Polymetallic nodule deck coverage calculation system and method

Abstract

The present invention discloses a system and method for calculating the deck coverage rate of polymetallic nodules, which belongs to the field of on-site analysis of marine polymetallic nodule resource detection, effectively solves the inefficiency and arbitrariness of manual statistics and estimation, makes the data of analyzing and measuring the sample coverage rate more accurate, and makes the operation more efficient and convenient. The system for calculating the deck coverage rate of polymetallic nodules of the present invention comprises a measuring platform, an image acquisition unit and a measuring terminal, wherein a sample placement area with a measuring scale is provided on the measuring platform, the image acquisition unit is located above the measuring platform and is used to photograph a sample distribution map of the sample placement area, and the measuring terminal calculates the deck coverage rate of the sample according to the image information photographed by the image acquisition unit.

Description

[Technical field]

[0001] The present invention belongs to the field of on-site analysis of marine polymetallic nodule resource detection, and in particular relates to a system and method for calculating the deck coverage rate of polymetallic nodules. [Background technology]

[0002] The measurement of the deck coverage rate of polymetallic nodules relies on manually placing nodule samples on a measuring plate with a ruler of a certain area. It is required that the nodule samples be arranged as tightly as possible without leaving any gaps. Finally, the area ratio of polymetallic nodules on the measuring plate is manually estimated as the analysis result of the deck coverage rate.

[0003] The general workflow is as follows: after the polymetallic nodule samples are taken out from the box-type, grab bucket and other samplers, the sediments adhering to the surface of the nodule samples are washed with seawater to remove them, and then the nodule samples are placed one by one on a measuring plate with a scale (the area of ​​the plate is consistent with the opening area of ​​the box-type or grab bucket sampler). The nodules are required to be laid tightly without overlapping, and as few gaps as possible (to reduce estimation errors). Then, with the help of a scale, the polymetallic nodule deck coverage rate sampled at the station is estimated based on the area ratio (percentage) of the sample coverage area on the measuring plate. The disadvantage of this method is that no matter how tightly the polymetallic nodules are laid manually, gaps are inevitable, and the area occupied by the gaps is difficult to estimate manually and cannot be eliminated, which ultimately affects the measurement and analysis accuracy of the polymetallic nodule sample coverage rate itself, and the work of laying samples is time-consuming and labor-intensive, and the efficiency is very low. [Summary of the invention]

[0004] The technical problem to be solved by the present invention is to overcome the shortcomings of the prior art and propose a polymetallic nodule deck coverage calculation system, which effectively solves the inefficiency and arbitrariness of manual statistics and estimation, makes the data of analysis and measurement of sampling sample coverage more accurate, and the operation more efficient and convenient.

[0005] In order to solve the above technical problems, the present invention adopts the following technical solutions:

[0006] The deck coverage rate calculation system of polymetallic nodules includes a measurement platform, an image acquisition unit and a measurement terminal. The measurement platform is provided with a sample placement area with a measurement scale. The image acquisition unit is located above the sample placement area and is used to shoot a sample distribution map of the sample placement area. The measurement terminal calculates the deck coverage rate of the sample according to the image information shot by the image acquisition unit. In the prior art, the deck coverage rate of polymetallic nodules is measured by manual estimation. In order to increase the accuracy of the estimation result, the samples are placed on a platform with a scale. The samples need to be arranged closely to eliminate the gaps between the samples. However, the shapes of the samples are irregular and the gaps between the samples are unavoidable. Therefore, the results obtained when calculating the deck coverage rate are relatively arbitrary and not accurate enough. The method is time-consuming and labor-intensive, and is also affected by the proficiency and patience of the operator. The accuracy is not high, which affects the scientificity and work efficiency of the marine survey. The present invention adopts image recognition technology. The measurement terminal can directly identify the samples in the image information through computer software, and calculate the deck coverage rate of the samples according to the measurement scale. The gaps between the samples will not affect the measurement result. The measurement efficiency is high and the labor consumption is low.

