This invention discloses a method and
system for
statistical analysis and
visualization of experimental data in IC substrate material research and development, aiming to address issues such as insufficient adaptability to existing technologies, limited statistical dimensions, weak
visualization, and lack of intelligent optimization and iteration mechanisms. The method includes: collecting and preprocessing data throughout the entire research and development process; assigning
traceability codes to construct a hierarchical
database; establishing a multi-dimensional statistical indicator
system; employing multi-factor
interactive analysis to mine parameter correlations and filter key parameters; constructing a standardized
visualization model and configuring interactive functions; establishing an anomaly warning mechanism and generating optimization suggestions; and storing data with tags and iteratively optimizing the model. The
system includes five collaborative modules. This invention achieves standardized management and control, in-depth analysis, intuitive presentation, and closed-
loop optimization of research and development data, improving
data reliability and decision-making accuracy, reducing the interpretation threshold and research and development costs, shortening the cycle, achieving full-
scenario coverage, and continuous upgrading of research and development capabilities. It is applicable to various IC substrate material research and development scenarios.