repeated until the test has ended. This is to help ensure that the ambient temperature is compensated for during the test and takes into account if there are any changes in the temperature of the environment during the test. If it is determined that the test has ended, then the test will stop. In another embodiment, the predetermined data and the data determined during the test that is obtained may be the voltage applied to the heating element and the temperature of operation of the testing device.

[0077] The predetermined data determined prior to the test and the data determined during the test may not be limited to the types of data listed above.

[0078] An advantage to methods 400, 500 and 600 is that a heat sensor within the heat detector testing device to measure the temperature of the environment is not needed to compensate the ambient temperature. This lowers the component count in the testing device and reduces the physical resources needed in a heat detector testing device to compensate for ambient conditions. Additionally, another advantage is that current heat detector testing devices will not need an additional heat sensor (to measure ambient temperatures) to be implemented. Instead, the instructions and data in methods 400, 500 and 600 can be provided to testing device, for example, onto the storage unit of an existing testing device. This requires less time and physical resources to upgrade an existing testing device and enable the testing device (that previously did not compensate for ambient temperatures) to compensate for ambient conditions. Obtaining the predetermined parameters that were calibrated prior to the test on the heat detector and the proportional relationship between the difference determined and the temperature offset are features that enables the ambient conditions to be compensated without the need of an additional heat sensor.

[0079] Referring to figure 8 (and figure 1 when referencing the example heat detector testing device 100), there is shown another example of a heat detector testing device 800 and a heat detector 250 located within a portion of the heat detector testing device 800.

[0080] The heat detector testing device 800 may comprise the components of the heat detector testing device 200 with an additional heat sensor 801 . The heat sensor 801 may correspond to an example of a sensing arrangement 130 in figure 1. In an example, the heat sensor 801 may comprise a hot air temperature sensor. This inlet temperature heat sensor (or sensing means) 801 is positioned away from the heating element and is configured to measure the temperature of the environment around the heat detector. The heat sensor 801 may be positioned at the end further from the heating element 203 of the heater duct assembly 206 or it may be positioned in the cup 205. The purpose of this heat sensor 801 is to account for the ambient temperature by directly measuring the temperature of the environment. It provides an alternative method of determining the temperature offset caused by the ambient temperature compared to the method 400, 500 and 600 disclosed above (where these methods do not comprise an inlet temperature heat sensor 801). Additionally, whilst the heat sensor 204 may initially be able to measure the ambient temperature at the start of the test (before the heating element 203 outputs heat), once the test begins and the heating element 203 outputs heat, the measurement by the heat sensor 204 will be primarily influenced and affected by the temperature of the heating element 203 rather than the temperature of the environment around the heat detector. Thus, an additional heat sensor 801 is helpful to continuously measure the temperature of the environment during a functional test of the heat detector 250.

[0081] Referring to figure 9, there is shown a flow diagram of another example of a method 900 for compensating ambient temperatures during a test on a heat detector using the heat detector testing device 100, 800. The method 900 starts with obtaining 910 predetermined data relating to a temperature of operation of a heat detector testing device and predetermined data relating to a temperature of an environment around the heat detector testing device wherein the predetermined data is determined prior to a functional test on a heat detector that is located in an environment within which a functional test is to be carried out.

[0082] In block 910, the controller 110 may obtain predetermined data relating to a temperature of operation of a heat detector testing device and predetermined data relating to a temperature of an environment around the heat detector testing device from the storage unit 113. The predetermined data obtained may correspond to one or more predetermined parameters relating to a temperature of operation of the testing device that were measured prior to testing the heat detector and stored in the storage unit 113. In an example, the predetermined parameters may have been measured during a calibration process, which occurs before testing the heat detector. An example calibration process is shown in figure 6. In an example, the predetermined parameters may correspond to any or all of the following: the temperature of operation of the testing device measured using the heat sensor 204, the power applied to the heating element 150, 203, the voltage applied to the heating element and / or the temperature of the environment (the ambient temperature) measured using the heat sensor 301 (see fig. 3). In some cases, the temperature of operation of the testing device may be determined by measuring the current flowing through the heating element using a sensing arrangement (such as a current sensor), the voltage applied to the heating element and data relating to a resistivity curve of the material of the heating element stored in the storage unit. Similarly, the measured current and applied voltage may be used to derive the power applied to the heating element. The predetermined data may be parameters of certain values in a given ambient environment that results in the temperature at the reference point corresponding to the reference temperature. The predetermined data may correspond to any of the predetermined parameters listed above and are not limited to those listed above. Blocks 920 to 950 may then perform a compensation and heating process that compensates for the temperature of an environment around the heat detector. In block 920 of method 900, the controller 110 obtains data relating to a temperature of an environment around the heat detector that is located in an environment within which a functional test is to be carried out. The controller may process, via the processor 112, the data received from the sensing arrangement 130, wherein the data relates to a temperature of an environment around a heat detector that is located in an environment within which a functional test is to be carried out. The data received from the sensing arrangement may also comprise data that relates to a temperature of operation of the heat detector testing device wherein the data is determined during a functional test on the heat detector. The controller 110 may obtain data relating to a temperature of an environment around a heat detector that is located in an environment within which a functional test is to be carried out. In an example, the data may be the temperature of the environment, measured using the heat sensor 801. This provides a direct way of measuring the ambient temperature in the testing environment. The controller 110 may also obtain data relating to a temperature of operation of a heat detector testing device. The data may be obtained using the sensing arrangement 130. In an example, the temperature of operation of a heat detector testing device may be the temperature of a heating element of the testing device where the heating element emits heat from the testing device based on a control signal. In an example, the data obtained may be the power applied to the heating element during the test on the heat detector and / or the temperature of operation of the testing device (which may the temperature of the heating element), measured using heat sensor 204. In another example, the obtained data determined during the functional test on the heat detector may comprise a temperature of the heating element and a voltage applied to the heating element where the voltage applied is adjusted such that the temperature of operation is maintained at a setpoint temperature.