[0007] Furthermore, the measuring platform includes a plurality of sample carriers, each of which defines a sample placement area with a measuring scale, and the plurality of sample carriers are stacked and arranged for screening samples layer by layer. Usually, after calculating the sample deck coverage, the samples need to be further divided into different types according to the particle size to calculate other data. The operation of dividing the samples into multiple parts is generally a manual operation, which is extremely labor-intensive. The measuring platform of the present invention has multiple layers of sample carriers that can screen samples, and can directly screen the samples into each layer of sample carriers according to the set division standard. The samples are screened into types of different sizes before measurement, which improves the efficiency of coverage measurement and greatly reduces the manual operation of sample classification.

[0008] Furthermore, the remaining sample carriers other than the bottom layer sample carrier are provided with sieve plates for sieving samples, and the sieve plate sieving mesh number increases from top to bottom. The samples can be placed on the sample carrier of the first layer for sieving. Since the sieve plate sieving mesh number increases from top to bottom, the sample particle size range in each layer of sample placement area is different, which can avoid overlapping of samples as much as possible, making the measurement result more accurate.

[0009] Furthermore, a detachable partition is slidably installed in the sample carrier, and the partition on the remaining sample carriers other than the bottom sample carrier is located below the sieve plate. The bottom sample carrier has only a partition, and the remaining sample carriers are installed with both a partition and a sieve plate. The sieve plate is located above the partition. When screening samples, the partition is taken out, and the samples can fall smoothly. The remaining samples will be blocked by the partition after falling on the bottom sample carrier. After the screening is completed, the partition is installed to block the sample placement area below during shooting, so as to prevent the samples in the sample placement area below from interfering with the measurement results of this layer.

[0010] Furthermore, the sieve plate is detachably connected to the sample carrier. The sieve plate can be removed from the sample carrier. The sieve on the sieve plate may affect the recognition of the sample by the measurement terminal. After the partition is installed, the sieve plate is removed and the sample on the sieve plate falls onto the partition. In this way, when the measurement terminal recognizes the sample, it will not be disturbed by the grid lines on the sieve plate, ensuring that the sample can be accurately recognized.

[0011] Furthermore, the multiple sample carriers are stacked freely; or, the measuring platform further includes a carrier bracket, the multiple sample carriers are coaxially mounted on the carrier bracket, and the sample carriers rotate and translate relative to the carrier bracket; or, the measuring platform further includes a carrier bracket, the multiple sample carriers are slidably mounted on the carrier bracket in an extraction manner, and the sample carriers slide and translate relative to the carrier bracket. The sample carriers are stacked freely, and free stacking means that the sample carriers are directly stacked together by their own weight, and there is no mechanical structure connection between adjacent sample carriers. Therefore, when switching to the sample carriers of the next layer, the sample carriers of the previous layer can be directly moved away, which is low in cost;

[0012] The rotational cooperation between the sample carriers means that the adjacent sample carriers can rotate relative to each other, and the sample carrier and the carrier support can rotate relative to each other. The image information of the sample carrier of the next layer can be collected by rotating the sample carrier half a circle, which is more labor-saving.

[0013] The sample carrier is slidably matched with the carrier bracket, and the sample carrier can be directly slid and removed from the carrier bracket, and the removal process is labor-saving and low-cost.

[0014] Furthermore, the sample placement area is rectangular, and two adjacent sides of the sample placement area are provided with measurement scales. The rectangular sample placement area enables the measurement terminal to better calculate the deck coverage rate, and the two sides of the rectangular sample placement area are perpendicular to each other, and the measurement scales on the two sides are perpendicular to each other. The perpendicular scales can be used as a most standard scale comparison, and the measurement terminal can easily and accurately calculate the sample deck coverage rate according to such measurement scales.

[0015] Furthermore, the measuring system also includes a vibration source that causes the sample placement area to vibrate. The vibration source can generate vibrations. If there are multiple layers of sample carriers, the purpose of vibrating the samples to promote screening can be achieved; if there is only one layer of sample carrier, the samples can also be vibrated to separate the samples and reduce the overlap between the samples, which can further reduce manual operations.

[0016] The present invention also provides a method for calculating the deck coverage rate of polymetallic nodules. The system comprises a measuring platform, an image acquisition unit and a measuring terminal. The measuring platform is provided with a sample placement area with a measuring scale. The method comprises the following steps:

[0017] S10: Spread the sample flat in the sample placement area;

[0018] S20: The image acquisition unit acquires a sample distribution map in the sample placement area and uploads the captured image to the measurement terminal;

[0019] S30: The measuring terminal calculates the deck coverage of the sample according to the image information taken by the image acquisition unit.

