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60 results about "Confirmation test" patented technology

Automatic confirmation testing method and system for embedded software

The invention discloses an automatic confirmation testing method and system for embedded software. The testing method comprises the following steps that: customizing a testing process, managing testing data, parsing the testing process, analyzing tested software, analyzing a testing result, carrying out network communication, controlling a testing interface, controlling a testing time sequence and reading tested platform software environment. The testing system comprises a testing process customization module, a testing data management module, a testing process parsing module, a tested software analyzer, a testing result analysis module, a network communication module, a testing interface control module, a testing time sequence control module and a tested platform software environment reader. By use of the method, the problems of the accurate input of a test case and the real-time collection of the output of tested software in an embedded software testing process are solved, the operation situation of the tested software is tracked under a situation that the code bloat rate of the tested software is almost not changed, and a full-automatic and visual corresponding relational graph of the test case and the operation situation of the tested software can be provided for testing personnel.
Owner:昆明奥多智能科技有限公司

Stimulation information compilation method for testing cognitive competence value

The invention provides a stimulation information compilation method for testing a cognitive competence value. The stimulation information compilation method at least comprises: selecting at least one stimulation information with test efficiency of the sample personnel conforming to the normal distribution; setting at least one reasonable sequence according to the efficiency and cognition dimension of the at least one stimulation information so as to be used for the test personnel to select according to individual favorite; dynamically compiling lie detection stimulation information and / or reverse stimulation information so as to test the reliability of the test personnel according to the physiological information and / or psychological state of the test personnel; comparing a test score of the test personnel and the score of the effective sample personnel on the normal distribution model so as to confirm the distribution situation of each cognition dimension of the test personnel. The stimulation information with high efficiency is reasonably selected according to the normal distribution model, and the lie detection stimulation information and guide stimulation information are dynamically compiled according to the variation of the physiological state and psychological state of the test personnel, so that real cognitive competence value data of the test personnel can be acquired.
Owner:BEIJING HUANDU INST OF WISDOM MIND TECH LTD

System and method for testing NVM chip

The invention discloses an NVM chip test system, comprising a test instrument, a multi-channel selection controller used for selecting test channels and a probe station which are sequentially connected for signal transmission. The invention also discloses an NVM chip test method including the following steps: selecting test channels; connecting the test channels and the probe; modifying files used for automatically distributing test sources to realize the automatic communication between the test instrument and the probe station; implementing a first flow of chip test to judge whether the chip is normal or not; determining the channel required to be cut according to the normal or abnormal states of the chip; closing the channels on the multi-channel selector sequentially; selecting and going-through a special objective chip to write the test results into the chip; generating and storing classified information of the chip test results; reading classified information of the chip test results and confirming the test results; implementing a second test flow to judge whether the chip is normal or not. The invention can make use of the test channels to a max extent so as to enhance a common test quantity and to shorten test time to raise a manufacturing speed of the product.
Owner:SHANGHAI HUA HONG NEC ELECTRONICS

Treponema pallidum IgG antibody biotin avidin enzyme-linked immune detection kit and preparation method thereof

The invention relates to a treponema pallidum IgG antibody biotin avidin enzyme-linked immune detection kit and a preparation method thereof, which relates to the syphilis detection. The kit comprises a concentrated washing liquid bottle, a negative and positive control bottle, a biotin mark antihuman IgG specific fragment gamma chain monoclonal antibody bottle, a horseradish peroxidase mark avidin bottle, a TMB coloured solution bottle A, a coloured solution bottle B, a reaction stopping solution bottle, a micropore plate coated with recombinant antigen. The treponema pallidum has infectious standard strain Nichol strain and treponema pallidum non-infectious standard strain Reiter strain, by using a proteomics method, the treponema pallidum proteomics can be separated through dimensional electrophoresis, protein with strong immunogenicity can be identified by different patient or infectious animal serum, and then an antigen marker can be searched. The antigen marker is used for syphilis confirmation test, so that diagnosis sensitivity and specificity can be increased, a window stage is shortened. The treponema pallidum antibody can be sensitively detected and enables quantitative measurement, and has the advantages of cheap price, simple operation and accurate result.
Owner:ZHONGSHAN HOSPITAL XIAMEN UNIV

Method for testing storage performance of NVRAM

The invention belongs to the technical field of electronics. The invention relates to a method for comprehensively testing the storage performance of an NVRAM (Non-Volatile Random Access Memory). By adopting the technical scheme of specific constant value detection, variable value detection and offline and environment simulation detection, rapid, accurate and comprehensive fault diagnosis can be realized, and the reliability, accuracy and comprehensiveness of NVRAM storage performance testing are effectively improved. Hardware resources required by the test method are a self-made test device and a tested object NVRAM, and required software is a self-written test program solidified in a memory of the self-test device. After the testing device is powered on and started, the performance of the testing device can be diagnosed, after it is confirmed that the performance of the testing device is normal, on-line constant value, on-line variable value and off-network storage performance testing operation is conducted on the Nvram, and a testing result is fed back. The problems of incompleteness and incapability of detecting boundaries of the conventional test are solved, and the complete test of NVRAM full-storage space and online and offline synchronous detection is realized. The testing method has the advantages of being low in cost, high in reliability and easy to implement.
Owner:LUOYANG INST OF ELECTRO OPTICAL EQUIP OF AVIC

Defect information processing system and method for test object

The embodiment of the invention provides a defect information processing system and method for a test object. The system comprises a test platform used for sending defect information for the test object to a research and development platform; the research and development platform is integrated with a plurality of research and development systems and is used for receiving defect information aimingat a test object and sending the defect information aiming at the test object to the research and development systems; the research and development system is used for acquiring feedback information for the defect information and sending the feedback information to the test platform through the research and development platform; the operation and maintenance platform is used for receiving problem information generated by the test platform according to feedback information of the plurality of research and development systems, wherein the problem information is used for indicating and confirmingwhether the test object has a production problem. According to the invention, the defect information can be transferred across research and development platforms, test platforms and operation and maintenance platforms, and can also be transferred among research and development systems in the research and development platforms, so that the waiting time is reduced, the processing efficiency is improved, and the historical problem of unmanned tracking of production problems is solved.
Owner:TAIKANG LIFE INSURANCE CO LTD
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