[0083] During a test on the heat detector, the temperature of operation of the testing device may be controlled by adjusting the power applied to the heating element such that the temperature of operation is maintained at a setpoint temperature. This setpoint temperature may be a predetermined temperature that is stored in the storage unit 113. This predetermined temperature may set from the calibration process according to method 600 and figure 6. It will be appreciated that the predetermined temperature stored in a storage unit 113 may have been previously obtained from a database and / or calibration methods other than the specific calibration method 600 of figure 6. In block 930 of method 900, the controller 110 determines a compensation factor that compensates for a temperature of the environment around the heat detector using the predetermined data obtained and the obtained data relating to a temperature of an environment around a heat detector. The compensation factor is determined using the predetermined data obtained and the obtained data relating to a temperature of an environment around the heat detector. In an example, the compensation factor may be determined by calculating the difference between the ambient temperature that is measured using the heat sensor 801 during the functional test and the predetermined ambient temperature stored in the storage unit 113 where the predetermined ambient temperature may have been measured during the calibration process disclosed in figure 6. In this case, the compensation factor is equivalent to the temperature offset.

[0084] In block 940 of method 900, the controller 110 adjusts a first parameter relating to the temperature of operation of the heat detector testing device based on the compensation factor. In an example, the adjusted first parameter may be the setpoint temperature. This setpoint temperature may be the predetermined temperature of operation of the testing device stored in the storage unit 113. The predetermined temperature of operation of the testing device may be from the calibration process in method 600. The setpoint temperature is the temperature at which the temperature of operation of the testing device is maintained at during a functional test. The setpoint temperature may be adjusted by the compensation factor (e.g., the temperature offset derived between the ambient temperatures) in order to compensate for the ambient temperature.

[0085] In block 950 of method 900, the controller 110 may generate a control signal that controls heat outputs of the heat detector testing device based on the adjusted first parameter during a functional test. In an example, this may correspond to generating a control signal to the heating element and instructing it to either increase or decrease the amount of heat generated based on the adjust first parameter. Generating a control signal that controls heat output of the heat detector testing device based on the adjust first parameter during the functional test may comprise comparing a second parameter from the predetermined data with the adjusted first parameter where the second parameter from the predetermined data and the adjusted first parameter are the same type of parameter. In an example, the second parameter may be the predetermined temperature of the heating element and the adjusted first parameter may be the adjusted setpoint temperature, where both parameters are both concerning the temperature of the heating element and hence are of the same type. Once the control signal is generated and is sent to the corresponding receiving device (e.g., heating element) that will adjust the heat output, the controller will wait for a predetermined amount of time. This predetermined amount of time can be determined by a user prior to the testing. The purpose of waiting for this process time is to provide time for the control signal to be processed, for the heat output of the heating element to be adjusted and for the heat sensor 204 to recognise and reflect the adjusted heat output sent by the control signal.

[0086] Once the process time has passed, the controller will determine if the test has ended. One example in which a test ends is if the heat detector has been activated. In this case, the test has been completed. Another example is whether a certain predefined amount of time has passed from the start of the test without the heat detector activating. This may occur if the heat detector is faulty. This predefined amount of time can be determined by the person using the testing device prior to the testing. If it is determined that the test has ended, then no further action will be taken. If it has been determined that the test has not ended, the controller will repeat steps 920 to 950 in a feedback loop. The purpose of this feedback loop is to enable the ambient temperature to be compensated whilst a functional test is taking place. This enables any fluctuations in the temperature of the environment to be taken into account during a test which results in improving the accuracy of the test.

[0087] Referring to figure 10 (and figure 1 when referencing the example heat detector testing device 100), there is shown a heat detector testing device 1000. The heat detector testing device 1000 comprises a test tool that is a dispenser 1002 that includes an elongate pole 1004 that may be attachable to the dispenser 1002 to allow the test to be carried out on a heat detector 1006 that may be located on the ceiling of an environment such as a building. In an example, the dispenser 1002 is formed an open topped housing 1008 including a bottom and sidewall forming a cavity to receive a heat detector 1006. The open topped housing 1008 may be transparent or opaque. In an example, components of the heat detector testing device 100 (see figure 1), 200 (see figure 2) and 800 (see figure 8) including the controller 110, sensing arrangement 130 and heating element 150 are located fully or partially within a module housing and in the housing of the dispenser 1002.

[0088] In addition to the examples described in detail above, the skilled person will recognize that various features described herein can be modified and / or combined with additional features, and the resulting additional examples can be implemented without departing from the scope of the system of the present disclosure, as this specification merely sets forth some of the many possible example configurations and implementations for the claimed solution. The following paragraphs provide a list of additional embodiments which may serve as basis for embodiments in this application or in any subsequently filed divisional application(s).