[0020] Furthermore, the measurement platform includes a plurality of sample carriers for defining the sample placement area, and steps S10 and S20 are repeated. The image acquisition unit acquires the sample distribution map in each layer of the sample placement area and uploads it to the measurement terminal. In step S30, the measurement terminal calculates the sample deck coverage rate in each layer of the sample placement area according to the image information taken by the image acquisition unit.

[0021] These features and advantages of the present invention will be disclosed in detail in the following specific embodiments and drawings.

Brief Description of the Drawings

[0022] The present invention will be further described below in conjunction with the accompanying drawings:

[0023] Figure 1 It is a structural schematic diagram of a measuring system in Embodiment 1 of the present invention;

[0024] Figure 2 The structure of the sample carrier in the first embodiment of the present invention is shown in FIG. Figure 1 ;

[0025] Figure 3 The structure of the sample carrier in the first embodiment of the present invention is shown in FIG. Figure 2 ;

[0026] Figure 4 This is a schematic diagram of the structure of the measurement platform in the first embodiment of the present invention;

[0027] Figure 5 It is a schematic top view of the sample placement area in the first embodiment of the present invention;

[0028] Figure 6 It is a side schematic diagram of a measuring platform with a carrier bracket in the first embodiment of the present invention;

[0029] Figure 7 is a schematic top view of a measuring platform without a carrier support in the first embodiment of the present invention;

[0030] Figure 8 This is a schematic diagram of the structure of the measurement platform in the second embodiment of the present invention;

[0031] Fig. 9 This is a schematic diagram of the structure of the measurement platform in the third embodiment of the present invention;

[0032] Fig.10 This is a flow chart of the calculation method in Embodiment 4 of the present invention.

[0033] Reference numerals:

[0034] A measuring terminal 100;

[0035] Image acquisition unit 200;

[0036] Measuring platform 300, measuring scale 310, first scale 311, second scale 312;

[0037] Sample placement area 320;

[0038] Carrier bracket 330, positioning pin 331, support plate 332, rotating shaft 333;

[0039] Sample carrier 340, first layer sample carrier 340a, second layer sample carrier 340b, bottom layer sample carrier 340c, sieve plate 341, partition plate 342;

[0040] The chute 343, the first chute 343a, the second chute 343b, the chute outlet 345, the first chute outlet 345a, the second chute outlet 345b;

[0041] Vibration source 350. [Specific implementation method]

[0042] The technical solutions of the embodiments of the present invention are explained and described below in conjunction with the drawings of the embodiments of the present invention, but the following embodiments are only preferred embodiments of the present invention, not all. Based on the embodiments in the implementation mode, other embodiments obtained by those skilled in the art without creative work are all within the protection scope of the present invention.

[0043] Embodiment 1:

[0044] Reference Figure 1The deck coverage rate calculation system of polymetallic nodules includes a measurement platform 300, an image acquisition unit 200 and a measurement terminal 100. The measurement platform 300 is provided with a sample placement area 320 with a measurement scale 310. The image acquisition unit 200 is located above the sample placement area 320 and is used to photograph the sample distribution map of the sample placement area 320. The measurement terminal 100 calculates the deck coverage rate of the sample according to the image information photographed by the image acquisition unit 200. In the prior art, the deck coverage rate of polymetallic nodules is measured by manual estimation. In order to increase the accuracy of the estimation result, the samples are placed on a platform with scales, and the samples need to be arranged closely to eliminate the gaps between the samples. However, the shapes of the samples are irregular, and the gaps between the samples are unavoidable. Therefore, the results obtained when calculating the deck coverage rate are relatively arbitrary and not accurate enough. The method is time-consuming and labor-intensive, and is also affected by the proficiency and patience of the operator. The accuracy is not high, which affects the scientific nature and work efficiency of the marine survey.

[0045] The present invention adopts image recognition technology. The measurement terminal 100 can directly identify the sample in the image information through computer software, and calculate the sample deck coverage rate according to the measurement scale 310. The coverage rate data obtained after processing is a net coverage rate, which can completely eliminate the influence of the laying gaps between individual tuberculosis samples. The gaps between samples will not affect the measurement results, and the measurement efficiency is high and the labor consumption is low.

