Electroluminescence measurement system

Abstract

The invention relates to an electroluminescence measurement system for measuring electroluminescence EL under a magnetic field and for automatic calibration, with a cabinet system that keeps the temperature constant and can be placed under vacuum and a valve system that allows gases to enter the cabinet, in order to prevent signal weakness and measurement noise and to make electroluminescence (EL) measurements safe.

Description

[0001] ELECTROLUMINESCENCE MEASUREMENT SYSTEM

[0002] Technical Field

[0003] The present invention relates to an electroluminescence measurement system with automatic calibration, with a cabinet system that keeps the temperature constant and can be placed under vacuum and a valve system that allows gases to enter the cabinet, in order to prevent signal weakness and measurement noise and to make electroluminescence (EL) measurements safe.

[0004] State of the Art

[0005] Electroluminescence (EL) measurement devices have a wide range of applications in various fields. These devices are used to detect defects in order to increase the efficiency of solar cells and control production quality. They test performance parameters such as brightness, color accuracy, and energy efficiency of devices such as LED and OLED. They also play an important role in materials science research by studying the electronic properties of semiconductor materials. They are used in photovoltaic research to optimize the performance of devices such as solar cells. Electroluminescence imaging offers an ideal method for surface mapping of semiconductor devices, particularly thin-film solar cells. These devices are used as a critical tool in the development and quality control processes of light-emitting materials. The most common uses of these devices are:

[0006]

[0007] is of Solar Cells:

[0008] Electroluminescence measurement devices are used to evaluate the efficiency and uniformity of solar cells. Microstructural defects in cells and errors occurring during manufacturing can be detected through electroluminescence signals. These devices are also used in the production process to improve the quality of solar cells.

[0009] This analysis method may not provide a completely homogeneous analysis, especially in large-sized solar cells. Additionally, when working with thin films, problems such as signal weakness and high noise levels may be encountered. Therefore, electroluminescence measurements are time-consuming and data processing iscomplex, which can slow down production lines. Additionally, a problem may arise that small defects cannot be detected due to low light intensity.

[0010] LED and OLED Performance Tests:

[0011] Electroluminescence measurement devices are widely used to evaluate the performance of LEDs and OLEDs. These devices analyze parameters such as light emission efficiency, color accuracy, brightness, and energy consumption. Especially in OLED technology, these measurements are critical to optimizing device longevity and overall performance. Despite the high sensitivity of OLEDs, the fact that environmental factors (e.g. temperature and humidity) can affect the results during the measurement can be considered a drawback. Aging of OLEDs over time can cause weakening of electroluminescent signals. This can make it difficult to measure the device's performance accurately and may lead to long-term reliability issues.

[0012] Materials Science Research:

[0013] Electroluminescence measurement devices are used to analyze the band gap, defect density, and electrical properties of semiconductor materials. These measurements allow in-depth investigation of the electronic properties of materials. Electroluminescence measurements may give misleading results in some areas due to the inhomogeneous structure of the material. Additionally, measuring effects only at the surface can prevent a full understanding of the internal structure of the material. This may cause problems such as not being able to detect low-density defects or leading to erroneous evaluations due to signal weakness in measurements performed to determine surface defects.

[0014] EL measurement systems used in the present art are used to characterize the electroluminescence properties of LED and OLED devices. These systems are generally limited to measuring the EL behavior of devices. They are not capable of measuring under a magnetic field, so special measurements such as magneto-electroluminescence (MEL) cannot be made. Current state-of-the-art EL measurement systems are not optimized for spintronic (e.g. spin OLED) devices. Most systems operate under atmospheric conditions and do not offer the possibility of measurements under vacuum or inert gas environments. This makes it difficult to account for environmental factors that may affect material and device performance.In the state of the art, special systems have been developed in some laboratories to examine material properties under magnetic fields (such as vibrating sample magnetometer, VSM). However, these systems are generally not suitable for optoelectronic measurements and cannot provide EL measurement. Since these devices are not designed to analyze electroluminescence signals, sample luminescence characterization and sample performance measurements under a magnetic field cannot be performed or external systems are required.

