The present invention relates to a method for examining a measurement tip (100, 110) of a scanning probe microscope (520), wherein the method includes the following steps of (a) producing at least onetest structure (600, 650, 710, 730, 750, 770, 810, 850) before or after analyzing a sample (400, 510) by means of the measuring tip (100, 110); and (b) examining the measuring tip (100, 110) with theaid of the at least one test structure (600, 650, 710, 730, 750, 770, 810, 850) produced.