[0046] The image acquisition unit 200 can be fixed or handheld, and the acquired image information can be uploaded to the measurement terminal 100 by wireless or wired means or by storage medium transmission. The measurement terminal 100 can also analyze and count other characteristic parameters of the tuberculosis sample, such as the number, the proportional distribution of individual sizes, etc.

[0047] In conventional measurements, after measuring the sample deck coverage, the sample needs to be divided into different types according to the particle size to measure other data. The operation of dividing the sample into multiple parts is generally a manual operation, which consumes a lot of manpower. In order to solve the problem of sample splitting, the measurement platform 300 includes multiple sample carriers 340, each sample carrier 340 defines a sample placement area 320 of a measurement scale 310, and multiple sample carriers 340 are stacked and arranged to screen samples layer by layer. In the present invention, the measurement platform 300 can directly screen the sample into each layer of sample carriers 340 according to the set division standard, and screen the sample into different types of sizes before the measurement, which greatly reduces the manual operation of sample classification while improving the efficiency of coverage measurement.

[0048] Dividing the sample into multiple portions according to particle size range can be achieved by the following scheme:

[0049] The remaining sample carriers 340 other than the bottom sample carrier are provided with sieve plates 341 for sieving samples, and the sieve plates 341 have sieve mesh numbers that increase from top to bottom. Figure 2 The sample is sieved into three parts. The sample carrier 340 is divided into a first layer sample carrier 340a, a second layer sample carrier 340b and a bottom layer sample carrier 340c from top to bottom. The sieve hole diameter of the sieve plate 341 on the first layer sample carrier 340a is 6 cm, and the sieve hole diameter of the sieve plate 341 on the second layer sample carrier 340b is 3 cm. After sieving, the diameter of the samples in the first layer is above 6 cm, the diameter of the samples in the second layer is between 3 and 6 cm, and the diameter of the samples in the bottom layer is below 3 cm. The interval between the sieve plates 341 on the first layer sample carrier 340a and the second layer sample carrier 340b is set at 8 to 10 cm, and the interval between the sieve plates 341 on the second layer sample carrier 340b and the bottom layer sample carrier 340c is set at 5 to 7 cm. When the samples screened by the sieve plates 341 fall downwards, due to their small mass and short falling distance, they will not generate much impact force on the samples themselves and the samples will not be broken. Samples below 3 cm in size do not need to be screened further, so there is no sieve plate 341 on the bottom layer sample carrier 340c, and the remaining sample carriers 340 are provided with sieve plates 341. The samples can be placed on the sample carrier 340 of the first layer for screening. Since the screening mesh number of the sieve plates 341 increases from top to bottom, the diameter range of the samples in each layer of the sample placement area 320 is different, which can avoid overlapping of samples as much as possible, making the measurement results more accurate.

[0050] Since the sieve plate 341 has sieve meshes, the sample placement area 320 of the next layer can be seen through the sieve plate 341 of the current layer. When collecting images, the image of the sample placement area 320 of the next layer will be collected through the sieve plate 341 of the current layer. In order to prevent the lower sample placement area 320 from affecting the current layer, refer to Figure 3 , advantageously, a detachable partition 342 is slidably installed in the sample carrier 340, and the partitions 342 on the remaining sample carriers 340 other than the bottom sample carrier 340 are located below the sieve plate 341. The bottom sample carrier 340 is only installed with the partition 342, and the remaining sample carriers 340 are simultaneously installed with the partition 342 and the sieve plate 341. The sample carrier 340 is provided with a slide groove 343, and the partition 342 is slidably installed between the slide grooves 343. When screening samples, the partition 342 is taken out, and the samples can fall smoothly. The remaining samples will be blocked by the partition 342 after falling on the bottom sample carrier 340. After the screening is completed, the partition 342 is installed to block the sample placement area 320 below when shooting, so as to prevent the samples in the sample placement area 320 below from interfering with the measurement results of this layer;

[0051] It should be noted that the slide groove 343 on the sample carrier 340 is a horizontal groove distributed along the height direction of the sample carrier 340, and a slide groove opening 345 connected to the slide groove 343 is provided on the end surface of the sample carrier 340. The partition 342 installed between the slide grooves 343 can be taken out from the sample carrier 340 through the slide groove opening 345.