[0015] In the state of the art, systems operating in vacuum or under inert gas are generally designed for electroluminescence or other spectroscopic measurements, and vacuum systems integrated with a magnetic field are not included in the state of the art.

[0016] In summary, the systems in the current art generally have the following technical problems:

[0017] • Current systems cannot study the effects of magnetic field on EL performance.

[0018] This situation causes a lack of knowledge, especially in spintronic applications.

[0019] • Material properties may deteriorate due to environmental effects such as oxidation. Existing systems operating in atmospheric conditions may not reflect the actual performance of the devices.

[0020] • The lack of systems that combine magnetic field, vacuum, and EL measurement forces users to use multiple devices. This situation both increases costs and may cause inconsistency in measurements.

[0021] As a result of the research made in the state of the art, document No CN221706898U is encountered. The application relates to a device for measuring the external quantum efficiency of the electroluminescence of a light emitting device. The device consists of a high-sensitivity detector and a high-sensitivity ammeter. However, the application does not include a cabin that keeps the temperature constant (temperature can be adjusted) and can be placed under vacuum.

[0022] As a result, due to the abovementioned disadvantages and the insufficiency of the current solutions regarding the subject matter, a development is required to be made in the relevant technical field.Object of the Invention

[0023] The invention is inspired by the current situation and aims to solve the above-mentioned drawbacks.

[0024] The main object of the present invention is to prevent signal weakness and measurement noise and make electroluminescence (EL) measurements safer by reducing the effect of environmental factors with a cabin that keeps the temperature constant and can be placed under vacuum.

[0025] The object of the present invention is to reduce oxidation with the valve system that allows gases to enter the cabin.

[0026] The present invention can be used to study the electroluminescence (EL) properties of devices such as LEDs and OLEDs under magnetic fields. Additionally, it can be used to evaluate the EL performance of spintronic-based devices such as spin OLED.

[0027] The present invention enables material optimization of next-generation optoelectronic devices.

[0028] The present invention tests the operating performance of LED and OLED designs under magnetic fields, enabling the development and quality control of new LED and OLED technologies.

[0029] The present invention enables the development of devices that operate under magnetic fields or whose performance changes in atmospheric environments.

[0030] In the invention, samples are protected from atmospheric effects thanks to the vacuum chamber. It is capable of operating under vacuum or with inert gases such as nitrogen. Thus, environmental factors such as oxidation can be eliminated and the true optoelectronic properties of the sample can be measured. Additionally, measurements can be made at low pressure or under inert gas, enabling more stable testing of materials such as OLEDs.

[0031] The invention has an integrated system that combines magnetic field, vacuum and EL measurement functions. Thus, different measurement needs can be met with a single system without the need to work with separate devices.Signal weakness and measurement noise are frequently encountered problems in electroluminescence measurements in the state of the art, especially in thin film solar cells and materials with low light intensity. This situation negatively affects the sensitivity and accuracy of the measurements. To solve the problem in question, the invention uses an advanced signal processing algorithm. The system is programmed with “Python”. In the invention, the light collection capacity of the device has been maximized by using digital data filtering techniques to reduce environmental and system noise. In this way, the invention can provide EL spectrum even at low light intensities.

[0032] In the state of the art, the accuracy of electroluminescence measurements can be affected by environmental factors (e.g., temperature, humidity). This can lead to loss of performance, especially in measurements of organic materials. In order to control this situation, the invention uses a cabin that keeps the temperature constant (temperature adjustable) and can be placed under vacuum. This cabinet also has a valve system that allows gases such as nitrogen (to reduce oxidation) to enter. The cabin is software-supported and constantly keeps the cabin interior constant according to environmental conditions. Thus, EL measurements become more secure.