[0089] Embodiment 1. A method comprising: obtaining predetermined data relating to a temperature of operation of a heat detector testing device wherein the predetermined data is determined prior to a functional test on a heat detector that is located in an environment within which a functional test is to be carried out; and performing a compensation and heating process that compensates for the temperature of an environment around the heat detector, the performing comprising: obtaining data relating to a temperature of operation of the heat detector testing device wherein the data is determined during a functional test on the heat detector; determining a compensation factor that compensates for a temperature of the environment around the heat detector using the predetermined data and the obtained data determined during the functional test on the heat detector; adjusting a first parameter relating to a temperature of operation of a heat detector testing device based on the compensation factor; and generating a control signal that controls heat output of the heat detector testing device based on the adjusted first parameter during the functional test.

[0090] Embodiment 2. The method according to Embodiment 1 wherein determining a compensation factor comprises: determining a difference between the predetermined data that was determined prior to a functional test on a heat detector and the obtained data that was determined during the functional test; and calculating the compensation factor based, at least in part, on the determined difference wherein the determined difference is proportional to a temperature offset caused by the temperature of the environment around the heat detector.

[0091] Embodiment 3. The method according to Embodiment 1 or 2, wherein after generating the control signal that controls heat output of the heat detector testing device, the method further comprising: waiting for a predetermined amount of time; determining whether the functional test has ended after the predetermined amount of time, wherein: based on determining that the functional test has ended, stopping the test; and based on determining that the functional test has not ended:

[0092] (i) performing the compensation and heating process;

[0093] (ii) waiting for the predetermined amount of time;

[0094] (iii) determining whether the functional test has ended after the predetermined amount of time; and based on determining that the functional test has not ended, repeating (i) to (iii) until the test has ended.

[0095] Embodiment 4. The method according to any preceding Embodiments, wherein obtaining the data relating to the temperature of operation of the heat detector testing device comprises controlling and maintaining the temperature of operation of the heat detector testing device at a stored setpoint temperature during a functional test on the heat detector.

[0096] Embodiment 5. The method according to Embodiment 4 wherein the stored setpoint temperature is included in at least part of the predetermined data relating a temperature of operation of a heat detector testing device.

[0097] Embodiment 6. The method according to any preceding Embodiments, wherein the adjusted first parameter comprises a setpoint temperature, wherein the setpoint temperature is a temperature at which a temperature of operation of the heat detector testing device is maintained at during a functional test on the heat detector.

[0098] Embodiment 7. The method according to any preceding Embodiments, wherein the temperature of operation of the heat detector testing device comprises a temperature of a heating element of the testing device wherein the heating element emits heat from the testing device based on the control signal.

[0099] Embodiment 8. The method according to Embodiment 7, wherein the predetermined data and the obtained data determined during the functional test on the heat detector comprise a temperature of the heating element and a power applied to the heating element.

[0100] Embodiment 9. The method according to Embodiment 7, wherein the predetermined data and the obtained data determined during the functional test on the heat detector comprise a temperature of the heating element and a voltage applied to the heating element.

[0101] Embodiment 10. The method according to any preceding Embodiments, wherein the predetermined data is determined through a calibration process on heat detector testing device prior to a functional test on a heat detector wherein the calibration process activates a heat sensor and / or a device representative of a heat sensor of a heat detector

[0102] Embodiment 11. The method according to Embodiment 10, wherein the calibration process comprises determining data relating to the temperature of operation of the heat detector testing device when a temperature of a position where a heat detector is to be located during a functional test is a temperature that activates the heat detector.

[0103] Embodiment 12. The method according to any preceding Embodiments, wherein generating a control signal that controls heat output of the heat detector testing device based on the adjusted first parameter during the functional test comprises comparing a second parameter from the obtained data that was determined during the functional test with the adjusted first parameter, wherein, the second parameter from the obtained data and the adjusted first parameter are the same type of parameter; and wherein, the control signal is configured to selectively change the heat output of the testing device, wherein: if the second parameter is larger than the first parameter, generate the control signal to decrease the heat output of the testing device; and / or if the second parameter is smaller than the first parameter, generate the control signal to increase the heat output of the testing device.

[0104] Embodiment 13. The method according to Embodiment 12 wherein if the second parameter is equal to first parameter, generate a control signal that maintains the heat output of the testing device.

[0105] Embodiment 14. A heat detector testing device comprising: a controller configured to: obtain predetermined data relating to a temperature of operation of a heat detector testing device wherein the predetermined data is determined prior to a functional test on a heat detector that is located in an environment within which a functional test is to be carried out; and perform a compensation and heating process that compensates for the temperature of an environment around the heat detector, the performing comprising: obtain data relating to a temperature of operation of the heat detector testing device wherein the data is determined during a functional test on the heat detector; determine a compensation factor that compensates for a temperature of the environment around the heat detector using the predetermined data and the obtained data determined during the functional test on the heat detector; adjust a first parameter relating to a temperature of operation of a heat detector testing device based on the compensation factor; and generate a control signal that controls heat output of the heat detector testing device based on the adjusted first parameter during the functional test.

[0106] Embodiment 15. The device according to Embodiment 14, further comprising: a heating element configured to emit heat from the testing device based on the control signal; a sensing arrangement configured to measure a second parameter relating to the temperature of operation of the heat detector testing device; a storage unit configured to store data.