[0052] In actual operation, the grid lines of the sieving mesh on the sieve plate 341 may interfere with the identification of the sample by the measurement terminal 100, and ultimately affect the measurement result. Advantageously, the sieve plate 341 is detachably connected to the sample carrier 340. Each sample carrier 340 is provided with two layers of slide grooves 343 in the vertical direction, and the sieve plate 341 can be installed in the slide grooves 343, so that the sieve plate 341 can be slid and removed from the sample carrier 340 like the partition 342. After the screening is completed, the partition 342 is installed, and the sieve plate 341 is removed. The sample on the sieve plate 341 will fall onto the partition 342. In this way, when the measurement terminal 100 identifies the sample, it will not be interfered by the grid lines on the sieve plate 341, ensuring that the sample can be accurately identified.

[0053] It should be noted that: the two slide grooves 343 are spaced apart along the height direction of the sample carrier 340, and the slide grooves 343 are parallel to each other. The two slide grooves 343 are divided into a first slide groove 343a and a second slide groove 343b from top to bottom. The sample carrier 340 is provided with two first slide groove openings 345a and a first slide groove opening 345b which are respectively connected to the first slide groove 343a and the second slide groove 343B. On the first layer of sample carriers 340a and the second layer of sample carriers 340b, the sieve plate 341 is installed between the first slide grooves 343a, and the partition plate 342 is installed between the second slide grooves 343b. On the bottom layer of sample carriers 340c, the partition plate 342 is installed between the first slide grooves 343a.

[0054] The sieve plate 341 and the partition plate 342 installed between the slide groove 343 can be taken out from the sample carrier 340 through the slide groove opening 345. When the sieve plate 341 moves, the sample on the sieve plate 341 will be blocked by the sample carrier 340 and cannot leave the sample placement area 320. The height of the slide groove opening 345 is below 5 mm. Except for the sample placement area 320 on the bottom layer, the sample particle size in the remaining sample placement areas 320 is greater than 5 mm and cannot be moved out from the opening of the slide groove 343, nor can it enter the grooves on both sides of the slide groove 343.

[0055] Taking into account the weight of the sample itself, when it is placed on the sieve plate 341, it may compress the sieve plate 341 and cause the sieve plate 341 to deform, making it difficult to remove the sieve plate 341. The sieve plate 341 can be selected from ordinary rubber plates, metal screens, etc. As a preferred embodiment, the sieve plate 341 is a polyurethane elastomer sieve plate 341, which has good wear resistance and a long service life. It is more than ten times that of metal screens, 3-5 times that of ordinary rubber plates, and 2-3 times that of stainless steel. When the sample falls on the sieve plate 341 made of this material, the sieve plate 341 will not be deformed, and the impact force on the sample is small, so the sample can be well supported, and the sieve plate 341 can be easily removed. The sieve hole design is reasonable, and the sieve plate 341 has a unique manufacturing process. Particles of extreme size will not block the sieve hole. It has good vibration absorption performance and strong sound absorption ability, which can reduce noise and make the screened material not easy to break during vibration.

[0056] Since the sample carrier 340 has multiple layers, the sample carrier 340 needs to be stacked during screening. When collecting image information, after a layer of sample carrier 340 has collected images, it is necessary to collect the next layer, and then it is necessary to switch to the next layer of sample carrier 340. Figure 4 , multiple sample carriers 340 are stacked freely, and at least four left-right symmetrical positioning pins 331 are provided at the bottom of the sample carrier 340, and the sample carriers 340 are stacked by the positioning pins 331. Free stacking means that the sample carriers 340 are directly stacked together by their own weight, and there is no mechanical structure connection between adjacent sample carriers 340. Under the action of the positioning pins 331, the center of each layer of sample carriers 340 is located on the same vertical branch line, which can ensure that the sample falls into the sample placement area 320 during screening. At least four positioning pins 331 keep the sample carriers 340 stable, and the sample carriers 340 and the ground are also stable. When collecting image information, the sample carriers 340 can be moved upwards to start collecting the image information of the next layer. The cost is low, the positioning is more accurate, the device is stable, and the number of screening layers is easy to control, but moving the sample carriers 340 requires labor.