[0033] In the state of the art, repeatability and calibration problems of electroluminescence measuring devices can cause inconsistent measurement results. This makes comparability of measurements made on different devices or over different time periods particularly difficult. To overcome this problem, the calibration settings of the invention are performed automatically. When the system is first turned on, it automatically adjusts itself according to the ambient conditions and becomes ready for measurement. Additionally, standardized reference materials are used to ensure reproducibility.

[0034] In summary, the subject of the invention generally has the following advantages:

[0035] • It contributes to spintronic research by enabling the simultaneous examination of Magnetic Field and EL properties.

[0036] • Measurement sensitivity is increased with vacuum and gas controlled environment features.

[0037] • Thanks to its wide wavelength measurement capacity, different devices can be analyzed in detail.

[0038] • All these features eliminate the shortcomings of standard systems and offer the user a versatile solution.The structural and characteristic features of the present invention will be understood clearly by the following drawings and the detailed description made with reference to these drawings and therefore the evaluation shall be made by taking these figures and the detailed description into consideration.

[0039] Figures Clarifying the Invention

[0040] Figure 1 is the general view of the electroluminescent device which is the subject of the invention.

[0041] Figure 2 is perspective views of the electroluminescent device from different angles.

[0042] Figure 3 is perspective views of the sensor holder from different angles.

[0043] Figure 4 is perspective views of the height adjuster from different angles.

[0044] Figure 5 is perspective views of the electronic component box.

[0045] Figure 6 is the perspective views of the electromagnet holder.

[0046] Figure 7 is the view of the electroluminescent device fixed between the electromagnets.

[0047] Figure 8 is a view of the cabin.

[0048] Description of Part References

[0049] A. Electroluminescence device

[0050] 1. Sensor

[0051] 2. Sensor holder

[0052] 3. Height adjuster

[0053] 4. Main body

[0054] 5. Electronic component box

[0055] 6. Cabin

[0056] 6.1. Cabin cover

[0057] 7. Vacuum inlet

[0058] 8. Gas inlet9. Electromagnet

[0059] 10. Electromagnet holder

[0060] Detailed Description of the Invention

[0061] In this detailed description, the preferred embodiments of the electroluminescence measurement system are described solely for the purpose of a better understanding of the subject matter.

[0062] The invention is generally an electroluminescence measurement system, characterized by comprising:

[0063] • electroluminescence device (A) comprising:

[0064] o a main body (4) on which the sample to be measured is placed, o sensor that detects the light coming from the sample (1 ),

[0065] o sensor holder (2) that secures the sensor (1 ),

[0066] o height adjuster (3), which is connected to the sensor holder (2) and adjusts the distance of the sensor (1) from the sample surface, • processor that receives the detected light of the sample via the sensor (1), converts the light into electrical signals, programs it, and calculates the electroluminescence intensity, color coordinates, luminous power, and quantum efficiency parameters of the sample,

[0067] • cabin (6) in which the electroluminescence device (A) is placed to protect the sample from ambient conditions,

[0068] • vacuum inlet (7) located on the cabin (6) and providing external gas entry into the system,

[0069] • electromagnet (9) located on the electromagnet holder (10) positioned on both sides of the sensor holder (2) to measure the sample under the magnetic field.

[0070] The sensor (1), which has a sensitive and wide spectral detection capacity, has high sensitivity in the optical visible region to accurately detect the color spectrum. The sensor (1) is fixed by means of the sensor holder (2). The height adjuster (3) allows the sensor (1) to be brought closer / further away from the surface of the sample to be measured, which is located on the main body (4). Electronic components are located in the electronic component box (5). The electroluminescence device (A) used for measurement is located inside the cabin (6). The vacuum inlet (7) located on the cabin(6) puts the measuring system into vacuum. The gas inlet (8) located on the cabin (6) provides gas entry to the system.