[0107] Embodiment 16. The device according to Embodiment 15 wherein the sensing arrangement comprises a heating sensor configured to measure the temperature of the heating element.

[0108] Embodiment 17. The device according to any of Embodiments 14 to 16, further comprising a fan configured to create an airflow in the testing device and to direct heated air towards a reference point, wherein a reference point is the position where a heat detector is to be located during a functional test.

[0109] Embodiment 18. The device according to any of Embodiments 14 to 17, wherein the controller is further configured to: determine a difference between the predetermined data that was determined prior to a functional test on a heat detector and the obtained data that was determined during the functional test; and calculate the compensation factor based, at least in part, on the determined difference wherein the determined difference is proportional to a temperature offset caused by the temperature of the environment around the heat detector.

[0110] Embodiment 19. A non-transitory computer-readable medium storing instructions, the instructions, when executed by one or more controllers, causing the one or more controllers to perform operations according to the method of any of Embodiments 1 to 13, including: obtaining predetermined data relating to a temperature of operation of a heat detector testing device wherein the predetermined data is determined prior to a functional test on a heat detector that is located in an environment within which a functional test is to be carried out; and performing a compensation and heating process that compensates for the temperature of an environment around the heat detector, the performing comprising: obtaining data relating to a temperature of operation of the heat detector testing device wherein the data is determined during a functional test on the heat detector; determining a compensation factor that compensates for a temperature of the environment around the heat detector using the predetermined data and the obtained data determined during the functional test on the heat detector; adjusting a first parameter relating to a temperature of operation of a heat detector testing device based on the compensation factor; and generating a control signal that controls heat output of the heat detector testing device based on the adjusted first parameter during the functional test.

[0111] Embodiment 20. A method for calibrating a heat detector testing device, the method comprising: measuring a temperature at a reference point where a heat detector is to be located during a functional test; adjusting a first parameter relating to a temperature of operation of the testing device such that the measured temperature at the reference point corresponds to a predefined reference temperature, wherein the predefined reference temperature is representative of a temperature at which the heat detector is to be activated during the functional test; and storing the adjusted first parameter of the testing device.

[0112] Embodiment 21. The method according to Embodiment 20, wherein the temperature of operation of the heat detector testing device comprises a temperature of a heating element of the testing device wherein the heating element emits heat from the testing device based on control signal.

[0113] Embodiment 22. The method according to any of Embodiments 20 to 21 further comprising: measuring the temperature of operation of the testing device when the measured temperature at the reference point corresponds to the predefined reference temperature; storing the temperature of operation of the testing device.

[0114] Embodiment 23. The method according to any of Embodiments 21 to 22, wherein the adjusted first parameter is a power applied to the heating element. Embodiment 24. The method according to any of Embodiments 21 to 22, wherein the adjusted first parameter is a voltage applied to the heating element.

[0115] Embodiment 25. The method according to any of Embodiments 20 to 24, further comprising measuring a temperature at a reference point where a heat detector is to be located during a functional test before a power is applied to a heating element of the testing device.

[0116] Embodiment 26. A system for calibrating a heat detector testing device, the system comprising: a heat sensor configured to measure a temperature at a reference point where the heat detector is to be located during a functional test; a controller configured to: adjust a first parameter relating to a temperature of operation of the testing device such that the measured temperature at the reference point corresponds to a predefined reference temperature, wherein the predefined reference temperature is representative of a temperature at which a heat detector is to be activated during the functional test; and a storage unit configured to store the adjusted first parameter of the testing device.

[0117] Embodiment 27. The system according to Embodiment 26 wherein the heat sensor is representative of a heat sensor of a heat detector, wherein the heat sensor is a separate device to the heat detector testing device.

[0118] Embodiment 28. A non-transitory computer-readable medium storing instructions, the instructions, when executed by one or more controllers, causing the one or more controllers to perform operations according to the method of any of Embodiments 20 to 25, including: obtaining or measuring a temperature at a reference point where a heat detector is to be located during a functional test; adjusting a first parameter relating to a temperature of operation of the testing device such that the measured temperature at the reference point corresponds to a predefined reference temperature, wherein the predefined reference temperature is representative of a temperature at which the heat detector is to be activated during the functional test; and storing the adjusted first parameter of the testing device.

[0119] Embodiment 29. A method comprising: obtaining predetermined data relating to a temperature of operation of a heat detector testing device and predetermined data relating to a temperature of an environment around a heat detector that is located in an environment within which a functional test is to be carried out wherein the predetermined data is determined prior to a functional test on the heat detector; and performing a compensation and heating process that compensates for the temperature of an environment around the heat detector, the performing comprising: obtaining data relating to a temperature of an environment around the heat detector that is located in an environment within which a functional test is to be carried out; determining a compensation factor that compensates for a temperature of the environment around the heat detector using the predetermined data obtained and the obtained data; adjusting a first parameter relating to the temperature of an operation of the heat detector testing device based on the compensation factor; and generating a control signal that controls heat output of the heat detector testing device based on the adjusted first parameter during the functional test.

[0120] Embodiment 30. The method according to Embodiment 29 wherein determining a compensation factor comprises: determining a temperature offset between the predetermined data obtained relating to a temperature of an environment around the heat detector testing device and the obtained data relating to a temperature of an environment around the heat detector; and calculating the compensation factor based, at least in part, on the temperature offset caused by the temperature of the environment around the heat detector.