[0057] Reference Figure 5The sample placement area 320 is rectangular, and two adjacent sides of the sample placement area 320 are respectively provided with measurement scales 310. The sample placement area 320 is located on the sample carrier 340. The sample carrier 340 is rectangular in shape, and a rectangular area is recessed in the center of the sample carrier 340. The rectangular area is the sample placement area 320. The rectangular sample placement area 320 enables the measurement terminal 100 to better calculate the deck coverage rate. On the adjacent two sides of each layer of the sample placement area 320, a first scale 311 and a second scale 312 are respectively provided. The first scale 311 and the second scale 312 are scales directly engraved on the upper surface of the sample carrier 340 or are scales located on the upper surface of the sample carrier 340. The measurement scales 310 on both sides are perpendicular to each other and can be used as a most standard scale comparison. The measurement terminal 100 can easily and accurately calculate the sample deck coverage rate based on such measurement scales 310. The size of the sample carrier 340 has a variety of different specifications, so the measurement scale 310 of the sample placement area 320 also has a variety of specifications.

[0058] When sieving samples, the sieving of samples can be promoted by vibrating the samples, see Figure 6 and 7 The measuring system also includes a vibration source 350 for vibrating the sample placement area 320. The process of vibrating the sample by the vibration source 350 to promote screening can refer to the principle of the vibrating screen. The vibration required for the sample in the present invention is not large. Excessive vibration may cause the sample vibration amplitude to be too large. The violent collision between the samples will eject the sample from the sample placement area 320. The samples may also be broken due to excessive collision. The vibration source 350 can select a motor with an eccentric wheel. The vibration intensity can be adjusted (that is, the speed of the motor is adjusted). The vibration frequency is high and the amplitude is small, which can meet the use requirements and achieve the purpose of vibrating the sample to promote screening. After the screening is completed, the sieve plate 341 is taken out. The sieve plate 341 The samples on the sieve plate 341 fall onto the partition 342, and the sieve plate 341 moves with the samples when it is moved out. However, before the samples fall onto the partition 342, as the sieve plate 341 moves, the samples on the sieve plate 341 will accumulate in the moving direction of the sieve plate 341. After falling, these samples will be concentrated on one side edge of the partition 342. There will be many overlapping samples, and the vibration of the vibration source 350 can make these overlapping samples move away from each other to reduce overlap. If there is only one layer of sample carrier 340, the samples can also be vibrated to separate the samples to reduce overlap between samples, which can further reduce manual operations.

[0059] The sample carriers 340 are stacked freely, and the vibration source 350 can be set on the sample carriers 340 at the bottom layer. During screening, the vibration source 350 vibrates the sample carriers 340 at the bottom layer, and the sample carriers 340 at the bottom layer can transfer the vibration upward to the remaining sample carriers 340 .

[0060] Embodiment 2:

[0061] This embodiment proposes another stacking method of the sample carrier 340. Specifically, refer to Figure 8 The measuring platform 300 also includes a carrier bracket 330, and a plurality of sample carriers 340 are coaxially mounted on the carrier bracket 330. The sample carriers 340 rotate and translate relative to the carrier bracket 330. The carrier bracket 330 includes two rows of support plates 332. A rotating shaft 333 is provided between the carrier bracket 330 and one row of support plates 332. The sample carriers 340 are located on the support plates 332 and rotate with the rotating shaft 333. The carrier support 330 in this embodiment is an L-shaped plate body, and a plurality of support plates 332 are arranged on the vertical part of the L-shaped plate body. The support plates 332 are divided into two rows, and the support plates 332 in one row are connected together by a rotating shaft 333. The support plates 332 in this row are wider, and the position of the rotating shaft 333 is not in the center of the support plates 332, so as to ensure that there is enough contact area between the sample carrier 340 and the support plates 332 after rotation, so as to maintain the overall stability. The bottom of the rotating shaft 333 is connected to the L-shaped plate body, and there is another plate body connected to the support plates 332 in another row on the side of the L-shaped plate body to stabilize the support plates 332 in another row;

[0062] The support plates 332 have two rows, and the support plates 332 in one row are connected by a rotating shaft 333, so that the support plates 332 in this row are not easy to bend, and the side of the support plates 332 in the other row is connected to the carrier bracket 330. When collecting image information and screening samples, the sample carrier 340 is located on the support plates 332 on both sides, which can keep the sample carrier 340 stable. After rotating the sample carrier 340 to make it rotate half a circle around the rotating shaft 333, the image acquisition unit 200 can collect the image information of the next layer, which has high measurement efficiency and less labor consumption, but the cost is higher and the number of screening layers is inconvenient to control;

[0063] The vibration source 350 is disposed on the carrier support 330 . The vibration source 350 can vibrate the carrier support 330 , and the carrier support 330 can transmit the vibration to the sample carrier 340 on the carrier support 330 .