[0071] The sensor (1) can measure the electroluminescence spectrum in the range of 400-700 nm. Thus, the full spectral performance of LED, OLED and spin OLED devices can be analyzed and how the devices operate at different wavelengths can be examined.

[0072] The sensor (1 ) detects the light coming out of the sample. The detected light is converted into electrical signals and analyzed by the Arduino Nano microprocessor programmed with Python. The processor performs the necessary mathematical operations and calculates / draws graphs for parameters such as electroluminescence intensity, CIE color coordinates, luminous power, quantum yield, and brightness of the sample. The sensor holder (2) performs the most ideal experimental measurement by adjusting the distance of the sensor to the sample surface. The electroluminescence device (A) that performs the measurement is placed inside the cabin (6) and protects the sample to be measured against environmental factors (humidity and temperature), thus ensuring more accurate measurements. The vacuum inlet (7) located on the cabin (6) is connected to an external pump and is used to put the inside of the cabin (6) under vacuum. Thus, it protects the sample to be measured from instant humidity and environmental pollution. The gas inlet (8) located on the cabin (6) is connected to the gas cylinder from outside and injects gases such as nitrogen into the system from outside, preventing the oxidation of samples that are easily spoiled in the air environment. The electromagnets (9) located on the electromagnet holder (10) positioned on both sides of the sensor holder (2) can measure the EL density of samples such as LEDs or OLEDs under a magnetic field. The magnetic field can be adjusted up to ± 0.4 Tesla (± 4000 Gauss) and magnetic field scanning can be performed. Thus, the EL intensity can be measured and plotted against the changing magnetic field.

[0073] The operating principle of the system is as follows:

[0074] The sample to be measured electroluminescence is placed in the sample section on the main body (4). The adjustment is then made using the height adjuster (3) to set the ideal distance of the sensor (1) from the sample surface. If the sample is not affected by environmental conditions, measurement can be started. However, if a sample is affected by environmental conditions, the electroluminescence device (A) is placed inside the cabin (6). The sample is placed in the sample holder on the main body (4) and the height of the electroluminescence device (A) is adjusted. Then close the cabin cover (6.1) andstart the vacuum pump. The inside of the cabin (6) is put under vacuum through the vacuum inlet (7). In the preferred embodiment of the invention, when it is desired to work in a gas environment such as nitrogen, argon, etc., gas inlet is provided from the gas inlet (8). Then, the computer program is run, and the desired measurements are taken. In another preferred embodiment of the invention, the EL intensity (magnetoelectroluminescence, MEL) can be measured in response to the magnetic field by placing the electromagnets (9) on both sides of the sensor holder (2).

Claims

CLAIMS1. Electroluminescence measurement system, characterized by comprising:• electroluminescence device (A) comprising:o a main body (4) on which the sample to be measured is placed, o sensor that detects the light coming from the sample (1 ), o sensor holder (2) that secures the sensor (1 ),o height adjuster (3), which is connected to the sensor holder (2) and adjusts the distance of the sensor (1) from the sample surface, • processor that receives the detected light of the sample via the sensor (1), converts the light into electrical signals, programs it, and calculates the electroluminescence intensity, color coordinates, luminous power, and quantum efficiency parameters of the sample,• cabin (6) in which the electroluminescence device (A) is placed to protect the sample from ambient conditions,• vacuum inlet (7) located on the cabin (6) and providing external gas entry into the system,• electromagnet (9) located on the electromagnet holder (10) positioned on both sides of the sensor holder (2) to measure the sample under the magnetic field.

2. The electroluminescence measurement system according to claim 1, characterized by comprising a gas inlet (8) located on the cabin (6), which can be connected to a gas cylinder from the outside to inject gases into the system and prevent oxidation of samples that are easily deteriorated in the air environment.

3. The electroluminescence measurement system according to claim 1, characterized by comprising a sensor (1) for measuring the electroluminescence spectrum in the range 400-700 nm.

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