[0121] Embodiment 31. The method according to any of Embodiments 29 to 30, wherein after generating the control signal that controls heat output of the heat detector testing device, the method further comprising: waiting for a predetermined amount of time; determining if the functional test has ended after the predetermined amount of time, wherein: based on determining that the functional test has ended, stopping the test; and based on determining that the functional test has not ended:

[0122] (i) performing the compensation and heating process;

[0123] (ii) waiting for the predetermined amount of time;

[0124] (iii) determining whether the functional test has ended after the predetermined amount of time; and based on determining that the functional test has not ended, repeating (i) to (iii) until the test has ended. Embodiment 32. The method according to any of Embodiments 29 to 31 , further comprising obtaining data relating to a temperature of operation of a heat detector testing device.

[0125] Embodiment 33. The method according to any of Embodiments 29 to 32, further comprising controlling and maintaining a temperature of operation of the heat detector testing device at a stored setpoint temperature during a functional test on the heat detector.

[0126] Embodiment 34. The method according to Embodiment 33, wherein the stored setpoint temperature is included in at least part of the predetermined data relating a temperature of operation of a heat detector testing device.

[0127] Embodiment 35. The method according to any of Embodiments 29 to 34, wherein the adjusted first parameter comprises a setpoint temperature, wherein the setpoint temperature is a temperature at which a temperature of operation of the heat detector testing device is maintained at during a functional test on the heat detector.

[0128] Embodiment 36. The method according to any of Embodiments 32 to 35, wherein the temperature of operation of the heat detector testing device comprises a temperature of a heating element of the testing device wherein the heating element emits heat from the testing device based on the control signal.

[0129] Embodiment 37. The method according to Embodiment 36, wherein the obtained data determined during the functional test on the heat detector comprise a temperature of the heating element and a power applied to the heating element.

[0130] Embodiment 38. The method according to Embodiment 36, wherein the obtained data determined during the functional test on the heat detector comprise a temperature of the heating element and a voltage applied to the heating element.

[0131] Embodiment 39. The method according to any of Embodiments 29 to 38, wherein the predetermined data is determined through a calibration process on heat detector testing device prior to a functional test on a heat detector wherein the calibration process activates a heat sensor and / or a device representative of a heat sensor of a heat detector.

[0132] Embodiment 40. The method according to Embodiment 39, wherein the calibration process comprises determining data relating to: the temperature of an environment surrounding the heat sensor and / or a device representative of a heat sensor of a heat detector and to the temperature of operation of the heat detector testing device when a temperature of a position where a heat detector is to be located during a functional test is a temperature that activates the heat detector.

[0133] Embodiment 41. The method according to any of Embodiments 29 to 40, wherein generating a control signal that controls heat output of the heat detector testing device based on the adjusted first parameter during the functional test comprises comparing a second parameter from the predetermined data obtained with the adjusted first parameter, wherein, the second parameter from the predetermined data obtained and the adjusted first parameter are the same type of parameter; and wherein, the control signal is configured to selectively change the heat output of the testing device, wherein: if the second parameter is larger than the first parameter, generate the control signal to decrease the heat output of the testing device; and / or if the second parameter is smaller than the first parameter, generate the control signal to increase the heat output of the testing device.

[0134] Embodiment 42. The method according to Embodiment 41 wherein if the second parameter is equal to first parameter, generate a control signal that maintains the heat output of the testing device.

[0135] Embodiment 43. A heat detector testing device comprising: a controller configured to: obtain predetermined data relating to a temperature of operation of a heat detector testing device and predetermined data relating to a temperature of an environment around a heat detector that is located in an environment within which a functional test is to be carried out wherein the predetermined data is determined prior to a functional test on the heat detector; and perform a compensation and heating process that compensates for the temperature of an environment around the heat detector, the performing comprising: obtain data relating to a temperature of an environment around a heat detector that is located in an environment within which a functional test is to be carried out; determine a compensation factor that compensates for a temperature of the environment around the heat detector using the predetermined data obtained and the obtained data; adjust a first parameter relating to the temperature of an operation of the heat detector testing device based on the compensation factor; and generate a control signal that controls heat output of the heat detector testing device based on the adjusted first parameter during the functional test.

[0136] Embodiment 44. The device according to Embodiment 43, further comprising: a heating element configured to heat the air around the heat detector; a sensing arrangement configured to measure a parameter relating to the temperature of operation of the heat detector testing device; a heat sensor configured to measure the temperature of the environment around the heat detector a storage unit configured to store data.

[0137] Embodiment 45. The device according to Embodiment 44 wherein the sensing arrangement is a heating sensor configured to measure the temperature of operation of the heating element.

[0138] Embodiment 46. The device according to any of Embodiments 43 to 45, further comprising a fan configured to create an airflow in the testing device and to direct heated air towards a reference point, wherein a reference point is the position where a heat detector is to be located during a functional test.

[0139] Embodiment 47. The device according to any of Embodiments 43 to 46, wherein the controller is further configured to: determine a temperature offset between the predetermined data obtained relating to a temperature of an environment around a heat detector and the obtained data relating to a temperature of an environment around the heat detector; and calculate the compensation factor based, at least in part, on the temperature offset caused by the temperature of the environment around the heat detector.