[0064] For other contents not described in this embodiment, please refer to Embodiment 1.

[0065] Embodiment three:

[0066] This embodiment proposes different stacking methods of the sample carrier 340. Specifically, refer to Fig. 9The measuring platform 300 also includes a carrier support 330, and a plurality of sample carriers 340 are slidably mounted on the carrier support 330 in an extracting manner, and the sample carriers 340 slide and translate relative to the carrier support 330. The sample carriers 340 and the carrier support 330 slide and cooperate with each other, so that the center of the sample carriers 340 of each layer is located on the same vertical branch line, and the sample can be ensured to fall into the sample placement area 320 during screening, and the sample carriers 340 and the carrier support 330 remain stable. When collecting image information, the sample carriers 340 are extracted from the carrier support 330 and moved away, and the image information of the next layer can be collected. The cost is low, the positioning is more accurate, the device is very stable, the number of screening layers is easy to control, and the labor consumed in moving the sample carriers 340 is less than that in the solution of the second embodiment;

[0067] The carrier support 330 is a rectangular frame with a hollow interior, and has open openings at the top and front side, and the sample carrier 340 can slide in the openings at the front side of the rectangular frame;

[0068] The vibration source 350 is disposed on the carrier support 330 . The vibration source 350 can vibrate the carrier support 330 , and the carrier support 330 can transmit the vibration to the sample carrier 340 on the carrier support 330 .

[0069] For other contents not described in this embodiment, reference may be made to the above embodiments.

[0070] Embodiment 4:

[0071] Reference Fig.10 This embodiment proposes a method for calculating the deck coverage rate of polymetallic nodules. The system includes a measuring platform, an image acquisition unit, and a measuring terminal. The measuring platform is provided with a sample placement area with a measuring scale. The method includes the following steps:

[0072] S10: Lay the samples flat in the sample placement area 320, start the vibration source 350 to vibrate the samples, so that the samples are separated from each other to avoid overlapping;

[0073] S20: The image acquisition unit 200 acquires a sample distribution map in the sample placement area 320 and uploads the captured image to the measurement terminal 100;

[0074] S30: The measuring terminal 100 calculates the deck coverage of the sample according to the image information captured by the image acquisition unit 200.

[0075] The measuring platform 300 includes a plurality of sample carriers 340 for defining the sample placement area 320. Steps S10 and S20 are repeated, and a sample distribution map in each layer of the sample placement area 320 is collected by the image acquisition unit 200, and uploaded to the measurement terminal 100. In step S30, the measurement terminal 100 calculates the actual coverage area and individual size of each tuberculosis individual in each layer of the sample placement area 320 according to the image information captured by the image acquisition unit 200. The coverage rate data obtained after processing is the net coverage rate. At the same time, other characteristic parameters of the tuberculosis samples can be analyzed and counted, such as: number, proportional distribution of individual sizes. If there are multiple sample carriers 340, it is necessary to add an operation of screening the samples through the sieve plate 341 after step S10. First, the samples are placed in the first layer sample placement area 320, and the vibration source 350 is started to start vibrating the samples so that the samples are quickly screened. After multiple layers of screening, the remaining samples fall into the bottom layer of the sample placement area 320. After the screening is completed, the sieve plate 341 is taken out, and the samples on the sieve plate 341 fall on the partition 342. Since the sieve plate 341 will move with the samples when it is moved out, the samples will be blocked by the sample carrier 340 and cannot be moved out of the sample placement area 320. However, before the samples fall onto the partition 342, as the sieve plate 341 moves, the samples on the sieve plate 341 will accumulate in the moving direction of the sieve plate 341. After falling, these samples will be concentrated on one side edge of the partition 342. There will be many overlapping samples, and it is necessary to start the vibration source 350 to vibrate the samples to keep these samples away from each other and reduce overlap.