[0140] Embodiment 48. A non-transitory computer-readable medium storing instructions, the instructions, when executed by one or more controllers, causing the one or more controllers to perform operations according to the method of any of Embodiments 29 to 42, including: obtain predetermined data relating to a temperature of operation of a heat detector testing device and predetermined data relating to a temperature of an environment around a heat detector that is located in an environment within which a functional test is to be carried out wherein the predetermined data is determined prior to a functional test on the heat detector; and performing a compensation and heating process that compensates for the temperature of an environment around the heat detector, the performing comprising: obtaining data relating to a temperature of an environment around a heat detector that is located in an environment within which a functional test is to be carried out; determining a compensation factor that compensates for a temperature of the environment around the heat detector using predetermined data obtained and the obtained the data; adjusting a first parameter relating to the temperature of an operation of the heat detector testing device based on the compensation factor; and generating a control signal that controls heat output of the heat detector testing device based on the adjusted first parameter during the functional test.

Claims

1. CLAIMS1. A method comprising: obtaining predetermined data relating to a temperature of operation of a heat detector testing device wherein the predetermined data is determined prior to a functional test on a heat detector that is located in an environment within which a functional test is to be carried out; and performing a compensation and heating process that compensates for the temperature of an environment around the heat detector, the performing comprising: obtaining data relating to a temperature of operation of the heat detector testing device wherein the data is determined during a functional test on the heat detector; determining a compensation factor that compensates for a temperature of the environment around the heat detector using the predetermined data and the obtained data determined during the functional test on the heat detector; adjusting a first parameter relating to a temperature of operation of a heat detector testing device based on the compensation factor; and generating a control signal that controls heat output of the heat detector testing device based on the adjusted first parameter during the functional test.

2. The method according to claim 1 wherein determining a compensation factor comprises: determining a difference between the predetermined data that was determined prior to a functional test on a heat detector and the obtained data that was determined during the functional test; and calculating the compensation factor based, at least in part, on the determined difference wherein the determined difference is proportional to a temperature offset caused by the temperature of the environment around the heat detector.

3. The method according to claim 1 or 2, wherein after generating the control signal that controls heat output of the heat detector testing device, the method further comprising: waiting for a predetermined amount of time; determining whether the functional test has ended after the predetermined amount of time, wherein: based on determining that the functional test has ended, stopping the test; and based on determining that the functional test has not ended:(i) performing the compensation and heating process;(ii) waiting for the predetermined amount of time;(iii) determining whether the functional test has ended after the predetermined amount of time; and based on determining that the functional test has not ended, repeating (i) to (iii) until the test has ended.

4. The method according to any preceding claim, wherein obtaining the data relating to the temperature of operation of the heat detector testing device comprises controlling and maintaining the temperature of operation of the heat detector testing device at a stored setpoint temperature during a functional test on the heat detector.

5. The method according to claim 4 wherein the stored setpoint temperature is included in at least part of the predetermined data relating a temperature of operation of a heat detector testing device.

6. The method according to any preceding claim, wherein the adjusted first parameter comprises a setpoint temperature, wherein the setpoint temperature is a temperature at which a temperature of operation of the heat detector testing device is maintained at during a functional test on the heat detector.

7. The method according to any preceding claim, wherein the temperature of operation of the heat detector testing device comprises a temperature of a heating element of the testing device wherein the heating element emits heat from the testing device based on the control signal.

8. The method according to claim 7, wherein the predetermined data and the obtained data determined during the functional test on the heat detector comprise a temperature of the heating element and a power applied to the heating element.

9. The method according to claim 7, wherein the predetermined data and the obtained data determined during the functional test on the heat detector comprise a temperature of the heating element and a voltage applied to the heating element.

10. The method according to any preceding claim, wherein the predetermined data is determined through a calibration process on heat detector testing device prior to a functional test on a heat detector wherein the calibration process activates a heat sensor and / or a device representative of a heat sensor of a heat detector11. The method according to claim 10, wherein the calibration process comprises determining data relating to the temperature of operation of the heat detector testing device when a temperature of a position where a heat detector is to be located during a functional test is a temperature that activates the heat detector.

12. The method according to any preceding claim, wherein generating a control signal that controls heat output of the heat detector testing device based on the adjusted first parameter during the functional test comprises comparing a second parameter from the obtained data that was determined during the functional test with the adjusted first parameter, wherein, the second parameter from the obtained data and the adjusted first parameter are the same type of parameter; and wherein, the control signal is configured to selectively change the heat output of the testing device, wherein: if the second parameter is larger than the first parameter, generate the control signal to decrease the heat output of the testing device; and / or if the second parameter is smaller than the first parameter, generate the control signal to increase the heat output of the testing device.

13. The method according to claim 12 wherein if the second parameter is equal to first parameter, generate a control signal that maintains the heat output of the testing device.

14. A heat detector testing device comprising: a controller configured to: obtain predetermined data relating to a temperature of operation of a heat detector testing device wherein the predetermined data is determined prior to a functional test on a heat detector that is located in an environment within which a functional test is to be carried out; and perform a compensation and heating process that compensates for the temperature of an environment around the heat detector, the performing comprising: obtain data relating to a temperature of operation of the heat detector testing device wherein the data is determined during a functional test on the heat detector; determine a compensation factor that compensates for a temperature of the environment around the heat detector using the predetermined data and the obtained data determined during the functional test on the heat detector; adjust a first parameter relating to a temperature of operation of a heat detector testing device based on the compensation factor; andgenerate a control signal that controls heat output of the heat detector testing device based on the adjusted first parameter during the functional test.