[0076] In step S20, after the image acquisition unit 200 has finished photographing the sample placement area 320 of one layer, a step of switching the sample placement area 320 needs to be added. After the image acquisition unit 200 has finished photographing the image of the current layer, it needs to photograph the image of the next layer, and it needs to remove the sample carrier 340 of the current layer. If the sample carrier 340 and the carrier bracket 330 are in sliding cooperation, the sample carrier 340 can be directly pulled out. If the sample carrier 340 and the carrier bracket 330 are in rotation cooperation, the sample carrier 340 needs to be rotated half a circle. If the sample carriers 340 are superimposed on each other, the sample carrier 340 of this layer is directly moved away.

[0077] After the measurement is completed, the sample on the partition 342 is first taken out for subsequent experiments, and then the partition 342 is removed, and the sample carrier 340, the partition 342 and the sieve plate 341 are simply rinsed to complete the relevant cleaning work.

[0078] For other contents not described in this embodiment, reference may be made to the above embodiments.

[0079] The above is only a specific embodiment of the present invention, but the protection scope of the present invention is not limited thereto. Those skilled in the art should understand that the present invention includes but is not limited to the contents described in the drawings and the above specific embodiments. Any modification that does not deviate from the functional and structural principles of the present invention will be included in the scope of the claims.

Claims

1. Polymetallic nodule deck coverage rate calculation system, characterized by: The device comprises a measuring platform, an image acquisition unit and a measuring terminal. The measuring platform is provided with a sample placement area with a measuring scale. The image acquisition unit is located above the measuring platform and is used to photograph a sample distribution diagram of the sample placement area. The measuring terminal calculates the deck coverage of the sample according to the image information photographed by the image acquisition unit. The measuring platform comprises a plurality of sample carriers. The remaining sample carriers other than the bottom sample carrier are provided with a sieve plate for sieving the sample. The sample carrier is slidably mounted with a detachable partition. The partition plates on the remaining sample carriers other than the bottom sample carrier are located below the sieve plate. Each sample carrier A sample placement area with a measuring scale is defined, and the multiple sample carriers are stacked and arranged to screen samples layer by layer; the screening mesh number of the sieve plate increases from top to bottom; the measurement system also includes a vibration source that causes the sample placement area to vibrate; the sample placement area is rectangular, and the adjacent two sides of the sample placement area are respectively provided with measuring scales; when screening samples, the partition is taken out, and the samples can fall smoothly, and the remaining samples will be blocked by the partition after falling on the sample carrier at the bottom layer. After the screening is completed, the partition is installed to block the sample placement area below when shooting, so as to prevent the samples in the sample placement area below from interfering with the measurement results of this layer.

2. The polymetallic nodule deck coverage rate calculation system according to claim 1 is characterized in that: The sieve plate is detachably connected to the sample carrier.

3. The polymetallic nodule deck coverage rate calculation system according to claim 1, characterized in that: The multiple sample carriers are freely stacked; or, the measurement platform further comprises a carrier support, the multiple sample carriers are coaxially mounted on the carrier support, and the sample carriers are rotated and translated relative to the carrier support; Alternatively, the measurement platform further comprises a carrier support, the plurality of sample carriers are slidably mounted on the carrier support in an extraction manner, and the sample carriers slide and translate relative to the carrier support.

4. The polymetallic nodule deck coverage rate calculation system according to claim 1, characterized in that: The measuring system comprises a measuring platform, an image acquisition unit and a measuring terminal. The measuring platform is provided with a sample placement area with a measuring scale. The measuring method comprises the following steps: S10: Spread the sample flat in the sample placement area; S20: The image acquisition unit acquires a sample distribution map in the sample placement area and uploads the captured image to the measurement terminal; S30: The measuring terminal calculates the deck coverage of the sample according to the image information captured by the image acquisition unit.

5. The polymetallic nodule deck coverage rate calculation system according to claim 4 is characterized in that: The measurement platform includes a plurality of sample carriers for defining the sample placement area. Steps S10 and S20 are repeated, and the image acquisition unit acquires the sample distribution map in each layer of the sample placement area and uploads it to the measurement terminal. In step S30, the measurement terminal calculates the sample deck coverage rate in each layer of the sample placement area according to the image information captured by the image acquisition unit.

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