15. The device according to claim 14, further comprising: a heating element configured to emit heat from the testing device based on the control signal; a sensing arrangement configured to measure a second parameter relating to the temperature of operation of the heat detector testing device; a storage unit configured to store data.

16. The device according to claim 15 wherein the sensing arrangement comprises a heating sensor configured to measure the temperature of the heating element.

17. The device according to any of claims 14 to 16, further comprising a fan configured to create an airflow in the testing device and to direct heated air towards a reference point, wherein a reference point is the position where a heat detector is to be located during a functional test.

18. The device according to any of claims 14 to 17, wherein the controller is further configured to: determine a difference between the predetermined data that was determined prior to a functional test on a heat detector and the obtained data that was determined during the functional test; and calculate the compensation factor based, at least in part, on the determined difference wherein the determined difference is proportional to a temperature offset caused by the temperature of the environment around the heat detector.

19. A non-transitory computer-readable medium storing instructions, the instructions, when executed by one or more controllers, causing the one or more controllers to perform operations comprising: obtaining predetermined data relating to a temperature of operation of a heat detector testing device wherein the predetermined data is determined prior to a functional test on a heat detector that is located in an environment within which a functional test is to be carried out; and performing a compensation and heating process that compensates for the temperature of an environment around the heat detector, the performing comprising:obtaining data relating to a temperature of operation of the heat detector testing device wherein the data is determined during a functional test on the heat detector; determining a compensation factor that compensates for a temperature of the environment around the heat detector using the predetermined data and the obtained data determined during the functional test on the heat detector; adjusting a first parameter relating to a temperature of operation of a heat detector testing device based on the compensation factor; and generating a control signal that controls heat output of the heat detector testing device based on the adjusted first parameter during the functional test.

20. A method for calibrating a heat detector testing device, the method comprising: measuring a temperature at a reference point where a heat detector is to be located during a functional test; adjusting a first parameter relating to a temperature of operation of the testing device such that the measured temperature at the reference point corresponds to a predefined reference temperature, wherein the predefined reference temperature is representative of a temperature at which the heat detector is to be activated during the functional test; and storing the adjusted first parameter of the testing device.

21. The method according to claim 20, wherein the temperature of operation of the heat detector testing device comprises a temperature of a heating element of the testing device wherein the heating element emits heat from the testing device based on control signal.

22. The method according to any of claims 20 to 21 further comprising: measuring the temperature of operation of the testing device when the measured temperature at the reference point corresponds to the predefined reference temperature; storing the temperature of operation of the testing device.

23. The method according to any of claims 21 to 22, wherein the adjusted first parameter is a power applied to the heating element.

24. The method according to any of claims 21 to 22, wherein the adjusted first parameter is a voltage applied to the heating element.

25. The method according to any of claims 20 to 24, further comprising measuring a temperature at a reference point where a heat detector is to be located during a functional test before a power is applied to a heating element of the testing device.

26. A system for calibrating a heat detector testing device, the system comprising: a heat sensor configured to measure a temperature at a reference point where the heat detector is to be located during a functional test; a controller configured to: adjust a first parameter relating to a temperature of operation of the testing device such that the measured temperature at the reference point corresponds to a predefined reference temperature, wherein the predefined reference temperature is representative of a temperature at which a heat detector is to be activated during the functional test; and a storage unit configured to store the adjusted first parameter of the testing device.

27. The system according to claim 26 wherein the heat sensor is representative of a heat sensor of a heat detector, wherein the heat sensor is a separate device to the heat detector testing device.

28. A non-transitory computer-readable medium storing instructions, the instructions, when executed by one or more controllers, causing the one or more controllers to perform operations comprising: obtaining a temperature at a reference point where a heat detector is to be located during a functional test; adjusting a first parameter relating to a temperature of operation of the testing device such that the measured temperature at the reference point corresponds to a predefined reference temperature, wherein the predefined reference temperature is representative of a temperature at which the heat detector is to be activated during the functional test; and storing the adjusted first parameter of the testing device.

29. A method comprising: obtaining predetermined data relating to a temperature of operation of a heat detector testing device and predetermined data relating to a temperature of an environment around a heat detector that is located in an environment within which a functional test is to be carried out wherein the predetermined data is determined prior to a functional test on the heat detector; and performing a compensation and heating process that compensates for the temperature of an environment around the heat detector, the performing comprising: obtaining data relating to a temperature of an environment around the heat detector that is located in an environment within which a functional test is to be carried out;determining a compensation factor that compensates for a temperature of the environment around the heat detector using the predetermined data obtained and the obtained data; adjusting a first parameter relating to the temperature of an operation of the heat detector testing device based on the compensation factor; and generating a control signal that controls heat output of the heat detector testing device based on the adjusted first parameter during the functional test.

30. The method according to claim 29 wherein determining a compensation factor comprises: determining a temperature offset between the predetermined data obtained relating to a temperature of an environment around the heat detector testing device and the obtained data relating to a temperature of an environment around the heat detector; and calculating the compensation factor based, at least in part, on the temperature offset caused by the temperature of the environment around the heat detector.31 . The method according to any of claims 29 to 30, wherein after generating the control signal that controls heat output of the heat detector testing device, the method further comprising: waiting for a predetermined amount of time; determining if the functional test has ended after the predetermined amount of time, wherein: based on determining that the functional test has ended, stopping the test; and based on determining that the functional test has not ended:(i) performing the compensation and heating process;(ii) waiting for the predetermined amount of time;(iii) determining whether the functional test has ended after the predetermined amount of time; and based on determining that the functional test has not ended, repeating (i) to (iii) until the test has ended.

32. The method according to any of claims 29 to 31 , further comprising obtaining data relating to a temperature of operation of a heat detector testing device.

33. The method according to any of claims 29 to 32, further comprising controlling and maintaining a temperature of operation of the heat detector testing device at a stored setpoint temperature during a functional test on the heat detector.

34. The method according to claim 33, wherein the stored setpoint temperature is included in at least part of the predetermined data relating a temperature of operation of a heat detector testing device.

35. The method according to any of claims 29 to 34, wherein the adjusted first parameter comprises a setpoint temperature, wherein the setpoint temperature is a temperature at which a temperature of operation of the heat detector testing device is maintained at during a functional test on the heat detector.

36. The method according to any of claims 32 to 35, wherein the temperature of operation of the heat detector testing device comprises a temperature of a heating element of the testing device wherein the heating element emits heat from the testing device based on the control signal.

37. The method according to claim 36, wherein the obtained data determined during the functional test on the heat detector comprise a temperature of the heating element and a power applied to the heating element.

38. The method according to claim 36, wherein the obtained data determined during the functional test on the heat detector comprise a temperature of the heating element and a voltage applied to the heating element.

39. The method according to any of claims 29 to 38, wherein the predetermined data is determined through a calibration process on heat detector testing device prior to a functional test on a heat detector wherein the calibration process activates a heat sensor and / or a device representative of a heat sensor of a heat detector.

40. The method according to claim 39, wherein the calibration process comprises determining data relating to: the temperature of an environment surrounding the heat sensor and / or a device representative of a heat sensor of a heat detector and to the temperature of operation of the heat detector testing device when a temperature of a position where a heat detector is to be located during a functional test is a temperature that activates the heat detector.

41. The method according to any of claims 29 to 40, wherein generating a control signal that controls heat output of the heat detector testing device based on the adjusted first parameterduring the functional test comprises comparing a second parameter from the predetermined data obtained with the adjusted first parameter, wherein, the second parameter from the predetermined data obtained and the adjusted first parameter are the same type of parameter; and wherein, the control signal is configured to selectively change the heat output of the testing device, wherein: if the second parameter is larger than the first parameter, generate the control signal to decrease the heat output of the testing device; and / or if the second parameter is smaller than the first parameter, generate the control signal to increase the heat output of the testing device.

42. The method according to claim 41 wherein if the second parameter is equal to first parameter, generate a control signal that maintains the heat output of the testing device.

43. A heat detector testing device comprising: a controller configured to: obtain predetermined data relating to a temperature of operation of a heat detector testing device and predetermined data relating to a temperature of an environment around a heat detector that is located in an environment within which a functional test is to be carried out wherein the predetermined data is determined prior to a functional test on the heat detector; and perform a compensation and heating process that compensates for the temperature of an environment around the heat detector, the performing comprising: obtain data relating to a temperature of an environment around a heat detector that is located in an environment within which a functional test is to be carried out; determine a compensation factor that compensates for a temperature of the environment around the heat detector using the predetermined data obtained and the obtained data; adjust a first parameter relating to the temperature of an operation of the heat detector testing device based on the compensation factor; and generate a control signal that controls heat output of the heat detector testing device based on the adjusted first parameter during the functional test.

44. The device according to claim 43, further comprising: a heating element configured to heat the air around the heat detector; a sensing arrangement configured to measure a parameter relating to the temperature of operation of the heat detector testing device;a heat sensor configured to measure the temperature of the environment around the heat detector a storage unit configured to store data.

45. The device according to claim 44 wherein the sensing arrangement is a heating sensor configured to measure the temperature of operation of the heating element.

46. The device according to any of claims 43 to 45, further comprising a fan configured to create an airflow in the testing device and to direct heated air towards a reference point, wherein a reference point is the position where a heat detector is to be located during a functional test.

47. The device according to any of claims 43 to 46, wherein the controller is further configured to: determine a temperature offset between the predetermined data obtained relating to a temperature of an environment around a heat detector and the obtained data relating to a temperature of an environment around the heat detector; and calculate the compensation factor based, at least in part, on the temperature offset caused by the temperature of the environment around the heat detector.

48. A non-transitory computer-readable medium storing instructions, the instructions, when executed by one or more controllers, causing the one or more controllers to perform operations comprising: obtain predetermined data relating to a temperature of operation of a heat detector testing device and predetermined data relating to a temperature of an environment around a heat detector that is located in an environment within which a functional test is to be carried out wherein the predetermined data is determined prior to a functional test on the heat detector; and performing a compensation and heating process that compensates for the temperature of an environment around the heat detector, the performing comprising: obtaining data relating to a temperature of an environment around a heat detector that is located in an environment within which a functional test is to be carried out; determining a compensation factor that compensates for a temperature of the environment around the heat detector using predetermined data obtained and the obtained the data;adjusting a first parameter relating to the temperature of an operation of the heat detector testing device based on the compensation factor; and generating a control signal that controls heat output of the heat detector testing device based on the adjusted first parameter during the functional test.

Images